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IWASHITA T.  岩下 彪

ORCIDConnect your ORCID iD *help
Researcher Number 00016081
Affiliation (based on the past Project Information) *help 1990 – 1991: 東京学芸大学, 教育学部, 教授
Review Section/Research Field
Except Principal Investigator
Physical properties of metals
Keywords
Except Principal Investigator
trapped / S parameter / multilayered materials / detects / brightness enhancement / magnetic tield / an electron linac / intense slow positron beam / チャンネルプレ-ト / ズ-ム・レンズ … More / アインツェル・レンズ / 静電場型ビ-ム / 磁場型ビ-ム / モデレ-タ / 低速陽電子 / ストッピング・プロファイル / HfーCu金属多層膜 / 酸化物層 / 7ラウエ・ゾ-ン / 0 / Si(III) / RHEPD / トラップ / Sパラメ-タ- / 多層材料 / 格子欠陥 / 輝度強化 / 磁場 / 電子線型加速器 / 高強度低速陽電子ビ-ム Less
  • Research Projects

    (1 results)
  • Co-Researchers

    (2 People)
  •  Study for defects in interfaces between metals and semiconductors by slow positron beams.

    • Principal Investigator
      KANAZAWA I.
    • Project Period (FY)
      1990 – 1991
    • Research Category
      Grant-in-Aid for General Scientific Research (C)
    • Research Field
      Physical properties of metals
    • Research Institution
      Tokyo Gakugei University
  • 1.  KANAZAWA I. (00134768)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 2.  MURAKAMI H. (30011000)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results

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