SHIRAKASHI Jun-ichi 白樫淳一

… Alternative Names

SHIRAKASHI Junichi 白樫淳一

自樫淳一シラカシジュンイチ

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Researcher Number	00315657
Other IDs
Affiliation (Current)	2025: 東京農工大学, 工学(系)研究科(研究院), 教授
Affiliation (based on the past Project Information) *help	2015 – 2022: 東京農工大学, 工学(系)研究科(研究院), 教授 2014: 東京農工大学, 大学院工学研究院, 准教授 2012 – 2014: 東京農工大学, 工学(系)研究科(研究院), 准教授 2010 – 2012: Tokyo University of Agriculture and Technology, 大学院・工学研究院, 准教授 2009: 東京農工大学, 大学院・共生科学技術研究, 准教授 … More 2006 – 2009: Tokyo University of Agriculture and Technology, 大学院・共生科学技術研究院, 准教授 2006: 東京農工大学, 大学院共生科学技術研究院, 助教授 2005: 東京農工大学, 大学院・共生科学技術研究部, 助教授 2004: 国立大学法人東京農工大学, 大学院・共生科学技術研究部, 助教授 2000 – 2003: 秋田県立大学, システム科学技術学部, 助教授 Less
Review Section/Research Field	Principal Investigator Electronic materials/Electric materials / Medium-sized Section 21:Electrical and electronic engineering and related fields / Basic Section 21050:Electric and electronic materials-related / Applied materials / Nanomaterials/Nanobioscience / Microdevices/Nanodevices / Applied physics, general / Electronic materials/Electric materials Except Principal Investigator Science and Engineering / Electronic materials/Electric materials
Keywords	Principal Investigator エレクトロマイグレーション / ナノギャップ / マイクロ・ナノデバイス / 強磁性単電子トランジスタ / 少数電子素子 / トンネル磁気抵抗効果 / FPGA / スピンエレクトロニクス / 磁性 / ナノテクノロジー … More / 走査型プローブ顕微鏡 / 原子接合 / 電子・電気材料 / 単電子トランジスタ / ナノ構造形成・制御 / 超微細加工技術 / シナプス素子 / リザバーコンピューティング / 物理リザバー / シナプス可塑性 / 人工シナプス / Auナノギャップ / ナノデバイス / 人工知能 / 原子ギャップ / 単原子トランジスタ / 原子接点 / リアルタイムオペレーティングシステム / 単電子素子 / マイグレーション / 電気・電子材料 / ナノ材料 / 原子移動制御 / 電界放射電流 / ナノギヤップ / 強磁性トンネル接合ダイオード / 操作型プローブ顕微鏡 / 絶縁体接合ダイオード / 強磁性金属 / 強磁性体 / ナノ構造 … More Except Principal Investigator 弾道電子 / 原子間力顕微鏡(AFM) / 強磁性トンネル接合 / トンネル磁気抵抗効果 / 磁気メモリ(MRAM) / 表面・界面物性 / 超薄膜 / 電解還元効果 / シリコンナノドット / 電子デバイス・機器 / 電子・電気材料 / 電解還元 / 薄膜素子 / プリンティング / 還元 / 薄膜デバイス / 薄膜堆積 / 還元効果 / 弾道電子放出 / ナノシリコン / 熱音響効果 / 集積回路 / 電子デバイス / 弾道電子効果 / 可視発光 / 表面終端 / 超音波放出 / 光集積 / 発光 / 量子サイズ効果 / シリコン / ナノ構造 / 磁気力顕微鏡(MFM) / クーロンブロッケイド / クローンブロッケイド Less

Application of Electromigrated Au Nanogaps to Artificial Synaptic Devices and Physical Reservoir ComputingPrincipal Investigator
- Principal Investigator
  
  Shirakashi Jun-ichi
- Project Period (FY)
  2021 – 2022
- Research Category
  
  Grant-in-Aid for Challenging Research (Exploratory)
- Review Section
  
  Medium-sized Section 21:Electrical and electronic engineering and related fields
- Research Institution
  Tokyo University of Agriculture and Technology
Fabrication of Au Atomic Junctions Using Artificial Intelligence Implemented on FPGAPrincipal Investigator
- Principal Investigator
  
  Shirakashi Jun-ichi
- Project Period (FY)
  2018 – 2020
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Review Section
  
  Basic Section 21050:Electric and electronic materials-related
- Research Institution
  Tokyo University of Agriculture and Technology
Time-Deterministic Control of Quantized Conductance of Au Nanowires Using Feedback-Controlled Electromigration with Real-Time Operating SystemPrincipal Investigator
- Principal Investigator
  
  SHIRAKASHI JUN-ICHI
- Project Period (FY)
  2015 – 2016
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Applied materials
- Research Institution
  Tokyo University of Agriculture and Technology
Investigation of Au Atomic Junctions Using Ultrafast Electromigration Controlled by a Field-Programmable Gate ArrayPrincipal Investigator
- Principal Investigator
  
  SHIRAKASHI JUN-ICHI
- Project Period (FY)
  2015 – 2017
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  Tokyo University of Agriculture and Technology
STRUCTURAL TUNING OF NANOGAPS USING FIELD-EMISSION-INDUCED ELECTROMIGRATIONPrincipal Investigator
- Principal Investigator
  
  SHIRAKASHI JUN-ICHI
- Project Period (FY)
  2013 – 2014
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  Tokyo University of Agriculture and Technology
Thin film deposition based on reducing activity of nanosiicon ballistic electron emitter
- Principal Investigator
  
  KOSHIDA NOBUYOSHI
- Project Period (FY)
  2012 – 2014
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  Tokyo University of Agriculture and Technology
INTEGRATION OF FERROMAGNETIC SINGLE-ELECTRON TRANSISTORS USING ELECTROMIGRATION METHODSPrincipal Investigator
- Principal Investigator
  
  SHIRAKASHI JUN-ICHI
- Project Period (FY)
  2012 – 2014
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  Tokyo University of Agriculture and Technology
CONTROL OF STRUCTURAL AND ELECTRICAL PROPERTIES OF NANOGAPS USING FIELD-EMISSION-INDUCED ELECTROMIGRATIONPrincipal Investigator
- Principal Investigator
  
  SHIRAKASHI Jun-ichi
- Project Period (FY)
  2010 – 2011
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Nanomaterials/Nanobioscience
- Research Institution
  Tokyo University of Agriculture and Technology
STUDY OF FERROMAGNETIC SINGLE-ELECTRON TRANSISTORS CONTROLLED BY GATE ELECTRIC FIELDSPrincipal Investigator
- Principal Investigator
  
  SHIRAKASHI Jun-ichi
- Project Period (FY)
  2008 – 2010
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  Tokyo University of Agriculture and Technology
Control of physical properties induced in silicon nanostructure and device applications
- Principal Investigator
  
  KOSHIDA Nobuyoshi
- Project Period (FY)
  2006 – 2009
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Review Section
  
  Science and Engineering
- Research Institution
  Tokyo University of Agriculture and Technology
トンネル磁気抵抗変調型強磁性単電子トランジスタメモリー技術の研究開発Principal Investigator
- Principal Investigator
  
  白樫淳一
- Project Period (FY)
  2004 – 2007
- Research Category
  
  Grant-in-Aid for Young Scientists (A)
- Research Field
  
  Microdevices/Nanodevices
- Research Institution
  Tokyo University of Agriculture and Technology
プレーナ型集積磁気メモリの設計試作と帯電効果による機能向上の探求
- Principal Investigator
  
  竹村泰司
- Project Period (FY)
  2002 – 2003
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Review Section
  
  Science and Engineering
- Research Institution
  Yokohama National University
強磁性単電子トランジスタ技術の研究開発Principal Investigator
- Principal Investigator
  
  白樫淳一
- Project Period (FY)
  2002 – 2003
- Research Category
  
  Grant-in-Aid for Young Scientists (B)
- Research Field
  
  Applied physics, general
- Research Institution
  Akita Prefectural University
プレーナ型強磁性トンネル接合を用いた集積磁気メモリの設計
- Principal Investigator
  
  TAKEMURA Yasushi
- Project Period (FY)
  2001
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas (A)
- Review Section
  
  Science and Engineering
- Research Institution
  Yokohama National University
走査型プローブ顕微鏡を用いた局所反応場制御リソグラフィー技術の開発Principal Investigator
- Principal Investigator
  
  白樫淳一
- Project Period (FY)
  2000 – 2001
- Research Category
  
  Grant-in-Aid for Encouragement of Young Scientists (A)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  Akita Prefectural University

[Book] Nanoelectronic Device Applications Handbook, "Chapter 13: Simultaneously Controlled Tuning of Tunneling Properties of Integrated Nanogaps Using Field-Emission-Induced Electromigration"2013
- Author(s)
  M. Ito, S. Akimoto, R. Suda and J. Shirakashi
- Publisher
  CRC Press, Taylor and Francis Group, LLC
- Data Source
  KAKENHI-PROJECT-24360117
[Book] Encyclopedia of Nanoscience and Nanotechnology(Nanofabrication Using Atomic Force Microscopy, Chapter 287)(Edited by Hari Singh Nalwa)2010
- Author(s)
  A.A.Tseng, L.Pellegrino, J.Shirakashi
- Publisher
  American Scientific Publishers
- Data Source
  KAKENHI-PROJECT-20360136
[Book] ナノシリコンの最新技術と応用展開(越田信義監修)(第5章プロセス技術第2節ナノシリコン構造形成SPM技術)2010
- Author(s)
  白樫淳一
- Publisher
  シーエムシー出版
- Data Source
  KAKENHI-PROJECT-20360136
[Journal Article] Variational Ansatz Preparation to Avoid CNOT-Gates on Noisy Quantum Devices for Combinatorial Optimizations2022
- Author(s)
  T. Miki, R. Okita, M. Shimada, D. Tsukayama and J. Shirakashi
- Journal Title
  
  AIP Advances
  
  Volume: 12 Issue: 3 Pages: 035247-035247
- DOI
  10.1063/5.0077706
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-21K18713
[Journal Article] Mimicking of Thermal Spin Dynamics by Controlling Sparsity of Interactions in Ising Spin Computing with Digital Logic Circuits2022
- Author(s)
  A. Yoshida, T. Miki, M. Shimada, Y. Yoneda and J. Shirakashi
- Journal Title
  
  Appl. Phys. Express
  
  Volume: 15 Issue: 6 Pages: 067002-067002
- DOI
  10.35848/1882-0786/ac6b84
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21K18713
[Journal Article] Multiple Connected Artificial Synapses Based on Electromigrated Au Nanogaps2022
- Author(s)
  K. Sakai, M. Yagi, M. Ito and J. Shirakashi
- Journal Title
  
  J. Vac. Sci. Technol. B
  
  Volume: 40 Issue: 5 Pages: 053202-053202
- DOI
  10.1116/6.0002081
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21K18713
[Journal Article] 論理ゲートイジング計算機における交換相互作用のスパース化によるスピン更新手法2021
- Author(s)
  吉田朝輝、三木司、島田萌絵、米田優里、白樫淳一
- Journal Title
  
  電子情報通信学会技術研究報告
  
  Volume: 121 Pages: 27-30
- Data Source
  KAKENHI-PROJECT-21K18713
[Journal Article] Combinatorial Optimization with Variational Approaches on Noisy Quantum Devices2021
- Author(s)
  T. Miki, R. Okita, M. Shimada and J. Shirakashi
- Journal Title
  
  Conference Proceedings, 2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
  
  Volume: - Pages: 214-217
- DOI
  10.1109/3m-nano49087.2021.9599740
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21K18713
[Journal Article] Memory Properties of Electromigrated Au Nanogaps to Realize Reservoir Computing2021
- Author(s)
  K. Sakai, M. Yagi, M. Ito and J. Shirakashi
- Journal Title
  
  Appl. Phys. Lett.
  
  Volume: 119 Issue: 8 Pages: 084101-084101
- DOI
  10.1063/5.0055352
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21K18713
[Journal Article] Gold nanogap-based artificial synapses (STAP Article)2020
- Author(s)
  Keita Sakai, Tomomi Sato, Riku Kiyokawa, Ryoya Koyama, Mamiko Yagi, Mitsuki Ito and Jun-ichi Shirakashi
- Journal Title
  
  Jpn. J. Appl. Phys.
  
  Volume: 59 Issue: 5 Pages: 050601-050601
- DOI
  10.35848/1347-4065/ab8168
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-18H01471
[Journal Article] Machine learning-based approach for automatically tuned feedback-controlled electromigration (Featured Article)2020
- Author(s)
  Yuma Iwata, Takuya Sakurai and Jun-ichi Shirakashi
- Journal Title
  
  AIP Advances
  
  Volume: 10 Issue: 6 Pages: 065301-065301
- DOI
  10.1063/1.5143051
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-18H01471
[Journal Article] Synaptic behaviors of electromigrated Au nanogaps2019
- Author(s)
  Keita Sakai, Tomomi Sato, Soki Tani, Mitsuki Ito, Mamiko Yagi, Jun-ichi Shirakashi
- Journal Title
  
  AIP Advances
  
  Volume: 9 Issue: 5 Pages: 055317-055317
- DOI
  10.1063/1.5096817
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-18H01471
[Journal Article] Fabrication of atomic junctions with experimental parameters optimized using ground-state searches of Ising spin computing2019
- Author(s)
  Shotaro Sakai, Yosuke Hirata, Mitsuki Ito, Jun-ichi Shirakashi
- Journal Title
  
  Scientific Reports
  
  Volume: 9 Issue: 1 Pages: 16211-16211
- DOI
  10.1038/s41598-019-52438-5
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-18H01471
[Journal Article] GAを用いた実験パラメータ進化手法とAu原子接合の自動形成2019
- Author(s)
  櫻井拓哉、竹林敬太、平田鷹介、白樫淳一
- Journal Title
  
  電子情報通信学会技術研究報告
  
  Volume: 119 Pages: 43-46
- Data Source
  KAKENHI-PROJECT-18H01471
[Journal Article] Simultaneous arrayed formation of single-electron transistors using electromigration in series-connected nanogaps2018
- Author(s)
  Ito Mitsuki、Yagi Mamiko、Shimada Moe、Shirakashi Jun-ichi
- Journal Title
  
  AIP Advances
  
  Volume: 8 Issue: 10 Pages: 105005-105005
- DOI
  10.1063/1.5043449
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-18H01471
[Journal Article] 人工知能により支援されたAu原子接合の作製と量子状態の観測2018
- Author(s)
  岩田侑馬、酒井正太郎、沼倉憲彬、白樫淳一
- Journal Title
  
  電子情報通信学会技術研究報告
  
  Volume: 117 Pages: 45-50
- Data Source
  KAKENHI-PROJECT-18H01471
[Journal Article] Fabrication of single-electron transistors with electromigrated Ni nanogaps2018
- Author(s)
  Ito Mitsuki、Yagi Mamiko、Shirakashi Jun-ichi
- Journal Title
  
  AIP Advances
  
  Volume: 8 Issue: 7 Pages: 075210-075210
- DOI
  10.1063/1.5031822
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-18H01471
[Journal Article] Evolution of local temperature in Au nanowires during feedback-controlled electromigration observed by atomic force microscopy2017
- Author(s)
  Yagi Mamiko、Shirakashi Jun-ichi
- Journal Title
  
  Applied Physics Letters
  
  Volume: 110 Issue: 20 Pages: 203105-203105
- DOI
  10.1063/1.4984024
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-15H03970
[Journal Article] 自然収束動作を利用したイジングコンピューティング技術の開発とFPGAへの実装2017
- Author(s)
  木原裕介、伊藤光樹、齋藤孝成、塩村真幸、酒井正太郎、白樫淳一
- Journal Title
  
  電子情報通信学会技術研究報告
  
  Volume: 116 Pages: 23-28
- Data Source
  KAKENHI-PROJECT-15H03970
[Journal Article] Investigation of electromigration induced by field emission current flowing through Au nanogaps in ambient air2017
- Author(s)
  Inoue Kazuki、Yagi Mamiko、Ito Mitsuki、Ito Tomoyuki、Shirakashi Jun-ichi
- Journal Title
  
  Journal of Applied Physics
  
  Volume: 122 Issue: 8 Pages: 084303-084303
- DOI
  10.1063/1.4999831
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-15H03970
[Journal Article] 論理ゲートで表現された2次元イジング計算機の組合せ最適化問題への適用2017
- Author(s)
  塩村真幸、齋藤孝成、伊藤光樹、木原裕介、酒井正太郎、白樫淳一
- Journal Title
  
  電子情報通信学会技術研究報告
  
  Volume: 116 Pages: 29-34
- Data Source
  KAKENHI-PROJECT-15K13333
[Journal Article] Wearable strain sensors based on thin graphite films for human activity monitoring2017
- Author(s)
  Saito Takanari、Kihara Yusuke、Shirakashi Jun-ichi
- Journal Title
  
  Journal of Physics: Conference Series
  
  Volume: 939 Pages: 012006-012006
- DOI
  10.1088/1742-6596/939/1/012006
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-15H03970
[Journal Article] Reductive Deposition of Thin Cu Films Using Ballistic Hot Electrons as a Printing Beam2016
- Author(s)
  R. Suda, M. Yagi, A. kojima, N. Mori, J. Shirakashi, and N. Koshida
- Journal Title
  
  J. Electrochem. Soc.
  
  Volume: 163 Issue: 6 Pages: E162-E165
- DOI
  10.1149/2.0921606jes
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-14J08599, KAKENHI-PROJECT-15H03970
[Journal Article] Field-Emission-Induced Electromigration Method for Precise Tuning of Electrical Properties of Ni-Based Single-Electron Transistors2015
- Author(s)
  M. Kase, K. Okada M. Ito and J. Shirakashi
- Journal Title
  
  Conference Proceedings, 2015 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
  
  Volume: Year 2015 Pages: 202-205
- DOI
  10.1109/3m-nano.2015.7425487
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-15K13333, KAKENHI-PROJECT-15H03970
[Journal Article] Structural Tuning of Nanogaps Using Electromigration Induced by Field Emission Current with Bipolar Biasing2015
- Author(s)
  M. Yagi, M. Ito and J. Shirakashi
- Journal Title
  
  J. Appl. Phys.
  
  Volume: 118 Issue: 1 Pages: 014306-014306
- DOI
  10.1063/1.4923347
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-15K13333
[Journal Article] Tuning of Channel Conductance of Au Nanowires Using Ultrafast Electromigration Controlled by a Field-Programmable Gate Array2015
- Author(s)
  Y. Katogi, Y. Kanamaru, S. Sato, T. Saito and J. Shirakashi
- Journal Title
  
  Conference Proceedings, 2015 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
  
  Volume: Year 2015 Pages: 198-201
- DOI
  10.1109/3m-nano.2015.7425485
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-15H03970, KAKENHI-PROJECT-16J08669
[Journal Article] Controlling the tunnel resistance of suspended Ni nanogaps using field-emission-induced electromigration2015
- Author(s)
  T.:Toyonaka, K. Morihara, K. Takikawa, M. Ito, and J. Shirakashi
- Journal Title
  
  J. Vac. Sci. & Technol.
  
  Volume: 33 Issue: 2
- DOI
  10.1116/1.4904731
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-24246053, KAKENHI-PROJECT-25630122
[Journal Article] Development of Ballistic Hot Electron Emitter and its Applications to Parallel Processing: Active-Matrix Massive Direct-Write Lithography in Vacuum and Thin Films Deposition in Solutions2015
- Author(s)
  N. Koshida, A. Kojima, N. Ikegami, R. Suda, M. Yagi, J. Shirakashi, T. Yoshida, H. Miyaguchi, M. Muroyama, H. Nishino, S. Yoshida, M. Sugata, K. Totsu, and M. Esashi
- Journal Title
  
  Proc. SPIE Symp. on Advanced Lithography)
  
  Volume: 9423 Pages: 942313-942313
- DOI
  10.1117/12.2085782
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-24246053
[Journal Article] Ultrafast Feedback-Controlled Electromigration Using a Field-Programmable Gate Array2015
- Author(s)
  Y. Kanamaru, M. Ando and J. Shirakashi
- Journal Title
  
  J. Vac. Sci. Technol. B
  
  Volume: 33 Issue: 2
- DOI
  10.1116/1.4903929
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24360117
[Journal Article] Deposition of thin Si and Ge films by ballistic hot electron reduction under a solution dripping mode and its application to the growth of thin SiGe films2015
- Author(s)
  R. Suda, M. Yagi, A. Kojima, R. Mentek, N., J. Shirakashi, and N. Koshida
- Journal Title
  
  Jpn. J. Appl. Phys.
  
  Volume: 54 Issue: 4S Pages: 04DH11-04DH11
- DOI
  10.7567/jjap.54.04dh11
- Peer Reviewed / Acknowledgement Compliant / Open Access
- Data Source
  KAKENHI-PROJECT-24246053
[Journal Article] Simultaneous Fabrication of Nanogap Electrodes Using Field-Emission-Induced Electromigration2015
- Author(s)
  M. Ito, M. Yagi, K. Morihara and J. Shirakashi
- Journal Title
  
  J. Appl. Phys.
  
  Volume: 118 Issue: 1 Pages: 014301-014301
- DOI
  10.1063/1.4923411
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-15H03970
[Journal Article] High-Throughput Nanogap Formation by Field-Emission-Induced Electromigration2015
- Author(s)
  M. Ito, K. Morihara, T. Toyonaka, K. Takikawa and J. Shirakashi
- Journal Title
  
  J. Vac. Sci. Technol. B
  
  Volume: 33 Issue: 5 Pages: 051801-051801
- DOI
  10.1116/1.4927443
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-15H03970
[Journal Article] In Situ Atomic Force Microscopy Imaging of Structural Changes in Metal Nanowires during Feedback-Controlled Electromigration2015
- Author(s)
  M. Yagi, M. Ito and J. Shirakashi
- Journal Title
  
  J. Vac. Sci. Technol. B
  
  Volume: 33 Issue: 5 Pages: 051806-051806
- DOI
  10.1116/1.4929444
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-15K13333
[Journal Article] Electrical Properties of Nanogap-Based Single-Electron Transistors Fabricated by Field-Emission-Induced Electromigration2014
- Author(s)
  R. Suda, S. Akimoto, K. Morihara and J. Shirakashi
- Journal Title
  
  Proc. 13th IEEE Int. Conf. on Nanotechnology (IEEE-NANO)
  
  Volume: 13 Pages: 87-90
- DOI
  10.1109/nano.2013.6720862
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24246053, KAKENHI-PROJECT-24360117
[Journal Article] A Fully Customized Hardware System for Ultra-Fast Feedback-Controlled Electromigration Using FPGA2014
- Author(s)
  Y. Kanamaru, M. Ando, R. Suda and J. Shirakashi
- Journal Title
  
  2014 IEEE 14th International Conference on Nanotechnology (IEEE-NANO)
  
  Volume: 14778995 Pages: 719-722
- DOI
  10.1109/nano.2014.6968058
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-14J08599, KAKENHI-PROJECT-24360117
[Journal Article] Electro-Deposition of Thin Si and Ge Films Based on Ballistic Hot Electron Injection2014
- Author(s)
  N. Koshida, A. Kojima, T. Ohta, R. Mentek, B. Gelloz, N. Mori, J. Shirakashi
- Journal Title
  
  ECS Solid State Letters
  
  Volume: 3 (5) Issue: 5 Pages: P57-P60
- DOI
  10.1149/2.002405ssl
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-23560388, KAKENHI-PROJECT-24246053, KAKENHI-PROJECT-25630122
[Journal Article] FPGAを用いた超高速フィードバック制御型エレクトロマイグレーション2014
- Author(s)
  金丸祐真、安藤昌澄、齋藤孝成、白樫淳一
- Journal Title
  
  電子情報通信学会技術研究報告
  
  Volume: 113 Pages: 83-87
- Data Source
  KAKENHI-PROJECT-25630122
[Journal Article] Simultaneous Fabrication of Nanogaps Using Field-Emission-Induced Electromigration2014
- Author(s)
  M. Ito, M. Yagi, K. Morihara and J. Shirakashi
- Journal Title
  
  Conference Proceedings, 2014 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
  
  Volume: INSPEC Accession #: 14983576 Pages: 312-315
- DOI
  10.1109/3m-nano.2014.7057331
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-25630122
[Journal Article] Low-temperature deposition of thin Si, Ge, and SiGe films using reducing activity of ballistic hot electrons2014
- Author(s)
  N. Koshida, R. Suda, M. Yagi, A. Kojima, R. Mentek, B. Gelloz, N. Mori, and J. Shirakashi
- Journal Title
  
  ECS Trans.
  
  Volume: 64 Issue: 6 Pages: 405-410
- DOI
  10.1149/06406.0405ecst
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-24246053, KAKENHI-PROJECT-24360117
[Journal Article] Ballistic hot electron effects in nanosilicon dots and their photonic applications (Invited)2014
- Author(s)
  N. Koshida, N. Ikegami, A. Kojima, R. Mentek, R. Suda, M. Yagi, J. Shirakashi, B. Gelloz, and N. Mori
- Journal Title
  
  ECS Trans.
  
  Volume: 61 Issue: 5 Pages: 47-54
- DOI
  10.1149/06105.0047ecst
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-24246053, KAKENHI-PROJECT-24360117
[Journal Article] ナノギャップでの原子のマイグレーション現象により作製したNi系ナノスケールデバイス2014
- Author(s)
  須田隆太郎、伊藤光樹、森原康平、豊中貴大、滝川主喜、白樫淳一
- Journal Title
  
  電子情報通信学会技術研究報告
  
  Volume: 113 Pages: 95-100
- Data Source
  KAKENHI-PROJECT-25630122
[Journal Article] Resistive Switching Effects in Electromigrated Ni Nanogaps2014
- Author(s)
  K. Takikawa, R. Suda, M. Ito, T. Toyonaka and J. Shirakashi
- Journal Title
  
  2014 IEEE 14th International Conference on Nanotechnology (IEEE-NANO)
  
  Volume: 14778966 Pages: 715-718
- DOI
  10.1109/nano.2014.6968014
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-14J08599, KAKENHI-PROJECT-24360117
[Journal Article] Structural Tuning of Nanogaps Using Field-Emission-Induced Electromigration with Bipolar Biasing2014
- Author(s)
  M. Yagi, M. Ito and J. Shirakashi
- Journal Title
  
  Conference Proceedings, 2014 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
  
  Volume: INSPEC Accession #: 14983607 Pages: 134-138
- DOI
  10.1109/3m-nano.2014.7057332
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-25630122
[Journal Article] In-Situ Observation of Temperature Distribution of Microheaters Using Near-Infrared Charge Coupled Device Imaging System2013
- Author(s)
  T. Saito, W. Lin and J. Shirakashi
- Journal Title
  
  Nanosci. Nanotechnol. Lett.
  
  Volume: 5 Issue: 10 Pages: 1076-1080
- DOI
  10.1166/nnl.2013.1671
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24360117
[Journal Article] Tuning of Resistance of Nanogaps Using Field-Emission-Induced Electromigration with Feedback Control Scheme2013
- Author(s)
  M. Ando, S. Akimoto, R. Suda and J. Shirakashi
- Journal Title
  
  Conference Proceedings, 2013 13th IEEE International Conference on Nanotechnology (IEEE-NANO)
  
  Volume: Year 2013 Pages: 1141-1144
- DOI
  10.1109/nano.2013.6721060
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24360117
[Journal Article] Control Parameters for Fabrication of Single-Electron Transistors Using Field-Emission-Induced Electromigration2013
- Author(s)
  S. Akimoto, M. Ito, S. Ueno and J. Shirakashi
- Journal Title
  
  J. Nanosci. Nanotechnol.
  
  Volume: 13 Issue: 2 Pages: 993-996
- DOI
  10.1166/jnn.2013.6073
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24246053, KAKENHI-PROJECT-24360117
[Journal Article] Formation Scheme of Quantum Point Contacts Based on Nanogaps Using Field-Emission-Induced Electromigration2013
- Author(s)
  R. Suda, M. Yagi, T. Watanabe and J. Shirakashi
- Journal Title
  
  J. Nanosci. Nanotechnol.
  
  Volume: 13 Issue: 2 Pages: 883-887
- DOI
  10.1166/jnn.2013.6072
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24246053, KAKENHI-PROJECT-24360117
[Journal Article] Nanoscale Scratching of Platinum Thin Films Using Atomic Force Microscopy with DLC Tips2012
- Author(s)
  X. Jiang, G Wu, Z. Du, K. J. Ma, J. Shirakashi and A. A. Tseng
- Journal Title
  
  J. Vac. Sci. Technol.
  
  Volume: 30 Issue: 2
- DOI
  10.1116/1.3694242
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24360117
[Journal Article] Integration of Single-Electron Transistors Using Field-Emission-Induced Electromigration2011
- Author(s)
  S.Ueno, Y.Tomoda, W.Kume, M.Hanada, K.Takiya, J.Shirakashi
- Journal Title
  
  J.Nanosci.Nanotechnol.
  
  Volume: 11 Issue: 7 Pages: 6258-6261
- DOI
  10.1166/jnn.2011.4328
- NAID
  110008001136
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22651039
[Journal Article] Tuning of Tunnel Resistance of Nanogaps by Field-Emission-Induced Electromigration Using Current Source Mode2011
- Author(s)
  K.Takiya, Y.Tomoda, W.Kume, S.Ueno, T. Watanabe, J.Shirakashi
- Journal Title
  
  J.Nanosci.Nanotechnol.
  
  Volume: 11 Issue: 7 Pages: 6266-6270
- DOI
  10.1166/jnn.2011.4336
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22651039
[Journal Article] Scratch Direction and Threshold Force in Nanoscale Scratching Using Atomic Force Microscopes2011
- Author(s)
  A. A. Tseng, C. J. Kuo, S. Jou, S. Nishimura and J. Shirakashi
- Journal Title
  
  Appl. Surf. Sci
  
  Volume: 257 Pages: 9243-9250
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22651039
[Journal Article] Fabrication of Planar-Type Ni/Vacuum/Ni Tunnel Junctions Based on Ferromagnetic Nanogaps Using Field-Emission-Induced Electromigration2011
- Author(s)
  T.Watanabe, K.Takiya, J.Shirakashi
- Journal Title
  
  J.Appl.Phys.
  
  Volume: 109 Issue: 7
- DOI
  10.1063/1.3565198
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22651039
[Journal Article] Integration of Single-Electron Transistors Using Field-Emission-Induced Electromigration2011
- Author(s)
  S. Ueno, Y. Tomoda, W. Kume, M. Hanada, K. Takiya and J. Shirakashi
- Journal Title
  
  J. Nanosci. Nanotechnol
  
  Volume: 11 Pages: 6258-6261
- NAID
  110008001136
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22651039
[Journal Article] 分割型電圧フィードバックエレクトロマイグレーション法を用いた室温動作可能なプレナー型強磁性トンネル接合素子の作製2011
- Author(s)
  安武龍太朗、渡邉敬登、上野俊介、北川潤、白樫淳一
- Journal Title
  
  電子情報通信学会技術研究報告
  
  Volume: vol.110, no.423 Pages: 19-23
- NAID
  110008688779
- Data Source
  KAKENHI-PROJECT-22651039
[Journal Article] Scratch Properties of Nickel Thin Films Using Atomic Force Microscopy2010
- Author(s)
  A. A. Tseng, J. Shirakashi, S. Jou, J. C. Huang and T. P. Chen
- Journal Title
  
  J. Vac. Sci. Technol
  
  Volume: B28 Pages: 202-210
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22651039
[Journal Article] Fabrication of Single-Electron Transistors Using Field-Emission-Induced Electromigration2010
- Author(s)
  W.Kume, Y.Tomoda, M.Hanada J.Shirakashi
- Journal Title
  
  J.Nanosci.Nanotechnol.
  
  Volume: 10 Pages: 7239-7243
- NAID
  110007131563
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20360136
[Journal Article] 10 Micrometer-Scale SPM Local Oxidation Lithography2010
- Author(s)
  T.Toyofuku, S.Nishimura, K.Miyashita, J.Shirakashi.
- Journal Title
  
  J.Nanosci.Nanotechnol.
  
  Volume: 10 Pages: 4543-4547
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22651039
[Journal Article] 電界放射電流誘起型エレクトロマイグレーション法によるプレナー型強磁性トンネル接合の作製2010
- Author(s)
  滝谷和聡、友田悠介、渡邉敬登、久米彌、上野俊介、白樫淳一
- Journal Title
  
  電子情報通信学会技術研究報告
  
  Volume: 422 Pages: 41-45
- NAID
  110008001137
- Data Source
  KAKENHI-PROJECT-22651039
[Journal Article] Nanomachining of Permalloy for Fabricating Nanoscale Ferromagnetic Structures Using Atomic Force Microscopy2010
- Author(s)
  A. A. Tseng, J. Shirakashi, S. Nishimura, K. Miyashita and Z. Li
- Journal Title
  
  J. Nanosci. Nanotechnol
  
  Volume: 10 Pages: 456-466
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22651039
[Journal Article] Fabrication of Planar-Type Ferromagnetic Tunnel Junctions Using Electromigration Method and Its Magnetoresistance Properties2010
- Author(s)
  Y.Tomoda, M.Hanada, W.Kume, S.Itami, T.Watanabe, J.Shirakashi
- Journal Title
  
  J.Phys.Conf.Ser. 200
  
  Pages: 62035-62035
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20360136
[Journal Article] Scanning Probe Microscope Lithography at the Micro- and Nano-Scales2010
- Author(s)
  J.Shirakashi (Invited)
- Journal Title
  
  J.Nanosci.Nanotechnol. 10
  
  Pages: 4486-4494
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20360136
[Journal Article] 電界放射電流誘起型エレクトロマイグレーションによる単電子トランジスタの集積化2010
- Author(s)
  上野俊介、友田悠介、久米彌、花田道庸、滝谷和聡、白樫淳一
- Journal Title
  
  電子情報通信学会技術研究報告
  
  Volume: 422 Pages: 35-39
- NAID
  110008001136
- Data Source
  KAKENHI-PROJECT-22651039
[Journal Article] Influence of Feedback Parameters on Resistance Control of Metal Nanowires by Stepwise Feedback-Controlled Electromigration2010
- Author(s)
  S.Itami, Y.Tomoda, R.Yasutake J.Shirakashi
- Journal Title
  
  J.Nanosci.Nanotechnol.
  
  Volume: 10 Pages: 7464-7468
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20360136
[Journal Article] Fabrication of Single-Electron Transistors Using Field-Emission-Induced Electro- migration2010
- Author(s)
  W.Kume, Y.Tomoda, M.Hanada, J.Shirakashi
- Journal Title
  
  J.Nanosci.Nanotechnol. 10
  
  Pages: 7239-7243
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20360136
[Journal Article] Influence of Feedback Parameters on Resistance Control of Metal Nanowires by Stepwise Feedback-Controlled Electromigration2010
- Author(s)
  S.Itami, Y.Tomoda, R.Yasutake, J.Shirakashi
- Journal Title
  
  J.Nanosci.Nanotechnol.
  
  Volume: 10 Pages: 7464-7468
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22651039
[Journal Article] Fabrication of Single-Electron Transistors Using Field-Emission-Induced Electromigration2010
- Author(s)
  W.Kume, Y.Tomoda, M.Hanada, J.Shirakashi
- Journal Title
  
  J.Nanosci.Nanotechnol.
  
  Volume: 10 Pages: 7239-7243
- NAID
  110007131563
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22651039
[Journal Article] Scanning Probe Microscope Lithography at the Micro- and Nano-Scales2010
- Author(s)
  J.Shirakashi
- Journal Title
  
  J.Nanosci.Nanotechnol.
  
  Volume: 10 Pages: 4486-4494
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20360136
[Journal Article] Influence of Feedback Parameters on Resistance Control of Metal Nanowires by Stepwise Feedback-Controlled Electro- migration2010
- Author(s)
  S.Itami, Y.Tomoda, R.Yasutake, J.Shirakashi
- Journal Title
  
  J.Nanosci.Nanotechnol. 10
  
  Pages: 7464-7468
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20360136
[Journal Article] Scratching Properties of Nickel-Iron Thin Film and Silicon Using Atomic Force Microscopy2009
- Author(s)
  A.A.Tseng, J.Shirakashi, S.Nishimura, K.Miyashita A.Notargiacomo
- Journal Title
  
  J.Appl.Phys. 106
  
  Pages: 44314-44314
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20360136
[Journal Article] Control of Channel Resistance on Metal Nanowires by Electromigration Patterning Method2009
- Author(s)
  K. Takahashi, Y. Tomoda, S. Itami, J. Shirakashi
- Journal Title
  
  J. Vac. Sci. Technol. B 27
  
  Pages: 805-809
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20360136
[Journal Article] Nanoscale Patterning of NiFe Surface by SPM Scratch Nanolithography2009
- Author(s)
  K. Miyashita, S. Nishimura, T. Toyofuku, J. Shirakashi
- Journal Title
  
  J. Vac. Sci. Technol. B 27
  
  Pages: 953-957
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20360136
[Journal Article] Magnetoresistance Properties of Planar-Type Tunnel Junctions with Ferromagnetic Nanogap System Fabricated by Electromigration Method2009
- Author(s)
  Y.Tomoda, K.Takahashi, M.Hanada, W.Kume, S.Itami, T.Watanabe, J.Shirakashi
- Journal Title
  
  IEEE Trans.Mag. 45
  
  Pages: 3480-3483
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063007
[Journal Article] Magnetoresistance Properties of Planar-Type Tunnel Junctions with Ferromagnetic Nanogap System Fabricated by Electromigration Method2009
- Author(s)
  Y.Tomoda, K.Takahashi, M.Hanada, W.Kume, S.Itami, T.Watanabe, J.Shirakashi
- Journal Title
  
  IEEE Trans.Mag. 45
  
  Pages: 3480-3483
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20360136
[Journal Article] Nanomachining of Permalloy for Fabricating Nanoscale Ferromagnetic Structures Using Atomic Force Microscopy2009
- Author(s)
  A.A.Tseng, J.Shirakashi, S.Nishimura, K.Miyashita, Z.Li
- Journal Title
  
  J.Vac.Sci.Technol.B 10
  
  Pages: 456-466
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063007
[Journal Article] Fabrication of Nanogap Electrodes by Field-Emission-Induced Electromigration2009
- Author(s)
  Y.Tomoda, K.Takahashi, M.Hanada, W.Kume, J.Shirakashi
- Journal Title
  
  J.Vac.Sci.Technol.B 27
  
  Pages: 813-816
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20360136
[Journal Article] Scratching properties of nickel-iron thin film and silicon using atomic force microscopy2009
- Author(s)
  A.A. Tseng, J. Shirakashi, S. Nishimura, K. Miyashita, A. Notargiacomo
- Journal Title
  
  J. Appl. Phys. 106
  
  Pages: 44314-44314
- Data Source
  KAKENHI-PROJECT-18063007
[Journal Article] Control of Channel Resistance on Metal Nanowires by Electromigration Patterning Method2009
- Author(s)
  K.Takahashi, Y.Tomoda, S.Itami, J.Shirakashi
- Journal Title
  
  J.Vac.Sci.Technol.B 27
  
  Pages: 805-809
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20360136
[Journal Article] Scratching Properties of Nickel-Iron Thin Film and Silicon Using Atomic Force Microscopy2009
- Author(s)
  A.A.Tseng, J.Shirakashi, S.Nishimura, K.Miyashita, A.Notargiacomo
- Journal Title
  
  J.Appl.Phys. 106
  
  Pages: 44314-44314
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20360136
[Journal Article] Control of channel resistance on metal nanowires by electromigration patterning method2009
- Author(s)
  K.Takahashi, Y.Tomoda, S.Itami, J.Shirakashi
- Journal Title
  
  J.Vac.Sci.Technol.B 27
  
  Pages: 805-809
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063007
[Journal Article] Magnetoresistance properties of planar-type tunnel junctions with ferromagnetic nanogap system fabricated by electromigration method2009
- Author(s)
  Y. Tomoda, K. Takahashi, M. Hanada, W. Kume, S. Itami, T. Watanabe, J. Shirakashi
- Journal Title
  
  IEEE Trans. Mag. 45
  
  Pages: 3480-3483
- Data Source
  KAKENHI-PROJECT-18063007
[Journal Article] Micrometer-scale local-oxidation lithography using scanning probe microscopy2008
- Author(s)
  S. Nishimura, T. Ogino, J. Shirakashi
- Journal Title
  
  Jpn. J. Appl. Phys. 47
  
  Pages: 715-717
- Data Source
  KAKENHI-PROJECT-18063007
[Journal Article] Wide-Range Control of Tunnel Resistance on Metallic Nanogaps Using Migration2008
- Author(s)
  S.Kayashima, K.Takahashi, M.Motoyama, J.Shirakashi
- Journal Title
  
  J.Phys.Conf.Ser. 100
  
  Pages: 52022-52022
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20360136
[Journal Article] Scratch nanolithography on Si surface using scanning probe microscopy : Influence of scanning parameters on groove size2008
- Author(s)
  T. Ogino, S. Nishimura, and J. Shirakashi
- Journal Title
  
  Jpn. J. Appl. Phys. 47
  
  Pages: 712-714
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063007
[Journal Article] Local oxidation of Si surfaces by tapping-mode scanning probe microscopy: Size dependence of oxide wires on dynamic properties of cantilever2008
- Author(s)
  S. Nishimura, T. Ogino, Y. Takemura, J. Shirakashi
- Journal Title
  
  Jpn. J. Appl. Phys. 47
  
  Pages: 718-720
- Data Source
  KAKENHI-PROJECT-18063007
[Journal Article] Micrometer-scale local-oxidation lithography using scanning probe microscopy2008
- Author(s)
  S. Nishimura, T. Ugino, and J. Shirakashi
- Journal Title
  
  Jpn. J. Appl. Phys. 47
  
  Pages: 715-717
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063007
[Journal Article] Local oxidation of Si surfaces by tapping-mode scanning probe microscopy : Size dependence of oxide wires on dynamic properties of cantilever2008
- Author(s)
  S. Nishimura, T. Ogino, Y. Takemura, and J. Shirakashi
- Journal Title
  
  Jpn. J. Appl. Phys. 47
  
  Pages: 718-720
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063007
[Journal Article] Measurement of reaction current during atomic force microscope local oxidation of conductive surfaces capped with insulating layers2008
- Author(s)
  Y. Shimada, T. Yamada, and J. Shirakashi
- Journal Title
  
  Jpn. J. Appl. Phys. 47
  
  Pages: 768-770
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063007
[Journal Article] Wide-Range Control of Tunnel Resistance on Metallic Nanogaps Using Migration2008
- Author(s)
  S. Kayashima, K. Takahashi, M. Motoyama, J. Shirakashi
- Journal Title
  
  J. Phys. Conf. Ser. 100
  
  Pages: 52022-52022
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20360136
[Journal Article] Measurement of reaction current during atomic force microscope local oxidation of conductive surfaces capped with insulating layers2008
- Author(s)
  Y. Shimada, T. Yamada an J. Shirakashi
- Journal Title
  
  Jpn. J. Appl. Phys. 47
  
  Pages: 768-770
- Data Source
  KAKENHI-PROJECT-18063007
[Journal Article] Scratch nanolithography on Si surface using scanning probe microscopy: Influence of scanning parameters on groove size2008
- Author(s)
  T. Ogino, S. Nishimura, J. Shirakashi
- Journal Title
  
  Jpn. J. Appl. Phys. 47
  
  Pages: 712-714
- Data Source
  KAKENHI-PROJECT-18063007
[Journal Article] Sub-20 nm Scratch Nanolithography for Si Using Scanning Probe Microscopy2007
- Author(s)
  T. Ogino, S. Nishimura and J. Shirakashi
- Journal Title
  
  Jpn. J. Appl. Phys. 46
  
  Pages: 6908-6910
- NAID
  40015642904
- Data Source
  KAKENHI-PROJECT-16681011
[Journal Article] Measurement of Faradaic Current during AFM Local Oxidation of Magnetic Metal Thin Films2007
- Author(s)
  Y. Takemura, Y. Shimada, G. Watanabe, T. Yamada and J. Shirakashi
- Journal Title
  
  J. Phys. Conf. Ser. 61
  
  Pages: 1147-1151
- Data Source
  KAKENHI-PROJECT-16681011
[Journal Article] SPM Local Oxidation Nanolithography with Active Control of Cantilever Dynamics2007
- Author(s)
  S. Nishimura, Y. Takemura and J. Shirakashi
- Journal Title
  
  J. Phys. Conf. Ser. 61
  
  Pages: 1066-1070
- Data Source
  KAKENHI-PROJECT-16681011
[Journal Article] Control of Tunnel Resistance of Nanogaps by Field-Emission-lnduced Electromigration2007
- Author(s)
  S. Kayashima, K. Takahashi, M. Motoyama and J. Shirakashi
- Journal Title
  
  Jpn. J. Appl. Phys. 46
- Data Source
  KAKENHI-PROJECT-16681011
[Journal Article] Control of tunnel resistance of nanogaps by field-emission-induced electromigration2007
- Author(s)
  S. Kayashima, K. Takahashi, M. Motoyama, J. Shirakashi
- Journal Title
  
  Jpn. J. Appl. Phys. 46
- NAID
  210000064124
- Data Source
  KAKENHI-PROJECT-18063007
[Journal Article] AFM Lithography for Fabrication of Magnetic Nanostructures and Devices2006
- Author(s)
  Y.Takemura, J.Shirakashi
- Journal Title
  
  J.Magn.Magn.Mat. (印刷中)
- Data Source
  KAKENHI-PROJECT-16681011
[Journal Article] Magnetoresistance Effect of Planar-Type Ferromagnetic Tunnel Junctions2006
- Author(s)
  Y.Tomoda, Y.Shibata, J.Shirakashi, Y.Takemura
- Journal Title
  
  J.Appl.Phys. (印刷中)
- Data Source
  KAKENHI-PROJECT-16681011
[Journal Article] Fabrication of Magnetic Nanostructures and Devices by AFM Nano-Lithography Technique2005
- Author(s)
  Y.Takemura, J.Shirakashi (Invited)
- Journal Title
  
  Proc.SPIE (印刷中)
- Data Source
  KAKENHI-PROJECT-16681011
[Journal Article] Magnetoresistance of Patterned NiFe Thin Films with Structures Modified by Atomic Force Microscope Nanolithography2005
- Author(s)
  G.Watanabe, S.Koizumi, K.Watanabe, T.Yamada, Y.Takemura, J.Shirakashi
- Journal Title
  
  J.Vac.Sci.& Technol. B23
  
  Pages: 2390-2393
- Data Source
  KAKENHI-PROJECT-16681011
[Journal Article] Direct Modification of Magnetic Domains in Co Nanostructures by AFM-Lithography2005
- Author(s)
  Y.Takemura, S.Hayashi, F.Okazaki, T.Yamada, J.Shirakashi
- Journal Title
  
  Jap.J.Appl.Phys. (印刷中)
- Data Source
  KAKENHI-PROJECT-16681011
[Journal Article] Modification of Electrical Properties and Magnetic Domain Structures in Magnetic Nanostructures by AFM Nano-Lithography2005
- Author(s)
  Y.Takemura, J.Shirakashi
- Journal Title
  
  Adv.Eng.Mat. 7
  
  Pages: 170-173
- Data Source
  KAKENHI-PROJECT-16681011
[Journal Article] Direct Modification of Magnetic Domains in Co Nanostructures by Atomic Force Microscope Lithography2005
- Author(s)
  Y.Takemura, S.Hayashi, F.Okazaki, T.Yamada, J.Shirakashi
- Journal Title
  
  Jpn.J.Appl.Phys. 44
- NAID
  10014505822
- Data Source
  KAKENHI-PROJECT-16681011
[Journal Article] SPM Fabrication of Nanometerscale Ferromagnetic Metal-Oxide Devices2004
- Author(s)
  J.Shirakashi, Y.Takemura
- Journal Title
  
  J.Magn.Magn.Mat. 272-276P2
  
  Pages: 1581-1583
- Data Source
  KAKENHI-PROJECT-16681011
[Journal Article] Ferromagnetic Ultra-Small Tunnel Junction Devices Fabricated by Scanning Probe Microscope (SPM) Local Oxidation2004
- Author(s)
  J.Shirakashi, Y.Takemura
- Journal Title
  
  IEEE Trans.Mag. 40
  
  Pages: 2640-2642
- Data Source
  KAKENHI-PROJECT-16681011
[Journal Article] Magnetic Nanostructures Fabricated by the Atomic Force Microscopy Nano-Lithography Technique2004
- Author(s)
  K.Watanabe, Y.Takemura, Y.Shimazu, J.Shirakashi
- Journal Title
  
  Nanotechnology 15
- Data Source
  KAKENHI-PROJECT-16681011
[Journal Article] Finite-Element Capacitance Calculation and Spin-dependent Transport Modeling of Double Magnetic Tunnel Junctions2004
- Author(s)
  M.B.A.Jalil, C.W.Kim, Y.Takemura, J.Shirakashi
- Journal Title
  
  Transactions of the Magnetics Society of Japan Vol.4,No.1
  
  Pages: 28-33
- Data Source
  KAKENHI-PROJECT-16681011
[Patent] 処理装置及び薄膜の製造方法2015
- Inventor(s)
  越田信義・白樫淳一・須田隆太郎・八木麻実子
- Industrial Property Rights Holder
  東京農工大学
- Industrial Property Rights Type
  特許
- Industrial Property Number
  2015-031822
- Filing Date
  2015-02-20
- Data Source
  KAKENHI-PROJECT-24246053
[Presentation] Reservoir Computing-Based Real-Time Prediction for Quantized Conductance of Au Atomic Junctions2022
- Author(s)
  Y. Shimada, M. Shimada, T. Miki and J. Shirakashi
- Organizer
  17th IEEE Nanotechnology Materials and Devices Conference (IEEE NMDC 2022), November 18-20, 2022, Nanjing, China. (in Combination with Online Conference)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18713
[Presentation] Experimental Evaluation of Performance Improvement by Sparse Operation in Ising Spin Computing2022
- Author(s)
  A. Yoshida, T. Miki, M. Shimada, Y. Yoneda and J. Shirakashi
- Organizer
  17th IEEE Nanotechnology Materials and Devices Conference (IEEE NMDC 2022), November 18-20, 2022, Nanjing, China. (in Combination with Online Conference)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18713
[Presentation] Efficient Ground-State Searches by Scheduling Sparsity of Interactions of Physical Spin Dynamics for Ising Spin Computing2022
- Author(s)
  A. Yoshida, T. Miki, M. Shimada, Y. Yoneda and J. Shirakashi
- Organizer
  2022 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (IEEE 3M-NANO 2022), August 8-12, 2022, Tianjin, China. (in Combination with Online Conference)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18713
[Presentation] Hybridization of Spin Decision Logics for Ising Machine with Logic Circuits2021
- Author(s)
  T. Miki, A. Yoshida, M. Shimada and J. Shirakashi
- Organizer
  21st IEEE International Conference on Nanotechnology (IEEE NANO 2021), July 28-31, 2021, Virtual Format. (Online Conference)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18713
[Presentation] Sparsifying Connected Spins in Majority Voting Method of Ising Spin Computing Based on Logic Gates2021
- Author(s)
  A. Yoshida, T. Miki, M. Shimada, Y. Yoneda and J. Shirakashi
- Organizer
  2021 International Conference on Nanoscience & Technology (ICN+T 2021), July 12-15, 2021, Virtual Event. (Online Conference)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18713
[Presentation] Application of Electromigrated Au Nanogaps to Artificial Synaptic Devices and Physical Reservoir Computing2021
- Author(s)
  K. Sakai and J. Shirakashi
- Organizer
  2021 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices (AWAD 2021), August 26-27, 2021, Virtual. (Online Conference)
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18713
[Presentation] Spin Connection Topology and Multi-Bit Spin Interaction Coefficients of Ising Spin Model with Digital Logic Gates2020
- Author(s)
  T. Miki, M. Shimada and J. Shirakashi
- Organizer
  2020 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (IEEE DTS), June 7-10, 2020, Hammamet, Tunisia. (Online Conference)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H01471
[Presentation] Information Processing Using Reservoir Computing with Dynamical Node of Electromigrated Au Nanogaps2020
- Author(s)
  K. Sakai, T. Miki, R. Kiyokawa, R. Koyama, K. Watanabe and J. Shirakashi
- Organizer
  2020 International Symposium on Nonlinear Theory and Its Applications (NOLTA2020), November 16-19, 2020, Okinawa, Japan. (Online Conference)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H01471
[Presentation] Computational Properties of Ising Spin Model on Spin Connection Parameters2019
- Author(s)
  T. Miki, M. Ito, Y. Hirata, Y. Kushitani, M. Shimada and J. Shirakashi
- Organizer
  19th IEEE International Conference on Nanotechnology (IEEE NANO 2019), July 22-26, 2019, Macao, China.
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H01471
[Presentation] Synaptic Learning Behavior of Multiple-Connected Au Nanogaps Using Electromigration2019
- Author(s)
  T. Sato, K. Sakai, K. Minami, S. Tani, M. Ito, M. Yagi and J. Shirakashi
- Organizer
  3rd International Conference on Applied Surface Science (ICASS 2019), June 17-20, 2019, Pisa, Italy.
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H01471
[Presentation] Calculation Behavior of 2D Ising Spin Computing with Different Spin Decision Logics2019
- Author(s)
  M. Shimada, M. Ito, Y. Hirata, Y. Kushitani, T. Miki and J. Shirakashi
- Organizer
  19th IEEE International Conference on Nanotechnology (IEEE NANO 2019), July 22-26, 2019, Macao, China.
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H01471
[Presentation] Fabrication of Au Atomic Junctions Using Artificial Intelligence Implemented on FPGA2018
- Author(s)
  T. Sakurai, Y. Hirata, K. Takebayashi, Y. Iwata and J. Shirakashi
- Organizer
  AVS Pacific Rim Symposium on Surfaces, Coatings and Interfaces (PacSurf 2018), December 2-6, 2018, Waikoloa, HI, USA.
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H01471
[Presentation] Electromigration-Induced Structural Modification of Series-Parallel-Connected Au Nanogaps2018
- Author(s)
  K. Minami, S. Tani, K. Sakai, T. Sato, M. Ito, M. Yagi and J. Shirakashi
- Organizer
  AVS Pacific Rim Symposium on Surfaces, Coatings and Interfaces (PacSurf 2018), December 2-6, 2018, Waikoloa, HI, USA.
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H01471
[Presentation] Single-Electron Tunneling Effects in Electromigrated Coulomb Island between Au Nanogaps2018
- Author(s)
  S. Tani, M. Ito, M. Yagi, M. Shimada, K. Sakai, K. Minami and J. Shirakashi
- Organizer
  13th IEEE Nanotechnology Materials and Devices Conference (IEEE NMDC 2018), October 14-17, 2018, Portland, OR, USA.
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H01471
[Presentation] Single-Electron Transistors with Electromigrated Au Nanogaps2017
- Author(s)
  S. Tani, M. Ito, K. Minami and J. Shirakashi
- Organizer
  2nd International Conference on Applied Surface Science (ICASS 2017), June 12-15, 2017, Dalian, China.
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H03970
[Presentation] Optimization of Experimental Parameters for Fabrication of Atomic Junctions Using Ground-State Searches of Ising Spin Computing2017
- Author(s)
  S. Sakai, Y. Iwata, Y. Katogi, M. Shiomura, Y. Kihara, M. Ito and J. Shirakashi
- Organizer
  17th IEEE International Conference on Nanotechnology (IEEE NANO 2017), July 25-28, 2017, Pittsburgh, PA, USA.
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H03970
[Presentation] Intelligent Control Approach of Quantized Conductance of Au Atomic Junctions Formed by Feedback-Controlled Electromigration2017
- Author(s)
  Y. Iwata, Y. Katogi, N. Numakura, S. Sakai and J. Shirakashi
- Organizer
  2nd International Conference on Applied Surface Science (ICASS 2017)
- Place of Presentation
  Dalian, China.
- Year and Date
  2017-06-12
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K13333
[Presentation] Optimization of Experimental Parameters for Fabrication of Atomic Junctions Using Ground-State Searches of Ising Spin Computing2017
- Author(s)
  S. Sakai, Y. Iwata, Y. Katogi, M. Shiomura, Y. Kihara, M. Ito and J. Shirakashi
- Organizer
  17th IEEE International Conference on Nanotechnology (IEEE NANO 2017)
- Place of Presentation
  Pittsburgh, PA, USA.
- Year and Date
  2017-07-25
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K13333
[Presentation] リアルタイムOSを用いたFCE法によるAu原子接合での制御パラメータの自律設定手法2017
- Author(s)
  岩田侑馬、加藤木悠、沼倉憲彬、酒井正太郎、白樫淳一
- Organizer
  第64回応用物理学会春季学術講演会
- Place of Presentation
  パシフィコ横浜、神奈川
- Data Source
  KAKENHI-PROJECT-15K13333
[Presentation] Local Joule Heating in Electromigrated Au Nanowires Imaged by In Situ Atomic Force Microscopy2017
- Author(s)
  M. Yagi and J. Shirakashi
- Organizer
  12th IEEE Nanotechnology Materials and Devices Conference (NMDC 2017), October 2-4, 2017, Singapore.
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H03970
[Presentation] Controlled Electromigration Method for the Fabrication of Nanoscale Junction Devices2016
- Author(s)
  J. Shirakashi
- Organizer
  Emerging Technologies 2016
- Place of Presentation
  Montreal, QC, Canada.
- Year and Date
  2016-05-25
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H03970
[Presentation] Time-Deterministic Control of Quantized Conductance of Au Nanowires Using Feedback-Controlled Electromigration with Real-Time Operating System2016
- Author(s)
  S. Sato, Y. Kanamaru, Y. Katogi and J. Shirakashi
- Organizer
  43rd International Conference on the Physics and Chemistry of Surfaces and Interfaces (PCSI-43)
- Place of Presentation
  Palm Springs, CA, USA.
- Year and Date
  2016-01-17
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K13333
[Presentation] Feedback-Controlled Electromigration (FCE) Method with Automatically Optimized Parameters2016
- Author(s)
  N. Numakura, Y. Iwata and J. Shirakashi
- Organizer
  Pacific Rim Symposium on Surfaces, Coatings and Interfaces (PacSurf 2016)
- Place of Presentation
  Hawaii, USA.
- Year and Date
  2016-12-11
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H03970
[Presentation] Channel Conductance of Au Nanowires Tuned by Ultrafast Electromigration Using a Field-Programmable Gate Array2015
- Author(s)
  Y. Katogi, Y. Kanamaru, S. Sato and J. Shirakashi
- Organizer
  10th International Conference on Surfaces, Coatings and Nanostructured Materials (NANOSMAT 2015)
- Place of Presentation
  Manchester, UK.
- Year and Date
  2015-09-13
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H03970
[Presentation] Thin Film Deposition Based on Reduction Effect of Ballistic Hot Electrons2015
- Author(s)
  N. Koshida, R. Suda, M. Yagi, N. Mori , and J. Shirakashi
- Organizer
  Int. Conf. on Nanotechnol., Nanomater. & Thin Films for Energy Applications
- Place of Presentation
  Manchester, UK
- Year and Date
  2015-06-02
- Data Source
  KAKENHI-PROJECT-24246053
[Presentation] Tuning of Channel Conductance of Au Nanowires Using Ultrafast Electromigration Controlled by a Field-Programmable Gate Array2015
- Author(s)
  Y. Katogi, Y. Kanamaru, S. Sato, T. Saito and J. Shirakashi
- Organizer
  5th International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO 2015)
- Place of Presentation
  Changchun, China.
- Year and Date
  2015-10-05
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H03970
[Presentation] Precise Tuning of Electrical Properties of Nanogap-Based Single-Electron Transistors Using Field-Emission-Induced Electromigration Method2015
- Author(s)
  M. Kase, K. Okada, K. Morihara and J. Shirakashi
- Organizer
  10th International Conference on Surfaces, Coatings and Nanostructured Materials (NANOSMAT 2015)
- Place of Presentation
  Manchester, UK.
- Year and Date
  2015-09-13
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K13333
[Presentation] ナノシリコン弾道電子源を用いたCu薄膜のプリンティング堆積2015
- Author(s)
  須田隆太郎、八木麻実子、小島明、Romain Mentek、白樫淳一、越田信義
- Organizer
  応用物理学会
- Place of Presentation
  東海大学（神奈川県平塚市）
- Year and Date
  2015-03-11
- Data Source
  KAKENHI-PROJECT-24246053
[Presentation] Functional applications of nanostructured silicon2015
- Author(s)
  N. Koshida, R. Mentek, A. Kojima, N. Ikegami, R. Suda, M. Yagi, N. Mori, and J. Shirakashi
- Organizer
  2015 Collaborative Conf. on 3D and Mater. Res.
- Place of Presentation
  Busan, Korea
- Year and Date
  2015-06-16
- Invited
- Data Source
  KAKENHI-PROJECT-24246053
[Presentation] Field-Emission-Induced Electromigration Method for Precise Tuning of Electrical Properties of Ni-Based Single-Electron Transistors2015
- Author(s)
  M. Ito, M. Kase, K. Okada and J. Shirakashi
- Organizer
  5th International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO 2015)
- Place of Presentation
  Changchun, China.
- Year and Date
  2015-10-05
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K13333
[Presentation] Low-Temperature Deposition of Thin Si, Ge, and SiGe Films Using Reducing Activity of Ballistic Hot Electrons2014
- Author(s)
  N. Koshida, R. Suda, M. Yagi, A. Kojima, R. Mentek, B. Gelloz, N. Mori, and J. Shirakashi
- Organizer
  Electrochem. Soc. Int. Symp. on SiGe, Ge, and Related Compounds: Materials, Processing, and Devices 6
- Place of Presentation
  Cancun, Mexico
- Year and Date
  2014-10-07
- Data Source
  KAKENHI-PROJECT-24246053
[Presentation] Deposition of Thin Si, Ge, and SiGe Films by Ballistic Electro-Reduction2014
- Author(s)
  N. Koshida, R. Suda, M. Yagi, A. Kojima, R. Mentek, B. Gelloz, N. Mori, and J. Shirakashi
- Organizer
  The 15th Int. Union of Mater. Res. Soc., Int. Conf. in Asia 2014
- Place of Presentation
  福岡大学（福岡市城南区）
- Year and Date
  2014-08-26
- Data Source
  KAKENHI-PROJECT-24246053
[Presentation] ナノギャップでの原子のマイグレーション現象により作製したNi系ナノスケールデバイス2014
- Author(s)
  須田隆太郎、伊藤光樹、森原康平、豊中貴大、滝川主喜、白樫淳一
- Organizer
  電子情報通信学会電子デバイス研究会（ED）/シリコン材料・デバイス研究会（SDM）「機能ナノデバイスおよび関連技術」
- Place of Presentation
  北海道大学
- Data Source
  KAKENHI-PROJECT-25630122
[Presentation] Deposition of thin Si, Ge, and SiGe films by ballistic hot electron reduction2014
- Author(s)
  M. Yagi, R. Suda, A. Kojima, R. Mentek, N. Mori, J. Shirakashi, and N. Koshida
- Organizer
  Int. Conf. Solid State Devices and Materials,
- Place of Presentation
  つくば国際会議場（茨城県つくば市）
- Year and Date
  2014-09-11
- Data Source
  KAKENHI-PROJECT-24246053
[Presentation] Ballistic hot electron effects in nanosilicon dots and their photonic applications2014
- Author(s)
  N. Koshida, N. Ikegami, A. Kojima, R. Mentek, R. Suda, M. Yagi, J. Shirakashi, B. Gelloz, and N. Mori
- Organizer
  Electrochem. Soc. Int. Symp. on Nanoscale Luminescent Materials 3
- Place of Presentation
  Orlando, USA
- Year and Date
  2014-05-12
- Invited
- Data Source
  KAKENHI-PROJECT-24246053
[Presentation] FPGAを用いた超高速フィードバック制御型エレクトロマイグレーション2014
- Author(s)
  金丸祐真、安藤昌澄、齋藤孝成、白樫淳一
- Organizer
  電子情報通信学会電子デバイス研究会（ED）/シリコン材料・デバイス研究会（SDM）「機能ナノデバイスおよび関連技術」
- Place of Presentation
  北海道大学
- Data Source
  KAKENHI-PROJECT-25630122
[Presentation] ナノシリコン弾道電子源を用いたⅣ族半導体薄膜の堆積2014
- Author(s)
  八木麻実子, 須田隆太郎, 小島明, M. Romain, 白樫淳一, 越田信義
- Organizer
  応用物理学会
- Place of Presentation
  北海道大学（札幌市北区）
- Year and Date
  2014-09-19
- Data Source
  KAKENHI-PROJECT-24246053
[Presentation] Nanoscale Mechanical Scratching of Graphene Using Scanning Probe Microscopy2013
- Author(s)
  R. Suda, T. Saito, A. A. Tseng and J. Shirakashi
- Organizer
  5th IEEE International Nanoelectronics Conference (INEC 2013)
- Place of Presentation
  Sentosa Island, Singapore
- Year and Date
  2013-01-03
- Data Source
  KAKENHI-PROJECT-24360117
[Presentation] Tuning of Resistance of Nanogaps Using Field-Emission-Induced Electromigration with Feedback Control Scheme2013
- Author(s)
  M. Ando, S. Akimoto, R. Suda and J. Shirakashi
- Organizer
  IEEE NANO 2013 (2013 IEEE International Conference on Nanotechnology)
- Place of Presentation
  Beijing, China
- Data Source
  KAKENHI-PROJECT-24360117
[Presentation] tic Electro-Deposition of Thin Si, Ge, and SiGe Films2013
- Author(s)
  R. Suda, M. Ito, M. Yagi, A. Kojima, R. Mentek, N. Mori, J. Shirakashi and N. Koshida
- Organizer
  2013 International Conference on Solid State Devices and Materials (SSDM 2013)
- Place of Presentation
  Fukuoka, Japan
- Data Source
  KAKENHI-PROJECT-25630122
[Presentation] Electrical Properties of Nanogap-Based Single-Electron Transistors Fabricated by Field-Emission-Induced Electromigration2013
- Author(s)
  R. Suda, S. Akimoto, K. Morihara and J. Shirakashi
- Organizer
  IEEE NANO 2013 (2013 IEEE International Conference on Nanotechnology)
- Place of Presentation
  Beijing, China
- Data Source
  KAKENHI-PROJECT-24360117
[Presentation] Electromigration-Based Fabrication Methods for Single-Electron Transistors2013
- Author(s)
  J. Shirakashi
- Organizer
  CMOS Emerging Technologies Research, 2013 Symposium
- Place of Presentation
  Whistler, BC, Canada
- Invited
- Data Source
  KAKENHI-PROJECT-24360117
[Presentation] In-Situ Control of Quantum Point Contacts Using Scanning Probe Microscopy Scratch Lithography2012
- Author(s)
  R. Suda, T. Ohyama, A. A. Tseng and J. Shirakashi
- Organizer
  IEEE NANO 2012 (12th International Conference on Nanotechnology)
- Place of Presentation
  Birmingham, UK.(招待講演)
- Year and Date
  2012-08-23
- Data Source
  KAKENHI-PROJECT-24360117
[Presentation] Investigation of Nanogap Formation Process Using Field-Emission-Induced Electromigration with Alternating Current Bias2012
- Author(s)
  M. Yagi, S. Akimoto, M. Ito and J. Shirakashi
- Organizer
  2012 International Conference on Nanoscience +Technology (ICN+T 2012)
- Place of Presentation
  Paris, France.
- Year and Date
  2012-07-25
- Data Source
  KAKENHI-PROJECT-24360117
[Presentation] Fabrication of Nanogaps Using Field-Emission-Induced Electromigration with Alternating Current Bias2011
- Author(s)
  M. Yagi, R. Suda, T. Watanabe and J. Shirakashi
- Organizer
  International Conference on Nanoscience and Technology, China 2011(ChinaNANO 2011)
- Place of Presentation
  Beijing, China
- Data Source
  KAKENHI-PROJECT-22651039
[Presentation] Simultaneous Tuning of Tunnel Resistance of Integrated Nanogaps by Field-Emission-Induced Electromigration2011
- Author(s)
  M.Ito, S.Ueno, T.Watanabe, S.Akimoto, J.Shirakashi
- Organizer
  The IEEE NANO 2011 Conference (11th International Conference on Nanotechnology)
- Place of Presentation
  Portland, OR, USA(招待講演)
- Data Source
  KAKENHI-PROJECT-22651039
[Presentation] Field-Emission-Induced Electromigration Method for the Integration of Single-Electron Transistors2010
- Author(s)
  S.Ueno, Y.Tomoda, W.Kume, M.Hanada, K.Takiya, J.Shirakashi
- Organizer
  International Conference on Nanoscience and Technology (ICN+T 2010)
- Place of Presentation
  Beijing, China.
- Data Source
  KAKENHI-PROJECT-20360136
[Presentation] A Newly Investigated Approach for the Control of Tunnel Resistance of Nanogaps Using Field-Emission-Induced Electromigration2010
- Author(s)
  K. Takiya, Y. Tomoda, W. Kume, S. Ueno, T. Watanabe and J. Shirakashi
- Organizer
  International Conference on Nanoscience and Technology(ICN-T 2010)
- Place of Presentation
  Beijing, China
- Data Source
  KAKENHI-PROJECT-22651039
[Presentation] Fabrication of Planar-Type Ni/Vacuum/Ni Tunnel Junctions Based on Ferromagnetic Nanogaps Using Field-Emission-Induced Electromigration2010
- Author(s)
  K.Takiya, T.Watanabe, J.Shirakashi
- Organizer
  55th Annual Conference on Magnetism and Magnetic Materials (MMM-2010)
- Place of Presentation
  Atlanta, GA, USA
- Data Source
  KAKENHI-PROJECT-22651039
[Presentation] Integration of Single-Electron Transistors Using Field-Emission-Induced Electromigration2010
- Author(s)
  S. Ueno, Y. Tomoda, W. Kume, M. Hanada, K. Takiya and J. Shirakashi
- Organizer
  10th International Conference on Nanotechnology(IEEE NANO 2010)-Joint Symposium with NANO KOREA 2010
- Place of Presentation
  Seoul, Korea
- Data Source
  KAKENHI-PROJECT-22651039
[Presentation] Fabrication of Planar-Type Ni/Vacuum/Ni Tunnel Junctions Based on Ferromagnetic Nanogaps Using Field-Emission-Induced Electromigration2010
- Author(s)
  K. Takiya, T. Watanabe and J. Shirakashi
- Organizer
  55th Annual Conference on Magnetism and Magnetic Materials(MMM-2010)
- Place of Presentation
  Atlanta, GA, USA
- Data Source
  KAKENHI-PROJECT-22651039
[Presentation] Tuning of Tunnel Resistance of Nanogaps by Field-Emission-Induced Electromigration Using Current Source Mode2010
- Author(s)
  K. Takiya, Y. Tomoda, W. Kume, S. Ueno, T. Watanabe and J. Shirakashi
- Organizer
  10th International Conference on Nanotechnology(IEEE NANO 2010)-Joint Symposium with NANO KOREA 2010
- Place of Presentation
  Seoul, Korea
- Data Source
  KAKENHI-PROJECT-22651039
[Presentation] Field-Emission-Induced Electromigration Method for the Integration of Single-Electron Transistors2010
- Author(s)
  S.Ueno, Y.Tomoda, W.Kume, M.Hanada, K.Takiya J.Shirakashi
- Organizer
  International Conference on Nanoscience and Technology(ICN+T 2010)
- Place of Presentation
  Beijing, China
- Data Source
  KAKENHI-PROJECT-20360136
[Presentation] Magnetoresistance Properties of Planar-Type Tunnel Junctions with Ferromagnetic Nanogap System Fabricated by Electromigration Method2009
- Author(s)
  J.Shirakashi
- Organizer
  International Magnetics Conference 2009
- Place of Presentation
  Sacramento, USA
- Year and Date
  2009-05-07
- Data Source
  KAKENHI-PROJECT-18063007
[Presentation] Constriction of Ferromagnetic Patterned Thin Film by Scratch Process Using Atomic Force Microscope(Invited)2009
- Author(s)
  J.Shirakashi
- Organizer
  International Conference on Composites/Nano Engineering
- Place of Presentation
  Honolulu, USA
- Year and Date
  2009-07-26
- Data Source
  KAKENHI-PROJECT-18063007
[Presentation] Fabrication of Single-Electron Transistors Using Field-Emission-Induced Electromigration2009
- Author(s)
  W.Kume, Y.Tomoda, M.Hanada, J.Shirakashi
- Organizer
  International Conference on Nanoscience and Technology China 2009 (ChinaNANO 2009)
- Place of Presentation
  Beijing, China
- Data Source
  KAKENHI-PROJECT-20360136
[Presentation] Fabrication of Single-Electron Transistors Using Field-Emission-Induced Electro- migration2009
- Author(s)
  W.Kume, Y.Tomoda, M.Hanada, J.Shirakashi
- Organizer
  International Conference on Nanoscience and Technology China 2009 (ChinaNANO 2009)
- Place of Presentation
  Beijing, China.
- Data Source
  KAKENHI-PROJECT-20360136
[Presentation] Fabrication of Single-Electron Transistors Using Field-Emission-Induced Electromigration2009
- Author(s)
  W.Kume, Y.Tomoda, M.Hanada, J.Shirakashi
- Organizer
  Int.Conf.on Nanosci.and Technol.
- Place of Presentation
  Beijing, China
- Year and Date
  2009-09-02
- Data Source
  KAKENHI-PROJECT-18063007
[Presentation] Fabrication of Nanogap Electrodes by Field-Emission-Induced Electromigration2008
- Author(s)
  Y. Tomoda, K. Takahashi, M. Hanada, W. Kume, J. Shirakashi
- Organizer
  The 2008 International Conference on Nanoscience +Technology (ICN+T 2008)
- Place of Presentation
  Keystone, CO, USA
- Data Source
  KAKENHI-PROJECT-20360136
[Presentation] Fabrication of Nanogap Electrodes by Field-Emission-Induced Electromigration2008
- Author(s)
  Y.Tomoda, K.Takahashi, M.Hanada, W.Kume, J.Shirakashi
- Organizer
  The 2008 International Conference on Nanoscience + Technology (ICN+T 2008)
- Place of Presentation
  Keystone, CO, USA.
- Data Source
  KAKENHI-PROJECT-20360136
[Presentation] Control of Tunnel Resistance of Suspended Ni Nanogaps Using Field-Emission-Induced Electromigration
- Author(s)
  T. Toyonaka, R. Suda, M. Ito, K. Takikawa and J. Shirakashi
- Organizer
  2014 International Conference on Nanoscience + Technology (ICN+T 2014)
- Place of Presentation
  Vail, Colorado, USA.
- Year and Date
  2014-07-20 – 2014-07-25
- Data Source
  KAKENHI-PROJECT-25630122
[Presentation] A Fully Customized Hardware System for Ultra-Fast Feedback-Controlled Electromigration Using FPGA
- Author(s)
  Y. Kanamaru, M. Ando, R. Suda and J. Shirakashi
- Organizer
  IEEE NANO 2014 (2014 IEEE International Conference on Nanotechnology)
- Place of Presentation
  Toronto, ON, Canada.
- Year and Date
  2014-08-18 – 2014-08-21
- Data Source
  KAKENHI-PROJECT-24360117
[Presentation] Investigation of Nanogap Formation Process Using Field-Emission-Induced Electromigration with Alternating Current Bias
- Author(s)
  M. Yagi, S. Akimoto, M. Ito and J. Shirakashi
- Organizer
  2012 International Conference on Nanoscience + Technology
- Place of Presentation
  Paris, France
- Data Source
  KAKENHI-PROJECT-24246053
[Presentation] Simultaneous Fabrication of Nanogaps Using Field-Emission-Induced Electromigration
- Author(s)
  M. Ito, M. Yagi, K. Morihara and J. Shirakashi
- Organizer
  4th International Conference on Manipulation, Manu-facturing and Measurement on the Nanoscale (3M-NANO 2014)
- Place of Presentation
  Taipei, Taiwan.
- Year and Date
  2014-10-27 – 2014-10-31
- Data Source
  KAKENHI-PROJECT-24360117
[Presentation] Nanoscale Mechanical Scratching of Graphene Using Scanning Probe Microscopy
- Author(s)
  R. Suda, T. Saito, A. A. Tseng and J. Shirakashi
- Organizer
  5th IEEE International Nanoelectronics Conference
- Place of Presentation
  Sentosa Island, Singapore
- Data Source
  KAKENHI-PROJECT-24246053
[Presentation] Ultra-Fast Feedback-Controlled Electromigration Using FPGA
- Author(s)
  Y. Kanamaru, M. Ando, R. Suda and J. Shirakashi
- Organizer
  2014 International Conference on Nanoscience + Technology (ICN+T 2014)
- Place of Presentation
  Vail, Colorado, USA.
- Year and Date
  2014-07-20 – 2014-07-25
- Data Source
  KAKENHI-PROJECT-25630122
[Presentation] Structural Tuning of Nanogaps Using Field-Emission-Induced Electromigration with Bipolar Biasing
- Author(s)
  M. Yagi, M. Ito and J. Shirakashi
- Organizer
  4th International Conference on Manipulation, Manu-facturing and Measurement on the Nanoscale (3M-NANO 2014)
- Place of Presentation
  Taipei, Taiwan.
- Year and Date
  2014-10-27 – 2014-10-31
- Invited
- Data Source
  KAKENHI-PROJECT-24360117
[Presentation] ナノシリコン弾道電子源を用いたSi, Ge, SiGe薄膜の堆積
- Author(s)
  須田隆太郎，八木麻実子，小島明，Mentek Romain，白樫淳一，越田信義
- Organizer
  応用物理学会
- Place of Presentation
  青山学院大学、相模原
- Data Source
  KAKENHI-PROJECT-24246053
[Presentation] 弾道電子の直接還元効果を用いた半導体薄膜堆積
- Author(s)
  伊藤光樹，須田隆太郎，八木麻実子，小島明, Romain Mentek,白樫淳一，越田信義
- Organizer
  応用物理学会
- Place of Presentation
  同志社大学、京都
- Data Source
  KAKENHI-PROJECT-24246053
[Presentation] Resistive Switching Effects in Electromigrated Ni Nanogaps
- Author(s)
  K. Takikawa, R. Suda, M. Ito, T. Toyonaka and J. Shirakashi
- Organizer
  IEEE NANO 2014 (2014 IEEE International Conference on Nanotechnology)
- Place of Presentation
  Toronto, ON, Canada.
- Year and Date
  2014-08-18 – 2014-08-21
- Data Source
  KAKENHI-PROJECT-24360117
[Presentation] Fabrication of Resistive Switching Devices Based on Ni Nanogaps Using Field-Emission-Induced Electromigration
- Author(s)
  K. Takikawa, R. Suda, M. Ito, T. Toyonaka and J. Shirakashi
- Organizer
  2014 International Conference on Nanoscience + Technology (ICN+T 2014)
- Place of Presentation
  Vail, Colorado, USA.
- Year and Date
  2014-07-20 – 2014-07-25
- Data Source
  KAKENHI-PROJECT-25630122
[Presentation] Ballistic electro-deposion of thin Si, Ge, and SiGe films
- Author(s)
  R. Suda, M. Ito, M.Yagi, A. Kojima, R. Mentek, N. Mori, J. Shirakashi, and N. Koshida
- Organizer
  Int. Conf. Solid State Devices and Materials
- Place of Presentation
  Hilton Fukuoka Sea Hawk, Fukuoka, Japan
- Data Source
  KAKENHI-PROJECT-24246053
[Presentation] In-Situ Control of Quantum Point Contacts Using Scanning Probe Microscopy Scratch Lithography
- Author(s)
  R. Suda, T. Ohyama, A. A. Tseng and J. Shirakashi
- Organizer
  IEEE NANO 2012 (12th International Conference on Nanotechnology
- Place of Presentation
  Birmingham, UK
- Invited
- Data Source
  KAKENHI-PROJECT-24246053
[Presentation] Applications of Nanosilicon Ballistic Electron Emitter to Nanofabrication Process
- Author(s)
  N. Koshida, R. Suda, M. Yagi, J. Shirakashi, A. Kojima, N. Ikegami, T. Yoshida, H. Miyaguchi, M. Muroyama, S. Yoshida, K. Totsu, and M. Esashi
- Organizer
  Int. IEEE Conf. on Nanotechnology
- Place of Presentation
  Rome, Italy
- Year and Date
  2015-07-27 – 2015-07-31
- Invited
- Data Source
  KAKENHI-PROJECT-24246053
[Presentation] ナノシリコン弾道電子源の還元効果によるSi 薄膜堆積
- Author(s)
  須田隆太郎, 伊藤光樹, 小島明, 白樫淳一，越田信義
- Organizer
  第60 回応用物理学会春季学術講演会
- Place of Presentation
  神奈川工科大学、神奈川
- Data Source
  KAKENHI-PROJECT-24246053

1. TAKEMURA Yasushi (30251763)

# of Collaborated Projects: 4 results

# of Collaborated Products: 0 results
2. KOSHIDA Nobuyoshi (50143631)

# of Collaborated Projects: 2 results

# of Collaborated Products: 17 results
3. GELLOZ Bernard (40343157)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
4. BERNAD GELLOZ

# of Collaborated Projects: 0 results

# of Collaborated Products: 1 results

SHIRAKASHI Jun-ichi 白樫 淳一

SHIRAKASHI Junichi 白樫 淳一

自樫 淳一 シラカシ ジュンイチ

Research Projects

Research Products

Co-Researchers

Application of Electromigrated Au Nanogaps to Artificial Synaptic Devices and Physical Reservoir ComputingPrincipal Investigator

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Fabrication of Au Atomic Junctions Using Artificial Intelligence Implemented on FPGAPrincipal Investigator

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Time-Deterministic Control of Quantized Conductance of Au Nanowires Using Feedback-Controlled Electromigration with Real-Time Operating SystemPrincipal Investigator

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Investigation of Au Atomic Junctions Using Ultrafast Electromigration Controlled by a Field-Programmable Gate ArrayPrincipal Investigator

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STRUCTURAL TUNING OF NANOGAPS USING FIELD-EMISSION-INDUCED ELECTROMIGRATIONPrincipal Investigator

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Thin film deposition based on reducing activity of nanosiicon ballistic electron emitter

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INTEGRATION OF FERROMAGNETIC SINGLE-ELECTRON TRANSISTORS USING ELECTROMIGRATION METHODSPrincipal Investigator

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CONTROL OF STRUCTURAL AND ELECTRICAL PROPERTIES OF NANOGAPS USING FIELD-EMISSION-INDUCED ELECTROMIGRATIONPrincipal Investigator

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STUDY OF FERROMAGNETIC SINGLE-ELECTRON TRANSISTORS CONTROLLED BY GATE ELECTRIC FIELDSPrincipal Investigator

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Control of physical properties induced in silicon nanostructure and device applications

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トンネル磁気抵抗変調型強磁性単電子トランジスタメモリー技術の研究開発Principal Investigator

Principal Investigator

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プレーナ型集積磁気メモリの設計試作と帯電効果による機能向上の探求

Principal Investigator

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Research Institution

強磁性単電子トランジスタ技術の研究開発Principal Investigator

Principal Investigator

SHIRAKASHI Jun-ichi 白樫淳一

SHIRAKASHI Junichi 白樫淳一

自樫淳一シラカシジュンイチ