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Nishikawa Osamu  西川 治

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NISHIKAWA Osamu  西川 治

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Researcher Number 10108235
External Links
Affiliation (Current) 2025: 金沢工業大学, 公私立大学の部局等, 名誉教授
Affiliation (based on the past Project Information) *help 2015: 金沢工業大学, 産学連携室, 教授
2008: 金沢工業大学, バイオ・化学部, 教授
2008: 金沢工業大学, バイオ・科学部, 教授
2004 – 2007: 金沢工業大学, 環境・建築学部, 教授
2001 – 2003: 金沢工業大学, 工学部, 教授 … More
1992 – 1999: Kanazawa Inst. Technology, Dept. of Electrical Engineering Professor, 工学部, 教授
1996: Kanazawa Institute of Technology, Faculty of Engineering, Professor, 工学郡, 教授
1991: Tokyo Inst. Technol., Mat. Sci. Eng., Professor, 大学院総合理I学研究科, 教授
1991: Tokyo Inst. Technol., Mat, Sci. Eng., Professor, 大学院総合理工学研究所, 教授
1990 – 1991: Tokyo Inst. Technol., Mat. Sci. Eng., Professor, 大学院・総合理工学研究科, 教授
1987 – 1991: 東京工業大学, 総合理工学研究科, 教授
1986 – 1991: 東京工業大学, 大学院総合理工学研究科, 教授
1990: 東京工業大学. 大学院総合理工学研究科, 教授
1989: 東京工業大学, 大学院総合理工学研究所, 教授
1986: 東京工大, 国立大学(その他), 教授
1985: 東京工業大学, 国立大(その他), 教授 Less
Review Section/Research Field
Principal Investigator
Applied materials / Physical properties of metals / 表面界面物性 / 物理計測・光学
Except Principal Investigator
Nanostructural science / Nanomaterials/Nanobioscience / Inorganic chemistry / 物質生物化学 / Applied materials / 固体物性
Keywords
Principal Investigator
走査型トンネル顕微鏡(STM) / 電界イオン顕微鏡(FIM) / 電界放射顕微鏡(FEM) / トンネル物性 / 高温超電導セラミックス / GaP / GaAs / クラスターイオン / アトムプローブ(A-P) / 電界蒸発 … More / アトムプロ-ブ(AーP) / F-N plot / 走査型トンネル顕微鏡 / 走査型アトムプローブ(SAP) / atom manipulation / field emission electron spectroscopy (FEES) / atom probe (AP) / scanning tunneling microscope (STM) / field emission microscope (FEM) / 原子間力顕微鏡(AFM) / 電界放射 / Surface / Tip Apex / He準安定原子線 / シリコン / パルスレーザー / アトムプローブ / 走査型トンネル電子分光法(STS) / 表面の電子状態 / 原子プローブ(AーP) / 走査型トンネル電子分光(STS) / High Temperature Superconducting Ceramics / Doopants / Oxidation Process of Polymers / Metal-Polymer Interfaces / Polypyrrole / Conducting Polymers / Atom-Probe / ドーパント / 高分子の酸化過程 / 金属-高分子界面 / ポリピロール / 電導性高分子 / 電歪素子 / 圧電素子 / 走査型トンネル電子顕微鏡(STM) / Al-GaAs interface / Pulsed-laser / Combined atom-probe / 金属-化合物半導体界面 / Al-GaAs界面 / 複合型アトムプローブ / Graphite / Silicon / CVD & HPHT Diamonds / Carbon Clusters / Carbon Nano-Tubes / Photo-Stimulated Field Emission / Scanning Atom Probe (SAP) / マススペクトル / ダイヤモンド / 電子のトンネル / 走査型アトムプローブ / ガラス状炭素 / HPHTダイヤモンド / CVDダイヤモンド / グラファイト / クラスター / 光励起電界放射 / カーボンナノチューブ(CNT) / CVDとHPHTダイヤモンド / scanning tunneling spectroscopy (STS) / electron spectroscopy / field ion microscope (FIM) / トンネル確率 / イメイジングプレイド(IP) / 原子移動 / (N11)GaAS / フタロシアニン / STS) / 分光(STM / 混晶半導体ナノ構造 / Si(001)表面ステップ / 電界放射電子のエネルギー分布 / イメイジングプレイト(IP) / Scanning tunneling spectroscopy (STS) / atomic force microscope (AFM) / fiel ion microscope (FIM) / 表面トポグラフ / サテライト研究会 / 電子分光法 / トンネル顕微鏡法 / 個々の原子 / 合同研究会 / 国際コロキュウム / シンポジウム / 表面原子の配列 / アトムプローブ(AP) / 走査型プローブ顕微鏡 / SPM / STM / Vacuum Gauge / Imaging Faraday Cage / Ultra-High Vacuum / Field Emission Microsocpe (FEM) / Field Emission / 映像型ファラディ-ケイジ / 電界放射型極高真空計 / 極高真空 / Field Emission Electron Spectrometer (FEES) / Scanning Tunneling Spectroscopy (STS) / Si cluster / Atom-Probe (A-P) / Scanning Tunneling Microscope (STM) / 電流映像型トンネル電子分光法(CITS) / 走査探針先端 / 二極走査型トンネル映像法(DPTI) / 電子の状態密度 / STM・A-P複合器 / アトムプロ-ブ(A-P) / 位置感知型AーP / 電界放射電子分光器(FEES) / STM・AーP複合器 / K+O共吸収系 / Cs@Si(111)とK@Si(100)吸着系 / 分子線 / ペニングイオン化電子分光 / 再配列構造 / Si(111) / 電子分光 / ペニングイオン化 / パルスレーザー光照射 / 原子プローブ(A-P) / Si / 点状イオン源 / 同軸型直衝突イオン散乱分光(CAICISS) / ペニングイオン電子分光法 / 表面構造 / イオンビーム散乱 / 電子励起イオン脱離(EDS) / 半導体 / 生体分子 … More
Except Principal Investigator
STM / 走査型トンネル顕微鏡 / 表面エレクトロマイグレーション / 走査型アトムプローブ / 反射電顕法 / 光電子顕微鏡 / 表面顕微鏡 / 固体表面 / 生体分子 / アトムプローブ / 反応性表面 / アミノ酸 / 炭素材料 / 酸化チタン / 光励起触媒 / シリコン表面 / 表面電子構造 / 表面顕微鏡法 / 電界蒸発 / 質量分析 / Polythiophene / Photo-stimulated Catalysis / Tetra-butyl-ammonium / Crystal Violet / Silicon / Carbon Nano Tube / Titanium Oxide / Scanning Atom Probe / 水素濃度 / シリコン / 酸化物光触媒 / 導電性高分子 / ナノチューブ / 機能性電子材料 / 分子内の結合状態 / ポリチオフェン / テトラブチルアンモニウム / クリスタルヴァイオレット / フラグメントイオン / 有機分子 / ダイヤモンド / 炭素材料シリコン / helicene / thin film / molecular recognition / optical activity / molecular chirality / gold surface / solid surface / scanning tunneling microscopy / 不斉識別 / ヘリセン / 有機超薄膜 / 分子認識 / 不斉 / キラリティ / 金表面 / Tabacco Mosasic Virus / Bacteriophage T4 / Clean and Well defined Conditions / Interacting Biological Molecular Systems / Tunneling Property / Scanning Tunneling Microscope / 生体分子のトンネル物性 / 生体用走査型トンネル顕微鏡 / バイオSTM / 生物試料 / バクテリオファージ / タバコモザイクウイルス / バクテリオファージT4 / 清浄定質ふん囲気 / 生体分子相互作用系 / トンネル物性 / Scanning Tip Apex / Field Emission Electron Spectroscopy (FEES) / Atom-Probe Field Ion Microscope (A-P FIM) / Scanning Tunneling Microscope (STM) / Scanning Tunneling Spectroscopy (STS) / Scanning X Microscope (SXM) / 原子間力顕微鏡 / 位置検出型アトムプロ-ブ / 走査探針 / 電界放射分光法 / アトムプロ-ブ・電界イオン顕微鏡 / 走査型トンネル分光法 / 走査型探索顕微鏡 / Si(001)2X1 / 高温超伝導体 / Si(111)7X7 / FIM / 透過電顕法 / 計算機実験 / 短距離秩序 / 電界イオン顕微鏡 / 走査トンネル顕微鏡 / RHEED / アルカリ原子吸着系 / 高分解能EELS / 低温表面 / 光プローブ / 原子プローブ / 電子プローブ / 表面新物質相 / ケクレン / 水素終端 / 層状酸化物 / 光触媒 / クラスターイオン / グラファイトナノファイバー / カーボンナノチューブ / 金属表面 / 表面物性 / 表面構造 / 吸着表面 / 清浄表面 / 微粒子 / エレクトロマイグレ-ション / 反射高速電子尾回折 / 走査トンネル顕微鏡法 / 超高真空反射電子顕微鏡法 / 半導体表面電流効果 / ビーム相互作用表面 Less
  • Research Projects

    (29 results)
  • Research Products

    (64 results)
  • Co-Researchers

    (38 People)
  •  Development of scanning atom probe technique for small molecular systems and its application for biomolecules

    • Principal Investigator
      TANIGUCHI Masahiro
    • Project Period (FY)
      2012 – 2015
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Nanomaterials/Nanobioscience
    • Research Institution
      Kanazawa Institute of Technology
  •  Scanning atom probe analyses of photocatalytic decomposition process of organic molecules on titanium oxide surface

    • Principal Investigator
      TANIGUCHI Masahiro
    • Project Period (FY)
      2006 – 2008
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Nanostructural science
    • Research Institution
      Kanazawa Institute of Technology
  •  Atomic Level Analysis of Advanced Electronic Materials by the Scanning Atom Probe

    • Principal Investigator
      TANIGUCHI Masahiro
    • Project Period (FY)
      2003 – 2005
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Nanostructural science
    • Research Institution
      KANAZAWA INSTITUTE OF TECHNOLOGY
  •  Direct observation of molecular chirality and molecular reaction on solid surface

    • Principal Investigator
      TANIGUCHI Masahiro
    • Project Period (FY)
      2001 – 2002
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Inorganic chemistry
    • Research Institution
      Kanazawa Institute of Technology
  •  TUNNELING CHARACTERISCITCS OF INDIVIDUAL SURFACE ATOMSPrincipal Investigator

    • Principal Investigator
      NISHIKAWA Osamu
    • Project Period (FY)
      1997
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Kanazawa Institute of Technology
  •  Atomic Level Study of Photo-Stimulated Field Emission from Insulating Thin Layers Utilizing the Scanning Atom ProbePrincipal Investigator

    • Principal Investigator
      NISHIKAWA Osamu
    • Project Period (FY)
      1997 – 1999
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      表面界面物性
    • Research Institution
      Kanazawa Institute of Technology
  •  ATOM MAMIPULATION AND EVALUATION OF PROBING TIPSPrincipal Investigator

    • Principal Investigator
      NISHIKAWA Osamu
    • Project Period (FY)
      1993 – 1996
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      KANAZAWA INSTITUTE OF TECHNOLOGY
  •  個々の原子のトンネル物性Principal Investigator

    • Principal Investigator
      西川 治
    • Project Period (FY)
      1992
    • Research Category
      Grant-in-Aid for Co-operative Research (B)
    • Research Field
      Applied materials
    • Research Institution
      Kanazawa Institute of Technology
  •  個々の原子のトンネル物性Principal Investigator

    • Principal Investigator
      西川 治
    • Project Period (FY)
      1991
    • Research Category
      Grant-in-Aid for Co-operative Research (B)
    • Research Field
      Applied materials
    • Research Institution
      Tokyo Institute of Technology
  •  表面新物質相

    • Principal Investigator
      吉森 昭夫
    • Project Period (FY)
      1990
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Osaka University
  •  Development of Preparation Methods of SXM Tips with a Ultra-fine Probing Area

    • Principal Investigator
      TOMITORI Masahiko
    • Project Period (FY)
      1990 – 1991
    • Research Category
      Grant-in-Aid for Developmental Scientific Research (B)
    • Research Field
      Applied materials
    • Research Institution
      Tokyo Institute of Technology
  •  Development of Field Emission Type Ultra-High Vacuum GaugePrincipal Investigator

    • Principal Investigator
      NISHIKAWA Osamu
    • Project Period (FY)
      1990 – 1991
    • Research Category
      Grant-in-Aid for Developmental Scientific Research (B)
    • Research Field
      物理計測・光学
    • Research Institution
      Tokyo Institute of Technology
  •  Construction of Scanning Tunneling Microscope for the Study of Interacting Biological Molecualr Systems and their Preparation

    • Principal Investigator
      IKAI Atsushi
    • Project Period (FY)
      1990 – 1992
    • Research Category
      Grant-in-Aid for Developmental Scientific Research (B)
    • Research Field
      物質生物化学
    • Research Institution
      Tokyo Institute of Technology
  •  個々の原子のトンネル物性Principal Investigator

    • Principal Investigator
      西川 治
    • Project Period (FY)
      1989
    • Research Category
      Grant-in-Aid for Co-operative Research (B)
    • Research Field
      Applied materials
    • Research Institution
      Tokyo Institute of Technology
  •  原子プローブ:レーザー誘起電界蒸発等による表面研究Principal Investigator

    • Principal Investigator
      西川 治
    • Project Period (FY)
      1989
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Tokyo Institute of Technology
  •  「表面新物質相」の総括評価

    • Principal Investigator
      吉森 昭夫
    • Project Period (FY)
      1989
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Osaka University
  •  表面顕微鏡法による表面観察と解析

    • Principal Investigator
      八木 克道
    • Project Period (FY)
      1989
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Tokyo Institute of Technology
  •  Ultra-Fine Surface Analysis by a Combined Instrument of an STM and A-PPrincipal Investigator

    • Principal Investigator
      NISHIKAWA Osamu
    • Project Period (FY)
      1989 – 1990
    • Research Category
      Grant-in-Aid for General Scientific Research (B)
    • Research Field
      Physical properties of metals
    • Research Institution
      Tokyo Institute of Technology
  •  「表面新物質相」の総括評価

    • Principal Investigator
      吉森 昭夫
    • Project Period (FY)
      1988
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Osaka University
  •  表面顕微鏡法による表面の観察と解析

    • Principal Investigator
      八木 克道
    • Project Period (FY)
      1988
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Tokyo Institute of Technology
  •  原子プローブ:レーザー誘起電界蒸発などによる表面研究Principal Investigator

    • Principal Investigator
      西川 治
    • Project Period (FY)
      1987
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Tokyo Institute of Technology
  •  「表面新物質相」の総括評価

    • Principal Investigator
      吉森 昭夫
    • Project Period (FY)
      1987
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Osaka University
  •  表面顕微鏡法による表面の観察と解析

    • Principal Investigator
      八木 克道
    • Project Period (FY)
      1987
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Tokyo Institute of Technology
  •  原子プローブ:レーザー誘起電界蒸発などによる表面研究Principal Investigator

    • Principal Investigator
      西川 治
    • Project Period (FY)
      1987 – 1989
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Tokyo Institute of Technology
  •  重点領域研究「表面新物質相」の企画

    • Principal Investigator
      吉森 昭夫
    • Project Period (FY)
      1986
    • Research Category
      Grant-in-Aid for Co-operative Research (B)
    • Research Field
      固体物性
    • Research Institution
      Osaka University
  •  パルスレーザー光照射型点状イオン源の開発Principal Investigator

    • Principal Investigator
      西川 治
    • Project Period (FY)
      1986
    • Research Category
      Grant-in-Aid for Developmental Scientific Research
    • Research Field
      Applied materials
    • Research Institution
      Tokyo Institute of Technology
  •  Ultramicroanalysis of Conducting Polymers with Atom-ProbePrincipal Investigator

    • Principal Investigator
      NISHIKAWA Osamu
    • Project Period (FY)
      1986 – 1987
    • Research Category
      Grant-in-Aid for General Scientific Research (B)
    • Research Field
      Applied materials
    • Research Institution
      Tokyo Institute of Technology
  •  Ultra-Microscopic Analysis of Metal-Compound Semiconductor Interfaces by the Atom-Probe Mass AnalyzerPrincipal Investigator

    • Principal Investigator
      NISHIKAWA Osamu
    • Project Period (FY)
      1984 – 1985
    • Research Category
      Grant-in-Aid for General Scientific Research (A)
    • Research Field
      Physical properties of metals
    • Research Institution
      Tokyo Institute of Technology
  •  汎用型走査トンネル電子顕微鏡の開発Principal Investigator

    • Principal Investigator
      西川 治
    • Project Period (FY)
      1984 – 1985
    • Research Category
      Grant-in-Aid for Developmental Scientific Research
    • Research Field
      Applied materials
    • Research Institution
      Tokyo Institute of Technology

All 2016 2015 2014 2009 2008 2007 2006 2005 2003 Other

All Journal Article Presentation Patent

  • [Journal Article] Atomic level analysis of dipeptide biomolecules by a scanning atom probe2016

    • Author(s)
      Masahiro Taniguchi and Osamu Nishikawa
    • Journal Title

      Journal of Vacuum Science and Technology B

      Volume: 34 Issue: 3

    • DOI

      10.1116/1.4941426

    • Peer Reviewed / Acknowledgement Compliant / Open Access
    • Data Source
      KAKENHI-PROJECT-24510157
  • [Journal Article] Scanning Atom Probe Analysis Alternately Triggered by Voltage and Laser Pulse2016

    • Author(s)
      Masahiro Taniguchi and Osamu Nishikawa
    • Journal Title

      e-Journal of Surface Science and Nanotechnology

      Volume: 14 Pages: 69-72

    • NAID

      130005132816

    • Peer Reviewed / Acknowledgement Compliant / Open Access
    • Data Source
      KAKENHI-PROJECT-24510157
  • [Journal Article] Atomic level analysis of carbon fibers by the scanning atom probe2014

    • Author(s)
      Osamu Nishikawa and Masahiro Taniguchi
    • Journal Title

      Surface and Interface Analysis

      Volume: 46 Issue: 12-13 Pages: 1231-1235

    • DOI

      10.1002/sia.5695

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-24510157
  • [Journal Article] "Study of Graphite Nanofibers by the Scanning Atom Probe"2008

    • Author(s)
      M. Taniguchi, O. Nishikawa, and M. Ushirozawa
    • Journal Title

      e-Journal of Surface Science and Nanotechnology 6

      Pages: 41-44

    • NAID

      130004933975

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Journal Article] "Study on Imidazolium-based Ionic Liquids with Scanning Atom Probe and Knudsen Effusion Mass Spectrometry"2008

    • Author(s)
      A. Tolstoguzov O. Nishikawa, M. Taniguchi
    • Journal Title

      Surface and Interface Analysis 40

      Pages: 1614-1618

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Journal Article] Scanning Atom Probe Study of Graphite Nnofibers2008

    • Author(s)
      O. Nishikawa
    • Journal Title

      Journal of Vacuum Science and Technology B 26

      Pages: 735-737

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Journal Article] A New Approach for the Mass Analysis of Biomolecules at Atomic Level Utilizing the Scanning Atom Probe2008

    • Author(s)
      O. Nishikawa
    • Journal Title

      Microscopy and Microanalysis 14

      Pages: 1244-1245

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Journal Article] "Scanning atom probe study of graphite nanofibers"2008

    • Author(s)
      O. Nishikawa, M. Taniguchi andM. Ushirozawa
    • Journal Title

      Journal of Vacuum Science & Technology B 26・2

      Pages: 735-737

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Journal Article] Scanning atom probe study of graphite nanofibers2008

    • Author(s)
      O. Nishikawa, M. Taniguchi and M. Ushirozawa
    • Journal Title

      Journal of Vacuum Science & Technology B 26・2

      Pages: 735-737

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Journal Article] Study of Characteristic Fragmentation of Nanocarbon by the Scanning Atom Probe2008

    • Author(s)
      O. Nishikawa
    • Journal Title

      Journal of Vacuum Science and Technology A 26

      Pages: 1074-1078

    • NAID

      120001469082

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Journal Article] "A New Approach for the Mass Analysis of Biomolecules at Atomic Level Utilizing the Scanning Atom Probe"2008

    • Author(s)
      O. Nishikawa, M. Taniguchi
    • Journal Title

      Microscopy and Microanalysis 14

      Pages: 1244-1245

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Journal Article] "Scanning Atom Probe Study of Graphite Naofibers"2008

    • Author(s)
      O. Nishikawa, M. Taniguchi
    • Journal Title

      Journal of Vacuum Science and Technology B 26

      Pages: 735-737

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Journal Article] "Study of Characteristic Fragmentation of Nanocarbon by the Scanning Atom Probe"2008

    • Author(s)
      O. Nishikawa, M. Taniguchi
    • Journal Title

      Journal of Vacuum Science and Technology A 26

      Pages: 1074-1078

    • NAID

      120001469082

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Journal Article] Scanning Atom Probe Study of Dissociation of Organic Molecules on Titanium Oxide2006

    • Author(s)
      O.Nishikawa, M.Taniguchi, S.Watanabe, A.Yamagishi, T.Sasaki
    • Journal Title

      Jpn. J. Appl. Phys. 45,No.3B

      Pages: 1892-1896

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-15310077
  • [Journal Article] Study of Molecular Reaction on Titanium Oxide by the Scanning Atom Probe2006

    • Author(s)
      M.Taniguchi, O.Nishikawa
    • Journal Title

      e-Journal of Surf. Sci. and Nanotechnology 4

      Pages: 1-7

    • NAID

      130004933939

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-15310077
  • [Journal Article] Scanning Atom Probe Study of Dissociation of Organic Molecules on Titanium Oxide2006

    • Author(s)
      O.Nishikawa, M.Taniguchi, S.Watanabe, A.Yamagishi, T.Sasaki
    • Journal Title

      Japanese Journal of Applied Physics Vol. 45・No 3B

      Pages: 1892-1896

    • Data Source
      KAKENHI-PROJECT-18310072
  • [Journal Article] Study of Molecular Reaction on Titanium Oxide by the Scanning Atom Probe2006

    • Author(s)
      M.Taniguchi, O.Nishikawa
    • Journal Title

      e-Journal of Surface Science and Nanotechnology

    • NAID

      130004933939

    • Data Source
      KAKENHI-PROJECT-15310077
  • [Journal Article] Polythiophene in Strong Electric Field2006

    • Author(s)
      L.R.C.Wang, H.J.Kreuzer, O.Nishikawa
    • Journal Title

      Organic Electronics 7/2

      Pages: 99-106

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-15310077
  • [Journal Article] Study of Molecular Reaction on Titanium Oxide by the Scanning Atom Probe2006

    • Author(s)
      M.Taniguchi, O.Nishikawa
    • Journal Title

      e-Journal of Surf.Sci.and Nanotechnology

    • NAID

      130004933939

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-15310077
  • [Journal Article] Study of Molecular Reaction on Titanium Oxide by the Scanning Atom Probe2006

    • Author(s)
      M.Taniguchi, O.Nishikawa, S.Komata, S.Watanabe, A.Yamagishi, T.Sasaki
    • Journal Title

      e-J. of Surf Sci. and Nanotech. 4

      Pages: 521-527

    • NAID

      130004933939

    • Data Source
      KAKENHI-PROJECT-18310072
  • [Journal Article] Polythiophene in Strong Electric Field2006

    • Author(s)
      L.R.C.Wang, H.J.Kreuzer, O.Nishikawa
    • Journal Title

      Organic Electronics (印刷中)

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-15310077
  • [Journal Article] "Scanning Atom Probe Study of Dissociation of Organic Molecules on Titanium Oxide"2006

    • Author(s)
      O. Nishikawa, M. Taniguchi, S. Wawtanabe, A. Yamagishi and T. Sasaki
    • Journal Title

      Japanese Journal of Applied Physics Vol.45. No 3B

      Pages: 1892-1896

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Journal Article] Scanning Atom Probe Study of Dissociation of Organic Molecules on Titanium Oxide2006

    • Author(s)
      O.Nishikawa, M.Taniguchi, S.Watanabe, A.Yamagishi, T.Sasalci
    • Journal Title

      Jpn.J.Appl.Phys. 45, No.3E

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-15310077
  • [Journal Article] Study of Molecular Reaction on Titanium Oxide by the Scanning Atom Probe2006

    • Author(s)
      M. Taniguchi, O. Nishikawa, S. Komata, S. Watanabe,A. Yamagishi and T. Sasaki
    • Journal Title

      e-Journal of Surface Science and Nanotechnology 4

      Pages: 521-527

    • NAID

      130004933939

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Journal Article] Atom-by-Atom Analysis of Non-Metallic Materials by the Scanning Atom Probe2005

    • Author(s)
      Osamu Nishikawa, Masahiro Taniguchi
    • Journal Title

      Chinese J.Physics 43, No.1-11

      Pages: 111-123

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-15310077
  • [Journal Article] Atom-by-Atom Analysis of Non-Metallic Materials by the Scanning Atom Probe2005

    • Author(s)
      Osamu Nishikawa, Masahiro Taniguchi
    • Journal Title

      Chinese J. Physics 43,No.1-II

      Pages: 111-123

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-15310077
  • [Journal Article] Atom-by-Atom Analysis of Non-Metallic Materials by the Scanning Atom Probe2005

    • Author(s)
      O.Nishikawa
    • Journal Title

      Chinese Journal of Physics Vol.43(1)

      Pages: 111-123

    • Data Source
      KAKENHI-PROJECT-15310077
  • [Journal Article] Atomic Level Analysis of Carbon Materials with the Scanning Atom Probe2003

    • Author(s)
      O.Nishikawa, M.Watanabe, T.Murakami, T.Yagyu, M.Taniguchi
    • Journal Title

      New Diamond and Frontier Carbon Technol 13

      Pages: 257-273

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-15310077
  • [Journal Article] Atomic Level Analysis of Carbon Materials with the Scanning Atom Probe2003

    • Author(s)
      O.Nishikawa, M.Watanabe, T.Murakami, T.Yagyu, M.Taniguchi
    • Journal Title

      New Diamond and Frontier Carbon Technology 13

      Pages: 257-273

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-15310077
  • [Journal Article] Atomic Level Analysis of Carbon and Silicon by a Scanning Atom Probe2003

    • Author(s)
      O.Nishikawa, T.Murakami, M.Watanabe, M.Taniguchi, T.Kuzumaki, S.Kondo
    • Journal Title

      Jpn. J. Appl. Phys. 42

      Pages: 4816-4824

    • NAID

      10011446894

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-15310077
  • [Journal Article] Atomic Level Analysis of Carbon and Silicon by a Scanning Atom Probe2003

    • Author(s)
      O.Nishikawa, T.Murakami, M.Watanabe, M.Taniguchi, T.Kuzumaki, S.Kondo
    • Journal Title

      Jpn.J.Appl.Phys. 42

      Pages: 4816-4824

    • NAID

      10011446894

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-15310077
  • [Patent] 分析装置及び分析方法2008

    • Inventor(s)
      西川治
    • Industrial Property Rights Holder
      学校法人 金沢工業大学
    • Industrial Property Number
      2008-145033
    • Acquisition Date
      2008-06-02
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Presentation] 走査型アトムプローブによるアミノ酸の原子レベルでの解析 :グルタミンとグルタミン酸2016

    • Author(s)
      西川 治、谷口 昌宏
    • Organizer
      応用物理学会春季学術講演会
    • Place of Presentation
      東工大大岡山キャンパス
    • Year and Date
      2016-03-22
    • Data Source
      KAKENHI-PROJECT-24510157
  • [Presentation] 27p-P-14 Scanning Atom Probe Study of Molecular System2015

    • Author(s)
      Masahiro Taniguchi and O. Nishikawa
    • Organizer
      10th International Symposium on Atomic Level Characterizations for New Materials and Devices '15
    • Place of Presentation
      くにびきメッセ(島根県松江市)
    • Year and Date
      2015-10-27
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-24510157
  • [Presentation] 走査型アトムプローブによるアミノ酸の原子レベルでの解析 :バリンとプロリン2015

    • Author(s)
      西川 治、谷口 昌宏
    • Organizer
      応用物理学会秋季学術講演会
    • Place of Presentation
      名古屋国際会議場
    • Year and Date
      2015-09-15
    • Data Source
      KAKENHI-PROJECT-24510157
  • [Presentation] 走査型アトムプローブによるポリチオフェンの原子レベルの分析2009

    • Author(s)
      西川治
    • Organizer
      第56回応川物理学関係連合議演会
    • Place of Presentation
      茨城県つくば市
    • Year and Date
      2009-03-30
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Presentation] 「走査型アトムプローブによるポリチオフェンの原子レベルの分析」2009

    • Author(s)
      西川治, 谷口昌宏,早坂健,石田龍平,角崎顕一,神戸裕晃,竹村進,加藤ひとし
    • Organizer
      第56 回応用物理学関係連合講演会
    • Place of Presentation
      茨城県つくば市
    • Year and Date
      2009-03-30
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Presentation] 「走査型アトムプローブによるカーボンナノチューブの原子レベルでの組成評価」2008

    • Author(s)
      西川治,谷口昌宏
    • Organizer
      第69 回応用物理学学術講演会
    • Place of Presentation
      愛知県名古屋市
    • Year and Date
      2008-09-02
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Presentation] "Scannng atom Probe Study of Characteristic Fragmentation of Biomolecules"2008

    • Author(s)
      O. Nishikawa
    • Organizer
      International Conference on Nanoscience Technology 2008
    • Place of Presentation
      Keystone, Colorado, USA.
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Presentation] "Quantitative Evaluation of Carbon Nano Tubes by the Scanning AtomProbe"2008

    • Author(s)
      O. Nishikawa, M.Taniguchi
    • Organizer
      AVS(American Vacuum Society) 55th International Symposium & Exhibition
    • Place of Presentation
      Boston, USA.
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Presentation] 走査型アトムプローブによるカーボンナノチューブの原子レベルでの組成評価2008

    • Author(s)
      西川治
    • Organizer
      第69回応用物理学学術講演会
    • Place of Presentation
      愛知県名古屋市
    • Year and Date
      2008-09-02
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Presentation] "Characterization of carbon nanotubes by the scanning atom probe"2008

    • Author(s)
      M. Taniguchi, O. Nishikawa, S. Takeuchi, S.Tanaka
    • Organizer
      The 51st International Field Emission Symposium
    • Place of Presentation
      Rouen, France
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Presentation] "Atomic Level Analysis of Non-metallic Specimens by the Scanning Atom Probe"2008

    • Author(s)
      O. Nishikawa, M.Taniguchi
    • Organizer
      4th Vacuum and Surface Science Conference of Asia and Australia
    • Place of Presentation
      島根県松江市
    • Year and Date
      2008-10-29
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Presentation] "Carbon Material Analysis by using the Scanning Atom Probe" Material Analysis by using the Scanning Atom Probe"2008

    • Author(s)
      M. Taniguchi, O. Nishikawa, S. Taktani, S. Tanaka, M.Ushirozawa
    • Organizer
      The 10th Int. Symposium on SIMS and Related Tech. Based on Ion-Solid Interactions (SISS-10)
    • Place of Presentation
      成蹊大学(東京都武蔵野市)
    • Year and Date
      2008-07-17
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Presentation] Atomic Level Analysis of Non-metallic Specimens by the Scanning Atom Probe2008

    • Author(s)
      O. Nishikawa
    • Organizer
      4th Vacuum and Surface Science Conference of Asia and Australia
    • Place of Presentation
      島根県 松江市
    • Year and Date
      2008-10-29
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Presentation] Scannng atom Probe Study of Characteristic Fragmentation of Biomolecules2008

    • Author(s)
      O. Nishikawa
    • Organizer
      International Conference on Nanoscience Technology 2008
    • Place of Presentation
      Keystone, Colorado, USA.
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Presentation] 「走査型アトムプローブ(3D- SAP)によるCNT の分析」2008

    • Author(s)
      谷口昌宏,西川治,竹谷慎介,田中慎哉
    • Organizer
      第2 回分子科学討論会
    • Place of Presentation
      福岡県福岡市
    • Year and Date
      2008-09-27
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Presentation] Quantitative Evaluation of Carbon Nano Tubes by the Scanning Atom Probe2008

    • Author(s)
      O. Nishikawa
    • Organizer
      AVS(Amcrican Vacuum Society) 55th International Symposium & Exhibition
    • Place of Presentation
      Boston, USA.
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Presentation] "Atomic Level Evaluation of Carbon Nanotubes by the Scanning Atom Probe"2008

    • Author(s)
      O. Nishikawa, M. Taniguchi, S. Taketani, S. Tanaka
    • Organizer
      21st International Vacuum Nanoelectronics Conference
    • Place of Presentation
      Wroclaw, Poland
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Presentation] Atomic Level Evaluation of Carbon Nanotubes by the Scanning Atom Probe2008

    • Author(s)
      O. Nishikawa
    • Organizer
      21sl Internalional Vacuum Nanoelectronics Conference
    • Place of Presentation
      Wroclaw, Poland
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Presentation] "Study on Imidazoliumbased Ionic Liquids with Scanning Atom Probe and Knudsen Effusion Mass Spectrometry"2007

    • Author(s)
      A. Tolstoguzov, U. Bardi, O. Nishikawa, M. Taniguchi
    • Organizer
      6th International Symposium on Atomic Level Characterizations for New Materials and Devices '07
    • Place of Presentation
      金沢市
    • Year and Date
      2007-10-30
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Presentation] "Scanning atom probe study of graphite nanofibres"2007

    • Author(s)
      M. Taniguchi, O. Nishikawa, M. Ushirozawa
    • Organizer
      Atom Probe Workshop 2007
    • Place of Presentation
      Gothenburg, Sweden
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Presentation] "Study of graphite nanofibers by the scanning atom probe"2007

    • Author(s)
      M. Taniguchi, O. Nishikawa, M. Ushirozawa
    • Organizer
      6th International Symposium on Atomic Level Characterizations for New Materials and Devices`07
    • Place of Presentation
      金沢市
    • Year and Date
      2007-10-30
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Presentation] 「走査型アトムプローブによるグラファイトナノファイバーの分析」2007

    • Author(s)
      谷口昌宏,長谷川優太,西川治,後沢瑞芳
    • Organizer
      第1 回分子科学討論会
    • Place of Presentation
      仙台市
    • Data Source
      KAKENHI-PROJECT-18310072
  • [Presentation] 走査型アトムプローブによる有機高分子膜(ウルシ膜)の分析2

    • Author(s)
      谷口昌宏、西川治
    • Organizer
      第33回表面科学学術講演会
    • Place of Presentation
      つくば国際会議場 (茨城県つくば市)
    • Data Source
      KAKENHI-PROJECT-24510157
  • [Presentation] アトムプローブにおける電界蒸発トリガー方法

    • Author(s)
      谷口昌宏、西川治
    • Organizer
      日本化学会第95春季年会
    • Place of Presentation
      日本大学理工学部船橋キャンパス (千葉県・船橋市)
    • Year and Date
      2015-03-26 – 2015-03-29
    • Data Source
      KAKENHI-PROJECT-24510157
  • [Presentation] 走査型アトムプローブによるアミノ酸の原子レベルでの解析

    • Author(s)
      谷口 昌宏、西川 治、猪飼 篤、川村 和孝、中岡 慎太郎
    • Organizer
      第32回表面科学学術講演会
    • Place of Presentation
      東北大学 さくらホール (宮城県 仙台市)
    • Data Source
      KAKENHI-PROJECT-24510157
  • [Presentation] 3次元アトムプローブによる炭素繊維の原子レベルでの解析

    • Author(s)
      谷口昌宏,西川治 (金沢工大)
    • Organizer
      第61回応用物理学会学術講演会
    • Place of Presentation
      青山学院大学(神奈川県相模原市)
    • Data Source
      KAKENHI-PROJECT-24510157
  • [Presentation] 走査型アトムプローブによる有機高分子膜(ウルシ膜)の分析

    • Author(s)
      谷口昌宏、林遼吾、西川治、小川俊夫
    • Organizer
      日本化学会第93春季年会
    • Place of Presentation
      立命館大学 びわこ ・くさつキャンパス(滋賀県 草津市)
    • Data Source
      KAKENHI-PROJECT-24510157
  • [Presentation] Atomic Level Analysis of Carbon Fibers by the Scanning Atom Probe

    • Author(s)
      O. Nishikawa and M. Taniguchi
    • Organizer
      9th International symposium on Atomic Lebel Characterizations for New Materials and Devices '13 (ALC'13)
    • Place of Presentation
      アメリカ合衆国ハワイ州ハワイ島
    • Data Source
      KAKENHI-PROJECT-24510157
  • [Presentation] 走査型アトムプローブによる炭素繊維の原子レベルでの解析(3) 定量的組成分析

    • Author(s)
      西川 治、谷口 昌宏
    • Organizer
      第75回応用物理学会秋季学術講演会
    • Place of Presentation
      北海道大学 (北海道・札幌市)
    • Year and Date
      2014-09-17 – 2014-09-20
    • Data Source
      KAKENHI-PROJECT-24510157
  • [Presentation] Atom Probe Analysis of Conductive Polymer

    • Author(s)
      M. Taniguchi, A. Yanagisawa, O.Nishikawa
    • Organizer
      SISS-14 in 2012 (The International symposium on SIMS and Related Techniques Base on Ion-Solid Interactions at Seikei University)
    • Place of Presentation
      Seikei University (東京都 武蔵野市)
    • Data Source
      KAKENHI-PROJECT-24510157
  • [Presentation] 走査型アトムプローブによるペプチドの原子レベルでの定性・定量解析

    • Author(s)
      西川 治、谷口 昌宏
    • Organizer
      第62回応用物理学会春季学術講演会
    • Place of Presentation
      東海大学 湘南キャンパス (神奈川県・平塚市)
    • Year and Date
      2015-03-11 – 2015-03-14
    • Data Source
      KAKENHI-PROJECT-24510157
  • [Presentation] 走査型アトムプローブによる炭素繊維の原子レベルでの解析

    • Author(s)
      西川治,谷口昌宏
    • Organizer
      第60回応用物理学会春季学術講演会
    • Place of Presentation
      神奈川工科大学 (神奈川県厚木市)
    • Data Source
      KAKENHI-PROJECT-24510157
  • 1.  TOMITORI Masahiko (10188790)
    # of Collaborated Projects: 9 results
    # of Collaborated Products: 0 results
  • 2.  八木 克道 (90016072)
    # of Collaborated Projects: 8 results
    # of Collaborated Products: 0 results
  • 3.  村田 好正 (10080467)
    # of Collaborated Projects: 6 results
    # of Collaborated Products: 0 results
  • 4.  吉森 昭夫 (50013470)
    # of Collaborated Projects: 5 results
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  • 5.  潮田 資勝 (90176652)
    # of Collaborated Projects: 5 results
    # of Collaborated Products: 0 results
  • 6.  IKAI Atsushi (50011713)
    # of Collaborated Projects: 4 results
    # of Collaborated Products: 0 results
  • 7.  KAWAZU Akira (20010796)
    # of Collaborated Projects: 4 results
    # of Collaborated Products: 0 results
  • 8.  TANIGUCHI Masahiro (30250418)
    # of Collaborated Projects: 4 results
    # of Collaborated Products: 50 results
  • 9.  田中 虔一 (00016718)
    # of Collaborated Projects: 4 results
    # of Collaborated Products: 0 results
  • 10.  MORITA Seizo (50091757)
    # of Collaborated Projects: 3 results
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  • 11.  YAMAGISHI Akihiko (70001865)
    # of Collaborated Projects: 3 results
    # of Collaborated Products: 0 results
  • 12.  YAMAGUCHI Tsuyoshi (50013537)
    # of Collaborated Projects: 3 results
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  • 13.  西垣 敏 (60126943)
    # of Collaborated Projects: 3 results
    # of Collaborated Products: 0 results
  • 14.  楠 勲 (30025390)
    # of Collaborated Projects: 3 results
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  • 15.  高柳 邦夫 (80016162)
    # of Collaborated Projects: 3 results
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  • 16.  塚田 捷 (90011650)
    # of Collaborated Projects: 2 results
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  • 17.  魚住 清彦 (20011124)
    # of Collaborated Projects: 2 results
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  • 18.  原田 義也 (20013477)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 0 results
  • 19.  ARAKAWA Hideo (80211704)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 20.  HYOUDO Shin-ichi (30010713)
    # of Collaborated Projects: 1 results
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  • 21.  ASAHI Hajime (90192947)
    # of Collaborated Projects: 1 results
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  • 22.  MORIKAWA Hiroshi (90024314)
    # of Collaborated Projects: 1 results
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  • 23.  YAO Takafumi (60230182)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 24.  OSHIMA Chuuhei (10212333)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 25.  YAMAMOTO Masahiko (30029160)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 26.  新庄 輝也 (70027043)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 27.  金持 徹 (40031059)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 28.  岡田 正和 (70034478)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 29.  青野 正和 (10184053)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 30.  上田 一之 (60029212)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 31.  丹司 敬義 (90125609)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 32.  金森 順次郎 (10028079)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 33.  中村 勝吾 (50029831)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 34.  宇佐美 誠二 (40017877)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 35.  高橋 正行 (50241295)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 36.  ISHIKAWA Yuuichi
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 37.  堀内 敬
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 38.  山岸 皓彦
    # of Collaborated Projects: 0 results
    # of Collaborated Products: 4 results

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