Tomitori Masahiko 富取正彦

… Alternative Names

TOMITORI Masahiko 富取正彦

冨取正彦トミトリマサヒコ

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Researcher Number	10188790
Other IDs
External Links
Affiliation (Current)	2025: 北陸先端科学技術大学院大学, 先端科学技術研究科, 名誉教授
Affiliation (based on the past Project Information) *help	2022 – 2024: 北陸先端科学技術大学院大学, 先端科学技術研究科, 名誉教授 2018 – 2022: 北陸先端科学技術大学院大学, 先端科学技術研究科, 教授 2016: 北陸先端科学技術大学院大学, 先端科学技術研究科, 教授 2006 – 2015: 北陸先端科学技術大学院大学, マテリアルサイエンス研究科, 教授 1994 – 2005: 北陸先端科学技術大学院大学, 材料科学研究科, 助教授 … More 1996: 北陸先端科学技術大学院大学, 材料科学研究所, 助教授 1994: 北陸先端科学技術大学院大学, 助教授 1993: TOKYO INSTITUTE OF TECHNOLOGY, INTERDISCIPLINARY GRADUATE SCHOOL OF SCIENCE AND TECHNOLOGY RESEARCH ASSOCIATE, 大学院・総合理工学研究科, 助手 1993: Materials Sci. & Engi, assistant, 大学院・総合理工学研究科, 教授 1993: 東京工業大学, 大学院総合理工, 助手 1993: 東京工業大学, 大学院総合理工学研究所, 助手 1992: Tokyo Inst. Technology, Dept. of Surface Science Assistant, 綜合理工学研究科, 助手 1991 – 1992: 東京工業大学, 総合理工学研究科, 助手 1986 – 1992: 東京工業大学, 大学院総合理工学研究科, 助手 1991: Tokyo Inst. Technol., Mat. Sci. Eng., Research Asso., 大学院総合理I学研究科, 助手 1991: Tokyo Inst. Technol., Mat, Sci. Eng., Research Asso., 大学院総合理工学研究所, 助手 1990: Tokyo Inst. Technol., Mat. Sci. Eng., Research Asso., 総合理工学研究科, 助手 1990: 東京工業大学. 大学院総合理工学研究科, 助手 Less
Review Section/Research Field	Principal Investigator 表面界面物性 / Thin film/Surface and interfacial physical properties / Medium-sized Section 29:Applied condensed matter physics and related fields / Physical properties of metals / Applied materials / Composite materials/Surface and interface engineering / Nanomaterials/Nanobioscience Except Principal Investigator Applied materials / Medium-sized Section 28:Nano/micro science and related fields / Nanomaterials/Nanobioscience … More / Science and Engineering / 物質生物化学 / 物理計測・光学 / Physical properties of metals / Microdevices/Nanodevices Less
Keywords	Principal Investigator 走査型トンネル顕微鏡 / 表面・界面物性 / 走査プローブ顕微鏡 / 走査型トンネル分光法 / シリコン / silicon / scanning tunneling microscopy / ナノコンタクト / 電界放射 / 走査型プローブ顕微鏡 … More / field emission / build-up / scanning tunneling spectroscopy / 電界放射顕微鏡 / ゲルマニウム / エネルギー散逸 / 物性実験 / 相互作用力 / 接合 / 電子顕微鏡 / interaction force / bias-voltage non-contact atomic force spectroscopy / non-contact atomic force microscopy / electronic properties / nanoscale interface / surface and interface properties / scanning probe microscopy / ナノ力学分光 / 電圧印加非接触原子間力分光 / 電圧印加非接触原子間力分光法 / 非接触原子間力顕微鏡 / 電子物性 / ナノ構造界面 / surface image state / surface electric field / vacuum gap / electron standing wave / 鏡映力表面状態 / 表面電界 / 真空ギャップ / 電子定在波 / electron spectroscopy / build-up tip / scanning tunneling microscope / field electron emission scanning probe microscope / 電子エネルギー分析 / ビルドアップ探針 / 電界電子放射走査型プローブ顕微鏡 / germanium / field emission microscope / [111] -orented W tip / atom resolved tunneling spectroscopy / build‐up処理 / [III]方位W探針 / 電界イオン顕微鏡 / build-up処理 / [111]方位W探針 / 原子分解トンネル分光法 / tungsten / inertia piezomotor / field emission microscopy / atom transfer / ピエゾ慣性駆動モータ / 3次元粗動機構 / 電界放射電子分光法 / ピエゾ素子慣性駆動モータ / 3次元粗動 / 超高真空 / シリコン(111)面 / T-F処理 / タングステン / シリコン(lll)面 / ピエゾ素子慣性駆動 / 原子移送 / Epitaxial Growth / Eptaxial Growth / Germanium / Silicon / Scanning Tunneling Spectroscopy / Scanning Tunneling Microscopy / ヘテロ構造 / エピタキシャル成長 / ダイマー / Ge(ゲルマニウム) / Si(シリコン) / Scanning Tip Apex / Field Emission Electron Spectroscopy (FEES) / Atom-Probe Field Ion Microscope (A-P FIM) / Scanning Tunneling Microscope (STM) / Scanning Tunneling Spectroscopy (STS) / Scanning X Microscope (SXM) / 原子間力顕微鏡 / 位置検出型アトムプロ-ブ / 走査探針 / 電界放射分光法 / アトムプロ-ブ・電界イオン顕微鏡 / 走査型探索顕微鏡 / 分子計測 / 電荷移動 / 走査電子顕微鏡 / トンネル障壁 / コンダクタンス / 結合力 / 吸着 / ステップ / 走査型電子顕微鏡 / DNA / 分子吸着 / 表面電子状態 / エネルギーフィルター / 非弾性トンネル過程 / 共鳴トンネル過程 / トンネル過程 / 針状試料 / シャド-効果 / シャドー効果 / 探針 / Si(001) / Geクラスター … More Except Principal Investigator 走査型トンネル顕微鏡(STM) / 高温超電導セラミックス / クラスターイオン / ナノ力学 / タングステン探針 / 赤外分光 / 周波数変調原子間力顕微鏡 / トンネル物性 / STM / 走査型トンネル顕微鏡 / Surface / Tip Apex / He準安定原子線 / アトムプローブ / 走査プローブ顕微鏡 / ナノ材料 / 非接触原子間力顕微鏡 / 原子プローブ(AーP) / 力学的エネルギー散逸 / 原子レベル顕微鏡/分光法 / High Temperature Superconducting Ceramics / Doopants / Oxidation Process of Polymers / Metal-Polymer Interfaces / Polypyrrole / Conducting Polymers / Atom-Probe / ドーパント / 高分子の酸化過程 / 金属-高分子界面 / ポリピロール / 電導性高分子 / non-contact atomic force microscopy / surface and interface / chemical bonding / nano material / interaction force / scanning probe microscopy / 電圧印加非接触原子間力分光法 / 表面局在相互作用分光法 / ナノ力学分光 / 表面・界面物性 / 化学結合力 / 相互作用力 / two-dimensional phase / adsorption / scanning tunneling microscopy / surface / GaAs(001)表面 / 電荷密度波 / 高温超伝導体 / 電荷移動錯体 / シリコン表面構造 / 層状物質 / 超伝導 / 触媒 / 半導体 / 走査トンネル分光法 / 2次元相 / 吸着 / 走査トンネル顕微鏡 / 表面 / Schottkey barrier / epitaxy / ultra-high vacuum electron microscope / シリコン・金属界面 / 原子スケール界面構造 / 超高真空電子顕微鏡法 / エピタクシャル界面 / ショットキー障壁 / エピタクシー / 超高真空電子顕微鏡 / Tabacco Mosasic Virus / Bacteriophage T4 / Clean and Well defined Conditions / Interacting Biological Molecular Systems / Tunneling Property / Scanning Tunneling Microscope / 生体分子 / 生体分子のトンネル物性 / 生体用走査型トンネル顕微鏡 / バイオSTM / 生物試料 / バクテリオファージ / タバコモザイクウイルス / バクテリオファージT4 / 清浄定質ふん囲気 / 生体分子相互作用系 / Vacuum Gauge / Imaging Faraday Cage / Ultra-High Vacuum / Field Emission Microsocpe (FEM) / Field Emission / 映像型ファラディ-ケイジ / 電界放射型極高真空計 / 電界放射 / 極高真空 / Field Emission Electron Spectrometer (FEES) / Scanning Tunneling Spectroscopy (STS) / Si cluster / Atom-Probe (A-P) / Scanning Tunneling Microscope (STM) / 電流映像型トンネル電子分光法(CITS) / 走査探針先端 / 二極走査型トンネル映像法(DPTI) / 電子の状態密度 / STM・A-P複合器 / アトムプロ-ブ(A-P) / 位置感知型AーP / 電界放射電子分光器(FEES) / 走査型トンネル電子分光(STS) / STM・AーP複合器 / アトムプロ-ブ(AーP) / K+O共吸収系 / Cs@Si(111)とK@Si(100)吸着系 / 分子線 / ペニングイオン化電子分光 / 再配列構造 / Si(111) / 電子分光 / ペニングイオン化 / シリコン / パルスレーザー光照射 / 原子プローブ(A-P) / GaP / GaAs / Si / パルスレーザー / 点状イオン源 / ナノ力学的顕微分光法 / 走査型プローブ顕微鏡 / 顕微分光 / ナノ表面・界面 / 結合形成過程 / 化学結合 / 有機薄膜太陽電池 / 配向制御 / エレクトロスピンニング / 分子デバイス / 共役系分子 / ナノコンタクト / π共役係分子 / アミノ基終端シリコン表面 / 探針清浄化 / 探針先鋭化 / フォース・マッピング / 原子間力分光 / 原子間力 / 極低温 / 原子位置の力学的制御 / 交換力顕微法 / 原子の力学的同定 / 原子間力の判別 / 非接触 / 原子間力顕微鏡 / 交換相互作用力顕微法 / 磁気相互作用力 / ピラーの形成 / ダンピングエネルギー / 原子の力学的操作 / 原子の力学的識別 / 原子分解能 / 同軸型直衝突イオン散乱分光(CAICISS) / 表面の電子状態 / ペニングイオン電子分光法 / 表面構造 / イオンビーム散乱 / 電子励起イオン脱離(EDS) Less

ナノ力学に基づく探針振動同期励起による原子レベルの赤外分光
- Principal Investigator
  
  新井豊子
- Project Period (FY)
  2022 – 2024
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Review Section
  
  Medium-sized Section 28:Nano/micro science and related fields
- Research Institution
  Kanazawa University
周波数変調/同期法を利用したナノ力学による原子レベルの顕微鏡/分光法の開拓
- Principal Investigator
  
  新井豊子
- Project Period (FY)
  2021 – 2024
- Research Category
  
  Grant-in-Aid for Challenging Research (Pioneering)
- Review Section
  
  Medium-sized Section 28:Nano/micro science and related fields
- Research Institution
  Kanazawa University
Nanoscale mechanical analysis of nanocontacts using combined scanning probe microscopy capable of detection of energy dissipationPrincipal Investigator
- Principal Investigator
  
  Tomitori Masahiko
- Project Period (FY)
  2018 – 2021
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Review Section
  
  Medium-sized Section 29:Applied condensed matter physics and related fields
- Research Institution
  Japan Advanced Institute of Science and Technology
Measurements of the charge state of a molecule on a solid substrate on the basis of scanning probe microscopyPrincipal Investigator
- Principal Investigator
  
  Tomitori Masahiko
- Project Period (FY)
  2014 – 2016
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Composite materials/Surface and interface engineering
- Research Institution
  Japan Advanced Institute of Science and Technology
Analysis and fabrication of nanoscale contacts and interfaces by scanning probe microscopy technologyPrincipal Investigator
- Principal Investigator
  
  Tomitori Masahiko
- Project Period (FY)
  2012 – 2015
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  Japan Advanced Institute of Science and Technology
In-situ observation and analysis of nano contacts and junctions formation at high temperatures by a combined microscope of SEM and SPMPrincipal Investigator
- Principal Investigator
  
  TOMITORI Masahiko
- Project Period (FY)
  2010 – 2012
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  Japan Advanced Institute of Science and Technology
Characterization of conjugated molecule monolayer chemically bonded on semiconductor surface and its application to single molecular light emitting devices
- Principal Investigator
  
  MURATA Hideyuki
- Project Period (FY)
  2008 – 2011
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Microdevices/Nanodevices
- Research Institution
  Japan Advanced Institute of Science and Technology
Analysis of binding formation between solid surfaces by bias voltage non-contact atomic force microscopy/spectroscopyPrincipal Investigator
- Principal Investigator
  
  TOMITORI Masahiko
- Project Period (FY)
  2008 – 2011
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  Japan Advanced Institute of Science and Technology
Atomic force spectroscopy of chemical bonding process with bias voltage tuning between a tip and a sample
- Principal Investigator
  
  ARAI Toyoko
- Project Period (FY)
  2008 – 2011
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Nanomaterials/Nanobioscience
- Research Institution
  Kanazawa University
シリコン表面に化学結合した共役系分子の電気伝導
- Principal Investigator
  
  MURATA Hideyuki
- Project Period (FY)
  2006 – 2007
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Review Section
  
  Science and Engineering
- Research Institution
  Japan Advanced Institute of Science and Technology
Measurements of electronic properties of interfaces with functional nanostructures by bias-voltage non-contact atomic force microscopy/spectroscopyPrincipal Investigator
- Principal Investigator
  
  TOMITORI Masahiko
- Project Period (FY)
  2005 – 2007
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  Japan Advanced Institute of Science and Technology
Mechanical and electronic measurements based on scanning probe microscopy for single molecules on surfaces using electron resonant interaction
- Principal Investigator
  
  ARAI Toyoko
- Project Period (FY)
  2005 – 2007
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Nanomaterials/Nanobioscience
- Research Institution
  Kanazawa University
  University of Tsukuba
走査型プローブ顕微鏡によるDNA分子の半導体表面ステップへの特異吸着の研究Principal Investigator
- Principal Investigator
  
  富取正彦
- Project Period (FY)
  2003 – 2004
- Research Category
  
  Grant-in-Aid for Exploratory Research
- Research Field
  
  Nanomaterials/Nanobioscience
- Research Institution
  Japan Advanced Institute of Science and Technology
Study of electric field close to a sample surface utilizing the electron standing wave excited in a vacuum gap of scanning tunneling microscopyPrincipal Investigator
- Principal Investigator
  
  TOMITORI Masahiko
- Project Period (FY)
  2000 – 2002
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  表面界面物性
- Research Institution
  Japan Advanced Institute, of Science and Technology
超高分解能原子間力プローブ法による原子の力学的分光と制御
- Principal Investigator
  
  森田清三
- Project Period (FY)
  1999 – 2002
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Review Section
  
  Science and Engineering
- Research Institution
  Osaka University
エネルギーフィルター電界放射顕微鏡による表面吸着電子状態解析の試みPrincipal Investigator
- Principal Investigator
  
  富取正彦
- Project Period (FY)
  1999 – 2000
- Research Category
  
  Grant-in-Aid for Exploratory Research
- Research Field
  
  表面界面物性
- Research Institution
  Japan Advanced Institute of Science and Technology
Development of a field electron emission-scanning probe microscope with a build-up tipPrincipal Investigator
- Principal Investigator
  
  TOMITORI Masahiko
- Project Period (FY)
  1998 – 2000
- Research Category
  
  Grant-in-Aid for Scientific Research (B).
- Research Field
  
  表面界面物性
- Research Institution
  Japan Advanced Institute of Science and Technology
ナノスケール探針のシャドー効果による光・電子照射測定の空間分解能向上の試みPrincipal Investigator
- Principal Investigator
  
  富取正彦
- Project Period (FY)
  1997 – 1998
- Research Category
  
  Grant-in-Aid for Exploratory Research
- Research Field
  
  表面界面物性
- Research Institution
  Japan Advanced Institute of Science and Technology
Recognition of atomic species on hetero-surfaces by atom resolved tunneling spectroscopyPrincipal Investigator
- Principal Investigator
  
  TOMITORI Masahiko
- Project Period (FY)
  1995 – 1997
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  表面界面物性
- Research Institution
  Japan Advanced Institute of Science and Technology
STM/STSによる半導体微粒子の研究Principal Investigator
- Principal Investigator
  
  富取正彦
- Project Period (FY)
  1993
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Research Institution
  Tokyo Institute of Technology
Tunneling Characteristics in Atomic Resolution
- Principal Investigator
  
  KAWAZU Akira
- Project Period (FY)
  1993 – 1996
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Research Institution
  The University of Tokyo
Construction of an experimental apparatus for atom transfer between nano-regionsPrincipal Investigator
- Principal Investigator
  
  TOMITORI Masahiko
- Project Period (FY)
  1993 – 1995
- Research Category
  
  Grant-in-Aid for Developmental Scientific Research (B)
- Research Field
  
  表面界面物性
- Research Institution
  Japan Advanced Institute of Science and Technology, Hokuriku
  Tokyo Institute of Technology
Schottrey barrier height of epitaxial interface studied by UHV-electron microscope
- Principal Investigator
  
  TAKAYANAGI Kunio
- Project Period (FY)
  1992 – 1993
- Research Category
  
  Grant-in-Aid for General Scientific Research (B)
- Research Field
  
  Applied materials
- Research Institution
  Tokyo Institute of Technology
Microscopic Study of Si-Ge Heteroepitaxial Growth by STM/STSPrincipal Investigator
- Principal Investigator
  
  TOMITORI Masahiko
- Project Period (FY)
  1992 – 1993
- Research Category
  
  Grant-in-Aid for General Scientific Research (C)
- Research Field
  
  Physical properties of metals
- Research Institution
  TOKYO INSTITUTE OF TECIHNOLOGY
Development of Preparation Methods of SXM Tips with a Ultra-fine Probing AreaPrincipal Investigator
- Principal Investigator
  
  TOMITORI Masahiko
- Project Period (FY)
  1990 – 1991
- Research Category
  
  Grant-in-Aid for Developmental Scientific Research (B)
- Research Field
  
  Applied materials
- Research Institution
  Tokyo Institute of Technology
Development of Field Emission Type Ultra-High Vacuum Gauge
- Principal Investigator
  
  NISHIKAWA Osamu
- Project Period (FY)
  1990 – 1991
- Research Category
  
  Grant-in-Aid for Developmental Scientific Research (B)
- Research Field
  
  物理計測・光学
- Research Institution
  Tokyo Institute of Technology
Construction of Scanning Tunneling Microscope for the Study of Interacting Biological Molecualr Systems and their Preparation
- Principal Investigator
  
  IKAI Atsushi
- Project Period (FY)
  1990 – 1992
- Research Category
  
  Grant-in-Aid for Developmental Scientific Research (B)
- Research Field
  
  物質生物化学
- Research Institution
  Tokyo Institute of Technology
原子プローブ:レーザー誘起電界蒸発等による表面研究
- Principal Investigator
  
  NISHIKAWA Osamu
- Project Period (FY)
  1989
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Research Institution
  Tokyo Institute of Technology
Ultra-Fine Surface Analysis by a Combined Instrument of an STM and A-P
- Principal Investigator
  
  NISHIKAWA Osamu
- Project Period (FY)
  1989 – 1990
- Research Category
  
  Grant-in-Aid for General Scientific Research (B)
- Research Field
  
  Physical properties of metals
- Research Institution
  Tokyo Institute of Technology
原子プローブ:レーザー誘起電界蒸発などによる表面研究
- Principal Investigator
  
  西川治
- Project Period (FY)
  1987
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Research Institution
  Tokyo Institute of Technology
原子プローブ:レーザー誘起電界蒸発などによる表面研究
- Principal Investigator
  
  西川治
- Project Period (FY)
  1987 – 1989
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Research Institution
  Tokyo Institute of Technology
パルスレーザー光照射型点状イオン源の開発
- Principal Investigator
  
  西川治
- Project Period (FY)
  1986
- Research Category
  
  Grant-in-Aid for Developmental Scientific Research
- Research Field
  
  Applied materials
- Research Institution
  Tokyo Institute of Technology
Ultramicroanalysis of Conducting Polymers with Atom-Probe
- Principal Investigator
  
  NISHIKAWA Osamu
- Project Period (FY)
  1986 – 1987
- Research Category
  
  Grant-in-Aid for General Scientific Research (B)
- Research Field
  
  Applied materials
- Research Institution
  Tokyo Institute of Technology

[Book] ポストシリコン半導体　―ナノ成膜ダイナミクスと基板･界面効果―、第４編評価・解析　第２章電子分光学的評価研究　第１節"半導体表面構造・電荷分布の原子スケール解析を実現する走査プローブ顕微鏡2013
- Author(s)
  笹原亮、富取正彦、（他、吉武道子、吉野淳二、伊藤智徳、岡田晋、金山敏彦、財満鎮明、押山淳、室田淳一、櫻庭政夫、奥村元、北畠真、石田夕起、矢野裕司、竹内哲也、尾鍋研太郎、鳥海明、酒井朗、その他37名）
- Total Pages
  556
- Publisher
  出版社エヌ・ティー・エス
- Data Source
  KAKENHI-PROJECT-24246014
[Book] 実験物理科学シリーズ6"走査プローブ顕微鏡「発展編第10章非接触AFMの展開」"(重川秀美、吉村雅満、河津璋編)2009
- Author(s)
  富取正彦、新井豊子(分担執筆)
- Total Pages
  425
- Publisher
  共立出版
- Data Source
  KAKENHI-PROJECT-20310058
[Book] 実験物理科学シリーズ6 走査プローブ顕微鏡「発展編第10章非接触AFMの展開」2009
- Author(s)
  富取正彦, 新井豊子
- Publisher
  共立出版
- Data Source
  KAKENHI-PROJECT-20246012
[Book] 実験物理科学シリーズ6"走査プローブ顕微鏡「発展編第10章非接触AFMの展開」"2009
- Author(s)
  富取正彦、新井豊子
- Total Pages
  7
- Publisher
  共立出版
- Data Source
  KAKENHI-PROJECT-20246012
[Book] 非接触AFM の発展(重川秀実、吉村雅満、河津璋, 編)発展編第10章(実験物理学シリーズ6走査プローブ顕微鏡)2009
- Author(s)
  富取正彦(分担執筆)
- Publisher
  共立出版
- Data Source
  KAKENHI-PROJECT-20246012
[Book] Applied Scanning Probe Methods Vol. VIII, IX, X2008
- Author(s)
  B. Bhushan, H. Fuchs and M. Tomitori
- Total Pages
  306
- Publisher
  Springer-Verlag, Berlin
- Data Source
  KAKENHI-PROJECT-18041007
[Book] 表面物性工学ハンドブック第2版第6章 SPM 6.2STM6.2.2 装置と測定法、6.2.3 観察例12007
- Author(s)
  富取正彦
- Publisher
  丸善
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Book] ナノテクノロジー入門シリーズ第4巻基礎装置工学・試料作製技術真空工学2007
- Author(s)
  富取正彦
- Total Pages
  243
- Publisher
  共立出版
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17310069
[Book] ナノテクノロジー入門シリーズ第4巻基礎装置工学・試料作製技術真空工学2007
- Author(s)
  富取正彦
- Publisher
  共立出版
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Book] ナノテクノロジー入門シリーズ第3巻極限微小系のナノ物性測定2007
- Author(s)
  富取正彦
- Total Pages
  254
- Publisher
  共立出版
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17310069
[Book] 表面物性工学ハンドブック第2版第6章 SPM 6.2STM 6.2.2 装置と測定法、6.2.3 観察例12007
- Author(s)
  富取正彦
- Total Pages
  1050
- Publisher
  丸善
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17310069
[Book] ナノテクノロジー入門シリーズ第3巻極限微小系のナノ物性測定2007
- Author(s)
  富取正彦
- Publisher
  共立出版
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Book] 走査プローブ顕微鏡第4章力学的分光 4.4散逸・非保存力測定2006
- Author(s)
  富取正彦, 新井豊子(分担執筆)
- Total Pages
  12
- Publisher
  裳華房
- Data Source
  KAKENHI-PROJECT-17206005
[Book] Scanning probe microscopy roadmap 2005 Chap.2. Scanning tunneling microscopy(edited by S. Morita)2006
- Author(s)
  M.Tomitori
- Total Pages
  8
- Publisher
  Springer-Verlag, Berlin
- Data Source
  KAKENHI-PROJECT-17206005
[Book] 実践ナノテクノロジー走査プローブ顕微鏡と局所分光2005
- Author(s)
  富取正彦
- Total Pages
  429
- Publisher
  裳華房
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17310069
[Book] 走査型プローブ顕微鏡最新技術と未来予測 2.1 走査型トンネル顕微鏡(STM)、5.2 半導体材料の評価2005
- Author(s)
  富取正彦
- Publisher
  丸善
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Book] Scanning probe microscopy roadmap 2005, Chap. 2 Scanning tunneling microscopy, Chap. 18 Characterization of semiconducting materials2005
- Author(s)
  M. Tomitori
- Publisher
  Springer-Verlag
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Book] Roadmap 2005 of Scanning probe microscopy2005
- Author(s)
  M. Tomitori
- Total Pages
  201
- Publisher
  Springer-Verlag
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17310069
[Book] 走査型プローブ顕微鏡最新技術と未来予測2005
- Author(s)
  富取正彦
- Total Pages
  202
- Publisher
  丸善
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17310069
[Book] 実践ナノテクノロジー走査プローブ顕微鏡と局所分光第4章力学的分光4.4散逸・非保存力測定2005
- Author(s)
  富取正彦
- Publisher
  裳華房
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Book] 「実践ナノテクノロジー・走査プローブ顕微鏡と局所分光」第3章各種分光法の基礎と応用 3・2 力学的分光 3・2・4 散逸(非保存力)2005
- Author(s)
  富取正彦, 新井豊子(分担執筆)
- Publisher
  裳華房
- Data Source
  KAKENHI-PROJECT-17310069
[Journal Article] Surface Effect on Young’s Modulus of Sub-Two-Nanometer Gold [111] Nanocontacts2022
- Author(s)
  Zhang Jiaqi、Tomitori Masahiko、Arai Toyoko、Oshima Yoshifumi
- Journal Title
  
  Physical Review Letters
  
  Volume: 128 Issue: 14 Pages: 146101-146101
- DOI
  10.1103/physrevlett.128.146101
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20K20359, KAKENHI-PROJECT-18H03879, KAKENHI-PROJECT-21K18191, KAKENHI-PROJECT-22H00279
[Journal Article] Mechanical energy dissipation of an oscillating cantilever close to a conductive substrate partly covered with thin mica films evaluated by frequency modulation atomic force microscopy2022
- Author(s)
  Hasan Md Mahamudul、Arai Toyoko、Tomitori Masahiko
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: published online Issue: 6 Pages: 065006-065006
- DOI
  10.35848/1347-4065/ac6b02
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-18H03879, KAKENHI-PROJECT-21K18191, KAKENHI-PROJECT-22H00279
[Journal Article] In-situ high-resolution scanning electron microscopy observation of electrodeposition and stripping of lead in an electrochemical cell2021
- Author(s)
  He Gada、Oshima Yoshifumi、Tomitori Masahiko
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 60 Issue: 3 Pages: 035509-035509
- DOI
  10.35848/1347-4065/abe640
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18H03879
[Journal Article] Measurement of Mechanical Properties of Metal Nanocontacts by in-situ TEM2021
- Author(s)
  大島義文、石塚慧介、張家奇、富取正彦、新井豊子
- Journal Title
  
  KENBIKYO
  
  Volume: 56 Issue: 1 Pages: 13-17
- DOI
  10.11410/kenbikyo.56.1_13
- NAID
  130008037280
- ISSN
  1349-0958, 2434-2386
- Year and Date
  2021-04-30
- Language
  Japanese
- Data Source
  KAKENHI-PROJECT-18H03879
[Journal Article] Peculiar Atomic Bond Nature in Platinum Monatomic Chains2021
- Author(s)
  Zhang Jiaqi、Ishizuka Keisuke、Tomitori Masahiko、Arai Toyoko、Hongo Kenta、Maezono Ryo、Tosatti Erio、Oshima Yoshifumi
- Journal Title
  
  Nano Letters
  
  Volume: online Issue: 9 Pages: 1-7
- DOI
  10.1021/acs.nanolett.1c00564
- Peer Reviewed / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03879, KAKENHI-PROJECT-20K20359, KAKENHI-PROJECT-19K22166, KAKENHI-PLANNED-16H06439, KAKENHI-PUBLICLY-19H04692, KAKENHI-PUBLICLY-19H05169, KAKENHI-PROJECT-19K05029, KAKENHI-PROJECT-21K03400, KAKENHI-PROJECT-21K18191
[Journal Article] Critical shear stress of gold nanocontacts estimated by in situ transmission electron microscopy equipped with a quartz length-extension resonator2021
- Author(s)
  Liu Jiaming、Zhang Jiaqi、Arai Toyoko、Tomitori Masahiko、Oshima Yoshifumi
- Journal Title
  
  Applied Physics Express
  
  Volume: 14 Issue: 7 Pages: 075006-075006
- DOI
  10.35848/1882-0786/ac09bd
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20K20359, KAKENHI-PROJECT-19K22166, KAKENHI-PROJECT-18H03879, KAKENHI-PROJECT-21K18191
[Journal Article] Atomic scale mechanics explored by in situ transmission electron microscopy with a quartz length-extension resonator as a force sensor2020
- Author(s)
  Zhang Jiaqi、Ishizuka Keisuke、Tomitori Masahiko、Arai Toyoko、Oshima Yoshifumi
- Journal Title
  
  Nanotechnology
  
  Volume: 31 Issue: 20 Pages: 205706-205706
- DOI
  10.1088/1361-6528/ab71b9
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18H03879, KAKENHI-PROJECT-20K20359, KAKENHI-PROJECT-19K22166, KAKENHI-PROJECT-18H01825
[Journal Article] Layer etching of mica nanosheets using a focused electron beam2020
- Author(s)
  Islam Mohammad Razzakul、Tomitori Masahiko
- Journal Title
  
  Applied Physics Express
  
  Volume: 13 Issue: 10 Pages: 106502-106502
- DOI
  10.35848/1882-0786/abb385
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18H03879
[Journal Article] Mechanical analysis of gold nanocontacts during stretching using an in-situ transmission electron microscope equipped with a force sensor2020
- Author(s)
  Ishizuka Keisuke、Tomitori Masahiko、Arai Toyoko、Oshima Yoshifumi
- Journal Title
  
  Applied Physics Express
  
  Volume: 13 Issue: 2 Pages: 025001-025001
- DOI
  10.35848/1882-0786/ab6936
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19K15382, KAKENHI-PROJECT-18H03879, KAKENHI-PROJECT-20K20359, KAKENHI-PROJECT-19K22166, KAKENHI-PROJECT-18H01825
[Journal Article] Evaluation of the discrete thickness of exfoliated artificially synthesized mica nanosheets on silicon substrates: Toward characterization of the tunneling current through the nanosheets2020
- Author(s)
  Islam Mohammad Razzakul、Tomitori Masahiko
- Journal Title
  
  Applied Surface Science
  
  Volume: 532 Pages: 147388-147388
- DOI
  10.1016/j.apsusc.2020.147388
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18H03879
[Journal Article] Nanomechanical Properties of Epitaxial Silicene Revealed by Noncontact Atomic Force Microscopy2018
- Author(s)
  Nogami Makoto、Fleurence Antoine、Yamada-Takamura Yukiko、Tomitori Masahiko
- Journal Title
  
  Advanced Materials Interfaces
  
  Volume: 6 Issue: 2 Pages: 1801278-1801278
- DOI
  10.1002/admi.201801278
- Peer Reviewed / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03879, KAKENHI-PROJECT-17K14116
[Journal Article] Local protrusions formed on Si(111) surface by surface melting and solidification under applied tensile stress2016
- Author(s)
  Takashi Nishimura, Masahiko Tomitori
- Journal Title
  
  Applied Physics Letters
  
  Volume: 109 Issue: 12
- DOI
  10.1063/1.4963020
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-26630330
[Journal Article] Atomic-scale electric capacitive change detected with a charge amplifier installed in a non-contact atomic force microscope2016
- Author(s)
  Makoto Nogami, Akira Sasahara, Toyoko Arai, Masahiko Tomitori
- Journal Title
  
  Applied Physics Express
  
  Volume: 9 Issue: 4 Pages: 046601-046601
- DOI
  10.7567/apex.9.046601
- NAID
  210000137866
- Peer Reviewed / Acknowledgement Compliant / Open Access
- Data Source
  KAKENHI-PROJECT-26630330, KAKENHI-PROJECT-24246014, KAKENHI-PROJECT-26600098
[Journal Article] Evaluation and optimization of quartz resonant-frequency retuned fork force sensors with high Q factors, and the associated electric circuits, for non-contact atomic force microscopy2016
- Author(s)
  Hiroaki Ooe, Mikihiro Fujii, Masahiko Tomitori, Toyoko Arai
- Journal Title
  
  Review of Scientific Instruments
  
  Volume: 87 Issue: 2
- DOI
  10.1063/1.4941065
- Peer Reviewed / Acknowledgement Compliant / Open Access
- Data Source
  KAKENHI-PROJECT-26630330, KAKENHI-PROJECT-24246014, KAKENHI-PROJECT-26600098
[Journal Article] An atomic scale study of TiO2(110) surfaces exposed to humid environments2016
- Author(s)
  Akira Sasahara, Masahiko Tomitori
- Journal Title
  
  The Journal of Physical Chemistry C
  
  Volume: 120 Issue: 38 Pages: 21427-21435
- DOI
  10.1021/acs.jpcc.6b05661
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-26630330, KAKENHI-PROJECT-16K13624
[Journal Article] Atom-Resolved Analysis of an Ionic KBr(001) Crystal Surface Covered with a Thin Water Layer by Frequency Modulation Atomic Force Microscopy2015
- Author(s)
  T. Arai, M.i Koshioka, K. Abe, M. Tomitori , R. Kokawa, M. Ohta, H. Yamada, K. Kobayashi, and N. Oyabu
- Journal Title
  
  Langmuir
  
  Volume: 31 Issue: 13 Pages: 3876-3883
- DOI
  10.1021/acs.langmuir.5b00087
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24221008, KAKENHI-PROJECT-24246014, KAKENHI-PROJECT-24340068, KAKENHI-PROJECT-25286057, KAKENHI-PROJECT-26600098, KAKENHI-PROJECT-26600101
[Journal Article] Difference in etching between Si(111) and (001) surfaces induced by atomic hydrogen irradiation observed by noncontact atomic force microscopy2015
- Author(s)
  Tomoaki Miyagi, Akira Sasahara, Masahiko Tomitori
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 54 Issue: 8S2 Pages: 08LB08-08LB08
- DOI
  10.7567/jjap.54.08lb08
- NAID
  210000145637
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-26630330, KAKENHI-PROJECT-24246014, KAKENHI-PROJECT-26600024
[Journal Article] Water wettability of Si(111) and (001) surfaces prepared to be reconstructed, atomic-hydrogen terminated and thinly oxidized in an ultrahigh vacuum chamber2015
- Author(s)
  Tomoaki Miyagi, Akira Sasahara, Masahiko Tomitori
- Journal Title
  
  Applied Surface Science
  
  Volume: 349 Pages: 904-910
- DOI
  10.1016/j.apsusc.2015.04.176
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-26630330, KAKENHI-PROJECT-24246014, KAKENHI-PROJECT-26600024
[Journal Article] Hydration of MgO(100) surface promoted at <011> steps2015
- Author(s)
  A. Sasahara, T. Murakami and M. Tomitori
- Journal Title
  
  J. Phys. Chem. C
  
  Volume: 119 Issue: 15 Pages: 8250-8257
- DOI
  10.1021/acs.jpcc.5b01759
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-24246014, KAKENHI-PROJECT-26600024
[Journal Article] Thermal transformation of 4,4”-diamino-p-terphenyl on a Si(111)-7×7 surface analyzed by X-ray photoemission spectroscopy and scanning tunneling microscopy2014
- Author(s)
  T. Nishimura, A. Sasahara, H. Murata, T. Arai and M. Tomitori
- Journal Title
  
  J. Phys. Chem. C
  
  Volume: 118 Issue: 43 Pages: 25104-25109
- DOI
  10.1021/jp508680a
- Peer Reviewed / Acknowledgement Compliant / Open Access
- Data Source
  KAKENHI-PROJECT-24246014, KAKENHI-PROJECT-24340068, KAKENHI-PROJECT-26600024, KAKENHI-PROJECT-26600098
[Journal Article] Stable alignment of 4,4”-diamino-p-terphenyl chemically adsorbed on a Si(001)-(2×1) surface observed by scanning tunneling microscopy2014
- Author(s)
  A. M. A. Hassan, T. Nishimura, A. Sasahara, H. Murata and M. Tomitori
- Journal Title
  
  Surf. Sci.
  
  Volume: 630 Pages: 96-100
- DOI
  10.1016/j.susc.2014.07.018
- NAID
  120005819531
- Peer Reviewed / Acknowledgement Compliant / Open Access
- Data Source
  KAKENHI-PROJECT-24246014, KAKENHI-PROJECT-26600024
[Journal Article] Resonance frequency-retuned quartz tuning fork as a force sensor for noncontact atomic force microscopy2014
- Author(s)
  H. Ooe, T. Sakuishi, M. Nogami, M. Tomitori and T. Arai
- Journal Title
  
  Appl. Phys. Lett.
  
  Volume: 105 Issue: 4
- DOI
  10.1063/1.4891882
- NAID
  120005650332
- Peer Reviewed / Acknowledgement Compliant / Open Access
- Data Source
  KAKENHI-PROJECT-24246014, KAKENHI-PROJECT-24340068, KAKENHI-PROJECT-26600098
[Journal Article] SPM のフロンティア～多様な材料系の研究ニーズに対応するSPM物性計測の最先端～2012
- Author(s)
  富取正彦
- Journal Title
  
  ペンシル型走査型プローブ顕微鏡の開発、顕微鏡
  
  Volume: 47 (1) Pages: 3-7
- Data Source
  KAKENHI-PROJECT-22656012
[Journal Article] Local interaction imaging by SiGe quantum dot probe2012
- Author(s)
  Y. Jeong, M. Hirade, R. Kokawa, H. Yamada, K. Kobayashi, N. Oyabu, T. Arai, A. Sasahara and M. Tomitori
- Journal Title
  
  Current Appl. Phys
  
  Volume: 12 Pages: 581-584
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20246012
[Journal Article] Local interaction imaging by SiGe quantum dot probe2012
- Author(s)
  Yonkil Jeong
- Journal Title
  
  Current Applied Physics
  
  Volume: 12 Issue: 2 Pages: 581-584
- DOI
  10.1016/j.cap.2011.09.005
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20246012, KAKENHI-PROJECT-20310058, KAKENHI-PROJECT-22656012, KAKENHI-PROJECT-23656030
[Journal Article] ペンシル型走査型プローブ顕微鏡の開発2012
- Author(s)
  富取正彦
- Journal Title
  
  顕微鏡
  
  Volume: 47 Pages: 3-7
- NAID
  10030552124
- Data Source
  KAKENHI-PROJECT-20246012
[Journal Article] ペンシル型走査型プローブ顕微鏡の開発2012
- Author(s)
  富取正彦
- Journal Title
  
  顕微鏡
  
  Volume: 47 Pages: 3-7
- NAID
  10030552124
- Data Source
  KAKENHI-PROJECT-22656012
[Journal Article] Adsorption state of 4, 4-diamino-p-terphenyl through an amino group bound to Si(111)-7×7 surface examined by X-ray photoelectron spectroscopy and scanning tunneling microscopy2010
- Author(s)
  T.Nishimura, A.Itabashi, A.Sasahara, H.Murata, T.Arai, M.Tomitori
- Journal Title
  
  J.Phys.Chem.C
  
  Volume: 114 Pages: 11109-11114
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20241034
[Journal Article] Atomic scale analysis of ultrathin SiO_2 films prepared on TiO_2(100) surfaces2010
- Author(s)
  Akira Sasahara, Chi Lun Pang, Masahiko Tomitori
- Journal Title
  
  J.Phys.Chem.C 114(47)
  
  Pages: 20189-20194
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20246012
[Journal Article] ナノ評価のための走査型プローブ顕微鏡法の概説と最近の話題2010
- Author(s)
  富取正彦
- Journal Title
  
  色材協会誌
  
  Volume: 83 (5) Pages: 233-239
- NAID
  10026218822
- Data Source
  KAKENHI-PROJECT-22656012
[Journal Article] Frequency modulation atomic force microscope observation of TiO_2(110) surfaces in water2010
- Author(s)
  A. Sasahara and M. Tomitori
- Journal Title
  
  J. Vac. Sci. and Technol. B
  
  Volume: 28(3)
- NAID
  120002260318
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20246012
[Journal Article] Adsorption state of 4, 4-diaminop-terphenyl through an amino group bound to Si(111)-7x7 surface examined by X-ray photoelectron spectroscopy and scanning tunneling microscopy2010
- Author(s)
  T. Nishimura, A. Itabashi, A. Sasahara, H. Murata, T. Arai and M. Tomitori
- Journal Title
  
  J. Phys. Chem. C
  
  Volume: 114 Pages: 11109-11114
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20246012
[Journal Article] Adsorption State of 4,4"-Diamino-p-terphenyl through an Amino Group Bound to Si(111)-7x7 Surface Examined by X-ray Photoelectron Spectroscopy and Scanning Tunneling Microscopy2010
- Author(s)
  Takashi Nishimura, Atsushi Itabashi, Akira Sasahara, Hideyuki Murata, Toyoko Arai, Masahiko Tomitori
- Journal Title
  
  J.Phys.Chem.C 114(25)
  
  Pages: 11109-11114
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20310058
[Journal Article] Frequency modulation atomic force microscope observation of TiO2(110) surfaces in water2010
- Author(s)
  Akira Sasahara, Masahiko Tomitori
- Journal Title
  
  J.Vac.Sci.Technol.B 28(3)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20246012
[Journal Article] Adsorption State of 4, 4 Diamino-p-terphenyl through an Amino Group Bound to Si(111)-7x7 Surface Examined by X-ray Photoelectron Spectroscopy and Scanning Tunneling Microscopy2010
- Author(s)
  Nishimura, T., Itabashi, A., Sasahara, A., Murata, H., Arai, T., Tomitori, M.
- Journal Title
  
  J. Phys. Chem. C
  
  Volume: 114 Issue: 25 Pages: 11109-11114
- DOI
  10.1021/jp102976a
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20310058
[Journal Article] Adsorption state of 4,4"-diamino-p-terphenyl through an amino group bound to Si(111)-7x7 surface examined by X-ray photoelectron spectroscopy and scanning tunneling microscopy2010
- Author(s)
  Takashi Nishimura, Atsushi Itabashi, Akira Sasahara, Hideyuki Murata, Toyoko Arai, Masahiko Tomitori
- Journal Title
  
  J.Phys.Chem.C 114(25)
  
  Pages: 11109-11114
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20246012
[Journal Article] Atomic scale analysis of ultra thin SiO_2 films prepared on TiO_2(100) surfaces2010
- Author(s)
  A. Sasahara, C. L. Pang and M. Tomitori
- Journal Title
  
  J. Phys. Chem. C
  
  Volume: 114 Pages: 20189-20194
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20246012
[Journal Article] Adsorption state of 4, 4"-diamino-p-terphenyl through an amino group bound to Si(111)-7×7 surface examined by X-ray photoelectron spectroscopy and scanning tunneling microscopy2010
- Author(s)
  T. Nishimura, A. Itabashi, A. Sasahara, H. Murata, T. Arai and M. Tomitori
- Journal Title
  
  J. Phys. Chem. C
  
  Volume: 114 Pages: 11109-11114
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20241034
[Journal Article] Adsorption state of 4,4"-diamino-p-terphenyl through an amino group bound to Si(111)-7×7 surface examined by X-ray photoelectron Spectroscopy and scanning tunneling microscopy2010
- Author(s)
  T.Nishimura, A.Itabashi, A.Sasahara, H.Murata, T.Arai, M.Tomitori
- Journal Title
  
  J.Phys.Chem.C 114
  
  Pages: 11109-11114
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20241034
[Journal Article] オノ評価のための走査型プローブ顕微鏡法の概説と最近の話題2010
- Author(s)
  富取正彦
- Journal Title
  
  色材協会誌
  
  Volume: 83 Pages: 233-239
- Data Source
  KAKENHI-PROJECT-20246012
[Journal Article] Low-flux elucidation of initial growth of Ge clusters deposited on Si(111)-7x7 observed by scanning tunneling microscopy2009
- Author(s)
  Z. A. Ansari, T. Arai and M. Tomitori
- Journal Title
  
  Phys. Rev. B
  
  Volume: 79
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20246012
[Journal Article] Low-flux elucidation of initial growth of Ge clusters deposited on Si(111)-7x7 observed by scanning tunneling microscopy2009
- Author(s)
  Z.A.Ansari, T.Arai, M.Tomitori
- Journal Title
  
  Phys.Rev.B(リポジトリ) 79
- NAID
  120001316586
- URL
  http://dspace.lib.kanazawa-u.ac.jp/dspace/handle/2297/17500
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20310058
[Journal Article] Low-flux elucidation of initial growth of Ge clusters deposited on Si (111) -7×7 observed by scanning tunneling microscopy2009
- Author(s)
  Z. A. Ansari, T. Arai, M. Tomitori
- Journal Title
  
  Physical Review B 79
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20246012
[Journal Article] Low-flux elucidation of initial growth of Ge clusters deposited on Si(111)-7x7 observed by scanning tunneling microscopy2009
- Author(s)
  Zubaida A.Ansari, Toyoko Arai, Masahiko Tomitori
- Journal Title
  
  Phys.Rev.B 79(3)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20246012
[Journal Article]2009
- Author(s)
  富取正彦, 新井豊子(分担執筆)
- Journal Title
  
  実験物理科学シリーズ6 "走査プローブ顕微鏡「発展編第10章非接触AFMの展開」"(重川秀美、吉村雅満、河津璋編)(共立出版)
  
  Pages: 357-363
- Data Source
  KAKENHI-PROJECT-20246012
[Journal Article] Low-flux elucidation of initial growth of Ge clusters deposited on Si(111)-7x7 observed by scanning tunneling microscopy2009
- Author(s)
  Ansari, Z. A., Arai, T., Tomitori, M.
- Journal Title
  
  Phys. Rev. B
  
  Volume: 79 Issue: 3
- DOI
  10.1103/physrevb.79.033302
- NAID
  120001316586
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20310058
[Journal Article] 走査型プローブ顕微鏡にみる電圧印加のナノ力学的相互作用2008
- Author(s)
  富取正彦
- Journal Title
  
  表面科学 29
  
  Pages: 239-245
- NAID
  10021165886
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17310069
[Journal Article] 走査型プローブ顕微鏡にみる電圧印加のナノ力学的相互作用2008
- Author(s)
  富取正彦、新井豊子
- Journal Title
  
  表面科学(リポジトリ) 29(4)
  
  Pages: 239-245
- NAID
  10021165886
- URL
  https://dspace.jaist.ac.jp/dspace/handle/10119/7939
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20310058
[Journal Article] Nanomechanical interaction under bias voltage in scanning probe microscopy(in Japanese)2008
- Author(s)
  M. Tomitori, T. Arai
- Journal Title
  
  Hyomen Kagaku 28
  
  Pages: 239-245
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Journal Article] 走査型プローブ顕微鏡にみる電圧印加のナノカ学的相互作用2008
- Author(s)
  富取正彦
- Journal Title
  
  表面科学 29
  
  Pages: 239-245
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20310058
[Journal Article] 研究紹介"走査型プローブ顕微鏡にみる電圧印加のナノ力学的相互作用"2008
- Author(s)
  富取正彦、新井豊子
- Journal Title
  
  表面科学
  
  Volume: 29(4) Pages: 239-245
- Data Source
  KAKENHI-PROJECT-20246012
[Journal Article] Nanomechanical Interaction between a Tip and a Sample with Changing Bias Voltage Observed by Using Scanning Probe Microscopy2008
- Author(s)
  富取正彦, 新井豊子
- Journal Title
  
  Hyomen Kagaku
  
  Volume: 29 Issue: 4 Pages: 239-245
- DOI
  10.1380/jsssj.29.239
- NAID
  130004486490
- ISSN
  0388-5321, 1881-4743
- Language
  Japanese
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20310058
[Journal Article] 走査型プローブ顕微鏡にみる電圧印加のナノ力学的相互作用2008
- Author(s)
  富取正彦
- Journal Title
  
  表面科学 29
  
  Pages: 239-245
- NAID
  10021165886
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Journal Article] 走査型プローブ顕微鏡にみる電圧印加のナノ力学的相互作用2008
- Author(s)
  富取正彦, 新井豊子
- Journal Title
  
  表面科学 29(4)
  
  Pages: 239-245
- NAID
  10021165886
- Data Source
  KAKENHI-PROJECT-20246012
[Journal Article] 走査型プローブ顕微鏡にみる電圧印加のナノ力学的相互作用2008
- Author(s)
  富取正彦、新井豊子
- Journal Title
  
  表面科学 29
  
  Pages: 239-245
- NAID
  10021165886
- Data Source
  KAKENHI-PROJECT-17206005
[Journal Article] 走査型プローブ顕微鏡にみる電圧印加のナノ力学的相互作用2008
- Author(s)
  富取正彦、新井豊子
- Journal Title
  
  表面科学 29
  
  Pages: 239-245
- NAID
  10021165886
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18041007
[Journal Article] 走査型プローブ顕微鏡にみる電圧印加のナノカ学的相互作用2008
- Author(s)
  富取正彦, 新井豊子
- Journal Title
  
  表面科学 29
  
  Pages: 239-245
- Data Source
  KAKENHI-PROJECT-20246012
[Journal Article] Nanoscale Manipulation and Characterization Using SPM-Based Instruments2007
- Author(s)
  Masahiko TOMITORI
- Journal Title
  
  The Fifteenth International Conference on COMPOSITES/NANO ENGINEERING(ICCE-15)proceedings
  
  Pages: 950-953
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17310069
[Journal Article] Nanoscale Manipulation and Characterization Using SPM-Based Instruments2007
- Author(s)
  Masahiko, TOMITORI
- Journal Title
  
  The Fifteenth International Conference on COMPOSITES/ NANO ENGINEERING (ICCE - 15) proceedings
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17310069
[Journal Article] Atomic force microscope Si tip with Ge clusters with the capability of remoulding by heating2007
- Author(s)
  Z.A.Ansari, T.Arai, M.Tomitori
- Journal Title
  
  Nanotechnology 18・8
  
  Pages: 84020-84020
- Data Source
  KAKENHI-PROJECT-17310069
[Journal Article] Atomic force microscope Si tip with Ge clusters with the capability of remoulding by heating2007
- Author(s)
  Z. A. Ansari, T. Arai and M. Tomitori
- Journal Title
  
  Nanotechnology 18
  
  Pages: 84020-84025
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18041007
[Journal Article] Chapter 5 Scanning tunneling microscopy(in Japanese)2007
- Author(s)
  M. Tomitori
- Journal Title
  
  Introduction series to nanotechnology (Kyoritsu) III, 254
  
  Pages: 87-99
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Journal Article] Tomitori : Atomic force microscope Si tip with Ge clusters with the capability of remoulding by heating2007
- Author(s)
  Z.A. Ansari, T. Arai, M. Tomitori
- Journal Title
  
  Nanotechnology 18
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Journal Article] Nanoscale manipulation and characterization using SPM-Based Instruments2007
- Author(s)
  M. Tomitori, Y. Ohkubo, M. Tani, T. Arai
- Journal Title
  
  The fifteenth international conference on composites/nano engineering (ICCE -15)
  
  Pages: 950-953
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Journal Article] Chapter 6 STM, 6.2 Apparatus and methodology, 6.2.3 Example of observation(in Japanese)2007
- Author(s)
  M. Tomitori
- Journal Title
  
  Handbook of Surface Physical Property Engineering, (Maruzen) 1050
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Journal Article] Nanoscale manipulation and characterization using SPM-based instruments2007
- Author(s)
  M. Tomitori
- Journal Title
  
  The 15th Intemational Confbrence on Composites/Nano Engineering(ICCE-15)
  
  Pages: 950-953
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Journal Article] Atomic force microscope Si tip with Ge clusters with the capability of remoulding by heating2007
- Author(s)
  Z.A.Ansari, T.Arai, M.Tomitori
- Journal Title
  
  Nanotechnology 18(8)
  
  Pages: 84020-6
- Data Source
  KAKENHI-PROJECT-17206005
[Journal Article] Atomic force microscope Si tip with Ge clusters with the capability of remoulding by heating2007
- Author(s)
  Z.A. Ansari, T. Arai, M. Tomitori
- Journal Title
  
  Nanotechnology 18
  
  Pages: 6-6
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17310069
[Journal Article] Chapter 4 Vacuum technology", (in Japanese)2007
- Author(s)
  M. Tomitori
- Journal Title
  
  Introduction series to nanotechnology (Kyoritsu) IV, 243
  
  Pages: 65-93
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Journal Article] Evidence of temperature dependence of initial adsorption sites of Ge atoms on Si(111)-7x72006
- Author(s)
  Z.A.Ansari, M.Tomitori, T.Arai
- Journal Title
  
  Applied Physics Letters in print
- NAID
  120000861401
- Data Source
  KAKENHI-PROJECT-17310069
[Journal Article] Energy spectra of electrons backscattered from sample surfaces with hetero structures using field emission scanning tunneling microscopy2006
- Author(s)
  M. Hirade, T. Arai, M. Tomitori
- Journal Title
  
  Jpn. J. Appl. Phys 45(3B)
  
  Pages: 2278-2282
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17310069
[Journal Article] Evidence of temperature dependence of initial adsorption sites of Ge atoms on Si(111)-7x72006
- Author(s)
  Z.A. Ansari, T. Arai, M. Tomitori
- Journal Title
  
  Appl. Phys. Lett 88
- NAID
  120000861401
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Journal Article] Energy spectra of electrons backscattered from sample surfaces with hetero structures using field emission scanning tunneling microscopy2006
- Author(s)
  M. Hirade, T. Arai, M. Tomitori
- Journal Title
  
  Jpn. J. Appl. Phys 45(3B)
  
  Pages: 2278-2282
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Journal Article] 電圧印加非接触原子間力分光法による量子力学的共鳴相互作用の測定2006
- Author(s)
  新井豊子, 富取正彦
- Journal Title
  
  固体物理 40(8)
  
  Pages: 581-590
- NAID
  40006867381
- Data Source
  KAKENHI-PROJECT-17206005
[Journal Article] Electric conductance through chemical bonding states being formed between a Si tip and a Si(111)7x7 surface by bias-voltage noncontact atomic force spectroscopy2006
- Author(s)
  T.Arai, M.Tomitori
- Journal Title
  
  Physical Review B 73
  
  Pages: 73307-73307
- NAID
  120001316581
- Data Source
  KAKENHI-PROJECT-17310069
[Journal Article] Electric conductance through chemical bonding states being formed between a Si tip and a Si(111)-7x7 surface by bias-voltage noncontact atomic force spectroscopy2006
- Author(s)
  T. Arai, M. Tomitori
- Journal Title
  
  Phys. Rev. B 73
- NAID
  120001316581
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Journal Article] Evidence of temperature dependence of initial adsorption sites of Geatoms on Si(111)-7x72006
- Author(s)
  Z.A.Ansari, M.Tomitori, T.Arai
- Journal Title
  
  Applied Physics Letters 88
  
  Pages: 171902-171902
- NAID
  120000861401
- Data Source
  KAKENHI-PROJECT-17310069
[Journal Article] Evidence of temperature dependence of initial adsorption sites of Ge atoms on Si(111)-7x72006
- Author(s)
  Z.A. Ansari, T. Arai, M. Tomitori
- Journal Title
  
  Appl. Phys. Lett 88
- NAID
  120000861401
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17310069
[Journal Article] Energy spectra of electrons backscattered from sample surfaces wit hetero structures using field emission scanning tunneling microscopy2006
- Author(s)
  M.Hirade, T.Arai, M.Tomitori
- Journal Title
  
  Japanese Journal of Applied Physics 45(3B)
  
  Pages: 2278-2282
- Data Source
  KAKENHI-PROJECT-17206005
[Journal Article] Energy spectra of electrons backscattered from sample surfaces with hetero structures using field emission scanning tunneling microscopy2006
- Author(s)
  M.Hirade, T.Arai, M.Tomitori
- Journal Title
  
  Japanese Journal of Applied Physics 45(3B)
  
  Pages: 2278-2278
- Data Source
  KAKENHI-PROJECT-17310069
[Journal Article] Electric conductance through chemical bonding states being formed between a Si tip and a Si(111)-7x7 surface by bias-voltage noncontact atomic force spectroscopy2006
- Author(s)
  T. Arai, M. Tomitori
- Journal Title
  
  Phys. Rev 73
- NAID
  120001316581
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17310069
[Journal Article] Evidence of temperature dependence of initial adsorption sites of Ge atoms on Si(111)-7x72006
- Author(s)
  Z.A.Ansari, M.Tomitori, T.Arai
- Journal Title
  
  Applied Physics Letters 88
  
  Pages: 171902-3
- NAID
  120000861401
- Data Source
  KAKENHI-PROJECT-17206005
[Journal Article] Electric conductance through chemical bonding states being formed between a Si tip and a Si(111)7x7 surface by bias-voltage noncontact atomic force spectroscopy2006
- Author(s)
  T.Arai, M.Tomitori
- Journal Title
  
  Physical Review B 73
- NAID
  120001316581
- Data Source
  KAKENHI-PROJECT-17206005
[Journal Article] 2. Scanning tunneling microscopy, pp. 7-14 ; S. Hasegawa and M. Tomitori : 18. Characterization of semiconducting materials2006
- Author(s)
  M. Tomitori
- Journal Title
  
  Scanning probe microscopy roadmap 2005, edited by S. Morita, (Springer-Verlag, Berlin) 201
  
  Pages: 133-137
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Journal Article] Energy spectra of electrons backscattered from sample surfaces with hetero structures using field emission scanning tunneling microscopy2006
- Author(s)
  M.Hirade, T.Arai, M.Tomitori
- Journal Title
  
  Japanese Journal of Applied Physics in print
- Data Source
  KAKENHI-PROJECT-17310069
[Journal Article] 最近の研究と技術"電圧印加非接触原子間力顕微鏡法を利用した探針-試料間の相互作用力分光法"2005
- Author(s)
  富取正彦
- Journal Title
  
  顕微鏡 40
  
  Pages: 193-195
- Description
  「研究成果報告書概要(和文)」より
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17206005
[Journal Article] 最近の研究と技術"電圧印加非接触原子間力顕微鏡法を利用した探針-試料間の相互作用力分光法"2005
- Author(s)
  富取正彦
- Journal Title
  
  顕微鏡 40
  
  Pages: 193-195
- Description
  「研究成果報告書概要(和文)」より
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17310069
[Journal Article] A Si nanopillar grown on a Si tip by atomic force microscopy in ultrahigh vacuum for a high-quality scanning probe2005
- Author(s)
  T. Arai, M. Tomitori
- Journal Title
  
  Appl. Phys. Lett 86
- NAID
  120000861400
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17310069
[Journal Article] Chapter 2.1 STM, 5.2 Evaluation of semiconducting materials(in Japanese)2005
- Author(s)
  M. Tomitori
- Journal Title
  
  Scanning probe microscopy -recent developments and future prospects, edited by S. Morita, (Maruzen) 202
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Journal Article] Hexagonal arrangement of Ge clusters self-organized on a template of half unit cells of Si(111)-7x7 observed by scanning tunneling microscopy2005
- Author(s)
  Z.A. Ansari, T. Arai, M. Tomitori
- Journal Title
  
  Surf Sci. Lett 574
  
  Pages: 17-22
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17310069
[Journal Article] Interaction force spectroscopy between a sample and a tip by bias-voltage noncontact atomic force microscopy(in Japanese)2005
- Author(s)
  M. Tomitori, T. Arai
- Journal Title
  
  Kenbikyou 40
  
  Pages: 193-195
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Journal Article] Measurement of quantum mechanical resonant interaction by bias-voltage noncontact atomic force microscopy(in Japanese)2005
- Author(s)
  T. Arai, M. Tomitori
- Journal Title
  
  Kotai Butsuri 40
  
  Pages: 47-56
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Journal Article] Hexagonal arrangement of Ge clusters self-organized on a template of half unit cells of Si(111)-7x7 observed by scanning tunneling microscopy2005
- Author(s)
  Z. A. Ansari, T. Arai, M. Tomitori
- Journal Title
  
  Surf. Sci. Lett 574
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Journal Article] "2. Scanning tunneling microscopy", S. Hasegawa and M. Tomitori : "18. Characterization of semiconducting materials"2005
- Author(s)
  M. Tomitori
- Journal Title
  
  Scanning probe microscopy roadmap edited by S. Morita, (2006) (Springer-Verlag, Berlin)
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17310069
[Journal Article] A Si nanopillar grown on a Si tip by atomic force microscopy in ultrahigh vacuum for a high-quality scanning probe2005
- Author(s)
  T. Arai, M. Tomitori
- Journal Title
  
  Appl. Phys. Lett 86
- NAID
  120000861400
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Journal Article] 電圧印加非接触原子間力分光法による量子力学的共鳴相互作用の測定2005
- Author(s)
  新井豊子, 富取正彦
- Journal Title
  
  固体物理 40(8)
  
  Pages: 581-590
- NAID
  40006867381
- Data Source
  KAKENHI-PROJECT-17310069
[Journal Article] Chapter 4 Mechanical spectroscopy, 4.4 Dissipation and non-conservative force measurements(in Japanese)2005
- Author(s)
  M. Tomitori, T. Arai
- Journal Title
  
  Practical nanotechnology -scanning probe microscopy and local spectroscopy, (Shokabo) 429
  
  Pages: 196-207
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Journal Article] Observation of electronic states on Si(111)-7x7 through short-range attractive force2004
- Author(s)
  T. Arai, M. Tomitori
- Journal Title
  
  Phys. Rev. Lett 93
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17310069
[Journal Article] ナノ評価のための走査型プローブ顕微鏡法の概説と最近の話題
- Author(s)
  富取正彦
- Journal Title
  
  色材協会誌 (in print)
  
  Pages: 7-7
- NAID
  10026218822
- Data Source
  KAKENHI-PROJECT-20246012
[Journal Article] Frequency modulation atomic force microscope observation of TiO_2 (110) Surfaces in water
- Author(s)
  笹原亮, 富取正彦
- Journal Title
  
  J.Vac.Sci.and Technol.B (in print)
- NAID
  120002260318
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20246012
[Journal Article] Lateral distribution of Li atoms at the initial stage of adsorption on TiO_2(110) surface
- Author(s)
  H. Tatsumi, A. Sasahara and M. Tomitori
- Journal Title
  
  J. Phys. Chem. C
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20246012
[Patent] カンチレバー加熱機構、それを用いたカンチレバーホルダ、及び、カンチレバー加熱方法2011
- Inventor(s)
  富取正彦、平出雅人
- Industrial Property Rights Holder
  北陸先端科学技術大学院大学
- Filing Date
  2011-02-07
- Data Source
  KAKENHI-PROJECT-20246012
[Patent] Positioning mechanism and microscope with the same2010
- Inventor(s)
  富取正彦、新井豊子、中榮穣
- Industrial Property Rights Holder
  北陸先端科学技術大学院大学
- Acquisition Date
  2010-03-02
- Overseas
- Data Source
  KAKENHI-PROJECT-20310058
[Patent] Positioning mechanism and microscope with the same(ポジショニング機構、及び、それを用いた顕微鏡)2010
- Inventor(s)
  富取正彦、新井豊子、中榮穣
- Industrial Property Rights Holder
  北陸先端科学技術大学院大学
- Acquisition Date
  2010-03-02
- Data Source
  KAKENHI-PROJECT-20310058
[Patent] ポジショニング機構、及び、それを用いた顕微鏡2010
- Inventor(s)
  富取正彦、新井豊子、中榮穣
- Industrial Property Rights Holder
  北陸先端科学技術大学院大学
- Filing Date
  2010-12-17
- Data Source
  KAKENHI-PROJECT-20310058
[Patent] Positioning mechanism and microscope with the same2010
- Inventor(s)
  富取正彦、新井豊子、中榮穣
- Industrial Property Rights Holder
  北陸先端科学技術大学院大学
- Filing Date
  2010-03-02
- Overseas
- Data Source
  KAKENHI-PROJECT-20310058
[Patent] Positioning mechanism and microscope with the same2010
- Inventor(s)
  富取正彦, 新井豊子, 中榮穣
- Industrial Property Rights Holder
  北陸先端科学技術大学院大学
- Filing Date
  2010-03-02
- Overseas
- Data Source
  KAKENHI-PROJECT-20246012
[Patent] Positioning mechanism and microscope with the same(ポジショニング機構、及び、それを用いた顕微鏡)2010
- Inventor(s)
  富取正彦、新井豊子、中榮穣
- Industrial Property Rights Holder
  北陸先端科学技術大学院大学
- Acquisition Date
  2010-03-02
- Data Source
  KAKENHI-PROJECT-20246012
[Patent] カンチレバー加熱機構、それを用いたカンチレバーホルダ、及び、カンチレバー加熱方法2009
- Inventor(s)
  富取正彦、平出雅人
- Industrial Property Rights Holder
  北陸先端科学技術大学院大学
- Filing Date
  2009-09-04
- Overseas
- Data Source
  KAKENHI-PROJECT-20246012
[Presentation] Estimation of Critical Shear Stress of Au nanocontacts using microscopic nanomechanics measurement method2023
- Author(s)
  Jiaming Liu, Toyoko Arai, Masahiko Tomitori, and Yoshifumi Oshima
- Organizer
  JAIST International Symposium of Nano-Materials for Novel Devices
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18191
[Presentation] 顕微ナノメカニックス計測法による金ナノ接点臨界せん断応力の計測2023
- Author(s)
  劉佳明、新井豊子、富取正彦、大島義文
- Organizer
  令和５年度応用物理学会北陸・信越支部学術講演会
- Data Source
  KAKENHI-PROJECT-21K18191
[Presentation] High-temperature flame etching to prepare tungsten tips for scanning probe microscopy2023
- Author(s)
  Toyoko Arai, Nobuhiko Utsunomiya, Masahiko Tomitori
- Organizer
  The 24rd International Conference on Non-contact Atomic Force Microscopy　(ncAFM2023)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22H00279
[Presentation] Structural and chemical analysis of tungsten tips for scanning probe microscopy prepared by flame etching2023
- Author(s)
  Yohei Nakano, Nobuhiko Utsunomiya, Toyoko Arai, Masahiko Tomitori
- Organizer
  JAIST International Symposium of Nano-Materials for Novel Devices
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18191
[Presentation] Structural and chemical analysis of tungsten tips for scanning probe microscopy prepared by flame etching2023
- Author(s)
  Yohei Nakano, Nobuhiko Utsunomiya, Toyoko Arai, Masahiko Tomitori
- Organizer
  JAIST International Symposium of Nano-Materials for Novel Devices
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22H00279
[Presentation] Introduction of microscopic nanomechanical measurement method2023
- Author(s)
  Atsuki Uno, Jiaming Liu, Toyoko Arai, Masahiko Tomitori, and Yoshifumi Oshima
- Organizer
  JAIST International Symposium of Nano-Materials for Novel Devices
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22H00279
[Presentation] Introduction of microscopic nanomechanical measurement method2023
- Author(s)
  Atsuki Uno, Jiaming Liu, Toyoko Arai, Masahiko Tomitori, and Yoshifumi Oshima
- Organizer
  JAIST International Symposium of Nano-Materials for Novel Devices
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18191
[Presentation] High-temperature flame etching to prepare tungsten tips for scanning probe microscopy2023
- Author(s)
  Toyoko Arai, Nobuhiko Utsunomiya, Masahiko Tomitori
- Organizer
  The 24rd International Conference on Non-contact Atomic Force Microscopy　(ncAFM2023)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18191
[Presentation] Real-Space DFT simulation of energy dissipation due to atomic displacements of a Si tip and a Si(111)-(7×7) surface detected by nc-AFM2023
- Author(s)
  Toyoko Arai, Jun-Ichi Iwata, Atsushi Oshiyama, Masahiko Tomitori
- Organizer
  The 24rd International Conference on Non-contact Atomic Force Microscopy　(ncAFM2023)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22H00279
[Presentation] Estimation of Critical Shear Stress of Au nanocontacts using microscopic nanomechanics measurement method2023
- Author(s)
  Jiaming Liu, Toyoko Arai, Masahiko Tomitori, and Yoshifumi Oshima
- Organizer
  JAIST International Symposium of Nano-Materials for Novel Devices
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22H00279
[Presentation] Real-Space DFT simulation of energy dissipation due to atomic displacements of a Si tip and a Si(111)-(7×7) surface detected by nc-AFM2023
- Author(s)
  Toyoko Arai, Jun-Ichi Iwata, Atsushi Oshiyama, Masahiko Tomitori
- Organizer
  The 24rd International Conference on Non-contact Atomic Force Microscopy　(ncAFM2023)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18191
[Presentation] 顕微ナノメカニックス計測法による金ナノ接点臨界せん断応力の計測2023
- Author(s)
  劉佳明、新井豊子、富取正彦、大島義文
- Organizer
  令和５年度応用物理学会北陸・信越支部学術講演会
- Data Source
  KAKENHI-PROJECT-22H00279
[Presentation] 水晶振動子を組み込んだTEM法による金ナノ接点の臨界せん断応力サイズ依存性の研究2022
- Author(s)
  劉佳明、富取正彦、新井豊子、大島義文
- Organizer
  第69回応用物理学会春季学術講演会、3月25日、青山学院大学相模原キャンパス、相模原市
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] 水素-酸素ガス炎エッチングによって調整したタングステン探針の評価2022
- Author(s)
  宇都宮信彦, 富取正彦, 新井豊子
- Organizer
  第70回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-21K18191
[Presentation] 水素-酸素ガス炎エッチングによって調整したタングステン探針の評価2022
- Author(s)
  宇都宮信彦, 富取正彦, 新井豊子
- Organizer
  第70回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-22H00279
[Presentation] Surface Effect on Young’s Modulus of Sub-Two-Nanometer Gold [111] Nanocontacts2022
- Author(s)
  Jiaqi Zhang, Masahiko Tomitori, Toyoko Arai, Yoshifumi Oshima
- Organizer
  The 22nd International vacuum congress (IVC-22)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18191
[Presentation] 炎アニールにより先鋭化したタングステン探針の作製と先端形状評価2022
- Author(s)
  宇都宮信彦, 中野陽平, 富取正彦, 新井豊子
- Organizer
  令和５年度応用物理学会北陸・信越支部学術講演会
- Data Source
  KAKENHI-PROJECT-21K18191
[Presentation] 水晶振動子を組み込んだ TEM 法による金ナノコンタクト臨界せん断応力の計測2022
- Author(s)
  劉佳明、富取正彦、新井豊子、大島義文
- Organizer
  ISSP workshop “Frontier of scanning probe microscopy and related nano science”、3月29日、online
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] 周波数変調原子間力顕微鏡を用いた金属の表面抵抗評価2022
- Author(s)
  島尚生, 加藤貴洋, 富取正彦, 新井豊子
- Organizer
  第70回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-22H00279
[Presentation] Surface Effect on Young’s Modulus of Sub-Two-Nanometer Gold [111] Nanocontacts2022
- Author(s)
  Jiaqi Zhang, Masahiko Tomitori, Toyoko Arai, Yoshifumi Oshima
- Organizer
  The 22nd International vacuum congress (IVC-22)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22H00279
[Presentation] Critical shear stress of gold nanocontact measured by TEM combined with a quartz resonator2022
- Author(s)
  Jiaming Liu, Jiaqi Zhang, Toyoko Arai, Masahiko Tomitori, Yoshifumi Oshima
- Organizer
  The 22nd International vacuum congress (IVC-22)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22H00279
[Presentation] 炎アニールにより先鋭化したタングステン探針の作製と先端形状評価2022
- Author(s)
  宇都宮信彦, 中野陽平, 富取正彦, 新井豊子
- Organizer
  令和５年度応用物理学会北陸・信越支部学術講演会
- Data Source
  KAKENHI-PROJECT-22H00279
[Presentation] 周波数変調原子間力顕微鏡を用いた金属の表面抵抗評価2022
- Author(s)
  島尚生, 加藤貴洋, 富取正彦, 新井豊子
- Organizer
  第70回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-21K18191
[Presentation] Surface resistivity evaluated by frequency modulation atomic force microscopy through Joule heat energy dissipation2022
- Author(s)
  M. Tomitori, M. M. Hasan, T. Kato, T. Arai
- Organizer
  The 23rd International Conference on Non-contact Atomic Force Microscopy
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22H00279
[Presentation] Non-contact evaluation of surface resistivity using frequency modulation atomic force microscopy2022
- Author(s)
  Takahiro Kato, Md Mahamudul Hasan, Masahiko Tomitori, Toyoko Arai
- Organizer
  The 22nd International vacuum congress (IVC-22)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22H00279
[Presentation] Surface resistivity evaluated by frequency modulation atomic force microscopy through Joule heat energy dissipation2022
- Author(s)
  M. Tomitori, M. M. Hasan, T. Kato, T. Arai
- Organizer
  The 23rd International Conference on Non-contact Atomic Force Microscopy
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18191
[Presentation] Non-contact evaluation of surface resistivity using frequency modulation atomic force microscopy2022
- Author(s)
  Takahiro Kato, Md Mahamudul Hasan, Masahiko Tomitori, Toyoko Arai
- Organizer
  The 22nd International vacuum congress (IVC-22)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18191
[Presentation] Critical shear stress of gold nanocontact measured by TEM combined with a quartz resonator2022
- Author(s)
  Jiaming Liu, Jiaqi Zhang, Toyoko Arai, Masahiko Tomitori, Yoshifumi Oshima
- Organizer
  The 22nd International vacuum congress (IVC-22)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18191
[Presentation] 長辺振動水晶振動子（LER）を用いた顕微ナノメカニクス計測法の開発～原子間結合強度の測定～2022
- Author(s)
  大島義文, Jiaqi Zhang, 新井豊子, 富取正彦
- Organizer
  電子情報通信学会　　電子デバイス研究会（ED）
- Invited
- Data Source
  KAKENHI-PROJECT-22H00279
[Presentation] 長辺振動水晶振動子（LER）を用いた顕微ナノメカニクス計測法の開発～原子間結合強度の測定～2022
- Author(s)
  大島義文, Jiaqi Zhang, 新井豊子, 富取正彦
- Organizer
  電子情報通信学会　　電子デバイス研究会（ED）
- Invited
- Data Source
  KAKENHI-PROJECT-21K18191
[Presentation] Mechanical properties of atomic bonds in Pt atomic chains measured by TEM coupled with a quartz resonator2021
- Author(s)
  Jiaqi Zhang, Keisuke Ishizuka, Masahiko Tomitori, Toyoko Arai, and Yoshifumi Oshima
- Organizer
  第68回応用物理学会春季学術講演会、3月16_19日、online
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Critical shear stress of gold nanocontact measured by TEM combined with a quartz resonator2021
- Author(s)
  Jiaming Liu, Jiaqi Zhang, Toyoko Arai, Masahiko Tomitori, and Yoshifumi Oshima
- Organizer
  第82回応用物理学会秋季学術講演会、9月13日、online
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Observation of mechanical energy dissipation between a conductive tip and a thin dielectric film on a metal-coated Si-substrate by frequency modulated atomic force microscopy2021
- Author(s)
  Md Mahamudul Hassan and Masahiko Tomitori
- Organizer
  第68回応用物理学会春季学術講演会、3月16_19日、online
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Mechanical properties of Pt atomic chains measured by TEM coupled with a quartz resonator2021
- Author(s)
  Jiaqi Zhang, Masahiko Tomitori, Toyoko Arai, Kenta Hongo, Ryo Maezono, Yoshifumi Oshima
- Organizer
  第82回応用物理学会秋季学術講演会
- Data Source
  KAKENHI-PROJECT-21K18191
[Presentation] In-situ observation of electro-deposition and stripping of lead using a high-resolution scanning electron microscope with an electrochemical cell2021
- Author(s)
  Gada He, Yoshifmi Oshima, and Masahiko Tomitori
- Organizer
  第68回応用物理学会春季学術講演会、3月16_19日、online
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Mechanical properties of Pt atomic chains measured by TEM coupled with a quartz resonator2021
- Author(s)
  Jiaqi Zhang, Masahiko Tomitori, Toyoko Arai, and Yoshifumi Oshima
- Organizer
  The Material Research Meeting 2021 (MRM2021), Dec. 16, パシフィコ横浜北、横浜市
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] 水晶振動子を組み込んだ TEM法による金ナノ接点の臨界せん断応力サイズ依存性の研究2021
- Author(s)
  劉佳明、張家奇、新井豊子、富取正彦、大島義文
- Organizer
  第69回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-21K18191
[Presentation] 白金原子鎖の機械的性質2021
- Author(s)
  Jiaqi Zhang, Masahiko Tomitori, Toyoko Arai, and Yoshifumi Oshima
- Organizer
  日本顕微鏡学会第77回学術講演会、6月14-16日、つくば国際会議場、つくば市
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Critical shear stress of gold nanocontact measured by TEM combined with a quartz resonator2021
- Author(s)
  Jiaming Liu, Jiaqi Zhang, Toyoko Arai, Masahiko Tomitori, Yoshifumi Oshima
- Organizer
  第82回応用物理学会秋季学術講演会
- Data Source
  KAKENHI-PROJECT-21K18191
[Presentation] Critical shear stress of gold nanocontact measured by TEM combined with a quartz resonator2021
- Author(s)
  Jiaming Liu, Jiaqi Zhang, Toyoko Arai, Masahiko Tomitori, and Yoshifumi Oshima
- Organizer
  The 9th International Symposium on Surface Science, Dec. 1, online
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Mechanical properties of Pt atomic chains measured by TEM coupled with a quartz resonator2021
- Author(s)
  Jiaqi Zhang, Masahiko Tomitori, Toyoko Arai, and Yoshifumi Oshima
- Organizer
  The 9th International Symposium on Surface Science, Dec. 1, online
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] 周波数変調原子間力顕微鏡を用いた表面抵抗測定法の考察2021
- Author(s)
  高畠侑馬、浜本和、富取正彦、新井豊子
- Organizer
  令和４年度応用物理学会北陸・信越支部学術講演会
- Data Source
  KAKENHI-PROJECT-21K18191
[Presentation] Measurement of critical shear stress of gold nanocontacts by in-situ transmission electron microscopy equipped with a quartz resonator2021
- Author(s)
  Jiaming Liu, Jiaqi Zhang, Toyoko Arai, Masahiko Tomitori, and Yoshifumi Oshima
- Organizer
  The Material Research Meeting 2021 (MRM2021), Dec. 16, パシフィコ横浜北、横浜市
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Interpretable machine learning to comprehend the mechanical and electric properties of gold nanocontacts measured by in-situ TEM equipped with a force senosr2020
- Author(s)
  Anh-Duc Dao, Tien-Sinh Vu, Duong-Nguyen Nguyen, Keisuke Ishizuka, Yoshifumi Oshima, Masahiko Tomitori, and Hieu-Chi Dam
- Organizer
  AI for Atoms: How to Machine Learn STEM Virtual School, Dec. 7_10, online, Oak Ridge National Laboratory, Oak Rdige, Tennessee, USA
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Dissipative interaction due to Joule heat through displacement current on mica nanosheets examained by non-contact atomic force microscopy2020
- Author(s)
  Md Mahamudul Hassan and Masahiko Tomitori
- Organizer
  2020年日本表面真空学会学術講演会、11月19日―21日、online
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] 水晶振動子力学センサーを組み込んだTEMホルダーによる金ナノ接点のヤング率計測2020
- Author(s)
  石塚慧介、富取正彦、新井豊子、大島義文
- Organizer
  日本顕微鏡学会第76回学術講演会、5月25日－27日、紙上開催
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Mica nanosheet patterned etching using focused electron beam2020
- Author(s)
  Islam Mohammad Razzakul and Masahiko Tomitori
- Organizer
  第81回応用物理学会秋季学術講演会、9月8-11日、online
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Atomic scale mechanics measured by TEM holder combined with a frequency-modulation force sensor2020
- Author(s)
  Jiaqi Zhang, Keisuke Ishizuka, Masahiko Tomitori, Toyoko Arai, and Yoshifumi Oshima
- Organizer
  第81回応用物理学会秋季学術講演会、9月8-11日、online
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Mechanical properties of Pt-Pt bond in an atomic chain measured by TEM combined with a frequency-modulation force sensing system2020
- Author(s)
  Jiaqi Zhang, Keisuke Ishizuka, Masahiko Tomitori, Toyoko Arai, and Yoshifumi Oshima
- Organizer
  第67回応用物理額春季学術講演会、3月12日-15日、上智大学四谷キャンパス、東京（紙上開催）
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Development of transmission electron microscopy holder with a quartz force sensor2020
- Author(s)
  Jiaqi Zhang, Keisuke Ishizuka, Masahiko Tomitori, Toyoko Arai, and Yoshifumi Oshima
- Organizer
  日本顕微鏡学会第76回学術講演会、5月25日－27日、紙上開催
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Dissipative interaction via capacitive coupling through mica nanosheets examained by non-contact atomic force microscopy2020
- Author(s)
  Md Mahamudul Hassan and Masahiko Tomitori
- Organizer
  第81回応用物理学会秋季学術講演会、9月8-11日、online
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] 高電界下での加熱処理による走査型プローブ顕微鏡のための単原子終端探針の作製と評価2020
- Author(s)
  木下博貴、富取正彦
- Organizer
  第67回応用物理額春季学術講演会、3月12日-15日、上智大学四谷キャンパス、東京（紙上開催）
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Conventional exfoliation method using a hand roller for artificially-synthesized mica nanosheets with a single layer and multi-layers in wide-area and their characterization2020
- Author(s)
  Islam Mohammad Razzakul and Masahiko Tomitori
- Organizer
  第67回応用物理額春季学術講演会、3月12日-15日、上智大学四谷キャンパス、東京（紙上開催）
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Mechanical energy dissipation via a thin mica film on a metal-coated Si substrate measured by frequency modulation atomic force microscopy2020
- Author(s)
  Md Mahamudul Hassan and Masahiko Tomitori
- Organizer
  ICSPM28, Dec. 10_11, online
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] 炎エッチングによるnc-AFM/STM用金属探針の作製と評価2019
- Author(s)
  笈田浩平、丸山天悟、富取正彦、新井豊子
- Organizer
  弟66回応用物理学会春期学術講演会
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Fabrication and evaluation of single-atom tips for scanning probe microscopy by heat treatment under high electric field2019
- Author(s)
  Hiroki Kinoshita and Masahiko Tomitori
- Organizer
  The 27th International Colloquium on Scanning Probe Microscopy, 5-7 Dec., Laforet Shuzenji, Shizuoka
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Development of tow-dimensional mica nanosheets on substrates analyzed by scanning Auger electron spectroscopy and atomic force microscopy2019
- Author(s)
  Islam Mohammad Razzakul and Masahiko Tomitori
- Organizer
  The 3rd International Conference on Applied Surface Science, 17-20 June, Pisa, Italy
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Mechanical properties of Pt atomic chain measured by TEM combined with a frequency-modulation force sensing system2019
- Author(s)
  Jiaqi Zhang, Yuki Kobori, Keisuke Ishizuka, Masahiko Tomitori, Toyoko Arai, and Yoshifumi Oshima
- Organizer
  第80回応用物理学秋季学術講演会、9月18-21日、北海道大学、札幌
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] 大気中における金ナノ接点の力学特性と電気伝導特性の相関関係2019
- Author(s)
  見寺悠伽、石塚慧介、大島義文、富取正彦、新井豊子
- Organizer
  2019年日本表面真空学会学術講演会、10月28日ー30日、つくば国際会議場、つくば
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] FM-AFM/TEM法によるAuナノ接点の力学・構造同時測定2019
- Author(s)
  石塚慧介、小堀雄稀、見寺悠伽、富取正彦、新井豊子、大島義文
- Organizer
  第80回応用物理学秋季学術講演会、9月18-21日、北海道大学、札幌
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Electro-plating and stripping of lead dendrites observed by operandi scanning electron microscopy with an electrochemical cell2019
- Author(s)
  G. He, Y. Oshima, M. Tomitori
- Organizer
  弟66回応用物理学会春期学術講演会
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Evaluation of the thickness of exfoliated artificially-synthesized mica nanosheets affixed on silicon substrates and correlations with current-voltage characteristics2019
- Author(s)
  Islam Mohammad Razzakul and Masahiko Tomitori
- Organizer
  The 27th International Colloquium on Scanning Probe Microscopy, 5-7 Dec., Laforet Shuzenji, Shizuoka
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] In-situ measurement of Young's modulus for Au nanocontacts by ultrahigh vacuum TEM with quartz crystal oscillator sensor2019
- Author(s)
  Kesisuke Ishizuka, Yuki Kobori, Masahiko Tomitori, Toyoko Arai, and Yoshifumi Oshima
- Organizer
  The 10th International Conference on Materials for Advnaced Technologies, 23-28, June, Marina Bay Sands, Singapore
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Discrimination of Si and Ge atoms in dissipation energy images on Ge/Si(111)-(5×5) using non-contact atomic force microscopy2019
- Author(s)
  Toyoko Arai, Daiki Kura, Toshiki Tsuji, and Masahiko Tomitori
- Organizer
  The 22nd International Conference on Non-cotact Atomic Force Microscopy, 29 July- 2 Aug., Regensburg, Germany
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] TEM-周波数変調法を用いたAuナノワイヤのヤング率方位依存性の測定2019
- Author(s)
  小堀雄稀、石塚慧介、見寺悠伽、富取正彦、新井豊子、大島義文
- Organizer
  弟66回応用物理学会春期学術講演会
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] nc-AFM/STM用音叉型水晶振動子力センサーのための金属探針の作製と評価2019
- Author(s)
  新井豊子、笈田浩平、丸山天悟、富取正彦
- Organizer
  第80回応用物理学秋季学術講演会、9月18-21日、北海道大学、札幌
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] 金属探針を用いた非接触原子間力顕微鏡による試料表面抵抗測定2019
- Author(s)
  丸山天悟、笈田浩平、藏大輝、富取正彦、新井豊子
- Organizer
  弟66回応用物理学会春期学術講演会
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] FM-AFM/TEM 同時測定による Au ナノ接点の力学・構造評価2019
- Author(s)
  石塚慧介、小堀雄稀、見寺悠伽、富取正彦、新井豊子、大島義文
- Organizer
  2019年日本表面真空学会学術講演会、10月28日ー30日、つくば国際会議場、つくば
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] TEM-微小振幅FM力勾配測定法によるPtナノ接点の力学測定2019
- Author(s)
  Jiaqi Zhang、小堀雄稀，石塚慧介，富取正彦，新井豊子，大島義文
- Organizer
  日本顕微鏡学会第75回学術講演会、名古屋国際会議場、名古屋
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] TEM-微小振幅FM力勾配測定法によるAuナノ接点ヤング率の結晶方位依存性の計測2019
- Author(s)
  小堀雄稀、石塚慧介、見寺悠伽、富取正彦、新井豊子、大島義文
- Organizer
  日本顕微鏡学会第75回学術講演会、名古屋国際会議場、名古屋
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Energy dissipation due to displacement of a Si adatom on Si(111)-(7×7) with noncontact atomic force microscopy2019
- Author(s)
  T. Shikichi, J.-I. Iwata, M. Tomitori, A. Oshiyama, and T. Arai
- Organizer
  The 27th International Colloquium on Scanning Probe Microscopy, 5-7 Dec., Laforet Shuzenji, Shizuoka
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] In-situ scanning electron microscopy observation of electrode-electrolyte interfaces in an electrochemical cell2019
- Author(s)
  He Gada, 大島義文、富取正彦
- Organizer
  2019年日本表面真空学会学術講演会、10月28日ー30日、つくば国際会議場、つくば
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] nc-AFMで検出するGe/Si(111)表面原子とSi探針間に働く化学結合力と散逸エネルギー2019
- Author(s)
  新井豊子、辻繁樹、藏大輝、敷地汰一、富取正彦
- Organizer
  第80回応用物理学秋季学術講演会、9月18-21日、北海道大学、札幌
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Mechancial properites of Pt nano-contacts measured by TEM combined with a frequency-modulation force sensor2019
- Author(s)
  Jiaqi Zhang, Yuki Kobori, Keisuke Ishizuka, Masahiko Tomitori, Toyoko Arai, and Yoshifumi Oshima
- Organizer
  The 10th International Conference on Materials for Advnaced Technologies, 23-28, June, Marina Bay Sands, Singapore
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Mechanical properties of Pt atomic chain measured by TEM combined with a frequency-modulation force sensing system2019
- Author(s)
  Jiaqi Zhang、小堀雄稀，石塚慧介，富取正彦，新井豊子，大島義文
- Organizer
  2019年日本表面真空学会学術講演会、10月28日ー30日、つくば国際会議場、つくば
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] nc-AFMで取得したエネルギー散逸像によるSi/Geの識別2019
- Author(s)
  藏大輝、辻繁樹、富取正彦、新井豊子
- Organizer
  弟66回応用物理学会春期学術講演会
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Evaluation of the thickness of mechanically exfoliated mica nanosheets affixed on Si substrates by scanning Auger electron spectroscopy2019
- Author(s)
  Islam Mohammad Razzakul and Masahiko Tomitori
- Organizer
  第80回応用物理学秋季学術講演会、9月18-21日、北海道大学、札幌
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] サブ10nmスケールにおける金ナノ接点の定量的弾性評価2019
- Author(s)
  石塚慧介、小堀雄稀、見寺悠伽、富取正彦、新井豊子、大島義文
- Organizer
  弟66回応用物理学会春期学術講演会
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] In-situ scanning electron microscopy observation of lead dendrites grown in an electrochemical cell2019
- Author(s)
  Gada He, Yoshifmi Oshima, and Masahiko Tomitori
- Organizer
  第80回応用物理学秋季学術講演会、9月18-21日、北海道大学、札幌
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Surface resistance change of Ge islands grown on Si(111)-(7x7) evaluated by Joule heat energy dissipation in non-contact atomic force microscopy2018
- Author(s)
  D. Kura, M. Tomitori, T. Arai
- Organizer
  14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Nanomechanical responses of epitaxial silicone on ZrB2(0001) examined by non-contact atomic force microscopy2018
- Author(s)
  M. Nogami, A. Fleurence, Y. Y.-Takamura, M. Tomitori
- Organizer
  14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Advanced material Science and atomic scale observations2018
- Author(s)
  M. Tomitori
- Organizer
  14th Arab Conference on the Peaceful Uses of Atomic Energy
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] High-temperature treatments of two-dimensional flakes of phlogopite mica on silicon substrates evaluated by atomic force microscopy2018
- Author(s)
  I. M. Razzakul, M. Tomitori
- Organizer
  14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Measurements of electronic conductance and mechanical properties of gold point contacts based on frequency modulation atomic force microscopy2018
- Author(s)
  H. Mitera, T. Murakami, R. Hashimoto, K. Ishizuka, Y. Oshima, M. Tomitori, T. Arai
- Organizer
  14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] 非接触AFMによるジュール熱散逸計測から評価したGe/Si(111)-(7x7)表面の表面抵抗2018
- Author(s)
  藏大輝、富取正彦、新井豊子
- Organizer
  第78回応用物理学会秋期学術講演会
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] In-situ scanning electron microscopy observation of electro-plating and stripping of lead dendrites in an electrochemical cell2018
- Author(s)
  G. He, Y. Oshima, M. Tomitori
- Organizer
  14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] FM-AFMを利用した金ナノ接点の電気伝導度とバネ定数の相関か遺跡2018
- Author(s)
  見寺悠伽、村上拓、石塚敬介、大島義文、富取正彦、新井豊子
- Organizer
  日本物理学会北陸支部定例学術講演会
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] 長辺振動水晶振動子を組み込んだTEMによるAuナノワイヤの特異的力学特性の観察2018
- Author(s)
  小堀雄稀、石塚慧介、見寺悠伽、富取正彦、新井豊子、大島義文
- Organizer
  日本表面真空学会学術講演会
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] 周波数変調原子間力顕微鏡を用いたナノ接点の力学特性測定の研究2018
- Author(s)
  見寺悠伽、石塚敬介、小堀雄稀、大島義文、富取正彦、新井豊子
- Organizer
  日本表面真空学会学術講演会
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] FM-AFMを利用した金ナノ接点の電気伝導と力学特性の相関解析2018
- Author(s)
  見寺悠伽、村上拓、橋本遼太、石塚慧介、大島義文、富取正彦、新井豊子
- Organizer
  弟78回応用物理学会秋期学術講演会
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Young's modulus of single-nano-scale gold nanowire estimated by TEM-AFM2018
- Author(s)
  K. Ishizuka, T. Murakami, Y. Kobori, M. Tomitori, T. Arai, Y. Oshima
- Organizer
  19th International Microscopy Congress
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Estimation of Young's modulus of Au nanowire by TEM combined with AFM2018
- Author(s)
  K. Ishizuka, T. Murakami, Y. Kobori, M. Tomitori, T. Arai, Y. Oshima
- Organizer
  14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] Surface resistivity change detected by non-contact atomic force microscopy through Joule heat energy dissipation2018
- Author(s)
  T. Arai, D. Kura, R. Inamura, M. Tomitori
- Organizer
  21th International Conference on non-contact atomic force microscopy
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03879
[Presentation] 非接触原子間力顕微鏡で検出されるエネルギー散逸機構の研究2017
- Author(s)
  稲村竜、藤井幹大、富取正彦、新井豊子
- Organizer
  第64回応用物理学会春季学術講演会
- Place of Presentation
  パシフィコ横浜、神奈川・横浜
- Year and Date
  2017-03-14
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] Ex-situ STM and XPS analysis of TiO2(110) surfaces to humid environments2017
- Author(s)
  Akira Sasahara, Tatsuya Murakami, Masahiko Tomitori
- Organizer
  Symposium on Surface Sciences and Nanotechnology -25th Anniversary of SSSJ Kansai
- Place of Presentation
  Kyoto International Community House, Kyoto, Kyoto
- Year and Date
  2017-01-24
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] Si(111)-(7x7)表面を試料とした非接触原子間力顕微鏡で検出されるエネルギー散逸機構の研究2017
- Author(s)
  稲村竜、藏大輝、富取正彦、新井豊子
- Organizer
  日本物理学会第72回年次大会
- Place of Presentation
  大阪大学豊中キャンパス、大阪・豊中
- Year and Date
  2017-03-17
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] 周波数変調原子間力顕微鏡法を応用した金ナノ接点の力学的特性の解析2017
- Author(s)
  村上拓、橋本遼太、石塚慧介、長井馨、大島義文、富取正彦、新井豊子
- Organizer
  日本物理学会第72回年次大会
- Place of Presentation
  大阪大学豊中キャンパス、大阪・豊中
- Year and Date
  2017-03-17
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] 疑似体液に浸漬させた構造規定酸化チタン表面のナノスケール解析2017
- Author(s)
  笹原亮、村上達也、富取正彦
- Organizer
  日本セラミックス協会2017年年会
- Place of Presentation
  日本大学駿河台キャンパス、東京・千代田区
- Year and Date
  2017-03-17
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] 自然酸化シリコン表面上に自己組織的に形成・配置された銅ロッド構造2017
- Author(s)
  坂本拓朗、西村高志、富取正彦
- Organizer
  第64回応用物理学会春季学術講演会
- Place of Presentation
  パシフィコ横浜、神奈川・横浜
- Year and Date
  2017-03-14
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] 非接触原子間力顕微鏡におけるエネルギー散逸機構の研究2016
- Author(s)
  稲村竜、富取正彦、新井豊子
- Organizer
  日本物理学会秋季大会
- Place of Presentation
  金沢大学・角間キャンパス、石川・金沢
- Year and Date
  2016-09-13
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] FM-AFMを用いた金ナノ接点の電気的・力学的特性の測定2016
- Author(s)
  村上拓、橋本遼太、石塚慧介、大島義文、富取正彦、新井豊子
- Organizer
  日本顕微鏡学会第72回学術講演会
- Place of Presentation
  仙台国際センター、宮城・仙台
- Year and Date
  2016-06-14
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] 電気伝導と力学特性の同時測定による金ナノ接点の原子配列の考察2016
- Author(s)
  橋本遼太、新井豊子、村上拓、石塚彗介、大島義文、富取正彦
- Organizer
  第63回応用物理学会春季学術講演会
- Place of Presentation
  東京工業大学　大岡山キャンパス、東京都目黒区
- Year and Date
  2016-03-18
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] 高湿度環境に暴露したTiO2(110)-(1x1)表面のUHV-STM/XPS解析2016
- Author(s)
  笹原亮、富取正彦
- Organizer
  第77回応用物理学会秋季学術講演会
- Place of Presentation
  朱鷺メッセ、新潟・新潟
- Year and Date
  2016-09-13
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] チャージアンプを備えたnc-AFMによる表面電子状態解析2016
- Author(s)
  野上真、新井豊子、笹原亮、富取正彦
- Organizer
  第63回応用物理学会春季学術講演会
- Place of Presentation
  東京工業大学　大岡山キャンパス、東京都目黒区
- Year and Date
  2016-03-18
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] 真空中で石英から昇華させたSiOのルチルTiO2(110)表面への堆積2016
- Author(s)
  附田健太郎、笹原亮、富取正彦
- Organizer
  第63回応用物理学会春季学術講演会
- Place of Presentation
  東京工業大学　大岡山キャンパス、東京都目黒区
- Year and Date
  2016-03-18
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] 純水及び疑似体液に浸漬させたTiO2(110)-(1x1)表面のex-situS解析2016
- Author(s)
  笹原亮、富取正彦
- Organizer
  真空・表面科学合同講演会第36回表面科学学術講演会
- Place of Presentation
  名古屋国際会議場、愛知県・名古屋
- Year and Date
  2016-11-29
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] 周波数変調原子間力顕微鏡を組み込んだ透過型電子顕微鏡による金ナノ接点の力学ー構造特性の同時測定2016
- Author(s)
  石塚慧介、村上拓、橋本遼太、大島義文、富取正彦、新井豊子
- Organizer
  真空・表面科学合同講演会第36回表面科学学術講演会
- Place of Presentation
  名古屋国際会議場、愛知県・名古屋
- Year and Date
  2016-11-29
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] 金ナノ接点の電気的・力学的特性の同時測定およびその解析2016
- Author(s)
  村上拓、橋本遼太、石塚慧介、大島義文、富取正彦、新井豊子
- Organizer
  日本物理学会秋季大会
- Place of Presentation
  金沢大学・角間キャンパス、石川・金沢
- Year and Date
  2016-09-13
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] 真空中で石英から昇華させたSiOのルチルTiO2(110)表面への堆積2016
- Author(s)
  附田健太郎、笹原亮、富取正彦
- Organizer
  第63回応用物理学会春季学術講演会
- Place of Presentation
  東京工業大学　大岡山キャンパス、東京都目黒区
- Year and Date
  2016-03-18
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] 疑似体液に浸漬させた酸化チタン単結晶表面のナノスケール解析2016
- Author(s)
  笹原亮、村上達也、Le Tran Uyen Tu、附田健太郎、富取正彦
- Organizer
  第63回応用物理学会春季学術講演会
- Place of Presentation
  東京工業大学　大岡山キャンパス、東京都目黒区
- Year and Date
  2016-03-18
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] 電気伝導と力学特性の同時測定による金ナノ接点の原子配列の考察2016
- Author(s)
  橋本遼太、新井豊子、村上拓、石塚彗介、大島義文、富取正彦
- Organizer
  第63回応用物理学会春季学術講演会
- Place of Presentation
  東京工業大学　大岡山キャンパス、東京都目黒区
- Year and Date
  2016-03-18
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] 加熱/煮沸処理を施した酸化チタン表面のリン酸カルシウムの析出2016
- Author(s)
  笹原亮、村上達也、Le Tran Uyen Tu、附田健太郎、富取正彦
- Organizer
  日本セラミックス協会 2016年年会
- Place of Presentation
  早稲田大学、西早稲田大学キャンパス、東京都新宿区
- Year and Date
  2016-03-14
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] 加熱/煮沸処理を施した酸化チタン表面のリン酸カルシウムの析出2016
- Author(s)
  笹原亮、村上達也、Le Tran Uyen Tu、附田健太郎、富取正彦
- Organizer
  日本セラミックス協会 2016年年会
- Place of Presentation
  早稲田大学、西早稲田大学キャンパス、東京都新宿区
- Year and Date
  2016-03-14
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] チャージアンプを備えたnc-AFMによる表面電子状態解析2016
- Author(s)
  野上真、新井豊子、笹原亮、富取正彦
- Organizer
  第63回応用物理学会春季学術講演会
- Place of Presentation
  東京工業大学　大岡山キャンパス、東京都目黒区
- Year and Date
  2016-03-18
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] 疑似体液に浸漬させた酸化チタン単結晶表面のナノスケール解析2016
- Author(s)
  笹原亮、村上達也、Le Tran Uyen Tu、附田健太郎、富取正彦
- Organizer
  第63回応用物理学会春季学術講演会
- Place of Presentation
  東京工業大学　大岡山キャンパス、東京都目黒区
- Year and Date
  2016-03-18
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] 長辺振動水晶振動子を力学センサーに応用した金ナノ接点の力学・電気伝導特性の同時計測2015
- Author(s)
  橋本遼太、新井豊子、大島義文、富取正彦
- Organizer
  第76回応用物理学会秋季講演会
- Place of Presentation
  名古屋国際会議場、愛知県名古屋市
- Year and Date
  2015-09-13
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] 二酸化チタン表面へのリン酸カルシウム析出のXPSとAFMによる解析2015
- Author(s)
  笹原亮、村上達也、Le Tran Uyen Tu, 附田健太郎、富取正彦
- Organizer
  第35回表面科学学術講演会
- Place of Presentation
  つくば国際会議場、茨城県つくば市
- Year and Date
  2015-12-01
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] 二酸化チタン表面へのリン酸カルシウム析出のXPSとAFMによる解析2015
- Author(s)
  笹原亮、村上達也、Le Tran Uyen Tu, 附田健太郎、富取正彦
- Organizer
  第35回表面科学学術講演会
- Place of Presentation
  つくば国際会議場、茨城県つくば市
- Year and Date
  2015-12-01
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] Dissipation decrease in a proximity region enhanced with a hydrogen-terminated Si tip in non-contact atomic force microscopy2015
- Author(s)
  R. Inamura, M. Tomitori, T. Arai
- Organizer
  the 18th International Conference on non-contact atomic force microscopy
- Place of Presentation
  Cassis, France
- Year and Date
  2015-09-07
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] 超高真空槽で調製したSi(001)と(111)面の水滴下後の表面変化2015
- Author(s)
  宮城友昭、笹原亮、富取正彦
- Organizer
  第76回応用物理学会秋季講演会
- Place of Presentation
  名古屋国際会議場、愛知県名古屋市
- Year and Date
  2015-09-13
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] 金ナノ接点の電気電導と力学特性の同時測定2015
- Author(s)
  橋本遼太、新井豊子、大島義文、富取正彦
- Organizer
  第35回表面科学学術講演会
- Place of Presentation
  つくば国際会議場、茨城県つくば市
- Year and Date
  2015-12-01
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] 加熱・加圧処理によるシリコン表面の突起構造の形成2015
- Author(s)
  西村高志、富取正彦
- Organizer
  第76回応用物理学会秋季講演会
- Place of Presentation
  名古屋国際会議場、愛知県名古屋市
- Year and Date
  2015-09-13
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] 長辺振動水晶振動子を力学センサーに応用した金ナノ接点の力学・電気伝導特性の同時計測2015
- Author(s)
  橋本遼太、新井豊子、大島義文、富取正彦
- Organizer
  第76回応用物理学会秋季講演会
- Place of Presentation
  名古屋国際会議場、愛知県名古屋市
- Year and Date
  2015-09-13
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] Dissipation decrease in a proximity region enhanced with a hydrogen-terminated Si tip in non-contact atomic force microscopy2015
- Author(s)
  R. Inamura, M. Tomitori, T. Arai
- Organizer
  the 18th International Conference on non-contact atomic force microscopy
- Place of Presentation
  Cassis, France
- Year and Date
  2015-09-11
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] 金ナノ接点の電気電導と力学特性の同時測定2015
- Author(s)
  橋本遼太、新井豊子、大島義文、富取正彦
- Organizer
  第35回表面科学学術講演会
- Place of Presentation
  つくば国際会議場、茨城県つくば市
- Year and Date
  2015-12-01
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] Chemical conformation of diamond-p-terphenyl on Si(001)-2×1 observed by STM2015
- Author(s)
  Amer Mahmoud Amer Hassan, Akira Sasahara, Hideyuki Murata, Masahiko Tomitori
- Organizer
  日本顕微鏡学会　第71回学術講演会
- Place of Presentation
  国立京都国際会議場、京都府京都市
- Year and Date
  2015-05-13
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] Laying-down configuration of 4,4" diamond-p-terphenyl on Si(001)-2×1 observed by scanning tunneling microscopy2015
- Author(s)
  Amer Mahmoud Amer Hassan, Akira Sasahara, Hideyuki Murata, Masahiko Tomitori
- Organizer
  EM-NANO 2015
- Place of Presentation
  TOKI MESSE Niigata Convention Center, Niigata, Niigata, Japan
- Year and Date
  2015-06-16
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] Simultaneous NC-AFM imaging with current and damping energy using a retuned fork sensor with a high Q-value2015
- Author(s)
  H. Ooe, M. Fujii, M. Tomitori, T. Arai
- Organizer
  the 18th International Conference on non-contact atomic force microscopy
- Place of Presentation
  Cassis, France
- Year and Date
  2015-09-07
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] Laying-down configuration of 4,4" diamond-p-terphenyl on Si(001)-2×1 observed by scanning tunneling microscopy2015
- Author(s)
  Amer Mahmoud Amer Hassan, Akira Sasahara, Hideyuki Murata, Masahiko Tomitori
- Organizer
  EM-NANO 2015
- Place of Presentation
  TOKI MESSE Niigata Convention Center, Niigata, Niigata, Japan
- Year and Date
  2015-06-16
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] 加熱・加圧処理によるシリコン表面の突起構造の形成2015
- Author(s)
  西村高志、富取正彦
- Organizer
  第76回応用物理学会秋季講演会
- Place of Presentation
  名古屋国際会議場、愛知県名古屋市
- Year and Date
  2015-09-13
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] Tip-sample distance dependence of the output of a charge amplifier in NC-AFM2015
- Author(s)
  M. Nogami, T. Arai, A. Sasahara, M. Tomitori
- Organizer
  the 18th International Conference on non-contact atomic force microscopy
- Place of Presentation
  Cassis, France
- Year and Date
  2015-09-07
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] 超高真空槽で調製したSi(001)と(111)面の水滴下後の表面変化2015
- Author(s)
  宮城友昭、笹原亮、富取正彦
- Organizer
  第76回応用物理学会秋季講演会
- Place of Presentation
  名古屋国際会議場、愛知県名古屋市
- Year and Date
  2015-09-13
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] Chemical conformation of diamond-p-terphenyl on Si(001)-2×1 observed by STM2015
- Author(s)
  Amer Mahmoud Amer Hassan, Akira Sasahara, Hideyuki Murata, Masahiko Tomitori
- Organizer
  日本顕微鏡学会　第71回学術講演会
- Place of Presentation
  国立京都国際会館、京都府京都市
- Year and Date
  2015-05-13
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] 雰囲気制御電気炉でのSiO2超薄膜のルチルTiO2(110)基板上への堆積2015
- Author(s)
  附田健太郎、笹原亮、富取正彦
- Organizer
  応用物理学会　北陸・信越支部学術講演会
- Place of Presentation
  信州大学工学部　長野県長野市
- Year and Date
  2015-12-12
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] Simultaneous NC-AFM imaging with current and damping energy using a retuned fork sensor with a high Q-value2015
- Author(s)
  H. Ooe, M. Fujii, M. Tomitori, T. Arai
- Organizer
  the 18th International Conference on non-contact atomic force microscopy
- Place of Presentation
  Cassis, France
- Year and Date
  2015-09-07
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] Tip-sample distance dependence of the output of a charge amplifier in NC-AFM2015
- Author(s)
  M. Nogami, T. Arai, A. Sasahara, M. Tomitori
- Organizer
  the 18th International Conference on non-contact atomic force microscopy
- Place of Presentation
  Cassis, France
- Year and Date
  2015-09-07
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] 雰囲気制御電気炉でのSiO2超薄膜のルチルTiO2(110)基板上への堆積2015
- Author(s)
  附田健太郎、笹原亮、富取正彦
- Organizer
  応用物理学会　北陸・信越支部学術講演会
- Place of Presentation
  信州大学工学部、長野県長野市
- Year and Date
  2015-12-12
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] チャージアンプを用いたNC-AFM による探針試料間相互作用の検出2013
- Author(s)
  野上真、新井豊子、笹原亮、富取正彦
- Organizer
  第60回応用物理学会学術講演会
- Place of Presentation
  神奈川工科大学、厚木市、神奈川県
- Data Source
  KAKENHI-PROJECT-22656012
[Presentation] Improvement of the Q factor of a tuning fork quartz force sensor with modified holding ways for nc-AFM/STM2012
- Author(s)
  Toyoko Arai, Hiroaki Ooe, Tatsuya Sakuishi, Masahiko Tomitori
- Organizer
  the 15th International Conference on Non-contact Atomic Force Microscopy
- Place of Presentation
  Cesky Krumlov, Czech Republic
- Data Source
  KAKENHI-PROJECT-22656012
[Presentation] 自励発振式水晶振動子センサーを用いた超高真空FM-AFM の開発II2012
- Author(s)
  作石達哉、野上真、大江弘晃、富取正彦、笹原亮
- Organizer
  第59回応用物理学関係連合講演会
- Place of Presentation
  早稲田大学、東京都
- Year and Date
  2012-03-15
- Data Source
  KAKENHI-PROJECT-22656012
[Presentation] 実デバイス指向の表面吸着構造のSPM解析の試み2011
- Author(s)
  富取正彦
- Organizer
  日本顕微鏡学会SPM分科会平成23年度オープン研究会
- Place of Presentation
  物質・材料研究機構、つくば市、茨城
- Year and Date
  2011-12-02
- Data Source
  KAKENHI-PROJECT-20246012
[Presentation] 水晶振動子q-Plus センサーを利用したSTM/nc-AFM の開発2011
- Author(s)
  作石達哉、大江弘晃、富取正彦、新井豊子
- Organizer
  応用物理学会北陸・信越支部学術講演会
- Place of Presentation
  金沢歌劇座、金沢市、石川県
- Year and Date
  2011-11-18
- Data Source
  KAKENHI-PROJECT-22656012
[Presentation] NC-AFM and force spectroscopy applied to H terminatedSi(111) 7×72011
- Author(s)
  T. Arai, T. Ikeshima, Y. Zhang, M. Tomitori
- Organizer
  14^<th> international conference on NC-AFM 2011
- Place of Presentation
  Lindau, German
- Year and Date
  2011-09-19
- Data Source
  KAKENHI-PROJECT-20246012
[Presentation] 水晶振動子力センサー・静電容量補償回路を用いたSTM/nc-AFM2011
- Author(s)
  作石達哉、大江弘晃、富取正彦、新井豊子
- Organizer
  第72回応用物理学会学術講演会
- Place of Presentation
  山形大学、山形市、山形県
- Year and Date
  2011-08-31
- Data Source
  KAKENHI-PROJECT-22656012
[Presentation] Si(001)表面におけるDAT分子の吸着構造と電子状態2011
- Author(s)
  小田将人, 西村高志, 笹原亮, 村田英幸, 新井豊子, 富取正彦
- Organizer
  日本物理学会第66会年次大会
- URL
  http://wwwsoc.nii.ac.jp/jps/index.html
- Place of Presentation
  新潟大学五十嵐キャンパス(新潟県)
- Data Source
  KAKENHI-PROJECT-20246012
[Presentation] NC-AFM and Force spectroscopy applied to H terminated Si(111) 7x72011
- Author(s)
  Arai, T., Ikeshima, T., Zhang, Y., Tomitori, M.
- Organizer
  14th International Conferencence on Noncontact Atomic Force Microscopy(ncAFM2011)
- Place of Presentation
  Lindau(Germany)
- Year and Date
  2011-09-19
- Data Source
  KAKENHI-PROJECT-20310058
[Presentation] Development of nc-AFM/STM using a tuning fork quartz force sensor2011
- Author(s)
  Toyoko Arai, Tatsuya Sakuishi, Hiroaki Ooe, Masahiko Tomitori
- Organizer
  the International Conference on Non-contact Atomic Force Microscopy
- Place of Presentation
  Lindau, Germany
- Year and Date
  2011-09-20
- Data Source
  KAKENHI-PROJECT-22656012
[Presentation] 実デバイス指向の表面吸着構造のSPM解析の試み2011
- Author(s)
  富取正彦
- Organizer
  日本顕微鏡学会・SPM分科会平成23年度オープン研究会
- Place of Presentation
  つくば物質・材料研究機構(招待講演)
- Year and Date
  2011-12-02
- Data Source
  KAKENHI-PROJECT-20246012
[Presentation] Non-contact AFM observation of Si(111)-(7×7) terminated with hydrogen2011
- Author(s)
  Arai, T., Ishikawa, T., Ikeshima, T., Tomitori, M.
- Organizer
  The 6th International Symposium on Surface Science(ISSS6)
- Place of Presentation
  タワーホール船堀(東京都)
- Year and Date
  2011-12-12
- Data Source
  KAKENHI-PROJECT-20310058
[Presentation] Nano imaging and characterization using scanning probe microscopy (Invited)2010
- Author(s)
  Masahiko Tomitori
- Organizer
  International Interdisciplinary Science Conference 2010 on Nanobiotechnology: An Interface between Physics and Biology
- Place of Presentation
  Jamia Millia Islamia, New Delhi, India
- Year and Date
  2010-12-03
- Data Source
  KAKENHI-PROJECT-22656012
[Presentation] Development of SPM instruments and tip preparation for force sensors2010
- Author(s)
  T.Arai, T.Sakuishi, K.Hori, M.Tomitori
- Organizer
  13th International Conference on Noncontact Atomic Force Microscopy
- Place of Presentation
  石川県立音楽堂(石川県)
- Year and Date
  2010-08-02
- Data Source
  KAKENHI-PROJECT-20246012
[Presentation] Development of SPM instruments and tip preparation for force sensors2010
- Author(s)
  T.Arai, T.Sakuishi, K.Hori, M.Tomitori
- Organizer
  13th International Conference on Noncontact Atomic Force Microscopy
- Place of Presentation
  石川県立音楽堂(石川県)
- Year and Date
  2010-08-02
- Data Source
  KAKENHI-PROJECT-20310058
[Presentation] Si (100) と (111) 表面上のジアミノパラターフェニル分子の吸着状態の比較2010
- Author(s)
  西村高志, 村田英幸, 笹原亮, 新井豊子, 富取正彦
- Organizer
  第57回応用物理学関連連合講演会
- Place of Presentation
  東海大学 (神奈川県)
- Data Source
  KAKENHI-PROJECT-20246012
[Presentation] Nano imaging and characterization using scanning probe microscopy2010
- Author(s)
  M. Tomitori
- Organizer
  International Interdisciplinary ScienceConference-2010 on Nanobiotechnology : An Interface between Physics and Biology
- Place of Presentation
  Jamia Millia Islamia, New Delhi
- Year and Date
  2010-12-03
- Data Source
  KAKENHI-PROJECT-20246012
[Presentation] π電子系分子で界面制御したシリコン/有機半導体素子の製作と評価2010
- Author(s)
  西村高志,村田英幸,笹原亮,新井豊子,富取正彦
- Organizer
  応用物理学会北陸・信越支部学術講演会
- Place of Presentation
  金沢大学(石川県)
- Year and Date
  2010-11-19
- Data Source
  KAKENHI-PROJECT-20310058
[Presentation] Nano imaging and characterization using scanning probe microscopy2010
- Author(s)
  Masahiko Tomitori
- Organizer
  International Interdisciplinary Science Conference-2010 on Nanobiotechnology : An Interface between Physics and Biology (Invited)
- Place of Presentation
  Jamia Millia Islamia, New Delhi, India6
- Year and Date
  2010-12-03
- Data Source
  KAKENHI-PROJECT-22656012
[Presentation] Nanoscale analysis by combined spectroscopies based on noncontact atomic force microscopy under a bias voltage2010
- Author(s)
  T.Arai, T.Ikeshima, K.Kiyohara, M.Tomitori
- Organizer
  13th International Conference on Noncontact Atomic Force Microscopy
- Place of Presentation
  石川県立音楽堂(石川県)
- Year and Date
  2010-08-02
- Data Source
  KAKENHI-PROJECT-20310058
[Presentation] Si(100)と(111)表面上のジアミノパラターフェニル分子の吸着状態の比較2010
- Author(s)
  西村高志, 村田英幸, 笹原亮, 新井豊子, 富取正彦
- Organizer
  第57回応用物理学関連連合講演会
- Place of Presentation
  東海大学(神奈川県)
- Data Source
  KAKENHI-PROJECT-20310058
[Presentation] Si (100) と (111) 表面上のジアミノパラターフェニル分子の吸着状態の比較2010
- Author(s)
  西村高志, 村田英幸, 笹原亮, 新井豊子, 富取正彦
- Organizer
  第57回応用物理学関係連合講演会
- Place of Presentation
  東海大学 (神奈川)
- Year and Date
  2010-03-20
- Data Source
  KAKENHI-PROJECT-20241034
[Presentation] Si(100)と(111)表面上のジアミノパラターフェニル分子の吸着状態の比較2010
- Author(s)
  西村高志,村田英幸,笹原亮,新井豊子,富取正彦
- Organizer
  第57回応用物理学関係連合講演会
- Place of Presentation
  神奈川
- Year and Date
  2010-03-17
- Data Source
  KAKENHI-PROJECT-20241034
[Presentation] Nanoscale analysis by combined spectroscopies based on non-contact atomic force microscopy under a bias voltage2010
- Author(s)
  Arai, T., Ikeshima, T., Kiyohara, K., Tomitori, M.
- Organizer
  13th International Conferencence on Noncontact Atomic Force Microscopy(ncAFM2010)
- Place of Presentation
  川県立音楽堂(石川県)
- Year and Date
  2010-08-02
- Data Source
  KAKENHI-PROJECT-20310058
[Presentation] nonc-contact atomic force microscope observation of TiO_2 (110) surface in pure water2009
- Author(s)
  笹原亮, Yonkil Jeong, 富取正彦
- Organizer
  12th international conference on noncontact atomic force microscopy (ncAFM 2009)
- Place of Presentation
  Yale 大学 (米国)
- Data Source
  KAKENHI-PROJECT-20246012
[Presentation] From non-contact to atomic scale contact between a Si tip and a Si surface analyzed using an nc-AFM and nc-AFS based instrument2009
- Author(s)
  Toyoko Arai, Kosei Kiyohara, Taiki Sato, Shugaku Kushida, Masahiko Tomitori
- Organizer
  12th international conference on noncontact atomic force microscopy(ncAFM2009)
- Place of Presentation
  Yale大学(米国)
- Data Source
  KAKENHI-PROJECT-20310058
[Presentation] アミノ化p-terphenyl誘導体のSi(111) 7x7表面上の結合状態のSTMとXPSによる評価2009
- Author(s)
  西村高志,板橋敦,笹原亮,村田英幸,新井豊子,富取正彦
- Organizer
  第56回応用物理学関係連合講演会
- Place of Presentation
  茨木
- Year and Date
  2009-03-30
- Data Source
  KAKENHI-PROJECT-20241034
[Presentation] 非接触原子間力顕微鏡による相互作用力・電流・散逸エネルギー測定による表面解析2009
- Author(s)
  新井豊子, 富取正彦
- Organizer
  第70回応用物理学会学術講演会シンポジウム「非接触原子間力顕微鏡で拓くナノテク最前線」
- Place of Presentation
  富山大学(富山県)
- Year and Date
  2009-09-08
- Data Source
  KAKENHI-PROJECT-20246012
[Presentation] SEM-SPMを用いたPt系探針と融解Ge粒子の接触・切断過程のその場観察2009
- Author(s)
  富取正彦, 大石直樹, 笹原亮, 谷正安, 新井豊子
- Organizer
  日本顕微鏡学会第65回学術講演会
- Place of Presentation
  仙台国際センター (宮城県)
- Data Source
  KAKENHI-PROJECT-20246012
[Presentation] From non-contact to atomic scale contact between a Si tip and a Si surface analyzed using an nc-AFM and nc-AFS based instrument2009
- Author(s)
  Arai, T., Kiyohara, K., Sato, T., Kushida, S., Tomitori, M.
- Organizer
  12th international conference on noncontact atomic force microscopy(ncAFM2009)
- Place of Presentation
  Yale Univ.(USA)
- Year and Date
  2009-08-11
- Data Source
  KAKENHI-PROJECT-20310058
[Presentation] Evaluation of binding states of p-terphenyls with amino groups on Si(111)7x7 using STM and XPS2009
- Author(s)
  西村高志, 笹原亮, 村田英幸, 新井豊子, 富取正彦
- Organizer
  10th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures(ACSIN10)
- Place of Presentation
  Granada Conference Centre, Granada(スペイン)
- Data Source
  KAKENHI-PROJECT-20310058
[Presentation] Surface electron spectroscopy based on nc-AFM with changing bias voltage at close tip-sample separation2009
- Author(s)
  T.Arai, K.Kiyohara, T.sato, S.Kushida, M.Tomitori
- Organizer
  ACSIN 10
- Place of Presentation
  Granada(Spain)
- Year and Date
  2009-09-23
- Data Source
  KAKENHI-PROJECT-20246012
[Presentation] Surface electron spectroscopy based on nc-AFM with changing bias voltage at closer tip-sample separations2009
- Author(s)
  Toyoko Arai, Kosei Kiyohara, Taiki Sato, Shugaku Kushida, Masahiko Tomitori
- Organizer
  10th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures(ACSIN10)
- Place of Presentation
  Granada Conference Centre, Granada(スペイン)
- Data Source
  KAKENHI-PROJECT-20310058
[Presentation] Nc-AFM study of a cleaved InAs(110) surface using modified Si probes under ambient atmopsheric pressure2009
- Author(s)
  Yonkil Jeong, Masato Hirade, Ryohei Kokawa, Hirofumi Yamada, Kei Kobayashi, Noriak Oyabu, Hiroshi Yamatani, Toyoko Arai, Akira Sasahara, Masahiko Tomitori
- Organizer
  12th international conference on noncontact atomic force microscopy(ncAFM2009)
- Place of Presentation
  Yale大学(米国)
- Data Source
  KAKENHI-PROJECT-20310058
[Presentation] SEM-SPMを用いたPt系探針と融解G6粒子の接触・切断過程のその場観察2009
- Author(s)
  富取正彦, 大石直樹, 笹原亮, 谷正安, 新井豊子
- Organizer
  日本顕微鏡学会第65回学術講演会
- Place of Presentation
  仙台国際センター(宮城県)
- Data Source
  KAKENHI-PROJECT-20310058
[Presentation] Surface electron spectroscopy based on nc-AFM with changing bias voltage at close tip-sample separation2009
- Author(s)
  T. Arai, K. Kiyohara, T. sato, S. Kushida, M. Tomitori
- Organizer
  ACSIN 10
- Place of Presentation
  Granada, Spain
- Year and Date
  2009-09-23
- Data Source
  KAKENHI-PROJECT-20246012
[Presentation] Evaluation of binding states of p-terphenyls with amino groups on Si (111) 7x7 using STM and XPS2009
- Author(s)
  西村高志, 笹原亮, 村田英幸, 新井豊子, 富取正彦
- Organizer
  10th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN 10)
- Place of Presentation
  Granada Conference Centre, Granada (スペイン)
- Data Source
  KAKENHI-PROJECT-20246012
[Presentation] 第70回応用物理学会学術講演会シンポジウム「非接触原子間力顕微鏡で拓くナノテク最前線」2009
- Author(s)
  新井豊子, 富取正彦
- Organizer
  非接触原子間力顕微鏡による相互作用力・電流・散逸エネルギー測定による表面解析
- Place of Presentation
  富山大学(富山県)
- Year and Date
  2009-09-08
- Data Source
  KAKENHI-PROJECT-20310058
[Presentation] Surface electron spectroscopy based on nc-AFM with changing bias voltage at closer tip-sample separations2009
- Author(s)
  新井豊子, Kosei Kiyohara, Taiki Sato, Shugaku Kushida, 富取正彦
- Organizer
  10th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN 10)
- Place of Presentation
  Granada Conference Centre, Granada (スペイン)
- Data Source
  KAKENHI-PROJECT-20246012
[Presentation] 非接触原子間力顕微鏡による相互作用力・電流・散逸エネルギー測定による表面解析2009
- Author(s)
  新井豊子, 富取正彦
- Organizer
  第70回応用物理学会学術講演会シンポジウム日本学術振興会ナノプローブテクノロジー第167委員会企画「非接触原子間力顕微鏡で拓くナノテク最前線」
- Place of Presentation
  富山大学(富山県)
- Year and Date
  2009-09-08
- Data Source
  KAKENHI-PROJECT-20310058
[Presentation] Si単結晶表面上のジアミノターフェニル分子の吸着状態2009
- Author(s)
  西村高志, 村田英幸, 笹原亮, 新井豊子, 富取正彦
- Organizer
  表面・界面スペクトロスコピー2009
- Place of Presentation
  定山渓ホテルミリオーネ(北海道)
- Data Source
  KAKENHI-PROJECT-20310058
[Presentation] Development of quartz force sensors for noncontact atomic force microscopy/spectroscopy2009
- Author(s)
  Kenichirou Hori, 新井豊子, 富取正彦
- Organizer
  12th international conference on noncontact atomic force microscopy (ncAFM 2009)
- Place of Presentation
  Yale 大学 (米国)
- Data Source
  KAKENHI-PROJECT-20246012
[Presentation] Surface electron spectroscopy based on nc-AFM with changing bias voltage at closer tip-sample separations2009
- Author(s)
  Arai, T., Kiyohara, K., Sato, T., Tomitori, M.
- Organizer
  10th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures(ACSIN10)
- Place of Presentation
  Granada Conference Centre(Spain)
- Year and Date
  2009-09-22
- Data Source
  KAKENHI-PROJECT-20310058
[Presentation] Si単結晶表面上のジアミノターフェニル分子の吸着状態2009
- Author(s)
  西村高志, 村田英幸, 笹原亮, 新井豊子, 富取正彦
- Organizer
  表面・界面スペクトロスコピー2009
- Place of Presentation
  定山渓ホテルミリオーネ (北海道)
- Data Source
  KAKENHI-PROJECT-20246012
[Presentation] From non-contact to atomic scale contact between a Si tip and a Si surface analyzed using an nc-AFM and nc-AFS based instruwent2009
- Author(s)
  新井豊子, Kosei Kiyohara, Taiki Sato, Shugaku Kushida, 富取正彦
- Organizer
  12th international conference on noncontact atomic force microscopy (ncAFM 2009)
- Place of Presentation
  Yale 大学 (米国)
- Data Source
  KAKENHI-PROJECT-20246012
[Presentation] 非接触原子間力顕微鏡による相互作用力・電流・散逸エネルギー測定による表面解析2009
- Author(s)
  新井豊子, 富取正彦
- Organizer
  第70回応用物理学会学術講演会シンポジウム日本学術振興会ナノプローブテクノロジー第167委員会企画「非接触原子間力顕微鏡で拓くナノテク最前線」
- Place of Presentation
  富山大学 (富山県)
- Year and Date
  2009-09-08
- Data Source
  KAKENHI-PROJECT-20246012
[Presentation] Nc-AFM study of a cleaved InAs (110) surface using modified Si probes under ambient atmopsheric pressure2009
- Author(s)
  Yonkil Jeong, Masato Hirade, Ryohei Kokawa, Hirofumi Yamada, Kei Kobayashi, Noriak Oyabu, Hiroshi Yamatani, 新井豊子, 笹原亮, 富取正彦
- Organizer
  12th international conference on noncontact atomic force microscopy (ncAFM 2009)
- Place of Presentation
  Yale 大学 (米国)
- Data Source
  KAKENHI-PROJECT-20246012
[Presentation] Development of quartz force sensors for noncontact atomic force microscopy/spectroscopy2009
- Author(s)
  Kenichirou Hori, Toyoko Arai, Masahiko Tomitori
- Organizer
  12th international conference on noncontact atomic force microscopy(ncAFM2009)
- Place of Presentation
  Yale大学(米国)
- Data Source
  KAKENHI-PROJECT-20310058
[Presentation] From noncontact to atomic scale contact between a Si tip and a Si surface analyzed using an nc-AFM and nc-AFS based instrument2009
- Author(s)
  T.Arai, K.Kiyohara, T.Sato, S.Kushida, 富取正彦
- Organizer
  12th international conference on noncontact atomic force microscopy
- Place of Presentation
  Yale University (USA)
- Year and Date
  2009-08-10
- Data Source
  KAKENHI-PROJECT-20310058
[Presentation] アミノ化p-terphenyl誘導体のSi (111)7×7表面上の結合状態のSTMとXPSによる評価2009
- Author(s)
  西村高志, 板橋敦, 笹原亮, 村田英幸, 新井豊子, 富取正彦
- Organizer
  第56回応用物理学関係連合講演会
- Place of Presentation
  茨城
- Data Source
  KAKENHI-PROJECT-20241034
[Presentation] 「STMを用いたSi (111) 7x7 表面上の4, 4"-diamino-p-terphenylの観察」2008
- Author(s)
  西村高志、板橋敦、村田英幸、富取正彦、新井豊子
- Organizer
  応用物理学会
- Place of Presentation
  日本大学
- Data Source
  KAKENHI-PROJECT-17310069
[Presentation] Si(111) 7x7表面上に室温蒸着した4, 4"-diamino-p-terphenylの熱処理効果2008
- Author(s)
  西村高志,板橋敦,笹原亮,村田英幸,新井豊子,富取正彦
- Organizer
  第69回応用物理学会学術講演会
- Place of Presentation
  愛知
- Year and Date
  2008-09-02
- Data Source
  KAKENHI-PROJECT-20241034
[Presentation] 走査型プローブ顕微鏡技術によるナノスケールの物性計測と操作2008
- Author(s)
  富取正彦
- Organizer
  日本顕微鏡学会第52回シンポジウム
- Place of Presentation
  千葉大学、千葉
- Year and Date
  2008-10-17
- Data Source
  KAKENHI-PROJECT-20246012
[Presentation] Scanning tunneling microscopy observation of 4,4'-dianoino-p-terphenyl on Si(111)7x7 (in Japanese)2008
- Author(s)
  T. Nishimura, A. Itabashi, H. Murata, T. Arai, M. Tomitori
- Organizer
  Meeting of the Japan Society of Applied Physics
- Place of Presentation
  Nihon Univ. Funabashi, Japan
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] STMを用いたSi(111)7x7表面上の4,4"-diamino-p-terphenylの観察2008
- Author(s)
  西村高志、板橋敦、村田英幸、富取正彦、新井豊子
- Organizer
  応用物理学会
- Place of Presentation
  千葉、日本大学
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Surface electron spectroscopy based on nc-AFM with changing bias voltage2008
- Author(s)
  T.Arai, S.Kushida, K.Kiyohara, M.Tomitori
- Organizer
  11th international conference on noncontact atomic force microscopy
- Place of Presentation
  Hotel Rafael Atocha, (Spain)
- Year and Date
  2008-09-16
- Data Source
  KAKENHI-PROJECT-20310058
[Presentation] Current-Voltage Characteristics with Staircases of a Si Point Contact between a Si Tip and a Si Substrate2008
- Author(s)
  Arai, T., Kiyohara, K., Kushida, S., Tomitori, M.
- Organizer
  International Conference on Nanoscience^+Technology(ICN+T 2008)
- Place of Presentation
  Keystone(USA)
- Year and Date
  2008-07-20
- Data Source
  KAKENHI-PROJECT-20310058
[Presentation] 走査型プローブ顕微鏡技術によるナノスケールの物性計測と操作2008
- Author(s)
  富取正彦
- Organizer
  日本顕微鏡学会第52回シンポジウム
- Place of Presentation
  千葉大学
- Year and Date
  2008-10-17
- Data Source
  KAKENHI-PROJECT-20246012
[Presentation] STMを用いたSi(111)7x7表面上の4,4''-Ddiamino-p-Tterphenylの観察2008
- Author(s)
  西村高志, 板橋敦, 村田英幸, 富取正彦, 新井豊子
- Organizer
  第55回応用物理学関連連合講演会
- Place of Presentation
  日本大学船橋キャンパス千葉
- Year and Date
  2008-03-28
- Data Source
  KAKENHI-PROJECT-18041007
[Presentation] 走査型プローブ顕微鏡技術によるナノスケールの物性計測と操作2008
- Author(s)
  富取正彦
- Organizer
  日本顕微鏡学会第52回シンポジウム
- Place of Presentation
  千葉大学(千葉県)
- Year and Date
  2008-10-17
- Data Source
  KAKENHI-PROJECT-20246012
[Presentation] Si (111)7×7表面上に室温蒸着した4, 4"-diamino-p-terphenylの熱処理効果2008
- Author(s)
  西村高志, 板橋敦, 笹原亮, 村田英幸, 新井豊子, 富取正彦
- Organizer
  第69回応用物理学会学術講演会
- Place of Presentation
  愛知
- Data Source
  KAKENHI-PROJECT-20241034
[Presentation] Surface electron spectroscopy based on nc-AFM with changing bias voltage2008
- Author(s)
  Arai, T., Kushida, S., Kiyohara, K., Tomitori, M.
- Organizer
  11th international conference on noncontact atomic force microscopy(ncAFM2008)
- Place of Presentation
  Hotel Rafael Atocha, Madrid(Spain)
- Year and Date
  2008-09-16
- Data Source
  KAKENHI-PROJECT-20310058
[Presentation] STM and XPS Studies of 4, 4'-diamino-p-terpehney adsorbed on Si(111)-(7x7)2008
- Author(s)
  T. Nishimura, A. Itabashi, A. Sasahara, H. Murata, and M. Tomitori
- Organizer
  International Conference on Nanoscience+Technology
- Place of Presentation
  Colorado, USA
- Year and Date
  2008-07-20
- Data Source
  KAKENHI-PROJECT-20241034
[Presentation] シリコン基板に直接化学結合したπ共役系分子の形成2007
- Author(s)
  板橋敦, 中山智裕, 新井豊子, 富取正彦、村田英幸
- Organizer
  第54回応用物理学会学術講演会
- Place of Presentation
  北海道工業大学、札幌
- Data Source
  KAKENHI-PROJECT-18041007
[Presentation] Scanning tunneling microscopy observation of 4,4'-diamino-p-terphenyl on Si(111)7x7 at room temperature2007
- Author(s)
  T. Nishimura, A. Itabashi, H. Murata, T. Arai, M. Tomitori
- Organizer
  JAIST International Symposium on Nano Technology 2007
- Place of Presentation
  JAIST, Japan
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Control of AFM tip apexes and bias-voltage nanomechanical spectroscopy(in Japanese)2007
- Author(s)
  M. Tomitori
- Organizer
  Workshop of the JSPS 141st committee of micro beam analysis
- Place of Presentation
  lshikawa Ongakudo, Kanazawa, Japan
- Year and Date
  2007-05-16
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Fabrication of it -conjugated molecule sysytem directly bound to Si substrate (in Japanese)2007
- Author(s)
  A. Itabashi, T. Nakayama, T. Arai, M. Tomitori, H. Murata
- Organizer
  Meeting of the Japan Society of Applied Physics
- Place of Presentation
  Hokkaido Institute of Technology, Univ., Sapporo, Japan
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Development I of high resolution FM atomic force microscopy operated in air or liquid (in Japanese)2007
- Author(s)
  M. Ohta, K. Watanabe, R. Kokawa, K. Kobayashi, H. Yamada, M. Abe, S. Morita, M. Tomitori, H. Onishi, T. Arai
- Organizer
  Meeting of the Japan Society of Applied Physics
- Place of Presentation
  Hokkaido Institute of Technology, Univ., Sapporo, Japan
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Scanning tunneling microscopy observation of 4,4'-diamino-P-telphenyl on Si (111) 7x7 at room temperature2007
- Author(s)
  T. Nishimura, A. Itabashi, H. Murata, T. Arai, M. Tomitori
- Organizer
  JAIST International Symposium on Nano Technology 2007
- Place of Presentation
  JAIST (石川県)
- Data Source
  KAKENHI-PROJECT-17310069
[Presentation] Nanoscale manipulation and characterization using STM-based instruments(Key note)2007
- Author(s)
  M. Tomitori
- Organizer
  ICCE 15
- Place of Presentation
  Haikou, China
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Surface electron spectroscopy using scanning probe microscopy from field-emission to force interaction under a tip-sample bias voltage(lnvited)2007
- Author(s)
  M.Tomitori, T.Arai and M.Hirade
- Organizer
  MRS Fall Meeting
- Place of Presentation
  Boston,USA
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] ペンシル型走査型プローブ顕微鏡を用いた探針成長の"その場"SEM観察2007
- Author(s)
  大久保芳彦、谷正安、松村浩司、新井豊子、富取正彦
- Organizer
  日本顕微鏡学会学術講演会
- Place of Presentation
  新潟、朱鷺メッセ
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] In situ SEM observation of tip growth with a pencil-type SPM (in Japanese)2007
- Author(s)
  Y. Ookubo, M. Tani, K. Matsumura, T. Arai, M. Tomitori
- Organizer
  Meeting of the Japan Society of Applied Physics
- Place of Presentation
  Aoyama Gakuin Univ., Sagamihara, Japa
- Year and Date
  2007-03-29
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Surface electron spectroscopy using scanning probe microscopy from field-emission to force interaction under a tip-sample bias voltage(invited)2007
- Author(s)
  M. Tomitori
- Organizer
  MRS fall meeting
- Place of Presentation
  Boston, USA
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Nanoscale manipulation and characterization using SPM-based instruments(lnvited,keynote)2007
- Author(s)
  M.Tomitori, Y.Ookubo, M.Tani and T.Ara
- Organizer
  The Fifteenth International Conference on Composites/Nano Engineering(ICCE-15)
- Place of Presentation
  Hainan,China
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Surface electron spectroscopy using scanning probe microscopy from field-emission to force interaction under a tip-sample bias voltage (invited)2007
- Author(s)
  M. Tomitori
- Organizer
  MRS fall meeting
- Place of Presentation
  Boston, USA
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Scanning tunneling microscopy observation of 4,4'-diamino-p-terphenyl on Si(1111)7x7 at room temperature2007
- Author(s)
  Takashi Nishimura, Atsushi Itabashi, Hideyuki Murata, Toyoko Arai Masahiko Tomitori
- Organizer
  1st International Symposium on Ultimate Stability of Nano-structured Polymers and Composites
- Place of Presentation
  石川ハイテク交流センター石川
- Year and Date
  2007-10-11
- Data Source
  KAKENHI-PROJECT-18041007
[Presentation] Nanoscale manipulation and characterization using pencil-type SPM combined with an ultrahigh-resolution field-emission SEM2007
- Author(s)
  H.Tsuneishi, Y.Ookubo, M.Tani, T.Arai, M.Tomitori
- Organizer
  JAIST International Symposium on Nano Technology 2007
- Place of Presentation
  Ishikawa,JAIST
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] STM study of 4,4'-diamino-p-terphenyl on Si (111) 7x72007
- Author(s)
  T. Nishimura, A. ltabashi, H. Murata, T. Arai, M. Tomitori
- Organizer
  ICSPM 15
- Place of Presentation
  Atagawa
- Data Source
  KAKENHI-PROJECT-17310069
[Presentation] Nanoscale manipulation and characterization using SPM-based instruments (invited, keynote)2007
- Author(s)
  M. Tomitori, Y. Ookubo, M. Tani, T. Arai
- Organizer
  ICCE 15
- Place of Presentation
  Haikou, China
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Nanoscale manipulation and characterization using pencil-type SPM combined with an ultrahigh-resolution field-emission SEM2007
- Author(s)
  H. Tsuneishi, Y. Ookubo, M. tani, T. Arai, M. Tomitori
- Organizer
  JAIST international symposium on Nano Technology 2007
- Place of Presentation
  JAIST (石川県)
- Data Source
  KAKENHI-PROJECT-17310069
[Presentation] Nanoscale manipulation and characterization using pencil-type SPM combined with an ultrahigh-resolution field-emission SEM2007
- Author(s)
  H. Tsuneishi, Y. Ookubo, M. Tani, T. Arai, M. Tomitori
- Organizer
  JAIST International Symposium on Nano Technology 2007
- Place of Presentation
  JAIST, Japan
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] シリコン基板に直接結合したπ共役系分子の形成2007
- Author(s)
  板橋敦、中山智祐、新井豊子、富取正彦、村田英幸
- Organizer
  応用物理学会
- Place of Presentation
  札幌、北海道工業大学
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] STM study of 4,4'-diamino-p-terphenyl on Si(111)7x72007
- Author(s)
  T.Nishimura, A.Itabashi, H.Murata, T.Arai, M.Tomitori
- Organizer
  ICSPM 15
- Place of Presentation
  Atagawa,Japan
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Scanning tunneling microscopy observation of 4,4'-diamino-p-terphenyl on Si(111)7x7at room temperature2007
- Author(s)
  T.Nishimura, A.Itabashi, H.Murata, T.Arai, M.Tomitori
- Organizer
  JAIST International Symposium on Nano Technology 2007
- Place of Presentation
  Ishikawa,JAIST
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] In situ observation by a an ultra-high resolution SEM combined with a pencil-type SPM (in Japanese)2007
- Author(s)
  Y. Oolcubo, M. Tani, K. Matsumura, T. Arai, M. Tomitori
- Organizer
  Annual meeting of the Japanese Society of Microscopy
- Place of Presentation
  Told Messe, Niigata, Japan
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] 「ペンシル型走査型プローブ顕微鏡を用いた探針成長の"その場"SEM観察」2007
- Author(s)
  大久保芳彦、谷正安、松村浩司、新井豊子、富取正彦
- Organizer
  日本顕微鏡学会学術講演会
- Place of Presentation
  新潟、朱鷺ヌツセ
- Data Source
  KAKENHI-PROJECT-17310069
[Presentation] Present state, and future prospects of STM, AFM and NSOM(in Japanese)2006
- Author(s)
  M. Tomitori, Y. Sugawara, T. Saeki
- Organizer
  Meeting of the Japan Society of Applied Physics
- Place of Presentation
  Musashi Institute of Technology, T
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Consideration of bias-voltage force curve and Kelvin force(in Japanese)2006
- Author(s)
  M. Tomitori
- Organizer
  Workshop of SPM session of the Japanese Society of Microscopy
- Place of Presentation
  Kyoto Campus Plaza, Kyoto, Japan
- Year and Date
  2006-12-12
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Attaching aromatic molecules to the Si(111) surfaces via conjugated bond2006
- Author(s)
  H. Murata, A. Itabashi, T. Arai, M. Tomitori
- Organizer
  10th ISSP International Symposium on Nanoscience at Surfaces (ISSP-10)
- Place of Presentation
  Kashiwa, Japan
- Year and Date
  2006-10-19
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] In situ tip treatments for nano scale observation and characterization with scanning probe microscopy2006
- Author(s)
  M. Tomitori, Z.A. Ansari, T. Arai
- Organizer
  ICN+T 2006
- Place of Presentation
  Basel, Switzerland
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Noncontact Atomic Force Microscopy/ spectroscopy with Changing Bias Voltage for Interaction Analysis between Two Bodies2006
- Author(s)
  M. Tomitori
- Organizer
  11th International Ceramics Congress (CIMTEC2006)
- Place of Presentation
  Sicily, Italy
- Year and Date
  2006-06-06
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17310069
[Presentation] In situ tip treatments for nano scale observation and characterization with scanning probe microscopy2006
- Author(s)
  M. Tomitori
- Organizer
  ICN+T2006
- Place of Presentation
  Basel, Switzerland
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Measurements of interaction force and current between a clean Si tip and a Si surface by bias-voltage noncontact atomic force spectroscopy(in Japanese)2006
- Author(s)
  T. Arai, M. Tomitori
- Organizer
  Meeting of the Japan Society of Applied Physics
- Place of Presentation
  Musashi Institute of Technology, Tok
- Year and Date
  2006-03-25
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] In Situ Tip Treatments for Nano Scale Observation and Characterization with Scanning Probe Microscopy2006
- Author(s)
  富取正彦
- Organizer
  International Conference on Nanoscience and Technology(ICN+T2006)
- Place of Presentation
  Basel, Switzerland
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17310069
[Presentation] Noncontact Atomic Force Microscopy/spectroscopy with Changing Bias Voltage for Interaction Analysis between Two Bodies2006
- Author(s)
  富取正彦
- Organizer
  11th International Ceramics Congress(CIMTEC2006)
- Place of Presentation
  Sicily, Italy
- Year and Date
  2006-06-06
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17310069
[Presentation] Evaluation of materials and devices by SPM(in Japanese)2006
- Author(s)
  K. Sueoka, S. Hasegawa, M. Tomitori, H. Usuda, H. Onishi, A. Ikai, K. Nakajima
- Organizer
  Meeting of the Japan Society of Applied Physics
- Place of Presentation
  Musashi Institute of Technology, T
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Noncontact atomic force microscopy/spectroscopy with changing bias voltage for interaction analysis between two bodies(invited)2006
- Author(s)
  M. Tomitori
- Organizer
  11th International Ceramics Congress(CIMTEC2006)
- Place of Presentation
  Sicily, Italy
- Year and Date
  2006-06-06
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Measurements of interaction force and conductance in proximity by noncontact atomic force spectroscopy(in Japanese)2006
- Author(s)
  T. Arai, M. Tomitori
- Organizer
  Meeting of the Physical Society of Japan
- Place of Presentation
  Ehime Univ., Matsuyama, Japan
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] In Situ Tip Treatments for Nano Scale Observation and Characterization with Scanning Probe Microscopy2006
- Author(s)
  M. Tomitori
- Organizer
  International Conference on Nanoscience and Technology (ICN+T2006)
- Place of Presentation
  Basel, Switzerland
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17310069
[Presentation] AFM探針先端制御と電圧印加ナノ力学分光2006
- Author(s)
  富取正彦
- Organizer
  マイクロビームアナリシス第141委員会研究会
- Place of Presentation
  石川県音楽堂、金沢
- Year and Date
  2006-05-16
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] STM, AFM, NSOMの現状と将来2006
- Author(s)
  富取正彦
- Organizer
  応用物理学会
- Place of Presentation
  武蔵工業大学
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Noncontact atomic force microscopy/ spectroscopy with changing bias voltage for interaction analysis between Two bodies2006
- Author(s)
  M. Tomitori
- Organizer
  11 th International Ceramics Congress (CIMTEC2006)
- Place of Presentation
  Sicily, Italy
- Year and Date
  2006-06-06
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] π-conjugated molecules directly attached to Si(111) surface2006
- Author(s)
  H. Murata, A. Itabashi, T. Arai, M. Tomitori
- Organizer
  Electronic Structure and Processes of Molecular-Based Interfaces : In Relation to Organic and Molecular Devices (ESPMI 06)
- Place of Presentation
  Nagoya, Japan
- Year and Date
  2006-03-03
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Nanoscale force interaction and conductance measurements using bias-voltage nc-AFM/S2006
- Author(s)
  T. Arai, M. Tomitori
- Organizer
  ICN+T 2006
- Place of Presentation
  Basel, Switzerland
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] 電圧印加フォーススペクトルとケルビンカの考察2006
- Author(s)
  富取正彦
- Organizer
  日本顕微鏡学会 SPM分科会研究会
- Place of Presentation
  京都キャンパスプラザ
- Year and Date
  2006-12-12
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] 原子間力顕微鏡の探針先端制御と電圧印加ナノ力学分光2005
- Author(s)
  富取正彦
- Organizer
  日本顕微鏡学会
- Place of Presentation
  エポカルつくば、茨城
- Year and Date
  2005-06-01
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Vertically aligned it-conjugated molecules directly attached to silicon surface via covalent bond2005
- Author(s)
  A. Itabashi, T. Arai, M. Tomitori, H. Murata
- Organizer
  JAIST International Symposium on Nanotechnology 2005
- Place of Presentation
  JAIST, Japan
- Year and Date
  2005-09-15
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Cotnrol of an AFM tip apex and bias-voltage nanomechanical force spectroscopy (in Japanese)2005
- Author(s)
  M. Tomitori, T. Arai
- Organizer
  Meeting of the Japanese Society of Microscopy
- Place of Presentation
  Epocal Tsukuba, Tsulcuba, Japan
- Year and Date
  2005-06-01
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] 原子間力顕微鏡の探針先端制御と電圧印加ナノ力学分光2005
- Author(s)
  富取正彦
- Organizer
  日本顕微鏡学会第61回学術講演会
- Place of Presentation
  つくば
- Year and Date
  2005-06-01
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17310069
[Presentation] ティップサイエンス-実験系から-2005
- Author(s)
  富取正彦
- Organizer
  ナノプローブテクノロジー学振167委員会研究会
- Place of Presentation
  武蔵工業大学
- Year and Date
  2005-10-19
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] First principles calculation of Joule heat due to displacement current induced between an nc-AFM tip and a sample(in Japanese)2005
- Author(s)
  M. Tanaka, S. Furuya, T. Arai, M. Tomitori, S. Watanabe
- Organizer
  Meeting of the Physical Society of Japan
- Place of Presentation
  Doshisha Univ., Kyotanabe, Japan
- Year and Date
  2005-09-19
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Bacicscattered electron spectroscopy from Al/Si(111) using a field emission STM (in Japanese)2005
- Author(s)
  M. Hirade, T. Arai, M. Tomitori
- Organizer
  Meeting of the Japanese Society of Applied Physics
- Place of Presentation
  Tokushima Univ., Tokushima, Japan
- Year and Date
  2005-09-07
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Energy spectra of electrons backscattered from sample surfaces with hetero structures using field emission scanning tunneling microscopy2005
- Author(s)
  M. Hirade, T. Arai, M. Tomitori
- Organizer
  13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM05)
- Place of Presentation
  Sapporo, Japan
- Year and Date
  2005-07-07
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Tip science from a viewpoint of experiment(in Japanese)2005
- Author(s)
  M. Tomitori
- Organizer
  Workshop of the JSPS 167th committee of nanoprobe technology
- Place of Presentation
  Osaka Univ., Japan
- Year and Date
  2005-10-19
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Analysis of interaction between a tip and a sample by bias-voltage noncontact atomic force microscopy/spectroscopy(in Japanese)2005
- Author(s)
  T. Arai, M. Tomitori
- Organizer
  Meeting of the Physical Society of Japan
- Place of Presentation
  Doshisha Univ. Kyototanabe, Japan
- Year and Date
  2005-09-19
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Self-assembled Ge nano-clusters grown on Si(111)-7x7 at elevated temperatures2005
- Author(s)
  Z. A. Ansari, T. Arai, M. Tomitori
- Organizer
  13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM05)
- Place of Presentation
  Sapporo, Japan
- Year and Date
  2005-07-07
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Spectroscopic measurement of atom-atom interaction force by bias-voltage noncontact AFM (in Japanese)2005
- Author(s)
  T. Arai, M. Tomitori
- Organizer
  Meeting of the Japanese Society of Applied Physics
- Place of Presentation
  Tokushima Univ., Tokushima, Japan
- Year and Date
  2005-09-08
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Bias-voltage dependence of chemical bonding force detected by noncontact atomic Force microscopy/spectroscopy2005
- Author(s)
  T. Arai, M. Tomitori
- Organizer
  13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM05)
- Place of Presentation
  Sapporo, Japan
- Year and Date
  2005-07-04
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Electron standing wave analysis in an STM vacuum gap for nano-structure fabrication on Si surfaces2005
- Author(s)
  M. M. Rahman, K. Yamagishi, T. Arai, M. Tomitori
- Organizer
  13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM05)
- Place of Presentation
  Sapporo, Japan
- Year and Date
  2005-07-05
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206005
[Presentation] Water wettability of Si surfaces prepared in an ultrahigh vacuum chamber
- Author(s)
  T. Miyagi, A. Sasahara and M. Tomitori,
- Organizer
  the 22th International Colloquium on Scanning Probe Microscopy ICSPM22
- Place of Presentation
  Atagawa Heights, Higashiizu, Kamo, Shizuoka
- Year and Date
  2014-12-11 – 2014-12-13
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] Silicon oxide layers hetero-epitaxially grown on rutile TiO2(110) surfaces observed by non-contact atomic force microscopy in water
- Author(s)
  L. T. U. Tu, A. Sasahara and M. Tomitori
- Organizer
  the 17th international conference on non-contact atomic force microscopy
- Place of Presentation
  Tsukuba International Congress Center, Tsukuba, Ibaraki, Japan
- Year and Date
  2014-08-04 – 2014-08-08
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] Force spectroscopy of an NH3-reacted Si(111)-(7×7) surface by non-contact AFM with different tip states
- Author(s)
  T. Arai, Y. Sakano, R. Inamura and M. Tomitori
- Organizer
  the 22th International Colloquium on Scanning Probe Microscopy ICSPM22
- Place of Presentation
  Atagawa Heights, Higashiizu, Kamo, Shizuoka
- Year and Date
  2014-12-11 – 2014-12-13
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] Atomic contrast change of NH3-related Si(111)-7x7 surfaces observed by non-contact atomic force microscopy
- Author(s)
  T. Arai, Y. Sakano and M. Tomitori
- Organizer
  the 17th international conference on non-contact atomic force microscopy
- Place of Presentation
  Tsukuba International Congress Center, Tsukuba, Ibaraki, Japan
- Year and Date
  2014-08-04 – 2014-08-08
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] 非接触原子間力顕微鏡／力分光法によるNH3反応Si(111)-(7×7)表面上のNH3とH吸着基の識別
- Author(s)
  坂野友樹、稲村竜、富取正彦、新井豊子
- Organizer
  第62回応用物理学会春季学術講演会
- Place of Presentation
  東海大学　湘南キャンパス、神奈川、平塚
- Year and Date
  2015-03-11 – 2015-03-14
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] Nanoscale capacitive analysis of surface states using a charge amplifier based on non-contact atomic force microscopy
- Author(s)
  M. Nogami, T. Arai, A. Sasahara, M. Tomitori
- Organizer
  the 17th international conference on non-contact atomic force microscopy
- Place of Presentation
  Tsukuba International Congress Center, Tsukuba, Ibaraki, Japan
- Year and Date
  2014-08-04 – 2014-08-08
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] Atom-resolved FM-AFM imaging of a KBr(001) surface covered with water layers in air with high humidity
- Author(s)
  T. Arai, M. Koshioka, K. Abe, M. Tomitori, R. Kokawa, M. Ohta, H. Yamada, K. Kobayashi and N. Oyabu
- Organizer
  the 17th international conference on non-contact atomic force microscopy
- Place of Presentation
  Tsukuba International Congress Center, Tsukuba, Ibaraki, Japan
- Year and Date
  2014-08-04 – 2014-08-08
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] 非接触原子間力顕微鏡におけるSi探針上の水素終端膜によるエネルギー散逸量への影響
- Author(s)
  稲村竜、坂野友樹、富取正彦、新井豊子
- Organizer
  第62回応用物理学会春季学術講演会
- Place of Presentation
  東海大学　湘南キャンパス、神奈川、平塚
- Year and Date
  2015-03-11 – 2015-03-14
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] Sharpening probes towards nanoscale imaging using scanning probe microscopy
- Author(s)
  M. Tomitori
- Organizer
  The 1st Malaysia-Japan Joint symposium on Nanotechnology 2014
- Place of Presentation
  UKM, Bangi, Malaysia
- Year and Date
  2014-12-10 – 2014-12-11
- Invited
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] NC-AFMに組み込んだチャージアンプと電流アンプ出力の同時測定
- Author(s)
  野上真、新井豊子、笹原亮、富取正彦
- Organizer
  第62回応用物理学会春季学術講演会
- Place of Presentation
  東海大学　湘南キャンパス、神奈川、平塚
- Year and Date
  2015-03-11 – 2015-03-14
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] Characterization and fabrication of nanoscale sharpened probes using scanning probe microscopy techniques
- Author(s)
  M. Tomitori
- Organizer
  the 9th India Japan Bilateral Conference, BICON-2014
- Place of Presentation
  Jaipur, India
- Year and Date
  2014-10-12 – 2014-10-17
- Invited
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] Change in water wettability under Cassie-Baxter law for SiO2 patched over layers epitaxially grown on a rutile TiO2(110) surface
- Author(s)
  L. T. U. Tu, A. Sasahara and M. Tomitori
- Organizer
  the 22th International Colloquium on Scanning Probe Microscopy ICSPM22
- Place of Presentation
  Atagawa Heights, Higashiizu, Kamo, Shizuoka
- Year and Date
  2014-12-11 – 2014-12-13
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] 非接触原子間力顕微鏡／力学分光法による微量NH3を反応させたSI(111)-7x7表面電子状態解析
- Author(s)
  坂野友樹、富取正彦、新井豊子
- Organizer
  第75回応用物理学会秋期学術講演会
- Place of Presentation
  北海道大学、北海道、札幌
- Year and Date
  2014-09-17 – 2014-09-20
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] Photo-induced super-hydrophilicity of SiO2 overlayers epitaxially grown on a rutile TiO2(110) surface
- Author(s)
  L. T. U. Tu, A. Sasahara and M. Tomitori
- Organizer
  7th International Workshop on Advanced Materials Science and Nanotechnology, IWAMSN 2014
- Place of Presentation
  Ha Long City, Vietnam
- Year and Date
  2014-11-02 – 2014-11-06
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] AFMとXPSを用いたMgO(100)単結晶表面の溶解の解析
- Author(s)
  笹原亮、村上達也、富取正彦
- Organizer
  第62回応用物理学会春季学術講演会
- Place of Presentation
  東海大学　湘南キャンパス、神奈川、平塚
- Year and Date
  2015-03-11 – 2015-03-14
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] SPM探針への応用に向けたタングステン酸化物の針状結晶成長法
- Author(s)
  永島一樹、富取正彦、新井豊子
- Organizer
  第75回応用物理学会秋期学術講演会
- Place of Presentation
  北海道大学、北海道、札幌
- Year and Date
  2014-09-17 – 2014-09-20
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] 針が繋ぐナノとマクロの顕微鏡技術　-FIM/SPM/SEM-
- Author(s)
  富取正彦
- Organizer
  日本顕微鏡学会第58回シンポジウム
- Place of Presentation
  九州大学医学部百年講堂、福岡、福岡
- Year and Date
  2014-11-16 – 2014-11-17
- Invited
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] 酸化チタン(110)表面上に吸着したパラジクロロベンゼンの原子スケール超高真空走査型トンネル顕微鏡観察
- Author(s)
  八鍬雄貴、笹原亮、富取正彦
- Organizer
  平成26年度応用物理学会北陸・信越支部学術講演会
- Place of Presentation
  富山大学工学部、富山、富山
- Year and Date
  2014-11-07 – 2014-11-08
- Data Source
  KAKENHI-PROJECT-24246014
[Presentation] NC-AFMに組込んだチャージアンプの出力解析
- Author(s)
  野上真、新井豊子、笹原亮、富取正彦
- Organizer
  第75回応用物理学会秋季学術講演会
- Place of Presentation
  北海道大学、北海道、札幌
- Year and Date
  2014-09-17 – 2014-09-20
- Data Source
  KAKENHI-PROJECT-26630330
[Presentation] Silicon surfaces etched with atomic hydrogen observed by environmental controlled non-contact atomic force microscopy
- Author(s)
  T. Miyagai, A. Sasahara, M. Tomitori, R. Kokawa, M. Ohta, H. Yamada, K. Kobayashi and N. Oyabu
- Organizer
  the 17th international conference on non-contact atomic force microscopy
- Place of Presentation
  Tsukuba International Congress Center, Tsukuba, Ibaraki, Japan
- Year and Date
  2014-08-04 – 2014-08-08
- Data Source
  KAKENHI-PROJECT-24246014

1. ARAI Toyoko (20250235)

# of Collaborated Projects: 11 results

# of Collaborated Products: 0 results
2. NISHIKAWA Osamu (10108235)

# of Collaborated Projects: 9 results

# of Collaborated Products: 0 results
3. MURATA Hideyuki (10345663)

# of Collaborated Projects: 6 results

# of Collaborated Products: 38 results
4. TAKAYANAGI Kunio (80016162)

# of Collaborated Projects: 3 results

# of Collaborated Products: 0 results
5. 西垣敏 (60126943)

# of Collaborated Projects: 3 results

# of Collaborated Products: 0 results
6. 楠勲 (30025390)

# of Collaborated Projects: 3 results

# of Collaborated Products: 0 results
7. OTSUKA Nobuo (80111649)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
8. SASAHARA Akira (40321905)

# of Collaborated Projects: 2 results

# of Collaborated Products: 37 results
9. 原田義也 (20013477)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
10. TAKAMURA Yukiko (90344720)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
11. TAKAMURA YUZURU (20290877)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
12. IKAI Atsushi (50011713)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
13. ARAKAWA Hideo (80211704)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
14. KIMURA Yoshinobu (60225076)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
15. KAWAZU Akira (20010796)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
16. HASEGAWA Tetsuya (10189532)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
17. SHIGEKAWA Hidemi (20134489)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
18. OGAWA Keiichi (00233411)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
19. IWASAWA Yasuhiro (40018015)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
20. 青野正和 (10184053)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
21. 上田一之 (60029212)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
22. 森田清三 (50091757)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
23. 菅原康弘 (40206404)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
24. 武笠幸一 (00001280)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
25. 西竜治 (40243183)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
26. 中村勝吾 (50029831)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
27. 大島義文 (80272699)

# of Collaborated Projects: 1 results

# of Collaborated Products: 40 results
28. ISHIKAWA Yuuichi

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
29. 堀内敬

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
30. 富取豊子

# of Collaborated Projects: 0 results

# of Collaborated Products: 200 results
31. 山田啓文

# of Collaborated Projects: 0 results

# of Collaborated Products: 1 results
32. 小林圭

# of Collaborated Projects: 0 results

# of Collaborated Products: 1 results

Tomitori Masahiko 富取 正彦

TOMITORI Masahiko 富取 正彦

冨取 正彦 トミトリ マサヒコ

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Nanoscale mechanical analysis of nanocontacts using combined scanning probe microscopy capable of detection of energy dissipationPrincipal Investigator

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Measurements of the charge state of a molecule on a solid substrate on the basis of scanning probe microscopyPrincipal Investigator

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Analysis and fabrication of nanoscale contacts and interfaces by scanning probe microscopy technologyPrincipal Investigator

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In-situ observation and analysis of nano contacts and junctions formation at high temperatures by a combined microscope of SEM and SPMPrincipal Investigator

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Analysis of binding formation between solid surfaces by bias voltage non-contact atomic force microscopy/spectroscopyPrincipal Investigator

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Measurements of electronic properties of interfaces with functional nanostructures by bias-voltage non-contact atomic force microscopy/spectroscopyPrincipal Investigator

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走査型プローブ顕微鏡によるDNA分子の半導体表面ステップへの特異吸着の研究Principal Investigator

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Study of electric field close to a sample surface utilizing the electron standing wave excited in a vacuum gap of scanning tunneling microscopyPrincipal Investigator

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Tomitori Masahiko 富取正彦

TOMITORI Masahiko 富取正彦

冨取正彦トミトリマサヒコ