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Tomitori Masahiko  富取 正彦

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… Alternative Names

TOMITORI Masahiko  富取 正彦

冨取 正彦  トミトリ マサヒコ

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Researcher Number 10188790
Other IDs
External Links
Affiliation (Current) 2025: 北陸先端科学技術大学院大学, 先端科学技術研究科, 名誉教授
Affiliation (based on the past Project Information) *help 2022 – 2024: 北陸先端科学技術大学院大学, 先端科学技術研究科, 名誉教授
2018 – 2022: 北陸先端科学技術大学院大学, 先端科学技術研究科, 教授
2016: 北陸先端科学技術大学院大学, 先端科学技術研究科, 教授
2006 – 2015: 北陸先端科学技術大学院大学, マテリアルサイエンス研究科, 教授
1994 – 2005: 北陸先端科学技術大学院大学, 材料科学研究科, 助教授 … More
1996: 北陸先端科学技術大学院大学, 材料科学研究所, 助教授
1994: 北陸先端科学技術大学院大学, 助教授
1993: TOKYO INSTITUTE OF TECHNOLOGY, INTERDISCIPLINARY GRADUATE SCHOOL OF SCIENCE AND TECHNOLOGY RESEARCH ASSOCIATE, 大学院・総合理工学研究科, 助手
1993: Materials Sci. & Engi, assistant, 大学院・総合理工学研究科, 教授
1993: 東京工業大学, 大学院総合理工, 助手
1993: 東京工業大学, 大学院総合理工学研究所, 助手
1992: Tokyo Inst. Technology, Dept. of Surface Science Assistant, 綜合理工学研究科, 助手
1991 – 1992: 東京工業大学, 総合理工学研究科, 助手
1986 – 1992: 東京工業大学, 大学院総合理工学研究科, 助手
1991: Tokyo Inst. Technol., Mat. Sci. Eng., Research Asso., 大学院総合理I学研究科, 助手
1991: Tokyo Inst. Technol., Mat, Sci. Eng., Research Asso., 大学院総合理工学研究所, 助手
1990: Tokyo Inst. Technol., Mat. Sci. Eng., Research Asso., 総合理工学研究科, 助手
1990: 東京工業大学. 大学院総合理工学研究科, 助手 Less
Review Section/Research Field
Principal Investigator
表面界面物性 / Thin film/Surface and interfacial physical properties / Medium-sized Section 29:Applied condensed matter physics and related fields / Physical properties of metals / Applied materials / Composite materials/Surface and interface engineering / Nanomaterials/Nanobioscience
Except Principal Investigator
Applied materials / Medium-sized Section 28:Nano/micro science and related fields / Nanomaterials/Nanobioscience … More / Science and Engineering / 物質生物化学 / 物理計測・光学 / Physical properties of metals / Microdevices/Nanodevices Less
Keywords
Principal Investigator
走査型トンネル顕微鏡 / 表面・界面物性 / 走査プローブ顕微鏡 / 走査型トンネル分光法 / シリコン / silicon / scanning tunneling microscopy / ナノコンタクト / 電界放射 / 走査型プローブ顕微鏡 … More / field emission / build-up / scanning tunneling spectroscopy / 電界放射顕微鏡 / ゲルマニウム / エネルギー散逸 / 物性実験 / 相互作用力 / 接合 / 電子顕微鏡 / interaction force / bias-voltage non-contact atomic force spectroscopy / non-contact atomic force microscopy / electronic properties / nanoscale interface / surface and interface properties / scanning probe microscopy / ナノ力学分光 / 電圧印加非接触原子間力分光 / 電圧印加非接触原子間力分光法 / 非接触原子間力顕微鏡 / 電子物性 / ナノ構造界面 / surface image state / surface electric field / vacuum gap / electron standing wave / 鏡映力表面状態 / 表面電界 / 真空ギャップ / 電子定在波 / electron spectroscopy / build-up tip / scanning tunneling microscope / field electron emission scanning probe microscope / 電子エネルギー分析 / ビルドアップ探針 / 電界電子放射走査型プローブ顕微鏡 / germanium / field emission microscope / [111] -orented W tip / atom resolved tunneling spectroscopy / build‐up処理 / [III]方位W探針 / 電界イオン顕微鏡 / build-up処理 / [111]方位W探針 / 原子分解トンネル分光法 / tungsten / inertia piezomotor / field emission microscopy / atom transfer / ピエゾ慣性駆動モータ / 3次元粗動機構 / 電界放射電子分光法 / ピエゾ素子慣性駆動モータ / 3次元粗動 / 超高真空 / シリコン(111)面 / T-F処理 / タングステン / シリコン(lll)面 / ピエゾ素子慣性駆動 / 原子移送 / Epitaxial Growth / Eptaxial Growth / Germanium / Silicon / Scanning Tunneling Spectroscopy / Scanning Tunneling Microscopy / ヘテロ構造 / エピタキシャル成長 / ダイマー / Ge(ゲルマニウム) / Si(シリコン) / Scanning Tip Apex / Field Emission Electron Spectroscopy (FEES) / Atom-Probe Field Ion Microscope (A-P FIM) / Scanning Tunneling Microscope (STM) / Scanning Tunneling Spectroscopy (STS) / Scanning X Microscope (SXM) / 原子間力顕微鏡 / 位置検出型アトムプロ-ブ / 走査探針 / 電界放射分光法 / アトムプロ-ブ・電界イオン顕微鏡 / 走査型探索顕微鏡 / 分子計測 / 電荷移動 / 走査電子顕微鏡 / トンネル障壁 / コンダクタンス / 結合力 / 吸着 / ステップ / 走査型電子顕微鏡 / DNA / 分子吸着 / 表面電子状態 / エネルギーフィルター / 非弾性トンネル過程 / 共鳴トンネル過程 / トンネル過程 / 針状試料 / シャド-効果 / シャドー効果 / 探針 / Si(001) / Geクラスター … More
Except Principal Investigator
走査型トンネル顕微鏡(STM) / 高温超電導セラミックス / クラスターイオン / ナノ力学 / タングステン探針 / 赤外分光 / 周波数変調原子間力顕微鏡 / トンネル物性 / STM / 走査型トンネル顕微鏡 / Surface / Tip Apex / He準安定原子線 / アトムプローブ / 走査プローブ顕微鏡 / ナノ材料 / 非接触原子間力顕微鏡 / 原子プローブ(AーP) / 力学的エネルギー散逸 / 原子レベル顕微鏡/分光法 / High Temperature Superconducting Ceramics / Doopants / Oxidation Process of Polymers / Metal-Polymer Interfaces / Polypyrrole / Conducting Polymers / Atom-Probe / ドーパント / 高分子の酸化過程 / 金属-高分子界面 / ポリピロール / 電導性高分子 / non-contact atomic force microscopy / surface and interface / chemical bonding / nano material / interaction force / scanning probe microscopy / 電圧印加非接触原子間力分光法 / 表面局在相互作用分光法 / ナノ力学分光 / 表面・界面物性 / 化学結合力 / 相互作用力 / two-dimensional phase / adsorption / scanning tunneling microscopy / surface / GaAs(001)表面 / 電荷密度波 / 高温超伝導体 / 電荷移動錯体 / シリコン表面構造 / 層状物質 / 超伝導 / 触媒 / 半導体 / 走査トンネル分光法 / 2次元相 / 吸着 / 走査トンネル顕微鏡 / 表面 / Schottkey barrier / epitaxy / ultra-high vacuum electron microscope / シリコン・金属界面 / 原子スケール界面構造 / 超高真空電子顕微鏡法 / エピタクシャル界面 / ショットキー障壁 / エピタクシー / 超高真空電子顕微鏡 / Tabacco Mosasic Virus / Bacteriophage T4 / Clean and Well defined Conditions / Interacting Biological Molecular Systems / Tunneling Property / Scanning Tunneling Microscope / 生体分子 / 生体分子のトンネル物性 / 生体用走査型トンネル顕微鏡 / バイオSTM / 生物試料 / バクテリオファージ / タバコモザイクウイルス / バクテリオファージT4 / 清浄定質ふん囲気 / 生体分子相互作用系 / Vacuum Gauge / Imaging Faraday Cage / Ultra-High Vacuum / Field Emission Microsocpe (FEM) / Field Emission / 映像型ファラディ-ケイジ / 電界放射型極高真空計 / 電界放射 / 極高真空 / Field Emission Electron Spectrometer (FEES) / Scanning Tunneling Spectroscopy (STS) / Si cluster / Atom-Probe (A-P) / Scanning Tunneling Microscope (STM) / 電流映像型トンネル電子分光法(CITS) / 走査探針先端 / 二極走査型トンネル映像法(DPTI) / 電子の状態密度 / STM・A-P複合器 / アトムプロ-ブ(A-P) / 位置感知型AーP / 電界放射電子分光器(FEES) / 走査型トンネル電子分光(STS) / STM・AーP複合器 / アトムプロ-ブ(AーP) / K+O共吸収系 / Cs@Si(111)とK@Si(100)吸着系 / 分子線 / ペニングイオン化電子分光 / 再配列構造 / Si(111) / 電子分光 / ペニングイオン化 / シリコン / パルスレーザー光照射 / 原子プローブ(A-P) / GaP / GaAs / Si / パルスレーザー / 点状イオン源 / ナノ力学的顕微分光法 / 走査型プローブ顕微鏡 / 顕微分光 / ナノ表面・界面 / 結合形成過程 / 化学結合 / 有機薄膜太陽電池 / 配向制御 / エレクトロスピンニング / 分子デバイス / 共役系分子 / ナノコンタクト / π共役係分子 / アミノ基終端シリコン表面 / 探針清浄化 / 探針先鋭化 / フォース・マッピング / 原子間力分光 / 原子間力 / 極低温 / 原子位置の力学的制御 / 交換力顕微法 / 原子の力学的同定 / 原子間力の判別 / 非接触 / 原子間力顕微鏡 / 交換相互作用力顕微法 / 磁気相互作用力 / ピラーの形成 / ダンピングエネルギー / 原子の力学的操作 / 原子の力学的識別 / 原子分解能 / 同軸型直衝突イオン散乱分光(CAICISS) / 表面の電子状態 / ペニングイオン電子分光法 / 表面構造 / イオンビーム散乱 / 電子励起イオン脱離(EDS) Less
  • Research Projects

    (33 results)
  • Research Products

    (407 results)
  • Co-Researchers

    (32 People)
  •  ナノ力学に基づく探針振動同期励起による原子レベルの赤外分光

    • Principal Investigator
      新井 豊子
    • Project Period (FY)
      2022 – 2024
    • Research Category
      Grant-in-Aid for Scientific Research (A)
    • Review Section
      Medium-sized Section 28:Nano/micro science and related fields
    • Research Institution
      Kanazawa University
  •  周波数変調/同期法を利用したナノ力学による原子レベルの顕微鏡/分光法の開拓

    • Principal Investigator
      新井 豊子
    • Project Period (FY)
      2021 – 2024
    • Research Category
      Grant-in-Aid for Challenging Research (Pioneering)
    • Review Section
      Medium-sized Section 28:Nano/micro science and related fields
    • Research Institution
      Kanazawa University
  •  Nanoscale mechanical analysis of nanocontacts using combined scanning probe microscopy capable of detection of energy dissipationPrincipal Investigator

    • Principal Investigator
      Tomitori Masahiko
    • Project Period (FY)
      2018 – 2021
    • Research Category
      Grant-in-Aid for Scientific Research (A)
    • Review Section
      Medium-sized Section 29:Applied condensed matter physics and related fields
    • Research Institution
      Japan Advanced Institute of Science and Technology
  •  Measurements of the charge state of a molecule on a solid substrate on the basis of scanning probe microscopyPrincipal Investigator

    • Principal Investigator
      Tomitori Masahiko
    • Project Period (FY)
      2014 – 2016
    • Research Category
      Grant-in-Aid for Challenging Exploratory Research
    • Research Field
      Composite materials/Surface and interface engineering
    • Research Institution
      Japan Advanced Institute of Science and Technology
  •  Analysis and fabrication of nanoscale contacts and interfaces by scanning probe microscopy technologyPrincipal Investigator

    • Principal Investigator
      Tomitori Masahiko
    • Project Period (FY)
      2012 – 2015
    • Research Category
      Grant-in-Aid for Scientific Research (A)
    • Research Field
      Thin film/Surface and interfacial physical properties
    • Research Institution
      Japan Advanced Institute of Science and Technology
  •  In-situ observation and analysis of nano contacts and junctions formation at high temperatures by a combined microscope of SEM and SPMPrincipal Investigator

    • Principal Investigator
      TOMITORI Masahiko
    • Project Period (FY)
      2010 – 2012
    • Research Category
      Grant-in-Aid for Challenging Exploratory Research
    • Research Field
      Thin film/Surface and interfacial physical properties
    • Research Institution
      Japan Advanced Institute of Science and Technology
  •  Characterization of conjugated molecule monolayer chemically bonded on semiconductor surface and its application to single molecular light emitting devices

    • Principal Investigator
      MURATA Hideyuki
    • Project Period (FY)
      2008 – 2011
    • Research Category
      Grant-in-Aid for Scientific Research (A)
    • Research Field
      Microdevices/Nanodevices
    • Research Institution
      Japan Advanced Institute of Science and Technology
  •  Analysis of binding formation between solid surfaces by bias voltage non-contact atomic force microscopy/spectroscopyPrincipal Investigator

    • Principal Investigator
      TOMITORI Masahiko
    • Project Period (FY)
      2008 – 2011
    • Research Category
      Grant-in-Aid for Scientific Research (A)
    • Research Field
      Thin film/Surface and interfacial physical properties
    • Research Institution
      Japan Advanced Institute of Science and Technology
  •  Atomic force spectroscopy of chemical bonding process with bias voltage tuning between a tip and a sample

    • Principal Investigator
      ARAI Toyoko
    • Project Period (FY)
      2008 – 2011
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Nanomaterials/Nanobioscience
    • Research Institution
      Kanazawa University
  •  シリコン表面に化学結合した共役系分子の電気伝導

    • Principal Investigator
      MURATA Hideyuki
    • Project Period (FY)
      2006 – 2007
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Review Section
      Science and Engineering
    • Research Institution
      Japan Advanced Institute of Science and Technology
  •  Measurements of electronic properties of interfaces with functional nanostructures by bias-voltage non-contact atomic force microscopy/spectroscopyPrincipal Investigator

    • Principal Investigator
      TOMITORI Masahiko
    • Project Period (FY)
      2005 – 2007
    • Research Category
      Grant-in-Aid for Scientific Research (A)
    • Research Field
      Thin film/Surface and interfacial physical properties
    • Research Institution
      Japan Advanced Institute of Science and Technology
  •  Mechanical and electronic measurements based on scanning probe microscopy for single molecules on surfaces using electron resonant interaction

    • Principal Investigator
      ARAI Toyoko
    • Project Period (FY)
      2005 – 2007
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Nanomaterials/Nanobioscience
    • Research Institution
      Kanazawa University
      University of Tsukuba
  •  走査型プローブ顕微鏡によるDNA分子の半導体表面ステップへの特異吸着の研究Principal Investigator

    • Principal Investigator
      富取 正彦
    • Project Period (FY)
      2003 – 2004
    • Research Category
      Grant-in-Aid for Exploratory Research
    • Research Field
      Nanomaterials/Nanobioscience
    • Research Institution
      Japan Advanced Institute of Science and Technology
  •  Study of electric field close to a sample surface utilizing the electron standing wave excited in a vacuum gap of scanning tunneling microscopyPrincipal Investigator

    • Principal Investigator
      TOMITORI Masahiko
    • Project Period (FY)
      2000 – 2002
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      表面界面物性
    • Research Institution
      Japan Advanced Institute, of Science and Technology
  •  超高分解能原子間力プローブ法による原子の力学的分光と制御

    • Principal Investigator
      森田 清三
    • Project Period (FY)
      1999 – 2002
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Review Section
      Science and Engineering
    • Research Institution
      Osaka University
  •  エネルギーフィルター電界放射顕微鏡による表面吸着電子状態解析の試みPrincipal Investigator

    • Principal Investigator
      富取 正彦
    • Project Period (FY)
      1999 – 2000
    • Research Category
      Grant-in-Aid for Exploratory Research
    • Research Field
      表面界面物性
    • Research Institution
      Japan Advanced Institute of Science and Technology
  •  Development of a field electron emission-scanning probe microscope with a build-up tipPrincipal Investigator

    • Principal Investigator
      TOMITORI Masahiko
    • Project Period (FY)
      1998 – 2000
    • Research Category
      Grant-in-Aid for Scientific Research (B).
    • Research Field
      表面界面物性
    • Research Institution
      Japan Advanced Institute of Science and Technology
  •  ナノスケール探針のシャドー効果による光・電子照射測定の空間分解能向上の試みPrincipal Investigator

    • Principal Investigator
      富取 正彦
    • Project Period (FY)
      1997 – 1998
    • Research Category
      Grant-in-Aid for Exploratory Research
    • Research Field
      表面界面物性
    • Research Institution
      Japan Advanced Institute of Science and Technology
  •  Recognition of atomic species on hetero-surfaces by atom resolved tunneling spectroscopyPrincipal Investigator

    • Principal Investigator
      TOMITORI Masahiko
    • Project Period (FY)
      1995 – 1997
    • Research Category
      Grant-in-Aid for Scientific Research (A)
    • Research Field
      表面界面物性
    • Research Institution
      Japan Advanced Institute of Science and Technology
  •  STM/STSによる半導体微粒子の研究Principal Investigator

    • Principal Investigator
      富取 正彦
    • Project Period (FY)
      1993
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Tokyo Institute of Technology
  •  Tunneling Characteristics in Atomic Resolution

    • Principal Investigator
      KAWAZU Akira
    • Project Period (FY)
      1993 – 1996
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      The University of Tokyo
  •  Construction of an experimental apparatus for atom transfer between nano-regionsPrincipal Investigator

    • Principal Investigator
      TOMITORI Masahiko
    • Project Period (FY)
      1993 – 1995
    • Research Category
      Grant-in-Aid for Developmental Scientific Research (B)
    • Research Field
      表面界面物性
    • Research Institution
      Japan Advanced Institute of Science and Technology, Hokuriku
      Tokyo Institute of Technology
  •  Schottrey barrier height of epitaxial interface studied by UHV-electron microscope

    • Principal Investigator
      TAKAYANAGI Kunio
    • Project Period (FY)
      1992 – 1993
    • Research Category
      Grant-in-Aid for General Scientific Research (B)
    • Research Field
      Applied materials
    • Research Institution
      Tokyo Institute of Technology
  •  Microscopic Study of Si-Ge Heteroepitaxial Growth by STM/STSPrincipal Investigator

    • Principal Investigator
      TOMITORI Masahiko
    • Project Period (FY)
      1992 – 1993
    • Research Category
      Grant-in-Aid for General Scientific Research (C)
    • Research Field
      Physical properties of metals
    • Research Institution
      TOKYO INSTITUTE OF TECIHNOLOGY
  •  Development of Preparation Methods of SXM Tips with a Ultra-fine Probing AreaPrincipal Investigator

    • Principal Investigator
      TOMITORI Masahiko
    • Project Period (FY)
      1990 – 1991
    • Research Category
      Grant-in-Aid for Developmental Scientific Research (B)
    • Research Field
      Applied materials
    • Research Institution
      Tokyo Institute of Technology
  •  Development of Field Emission Type Ultra-High Vacuum Gauge

    • Principal Investigator
      NISHIKAWA Osamu
    • Project Period (FY)
      1990 – 1991
    • Research Category
      Grant-in-Aid for Developmental Scientific Research (B)
    • Research Field
      物理計測・光学
    • Research Institution
      Tokyo Institute of Technology
  •  Construction of Scanning Tunneling Microscope for the Study of Interacting Biological Molecualr Systems and their Preparation

    • Principal Investigator
      IKAI Atsushi
    • Project Period (FY)
      1990 – 1992
    • Research Category
      Grant-in-Aid for Developmental Scientific Research (B)
    • Research Field
      物質生物化学
    • Research Institution
      Tokyo Institute of Technology
  •  原子プローブ:レーザー誘起電界蒸発等による表面研究

    • Principal Investigator
      NISHIKAWA Osamu
    • Project Period (FY)
      1989
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Tokyo Institute of Technology
  •  Ultra-Fine Surface Analysis by a Combined Instrument of an STM and A-P

    • Principal Investigator
      NISHIKAWA Osamu
    • Project Period (FY)
      1989 – 1990
    • Research Category
      Grant-in-Aid for General Scientific Research (B)
    • Research Field
      Physical properties of metals
    • Research Institution
      Tokyo Institute of Technology
  •  原子プローブ:レーザー誘起電界蒸発などによる表面研究

    • Principal Investigator
      西川 治
    • Project Period (FY)
      1987
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Tokyo Institute of Technology
  •  原子プローブ:レーザー誘起電界蒸発などによる表面研究

    • Principal Investigator
      西川 治
    • Project Period (FY)
      1987 – 1989
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Tokyo Institute of Technology
  •  パルスレーザー光照射型点状イオン源の開発

    • Principal Investigator
      西川 治
    • Project Period (FY)
      1986
    • Research Category
      Grant-in-Aid for Developmental Scientific Research
    • Research Field
      Applied materials
    • Research Institution
      Tokyo Institute of Technology
  •  Ultramicroanalysis of Conducting Polymers with Atom-Probe

    • Principal Investigator
      NISHIKAWA Osamu
    • Project Period (FY)
      1986 – 1987
    • Research Category
      Grant-in-Aid for General Scientific Research (B)
    • Research Field
      Applied materials
    • Research Institution
      Tokyo Institute of Technology

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All Journal Article Presentation Book Patent

  • [Book] ポストシリコン半導体 ―ナノ成膜ダイナミクスと基板・界面効果―、第4編 評価・解析 第2章 電子分光学的評価研究 第1節"半導体表面構造・電荷分布の原子スケール解析を実現する走査プローブ顕微鏡2013

    • Author(s)
      笹原亮、富取正彦、(他、吉武道子、吉野淳二、伊藤智徳、岡田晋、金山敏彦、財満鎮明、押山淳、室田淳一、櫻庭政夫、奥村元、北畠真、石田夕起、矢野裕司、竹内哲也、尾鍋研太郎、鳥海明、酒井朗、その他37名)
    • Total Pages
      556
    • Publisher
      出版社エヌ・ティー・エス
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Book] 実験物理科学シリーズ6"走査プローブ顕微鏡「発展編 第10章 非接触AFMの展開」"(重川秀美、吉村雅満、河津璋編)2009

    • Author(s)
      富取正彦、新井豊子(分担執筆)
    • Total Pages
      425
    • Publisher
      共立出版
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Book] 実験物理科学シリーズ6 走査プローブ顕微鏡「発展編 第10章 非接触AFMの展開」2009

    • Author(s)
      富取正彦, 新井豊子
    • Publisher
      共立出版
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Book] 実験物理科学シリーズ6"走査プローブ顕微鏡「発展編第10章非接触AFMの展開」"2009

    • Author(s)
      富取正彦、新井豊子
    • Total Pages
      7
    • Publisher
      共立出版
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Book] 非接触AFM の発展(重川秀実、吉村雅満、河津璋, 編)発展編 第10章(実験物理学シリーズ6走査プローブ顕微鏡)2009

    • Author(s)
      富取正彦(分担執筆)
    • Publisher
      共立出版
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Book] Applied Scanning Probe Methods Vol. VIII, IX, X2008

    • Author(s)
      B. Bhushan, H. Fuchs and M. Tomitori
    • Total Pages
      306
    • Publisher
      Springer-Verlag, Berlin
    • Data Source
      KAKENHI-PROJECT-18041007
  • [Book] 表面物性工学ハンドブック 第2版 第6章 SPM 6.2STM6.2.2 装置と測定法、6.2.3 観察例12007

    • Author(s)
      富取 正彦
    • Publisher
      丸善
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Book] ナノテクノロジー入門シリーズ 第4巻 基礎装置工学・試料作製技術 真空工学2007

    • Author(s)
      富取 正彦
    • Total Pages
      243
    • Publisher
      共立出版
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Book] ナノテクノロジー入門シリーズ 第4巻 基礎装置工学・試料作製技術 真空工学2007

    • Author(s)
      富取 正彦
    • Publisher
      共立出版
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Book] ナノテクノロジー入門シリーズ 第3巻 極限微小系のナノ物性測定2007

    • Author(s)
      富取 正彦
    • Total Pages
      254
    • Publisher
      共立出版
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Book] 表面物性工学ハンドブック 第2版 第6章 SPM 6.2STM 6.2.2 装置と測定法、6.2.3 観察例12007

    • Author(s)
      富取 正彦
    • Total Pages
      1050
    • Publisher
      丸善
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Book] ナノテクノロジー入門シリーズ 第3巻 極限微小系のナノ物性測定2007

    • Author(s)
      富取 正彦
    • Publisher
      共立出版
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Book] 走査プローブ顕微鏡 第4章 力学的分光 4.4散逸・非保存力測定2006

    • Author(s)
      富取正彦, 新井豊子(分担執筆)
    • Total Pages
      12
    • Publisher
      裳華房
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Book] Scanning probe microscopy roadmap 2005 Chap.2. Scanning tunneling microscopy(edited by S. Morita)2006

    • Author(s)
      M.Tomitori
    • Total Pages
      8
    • Publisher
      Springer-Verlag, Berlin
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Book] 実践ナノテクノロジー走査プローブ顕微鏡と局所分光2005

    • Author(s)
      富取 正彦
    • Total Pages
      429
    • Publisher
      裳華房
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Book] 走査型プローブ顕微鏡 最新技術と未来予測 2.1 走査型トンネル顕微鏡(STM)、5.2 半導体材料の評価2005

    • Author(s)
      富取 正彦
    • Publisher
      丸善
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Book] Scanning probe microscopy roadmap 2005, Chap. 2 Scanning tunneling microscopy, Chap. 18 Characterization of semiconducting materials2005

    • Author(s)
      M. Tomitori
    • Publisher
      Springer-Verlag
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Book] Roadmap 2005 of Scanning probe microscopy2005

    • Author(s)
      M. Tomitori
    • Total Pages
      201
    • Publisher
      Springer-Verlag
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Book] 走査型プローブ顕微鏡 最新技術と未来予測2005

    • Author(s)
      富取 正彦
    • Total Pages
      202
    • Publisher
      丸善
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Book] 実践ナノテクノロジー 走査プローブ顕微鏡と局所分光 第4章力学的分光4.4散逸・非保存力測定2005

    • Author(s)
      富取 正彦
    • Publisher
      裳華房
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Book] 「実践ナノテクノロジー・走査プローブ顕微鏡と局所分光」第3章 各種分光法の基礎と応用 3・2 力学的分光 3・2・4 散逸(非保存力)2005

    • Author(s)
      富取正彦, 新井豊子(分担執筆)
    • Publisher
      裳華房
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Journal Article] Surface Effect on Young’s Modulus of Sub-Two-Nanometer Gold [111] Nanocontacts2022

    • Author(s)
      Zhang Jiaqi、Tomitori Masahiko、Arai Toyoko、Oshima Yoshifumi
    • Journal Title

      Physical Review Letters

      Volume: 128 Issue: 14 Pages: 146101-146101

    • DOI

      10.1103/physrevlett.128.146101

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20K20359, KAKENHI-PROJECT-18H03879, KAKENHI-PROJECT-21K18191, KAKENHI-PROJECT-22H00279
  • [Journal Article] Mechanical energy dissipation of an oscillating cantilever close to a conductive substrate partly covered with thin mica films evaluated by frequency modulation atomic force microscopy2022

    • Author(s)
      Hasan Md Mahamudul、Arai Toyoko、Tomitori Masahiko
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: published online Issue: 6 Pages: 065006-065006

    • DOI

      10.35848/1347-4065/ac6b02

    • Peer Reviewed / Open Access
    • Data Source
      KAKENHI-PROJECT-18H03879, KAKENHI-PROJECT-21K18191, KAKENHI-PROJECT-22H00279
  • [Journal Article] In-situ high-resolution scanning electron microscopy observation of electrodeposition and stripping of lead in an electrochemical cell2021

    • Author(s)
      He Gada、Oshima Yoshifumi、Tomitori Masahiko
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 60 Issue: 3 Pages: 035509-035509

    • DOI

      10.35848/1347-4065/abe640

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Journal Article] Measurement of Mechanical Properties of Metal Nanocontacts by in-situ TEM2021

    • Author(s)
      大島 義文、石塚 慧介、張 家奇、富取 正彦、新井 豊子
    • Journal Title

      KENBIKYO

      Volume: 56 Issue: 1 Pages: 13-17

    • DOI

      10.11410/kenbikyo.56.1_13

    • NAID

      130008037280

    • ISSN
      1349-0958, 2434-2386
    • Year and Date
      2021-04-30
    • Language
      Japanese
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Journal Article] Peculiar Atomic Bond Nature in Platinum Monatomic Chains2021

    • Author(s)
      Zhang Jiaqi、Ishizuka Keisuke、Tomitori Masahiko、Arai Toyoko、Hongo Kenta、Maezono Ryo、Tosatti Erio、Oshima Yoshifumi
    • Journal Title

      Nano Letters

      Volume: online Issue: 9 Pages: 1-7

    • DOI

      10.1021/acs.nanolett.1c00564

    • Peer Reviewed / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03879, KAKENHI-PROJECT-20K20359, KAKENHI-PROJECT-19K22166, KAKENHI-PLANNED-16H06439, KAKENHI-PUBLICLY-19H04692, KAKENHI-PUBLICLY-19H05169, KAKENHI-PROJECT-19K05029, KAKENHI-PROJECT-21K03400, KAKENHI-PROJECT-21K18191
  • [Journal Article] Critical shear stress of gold nanocontacts estimated by in situ transmission electron microscopy equipped with a quartz length-extension resonator2021

    • Author(s)
      Liu Jiaming、Zhang Jiaqi、Arai Toyoko、Tomitori Masahiko、Oshima Yoshifumi
    • Journal Title

      Applied Physics Express

      Volume: 14 Issue: 7 Pages: 075006-075006

    • DOI

      10.35848/1882-0786/ac09bd

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20K20359, KAKENHI-PROJECT-19K22166, KAKENHI-PROJECT-18H03879, KAKENHI-PROJECT-21K18191
  • [Journal Article] Atomic scale mechanics explored by in situ transmission electron microscopy with a quartz length-extension resonator as a force sensor2020

    • Author(s)
      Zhang Jiaqi、Ishizuka Keisuke、Tomitori Masahiko、Arai Toyoko、Oshima Yoshifumi
    • Journal Title

      Nanotechnology

      Volume: 31 Issue: 20 Pages: 205706-205706

    • DOI

      10.1088/1361-6528/ab71b9

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18H03879, KAKENHI-PROJECT-20K20359, KAKENHI-PROJECT-19K22166, KAKENHI-PROJECT-18H01825
  • [Journal Article] Layer etching of mica nanosheets using a focused electron beam2020

    • Author(s)
      Islam Mohammad Razzakul、Tomitori Masahiko
    • Journal Title

      Applied Physics Express

      Volume: 13 Issue: 10 Pages: 106502-106502

    • DOI

      10.35848/1882-0786/abb385

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Journal Article] Mechanical analysis of gold nanocontacts during stretching using an in-situ transmission electron microscope equipped with a force sensor2020

    • Author(s)
      Ishizuka Keisuke、Tomitori Masahiko、Arai Toyoko、Oshima Yoshifumi
    • Journal Title

      Applied Physics Express

      Volume: 13 Issue: 2 Pages: 025001-025001

    • DOI

      10.35848/1882-0786/ab6936

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-19K15382, KAKENHI-PROJECT-18H03879, KAKENHI-PROJECT-20K20359, KAKENHI-PROJECT-19K22166, KAKENHI-PROJECT-18H01825
  • [Journal Article] Evaluation of the discrete thickness of exfoliated artificially synthesized mica nanosheets on silicon substrates: Toward characterization of the tunneling current through the nanosheets2020

    • Author(s)
      Islam Mohammad Razzakul、Tomitori Masahiko
    • Journal Title

      Applied Surface Science

      Volume: 532 Pages: 147388-147388

    • DOI

      10.1016/j.apsusc.2020.147388

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Journal Article] Nanomechanical Properties of Epitaxial Silicene Revealed by Noncontact Atomic Force Microscopy2018

    • Author(s)
      Nogami Makoto、Fleurence Antoine、Yamada-Takamura Yukiko、Tomitori Masahiko
    • Journal Title

      Advanced Materials Interfaces

      Volume: 6 Issue: 2 Pages: 1801278-1801278

    • DOI

      10.1002/admi.201801278

    • Peer Reviewed / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03879, KAKENHI-PROJECT-17K14116
  • [Journal Article] Local protrusions formed on Si(111) surface by surface melting and solidification under applied tensile stress2016

    • Author(s)
      Takashi Nishimura, Masahiko Tomitori
    • Journal Title

      Applied Physics Letters

      Volume: 109 Issue: 12

    • DOI

      10.1063/1.4963020

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Journal Article] Atomic-scale electric capacitive change detected with a charge amplifier installed in a non-contact atomic force microscope2016

    • Author(s)
      Makoto Nogami, Akira Sasahara, Toyoko Arai, Masahiko Tomitori
    • Journal Title

      Applied Physics Express

      Volume: 9 Issue: 4 Pages: 046601-046601

    • DOI

      10.7567/apex.9.046601

    • NAID

      210000137866

    • Peer Reviewed / Acknowledgement Compliant / Open Access
    • Data Source
      KAKENHI-PROJECT-26630330, KAKENHI-PROJECT-24246014, KAKENHI-PROJECT-26600098
  • [Journal Article] Evaluation and optimization of quartz resonant-frequency retuned fork force sensors with high Q factors, and the associated electric circuits, for non-contact atomic force microscopy2016

    • Author(s)
      Hiroaki Ooe, Mikihiro Fujii, Masahiko Tomitori, Toyoko Arai
    • Journal Title

      Review of Scientific Instruments

      Volume: 87 Issue: 2

    • DOI

      10.1063/1.4941065

    • Peer Reviewed / Acknowledgement Compliant / Open Access
    • Data Source
      KAKENHI-PROJECT-26630330, KAKENHI-PROJECT-24246014, KAKENHI-PROJECT-26600098
  • [Journal Article] An atomic scale study of TiO2(110) surfaces exposed to humid environments2016

    • Author(s)
      Akira Sasahara, Masahiko Tomitori
    • Journal Title

      The Journal of Physical Chemistry C

      Volume: 120 Issue: 38 Pages: 21427-21435

    • DOI

      10.1021/acs.jpcc.6b05661

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-26630330, KAKENHI-PROJECT-16K13624
  • [Journal Article] Atom-Resolved Analysis of an Ionic KBr(001) Crystal Surface Covered with a Thin Water Layer by Frequency Modulation Atomic Force Microscopy2015

    • Author(s)
      T. Arai, M.i Koshioka, K. Abe, M. Tomitori , R. Kokawa, M. Ohta, H. Yamada, K. Kobayashi, and N. Oyabu
    • Journal Title

      Langmuir

      Volume: 31 Issue: 13 Pages: 3876-3883

    • DOI

      10.1021/acs.langmuir.5b00087

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-24221008, KAKENHI-PROJECT-24246014, KAKENHI-PROJECT-24340068, KAKENHI-PROJECT-25286057, KAKENHI-PROJECT-26600098, KAKENHI-PROJECT-26600101
  • [Journal Article] Difference in etching between Si(111) and (001) surfaces induced by atomic hydrogen irradiation observed by noncontact atomic force microscopy2015

    • Author(s)
      Tomoaki Miyagi, Akira Sasahara, Masahiko Tomitori
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 54 Issue: 8S2 Pages: 08LB08-08LB08

    • DOI

      10.7567/jjap.54.08lb08

    • NAID

      210000145637

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-26630330, KAKENHI-PROJECT-24246014, KAKENHI-PROJECT-26600024
  • [Journal Article] Water wettability of Si(111) and (001) surfaces prepared to be reconstructed, atomic-hydrogen terminated and thinly oxidized in an ultrahigh vacuum chamber2015

    • Author(s)
      Tomoaki Miyagi, Akira Sasahara, Masahiko Tomitori
    • Journal Title

      Applied Surface Science

      Volume: 349 Pages: 904-910

    • DOI

      10.1016/j.apsusc.2015.04.176

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-26630330, KAKENHI-PROJECT-24246014, KAKENHI-PROJECT-26600024
  • [Journal Article] Hydration of MgO(100) surface promoted at <011> steps2015

    • Author(s)
      A. Sasahara, T. Murakami and M. Tomitori
    • Journal Title

      J. Phys. Chem. C

      Volume: 119 Issue: 15 Pages: 8250-8257

    • DOI

      10.1021/acs.jpcc.5b01759

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-24246014, KAKENHI-PROJECT-26600024
  • [Journal Article] Thermal transformation of 4,4”-diamino-p-terphenyl on a Si(111)-7×7 surface analyzed by X-ray photoemission spectroscopy and scanning tunneling microscopy2014

    • Author(s)
      T. Nishimura, A. Sasahara, H. Murata, T. Arai and M. Tomitori
    • Journal Title

      J. Phys. Chem. C

      Volume: 118 Issue: 43 Pages: 25104-25109

    • DOI

      10.1021/jp508680a

    • Peer Reviewed / Acknowledgement Compliant / Open Access
    • Data Source
      KAKENHI-PROJECT-24246014, KAKENHI-PROJECT-24340068, KAKENHI-PROJECT-26600024, KAKENHI-PROJECT-26600098
  • [Journal Article] Stable alignment of 4,4”-diamino-p-terphenyl chemically adsorbed on a Si(001)-(2×1) surface observed by scanning tunneling microscopy2014

    • Author(s)
      A. M. A. Hassan, T. Nishimura, A. Sasahara, H. Murata and M. Tomitori
    • Journal Title

      Surf. Sci.

      Volume: 630 Pages: 96-100

    • DOI

      10.1016/j.susc.2014.07.018

    • NAID

      120005819531

    • Peer Reviewed / Acknowledgement Compliant / Open Access
    • Data Source
      KAKENHI-PROJECT-24246014, KAKENHI-PROJECT-26600024
  • [Journal Article] Resonance frequency-retuned quartz tuning fork as a force sensor for noncontact atomic force microscopy2014

    • Author(s)
      H. Ooe, T. Sakuishi, M. Nogami, M. Tomitori and T. Arai
    • Journal Title

      Appl. Phys. Lett.

      Volume: 105 Issue: 4

    • DOI

      10.1063/1.4891882

    • NAID

      120005650332

    • Peer Reviewed / Acknowledgement Compliant / Open Access
    • Data Source
      KAKENHI-PROJECT-24246014, KAKENHI-PROJECT-24340068, KAKENHI-PROJECT-26600098
  • [Journal Article] SPM のフロンティア ~多様な材料系の研究ニーズに対応するSPM物性計測の最先端~2012

    • Author(s)
      富取 正彦
    • Journal Title

      ペンシル型走査型プローブ顕微鏡の開発、顕微鏡

      Volume: 47 (1) Pages: 3-7

    • Data Source
      KAKENHI-PROJECT-22656012
  • [Journal Article] Local interaction imaging by SiGe quantum dot probe2012

    • Author(s)
      Y. Jeong, M. Hirade, R. Kokawa, H. Yamada, K. Kobayashi, N. Oyabu, T. Arai, A. Sasahara and M. Tomitori
    • Journal Title

      Current Appl. Phys

      Volume: 12 Pages: 581-584

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Journal Article] Local interaction imaging by SiGe quantum dot probe2012

    • Author(s)
      Yonkil Jeong
    • Journal Title

      Current Applied Physics

      Volume: 12 Issue: 2 Pages: 581-584

    • DOI

      10.1016/j.cap.2011.09.005

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20246012, KAKENHI-PROJECT-20310058, KAKENHI-PROJECT-22656012, KAKENHI-PROJECT-23656030
  • [Journal Article] ペンシル型走査型プローブ顕微鏡の開発2012

    • Author(s)
      富取正彦
    • Journal Title

      顕微鏡

      Volume: 47 Pages: 3-7

    • NAID

      10030552124

    • Data Source
      KAKENHI-PROJECT-20246012
  • [Journal Article] ペンシル型走査型プローブ顕微鏡の開発2012

    • Author(s)
      富取正彦
    • Journal Title

      顕微鏡

      Volume: 47 Pages: 3-7

    • NAID

      10030552124

    • Data Source
      KAKENHI-PROJECT-22656012
  • [Journal Article] Adsorption state of 4, 4-diamino-p-terphenyl through an amino group bound to Si(111)-7×7 surface examined by X-ray photoelectron spectroscopy and scanning tunneling microscopy2010

    • Author(s)
      T.Nishimura, A.Itabashi, A.Sasahara, H.Murata, T.Arai, M.Tomitori
    • Journal Title

      J.Phys.Chem.C

      Volume: 114 Pages: 11109-11114

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20241034
  • [Journal Article] Atomic scale analysis of ultrathin SiO_2 films prepared on TiO_2(100) surfaces2010

    • Author(s)
      Akira Sasahara, Chi Lun Pang, Masahiko Tomitori
    • Journal Title

      J.Phys.Chem.C 114(47)

      Pages: 20189-20194

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Journal Article] ナノ評価のための走査型プローブ顕微鏡法の概説と最近の話題2010

    • Author(s)
      富取 正彦
    • Journal Title

      色材協会誌

      Volume: 83 (5) Pages: 233-239

    • NAID

      10026218822

    • Data Source
      KAKENHI-PROJECT-22656012
  • [Journal Article] Frequency modulation atomic force microscope observation of TiO_2(110) surfaces in water2010

    • Author(s)
      A. Sasahara and M. Tomitori
    • Journal Title

      J. Vac. Sci. and Technol. B

      Volume: 28(3)

    • NAID

      120002260318

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Journal Article] Adsorption state of 4, 4-diaminop-terphenyl through an amino group bound to Si(111)-7x7 surface examined by X-ray photoelectron spectroscopy and scanning tunneling microscopy2010

    • Author(s)
      T. Nishimura, A. Itabashi, A. Sasahara, H. Murata, T. Arai and M. Tomitori
    • Journal Title

      J. Phys. Chem. C

      Volume: 114 Pages: 11109-11114

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Journal Article] Adsorption State of 4,4"-Diamino-p-terphenyl through an Amino Group Bound to Si(111)-7x7 Surface Examined by X-ray Photoelectron Spectroscopy and Scanning Tunneling Microscopy2010

    • Author(s)
      Takashi Nishimura, Atsushi Itabashi, Akira Sasahara, Hideyuki Murata, Toyoko Arai, Masahiko Tomitori
    • Journal Title

      J.Phys.Chem.C 114(25)

      Pages: 11109-11114

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Journal Article] Frequency modulation atomic force microscope observation of TiO2(110) surfaces in water2010

    • Author(s)
      Akira Sasahara, Masahiko Tomitori
    • Journal Title

      J.Vac.Sci.Technol.B 28(3)

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Journal Article] Adsorption State of 4, 4 Diamino-p-terphenyl through an Amino Group Bound to Si(111)-7x7 Surface Examined by X-ray Photoelectron Spectroscopy and Scanning Tunneling Microscopy2010

    • Author(s)
      Nishimura, T., Itabashi, A., Sasahara, A., Murata, H., Arai, T., Tomitori, M.
    • Journal Title

      J. Phys. Chem. C

      Volume: 114 Issue: 25 Pages: 11109-11114

    • DOI

      10.1021/jp102976a

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Journal Article] Adsorption state of 4,4"-diamino-p-terphenyl through an amino group bound to Si(111)-7x7 surface examined by X-ray photoelectron spectroscopy and scanning tunneling microscopy2010

    • Author(s)
      Takashi Nishimura, Atsushi Itabashi, Akira Sasahara, Hideyuki Murata, Toyoko Arai, Masahiko Tomitori
    • Journal Title

      J.Phys.Chem.C 114(25)

      Pages: 11109-11114

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Journal Article] Atomic scale analysis of ultra thin SiO_2 films prepared on TiO_2(100) surfaces2010

    • Author(s)
      A. Sasahara, C. L. Pang and M. Tomitori
    • Journal Title

      J. Phys. Chem. C

      Volume: 114 Pages: 20189-20194

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Journal Article] Adsorption state of 4, 4"-diamino-p-terphenyl through an amino group bound to Si(111)-7×7 surface examined by X-ray photoelectron spectroscopy and scanning tunneling microscopy2010

    • Author(s)
      T. Nishimura, A. Itabashi, A. Sasahara, H. Murata, T. Arai and M. Tomitori
    • Journal Title

      J. Phys. Chem. C

      Volume: 114 Pages: 11109-11114

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20241034
  • [Journal Article] Adsorption state of 4,4"-diamino-p-terphenyl through an amino group bound to Si(111)-7×7 surface examined by X-ray photoelectron Spectroscopy and scanning tunneling microscopy2010

    • Author(s)
      T.Nishimura, A.Itabashi, A.Sasahara, H.Murata, T.Arai, M.Tomitori
    • Journal Title

      J.Phys.Chem.C 114

      Pages: 11109-11114

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20241034
  • [Journal Article] オノ評価のための走査型プローブ顕微鏡法の概説と最近の話題2010

    • Author(s)
      富取正彦
    • Journal Title

      色材協会誌

      Volume: 83 Pages: 233-239

    • Data Source
      KAKENHI-PROJECT-20246012
  • [Journal Article] Low-flux elucidation of initial growth of Ge clusters deposited on Si(111)-7x7 observed by scanning tunneling microscopy2009

    • Author(s)
      Z. A. Ansari, T. Arai and M. Tomitori
    • Journal Title

      Phys. Rev. B

      Volume: 79

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Journal Article] Low-flux elucidation of initial growth of Ge clusters deposited on Si(111)-7x7 observed by scanning tunneling microscopy2009

    • Author(s)
      Z.A.Ansari, T.Arai, M.Tomitori
    • Journal Title

      Phys.Rev.B(リポジトリ) 79

    • NAID

      120001316586

    • URL

      http://dspace.lib.kanazawa-u.ac.jp/dspace/handle/2297/17500

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Journal Article] Low-flux elucidation of initial growth of Ge clusters deposited on Si (111) -7×7 observed by scanning tunneling microscopy2009

    • Author(s)
      Z. A. Ansari, T. Arai, M. Tomitori
    • Journal Title

      Physical Review B 79

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Journal Article] Low-flux elucidation of initial growth of Ge clusters deposited on Si(111)-7x7 observed by scanning tunneling microscopy2009

    • Author(s)
      Zubaida A.Ansari, Toyoko Arai, Masahiko Tomitori
    • Journal Title

      Phys.Rev.B 79(3)

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Journal Article]2009

    • Author(s)
      富取正彦, 新井豊子(分担執筆)
    • Journal Title

      実験物理科学シリーズ6 "走査プローブ顕微鏡「発展編 第10章 非接触AFMの展開」"(重川秀美、吉村雅満、河津璋編)(共立出版)

      Pages: 357-363

    • Data Source
      KAKENHI-PROJECT-20246012
  • [Journal Article] Low-flux elucidation of initial growth of Ge clusters deposited on Si(111)-7x7 observed by scanning tunneling microscopy2009

    • Author(s)
      Ansari, Z. A., Arai, T., Tomitori, M.
    • Journal Title

      Phys. Rev. B

      Volume: 79 Issue: 3

    • DOI

      10.1103/physrevb.79.033302

    • NAID

      120001316586

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Journal Article] 走査型プローブ顕微鏡にみる電圧印加のナノ力学的相互作用2008

    • Author(s)
      富取 正彦
    • Journal Title

      表面科学 29

      Pages: 239-245

    • NAID

      10021165886

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Journal Article] 走査型プローブ顕微鏡にみる電圧印加のナノ力学的相互作用2008

    • Author(s)
      富取正彦、新井豊子
    • Journal Title

      表面科学(リポジトリ) 29(4)

      Pages: 239-245

    • NAID

      10021165886

    • URL

      https://dspace.jaist.ac.jp/dspace/handle/10119/7939

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Journal Article] Nanomechanical interaction under bias voltage in scanning probe microscopy(in Japanese)2008

    • Author(s)
      M. Tomitori, T. Arai
    • Journal Title

      Hyomen Kagaku 28

      Pages: 239-245

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Journal Article] 走査型プローブ顕微鏡にみる電圧印加のナノカ学的相互作用2008

    • Author(s)
      富取正彦
    • Journal Title

      表面科学 29

      Pages: 239-245

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Journal Article] 研究紹介"走査型プローブ顕微鏡にみる電圧印加のナノ力学的相互作用"2008

    • Author(s)
      富取正彦、新井豊子
    • Journal Title

      表面科学

      Volume: 29(4) Pages: 239-245

    • Data Source
      KAKENHI-PROJECT-20246012
  • [Journal Article] Nanomechanical Interaction between a Tip and a Sample with Changing Bias Voltage Observed by Using Scanning Probe Microscopy2008

    • Author(s)
      富取正彦, 新井豊子
    • Journal Title

      Hyomen Kagaku

      Volume: 29 Issue: 4 Pages: 239-245

    • DOI

      10.1380/jsssj.29.239

    • NAID

      130004486490

    • ISSN
      0388-5321, 1881-4743
    • Language
      Japanese
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Journal Article] 走査型プローブ顕微鏡にみる電圧印加のナノ力学的相互作用2008

    • Author(s)
      富取 正彦
    • Journal Title

      表面科学 29

      Pages: 239-245

    • NAID

      10021165886

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Journal Article] 走査型プローブ顕微鏡にみる電圧印加のナノ力学的相互作用2008

    • Author(s)
      富取正彦, 新井豊子
    • Journal Title

      表面科学 29(4)

      Pages: 239-245

    • NAID

      10021165886

    • Data Source
      KAKENHI-PROJECT-20246012
  • [Journal Article] 走査型プローブ顕微鏡にみる電圧印加のナノ力学的相互作用2008

    • Author(s)
      富取 正彦、新井 豊子
    • Journal Title

      表面科学 29

      Pages: 239-245

    • NAID

      10021165886

    • Data Source
      KAKENHI-PROJECT-17206005
  • [Journal Article] 走査型プローブ顕微鏡にみる電圧印加のナノ力学的相互作用2008

    • Author(s)
      富取 正彦、新井 豊子
    • Journal Title

      表面科学 29

      Pages: 239-245

    • NAID

      10021165886

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18041007
  • [Journal Article] 走査型プローブ顕微鏡にみる電圧印加のナノカ学的相互作用2008

    • Author(s)
      富取正彦, 新井豊子
    • Journal Title

      表面科学 29

      Pages: 239-245

    • Data Source
      KAKENHI-PROJECT-20246012
  • [Journal Article] Nanoscale Manipulation and Characterization Using SPM-Based Instruments2007

    • Author(s)
      Masahiko TOMITORI
    • Journal Title

      The Fifteenth International Conference on COMPOSITES/NANO ENGINEERING(ICCE-15)proceedings

      Pages: 950-953

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Journal Article] Nanoscale Manipulation and Characterization Using SPM-Based Instruments2007

    • Author(s)
      Masahiko, TOMITORI
    • Journal Title

      The Fifteenth International Conference on COMPOSITES/ NANO ENGINEERING (ICCE - 15) proceedings

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Journal Article] Atomic force microscope Si tip with Ge clusters with the capability of remoulding by heating2007

    • Author(s)
      Z.A.Ansari, T.Arai, M.Tomitori
    • Journal Title

      Nanotechnology 18・8

      Pages: 84020-84020

    • Data Source
      KAKENHI-PROJECT-17310069
  • [Journal Article] Atomic force microscope Si tip with Ge clusters with the capability of remoulding by heating2007

    • Author(s)
      Z. A. Ansari, T. Arai and M. Tomitori
    • Journal Title

      Nanotechnology 18

      Pages: 84020-84025

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18041007
  • [Journal Article] Chapter 5 Scanning tunneling microscopy(in Japanese)2007

    • Author(s)
      M. Tomitori
    • Journal Title

      Introduction series to nanotechnology (Kyoritsu) III, 254

      Pages: 87-99

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Journal Article] Tomitori : Atomic force microscope Si tip with Ge clusters with the capability of remoulding by heating2007

    • Author(s)
      Z.A. Ansari, T. Arai, M. Tomitori
    • Journal Title

      Nanotechnology 18

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Journal Article] Nanoscale manipulation and characterization using SPM-Based Instruments2007

    • Author(s)
      M. Tomitori, Y. Ohkubo, M. Tani, T. Arai
    • Journal Title

      The fifteenth international conference on composites/nano engineering (ICCE -15)

      Pages: 950-953

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Journal Article] Chapter 6 STM, 6.2 Apparatus and methodology, 6.2.3 Example of observation(in Japanese)2007

    • Author(s)
      M. Tomitori
    • Journal Title

      Handbook of Surface Physical Property Engineering, (Maruzen) 1050

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Journal Article] Nanoscale manipulation and characterization using SPM-based instruments2007

    • Author(s)
      M. Tomitori
    • Journal Title

      The 15th Intemational Confbrence on Composites/Nano Engineering(ICCE-15)

      Pages: 950-953

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Journal Article] Atomic force microscope Si tip with Ge clusters with the capability of remoulding by heating2007

    • Author(s)
      Z.A.Ansari, T.Arai, M.Tomitori
    • Journal Title

      Nanotechnology 18(8)

      Pages: 84020-6

    • Data Source
      KAKENHI-PROJECT-17206005
  • [Journal Article] Atomic force microscope Si tip with Ge clusters with the capability of remoulding by heating2007

    • Author(s)
      Z.A. Ansari, T. Arai, M. Tomitori
    • Journal Title

      Nanotechnology 18

      Pages: 6-6

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Journal Article] Chapter 4 Vacuum technology", (in Japanese)2007

    • Author(s)
      M. Tomitori
    • Journal Title

      Introduction series to nanotechnology (Kyoritsu) IV, 243

      Pages: 65-93

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Journal Article] Evidence of temperature dependence of initial adsorption sites of Ge atoms on Si(111)-7x72006

    • Author(s)
      Z.A.Ansari, M.Tomitori, T.Arai
    • Journal Title

      Applied Physics Letters in print

    • NAID

      120000861401

    • Data Source
      KAKENHI-PROJECT-17310069
  • [Journal Article] Energy spectra of electrons backscattered from sample surfaces with hetero structures using field emission scanning tunneling microscopy2006

    • Author(s)
      M. Hirade, T. Arai, M. Tomitori
    • Journal Title

      Jpn. J. Appl. Phys 45(3B)

      Pages: 2278-2282

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Journal Article] Evidence of temperature dependence of initial adsorption sites of Ge atoms on Si(111)-7x72006

    • Author(s)
      Z.A. Ansari, T. Arai, M. Tomitori
    • Journal Title

      Appl. Phys. Lett 88

    • NAID

      120000861401

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Journal Article] Energy spectra of electrons backscattered from sample surfaces with hetero structures using field emission scanning tunneling microscopy2006

    • Author(s)
      M. Hirade, T. Arai, M. Tomitori
    • Journal Title

      Jpn. J. Appl. Phys 45(3B)

      Pages: 2278-2282

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Journal Article] 電圧印加非接触原子間力分光法による量子力学的共鳴相互作用の測定2006

    • Author(s)
      新井豊子, 富取 正彦
    • Journal Title

      固体物理 40(8)

      Pages: 581-590

    • NAID

      40006867381

    • Data Source
      KAKENHI-PROJECT-17206005
  • [Journal Article] Electric conductance through chemical bonding states being formed between a Si tip and a Si(111)7x7 surface by bias-voltage noncontact atomic force spectroscopy2006

    • Author(s)
      T.Arai, M.Tomitori
    • Journal Title

      Physical Review B 73

      Pages: 73307-73307

    • NAID

      120001316581

    • Data Source
      KAKENHI-PROJECT-17310069
  • [Journal Article] Electric conductance through chemical bonding states being formed between a Si tip and a Si(111)-7x7 surface by bias-voltage noncontact atomic force spectroscopy2006

    • Author(s)
      T. Arai, M. Tomitori
    • Journal Title

      Phys. Rev. B 73

    • NAID

      120001316581

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Journal Article] Evidence of temperature dependence of initial adsorption sites of Geatoms on Si(111)-7x72006

    • Author(s)
      Z.A.Ansari, M.Tomitori, T.Arai
    • Journal Title

      Applied Physics Letters 88

      Pages: 171902-171902

    • NAID

      120000861401

    • Data Source
      KAKENHI-PROJECT-17310069
  • [Journal Article] Evidence of temperature dependence of initial adsorption sites of Ge atoms on Si(111)-7x72006

    • Author(s)
      Z.A. Ansari, T. Arai, M. Tomitori
    • Journal Title

      Appl. Phys. Lett 88

    • NAID

      120000861401

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Journal Article] Energy spectra of electrons backscattered from sample surfaces wit hetero structures using field emission scanning tunneling microscopy2006

    • Author(s)
      M.Hirade, T.Arai, M.Tomitori
    • Journal Title

      Japanese Journal of Applied Physics 45(3B)

      Pages: 2278-2282

    • Data Source
      KAKENHI-PROJECT-17206005
  • [Journal Article] Energy spectra of electrons backscattered from sample surfaces with hetero structures using field emission scanning tunneling microscopy2006

    • Author(s)
      M.Hirade, T.Arai, M.Tomitori
    • Journal Title

      Japanese Journal of Applied Physics 45(3B)

      Pages: 2278-2278

    • Data Source
      KAKENHI-PROJECT-17310069
  • [Journal Article] Electric conductance through chemical bonding states being formed between a Si tip and a Si(111)-7x7 surface by bias-voltage noncontact atomic force spectroscopy2006

    • Author(s)
      T. Arai, M. Tomitori
    • Journal Title

      Phys. Rev 73

    • NAID

      120001316581

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Journal Article] Evidence of temperature dependence of initial adsorption sites of Ge atoms on Si(111)-7x72006

    • Author(s)
      Z.A.Ansari, M.Tomitori, T.Arai
    • Journal Title

      Applied Physics Letters 88

      Pages: 171902-3

    • NAID

      120000861401

    • Data Source
      KAKENHI-PROJECT-17206005
  • [Journal Article] Electric conductance through chemical bonding states being formed between a Si tip and a Si(111)7x7 surface by bias-voltage noncontact atomic force spectroscopy2006

    • Author(s)
      T.Arai, M.Tomitori
    • Journal Title

      Physical Review B 73

    • NAID

      120001316581

    • Data Source
      KAKENHI-PROJECT-17206005
  • [Journal Article] 2. Scanning tunneling microscopy, pp. 7-14 ; S. Hasegawa and M. Tomitori : 18. Characterization of semiconducting materials2006

    • Author(s)
      M. Tomitori
    • Journal Title

      Scanning probe microscopy roadmap 2005, edited by S. Morita, (Springer-Verlag, Berlin) 201

      Pages: 133-137

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Journal Article] Energy spectra of electrons backscattered from sample surfaces with hetero structures using field emission scanning tunneling microscopy2006

    • Author(s)
      M.Hirade, T.Arai, M.Tomitori
    • Journal Title

      Japanese Journal of Applied Physics in print

    • Data Source
      KAKENHI-PROJECT-17310069
  • [Journal Article] 最近の研究と技術"電圧印加非接触原子間力顕微鏡法を利用した探針-試料間の相互作用力分光法"2005

    • Author(s)
      富取 正彦
    • Journal Title

      顕微鏡 40

      Pages: 193-195

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Journal Article] 最近の研究と技術"電圧印加非接触原子間力顕微鏡法を利用した探針-試料間の相互作用力分光法"2005

    • Author(s)
      富取 正彦
    • Journal Title

      顕微鏡 40

      Pages: 193-195

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Journal Article] A Si nanopillar grown on a Si tip by atomic force microscopy in ultrahigh vacuum for a high-quality scanning probe2005

    • Author(s)
      T. Arai, M. Tomitori
    • Journal Title

      Appl. Phys. Lett 86

    • NAID

      120000861400

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Journal Article] Chapter 2.1 STM, 5.2 Evaluation of semiconducting materials(in Japanese)2005

    • Author(s)
      M. Tomitori
    • Journal Title

      Scanning probe microscopy -recent developments and future prospects, edited by S. Morita, (Maruzen) 202

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Journal Article] Hexagonal arrangement of Ge clusters self-organized on a template of half unit cells of Si(111)-7x7 observed by scanning tunneling microscopy2005

    • Author(s)
      Z.A. Ansari, T. Arai, M. Tomitori
    • Journal Title

      Surf Sci. Lett 574

      Pages: 17-22

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Journal Article] Interaction force spectroscopy between a sample and a tip by bias-voltage noncontact atomic force microscopy(in Japanese)2005

    • Author(s)
      M. Tomitori, T. Arai
    • Journal Title

      Kenbikyou 40

      Pages: 193-195

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Journal Article] Measurement of quantum mechanical resonant interaction by bias-voltage noncontact atomic force microscopy(in Japanese)2005

    • Author(s)
      T. Arai, M. Tomitori
    • Journal Title

      Kotai Butsuri 40

      Pages: 47-56

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Journal Article] Hexagonal arrangement of Ge clusters self-organized on a template of half unit cells of Si(111)-7x7 observed by scanning tunneling microscopy2005

    • Author(s)
      Z. A. Ansari, T. Arai, M. Tomitori
    • Journal Title

      Surf. Sci. Lett 574

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Journal Article] "2. Scanning tunneling microscopy", S. Hasegawa and M. Tomitori : "18. Characterization of semiconducting materials"2005

    • Author(s)
      M. Tomitori
    • Journal Title

      Scanning probe microscopy roadmap edited by S. Morita, (2006) (Springer-Verlag, Berlin)

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Journal Article] A Si nanopillar grown on a Si tip by atomic force microscopy in ultrahigh vacuum for a high-quality scanning probe2005

    • Author(s)
      T. Arai, M. Tomitori
    • Journal Title

      Appl. Phys. Lett 86

    • NAID

      120000861400

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Journal Article] 電圧印加非接触原子間力分光法による量子力学的共鳴相互作用の測定2005

    • Author(s)
      新井豊子, 富取 正彦
    • Journal Title

      固体物理 40(8)

      Pages: 581-590

    • NAID

      40006867381

    • Data Source
      KAKENHI-PROJECT-17310069
  • [Journal Article] Chapter 4 Mechanical spectroscopy, 4.4 Dissipation and non-conservative force measurements(in Japanese)2005

    • Author(s)
      M. Tomitori, T. Arai
    • Journal Title

      Practical nanotechnology -scanning probe microscopy and local spectroscopy, (Shokabo) 429

      Pages: 196-207

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Journal Article] Observation of electronic states on Si(111)-7x7 through short-range attractive force2004

    • Author(s)
      T. Arai, M. Tomitori
    • Journal Title

      Phys. Rev. Lett 93

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Journal Article] ナノ評価のための走査型プローブ顕微鏡法の概説と最近の話題

    • Author(s)
      富取正彦
    • Journal Title

      色材協会誌 (in print)

      Pages: 7-7

    • NAID

      10026218822

    • Data Source
      KAKENHI-PROJECT-20246012
  • [Journal Article] Frequency modulation atomic force microscope observation of TiO_2 (110) Surfaces in water

    • Author(s)
      笹原亮, 富取正彦
    • Journal Title

      J.Vac.Sci.and Technol.B (in print)

    • NAID

      120002260318

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Journal Article] Lateral distribution of Li atoms at the initial stage of adsorption on TiO_2(110) surface

    • Author(s)
      H. Tatsumi, A. Sasahara and M. Tomitori
    • Journal Title

      J. Phys. Chem. C

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Patent] カンチレバー加熱機構、それを用いたカンチレバーホルダ、及び、カンチレバー加熱方法2011

    • Inventor(s)
      富取正彦、平出雅人
    • Industrial Property Rights Holder
      北陸先端科学技術大学院大学
    • Filing Date
      2011-02-07
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Patent] Positioning mechanism and microscope with the same2010

    • Inventor(s)
      富取正彦、新井豊子、中榮穣
    • Industrial Property Rights Holder
      北陸先端科学技術大学院大学
    • Acquisition Date
      2010-03-02
    • Overseas
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Patent] Positioning mechanism and microscope with the same(ポジショニング機構、及び、それを用いた顕微鏡)2010

    • Inventor(s)
      富取正彦、新井豊子、中榮穣
    • Industrial Property Rights Holder
      北陸先端科学技術大学院大学
    • Acquisition Date
      2010-03-02
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Patent] ポジショニング機構、及び、それを用いた顕微鏡2010

    • Inventor(s)
      富取正彦、新井豊子、中榮穣
    • Industrial Property Rights Holder
      北陸先端科学技術大学院大学
    • Filing Date
      2010-12-17
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Patent] Positioning mechanism and microscope with the same2010

    • Inventor(s)
      富取正彦、新井豊子、中榮穣
    • Industrial Property Rights Holder
      北陸先端科学技術大学院大学
    • Filing Date
      2010-03-02
    • Overseas
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Patent] Positioning mechanism and microscope with the same2010

    • Inventor(s)
      富取正彦, 新井豊子, 中榮穣
    • Industrial Property Rights Holder
      北陸先端科学技術大学院大学
    • Filing Date
      2010-03-02
    • Overseas
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Patent] Positioning mechanism and microscope with the same(ポジショニング機構、及び、それを用いた顕微鏡)2010

    • Inventor(s)
      富取正彦、新井豊子、中榮穣
    • Industrial Property Rights Holder
      北陸先端科学技術大学院大学
    • Acquisition Date
      2010-03-02
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Patent] カンチレバー加熱機構、それを用いたカンチレバーホルダ、及び、カンチレバー加熱方法2009

    • Inventor(s)
      富取正彦、平出雅人
    • Industrial Property Rights Holder
      北陸先端科学技術大学院大学
    • Filing Date
      2009-09-04
    • Overseas
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Presentation] Estimation of Critical Shear Stress of Au nanocontacts using microscopic nanomechanics measurement method2023

    • Author(s)
      Jiaming Liu, Toyoko Arai, Masahiko Tomitori, and Yoshifumi Oshima
    • Organizer
      JAIST International Symposium of Nano-Materials for Novel Devices
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21K18191
  • [Presentation] 顕微ナノメカニックス計測法による金ナノ接点臨界せん断応力の計測2023

    • Author(s)
      劉佳明、新井豊子、富取正彦、大島義文
    • Organizer
      令和5年度 応用物理学会 北陸・信越支部 学術講演会
    • Data Source
      KAKENHI-PROJECT-21K18191
  • [Presentation] High-temperature flame etching to prepare tungsten tips for scanning probe microscopy2023

    • Author(s)
      Toyoko Arai, Nobuhiko Utsunomiya, Masahiko Tomitori
    • Organizer
      The 24rd International Conference on Non-contact Atomic Force Microscopy (ncAFM2023)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-22H00279
  • [Presentation] Structural and chemical analysis of tungsten tips for scanning probe microscopy prepared by flame etching2023

    • Author(s)
      Yohei Nakano, Nobuhiko Utsunomiya, Toyoko Arai, Masahiko Tomitori
    • Organizer
      JAIST International Symposium of Nano-Materials for Novel Devices
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21K18191
  • [Presentation] Structural and chemical analysis of tungsten tips for scanning probe microscopy prepared by flame etching2023

    • Author(s)
      Yohei Nakano, Nobuhiko Utsunomiya, Toyoko Arai, Masahiko Tomitori
    • Organizer
      JAIST International Symposium of Nano-Materials for Novel Devices
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-22H00279
  • [Presentation] Introduction of microscopic nanomechanical measurement method2023

    • Author(s)
      Atsuki Uno, Jiaming Liu, Toyoko Arai, Masahiko Tomitori, and Yoshifumi Oshima
    • Organizer
      JAIST International Symposium of Nano-Materials for Novel Devices
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-22H00279
  • [Presentation] Introduction of microscopic nanomechanical measurement method2023

    • Author(s)
      Atsuki Uno, Jiaming Liu, Toyoko Arai, Masahiko Tomitori, and Yoshifumi Oshima
    • Organizer
      JAIST International Symposium of Nano-Materials for Novel Devices
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21K18191
  • [Presentation] High-temperature flame etching to prepare tungsten tips for scanning probe microscopy2023

    • Author(s)
      Toyoko Arai, Nobuhiko Utsunomiya, Masahiko Tomitori
    • Organizer
      The 24rd International Conference on Non-contact Atomic Force Microscopy (ncAFM2023)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21K18191
  • [Presentation] Real-Space DFT simulation of energy dissipation due to atomic displacements of a Si tip and a Si(111)-(7×7) surface detected by nc-AFM2023

    • Author(s)
      Toyoko Arai, Jun-Ichi Iwata, Atsushi Oshiyama, Masahiko Tomitori
    • Organizer
      The 24rd International Conference on Non-contact Atomic Force Microscopy (ncAFM2023)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-22H00279
  • [Presentation] Estimation of Critical Shear Stress of Au nanocontacts using microscopic nanomechanics measurement method2023

    • Author(s)
      Jiaming Liu, Toyoko Arai, Masahiko Tomitori, and Yoshifumi Oshima
    • Organizer
      JAIST International Symposium of Nano-Materials for Novel Devices
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-22H00279
  • [Presentation] Real-Space DFT simulation of energy dissipation due to atomic displacements of a Si tip and a Si(111)-(7×7) surface detected by nc-AFM2023

    • Author(s)
      Toyoko Arai, Jun-Ichi Iwata, Atsushi Oshiyama, Masahiko Tomitori
    • Organizer
      The 24rd International Conference on Non-contact Atomic Force Microscopy (ncAFM2023)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21K18191
  • [Presentation] 顕微ナノメカニックス計測法による金ナノ接点臨界せん断応力の計測2023

    • Author(s)
      劉佳明、新井豊子、富取正彦、大島義文
    • Organizer
      令和5年度 応用物理学会 北陸・信越支部 学術講演会
    • Data Source
      KAKENHI-PROJECT-22H00279
  • [Presentation] 水晶振動子を組み込んだTEM法による金ナノ接点の臨界せん断応力サイズ依存性の研究2022

    • Author(s)
      劉 佳明、富取 正彦、新井 豊子、大島 義文
    • Organizer
      第69回応用物理学会春季学術講演会、3月25日、青山学院大学相模原キャンパス、相模原市
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] 水素-酸素ガス炎エッチングによって調整したタングステン探針の評価2022

    • Author(s)
      宇都宮 信彦, 富取 正彦, 新井 豊子
    • Organizer
      第70回応用物理学会春季学術講演会
    • Data Source
      KAKENHI-PROJECT-21K18191
  • [Presentation] 水素-酸素ガス炎エッチングによって調整したタングステン探針の評価2022

    • Author(s)
      宇都宮 信彦, 富取 正彦, 新井 豊子
    • Organizer
      第70回応用物理学会春季学術講演会
    • Data Source
      KAKENHI-PROJECT-22H00279
  • [Presentation] Surface Effect on Young’s Modulus of Sub-Two-Nanometer Gold [111] Nanocontacts2022

    • Author(s)
      Jiaqi Zhang, Masahiko Tomitori, Toyoko Arai, Yoshifumi Oshima
    • Organizer
      The 22nd International vacuum congress (IVC-22)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21K18191
  • [Presentation] 炎アニールにより先鋭化したタングステン探針の作製と先端形状評価2022

    • Author(s)
      宇都宮信彦, 中野陽平, 富取正彦, 新井豊子
    • Organizer
      令和5年度 応用物理学会 北陸・信越支部 学術講演会
    • Data Source
      KAKENHI-PROJECT-21K18191
  • [Presentation] 水晶振動子を組み込んだ TEM 法による金ナノコンタクト臨界せん断応力の計測2022

    • Author(s)
      劉 佳明、富取 正彦、新井 豊子、大島 義文
    • Organizer
      ISSP workshop “Frontier of scanning probe microscopy and related nano science”、3月29日、online
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] 周波数変調原子間力顕微鏡を用いた金属の表面抵抗評価2022

    • Author(s)
      島 尚生, 加藤 貴洋, 富取 正彦, 新井 豊子
    • Organizer
      第70回応用物理学会春季学術講演会
    • Data Source
      KAKENHI-PROJECT-22H00279
  • [Presentation] Surface Effect on Young’s Modulus of Sub-Two-Nanometer Gold [111] Nanocontacts2022

    • Author(s)
      Jiaqi Zhang, Masahiko Tomitori, Toyoko Arai, Yoshifumi Oshima
    • Organizer
      The 22nd International vacuum congress (IVC-22)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-22H00279
  • [Presentation] Critical shear stress of gold nanocontact measured by TEM combined with a quartz resonator2022

    • Author(s)
      Jiaming Liu, Jiaqi Zhang, Toyoko Arai, Masahiko Tomitori, Yoshifumi Oshima
    • Organizer
      The 22nd International vacuum congress (IVC-22)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-22H00279
  • [Presentation] 炎アニールにより先鋭化したタングステン探針の作製と先端形状評価2022

    • Author(s)
      宇都宮信彦, 中野陽平, 富取正彦, 新井豊子
    • Organizer
      令和5年度 応用物理学会 北陸・信越支部 学術講演会
    • Data Source
      KAKENHI-PROJECT-22H00279
  • [Presentation] 周波数変調原子間力顕微鏡を用いた金属の表面抵抗評価2022

    • Author(s)
      島 尚生, 加藤 貴洋, 富取 正彦, 新井 豊子
    • Organizer
      第70回応用物理学会春季学術講演会
    • Data Source
      KAKENHI-PROJECT-21K18191
  • [Presentation] Surface resistivity evaluated by frequency modulation atomic force microscopy through Joule heat energy dissipation2022

    • Author(s)
      M. Tomitori, M. M. Hasan, T. Kato, T. Arai
    • Organizer
      The 23rd International Conference on Non-contact Atomic Force Microscopy
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-22H00279
  • [Presentation] Non-contact evaluation of surface resistivity using frequency modulation atomic force microscopy2022

    • Author(s)
      Takahiro Kato, Md Mahamudul Hasan, Masahiko Tomitori, Toyoko Arai
    • Organizer
      The 22nd International vacuum congress (IVC-22)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-22H00279
  • [Presentation] Surface resistivity evaluated by frequency modulation atomic force microscopy through Joule heat energy dissipation2022

    • Author(s)
      M. Tomitori, M. M. Hasan, T. Kato, T. Arai
    • Organizer
      The 23rd International Conference on Non-contact Atomic Force Microscopy
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21K18191
  • [Presentation] Non-contact evaluation of surface resistivity using frequency modulation atomic force microscopy2022

    • Author(s)
      Takahiro Kato, Md Mahamudul Hasan, Masahiko Tomitori, Toyoko Arai
    • Organizer
      The 22nd International vacuum congress (IVC-22)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21K18191
  • [Presentation] Critical shear stress of gold nanocontact measured by TEM combined with a quartz resonator2022

    • Author(s)
      Jiaming Liu, Jiaqi Zhang, Toyoko Arai, Masahiko Tomitori, Yoshifumi Oshima
    • Organizer
      The 22nd International vacuum congress (IVC-22)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21K18191
  • [Presentation] 長辺振動水晶振動子(LER)を用いた顕微ナノメカニクス計測法の開発 ~ 原子間結合強度の測定 ~2022

    • Author(s)
      大島義文, Jiaqi Zhang, 新井豊子, 富取正彦
    • Organizer
      電子情報通信学会  電子デバイス研究会(ED)
    • Invited
    • Data Source
      KAKENHI-PROJECT-22H00279
  • [Presentation] 長辺振動水晶振動子(LER)を用いた顕微ナノメカニクス計測法の開発 ~ 原子間結合強度の測定 ~2022

    • Author(s)
      大島義文, Jiaqi Zhang, 新井豊子, 富取正彦
    • Organizer
      電子情報通信学会  電子デバイス研究会(ED)
    • Invited
    • Data Source
      KAKENHI-PROJECT-21K18191
  • [Presentation] Mechanical properties of atomic bonds in Pt atomic chains measured by TEM coupled with a quartz resonator2021

    • Author(s)
      Jiaqi Zhang, Keisuke Ishizuka, Masahiko Tomitori, Toyoko Arai, and Yoshifumi Oshima
    • Organizer
      第68回応用物理学会春季学術講演会、3月16_19日、online
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Critical shear stress of gold nanocontact measured by TEM combined with a quartz resonator2021

    • Author(s)
      Jiaming Liu, Jiaqi Zhang, Toyoko Arai, Masahiko Tomitori, and Yoshifumi Oshima
    • Organizer
      第82回応用物理学会秋季学術講演会、9月13日、online
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Observation of mechanical energy dissipation between a conductive tip and a thin dielectric film on a metal-coated Si-substrate by frequency modulated atomic force microscopy2021

    • Author(s)
      Md Mahamudul Hassan and Masahiko Tomitori
    • Organizer
      第68回応用物理学会春季学術講演会、3月16_19日、online
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Mechanical properties of Pt atomic chains measured by TEM coupled with a quartz resonator2021

    • Author(s)
      Jiaqi Zhang, Masahiko Tomitori, Toyoko Arai, Kenta Hongo, Ryo Maezono, Yoshifumi Oshima
    • Organizer
      第82回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-21K18191
  • [Presentation] In-situ observation of electro-deposition and stripping of lead using a high-resolution scanning electron microscope with an electrochemical cell2021

    • Author(s)
      Gada He, Yoshifmi Oshima, and Masahiko Tomitori
    • Organizer
      第68回応用物理学会春季学術講演会、3月16_19日、online
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Mechanical properties of Pt atomic chains measured by TEM coupled with a quartz resonator2021

    • Author(s)
      Jiaqi Zhang, Masahiko Tomitori, Toyoko Arai, and Yoshifumi Oshima
    • Organizer
      The Material Research Meeting 2021 (MRM2021), Dec. 16, パシフィコ横浜北、横浜市
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] 水晶振動子を組み込んだ TEM法による金ナノ接点の臨界せん断応力サイズ依存性の研究2021

    • Author(s)
      劉 佳明、張 家奇、新井 豊子、富取 正彦、大島 義文
    • Organizer
      第69回応用物理学会春季学術講演会
    • Data Source
      KAKENHI-PROJECT-21K18191
  • [Presentation] 白金原子鎖の機械的性質2021

    • Author(s)
      Jiaqi Zhang, Masahiko Tomitori, Toyoko Arai, and Yoshifumi Oshima
    • Organizer
      日本顕微鏡学会第77回学術講演会、6月14-16日、つくば国際会議場、つくば市
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Critical shear stress of gold nanocontact measured by TEM combined with a quartz resonator2021

    • Author(s)
      Jiaming Liu, Jiaqi Zhang, Toyoko Arai, Masahiko Tomitori, Yoshifumi Oshima
    • Organizer
      第82回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-21K18191
  • [Presentation] Critical shear stress of gold nanocontact measured by TEM combined with a quartz resonator2021

    • Author(s)
      Jiaming Liu, Jiaqi Zhang, Toyoko Arai, Masahiko Tomitori, and Yoshifumi Oshima
    • Organizer
      The 9th International Symposium on Surface Science, Dec. 1, online
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Mechanical properties of Pt atomic chains measured by TEM coupled with a quartz resonator2021

    • Author(s)
      Jiaqi Zhang, Masahiko Tomitori, Toyoko Arai, and Yoshifumi Oshima
    • Organizer
      The 9th International Symposium on Surface Science, Dec. 1, online
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] 周波数変調原子間力顕微鏡を用いた表面抵抗測定法の考察2021

    • Author(s)
      高畠 侑馬、浜本 和、富取 正彦、新井 豊子
    • Organizer
      令和4年度 応用物理学会 北陸・信越支部 学術講演会
    • Data Source
      KAKENHI-PROJECT-21K18191
  • [Presentation] Measurement of critical shear stress of gold nanocontacts by in-situ transmission electron microscopy equipped with a quartz resonator2021

    • Author(s)
      Jiaming Liu, Jiaqi Zhang, Toyoko Arai, Masahiko Tomitori, and Yoshifumi Oshima
    • Organizer
      The Material Research Meeting 2021 (MRM2021), Dec. 16, パシフィコ横浜北、横浜市
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Interpretable machine learning to comprehend the mechanical and electric properties of gold nanocontacts measured by in-situ TEM equipped with a force senosr2020

    • Author(s)
      Anh-Duc Dao, Tien-Sinh Vu, Duong-Nguyen Nguyen, Keisuke Ishizuka, Yoshifumi Oshima, Masahiko Tomitori, and Hieu-Chi Dam
    • Organizer
      AI for Atoms: How to Machine Learn STEM Virtual School, Dec. 7_10, online, Oak Ridge National Laboratory, Oak Rdige, Tennessee, USA
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Dissipative interaction due to Joule heat through displacement current on mica nanosheets examained by non-contact atomic force microscopy2020

    • Author(s)
      Md Mahamudul Hassan and Masahiko Tomitori
    • Organizer
      2020年日本表面真空学会学術講演会、11月19日―21日、online
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] 水晶振動子力学センサーを組み込んだTEMホルダーによる金ナノ接点のヤング率計測2020

    • Author(s)
      石塚 慧介、富取 正彦、新井 豊子、大島 義文
    • Organizer
      日本顕微鏡学会第76回学術講演会、5月25日-27日、紙上開催
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Mica nanosheet patterned etching using focused electron beam2020

    • Author(s)
      Islam Mohammad Razzakul and Masahiko Tomitori
    • Organizer
      第81回応用物理学会秋季学術講演会、9月8-11日、online
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Atomic scale mechanics measured by TEM holder combined with a frequency-modulation force sensor2020

    • Author(s)
      Jiaqi Zhang, Keisuke Ishizuka, Masahiko Tomitori, Toyoko Arai, and Yoshifumi Oshima
    • Organizer
      第81回応用物理学会秋季学術講演会、9月8-11日、online
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Mechanical properties of Pt-Pt bond in an atomic chain measured by TEM combined with a frequency-modulation force sensing system2020

    • Author(s)
      Jiaqi Zhang, Keisuke Ishizuka, Masahiko Tomitori, Toyoko Arai, and Yoshifumi Oshima
    • Organizer
      第67回応用物理額春季学術講演会、3月12日-15日、上智大学四谷キャンパス、東京(紙上開催)
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Development of transmission electron microscopy holder with a quartz force sensor2020

    • Author(s)
      Jiaqi Zhang, Keisuke Ishizuka, Masahiko Tomitori, Toyoko Arai, and Yoshifumi Oshima
    • Organizer
      日本顕微鏡学会第76回学術講演会、5月25日-27日、紙上開催
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Dissipative interaction via capacitive coupling through mica nanosheets examained by non-contact atomic force microscopy2020

    • Author(s)
      Md Mahamudul Hassan and Masahiko Tomitori
    • Organizer
      第81回応用物理学会秋季学術講演会、9月8-11日、online
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] 高電界下での加熱処理による走査型プローブ顕微鏡のための単原子終端探針の作製と評価2020

    • Author(s)
      木下 博貴、富取 正彦
    • Organizer
      第67回応用物理額春季学術講演会、3月12日-15日、上智大学四谷キャンパス、東京(紙上開催)
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Conventional exfoliation method using a hand roller for artificially-synthesized mica nanosheets with a single layer and multi-layers in wide-area and their characterization2020

    • Author(s)
      Islam Mohammad Razzakul and Masahiko Tomitori
    • Organizer
      第67回応用物理額春季学術講演会、3月12日-15日、上智大学四谷キャンパス、東京(紙上開催)
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Mechanical energy dissipation via a thin mica film on a metal-coated Si substrate measured by frequency modulation atomic force microscopy2020

    • Author(s)
      Md Mahamudul Hassan and Masahiko Tomitori
    • Organizer
      ICSPM28, Dec. 10_11, online
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] 炎エッチングによるnc-AFM/STM用金属探針の作製と評価2019

    • Author(s)
      笈田 浩平、丸山 天悟、富取 正彦、新井 豊子
    • Organizer
      弟66回応用物理学会春期学術講演会
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Fabrication and evaluation of single-atom tips for scanning probe microscopy by heat treatment under high electric field2019

    • Author(s)
      Hiroki Kinoshita and Masahiko Tomitori
    • Organizer
      The 27th International Colloquium on Scanning Probe Microscopy, 5-7 Dec., Laforet Shuzenji, Shizuoka
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Development of tow-dimensional mica nanosheets on substrates analyzed by scanning Auger electron spectroscopy and atomic force microscopy2019

    • Author(s)
      Islam Mohammad Razzakul and Masahiko Tomitori
    • Organizer
      The 3rd International Conference on Applied Surface Science, 17-20 June, Pisa, Italy
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Mechanical properties of Pt atomic chain measured by TEM combined with a frequency-modulation force sensing system2019

    • Author(s)
      Jiaqi Zhang, Yuki Kobori, Keisuke Ishizuka, Masahiko Tomitori, Toyoko Arai, and Yoshifumi Oshima
    • Organizer
      第80回応用物理学秋季学術講演会、9月18-21日、北海道大学、札幌
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] 大気中における金ナノ接点の力学特性と電気伝導特性の相関関係2019

    • Author(s)
      見寺 悠伽、石塚 慧介、大島 義文、富取 正彦、新井 豊子
    • Organizer
      2019年日本表面真空学会学術講演会、10月28日ー30日、つくば国際会議場、つくば
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] FM-AFM/TEM法によるAuナノ接点の力学・構造同時測定2019

    • Author(s)
      石塚 慧介、小堀 雄稀、見寺 悠伽、富取 正彦、新井 豊子、大島 義文
    • Organizer
      第80回応用物理学秋季学術講演会、9月18-21日、北海道大学、札幌
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Electro-plating and stripping of lead dendrites observed by operandi scanning electron microscopy with an electrochemical cell2019

    • Author(s)
      G. He, Y. Oshima, M. Tomitori
    • Organizer
      弟66回応用物理学会春期学術講演会
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Evaluation of the thickness of exfoliated artificially-synthesized mica nanosheets affixed on silicon substrates and correlations with current-voltage characteristics2019

    • Author(s)
      Islam Mohammad Razzakul and Masahiko Tomitori
    • Organizer
      The 27th International Colloquium on Scanning Probe Microscopy, 5-7 Dec., Laforet Shuzenji, Shizuoka
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] In-situ measurement of Young's modulus for Au nanocontacts by ultrahigh vacuum TEM with quartz crystal oscillator sensor2019

    • Author(s)
      Kesisuke Ishizuka, Yuki Kobori, Masahiko Tomitori, Toyoko Arai, and Yoshifumi Oshima
    • Organizer
      The 10th International Conference on Materials for Advnaced Technologies, 23-28, June, Marina Bay Sands, Singapore
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Discrimination of Si and Ge atoms in dissipation energy images on Ge/Si(111)-(5×5) using non-contact atomic force microscopy2019

    • Author(s)
      Toyoko Arai, Daiki Kura, Toshiki Tsuji, and Masahiko Tomitori
    • Organizer
      The 22nd International Conference on Non-cotact Atomic Force Microscopy, 29 July- 2 Aug., Regensburg, Germany
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] TEM-周波数変調法を用いたAuナノワイヤのヤング率方位依存性の測定2019

    • Author(s)
      小堀 雄稀、石塚 慧介、見寺 悠伽、富取 正彦、新井 豊子、大島 義文
    • Organizer
      弟66回応用物理学会春期学術講演会
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] nc-AFM/STM用音叉型水晶振動子力センサーのための金属探針の作製と評価2019

    • Author(s)
      新井 豊子、笈田 浩平、丸山 天悟、富取 正彦
    • Organizer
      第80回応用物理学秋季学術講演会、9月18-21日、北海道大学、札幌
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] 金属探針を用いた非接触原子間力顕微鏡による試料表面抵抗測定2019

    • Author(s)
      丸山 天悟、笈田 浩平、藏 大輝、富取 正彦、新井 豊子
    • Organizer
      弟66回応用物理学会春期学術講演会
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] FM-AFM/TEM 同時測定による Au ナノ接点の力学・構造評価2019

    • Author(s)
      石塚 慧介、小堀 雄稀、見寺 悠伽、富取 正彦、新井 豊子、大島 義文
    • Organizer
      2019年日本表面真空学会学術講演会、10月28日ー30日、つくば国際会議場、つくば
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] TEM-微小振幅FM力勾配測定法によるPtナノ接点の力学測定2019

    • Author(s)
      Jiaqi Zhang、小堀 雄稀,石塚 慧介,富取 正彦,新井 豊子,大島 義文
    • Organizer
      日本顕微鏡学会第75回学術講演会、名古屋国際会議場、名古屋
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] TEM-微小振幅FM力勾配測定法によるAuナノ接点ヤング率の結晶方位依存性の計測2019

    • Author(s)
      小堀 雄稀、石塚 慧介、見寺 悠伽、富取 正彦、新井 豊子、大島 義文
    • Organizer
      日本顕微鏡学会第75回学術講演会、名古屋国際会議場、名古屋
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Energy dissipation due to displacement of a Si adatom on Si(111)-(7×7) with noncontact atomic force microscopy2019

    • Author(s)
      T. Shikichi, J.-I. Iwata, M. Tomitori, A. Oshiyama, and T. Arai
    • Organizer
      The 27th International Colloquium on Scanning Probe Microscopy, 5-7 Dec., Laforet Shuzenji, Shizuoka
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] In-situ scanning electron microscopy observation of electrode-electrolyte interfaces in an electrochemical cell2019

    • Author(s)
      He Gada, 大島 義文、富取 正彦
    • Organizer
      2019年日本表面真空学会学術講演会、10月28日ー30日、つくば国際会議場、つくば
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] nc-AFMで検出するGe/Si(111)表面原子とSi探針間に働く化学結合力と散逸エネルギー2019

    • Author(s)
      新井 豊子、辻 繁樹、藏 大輝、敷地 汰一、富取 正彦
    • Organizer
      第80回応用物理学秋季学術講演会、9月18-21日、北海道大学、札幌
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Mechancial properites of Pt nano-contacts measured by TEM combined with a frequency-modulation force sensor2019

    • Author(s)
      Jiaqi Zhang, Yuki Kobori, Keisuke Ishizuka, Masahiko Tomitori, Toyoko Arai, and Yoshifumi Oshima
    • Organizer
      The 10th International Conference on Materials for Advnaced Technologies, 23-28, June, Marina Bay Sands, Singapore
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Mechanical properties of Pt atomic chain measured by TEM combined with a frequency-modulation force sensing system2019

    • Author(s)
      Jiaqi Zhang、小堀 雄稀,石塚 慧介,富取 正彦,新井 豊子,大島 義文
    • Organizer
      2019年日本表面真空学会学術講演会、10月28日ー30日、つくば国際会議場、つくば
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] nc-AFMで取得したエネルギー散逸像によるSi/Geの識別2019

    • Author(s)
      藏 大輝、辻 繁樹、富取 正彦、新井 豊子
    • Organizer
      弟66回応用物理学会春期学術講演会
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Evaluation of the thickness of mechanically exfoliated mica nanosheets affixed on Si substrates by scanning Auger electron spectroscopy2019

    • Author(s)
      Islam Mohammad Razzakul and Masahiko Tomitori
    • Organizer
      第80回応用物理学秋季学術講演会、9月18-21日、北海道大学、札幌
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] サブ10nmスケールにおける金ナノ接点の定量的弾性評価2019

    • Author(s)
      石塚 慧介、小堀 雄稀、見寺 悠伽、富取 正彦、新井 豊子、大島 義文
    • Organizer
      弟66回応用物理学会春期学術講演会
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] In-situ scanning electron microscopy observation of lead dendrites grown in an electrochemical cell2019

    • Author(s)
      Gada He, Yoshifmi Oshima, and Masahiko Tomitori
    • Organizer
      第80回応用物理学秋季学術講演会、9月18-21日、北海道大学、札幌
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Surface resistance change of Ge islands grown on Si(111)-(7x7) evaluated by Joule heat energy dissipation in non-contact atomic force microscopy2018

    • Author(s)
      D. Kura, M. Tomitori, T. Arai
    • Organizer
      14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Nanomechanical responses of epitaxial silicone on ZrB2(0001) examined by non-contact atomic force microscopy2018

    • Author(s)
      M. Nogami, A. Fleurence, Y. Y.-Takamura, M. Tomitori
    • Organizer
      14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Advanced material Science and atomic scale observations2018

    • Author(s)
      M. Tomitori
    • Organizer
      14th Arab Conference on the Peaceful Uses of Atomic Energy
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] High-temperature treatments of two-dimensional flakes of phlogopite mica on silicon substrates evaluated by atomic force microscopy2018

    • Author(s)
      I. M. Razzakul, M. Tomitori
    • Organizer
      14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Measurements of electronic conductance and mechanical properties of gold point contacts based on frequency modulation atomic force microscopy2018

    • Author(s)
      H. Mitera, T. Murakami, R. Hashimoto, K. Ishizuka, Y. Oshima, M. Tomitori, T. Arai
    • Organizer
      14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] 非接触AFMによるジュール熱散逸計測から評価したGe/Si(111)-(7x7)表面の表面抵抗2018

    • Author(s)
      藏 大輝、富取 正彦、新井 豊子
    • Organizer
      第78回応用物理学会 秋期学術講演会
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] In-situ scanning electron microscopy observation of electro-plating and stripping of lead dendrites in an electrochemical cell2018

    • Author(s)
      G. He, Y. Oshima, M. Tomitori
    • Organizer
      14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] FM-AFMを利用した金ナノ接点の電気伝導度とバネ定数の相関か遺跡2018

    • Author(s)
      見寺 悠伽、村上 拓、石塚 敬介、大島 義文、富取 正彦、新井 豊子
    • Organizer
      日本物理学会 北陸支部定例学術講演会
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] 長辺振動水晶振動子を組み込んだTEMによるAuナノワイヤの特異的力学特性の観察2018

    • Author(s)
      小堀 雄稀、石塚 慧介、見寺 悠伽、富取 正彦、新井 豊子、大島 義文
    • Organizer
      日本表面真空学会 学術講演会
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] 周波数変調原子間力顕微鏡を用いたナノ接点の力学特性測定の研究2018

    • Author(s)
      見寺 悠伽、石塚 敬介、小堀 雄稀、大島 義文、富取 正彦、新井 豊子
    • Organizer
      日本表面真空学会 学術講演会
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] FM-AFMを利用した金ナノ接点の電気伝導と力学特性の相関解析2018

    • Author(s)
      見寺 悠伽、村上 拓、橋本 遼太、石塚 慧介、大島 義文、富取 正彦、新井 豊子
    • Organizer
      弟78回応用物理学会 秋期学術講演会
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Young's modulus of single-nano-scale gold nanowire estimated by TEM-AFM2018

    • Author(s)
      K. Ishizuka, T. Murakami, Y. Kobori, M. Tomitori, T. Arai, Y. Oshima
    • Organizer
      19th International Microscopy Congress
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Estimation of Young's modulus of Au nanowire by TEM combined with AFM2018

    • Author(s)
      K. Ishizuka, T. Murakami, Y. Kobori, M. Tomitori, T. Arai, Y. Oshima
    • Organizer
      14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] Surface resistivity change detected by non-contact atomic force microscopy through Joule heat energy dissipation2018

    • Author(s)
      T. Arai, D. Kura, R. Inamura, M. Tomitori
    • Organizer
      21th International Conference on non-contact atomic force microscopy
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03879
  • [Presentation] 非接触原子間力顕微鏡で検出されるエネルギー散逸機構の研究2017

    • Author(s)
      稲村竜、藤井幹大、富取正彦、新井豊子
    • Organizer
      第64回応用物理学会春季学術講演会
    • Place of Presentation
      パシフィコ横浜、神奈川・横浜
    • Year and Date
      2017-03-14
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] Ex-situ STM and XPS analysis of TiO2(110) surfaces to humid environments2017

    • Author(s)
      Akira Sasahara, Tatsuya Murakami, Masahiko Tomitori
    • Organizer
      Symposium on Surface Sciences and Nanotechnology -25th Anniversary of SSSJ Kansai
    • Place of Presentation
      Kyoto International Community House, Kyoto, Kyoto
    • Year and Date
      2017-01-24
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] Si(111)-(7x7)表面を試料とした非接触原子間力顕微鏡で検出されるエネルギー散逸機構の研究2017

    • Author(s)
      稲村竜、藏大輝、富取正彦、新井豊子
    • Organizer
      日本物理学会第72回年次大会
    • Place of Presentation
      大阪大学豊中キャンパス、大阪・豊中
    • Year and Date
      2017-03-17
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] 周波数変調原子間力顕微鏡法を応用した金ナノ接点の力学的特性の解析2017

    • Author(s)
      村上拓、橋本遼太、石塚慧介、長井馨、大島義文、富取正彦、新井豊子
    • Organizer
      日本物理学会第72回年次大会
    • Place of Presentation
      大阪大学豊中キャンパス、大阪・豊中
    • Year and Date
      2017-03-17
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] 疑似体液に浸漬させた構造規定酸化チタン表面のナノスケール解析2017

    • Author(s)
      笹原亮、村上達也、富取正彦
    • Organizer
      日本セラミックス協会2017年年会
    • Place of Presentation
      日本大学駿河台キャンパス、東京・千代田区
    • Year and Date
      2017-03-17
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] 自然酸化シリコン表面上に自己組織的に形成・配置された銅ロッド構造2017

    • Author(s)
      坂本拓朗、西村高志、富取正彦
    • Organizer
      第64回応用物理学会春季学術講演会
    • Place of Presentation
      パシフィコ横浜、神奈川・横浜
    • Year and Date
      2017-03-14
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] 非接触原子間力顕微鏡におけるエネルギー散逸機構の研究2016

    • Author(s)
      稲村竜、富取正彦、新井豊子
    • Organizer
      日本物理学会秋季大会
    • Place of Presentation
      金沢大学・角間キャンパス、石川・金沢
    • Year and Date
      2016-09-13
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] FM-AFMを用いた金ナノ接点の電気的・力学的特性の測定2016

    • Author(s)
      村上拓、橋本遼太、石塚慧介、大島義文、富取正彦、新井豊子
    • Organizer
      日本顕微鏡学会第72回学術講演会
    • Place of Presentation
      仙台国際センター、宮城・仙台
    • Year and Date
      2016-06-14
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] 電気伝導と力学特性の同時測定による金ナノ接点の原子配列の考察2016

    • Author(s)
      橋本遼太、新井豊子、村上拓、石塚彗介、大島義文、富取正彦
    • Organizer
      第63回応用物理学会春季学術講演会
    • Place of Presentation
      東京工業大学 大岡山キャンパス、東京都目黒区
    • Year and Date
      2016-03-18
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] 高湿度環境に暴露したTiO2(110)-(1x1)表面のUHV-STM/XPS解析2016

    • Author(s)
      笹原亮、富取正彦
    • Organizer
      第77回応用物理学会秋季学術講演会
    • Place of Presentation
      朱鷺メッセ、新潟・新潟
    • Year and Date
      2016-09-13
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] チャージアンプを備えたnc-AFMによる表面電子状態解析2016

    • Author(s)
      野上真、新井豊子、笹原亮、富取正彦
    • Organizer
      第63回応用物理学会春季学術講演会
    • Place of Presentation
      東京工業大学 大岡山キャンパス、東京都目黒区
    • Year and Date
      2016-03-18
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] 真空中で石英から昇華させたSiOのルチルTiO2(110)表面への堆積2016

    • Author(s)
      附田健太郎、笹原亮、富取正彦
    • Organizer
      第63回応用物理学会春季学術講演会
    • Place of Presentation
      東京工業大学 大岡山キャンパス、東京都目黒区
    • Year and Date
      2016-03-18
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] 純水及び疑似体液に浸漬させたTiO2(110)-(1x1)表面のex-situS解析2016

    • Author(s)
      笹原亮、富取正彦
    • Organizer
      真空・表面科学合同講演会 第36回表面科学学術講演会
    • Place of Presentation
      名古屋国際会議場、愛知県・名古屋
    • Year and Date
      2016-11-29
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] 周波数変調原子間力顕微鏡を組み込んだ透過型電子顕微鏡による金ナノ接点の力学ー構造特性の同時測定2016

    • Author(s)
      石塚慧介、村上拓、橋本遼太、大島義文、富取正彦、新井豊子
    • Organizer
      真空・表面科学合同講演会 第36回表面科学学術講演会
    • Place of Presentation
      名古屋国際会議場、愛知県・名古屋
    • Year and Date
      2016-11-29
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] 金ナノ接点の電気的・力学的特性の同時測定およびその解析2016

    • Author(s)
      村上拓、橋本遼太、石塚慧介、大島義文、富取正彦、新井豊子
    • Organizer
      日本物理学会秋季大会
    • Place of Presentation
      金沢大学・角間キャンパス、石川・金沢
    • Year and Date
      2016-09-13
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] 真空中で石英から昇華させたSiOのルチルTiO2(110)表面への堆積2016

    • Author(s)
      附田健太郎、笹原亮、富取正彦
    • Organizer
      第63回応用物理学会春季学術講演会
    • Place of Presentation
      東京工業大学 大岡山キャンパス、東京都目黒区
    • Year and Date
      2016-03-18
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] 疑似体液に浸漬させた酸化チタン単結晶表面のナノスケール解析2016

    • Author(s)
      笹原亮、村上達也、Le Tran Uyen Tu、附田健太郎、富取正彦
    • Organizer
      第63回応用物理学会春季学術講演会
    • Place of Presentation
      東京工業大学 大岡山キャンパス、東京都目黒区
    • Year and Date
      2016-03-18
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] 電気伝導と力学特性の同時測定による金ナノ接点の原子配列の考察2016

    • Author(s)
      橋本遼太、新井豊子、村上拓、石塚彗介、大島義文、富取正彦
    • Organizer
      第63回応用物理学会春季学術講演会
    • Place of Presentation
      東京工業大学 大岡山キャンパス、東京都目黒区
    • Year and Date
      2016-03-18
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] 加熱/煮沸処理を施した酸化チタン表面のリン酸カルシウムの析出2016

    • Author(s)
      笹原亮、村上達也、Le Tran Uyen Tu、附田健太郎、富取正彦
    • Organizer
      日本セラミックス協会 2016年年会
    • Place of Presentation
      早稲田大学、西早稲田大学キャンパス、東京都新宿区
    • Year and Date
      2016-03-14
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] 加熱/煮沸処理を施した酸化チタン表面のリン酸カルシウムの析出2016

    • Author(s)
      笹原亮、村上達也、Le Tran Uyen Tu、附田健太郎、富取正彦
    • Organizer
      日本セラミックス協会 2016年年会
    • Place of Presentation
      早稲田大学、西早稲田大学キャンパス、東京都新宿区
    • Year and Date
      2016-03-14
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] チャージアンプを備えたnc-AFMによる表面電子状態解析2016

    • Author(s)
      野上真、新井豊子、笹原亮、富取正彦
    • Organizer
      第63回応用物理学会春季学術講演会
    • Place of Presentation
      東京工業大学 大岡山キャンパス、東京都目黒区
    • Year and Date
      2016-03-18
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] 疑似体液に浸漬させた酸化チタン単結晶表面のナノスケール解析2016

    • Author(s)
      笹原亮、村上達也、Le Tran Uyen Tu、附田健太郎、富取正彦
    • Organizer
      第63回応用物理学会春季学術講演会
    • Place of Presentation
      東京工業大学 大岡山キャンパス、東京都目黒区
    • Year and Date
      2016-03-18
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] 長辺振動水晶振動子を力学センサーに応用した金ナノ接点の力学・電気伝導特性の同時計測2015

    • Author(s)
      橋本遼太、新井豊子、大島義文、富取正彦
    • Organizer
      第76回応用物理学会秋季講演会
    • Place of Presentation
      名古屋国際会議場、愛知県名古屋市
    • Year and Date
      2015-09-13
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] 二酸化チタン表面へのリン酸カルシウム析出のXPSとAFMによる解析2015

    • Author(s)
      笹原亮、村上達也、Le Tran Uyen Tu, 附田健太郎、富取正彦
    • Organizer
      第35回表面科学学術講演会
    • Place of Presentation
      つくば国際会議場、茨城県つくば市
    • Year and Date
      2015-12-01
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] 二酸化チタン表面へのリン酸カルシウム析出のXPSとAFMによる解析2015

    • Author(s)
      笹原亮、村上達也、Le Tran Uyen Tu, 附田健太郎、富取正彦
    • Organizer
      第35回表面科学学術講演会
    • Place of Presentation
      つくば国際会議場、茨城県つくば市
    • Year and Date
      2015-12-01
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] Dissipation decrease in a proximity region enhanced with a hydrogen-terminated Si tip in non-contact atomic force microscopy2015

    • Author(s)
      R. Inamura, M. Tomitori, T. Arai
    • Organizer
      the 18th International Conference on non-contact atomic force microscopy
    • Place of Presentation
      Cassis, France
    • Year and Date
      2015-09-07
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] 超高真空槽で調製したSi(001)と(111)面の水滴下後の表面変化2015

    • Author(s)
      宮城友昭、笹原亮、富取正彦
    • Organizer
      第76回応用物理学会秋季講演会
    • Place of Presentation
      名古屋国際会議場、愛知県名古屋市
    • Year and Date
      2015-09-13
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] 金ナノ接点の電気電導と力学特性の同時測定2015

    • Author(s)
      橋本遼太、新井豊子、大島義文、富取正彦
    • Organizer
      第35回表面科学学術講演会
    • Place of Presentation
      つくば国際会議場、茨城県つくば市
    • Year and Date
      2015-12-01
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] 加熱・加圧処理によるシリコン表面の突起構造の形成2015

    • Author(s)
      西村高志、富取正彦
    • Organizer
      第76回応用物理学会秋季講演会
    • Place of Presentation
      名古屋国際会議場、愛知県名古屋市
    • Year and Date
      2015-09-13
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] 長辺振動水晶振動子を力学センサーに応用した金ナノ接点の力学・電気伝導特性の同時計測2015

    • Author(s)
      橋本遼太、新井豊子、大島義文、富取正彦
    • Organizer
      第76回応用物理学会秋季講演会
    • Place of Presentation
      名古屋国際会議場、愛知県名古屋市
    • Year and Date
      2015-09-13
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] Dissipation decrease in a proximity region enhanced with a hydrogen-terminated Si tip in non-contact atomic force microscopy2015

    • Author(s)
      R. Inamura, M. Tomitori, T. Arai
    • Organizer
      the 18th International Conference on non-contact atomic force microscopy
    • Place of Presentation
      Cassis, France
    • Year and Date
      2015-09-11
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] 金ナノ接点の電気電導と力学特性の同時測定2015

    • Author(s)
      橋本遼太、新井豊子、大島義文、富取正彦
    • Organizer
      第35回表面科学学術講演会
    • Place of Presentation
      つくば国際会議場、茨城県つくば市
    • Year and Date
      2015-12-01
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] Chemical conformation of diamond-p-terphenyl on Si(001)-2×1 observed by STM2015

    • Author(s)
      Amer Mahmoud Amer Hassan, Akira Sasahara, Hideyuki Murata, Masahiko Tomitori
    • Organizer
      日本顕微鏡学会 第71回学術講演会
    • Place of Presentation
      国立京都国際会議場、京都府京都市
    • Year and Date
      2015-05-13
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] Laying-down configuration of 4,4" diamond-p-terphenyl on Si(001)-2×1 observed by scanning tunneling microscopy2015

    • Author(s)
      Amer Mahmoud Amer Hassan, Akira Sasahara, Hideyuki Murata, Masahiko Tomitori
    • Organizer
      EM-NANO 2015
    • Place of Presentation
      TOKI MESSE Niigata Convention Center, Niigata, Niigata, Japan
    • Year and Date
      2015-06-16
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] Simultaneous NC-AFM imaging with current and damping energy using a retuned fork sensor with a high Q-value2015

    • Author(s)
      H. Ooe, M. Fujii, M. Tomitori, T. Arai
    • Organizer
      the 18th International Conference on non-contact atomic force microscopy
    • Place of Presentation
      Cassis, France
    • Year and Date
      2015-09-07
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] Laying-down configuration of 4,4" diamond-p-terphenyl on Si(001)-2×1 observed by scanning tunneling microscopy2015

    • Author(s)
      Amer Mahmoud Amer Hassan, Akira Sasahara, Hideyuki Murata, Masahiko Tomitori
    • Organizer
      EM-NANO 2015
    • Place of Presentation
      TOKI MESSE Niigata Convention Center, Niigata, Niigata, Japan
    • Year and Date
      2015-06-16
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] 加熱・加圧処理によるシリコン表面の突起構造の形成2015

    • Author(s)
      西村高志、富取正彦
    • Organizer
      第76回応用物理学会秋季講演会
    • Place of Presentation
      名古屋国際会議場、愛知県名古屋市
    • Year and Date
      2015-09-13
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] Tip-sample distance dependence of the output of a charge amplifier in NC-AFM2015

    • Author(s)
      M. Nogami, T. Arai, A. Sasahara, M. Tomitori
    • Organizer
      the 18th International Conference on non-contact atomic force microscopy
    • Place of Presentation
      Cassis, France
    • Year and Date
      2015-09-07
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] 超高真空槽で調製したSi(001)と(111)面の水滴下後の表面変化2015

    • Author(s)
      宮城友昭、笹原亮、富取正彦
    • Organizer
      第76回応用物理学会秋季講演会
    • Place of Presentation
      名古屋国際会議場、愛知県名古屋市
    • Year and Date
      2015-09-13
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] Chemical conformation of diamond-p-terphenyl on Si(001)-2×1 observed by STM2015

    • Author(s)
      Amer Mahmoud Amer Hassan, Akira Sasahara, Hideyuki Murata, Masahiko Tomitori
    • Organizer
      日本顕微鏡学会 第71回学術講演会
    • Place of Presentation
      国立京都国際会館、京都府京都市
    • Year and Date
      2015-05-13
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] 雰囲気制御電気炉でのSiO2超薄膜のルチルTiO2(110)基板上への堆積2015

    • Author(s)
      附田健太郎、笹原亮、富取正彦
    • Organizer
      応用物理学会 北陸・信越支部学術講演会
    • Place of Presentation
      信州大学工学部 長野県長野市
    • Year and Date
      2015-12-12
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] Simultaneous NC-AFM imaging with current and damping energy using a retuned fork sensor with a high Q-value2015

    • Author(s)
      H. Ooe, M. Fujii, M. Tomitori, T. Arai
    • Organizer
      the 18th International Conference on non-contact atomic force microscopy
    • Place of Presentation
      Cassis, France
    • Year and Date
      2015-09-07
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] Tip-sample distance dependence of the output of a charge amplifier in NC-AFM2015

    • Author(s)
      M. Nogami, T. Arai, A. Sasahara, M. Tomitori
    • Organizer
      the 18th International Conference on non-contact atomic force microscopy
    • Place of Presentation
      Cassis, France
    • Year and Date
      2015-09-07
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] 雰囲気制御電気炉でのSiO2超薄膜のルチルTiO2(110)基板上への堆積2015

    • Author(s)
      附田健太郎、笹原亮、富取正彦
    • Organizer
      応用物理学会 北陸・信越支部学術講演会
    • Place of Presentation
      信州大学工学部、長野県長野市
    • Year and Date
      2015-12-12
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] チャージアンプを用いたNC-AFM による探針試料間相互作用の検出2013

    • Author(s)
      野上 真、新井 豊子、笹原 亮、富取 正彦
    • Organizer
      第60回応用物理学会学術講演会
    • Place of Presentation
      神奈川工科大学、厚木市、神奈川県
    • Data Source
      KAKENHI-PROJECT-22656012
  • [Presentation] Improvement of the Q factor of a tuning fork quartz force sensor with modified holding ways for nc-AFM/STM2012

    • Author(s)
      Toyoko Arai, Hiroaki Ooe, Tatsuya Sakuishi, Masahiko Tomitori
    • Organizer
      the 15th International Conference on Non-contact Atomic Force Microscopy
    • Place of Presentation
      Cesky Krumlov, Czech Republic
    • Data Source
      KAKENHI-PROJECT-22656012
  • [Presentation] 自励発振式水晶振動子センサーを用いた超高真空FM-AFM の開発II2012

    • Author(s)
      作石 達哉、野上 真、大江 弘晃、富取 正彦、笹原 亮
    • Organizer
      第59回応用物理学関係連合講演会
    • Place of Presentation
      早稲田大学、東京都
    • Year and Date
      2012-03-15
    • Data Source
      KAKENHI-PROJECT-22656012
  • [Presentation] 実デバイス指向の表面吸着構造のSPM解析の試み2011

    • Author(s)
      富取正彦
    • Organizer
      日本顕微鏡学会SPM分科会平成23年度オープン研究会
    • Place of Presentation
      物質・材料研究機構、つくば市、茨城
    • Year and Date
      2011-12-02
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Presentation] 水晶振動子q-Plus センサーを利用したSTM/nc-AFM の開発2011

    • Author(s)
      作石 達哉、大江 弘晃、富取 正彦、新井 豊子
    • Organizer
      応用物理学会 北陸・信越支部 学術講演会
    • Place of Presentation
      金沢歌劇座、金沢市、石川県
    • Year and Date
      2011-11-18
    • Data Source
      KAKENHI-PROJECT-22656012
  • [Presentation] NC-AFM and force spectroscopy applied to H terminatedSi(111) 7×72011

    • Author(s)
      T. Arai, T. Ikeshima, Y. Zhang, M. Tomitori
    • Organizer
      14^<th> international conference on NC-AFM 2011
    • Place of Presentation
      Lindau, German
    • Year and Date
      2011-09-19
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Presentation] 水晶振動子力センサー・静電容量補償回路を用いたSTM/nc-AFM2011

    • Author(s)
      作石 達哉、大江 弘晃、富取 正彦、新井 豊子
    • Organizer
      第72回応用物理学会学術講演会
    • Place of Presentation
      山形大学、山形市、山形県
    • Year and Date
      2011-08-31
    • Data Source
      KAKENHI-PROJECT-22656012
  • [Presentation] Si(001)表面におけるDAT分子の吸着構造と電子状態2011

    • Author(s)
      小田将人, 西村高志, 笹原亮, 村田英幸, 新井豊子, 富取正彦
    • Organizer
      日本物理学会第66会年次大会
    • URL

      http://wwwsoc.nii.ac.jp/jps/index.html

    • Place of Presentation
      新潟大学 五十嵐キャンパス(新潟県)
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Presentation] NC-AFM and Force spectroscopy applied to H terminated Si(111) 7x72011

    • Author(s)
      Arai, T., Ikeshima, T., Zhang, Y., Tomitori, M.
    • Organizer
      14th International Conferencence on Noncontact Atomic Force Microscopy(ncAFM2011)
    • Place of Presentation
      Lindau(Germany)
    • Year and Date
      2011-09-19
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Presentation] Development of nc-AFM/STM using a tuning fork quartz force sensor2011

    • Author(s)
      Toyoko Arai, Tatsuya Sakuishi, Hiroaki Ooe, Masahiko Tomitori
    • Organizer
      the International Conference on Non-contact Atomic Force Microscopy
    • Place of Presentation
      Lindau, Germany
    • Year and Date
      2011-09-20
    • Data Source
      KAKENHI-PROJECT-22656012
  • [Presentation] 実デバイス指向の表面吸着構造のSPM解析の試み2011

    • Author(s)
      富取正彦
    • Organizer
      日本顕微鏡学会・SPM分科会平成23年度オープン研究会
    • Place of Presentation
      つくば物質・材料研究機構(招待講演)
    • Year and Date
      2011-12-02
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Presentation] Non-contact AFM observation of Si(111)-(7×7) terminated with hydrogen2011

    • Author(s)
      Arai, T., Ishikawa, T., Ikeshima, T., Tomitori, M.
    • Organizer
      The 6th International Symposium on Surface Science(ISSS6)
    • Place of Presentation
      タワーホール船堀(東京都)
    • Year and Date
      2011-12-12
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Presentation] Nano imaging and characterization using scanning probe microscopy (Invited)2010

    • Author(s)
      Masahiko Tomitori
    • Organizer
      International Interdisciplinary Science Conference 2010 on Nanobiotechnology: An Interface between Physics and Biology
    • Place of Presentation
      Jamia Millia Islamia, New Delhi, India
    • Year and Date
      2010-12-03
    • Data Source
      KAKENHI-PROJECT-22656012
  • [Presentation] Development of SPM instruments and tip preparation for force sensors2010

    • Author(s)
      T.Arai, T.Sakuishi, K.Hori, M.Tomitori
    • Organizer
      13th International Conference on Noncontact Atomic Force Microscopy
    • Place of Presentation
      石川県立音楽堂(石川県)
    • Year and Date
      2010-08-02
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Presentation] Development of SPM instruments and tip preparation for force sensors2010

    • Author(s)
      T.Arai, T.Sakuishi, K.Hori, M.Tomitori
    • Organizer
      13th International Conference on Noncontact Atomic Force Microscopy
    • Place of Presentation
      石川県立音楽堂(石川県)
    • Year and Date
      2010-08-02
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Presentation] Si (100) と (111) 表面上のジアミノパラターフェニル分子の吸着状態の比較2010

    • Author(s)
      西村高志, 村田英幸, 笹原亮, 新井豊子, 富取正彦
    • Organizer
      第57回応用物理学関連連合講演会
    • Place of Presentation
      東海大学 (神奈川県)
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Presentation] Nano imaging and characterization using scanning probe microscopy2010

    • Author(s)
      M. Tomitori
    • Organizer
      International Interdisciplinary ScienceConference-2010 on Nanobiotechnology : An Interface between Physics and Biology
    • Place of Presentation
      Jamia Millia Islamia, New Delhi
    • Year and Date
      2010-12-03
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Presentation] π電子系分子で界面制御したシリコン/有機半導体素子の製作と評価2010

    • Author(s)
      西村高志,村田英幸,笹原亮,新井豊子,富取正彦
    • Organizer
      応用物理学会北陸・信越支部学術講演会
    • Place of Presentation
      金沢大学(石川県)
    • Year and Date
      2010-11-19
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Presentation] Nano imaging and characterization using scanning probe microscopy2010

    • Author(s)
      Masahiko Tomitori
    • Organizer
      International Interdisciplinary Science Conference-2010 on Nanobiotechnology : An Interface between Physics and Biology (Invited)
    • Place of Presentation
      Jamia Millia Islamia, New Delhi, India6
    • Year and Date
      2010-12-03
    • Data Source
      KAKENHI-PROJECT-22656012
  • [Presentation] Nanoscale analysis by combined spectroscopies based on noncontact atomic force microscopy under a bias voltage2010

    • Author(s)
      T.Arai, T.Ikeshima, K.Kiyohara, M.Tomitori
    • Organizer
      13th International Conference on Noncontact Atomic Force Microscopy
    • Place of Presentation
      石川県立音楽堂(石川県)
    • Year and Date
      2010-08-02
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Presentation] Si(100)と(111)表面上のジアミノパラターフェニル分子の吸着状態の比較2010

    • Author(s)
      西村高志, 村田英幸, 笹原亮, 新井豊子, 富取正彦
    • Organizer
      第57回応用物理学関連連合講演会
    • Place of Presentation
      東海大学(神奈川県)
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Presentation] Si (100) と (111) 表面上のジアミノパラターフェニル分子の吸着状態の比較2010

    • Author(s)
      西村高志, 村田英幸, 笹原亮, 新井豊子, 富取正彦
    • Organizer
      第57回応用物理学関係連合講演会
    • Place of Presentation
      東海大学 (神奈川)
    • Year and Date
      2010-03-20
    • Data Source
      KAKENHI-PROJECT-20241034
  • [Presentation] Si(100)と(111)表面上のジアミノパラターフェニル分子の吸着状態の比較2010

    • Author(s)
      西村高志,村田英幸,笹原亮,新井豊子,富取正彦
    • Organizer
      第57回応用物理学関係連合講演会
    • Place of Presentation
      神奈川
    • Year and Date
      2010-03-17
    • Data Source
      KAKENHI-PROJECT-20241034
  • [Presentation] Nanoscale analysis by combined spectroscopies based on non-contact atomic force microscopy under a bias voltage2010

    • Author(s)
      Arai, T., Ikeshima, T., Kiyohara, K., Tomitori, M.
    • Organizer
      13th International Conferencence on Noncontact Atomic Force Microscopy(ncAFM2010)
    • Place of Presentation
      川県立音楽堂(石川県)
    • Year and Date
      2010-08-02
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Presentation] nonc-contact atomic force microscope observation of TiO_2 (110) surface in pure water2009

    • Author(s)
      笹原亮, Yonkil Jeong, 富取正彦
    • Organizer
      12th international conference on noncontact atomic force microscopy (ncAFM 2009)
    • Place of Presentation
      Yale 大学 (米国)
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Presentation] From non-contact to atomic scale contact between a Si tip and a Si surface analyzed using an nc-AFM and nc-AFS based instrument2009

    • Author(s)
      Toyoko Arai, Kosei Kiyohara, Taiki Sato, Shugaku Kushida, Masahiko Tomitori
    • Organizer
      12th international conference on noncontact atomic force microscopy(ncAFM2009)
    • Place of Presentation
      Yale大学(米国)
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Presentation] アミノ化p-terphenyl誘導体のSi(111) 7x7表面上の結合状態のSTMとXPSによる評価2009

    • Author(s)
      西村高志,板橋敦,笹原亮,村田英幸,新井豊子,富取正彦
    • Organizer
      第56回応用物理学関係連合講演会
    • Place of Presentation
      茨木
    • Year and Date
      2009-03-30
    • Data Source
      KAKENHI-PROJECT-20241034
  • [Presentation] 非接触原子間力顕微鏡による相互作用力・電流・散逸エネルギー測定による表面解析2009

    • Author(s)
      新井豊子, 富取正彦
    • Organizer
      第70回応用物理学会学術講演会シンポジウム「非接触原子間力顕微鏡で拓くナノテク最前線」
    • Place of Presentation
      富山大学(富山県)
    • Year and Date
      2009-09-08
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Presentation] SEM-SPMを用いたPt系探針と融解Ge粒子の接触・切断過程のその場観察2009

    • Author(s)
      富取正彦, 大石直樹, 笹原亮, 谷正安, 新井豊子
    • Organizer
      日本顕微鏡学会第65回学術講演会
    • Place of Presentation
      仙台国際センター (宮城県)
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Presentation] From non-contact to atomic scale contact between a Si tip and a Si surface analyzed using an nc-AFM and nc-AFS based instrument2009

    • Author(s)
      Arai, T., Kiyohara, K., Sato, T., Kushida, S., Tomitori, M.
    • Organizer
      12th international conference on noncontact atomic force microscopy(ncAFM2009)
    • Place of Presentation
      Yale Univ.(USA)
    • Year and Date
      2009-08-11
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Presentation] Evaluation of binding states of p-terphenyls with amino groups on Si(111)7x7 using STM and XPS2009

    • Author(s)
      西村高志, 笹原亮, 村田英幸, 新井豊子, 富取正彦
    • Organizer
      10th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures(ACSIN10)
    • Place of Presentation
      Granada Conference Centre, Granada(スペイン)
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Presentation] Surface electron spectroscopy based on nc-AFM with changing bias voltage at close tip-sample separation2009

    • Author(s)
      T.Arai, K.Kiyohara, T.sato, S.Kushida, M.Tomitori
    • Organizer
      ACSIN 10
    • Place of Presentation
      Granada(Spain)
    • Year and Date
      2009-09-23
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Presentation] Surface electron spectroscopy based on nc-AFM with changing bias voltage at closer tip-sample separations2009

    • Author(s)
      Toyoko Arai, Kosei Kiyohara, Taiki Sato, Shugaku Kushida, Masahiko Tomitori
    • Organizer
      10th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures(ACSIN10)
    • Place of Presentation
      Granada Conference Centre, Granada(スペイン)
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Presentation] Nc-AFM study of a cleaved InAs(110) surface using modified Si probes under ambient atmopsheric pressure2009

    • Author(s)
      Yonkil Jeong, Masato Hirade, Ryohei Kokawa, Hirofumi Yamada, Kei Kobayashi, Noriak Oyabu, Hiroshi Yamatani, Toyoko Arai, Akira Sasahara, Masahiko Tomitori
    • Organizer
      12th international conference on noncontact atomic force microscopy(ncAFM2009)
    • Place of Presentation
      Yale大学(米国)
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Presentation] SEM-SPMを用いたPt系探針と融解G6粒子の接触・切断過程のその場観察2009

    • Author(s)
      富取正彦, 大石直樹, 笹原亮, 谷正安, 新井豊子
    • Organizer
      日本顕微鏡学会第65回学術講演会
    • Place of Presentation
      仙台国際センター(宮城県)
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Presentation] Surface electron spectroscopy based on nc-AFM with changing bias voltage at close tip-sample separation2009

    • Author(s)
      T. Arai, K. Kiyohara, T. sato, S. Kushida, M. Tomitori
    • Organizer
      ACSIN 10
    • Place of Presentation
      Granada, Spain
    • Year and Date
      2009-09-23
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Presentation] Evaluation of binding states of p-terphenyls with amino groups on Si (111) 7x7 using STM and XPS2009

    • Author(s)
      西村高志, 笹原亮, 村田英幸, 新井豊子, 富取正彦
    • Organizer
      10th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN 10)
    • Place of Presentation
      Granada Conference Centre, Granada (スペイン)
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Presentation] 第70回応用物理学会学術講演会シンポジウム「非接触原子間力顕微鏡で拓くナノテク最前線」2009

    • Author(s)
      新井豊子, 富取正彦
    • Organizer
      非接触原子間力顕微鏡による相互作用力・電流・散逸エネルギー測定による表面解析
    • Place of Presentation
      富山大学(富山県)
    • Year and Date
      2009-09-08
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Presentation] Surface electron spectroscopy based on nc-AFM with changing bias voltage at closer tip-sample separations2009

    • Author(s)
      新井豊子, Kosei Kiyohara, Taiki Sato, Shugaku Kushida, 富取正彦
    • Organizer
      10th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN 10)
    • Place of Presentation
      Granada Conference Centre, Granada (スペイン)
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Presentation] 非接触原子間力顕微鏡による相互作用力・電流・散逸エネルギー測定による表面解析2009

    • Author(s)
      新井豊子, 富取正彦
    • Organizer
      第70回応用物理学会学術講演会シンポジウム日本学術振興会ナノプローブテクノロジー第167委員会企画「非接触原子間力顕微鏡で拓くナノテク最前線」
    • Place of Presentation
      富山大学(富山県)
    • Year and Date
      2009-09-08
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Presentation] Si単結晶表面上のジアミノターフェニル分子の吸着状態2009

    • Author(s)
      西村高志, 村田英幸, 笹原亮, 新井豊子, 富取正彦
    • Organizer
      表面・界面スペクトロスコピー2009
    • Place of Presentation
      定山渓ホテルミリオーネ(北海道)
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Presentation] Development of quartz force sensors for noncontact atomic force microscopy/spectroscopy2009

    • Author(s)
      Kenichirou Hori, 新井豊子, 富取正彦
    • Organizer
      12th international conference on noncontact atomic force microscopy (ncAFM 2009)
    • Place of Presentation
      Yale 大学 (米国)
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Presentation] Surface electron spectroscopy based on nc-AFM with changing bias voltage at closer tip-sample separations2009

    • Author(s)
      Arai, T., Kiyohara, K., Sato, T., Tomitori, M.
    • Organizer
      10th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures(ACSIN10)
    • Place of Presentation
      Granada Conference Centre(Spain)
    • Year and Date
      2009-09-22
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Presentation] Si単結晶表面上のジアミノターフェニル分子の吸着状態2009

    • Author(s)
      西村高志, 村田英幸, 笹原亮, 新井豊子, 富取正彦
    • Organizer
      表面・界面スペクトロスコピー2009
    • Place of Presentation
      定山渓ホテルミリオーネ (北海道)
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Presentation] From non-contact to atomic scale contact between a Si tip and a Si surface analyzed using an nc-AFM and nc-AFS based instruwent2009

    • Author(s)
      新井豊子, Kosei Kiyohara, Taiki Sato, Shugaku Kushida, 富取正彦
    • Organizer
      12th international conference on noncontact atomic force microscopy (ncAFM 2009)
    • Place of Presentation
      Yale 大学 (米国)
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Presentation] 非接触原子間力顕微鏡による相互作用力・電流・散逸エネルギー測定による表面解析2009

    • Author(s)
      新井豊子, 富取正彦
    • Organizer
      第70回応用物理学会学術講演会シンポジウム 日本学術振興会ナノプローブテクノロジー第167委員会企画「非接触原子間力顕微鏡で拓くナノテク最前線」
    • Place of Presentation
      富山大学 (富山県)
    • Year and Date
      2009-09-08
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Presentation] Nc-AFM study of a cleaved InAs (110) surface using modified Si probes under ambient atmopsheric pressure2009

    • Author(s)
      Yonkil Jeong, Masato Hirade, Ryohei Kokawa, Hirofumi Yamada, Kei Kobayashi, Noriak Oyabu, Hiroshi Yamatani, 新井豊子, 笹原亮, 富取正彦
    • Organizer
      12th international conference on noncontact atomic force microscopy (ncAFM 2009)
    • Place of Presentation
      Yale 大学 (米国)
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Presentation] Development of quartz force sensors for noncontact atomic force microscopy/spectroscopy2009

    • Author(s)
      Kenichirou Hori, Toyoko Arai, Masahiko Tomitori
    • Organizer
      12th international conference on noncontact atomic force microscopy(ncAFM2009)
    • Place of Presentation
      Yale大学(米国)
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Presentation] From noncontact to atomic scale contact between a Si tip and a Si surface analyzed using an nc-AFM and nc-AFS based instrument2009

    • Author(s)
      T.Arai, K.Kiyohara, T.Sato, S.Kushida, 富取正彦
    • Organizer
      12th international conference on noncontact atomic force microscopy
    • Place of Presentation
      Yale University (USA)
    • Year and Date
      2009-08-10
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Presentation] アミノ化p-terphenyl誘導体のSi (111)7×7表面上の結合状態のSTMとXPSによる評価2009

    • Author(s)
      西村高志, 板橋敦, 笹原亮, 村田英幸, 新井豊子, 富取正彦
    • Organizer
      第56回応用物理学関係連合講演会
    • Place of Presentation
      茨城
    • Data Source
      KAKENHI-PROJECT-20241034
  • [Presentation] 「STMを用いたSi (111) 7x7 表面上の4, 4"-diamino-p-terphenylの観察」2008

    • Author(s)
      西村 高志、板橋 敦、村田 英幸、富取 正彦、新井 豊子
    • Organizer
      応用物理学会
    • Place of Presentation
      日本大学
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Presentation] Si(111) 7x7表面上に室温蒸着した4, 4"-diamino-p-terphenylの熱処理効果2008

    • Author(s)
      西村高志,板橋敦,笹原亮,村田英幸,新井豊子,富取正彦
    • Organizer
      第69回応用物理学会学術講演会
    • Place of Presentation
      愛知
    • Year and Date
      2008-09-02
    • Data Source
      KAKENHI-PROJECT-20241034
  • [Presentation] 走査型プローブ顕微鏡技術によるナノスケールの物性計測と操作2008

    • Author(s)
      富取正彦
    • Organizer
      日本顕微鏡学会第52回シンポジウム
    • Place of Presentation
      千葉大学、千葉
    • Year and Date
      2008-10-17
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Presentation] Scanning tunneling microscopy observation of 4,4'-dianoino-p-terphenyl on Si(111)7x7 (in Japanese)2008

    • Author(s)
      T. Nishimura, A. Itabashi, H. Murata, T. Arai, M. Tomitori
    • Organizer
      Meeting of the Japan Society of Applied Physics
    • Place of Presentation
      Nihon Univ. Funabashi, Japan
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] STMを用いたSi(111)7x7表面上の4,4"-diamino-p-terphenylの観察2008

    • Author(s)
      西村 高志、板 橋敦、村田 英幸、富取 正彦、新井 豊子
    • Organizer
      応用物理学会
    • Place of Presentation
      千葉、日本大学
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Surface electron spectroscopy based on nc-AFM with changing bias voltage2008

    • Author(s)
      T.Arai, S.Kushida, K.Kiyohara, M.Tomitori
    • Organizer
      11th international conference on noncontact atomic force microscopy
    • Place of Presentation
      Hotel Rafael Atocha, (Spain)
    • Year and Date
      2008-09-16
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Presentation] Current-Voltage Characteristics with Staircases of a Si Point Contact between a Si Tip and a Si Substrate2008

    • Author(s)
      Arai, T., Kiyohara, K., Kushida, S., Tomitori, M.
    • Organizer
      International Conference on Nanoscience^+Technology(ICN+T 2008)
    • Place of Presentation
      Keystone(USA)
    • Year and Date
      2008-07-20
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Presentation] 走査型プローブ顕微鏡技術によるナノスケールの物性計測と操作2008

    • Author(s)
      富取正彦
    • Organizer
      日本顕微鏡学会 第52回シンポジウム
    • Place of Presentation
      千葉大学
    • Year and Date
      2008-10-17
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Presentation] STMを用いたSi(111)7x7表面上の4,4''-Ddiamino-p-Tterphenylの観察2008

    • Author(s)
      西村高志, 板橋 敦, 村田英幸, 富取正彦, 新井豊子
    • Organizer
      第55回応用物理学関連連合講演会
    • Place of Presentation
      日本大学船橋キャンパス千葉
    • Year and Date
      2008-03-28
    • Data Source
      KAKENHI-PROJECT-18041007
  • [Presentation] 走査型プローブ顕微鏡技術によるナノスケールの物性計測と操作2008

    • Author(s)
      富取正彦
    • Organizer
      日本顕微鏡学会第52回シンポジウム
    • Place of Presentation
      千葉大学(千葉県)
    • Year and Date
      2008-10-17
    • Data Source
      KAKENHI-PROJECT-20246012
  • [Presentation] Si (111)7×7表面上に室温蒸着した4, 4"-diamino-p-terphenylの熱処理効果2008

    • Author(s)
      西村高志, 板橋敦, 笹原亮, 村田英幸, 新井豊子, 富取正彦
    • Organizer
      第69回応用物理学会学術講演会
    • Place of Presentation
      愛知
    • Data Source
      KAKENHI-PROJECT-20241034
  • [Presentation] Surface electron spectroscopy based on nc-AFM with changing bias voltage2008

    • Author(s)
      Arai, T., Kushida, S., Kiyohara, K., Tomitori, M.
    • Organizer
      11th international conference on noncontact atomic force microscopy(ncAFM2008)
    • Place of Presentation
      Hotel Rafael Atocha, Madrid(Spain)
    • Year and Date
      2008-09-16
    • Data Source
      KAKENHI-PROJECT-20310058
  • [Presentation] STM and XPS Studies of 4, 4'-diamino-p-terpehney adsorbed on Si(111)-(7x7)2008

    • Author(s)
      T. Nishimura, A. Itabashi, A. Sasahara, H. Murata, and M. Tomitori
    • Organizer
      International Conference on Nanoscience+Technology
    • Place of Presentation
      Colorado, USA
    • Year and Date
      2008-07-20
    • Data Source
      KAKENHI-PROJECT-20241034
  • [Presentation] シリコン基板に直接化学結合したπ共役系分子の形成2007

    • Author(s)
      板橋 敦, 中山智裕, 新井豊子, 富取正彦、村田英幸
    • Organizer
      第54回応用物理学会 学術講演会
    • Place of Presentation
      北海道工業大学、札幌
    • Data Source
      KAKENHI-PROJECT-18041007
  • [Presentation] Scanning tunneling microscopy observation of 4,4'-diamino-p-terphenyl on Si(111)7x7 at room temperature2007

    • Author(s)
      T. Nishimura, A. Itabashi, H. Murata, T. Arai, M. Tomitori
    • Organizer
      JAIST International Symposium on Nano Technology 2007
    • Place of Presentation
      JAIST, Japan
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Control of AFM tip apexes and bias-voltage nanomechanical spectroscopy(in Japanese)2007

    • Author(s)
      M. Tomitori
    • Organizer
      Workshop of the JSPS 141st committee of micro beam analysis
    • Place of Presentation
      lshikawa Ongakudo, Kanazawa, Japan
    • Year and Date
      2007-05-16
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Fabrication of it -conjugated molecule sysytem directly bound to Si substrate (in Japanese)2007

    • Author(s)
      A. Itabashi, T. Nakayama, T. Arai, M. Tomitori, H. Murata
    • Organizer
      Meeting of the Japan Society of Applied Physics
    • Place of Presentation
      Hokkaido Institute of Technology, Univ., Sapporo, Japan
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Development I of high resolution FM atomic force microscopy operated in air or liquid (in Japanese)2007

    • Author(s)
      M. Ohta, K. Watanabe, R. Kokawa, K. Kobayashi, H. Yamada, M. Abe, S. Morita, M. Tomitori, H. Onishi, T. Arai
    • Organizer
      Meeting of the Japan Society of Applied Physics
    • Place of Presentation
      Hokkaido Institute of Technology, Univ., Sapporo, Japan
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Scanning tunneling microscopy observation of 4,4'-diamino-P-telphenyl on Si (111) 7x7 at room temperature2007

    • Author(s)
      T. Nishimura, A. Itabashi, H. Murata, T. Arai, M. Tomitori
    • Organizer
      JAIST International Symposium on Nano Technology 2007
    • Place of Presentation
      JAIST (石川県)
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Presentation] Nanoscale manipulation and characterization using STM-based instruments(Key note)2007

    • Author(s)
      M. Tomitori
    • Organizer
      ICCE 15
    • Place of Presentation
      Haikou, China
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Surface electron spectroscopy using scanning probe microscopy from field-emission to force interaction under a tip-sample bias voltage(lnvited)2007

    • Author(s)
      M.Tomitori, T.Arai and M.Hirade
    • Organizer
      MRS Fall Meeting
    • Place of Presentation
      Boston,USA
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] ペンシル型走査型プローブ顕微鏡を用いた探針成長の"その場"SEM観察2007

    • Author(s)
      大久保 芳彦、谷 正安、松村 浩司、新井 豊子、富取 正彦
    • Organizer
      日本顕微鏡学会学術講演会
    • Place of Presentation
      新潟、朱鷺メッセ
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] In situ SEM observation of tip growth with a pencil-type SPM (in Japanese)2007

    • Author(s)
      Y. Ookubo, M. Tani, K. Matsumura, T. Arai, M. Tomitori
    • Organizer
      Meeting of the Japan Society of Applied Physics
    • Place of Presentation
      Aoyama Gakuin Univ., Sagamihara, Japa
    • Year and Date
      2007-03-29
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Surface electron spectroscopy using scanning probe microscopy from field-emission to force interaction under a tip-sample bias voltage(invited)2007

    • Author(s)
      M. Tomitori
    • Organizer
      MRS fall meeting
    • Place of Presentation
      Boston, USA
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Nanoscale manipulation and characterization using SPM-based instruments(lnvited,keynote)2007

    • Author(s)
      M.Tomitori, Y.Ookubo, M.Tani and T.Ara
    • Organizer
      The Fifteenth International Conference on Composites/Nano Engineering(ICCE-15)
    • Place of Presentation
      Hainan,China
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Surface electron spectroscopy using scanning probe microscopy from field-emission to force interaction under a tip-sample bias voltage (invited)2007

    • Author(s)
      M. Tomitori
    • Organizer
      MRS fall meeting
    • Place of Presentation
      Boston, USA
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Scanning tunneling microscopy observation of 4,4'-diamino-p-terphenyl on Si(1111)7x7 at room temperature2007

    • Author(s)
      Takashi Nishimura, Atsushi Itabashi, Hideyuki Murata, Toyoko Arai Masahiko Tomitori
    • Organizer
      1st International Symposium on Ultimate Stability of Nano-structured Polymers and Composites
    • Place of Presentation
      石川ハイテク交流センター石川
    • Year and Date
      2007-10-11
    • Data Source
      KAKENHI-PROJECT-18041007
  • [Presentation] Nanoscale manipulation and characterization using pencil-type SPM combined with an ultrahigh-resolution field-emission SEM2007

    • Author(s)
      H.Tsuneishi, Y.Ookubo, M.Tani, T.Arai, M.Tomitori
    • Organizer
      JAIST International Symposium on Nano Technology 2007
    • Place of Presentation
      Ishikawa,JAIST
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] STM study of 4,4'-diamino-p-terphenyl on Si (111) 7x72007

    • Author(s)
      T. Nishimura, A. ltabashi, H. Murata, T. Arai, M. Tomitori
    • Organizer
      ICSPM 15
    • Place of Presentation
      Atagawa
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Presentation] Nanoscale manipulation and characterization using SPM-based instruments (invited, keynote)2007

    • Author(s)
      M. Tomitori, Y. Ookubo, M. Tani, T. Arai
    • Organizer
      ICCE 15
    • Place of Presentation
      Haikou, China
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Nanoscale manipulation and characterization using pencil-type SPM combined with an ultrahigh-resolution field-emission SEM2007

    • Author(s)
      H. Tsuneishi, Y. Ookubo, M. tani, T. Arai, M. Tomitori
    • Organizer
      JAIST international symposium on Nano Technology 2007
    • Place of Presentation
      JAIST (石川県)
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Presentation] Nanoscale manipulation and characterization using pencil-type SPM combined with an ultrahigh-resolution field-emission SEM2007

    • Author(s)
      H. Tsuneishi, Y. Ookubo, M. Tani, T. Arai, M. Tomitori
    • Organizer
      JAIST International Symposium on Nano Technology 2007
    • Place of Presentation
      JAIST, Japan
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] シリコン基板に直接結合したπ共役系分子の形成2007

    • Author(s)
      板 橋敦、中山 智祐、新井 豊子、富取 正彦、村田 英幸
    • Organizer
      応用物理学会
    • Place of Presentation
      札幌、北海道工業大学
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] STM study of 4,4'-diamino-p-terphenyl on Si(111)7x72007

    • Author(s)
      T.Nishimura, A.Itabashi, H.Murata, T.Arai, M.Tomitori
    • Organizer
      ICSPM 15
    • Place of Presentation
      Atagawa,Japan
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Scanning tunneling microscopy observation of 4,4'-diamino-p-terphenyl on Si(111)7x7at room temperature2007

    • Author(s)
      T.Nishimura, A.Itabashi, H.Murata, T.Arai, M.Tomitori
    • Organizer
      JAIST International Symposium on Nano Technology 2007
    • Place of Presentation
      Ishikawa,JAIST
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] In situ observation by a an ultra-high resolution SEM combined with a pencil-type SPM (in Japanese)2007

    • Author(s)
      Y. Oolcubo, M. Tani, K. Matsumura, T. Arai, M. Tomitori
    • Organizer
      Annual meeting of the Japanese Society of Microscopy
    • Place of Presentation
      Told Messe, Niigata, Japan
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] 「ペンシル型走査型プローブ顕微鏡を用いた探針成長の"その場"SEM観察」2007

    • Author(s)
      大久保 芳彦、谷 正安、松村 浩司、新井 豊子、富取 正彦
    • Organizer
      日本顕微鏡学会 学術講演会
    • Place of Presentation
      新潟、朱鷺ヌツセ
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Presentation] Present state, and future prospects of STM, AFM and NSOM(in Japanese)2006

    • Author(s)
      M. Tomitori, Y. Sugawara, T. Saeki
    • Organizer
      Meeting of the Japan Society of Applied Physics
    • Place of Presentation
      Musashi Institute of Technology, T
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Consideration of bias-voltage force curve and Kelvin force(in Japanese)2006

    • Author(s)
      M. Tomitori
    • Organizer
      Workshop of SPM session of the Japanese Society of Microscopy
    • Place of Presentation
      Kyoto Campus Plaza, Kyoto, Japan
    • Year and Date
      2006-12-12
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Attaching aromatic molecules to the Si(111) surfaces via conjugated bond2006

    • Author(s)
      H. Murata, A. Itabashi, T. Arai, M. Tomitori
    • Organizer
      10th ISSP International Symposium on Nanoscience at Surfaces (ISSP-10)
    • Place of Presentation
      Kashiwa, Japan
    • Year and Date
      2006-10-19
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] In situ tip treatments for nano scale observation and characterization with scanning probe microscopy2006

    • Author(s)
      M. Tomitori, Z.A. Ansari, T. Arai
    • Organizer
      ICN+T 2006
    • Place of Presentation
      Basel, Switzerland
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Noncontact Atomic Force Microscopy/ spectroscopy with Changing Bias Voltage for Interaction Analysis between Two Bodies2006

    • Author(s)
      M. Tomitori
    • Organizer
      11th International Ceramics Congress (CIMTEC2006)
    • Place of Presentation
      Sicily, Italy
    • Year and Date
      2006-06-06
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Presentation] In situ tip treatments for nano scale observation and characterization with scanning probe microscopy2006

    • Author(s)
      M. Tomitori
    • Organizer
      ICN+T2006
    • Place of Presentation
      Basel, Switzerland
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Measurements of interaction force and current between a clean Si tip and a Si surface by bias-voltage noncontact atomic force spectroscopy(in Japanese)2006

    • Author(s)
      T. Arai, M. Tomitori
    • Organizer
      Meeting of the Japan Society of Applied Physics
    • Place of Presentation
      Musashi Institute of Technology, Tok
    • Year and Date
      2006-03-25
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] In Situ Tip Treatments for Nano Scale Observation and Characterization with Scanning Probe Microscopy2006

    • Author(s)
      富取 正彦
    • Organizer
      International Conference on Nanoscience and Technology(ICN+T2006)
    • Place of Presentation
      Basel, Switzerland
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Presentation] Noncontact Atomic Force Microscopy/spectroscopy with Changing Bias Voltage for Interaction Analysis between Two Bodies2006

    • Author(s)
      富取 正彦
    • Organizer
      11th International Ceramics Congress(CIMTEC2006)
    • Place of Presentation
      Sicily, Italy
    • Year and Date
      2006-06-06
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Presentation] Evaluation of materials and devices by SPM(in Japanese)2006

    • Author(s)
      K. Sueoka, S. Hasegawa, M. Tomitori, H. Usuda, H. Onishi, A. Ikai, K. Nakajima
    • Organizer
      Meeting of the Japan Society of Applied Physics
    • Place of Presentation
      Musashi Institute of Technology, T
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Noncontact atomic force microscopy/spectroscopy with changing bias voltage for interaction analysis between two bodies(invited)2006

    • Author(s)
      M. Tomitori
    • Organizer
      11th International Ceramics Congress(CIMTEC2006)
    • Place of Presentation
      Sicily, Italy
    • Year and Date
      2006-06-06
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Measurements of interaction force and conductance in proximity by noncontact atomic force spectroscopy(in Japanese)2006

    • Author(s)
      T. Arai, M. Tomitori
    • Organizer
      Meeting of the Physical Society of Japan
    • Place of Presentation
      Ehime Univ., Matsuyama, Japan
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] In Situ Tip Treatments for Nano Scale Observation and Characterization with Scanning Probe Microscopy2006

    • Author(s)
      M. Tomitori
    • Organizer
      International Conference on Nanoscience and Technology (ICN+T2006)
    • Place of Presentation
      Basel, Switzerland
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Presentation] AFM探針先端制御と電圧印加ナノ力学分光2006

    • Author(s)
      富取 正彦
    • Organizer
      マイクロビームアナリシス第141委員会 研究会
    • Place of Presentation
      石川県音楽堂、金沢
    • Year and Date
      2006-05-16
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] STM, AFM, NSOMの現状と将来2006

    • Author(s)
      富取 正彦
    • Organizer
      応用物理学会
    • Place of Presentation
      武蔵工業大学
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Noncontact atomic force microscopy/ spectroscopy with changing bias voltage for interaction analysis between Two bodies2006

    • Author(s)
      M. Tomitori
    • Organizer
      11 th International Ceramics Congress (CIMTEC2006)
    • Place of Presentation
      Sicily, Italy
    • Year and Date
      2006-06-06
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] π-conjugated molecules directly attached to Si(111) surface2006

    • Author(s)
      H. Murata, A. Itabashi, T. Arai, M. Tomitori
    • Organizer
      Electronic Structure and Processes of Molecular-Based Interfaces : In Relation to Organic and Molecular Devices (ESPMI 06)
    • Place of Presentation
      Nagoya, Japan
    • Year and Date
      2006-03-03
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Nanoscale force interaction and conductance measurements using bias-voltage nc-AFM/S2006

    • Author(s)
      T. Arai, M. Tomitori
    • Organizer
      ICN+T 2006
    • Place of Presentation
      Basel, Switzerland
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] 電圧印加フォーススペクトルとケルビンカの考察2006

    • Author(s)
      富取 正彦
    • Organizer
      日本顕微鏡学会 SPM分科会研究会
    • Place of Presentation
      京都キャンパスプラザ
    • Year and Date
      2006-12-12
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] 原子間力顕微鏡の探針先端制御と電圧印加ナノ力学分光2005

    • Author(s)
      富取 正彦
    • Organizer
      日本顕微鏡学会
    • Place of Presentation
      エポカルつくば、茨城
    • Year and Date
      2005-06-01
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Vertically aligned it-conjugated molecules directly attached to silicon surface via covalent bond2005

    • Author(s)
      A. Itabashi, T. Arai, M. Tomitori, H. Murata
    • Organizer
      JAIST International Symposium on Nanotechnology 2005
    • Place of Presentation
      JAIST, Japan
    • Year and Date
      2005-09-15
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Cotnrol of an AFM tip apex and bias-voltage nanomechanical force spectroscopy (in Japanese)2005

    • Author(s)
      M. Tomitori, T. Arai
    • Organizer
      Meeting of the Japanese Society of Microscopy
    • Place of Presentation
      Epocal Tsukuba, Tsulcuba, Japan
    • Year and Date
      2005-06-01
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] 原子間力顕微鏡の探針先端制御と電圧印加ナノ力学分光2005

    • Author(s)
      富取 正彦
    • Organizer
      日本顕微鏡学会第61回学術講演会
    • Place of Presentation
      つくば
    • Year and Date
      2005-06-01
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17310069
  • [Presentation] ティップサイエンス-実験系から-2005

    • Author(s)
      富取 正彦
    • Organizer
      ナノプローブテクノロジー学振167委員会 研究会
    • Place of Presentation
      武蔵工業大学
    • Year and Date
      2005-10-19
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] First principles calculation of Joule heat due to displacement current induced between an nc-AFM tip and a sample(in Japanese)2005

    • Author(s)
      M. Tanaka, S. Furuya, T. Arai, M. Tomitori, S. Watanabe
    • Organizer
      Meeting of the Physical Society of Japan
    • Place of Presentation
      Doshisha Univ., Kyotanabe, Japan
    • Year and Date
      2005-09-19
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Bacicscattered electron spectroscopy from Al/Si(111) using a field emission STM (in Japanese)2005

    • Author(s)
      M. Hirade, T. Arai, M. Tomitori
    • Organizer
      Meeting of the Japanese Society of Applied Physics
    • Place of Presentation
      Tokushima Univ., Tokushima, Japan
    • Year and Date
      2005-09-07
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Energy spectra of electrons backscattered from sample surfaces with hetero structures using field emission scanning tunneling microscopy2005

    • Author(s)
      M. Hirade, T. Arai, M. Tomitori
    • Organizer
      13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM05)
    • Place of Presentation
      Sapporo, Japan
    • Year and Date
      2005-07-07
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Tip science from a viewpoint of experiment(in Japanese)2005

    • Author(s)
      M. Tomitori
    • Organizer
      Workshop of the JSPS 167th committee of nanoprobe technology
    • Place of Presentation
      Osaka Univ., Japan
    • Year and Date
      2005-10-19
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Analysis of interaction between a tip and a sample by bias-voltage noncontact atomic force microscopy/spectroscopy(in Japanese)2005

    • Author(s)
      T. Arai, M. Tomitori
    • Organizer
      Meeting of the Physical Society of Japan
    • Place of Presentation
      Doshisha Univ. Kyototanabe, Japan
    • Year and Date
      2005-09-19
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Self-assembled Ge nano-clusters grown on Si(111)-7x7 at elevated temperatures2005

    • Author(s)
      Z. A. Ansari, T. Arai, M. Tomitori
    • Organizer
      13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM05)
    • Place of Presentation
      Sapporo, Japan
    • Year and Date
      2005-07-07
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Spectroscopic measurement of atom-atom interaction force by bias-voltage noncontact AFM (in Japanese)2005

    • Author(s)
      T. Arai, M. Tomitori
    • Organizer
      Meeting of the Japanese Society of Applied Physics
    • Place of Presentation
      Tokushima Univ., Tokushima, Japan
    • Year and Date
      2005-09-08
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Bias-voltage dependence of chemical bonding force detected by noncontact atomic Force microscopy/spectroscopy2005

    • Author(s)
      T. Arai, M. Tomitori
    • Organizer
      13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM05)
    • Place of Presentation
      Sapporo, Japan
    • Year and Date
      2005-07-04
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Electron standing wave analysis in an STM vacuum gap for nano-structure fabrication on Si surfaces2005

    • Author(s)
      M. M. Rahman, K. Yamagishi, T. Arai, M. Tomitori
    • Organizer
      13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM05)
    • Place of Presentation
      Sapporo, Japan
    • Year and Date
      2005-07-05
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17206005
  • [Presentation] Water wettability of Si surfaces prepared in an ultrahigh vacuum chamber

    • Author(s)
      T. Miyagi, A. Sasahara and M. Tomitori,
    • Organizer
      the 22th International Colloquium on Scanning Probe Microscopy ICSPM22
    • Place of Presentation
      Atagawa Heights, Higashiizu, Kamo, Shizuoka
    • Year and Date
      2014-12-11 – 2014-12-13
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] Silicon oxide layers hetero-epitaxially grown on rutile TiO2(110) surfaces observed by non-contact atomic force microscopy in water

    • Author(s)
      L. T. U. Tu, A. Sasahara and M. Tomitori
    • Organizer
      the 17th international conference on non-contact atomic force microscopy
    • Place of Presentation
      Tsukuba International Congress Center, Tsukuba, Ibaraki, Japan
    • Year and Date
      2014-08-04 – 2014-08-08
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] Force spectroscopy of an NH3-reacted Si(111)-(7×7) surface by non-contact AFM with different tip states

    • Author(s)
      T. Arai, Y. Sakano, R. Inamura and M. Tomitori
    • Organizer
      the 22th International Colloquium on Scanning Probe Microscopy ICSPM22
    • Place of Presentation
      Atagawa Heights, Higashiizu, Kamo, Shizuoka
    • Year and Date
      2014-12-11 – 2014-12-13
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] Atomic contrast change of NH3-related Si(111)-7x7 surfaces observed by non-contact atomic force microscopy

    • Author(s)
      T. Arai, Y. Sakano and M. Tomitori
    • Organizer
      the 17th international conference on non-contact atomic force microscopy
    • Place of Presentation
      Tsukuba International Congress Center, Tsukuba, Ibaraki, Japan
    • Year and Date
      2014-08-04 – 2014-08-08
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] 非接触原子間力顕微鏡/力分光法によるNH3反応Si(111)-(7×7)表面上のNH3とH吸着基の識別

    • Author(s)
      坂野友樹、稲村竜、富取正彦、新井豊子
    • Organizer
      第62回応用物理学会春季学術講演会
    • Place of Presentation
      東海大学 湘南キャンパス、神奈川、平塚
    • Year and Date
      2015-03-11 – 2015-03-14
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] Nanoscale capacitive analysis of surface states using a charge amplifier based on non-contact atomic force microscopy

    • Author(s)
      M. Nogami, T. Arai, A. Sasahara, M. Tomitori
    • Organizer
      the 17th international conference on non-contact atomic force microscopy
    • Place of Presentation
      Tsukuba International Congress Center, Tsukuba, Ibaraki, Japan
    • Year and Date
      2014-08-04 – 2014-08-08
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] Atom-resolved FM-AFM imaging of a KBr(001) surface covered with water layers in air with high humidity

    • Author(s)
      T. Arai, M. Koshioka, K. Abe, M. Tomitori, R. Kokawa, M. Ohta, H. Yamada, K. Kobayashi and N. Oyabu
    • Organizer
      the 17th international conference on non-contact atomic force microscopy
    • Place of Presentation
      Tsukuba International Congress Center, Tsukuba, Ibaraki, Japan
    • Year and Date
      2014-08-04 – 2014-08-08
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] 非接触原子間力顕微鏡におけるSi探針上の水素終端膜によるエネルギー散逸量への影響

    • Author(s)
      稲村竜、坂野友樹、富取正彦、新井豊子
    • Organizer
      第62回応用物理学会春季学術講演会
    • Place of Presentation
      東海大学 湘南キャンパス、神奈川、平塚
    • Year and Date
      2015-03-11 – 2015-03-14
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] Sharpening probes towards nanoscale imaging using scanning probe microscopy

    • Author(s)
      M. Tomitori
    • Organizer
      The 1st Malaysia-Japan Joint symposium on Nanotechnology 2014
    • Place of Presentation
      UKM, Bangi, Malaysia
    • Year and Date
      2014-12-10 – 2014-12-11
    • Invited
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] NC-AFMに組み込んだチャージアンプと電流アンプ出力の同時測定

    • Author(s)
      野上真、新井豊子、笹原亮、富取正彦
    • Organizer
      第62回応用物理学会春季学術講演会
    • Place of Presentation
      東海大学 湘南キャンパス、神奈川、平塚
    • Year and Date
      2015-03-11 – 2015-03-14
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] Characterization and fabrication of nanoscale sharpened probes using scanning probe microscopy techniques

    • Author(s)
      M. Tomitori
    • Organizer
      the 9th India Japan Bilateral Conference, BICON-2014
    • Place of Presentation
      Jaipur, India
    • Year and Date
      2014-10-12 – 2014-10-17
    • Invited
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] Change in water wettability under Cassie-Baxter law for SiO2 patched over layers epitaxially grown on a rutile TiO2(110) surface

    • Author(s)
      L. T. U. Tu, A. Sasahara and M. Tomitori
    • Organizer
      the 22th International Colloquium on Scanning Probe Microscopy ICSPM22
    • Place of Presentation
      Atagawa Heights, Higashiizu, Kamo, Shizuoka
    • Year and Date
      2014-12-11 – 2014-12-13
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] 非接触原子間力顕微鏡/力学分光法による微量NH3を反応させたSI(111)-7x7表面電子状態解析

    • Author(s)
      坂野友樹、富取正彦、新井豊子
    • Organizer
      第75回応用物理学会秋期学術講演会
    • Place of Presentation
      北海道大学、北海道、札幌
    • Year and Date
      2014-09-17 – 2014-09-20
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] Photo-induced super-hydrophilicity of SiO2 overlayers epitaxially grown on a rutile TiO2(110) surface

    • Author(s)
      L. T. U. Tu, A. Sasahara and M. Tomitori
    • Organizer
      7th International Workshop on Advanced Materials Science and Nanotechnology, IWAMSN 2014
    • Place of Presentation
      Ha Long City, Vietnam
    • Year and Date
      2014-11-02 – 2014-11-06
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] AFMとXPSを用いたMgO(100)単結晶表面の溶解の解析

    • Author(s)
      笹原亮、村上達也、富取正彦
    • Organizer
      第62回応用物理学会春季学術講演会
    • Place of Presentation
      東海大学 湘南キャンパス、神奈川、平塚
    • Year and Date
      2015-03-11 – 2015-03-14
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] SPM探針への応用に向けたタングステン酸化物の針状結晶成長法

    • Author(s)
      永島一樹、富取正彦、新井豊子
    • Organizer
      第75回応用物理学会秋期学術講演会
    • Place of Presentation
      北海道大学、北海道、札幌
    • Year and Date
      2014-09-17 – 2014-09-20
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] 針が繋ぐナノとマクロの顕微鏡技術 -FIM/SPM/SEM-

    • Author(s)
      富取正彦
    • Organizer
      日本顕微鏡学会第58回シンポジウム
    • Place of Presentation
      九州大学医学部百年講堂、福岡、福岡
    • Year and Date
      2014-11-16 – 2014-11-17
    • Invited
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] 酸化チタン(110)表面上に吸着したパラジクロロベンゼンの原子スケール超高真空走査型トンネル顕微鏡観察

    • Author(s)
      八鍬雄貴、笹原亮、富取正彦
    • Organizer
      平成26年度応用物理学会 北陸・信越支部 学術講演会
    • Place of Presentation
      富山大学 工学部、富山、富山
    • Year and Date
      2014-11-07 – 2014-11-08
    • Data Source
      KAKENHI-PROJECT-24246014
  • [Presentation] NC-AFMに組込んだチャージアンプの出力解析

    • Author(s)
      野上真、新井豊子、笹原亮、富取正彦
    • Organizer
      第75回応用物理学会秋季学術講演会
    • Place of Presentation
      北海道大学、北海道、札幌
    • Year and Date
      2014-09-17 – 2014-09-20
    • Data Source
      KAKENHI-PROJECT-26630330
  • [Presentation] Silicon surfaces etched with atomic hydrogen observed by environmental controlled non-contact atomic force microscopy

    • Author(s)
      T. Miyagai, A. Sasahara, M. Tomitori, R. Kokawa, M. Ohta, H. Yamada, K. Kobayashi and N. Oyabu
    • Organizer
      the 17th international conference on non-contact atomic force microscopy
    • Place of Presentation
      Tsukuba International Congress Center, Tsukuba, Ibaraki, Japan
    • Year and Date
      2014-08-04 – 2014-08-08
    • Data Source
      KAKENHI-PROJECT-24246014
  • 1.  ARAI Toyoko (20250235)
    # of Collaborated Projects: 11 results
    # of Collaborated Products: 0 results
  • 2.  NISHIKAWA Osamu (10108235)
    # of Collaborated Projects: 9 results
    # of Collaborated Products: 0 results
  • 3.  MURATA Hideyuki (10345663)
    # of Collaborated Projects: 6 results
    # of Collaborated Products: 38 results
  • 4.  TAKAYANAGI Kunio (80016162)
    # of Collaborated Projects: 3 results
    # of Collaborated Products: 0 results
  • 5.  西垣 敏 (60126943)
    # of Collaborated Projects: 3 results
    # of Collaborated Products: 0 results
  • 6.  楠 勲 (30025390)
    # of Collaborated Projects: 3 results
    # of Collaborated Products: 0 results
  • 7.  OTSUKA Nobuo (80111649)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 0 results
  • 8.  SASAHARA Akira (40321905)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 37 results
  • 9.  原田 義也 (20013477)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 0 results
  • 10.  TAKAMURA Yukiko (90344720)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 11.  TAKAMURA YUZURU (20290877)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 12.  IKAI Atsushi (50011713)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 13.  ARAKAWA Hideo (80211704)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 14.  KIMURA Yoshinobu (60225076)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 15.  KAWAZU Akira (20010796)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 16.  HASEGAWA Tetsuya (10189532)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 17.  SHIGEKAWA Hidemi (20134489)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 18.  OGAWA Keiichi (00233411)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 19.  IWASAWA Yasuhiro (40018015)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 20.  青野 正和 (10184053)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 21.  上田 一之 (60029212)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 22.  森田 清三 (50091757)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 23.  菅原 康弘 (40206404)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 24.  武笠 幸一 (00001280)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 25.  西 竜治 (40243183)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 26.  中村 勝吾 (50029831)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 27.  大島 義文 (80272699)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 40 results
  • 28.  ISHIKAWA Yuuichi
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 29.  堀内 敬
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 30.  富取 豊子
    # of Collaborated Projects: 0 results
    # of Collaborated Products: 200 results
  • 31.  山田 啓文
    # of Collaborated Projects: 0 results
    # of Collaborated Products: 1 results
  • 32.  小林 圭
    # of Collaborated Projects: 0 results
    # of Collaborated Products: 1 results

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