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Kagoshima Yasushi  篭島 靖

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… Alternative Names

篭島 靖  カゴシマ ヤスシ

KAGOSHIMA Yasushi  篭島 靖

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Researcher Number 10224370
Other IDs
Affiliation (Current) 2025: 兵庫県立大学, 理学研究科, 教授
Affiliation (based on the past Project Information) *help 2021 – 2023: 兵庫県立大学, 理学研究科, 教授
2016 – 2020: 兵庫県立大学, 物質理学研究科, 教授
2012 – 2014: 兵庫県立大学, 物質理学研究科, 教授
2009 – 2011: University of Hyogo, 大学院・物質理学研究科, 教授
2002 – 2003: 姫路工業大学, 大学院・理学研究科, 助教授
1998 – 2003: 姫路工業大学, 理学部, 助教授
Review Section/Research Field
Principal Investigator
Basic Section 80040:Quantum beam science-related / Quantum beam science / Quantum beam science / Quantum beam science
Except Principal Investigator
Radiation science / Electronic materials/Electric materials
Keywords
Principal Investigator
X線顕微鏡 / X線光学 / 放射光 / 回折積分 / 回折限界 / ゾーンプレート / X線顕微鏡 / X線ナノビーム / X線光学 / コンピュータトモグラフィ … More / 空間分解能 / 焦点深度 / X線トモグラフィ / 屈折レンズ / X線レンズ / ビームライン … More
Except Principal Investigator
放射光 / LED / Synchrotron Radiation / X線 / 位相画像 / Refraction contrast imaging / Microfocus X-ray / Ray Tracing method / 拡大イメージング / 拡大撮像 / 微小点光源 / 屈折コントラスト画像 / 微小焦点X線 / レイトレーシング法 / Silicon-on-Insulator Crystal / Semiconductor Laser / Device Characteristics / X-ray Microbeam / Lattice Strain / Semiconductor Substrate / その場測定 / マイクロビーム / 電子デバイス / 局所歪み / 薄膜 / SOI / ゾーンプレート / 円筒ミラー / 非対称ブラッグ反射 / SOI結晶 / 半導体レーザー / デバイス特性 / X線マイクロビーム / 格子歪み / 半導体基板 / Hard X-rays / imaging / collimator / 形態測定 / X線天文学 / SPring-8 / フーリエ変換法 / 生体測定 / スダレコリメーター / 硬X線 / イメージング / コリメータ / phase image / refraction contrast X-ray image / synchrotron radiation / 屈折コントラスト法 Less
  • Research Projects

    (9 results)
  • Research Products

    (40 results)
  • Co-Researchers

    (14 People)
  •  X線用深焦点ゾーンプレートの原理実証と深焦点内波動伝播結像シミュレーションPrincipal Investigator

    • Principal Investigator
      篭島 靖
    • Project Period (FY)
      2023 – 2025
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Review Section
      Basic Section 80040:Quantum beam science-related
    • Research Institution
      University of Hyogo
  •  Practical design of the Inverse-Phase Composite Zone Plate for achieving better performance than diffraction limitPrincipal Investigator

    • Principal Investigator
      Kagoshima Yasushi
    • Project Period (FY)
      2019 – 2022
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Review Section
      Basic Section 80040:Quantum beam science-related
    • Research Institution
      University of Hyogo
  •  Proposal for a transmission-grating-type focusing device achieving better performance than diffraction limit and its numerical simulationPrincipal Investigator

    • Principal Investigator
      Kagoshima Yasushi
    • Project Period (FY)
      2016 – 2018
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Quantum beam science
    • Research Institution
      University of Hyogo
  •  Production of high-flux pink nano-beam by x-ray circular multilayer zone platePrincipal Investigator

    • Principal Investigator
      KAGOSHIMA Yasushi
    • Project Period (FY)
      2012 – 2014
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Quantum beam science
    • Research Institution
      University of Hyogo
  •  Development of weak focusing optical devise for synchrotron radiation X-raysPrincipal Investigator

    • Principal Investigator
      KAGOSHIMA Yasushi
    • Project Period (FY)
      2009 – 2011
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Quantum beam science
    • Research Institution
      University of Hyogo
  •  Study of medical imaging of X-ray minute point source using synchrotron radiation

    • Principal Investigator
      YAMASAKI Katsuhito
    • Project Period (FY)
      2002 – 2003
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Radiation science
    • Research Institution
      Japan Synchrotron Radiation Research institute
  •  In-Situ Measurement of Local Crystal Strain Under Device Operation by Highly Parallel X-ray Microbeam.

    • Principal Investigator
      MATSUI Junji
    • Project Period (FY)
      2001 – 2003
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Electronic materials/Electric materials
    • Research Institution
      Himeji Institute of Technology
  •  Sudare Collimator Imaging Using Synchrotron Radiation

    • Principal Investigator
      SUGIMURA Kazuro
    • Project Period (FY)
      2000 – 2001
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Radiation science
    • Research Institution
      Kobe University
  •  Research on the refraction-enhanced imaging using synchrotron radiation

    • Principal Investigator
      YAMASAKI Katsuhito
    • Project Period (FY)
      1998 – 1999
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Radiation science
    • Research Institution
      Kobe University

All 2024 2022 2021 2020 2019 2018 2017 2014 2012 2011 2010 2003 2002 2001 Other

All Journal Article Presentation Book Patent

  • [Book] X線マイクロビームを用いた局所領域微量ひずみの検出2003

    • Author(s)
      松井純爾, 篭島靖, 津坂佳幸, 木村滋
    • Publisher
      応用物理学会
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-13555096
  • [Book] 第145回委員会研究会資料2001

    • Author(s)
      松井純爾, 篭島靖, 津坂佳幸, 横山和司
    • Publisher
      日本学術振興会
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-13555096
  • [Book] 第135回 X線材料強度部門委員会資料2001

    • Author(s)
      松井純爾, 篭島靖, 津坂佳幸, 横山和司
    • Publisher
      日本材料学会
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-13555096
  • [Journal Article] Inverse-phase composite zone plate providing deeper focus than the normal diffraction-limited depth of X-ray microbeams2019

    • Author(s)
      Kagoshima Yasushi、Takayama Yuki
    • Journal Title

      Journal of Synchrotron Radiation

      Volume: 26 Issue: 1 Pages: 52-58

    • DOI

      10.1107/s1600577518016703

    • Peer Reviewed / Open Access
    • Data Source
      KAKENHI-PROJECT-16K05019
  • [Journal Article] Proposal for Inverse-Phase Composite Zone Plate for Deeper Depth of Focus2018

    • Author(s)
      Kagoshima Yasushi、Takayama Yuki
    • Journal Title

      Microscopy and Microanalysis

      Volume: 24 Issue: S2 Pages: 280-281

    • DOI

      10.1017/s1431927618013739

    • Peer Reviewed / Open Access
    • Data Source
      KAKENHI-PROJECT-16K05019
  • [Journal Article] Point spread function measurement of an X-ray beam focused by a multilayer zone plate with narrow annular aperture2014

    • Author(s)
      H. Takano, S. Konishi, T. Koyama, Y. Tsusaka, S. Ichimaru, T. Ohchi, H. Takenaka and Y. Kagoshima
    • Journal Title

      Journal of Synchrotron Radiation

      Volume: 21 Pages: 446-448

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-24510125
  • [Journal Article] Estimation of Bonded Silicon-on-Insulator Wafers by Means of Diffractometry Using a Parallel X-Ray Microbeam2003

    • Author(s)
      Y.Tsusaka, M.Urakawa, K.Yokoyama, S.Takeda, M.Katou, H.Kurihara, F.Yoshida, K.Watanabe, Y.Kagoshima, J.Matsui
    • Journal Title

      Nucl. Instrum. & Methods B199

      Pages: 19-22

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-13555096
  • [Journal Article] Measurement of Minute Local Strain in Semiconductor Material and Electronic Devices by Using a Highly-Parallel X-ray Microbeam2003

    • Author(s)
      J.Matsui, Y.Tsusaka, K.Yokoyama, S Takeda, M.Katou, H.Kurihara, K.Watanabe, Y.Kagoshima, S.Kimura
    • Journal Title

      Nucl. Instrum. & Methods B199

      Pages: 15-18

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-13555096
  • [Journal Article] Estimation of Bonded Silicon-on-Insulator Wafers by Means of Diffractometry Using a Parallel X-Ray Microbeam2003

    • Author(s)
      Y.Tsusaka, M.Urakawa, K.Yokoyama, S.Takeda, M.Katou, H.Kurihara, F.Yoshida, K.Watanabe, Y.Kagoshima, J.Matsui
    • Journal Title

      Nucl.Instrum.& Methods B199

      Pages: 19-22

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-13555096
  • [Journal Article] Measurement of Minute Local Strain in Semiconductor Materials and Electronic Devices by Using a Highly Parallel X-ray Microbeam2003

    • Author(s)
      J.Matsui, Y.Tsusaka, K.Yokoyama, S.Takeda, M.Katou, H.Kurihara, K.Watanabe, Y.Kagoshima, S.Kimura
    • Journal Title

      Nucl.Instrum.& Methods B199

      Pages: 15-18

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-13555096
  • [Journal Article] Measurement of Strain Distribution in InGaAsP Selective-Area Growth Layers Using a Micro-Area X-ray Diffraction Method with a Sub-mm Spatial Resolution2002

    • Author(s)
      S.Kimura, Y.Kagoshima, K.Kobayashi, K.Izumi, Y.Sakata, S.Sudo, K.Yokoyama, T.Niimi, Y.Tsusaka, J.Matsui
    • Journal Title

      Japan.J.Appl.Phys. 41

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-13555096
  • [Journal Article] Evaluation of Lattice Strain in Silicon Substrate Beneath Alminum Conductor Film Using High-Resolution X-Ray Microbeam Diffractometry2002

    • Author(s)
      K.Yokoyama, H.Kurihara, S.Takeda, M.Yrakawa, K.Watanabe, M.Katou, N.Inoue, N.Miyamoto, Y.Tsusaka, Y.Kagoshima, J.Matsui
    • Journal Title

      Japan.J.Appl.Phys. 41

      Pages: 6094-6097

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-13555096
  • [Journal Article] Microscopic Strain Analysis of Semiconductor Crystals Using a Synchrotron X-ray Microbeam2002

    • Author(s)
      J.Matsui, Y.Tsusaka, K.Yokoyama, S.Takeda, M.Urakawa, Y.Kagoshima, S.Kimura
    • Journal Title

      J.Crystal Growth 237-239

      Pages: 317-323

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-13555096
  • [Journal Article] Evaluation of Lattice Strain In Silicon Substrate Beneath Aluminum Conductor Film Using High-Resolution X-Ray Microbeam Diffactometry2002

    • Author(s)
      K.Yokoyama, H.Kurihara, S.Takeda, M.Urakawa, K.Watanabe, M.Katou, N.Inoue, N.Miyamoto, Y.Tsusaka, Y.Kagoshima, J.Matsui
    • Journal Title

      Japan. J. Appl. Phys. 41

      Pages: 6094-6097

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-13555096
  • [Journal Article] Measurement of Strain Distribution in InGaAsP Selective-Area Growth Layers Using a Micro-Area X-ray Diffraction Method with a Sub-mm Spatial Resolution2002

    • Author(s)
      S.Kimura, Y.Kagoshima, K.Kobayashi, K.Izumi, Y.Sakata, S.Sudo, K.Yokoyama, T.Niimi, Y.Tsusaka, J.Matsui
    • Journal Title

      Japan. J. Appl. Phys. 41

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-13555096
  • [Journal Article] Microscopic strain Analysis of Semiconductor Crystals Using a Synchrotron X-ray Microbeam2002

    • Author(s)
      J.Matsui, Y.Tsusaka, K.Yokoyama, S.Takeda, M.Urakawa, Y.Kagoshima, S.Kimura
    • Journal Title

      J. Crystal Growth 237-239

      Pages: 317-323

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-13555096
  • [Journal Article] Hyogo Beamline at Spring-8 : Multiple Station Beamline with the TROIKA concept2001

    • Author(s)
      Y.Tsusaka, K.Yokoyama, K.Takai, S.Takeda, Y.Kagoshima, J.Matusi
    • Journal Title

      Nucl. Instrum & Methods A467-468

      Pages: 670-673

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-13555096
  • [Journal Article] Rocking Curve Measurement of Infrared LEDs Using Highly Parallel X-ray Microbeam2001

    • Author(s)
      S.Takeda, K.Yokoyama, M.Urakawa, T.Ibuki, K.Takai, Y.Tsusaka, Y.Kagoshima, J.Matsui, N.Miyamoto
    • Journal Title

      Nucl. Instrum & Methods A467-468

      Pages: 974-977

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-13555096
  • [Journal Article] Rocking Curve Measurement of Infrared LEDs Using Highly Parallel X-ray Microbeam2001

    • Author(s)
      S.Takeda, K.Yokoyama, M.Urakawa, T.Ibuki, K.Takai, T.Tsusaka, Y.Kagoshima, J.Matsui, N.Miyamoto
    • Journal Title

      Nucl.Instrum & Methods A467-468

      Pages: 974-977

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-13555096
  • [Journal Article] Hyogo Beamline at SPring-8: Multiple Station Beamline with the TROIKA Concept2001

    • Author(s)
      Y.Tsusaka, K.Yokoyama, K.Takai, S.Takeda, Y.Kagoshima, J.Matsui
    • Journal Title

      Nucl.Instrum & Methods A467-468

      Pages: 670-673

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-13555096
  • [Journal Article] Study of Local Strain Distribution in Semiconductor Devices Using High-Resolution X-ray Microbeam Diffractometry2001

    • Author(s)
      K.Yokoyama, S Takeda, M.Urakawa, Y.Tsusaka, Y.Kagoshima, J.Matsui, S.Kimura, H.Kimura, K.Kobayashi, T.Ohhira, K.Izumi, J.Matsui
    • Journal Title

      Nucl. Instrum & Methods A467-468

      Pages: 1205-1208

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-13555096
  • [Journal Article] X-ray Phase-Contrast Imaging with Submicron Resolution by Using Extremely Asymmetric Bragg Diffractions2001

    • Author(s)
      K.Kobayashi, K.Izumi, H.Kimura, S.Kimura, T.Ibuki, K.Yokoyama, Y.Tsusaka, Y.Kagoshima, J.Matsui
    • Journal Title

      Appl.Phys.Letters 78

      Pages: 132-134

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-13555096
  • [Journal Article] Study of Local Strain Distribution in Semiconductor Devices Using High-Resolution X-ray Microbeam Diffractometry2001

    • Author(s)
      K.Yokoyama, S.Takeda, M.Urakawa, Y.Tsusaka, Y.Kagoshima, J.Matsui, S.Kimura, H.Kimura, K.Kobayashi, T.Ohhira, K.Izumi, N.Miyamoto
    • Journal Title

      Nucl.Instrum & Methods A467-468

      Pages: 1205-1208

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-13555096
  • [Patent] X線屈折方法2011

    • Inventor(s)
      篭島靖
    • Industrial Property Rights Holder
      兵庫県
    • Industrial Property Number
      2011-034166
    • Filing Date
      2011-02-21
    • Data Source
      KAKENHI-PROJECT-21604006
  • [Patent] X線屈折方法2010

    • Inventor(s)
      篭島靖
    • Industrial Property Rights Holder
      兵庫県
    • Industrial Property Number
      2010-078858
    • Filing Date
      2010-03-30
    • Data Source
      KAKENHI-PROJECT-21604006
  • [Presentation] X線用コンポジットゾーンプレートの結像特性シミュレーション2024

    • Author(s)
      千原 直也、篭島 靖
    • Organizer
      第37回日本放射光学会年会・放射光科学合同シンポジウム
    • Data Source
      KAKENHI-PROJECT-23K11705
  • [Presentation] ディープフォーカスゾーンプレートの結像シミュレーション2022

    • Author(s)
      篭島 靖、高山 裕貴
    • Organizer
      第35回日本放射光学会年会・放射光科学合同シンポジウム
    • Data Source
      KAKENHI-PROJECT-19K12630
  • [Presentation] Practical Design of the Inverse-Phase Composite Zone Plate for Improved Depth of Focus2022

    • Author(s)
      Y. Kagoshima and Y. Takayama
    • Organizer
      XRM2022, 15th International Conference on X-Ray Microscopy, June 19-24, 2022.
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-19K12630
  • [Presentation] 軟X線顕微鏡用ディープフォーカスゾーンプレートの設計と集光特性2021

    • Author(s)
      ○藤井 綾香,高山 裕貴,篭島 靖
    • Organizer
      Optics & Photonics Japan 2021
    • Data Source
      KAKENHI-PROJECT-19K12630
  • [Presentation] ディープフォーカスゾーンプレートの実用設計2020

    • Author(s)
      篭島 靖、高山裕貴
    • Organizer
      第32回日本放射光学会年会・放射光科学合同シンポジウム
    • Data Source
      KAKENHI-PROJECT-19K12630
  • [Presentation] Practical Designing of Inverse-Phase Composite Zone Plate for Deeper Depth of Focu2019

    • Author(s)
      Y. Kagoshima and Y. Takayama
    • Organizer
      The 15th Symposium of Japanese Research Community on X-ray Imaging Optics
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-19K12630
  • [Presentation] ディープフォーカスゾーンプレートの提案(2)2019

    • Author(s)
      篭島 靖、高山 裕貴
    • Organizer
      第32回日本放射光学会年会・放射光科学合同シンポジウム
    • Data Source
      KAKENHI-PROJECT-16K05019
  • [Presentation] ディープフォーカスゾーンプレートの提案2018

    • Author(s)
      篭島 靖
    • Organizer
      第31回日本放射光学会年会・放射光科学合同シンポジウム
    • Data Source
      KAKENHI-PROJECT-16K05019
  • [Presentation] Proposal for Inverse-Phase Composite Zone Plate for Deeper Depth of Focus2018

    • Author(s)
      Y. Kagoshima and Y. Takayama
    • Organizer
      XRM2018, 14th International Conference on X-Ray Microscopy
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-16K05019
  • [Presentation] ディープフォーカスゾーンプレートの提案2017

    • Author(s)
      篭島 靖
    • Organizer
      第13回X線結像光学シンポジウム
    • Data Source
      KAKENHI-PROJECT-16K05019
  • [Presentation] 硬 X 線多層膜ゾーンプレートの作製及び評価2014

    • Author(s)
      角田和浩、廣友稔樹、小山貴久、小西繁樹、作花賢治、松村篤恭、高野秀和、津坂佳幸、篭島 靖、市丸 智、大知渉之、竹中久貴
    • Organizer
      第27回日本放射光学会年会・放射光科学合同シンポジウム
    • Place of Presentation
      広島国際会議場(広島県広島市)
    • Data Source
      KAKENHI-PROJECT-24510125
  • [Presentation] 放射光X線ビームライン用粗集光素子の開発2012

    • Author(s)
      篭島靖, 高野秀和, 竹田晋吾
    • Organizer
      第25回日本放射光学会年会・放射光科学合同シンポジウム
    • Place of Presentation
      鳥栖市民文化会館・中央公民館(佐賀県)
    • Year and Date
      2012-01-09
    • Data Source
      KAKENHI-PROJECT-21604006
  • [Presentation] 傾斜式微小プリズムアレイX線粗集光素子の開発2011

    • Author(s)
      篭島靖, 高野秀和, 竹田晋吾
    • Organizer
      第11回X線結像光学シンポジウム
    • Place of Presentation
      東北大学(宮城県)
    • Year and Date
      2011-11-04
    • Data Source
      KAKENHI-PROJECT-21604006
  • [Presentation] Hard X-ray multilayer zone plate with 30-nm outermost zone width

    • Author(s)
      Y. Kagoshima, T. Hirotomo, K. Sumida, S. Konishi, H. Takano, T. Koyama, S. Ichimaru, T. Ohchi, H. Takenaka
    • Organizer
      XRM2014, 12th International Conference on X-Ray Microscopy
    • Place of Presentation
      Melbourne, Australian
    • Year and Date
      2014-10-26 – 2014-10-31
    • Data Source
      KAKENHI-PROJECT-24510125
  • [Presentation] 硬 X 線多層膜ゾーンプレートの高空間分解能化

    • Author(s)
      角田和浩、小山貴久、小西繁樹、廣友稔樹、松村篤恭、高野秀和、津坂佳幸、篭島 靖、市丸智、大知渉之、竹中久貴
    • Organizer
      第28回日本放射光学会年会・放射光科学合同シンポジウム
    • Place of Presentation
      立命館大学びわこ・くさつキャンパス(滋賀県草津市)
    • Year and Date
      2015-01-10 – 2015-01-12
    • Data Source
      KAKENHI-PROJECT-24510125
  • 1.  MATSUI Junji (10295751)
    # of Collaborated Projects: 4 results
    # of Collaborated Products: 19 results
  • 2.  SUGIMURA Kazuo (00136384)
    # of Collaborated Projects: 3 results
    # of Collaborated Products: 0 results
  • 3.  YAMASAKI Katsuhito (50210381)
    # of Collaborated Projects: 3 results
    # of Collaborated Products: 0 results
  • 4.  TSUSAKA Yoshiyuki (20270473)
    # of Collaborated Projects: 3 results
    # of Collaborated Products: 20 results
  • 5.  TAKANO Hidekazu (50366548)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 6 results
  • 6.  SHIKATA Yoshihiro (50028114)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 0 results
  • 7.  YAGI Naoto (80133940)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 8.  NEGORO Hitoshi (30300891)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 9.  MAEDA Sakan (50030911)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 10.  MIKOSHIBA Katsuhiko (30051840)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 11.  KIMURA Shigeru (50360821)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 12 results
  • 12.  UMETANI Keiji (50344396)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 13.  足立 秀治 (60159407)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 14.  Takayama Yuki
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 4 results

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