Arai Masayuki 新井雅之

… Alternative Names

ARAI Masayuki 新井雅之

Less

Researcher Number	10336521
Other IDs
External Links
Affiliation (Current)	2025: 日本大学, 生産工学部, 教授
Affiliation (based on the past Project Information) *help	2021 – 2023: 日本大学, 生産工学部, 教授 2019 – 2020: 日本大学, 生産工学部, 准教授 2016 – 2017: 日本大学, 生産工学部, 准教授 2013 – 2015: 日本大学, 生産工学部, 助教 2013: 首都大学東京, システムデザイン学部, 助教 … More 2011 – 2012: 首都大学東京, システムデザイン研究科, 助教 2007 – 2008: 首都大学東京, システムデザイン研究科, 助教 2006: 首都大学東京, システムデザイン研究科, 助手 2005: Tokyo Metropolitan University, Faculty of System Design, Assistant Professor, システムデザイン学部, 助手 2004: 東京都立大学, 工学研究科, 助手 Less
Review Section/Research Field	Principal Investigator Basic Section 60040:Computer system-related / Power engineering/Power conversion/Electric machinery / Computer system/Network Except Principal Investigator Computer system/Network
Keywords	Principal Investigator クリティカルエリア / 重み付き故障カバレージ / クリティカルエリアサンプリング / 欠陥レベル / ブリッジ故障モデル / LSIテストパターン生成 / LSI欠陥位置推定 / DPPM / 欠陥レベル見積り / 欠陥レベル削減 … More / ウェハマップ / ウェハマップ欠陥パターン / マルチモデルサンプリング / オンライン誤りマスク / オンラインマスク / 多重過渡故障 / 高電磁環境 / インバータスイッチングノイズ / 双対近似回路 / 同時多重過渡故障 / ディペンダブルプロセッサ / SoC高信頼設計 / SoC欠陥レベル削減 / 欠陥レベル見積 / VLSIテスト / 重みつき故障カバレージ … More Except Principal Investigator SoC / NAS / SAN / Convolutional Codes / Coordinated Checkpointing / Uncoodinated Checkpointing / Quorum / Data Replication Protocol / Distributed System / リカバリライン / グリッドプロトコル / ツリークォーラム / ロールバックリカバリ / 分散チェックポインティング / 台形プロトコル / 確率的クォーラム / SANINAS / 並列システム / 畳込み符号 / 連携チェックポインティング / 非連携チェックポインティング / クォーラム / データ複製プロトコル / 分散システム / DC-DC コンバータ / 周期的な多重故障 / 組み込み自己テスト / ディペンダブルコンピューティング / 故障モデル / 高電磁環境 / テストパターン / LSIテスト / ディペンダブルプロセッサ / SoC高信頼設計 / SoC欠陥レベル削減 / TMR / 故障カバレージ / レイアウト情報 / VLSIテスト / 市場不良率 / 集積回路 / 電磁波 / コンデンサ放電 / 時間冗長プロセッサ / FPGA / 確率モデル / 信頼性評価尺度 / 性能評価尺度 / 時空間冗長プロセッサ / 同時多重故障 / ソフトエラー / 過渡故障 Less

SoC Defect Level Estimation and Reduction by Multi-Model SamplingPrincipal Investigator
- Principal Investigator
  
  ARAI Masayuki
- Project Period (FY)
  2019 – 2023
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 60040:Computer system-related
- Research Institution
  Nihon University
On-Line Masking of Periodic Multiple Transient Faults under Highly Electromagnetic EnvironmentsPrincipal Investigator
- Principal Investigator
  
  ARAI Masayuki
- Project Period (FY)
  2015 – 2017
- Research Category
  
  Grant-in-Aid for Young Scientists (B)
- Research Field
  
  Power engineering/Power conversion/Electric machinery
- Research Institution
  Nihon University
Studies on Fault Tolerant Sequential Circuits for a New Transient Fault Model under Highly Electromagnetic Environment
- Principal Investigator
  
  FUKUMOTO Satoshi
- Project Period (FY)
  2012 – 2014
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Computer system/Network
- Research Institution
  Tokyo Metropolitan University
Highly Accurate Devect Level Estimation of SOC Chips Based on Its Layouts
- Principal Investigator
  
  IWASAKI Kazuhiko
- Project Period (FY)
  2011 – 2013
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Computer system/Network
- Research Institution
  Tokyo Metropolitan University
SoC Defect Level Reduction Based on Critical Area SamplingPrincipal Investigator
- Principal Investigator
  
  ARAI Masayuki
- Project Period (FY)
  2011 – 2013
- Research Category
  
  Grant-in-Aid for Young Scientists (B)
- Research Field
  
  Computer system/Network
- Research Institution
  Nihon University
  Tokyo Metropolitan University
A Basic Study on SoC Base Dependable Processor with Self-healing Mechanism for Faults
- Principal Investigator
  
  FUKUMOTO Satoshi
- Project Period (FY)
  2006 – 2008
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Computer system/Network
- Research Institution
  Tokyo Metropolitan University
Studies on Dependable Distributed Storage Cluster for SoC Design System using SAN/NAS
- Principal Investigator
  
  FUKUMOTO Satoshi
- Project Period (FY)
  2003 – 2005
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Computer system/Network
- Research Institution
  Tokyo Metroplitan University

[Book] ``Chapter 11: Hybrid Checkpointing Technique Using Incremental Snapshots,'' Reliability Modeling with Applications2014
- Author(s)
  Mamoru Ohara, Masayuki Arai, Satoshi Fukumoto and Kazuhiko Iwasaki
- Total Pages
  364
- Publisher
  World Scientific
- Data Source
  KAKENHI-PROJECT-24500070
[Journal Article] Layout Feature Extraction using CNN Classification in Root Cause Analysis of LSI Defects2021
- Author(s)
  Yoshikazu Nagamura, Koji Arima, Masayuki Arai, Satoshi Fukumoto
- Journal Title
  
  IEEE Transactions on Semiconductor Manufacturing
  
  Volume: Early Access Issue: 2 Pages: 153-160
- DOI
  10.1109/tsm.2021.3056717
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19K11884
[Journal Article] CNN-based Layout Segment Classification for Analysis of Layout-induced Failures2020
- Author(s)
  Yoshikazu Nagamura, Takashi Ide, Masayuki Arai, Satoshi Fukumoto
- Journal Title
  
  IEEE Transactions on Semiconductor Manufacturing
  
  Volume: 33 Issue: 4 Pages: 597-605
- DOI
  10.1109/tsm.2020.3029049
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19K11884
[Journal Article] Layout-Based Test Coverage Verification for High-Reliability Devices2017
- Author(s)
  Yoshikazu Nagamura, Kenji Shiozawa, Toru Koyama, Jun Matsushima, Kazuhiko Tomonaga, Yutaka Hoshi, Shuji Nomura, Masayuki Arai, Kazuhiko Iwasaki
- Journal Title
  
  IEEE Transactions on Semiconductor Manufacturing
  
  Volume: 30 Issue: 4 Pages: 317-322
- DOI
  10.1109/tsm.2017.2746089
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-15K21413
[Journal Article] Fault masking issue on a dependable processor using BIST under highly electromagnetic environment2017
- Author(s)
  Aromhack Saysanasongkham, Satoshi Fukumoto, Masayuki Arai
- Journal Title
  
  International Journal of Computational Science and Engineering
  
  Volume: 14 Issue: 4 Pages: 309-320
- DOI
  10.1504/ijcse.2017.084681
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-15K21413
[Journal Article] A Low Capture Power Test Generation Method Based on Capture Safe Test Vector Manipulation2017
- Author(s)
  Toshinori HOSOKAWA, Atsushi HIRAI, Yukari YAMAUCHI, Masayuki ARAI
- Journal Title
  
  IEICE Trans. Inf. & Syst.
  
  Volume: E100.D Issue: 9 Pages: 2118-2125
- DOI
  10.1587/transinf.2016EDP7418
- NAID
  130006038489
- ISSN
  0916-8532, 1745-1361
- Language
  English
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-15K21413
[Journal Article] Reordering-Based Test Pattern Reduction Considering Critical Area-Aware Weighted Fault Coverage2017
- Author(s)
  Masayuki Arai, Kazuhiko Iwasaki
- Journal Title
  
  IEICE Trans. Fundamentals
  
  Volume: E100.A Issue: 7 Pages: 1488-1495
- DOI
  10.1587/transfun.E100.A.1488
- NAID
  130007311790
- ISSN
  0916-8508, 1745-1337
- Language
  English
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-15K21413
[Journal Article] Distributed Data Replication Protocol for File Versioning2015
- Author(s)
  池田貴彦, 大原衛, 福本聡, 新井雅之, 岩崎一彦, 木村光宏
- Journal Title
  
  電子情報通信学会論文誌D 情報・システム
  
  Volume: J98-D Issue: 4 Pages: 684-699
- DOI
  10.14923/transinfj.2014JDP7061
- ISSN
  1880-4535, 1881-0225
- Year and Date
  2015-04-01
- Language
  Japanese
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24500070, KAKENHI-PROJECT-15K01208, KAKENHI-PROJECT-15K06073
[Journal Article] A Highly Reliable Digital Current Control using an Adaptive Sampling Method2014
- Author(s)
  Aromhack Saysanasongkham, Masayuki Arai, Satoshi Fukumoto, Shun Takeuchi and Keiji Wada
- Journal Title
  
  IEEJ Journal of Industry Applications
  
  Volume: 3 Issue: 4 Pages: 296-303
- DOI
  10.1541/ieejjia.3.296
- NAID
  130004597586
- ISSN
  2187-1094, 2187-1108
- Language
  English
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24500070
[Journal Article] A Highly Reliable Digital Current Control using an Adaptive Sampling Method2014
- Author(s)
  A. Saysanasongkham, M. Arai, Satoshi Fukumoto, S. Takeuchi, and K. Wada
- Journal Title
  
  IEEJ Journal of Industry Applications
  
  Volume: Vol.3, No.4 (掲載決定)
- NAID
  130004597586
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23700062
[Journal Article] Checkpoint Time Arrangement Rotation in Hybrid State Saving with a Limited Number of Periodical Checkpoints2013
- Author(s)
  R. Suzuki, M. Ohara, M. Arai, S. Fukumoto, and K. Iwasaki
- Journal Title
  
  IEICE Trans. Inf. & Syst.
  
  Volume: E96.D Issue: 1 Pages: 141-145
- DOI
  10.1587/transinf.E96.D.141
- NAID
  10031167391
- ISSN
  0916-8532, 1745-1361
- Language
  English
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23500063, KAKENHI-PROJECT-23700062
[Journal Article] Checkpoint Time Arrangement Rotation in Hybrid State Saving with Limited Number of Periodical Checkpoints2013
- Author(s)
  R. Suzuki, M. Ohara, M. Arai, S. Fukumoto, and K. Iwasaki
- Journal Title
  
  IEICE Transactions on Information and Systems
  
  Volume: Vol. E96-D, No. 1 Pages: 141-145
- NAID
  10031167391
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24500070
[Journal Article] Checkpoint Time Arrangement Rotation in Hybrid State Saving with a Limited Number of Periodical Checkpoints2013
- Author(s)
  R. Suzuki, M. Ohara, M. Arai, S. Fukumoto, and K. Iwasaki
- Journal Title
  
  IEIEC Trans. Inf.&Syst.
  
  Volume: Vol. E96-D, No. 1 Pages: 141-145
- NAID
  10031167391
- Data Source
  KAKENHI-PROJECT-23500063
[Journal Article] Checkpoint Time Arrangement Rotation in Hybrid State Saving with Limited Number of Periodical Checkpoints2013
- Author(s)
  R. Suzuki, M. Ohara, M. Arai, S. Fukumoto, and K. Iwasaki
- Journal Title
  
  IEICE Transactions on Information and Systems
  
  Volume: Vol.E96-D, No.1 Pages: 141-145
- NAID
  10031167391
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23700062
[Journal Article] Time Redundancy Processor with a Tolerance to Transient Faults Caused by ElectromagneticWaves2007
- Author(s)
  M. Kimura, M. Arai, S. Fukumoto, and K. Iwasaki
- Journal Title
  
  Proceedings of Workshop on Dependable and Secure Nanocomputing
  
  Pages: 248-254
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18500041
[Journal Article] 安全・安心のための半導体設計・テスト技術2007
- Author(s)
  福本聡, 新井雅之, 岩崎一彦
- Journal Title
  
  日本オペレーションズリサーチ学会第57回シンポジウム No.57
  
  Pages: 71-78
- NAID
  110006317655
- Data Source
  KAKENHI-PROJECT-18500041
[Journal Article] 安全・安心のための半導体設計・テスト技術2007
- Author(s)
  福本聡, 新井雅之, 岩崎一彦
- Journal Title
  
  OR学会誌 Vol.52
  
  Pages: 409-415
- NAID
  110006317655
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18500041
[Journal Article] Time Redundancy Processor with the Tolerance to Transient Faults Caused by Electromagnetic Waves2007
- Author(s)
  M.Kimura, M.Arai, S.Fukumoto, K.Iwasaki
- Journal Title
  
  Proceedings in Workshop on Dependable and Secure Nanocomputing in the framework of DSN-2007. (掲載決定)
- Data Source
  KAKENHI-PROJECT-18500041
[Journal Article] A note on Reliable Multicast Applying Convolutional-Code-Based FEC over Finite Field2006
- Author(s)
  M.Arai, S.Fukumoto, K.Iwasaki
- Journal Title
  
  International Journal of Reliability,Quality and Safety Engineering Vol.12,No3
  
  Pages: 203-212
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15500046
[Journal Article] Analytical Model on Hybrid State Saving with a Limited Number of Checkpoints and Bound Rollbacks2006
- Author(s)
  M.Ohara, M.Arai, S.Fukumoto, K.Iwasaki
- Journal Title
  
  IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences (to appear)
- NAID
  110007537954
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15500046
[Journal Article] Analytical Model on Hybrid State Saving with a Limited Number of Checkpoints and Bound Rollbacks2006
- Author(s)
  M, Ohara, M.Arai, S.Fukumoto, K.Iwasaki
- Journal Title
  
  IEICE Transactions on Fundamentals of Electronics,Communications and Computer Sciences (採録決定済み)
- NAID
  110007537954
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15500046
[Journal Article] 過度故障に耐性を持つ時間冗長プロセッサの検討2006
- Author(s)
  木村真琴, 新井雅之, 福本聡, 岩崎一彦
- Journal Title
  
  電子情報通信学会技術研究報告書(DC 研究会) DC2006-14(2006-8)
  
  Pages: 13-18
- Data Source
  KAKENHI-PROJECT-18500041
[Journal Article] ディペンダブルVLSI2006
- Author(s)
  福本聡, 新井雅之, 岩崎一彦
- Journal Title
  
  第10回システムLSIワークショップ講演資料集 No.10
  
  Pages: 171-180
- Data Source
  KAKENHI-PROJECT-18500041
[Journal Article] Analytical Model on Hybrid State Saving with a Limited Number of Checkpoints and Bound Rollbacks2006
- Author(s)
  M.Ohara, M.Arai, S.Fukumoto, K.Iwasaki
- Journal Title
  
  IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences (採録決定済み)
- NAID
  110007537954
- Data Source
  KAKENHI-PROJECT-15500046
[Journal Article] Proposal and Evaluation of a Coordinated Checkpointing Technique Using Incremental Snapshots (Japanese Edition)2006
- Author(s)
  M.Ohara, M.Arai, S.Fukumoto, K.Iwasaki
- Journal Title
  
  IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences (to appear)
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15500046
[Journal Article] 差分スナップショットを伴う連携チェックポインティングの提案と評価2006
- Author(s)
  大原衛, 新井雅之, 福本聡, 岩崎一彦
- Journal Title
  
  電子情報通信学会論文誌基礎・境界 Vol.J89-A, No.5(掲載予定)
- NAID
  110007384374
- Data Source
  KAKENHI-PROJECT-15500046
[Journal Article] 多世代データ保持のためのデータ複製プロトコル2006
- Author(s)
  池田貴彦, 新井雅之, 福本聡, 岩崎一彦
- Journal Title
  
  電子情報通信学会技術研究報告 CPSY2006-4, DC2006-4(掲載予定)
- NAID
  110004718862
- Data Source
  KAKENHI-PROJECT-15500046
[Journal Article] 差分スナップショットを伴う連携チェックポンティングの提案と評価2006
- Author(s)
  大原衛, 新井雅之, 福本聡, 岩崎一彦
- Journal Title
  
  電子情報通信学会論文誌基礎・境界 Vol.J89-A,No.5(掲載予定)
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15500046
[Journal Article] A Note on Reliable Multicast Applying Convolutional-Code-Based FEC over Finite Field2006
- Author(s)
  M.Arai, S.Fukumoto, K.Iwasaki
- Journal Title
  
  International Journal of Reliability, Quality and Safety Engineering Vol.12, No.3
  
  Pages: 203-212
- Data Source
  KAKENHI-PROJECT-15500046
[Journal Article] Rsliability Analysis of a Convolutional-Code-Based Packet Level FEC under Limited Buffer Size2005
- Author(s)
  M.Arai, S.Fukummoto, K.Iwasaki
- Journal Title
  
  IEICE Transactions on Fundamentals of Electronics,Communications and Conmputer Sciences Vol. E88-A,No.4
  
  Pages: 1047-1054
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15500046
[Journal Article] On the Optimal Checkpoint Interval for Uncoordinated Checkpointing with a Limited Number of Checkpoints and Bound Rollbacks2005
- Author(s)
  M.Ohara, M.Arai, S.Fukumoto, K.Iwasaki
- Journal Title
  
  Proceedings of 2005 International Workshop on Recent Advances in Stochastic Operations Research
  
  Pages: 187-194
- Data Source
  KAKENHI-PROJECT-15500046
[Journal Article] Analysis of Probabilistic Trapezoid Protocol for Data Replication2005
- Author(s)
  T.Suzuki, M.Ohara, M.Arai, S.Fukumoto, K.Iwasaki
- Journal Title
  
  Proceedings of the International Conference on Dependable Systems and-Networks
- NAID
  130000058166
- Data Source
  KAKENHI-PROJECT-15500046
[Journal Article] Analysis of probabilistic Trapezoid protocol for Data Replication2005
- Author(s)
  T.Suzuki, M.Ohara, M.Arai, S.Fukumoto, K.Iwasaki
- Journal Title
  
  Proceedings of International Conference on Dependable Systems and Networks(DSN2005)
  
  Pages: 782-791
- NAID
  130000058166
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15500046
[Journal Article] Design of Dependable VLSI Processor Using Triple Modular Redundancy2004
- Author(s)
  Masayuki Arai, Satosi Fukumoto, Kazuhiko Iwasaki
- Journal Title
  
  Proceedings of 2004 International Conference on Dependable Systems and Networks, Fast Abstract Session
  
  Pages: 8-8
- Data Source
  KAKENHI-PROJECT-15500046
[Journal Article] データリプリケーション用台形プロトコルの設計と実装2004
- Author(s)
  鈴木旅人, 田中保夫, 大原衛, 新井雅之, 福本聡, 岩崎一彦
- Journal Title
  
  電子情報通信学会技術研究報告 CPSY2004-2,DC2004-2
  
  Pages: 7-12
- NAID
  110003173698
- Data Source
  KAKENHI-PROJECT-15500046
[Journal Article] データ複製用確率的台形プロトコルの解析と実装2004
- Author(s)
  鈴木旅人, 大原衛, 新井雅之, 福本聡, 岩崎一彦
- Journal Title
  
  電子情報通信学会技術研究報告 DE2004-107,DC2004-22
  
  Pages: 5-10
- NAID
  110003204294
- Data Source
  KAKENHI-PROJECT-15500046
[Journal Article] ハイブリッドチェックポインティングの回復能力の評価2004
- Author(s)
  大原衛, 田中保夫, 新井雅之, 福本聡, 岩崎一彦
- Journal Title
  
  電子情報通信学会技術研究報告 CPSY2004-2,DC2004-2
  
  Pages: 13-18
- NAID
  110003173699
- Data Source
  KAKENHI-PROJECT-15500046
[Journal Article] (n,k,m)畳込み符号を用いたバケット損回復方式の提案2004
- Author(s)
  山口アンナ, 新井雅彦, 福本聡, 岩崎一彦
- Journal Title
  
  電子情報通信学会和文論文誌(基礎・境界) Vol.J87-A,No.8
  
  Pages: 1120-1132
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15500046
[Journal Article] 制限されたリカバリ間隔に対する非連携チェックポインティングの評価
- Author(s)
  大原衛, 新井雅之, 福本聡, 岩崎一彦
- Journal Title
  
  第52回FTC研究会資料(セッション3)
- Data Source
  KAKENHI-PROJECT-15500046
[Journal Article] Method to Recover Lost Internet Packets Using (n, k, m) Convolutional Codes (Japanese Edition)
- Author(s)
  A.Yamaguchi, M.Arai, S.Fukumoto, K.Iwasaki
- Journal Title
  
  IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences J87-A, No.8
  
  Pages: 1120-1132
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15500046
[Journal Article] A Note on Reliable Multicast Applying Convolutional-Code-Based FEC over Finite Field
- Author(s)
  M.Arai, S.Fukumoto, K.Iwasaki
- Journal Title
  
  International Journal of Reliability, Quality and Safety Engineering Vol.12,No.3
  
  Pages: 203-212
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15500046
[Journal Article] Reliability Analysis of a Convolutional-Code-Based Packet Level FEC under Limited Buffer Size
- Author(s)
  M.Arai, S.Fukumoto, K.Iwasaki
- Journal Title
  
  IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences Vol.E88-A, No.4
  
  Pages: 1047-1054
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15500046
[Journal Article] Analysis of Probabilistic Trapezoid Protocol for Data Replication
- Author(s)
  T.Suzuki, M.Ohara, M.Arai, S.Fukumoto, K.Iwasaki
- Journal Title
  
  Proceedings of International Conference on Dependable Systems and Networks (DSN2005)
  
  Pages: 782-791
- NAID
  130000058166
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15500046
[Presentation] An Estimation Method of Defect Types Using Artificial Neural Networks and Fault Detection Information2023
- Author(s)
  Natsuki Ota , Toshinori Hosokawa , Koji Yamazaki , Yukari Yamauchi , Masayuki Arai
- Organizer
  IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2023)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19K11884
[Presentation] CapsNetを用いた高解像度ウェハマップの欠陥パターン分類法におけるScratch再構成に関する考察2023
- Author(s)
  山中祐輝,永村美一,新井雅之,福本聡
- Organizer
  組込み技術とネットワークに関するワークショップ (ETNET2023)
- Data Source
  KAKENHI-PROJECT-19K11884
[Presentation] レイアウト起因LSI欠陥検出のためのFSGANを用いたデータ拡張に関する検討2023
- Author(s)
  杉岡拓海,永村美一,新井雅之,福本聡
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会
- Data Source
  KAKENHI-PROJECT-19K11884
[Presentation] Toward Improvement and Evaluation of Reconstruction Capability of CapsNet-Based Wafer Map Defect Pattern Classifier2023
- Author(s)
  Yuki Yamanaka , Masayuki Arai , Yoshikazu Nagamura , Satoshi Fukumoto
- Organizer
  THE 7TH IEEE INTERNATIONAL TEST CONFERENCE IN ASIA (ITC-ASIA) 2023
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19K11884
[Presentation] CapsNetを用いた高解像度ウェハマップの欠陥パターン分類法に関する考察2022
- Author(s)
  山中祐輝,永村美一,新井雅之,福本聡
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会，コンピュータシステム研究会，情報処理学会システム・アーキテクチャ研究会合同研究会(HotSPA2022)
- Data Source
  KAKENHI-PROJECT-19K11884
[Presentation] Note on CapsNet-Based Wafer Map Defect Pattern Classification2021
- Author(s)
  Itsuki Fujita, Yoshikazu Nagamura, Masayuki Arai, Satoshi Fukumoto
- Organizer
  IEEE Asian Test Symposium
- Data Source
  KAKENHI-PROJECT-19K11884
[Presentation] An Estimation Method of Defect Types for Suspected Logical Faulty Lines Using Artificial Neural Networks and Fault Detection Information of Universal Logical Fault Model2021
- Author(s)
  Natsuki Ohta, Toshinori Hosokawa, Koji Yamazaki, Yukari Yamauchi and Masayuki Arai
- Organizer
  IEEE Workshop on RTL and High Level Test (WRTLT 2021)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19K11884
[Presentation] Evaluation of CNN-Based Defect Location Estimation on LSI Layouts2020
- Author(s)
  Yoshikazu Nagamura, Masayuki Arai and Satoshi Fukumoto
- Organizer
  IEEE Workshop on RTL & High Level Testing (WRTLT 2020)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19K11884
[Presentation] Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the Number of Test Patterns Using Partial MaxSAT2020
- Author(s)
  Ryuki Asami, Toshinori Hosokawa, Masayoshi Yoshimura, Masayuki Arai
- Organizer
  The 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2020)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19K11884
[Presentation] パーシャルMAX-SATを用いた抵抗性オープン故障に対するテスト生成法2020
- Author(s)
  山崎紘史，石山悠太，松田竜馬，細川利典，吉村正義，新井雅之，四柳浩之，橋爪正樹
- Organizer
  電子情報通信学会ハードウェアセキュリティ研究会
- Data Source
  KAKENHI-PROJECT-19K11884
[Presentation] SATを用いたSDNルールテーブル分割法の高速化に関する検討2019
- Author(s)
  好川雄太郎，新井雅之
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会
- Data Source
  KAKENHI-PROJECT-19K11884
[Presentation] A Low Capture Power Oriented X-filling Method Using Partial MaxSAT Iteratively2019
- Author(s)
  T. Hosokawa, K. Misawa, Y. Hirama, H.Yamazaki, M. Yoshimura and M. Arai
- Organizer
  The 32nd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2019)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19K11884
[Presentation] A Don't Care Identification-Filling Co-Optimization Method for Low Capture Power Testing Using Partial MaxSAT2019
- Author(s)
  Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki, Masayoshi Yoshimura and Masayuki Arai
- Organizer
  IEEE Workshop on RTL & High Level Testing (WRTLT 2019)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19K11884
[Presentation] A Fine-Grained SDN Rule Table Partitioning and Distribution2019
- Author(s)
  Yutaro Yoshikawa, Masayuki Arai
- Organizer
  IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2019)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19K11884
[Presentation] Spare-Tile-Based Dependable Logic Design for Sea-of-Tiles Architecture with Ambipolar Devices2017
- Author(s)
  Dan Takahashi, Masayuki Arai
- Organizer
  IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2017)
- Place of Presentation
  Christchurch, New Zealand
- Year and Date
  2017-01-22
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K21413
[Presentation] Data Aggregation on Smart Grid Communications Considering Fault Tolerance and Privacy2017
- Author(s)
  Ryota Ogasawara, Masayuki Arai
- Organizer
  International Future Energy Electronics Conference (IFEEC) - ECCE Asia
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K21413
[Presentation] A Dynamic Test Compaction Method on Low Power Test Generation Based on Capture Safe Test Vectors2017
- Author(s)
  Toshinori Hosokawa, Atsushi Hirai, Hiroshi Yamazaki and Masayuki Arai
- Organizer
  IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K21413
[Presentation] Erasure-Code-Based DTN Multi-Path Routing for Contact Avoidance2017
- Author(s)
  Hironori Arai, Masayuki Arai
- Organizer
  IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2017)
- Place of Presentation
  Christchurch, New Zealand
- Year and Date
  2017-01-22
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K21413
[Presentation] Layout-Aware 2-Step Window-based Pattern Reordering for Fast Bridge/Open Test Generation2017
- Author(s)
  Masayuki Arai, Shingo Inuyama, Kazuhiko Iwasaki
- Organizer
  International Test Conference
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K21413
[Presentation] Critical-Area-Aware Test Pattern Generation and Reordering2016
- Author(s)
  Shingo Inuyama, Kazuhiko Iwasaki, Masayuki Arai
- Organizer
  IEEE Asian Test Symposium (ATS 2016)
- Place of Presentation
  Hiroshima, Japan
- Year and Date
  2016-11-22
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K21413
[Presentation] Layout-Based Test Coverage Verification for High-Reliability Devices2016
- Author(s)
  Yoshikazu Nagamura, Kenji Shiozawa, Toru Koyama, Jun Matsushima, Kazuhiro Tomonaga, Yutaka Hoshi, Shuji Nomura, Masayuki Arai, Kazuhiko Iwasaki
- Organizer
  International Symposium on Semiconductor Manufacturing (ISSM)
- Place of Presentation
  Tokyo, Japan
- Year and Date
  2016-12-12
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K21413
[Presentation] Note on Fast Bridge Fault Test Generation Based on Critical Area2015
- Author(s)
  Masayuki Arai, Shingo Inuyama, Kazuhiko Iwasaki
- Organizer
  15th International Conference on Algorithms and Architectures for Parallel Processing
- Place of Presentation
  Zhanjiajie, P.R. China
- Year and Date
  2015-11-18
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K21413
[Presentation] 物理的なテストカバレッジ (物理カバー率) の検証方法の開発2015
- Author(s)
  永村美一, 小山徹, 松嶋潤, 朝永和洋, 星豊, 野村周司, 岩崎一彦, 新井雅之
- Organizer
  第36回ナノテスティングシンポジウム
- Place of Presentation
  千里ライフサイエンスセンター（大阪府豊中市)
- Year and Date
  2015-11-11
- Data Source
  KAKENHI-PROJECT-15K21413
[Presentation] Note on Dependable Logic Design by Ambipolar Device and Its Fault Modeling2015
- Author(s)
  Dan Takahashi, Masayuki Arai
- Organizer
  IEEE Workshop on RTL & High Level Testing (WRTLT 2015)
- Place of Presentation
  Mumbai, India
- Year and Date
  2015-11-25
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K21413
[Presentation] A low capture power test generation method using capture safe test vectors2015
- Author(s)
  Atsushi Hirai, Toshinori Hosokawa, Yukari Yamauchi, Masayuki Arai
- Organizer
  IEEE European Test Symposium
- Place of Presentation
  Cluj-Napoca, Romania
- Year and Date
  2015-05-23
- Data Source
  KAKENHI-PROJECT-15K21413
[Presentation] Testbeds of a Hybrid-ARQ-Based Reliable Communication for CANs in Highly Electromagnetic Environments2015
- Author(s)
  Muneyuki Nakamura, Mamoru Ohara, Aromhack Saysanasongkham, Masayuki Arai, Kazuya Sakai, Satoshi Fukumoto, Keiji Wada
- Organizer
  IEEE Future Energy Electronics Conference (IFEEC 2015)
- Place of Presentation
  Taipei, ROC
- Year and Date
  2015-11-01
- Data Source
  KAKENHI-PROJECT-15K21413
[Presentation] CANにおけるDC-DCコンバータノイズに対処したハイブリッドARQの一考察2014
- Author(s)
  中村宗幸, 大原衛, サイサナソンカムアロムハック, 新井雅之, 酒井和哉, 福本聡
- Organizer
  電子情報通信学会技術研究報告DC2014-25
- Place of Presentation
  機械振興会館（東京）
- Year and Date
  2014-10-27
- Data Source
  KAKENHI-PROJECT-24500070
[Presentation] 重み付き故障カバレージ算出に向けたクリティカルエリアの推定に関する一検討2014
- Author(s)
  中山裕太, 佐久間俊介, 新井雅之, 史紅波, 岩崎一彦
- Organizer
  電子情報通信学会総合大会
- Place of Presentation
  新潟大学
- Data Source
  KAKENHI-PROJECT-23500063
[Presentation] Application-Layer Hybrid ARQ in CAN Networks for Tolerating DC-DC Converter Noise2014
- Author(s)
  Masahiko Negishi, Aromhack Saysanasongkam, Muneyuki Nakamura, Mamoru Ohrara, Masayuki Arai, Satoshi Fukumoto
- Organizer
  Fast Abstracts of The 44nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2014)
- Place of Presentation
  Atlanta (USA)
- Year and Date
  2014-06-25
- Data Source
  KAKENHI-PROJECT-24500070
[Presentation] 福本聡，遠藤知輝，大原衛，新井雅之ビザンチン故障的に振舞うノードを考慮した構造化P2Pネットワークの探索プロトコル2014
- Author(s)
  福本聡，遠藤知輝，大原衛，新井雅之
- Organizer
  電子情報通信学会技術研究報告DC2014-9
- Place of Presentation
  機械振興会館（東京都）
- Year and Date
  2014-04-25
- Data Source
  KAKENHI-PROJECT-24500070
[Presentation] 高電磁ノイズに対するCANプロトコルの耐故障手法2014
- Author(s)
  根岸正彦, サイサナソンカムアロムハック, 中村宗幸, 大原衛, 新井雅之, 福本聡
- Organizer
  第70回FTC研究会セッション4
- Place of Presentation
  宝荘ホテル（松山市）
- Data Source
  KAKENHI-PROJECT-24500070
[Presentation] 日和見主義的なモバイルネットワークにおけるキャッシュ・データの鮮度維持手法の検討2014
- Author(s)
  六川恵，福本聡，新井雅之，酒井和哉
- Organizer
  第13回情報科学技術フォーラム(FIT2014) C-009
- Place of Presentation
  筑波大学（茨城県）
- Year and Date
  2014-09-03
- Data Source
  KAKENHI-PROJECT-24500070
[Presentation] 異なる欠陥粒径とビアオープンを考慮した重み付き故障カバレージに関する一考察2014
- Author(s)
  中山裕太, 新井雅之, 史紅波, 岩崎一彦
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会, DC2013-84
- Data Source
  KAKENHI-PROJECT-23500063
[Presentation] 分散レプリケーションの性能・可用性・一貫性に関する評価尺度の検討2014
- Author(s)
  福本聡，神田一平，新井雅之
- Organizer
  電子情報通信学会技術報告R2014-14
- Place of Presentation
  スマイルホテル函館（北海道）
- Year and Date
  2014-08-01
- Data Source
  KAKENHI-PROJECT-24500070
[Presentation] An Adaptive Sampling Method for a Highly Reliable Digital Control Power Converter2013
- Author(s)
  Aromhack Saysanasongkam, Masayuki Arai, Satoshi Fukumoto, Shun Takeuchi and Keiji Wada
- Organizer
  Proceedings of International Future Energy Electronics Conference 2013 (IFEEC 2013) pp. 716-721
- Place of Presentation
  Taipei, Taiwan
- Data Source
  KAKENHI-PROJECT-24500070
[Presentation] A Note on Influence of DC-DC Converter Noise in CAN Networks2013
- Author(s)
  M. Ohara, M. Arai, S. Fukumoto
- Organizer
  fast abstract of The 19th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2013)
- Place of Presentation
  Vancouver, Canada
- Data Source
  KAKENHI-PROJECT-24500070
[Presentation] Note on Test Pattern Reordering for Weighted Fault Coverage Improvement2013
- Author(s)
  M. Arai, Y. Nakayama, and K. Iwasaki
- Organizer
  Workshop on High-Level and RTL
- Place of Presentation
  Yilan, Taiwan
- Data Source
  KAKENHI-PROJECT-23500063
[Presentation] An Adaptive Sampling Method for a Highly Reliable Digital Control Power Converter2013
- Author(s)
  K. Wada, A. Saysanasongkham, S. Fukumoto, S. Takeuchi, M. Arai
- Organizer
  International Future Energy Electronics Conference 2013 (IFEEC 2013)
- Place of Presentation
  Taichu, Taiwan
- Data Source
  KAKENHI-PROJECT-23700062
[Presentation] Note on Test Pattern Reordering for Weighted Fault Coverage Improvement2013
- Author(s)
  M. Arai, Y. Nakayama, K. Iwasaki
- Organizer
  Workshop on RTL and High Level Testing 2013 (WRTLT 2013) 出版者
- Place of Presentation
  Jiaosi, Taiwan
- Data Source
  KAKENHI-PROJECT-23700062
[Presentation] LSIのオープン欠陥クリティカルエリアに関する一検討2013
- Author(s)
  中山裕太，清水貴弘，新井雅之
- Organizer
  電子情報通信学会総合大会
- Place of Presentation
  Tokyo, Japan
- Data Source
  KAKENHI-PROJECT-23700062
[Presentation] An Adaptive Approach to Dependable Circuits for a Digital Power Control2013
- Author(s)
  A. Saysanasongkham, K. Imai, M. Arai, S. Fukumoto, K. Wada
- Organizer
  International Conference on Dependable Systems and Networks
- Place of Presentation
  Budapest, Hungary
- Data Source
  KAKENHI-PROJECT-23700062
[Presentation] An Adaptive Approach to Dependable Circuits for a Digital Power Control2013
- Author(s)
  Aromhack Saysanasongkam, Kenta Imai, Masayuki Arai, Satoshi Fukumoto
- Organizer
  Fast Abstracts of The 43nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2013)
- Place of Presentation
  Budapest, Hungary
- Data Source
  KAKENHI-PROJECT-24500070
[Presentation] レジスタ多重化による耐過渡故障高信頼プロセッサの評価2013
- Author(s)
  緑川直樹, 小山善史, 新井雅之, 福本聡
- Organizer
  電子情報通信学会技術研究報告, DC2013-20, pp.21-25
- Place of Presentation
  北九州国際会議場（北九州市）
- Data Source
  KAKENHI-PROJECT-24500070
[Presentation] Layout-Aware Weighted Bridge/Open Fault Coverage Considering Multiple Defect Sizes2013
- Author(s)
  M. Arai and K. Iwasaki
- Organizer
  International Test Conference
- Place of Presentation
  Anaheim, USA
- Data Source
  KAKENHI-PROJECT-23500063
[Presentation] ディジタル・パワー制御の高信頼化に関する試み2013
- Author(s)
  今井健太, サイサナソンカムアロムハック, 新井雅之, 福本聡, 和田圭二
- Organizer
  電子情報通信学会技術研究報告 CPSY2013-1/DC2013-1, pp.1-6
- Place of Presentation
  首都大学東京秋葉原サテライトキャンパス
- Data Source
  KAKENHI-PROJECT-24500070
[Presentation] クリティカルエリア解析に基づく故障カバレージ見積りに関する一考察2013
- Author(s)
  清水貴弘, 新井雅之, 岩崎一彦
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会, DC2012-82
- Data Source
  KAKENHI-PROJECT-23500063
[Presentation] Note on Test Pattern Reordering for Weighted Fault Coverage Improvement2013
- Author(s)
  M. Arai, Y. Nakayama, and K. Iwasaki
- Organizer
  Workshop on High-Level and RTL (WRTLT)
- Data Source
  KAKENHI-PROJECT-23500063
[Presentation] 高電磁環境下におけるCANプロトコルの高信頼化に関する考察2013
- Author(s)
  根岸正彦, サイサナソンカムアロムハック, 大原衛, 新井雅之, 福本聡
- Organizer
  第69回FTC研究会セッション4
- Place of Presentation
  かんぽの宿湯田（山口市）
- Data Source
  KAKENHI-PROJECT-24500070
[Presentation] Layout-Aware Weighted Bridge/Open Fault Coverage Considering Multiple Defect Sizes2013
- Author(s)
  M. Arai and K. Iwasaki
- Organizer
  International Test Conference (ITC)
- Data Source
  KAKENHI-PROJECT-23500063
[Presentation] A Note on Influence of DC-DC Converter Noise in CAN Networks2013
- Author(s)
  M. Ohara, M. Arai, S. Fukumoto
- Organizer
  The 19th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2013)
- Place of Presentation
  Vancouver, Canada
- Data Source
  KAKENHI-PROJECT-23700062
[Presentation] パイプラインプロセッサ向けカスケードTMRにおける遺伝的アルゴリズムを用いた構成探索2012
- Author(s)
  新井　雅之，井出　創，岩崎　一彦
- Organizer
  組込み技術とネットワークに関するワークショップ
- Place of Presentation
  ホテル松島大観荘，宮城県
- Data Source
  KAKENHI-PROJECT-23700062
[Presentation] A Processor Tolerating Periodical Transient Faults under Highly Electromagnetic Environment by Using Built in Self Test2012
- Author(s)
  Aromhack Saysanasongkam, Masahiko Negishi, Masayuki Arai, Satoshi Fukumoto
- Organizer
  The International symposium of the Interfaculty Initiative in Electrical Energy and Communications, Tokyo Metropolitan University
- Place of Presentation
  Tokyo Metropolitan University
- Data Source
  KAKENHI-PROJECT-24500070
[Presentation] CANプロトコルによる車載LANにおける高電磁ノイズ下での耐故障性2012
- Author(s)
  根岸正彦, サイサナソンカムアロムハック, 新井雅之, 大原衛, 福本聡
- Organizer
  電子情報通信学会技術研究報告 DC2012-75, pp.11-15
- Place of Presentation
  アオッサ（福井）
- Data Source
  KAKENHI-PROJECT-24500070
[Presentation] パイプラインプロセッサ向けカスケード TMR における遺伝的アルゴリズムを用いた構成探索2012
- Author(s)
  新井雅之, 井出創, 岩崎一彦
- Organizer
  電子情報通信学会コンピュータシステム研究会, CPSY2011-94, 電子情報通信学会ディペンダブルコンピューティング研究会, DC2011-98
- Data Source
  KAKENHI-PROJECT-23500063
[Presentation] レイアウトを考慮したブリッジ/オープン故障カバレージの高精度見積法2012
- Author(s)
  新井雅之, 清水貴弘, 岩崎一彦
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会, DC2012-13
- Data Source
  KAKENHI-PROJECT-23500063
[Presentation] Note on Layout-Aware Weighted Probabilistic Bridge Fault Coverage2012
- Author(s)
  M. Arai, Y. Shimizu, and K. Iwasaki
- Organizer
  Asian Test Symposium (ATS)
- Place of Presentation
  Niigata
- Data Source
  KAKENHI-PROJECT-23500063
[Presentation] A Dependable Processor by Using Built in Self Test to Tolerate Periodical Transient Faults under Highly Electromagnetic Environment2012
- Author(s)
  A. Saysanasongkham, M. Negishi, M. Arai, S. Fukumoto
- Organizer
  IEEE Pacific Rim International Symposium on Dependable Computig
- Place of Presentation
  Niigata, Japan
- Data Source
  KAKENHI-PROJECT-23700062
[Presentation] A Dependable Processor by Using Built in Self Test to Tolerate Periodical Transient Faults under Highly Electromagnetic Environment2012
- Author(s)
  Aromhack Saysanasongkam, Masahiko Negishi, Masayuki Arai, Satoshi Fukumoto
- Organizer
  The 18th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2012), pp.127-134
- Place of Presentation
  Niigata, Japan
- Data Source
  KAKENHI-PROJECT-24500070
[Presentation] Note on Layout-Aware Weighted Probabilistic Bridge Fault Coverage2012
- Author(s)
  M. Arai, Y. Shimizu, K. Iwasaki
- Organizer
  IEEE Asian Test Symposium
- Place of Presentation
  Niigata, Japan
- Data Source
  KAKENHI-PROJECT-23700062
[Presentation] パイプラインプロセッサ向けカスケードTMRにおける遺伝的アルゴリズムを用いた構成探索2012
- Author(s)
  新井　雅之，井出　創，岩崎　一彦
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会
- Place of Presentation
  ホテル松島大観荘，宮城県
- Data Source
  KAKENHI-PROJECT-23500063
[Presentation] レイアウトを考慮した故障カバレージの高精度見積りに関する一考察2012
- Author(s)
  新井　雅之，清水　貴弘，岩崎　一彦
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会
- Place of Presentation
  機械振興会館，東京都
- Data Source
  KAKENHI-PROJECT-23700062
[Presentation] A Note on Dependable Processor for Periodical Transient Faults under High Electromagnetic Environment2012
- Author(s)
  Aromhack Saysanasongkam, Masahiko Negishi, Masayuki Arai, Satoshi Fukumoto
- Organizer
  Fast Abstracts III of The 42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2012)
- Place of Presentation
  Boston, USA
- Data Source
  KAKENHI-PROJECT-24500070
[Presentation] 組込み自己テストによって高電磁環境下の周期的過渡故障を回避するプロセッサ2012
- Author(s)
  根岸正彦, サイサナソンカムアロムハック, 新井雅之, 福本聡
- Organizer
  電子情報通信学会技術研究報告 CPSY2012-1/DC2012-1, pp.1-6
- Place of Presentation
  東工大，大岡山キャンパス
- Data Source
  KAKENHI-PROJECT-24500070
[Presentation] レイアウトを考慮した故障カバレージの高精度見積りに関する一考察2012
- Author(s)
  新井　雅之，清水　貴弘，岩崎　一彦
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会
- Place of Presentation
  機械振興会館，東京都
- Data Source
  KAKENHI-PROJECT-23500063
[Presentation] Note on Layout-Aware Weighted Probabilistic Bridge Fault Coverage2012
- Author(s)
  M. Arai, Y. Shimizu, K. Iwasaki
- Organizer
  2012 IEEE 21st Asian Test Symposium (ATS 2012)
- Place of Presentation
  Niigata, Japan(pp. 89-94)
- Data Source
  KAKENHI-PROJECT-23700062
[Presentation] 高電磁環境下で論理回路に発生する過渡故障の実験的評価2012
- Author(s)
  永島一磨, 今井健太, 新井雅之, 福本聡, 和田圭二
- Organizer
  第11回情報科学技術フォーラム(FIT2012), C-024, pp. 317-318
- Place of Presentation
  法政大学，小金井キャンパス
- Data Source
  KAKENHI-PROJECT-24500070
[Presentation] Note on Dependable Processor for Periodical Transient Faults under High Electromagnetic Environment2012
- Author(s)
  A. Saysanasongkham, M. Negishi, M. Arai, S. Fukumoto
- Organizer
  International Conference on Dependable Systems and Networks (Fast Abstract)
- Place of Presentation
  Boston, MA, USA
- Data Source
  KAKENHI-PROJECT-23700062
[Presentation] Area Per Yield and Defect Level of Cascaded TMR for Pipelined Processors2011
- Author(s)
  Masayuki Arai and Kazuhiko Iwasaki
- Organizer
  17th IEEE Pacific Rim International Symposium on Dependable Computing
- Place of Presentation
  Westin Pasadena, CA, USA
- Data Source
  KAKENHI-PROJECT-23500063
[Presentation] 過渡故障を対象とした高信頼化プロセッサの研究動向2011
- Author(s)
  小山　善文，今井　健太，サイサナソンカム　アロムハック，新井　雅之，福本　聡
- Organizer
  2011年並列/分散/協調処理に関する『鹿児島』サマー・ワークショップ
- Place of Presentation
  かごしま県民交流センター，鹿児島県
- Data Source
  KAKENHI-PROJECT-23700062
[Presentation] パイプラインプロセッサ向けカスケードTMRの欠陥レベル評価に関する一考察2011
- Author(s)
  新井　雅之，岩崎　一彦
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会
- Place of Presentation
  首都大学東京秋葉原サテライトキャンパス，東京都
- Data Source
  KAKENHI-PROJECT-23500063
[Presentation] Area-Per-Yield and Defect Level of Cascaded TMR for Pipelined Processors2011
- Author(s)
  M. Arai, and K. Iwasaki
- Organizer
  Pacific Rim International Symposium on Dependable Computing (PRDC)
- Data Source
  KAKENHI-PROJECT-23500063
[Presentation] パイプラインプロセッサ向けカスケードTMRの欠陥レベル評価に関する一考察2011
- Author(s)
  新井　雅之，岩崎　一彦
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会
- Place of Presentation
  首都大学東京秋葉原サテライトキャンパス，東京都
- Data Source
  KAKENHI-PROJECT-23700062
[Presentation] Self-Calibration Using Functional BIST for Transient-Fault-Tolerant Sequential Circuits in Severe Electromagnetic Environment2011
- Author(s)
  M. Arai, A. Saysanasongkham, K. Imai,Y. Koyama, S. Fukumoto
- Organizer
  IEEE 12th International Workshop on RTL and High-Level Testing
- Place of Presentation
  Jaipur, India(pp. 90-93)
- Data Source
  KAKENHI-PROJECT-23700062
[Presentation] Area-Per-Yield and Defect Level of Cascaded TMR for Pipelined Processors2011
- Author(s)
  M. Arai, K. Iwasaki
- Organizer
  IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2011)
- Place of Presentation
  Pasadena, CA, USA(pp. 264-271)
- Data Source
  KAKENHI-PROJECT-23700062
[Presentation] パイプラインプロセッサ向けカスケード TMR の欠陥レベル評価に関する一考察2011
- Author(s)
  新井雅之, 岩崎一彦
- Organizer
  電子情報通信学会コンピュータシステム研究会, 電子情報通信学会ディペンダブルコンピューティング研究会, CPSY2011-6, DC2011-6
- Data Source
  KAKENHI-PROJECT-23500063
[Presentation] Area Per Yield and Defect Level of Cascaded TMR for Pipelined Processors2011
- Author(s)
  Masayuki Arai and Kazuhiko Iwasaki
- Organizer
  International Test Conference
- Place of Presentation
  Disneyland Hotel, Anaheim, CA, USA
- Data Source
  KAKENHI-PROJECT-23700062
[Presentation] Self-Calibration Using Functional BIST for Transient-Fault-Tolerant Sequential Circuits in Severe Electromagnetic Environment2011
- Author(s)
  Masayuki Arai, Aromhack Saysanasongkham, Kenta Imai, Yoshifumi Koyama, and Satoshi Fukumoto
- Organizer
  IEEE 12th International Workshop on RTL and High Level Testing
- Place of Presentation
  MNIT, Jaipur, India
- Data Source
  KAKENHI-PROJECT-23700062
[Presentation] ランダムパターンテストにおける故障検出率分布に関する考察2011
- Author(s)
  福本聡, 新井雅之, 原慎哉, 岩崎一彦
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会, DC2011-6
- Data Source
  KAKENHI-PROJECT-23500063
[Presentation] Area Per Yield and Defect Level of Cascaded TMR for Pipelined Processors2011
- Author(s)
  Masayuki Arai and Kazuhiko Iwasaki
- Organizer
  17th IEEE Pacific Rim International Symposium on Dependable Computing
- Place of Presentation
  Westin Pasadena, CA, USA
- Data Source
  KAKENHI-PROJECT-23700062
[Presentation] Area Per Yield and Defect Level of Cascaded TMR for Pipelined Processors2011
- Author(s)
  Masayuki Arai and Kazuhiko Iwasaki
- Organizer
  International Test Conference
- Place of Presentation
  Disneyland Hotel, Anaheim, CA, USA
- Data Source
  KAKENHI-PROJECT-23500063
[Presentation] Area Per Yield and Defect Level of Cascaded TMR for Pipelined Processors2011
- Author(s)
  M. Arai and K. Iwasaki
- Organizer
  International Test Conference (ITC)
- Data Source
  KAKENHI-PROJECT-23500063
[Presentation] 同時多重に発生する過渡故障を前提にレジスタを二重化した順序回路2009
- Author(s)
  丸本耕平, 新井雅之, 福本聡, 岩崎一彦
- Organizer
  電子情報通信学会総合大会
- Place of Presentation
  電子情報通信学会総合大会
- Year and Date
  2009-03-17
- Data Source
  KAKENHI-PROJECT-18500041
[Presentation] 同時多重に発生する過渡故障を前提にレジスタを重化した陣所回路2009
- Author(s)
  丸本耕平, 新井雅之, 福本聡, 岩崎一彦
- Organizer
  電子情報通信学会総合大会
- Place of Presentation
  愛媛大学
- Data Source
  KAKENHI-PROJECT-18500041
[Presentation] 耐故障プロセッサ評価モデルの解析について2008
- Author(s)
  福本聡, 新井雅之, 岩崎一彦
- Organizer
  電子情報通信学会技術研究報告
- Place of Presentation
  サンライフ萩
- Year and Date
  2008-12-12
- Data Source
  KAKENHI-PROJECT-18500041
[Presentation] 耐故障プロセッサ評価モデルの解析について2008
- Author(s)
  福本聡, 新井雅之, 岩崎一彦
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会
- Place of Presentation
  サンライフ萩
- Year and Date
  2008-12-12
- Data Source
  KAKENHI-PROJECT-18500041
[Presentation] 耐故障プロセッサの信頼性・性能評価手法に関する-考察2008
- Author(s)
  福本聡, 新井雅之, 岩崎一彦
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会
- Place of Presentation
  国立情報学研究所
- Year and Date
  2008-10-20
- Data Source
  KAKENHI-PROJECT-18500041
[Presentation] CMOSLSIのESD/Latch-up故障の解析-実データでの故障モード解析2008
- Author(s)
  小日向秀雄, 新井雅之, 福本聡
- Organizer
  電子情報通信学会技術研究報告
- Place of Presentation
  機械振興会館
- Data Source
  KAKENHI-PROJECT-18500041
[Presentation] 同時多重に発生する過渡故障を前提とした高信頼プロセッサ設計2008
- Author(s)
  木村真琴, 新井雅之, 福本聡, 岩崎一彦
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会
- Place of Presentation
  機械振興会館
- Year and Date
  2008-06-20
- Data Source
  KAKENHI-PROJECT-18500041
[Presentation] CMOS LSIのESD/Latch-up故障の解析-実データでの故障モード解析-2008
- Author(s)
  小日向秀雄, 新井雅之, 福本聡
- Organizer
  電子情報通信学会技術研究報告
- Place of Presentation
  機械振興会館
- Year and Date
  2008-02-08
- Data Source
  KAKENHI-PROJECT-18500041
[Presentation] 耐故障プロセッサの信頼性・性能評価手法に関する一考察2008
- Author(s)
  福本聡, 新井雅之, 岩崎一彦
- Organizer
  電子情報通信学会技術研究報告
- Place of Presentation
  国立情報学研究所
- Year and Date
  2008-10-20
- Data Source
  KAKENHI-PROJECT-18500041
[Presentation] 同時多重に発生する過渡故障を前提とした高信頼プロセッサ設計2008
- Author(s)
  木村真琴, 新井雅之, 福本聡, 岩崎一彦
- Organizer
  電子情報通信学会技術研究報告
- Place of Presentation
  機械振興会館
- Year and Date
  2008-06-20
- Data Source
  KAKENHI-PROJECT-18500041
[Presentation] Time Redundancy Processor with the Tolerance to Transient Faults Caused by Electromagnetic Waves2007
- Author(s)
  M. Kimura, M. Arai, S. Fukumoto, K. Iwasaki
- Organizer
  Workshop on Dependable and Secure Nanocomputing
- Place of Presentation
  Edinburgh, UK
- Year and Date
  2007-06-01
- Data Source
  KAKENHI-PROJECT-18500041
[Presentation] 安全・安心のための半導体設計・テスト技術2007
- Author(s)
  福本聡, 新井雅之, 岩崎一彦
- Organizer
  日本オペレーションズリサーチ学会第57回シンポジウム
- Place of Presentation
  鳥取大学(No.57)
- Data Source
  KAKENHI-PROJECT-18500041
[Presentation] 故障挿入によるTMRプロセッサの耐縮退故障性評価2007
- Author(s)
  丸本耕平, 新井雅之, 福本聡, 岩崎一彦
- Organizer
  第6回情報科学技術フォーラム(FIT2007)
- Place of Presentation
  中京大学
- Data Source
  KAKENHI-PROJECT-18500041
[Presentation] ディペンダブルVLSI2006
- Author(s)
  福本聡, 新井雅之, 岩崎一彦
- Organizer
  第10回システムLSIワークショップ講演資料集
- Place of Presentation
  北九州(No.10)
- Data Source
  KAKENHI-PROJECT-18500041
[Presentation] 過渡故障に耐性を持つ時間冗長プロセッサの検討2006
- Author(s)
  木村真琴, 新井雅之, 福本聡, 岩崎一彦
- Organizer
  電子情報通信学会技術研究報告書
- Place of Presentation
  高知
- Data Source
  KAKENHI-PROJECT-18500041
[Presentation] レイアウトを考慮したブリッジ/オープン故障カバレージの高精度見積法
- Author(s)
  新井雅之, 清水貴弘, 岩崎一彦
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会
- Place of Presentation
  東京
- Data Source
  KAKENHI-PROJECT-23500063
[Presentation] レイアウトを考慮したブリッジ/オープン故障カバレージの高精度見積法
- Author(s)
  新井雅之, 清水貴弘, 岩崎一彦
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会
- Place of Presentation
  Tokyo, Japan
- Data Source
  KAKENHI-PROJECT-23700062
[Presentation] Study on Routing Protocol for Structured P2P Network Taking Account of the Nodes Which Behave Like a Byzantine Fault
- Author(s)
  Satoshi Fukumoto, Tomoki Endo, Mamoru Ohara, and Masayuki Arai
- Organizer
  fast abstract of The 20th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2014)
- Place of Presentation
  Singapore (Public of Singapore)
- Year and Date
  2014-11-19 – 2014-11-21
- Data Source
  KAKENHI-PROJECT-24500070
[Presentation] クリティカルエリア解析に基づく故障カバレージ見積りに関する一考察
- Author(s)
  清水貴弘, 中山裕太, 新井雅之, 岩崎一彦
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会
- Place of Presentation
  Gifu, Japan
- Data Source
  KAKENHI-PROJECT-23700062
[Presentation] LSIのオープン欠陥クリティカルエリアに関する一検討
- Author(s)
  中山裕太, 清水貴弘, 新井雅之, 岩崎一彦
- Organizer
  電子情報通信学会総合大会
- Place of Presentation
  岐阜市
- Data Source
  KAKENHI-PROJECT-23500063
[Presentation] 異なる欠陥粒径とビアオープンを考慮した重み付き故障カバレージに関する一考察
- Author(s)
  中山裕太, 新井雅之, 史紅波, 岩崎一彦
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会
- Place of Presentation
  機械振興会館
- Data Source
  KAKENHI-PROJECT-23500063
[Presentation] クリティカルエリア解析に基づく故障カバレージ見積りに関する一考察
- Author(s)
  清水貴弘, 新井雅之, 岩崎一彦
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会
- Place of Presentation
  東京
- Data Source
  KAKENHI-PROJECT-23500063
[Presentation] Hybrid ARQ for DC-DC Converter Noise in Controller Area Networks
- Author(s)
  Muneyuki Nakamura, Mamoru Ohara, Aromhack Saysansongkham, Masayuki Arai, Kazuya Sakai, and Satoshi Fukumoto
- Organizer
  Proceedings of International Workshop on Applications of Wireless Ad hoc and Sensor Networks (AWASN'14)
- Place of Presentation
  Minneapolis (USA)
- Year and Date
  2014-09-09 – 2014-09-12
- Data Source
  KAKENHI-PROJECT-24500070
[Presentation] Note on Layout-Aware Weighted Probabilistic Bridge Fault Coverage
- Author(s)
  M. Arai, Y. Shimizu, and K. Iwasaki
- Organizer
  Asian Test Symposium
- Place of Presentation
  Niigata City
- Data Source
  KAKENHI-PROJECT-23500063

1. FUKUMOTO Satoshi (50247590)

# of Collaborated Projects: 3 results

# of Collaborated Products: 65 results
2. IWASAKI Kazuhiko (40232649)

# of Collaborated Projects: 3 results

# of Collaborated Products: 67 results

Arai Masayuki 新井 雅之

ARAI Masayuki 新井 雅之

Research Projects

Research Products

Co-Researchers

SoC Defect Level Estimation and Reduction by Multi-Model SamplingPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

On-Line Masking of Periodic Multiple Transient Faults under Highly Electromagnetic EnvironmentsPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Studies on Fault Tolerant Sequential Circuits for a New Transient Fault Model under Highly Electromagnetic Environment

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Highly Accurate Devect Level Estimation of SOC Chips Based on Its Layouts

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

SoC Defect Level Reduction Based on Critical Area SamplingPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

A Basic Study on SoC Base Dependable Processor with Self-healing Mechanism for Faults

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Studies on Dependable Distributed Storage Cluster for SoC Design System using SAN/NAS

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Book] ``Chapter 11: Hybrid Checkpointing Technique Using Incremental Snapshots,'' Reliability Modeling with Applications2014

Author(s)

Total Pages

Publisher

Data Source

[Journal Article] Layout Feature Extraction using CNN Classification in Root Cause Analysis of LSI Defects2021

Author(s)

Journal Title

DOI

Data Source

[Journal Article] CNN-based Layout Segment Classification for Analysis of Layout-induced Failures2020

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Layout-Based Test Coverage Verification for High-Reliability Devices2017

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Fault masking issue on a dependable processor using BIST under highly electromagnetic environment2017

Author(s)

Journal Title

DOI

Data Source

[Journal Article] A Low Capture Power Test Generation Method Based on Capture Safe Test Vector Manipulation2017

Author(s)

Journal Title

DOI

NAID

ISSN

Language

Data Source

Arai Masayuki 新井雅之

ARAI Masayuki 新井雅之