INAMOTO TSUTOMU 稲元勉

… Alternative Names

稲元勉イナモトツトム

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Researcher Number	10379513
Other IDs
Affiliation (Current)	2025: 愛媛大学, 理工学研究科(工学系), 講師
Affiliation (based on the past Project Information) *help	2019 – 2023: 愛媛大学, 理工学研究科(工学系), 講師 2016: 愛媛大学, 理工学研究科(工学系), 助教 2014 – 2015: 愛媛大学, 理工学研究科, 助教
Review Section/Research Field	Except Principal Investigator Basic Section 60040:Computer system-related / Information network
Keywords	Except Principal Investigator 出力応答圧縮 / テストパターン生成 / フィールドテスト / LSIの故障診断 / アダプティブ故障診断 / LSIテスト / 組込み自己テスト / テストパターン / ニューラルネットワーク / 出力圧縮 … More / テストポイント / 機械学習 / 故障辞書 / テスト容易化設計 / 故障診断 / セキュリティ / グリッドコンピューティング / 分散処理 Less

Study on Adaptive Fault Diagnosis for Reducing Fault Diagnosis Time
- Principal Investigator
  
  higami Yoshinobu
- Project Period (FY)
  2019 – 2023
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 60040:Computer system-related
- Research Institution
  Ehime University
Realization of compatibility between reliability securing and processing performance in external GRID computing system capable of secure processing
- Principal Investigator
  
  KOBAYASHI SHINYA
- Project Period (FY)
  2014 – 2016
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Information network
- Research Institution
  Ehime University

All 2023 2022 2021 2020 2019 2017 2016 2015 Other

All Journal Article Presentation Book

[Book] Hard and Soft Computing for Artificial Intelligence, Multimedia and Security, Chapter 10 ( pp.112-122)2017
- Author(s)
  K. Yamaguchi, T. Inamoto, K. Endo, Y. Higami, and S. Kobayashi
- Total Pages
  368
- Publisher
  Springer
- Data Source
  KAKENHI-PROJECT-26330105
[Journal Article] Improving of Fault Diagnosis Ability by Test Point Insertion and Output Compaction2023
- Author(s)
  Higami Yoshinobu、Inamoto Tsutomu、Wang Senling、Takahashi Hiroshi、Saluja Kewal K.
- Journal Title
  
  Proc. in 2023 International Technical Conference on Circuits/Systems, Computers, and Communications (ITC-CSCC)
  
  Volume: - Pages: 1-6
- DOI
  10.1109/itc-cscc58803.2023.10212844
- Peer Reviewed / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22K11955, KAKENHI-PROJECT-19K11877
[Journal Article] Preliminary Study on Noise-Resilient Artificial Neural Networks for On-Chip Test Generation2022
- Author(s)
  Tsutomu Inamoto, Tomoki Nishino, Senling Wang, Yoshinobu Higami and Hiroshi Takahashi
- Journal Title
  
  Proceedings of IEEE 11th Global Conference on Consumer Electronics
  
  Volume: - Pages: 561-565
- DOI
  10.1109/gcce56475.2022.10014218
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19K11877, KAKENHI-PROJECT-19K20234
[Journal Article] Machine Learning Based Fault Diagnosis for Stuck-at Faults and Bridging Faults2022
- Author(s)
  Yoshinobu Higami, Takaya Yamauchi, Tsutomu Inamoto, Senling Wang, Hiroshi Takahashi, Kewal K. Saluja
- Journal Title
  
  Proceedings of International Technical Conference on Circuits/Systems, Computers and Communications
  
  Volume: - Pages: 477-480
- DOI
  10.1109/itc-cscc55581.2022.9894966
- Peer Reviewed / Open Access / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19K11877, KAKENHI-PROJECT-22K11955, KAKENHI-PROJECT-19K20234
[Journal Article] Compaction of Fault Dictionary without Degrading Diagnosis Ability,2021
- Author(s)
  Yoshinobu Higami, Tomokazu Nakamura, Tsutomu Inamoto, Senling Wang, Hiroshi Takahashi, Kewal K. Saluja
- Journal Title
  
  Proceedings of International Technical Conference on Circuits/Systems, Computers and Communications
  
  Volume: - Pages: 51-54
- DOI
  10.1109/itc-cscc52171.2021.9501474
- Peer Reviewed / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19K11877, KAKENHI-PROJECT-19K20234
[Journal Article] Preliminary Evaluation of Artificial Neural Networks as Test Pattern Generators for BIST2021
- Author(s)
  Tsutomu Inamoto, Kazuki Ohtomo, and Yoshinobu Higami
- Journal Title
  
  Proceedings of International Technical Conference on Circuits/Systems, Computers and Communications
  
  Volume: - Pages: 307-310
- DOI
  10.1109/itc-cscc52171.2021.9501263
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19K11877
[Journal Article] Regeneration of Test Patterns for BIST by Using Artificial Neural Networks2020
- Author(s)
  Tsutomu Inamoto, Yoshinobu Higami
- Journal Title
  
  Proc. Int. Technical Conf. on Circuits/Systems, Computers and Communications
  
  Volume: - Pages: 137-140
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19K11877
[Journal Article] Reduction of Fault Dictionary Size by Optimizing the Order of Test Patterns Application2020
- Author(s)
  Yoshinobu Higami, Tsutomu Inamoto, Senling Wang, Hiroshi Takahashi, Kewal K. Saluja
- Journal Title
  
  Proc. Int. Technical Conf. on Circuits/Systems, Computers and Communications
  
  Volume: - Pages: 131-136
- Peer Reviewed / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19K11877
[Journal Article] Formulation of a Test Pattern Measure that Counts Distinguished Fault-Pairs for Circuit Fault Diagnosis2020
- Author(s)
  Tsutomu Inamoto and Yoshinobu Higami
- Journal Title
  
  IEICE Trans. on Fundamentals
  
  Volume: E103-A Pages: 1456-1463
- NAID
  130007948287
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19K11877
[Journal Article] Compact Dictionaries for Reducing Compute Time in Adaptive Diagnosis2019
- Author(s)
  Yoshinobu Higami, Tomokazu Nakamura, Tsutomu Inamoto, Senling Wang, Hiroshi Takahashi, Kewal K Saluja
- Journal Title
  
  Proceedings Internationa Technical Conference on Circuits/Systems, Computers and Communications
  
  Volume: - Pages: 525-528
- DOI
  10.1109/itc-cscc.2019.8793429
- Peer Reviewed / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19K11877, KAKENHI-PROJECT-19K20234
[Journal Article] 畳み込みニューラルネットワークを用いたテストパターンの再生2019
- Author(s)
  稲元勉, 樋上喜信
- Journal Title
  
  第32回回路とシステムワークショップ (KWS 32) 論文集
  
  Volume: - Pages: 234-239
- NAID
  40021991413
- Data Source
  KAKENHI-PROJECT-19K11877
[Journal Article] Application of Convolutional Neural Networks to RegenerateDeterministic Test Pattern for BIST2019
- Author(s)
  Tsutomu Inamoto and Yoshinobu Higami
- Journal Title
  
  Proceedings Internationa Technical Conference on Circuits/Systems, Computers and Communications
  
  Volume: - Pages: 523-524
- DOI
  10.1109/itc-cscc.2019.8793374
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19K11877
[Journal Article] Evaluation of Influence Exerted by a Malicious Group’s Various Aims in the External Grid2016
- Author(s)
  K. Yamaguchi, T. Inamoto, K. Endo, Y. Higami, and S. Kobayashi
- Journal Title
  
  The 20th International Multi-Conference on Advanced Computer Systems
  
  Volume: - Pages: 112-122
- DOI
  10.1007/978-3-319-48429-7_11
- ISBN
  9783319484280, 9783319484297
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-26330105
[Presentation] 圧縮優先度の近似的計算による故障辞書の圧縮処理時間の短縮2022
- Author(s)
  濱野郁也，稲元勉，樋上喜信
- Organizer
  令和4年度電気・電子・情報関係学会四国支部連合大会
- Data Source
  KAKENHI-PROJECT-19K11877
[Presentation] 機械学習を用いた複数故障モデルの故障診断2021
- Author(s)
  山内崇矢，稲元勉，王森レイ，樋上喜信，高橋寛
- Organizer
  令和3年度電気・電子・情報関係学会四国支部連合大会
- Data Source
  KAKENHI-PROJECT-19K11877
[Presentation] 悪人集団の盗視に対抗する保護処理を用いたエクスターナルグリッドの性能評価2016
- Author(s)
  山口晃右，稲元勉，樋上喜信，小林真也
- Organizer
  情報処理学会マルチメディア, 分散, 協調とモバイルシンポジウム (DICOMO2016)
- Place of Presentation
  鳥羽シーサイドホテル（三重県鳥羽市）
- Year and Date
  2016-07-07
- Data Source
  KAKENHI-PROJECT-26330105
[Presentation] 暫定閾値に基づく先行処理を用いたエクスターナルグリッドにおける閾値と処理時間の関係2016
- Author(s)
  田中祐生, 井上竜太郎, 稲元勉, 遠藤慶一, 樋上喜信, 小林真也
- Organizer
  平成28年度電気関係学会四国支部連合大会
- Place of Presentation
  徳島大学（徳島県・徳島市）
- Data Source
  KAKENHI-PROJECT-26330105
[Presentation] 悪人集団の盗視に対抗する保護処理を用いたエクスターナルグリッドの性能評価2016
- Author(s)
  山口晃右, 稲元勉, 樋上喜信, 小林真也
- Organizer
  マルチメディア，分散，協調とモバイルシンポジウム (DICOMO2016)
- Place of Presentation
  鳥羽シーサイドホテル（三重県・鳥羽市）
- Year and Date
  2016-07-05
- Data Source
  KAKENHI-PROJECT-26330105
[Presentation] エクスターナルグリッドに対する依存関係を利用した不正解析のリスクを軽減する手法2016
- Author(s)
  山口晃右，稲元　勉，樋上喜信，小林真也
- Organizer
  第78回情報処理学会全国大会
- Place of Presentation
  慶應義塾大学矢上キャンパス（神奈川県横浜市）
- Year and Date
  2016-03-09
- Data Source
  KAKENHI-PROJECT-26330105
[Presentation] セキュアプロセッシングにおける先行処理による処理時間改善に対する定量的評価2015
- Author(s)
  廣瀬吉隆，稲元勉，樋上喜信，小林真也
- Organizer
  第14回情報科学技術フォーラム (FIT2015)
- Place of Presentation
  愛媛大学（愛媛県松山市）
- Year and Date
  2015-09-15
- Data Source
  KAKENHI-PROJECT-26330105
[Presentation] プログラム断片の連続性に基づくセキュアプロセッシングの秘匿性能に関する調査2015
- Author(s)
  中矢匠, 稲元勉, 樋上喜信, 小林真也
- Organizer
  情報処理学会マルチメディア, 分散, 協調とモバイルシンポジウム (DICOMO2015)
- Place of Presentation
  ホテル安比グランド（岩手県八幡平市）
- Year and Date
  2015-07-08
- Data Source
  KAKENHI-PROJECT-26330105
[Presentation] プログラム断片の連続性に基づくセキュアプロセッシングの秘匿性能に関する調査
- Author(s)
  中矢匠, 稲元勉, 樋上喜信, 小林真也
- Organizer
  マルチメディア, 分散, 協調とモバイルシンポジウム(DICOMO2015)
- Place of Presentation
  岩手県八幡平市安比高原
- Year and Date
  2015-07-08 – 2015-07-10
- Data Source
  KAKENHI-PROJECT-26330105

1. KOBAYASHI SHINYA (10234824)

# of Collaborated Projects: 1 results

# of Collaborated Products: 9 results
2. higami Yoshinobu (40304654)

# of Collaborated Projects: 1 results

# of Collaborated Products: 13 results
3. 高橋寛 (80226878)

# of Collaborated Projects: 1 results

# of Collaborated Products: 7 results
4. 王森レイ (90735581)

# of Collaborated Projects: 1 results

# of Collaborated Products: 7 results

INAMOTO TSUTOMU 稲元 勉

稲元 勉 イナモト ツトム

Research Projects

Research Products

Co-Researchers

Study on Adaptive Fault Diagnosis for Reducing Fault Diagnosis Time

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Realization of compatibility between reliability securing and processing performance in external GRID computing system capable of secure processing

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Book] Hard and Soft Computing for Artificial Intelligence, Multimedia and Security, Chapter 10 ( pp.112-122)2017

Author(s)

Total Pages

Publisher

Data Source

[Journal Article] Improving of Fault Diagnosis Ability by Test Point Insertion and Output Compaction2023

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Preliminary Study on Noise-Resilient Artificial Neural Networks for On-Chip Test Generation2022

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Machine Learning Based Fault Diagnosis for Stuck-at Faults and Bridging Faults2022

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Compaction of Fault Dictionary without Degrading Diagnosis Ability,2021

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Preliminary Evaluation of Artificial Neural Networks as Test Pattern Generators for BIST2021

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Regeneration of Test Patterns for BIST by Using Artificial Neural Networks2020

Author(s)

Journal Title

Data Source

[Journal Article] Reduction of Fault Dictionary Size by Optimizing the Order of Test Patterns Application2020

Author(s)

Journal Title

Data Source

[Journal Article] Formulation of a Test Pattern Measure that Counts Distinguished Fault-Pairs for Circuit Fault Diagnosis2020

Author(s)

Journal Title

NAID

Data Source

[Journal Article] Compact Dictionaries for Reducing Compute Time in Adaptive Diagnosis2019

Author(s)

Journal Title

DOI

Data Source

[Journal Article] 畳み込みニューラルネットワークを用いたテストパターンの再生2019

Author(s)

Journal Title

NAID

Data Source

[Journal Article] Application of Convolutional Neural Networks to RegenerateDeterministic Test Pattern for BIST2019

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Evaluation of Influence Exerted by a Malicious Group’s Various Aims in the External Grid2016

Author(s)

Journal Title

DOI

ISBN

INAMOTO TSUTOMU 稲元勉

稲元勉イナモトツトム

[Presentation] 悪人集団の盗視に対抗する保護処理を用いたエクスターナルグリッドの性能評価2016