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Omura Ichiro  大村 一郎

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大村 一郎  オオムラ イチロウ

OMURA Ichiro  大村 一郎

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Researcher Number 10510670
Other IDs
Affiliation (Current) 2025: 九州工業大学, 大学院生命体工学研究科, 教授
Affiliation (based on the past Project Information) *help 2023: 九州工業大学, 大学院生命体工学研究科, 教授
2017 – 2020: 九州工業大学, 大学院生命体工学研究科, 教授
2015 – 2016: 九州工業大学, 大学院工学研究院, 教授
2012: 九州工業大学, 工学(系)研究科(研究院), 教授
2012: 九州工業大学, 工学研究院, 教授
2010 – 2011: 九州工業大学, 大学院・工学研究院, 教授
Review Section/Research Field
Principal Investigator
Basic Section 21010:Power engineering-related / Power engineering/Power conversion/Electric machinery / Power engineering/Power conversion/Electric machinery
Except Principal Investigator
Basic Section 21010:Power engineering-related / Power engineering/Power conversion/Electric machinery
Keywords
Principal Investigator
パワー半導体 / 窒化ガリウム(GaN) / TCADシミュレーション / コラプス現象 / GaNパワー半導体 / PiNダイオード / パワー / IGBT / バイポーラ / パワー半導体デバイス … More / 終端構造 / ワイドバンドギャップ / 不純物活性化 / ダイヤモンド / pip構造 / RESURF構造 / 超高耐圧パワー素子 / 二酸化炭素排出削減 / 省エネルギー / 電子デバイス・機器 / 電力用ダイオード / パワーエレクトロニクス … More
Except Principal Investigator
予知保全 / 電流センサー / ダブルパルス試験 / パワーサイクル試験 / 電流センサ / 簡易モジュール / パワーモジュール / 故障解析 / 温度分布 / 超音波 / 超音波顕微鏡 / 信頼性 / 熱解析 / パワーデバイス Less
  • Research Projects

    (6 results)
  • Research Products

    (29 results)
  • Co-Researchers

    (4 People)
  •  Extremely low energy loss bipolar power semiconductor devicePrincipal Investigator

    • Principal Investigator
      大村 一郎
    • Project Period (FY)
      2023 – 2025
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Review Section
      Basic Section 21010:Power engineering-related
    • Research Institution
      Kyushu Institute of Technology
  •  インフラ設備用パワー半導体モジュールの遠隔異常監視機能の開発

    • Principal Investigator
      附田 正則
    • Project Period (FY)
      2019 – 2020
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Review Section
      Basic Section 21010:Power engineering-related
    • Research Institution
      Kyushu Institute of Technology
  •  Diamond Power Electronics: Innovative Device TechnologyPrincipal Investigator

    • Principal Investigator
      Omura Ichiro
    • Project Period (FY)
      2018 – 2020
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Review Section
      Basic Section 21010:Power engineering-related
    • Research Institution
      Kyushu Institute of Technology
  •  窒化ガリウムパワー半導体素子の信頼性に関する研究Principal Investigator

    • Principal Investigator
      大村 一郎
    • Project Period (FY)
      2017 – 2018
    • Research Category
      Grant-in-Aid for JSPS Fellows
    • Research Field
      Power engineering/Power conversion/Electric machinery
    • Research Institution
      Kyushu Institute of Technology
  •  Temperature distribution imaging for power devices by ultrasonic wave

    • Principal Investigator
      Watanabe Akihiko
    • Project Period (FY)
      2015 – 2017
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Power engineering/Power conversion/Electric machinery
    • Research Institution
      Kyushu Institute of Technology
  •  Innovative Low Loss Semiconductor Rectifier with Pulsed Carrier Injection MechanismPrincipal Investigator

    • Principal Investigator
      OMURA Ichiro
    • Project Period (FY)
      2010 – 2012
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Power engineering/Power conversion/Electric machinery
    • Research Institution
      Kyushu Institute of Technology

All 2018 2013 2012 2011 2010

All Journal Article Presentation Patent

  • [Journal Article] Role of Simulation Technology for the Progress in Power Devices and Their Applications2013

    • Author(s)
      Hiromichi Ohashi, Ichiro Omura
    • Journal Title

      IEEE TRANSACTION ON ELECTRON DEVICES

      Volume: Vol.60, No.2 Issue: 2 Pages: 528-536

    • DOI

      10.1109/ted.2012.2228272

    • NAID

      120005841742

    • URL

      http://dx.doi.org/

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Journal Article] IGBT Scaling Principle Toward CMOS Compatible Wafer Processes2012

    • Author(s)
      Masahiro Tanaka, Ichiro Omura
    • Journal Title

      Solid-State Electronics

      Volume: vol.80 Pages: 118-123

    • DOI

      10.1016/j.sse.2012.10.020

    • NAID

      120005841745

    • URL

      http://dx.doi.org/

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Journal Article] Structure Oriented Compact Model for Advanced Trench IGBTs without Fitting Parameters for Extreme Condition: part I2011

    • Author(s)
      Masahiro Tanaka, Ichiro Omura
    • Journal Title

      Microelectronics Reliability

      Volume: vol.51 Issue: 9-11 Pages: 1933-1937

    • DOI

      10.1016/j.microrel.2011.07.050

    • URL

      http://dx.doi.org/

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Patent] 高電圧絶縁ゲート型電力用半導体装置2012

    • Inventor(s)
      大村一郎、田中雅浩、三木大和
    • Industrial Property Rights Holder
      九州工業大学
    • Industrial Property Number
      2012-123462
    • Filing Date
      2012-05-30
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Patent] 半導体装置及び駆動方法2012

    • Inventor(s)
      大村一郎、松本泰明、津田基裕、
    • Industrial Property Rights Holder
      九州工業大学
    • Industrial Property Rights Type
      特許
    • Filing Date
      2012-05-14
    • Overseas
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Patent] 半導体装置及び駆動方法2012

    • Inventor(s)
      大村一郎、松本泰明、津田基裕、附田正則
    • Industrial Property Rights Holder
      九州工業大学
    • Filing Date
      2012-05-17
    • Overseas
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Patent] 半導体装置及び駆動方法2012

    • Inventor(s)
      大村一郎、松本泰明、津田基裕、附田正則
    • Industrial Property Rights Holder
      九州工業大学
    • Filing Date
      2012-05-14
    • Overseas
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Patent] 高電圧電力用半導体装置2012

    • Inventor(s)
      大村一郎、瀬戸康太、附田正則
    • Industrial Property Rights Holder
      九州工業大学
    • Industrial Property Number
      2012-123461
    • Filing Date
      2012-05-30
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Patent] 高電圧絶縁ゲート型電力用半導体装置およびその製造方法2012

    • Inventor(s)
      大村一郎、田中雅浩、附田正則、三木大和
    • Industrial Property Rights Holder
      九州工業大学
    • Industrial Property Number
      2012-195347
    • Filing Date
      2012-09-05
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Patent] 半導体装置及び駆動方法2012

    • Inventor(s)
      大村一郎、松本泰明、津田基裕、
    • Industrial Property Rights Holder
      九州工業大学
    • Industrial Property Rights Type
      特許
    • Filing Date
      2012-05-17
    • Overseas
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Patent] 高電圧絶縁ゲート型電力用半導体装置2012

    • Inventor(s)
      大村一郎、田中雅浩、附田正則、
    • Industrial Property Rights Holder
      九州工業大学
    • Industrial Property Rights Type
      特許
    • Industrial Property Number
      2012-195347
    • Filing Date
      2012-09-05
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Patent] 半導体装置及び駆動方法2011

    • Inventor(s)
      大村一郎、松本泰明、津田基裕、附田正則
    • Industrial Property Rights Holder
      九州工業大学
    • Patent Publication Number
      2012-243918
    • Filing Date
      2011-05-18
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Patent] 半導体装置及び駆動方法2011

    • Inventor(s)
      大村一郎, 松本泰明, 津田基裕, 附田正則
    • Industrial Property Rights Holder
      国立大学法人九州工業大学
    • Industrial Property Number
      2011-111883
    • Filing Date
      2011-05-18
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Presentation] Prospects of reliable GaN technology in power devices2018

    • Author(s)
      Giorgia Longobardi, Ichiro Omura
    • Organizer
      BIT’s 4th Annual World Congress of Smart Materials-2018 (WCSM-2018)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-17F17809
  • [Presentation] 「高耐圧パワーデバイス用スケールダウン・テストヘッドの開発」2013

    • Author(s)
      松吉峻、附田正則(ICSEAD)、平井秀敏、大村一郎
    • Organizer
      電子情報通信学会
    • Place of Presentation
      熊本、日本
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Presentation] 高耐圧パワーデバイス用スケールダウン・テストヘッドの開発2013

    • Author(s)
      松吉峻、附田正則(ICSEAD)、平井秀敏、大村一郎
    • Organizer
      電子情報通信学会 IEICE Technical Report EE2012-46
    • Place of Presentation
      熊本
    • Year and Date
      2013-01-24
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Presentation] Lateral Power Devices: from LDMOS, LIGBT to GaN2012

    • Author(s)
      Ichiro Omura
    • Organizer
      2012 International Symposium on VLSI Technology
    • Place of Presentation
      Hsinchu, Taiwan
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Presentation] Universal Trench Edge Termination Design2012

    • Author(s)
      Kota Seto, Ryu Kamibaba, Masanori Tsukuda and Ichiro Omura
    • Organizer
      Proc. Of ISPSD
    • Place of Presentation
      Bruges, Belgium
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Presentation] “Universal Trench Edge Termination Design”2012

    • Author(s)
      Kota Seto, Ryu Kamibaba, Masanori Tsukuda, Ichiro Omura
    • Organizer
      The 24th International Symposium on Power Semiconductor Devices & IC's (ISPSD’12)
    • Place of Presentation
      Bruges, Belgium
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Presentation] Semiconductor Power Switches: Principles and the Future2012

    • Author(s)
      Ichiro Omura
    • Organizer
      Proc. Of ISPSD
    • Place of Presentation
      Bruges, Belgium
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Presentation] Scattering Parameter Approach to Power MOSFET Design for EMI2012

    • Author(s)
      Masanori Tsukuda, Keiichiro Kawakami and Ichiro Omura
    • Organizer
      Proc. Of ISPSD
    • Place of Presentation
      Bruges, Belgium
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Presentation] “Lateral Power Devices: from LDMOS, LIGBT to GaN”2012

    • Author(s)
      Ichiro Omura
    • Organizer
      2012 International Symposium on VLSI Technology, Systems and Applications VLSI Design, Automation and Test
    • Place of Presentation
      Hsinchu, Taiwan
    • Invited
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Presentation] Scaling Rule for Very Shallow Trench IGBT toward CMOS Process Compatibility2012

    • Author(s)
      Masahiro Tanaka and Ichiro Omura
    • Organizer
      Proc. Of ISPSD
    • Place of Presentation
      Bruges, Belgium
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Presentation] “Scaling Rule for Very Shallow Trench IGBT toward CMOS Process Compatibility”2012

    • Author(s)
      Masahiro Tanaka, Ichiro Omura
    • Organizer
      The 24th International Symposium on Power Semiconductor Devices & IC's (ISPSD’12)
    • Place of Presentation
      Bruges, Belgium
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Presentation] “Scattering Parameter Approach to Power MOSFET Design for EMI”2012

    • Author(s)
      Masanori Tsukuda, Keiichiro Kawakami, Ichiro Omura
    • Organizer
      The 24th International Symposium on Power Semiconductor Devices & IC's (ISPSD’12)
    • Place of Presentation
      Bruges, Belgium
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Presentation] Ultra Low Loss Trench Gate PCI-PiN Diode with V_F<350mV2011

    • Author(s)
      Motohiro Tsuda, Yasuaki Matsumoto, Ichiro Omura
    • Organizer
      The 23rd International Symposium on Power Semicon ductor Devices & IC's
    • Place of Presentation
      San Diego, USA
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Presentation] Ultra Low Loss Trench Gate PCI-PiN Diode with VF<350mV2011

    • Author(s)
      Motohiro Tsuda, Yasuaki Matsumoto, Ichiro Omura
    • Organizer
      he 23rd International Symposium on Power Semiconductor Devices & IC's (ISPSD'11)
    • Place of Presentation
      San Diego, USA
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Presentation] Challenge to the Barrier of Conduction Loss in PiN Diode toward VF<300 mV with Pulsed Carrier Injection Concept2010

    • Author(s)
      Yasuaki Matumoto, Kenichi Takahama, Ichiro Omura
    • Organizer
      The 22^<nd> International Symposium on Power Semiconductor Devices and ICs (ISPSD'10)
    • Place of Presentation
      Hiroshima, Japan
    • Data Source
      KAKENHI-PROJECT-22360118
  • [Presentation] Challenge to the Barrier of Conduction Loss in PiN Diode toward VF<300 mV with Pulsed Carrier Injection Concept2010

    • Author(s)
      Yasuaki Matumoto, Kenichi Takahama, Ichiro Omura
    • Organizer
      The 22nd International Symposium on Power Semiconductor Devices and ICs (ISPSD'10)
    • Place of Presentation
      Hiroshima, Japan
    • Data Source
      KAKENHI-PROJECT-22360118
  • 1.  Watanabe Akihiko (80363406)
    # of Collaborated Projects: 3 results
    # of Collaborated Products: 0 results
  • 2.  附田 正則 (00579154)
    # of Collaborated Projects: 3 results
    # of Collaborated Products: 0 results
  • 3.  長谷川 一徳 (80712637)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 4.  LONGOBARDI GIORGIA
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 2 results

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