Yokogawa Ryo 横川凌

Researcher Number	10880619
Other IDs
Affiliation (Current)	2025: 広島大学, 半導体産業技術研究所, 助教
Affiliation (based on the past Project Information) *help	2020 – 2024: 明治大学, 理工学部, 助教
Review Section/Research Field	Principal Investigator Basic Section 21050:Electric and electronic materials-related / 0302:Electrical and electronic engineering and related fields
Keywords	Principal Investigator 界面 / 表面 / X線非弾性散乱 / 熱伝導率 / SiGe / 局在振動モード / 非調和振動 / ナノ構造 / ラマン分光法 / シリコンゲルマニウム … More / フォノン / ラマンシフト / 温度可変ラマン分光法 / 熱酸化膜 / Ｘ線回折 / Si / 熱電発電デバイス / CTR散乱 / 放射光X線回折 / Si酸化膜 / 放射光 / X線回折 / 酸化膜 / 熱電変換 / シリコン Less

Research Projects
(3 results)
Research Products
(24 results)

斜入射X線非弾性散乱法によるGeおよびSi表面・界面のフォノン散乱解明に関する研究Principal Investigator
- Principal Investigator
  
  横川凌
- Project Period (FY)
  2024 – 2026
- Research Category
  
  Grant-in-Aid for Early-Career Scientists
- Review Section
  
  Basic Section 21050:Electric and electronic materials-related
- Research Institution
  Meiji University
Study on thermal transport mechanism at nanoscale of SiGe alloys using variable temperature Raman spectroscopyPrincipal Investigator
- Principal Investigator
  
  Yokogawa Ryo
- Project Period (FY)
  2021 – 2023
- Research Category
  
  Grant-in-Aid for Early-Career Scientists
- Review Section
  
  Basic Section 21050:Electric and electronic materials-related
- Research Institution
  Meiji University
Study on evaluation of thermal properties for thermoelectric Si device by temperature dependent X-ray diffraction with synchrotron radiationPrincipal Investigator
- Principal Investigator
  
  Yokogawa Ryo
- Project Period (FY)
  2020 – 2021
- Research Category
  
  Grant-in-Aid for Research Activity Start-up
- Review Section
  
  0302:Electrical and electronic engineering and related fields
- Research Institution
  Meiji University

All 2024 2023 2022 2021 2020

All Journal Article Presentation

[Journal Article] Local thermal conductivity properties of a SiGe nanowire observed by laser power sweep Raman spectroscopy2024
- Author(s)
  Sugawa Sho、Yokogawa Ryo、Ogura Atsushi
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 63 Issue: 2 Pages: 02SP68-02SP68
- DOI
  10.35848/1347-4065/ad1bc0
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21K14201
[Journal Article] Determination of Ge-fraction-shift coefficients for Raman spectroscopy in all vibration modes investigated by single-crystalline bulk SiGe and its application to strain evaluation in SiGe film grown on substrate2024
- Author(s)
  Yokogawa Ryo、Sugawa Sho、Yonenaga Ichiro、Arai Yasutomo、Ogura Atsushi
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 63 Issue: 3 Pages: 035503-035503
- DOI
  10.35848/1347-4065/ad29db
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21K14201
[Journal Article] Temperature Dependence of Raman Peak Shift in Single-Crystalline Silicon-Germanium2023
- Author(s)
  Sugawa Sho、Yokogawa Ryo、Yoshioka Kazutoshi、Arai Yasutomo、Yonenaga Ichiro、Ogura Atsushi
- Journal Title
  
  ECS Journal of Solid State Science and Technology
  
  Volume: 12 Issue: 6 Pages: 064004-064004
- DOI
  10.1149/2162-8777/acdffa
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21K14201
[Journal Article] Origin of carrier lifetime degradation in floating-zone silicon during a high-temperature process for insulated gate bipolar transistor2020
- Author(s)
  Yokogawa Ryo、Kobayashi Hiroto、Numasawa Yohichiroh、Ogura Atsushi、Nishizawa Shin-ichi、Saraya Takuya、Ito Kazuo、Takakura Toshihiko、Suzuki Shinichi、Fukui Munetoshi、Takeuchi Kiyoshi、Hiramoto Toshiro
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 59 Issue: 11 Pages: 115503-115503
- DOI
  10.35848/1347-4065/abc1d0
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20K22418
[Presentation] SiGeラマンスペクトルの非対称ブロードニングに関する考察2024
- Author(s)
  横川凌, 寿川尚, 前田唯葉, 荒井康智, 米永一郎, 小椋厚志
- Organizer
  第71回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-21K14201
[Presentation] Local Thermal Conductivity Properties of SiGe Nanowire Observed by Laser Power Sweep Raman Spectroscopy2023
- Author(s)
  S. Sugawa, R. Yokogawa, A. Ogura
- Organizer
  36th International Microprocess and Nanotechnology Conference 2023 (MNC2023)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K14201
[Presentation] レーザパワー掃引ラマン分光法によるSiGeナノワイヤの熱伝導特性評価2023
- Author(s)
  寿川尚, 横川凌, 小椋厚志
- Organizer
  第7回フォノンエンジニアリング研究会
- Data Source
  KAKENHI-PROJECT-21K14201
[Presentation] ラマン分光法によるSiGeナノワイヤの熱伝導測定2023
- Author(s)
  寿川尚, 横川凌, 小椋厚志
- Organizer
  第84回応用物理学会秋季学術講演会
- Data Source
  KAKENHI-PROJECT-21K14201
[Presentation] 液浸ラマン分光法による高Ge濃度SiGe薄膜のラマンスペクトルに現れるブロードピークの温度依存性評価2023
- Author(s)
  前田唯葉, 横川凌, 小椋厚志
- Organizer
  第7回フォノンエンジニアリング研究会
- Data Source
  KAKENHI-PROJECT-21K14201
[Presentation] 3次元自己組織化多層SiGeナノドットの熱物性2023
- Author(s)
  横川凌, 寿川尚, 前田唯葉, 伊藤佑太, 山下雄一郎, Wen Wei-Chen, 山本裕司, 小椋厚志
- Organizer
  第84回応用物理学会秋季学術講演会
- Data Source
  KAKENHI-PROJECT-21K14201
[Presentation] 3次元自己組織化多層SiGeナノドットのフォノン散乱評価2023
- Author(s)
  横川凌, 寿川尚, 前田唯葉, 伊藤佑太, 山下雄一郎, Wen Wei-Chen, 山本裕司, 小椋厚志
- Organizer
  第7回フォノンエンジニアリング研究会
- Data Source
  KAKENHI-PROJECT-21K14201
[Presentation] バルクSiGeを用いた無歪ラマンシフト全振動モードの導出2023
- Author(s)
  横川凌, 寿川尚, 柴山裕貴, 荒井康智, 米永一郎, 小椋厚志
- Organizer
  第70回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-21K14201
[Presentation] 高Ge組成バルクSiGeにおける局在振動モードラマンスペクトルの温度依存性2023
- Author(s)
  横川凌, 寿川尚, 荒井康智, 米永一郎, 小椋厚志
- Organizer
  第70回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-21K14201
[Presentation] Phonon properties of bulk silicon-germanium analyzed by inelastic X-ray scattering2022
- Author(s)
  Ryo Yokogawa
- Organizer
  The 8th International Symposium on Advanced Science and Technology of Silicon Materials
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K14201
[Presentation] Temperature Dependence of Raman Peak Shift in Single-Crystalline Si-Rich SiGe2022
- Author(s)
  Sho Sugawa, Ryo Yokogawa, Yasutomo Arai, Ishiro. Yonenaga, Atsushi Ogura
- Organizer
  242nd ECS Meeting
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K14201
[Presentation] 放射光技術を利用した次世代熱電発電デバイス用Ⅳ族半導体の微小領域熱特性評価2022
- Author(s)
  横川凌, 小椋厚志
- Organizer
  第9回SPring-8次世代先端デバイス研究会/第72回SPring-8先端利用技術ワークショップ「半導体プロセス開発の現状と放射光の役割」
- Invited
- Data Source
  KAKENHI-PROJECT-20K22418
[Presentation] SiGe混晶のフォノン物性解明へ向けて2022
- Author(s)
  横川凌
- Organizer
  第6回フォノンエンジニアリング研究会
- Invited
- Data Source
  KAKENHI-PROJECT-21K14201
[Presentation] 温度可変放射光X線回折による熱酸化およびスパッタSiO2/Si界面の熱特性評価2022
- Author(s)
  横川凌, 渡辺剛, 廣沢一郎, 富田基裕, 渡邉孝信, 小椋厚志
- Organizer
  第69回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-20K22418
[Presentation] Evaluation of Strained Group IV Semiconductor Devices by Oil-Immersion Raman Spectroscopy2022
- Author(s)
  Ryo Yokogawa, Chia-Tsong Chen, Kasidit Toprasertpong, Mitsuru Takenaka, Shinishi Takagi, Atsushi Ogura
- Organizer
  242nd ECS Meeting
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K14201
[Presentation] Si-rich SiGeバルク単結晶におけるラマン散乱の温度依存性2022
- Author(s)
  寿川尚, 横川凌, 荒井康智, 米永一郎, 小椋厚志
- Organizer
  第69回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-21K14201
[Presentation] Ge-rich SiGeバルク単結晶におけるラマンピークの温度依存性2022
- Author(s)
  寿川尚, 横川凌, 荒井康智, 米永一郎, 小椋厚志
- Organizer
  第83回応用物理学会秋季学術講演会
- Data Source
  KAKENHI-PROJECT-21K14201
[Presentation] X線逆格子空間マッピングを用いたメサ構造状カーボンドープシリコンにおける3軸歪評価2021
- Author(s)
  吉岡和俊, 小原田賢聖, 小笠原凱, 廣沢一郎, 渡辺剛, 横川凌, 小椋厚志
- Organizer
  第68回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-20K22418
[Presentation] Strain Behaviors and Characteristics of Phonon Transports in Group IV Semiconductors Observed by Synchrotron Radiation Techniques2021
- Author(s)
  Ryo Yokogawa, Atsushi Ogura
- Organizer
  Material Research Meeting 2021 (MRM2021)
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20K22418
[Presentation] ラマン分光法によるAsイオン注入Siの歪評価2021
- Author(s)
  小原田賢聖, 佐竹雄太, 横川凌, 小椋厚志
- Organizer
  第68回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-20K22418

Yokogawa Ryo 横川 凌

Research Projects

Research Products

斜入射X線非弾性散乱法によるGeおよびSi表面・界面のフォノン散乱解明に関する研究Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Study on thermal transport mechanism at nanoscale of SiGe alloys using variable temperature Raman spectroscopyPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Study on evaluation of thermal properties for thermoelectric Si device by temperature dependent X-ray diffraction with synchrotron radiationPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

[Journal Article] Local thermal conductivity properties of a SiGe nanowire observed by laser power sweep Raman spectroscopy2024

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Determination of Ge-fraction-shift coefficients for Raman spectroscopy in all vibration modes investigated by single-crystalline bulk SiGe and its application to strain evaluation in SiGe film grown on substrate2024

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Temperature Dependence of Raman Peak Shift in Single-Crystalline Silicon-Germanium2023

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Origin of carrier lifetime degradation in floating-zone silicon during a high-temperature process for insulated gate bipolar transistor2020

Author(s)

Journal Title

DOI

Data Source

[Presentation] SiGeラマンスペクトルの非対称ブロードニングに関する考察2024

Author(s)

Organizer

Data Source

[Presentation] Local Thermal Conductivity Properties of SiGe Nanowire Observed by Laser Power Sweep Raman Spectroscopy2023

Author(s)

Organizer

Data Source

[Presentation] レーザパワー掃引ラマン分光法によるSiGeナノワイヤの熱伝導特性評価2023

Author(s)

Organizer

Data Source

[Presentation] ラマン分光法によるSiGeナノワイヤの熱伝導測定2023

Author(s)

Organizer

Data Source

[Presentation] 液浸ラマン分光法による高Ge濃度SiGe薄膜のラマンスペクトルに現れるブロードピークの温度依存性評価2023

Author(s)

Organizer

Data Source

[Presentation] 3次元自己組織化多層SiGeナノドットの熱物性2023

Author(s)

Organizer

Data Source

[Presentation] 3次元自己組織化多層SiGeナノドットのフォノン散乱評価2023

Author(s)

Organizer

Data Source

[Presentation] バルクSiGeを用いた無歪ラマンシフト全振動モードの導出2023

Author(s)

Organizer

Data Source

[Presentation] 高Ge組成バルクSiGeにおける局在振動モードラマンスペクトルの温度依存性2023

Author(s)

Organizer

Data Source

[Presentation] Phonon properties of bulk silicon-germanium analyzed by inelastic X-ray scattering2022

Author(s)

Organizer

Yokogawa Ryo 横川凌