Takahashi Takuji 高橋琢二

… Alternative Names

TAKAHASHI Takuji 高橋琢二

Less

Researcher Number	20222086
External Links
Affiliation (Current)	2025: 東京大学, 生産技術研究所, 教授
Affiliation (based on the past Project Information) *help	2017 – 2024: 東京大学, 生産技術研究所, 教授 2008 – 2011: The University of Tokyo, 生産技術研究所, 准教授 2007: The University of Tokyo, 准教授 2006: 東京大学, 生産技術研究所, 助教授 1999 – 2002: 東京大学, 生産技術研究所, 助教授 … More 1998: The University of Tokyo, Research Center for Advanced Science and Technology, As, 先端技術研究センター, 助教授 1996 – 1998: Univ. of Tokyo Research Center for Advanced Science and Technology, Associate-Pr, 先端科学技術研究センター, 助教授 1993 – 1995: 東京大学, 先端科学技術研究センター, 講師 1990: Research Center for Advanced Science and Technology, Univ. of Tokyo, 先端科学技術研究センター, 特別研究員 Less
Review Section/Research Field	Principal Investigator Electronic materials/Electric materials / Basic Section 21050:Electric and electronic materials-related / Thin film/Surface and interfacial physical properties / 表面界面物性 / 電子デバイス・機器工学 / Electronic materials/Electric materials / Thin film/Surface and interfacial physical properties Except Principal Investigator 電子デバイス・機器工学 / Electronic materials/Electric materials / Medium-sized Section 30:Applied physics and engineering and related fields
Keywords	Principal Investigator 光励起キャリア / 光起電力 / ナノプローブ / 微分コンダクタンス / 太陽電池 / 非発光再結合 / 再結合プロセス / ケルビンプローブフォース顕微鏡 / 自己形成量子ドット / 走査トンネル顕微鏡 … More / 表面空乏層 / 表面光電位効果 / 空乏層容量 / 光援用ナノプローブ / 時間分解計測 / 多元系化合物半導体 / Photoabsorption property / Differential conductance / Surface potential / Schottky barrier / GaAs giant steps / Laser-illuminated STM / Conductive tip AFM / InAs wires and thin films / 光吸収特性 / 表面電位 / ショットキ障壁 / GaAs巨大ステップ / レーザ光照射STM / 導電性探針AFM / 薄膜構造 / InAs細線 / Self-assembled Dots / Electrostatic Force / AFM with a Conductive Tip / Surface Depletion / Photo-excited Carriers / Laser Irradiation / Semiconductor Tips / Scanning Tunneling Microscopy / 表面光起電力効果 / バンドギャップ / 半導性探針AFM / 静電引力 / 導電性探針 AFM / 表面空乏化 / レーザ光照射 / 半導体探針 / AFM光熱分光計測法 / ケルビン・プローブ・フォース顕微鏡 / AFM 光熱分光計測法 / 少数キャリア / 太陽電池材料 / 多結晶シリコン太陽電池 / 間欠バイアスKFM / 少数キャリアダイナミクス / 少数キャリア拡散長 / 少数キャリア特性 / 電荷蓄積効果 / 量子準位 / ナノ構造中電子状態 / 高精度電位測定 / フォトキャリア / 組成イメージ / 光吸収スペクトル / トンネル電流-電圧スペクトル / フェルミレベル / 走査型トンネル顕微鏡 … More Except Principal Investigator quantum dots / 量子ドット / 量子細線 / 電子散乱 / ナノ構造 / 自己形成 / 逆HEMT構造 / InAs量子箱 / 赤外検出器 / クーロン相互作用 / quantum wires / MOCVD / 量子箱 / 基板接合 / 高電子移動度トランジスタ / 電界効果トランジスタ / 窒化物半導体 / Strain Effect / Band Theory / Metal Organic Vapor Phase Deposition / Molecular Beam Epitaxy / Semiconductor Laser / High Magnetic Field / Quantum Wire / Quantum Box / 半導体レ-ザ / 強磁場 / 歪み効果 / バンド理論 / 有機金属気相成長 / 分子線エピタキシ- / 量子井戸細線 / 量子井戸箱 / nanostructures / Electron relaxation / localization / quantum rings / Electron scattering / anti-dots / Granular materials / プレーナ起格子 / 零次元電子 / InAsドット / 電子緩和 / 局在 / 量子リング / アンチドット / グレイン(粒状)物質 / optical transitions / quantum levels / quantum well films / Nanostructures / 光学フォノン / ボロメータ / メモリ素子 / 伝導特性 / 単一ヘテロ構造 / 光イオン化 / シュタルク効果 / 中赤外光 / エネルギー準位 / 量子(井戸) / 赤外光 / 光学遷移 / 量子準位 / 量子井戸薄膜 / Capacitance-voltage spectroscopy / Resonant tunnel structure / Quantum point contact / Optical detector / Memory function / Inverted HEMT structure / Self-assembly / 10nm InAs quantum dot / 電子状態 / 逆HEMT / ヒステリシス特性 / 量子化コンダクタンス / FET / 自己形成量子箱 / 容量・電圧分光法 / 共鳴トンネル構造 / 量子ポイントコンタクト / 光検出器 / メモリー機能 / 10nm級InAs量子箱 / intersubband excitation / multi-atomic step / memory device / InAs quantum box / negative mutual conductance / infrered detector / velocity modulation / heterocoupling / 非局在状態 / 共鳴散乱 / 非共鳴 / 共鳴 / 2重量子井戸 / 電子速度変調 / トンネル結合 / エッジ状態 / メモリー / インジウム砒素(InAs) / サイクロトロン共鳴 / GaAs(111)B面 / 自己形成InAs量子箱 / 共鳴結合 / 二重量子井戸 / サブバンド間励起 / 多段原子ステップ / メモリー素子 / 負の相互コンダクタンス / 速度変調 / ヘテロカップリング / diamugnetic shift / oscillator strength / one-dimensional exciton / spatially resolved micro-photo luminescence / T-shaped GaAs quantum wire / cleaved overgrowth / atomic force microscope / ridge quantum wire / 束縛エネルギー / へき開再成長法 / リッジ構造 / T型量子細線 / フォトルミネセンス励起スペクトル / 横方向閉じ込め / 空間分解フォトルミネセンス / 一次元状態 / 反磁性シフト / 振動子強度 / 一次元励起子 / 空間分解顕微フォトルミネセンス / T型GaAs量子細線 / へき開再成長 / 原子間力顕微鏡 / リッジ量子細線 / step-edges / microcavities / semiconductor lasers / strained srructures / ステップエッジ / 微小共振器 / 半導体レーザ / 歪構造 Less

窒化物半導体における選択極性反転技術の構築とn型p型領域同時形成への応用の研究
- Principal Investigator
  
  末光哲也
- Project Period (FY)
  2024 – 2026
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Review Section
  
  Medium-sized Section 30:Applied physics and engineering and related fields
- Research Institution
  Tohoku University
時間分解・光援用ナノプローブの開発と多元系半導体太陽電池評価への応用展開Principal Investigator
- Principal Investigator
  
  高橋琢二
- Project Period (FY)
  2022 – 2025
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Review Section
  
  Basic Section 21050:Electric and electronic materials-related
- Research Institution
  The University of Tokyo
Investigation of photo-induced carrier dynamics in solar cells consisting of multinary compound semiconductors using photo-assisted nanoprobesPrincipal Investigator
- Principal Investigator
  
  Takahashi Takuji
- Project Period (FY)
  2017 – 2020
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  The University of Tokyo
Minority carrier dynamics in solar cell materials investigated by photo-assisted KFMPrincipal Investigator
- Principal Investigator
  
  TAKAHASHI Takuji
- Project Period (FY)
  2009 – 2011
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  The University of Tokyo
Study on precise potential measurements by nano-probes and on investigation of electronic properties in nanostructuresPrincipal Investigator
- Principal Investigator
  
  TAKAHASHI Takuji
- Project Period (FY)
  2006 – 2008
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  The University of Tokyo
Characterization on near-surface electronic properties and investigation of electron transport mechanisms in InAs nanostructures studied by nano-probesPrincipal Investigator
- Principal Investigator
  
  TAKAHASHI Takuji
- Project Period (FY)
  2001 – 2002
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  表面界面物性
- Research Institution
  The University of Tokyo
Physics and controlled properties of micro-and nano-scale granular semiconductor structures
- Principal Investigator
  
  SAKAKI Hiroyuki
- Project Period (FY)
  2000 – 2002
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  The University of Tokyo
Control of electron transitions in nano structures and development of near-and mid-infrared optical modulator devices
- Principal Investigator
  
  SASAKI Hiroyuki
- Project Period (FY)
  1999 – 2001
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  電子デバイス・機器工学
- Research Institution
  The University of Tokyo
Study of electronic states in 10nm-scale semiconductor quantum dots and exploration of their memory functions
- Principal Investigator
  
  SAKAKI Hiroyuki
- Project Period (FY)
  1997 – 1998
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  電子デバイス・機器工学
- Research Institution
  The University of Tokyo
Electronic Spectroscopies by a Novel STM with functional Semiconductor TipsPrincipal Investigator
- Principal Investigator
  
  TAKAHASHI Takuji
- Project Period (FY)
  1997 – 1998
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  電子デバイス・機器工学
- Research Institution
  The University of Tokyo
レーザ光照射・走査型プローブ顕微鏡を用いた半導体極微細構造の特性評価Principal Investigator
- Principal Investigator
  
  高橋琢二
- Project Period (FY)
  1996
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  The University of Tokyo
レーザ光励起STMによる半導体極微細構造の特性評価Principal Investigator
- Principal Investigator
  
  高橋琢二
- Project Period (FY)
  1995
- Research Category
  
  Grant-in-Aid for General Scientific Research (C)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  The University of Tokyo
Control of nano-scale quantum wire structures and optocal properties of one-dimensional excitons
- Principal Investigator
  
  SAKAKI Hiroyuki
- Project Period (FY)
  1995 – 1996
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  The University of Tokyo
Infrared-detector and FET applications and velocity modulation effect using hetero-coupling
- Principal Investigator
  
  SAKAKI Hiroyuki
- Project Period (FY)
  1995 – 1997
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  電子デバイス・機器工学
- Research Institution
  University of Tokyo
Basic Research on Semiconductor Lasers with Vertical Microcavity
- Principal Investigator
  
  ARAKAWA Yasuhiko
- Project Period (FY)
  1993 – 1994
- Research Category
  
  Grant-in-Aid for General Scientific Research (B)
- Research Field
  
  電子デバイス・機器工学
- Research Institution
  Institute of Industrial Science, University of Tokyo
New Type of Semiconductor Lasers with Quantum-Well Wire Structures and Quantum-Well Box Structures
- Principal Investigator
  
  ARAKAWA Yasuhiko
- Project Period (FY)
  1988 – 1990
- Research Category
  
  Grant-in-Aid for international Scientific Research
- Research Institution
  Research Center for Advanced Science and Technology, Univ. of Tokyo

[Journal Article] Accurate Electrostatic Force Measurements by Atomic Force Microscopy Using Proper Distance Control2023
- Author(s)
  Fukuzawa Ryota、Kobayashi Daichi、Takahashi Takuji
- Journal Title
  
  IEEE Transactions on Instrumentation and Measurement
  
  Volume: 72 Pages: 1-8
- DOI
  10.1109/tim.2023.3256473
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23K22788
[Journal Article] Effect of Cesium for Cu(In,Ga)(S,Se)$_{2}$ Solar Cells Using Photothermal Atomic Force Microscopy Under Various Photoexcitation Conditions2022
- Author(s)
  Yamada Ayaka、Takahashi Takuji
- Journal Title
  
  IEEE Journal of Photovoltaics
  
  Volume: 12 Issue: 6 Pages: 1303-1307
- DOI
  10.1109/jphotov.2022.3208713
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23K22788
[Journal Article] Multi-pulse modulation method in photothermal atomic force microscopy for variable frequency modulation of incident light2021
- Author(s)
  Yamada Ayaka、Takahashi Takuji
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 60 Issue: SE Pages: SE1003-SE1003
- DOI
  10.35848/1347-4065/abf07b
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17H02783
[Journal Article] Dual Bias Modulation Electrostatic Force Microscopy on Cu(In, Ga)Se22020
- Author(s)
  Fukuzawa Ryota, Minemoto Takashi, Takahashi Takuji
- Journal Title
  
  Proceedings of 2020 47th IEEE Photovoltaic Specialists Conference (PVSC)
  
  Volume: 00 Pages: 0394-0396
- DOI
  10.1109/pvsc45281.2020.9300457
- Data Source
  KAKENHI-PROJECT-17H02783
[Journal Article] Development of dual bias modulation electrostatic force microscopy for variable frequency measurements of capacitance2020
- Author(s)
  Fukuzawa Ryota, Takahashi Takuji
- Journal Title
  
  Review of Scientific Instruments
  
  Volume: 91 Issue: 2 Pages: 023702-023702
- DOI
  10.1063/1.5127219
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17H02783
[Journal Article] Direct imaging method of frequency response of capacitance in dual bias modulation electrostatic force microscopy2020
- Author(s)
  Fukuzawa Ryota, Takahashi Takuji
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 59 Issue: 7 Pages: 078001-078001
- DOI
  10.35848/1347-4065/ab9ae0
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17H02783
[Journal Article] Photovoltage Decay Measurements by Photo-Assisted Kelvin Probe Force Microscopy on Cu(In,Ga)Se2 Solar Cells2019
- Author(s)
  Hyeondeuk Yong, Takashi Minemoto, Takuji Takahashi
- Journal Title
  
  IEEE Journal of Photovoltaics
  
  Volume: 9 Issue: 2 Pages: 483-491
- DOI
  10.1109/jphotov.2018.2885835
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17H02783
[Journal Article] Dependence of Photovoltage on Incident Photon Energies Investigated by Photo-assisted Kelvin Probe Force Microscopy on Cu(In,Ga)Se2 Solar Cells2018
- Author(s)
  Hyeondeuk Yong, Takashi Minemoto, Takuji Takahashi
- Journal Title
  
  2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC)
  
  Volume: 1 Pages: 1966-1969
- DOI
  10.1109/pvsc.2018.8547957
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17H02783
[Journal Article] Local Measurements of Surface Capacitance by Electrostatic Force Microscopy on Cu(In,Ga)Se2 Materials2017
- Author(s)
  Tomoaki Ishii, Takashi Minemoto, and Takuji Takahashi
- Journal Title
  
  Proceedings of 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC)
  
  Volume: 1 Pages: 455-458
- DOI
  10.1109/pvsc.2017.8366110
- Data Source
  KAKENHI-PROJECT-17H02783
[Journal Article] An Investigation of Band Profile around the Grain Boundary of Cu(InGa)Se2 Solar Cell Material by Scan- ning Probe Microscopy2013
- Author(s)
  M. Takihara, T. Minemoto, Y. Wakisa- ka, and T. Takahashi
- Journal Title
  
  Prog. Photovolt:Res. Appl.
  
  Volume: 21 Issue: 4 Pages: 595-599
- DOI
  10.1002/pip.1235
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360143
[Journal Article] Photo- thermal Signal and Surface Potential around Grain Boundaries in Multicrys- talline Silicon Solar Cells Investigated by Scanning Probe Microscopy2012
- Author(s)
  K. Hara and T. Takahashi
- Journal Title
  
  Appl. Phys. Express
  
  Volume: 5 Issue: 2 Pages: 22301-22301
- DOI
  10.1143/apex.5.022301
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360143
[Journal Article] Photo- thermal Spectroscopy on Multicrystalline Silicon Solar Cell Materials by Dual Sam- pling Method in Atomic Force Microscopy2012
- Author(s)
  K. Hara and T. Takahashi
- Journal Title
  
  Proceedings of 38th IEEE Photovoltaic Specialists Conference PVSC 38
  
  Volume: - Pages: 1271-1273
- DOI
  10.1109/pvsc.2012.6317833
- Data Source
  KAKENHI-PROJECT-21360143
[Journal Article] Photovoltage Decay Measurements on Cu(In,Ga)Se2 Solar Cells by Photo-assisted Kelvin Probe Force Mi- croscopy2012
- Author(s)
  Y. Nakajima, M. Takihara, T. Minemoto, and T. Takahashi
- Journal Title
  
  Proceedings of 38th IEEE Photovoltaic Specialists Conference PVSC 38
  
  Volume: - Pages: 1736-1738
- DOI
  10.1109/pvsc.2012.6317930
- Data Source
  KAKENHI-PROJECT-21360143
[Journal Article] Photothermal Signal and Surface Potential around Grain Boundaries in Multicrystalline Silicon Solar Cells Investigated by Scanning Probe Microscopy2012
- Author(s)
  Kenji Hara, Takuji Takahashi
- Journal Title
  
  Appl.Phys.Express
  
  Volume: 5
- NAID
  10030155404
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360143
[Journal Article] Photoassisted Kelvin Probe Force Microscopy on Multicrystalline Si Solar Cell Materials2011
- Author(s)
  Takuji Takahashi
- Journal Title
  
  Jpn.J.Appl.Phys.
  
  Volume: 50
- NAID
  210000071129
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360143
[Journal Article] Photoassisted Kelvin Probe Force Microscopy on Multicrystal- line Si Solar Cell Materials2011
- Author(s)
  T. Takahashi
- Journal Title
  
  Jpn. J. Appl. Phys.
  
  Volume: 50 Issue: 8S3 Pages: 1387-1389
- DOI
  10.1143/jjap.50.08la05
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360143
[Journal Article] Band Pro- file aroundGrain Boundary of Cu(InGa)Se2 Solar CellMaterials Characterized by Scanning Probe Microscopy2010
- Author(s)
  M. Takihara, T. Minemoto, Y. Wakisaka, and T. Takahashi
- Journal Title
  
  Proceedings of 35th IEEE Photovoltaic Specialists Con- ference (PVSC)
  
  Pages: 2512-2515
- DOI
  10.1109/pvsc.2010.5614681
- Data Source
  KAKENHI-PROJECT-21360143
[Journal Article] Photothermal Characterization by Atomic Force Microscopy around Grain Boundary in Multicrystalline Silicon Material2010
- Author(s)
  Kenji Hara, Takuji Takahashi
- Journal Title
  
  Proceedings of 35th IEEE Photovoltaic Specialists Conference (PVSC)
  
  Pages: 1387-1389
- Data Source
  KAKENHI-PROJECT-21360143
[Journal Article] Band profile around grain boundary of Cu(InGa) Se2 solar cell materials characterized by scanning probe microscopy2010
- Author(s)
  Masaki Takihara, Takashi Minemoto, Youichi Wakisaka, Takuji Takahashi
- Journal Title
  
  Proceedings of 35th IEEE Photovoltaic Specialists Conference (PVSC)
  
  Pages: 2512-2515
- Data Source
  KAKENHI-PROJECT-21360143
[Journal Article] Band profile around grain boundary of Cu (InGa) Se2 solar cell materials characterized by scanning probe microscopy2010
- Author(s)
  Masaki Takihara, Takashi Minemoto, Youichi Wakisaka, Takuji Takahashi
- Journal Title
  
  Proceedings of 35th IEEE Photovoltaic Specialists Conference (PVSC)
  
  Pages: 2512-2515
- Data Source
  KAKENHI-PROJECT-21360143
[Journal Article] Study of minority carrier diffusion length in multicrystalline silicon solar cells using photoassisted Kelvin probe force microscopy2009
- Author(s)
  Masaki Takihara, Takuji Takahashi, Toru Ujihara
- Journal Title
  
  Applied Physics Letters 95
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18360019
[Journal Article] Improvement of KFM Performance by Intermittent Bias Application Method and by Sampling Detection of Cantilever Deflection2009
- Author(s)
  T. Takahashi, T. Matsumoto, S. Ono
- Journal Title
  
  Ultramicroscopy 109
  
  Pages: 963-967
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18360019
[Journal Article] Study of Minority Carrier Diffusion Length in Multicrystalline Silicon Solar Cells Using Photoassisted Kelvin Probe Force Microscopy2009
- Author(s)
  Masaki Takihara, Takuji Takahashi, Toru Ujihara
- Journal Title
  
  Applied Physics Letters
  
  Volume: 95
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360143
[Journal Article] Study of Minority Carrier Dif- fusion Length in Multicrystalline Silicon Solar Cells Using Photoassisted Kelvin Probe Force Microscopy2009
- Author(s)
  M. Takihara, T. Takahashi, and T. Ujihara
- Journal Title
  
  Appl. Phys. Lett.
  
  Volume: 95 Issue: 19 Pages: 191908-191908
- DOI
  10.1063/1.3264081
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360143
[Journal Article] Study of minority carrier diffusion length in multicrystalline silicon solar cells using photoassisted Kelvin probe force microscopy2009
- Author(s)
  M. Takihara, T. Takahashi, T. Ujihara
- Journal Title
  
  Appl.Phys.Lett. 95
  
  Pages: 191908-191908
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18360019
[Journal Article] Improvement of KFM Performance by Intermittent Bias Application Method and by Sampling Detection of Cantilever Deflection2009
- Author(s)
  Takuji Takahashi, Tadahisa Matsumoto, Shiano Ono
- Journal Title
  
  Ultramicroscopy 109
  
  Pages: 963-697
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18360019
[Journal Article] Minority Carrier Lifetime in Polycrystalline Silicon Solar Cells Studied by Photoassisted Kelvin Probe Force Microscopy2008
- Author(s)
  Masaki Takihara, Takuji Takahashi, Toru Ujihara
- Journal Title
  
  Applied Physics Letters 93
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18360019
[Journal Article] Minority carrier lifetime in polycrystalline silicon solar cells studied by photoassisted Kelvin probe force microscopy2008
- Author(s)
  M. Takihara, T. Ujihara, T. Takahashi
- Journal Title
  
  Applied Physics Letters 93
  
  Pages: 21902-21902
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18360019
[Journal Article] Minority Carrier Lifetime in Polycrystalline Silicon Solar Cells Studied by Photoassisted Kelvin Probe Force Microscopy2008
- Author(s)
  M. Takihara, T. Takahashi, T. Ujihara
- Journal Title
  
  Appl.Phys.Lett. 93
  
  Pages: 21902-21902
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18360019
[Journal Article] Photovoltage Mapping on Polycrystalline Silicon Solar Cells by Kelvin Probe Force Microscopy with Piezoresistive Cantilever2007
- Author(s)
  M. Takihara, T. Igarashi, T. Ujihara, T. Takahashi
- Journal Title
  
  Japanese Journal of Applied Physics 46
  
  Pages: 5548-5551
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18360019
[Journal Article] Photovoltage Mapping on Polycrystalline Silicon Solar Cells by KFM with Piezo-resistive Cantilever2007
- Author(s)
  M.Takihara, T.Igarashi, T.Ujihara, T.Takahashi
- Journal Title
  
  Japanese Journal of Applied Physics (in press)
- Data Source
  KAKENHI-PROJECT-18360019
[Journal Article] Photovoltage Mapping on Polycrystalline Silicon Solar Cells by Kelvin Probe Force Microscopy with Piezoresistive Cantilever2007
- Author(s)
  M. Takihara, T. Igarashi, T. Ujihara, T. Takahashi
- Journal Title
  
  Jpn.J.Appl.Phys. 46
  
  Pages: 5548-5551
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18360019
[Journal Article] Scanning Probe Methods for Characterization of Electrical Properties in Nano-materials2006
- Author(s)
  Takuji Takahashi
- Journal Title
  
  Proceedings on 6th Pacific Rim Conference on Ceramic and Glass Technology
  
  Pages: 163-163
- Data Source
  KAKENHI-PROJECT-18360019
[Journal Article] Scanning Probe Methods for Characterization of Electrical Properties in Nano-materials2006
- Author(s)
  T. Takahashi
- Journal Title
  
  Proceedings on 6th Pacific Rim Conference on Ceramic and Glass Technology 163
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18360019
[Journal Article] Light-illuminated STM Studies on Photoabsorption in InAs Nanowires2003
- Author(s)
  Takuji Takahashi, Kan Takada, Misaichi Takeuchi
- Journal Title
  
  Ultramicroscopy 97
  
  Pages: 1-6
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13650024
[Journal Article] 交流電流が作るGaAs/AlGaAsメサストライブ周辺磁界の磁気万顕微鏡観察2003
- Author(s)
  才田大輔、高橋琢二
- Journal Title
  
  電子情報通信学会論文誌C J86
  
  Pages: 204-205
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13650024
[Journal Article] Current-induced Magnetic Field Detection by Magnetic Force Microscopy around a GaAs/AlGaAs Mesa Stripe2003
- Author(s)
  Daisuke Saida, Takuji Takahashi
- Journal Title
  
  Japanese Journal of Applied Physics 42
  
  Pages: 4874-4877
- NAID
  10011447096
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13650024
[Journal Article] Current-induced Magnetic Field Detection by Magnetic Force Microscopy around a GaAs/AlGaAs Mesa Stripe2003
- Author(s)
  Daisuke Saida, Takuji Takahashi
- Journal Title
  
  Jpn.J.Appl.Phys. Vol.42
  
  Pages: 4874-4877
- NAID
  10011447096
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13650024
[Journal Article] Current-induced Magnetic Field around a GaAs/AlGaAs Mesa Stripe Studied by Magnetic Force Microscopy2003
- Author(s)
  Daisuke Saida, Takuji Takahashi
- Journal Title
  
  Tran.of IEICE, C Vol.J86
  
  Pages: 204-205
- NAID
  110003172116
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13650024
[Journal Article] Surface Potential Imaging on InAs Quantum Dots and InAs Thin Films by Kelvin Probe Force Microscopy Operated in High Vacuum2003
- Author(s)
  Shiano Ono, Misaichi Takeuchi, Takuji Takahashi
- Journal Title
  
  Jpn.J.Appl.Phys. Vol.42
  
  Pages: 4869-4873
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13650024
[Journal Article] Surface Potential Imaging on InAs Quantum Dots and InAs Thin Films by Kelvin Probe Force Microscopy Operated in High Vacuum2003
- Author(s)
  Shiano Ono, Misaichi Takeuchi, Takuji Takahashi
- Journal Title
  
  Japanese Journal of Applied Physics 42
  
  Pages: 4869-4873
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13650024
[Journal Article] Light-illuminated STM Studies on Photoabsorption in InAs Nanowires2003
- Author(s)
  Takuji Takahashi, Kan Takada, Misaichi Takeuchi
- Journal Title
  
  Ultramicroscopy vol.97
  
  Pages: 1-6
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13650024
[Journal Article] Current and Potential Characterization on InAs Nanowires by Contact-mode Atomic Force Microscopy and Kelvin Probe Force Microscopy2002
- Author(s)
  Shiano Ono, Misaichi Takeuchi, Takuji Takahashi
- Journal Title
  
  Ultramicroscopy Vol.91
  
  Pages: 127-132
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13650024
[Journal Article] Current and Potential Characterization on InAs Nanowires by Contact-mode Atomic Force Microscopy and Kelvin Probe Force Microscopy2002
- Author(s)
  Shiano Ono, Misaichi Takeuchi, Takuji Takahashi
- Journal Title
  
  Ultramicroscopy 91
  
  Pages: 127-132
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13650024
[Journal Article] Photoabsorption Characterization on Surface InAs Nanostructures Using Light-illuminated STM2002
- Author(s)
  Kan Takada, Misaichi Takeuchi, Takuji Takahashi
- Journal Title
  
  Jpn.J.Appl.Phys. Vol.41
  
  Pages: 4990-4993
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13650024
[Journal Article] Photoabsorptton Characterization on Surface InAs Nanostructures Using Light-Illuminated Scanning Tunneling Microscope2002
- Author(s)
  Kan Takada, Misaichl Takeuchi, Takuji Takahashi
- Journal Title
  
  Japanese Journal of Applied Physics 41
  
  Pages: 4990-4993
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13650024
[Presentation] AM距離制御を用いたFM-EFMの有効性の検証2023
- Author(s)
  福澤亮太，小林大地，高橋琢二
- Organizer
  第70回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-23K22788
[Presentation] Photo-assisted Scanning Probe Microscopy on Solar Cells2022
- Author(s)
  Takuji Takahashi
- Organizer
  LIMMS-IEMN Workshop
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23K22788
[Presentation] Photo-assisted Scanning Probe Methods on Solar Cells2022
- Author(s)
  Takuji Takahashi
- Organizer
  International Workshop on Micro- and Nano-Technologies for Energy, Bio-engineering and Bio-sensing
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23K22788
[Presentation] Verification of Time-resolved EFM Combined with KFM2022
- Author(s)
  Jo Sato and Takuji Takahashi
- Organizer
  2022 NAMIS Marathon Workshop
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23K22788
[Presentation] ケルビン・プローブ・フォース法を併用した時間分解静電引力顕微鏡2022
- Author(s)
  佐藤捷，高橋琢二
- Organizer
  第83回応用物理学会秋季学術講演会
- Data Source
  KAKENHI-PROJECT-23K22788
[Presentation] Investigation of Cs Treatment Effect on Cu(In,Ga)(S,Se)2 Solar Cell from Non-radiative Recombination Distribution under Various Photoexcitation Conditions Using Photothermal Atomic Force Microscopy2022
- Author(s)
  Ayaka Yamada and Takuji Takahashi
- Organizer
  the 49th IEEE Photovoltaic Specialists Conference
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23K22788
[Presentation] Observation of Nonradiative Recombination on Cu(In,Ga)(S,Se)2 Solar Cells using Photothermal Atomic Force Microscopy2022
- Author(s)
  Ayaka Yamada and Takuji Takahashi
- Organizer
  2022 NAMIS Marathon Workshop
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23K22788
[Presentation] Cu(In,Ga)(S,Se)2太陽電池に対するCs処理効果の光熱モードAFMによる検討2022
- Author(s)
  山田綾果、高橋琢二
- Organizer
  第69回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Photothermal Atomic Force Microscopy on Cu(In,Ga)(S,Se)2 Solar Cell Materials to Investigate CsF Treatment Effect2022
- Author(s)
  Ayaka Yamada and Takuji Takahashi
- Organizer
  The 22nd International Vacuum Congress
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23K22788
[Presentation] 周波数変調型静電引力顕微鏡法によるキャリア密度の定量測定2022
- Author(s)
  福澤亮太, 梁剣波, 重川直輝, 高橋琢二
- Organizer
  第69回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Multi-pulse変調を用いた光熱モードAFMによる非発光再結合の変調周波数依存性測定2021
- Author(s)
  山田綾果、高橋琢二
- Organizer
  第68回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Time-resolved photo-assisted Kelvin probe force microscopy on Cu(In,Ga)Se2 solar cells2021
- Author(s)
  Tomoe Kuroiwa, Takuji Takahashi
- Organizer
  29th International Colloquium on Scanning Probe Microscopy (ICSPM29)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] ジュール熱の外部変調を利用した非接触型抵抗原子間力顕微鏡法2021
- Author(s)
  福澤亮太、高橋琢二
- Organizer
  第82回応用物理学会秋季学術講演会
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] 二重バイアス変調静電引力顕微鏡による直接貼り合わせp-n接合の断面解析2021
- Author(s)
  福澤亮太, 梁剣波, 重川直輝, 高橋琢二
- Organizer
  第68回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Quantitative Capacitance Measurements in Frequency Modulation Electrostatic Force Microscopy2021
- Author(s)
  Ryota Fukuzawa, Takuji Takahashi
- Organizer
  29th International Colloquium on Scanning Probe Microscopy (ICSPM29)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] 光照射ケルビンプローブフォース顕微鏡によるCu(In,Ga)Se2太陽電池での時間分解光起電力計測2021
- Author(s)
  黒岩朋恵、高橋琢二
- Organizer
  第82回応用物理学会秋季学術講演会
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] 原子間力顕微鏡を用いた静電引力検出による局所静電容量の定量測定2021
- Author(s)
  福澤亮太、高橋琢二
- Organizer
  応用物理学会 KOSEN SC 第3回 VR学術講演会
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Time-resolved Photovoltaic Measurements by Photo-assisted Kelvin Probe Force Microscopy2021
- Author(s)
  Tomoe Kuroiwa, Ryota Ishibashi, Takuji Takahashi
- Organizer
  The 5th international symposium on “Elucidation of Next Generation Functional Materials・Surface and Interface Properties"
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] 周波数変調型静電引力顕微鏡における静電容量の定量測定に向けた金属-半導体間の静電引力と周波数シフト量の関係の定式化2021
- Author(s)
  福澤亮太、高橋琢二
- Organizer
  第82回応用物理学会秋季学術講演会
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] 光熱モードAFMによる非発光再結合局所分布計測を用いたCu(In,Ga)(S,Se)2に対するCs処理効果の検討2020
- Author(s)
  山田綾果、高橋琢二
- Organizer
  第81回応用物理学会秋季学術講演会
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Photo-assisted Scanning Probe Microscopy on Solar Cell Materials2020
- Author(s)
  Takuji Takahashi
- Organizer
  Seoul National Univ.(SNU)/IIS, The Univ.of Tokyo Joint Woprkshop on Innovative Micro/Nano systems
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] 導電性ナノプローブ用いた静電引力測定によるCu(In,Ga)Se2中のCd拡散効果の解析2020
- Author(s)
  福澤亮太、峯元高志、高橋琢二
- Organizer
  第81回応用物理学会秋季学術講演会
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] 間欠バイアス印加ケルビンプローブフォース顕微鏡による時間分解計測2020
- Author(s)
  石橋亮太、高橋琢二
- Organizer
  第81回応用物理学会秋季学術講演会
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Dual Bias Modulation Electrostatic Force Microscopy on Cu(In,Ga)Se22020
- Author(s)
  Ryota Fukuzawa, Takashi Minemoto, Takuji Takahashi
- Organizer
  2020 47th IEEE Photovoltaic Specialists Conference (PVSC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Time resolved Kelvin Probe Force Microscopy with Intermittent Bias Application Method2020
- Author(s)
  Ryota Ishibashi, Takuji Takahashi
- Organizer
  28th International Colloquium on Scanning Probe Microscopy (ICSPM28)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Time-resolved measurements by Kelvin probe force microscopy with intermittent bias application2020
- Author(s)
  Ryota Ishibashi, Takuji Takahashi
- Organizer
  2020 NAMIS MARATHON WORKSHOP
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] 二重バイアス変調静電引力顕微鏡における可変周波数静電容量測定2020
- Author(s)
  福澤亮太、高橋琢二
- Organizer
  応用物理学会 KOSEN SC 第1回 VR学術講演会
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Investigation on local non-radiative recombination property in Cu(In,Ga)(S,Se)2 by photothermal AFM2020
- Author(s)
  Ayaka Yamada, Takuji Takahashi
- Organizer
  2020 NAMIS MARATHON WORKSHOP
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Multi-pulse Modulation Method in Photothermal Atomic Force Microscopy2020
- Author(s)
  Ayaka Yamada, Takuji Takahashi
- Organizer
  28th International Colloquium on Scanning Probe Microscopy (ICSPM28)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] 二重バイアス変調静電引力顕微鏡によるCu(In,Ga)Se2上での局所的容量測定2020
- Author(s)
  福澤亮太, 峯元高志, 高橋琢二
- Organizer
  第67回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] 光熱モードAFMによる非発光再結合特性評価を通じたCu(In,Ga)(S,Se)2に対するCs処理効果の検討2020
- Author(s)
  山田綾果、高橋琢二
- Organizer
  応用物理学会 KOSEN SC 第1回 VR学術講演会
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] 走査プローブ顕微鏡の基礎と応用2020
- Author(s)
  高橋琢二
- Organizer
  応用物理学会 KOSEN SC 第1回 VR学術講演会
- Invited
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] 光熱モードAFMによるCu(In,Ga)(S,Se)2における非発光再結合特性の評価2019
- Author(s)
  山田綾果, 高橋琢二
- Organizer
  第80回応用物理学会秋季学術講演会
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Dual Bias Modulation Method for Variable Frequency Measurements in Electrostatic Force Microscopy2019
- Author(s)
  Ryota Fukuzawa and Takuji Takahashi
- Organizer
  The 21th International Scanning Probe Microscopy Conference (ISPM 2019)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Dual Bias Modulation Electrostatic Force Microscopy for Variable Frequency2019
- Author(s)
  Ryota Fukuzawa and Takuji Takahashi
- Organizer
  NAMIS Marathon Workshop
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Photo-assisted Scanning Probe Methods on Solar Cell Materials2019
- Author(s)
  Takuji Takahashi
- Organizer
  The 8th LIA NextPV International Workshop
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] 二重バイアス変調静電引力顕微鏡における可変周波数測定2019
- Author(s)
  福澤亮太, 高橋琢二
- Organizer
  第80回応用物理学会秋季学術講演会
- Invited
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Valuable Frequency Measurements of dC/dV by Electrostatic Force Microscopy on Cu(In,Ga)(S,Se)22019
- Author(s)
  Ryota Fukuzawa and Takuji Takahashi
- Organizer
  LIMMS-Next PV Joint Energy Workshop
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] 二重バイアス変調静電引力顕微鏡による周波数応答の直接画像化2019
- Author(s)
  福澤亮太, 高橋琢二
- Organizer
  第80回応用物理学会秋季学術講演会
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Non-radiative Recombination Properties in Cu(In,Ga)(S,Se)2 Investigated by Photothermal AFM2019
- Author(s)
  Ayaka Yamada and Takuji Takahashi
- Organizer
  The 27th International Colloquium on Scanning Probe Microscopy (ICSPM27)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Investigation on Non-radiative Recombination Property in Cu(In,Ga)(S,Se)2 by Photothermal AFM2019
- Author(s)
  Ayaka Yamada and Takuji Takahashi
- Organizer
  NAMIS Marathon Workshop
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Photo-assisted Scanning Probe Methods on Solar Cell Materials2019
- Author(s)
  Takuji Takahashi
- Organizer
  LIMMS-Next PV Joint Energy Workshop
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Direct Imaging Method of Frequency Response in Dual Bias Modulation Electrostatic Force Microscopy2019
- Author(s)
  Ryota Fukuzawa and Takuji Takahashi
- Organizer
  The 27th International Colloquium on Scanning Probe Microscopy (ICSPM27)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Dual Bias Modulation Electrostatic Force Microscopy for Variable Frequency Analyses2019
- Author(s)
  Takuji Takahashi
- Organizer
  The 4th International Symposium on "Elucidation of Property of Next Generation Functional Materials and Surface/Interface"
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Photo-assisted Kelvin Probe Force Microscopy on Cu(In,Ga)Se2 Solar Cells2018
- Author(s)
  Takuji Takahashi
- Organizer
  The 3rd international symposium on “Recent Trends in Elucidation and Function Discovery on Next Generation Functional Materials ・ Surface/Interface Properties”
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Photo-assisted Kelvin Probe Force Microscopy on Cu(In,Ga)Se2 Solar Cells under Light with Various Photon Energies2018
- Author(s)
  Hyeondeuk Yong, Takashi Minemoto, and Takuji Takahashi
- Organizer
  The 20th International Scanning Probe Microscopy Conference (ISPM 2018)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Photo-assisted Scanning Probe Methods on Solar Cells2018
- Author(s)
  Takuji Takahashi
- Organizer
  LIMMS/CNRS-IIS and UTC Joint Workshop
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Photo-assisted Scanning Probe Microscopy on Cu(In,Ga)Se2 Solar Cells2018
- Author(s)
  Takuji Takahashi
- Organizer
  CNRS GDRe Thermal Nanosciences and Nano Engineering
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Dependence of Photovoltage on Incident Photon Energies Investigated by Photo-assisted Kelvin Probe Force Microscopy on Cu(In,Ga)Se2 Solar Cells2018
- Author(s)
  Hyeondeuk Yong, Takashi Minemoto, and Takuji Takahashi
- Organizer
  The 7th Edition of the World Conference on Photovoltaic Energy Conversion (WCPEC-7)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Dual Bias Modulation in EFM for Vanable Frequency Measurements of dC/dV2018
- Author(s)
  Ryota Fukuzawa and Takuji Takahashi
- Organizer
  14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-14) & 26th International Colloquium on Scanning Probe Microscopy (ICSPM26)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Photothermal Measurements by AFM on Cu(In,Ga)Se2 Materials2017
- Author(s)
  Risa Komatsu, Yasushi Hamamoto, Takashi Minemoto, and Takuji Takahashi
- Organizer
  International Scanning Probe Microscopy Conference (Kyoto 2017)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Photo-carrier Recombination Properties in Cu(In,Ga)Se2 Solar Cells Investigated by Photo-assisted KFM under Various Illumination Conditions2017
- Author(s)
  Hyeondeuk Yong, Takashi Minemoto, and Takuji Takahashi
- Organizer
  25th International Colloquium on Scanning Probe Microscopy (ICSPM25)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Local Measurements of Surface Capacitance by Electrostatic Force Microscopy on Cu(In,Ga)Se2 Materials2017
- Author(s)
  Tomoaki Ishii, Takashi Minemoto, and Takuji Takahashi
- Organizer
  2017 IEEE 44th Photovoltaic Specialist Conference (PVSC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Photovoltaic Measurements on Cu(In,Ga)Se2 Solar Cells by Photo-assisted KFM under Various Illumination Conditions2017
- Author(s)
  Hyeondeuk Yong, Takashi Minemoto, and Takuji Takahashi
- Organizer
  International Scanning Probe Microscopy Conference (Kyoto 2017)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] Photothermal-mode AFM on Cu(In,Ga)Se2 Materials2017
- Author(s)
  Risa Komatsu, Takashi Minemoto, and Takuji Takahashi
- Organizer
  25th International Colloquium on Scanning Probe Microscopy (ICSPM25)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H02783
[Presentation] AFM 光熱分光法による Cu(In,Ga)Se2 太陽電池における非発光再結合の観測2013
- Author(s)
  浜本寧,原賢二,峯元高志,高橋琢二
- Organizer
  第60回応用物理学会春季学術講演会
- Place of Presentation
  厚木
- Year and Date
  2013-03-28
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] P-KFM による CIGS 太陽電池における光励起キャリア再結合プロセスの評価2013
- Author(s)
  龍顯得,中島悠,峯元高志,高橋琢二
- Organizer
  第60回応用物理学会春季学術講演会
- Place of Presentation
  厚木
- Year and Date
  2013-03-28
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Local PhotothermalMeasurements by AFM on Cu(In,Ga)Se2Solar Cells2012
- Author(s)
  Y. Hamamoto, K. Hara, T. Minemoto, and T. Takahashi
- Organizer
  20th International Colloqui- um on Scanning Probe Microscopy (ICSPM20)
- Place of Presentation
  Naha, Japan
- Year and Date
  2012-12-17
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] ScanningProbe Analyses on Cu(In,Ga)Se2 Solar CellMaterials2012
- Author(s)
  M. Takihara, K. Hara, Y. Nakajima, T. Minemoto, and T. Takahashi
- Organizer
  Seeing at the Nanoscale 2012
- Place of Presentation
  Bristol, U.K.
- Year and Date
  2012-07-10
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Cu(InGa)Se2薄膜に対するAFM光熱分光測定2012
- Author(s)
  原賢二, 峯元高志, 高橋琢二
- Organizer
  第59回応用物理学会関係連合講演会
- Place of Presentation
  東京
- Year and Date
  2012-03-17
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photovoltage DecayMeasurements by Photo-assisted KelvinProbe Force Microscopy on Cu(In,Ga)Se2Solar Cells2012
- Author(s)
  T. Takahashi
- Organizer
  4th Multifrequency AFM Con- ference, Oral 16
- Place of Presentation
  Madrid, Spain
- Year and Date
  2012-10-16
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] CIGS太陽電池における光起電力減衰時定数と再結合プロセス2012
- Author(s)
  中島悠、峯元高志、高橋琢二
- Organizer
  第59回応用物理学会関係連合講演会
- Place of Presentation
  東京
- Year and Date
  2012-03-17
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photovolt-age Decay Measurements on Cu(In,Ga)Se2Solar Cells by Photo-assisted Kelvin Probe Force Microscopy2012
- Author(s)
  Y. Nakajima, M. Takihara, T. Minemoto, and T. Takahashi
- Organizer
  38th IEEE Photovoltaic Specialists Conference (PVSC 38)
- Place of Presentation
  Austin, U.S.A.
- Year and Date
  2012-06-06
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] 「AFM 光熱分光法による Cu(In,Ga)Se2 薄膜中ギャップ内準位の観測」2012
- Author(s)
  浜本寧,原賢二,峯元高志,高橋琢二
- Organizer
  第73回応用物理学会学術講演会
- Place of Presentation
  松山
- Year and Date
  2012-09-12
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] SPM を用いた太陽電池材料の多角的評価2012
- Author(s)
  高橋琢二
- Organizer
  第17回結晶工学セミナー「物理・化学分析の最先端技術を基礎から理解する」-グリーンデバイス材料を中心に-
- Place of Presentation
  東京
- Year and Date
  2012-12-05
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Local Photothermal Measurement by AFM around Grain Boundaries in Multicrys- talline Si Solar Cell2012
- Author(s)
  K. Hara and T. Takahashi
- Organizer
  International Con- ference on Nanoscience + Technology (ICN+T2012)
- Place of Presentation
  Paris, France
- Year and Date
  2012-07-25
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photovoltage Decay Measurements by P-KFM on Cu(In,Ga)Se2Solar Cells2012
- Author(s)
  H. Yong, Y. Nakajima, T. Minemoto, and T. Takahashi
- Organizer
  20th International Colloqui- um on Scanning Probe Microscopy (ICSPM20)
- Place of Presentation
  Naha, Japan
- Year and Date
  2012-12-19
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photo- thermal Spectroscopy on Multicrystalline Silicon Solar Cell Materials by Dual Sam- pling Method in Atomic Force Microscopy2012
- Author(s)
  K. Hara and T. Takahashi
- Organizer
  38th IEEE Photovoltaic Specialists Con- ference (PVSC 38)
- Place of Presentation
  Austin, U.S.A.
- Year and Date
  2012-06-05
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] CIGS 太陽電池における光起電力減衰時定数と再結合プロセス2012
- Author(s)
  中島悠,峯元高志,高橋琢二
- Organizer
  第59回応用物理学会関係連合講演会,17p-C1-10
- Place of Presentation
  東京
- Year and Date
  2012-03-17
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] P-KFM による CIGS 太陽電池における再結合プロセスの時定数測定2012
- Author(s)
  龍顯得,中島悠,峯元高志,高橋琢二
- Organizer
  第73回応用物理学会学術講演会
- Place of Presentation
  松山
- Year and Date
  2012-09-11
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photo-assisted Kelvin Probe Force Microscopy onCu(In,Ga)Se2 Solar Cells2012
- Author(s)
  T. Takahashi, Y. Nakajima, M. Takihara, and T. Minemoto
- Organizer
  (Invited), The14th International Scanning Probe Micros- copy Conference (Toronto 2012)
- Place of Presentation
  Toronto, Canada
- Year and Date
  2012-06-17
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] 多結晶Si太陽電池に対する近赤外光照射下でのAFM光熱分光測定2012
- Author(s)
  原賢二, 高橋琢二
- Organizer
  第59回応用物理学会関係連合講演会
- Place of Presentation
  東京
- Year and Date
  2012-03-17
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Cu(InGa)Se2薄膜に対する AFM 光熱分光測定2012
- Author(s)
  原賢二 , 峯元高志 , 高橋琢二
- Organizer
  第59回応用物理学会関係連合講演会
- Place of Presentation
  東京
- Year and Date
  2012-03-17
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photo- thermal and Potential Properties Inves- tigated by SPMs around Grain Boundary in Multicrystalline Si Solar Cell2011
- Author(s)
  K. Hara and T. Takahashi
- Organizer
  Inter- national Scanning Probe Microscopy Con- ference (ISPM 2011)
- Place of Presentation
  Munich, Germany
- Year and Date
  2011-06-20
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Local Characterization of Multicrystalline Silicon Solar Cells through Photothermal and Potential Measurements by Scanning Probe Microscopy2011
- Author(s)
  Kenji Hara, Takuji Takahashi
- Organizer
  2011 International Conference on Solid State Devices and Materials (SSDM 2011)
- Place of Presentation
  名古屋
- Year and Date
  2011-09-30
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] 走査プローブ顕微鏡を用いた光熱/ポテンシャル測定による多結晶シリコン太陽電池の局所的評価2011
- Author(s)
  原賢二, 高橋琢二
- Organizer
  第72回応用物理学会学術講演会
- Place of Presentation
  山形
- Year and Date
  2011-09-01
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] CIGS太陽電池における光起電力減衰時定数測定2011
- Author(s)
  中島悠, 峯元高志, 高橋琢二
- Organizer
  第72回応用物理学会学術講演会
- Place of Presentation
  山形
- Year and Date
  2011-08-30
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photovoltage Decay Inves- tigated by Photoassisted Kelvin ProbeForce Microscopy on Cu(In,Ga)Se2 SolarCells2011
- Author(s)
  Y. Nakajima, T. Minemoto, and T. Takahashi
- Organizer
  19th International Colloquium on Scanning Probe Microscopy (ICSPM19)
- Place of Presentation
  Hokkaido, Japan
- Year and Date
  2011-12-20
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] SPMを利用した太陽電池材料の評価2011
- Author(s)
  高橋琢二
- Organizer
  第21回格子欠陥フォーラム「格子欠陥が担うエネルギー・環境材料に関する挑戦課題」
- Place of Presentation
  富山(招待講演)
- Year and Date
  2011-09-19
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photothermal and Potential Properties Investigated by SPMs around Grain Boundary in Multicrystalline Si Solar Cel2011
- Author(s)
  Kenji Hara, Takuji Takahashi
- Organizer
  International Scanning Probe Microscopy Conference (ISPM) 2011
- Place of Presentation
  Munich, Germany
- Year and Date
  2011-06-20
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Local Photothermal Analysis around Grain Boundary in Multicrystalline Si Solar Cell by Atomic Force Microscopy2011
- Author(s)
  K. Hara and T. Takahashi
- Organizer
  International Workshop on Scanning Probe Microscopy for Energy Applications 2011
- Place of Presentation
  Mainz, Germany
- Year and Date
  2011-06-08
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Local Characterization of Multicrystalline Sili con Solar Cells through Photothermal and Potential Measurements by Scanning Probe Microscopy2011
- Author(s)
  K. Hara and T. Takahashi
- Organizer
  2011 International Conference on Solid State Devices and Materials (SSDM 2011)
- Place of Presentation
  Nagoya,Japan
- Year and Date
  2011-09-30
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Characterization of Solar Cell Materials by SPMs2011
- Author(s)
  Takuji Takahashi
- Organizer
  International Workshop on Scanning Probe Microscopy for Energy Applications 2011
- Place of Presentation
  Mainz, Germany(Invited)
- Year and Date
  2011-06-08
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Local Photothermal Measurement by AFM under Near-Infrared Light around Grain Bound- aries in Multicrystalline Si Solar Cell2011
- Author(s)
  K. Hara and T. Takahashi
- Organizer
  19th International Colloquium on Scan- ning Probe Microscopy (ICSPM19)
- Place of Presentation
  Hokkaido, Japan
- Year and Date
  2011-12-20
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Characterization of Solar Cell Materials by SPMs2011
- Author(s)
  T. Takahashi
- Organizer
  (Invited), International Workshop on Scanning Probe Microscopy for Energy Applications 2011
- Place of Presentation
  Mainz, Germany
- Year and Date
  2011-06-08
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] SPM を利用した太陽電池材料の評価2011
- Author(s)
  高橋琢二
- Organizer
  第21回格子欠陥フォーラム「格子欠陥が担うエネルギー・環境材料に関する挑戦課題」
- Place of Presentation
  富山
- Year and Date
  2011-09-19
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photothermal Signals on Multicrystalline Silicon Solar Cells Measured by Dual Sampling Method in Atomic Force Microscopy2011
- Author(s)
  Kenji Hara, Takuji Takahashi
- Organizer
  16th International Conference on Photoacoustic and Photothermal Phenomena (ICPPP16)
- Place of Presentation
  Merida, Mexico
- Year and Date
  2011-11-28
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photovoltage Decay Investigated by Photoassisted Kelvin Probe Force Microscopy on Cu (In, Ga) Se2 Solar Cells2011
- Author(s)
  Yu Nakajima, Takashi Minemoto, Takuji Takahashii
- Organizer
  19th International Colloquium on Scanning Probe Microscopy (ICSPM19)
- Place of Presentation
  洞爺湖
- Year and Date
  2011-12-20
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photo- thermal and Potential Measurements by SPM around Grain Boundaries in Multi- crystalline Si Solar Cells2011
- Author(s)
  K. Hara and T. Takahashi
- Organizer
  Seeing at the Nanoscale 2011
- Place of Presentation
  Santa Barbara, U.S.A.
- Year and Date
  2011-07-20
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photo- thermal Signals on Multicrystalline Silicon Solar Cells Measured by Dual Sampling Method in Atomic Force Microscopy2011
- Author(s)
  K. Hara and T. Takahashi
- Organizer
  16th International Conference on Photoacoustic and Photothermal Phenomena (ICPPP16)
- Place of Presentation
  Merida, Mexico
- Year and Date
  2011-11-28
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Local Photothermal Analysis around Grain oundary in Multicrystalline Si Solar Cell by Atomic Force Microscopy2011
- Author(s)
  Kenji Hara, Takuji Takahashi
- Organizer
  International Workshop on Scanning Probe Microscopy for Energy Applications 2011
- Place of Presentation
  Mainz, Germany
- Year and Date
  2011-06-08
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photo- thermal and Potential Properties around Grain Boundary in Multicrystalline Si Solar Cell Studied by AFM2010
- Author(s)
  K. Hara and T. Takahashi
- Organizer
  18th Inter- national Colloquium on Scanning Probe Microscopy (ICSPM 18)
- Place of Presentation
  Atagawa, Japan
- Year and Date
  2010-12-09
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] ScanningProbe Microscopy on Cu(InGa)Se2 SolarCell Material to Analyze Band Profile around Grain Boundary2010
- Author(s)
  T. Takahashi, M. Takihara, T. Minemoto, and Y. Wakisaka
- Organizer
  18th Interna- tional Vacuum Congress (IVC-18) / Inter- national Conference on Nanoscience and Technology (ICN+T 2010),
- Place of Presentation
  Beijing, P.R.China
- Year and Date
  2010-08-24
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Nano-probe characterization of multicrystalline Si solar cell materials2010
- Author(s)
  Takuji Takahashi (Invited)
- Organizer
  The Forum on the Science and Technology of Silicon Materials 2010
- Place of Presentation
  岡山
- Year and Date
  2010-11-14
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photothermal Characterization by Atomic Force Microscopy around Grain Boundary in Multicrystalline Silicon Material2010
- Author(s)
  Kenji Hara, Takuji Takahashi
- Organizer
  35th IEEE Photovoltaic Specialists Conference (PVSC)
- Place of Presentation
  Hawaii, USA
- Year and Date
  2010-06-22
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] SPM characterization of solar cell materials2010
- Author(s)
  Takuji Takahashi
- Organizer
  18th International Colloquium on Scanning Probe Microscopy (ICSPM 18)
- Place of Presentation
  熱川(Invited)
- Year and Date
  2010-12-11
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Scanning probe microscopy on Cu (InGa) Se2 solar cell material to analyze band profile around grain boundary2010
- Author(s)
  Takuji Takahashi, Masaki Takihara, Takashi Minemoto, Youichi Wakisaka
- Organizer
  18th International Vacuum Congress (IVC-18)/International Conference on Nanoscience and Technology (ICN+T 2010)
- Place of Presentation
  Beijing, P.R.China
- Year and Date
  2010-08-24
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Local Photothermal Analysis by Atomic Force Microscopy around Grain Boundary in Multicrystalline Si Solar Cell2010
- Author(s)
  K. Hara and T. Takahashi
- Organizer
  The Forum on the Science and Technology of Silicon Materials 2010
- Year and Date
  2010-11-15
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Local Photothermal Analysis by Atomic Force Microscopy around Grain Boundary in Multicrystalline Si Solar Cell2010
- Author(s)
  Kenji Hara, Takuji Takahashi
- Organizer
  The Forum on the Science and Technology of Silicon Materials 2010
- Place of Presentation
  岡山
- Year and Date
  2010-11-15
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photo- thermal Characterization by Atomic Force Microscopy around Grain Boundary in Multicrystalline Silicon Material2010
- Author(s)
  K. Hara and T. Takahashi
- Organizer
  35th IEEE Photovoltaic Specialists Conference (PVSC)
- Place of Presentation
  Honolulu, U.S.A.
- Year and Date
  2010-06-22
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Local Photothermal Measurements by AFM around Grain Boundary in Multicrystalline Silicon Material2010
- Author(s)
  K. Hara and T. Takahashi
- Organizer
  The 12th International Scanning Probe Microscopy Conference (Sapporo 2010),
- Place of Presentation
  Sapporo, Japan
- Year and Date
  2010-06-11
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Nano-probe characterization of multicrystalline Si solar cell materials2010
- Author(s)
  Takuji Takahashi
- Organizer
  The Forum on the Science and Technology of Silicon Materials 2010
- Place of Presentation
  岡山(Invited)
- Year and Date
  2010-11-15
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photothermal Spectroscopy by Atomic Force Microscopy on Crystalline Silicon Solar Cell Materials2010
- Author(s)
  Kenji Hara, Takuji Takahashi
- Organizer
  2010 International Conference on Solid State Devices and Materials (SSDM 2010)
- Place of Presentation
  東京
- Year and Date
  2010-09-24
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photothermal Spectroscopic Measurements by AFM around Grain Boundary in Multicrystalline Silicon Material2010
- Author(s)
  Kenji Hara, Takuji Takahashi
- Organizer
  18th International Vacuum Congress (IVC-18)/International Conference on Nanoscience and Technology (ICN+T 2010)
- Place of Presentation
  Beijing, P.R.China
- Year and Date
  2010-08-25
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] 走査プローブ顕微鏡を利用したCu(InGa)Se2太陽電池材料中結晶粒界近傍のバンド構造解析2010
- Author(s)
  瀧原昌輝, 峯元高志, 高橋琢二
- Organizer
  ナノ量子情報エレクトロニクス研究機構公開シンポジウム「ナノ量子情報エレクトロニクスの進展」
- Place of Presentation
  東京
- Year and Date
  2010-12-22
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Band profile around grain boundary of Cu (InGa) Se2 solar cell materials investigated by scanning probe microscopy2010
- Author(s)
  Masaki Takihara, Takashi Minemoto, Youichi Wakisaka, Takuji Takahashi
- Organizer
  The 12th International Scanning Probe Microscopy Conference (Sapporo 2010)
- Place of Presentation
  札幌
- Year and Date
  2010-05-10
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photothermal and Potential Properties around Grain Boundary in Multicrystalline Si Solar Cell Studied by AFM2010
- Author(s)
  Kenji Kara, Takuji Takahashi
- Organizer
  18th International Colloquium on Scanning Probe Microscopy (ICSPM 18)
- Place of Presentation
  熱川
- Year and Date
  2010-12-09
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] GaAs上自己形成InAs量子ドットにおける静電気力スペクトルの観測-II-2010
- Author(s)
  山田俊介, 高橋琢二
- Organizer
  第57回春季応用物理学会
- Place of Presentation
  20a-TR-4, 平塚
- Year and Date
  2010-03-20
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Band Pro-file around Grain Boundary of Cu(InGa)Se2Solar Cell Materials Characterized by Scanning Prove Microscopy2010
- Author(s)
  M. Takihara, T. Minemoto, Y. Wakisaka, and T. Takahashi
- Organizer
  35th IEEE Photovoltaic Specialists Conference (PVSC)
- Place of Presentation
  Honolulu, U.S.A.
- Year and Date
  2010-06-23
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Band Pro-file around Grain Boundary of Cu(InGa)Se2Solar Cell Materials Investigated by Scan- ning Probe Microscopy2010
- Author(s)
  M. Takihara, T. Minemoto, Y. Wakisaka, and T. Takahashi
- Organizer
  The 12th Interna- tional Scanning Probe Microscopy Confer- ence (Sapporo 2010),
- Place of Presentation
  Sapporo, Japan
- Year and Date
  2010-05-10
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] CIGS太陽電池の結晶粒界近傍におけるバンドプロファイリング2010
- Author(s)
  瀧原昌輝, 高橋琢二, 脇坂暢一, 峯元高志
- Organizer
  第57回応用物理学関係連合講演会
- Place of Presentation
  平塚
- Year and Date
  2010-03-20
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Band profile around grain boundary of Cu (InGa) Se2 solar cell materials characterized by scanning probe microscopy2010
- Author(s)
  Masaki Takihara, Takashi Minemoto, Youichi Wakisaka, Takuji Takahashi
- Organizer
  35th IEEE Photovoltaic Specialists Conference (PVSC)
- Place of Presentation
  Hawaii, USA
- Year and Date
  2010-06-23
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Band profile around grain boundary of Cu(InGa)Se2 solar cell materials investigated by scanning probe microscopy2010
- Author(s)
  Masaki Takihara, Takashi Minemoto, Youichi Wakisaka, Takuji Takahashi
- Organizer
  The 12th International Scanning Probe Microscopy Conference (Sapporo2010)
- Place of Presentation
  札幌
- Year and Date
  2010-05-12
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photo-thermal Spectroscopy by Atomic Force Mi- croscopy on Crystalline Silicon Solar Cell Materials2010
- Author(s)
  K. Hara and T. Takahashi
- Organizer
  2010 International Conference on Solid State Devices and Materials (SSDM 2010)
- Place of Presentation
  Tokyo, Japan
- Year and Date
  2010-09-24
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] SPM Characterization of Solar Cell Materials2010
- Author(s)
  T. Takahashi
- Organizer
  (Invited), 18th International Colloquium on Scanning Probe Microscopy (ICSPM 18)
- Place of Presentation
  Atagawa, Japan
- Year and Date
  2010-12-11
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] 原子間力顕微鏡による多結晶Si太陽電池の局所的光熱解析2010
- Author(s)
  原賢二, 高橋琢二
- Organizer
  ナノ量子情報エレクトロニクス研究機構公開シンポジウム「ナノ量子情報エレクトロニクスの進展」
- Place of Presentation
  東京
- Year and Date
  2010-12-22
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] GaAs上InAs量子ドット上における静電気力スペクトルの観測2010
- Author(s)
  山田俊介, 高橋琢二
- Organizer
  第57回応用物理学関係連合講演会
- Place of Presentation
  平塚
- Year and Date
  2010-03-20
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Nano-probe Character- ization of Multicrystalline Si Solar Cell Materials2010
- Author(s)
  T. Takahashi
- Organizer
  (Invited), The Forum on the Sci- ence and Technology of Silicon Materials2010
- Place of Presentation
  Okayama, Japan
- Year and Date
  2010-11-15
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Local Photothermal Measurements by AFM around Grain Boundary in Multicrystalline Silicon Material2010
- Author(s)
  Kenji Hara, Takuji Takahashi
- Organizer
  The 12th International Scanning Probe Microscopy Conference (Sapporo 2010)
- Place of Presentation
  札幌
- Year and Date
  2010-05-11
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Scanning probe microscopy on Cu(InGa)Se2 solar cell material to analyze band profile around grain boundary2010
- Author(s)
  Takuji Takahashi, Masaki Takihara, Takashi Minemoto, Youichi Wakisaka
- Organizer
  18th International Vacuum Congress (IVC-18)/International Conference on Nanoscience and Technology (ICN+T 2010)
- Place of Presentation
  Beijing, P.R.China
- Year and Date
  2010-08-23
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photo- thermal Spectroscopic Measurements by AFM around Grain Boundary in Multicrys- talline Silicon Material2010
- Author(s)
  K. Hara and T. Takahashi
- Organizer
  18th Internation- al Vacuum Congress (IVC-18) / Interna- tional Conference on Nanoscience and Technology (ICN+T 2010),
- Place of Presentation
  Beijing, P.R.China
- Year and Date
  2010-08-25
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] SPM characterization of solar cell materials2010
- Author(s)
  Takuji Takahashi (Invited)
- Organizer
  18th International Colloquium on Scanning Probe Microscopy (ICSPM 18)
- Place of Presentation
  熱川
- Year and Date
  2010-12-10
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] 原子間力顕微鏡を用いた光熱分光測定による結晶系シリコン太陽電池材料の評価2010
- Author(s)
  原賢二, 高橋琢二
- Organizer
  第71回応用物理学会学術講演会
- Place of Presentation
  長崎
- Year and Date
  2010-09-15
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Band profile around grain boundary of Cu(InGa) Se2 solar cell materials characterized by scanning probe microscopy2010
- Author(s)
  Masaki Takihara, Takashi Minemoto, Youichi Wakisaka, Takuji Takahashi
- Organizer
  35th IEEE Photovoltaic Specialists Conference (PVSC)
- Place of Presentation
  Hawaii, USA
- Year and Date
  2010-06-20
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Local Measurements of Photothermal Signals on Polycrystalline Silicon Materials by Dual Sampling Method in Atomic Force Micros- copy2009
- Author(s)
  K. Hara and T. Takahashi
- Organizer
  2009 International Conference on Solid State Devices and Materials (SSDM2009)
- Place of Presentation
  Sendai, Japan
- Year and Date
  2009-10-08
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Electrostatic Force Spectra on InAs Quantum Dots on GaAs Obtained by Noncontact AFM with a Conductive Tip2009
- Author(s)
  S. Yamada, T. Takahashi
- Organizer
  17th International Colloquium on Scanning Probe Microscopy (ICSPM17), S4-43, Atagawa
- Place of Presentation
  Japan
- Year and Date
  2009-10-10
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Grain Boundary Characteristics of Cu(InGa)Se2 Solar Cells Studied by Photoassisted Kelvin Probe Force Microscopy2009
- Author(s)
  Masaki Takihara, Takashi Minemoto, Youichi Wakisaka Takuji Takahashi
- Organizer
  17th International Colloquium on Scanning Probe Microscopy (ICSPM17)
- Place of Presentation
  熱川
- Year and Date
  2009-12-11
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] CIGS太陽電池の結晶粒界におけるポテンシャル分布とそのGa濃度依存性2009
- Author(s)
  瀧原昌輝, 峯元高志, 脇坂暢一, 高橋琢二
- Organizer
  第70回応用物理学会学術講演会
- Place of Presentation
  富山
- Year and Date
  2009-09-10
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Potential Profi les around Grain Boundary Studied by Photoassisted Kelvin Probe Force Microscopy on Cu(InGa)Se2 Solar Cells2009
- Author(s)
  Masaki Takihara, Takashi Minemoto, Youichi Wakisaka, Takuji Takahashi
- Organizer
  2009 International Conference on Solid State Devices and Materials (SSDM 2009)
- Place of Presentation
  宮城
- Year and Date
  2009-09-08
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Grain Boundary Characteristics of Cu(InGa)Se2Solar Cells Studied by Photoassisted Kel- vin Probe Force Microscopy2009
- Author(s)
  M. Takihara, T. Minemoto, Y. Wakisaka, and T. Takahashi
- Organizer
  17th Inter- national Colloquium on Scanning Probe Microscopy (ICSPM 17)
- Place of Presentation
  Atagawa, Japan
- Year and Date
  2009-12-11
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] 光KFMによる多結晶シリコン太陽電池の局所的物性評価2009
- Author(s)
  高橋琢二, 瀧原昌輝
- Organizer
  第56回春季応用物理学会
- Place of Presentation
  31p-TG-6, 筑波大学, つくば
- Year and Date
  2009-03-31
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Electrostatic Force Spectra on InAs Quantum Dots on GaAs Obtained by Noncontact AFM with a Conductive Tip2009
- Author(s)
  山田俊介, 高橋琢二
- Organizer
  17th International Colloquium on Scanning Probe Microscopy(ICSPM17)
- Place of Presentation
  伊豆熱川
- Year and Date
  2009-12-10
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] GaAs上自己形成InAs量子ドットにおける静電気カスペクトルの観測2009
- Author(s)
  山田俊介, 高橋琢二
- Organizer
  第70回応用物理学会学術講演会
- Place of Presentation
  9p-L-13, 富山
- Year and Date
  2009-09-09
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] GaAs上自己形成InAs量子ドットにおける静電気力スペクトルの観測2009
- Author(s)
  山田俊介, 高橋琢二
- Organizer
  第70回応用物理学会学術講演会
- Place of Presentation
  富山
- Year and Date
  2009-09-09
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] 光KFMによる多結晶シリコン太陽電池の局所的物性評価2009
- Author(s)
  高橋琢二, 瀧原昌輝
- Organizer
  第56回春季応用物理学会
- Place of Presentation
  つくば
- Year and Date
  2009-03-31
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Nonradia- tive Recombination Property around Grain Boundary in Multicrystalline Silicon Mate- rials Studied by Photothermal Measure-ments in AFM2009
- Author(s)
  K. Hara and T. Takahashi
- Organizer
  17th International Collo- quium on Scanning Probe Microscopy (ICSPM 17)
- Place of Presentation
  Atagawa, Japan
- Year and Date
  2009-12-11
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Potential Profiles around Grain Boundary Studied by Photoassisted Kelvin Probe Force Mi-croscopy on Cu(InGa)Se2 Solar Cells2009
- Author(s)
  M. Takihara, T. Minemoto, Y. Wakisaka, and T. Takahashi
- Organizer
  2009International Conference on Solid State Devices and Materials (SSDM 2009)
- Place of Presentation
  Sendai, Japan
- Year and Date
  2009-10-09
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photovoltaic Characterization of Cu(InGa)Se2 and Cu(InAl)Se2 Solar Cells by Photoassisted Kelvin Probe Force Microscopy2009
- Author(s)
  Masaki Takihara, Takashi Minemoto, Youichi Wakisaka, Shunsuke Yamada, Takuji Takahashi
- Organizer
  The 34th IEEE Photovoltaic Specialists Conference (PVSC)
- Place of Presentation
  Philadelphia, USA
- Year and Date
  2009-06-08
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Improvement of KFM Performance by Intermittent Bias Application Method and by Sampling Detection of Cantilever Deflection2008
- Author(s)
  T. Takahashi, T. Matsumoto, S. Ono
- Organizer
  International Scanning Probe Microscopy Conference (Seattle 08), P-18
- Place of Presentation
  Seattle, USA
- Year and Date
  2008-06-23
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Minority Carrier Dynamics in Polycrystalline Silicon Solar Cells Studied by Photo-assisted Kelvin Probe Force Microscopy2008
- Author(s)
  M. Takihara, T. Ujihara, T. Takahashi
- Organizer
  33rd IEEE Photovoltaic Specialists Conference (PVSC 33), #339
- Place of Presentation
  San Diego, USA
- Year and Date
  2008-05-14
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Photoassisted Kelvin Probe Force Microscopy for Measuring Minority Carrier Lifetime in Solar Cell Materials2008
- Author(s)
  瀧原昌輝、高橋琢二
- Organizer
  16th International Colloquium on Scanning Probe Microscopy(ICSPM16)
- Place of Presentation
  伊豆熱川
- Year and Date
  2008-12-11
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Multiple Characterization of Minority Carriers in Polycrystalline Silicon Solar Cells by Photoassisted Kelvin Probe Force Microscopy2008
- Author(s)
  M. Takihara, T. Ujihara, T. Takahashi
- Organizer
  16th International Colloquium on Scanning Probe Microscopy (ICSPM16), S4-25, Atagawa
- Place of Presentation
  Japan
- Year and Date
  2008-12-11
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Minority Carrier Dynamics in Polycrystalline Silicon Solar Cells Investigated by Photo-assisted Kelvin Probe Force Microscopy2008
- Author(s)
  Masaki Takihara, Toru Ujihara, Takuji Takahashi
- Organizer
  18th Workshop on Crystalline Silicon Solar Cells & Modules : Materials and Processes
- Place of Presentation
  Vail, USA
- Year and Date
  2008-08-04
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Intermittent Bias Application Method for High Performance KFM2008
- Author(s)
  T. Takahashi, T. Matsumoto, S. Ono
- Organizer
  International Conference on Nanoscience+Technology (ICN+T 2008)
- Place of Presentation
  SP-TuM12, Keystone, USA
- Year and Date
  2008-07-22
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Minority Carrier Dynamics in Polycrystalline Silicon Solar Cell Investigated by Photo-assisted Kelvin Probe Force Microscopy2008
- Author(s)
  Takuji Takahashi, Masaki Takihara, Toru Ujihara
- Organizer
  International Scanning Probe Microscopy Conference(Seattle 08)
- Place of Presentation
  Seattle, USA
- Year and Date
  2008-06-21
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] 間欠バイアスKFMを利用した静電引力の距離依存性に関する検討2008
- Author(s)
  松本忠久, 小野志亜之, 高橋琢二
- Organizer
  第55回応用物理学関係連合講演会
- Place of Presentation
  29a-Q-12, 千葉
- Year and Date
  2008-03-29
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Minority Carrier Dynamics in Polycrystalline Silicon Solar Cells Studied by Photo-assisted Kelvin Probe Force Microscopy2008
- Author(s)
  Masaki Takihara, Toru Ujihara, Takuji Takahashi
- Organizer
  33rd IEEE Photovoltaic Specialists Conference(PVSC 33)
- Place of Presentation
  San Diego, USA
- Year and Date
  2008-05-14
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Minority Carrier Dynamics in Polycrystalline Silicon Solar Cell Investigated by Photo-assisted Kelvin Probe Force Microscopy2008
- Author(s)
  T. Takahashi, M. Takihara, T. Ujihara
- Organizer
  International Scanning Probe Microscopy Conference (Seattle 08), O-7
- Place of Presentation
  Seattle, USA
- Year and Date
  2008-06-22
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Diffusion Length, Lifetime and Mobility of Minority Carrier in Polycrystalline Silicon Solar Cells Measured by Photo-assisted Kelvin Probe Force Microscopy2008
- Author(s)
  Masaki Takihara, Toru Ujihara, Takuji Takahashi
- Organizer
  The 4th Asian Conference on Crystal Growth and Crystal Technology(CGCT4)
- Place of Presentation
  仙台
- Year and Date
  2008-05-24
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Photoassisted Kelvin Probe Force Microscopy for Measuring Minority Carrier Lifetime in Solar Cell Materials2008
- Author(s)
  M. Takihara, T. Takahashi
- Organizer
  16th International Colloquium on Scanning Probe Microscopy (ICSPM16), S4-26, Atagawa
- Place of Presentation
  Japan
- Year and Date
  2008-12-11
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] 光KFMによる少数キャリアライフタイム測定の妥当性の検証2008
- Author(s)
  瀧原昌輝, 高橋琢二
- Organizer
  第69回応用物理学会学術講演会
- Place of Presentation
  3a-S-6, 名古屋
- Year and Date
  2008-09-03
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Intermittent Bias Application Method for High Performance KFM2008
- Author(s)
  Takuji Takahashi, Tadahisa Matsumoto, Shiano Ono
- Organizer
  International Conference on Nanoscience+Technology(ICN+T 2008)
- Place of Presentation
  Keystone, USA.
- Year and Date
  2008-07-22
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Photo-assisted Kelvin Probe Force Microscopy for Investigating Minority Carrier Dynamics in Polycrystalline Silicon Solar Cells2008
- Author(s)
  M. Takihara, T. Ujihara, T. Takahashi
- Organizer
  International Conference on Nanoscience+Technology (ICN+T2008)
- Place of Presentation
  SP-TuM11, Keystone, USA
- Year and Date
  2008-07-22
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Improvement of KFM Performance by Intermittent Bias Application Method and by Sampling Detection of Cantilever Deflection2008
- Author(s)
  Takuji Takahashi, Tadahisa Matsumoto, Shiano Ono
- Organizer
  International Scanning Probe Microscopy Conference(Seattle 08)
- Place of Presentation
  Seattle, USA
- Year and Date
  2008-06-22
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] 光KFMによる多結晶Si太陽電池の少数キャリア拡散長及び移動度測定2008
- Author(s)
  瀧原昌輝, 宇治原徹, 高橋琢二
- Organizer
  第55回応用物理学関係連合講演会
- Place of Presentation
  30a-ZC-3, 千葉
- Year and Date
  2008-03-30
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] 光KFMによる多結晶Si太陽電池の少数キャリアライフタイム測定2008
- Author(s)
  瀧原昌輝, 宇治原徹, 高橋琢二
- Organizer
  第55回応用物理学関係連合講演会
- Place of Presentation
  千葉
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] 間欠バイアスKFMを利用した静電引力の距離依存性に関する検討2008
- Author(s)
  松本忠久, 小野志亜之, 高橋琢二
- Organizer
  第55回応用物理学関係連合講演会
- Place of Presentation
  千葉
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] 光KFMによる少数キャリアライフタイム測定の妥当性の検証2008
- Author(s)
  瀧原昌輝、高橋琢二
- Organizer
  第69回応用物理学会学術講演会
- Place of Presentation
  名古屋
- Year and Date
  2008-09-03
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] 光KFMによる多結晶Si太陽電池の少数キャリア拡散長及び移動度測定2008
- Author(s)
  瀧原昌輝, 宇治原徹, 高橋琢二
- Organizer
  第55回応用物理学関係連合講演会
- Place of Presentation
  千葉
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] 光KFMによる多結晶Si太陽電池の少数キャリアライフタイム測定2008
- Author(s)
  瀧原昌輝, 宇治原徹, 高橋琢二
- Organizer
  第55回応用物理学関係連合講演会
- Place of Presentation
  30a-ZC-2, 千葉
- Year and Date
  2008-03-30
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Photo-assisted Kelvin Probe Force Microscopy for Investigating Minority Carrier Dynamics in Polycrystalline Silicon Solar Cells2008
- Author(s)
  Masaki Takihara, Toru Ujihara, Takuji Takahashi
- Organizer
  International Conference on Nanoscience+Technology(ICN+T 2008)
- Place of Presentation
  Keystone, USA.
- Year and Date
  2008-07-22
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Multiple Characterization of Minority Carriers in Polycrystalline Silicon Solar Cells by Photoassisted Kelvin Probe Force Microscopy2008
- Author(s)
  Masaki Takihara, Toru Ujihara, Takuji Takahashi
- Organizer
  16th International Colloquium on Scanning Probe Microscopy(ICSPM16)
- Place of Presentation
  伊豆熱川
- Year and Date
  2008-12-11
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Photovoltage Mapping on Polycrystalline Silicon Solar Cells by Kelvin Probe Force Micorscopy2007
- Author(s)
  M. Takihara, T. Igarashi, T. Ujihara, T. Takahashi
- Organizer
  22nd European Photovoltaic Solar Energy Conference (22nd EU-PVSEC)
- Place of Presentation
  Milano, Italy
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Minority Carrier Diffusion Length in Polycrystalline Silicon Solar Cell Materials Evaluated through Surface Photovoltage Measurements by Kelvin Probe Force Microscopy2007
- Author(s)
  T. Takahashi, M. Takihara, T. Ujihara
- Organizer
  International Scanning Probe Microscopy Conference (Jeju 2007 ISPM)
- Place of Presentation
  PI-1-07, Jeju, Korea
- Year and Date
  2007-06-11
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Electrostatic Force Spectroscopy on Self-assembled InAs Quantum Dots2007
- Author(s)
  T. Takahashi
- Organizer
  International Scanning Probe Microscopy Conference (Jeju 2007 ISPM)
- Place of Presentation
  PII-4-06, Jeju, Korea
- Year and Date
  2007-06-12
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Photovoltage Mapping on Polycrystalline Silicon Solar Cells Studied by Kelvin Probe Force Microscopy2007
- Author(s)
  T. Takahashi, M. Takihara, T. Igarashi, T. Ujihara
- Organizer
  International Scanning Probe Microscopy Conference (Jeju 2007 ISPM)
- Place of Presentation
  OP3, Jeju, Korea
- Year and Date
  2007-07-11
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Influence of a Long-range Feature of an Electrostatic Force and Effectiveness of Intermittent Bias Application Method in Kelvin Probe Force Microscopy2007
- Author(s)
  T. Matsumoto, S. Ono, T. Takahashi
- Organizer
  15th International Colloquium on Scanning Probe Microscopy (ICSPM15)
- Place of Presentation
  S4-79, Atagawa, Japan
- Year and Date
  2007-12-06
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Photovoltage Mapping on Polycrystalline Silicon Solar Cells by Kelvin Probe Force Micooscopy2007
- Author(s)
  M. Takihara, T. Igarashi, T. Ujihara, T. Takahashi
- Organizer
  17th International Vacuum Congress (IVC-17)/13th International Conference on Surface Science (ICSS-13)/International Conference on Nano Science and Technology (ICN+T 2007), NSP1-84
- Place of Presentation
  Stockholm, Sweden
- Year and Date
  2007-07-02
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Electrostatic Force Spectroscopy on Self-assembled InAs Quantum Dots2007
- Author(s)
  T. Takahashi
- Organizer
  International Scanning Probe Microscopy Conference (Jeju 2007 ISPM)
- Place of Presentation
  Jeju, Korea
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Minority Carrier Diffusion Length Measurements on Polycrystalline Silicon Solar Cells by Kelvin Probe Force Microscopy2007
- Author(s)
  M. Takihara, T. Ujihara, T. Takahashi
- Organizer
  17th International Vacuum Congress (IVC-17)/13th International Conference on Surface Science (ICSS-13)/International Conference on Nano Science and Technology (ICN+T 2007)
- Place of Presentation
  NSP1-86, Stockholm, Sweden
- Year and Date
  2007-07-02
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Photovoltage Mapping on Polycrystalline Silicon Solar Cells by Kelvin Probe Force Micorscopy2007
- Author(s)
  M. Takihara, T. Igarashi, T. Ujihara, T. Takahashi
- Organizer
  22nd European Photovoltaic Solar Energy Conference (22nd EU-PVSEC)
- Place of Presentation
  1CV.2.12, Milano, Italy
- Year and Date
  2007-09-05
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Minority Carrier Diffusion Length in Polycrystalline Silicon Solar Cell Materials Evaluated through Surface Photovoltage Measurements by KelvinProbeForceMicroscopy2007
- Author(s)
  T. Takahashi, M. Takihara, T. Ujihara
- Organizer
  International Scanning Probe Microscopy Conference (Jeju 2007 ISPM)
- Place of Presentation
  Jeju, Korea
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Minority Carrier Dynamics in Polycristalline Silicon Solar Cells Studied by Photo-assisted Kelvin Probe Force Microscopy2007
- Author(s)
  M. Takihara, T. Ujihara, T. Takahashi
- Organizer
  17th International Photovoltaic Science and Engineering Conference (PVSEC-17)
- Place of Presentation
  4P-P2-53, Fukuoka, Japan
- Year and Date
  2007-12-04
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Photovoltage Mapping on Polycrystalline Silicon Solar Cells by Kelvin Probe Force Micorscopy2007
- Author(s)
  M. Takihara, T. Igarashi, T. Ujihara, T. Takahashi
- Organizer
  17th International Vacuum Congress (IVC-17)/13th International Conference on Surface Science (ICSS-13)/International Conference on Nano Science and Technology (ICN+T 2007)
- Place of Presentation
  Stockholm, Sweden
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Minority Carrier Dynamics in Polycristalline Silicon Solar Cells Studied by Photo-assisted Kelvin Probe Force Microscopy2007
- Author(s)
  M. Takihara, T. Ujihara, T. Takahashi
- Organizer
  International Photovoltaic Science and Engineering Conference (PVSEC-17)
- Place of Presentation
  Fukuoka, Japan
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Minority Carrier Diffusion Length Measurements on Polycrystalline Silicon Solar Cells by Kelvin Probe Force Microscopy2007
- Author(s)
  M. Takihara, T. Ujihara, T. Takahashi
- Organizer
  17th International Vacuum Congress (IVC-17)/13th International Conference on Surface Science (ICSS-13)/International Conference on Nano Science and Technology (ICN+T 2007)
- Place of Presentation
  Stockholm, Sweden
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Photovoltage Mapping on Polycrystalline Silicon Solar Cells Studied by Kelvin Probe Force Microscopy2007
- Author(s)
  T. Takahashi, M. Takihara, T. Igarashi, T. Ujihara
- Organizer
  International Scanning Probe Microscopy Conference (Jeju 2007 ISPM)
- Place of Presentation
  Jeju, Korea
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] ケルビンプローブフォース顕微鏡による多結晶シリコン太陽電池の局所的光起電力評価2007
- Author(s)
  瀧原昌輝, 五十嵐考俊, 宇治原徹, 高橋琢二
- Organizer
  第54回応用物理学関係連合講演会
- Place of Presentation
  27a-ZK-8, 神奈川
- Year and Date
  2007-03-27
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] ケルビンプローブフォース顕微鏡による多結晶シリコン太陽電池の少数キャリア拡散長測定2007
- Author(s)
  瀧原昌輝, 宇治原徹, 高橋琢二
- Organizer
  第54回応用物理学関係連合講演会
- Place of Presentation
  27a-ZK-9, 神奈川
- Year and Date
  2007-03-27
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Minority Carrier Dynamics in Polycrystalline Silicon Solar Cells Studied by Photo-assisted Kelvin Probe Force Microscopy2007
- Author(s)
  M. Takihara, T. Ujihara, T. Takahashi
- Organizer
  15th International Colloquium on Scanning Probe Microscopy (ICSPM15)
- Place of Presentation
  S10-5, Atagawa, Japan
- Year and Date
  2007-12-08
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Local Measurements of Minority Carrier Diffusion Length in Polycrystalline Silicon Solar Cells by Kelvin Probe Force Microscopy2006
- Author(s)
  M. Takihara, T. Ujihara, T. Takahashi
- Organizer
  14th International Colloquium on Scanning Probe Microscopy (ICSPM14)
- Place of Presentation
  S4-35, Atagawa
- Year and Date
  2006-12-07
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Local Characterization of Photovoltage on Polycrystalline Silicon Solar Cells by KFM with Piezo-resistive Cantilever2006
- Author(s)
  M. Takihara, T. Igarashi, T. Ujihara, T. Takahashi
- Organizer
  International Conference on Solid State Devices and Materials (SSDM2006)
- Place of Presentation
  P-9-9, Yokohama
- Year and Date
  2006-09-14
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] 自己検知型カンチレバーを用いたKFMによる多結品シリコン太陽電池の局所的光起電力評価2006
- Author(s)
  瀧原昌輝, 五十嵐考俊, 宇治原徹, 高橋琢二
- Organizer
  第67回応用物理学会学術講演会
- Place of Presentation
  30a-Y9, 草津
- Year and Date
  2006-08-30
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Local Photovoltage Measurements on Polycrystalline Silicon Solar Cells by KFM with Piezo-resistive Cantilever2006
- Author(s)
  T. Takahashi, M. Takihara, T. Igarashi, T. Ujihara
- Organizer
  International Conference on Nanoscience and Technology (ICN&T 2006)
- Place of Presentation
  P634, Basel, Switzerland
- Year and Date
  2006-07-31
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Photovoltage Mapping on Polycrystalline Silicon Solar Cells by KFM with Piezo-resistive Cantilever2006
- Author(s)
  M. Takihara, T. Igarashi, T. Ujihara, T. Takahashi
- Organizer
  14th International Colloquium on Scanning Probe Microscopy (ICSPM14)
- Place of Presentation
  S10-3, Atagawa
- Year and Date
  2006-12-09
- Data Source
  KAKENHI-PROJECT-18360019
[Presentation] Local Photothermal Measurement by AFM around Grain Boundaries in Multicrystalline Si Solar Cell
- Author(s)
  Kenji Hara and Takuji Takahashi
- Organizer
  International Conference on Nanoscience + Technology (ICN+T 2012)
- Place of Presentation
  Paris (France)
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photovoltage Decay Investigated by Photoassisted Kelvin Probe Force Microscopy on Cu(In,Ga)Se2 Solar Cells
- Author(s)
  Yu Nakajima, Takashi Minemoto and Takuji Takahashi
- Organizer
  19th International Colloquium on Scanning Probe Microscopy (ICSPM19)
- Place of Presentation
  洞爺湖 (北海道)
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photovoltage Decay Measurements by P-KFM on Cu(In,Ga)Se2 Solar Cells
- Author(s)
  Hyeondeuk Yong,Yu Nakajima,Takashi Minemoto and Takuji Takahashi
- Organizer
  20th International Colloquium on Scanning Probe Microscopy (ICSPM20)
- Place of Presentation
  那覇　(沖縄県)
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photothermal and Potential Properties Investigated by SPMs around Grain Boundary in Multicrystalline Si Solar Cells
- Author(s)
  Kenji Hara and Takuji Takahashi
- Organizer
  International Scanning Probe Microscopy Conference (ISPM) 2011
- Place of Presentation
  Munich (Germany)
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Local Characterization of Multicrystalline Silicon Solar Cells through Photothermal and Potential Measurements by Scanning Probe Microscopy
- Author(s)
  Kenji Hara and Takuji Takahashi
- Organizer
  2011 International Conference on Solid State Devices and Materials (SSDM 2011)
- Place of Presentation
  WINC AICHI (愛知県)
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] AFM光熱分光法によるCu(In,Ga)Se2薄膜中ギャップ内準位の観測
- Author(s)
  浜本寧，原賢二，峯元高志，高橋琢二
- Organizer
  第73回応用物理学会学術講演会
- Place of Presentation
  愛媛大学 (愛媛県)
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photothermal Spectroscopy by Atomic Force Microscopy on Cu(In,Ga)Se2 Solar Cells
- Author(s)
  Yasushi Hamamoto, Kenji Hara, Takashi Minemoto, and Takuji Takahashi
- Organizer
  39th Photovoltaic Specialists Conference
- Place of Presentation
  Tampa (U.S.A.)
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photothermal and Potential Measurements by SPM around Grain Boundaries in Multicrystalline Si Solar Cells
- Author(s)
  Kenji Hara and Takuji Takahashii
- Organizer
  Seeing at the Nanoscale 2011
- Place of Presentation
  Santa Barbara (U.S.A.)
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] P-KFMによるCIGS太陽電池における光励起キャリア再結合プロセスの評価
- Author(s)
  龍顯得，中島悠，峯元高志，高橋琢二
- Organizer
  第60回応用物理学会春季学術講演会
- Place of Presentation
  神奈川工科大学　(神奈川県)
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] SPMを用いた太陽電池材料の多角的評価
- Author(s)
  高橋琢二
- Organizer
  第17回結晶工学セミナー「物理・化学分析の最先端技術を基礎から理解する」-グリーンデバイス材料を中心に-
- Place of Presentation
  学習院大学　(東京都)
- Invited
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Cu(InGa)Se2薄膜に対するAFM光熱分光測定
- Author(s)
  原　賢二，峯元高志，高橋琢二
- Organizer
  第59回応用物理学会関係連合講演会
- Place of Presentation
  早稲田大学 (東京都)
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] AFM光熱分光法によるCu(In,Ga)Se2太陽電池における非発光再結合の観測
- Author(s)
  浜本寧，原賢二，峯元高志，高橋琢二
- Organizer
  第60回応用物理学会春季学術講演会
- Place of Presentation
  神奈川工科大学　(神奈川県)
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Scanning Probe Analyses on Cu(In,Ga)Se2 Solar Cell Materials
- Author(s)
  Takuji Takahashi
- Organizer
  Seeing at the Nanoscale 2012
- Place of Presentation
  Bristol (U.K.)
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] P-KFMによるCIGS太陽電池における再結合プロセスの時定数測定
- Author(s)
  龍顯得, 中島悠, 峯元高志, 高橋琢二
- Organizer
  第73回応用物理学会学術講演会
- Place of Presentation
  愛媛大学 (愛媛県)
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photo-Assisted Kelvin Probe Microscopy on Cu(In,Ga)Se2 Solar Cells
- Author(s)
  Yu Nakajima, Masaki Takihara, Takashi Minemoto, and Takuji Takahashi
- Organizer
  14th International Scanning Probe Microscopy Conference (ISPM)
- Place of Presentation
  Toronto (Canada)
- Invited
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photovoltage Decay Measurements on Cu(In,Ga)Se2 Solar Cells by Photo-assisted Kelvin Probe Force Microscopy
- Author(s)
  Yu Nakajima, Masaki Takihara, Takashi Minemoto and Takuji Takahashi
- Organizer
  38th IEEE Photovoltaic Specialists Conference (PVSC 38)
- Place of Presentation
  Austin (U.S.A.)
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photothermal Spectroscopy on Multicrystalline Silicon Solar Cell Materials by Dual Sampling Method in Atomic Force Microscopy
- Author(s)
  Kenji Hara and Takuji Takahashi
- Organizer
  38th IEEE Photovoltaic Specialists Conference (PVSC 38)
- Place of Presentation
  Austin (U.S.A.)
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Local Photothermal Measurements by AFM on Cu(In,Ga)Se2 Solar Cells
- Author(s)
  Yasushi Hamamoto, Kenji Hara, Takashi Minemoto and Takuji Takahashi
- Organizer
  20th International Colloquium on Scanning Probe Microscopy (ICSPM20)
- Place of Presentation
  那覇　(沖縄県)
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photothermal Signals on Multicrystalline Silicon Solar Cells Measured by Dual Sampling Method in Atomic Force Microscopy
- Author(s)
  Kenji Hara and Takuji Takahashi
- Organizer
  16th International Conference on Photoacoustic and Photothermal Phenomena (ICPPP16)
- Place of Presentation
  Merida (Mexico)
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] 多結晶Si太陽電池に対する近赤外光照射下でのAFM光熱分光測定
- Author(s)
  原　賢二，高橋琢二
- Organizer
  第59回応用物理学会関係連合講演会
- Place of Presentation
  早稲田大学 (東京都)
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] SPMを利用した太陽電池材料の評価
- Author(s)
  高橋琢二
- Organizer
  第21回格子欠陥フォーラム「格子欠陥が担うエネルギー・環境材料に関する挑戦課題」
- Place of Presentation
  立山国際ホテル (富山県)
- Invited
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] CIGS太陽電池における光起電力減衰時定数と再結合プロセス
- Author(s)
  中島　悠、峯元高志、高橋琢二
- Organizer
  第59回応用物理学会関係連合講演会
- Place of Presentation
  早稲田大学 (東京都)
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photovoltage Decay Measurements by Photo-assisted Kelvin Probe Force Microscopy on Cu(In,Ga)Se2 Solar Cells
- Author(s)
  Takuji Takahashi
- Organizer
  4th Multifrequency AFM Conference
- Place of Presentation
  Madrid (Spain)
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Local Photothermal Measurement by AFM under Near-Infrared Light around Grain Boundaries in Multicrystalline Si Solar Cell
- Author(s)
  Kenji Hara and Takuji Takahashi
- Organizer
  19th International Colloquium on Scanning Probe Microscopy (ICSPM19)
- Place of Presentation
  洞爺湖 (北海道)
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] 走査プローブ顕微鏡を用いた光熱/ポテンシャル測定による多結晶シリコン太陽電池の局所的評価
- Author(s)
  原　賢二, 高橋琢二
- Organizer
  第72回応用物理学会学術講演会
- Place of Presentation
  山形大学 (山形県)
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Local Photothermal Analysis around Grain oundary in Multicrystalline Si Solar Cell by Atomic Force Microscopy
- Author(s)
  Kenji Hara and Takuji Takahashi
- Organizer
  International Workshop on Scanning Probe Microscopy for Energy Applications 2011
- Place of Presentation
  Mainz (Germany)
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] CIGS太陽電池における光起電力減衰時定数測定
- Author(s)
  中島　悠，峯元高志，高橋琢二
- Organizer
  第72回応用物理学会学術講演会
- Place of Presentation
  山形大学 (山形県)
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Characterization of Solar Cell Materials by SPMs
- Author(s)
  Takuji Takahashi
- Organizer
  International Workshop on Scanning Probe Microscopy for Energy Applications 2011
- Place of Presentation
  Mainz (Germany)
- Invited
- Data Source
  KAKENHI-PROJECT-21360143
[Presentation] Photovoltage Decay Processes in Cu(In,Ga)Se2 Solar Cells Studied by Photo-assisted Kelvin Probe Force Microscopy
- Author(s)
  Hyeondeuk Yong, Yu Nakajima, Takashi Minemoto, and Takuji Takahashi
- Organizer
  39th Photovoltaic Specialists Conference
- Place of Presentation
  Tampa (U.S.A.)
- Data Source
  KAKENHI-PROJECT-21360143

1. SAKAKI Hiroyuki (90013226)

# of Collaborated Projects: 7 results

# of Collaborated Products: 0 results
2. NODA Takeshi (90251462)

# of Collaborated Projects: 6 results

# of Collaborated Products: 0 results
3. ARAKAWA Yasuhiko (30134638)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
4. AKIYAMA Hidefumi (40251491)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
5. NAGAMUNE Yasushi (20218027)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
6. OHSHITA Yoshio (10329849)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
7. MINEMOTO Takashi (80373091)

# of Collaborated Projects: 1 results

# of Collaborated Products: 52 results
8. FUJII Yoichi (00013110)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
9. SOGAWA Tetsuomi (70211993)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
10. IKOMA Toshiaki (80013118)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
11. バハラケリー (98999999)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
12. 末光哲也 (90447186)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
13. 重川直輝 (60583698)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
14. 大野裕 (80243129)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
15. シュールマンジョー

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
16. ヤリフアムノン

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
17. SCHULMAN Joel N.

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
18. YARIV Amnon

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
19. VAHALA Kerry

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

Takahashi Takuji 高橋 琢二

TAKAHASHI Takuji 高橋 琢二

Research Projects

Research Products

Co-Researchers

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

時間分解・光援用ナノプローブの開発と多元系半導体太陽電池評価への応用展開Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Investigation of photo-induced carrier dynamics in solar cells consisting of multinary compound semiconductors using photo-assisted nanoprobesPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Minority carrier dynamics in solar cell materials investigated by photo-assisted KFMPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Study on precise potential measurements by nano-probes and on investigation of electronic properties in nanostructuresPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Characterization on near-surface electronic properties and investigation of electron transport mechanisms in InAs nanostructures studied by nano-probesPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Electronic Spectroscopies by a Novel STM with functional Semiconductor TipsPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

レーザ光照射・走査型プローブ顕微鏡を用いた半導体極微細構造の特性評価Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

レーザ光励起STMによる半導体極微細構造の特性評価Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Principal Investigator

Project Period (FY)

Takahashi Takuji 高橋琢二

TAKAHASHI Takuji 高橋琢二