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Takatsuka Toshiko  高塚 登志子

ORCIDConnect your ORCID iD *help
… Alternative Names

奥井 登志子  オクイ トシコ

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Researcher Number 20398895
Other IDs
Affiliation (Current) 2025: 国立研究開発法人産業技術総合研究所, 計量標準総合センター, 主任研究員
Affiliation (based on the past Project Information) *help 2005 – 2006: 武蔵工業大学, 総合研究所, ポストドクター
Review Section/Research Field
Principal Investigator
Electronic materials/Electric materials
Keywords
Principal Investigator
走査プローブ顕微鏡 / 走査プロープ顕微鏡 / ヘテロ構造 / 半導体物性 / 電子・電気材料
  • Research Projects

    (1 results)
  • Research Products

    (1 results)
  •  走査型トンネル顕微鏡によるSiGe系微細ヘテロ構造のポテンシャル解析Principal Investigator

    • Principal Investigator
      奥井 登志子
    • Project Period (FY)
      2005 – 2006
    • Research Category
      Grant-in-Aid for Young Scientists (B)
    • Research Field
      Electronic materials/Electric materials
    • Research Institution
      Musashi Institute of Technology

All 2007

All Journal Article

  • [Journal Article] Surface treatments of SiGe for scanning tunneling microscopy/spectroscopy and characterization of SiGe p-n junction2007

    • Author(s)
      奥井登志子
    • Journal Title

      Journal of Vacuum Science & Technology B Vol. 25, No. 1

      Pages: 29-32

    • Data Source
      KAKENHI-PROJECT-17760257

URL: 

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