Sato Takashi 佐藤高史

… Alternative Names

SATO Takashi 佐藤高史

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Researcher Number	20431992
Other IDs
Affiliation (Current)	2025: 京都大学, 情報学研究科, 教授
Affiliation (based on the past Project Information) *help	2010 – 2024: 京都大学, 情報学研究科, 教授 2016: 京都大学, 大学院情報学研究科, 教授 2012: 京都大学, 大学院・情報学研究科, 教授 2009: 東京工業大学, 統合研究院, 特任教授 2006 – 2007: 東京工業大学, 統合研究院, 教授
Review Section/Research Field	Principal Investigator Basic Section 60040:Computer system-related / Medium-sized Section 60:Information science, computer engineering, and related fields / Computer system / Sections That Are Subject to Joint Review: Basic Section60040:Computer system-related , Basic Section60090:High performance computing-related / Basic Section 60090:High performance computing-related / Applied health science / Electron device/Electronic equipment Except Principal Investigator Basic Section 60040:Computer system-related / Computer system / Electron device/Electronic equipment / Computer system/Network / Science and Engineering
Keywords	Principal Investigator 認証 / 集積回路設計 / 超並列検索 / デオキシリボ核酸 / 類似画像検索 / コールドデータ / DNA記憶装置 / 遅延フィードバック型リザバー / エコーステートネットワーク / リザバー表現 … More / クロスバアレイ / シリコンリザバー / ハイブリッド回路 / トランジスタアレイ / センサ / ヘルスケアセンサ / セレクタ回路 / 増幅回路 / バイアス生成回路 / スイッチマトリクス / センサ回路 / 有機トランジスタ / ハードウェアセキュリティ / ＰＵＦ / 物理的複製困難回路 / PUF / セキュリティ / 特性ばらつき / 物理的複製困難関数 / 暗号・認証等 / 集積回路 / 個体認識 / 暗号・認証 / 個体識別 / 暗号 / 経年劣化 / チップID / ノイズ / 脈波推定 / 信号処理 / 生体情報 / 非接触測定 / 心拍間隔推定 / 心拍数推定 / モデル化 / 経時特性変化 / 大規模アレイ回路 / デバイスモデル / シミュレーション / デバイス設計・製造プロセス / 電子デバイス / 電子回路CAD / モンテカルロ法 / タイミング解析 / CAD / 集積回路設計技術 … More Except Principal Investigator 近似計算 / ニューラルネットワーク / 画像認識 / ばらつき / ハードウェアセキュリティ / PUF / フレキシブル / 測定技術 / フレキシブルデバイス / 信頼性評価 / 多素子測定 / 有機トランジスタ / プロセッサアーキテクチャ / 不正確演算 / 深層学習 / 計算機アーキテクチャ / 低消費電力技術 / メモリスタ / 低消費電力設計 / ディープラーニング / wire length distribution / network on chip / system on chip / low power consumption / high speed signal propagation / nano interconnect / integrated cirtcuit / transmission line / 配線長分布 / ネットワークオンチップ / システムオンチップ / 低消費電力 / 高速信号伝送 / 微細配線 / 集積回路 / 伝送線路 / アドホックネットワーク / マスクROM / 長期信頼性 / オンチップ太陽電池 / 非接触電源供給 / 非接触通信 / ばらっき / シグナルインテグリティ / 揺らぎ / インテグリティ / シグナル・インテグリティ / ナノ配線 Less

Scalable Silicon Reservoir ComputingPrincipal Investigator
- Principal Investigator
  
  佐藤高史
- Project Period (FY)
  2023 – 2025
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Review Section
  
  Basic Section 60040:Computer system-related
  Basic Section 60090:High performance computing-related
  Sections That Are Subject to Joint Review: Basic Section60040:Computer system-related , Basic Section60090:High performance computing-related
- Research Institution
  Kyoto University
DNA記憶装置による高機能演算の実現Principal Investigator
- Principal Investigator
  
  佐藤高史
- Project Period (FY)
  2023 – 2025
- Research Category
  
  Grant-in-Aid for Challenging Research (Exploratory)
- Review Section
  
  Medium-sized Section 60:Information science, computer engineering, and related fields
- Research Institution
  Kyoto University
Transistor Array Measurements for Physical Unclonable Function with Flexible Printable Transistors
- Principal Investigator
  
  小笠原泰弘
- Project Period (FY)
  2022 – 2024
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 60040:Computer system-related
- Research Institution
  National Institute of Advanced Industrial Science and Technology
Clonable PUF: Physical Unclonable Function with Limited ReplicationPrincipal Investigator
- Principal Investigator
  
  Sato Takashi
- Project Period (FY)
  2020 – 2022
- Research Category
  
  Grant-in-Aid for Challenging Research (Exploratory)
- Review Section
  
  Medium-sized Section 60:Information science, computer engineering, and related fields
- Research Institution
  Kyoto University
Multi-functional and ultra-low-cost disposable healthcare sensors using organic-silicon hybrid circuitsPrincipal Investigator
- Principal Investigator
  
  Takashi Sato
- Project Period (FY)
  2020 – 2022
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Review Section
  
  Basic Section 60040:Computer system-related
- Research Institution
  Kyoto University
不正確演算による深層学習向け高効率計算技術
- Principal Investigator
  
  廣本正之
- Project Period (FY)
  2018 – 2020
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Review Section
  
  Basic Section 60040:Computer system-related
- Research Institution
  Kyoto University
Development of Time-Varying Chip-ID Based on Transistor Models Considering Transient DegradationPrincipal Investigator
- Principal Investigator
  
  Sato Takashi
- Project Period (FY)
  2017 – 2019
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Computer system
- Research Institution
  Kyoto University
Unconscious, non-contact, and continuous bital sensingPrincipal Investigator
- Principal Investigator
  
  Sato Takashi
- Project Period (FY)
  2015 – 2016
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Applied health science
- Research Institution
  Kyoto University
Reliability design for lifetime prediction, failure prevention, and degradation recovery of integrated circuitsPrincipal Investigator
- Principal Investigator
  
  Sato Takashi
- Project Period (FY)
  2014 – 2016
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Computer system
- Research Institution
  Kyoto University
Study on Neural Network Processor for Image Recognition
- Principal Investigator
  
  HIROMOTO Masayuki
- Project Period (FY)
  2014 – 2016
- Research Category
  
  Grant-in-Aid for Young Scientists (B)
- Research Field
  
  Computer system
- Research Institution
  Kyoto University
Architecture for Large-scale Long-term Digital Storage System
- Principal Investigator
  
  OCHI Hiroyuki
- Project Period (FY)
  2011 – 2013
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Computer system/Network
- Research Institution
  Ritsumeikan University
  Kyoto University
Acceleration of Timing Analysis using Monte Carlo MethodsPrincipal Investigator
- Principal Investigator
  
  SATO Takashi
- Project Period (FY)
  2010 – 2012
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Electron device/Electronic equipment
- Research Institution
  Kyoto University
Signal Integrity of Nano-Scale interconnect and Circuit
- Principal Investigator
  
  MASU Kazuya
- Project Period (FY)
  2006 – 2009
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Review Section
  
  Science and Engineering
- Research Institution
  Tokyo Institute of Technology
Development of On-chip Nano-Scale Network Based on Communication Theory
- Principal Investigator
  
  MASU Kazuya
- Project Period (FY)
  2004 – 2007
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Electron device/Electronic equipment
- Research Institution
  Tokyo Institute of Technology

[Book] Circuit design for reliability, Chapter 52015
- Author(s)
  Takashi Sato and Hiromitsu Awano
- Total Pages
  272
- Publisher
  Springer-Verlag New York
- Data Source
  KAKENHI-PROJECT-26280014
[Journal Article] Layout Design for DNTT-Based Organic TFTs Considering Fringe Leakage Current2024
- Author(s)
  Oshima Kunihiro、Kuribara Kazunori、Sato Takashi
- Journal Title
  
  IEEE Journal on Flexible Electronics
  
  Volume: 3 Issue: 3 Pages: 100-107
- DOI
  10.1109/jflex.2024.3354715
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22KJ1737, KAKENHI-PROJECT-23K28052
[Journal Article] Modular DFR: Digital Delayed Feedback Reservoir Model for Enhancing Design Flexibility2023
- Author(s)
  Ikeda Sosei、Awano Hiromitsu、Sato Takashi
- Journal Title
  
  ACM Transactions on Embedded Computing Systems
  
  Volume: 22 Issue: 5s Pages: 1-20
- DOI
  10.1145/3609105
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-23K28052
[Journal Article] Flex-SNN: Spiking Neural Network on Flexible Substrate2023
- Author(s)
  Oshima Kunihiro、Kuribara Kazunori、Sato Takashi
- Journal Title
  
  IEEE Sensors Letters
  
  Volume: 7 Issue: 5 Pages: 1-4
- DOI
  10.1109/lsens.2023.3271988
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22KJ1737, KAKENHI-PROJECT-23K28052
[Journal Article] Aging-robust amplifier composed of p-type low voltage OTFT and organic semiconductor load2023
- Author(s)
  Kaneiwa Yuto、Kuribara Kazunori、Sato Takashi
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 62 Issue: SC Pages: SC1061-SC1061
- DOI
  10.35848/1347-4065/acb2be
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20H04156, KAKENHI-PROJECT-20K21793
[Journal Article] Measurement of 64 organic thin-film transistors in an array test structure using a relay-switch board for efficient evaluation of long-term reliability2023
- Author(s)
  Ogasahara Yasuhiro、Kuribara Kazunori、Sato Takashi
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 62 Issue: SC Pages: SC1030-SC1030
- DOI
  10.35848/1347-4065/acae2d
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22K11966, KAKENHI-PROJECT-20H04156
[Journal Article] Efficient Analysis for Mitigation of Workload-dependent Aging Degradation2022
- Author(s)
  Morita Shumpei、Bian Song、Shintani Michihiro、Sato Takashi
- Journal Title
  
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  
  Volume: - Issue: 12 Pages: 1-1
- DOI
  10.1109/tcad.2022.3149856
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-20H04156, KAKENHI-PROJECT-20K21793
[Journal Article] Yield and leakage current of organic thin-film transistor logic gates toward reliable and low-power operation of large-scale logic circuits for IoT nodes2022
- Author(s)
  Ogasahara Yasuhiro、Kuribara Kazunori、Oshima Kunihiro、Qin Zhaoxing、Sato Takashi
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 61 Issue: SC Pages: SC1044-SC1044
- DOI
  10.35848/1347-4065/ac44cf
- Peer Reviewed / Open Access / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H04156, KAKENHI-PROJECT-20K21793, KAKENHI-PROJECT-22KJ1911
[Journal Article] Hardware-Friendly Delayed-Feedback Reservoir for Multivariate Time-Series Classification2022
- Author(s)
  Ikeda Sosei、Awano Hiromitsu、Sato Takashi
- Journal Title
  
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  
  Volume: 41 Issue: 11 Pages: 3650-3660
- DOI
  10.1109/tcad.2022.3197488
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20K21793
[Journal Article] Hybrid CMOS and pseudo-CMOS Organic Memory for Flexible Sensors2022
- Author(s)
  Qin Zhaoxing、Kuribara Kazunori、Ogasahara Yasuhiro、Sato Takashi
- Journal Title
  
  IEEE Sensors Journal
  
  Volume: - Issue: 20 Pages: 1-1
- DOI
  10.1109/jsen.2022.3153714
- Peer Reviewed / Open Access / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H04156, KAKENHI-PROJECT-22KJ1911, KAKENHI-PROJECT-20K21793
[Journal Article] Accelerating Parameter Extraction of Power MOSFET Models Using Automatic Differentiation2022
- Author(s)
  Shintani Michihiro、Ueda Aoi、Sato Takashi
- Journal Title
  
  IEEE Transactions on Power Electronics
  
  Volume: 37 Issue: 3 Pages: 2970-2982
- DOI
  10.1109/tpel.2021.3118057
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-20H04156, KAKENHI-PROJECT-20K21793
[Journal Article] Stable Organic SRAM Cell With P-type Access Transistors2021
- Author(s)
  Z. Qin, S. Bian, K. Kuribara, and T. Sato
- Journal Title
  
  Japanese Journal of Applied Physics (JJAP)
  
  Volume: 60 Issue: SB Pages: SBBG04-SBBG04
- DOI
  10.35848/1347-4065/abd534
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20K21793, KAKENHI-PROJECT-20H04156
[Journal Article] Separation of Bias Stress Degradation Factors in Organic Thin-film Transistors2021
- Author(s)
  K. Oshima, S. Bian, K. Kuribara, and T. Sato
- Journal Title
  
  Japanese Journal of Applied Physics (JJAP)
  
  Volume: 60 Issue: SB Pages: SBBG06-SBBG06
- DOI
  10.35848/1347-4065/abdcb2
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20K21793, KAKENHI-PROJECT-20H04156
[Journal Article] APAS: Application-Specific Accelerators for RLWE-based Homomorphic Linear Transformations2021
- Author(s)
  Bian Song、Kundi Dur E Shahwar、Hirozawa Kazuma、Liu Weiqiang、Sato Takashi
- Journal Title
  
  IEEE Transactions on Information Forensics and Security
  
  Volume: 1 Pages: 4663-4678
- DOI
  10.1109/tifs.2021.3114032
- Peer Reviewed / Open Access / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20K19799, KAKENHI-PROJECT-20H04156, KAKENHI-PROJECT-20K21793
[Journal Article] Statistical Extraction of Normally and Lognormally Distributed Model Parameters for Power MOSFETs2020
- Author(s)
  Tsukamoto Hiroki、Shintani Michihiro、Sato Takashi
- Journal Title
  
  IEEE Transactions on Semiconductor Manufacturing
  
  Volume: 33 Issue: 2 Pages: 1-1
- DOI
  10.1109/tsm.2020.2975300
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-17H01713
[Journal Article] Measurement and Modeling of Ambient-air-induced Degradation in Organic Thin-Film Transistor2020
- Author(s)
  Michihiro Shintani, Michiaki Saito, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato
- Journal Title
  
  IEEE Transactions on Semiconductor Manufacturing
  
  Volume: 33 Issue: 2 Pages: 216-223
- DOI
  10.1109/tsm.2020.2986609
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18K18025, KAKENHI-PROJECT-20H04156
[Journal Article] Measurement and Modeling of Ambient-air-induced Degradation in Organic Thin-film Transistor2020
- Author(s)
  Michihiro Shintani, Michiaki Saito, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato,
- Journal Title
  
  IEEE Transactions on Semiconductor Manufacturing
  
  Volume: 33 Pages: 1-1
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-17H01713
[Journal Article] Organic Current Mirror PUF for Improved Stability Against Device Aging2020
- Author(s)
  Zhaoxing Qin, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato
- Journal Title
  
  IEEE Sensors Journal
  
  Volume: 20 Issue: 14 Pages: 1-1
- DOI
  10.1109/jsen.2020.2986077
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-17H01713, KAKENHI-PROJECT-20K21793, KAKENHI-PROJECT-20H04156
[Journal Article] Ed-PUF: Event Driven Physical Unclonable Function for Camera Authentication in Reactive Monitoring System2020
- Author(s)
  Yue Zheng, Xiaojin Zhao, Takashi Sato, Yuan Cao, and Chip-Hong Chang
- Journal Title
  
  IEEE Transactions on Information Forensics and Security
  
  Volume: 15 Pages: 2824-2839
- DOI
  10.1109/tifs.2020.2977597
- Peer Reviewed / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Journal Article] Recovery-aware Bias-stress Degradation Model for Organic Thin-film Transistors Considering Drain and Gate Bias Voltages2020
- Author(s)
  Kunihiro Oshima, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato
- Journal Title
  
  Japanese Journal of Applied Physics (JJAP), Vol.59, No.SG, pp.SGGG08, March 2020
  
  Volume: 59 Issue: SG Pages: 1-8
- DOI
  10.7567/1347-4065/ab6460
- NAID
  210000157860
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17H01713
[Journal Article] Hardware-Accelerated Secured Naïve Bayesian Filter Based on Partially Homomorphic Encryption2019
- Author(s)
  S. Bian, M. Hiromoto, and T. Sato
- Journal Title
  
  IEICE Trans. Fundamentals
  
  Volume: E102.A Issue: 2 Pages: 430-439
- DOI
  10.1587/transfun.E102.A.430
- NAID
  130007587609
- ISSN
  0916-8508, 1745-1337
- Year and Date
  2019-02-01
- Language
  English
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-17H01713, KAKENHI-PROJECT-17J06952
[Journal Article] Feasibility of a low-power, low-voltage complementary organic thin film transistor buskeeper physical unclonable function2019
- Author(s)
  Ogasahara Yasuhiro、Kuribara Kazunori、Shintani Michihiro、Sato Takashi
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 58 Issue: SB Pages: SBBG03-SBBG03
- DOI
  10.7567/1347-4065/aaf7fd
- NAID
  210000135297
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-16K16031, KAKENHI-PROJECT-17H01713
[Journal Article] GPU-based Ising Computing for Solving Max-cut Combinatorial Optimization Problems2019
- Author(s)
  Chase Cook, Hengyang Zhao, Takashi Sato, Masayuki Hiromoto, and Sheldon Tan
- Journal Title
  
  Integration, the VLSI Journal
  
  Volume: 69 Pages: 335-334
- DOI
  10.1016/j.vlsi.2019.07.003
- Peer Reviewed / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Journal Article] Surface-potential-based silicon carbide power MOSFET model for circuit simulation2018
- Author(s)
  M. Shintani, Y. Nakamura, K. Oishi, M. Hiromoto, T. Hikihara, and T. Sato
- Journal Title
  
  IEEE Transactions on Power Electronics (TPEL)
  
  Volume: 33 Issue: 12 Pages: 0774-10783
- DOI
  10.1109/tpel.2018.2805808
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-17H01713
[Journal Article] Mechanically and electrically robust metal-mask design for organic CMOS circuits2018
- Author(s)
  Michihiro Shintani, Zhaoxing Qin, Kazunori Kuribara, Yasuhiro Ogasahara, Masayuki Hiromoto, and Takashi Sato
- Journal Title
  
  Japanese Journal of Applied Physics (JJAP)
  
  Volume: 57 Issue: 4S Pages: 04FL05-04FL05
- DOI
  10.7567/jjap.57.04fl05
- NAID
  210000148964
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-17H01713
[Journal Article] Coin flipping PUF: A novel PUF with improved resistance against machine learning attacks2018
- Author(s)
  Yuki Tanaka, Song Bian, Masayuki Hiromoto, and Takashi Sato
- Journal Title
  
  IEEE Transactions on Circuits and Systems II: Express Briefs (TCASII)
  
  Volume: -
- NAID
  120006463756
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-17H01713
[Journal Article] Efficient Mini-Batch Training on Memristor Neural Network Integrating Gradient Calculation and Weight Update2018
- Author(s)
  S. Yamamori, M. Hiromoto, and T. Sato
- Journal Title
  
  IEICE Trans. Fundamentals
  
  Volume: E101.A Issue: 7 Pages: 1092-1100
- DOI
  10.1587/transfun.E101.A.1092
- NAID
  130007386698
- ISSN
  0916-8508, 1745-1337
- Year and Date
  2018-07-01
- Language
  English
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-17H01713
[Journal Article] MRO-PUF: Physically Unclonable Function with Enhanced Resistance against Machine Learning Attacks Utilizing Instantaneous Output of Ring Oscillator2018
- Author(s)
  M. Hiromoto, M. Yoshinaga, and T. Sato
- Journal Title
  
  IEICE Trans. Fundamentals
  
  Volume: E101.A Issue: 7 Pages: 1035-1044
- DOI
  10.1587/transfun.E101.A.1035
- NAID
  130007386621
- ISSN
  0916-8508, 1745-1337
- Year and Date
  2018-07-01
- Language
  English
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-17H01713
[Journal Article] Efficient mini-batch training on memristor neural network integrating gradient calculation and weight update2018
- Author(s)
  Satoshi Yamamori, Masayuki Hiromoto, and Takashi Sato
- Journal Title
  
  IEICE Transactions on Transactions of Fundamentals on Electronics, Communications and Computer Sciences
  
  Volume: -
- NAID
  130007386698
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-17H01713
[Journal Article] MRO-PUF: Physically unclonable function with enhanced resistance against machine learning attacks utilizing instantaneous output of ring oscillator2018
- Author(s)
  Masayuki Hiromoto, Motoki Yoshinaga, and Takashi Sato
- Journal Title
  
  IEICE Transactions of Fundamentals on Electronics, Communications and Computer Sciences
  
  Volume: -
- NAID
  130007386621
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-17H01713
[Journal Article] Coin flipping PUF: A novel PUF with improved resistance against machine learning attacks2018
- Author(s)
  Y. Tanaka, S. Bian, M. Hiromoto, and T. Sato
- Journal Title
  
  IEEE Transactions on Circuits and Systems--II: Express Briefs (TCASII)
  
  Volume: 65 Issue: 5 Pages: 602-606
- DOI
  10.1109/tcsii.2018.2821267
- NAID
  120006463756
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-17H01713, KAKENHI-PROJECT-17J06952
[Journal Article] Area Efficient Annealing Processor for Ising Model without Random Number Generator2018
- Author(s)
  Hidenori Gyoten, Masayuki Hiromoto, and Takashi Sato
- Journal Title
  
  IEICE Trans. Inf. & Syst.
  
  Volume: E101.D Issue: 2 Pages: 314-323
- DOI
  10.1587/transinf.2017RCP0015
- NAID
  130006328493
- ISSN
  0916-8532, 1745-1361
- Language
  English
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-17H01713
[Journal Article] Path clustering for test pattern reduction of variation-aware adaptive path delay testing2017
- Author(s)
  Michihiro Shintani, Takumi Uezono, Kazumi Hatayama, Kazuya Masu, and Takashi Sato
- Journal Title
  
  Journal of Electronic Testing: Theory and Applications (JETTA)
  
  Volume: 32 Issue: 5 Pages: 601-609
- DOI
  10.1007/s10836-016-5614-0
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-26280014, KAKENHI-PROJECT-15K15960
[Journal Article] Identification and Application of Invariant Critical Paths under NBTI Degradation2017
- Author(s)
  Song Bian, Shumpei Morita, Michihiro Shintani, Hiromitsu Awano, Masayuki Hiromoto, and Takashi Sato
- Journal Title
  
  IEICE Trans. Fundamentals
  
  Volume: E100.A Issue: 12 Pages: 2797-2806
- DOI
  10.1587/transfun.E100.A.2797
- NAID
  130006236529
- ISSN
  0916-8508, 1745-1337
- Language
  English
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-17H01713, KAKENHI-PROJECT-17J06952, KAKENHI-PROJECT-15K15960
[Journal Article] Utilization of Path-Clustering in Efficient Stress-Control Gate Replacement for NBTI Mitigation2017
- Author(s)
  Shumpei Morita, Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato
- Journal Title
  
  IEICE Trans. Fundamentals
  
  Volume: E100.A Issue: 7 Pages: 1464-1472
- DOI
  10.1587/transfun.E100.A.1464
- NAID
  130007311781
- ISSN
  0916-8508, 1745-1337
- Language
  English
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-17H01713, KAKENHI-PROJECT-15K15960
[Journal Article] PHRHELIA: particle-filter-based heart rate estimation from photoplethysmographic signals during physical exercise2017
- Author(s)
  Yuya Fujita, Masayuki Hiromoto, and Takashi Sato
- Journal Title
  
  IEEE Transactions on Bio-Medical Engineering
  
  Volume: 印刷中
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-15K12700
[Journal Article] RTN in scaled transistors for on-chip random seed generation2017
- Author(s)
  Abinash Mohanty, Ketul Sutaria, Hiromitsu Awano, Takashi Sato, and Yu Cao
- Journal Title
  
  IEEE Transactions on Very Large Scaspple Integration (VLSI) Systems
  
  Volume: 印刷中 Issue: 8 Pages: 2248-2257
- DOI
  10.1109/tvlsi.2017.2687762
- Peer Reviewed / Open Access / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26280014, KAKENHI-PROJECT-17H01713
[Journal Article] Utilization of path-clustering in efficient stress-control gate replacement for NBTI mitigation2017
- Author(s)
  Shumpei Morita, Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato
- Journal Title
  
  IEICE Transactions of Fundamentals on Electronics, Communications and Computer Sciences
  
  Volume: 印刷中
- NAID
  130007311781
- Peer Reviewed / Acknowledgement Compliant / Open Access
- Data Source
  KAKENHI-PROJECT-26280014
[Journal Article] Efficient Aging-Aware Failure Probability Estimation Using Augmented Reliability and Subset Simulation2017
- Author(s)
  Hiromitsu Awano and Takashi Sato
- Journal Title
  
  IEICE Trans. Fundamentals
  
  Volume: E100.A Issue: 12 Pages: 2807-2815
- DOI
  10.1587/transfun.E100.A.2807
- NAID
  130006236530
- ISSN
  0916-8508, 1745-1337
- Language
  English
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-17H01713
[Journal Article] Scalable device array for statistical characterization of BTI-related parameters2017
- Author(s)
  Hiromitsu Awano, Shumpei Morita, Takashi Sato
- Journal Title
  
  IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  
  Volume: 25 Issue: 4 Pages: 1455-1466
- DOI
  10.1109/tvlsi.2016.2638021
- Peer Reviewed / Acknowledgement Compliant / Open Access
- Data Source
  KAKENHI-PROJECT-26280014, KAKENHI-PROJECT-17H01713
[Journal Article] Fast Estimation of NBTI-Induced Delay Degradation Based on Signal Probability2016
- Author(s)
  Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato
- Journal Title
  
  IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
  
  Volume: Vol.E99-C, No.7
- NAID
  130005159598
- Peer Reviewed / Acknowledgement Compliant / Open Access
- Data Source
  KAKENHI-PROJECT-26280014
[Journal Article] Efficient Aging-Aware SRAM Failure Probability Calculation via Particle Filter-Based Importance Sampling2016
- Author(s)
  Hiromitsu Awano, Masayuki Hiromoto and Takashi Sato
- Journal Title
  
  IEICE Trans. Fundamentals
  
  Volume: E99.A Issue: 7 Pages: 1390-1399
- DOI
  10.1587/transfun.E99.A.1390
- NAID
  130005159599
- ISSN
  0916-8508, 1745-1337
- Language
  English
- Peer Reviewed / Acknowledgement Compliant / Open Access
- Data Source
  KAKENHI-PROJECT-26280014
[Journal Article] Efficient Aging-Aware SRAM Failure Probability Calculation via Particle Filter Based Importance Sampling2016
- Author(s)
  Hiromitsu Awano, Masayuki Hiromoto, and Takashi Sato
- Journal Title
  
  IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
  
  Volume: Vol.E99-C, No.7
- NAID
  130005159599
- Peer Reviewed / Acknowledgement Compliant / Open Access
- Data Source
  KAKENHI-PROJECT-26280014
[Journal Article] Fast Estimation of NBTI-Induced Delay Degradation Based on Signal Probability2016
- Author(s)
  Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato
- Journal Title
  
  IEICE Trans. Fundamentals
  
  Volume: E99.A Issue: 7 Pages: 1400-1409
- DOI
  10.1587/transfun.E99.A.1400
- NAID
  130005159598
- ISSN
  0916-8508, 1745-1337
- Language
  English
- Peer Reviewed / Acknowledgement Compliant / Open Access
- Data Source
  KAKENHI-PROJECT-26280014, KAKENHI-PROJECT-15K15960
[Journal Article] An Error Correction Scheme through Time Redundancy for Enhancing Persistent Soft-Error Tolerance of CGRAs2015
- Author(s)
  Takashi Imagawa, Masayuki Hiromoto, Hiroyuki Ochi, and Takashi Sato
- Journal Title
  
  IEICE Trans. Electron.
  
  Volume: E98.C Issue: 7 Pages: 741-750
- DOI
  10.1587/transele.E98.C.741
- NAID
  130005086147
- ISSN
  0916-8524, 1745-1353
- Language
  English
- Peer Reviewed / Acknowledgement Compliant / Open Access
- Data Source
  KAKENHI-PROJECT-26280014
[Journal Article] BTIarray: A time-overlapping transistor array for efficient statistical characterization of bias temperature instability2014
- Author(s)
  Hiromitsu Awano, Masayuki Hiromoto, and Takashi Sato
- Journal Title
  
  IEEE Transactions on Device and Materials Reliability
  
  Volume: 14 Issue: 3 Pages: 833-843
- DOI
  10.1109/tdmr.2014.2327164
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-26280014
[Journal Article] Automation of Model Parameter Estimation for Random Telegraph Noise2014
- Author(s)
  Hirofumi Shimizu, Hiromitsu Awano, Masayuki Hiromoto, and Takashi Sato
- Journal Title
  
  IEICE Trans. Fundamentals
  
  Volume: E97.A Issue: 12 Pages: 2383-2392
- DOI
  10.1587/transfun.E97.A.2383
- NAID
  130004706400
- ISSN
  0916-8508, 1745-1337
- Language
  English
- Peer Reviewed / Acknowledgement Compliant / Open Access
- Data Source
  KAKENHI-PROJECT-26280014
[Journal Article] Aging statistics based on trapping/detrapping: compact modeling and silicon validation2014
- Author(s)
  Ketul B. Sutaria, Jyothi Bhaskarr Velamala, Chris Kim, Takashi Sato, and Yu Cao
- Journal Title
  
  IEEE Transactions on Device and Materials Reliability
  
  Volume: 14 Issue: 2 Pages: 607-615
- DOI
  10.1109/tdmr.2014.2308140
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26280014
[Journal Article] IDDQ Outlier Screening through Two-Phase Approach: Clustering-Based Filtering and Estimation-Based Current-Threshold Determination2014
- Author(s)
  Michihiro Shintani and Takashi Sato
- Journal Title
  
  IEICE Trans. Inf. & Syst.
  
  Volume: E97.D Issue: 8 Pages: 2095-2104
- DOI
  10.1587/transinf.E97.D.2095
- NAID
  130004679289
- ISSN
  0916-8532, 1745-1361
- Language
  English
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-26280014
[Journal Article] A variability-aware adaptive test flow for test quality improvement2014
- Author(s)
  Michihiro Shintani, Takumi Uezono, Tomoyuki Takahashi, Kazumi Hatayama, Takashi Aikyo, Kazuya Masu, and Takashi Sato
- Journal Title
  
  IEEE Transactions on Computer-Aided Design
  
  Volume: 33 Issue: 7 Pages: 1056-1066
- DOI
  10.1109/tcad.2014.2305835
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26280014
[Journal Article] A Cost-Effective Selective TMR for Coarse-Grained Reconfigurable Architectures Based on DFG-Level Vulnerability Analysis2013
- Author(s)
  Takashi Imagawa, Hiroshi Tsutsui, Hiroyuki Ochi and Takashi Sato
- Journal Title
  
  IEICE Trans. Electron.
  
  Volume: E96.C Issue: 4 Pages: 454-462
- DOI
  10.1587/transele.E96.C.454
- NAID
  10031182821
- ISSN
  0916-8524, 1745-1353
- Language
  English
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22360143
[Journal Article] Device-Parameter Estimation through IDDQ Signatures2013
- Author(s)
  Michihiro Shintani and Takashi Sato
- Journal Title
  
  IEICE Trans. Inf. & Syst.
  
  Volume: E96.D Issue: 2 Pages: 303-313
- DOI
  10.1587/transinf.E96.D.303
- NAID
  10031167410
- ISSN
  0916-8532, 1745-1361
- Language
  English
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22360143
[Journal Article] Parallel Acceleration Scheme for Monte Carlo Based SSTA Using Generalized STA Processing Element2013
- Author(s)
  Hiroshi Yuasa, Hiroshi Tsutsui, Hiroyuki Ochi and Takashi Sato
- Journal Title
  
  IEICE Trans. Electron.
  
  Volume: E96.C Issue: 4 Pages: 473-481
- DOI
  10.1587/transele.E96.C.473
- NAID
  10031182823
- ISSN
  0916-8524, 1745-1353
- Language
  English
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22360143
[Journal Article] A Variability-Aware Energy-Minimization Strategy for Subthreshold Circuits2012
- Author(s)
  Junya Kawashima, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
- Journal Title
  
  IEICE Trans. Fundamentals
  
  Volume: E95.A Issue: 12 Pages: 2242-2250
- DOI
  10.1587/transfun.E95.A.2242
- NAID
  10031161358
- ISSN
  0916-8508, 1745-1337
- Language
  English
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22360143
[Journal Article] Power Distribution Network Optimization for Timing Improvement with Statistical Noise Model and Timing Analysis2012
- Author(s)
  Takashi Enami, Takashi Sato, and Masanori Hashimoto
- Journal Title
  
  IEICE Trans. Fundamentals
  
  Volume: E95.A Issue: 12 Pages: 2261-2271
- DOI
  10.1587/transfun.E95.A.2261
- NAID
  10031161360
- ISSN
  0916-8508, 1745-1337
- Language
  English
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22360143
[Journal Article] Bayesian Estimation of Multi-Trap RTN Parameters Using Markov Chain Monte Carlo Method2012
- Author(s)
  Hiromitsu Awano, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
- Journal Title
  
  IEICE Trans. Fundamentals
  
  Volume: E95.A Issue: 12 Pages: 2272-2283
- DOI
  10.1587/transfun.E95.A.2272
- NAID
  10031161361
- ISSN
  0916-8508, 1745-1337
- Language
  English
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22360143
[Journal Article] Linear time calculation of on-chip power distribution network capacitance considering state-dependence2010
- Author(s)
  Shiho Hagiwara, Koh Yamanaga, Ryo Takahashi, Kazuya Masu, Takashi Sato
- Journal Title
  
  IEICE Transactions of Fundamentals on Electronics, Communications and Computer Sciences
  
  Volume: Vol.E93-A, No.12 Pages: 2409-2416
- NAID
  120005323043
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22360143
[Journal Article] Reliability evaluation environment for exploring design space of coarse-grained reconfigurable architectures2010
- Author(s)
  Takashi Imagawa, Masayuki Hiromoto, Hiroyuki Ochi, Takashi Sato
- Journal Title
  
  IEICE Transactions of Fundamentals on Electronics, Communications and Computer Sciences
  
  Volume: Vol.E93-A, No.12 Pages: 2524-2532
- NAID
  10027985803
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22360143
[Journal Article] A Time-Slicing Ring Oscillator for Capturing Time-Dependent Delay Degradation and Power Supply Voltage Fluctuation"2010
- Author(s)
  Takumi Uezono, Kazuya Masu, kashi Sato
- Journal Title
  
  IEICE Transactions on Fundamentals of Electronics vol.E93-C,no.3
  
  Pages: 324-331
- NAID
  10026824830
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063008
[Journal Article] A Time-Slicing Ring Oscillator for Capturing Time-Dependent Delay Degradation and Power Supply Voltage Fluctuation2010
- Author(s)
  Takumi Uezono, Kazuya Masu, Takashi Sato
- Journal Title
  
  IEICE Transactions on Fundamentals of Electronics vol.E93-C, no.3
  
  Pages: 324-331
- NAID
  10026824830
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063008
[Journal Article] One-Shot Voltage-Measurement Circuit Utilizing Process Variation2009
- Author(s)
  Takumi Uezono, Takashi Sato, and Kazuya Masu
- Journal Title
  
  IEICE Transactions on Fundamentals of Electronics Vol.E92-A, No.4
  
  Pages: 1024-1030
- NAID
  10026856922
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063008
[Journal Article] Physical design challenges to nano-CMOS circuits2009
- Author(s)
  Kazuya Masu, Noboru Ishihara, Noriaki Nakayama, Takashi Sato, Shuhei Amakawa
- Journal Title
  
  IEICE Electronics Express(ELEX) vol.6 no.11
  
  Pages: 703-720
- NAID
  130000121132
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063008
[Journal Article] Accurate array-based measurement for subthreshold-current of MOS transistors2009
- Author(s)
  Takashi Sato, Hiroyuki Ueyama, Noriaki Nakayama, Kazuya Masu
- Journal Title
  
  IEEE Journal of Solid-State Circuits vol.44,no.11
  
  Pages: 2977-2986
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063008
[Journal Article] Analytical Estimation of Path-Delay Variation for Multi-Threshold CMOS Circuits2009
- Author(s)
  Shiho Hagiwara, Takashi Sato, Kazuya Masu
- Journal Title
  
  IEICE Transactions on Fundamentals of Electronics vol.E92-A,no.4
  
  Pages: 1031-1038
- NAID
  10026856933
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063008
[Journal Article] One-Shot Voltage-Measurement Circuit Utilizing Process Variation2009
- Author(s)
  Takumi Uezono, Takashi Sato, Kazuya Masu
- Journal Title
  
  IEICE Transactions on Fundamentals of Electronics vol.E92-A, no.4
  
  Pages: 1024-1030
- NAID
  10026856922
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063008
[Journal Article] Accurate array-based measurement for subthreshold-current of MOS transistors2009
- Author(s)
  Takashi Sato, Hiroyuki Ueyama, Noriaki Nakayama, Kazuya Masu
- Journal Title
  
  IEEE Journal of Solid-State Circuits vol.44, no.11
  
  Pages: 2977-2986
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063008
[Journal Article] Physical design challenges to nano-CMOS circuits2009
- Author(s)
  Kazuya Masu, Noboru Ishihara, Noriaki Nakayama, Takashi Sato, Shuhei Amakawa
- Journal Title
  
  IEICE Electronics Express (ELEX) vol.6no.11
  
  Pages: 703-720
- NAID
  130000121132
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063008
[Journal Article] 2-Port Modeling Technique for Surface-Mount Passive Components Using Partial Inductance Concept2009
- Author(s)
  Koh Yamanaga, Takashi Sato, Kazuya Masu
- Journal Title
  
  IEICE Transactions on Fundamentals of Electronics vol.E92-A, no.4
  
  Pages: 976-982
- NAID
  10026856840
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063008
[Journal Article] One-Shot Voltage-Measurement Circuit Utilizing Process Variation2009
- Author(s)
  Takumi Uezono, Takashi Sato, Kazuya Masu
- Journal Title
  
  IEICE Transactions on Fundamentals of Electronics vol.E92-A,no.4
  
  Pages: 1024-1030
- NAID
  10026856922
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063008
[Journal Article] Analytical Estimation of Path-Delay Variation for Multi-Threshold CMOS Circuits2009
- Author(s)
  Shiho Hagiwara, Takashi Sato, Kazuya Masu
- Journal Title
  
  IEICE Transactions on Fundamentals of Electronics vol.E92-A, no.4
  
  Pages: 1031-1038
- NAID
  10026856933
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063008
[Journal Article] Application of Correlation-based Regression Analysis for Improvement of Power Distribution Network2008
- Author(s)
  Shiho Hagiwara, Takumi Uezono, Takashi Sato, Kazuya Masu
- Journal Title
  
  IEICE Transactions on Fundamentals 91-A
  
  Pages: 951-956
- NAID
  10026848448
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063008
[Journal Article] Application of Correlation-based Regression Analysis for Improvement of Power Distribution Network2008
- Author(s)
  Shiho, Hagiwara, Takumi, Uezono, Takashi, Sato, Kazuya, Masu
- Journal Title
  
  IEICE Transactions on Fundamentals Vol. E91-A, No. 4
  
  Pages: 951-956
- NAID
  10026848448
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Journal Article] Application of Correlation-based Regression Analysis for Improvement of Power Distribution Network,2008
- Author(s)
  Shiho Hagiwara, Takumi Uezono, Takashi Sato, Kazuya Masu
- Journal Title
  
  IEICE Transactions on Fundamentals Vol.E91-A,No.4
  
  Pages: 951-956
- NAID
  10026848448
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063008
[Journal Article] Application of Correlation-based Regression Analysis for Improvement of Power Distribution Network,",2008
- Author(s)
  S. Hagiwara, T. Uezono, T. Sato, K. Masu
- Journal Title
  
  IEICE Transactions on Fundamentals E91-A(4)4
  
  Pages: 951-956
- NAID
  10026848448
- Description
  「研究成果報告書概要(和文)」より
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16206034
[Journal Article] Low-Loss Distributed Constant Passive Devices Using Wafer-Level Chip Scale Package Technology2007
- Author(s)
  Hiroyuki, Ito, Hideyuki, Sugita, Kenichi, Okada, Tatsuya, Ito, Kazuhisa, Itoi, Masakazu, Sato, Ryozo, Yamauchi, Kazuya, Masu
- Journal Title
  
  IEICE Transactions on Electronics Vol. E90-C, No.3
  
  Pages: 641-643
- NAID
  110007519598
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Journal Article] On-Chip Yagi-Uda Antenna for Horizontal Wireless Signal Transmission in Stacked Multi Chip Packaging2007
- Author(s)
  Kazuma, Ohashi, Tackya, Yammouch, Makoto, Kimura, Hiroyuki, Ito, Kenichi, Okada, Kazuhisa, Itoi, Masakazu, Sato, Tatsuya, Ito, Ryozo, Yamauchi, Kazuya, Masu
- Journal Title
  
  Japanese Journal of Applied Physics Vol.46, No 4B
  
  Pages: 2283-2286
- NAID
  210000062365
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Journal Article] On-Chip Yagi-Uda Antenna for Horizontal Wireless Signal Transmission in Stacked Multi Chip Packaging2007
- Author(s)
  K. Ohashi, T. Yammouch, M. Kimura, H. Ito, K. Okada, K. Itoi, M. Sato, T. Ito, R. Yamauchi, and K. Masu
- Journal Title
  
  Japanese Journal of Applied Physics 46(4B
  
  Pages: 2283-2286
- NAID
  210000062365
- Description
  「研究成果報告書概要(和文)」より
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16206034
[Journal Article] Low-Loss Distributed Constant Passive Devices Using Wafer-Level Chip Scale Package Technology2007
- Author(s)
  Hiroyuki Ito, Hideyuki Sugita, Kenichi Okada, Tatsuya Ito, Kazuhisa Itoi, Masakazu Sato, Ryozo Yamauchi, Kazuya Masu
- Journal Title
  
  IEICE Transactions on Electronics Vol.E90-C,No.3
  
  Pages: 641-643
- NAID
  110007519598
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063008
[Journal Article] On-Chip Yagi-Uda Antenna for Horizontal Wireless Signal Transmission in Stacked Multi Chip Packaging2007
- Author(s)
  K.Ohashi, T.Yammouch, M. Kimura, H.Ito, K.Okada, K.Itoi, M.Sato, T.Ito, R.Yamauchi, and K. Masu
- Journal Title
  
  Japanese Journal of Applied Physics 46(4B
  
  Pages: 2283-2286
- NAID
  210000062365
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063008
[Journal Article] Low-Loss Distributed Constant Passive Devices Using Wafer-Level Chip Scale Package Technology2007
- Author(s)
  Hiroyuki Ito, Hideyuki Sugita, Kenichi Okada, Tatsuya Ito, Kazuhisa Itoi, Masakazu Sato, Ryozo Yamauchi, Kazuya Masu
- Journal Title
  
  IEICE Transactions on Electronics VolE90-C No.3
  
  Pages: 641-643
- NAID
  110007519598
- Data Source
  KAKENHI-PROJECT-16206034
[Journal Article] Low-Loss Distributed Constant Passive Devices Using Wafer-Level Chip Scale Package Technology2007
- Author(s)
  Hiroyuki Ito, Hideyuki Sugita, Kenichi Okada, Tatsuya Ito, Kazuhisa Itoi, Masakazu Sato, Ryozo Yamauchi, Kazuya Masu
- Journal Title
  
  IEICE Transactions on Electronics Vol.E90-C No.3
  
  Pages: 641-643
- NAID
  110007519598
- Data Source
  KAKENHI-PROJECT-18063008
[Journal Article] Low-Loss Distributed Constant Passive Devices Using Wafer-Level Chip Scale Package Technology2007
- Author(s)
  H. Ito, H. Sugita, K. Okada, T. Ito, K. Itoi, M. Sato, R. Yamauchi, and K. Masu
- Journal Title
  
  IEICE Transactions on Electronics E90-C(3)
  
  Pages: 641-643
- NAID
  110007519598
- Description
  「研究成果報告書概要(和文)」より
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16206034
[Journal Article] On-Chip High-Q Variable Inductor Using Wafer-Level Chip-Scale Package Technology2006
- Author(s)
  K. Okada, H. Sugawara, H. Ito, K. Itoi, M. Sato, H. Abe, T. Ito, and K. Masu
- Journal Title
  
  IEEE Transactions on Electron Devices 53(9)
  
  Pages: 2401-2406
- Description
  「研究成果報告書概要(和文)」より
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16206034
[Journal Article] On-Chip High-Q Variable Inductor Using Wafer-Level Chip-Scale Package Technology2006
- Author(s)
  Kenicni Okada, Hirotaka Sugawara, Hiroyuki Ito, Kazuhisa Itoi, Masakazu Sato, Hiroshi Abe, Tatsuya Ito, Kazuya Masu
- Journal Title
  
  IEEE Transactions on Electron Devices Vol.53, No.9
  
  Pages: 2401-2406
- Data Source
  KAKENHI-PROJECT-18063008
[Journal Article] On-Chio High-Q Varible Inductor Using Wafer-Level Chip-Scale Package Technology2006
- Author(s)
  Kenichi Okada, Hirotaka Sugawara, Hiroyuki Ito, Kazuhisa Itoi, Masakazu Sato, Hiroshi Abe, Tatsuya Ito, Kazuya Masu
- Journal Title
  
  IEEE Transactions on Electron Devices Vol.53,No.9
  
  Pages: 2401-2406
- Data Source
  KAKENHI-PROJECT-16206034
[Journal Article] On-Chip High-Q Variable Inductor Using Wafer-Level Chip-Scale Package Technology2006
- Author(s)
  Kenichi Okada, Hirotaka Sugawara, Hiroyuki Ito, Kazuhisa Itoi, Masakazu Sato, Hiroshi Abe, Tatsuya Ito, Kazuya Masu
- Journal Title
  
  IEEE Transactions on Electron Devices Vol.53,No.9
  
  Pages: 2401-2406
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063008
[Journal Article] On-Chip High-Q Variable Inductor Using Wafer-Level Chip-Scale Package Technology2006
- Author(s)
  Kenichi, Okada, Hirotaka, Sugawara, Hiroyuki, Ito, Kazuhisa, Itoi, Masakazu, Sato, Hiroshi, Abe, Tatsuya, Ito, Kazuya, Masu
- Journal Title
  
  IEEE Transactions on Electron Devices Vol. 53, No. 9
  
  Pages: 2401-2406
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Patent] ＰＵＦ回路群，ＰＵＦ回路群の製造方法，ＰＵＦ回路の使用方法，及びネットワークシステム2018
- Inventor(s)
  佐藤高史、田中悠貴、辺松、廣本正之
- Industrial Property Rights Holder
  佐藤高史、田中悠貴、辺松、廣本正之
- Industrial Property Rights Type
  特許
- Industrial Property Number
  2018-154477
- Filing Date
  2018
- Data Source
  KAKENHI-PROJECT-17H01713
[Patent] 太陽電池, 複合太陽電池および集積回路2013
- Inventor(s)
  越智裕之, 佐藤高史, 池辺卓
- Industrial Property Rights Holder
  国立大学法人京都大学
- Industrial Property Rights Type
  特許
- Industrial Property Number
  2013-020277
- Filing Date
  2013-02-05
- Data Source
  KAKENHI-PROJECT-23300015
[Patent] 太陽電池、複合太陽電池および集積回路2013
- Inventor(s)
  越智裕之、佐藤高史、池辺卓
- Industrial Property Rights Holder
  国立大学法人京都大学
- Industrial Property Rights Type
  特許
- Industrial Property Number
  2013-020277
- Filing Date
  2013
- Data Source
  KAKENHI-PROJECT-23300015
[Patent] 回路モデル作成装置、回路モデル作成方法、シミュレーション装置、及び、シミュレーション方法」2009
- Inventor(s)
  佐藤高史、益一哉、山長功
- Industrial Property Rights Holder
  東京工業大学
- Industrial Property Number
  2009-050343
- Filing Date
  2009-03-04
- Data Source
  KAKENHI-PROJECT-18063008
[Patent] 電圧測定装置、集積回路基板、及び、電圧測定方法2008
- Inventor(s)
  佐藤高史、上薗巧、益一哉
- Industrial Property Rights Holder
  東京工業大学
- Industrial Property Number
  2008-081781
- Filing Date
  2008-03-26
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] Design of aging-robust clonable PUF using organic thin-film transistors and insulator-based ReRAM2024
- Author(s)
  Kunihiro Oshima, Kazunori Kuribara, and Takashi Sato
- Organizer
  ACM/IEEE Asia and South Pacific Design Automation Conference (ASPDAC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23K28052
[Presentation] Triplet network-based DNA encoding for enhanced similarity image retrieval2024
- Author(s)
  Takefumi Koike, Hiromitsu Awano, and Takashi Sato
- Organizer
  Proc. ACM/IEEE Design Automation Conference (DAC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23K18462
[Presentation] DNA-based similar image retrieval via triplet network-driven encoder2024
- Author(s)
  Koike, Hiromitsu Awano, and Takashi Sato
- Organizer
  Proc. Design, Automation and Test in Europe (DATE)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23K18462
[Presentation] Fast parameter optimization of delayed feedback reservoir with backpropagation and gradient descent2024
- Author(s)
  Sosei Ikeda, Hiromitsu Awano, and Takashi Sato
- Organizer
  Design, Automation and Test in Europe (DATE)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23K28052
[Presentation] Experimental study of pass/fail threshold determination based on Gaussian process regression2024
- Author(s)
  Daisuke Goeda, Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki, Takashi Sato, and Michihiro Shintani
- Organizer
  Workshop on synthesis and system integration of mixed information technologies (SASIMI)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23K28052
[Presentation] Enhancing visual similarities in DNA-based similar image retrieval2024
- Author(s)
  Takefumi Koike and Takashi Sato
- Organizer
  Proc. Workshop on synthesis and system integration of mixed information technologies (SASIMI)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23K18462
[Presentation] Triplet network-based DNA encoding for enhanced similarity image retrieval2024
- Author(s)
  Takefumi Koike, Hiromitsu Awano, and Takashi Sato
- Organizer
  ACM/IEEE Design Automation Conference (DAC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23K28052
[Presentation] Introducing Transfer Learning Framework on Device Modeling by Machine Learning2023
- Author(s)
  Kota Niiyama, Hiromitu Awano, and Takashi Sato
- Organizer
  IEEE International Conference on Microelectronic Test Structures (ICMTS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H04156
[Presentation] OPTL: Robust and area-efficient pass gate logic for organic transistors2023
- Author(s)
  Qin Zhaoxing, Kunihiro Oshima, Kazunori Kuribara, and Takashi Sato
- Organizer
  IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS)
- Data Source
  KAKENHI-PROJECT-20K21793
[Presentation] OPTL: Robust and area-efficient pass gate logic for organic transistors2023
- Author(s)
  Qin Zhaoxing, Kunihiro Oshima, Kazunori Kuribara, and Takashi Sato
- Organizer
  IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23K28052
[Presentation] Improving efficiency and robustness of Gaussian process based outlier detection via ensemble learning2023
- Author(s)
  Makoto Eiki, Tomoki Nakamura, Masuo Kajiyama, Michiko Inoue, Takashi Sato, and Michihiro Shintani
- Organizer
  International Test Conference (ITC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23K28052
[Presentation] Integer-wise型TFHEの算術演算の高速化2023
- Author(s)
  松岡航太郎, 星月祐介, 佐藤高史, Song Bian
- Organizer
  暗号とセキュリティシンポジウム
- Data Source
  KAKENHI-PROJECT-20K21793
[Presentation] Respiratory rate estimation based on WiFi frame capture2022
- Author(s)
  Takamochi Kanda, Takashi Sato, Hiromitsu Awano, Sota Kondo, and Koji Yamamoto
- Organizer
  IEEE Consumer Communications & Networking Conference (CCNC)
- Data Source
  KAKENHI-PROJECT-20K21793
[Presentation] dGPLVM: A nonparametric device model for statistical circuit simulation2022
- Author(s)
  Kyohei Shimozato and Takashi Sato
- Organizer
  IEEE International Conference on Microelectronic Test Structures (ICMTS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20K21793
[Presentation] Investigation of layout-dependent characteristic change for improving performance of organic thin-film transistors2022
- Author(s)
  Kunihiro Oshima, Kazunori Kuribara, and Takashi Sato
- Organizer
  IEEE International Conference on Microelectronic Test Structures (ICMTS)
- Invited
- Data Source
  KAKENHI-PROJECT-20H04156
[Presentation] Respiratory rate estimation based on WiFi frame capture2022
- Author(s)
  Takamochi Kanda, Takashi Sato, Hiromitsu Awano, Sota Kondo, and Koji Yamamoto
- Organizer
  IEEE Consumer Communications & Networking Conference (CCNC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H04156
[Presentation] Feasibility of the Efficient OTFT Array Measurement for the Long-term Reliability Evaluation Using External Measurement Board2022
- Author(s)
  Yasuhiro Ogasahara, Kazunori Kuribara, and Takashi Sato
- Organizer
  International Conference on Solid State Devices and Materials (SSDM)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H04156
[Presentation] Aging-robust Amplifier Design Using Low Voltage Organic Semiconductor Loads2022
- Author(s)
  Yuto Kaneiwa, Kazunori Kuribara, and Takashi Sato
- Organizer
  International Conference on Solid State Devices and Materials (SSDM)
- Data Source
  KAKENHI-PROJECT-20H04156
[Presentation] Evaluating Accuracy of Quantum Circuit Learning via Quantum Circuit Mapping2022
- Author(s)
  Nanao Segawa and Takashi Sato
- Organizer
  Workshop on synthesis and system integration of mixed information technologies (SASIMI)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H04156
[Presentation] SNRoverSDNN: A Metric for Robust CNN-based ROI Selection in Remote Heart Rate Extraction2022
- Author(s)
  Yuta Hitotsuyanagi and Takashi Sato
- Organizer
  Workshop on synthesis and system integration of mixed information technologies (SASIMI)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H04156
[Presentation] 完全準同型暗号におけるBNNを用いた高速な秘匿推論手法の実装と評価2022
- Author(s)
  橋詰陽太, 古川修平, 松本直樹, 伴野良太郎, 松岡航太郎, 佐藤高史
- Organizer
  情報処理学会第84回全国大会
- Data Source
  KAKENHI-PROJECT-20K21793
[Presentation] Layout-dependent vertical and in-plane leakage current reduction of organic thin-film transistors by layer contact restriction2022
- Author(s)
  Kunihiro Oshima, Kazunori Kuribara, and Takashi Sato
- Organizer
  IEEE International Conference on Microelectronic Test Structures (ICMTS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H04156
[Presentation] Evaluating accuracy of quantum circuit learning via quantum circuit mapping2022
- Author(s)
  Nanao Segawa and Takashi Sato
- Organizer
  Workshop on synthesis and system integration of mixed information technologies (SASIMI)
- Data Source
  KAKENHI-PROJECT-20K21793
[Presentation] 量子計算の誤り軽減のための量子ビット初期配置手法2021
- Author(s)
  瀬川七央, 佐藤高史
- Organizer
  回路とシステムワークショップ
- Data Source
  KAKENHI-PROJECT-20H04156
[Presentation] 量子計算の誤り軽減のための量子ビット初期配置手法2021
- Author(s)
  瀬川七央, 佐藤高史
- Organizer
  回路とシステムのワークショップ
- Data Source
  KAKENHI-PROJECT-20K21793
[Presentation] WiFiフレームキャプチャに基づく呼吸数推定に関する検討2021
- Author(s)
  神田高望, 佐藤高史, 粟野皓光, 近藤綜太, 山本高至
- Organizer
  信学技報 SRW SeMI CNR
- Data Source
  KAKENHI-PROJECT-20K21793
[Presentation] Clonable PUF: On the design of PUFs that share equivalent responses2021
- Author(s)
  Takashi Sato, Yuki Tanaka, and Song Bian
- Organizer
  IEEE International Symposium on Circuits and Systems (ISCAS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20K21793
[Presentation] Clonable PUF: On the design of PUFs that share equivalent responses2021
- Author(s)
  Takashi Sato, Yuki Tanaka, and Song Bian
- Organizer
  IEEE International Symposium on Circuits and Systems (ISCAS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H04156
[Presentation] 複数カメラと粒子フィルタを用いた体動にロバストな心拍推定手法2021
- Author(s)
  一柳優太, 佐藤高史
- Organizer
  回路とシステムワークショップ
- Data Source
  KAKENHI-PROJECT-20H04156
[Presentation] WiFiフレームキャプチャに基づく呼吸数推定に関する検討2021
- Author(s)
  神田高望, 佐藤高史, 粟野皓光, 近藤綜太, 山本高至
- Organizer
  信学技報 SRW SeMI CNR
- Data Source
  KAKENHI-PROJECT-20H04156
[Presentation] Towards better standard cell library: Optimizing compound logic gates for TFHE2021
- Author(s)
  Kotaro Matsuoka, Yusuke Hoshizuki, Takashi Sato and Song Bian
- Organizer
  ACM Workshop on Encrypted Computing & Applied Homomorphic Cryptography (WAHC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20K21793
[Presentation] 統計的回路シミュレーションのための非正規分布モデルパラメータの生成2021
- Author(s)
  佐藤高史, 塚本裕貴, 辺松, 新谷道広
- Organizer
  信学技報 SDM研究会
- Invited
- Data Source
  KAKENHI-PROJECT-20H04156
[Presentation] Automatic parallelism tuning for module learning with errors based post-Quantum key exchanges on GPUs2021
- Author(s)
  Tatsuki Ono, Song Bian, and Takashi Sato
- Organizer
  IEEE International Symposium on Circuits and Systems (ISCAS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20K21793
[Presentation] Privacy-preserving Medical Image Segmentation via Hybrid Trusted Execution Environment2021
- Author(s)
  S. Bian, W. Jiang, and T. Sato
- Organizer
  ACM/IEEE Design Automation Conference (DAC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20K21793
[Presentation] Hierarchical overlapped clustering for Ising-model based TSP solver2021
- Author(s)
  Riu Shimizu, Song Bian and Takashi Sato
- Organizer
  Workshop on synthesis and system integration of mixed information technologies (SASIMI)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H04156
[Presentation] 統計的回路シミュレーションのための非正規分布モデルパラメータの生成(招待)2021
- Author(s)
  佐藤高史, 塚本裕貴, 辺松, 新谷道広
- Organizer
  信学技報 SDM研究会
- Invited
- Data Source
  KAKENHI-PROJECT-20K21793
[Presentation] Adaptive outlier detection for power MOSFETs based on Gaussian process regression2021
- Author(s)
  Kyohei Shimozato, Michihiro Shintani, and Takashi Sato
- Organizer
  IEEE Applied Power Electronics Conference and Exposition (APEC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20K21793
[Presentation] 商用Wi-Fiデバイスを使用したピーク位置推定に基づく心拍変動の推定2021
- Author(s)
  白神樹, 佐藤高史
- Organizer
  回路とシステムワークショップ
- Data Source
  KAKENHI-PROJECT-20H04156
[Presentation] 大規模MOSFETリザバーの高速シミュレーション2021
- Author(s)
  村田寛也, 久米祐貴, 辺松, 粟野皓光, 佐藤高史
- Organizer
  DA シンポジウム
- Data Source
  KAKENHI-PROJECT-20H04156
[Presentation] 統計的回路シミュレーションのための非正規分布モデルパラメータの生成2021
- Author(s)
  佐藤高史, 塚本裕貴, 辺松, 新谷道広統計的回路シミュレーションのための非正規分布モデルパラメータの生成(招待)
- Organizer
  信学技報 SDM研究会
- Invited
- Data Source
  KAKENHI-PROJECT-20K21793
[Presentation] Motion robust remote photoplethsymography via frequency domain motion artifact reduction2021
- Author(s)
  Suraj Hebber and Takashi Sato
- Organizer
  IEEE Biomedical Circuits and Systems Conference (BIOCAS)
- Invited
- Data Source
  KAKENHI-PROJECT-20H04156
[Presentation] Automatic Parallelism Tuning for Module Learning With Errors Based Post-Quantum Key Exchanges on GPUs2021
- Author(s)
  T. Ono, S. Bian, and T. Sato
- Organizer
  IEEE International Symposium on Circuits and Systems (ISCAS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20K21793
[Presentation] Virtual secure platform: A five-stage pipeline processor over TFHE2021
- Author(s)
  Kotaro Matsuoka, Ryotaro Banno, Naoki Matsumoto, Takashi Sato, and Song Bian
- Organizer
  Usenix Security Symposium
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20K21793
[Presentation] Rail-to-rail output voltage swing of inverter with organic thin-film transistor at 2.5V Vdd toward reliable operation of low leakage large scale logic circuits2021
- Author(s)
  Yasuhiro Ogasahara, Kazunori Kuribara, Kunihiro Oshima, and Takashi Sato
- Organizer
  International Conference on Solid State Devices and Materials (SSDM)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H04156
[Presentation] Extraction of heart rate variability using commodity Wi-Fi devices2021
- Author(s)
  Itsuki Shirakami and Takashi Sato
- Organizer
  IEEE Conference on Biomedical and Health Informatics (BHI),
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H04156
[Presentation] An SRAM-based scratchpad memory for organic IoT sensors2021
- Author(s)
  Zhaoxing Qin, Kazunori Kuribara, and Takashi Sato
- Organizer
  IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H04156
[Presentation] Virtual Secure Platform: A Five-stage Pipeline Processor Over TFHE2021
- Author(s)
  K. Matsuoka, R. Banno, N. Matsumoto, T. Sato, and S. Bian
- Organizer
  Usenix Security Symposium
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20K21793
[Presentation] Privacy-preserving medical image segmentation via hybrid trusted execution environment2021
- Author(s)
  Song Bian, Weiweng Jiang, and Takashi Sato
- Organizer
  ACM/IEEE Design Automation Conference (DAC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20K21793
[Presentation] Clonable PUF: On the Design of PUFs That Share Equivalent Responses2021
- Author(s)
  T. Sato, Y. Tanaka, and S. Bian
- Organizer
  IEEE International Symposium on Circuits and Systems (ISCAS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20K21793
[Presentation] Automatic parallelism tuning for module learning with errors based post-Quantum key exchanges on GPUs2021
- Author(s)
  Tatsuki Ono, Song Bian, and Takashi Sato
- Organizer
  International Symposium on Circuits and Systems (ISCAS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H04156
[Presentation] NASS: Optimizing Secure Inference via Neural Architecture Search2020
- Author(s)
  Song Bian, Weiwen Jiang, Qing Lu, Yiyu Shi, and Takashi Sato
- Organizer
  European Conference on Artificial Intelligence (ECAI), June 2020
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] n型有機薄膜トランジスタにおけるバイアス・ストレス特性変動物理メカニズムの実験的評価2020
- Author(s)
  大島國弘, 栗原一徳, 辺松, 佐藤高史
- Organizer
  DA シンポジウム
- Data Source
  KAKENHI-PROJECT-20H04156
[Presentation] A Tuning-Free Hardware Reservoir Based on MOSFET Crossbar Array for Practical Echo State Network Implementation,2020
- Author(s)
  Yuki Kume, Song Bian, and Takashi Sato
- Organizer
  IEICE Technical Report, pp.139-144, March 2020
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] NASS: Optimizing Secure Inference via Neural Architecture Search2020
- Author(s)
  S. Bian, W. Jiang, Q. Lu, Y. Shi, and T. Sato
- Organizer
  European Conference on Artificial Intelligence (ECAI)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20K21793
[Presentation] Design of an organic SRAM cell with p-type access transistors2020
- Author(s)
  Qin Zhaoxing, Kazunori Kuribara, Song Bian, and Takashi Sato
- Organizer
  International Conference on Solid State Devices and Materials (SSDM)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H04156
[Presentation] BUNET: Blind Medical Image Segmentation Based on Secure UNET2020
- Author(s)
  S. Bian, X. Xu, W. Jiang, Y. Shi, and T. Sato
- Organizer
  Medical Image Computing and Computer Assisted Interventions (MICCAI)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20K21793
[Presentation] Clustering Approach for Solving Traveling Salesman Problems via Ising Model Based Solver2020
- Author(s)
  Akira Dan, Riu Shimizu, Takeshi Nishikawa, Song Bian and Takashi Sato
- Organizer
  ACM/IEEE Design Automation Conference (DAC), July 2020
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] ENSEI: Efficient Secure Inference via Frequency-domain Homomorphic Convolution for Privacy-preserving Visual Recognition2020
- Author(s)
  Song Bian, Tianchen Wang, Masayuki Hiromoto, Yiyu Shi, and Takashi Sato
- Organizer
  Computer Vision and Pattern Recognition (CVPR), June 2020
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] An electrothermal compact model of SiC MOSFETs for simulating unclamped inductive switching tests2020
- Author(s)
  Kyohei Shimozato, Yohei Nakamura, Song Bian, and Takashi Sato
- Organizer
  International Conference on Solid State Devices and Materials (SSDM)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H04156
[Presentation] A Tuning-free Hardware Reservoir Based on MOSFET Crossbar Array for Practical Echo State Network Implementation2020
- Author(s)
  Yuki Kume, Song Bian, and Takashi Sato
- Organizer
  ACM/IEEE Asia and South Pacific Design Automation Conference (ASPDAC), pp.458-463, January 2020
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] ENSEI: Efficient Secure Inference via Frequency-domain Homomorphic Convolution for Privacy-preserving Visual Recognition2020
- Author(s)
  S. Bian, T. Wang, M. Hiromoto, Y. Shi, and T. Sato
- Organizer
  Computer Vision and Pattern Recognition (CVPR)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20K21793
[Presentation] Quantification of insulator and semiconductor carrier trapping in organic thin film transistors using DNTT and TU-12020
- Author(s)
  Kunihiro Oshima, Kazunori Kuribara, Song Bian, and Takashi Sato
- Organizer
  International Conference on Solid State Devices and Materials (SSDM)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H04156
[Presentation] Clustering approach for solving traveling salesman problems via Ising model based solver2020
- Author(s)
  Akira Dan, Riu Shimizu, Takeshi Nishikawa, Song Bian and Takashi Sato
- Organizer
  ACM/IEEE Design Automation Conference (DAC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H04156
[Presentation] Performance Evaluation of Echo State Networks With Hardware Reservoirs2020
- Author(s)
  Yuki Kume, Song Bian, Kenta Nagura, and Takashi Sato
- Organizer
  IEICE Technical Report, pp.245-250, March 2020
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] OCM-PUF: An Organic Current Mirror PUF With Enhanced Resilience to Device Degradation2019
- Author(s)
  Zhaoxing Qin, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato
- Organizer
  IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] A Three-level Active Gate Drive Circuit for Power MOSFETs Utilizing a Generic Gate Driver IC,2019
- Author(s)
  Michihiro Shintani, Kazuki Oishi, and Takashi Sato
- Organizer
  International Conference on Silicon Carbide and Related Materials (ICSCRM), September 2019
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] Filianore: Better multiplier architectures for LWE-based post-quantum key exchange2019
- Author(s)
  S. Bian, M. Hiromoto, and T. Sato
- Organizer
  ACM/IEEE Design Automation Conference (DAC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] A Tuning-free Reservoir of MOSFET Crossbar Array for Inexpensive Hardware Realization of Echo State Network2019
- Author(s)
  Yuki Kume, Masayuki Hiromoto and Takashi Sato
- Organizer
  The 22nd workshop on synthesis and system integration of mixed information technologies (SASIMI), pp.324-349, October 2019
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] Estimation of NBTI-induced Timing Degradation Considering Duty Ratio2019
- Author(s)
  Kunihiro Oshima, Song Bian and Takashi Sato
- Organizer
  The 22nd workshop on synthesis and system integration of mixed information technologies (SASIMI), pp.330-335, October 2019
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] Experimental Study of Bias Stress Degradation of Organic Thin Film Transistors2019
- Author(s)
  Kunihiro Oshima, Michiaki Saito, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato
- Organizer
  International Conference on Solid State Devices and Materials (SSDM), pp.89-90, September 2019
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] Heart Rate Estimation During Exercise from Photoplethysmographic Signals Using Convolutional Neural Network2019
- Author(s)
  Masaki Nakamura and Takashi Sato
- Organizer
  Biomedical Circuits and Systems Conference (BIOCAS), pp.1-4, October 2019
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] レプリカ交換イジングモデルソルバにおけるレプリカトポロジーと温度割当方法に関する検討2019
- Author(s)
  党璋, 佐藤高史
- Organizer
  信学技報 VLD研究会, pp.7-12, May 2019
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] DArL: Dynamic parameter adjustment for LWE-based secure inference2019
- Author(s)
  S. Bian, M. Hiromoto, and T. Sato
- Organizer
  Design, Automation and Test in Europe (DATE)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] Parameter Extraction Procedure for Surface-potential-based SiC MOSFET Model2019
- Author(s)
  Michihiro Shintani, Hiroki Tsukamoto, and Takashi Sato
- Organizer
  IEEE Workshop on Wide Bandgap Power Devices and Applications (WiPDA), pp.444-448, October 2019
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] Improved Multiplier Architecture on ASIC for RLWE-based Key Exchange2019
- Author(s)
  Tatsuki Ono, Song Bian and Takashi Sato
- Organizer
  The 22nd workshop on synthesis and system integration of mixed information technologies (SASIMI), pp.39-40, October 2019
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] OCM-PUF: An Organic Current Mirror PUF With Enhanced Resilience to Device Degradation2019
- Author(s)
  Zhaoxing Qin, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato
- Organizer
  IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS), pp.1-3, July 2019.
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] 有機薄膜トランジスタの実測に基づくバイアス・ストレス劣化の要因とモデル化に関する検討2019
- Author(s)
  大島國弘, 齋藤成晃, 新谷道広, 栗原一徳, 小笠原泰弘, 佐藤高史
- Organizer
  DA シンポジウム, pp.214-219, August 2019
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] Filianore: Better Multiplier Architectures for LWE-based Post-quantum Key Exchange2019
- Author(s)
  Song Bian, Masayuki Hiromoto and Takashi Sato
- Organizer
  ACM/IEEE Design Automation Conference (DAC), pp.52.4:1-52.4:6, June 2019
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] 畳み込みニューラルネットワークを利用した光電容積脈波からの運動時心拍推定手法2019
- Author(s)
  中村公暉, 廣本正之, 佐藤高史
- Organizer
  回路とシステムワークショップ, pp.7-12, August 2019
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] Approximate computing を用いたLWE暗号の高効率復号回路2018
- Author(s)
  辺松, 廣本正之, 佐藤高史
- Organizer
  情報処理学会DAシンポジウム
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] Ising-PUF: A Machine Learning Attack Resistant PUF Featuring Lattice Like Arrangement of Arbiter-PUFs2018
- Author(s)
  Hiromitsu Awano and Takashi Sato
- Organizer
  Design, Automation and Test in Europe (DATE)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] Enhancing the solution quality of hardware Ising-model solver via parallel tempering2018
- Author(s)
  H. Gyoten, M. Hiromoto, and T. Sato
- Organizer
  IEEE/ACM International Conference on Computer-Aided Design (ICCAD)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] メモリスタを用いた等価な応答を返すPUF対の検討2018
- Author(s)
  田中悠貴, 辺松, 廣本正之, 佐藤高史
- Organizer
  情報処理学会DAシンポジウム
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] Fast and robust heart rate estimation from videos through dynamic region selection2018
- Author(s)
  Y. Fujita, M. Hiromoto, and T. Sato
- Organizer
  International Engineering in Medicine and Biology Conference (EMBC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] A transient approach for input capacitance characterization of power devices2018
- Author(s)
  T. Sato
- Organizer
  IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] DWE: Decrypting learning with errors with errors2018
- Author(s)
  S. Bian, M. Hiromoto, and T. Sato
- Organizer
  ACM/IEEE Design Automation Conference (DAC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] RRAM/CMOS-Hybrid Architecture of Annealing Processor for Fully Connected Ising Model2018
- Author(s)
  Shogo Matsumoto, Hidenori Gyoten, Masayuki Hiromoto, and Takashi Sato
- Organizer
  International Memory Workshop (IMW)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03214
[Presentation] NBTI劣化によるArbiter PUFの応答変化に関する検討2018
- Author(s)
  小野龍輝, 田中悠貴, 新瑞徳, 辺松, 廣本正之, 佐藤高史
- Organizer
  電子情報通信学会総合大会
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] Measurement and modeling of frequency degradation of an oTFT ring oscillator2018
- Author(s)
  M. Saito, M. Shintani, K. Kuribara, Y. Ogasahara, and T. Sato
- Organizer
  IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] DWE: Decrypting Learning With Errors With Errors2018
- Author(s)
  Song Bian, Masayuki Hiromoto, and Takashi Sato
- Organizer
  ACM/IEEE Design Automation Conference (DAC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] A Feasibility Study of Annealing Processor for Fully-connected Ising Model Based on Memristor/CMOS Hybrid Architecture2018
- Author(s)
  Shogo Matsumoto, Hidenori Gyoten, Masayuki Hiromoto and Takashi Sato
- Organizer
  The 21st workshop on synthesis and system integration of mixed information technologies (SASIMI)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] 多ビットの相互作用をもつ全接続イジングモデルのためのRRAMアニーリングプロセッサ2018
- Author(s)
  松本章吾, 業天英範, 廣本正之, 佐藤高史
- Organizer
  回路とシステムワークショップ
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] レプリカセンサを用いたNBTIによる回路特性変動予測に関する検討2018
- Author(s)
  大島國弘, 辺松, 廣本正之, 佐藤高史
- Organizer
  信学技報 VLD研究会(デザインガイア)
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] A compact model of I-V characteristic degradation for organic thin film transistors2018
- Author(s)
  M. Saito, M. Shintani, K. Kuribara, Y. Ogasahara, and T. Sato
- Organizer
  IEEE International Conference on Microelectronic Test Structures (ICMTS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] On the reset operation of organic cross-coupled inverter2018
- Author(s)
  M. Saito, M. Shintani, K. Kuribara, Y. Ogasahara, M. Hiromoto, and T. Sato
- Organizer
  International Conference on Solid State Devices and Materials (SSDM)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] An experimental design of robust current-mode arbiter PUF using organic thin film transistors2018
- Author(s)
  Z. Qin, M. Shintani, K. Kuribara, Y. Ogasahara, and T. Sato
- Organizer
  IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] A Study on NBTI-induced Delay Degradation Considering Stress Frequency Dependence2018
- Author(s)
  Zuitoku Shin, Shumpei Morita, Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato
- Organizer
  International Symposium on Quality Electronic Design (ISQED)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] 多ビットの相互作用をもつ全接続イジングモデルのためのRRAMアニーリングプロセッサ2018
- Author(s)
  松本章吾, 業天英範, 廣本正之, 佐藤高史
- Organizer
  第31回回路とシステムワークショップ
- Data Source
  KAKENHI-PROJECT-18H03214
[Presentation] Study on statistical parameter extraction of power MOSFET model by principal component analysis2018
- Author(s)
  H. Tsukamoto, M. Shintani, and T. Sato
- Organizer
  IEEE International Conference on Microelectronic Test Structures (ICMTS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] ストカスティック計算を用いたニューラルネットワークハードウェアのための省面積積和演算器2018
- Author(s)
  名倉健太, 廣本正之, 佐藤高史
- Organizer
  電子情報通信学会 VLSI設計技術研究会
- Data Source
  KAKENHI-PROJECT-18H03214
[Presentation] Initial parameter extraction procedure for surface-potential-based SiC MOSFET model2018
- Author(s)
  M. Shintani and T. Sato
- Organizer
  Workshop on variability modeling and characterization (VMC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] RRAM/CMOS-hybrid Architecture of Annealing Processor for Fully Connected Ising Model2018
- Author(s)
  Shogo Matsumoto, Hidenori Gyoten, Masayuki Hiromoto, and Takashi Sato
- Organizer
  IEEE International Memory Workshop (IMW)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] Efficient Exploration of Worst Case Workload and Timing Degradation Under NBTI2018
- Author(s)
  Shumpei Morita, Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato
- Organizer
  ACM/IEEE Asia and South Pacific Design Automation Conference (ASPDAC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] 有機トランジスタによるBuskeeper PUFの試作と連続測定のためのリセット回路の検討2018
- Author(s)
  齊藤成晃, 新谷道広, 栗原一徳, 小笠原泰弘, 廣本正之, 佐藤高史
- Organizer
  回路とシステムワークショップ
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] Comparative Study of Delay Degradation Caused by NBTI Considering Stress Frequency Dependence2018
- Author(s)
  Zuitoku Shin, Shumpei Morita, Song Bian, Michihiro Shintani, Masayuki Hiromoto and Takashi Sato
- Organizer
  The 21st workshop on synthesis and system integration of mixed information technologies (SASIMI)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] A plotter-based automatic measurements and statistical characterization of multiple discrete power devices2018
- Author(s)
  M. Shintani, B. N. Dauphin, K. Oishi, M. Hiromoto, and T. Sato
- Organizer
  International power electronics conference (IPEC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] A PUF Based on the Instantaneous Response of Ring Oscillator Determined by the Convergence Time of Bistable Ring2018
- Author(s)
  Yuki Tanaka, Song Bian, Masayuki Hiromoto and Takashi Sato
- Organizer
  The 21st workshop on synthesis and system integration of mixed information technologies (SASIMI)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] Towards practical homomorphic email filtering: A hardware-accelerated secure naive Bayesian filter2018
- Author(s)
  S. Bian, M. Hiromoto, and T. Sato
- Organizer
  電子情報通信学会VLD研究会
- Invited
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] Fast and Robust Heart Rate Estimation from Videos Through Dynamic Region Selection2018
- Author(s)
  Yuya Fujita, Masayuki Hiromoto, and Takashi Sato
- Organizer
  Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03214
[Presentation] レプリカ交換イジングモデルソルバにおけるレプリカトポロジーと温度割当方法に関する検討2018
- Author(s)
  党璋, 佐藤高史
- Organizer
  信学技報 VLD研究会
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] 畳み込みニューラルネットワークの周波数領域学習による演算量削減2018
- Author(s)
  三宅哲史, 廣本正之, 佐藤高史
- Organizer
  第31回回路とシステムワークショップ
- Data Source
  KAKENHI-PROJECT-18H03214
[Presentation] RAM/CMOS-hybrid architecture of annealing processor for fully connected Ising model2018
- Author(s)
  S. Matsumoto, H. Gyoten, M. Hiromoto, and T. Sato
- Organizer
  IEEE International Memory Workshop (IMW)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] Interpolation-Based Object Detection Using Motion Vectors for Embedded Real-Time Tracking Systems2018
- Author(s)
  Takayuki Ujiie, Masayuki Hiromoto, and Takashi Sato
- Organizer
  IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18H03214
[Presentation] LSTA: Learning-based Static Timing Analysis for High-dimensional Correlated On-chip Variations2017
- Author(s)
  Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato
- Organizer
  ACM/IEEE Design Automation Conference (DAC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] トランジスタ劣化の永続・回復可能成分を考慮したしきい値電圧変動の時間依存モデル2017
- Author(s)
  新瑞徳, 森田俊平, 新谷道新, 廣本正之, 佐藤高史
- Organizer
  回路とシステムワークショップ
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] LSTA: Learning-based static timing analysis for high-dimensional correlated on-chip variations2017
- Author(s)
  Song Bian, Michihiro Shintani, Shumpei Morita, Masayuki Hiromoto, and Takashi Sato
- Organizer
  ACM/IEEE Design Automation Conference (DAC)
- Place of Presentation
  テキサス州オースチン市（米国）
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] チャレンジヒステリシス特性を有するPUFの設計とシミュレーションに基づく性能評価2017
- Author(s)
  粟野皓光, 佐藤高史
- Organizer
  DA シンポジウム
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] 手の動画像からの心拍間隔推定に関する一検討2017
- Author(s)
  藤田雄也, 廣本正之, 佐藤高史
- Organizer
  電子情報通信学会総合大会
- Place of Presentation
  名城大学（愛知県名古屋市）
- Year and Date
  2017-03-22
- Data Source
  KAKENHI-PROJECT-15K12700
[Presentation] 動画のフレーム間相関を利用した圧縮センシングの高速復元手法2017
- Author(s)
  小西慧, 廣本正之, 佐藤高史
- Organizer
  電子情報通信学会スマートインフォメディアシステム研究会
- Place of Presentation
  神奈川工科大学(神奈川県横浜市)
- Year and Date
  2017-03-03
- Data Source
  KAKENHI-PROJECT-15K12700
[Presentation] A Design-analysis Flow Considering Mechanical Stability of Metal Masks for Organic CMOS Circuits2017
- Author(s)
  Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, Masayuki Hiromoto, and Takashi Sato
- Organizer
  IEEE International Conference on Solid State Devices and Materials (SSDM)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] Efficient circuit failure probability calculation along product lifetime considering device aging2017
- Author(s)
  Hiromitsu Awano, Masayuki Hiromoto, and Takashi Sato
- Organizer
  IEEE/ACM Asia and South Pacific Design Automation Conference (ASPDAC)
- Place of Presentation
  幕張メッセ（千葉県幕張市）
- Year and Date
  2017-01-17
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] Pattern based runtime voltage emergency prediction: an instruction-aware block sparse compressed sensing approach2017
- Author(s)
  Yu-Guang Chen, Michihiro Shintani, Takashi Sato, Yiyu Shi, and Shih-Chieh Chang
- Organizer
  IEEE/ACM Asia and South Pacific Design Automation Conference (ASPDAC)
- Place of Presentation
  幕張メッセ（千葉県幕張市）
- Year and Date
  2017-01-19
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] Secured Content Addressable Memory Based on Homomorphic Encryption2017
- Author(s)
  Song Bian, Masayuki Hiromoto, and Takashi Sato
- Organizer
  DA Symposium
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01713
[Presentation] Line samplingを用いたモンテカルロ法に基づくタイミング歩留り解析の高速化2017
- Author(s)
  粟野皓光, 佐藤高史
- Organizer
  電子情報通信学会VLSI設計技術研究会
- Place of Presentation
  沖縄県青年会館（沖縄県那覇市）
- Year and Date
  2017-03-02
- Invited
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] トランジスタ劣化の永続・回復可能成分を考慮したしきい値電圧変動の時間依存モデル2017
- Author(s)
  新瑞徳, 新谷道広, 廣本正之, 佐藤高史
- Organizer
  第30回回路とシステムワークショップ
- Place of Presentation
  北九州国際会議場（福岡県北九州市）
- Year and Date
  2017-05-12
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] Circuit Aging2 - Measurement Techniques (tutorial)2016
- Author(s)
  Takashi Sato and Hidetoshi Onodera
- Organizer
  International Reliability Physics Symposium (IRPS)
- Place of Presentation
  Pasadena, CA, USA
- Year and Date
  2016-04-17
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] Hardware Accelerator of Convolutional Neural Network for Image Recognition and its Performance Evaluation Platform2016
- Author(s)
  Takayuki Ujiie, Masayuki Hiromoto, and Takashi Sato
- Organizer
  20th Workshop on Synthesis And System Integration of Mixed Information technologies (SASIMI2016)
- Place of Presentation
  京都リサーチパーク（京都府京都市）
- Year and Date
  2016-10-24
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26730027
[Presentation] Efficient Transistor-Level Timing Yield Estimation via Line Sampling2016
- Author(s)
  Hiromitsu Awano and Takashi Sato
- Organizer
  Design Automation Conference (DAC)
- Place of Presentation
  Austin, TX, USA
- Year and Date
  2016-06-05
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] Workload-Aware Worst Path Analysis of Processor-Scale NBTI Degradation2016
- Author(s)
  Song Bian, Michihiro Shintani, Shumpei Morita, Hiromitsu Awano, Masayuki Hiromoto, and Takashi Sato
- Organizer
  Great Lakes Symposium on VLSI (GLSVLSI)
- Place of Presentation
  Boston, MA,USA
- Year and Date
  2016-05-18
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] 格子状電極を用いたジェスチャ認識向け電界センサによる導電体位置推定精度の評価2016
- Author(s)
  岸野瞬士, 廣本正之, 佐藤高史
- Organizer
  電子情報通信学会総合大会
- Place of Presentation
  九州大学伊都キャンパス福岡県福岡市
- Year and Date
  2016-03-15
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] Physically Unclonable Function Using RTN-Induced Delay Fluctuation in Ring Oscillators2016
- Author(s)
  Motoki Yoshinaga, Hiromitsu Awano, Masayuki Hiromoto, and Takashi Sato
- Organizer
  IEEE International Symposium on Circuits and Systems (ISCAS)
- Place of Presentation
  Montreal, QC, Canada
- Year and Date
  2016-05-22
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] NBTIによるしきい値電圧変動のストレス確率依存性の評価2016
- Author(s)
  忻瑞徳, 森田俊平, 新谷道広, 廣本正之, 佐藤高史
- Organizer
  電子情報通信学会ソサイエティ大会
- Place of Presentation
  北海道大学（北海道札幌市）
- Year and Date
  2016-09-20
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] Unique device identification framework for power MOSFETs using inherent device variation2016
- Author(s)
  Michihiro Shintani, Kazuki Oishi, Rui Zhou, Masayuki Hiromoto, and Takashi Sato
- Organizer
  Workshop on variability modeling and characterization (VMC)
- Place of Presentation
  テキサス州オースチン市（米国）
- Year and Date
  2016-11-10
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] Workload-aware worst path analysis of processor-scale NBTI degradation2016
- Author(s)
  Song Bian, Michihiro Shintani, Shumpei Morita, Hiromitsu Awano, Masayuki Hiromoto and Takashi Sato
- Organizer
  ACM Great Lakes Symposium on VLSI (GLSVLSI)
- Place of Presentation
  マサチューセッツ州ボストン市（米国）
- Year and Date
  2016-05-19
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] 粒子フィルタを用いた光電脈波信号からの運動時心拍数推定手法2016
- Author(s)
  藤田雄也, 廣本正之, 佐藤高史
- Organizer
  第29回回路とシステムワークショップ
- Place of Presentation
  北九州国際会議場福岡県北九州市
- Year and Date
  2016-05-12
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] 粒子フィルタを用いた光電脈波信号からの運動時心拍数推定手法2016
- Author(s)
  藤田雄也, 廣本正之, 佐藤高史
- Organizer
  回路とシステムワークショップ
- Place of Presentation
  北九州国際会議場(福岡県北九州市)
- Year and Date
  2016-05-13
- Data Source
  KAKENHI-PROJECT-15K12700
[Presentation] ばらつきを考慮したメモリスタモデルによるニューラルネットワークの学習収束性の評価2016
- Author(s)
  山森聡, 廣本正之, 佐藤高史
- Organizer
  電子情報通信学会ソサイエティ大会
- Place of Presentation
  北海道大学（北海道札幌市）
- Year and Date
  2016-09-20
- Data Source
  KAKENHI-PROJECT-26730027
[Presentation] Representative path approach for time-efficient NBTI mitigation logic replacement2016
- Author(s)
  Shumpei Morita, Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato
- Organizer
  Workshop on variability modeling and characterization (VMC)
- Place of Presentation
  テキサス州オースチン市（米国）
- Year and Date
  2016-11-10
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] 近似的予測戦略に基づく畳み込みニューラルネットワークプロセッサの低電力化2016
- Author(s)
  氏家隆之, 廣本正之, 佐藤高史
- Organizer
  第29回回路とシステムワークショップ
- Place of Presentation
  北九州国際会議場（福岡県北九州市）
- Year and Date
  2016-05-12
- Data Source
  KAKENHI-PROJECT-26730027
[Presentation] CIRCUIT AGING 2, Measurement Techniques (tutorial)2016
- Author(s)
  Takashi Sato and Hidetoshi Onodera
- Organizer
  IEEE International Reliability Physics Symposium (IRPS)
- Place of Presentation
  カリフォルニア州パサデナ市（米国）
- Year and Date
  2016-04-18
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] 代表パス抽出による劣化緩和セル置換箇所の高速な選択手法2016
- Author(s)
  森田俊平, 辺松, 新谷道広, 廣本正之, 佐藤高史
- Organizer
  第29回回路とシステムワークショップ
- Place of Presentation
  北九州国際会議場福岡県北九州市
- Year and Date
  2016-05-12
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] 有機トランジスタにおける漏れ電流特性のモデル化2016
- Author(s)
  齊藤成晃, 新谷道広, 小笠原泰弘, 廣本正之, 佐藤高史
- Organizer
  電子情報通信学会ソサイエティ大会
- Place of Presentation
  北海道大学（北海道札幌市）
- Year and Date
  2016-09-21
- Data Source
  KAKENHI-PROJECT-15K12700
[Presentation] Physically unclonable function using RTN-induced delay fluctuation in ring oscillators2016
- Author(s)
  Motoki Yoshinaga, Hiromitsu Awano, Masayuki Hiromoto, and Takashi Sato
- Organizer
  IEEE International Symposium on Circuits and Systems (ISCAS)
- Place of Presentation
  ケベック州モントリオール市（カナダ）
- Year and Date
  2016-05-25
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] Efficient Transistor-Level Timing Yield Estimation via Line Sampling2016
- Author(s)
  Hiromitsu Awano and Takashi Sato
- Organizer
  International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU)
- Place of Presentation
  Santa Rosa, CA, USA
- Year and Date
  2016-03-10
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] 演算簡略化手法評価のための畳み込みニューラルネットワークのFPGA実装2016
- Author(s)
  氏家隆之, 廣本正之, 佐藤高史
- Organizer
  第42回パルテノン研究会
- Place of Presentation
  東海大学高輪キャンパス（東京都港区）
- Data Source
  KAKENHI-PROJECT-26730027
[Presentation] 信号確率伝播に基づいたプロセッサのためのNBTI起因最大遅延パスの抽出2016
- Author(s)
  辺松, 新谷道広, 森田俊平, 粟野皓光, 廣本正之, 佐藤高史
- Organizer
  第29回回路とシステムワークショップ
- Place of Presentation
  北九州国際会議場　（福岡県北九州市）
- Year and Date
  2016-05-12
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] 近似的予測戦略に基づく畳み込みニューラルネットワークプロセッサの低電力化2016
- Author(s)
  氏家隆之, 廣本正之, 佐藤高史
- Organizer
  第29回回路とシステムワークショップ
- Place of Presentation
  北九州国際会議場福岡県北九州市
- Year and Date
  2016-05-12
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] Nonliner Delay-Table Approach for Full-Chip NBTI Degration Prediction2016
- Author(s)
  Song Bian,Michihiro Shintani,Shunpei Morita, Masayuki Hiromoto, Takashi Sato
- Organizer
  International Symposium on Quality Electronic Design (ISQED)
- Place of Presentation
  Santa Clara, CA, USA
- Year and Date
  2016-03-16
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] Efficient transistor-level timing yield estimation via line sampling2016
- Author(s)
  Hiromitsu Awano and Takashi Sato
- Organizer
  Design automation conference (DAC)
- Place of Presentation
  テキサス州オースチン市（米国）
- Year and Date
  2016-06-09
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] Runtime NBTI mitigtion for processor lifespan extension via selective node control2016
- Author(s)
  Song Bian, Michihiro Shintani, Zheng Wang, Masayuki Hiromoto, Anupam Chattopadhyay, and Takashi Sato
- Organizer
  IEEE Asian Test Symposium (ATS)
- Place of Presentation
  広島国際会議場（広島県広島市）
- Year and Date
  2016-11-24
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] 顔と手の連続静止画からの脈波伝播時間推定に関する一検討2016
- Author(s)
  藤田雄也, 廣本正之, 佐藤高史
- Organizer
  電子情報通信学会ソサイエティ大会
- Place of Presentation
  北海道大学（北海道札幌市）
- Year and Date
  2016-09-20
- Data Source
  KAKENHI-PROJECT-15K12700
[Presentation] Approximated Prediction Strategy for Reducing Power Consumption of Convolutional Neural Network Processor2016
- Author(s)
  Takayuki Ujiie, Masayuki Hiromoto, and Takashi Sato
- Organizer
  IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)
- Place of Presentation
  Las Vegas (USA)
- Year and Date
  2016-06-26
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26730027
[Presentation] しきい値電圧ばらつきによるBistable Ring PUFの応答予測2016
- Author(s)
  田中悠貴, 吉永幹, 廣本正之, 佐藤高史
- Organizer
  電子情報通信学会ソサイエティ大会
- Place of Presentation
  北海道大学（北海道札幌市）
- Year and Date
  2016-09-20
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] Aging-aware timing analysis based on machine learning2016
- Author(s)
  Son Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato
- Organizer
  DAシンポジウム
- Place of Presentation
  山代温泉　ゆのくに天祥（石川県加賀市）
- Year and Date
  2016-09-14
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] 信号確率伝播に基づいたプロセッサのためのNBTI起因最大遅延パスの抽出2016
- Author(s)
  辺松, 新谷道広, 森田俊平, 粟野皓光, 廣本正之, 佐藤高史
- Organizer
  第29回回路とシステムワークショップ
- Place of Presentation
  北九州国際会議場福岡県北九州市
- Year and Date
  2016-05-12
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] Mitigation of NBTI-induced Timing Degradation in processor2016
- Author(s)
  Song Bian,Michihiro Shintani,Zheng Wang,Masayuki Hiromoto, Takashi Sato, Anupam Chattopadhyay
- Organizer
  International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU)
- Place of Presentation
  Santa Rosa, CA, USA
- Year and Date
  2016-03-10
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] Path grouping approach for efficient candidate-selection of replacing NBTI mitigation logic2016
- Author(s)
  Shumpei Morita, Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato
- Organizer
  Workshop on synthesis and system integration of mixed information technologies (SASIMI)
- Place of Presentation
  京都リサーチパーク（京都府京都市）
- Year and Date
  2016-10-25
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] 代表パス抽出による劣化緩和セル置換箇所の高速な選択手法2016
- Author(s)
  森田俊平, 辺松, 新谷道広, 廣本正之, 佐藤高史
- Organizer
  第29回回路とシステムワークショップ
- Place of Presentation
  北九州国際会議場　（福岡県北九州市）
- Year and Date
  2016-05-12
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] 最大カット問題の高速求解に向けた二次元イジングモデルのFPGA実装2016
- Author(s)
  業天英範, 廣本正之, 佐藤高史
- Organizer
  電子情報通信学会技術研究報告(VLSI設計技術研究会)
- Place of Presentation
  沖縄県青年会館　沖縄県那覇市
- Year and Date
  2016-02-29
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] 粒子フィルタを用いた光電脈波信号からの運動時心拍数推定手法2016
- Author(s)
  藤田雄也, 廣本正之, 佐藤高史
- Organizer
  第29回回路とシステムワークショップ
- Place of Presentation
  北九州国際会議場　福岡県北九州市
- Year and Date
  2016-05-12
- Data Source
  KAKENHI-PROJECT-15K12700
[Presentation] 格子状電極を用いたジェスチャ認識向け電界センサによる導電体位置推定精度の評価2016
- Author(s)
  岸野瞬士, 廣本正之, 佐藤高史
- Organizer
  電子情報通信学会総合大会基礎・境界講演論文集
- Place of Presentation
  九州大学伊都キャンパス　福岡県福岡市
- Year and Date
  2016-03-15
- Data Source
  KAKENHI-PROJECT-15K12700
[Presentation] Binarized Neural Networkを用いた画像認識ハードウェアの消費エネルギー評価2016
- Author(s)
  三宅哲史, 氏家隆之, 廣本正之, 佐藤高史
- Organizer
  電子情報通信学会ソサイエティ大会
- Place of Presentation
  北海道大学（北海道札幌市）
- Year and Date
  2016-09-20
- Data Source
  KAKENHI-PROJECT-26730027
[Presentation] Accelerating Random-Walk-based power grid analysis through error smoothing2015
- Author(s)
  Tsuyoshi Okazaki, Masayuki Hiromoto, and Takashi Sato
- Organizer
  The 19th workshop on synthesis and system integration of mixed information technologies (SASIMI)
- Place of Presentation
  礁渓, 台湾
- Year and Date
  2015-03-17
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] プロセッサのNBTI劣化緩和法における劣化抑止制御回路の置換箇所削減に関する一検討2015
- Author(s)
  森田　俊平, 辺　松, 新谷　道広, 廣本　正之, 佐藤　高史
- Organizer
  電子情報通信学会　ソサイエティ大会
- Place of Presentation
  東北大学　宮城県仙台市
- Year and Date
  2015-09-08
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] ばらつき考慮シミュレーションの最近の動向2015
- Author(s)
  佐藤　高史
- Organizer
  第28回回路とシステムワークショップ
- Place of Presentation
  淡路夢舞台国際会議場　兵庫県淡路市
- Year and Date
  2015-08-03
- Invited
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] 粒子フィルタを用いた運動時ノイズに頑健な心拍数推定アルゴリズム2015
- Author(s)
  藤田雄也, 廣本正之, 佐藤高史
- Organizer
  電子情報通信学会ソサイエティ大会
- Place of Presentation
  東北大学川内キャンパス　宮城県仙台市
- Year and Date
  2015-09-08
- Data Source
  KAKENHI-PROJECT-15K12700
[Presentation] 低電圧畳み込みニューラルネットワーク回路における演算誤り緩和に向けたプーリング手法の検討2015
- Author(s)
  氏家隆之, 大荷唯明, 廣本正之, 佐藤高史
- Organizer
  電子情報通信学会　ソサイエティ大会
- Place of Presentation
  東北大学　宮城県仙台市
- Year and Date
  2015-09-08
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] ニューラルネットワークハードウエアの低電圧動作時における演算誤り緩和2015
- Author(s)
  大荷　唯明、　廣本　正之、佐藤高史
- Organizer
  第28回回路とシステムワークショップ
- Place of Presentation
  淡路夢舞台国際会議場　兵庫県淡路市
- Year and Date
  2015-08-04
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] ECRIPSE: An efficient method for calculating RTN-induced failure probability of an SRAM cell2015
- Author(s)
  Hiromitsu Awano, Masayuki Hiromoto, and Takashi Sato
- Organizer
  Design, Automation & Test in Europe (DATE)
- Place of Presentation
  Grenoble, France
- Year and Date
  2015-03-11
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] Fast Monte Carlo for Timing Yield Estimation via Line Sampling2015
- Author(s)
  Hiromitsu Awano and Takashi Sato
- Organizer
  Workshop on variability modeling and characterization (VMC)
- Place of Presentation
  Austin, TX, USA
- Year and Date
  2015-11-06
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] RTN起因のリングオシレータ発振周波数変動を利用したPUF2015
- Author(s)
  吉永幹, 粟野皓光, 廣本正之, 佐藤高史
- Organizer
  電子情報通信学会技術研究報告
- Place of Presentation
  沖縄県青年会館, 沖縄県那覇市
- Year and Date
  2015-03-04
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] デバイス特性の経年劣化に起因する不良確率変化の効率的な解析手法2015
- Author(s)
  粟野皓光, 廣本正之, 佐藤高史
- Organizer
  情報処理学会　DAシンポジウム2015
- Place of Presentation
  山代温泉　ゆのくに天祥　石川県加賀市
- Year and Date
  2015-08-28
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] 粒子フィルタを用いた運動時ノイズに頑健な心拍数推定アルゴリズム2015
- Author(s)
  藤田雄也, 廣本正之, 佐藤高史
- Organizer
  電子情報通信学会　ソサイエティ大会
- Place of Presentation
  東北大学　宮城県仙台市
- Year and Date
  2015-09-08
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] モンテカルロ法に基づくタイミング歩留まり解析の高速化2015
- Author(s)
  粟野　皓光, 佐藤　高史
- Organizer
  デザインガイア2015　-VLSI設計の新しい大地-
- Place of Presentation
  長崎県勤労福祉会館　長崎県長崎市
- Year and Date
  2015-12-01
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] ニューラルネットワークハードウェアの低電圧動作時における演算誤り緩和2015
- Author(s)
  大荷唯明, 廣本正之, 佐藤高史
- Organizer
  第28回回路とシステムワークショップ
- Place of Presentation
  淡路夢舞台国際会議場（兵庫県淡路市）
- Year and Date
  2015-08-03
- Data Source
  KAKENHI-PROJECT-26730027
[Presentation] 命令セットアーキテクチャによる劣化抑止ゲート制御を用いたプロセッサNBTI劣化緩和手法2015
- Author(s)
  辺松, 新谷道広, Zheng Wang, 廣本正之, Anupam Chattopadhyay, 佐藤高史
- Organizer
  電子情報通信学会技術研究報告
- Place of Presentation
  沖縄県青年会館, 沖縄県那覇市
- Year and Date
  2015-03-03
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] Fast estimation on NBTI-induced delay degradation based on signal probability2015
- Author(s)
  Song Bian,Michihiro Shintani,Masayuki Hiromoto, Takashi Sato
- Organizer
  情報処理学会　DAシンポジウム2015
- Place of Presentation
  山代温泉　ゆのくに天祥　石川県加賀市
- Year and Date
  2015-08-28
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] A scalable device array for statistical device-aging characterization2015
- Author(s)
  Takashi Sato, Hiromitsu Awano, and Masayuki Hiromoto
- Organizer
  IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)
- Place of Presentation
  桂林, 中国
- Year and Date
  2015-03-04
- Invited
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] 圧縮センシング向けイメージセンサにおける省電力な観測行列生成回路2015
- Author(s)
  小西慧, 廣本正之, 佐藤高史
- Organizer
  第28回回路とシステムワークショップ
- Place of Presentation
  淡路夢舞台国際会議場兵庫県淡路市
- Year and Date
  2015-08-03
- Data Source
  KAKENHI-PROJECT-15K12700
[Presentation] 二次元イジングモデルによる最大カット問題の求解における収束の速いスピン更新方法の検討2015
- Author(s)
  業天　英, 廣本　正之, 佐藤　高史
- Organizer
  電子情報通信学会　ソサイエティ大会
- Place of Presentation
  東北大学　宮城県仙台市
- Year and Date
  2015-09-08
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] 圧縮センシング向けイメージセンサにおける省電力な観測行列生成回路2015
- Author(s)
  小西慧, 廣本正之, 佐藤高史
- Organizer
  第28回回路とシステムワークショップ
- Place of Presentation
  淡路夢舞台国際会議場　兵庫県淡路市
- Year and Date
  2015-08-04
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] 低電圧畳み込みニューラルネットワーク回路における演算誤り緩和に向けたプーリング手法の検討2015
- Author(s)
  氏家隆之, 大荷唯明, 廣本正之, 佐藤高史
- Organizer
  電子情報通信学会ソサイエティ大会
- Place of Presentation
  東北大学川内北キャンパス（宮城県仙台市）
- Year and Date
  2015-09-08
- Data Source
  KAKENHI-PROJECT-26730027
[Presentation] A Case Study of Chinese Calligraphic Style Classification using Deep Neural Network2014
- Author(s)
  Masayuki Hiromoto and Takashi Sato
- Organizer
  International Workshop on Smart Info-Media Systems in Asia
- Place of Presentation
  Ho Chi Minh City, Vietnam
- Year and Date
  2014-10-10
- Data Source
  KAKENHI-PROJECT-26730027
[Presentation] 高次元回路歩留まり解析高速化のための最急降下法を用いた不良領域探索2014
- Author(s)
  木村和紀, 廣本正之, 佐藤高史
- Organizer
  回路とシステムワークショップ
- Place of Presentation
  淡路国際会議場, 兵庫県淡路市
- Year and Date
  2014-08-05
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] Sensorless device-parameter estimation through fmax westing2014
- Author(s)
  Michihiro Shintani and Takashi Sato
- Organizer
  IEEE/ACM International Conference on Computer-Aided Design (ICCAD)
- Place of Presentation
  San Jose, CA, USA
- Year and Date
  2014-11-04
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] RTNを考慮したSRAM不良確率の高速計算2014
- Author(s)
  粟野皓光, 廣本正之, 佐藤高史
- Organizer
  電子情報通信学会技術研究報告（デザインガイア2014）
- Place of Presentation
  別府国際コンベンションセンター, 大分県別府市
- Year and Date
  2014-11-26
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] Variability in device degradations: statistical observation of NBTI for 3996 transistors2014
- Author(s)
  Hiromitsu Awano, Masayuki Hiromoto, and Takashi Sato
- Organizer
  The 44th Solid-State Device Research Conference (ESSDERC)
- Place of Presentation
  Venice, Italy
- Year and Date
  2014-09-24
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] ランダムテレグラフノイズを用いたチップ識別手法の一検討2014
- Author(s)
  吉永幹, 粟野皓光, 廣本正之, 佐藤高史
- Organizer
  電子情報通信学会ソサイエティ大会
- Place of Presentation
  徳島大学常三島キャンパス, 徳島県徳島市
- Year and Date
  2014-09-23
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] 3996 トランジスタにおけるNBTI劣化の統計的ばらつき2014
- Author(s)
  粟野皓光, 廣本正之, 佐藤高史
- Organizer
  情報処理学会DAシンポジウム
- Place of Presentation
  ホテル下呂温泉水明館, 岐阜県下呂市
- Year and Date
  2014-08-28
- Data Source
  KAKENHI-PROJECT-26280014
[Presentation] 低電圧起動回路を用いた省電力チップ間非接触通信回路2014
- Author(s)
  佐川善彦, 廣本正之, 佐藤高史, 越智裕之
- Organizer
  第166回システムとLSIの設計技術研究会
- Place of Presentation
  北九州国際会議場(福岡県)
- Year and Date
  2014-05-29
- Data Source
  KAKENHI-PROJECT-23300015
[Presentation] A Bayesian-Based Process Parameter Estimation using IDDQ Current Signature2013
- Author(s)
  Michihiro Shintani and Takashi Sato
- Organizer
  IEEE VLSI Test Symposium (VTS)
- Place of Presentation
  Hyatt Maui, Hawaii, USA
- Year and Date
  2013-04-23
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] オンラインテストを指向したIDDQ電流しきい値決定手法の検討2013
- Author(s)
  新谷道弘, 佐藤高史
- Organizer
  電子情報通信学会 VLSI設計技術研究会
- Place of Presentation
  沖縄青年会館，那覇市
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] Realization of frequency-domain circuit analysis through random walk2013
- Author(s)
  Tetsuro Miyakawa, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
- Organizer
  ACM/IEEE Asia and South Pacific Design Automation Conference (ASPDAC)
- Place of Presentation
  Pacifico Yokohama, Yokohama
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] Evaluation of dependent node selection of histogram propagation based statistical timing analysis2013
- Author(s)
  Shiyi Zhang, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
- Organizer
  電子情報通信学会総合大会
- Place of Presentation
  岐阜大学，岐阜市
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] Multi-Trap RTN Parameter Extraction Based on Bayesian Inference2013
- Author(s)
  Hiromitsu Awano, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
- Organizer
  International Symposium on Quality Electrical Design (ISQED) (Techmart Center
- Place of Presentation
  Santa Clara, USA
- Year and Date
  2013-03-06
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] Architecture for sealed wafer-scale mask ROM for long-term digital data preservation2013
- Author(s)
  Shinya Matsuda, Takashi Imagawa, Hiroshi Tsutsui, Takashi Sato, Yukihiro Nakamura, and Hiroyuki Ochi
- Organizer
  28th Intl. Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC)
- Place of Presentation
  Yeosu, (Korea)
- Year and Date
  2013-07-01
- Data Source
  KAKENHI-PROJECT-23300015
[Presentation] ランダムウォーク線形回路解析のスレッド並列化における電圧源化排他制御の検討2013
- Author(s)
  岡崎剛, 筒井弘, 越智裕之, 佐藤高史
- Organizer
  電子情報通信学会総合大会
- Place of Presentation
  岐阜大学，岐阜市
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] Multi-trap RTN parameter extraction based on Bayesian inference2013
- Author(s)
  Hiromitsu Awano, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
- Organizer
  International Symposium on Quality Electronic Design (ISQED)
- Place of Presentation
  Techmart Center, Santa Clara, USA
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] An Adaptive Current-Threshold Determination for IDDQ Testing Based on Bayesian Process Parameter Estimation2013
- Author(s)
  Michihiro Shintani and Takashi Sato
- Organizer
  ACM/IEEE Asia South Pacific Design Automation Conference (ASP-DAC)
- Place of Presentation
  Pacifico Yokohama, Yokohama, Japan
- Year and Date
  2013-01-25
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] 回路構造の異なるラッチの消費エネルギーの比較2013
- Author(s)
  藤田隆史, 筒井弘, 越智裕之, 佐藤高史
- Organizer
  電子情報通信学会総合大会
- Place of Presentation
  岐阜大学，岐阜市
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] Evaluation of dependent node selection of histogram propagation based statistical timing analysis2013
- Author(s)
  Shiyi Zhang, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
- Organizer
  電子情報通信学会総合大会
- Place of Presentation
  岐阜大学,岐阜市
- Year and Date
  2013-03-19
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] An Adaptive Current-Threshold Determination for IDDQ Testing Based on Bayesian Process Parameter Estimation2013
- Author(s)
  Michihiro Shintani and Takashi Sato
- Organizer
  ACM/IEEE Asia and South Pacific Design Automation Conference (ASPDAC)
- Place of Presentation
  Pacifico Yokohama, Yokohama
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] 回路構造の異なるラッチの消費エネルギーの比較2013
- Author(s)
  藤田隆史, 筒井弘, 越智裕之, 佐藤高史
- Organizer
  電子情報通信学会総合大会
- Place of Presentation
  岐阜大学,岐阜市
- Year and Date
  2013-03-19
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] GPU Acceleration of Cycle-Based Soft-Error Simulation for Reconfigurable Array Architectures2012
- Author(s)
  Takashi Imagawa, Takahiro Oue, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato
- Organizer
  the 17th Workshop on Synthesis And System Integration of Mixed Information technologies (SASIMI2012)
- Place of Presentation
  B-con Plaza, Beppu, Oita, Japan
- Year and Date
  2012-03-08
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] A Bayesian-based process parameter estimation using IDDQ current signature2012
- Author(s)
  Michihiro Shintani and Takashi Sato
- Organizer
  IEEE VLSI test symposium (VTS)
- Place of Presentation
  Hyatt Maui, Hawaii, USA
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] 情報量規準を用いる RTN モデルパラメータ推定の自動化2012
- Author(s)
  清水裕史, 筒井弘, 越智裕之, 佐藤高史
- Organizer
  DA シンポジウム
- Place of Presentation
  ホテル下呂温泉水明館，下呂市
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] IDDQ電流による大域プロセスばらつきの推定手法2012
- Author(s)
  新谷道広, 佐藤高史
- Organizer
  VLSI設計技術研究会(VLD)
- Place of Presentation
  ビーコンプラザ(大分県)
- Year and Date
  2012-03-06
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] プロセスばらつき推定に基づくIDDQテスト良品判定基準決定の試み2012
- Author(s)
  新谷道広, 佐藤高史
- Organizer
  電子情報通信学会技術研究報告(ディペンダブルコンピューティング研究会)
- Place of Presentation
  機械振興会館(東京都)
- Year and Date
  2012-02-13
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] Physics matters: statistical aging prediction under trapping/detrapping2012
- Author(s)
  Jyothi B. Velamala, Ketul B. Sutaria, Takashi Sato, and Yu Cao
- Organizer
  ACM/IEEE Design Automation Conference (DAC)
- Place of Presentation
  Moscone Center, San Francisco, USA
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] Aging Statistics Based on Trapping/detrapping: Silicon Evidence, Modeling and Prediction2012
- Author(s)
  Jyothi B. Velamala, Ketul B. Sutaria, Takashi Sato, and Yu Cao
- Organizer
  IEEE International Reliability Physics Symposium
- Place of Presentation
  Hyatt Regency Orange County, Anaheim, USA
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] クリロフ部分空間法を用いた電源回路網解析の GPU 実装による高速化2012
- Author(s)
  森下拓海, 筒井弘, 越智裕之, 佐藤高史
- Organizer
  回路とシステムワークショップ
- Place of Presentation
  淡路夢舞台国際会議場，淡路市
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] Aging statistics based on trapping/detrapping: silicon evidence, modeling and long-term prediction2012
- Author(s)
  Jyothi B. Velamala, Ketul B. Sutaria, Takashi Sato, and Yu Cao
- Organizer
  IEEE International Reliability Physics Symposium (IRPS)
- Place of Presentation
  Hyatt Regency Orange County, Anaheim, USA
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] チップ試作による最小動作電圧予測手法の評価2012
- Author(s)
  川島潤也, 筒井弘, 越智裕之, 佐藤高史
- Organizer
  電子情報通信学会 ICD研究会
- Place of Presentation
  東京工業大学大岡山キャンパス東工大大蔵前会館ロイアルブルーホール,東京都
- Year and Date
  2012-12-17
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] Accurate I/O Buffer Impedance Self-Adjustment using Vth and Temperature Sensors2012
- Author(s)
  Zhi Li, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
- Organizer
  デザインガイア
- Place of Presentation
  九州大学医学部百年講堂，福岡市
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] 回路の最小動作電圧改善とその予測精度向上の一検討2012
- Author(s)
  川島潤也, 越智裕之, 筒井弘, 佐藤高史
- Organizer
  回路とシステムワークショップ
- Place of Presentation
  淡路夢舞台国際会議場，淡路市
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] 情報量規準を用いるRTNモデルパラメータ推定の自動化2012
- Author(s)
  清水裕史, 筒井弘, 越智裕之, 佐藤高史
- Organizer
  DAシンポジウム
- Place of Presentation
  ホテル下呂温泉水明館,下呂市
- Year and Date
  2012-08-29
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] Hardware Architecture for Accelerating Monte Carlo Based SSTA using Generalized STA Processing Element2012
- Author(s)
  Hiroshi Yuasa, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato
- Organizer
  the 17th Workshop on Synthesis And System Integration of Mixed Information technologies (SASIMI2012)
- Place of Presentation
  B-con Plaza, Beppu, Oita, Japan
- Year and Date
  2012-03-08
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] Acceleration Scheme for Monte Carlo Based SSTA using Generalized STA Processing Element2012
- Author(s)
  Hiroshi Yuasa, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato
- Organizer
  ACM/IEEE International Workshop on Timing Issues (TAU)
- Place of Presentation
  Taipei, Taiwan
- Year and Date
  2012-01-18
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] Statistical Aging under dynamic voltage scaling: A logarithmic model approach2012
- Author(s)
  Jyothi Bhaskarr Velamala, Ketul B. Sutaria, Hirofumi Shimizu, Hiromitsu Awano, Takashi Sato and Yu Cao
- Organizer
  IEEE Custom Integrated Circuits Conference (CICC)
- Place of Presentation
  DoubleTree Hotel San Jose, San Jose, USA
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] Statistical Aging Under Dynamic Voltage Scaling: a Logarithmic Model Approach2012
- Author(s)
  Jyothi Bhaskarr Velamala, Ketul B. Sutaria, Hirofumi Shimizu, Hiromitsu Awano, Takashi Sato, and Yu Cao
- Organizer
  IEEE Custom Integrated Circuits Conference (CICC)
- Place of Presentation
  DoubleTree Hotel, San Jose, USA
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] Acceleration Scheme for Monte Carlo Based SSTA using Generalized STA Processing Element2012
- Author(s)
  Hiroshi Yuasa, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
- Organizer
  ACM/IEEE International Workshop on Timing Issues (TAU)
- Place of Presentation
  National Taiwan University, Taipei, Taiwan
- Year and Date
  2012-01-18
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] Statistical Observations of NBTI-Induced Threshold Voltage Shifts on Small Channel-Area Devices2012
- Author(s)
  Takashi Sato, Hiromitsu Awano, Hirofumi Shimizu, Hiroshi Tsutsui, Hiroyuki Ochi
- Organizer
  International Symposium on Quality Electrical Design (ISQED)
- Place of Presentation
  Santa Clara, CA USA
- Year and Date
  2012-03-20
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] 回路の最小動作電圧改善とその予測精度向上の一検討2012
- Author(s)
  川島潤也, 越智裕之, 筒井弘, 佐藤高史
- Organizer
  第25回回路とシステムワークショップ
- Place of Presentation
  淡路夢舞台国際会議場,淡路市
- Year and Date
  2012-07-31
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] Physics Matters: Statistical Aging Prediction Under Trapping/detrapping2012
- Author(s)
  Jyothi B. Velamala, Ketul B. Sutaria, Takashi Sato, and Yu Cao
- Organizer
  ACM/IEEE Design Automation Conference (DAC)
- Place of Presentation
  Moscone Center, San Francisco, USA
- Year and Date
  2012-06-05
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] Accurate I/O Buffer Impedance Self-Adjustment using Vth and Temperature Sensors2012
- Author(s)
  Zhi Li, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
- Organizer
  デザインガイア
- Place of Presentation
  九州大学医学部百年講堂,福岡市
- Year and Date
  2012-11-27
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] チップ試作による最小動作電圧予測手法の評価2012
- Author(s)
  川島潤也, 筒井弘, 越智裕之, 佐藤高史
- Organizer
  電子情報通信学会 ICD研究会
- Place of Presentation
  東京工業大学大岡山キャンパス東工大蔵前会館ロイアルブルーホール，東京都
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] A Stress-Parallelized Device Array for Efficient Bias-Temperature Stability Measurements2011
- Author(s)
  Takashi Sato, Tadamichi Kozaki, Takumi Uezono, Hiroshi Tsutsui, and Hiroyuki Ochi
- Organizer
  IEEE International Workshop on Design for Manufacturability and Yield 2011(DFM&Y)
- Place of Presentation
  San Diego Convention Center, San Diego, USA
- Year and Date
  2011-06-06
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] Statistical Aging Prediction and Characterization using Trapping/detrapping Based NBTI Models2011
- Author(s)
  Jyothi Bhaskarr Velamala, Takashi Sato, and Yu Cao
- Organizer
  Workshop on Variability Modeling and Characterization (VMC)
- Place of Presentation
  DoubleTree Hotel, San Jose, USA
- Year and Date
  2011-11-10
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] A Device Array for Efficient Bias-Temperature Instability Measurements2011
- Author(s)
  Takashi Sato, Tadamichi Kozaki, Takumi Uezono, Hiroshi Tsutsui, Hiroyuki Ochi
- Organizer
  European Solid-State Device Research Conference (ESSDERC)
- Place of Presentation
  Helsinki, Finland
- Year and Date
  2011-09-13
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] ヤコビ法を用いた電源回路網解析のGPU実装2011
- Author(s)
  森下拓海, 筒井弘, 越智裕之, 佐藤高史
- Organizer
  電子情報通信学会ソサイエティ大会
- Place of Presentation
  北海道大学,札幌キャンパス
- Year and Date
  2011-09-15
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] Getting the Most Out of IDDQ Testing2011
- Author(s)
  Michihiro Shintani, Takashi Sato
- Organizer
  Workshop on Variability Modeling and Characterization (VMC)
- Place of Presentation
  San Jose, CA USA
- Year and Date
  2011-11-10
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] A Stress-Parallelized Device Array for Efficient Bias-Temperature Stability Measurement2011
- Author(s)
  Takashi Sato, Tadamichi Kozaki, Takumi Uezono, Hiroshi Tsutsui, Hiroyuki Ochi
- Organizer
  IEEE International Workshop on Design for Manufacturability and Yield 2011 (DFM&Y)
- Place of Presentation
  San Diego, California, USA
- Year and Date
  2011-06-06
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] ブロック反復法による電源回路網解析の高速化2011
- Author(s)
  森下拓海, 筒井弘, 越智裕之, 佐藤高史
- Organizer
  電子情報通信学会技術研究報告(デザインガイア2011-VLSI設計の新しい大地-)
- Place of Presentation
  ニューウェルシティ宮崎(宮崎県)
- Year and Date
  2011-11-28
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] A fully pipelined implementation of Monte Carlo based SSTA on FPGAs2011
- Author(s)
  Hiroshi Yuasa, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
- Organizer
  International Symposium on Quality Electrical Design (ISQED)
- Place of Presentation
  Techmart Center, Santa Clara, USA
- Year and Date
  2011-03-16
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] エネルギー最小化と動作保証を考慮したサブスレッショルド回路の設計指針の検討2011
- Author(s)
  川島潤也, 越智裕之, 筒井弘, 佐藤高史
- Organizer
  第24回回路とシステムワークショップ
- Place of Presentation
  淡路夢舞台国際会議場(兵庫県)
- Year and Date
  2011-08-02
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] A Device Array for Efficient Bias-Temperature Instability Measurements2011
- Author(s)
  Takashi Sato, Tadamichi Kozaki, Takumi Uezono, Hiroshi Tsutsui, a nd Hiroyuki Ochi
- Organizer
  European Solid-State Device Research Conference (ESSDERC)
- Place of Presentation
  Finlandia Hall, Helsinki, Finland
- Year and Date
  2011-09-13
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] ランダムテレグラフノイズモデル化のためのパラメータ推定法の検討2011
- Author(s)
  粟野皓光, 清水裕史, 筒井弘, 越智裕之, 佐藤高史
- Organizer
  電子情報通信学会技術研究報告(デザインガイア2011-VLSI設計の新しい大地-)
- Place of Presentation
  ニューウェルシティ宮崎(宮崎県)
- Year and Date
  2011-11-28
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] 混合正規分布による重点的サンプリングの高次元ばらつき解析への適用2011
- Author(s)
  萩原汐, 伊達貴徳, 上薗巧, 益一哉, 佐藤高史
- Organizer
  情報処理学会第148回システムLSI設計技術研究会
- Place of Presentation
  沖縄県宮古島
- Year and Date
  2011-03-18
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] EM法によるMOSデバイス界面状態数の自動推定2011
- Author(s)
  清水裕史, 筒井弘, 越智裕之, 佐藤高史
- Organizer
  電子情報通信学会ソサイエティ大会
- Place of Presentation
  北海道大学,札幌キャンパス
- Year and Date
  2011-09-13
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] 複数不良領域を持つ回路歩留まり解析のための逐次重点的サンプリング法2011
- Author(s)
  片山健太朗, 筒井弘, 越智裕之, 佐藤高史
- Organizer
  情報処理学会DAシンポジウム2011
- Place of Presentation
  ホテル下呂温泉水明館(岐阜県)
- Year and Date
  2011-08-31
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] ゼロ分散推定重点的サンプリングを用いたランダムウォークによる線形回路の過渡解析2011
- Author(s)
  宮川哲朗, 筒井弘, 越智裕之, 佐藤高史
- Organizer
  電子情報通信学会技術研究報告(デザインガイア2011-VLSI設計の新しい大地-)
- Place of Presentation
  ニューウェルシティ宮崎(宮崎県)
- Year and Date
  2011-11-28
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] Statistical Aging Prediction and Characterization using Trapping/detrapping Based NBTI Models2011
- Author(s)
  Jyothi Bhaskarr Velamala, Takashi Sato, Yu Cao
- Organizer
  Workshop on Variability Modeling and Characterization (VMC)
- Place of Presentation
  San Jose, CA USA
- Year and Date
  2011-11-10
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] A transistor-array for parallel BTI-effects measurements2011
- Author(s)
  Takumi Uezono, Tadamichi Kozaki, Hiroyuki Ochi, Takashi Sato
- Organizer
  Workshop on variability modeling and characterization (VMC)
- Place of Presentation
  San Jose, USA
- Year and Date
  2011-11-11
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] A Design Strategy for Sub-Threshold Circuits Considering Energy-Minimization and Yield-Maximization2011
- Author(s)
  Junya Kawashima, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato
- Organizer
  IEEE International SOC Conference (SOCC)
- Place of Presentation
  Taipei, Taiwan
- Year and Date
  2011-09-26
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] A Design Strategy for Sub-Threshold Circuits Considering Energy-Minimization and Yield-Maximization2011
- Author(s)
  Junya Kawashima, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
- Organizer
  IEEE International SOC Conference (SOCC)
- Place of Presentation
  Grand Hotel, Taipei, Taiwan
- Year and Date
  2011-09-26
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] A fully pipelined implementation of Monte Carlo based SSTA on FPGAs2011
- Author(s)
  Hiroshi Yuasa, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato
- Organizer
  International Symposium on Quality Electrical Design (ISQED)
- Place of Presentation
  Santa Clara, USA
- Year and Date
  2011-03-16
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] Acceleration of Random-Walk-Based Linear Circuit Analysis using Importance Sampling2011
- Author(s)
  Tetsuro Miyakawa, Koh Yamanaga, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato
- Organizer
  GLSVLSI 2011
- Place of Presentation
  Lausanne, Switzerland
- Year and Date
  2011-05-04
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] A Sensor-Based Self-Adjustment Approach for Controlling I/O Buffer Impedance2011
- Author(s)
  Zhi Li, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato
- Organizer
  IEICE Society Conference
- Place of Presentation
  Hokkaido University, Sapporo Campus
- Year and Date
  2011-09-15
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] エネルギー最小化と動作保証を考慮したサブスレッショルド回路の設計指針の検討2011
- Author(s)
  川島潤也, 越智裕之, 筒井弘, 佐藤高史
- Organizer
  第24回回路とシステムワークショップ
- Place of Presentation
  淡路夢舞台国際会議場,淡路市
- Year and Date
  2011-08-02
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] EM法によるMOSデバイス界面状態数の自動推定2011
- Author(s)
  清水裕史, 筒井弘, 越智裕之, 佐藤高史
- Organizer
  電子情報通信学会ソサイエティ大会
- Place of Presentation
  北海道大学,札幌市
- Year and Date
  2011-09-13
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] 配線資源の信頼性モデルを用いた粗粒度再構成可能アーキテクチャ向け選択的三重化の最適化手法2011
- Author(s)
  今川隆司, 湯浅洋史, 筒井弘, 越智裕之, 佐藤高史
- Organizer
  情報処理学会DAシンポジウム2011
- Place of Presentation
  ホテル下呂温泉水明館(岐阜県)
- Year and Date
  2011-09-01
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] A transistor-array for parallel BTI-effects measurements2010
- Author(s)
  Takumi Uezono, Tadamichi Kozaki, Hiroyuki Ochi, and Takashi Sato
- Organizer
  Workshop on Variability Modeling and Characterization (VMC)
- Place of Presentation
  DoubleTreeHotel, San Jose, USA
- Year and Date
  2010-11-11
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] リングオシレータによるしきい値簡易測定の温度依存性の検討2010
- Author(s)
  上薗巧, 越智裕之, 佐藤高史
- Organizer
  電子情報通信学会 VLSI設計技術研究会(VLD)
- Place of Presentation
  京都府京都工芸繊維大学
- Year and Date
  2010-09-28
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] 超球の一部を用いた歩留り推定における不良領域の効率的探索手法2010
- Author(s)
  伊達貴徳, 萩原汐, 益一哉, 佐藤高史
- Organizer
  VLSI設計技術研究会, 電子情報通信学会技術研究報告
- Place of Presentation
  沖縄, 日本
- Year and Date
  2010-02-10
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] Sequential importance sampling for low-probability and high-dimensional SRAM yield analysis2010
- Author(s)
  Kentaro Katayama, Shiho Hagiwara, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato
- Organizer
  ACM/IEEE International Conference on Computer-Aided Design (ICCAD)
- Place of Presentation
  San Jose, USA
- Year and Date
  2010-11-11
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] Decomposition of drain-current variation into gain-factor and threshold voltage variations2010
- Author(s)
  Takashi Sato, Takumi Uezono, Noriaki Nakayama, Kazuya Masu
- Organizer
  IEEE International Symposium on Circuits and Systems (ISCAS)
- Place of Presentation
  Paris, France
- Year and Date
  2010-05-31
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] Path clustering for adaptive test2010
- Author(s)
  Takumi Uezono, Tomoyuki Takahashi, Michihiro Shintani, Kazumi Hatayama, Kazuya Masu, Hiroyuki Ochi, Takashi Sato
- Organizer
  IEEE VLSI test symposium (VTS)
- Place of Presentation
  Santa Cruz, USA
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] Linear Time Calculation of State-Dependent Power Distribution Network Capacitance2010
- Author(s)
  Shiho Hagiwara, Koh Yamanaga, Ryo Takahashi, Kazuya Masu, Takashi Sato
- Organizer
  International Symposium on Quality Electronic Design (ISQED)
- Place of Presentation
  San Jose, USA
- Year and Date
  2010-03-23
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] Linear Time Calculation of State-Dependent Power Distribution Network Capacitance2010
- Author(s)
  Shiho Hagiwara, Koh Yamanaga, Ryo Takahashi, Kazuya Masu, Takashi Sato
- Organizer
  International Symposium on Quality Electronic Design(ISQED)
- Place of Presentation
  San Jose, USA
- Year and Date
  2010-03-23
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] Small delay and area overhead process parameter estimation through path-delay inequalities2010
- Author(s)
  Takumi Uezono, Tomoyuki Takahashi, Michihiro Shintani, Kazumi Hatayama, Kazuya Masu, Hiroyuki Ochi, Takashi Sato
- Organizer
  IEEE International Symposium on Circuits and Systems (ISCAS)
- Place of Presentation
  Paris, France
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] A routing architecture exploration for coarse-grained reconfigurable architecture with an automation of SEU-tolerance evaluation2010
- Author(s)
  Takashi Imagawa, Masayuki Hiromoto, Hiroyuki Ochi, Takashi Sato
- Organizer
  23rd IEEE International SOC Conference (SOCC)
- Place of Presentation
  Las Vegas, USA
- Year and Date
  2010-09-28
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] Robust importance sampling for efficient SRAM yield analysis2010
- Author(s)
  伊達貴徳, 萩原汐, 益一哉, 佐藤高史
- Organizer
  International Symposium on Quality Electronic Design(ISQED)
- Place of Presentation
  San Jose, USA
- Year and Date
  2010-03-23
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] A tool chain for generating SEU-vulnerability map for coarse-grained reconfigurable architecture2010
- Author(s)
  Takashi Imagawa, Masayuki Hiromoto, Hiroyuki Ochi, Takashi Sato
- Organizer
  The 25th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC)
- Place of Presentation
  Bangkok, Thai
- Year and Date
  2010-07-06
- Data Source
  KAKENHI-PROJECT-22360143
[Presentation] On-die parameter extraction from path-delay measurements2009
- Author(s)
  Tomoyuki Takahashi, Takumi Uezono, Michihiro Shintani, Kazuya Masu, Takashi Sato
- Organizer
  2009 IEEE Asian Solid-State Circuits Conference
- Place of Presentation
  Taipei, Taiwan
- Year and Date
  2009-11-17
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] S-parameter-based modal decomposition of multiconductor transmission lines and its application to de-embedding2009
- Author(s)
  S. Amakawa, K. Yamanaga, H. Ito, T. Sato, N. Ishihara, K. Masu
- Organizer
  International Conference on Microelectronic Test Structures (ICMTS)
- Place of Presentation
  Oxnard, California
- Year and Date
  2009-04-01
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] An Adaptive Test for Parametric Faults Based on Statistical Timing Information2009
- Author(s)
  Michihiro Shintani, Takumi Uezono, Tomoyuki Takahashi, Hiroyuki Ueyama, Takashi Sato, Kazumi Hatayama, Takashi Aikyo, Kazuya Masu
- Organizer
  IEEE Asian Test Symposium
- Place of Presentation
  Taichung, Taiwan
- Year and Date
  2009-11-24
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] パス遅延測定によるチップ特性の推定手法2009
- Author(s)
  高橋知之, 上薗巧, 越智裕之, 益一哉, 佐藤高史
- Organizer
  DAシンポジウム
- Place of Presentation
  石川, 日本
- Year and Date
  2009-08-27
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] Two-Dimentional Moment Method for Analyzing Current Distribution of a Ceramic Capacitor2009
- Author(s)
  K.Yamanaga, S.Amakawa, T.Sato, K.Masu
- Organizer
  2009 International Symposium on Electromagnetic Comptibility
- Place of Presentation
  Kyoto, Japan
- Year and Date
  2009-07-27
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] S-parameter-based modal decomposition of multiconductor transmission lines and its application to de-embedding2009
- Author(s)
  S.Amakawa, K.Yamanaga, H.Ito, T.Sato, N.Ishihara, K.Masu
- Organizer
  International Conference on Microelectronic Test Structures(ICMTS)
- Place of Presentation
  Oxnard, California
- Year and Date
  2009-04-01
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] SRAM回路の構造的対称性を考慮した2段階学習型重点的サンプリング2009
- Author(s)
  伊達貴徳, 萩原汐, 上薗巧, 佐藤高史, 益一哉
- Organizer
  VLSI設計技術研究会システム設計及び一般
- Place of Presentation
  福岡, 日本
- Year and Date
  2009-05-21
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] 電源遮断回路におけるインバータ列遅延時間ばらつきの計算2008
- Author(s)
  萩原汐, 佐藤高史, 益一哉
- Organizer
  電子情報通信学会総合大会
- Place of Presentation
  九州学術研究都市
- Year and Date
  2008-03-19
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] A MOS transistor array with pico-ampere order precision for accurate characterization of leakage current variation2008
- Author(s)
  Takashi Sato, Hiroyuki Ueyama, Noriaki Nakayama, and Kazuya Masu
- Organizer
  A MOS transistor array with pico-ampere order precision for accurate characterization of leakage current variation
- Place of Presentation
  Fukuoka,Japan
- Year and Date
  2008-11-05
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] プロセスばらつきの積極的活用による非繰返し電圧波形の測定2008
- Author(s)
  上薗巧, 佐藤高史, 益一哉
- Organizer
  第21回回路とシステム軽井沢ワークショップ, pp. 439-444
- Place of Presentation
  軽井沢
- Year and Date
  2008-04-22
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] リーク電流測定用トランジスタアレイ回路の測定2008
- Author(s)
  植山寛之, 佐藤高史, 中山範明, 益一哉
- Organizer
  電子情報通信学会総合大会
- Place of Presentation
  九州学術研究都市
- Year and Date
  2008-03-19
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] Small-Area CMOS RF Distributed Mixer Using Multi-Port Inductors2008
- Author(s)
  Susumu, Sadoshima, Satoshi, Fukuda, Tackya, Yammouch, Hiroyuki, Ito, Kenichi, Okada, Kazuya, Masu
- Organizer
  IEEE/ACM Asia and South Pacific Design Automation Conference (University LSI Design Contest)
- Place of Presentation
  Seoul, Korea
- Year and Date
  2008-01-22
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] A MOS transistor array with pico-ampere order precision for accurate characterization of leakage current variation2008
- Author(s)
  Takashi Sato, Hiroyuki Ueyama, Noriaki Nakayama, and Kazuya Masu
- Organizer
  IEEE Asian solid-state circuit conference(ASSCC), pp.389-392
- Place of Presentation
  Fukuoka
- Year and Date
  2008-11-25
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] "Non-invasive direct probing for on-chip voltage measurement2008
- Author(s)
  Takashi Sato, Koh Yamanaga, and Kazuya Masu
- Organizer
  International SoC design conference (ISOCC)
- Place of Presentation
  International SoC design conference (ISOCC)
- Year and Date
  2008-11-25
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] A MOS transis0or array with pico-ampere order precision for accurate characterization of leakage current variation2008
- Author(s)
  Takashi Sato, Hiroyuki Ueyama, Noriaki Nakayama, Kazuya Masu
- Organizer
  IEEE Asian Solid-State Circuits Conference (A-SSCC)
- Year and Date
  2008-11-05
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] 閾値電圧の大域ばらつきが回路遅延ばらつきに与える影響」,Sep 3.2007.2007
- Author(s)
  植山寛之, 佐藤高史, 中山範明, 益一哉
- Organizer
  STARCシンポジウム
- Place of Presentation
  大阪
- Year and Date
  2007-09-03
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] Weakness identification for effective repair of power distribution network, Sweden2007
- Author(s)
  T. Sato, S. Hagiwara, T. Uezono, and K. Masu
- Organizer
  17th International workshop on power and timing modeling, optimization and simulation(PATMOS)
- Place of Presentation
  Goteborg, Sweden
- Year and Date
  2007-09-04
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] Adaptable wire-length distribution with tunable occupation probability2007
- Author(s)
  Shuhei Amakawa, Takumi Uezono, Takashi Sato, Kenichi Okada, Kazuya Masu
- Organizer
  International Workshop on System Level Interconnect Prediction (SLIP)
- Place of Presentation
  Austin, Texas
- Year and Date
  2007-03-17
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] Improvement of power distribution network using correlation-based regression analysis2007
- Author(s)
  Shiho, Hagiwara, Takumi, Uezono, Takashi, Sato, Kazuya, Masu
- Organizer
  Great Lakes Symposium on VLSI (GLSVLSI)
- Place of Presentation
  Stresa-Lago Maggiore, Italy
- Year and Date
  2007-03-13
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] A Multi-Drop Transmission-Line Interconnect in Si LSI2007
- Author(s)
  J. Seita, H. Ito, K. Okada, T. Sato, and K. Masu
- Organizer
  Asia and South Pacific Design Automation Conference(ASP-DAC)
- Place of Presentation
  Yokohama, Japan
- Year and Date
  2007-01-24
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] Weakness identification for effective repair of power distribution network2007
- Author(s)
  Takashi, Sato, Shiho, Hagiwara, Takumi, Uezono, Kazuya, Masu
- Organizer
  17th International workshop on power and timing modeling, optimization and simulation (PATMOS)
- Place of Presentation
  Goteborg, Sweden
- Year and Date
  2007-09-04
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] Reconfigurable CMOS Low Noise Amplifier Using Variable Bias Circuit for Self Compensation2007
- Author(s)
  Satoshi, Fukuda, Daisuke, Kawazoe, Kenichi, Okada, Kazuya, Masu
- Organizer
  Asia and South Pacific Design Automation Conference
- Place of Presentation
  Yokohama, Japan
- Year and Date
  2007-01-24
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] A Multi-Drop Transmission-Line Interconnect in Si LSI2007
- Author(s)
  Junki, Seita, Hiroyuki, Ito, Kenichi, Okada, Takashi, Sato, Kazuya, Masu
- Organizer
  Asia and South Pacific Design Automation Conference
- Place of Presentation
  Yokohama, Japan
- Year and Date
  2007-01-24
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] Wafer-level-packaging inductor with extremely high quality factor and its application to 5.8GHz LC-type voltage controlled oscillator2007
- Author(s)
  H. Hatakeyama, K. Okada, K. Ohashi, Y. Ito, N. Ozawa, M. Sato, T. Aizawa, T. Ito, R. Yamauchi, and K. Masu
- Organizer
  Advanced Metallization Conference(AMC)
- Place of Presentation
  Albany, New York, USA
- Year and Date
  2007-10-09
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] A MOS transistor-array for accurate measurement of subthreshold leakage variation2007
- Author(s)
  Takashi, Sato, Takumi, Uezono, Shiho, Hagiwara, Kemchi, Okada, Shuhei, Amakawa, Noriaki, Nakayama, Kazuya, Masu
- Organizer
  International Symposium on Quality Electronic Design (ISQED)
- Place of Presentation
  San Jose, California
- Year and Date
  2007-03-27
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] A 5.2GHz CMOS Low Noise Amplifier with High-Q Inductors Embedded in Wafer-Level Chip-Scale Package2007
- Author(s)
  S. Fukuda, H. Ito, K. Itoi, M. Sato, Tatsuya Ito, R. Yamauchi, K. Okada, and K. Masu
- Organizer
  International WorkS.p on RF Integration Technology (RFIT)
- Place of Presentation
  Singapore
- Year and Date
  2007-12-10
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] Wafer-level-packaging inductor with extremely high quality factor and its application to 5.8GHz LC-type voltage controlled oscillator,", pp.108-109, Tokyo,2007
- Author(s)
  H. Hatakeyama, K. Okada, K. Ohashi, Y. Ito, N. Ozawa, M. Sato, T. Aizawa, Tatsuya Ito, R. Yamauchi, and K. Masu
- Organizer
  Advanced Metallization Conference (AMC) Advanced Metallization Conference, Asian Session (ADMETA)
- Place of Presentation
  Albany, New York, USA Tokyo, Japan
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] Improvement of power distribution network using correlation-based regression analysis2007
- Author(s)
  S. Hagiwara, T. Uezono, T. Sato, and K. Masu
- Organizer
  Great Lakes Symposium on VLSI(GLSVLSI)
- Place of Presentation
  Stresa-Lago Maggiore, Italy
- Year and Date
  2007-03-13
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] 電源電圧降下の時間的・空間的広がり可視化回路2007
- Author(s)
  上薗巧, 佐藤高史, 益一哉
- Organizer
  VDECデザイナーフォーラム
- Place of Presentation
  しんしのつ温泉
- Year and Date
  2007-09-17
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] A Low-Power Low-Phase-Noise CMOS VCO using RF SiP Technology2007
- Author(s)
  K. Ohashi, Y. Ito, H. Ito, K. Okada, H. Hatakeyama, N. Ozawa, M. Sato, T. Aizawa, T. Ito, R. Yamauchi, and K. Masu
- Organizer
  Asia-Pacific Microwave Conference (APMC)
- Place of Presentation
  Bangkok, Thailand
- Year and Date
  2007-12-14
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] A 5.2GHz CMOS Low Noise Amplifier with High-Q Inductors Embedded in Wafer-Level Chip-Scale Package2007
- Author(s)
  S. Fukuda, H. Ito, K. Itoi, M. Sato, T. Ito, R. Yamauchi, K. Okada, and K. Masu
- Organizer
  International Workshop on RF Integration Technology(RFIT)
- Place of Presentation
  Singapore
- Year and Date
  2007-12-10
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] Adaptable wire-length distribution with tunable occupation probability2007
- Author(s)
  Shuhei, Amakawa, Takumi, Uezono, Takashi, Sato, Kenichi, Okada, Kazuya, Masu
- Organizer
  International Workshop on System Level Interconnect Prediction (SLIP)
- Place of Presentation
  Austin, Texas
- Year and Date
  2007-03-17
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] "Adaptable wire-length distribution with tunable occupation probability2007
- Author(s)
  S. Amakawa, T. Uezono, T. Sato, K. Okada, and K. Masu
- Organizer
  International Workshop on System Level Interconnect Prediction(SLIP)
- Place of Presentation
  Austin, Texas
- Year and Date
  2007-03-17
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] A Low-Power Low-Phase-Noise CMOS VCO using RF SiP Technology2007
- Author(s)
  K. Ohashi, Y. Ito, H. Ito, K. Okada, H. Hatakeyama, N. Ozawa, M. Sato, T. Aizawa, T. Ito, R. Yamauchi, and K. Masu
- Organizer
  Asia-Pacific Microwave Conference(APMC)
- Place of Presentation
  Bangkok, Thailand
- Year and Date
  2007-12-14
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] 相関係数にもとづく回帰分析の電源改善への適用2007
- Author(s)
  萩原汐, 上薗巧, 佐藤高史, 益一哉
- Organizer
  第20回回路とシステム軽井沢ワークショップ
- Place of Presentation
  軽井沢
- Year and Date
  2007-04-23
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] Weakness identification for effective repair of power distribution network2007
- Author(s)
  T. Sato, S. Hagiwara, T. Uezono, and K. Masu
- Organizer
  17th International workS.p on power and timing modeling, optimization and simulation (PATMOS),
- Place of Presentation
  Goteborg, Sweden
- Year and Date
  2007-09-04
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] Wafer-level-packaging inductor with extremely high quality factor and its application to 5.8GHz LC-type voltage controlled oscillator2007
- Author(s)
  Hideki, Hatakeyama, Kenichi, Okada, Kazuma, Ohashi, Yusaku, Ito, Naoyuki, Ozawa, Masakazu, Sato, Takuya, Aizawa, Tatsuya, Ito, Ryozo, Yamauchi, Kazuya, Masu
- Organizer
  Advanced Metallization Conference (AMC)
- Place of Presentation
  Albany, New York
- Year and Date
  2007-10-09
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] Wafer-level-packaging inductor with extremely high quality factor and its application to 5.8GHz LC-type voltage controlled oscillator2007
- Author(s)
  Hideki, Hatakeyama, Kenichi, Okada, Kazuma, Ohashi, Yusaku, Ito, Naoyuki, Ozawa, Masakazu, Sato, Takuya, Aizawa, Tatsuya, Ito, Ryozo, Yamauchi, Kazuya, Masu
- Organizer
  Advanced Metallization Conference, Asian Session (ADMETA)
- Place of Presentation
  Tokyo
- Year and Date
  2007-10-24
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] Wafer-level-packaging inductor with extremely high quality factor and its application to 5.8 GHz LC-type voltage controlled oscillator,", pp. 108-109, Tokyo,2007
- Author(s)
  H. Hatakeyama, K. Okada, K. Ohashi, Y. Ito, N. Ozawa, M. Sato, T. Aizawa, Tatsuya Ito, R. Yamauchi, and K. Masu
- Organizer
  Advanced Metallization Conference(AMC)Advanced Metallization Conference, Asian Session(ADMETA)
- Place of Presentation
  Albany, New York, USA Tokyo, Japan
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] 電源電圧降下の時間的・空間的広がり可視化手法2007
- Author(s)
  上薗巧, 佐藤高史, 益一哉
- Organizer
  電子情報通信学会総合大会
- Place of Presentation
  鳥取大学
- Year and Date
  2007-09-11
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] A MOS transistor-array for accurate measurement of subthreshold leakage variation,2007
- Author(s)
  T. Sato, T. Uezono, S. Hagiwara, K. Okada, S. Amakawa, N. Nakayama, and K. Masu
- Organizer
  International Symposium on Quality Electronic Design(ISQED)
- Place of Presentation
  San Jose, California
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] パワーゲーティング技術における製造ばらつきの回路特性への影響2007
- Author(s)
  萩原汐, 佐藤高史, 益一哉
- Organizer
  第131回システムLSI設計技術研究発表会 (ICD/SIP/IE/SLD合同研究会
- Place of Presentation
  会津若松.
- Year and Date
  2007-10-26
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] A Low-Power Low-Phase-Noise CMOS VCO using RF SiP Technology2007
- Author(s)
  Kazuma, Ohashi, Yusaku, Ito, Hiroyuki, Ito, Kenichi, Okada, Hideki, Hatakeyama, Naoyuki, Ozawa, Masakazu, Sato, Takuya, Aizawa, Tatsuya, Ito, Ryozo, Yamauchi, Kazuya, Masu
- Organizer
  Asia-Pacific Microwave Conference (APMC)
- Place of Presentation
  Bangkok, Thailand
- Year and Date
  2007-12-14
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] 大域ばらつきの近似次数が回路遅延ばらつきに与える影響2007
- Author(s)
  植山寛之, 佐藤高史, 中山範明, 益一哉
- Organizer
  電子情報通信学会総合大会
- Place of Presentation
  鳥取大学
- Year and Date
  2007-09-11
- Data Source
  KAKENHI-PROJECT-18063008
[Presentation] A 5.2GHz CMOS Low Noise Amphfier with High-Q Inductors Embedded in Wafer-Level Chip-Scale Package2007
- Author(s)
  Satoshi, Fukuda, Hiroyuki, Ito, Kazuhisa, Itoi, Masakazu, Sato, Tatsuya, Ito, Ryozo, Yamauchi, Kenichi, Okada, Kazuya, Masu
- Organizer
  International Workshop on RF Integration Technology (RFIT)
- Place of Presentation
  Singapore
- Year and Date
  2007-12-10
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] Wafer-level-packaging inductor with extremely high quality factor and its application to 5.8GHz LC-type voltage controlled oscillator2007
- Author(s)
  H. Hatakeyama, K. Okada, K. Ohashi, Y. Ito, N. Ozawa, M. Sato, T. Aizawa, T. Ito, R. Yamauchi, and K. Masu
- Organizer
  Advanced Metallization Conference, Asian Session(ADMETA)
- Place of Presentation
  Tokyo, Japan
- Year and Date
  2007-10-24
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] A 5.2 GHz CMOS Low Noise Amplifier with High-Q Inductors Embedded in Wafer-Level Chip-Scale Package2007
- Author(s)
  S. Fukuda, H. Ito, K. Itoi, M. Sato, Tatsuya Ito, R. Yamauchi, K. Okada, and K. Masu
- Organizer
  International WorkS. p on RF Integration Technology(RFIT)
- Place of Presentation
  Singapore
- Year and Date
  2007-12-10
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] On-Chip Yagi Antenna for Wireless Signal Transmission in Stacked MCP2006
- Author(s)
  Kazuma, Ohashi, Tackya, Yammouch, Makoto, Kimura, Hiroyuki, Ito, Kenichi, Okada, Koichi, Ishida, Kazuhisa, Itoi, Masakazu, Sato, Tatsuya, Ito, Kazuya, Masu
- Organizer
  International Conference on Solid State Devices and Materials (SSDM)
- Place of Presentation
  Yokohama
- Year and Date
  2006-09-13
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] On-Chip Yagi Antenna for Wireless Signal Transmission in Stacked MCP,2006
- Author(s)
  K. Ohashi, T. Yammouch, M. Kimura, H. Ito, K. Okada, K. Ishida, K. Itoi, M. Sato, T. Ito, and K. Masu
- Organizer
  International Conference on Solid State Devices and Materials(SSDM)
- Place of Presentation
  Yokohama
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] An Left Handed Material on Si CMOS Chip with Wafer Level Package Process2006
- Author(s)
  Jang-Gu, Kim, Kenichi, Okada, Tackya, Yammouch, Takashi, Sato, Kazuya, Masu
- Organizer
  IEEE Asia-Pacific Microwave Conference (APMC)
- Place of Presentation
  Yokohama
- Year and Date
  2006-12-14
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] Distributed Constant Passive Devices Using Wafer-Level Chip Scale Package Technology for One-Chip Wireless Communication Circuits2006
- Author(s)
  J. Seita, H. Ito, H. Sugita, K. Okada, T. Ito, K. Itoi, M. Sato, and K. Masu
- Organizer
  IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems
- Place of Presentation
  San Diego, CA
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] Distributed Constant Passive Devices Using Wafer-Level Chip Scale Package Technology for One-Chip Wireless Communication Circuits2006
- Author(s)
  Junki, Seita, Hiroyuki, Ito, Hideyuki, Sugita, Kenichi, Okada, Tatsuya, Ito, Kazuhisa, Itoi, Masakazu, Sato, Kazuya, Masu
- Organizer
  IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems
- Place of Presentation
  San Diego
- Year and Date
  2006-01-18
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] An Left Handed Material on Si CMOS Chip with Wafer Level Package Process2006
- Author(s)
  J.-G. Kim, K. Okada, T. Yammouch, T. Sato, and K. Masu
- Organizer
  IEEE Asia-Pacific Microwave Conference(APMC).
- Place of Presentation
  Yokohama, Japan
- Year and Date
  2006-12-14
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] High-Q Variable Inductor Using Redistributed Layers for Si RF Circuits2004
- Author(s)
  Hirotaka, Sugawara, Hiroyuki, Ito, Kenichi, Okada, Kazuhisa, Itoi, Masakazu, Sato, Hiroshi, Abe, Kazuya, Masu
- Organizer
  IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems
- Place of Presentation
  Atlanta
- Year and Date
  2004-09-08
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] High-Q Variable Inductor Using Redistributed Layers for Si RF Circuits2004
- Author(s)
  H. Sugawara, H. Ito, K. Okada, K. Itoi, M. Sato, H. Abe and K. Masu
- Organizer
  IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems
- Place of Presentation
  Atlanta, GA
- Year and Date
  2004-09-08
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-16206034
[Presentation] 低電圧起動回路を用いた省電力チップ間非接触通信回路
- Author(s)
  佐川善彦, 廣本正之, 佐藤高史, 越智裕之
- Organizer
  第166回システムとLSIの設計技術研究発表会
- Place of Presentation
  北九州国際会議場, 福岡県
- Data Source
  KAKENHI-PROJECT-23300015
[Presentation] Architecture for sealed wafer-scale mask ROM for long-term digital data preservation
- Author(s)
  Shinya Matsuda, Takashi Imagawa, Hiroshi Tsutsui, Takashi Sato, Yukihiro Nakamura, and Hiroyuki Ochi
- Organizer
  28th Intl. Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC)
- Place of Presentation
  Yeosu, Korea
- Data Source
  KAKENHI-PROJECT-23300015

1. HIROMOTO Masayuki (60718039)

# of Collaborated Projects: 5 results

# of Collaborated Products: 108 results
2. AMAKAWA Shuhei (40431994)

# of Collaborated Projects: 3 results

# of Collaborated Products: 10 results
3. ITO Hiroyuki (40451992)

# of Collaborated Projects: 3 results

# of Collaborated Products: 37 results
4. OKADA Kenichi (70361772)

# of Collaborated Projects: 3 results

# of Collaborated Products: 43 results
5. MASU Kazuya (20157192)

# of Collaborated Projects: 2 results

# of Collaborated Products: 88 results
6. ISHIDA Koichi (30431993)

# of Collaborated Projects: 2 results

# of Collaborated Products: 2 results
7. OCHI Hiroyuki (40264957)

# of Collaborated Projects: 2 results

# of Collaborated Products: 55 results
8. TSUTSUI Hiroshi (30402803)

# of Collaborated Projects: 2 results

# of Collaborated Products: 45 results
9. 小笠原泰弘 (30635298)

# of Collaborated Projects: 2 results

# of Collaborated Products: 6 results
10. 栗原一徳 (30757414)

# of Collaborated Projects: 2 results

# of Collaborated Products: 13 results
11. ISHIHARA Noboru (20396641)

# of Collaborated Projects: 1 results

# of Collaborated Products: 4 results
12. NAKAMURA Yukihiro (60283628)

# of Collaborated Projects: 1 results

# of Collaborated Products: 2 results
13. Bian Song (00866030)

# of Collaborated Projects: 1 results

# of Collaborated Products: 16 results
14. 新谷道広

# of Collaborated Projects: 0 results

# of Collaborated Products: 1 results

Sato Takashi 佐藤 高史

SATO Takashi 佐藤 高史

Research Projects

Research Products

Co-Researchers

Scalable Silicon Reservoir ComputingPrincipal Investigator

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DNA記憶装置による高機能演算の実現Principal Investigator

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Transistor Array Measurements for Physical Unclonable Function with Flexible Printable Transistors

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Clonable PUF: Physical Unclonable Function with Limited ReplicationPrincipal Investigator

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Multi-functional and ultra-low-cost disposable healthcare sensors using organic-silicon hybrid circuitsPrincipal Investigator

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不正確演算による深層学習向け高効率計算技術

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Development of Time-Varying Chip-ID Based on Transistor Models Considering Transient DegradationPrincipal Investigator

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Unconscious, non-contact, and continuous bital sensingPrincipal Investigator

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Reliability design for lifetime prediction, failure prevention, and degradation recovery of integrated circuitsPrincipal Investigator

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Study on Neural Network Processor for Image Recognition

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Architecture for Large-scale Long-term Digital Storage System

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Acceleration of Timing Analysis using Monte Carlo MethodsPrincipal Investigator

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Signal Integrity of Nano-Scale interconnect and Circuit

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Sato Takashi 佐藤高史

SATO Takashi 佐藤高史