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YAMATO Yuta  大和 勇太

ORCIDConnect your ORCID iD *help
Researcher Number 20707244
Affiliation (based on the past Project Information) *help 2013 – 2015: 奈良先端科学技術大学院大学, 情報科学研究科, 助教
Review Section/Research Field
Except Principal Investigator
Computer system
Keywords
Except Principal Investigator
ディペダブル・コンピューティング / ディペンダブル・コンピューティング / 計算機システム / 組み込みメモリ / IRドロップ / 組み込み自己テスト / LSI信頼性
  • Research Projects

    (1 results)
  • Research Products

    (12 results)
  • Co-Researchers

    (2 People)
  •  Research on Built-in Self-Test to Enhance LSI Reliability through its Lifecycle

    • Principal Investigator
      Inoue Michiko
    • Project Period (FY)
      2013 – 2015
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Computer system
    • Research Institution
      Nara Institute of Science and Technology

All 2016 2015 2014 2013 Other

All Presentation

  • [Presentation] 重み付きランダムパターンとリシードを組み合わせた組込み自己テスト手法2016

    • Author(s)
      里中 沙矢香, 米田 友和, 大和 勇太, 井上 美智子
    • Organizer
      電子情報通信学会ディペンダブルコンピューティング研究会
    • Place of Presentation
      機械振興会館(東京都港区)
    • Year and Date
      2016-02-17
    • Data Source
      KAKENHI-PROJECT-25280015
  • [Presentation] ゼロ遅延論理シミュレーションに基づく遅延故障インジェクション環境2016

    • Author(s)
      川崎 真司, 米田 友和, 大和 勇太, 井上 美智子
    • Organizer
      電子情報通信学会ディペンダブルコンピューティング研究会
    • Place of Presentation
      機械振興会館(東京都港区)
    • Year and Date
      2016-02-17
    • Data Source
      KAKENHI-PROJECT-25280015
  • [Presentation] Reliability enhancement of embedded memory with combination of aging-aware adaptive in-field self-repair and ECC2016

    • Author(s)
      Gian Mayuga, Yuta Yamato, Tomokazu Yoneda, Yasuo Sato and Michiko Inoue
    • Organizer
      the 21st IEEE European Test Symposium
    • Place of Presentation
      Amsterdam, The Netherlands
    • Year and Date
      2016-05-24
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-25280015
  • [Presentation] An ECC-Based memory architecture with online self-repair capabilities for reliability enhancement2015

    • Author(s)
      Gian Mayuga, Yuta Yamato, Tomokazu Yoneda, Yasuo Sato and Michiko Inoue
    • Organizer
      the 20th IEEE European Test Symposium
    • Place of Presentation
      Cluj-Napoca, Romania
    • Year and Date
      2015-05-25
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-25280015
  • [Presentation] メモリの隣接パタン依存故障テストに対するバックグラウンド列の生成2015

    • Author(s)
      上岡真也, 米田友和, 大和勇太, 井上美智子
    • Organizer
      電子情報通信学会ディペンダブルコンピューティング研究会
    • Place of Presentation
      福江文化会館(長崎県五島市)
    • Year and Date
      2015-12-01
    • Data Source
      KAKENHI-PROJECT-25280015
  • [Presentation] Memory block based scan-BIST architecture for application-dependent FPGA testing2014

    • Author(s)
      Keita Ito, Tomokazu Yoneda, Yuta Yamato, Kazumi Hatayama, Michiko Inoue
    • Organizer
      ACM/SIGDA International Symposium on Field-Programmable Gate Arrays
    • Place of Presentation
      Monterey, California, USA
    • Data Source
      KAKENHI-PROJECT-25280015
  • [Presentation] Reliability of ECC-based memory architectures with online self-repair capabilities2014

    • Author(s)
      Gian Mayuga, Yuta Yamato, Tomokazu Yoneda, Yasuo Sato and Michiko Inoue
    • Organizer
      電子情報通信学会ディペンダブルコンピューティング研究会
    • Place of Presentation
      高岡テクノドーム(富山県高岡市)
    • Year and Date
      2014-12-19
    • Data Source
      KAKENHI-PROJECT-25280015
  • [Presentation] FPGA向けアプリケーション依存テストのための効率的なスキャンBISTアーキテクチャ2013

    • Author(s)
      伊藤 渓太, 米田 友和, 大和 勇太, 畠山 一実, 井上 美智子
    • Organizer
      電子情報通信学会ディペンダブルコンピューティング研究会
    • Place of Presentation
      石川県七尾市
    • Data Source
      KAKENHI-PROJECT-25280015
  • [Presentation] Efficient scan-based BIST architecture for application-dependent FPGA test2013

    • Author(s)
      Keita Ito, Tomokazu Yoneda, Yuta Yamato, Kazumi Hatayama, Michiko Inoue
    • Organizer
      The Forteenth Workshop on RTL and High Level Testing
    • Place of Presentation
      台湾・宜蘭
    • Data Source
      KAKENHI-PROJECT-25280015
  • [Presentation] An online repair strategy and reliability for ECC-Based memory architectures

    • Author(s)
      Gian Mayuga, Yuta Yamato, Tomokazu Yoneda, Yasuo Sato and Michiko Inoue
    • Organizer
      IEEE Workshop on RTL and High Level Testing
    • Place of Presentation
      Hangzhou, China
    • Year and Date
      2014-11-19 – 2014-11-20
    • Data Source
      KAKENHI-PROJECT-25280015
  • [Presentation] Parallel path delay fault simulation for multi/many-core processors with SIMD units

    • Author(s)
      Yussuf Ali, Yuta Yamato, Tomokazu Yoneda, Kazumi Hatayama, Michiko Inoue
    • Organizer
      IEEE Asian Test Symposium
    • Place of Presentation
      Hangzhou, China
    • Year and Date
      2014-11-16 – 2014-11-19
    • Data Source
      KAKENHI-PROJECT-25280015
  • [Presentation] An ECC-Based memory architecture with online self-repair capabilities for reliability enhancement

    • Author(s)
      Gian Mayuga, Yuta Yamato, Tomokazu Yoneda, Yasuo Sato and Michiko Inoue
    • Organizer
      IEEE European Test Symposium
    • Place of Presentation
      Cluj-Napoca, Romania
    • Year and Date
      2015-05-25 – 2015-05-29
    • Data Source
      KAKENHI-PROJECT-25280015
  • 1.  Inoue Michiko (30273840)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 12 results
  • 2.  YONEDA Tomokazu (20359871)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 12 results

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