Inoue Michiko 井上美智子

… Alternative Names

井上美智子イノウエミチコ

INOUE Michiko 井上美智子

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Researcher Number	30273840
Other IDs
External Links
Affiliation (Current)	2025: 奈良先端科学技術大学院大学, 先端科学技術研究科, 教授
Affiliation (based on the past Project Information) *help	2022 – 2023: 奈良先端科学技術大学院大学, 先端科学技術研究科, 教授 2018 – 2020: 奈良先端科学技術大学院大学, 先端科学技術研究科, 教授 2013 – 2017: 奈良先端科学技術大学院大学, 情報科学研究科, 教授 2007 – 2010: Nara Institute of Science and Technology, 情報科学研究科, 准教授 2000 – 2006: 奈良先端科学技術大学院大学, 情報科学研究科, 助教授 2001: 奈良先端科学技術大学院大学, 情報科学研究科, 教授 1997 – 2000: 奈良先端科学技術大学院大学, 情報科学研究科, 助手
Review Section/Research Field	Principal Investigator 計算機科学 / Mathematical informatics / Computer system / Computer system/Network Except Principal Investigator Basic Section 60010:Theory of informatics-related / Computer system/Network / 計算機科学
Keywords	Principal Investigator VLSI / テスト容易化設計 / 故障耐性 / 自己安定性 / 共有メモリシステム / 無待機アルゴリズム / 分散アルゴリズム / 部分影 / 接続トポロジー再構成 / 太陽光発電システム … More / 発電量最適化 / 再構成 / 接続トポロジー / 太陽光発電 / ディペダブル・コンピューティング / ディペンダブル・コンピューティング / 計算機システム / 組み込みメモリ / IRドロップ / 組み込み自己テスト / LSI信頼性 / 遅延故障 / プロセッサ / テスト生成 / 実動作速度テスト / 誤りマスク / テストプログラムテンプレート / 命令レベル自己テスト / プロセッサ自己テスト / VLSIのテスト / 設計自動化 / テストスケジューリング / SoC / レジスタ転送レベル / 低消費電力 / 無待機性 / 繰り返し改名問題 / ポイント競合度適応 / 分散協調問題 / マルチプロセッサシステム … More Except Principal Investigator 分散アルゴリズム / 動的ネットワーク / ビザンチン故障 / 個体群プロトコル / モバイルロボット / モバイルエージェント / 自己安定 / DESIGN FOR TESTABILITY / テスト容易化設計 / システムオンチップ / スキャン設計 / 自己安定アルゴリズム / CORE-BAES DESIGN / CO-OPTIMIZATION / TEST ACCESS MECHANISM / TEST ARCHITECTURE / CONSECUTIVE TRANSPARENCY / CONSECUTIVE TESTABILITY / SYSTEM-ON-CHIP / コアベース設計 / 相互最適化 / テストアクセス機構 / テストアーキテクチャ / 連続透明 / 連続可検査 / computer cluster / wait-freedom / self-stabilization / fault tolerance / parallel algoritmhs / protocol / distributed algorithms / 故障耐性 / 計算機クラスタ / 無待機 / フォールトトレランス / 並列アルゴリズム / プロトコル / CONTROLLER / DATA PATH / REGISTER TRANSFERLEVEL / DATA FLOW GRAPH / VLSITEST / HIGHLEVEL SYNTHESIS / SYNTHESIS FOR TESTABILITY / テスト容易化合物 / コントローラ / データパス / レジスタ転送レベル / データフローグラフ / VLSIテスト / 高位合成 / テスト容易化合成 / 設計自動化 / 高信頼性ネットワーク / ディペンダブルコンピューティング / 安全性(セキュリティ) / テスト容易性 / ネットワークオンチップ / VLSIのテスト / VLSI設計技術 Less

A study on Byzantine-tolerant algorithms for mobile robots
- Principal Investigator
  
  大下福仁
- Project Period (FY)
  2022 – 2024
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 60010:Theory of informatics-related
- Research Institution
  Fukui University of Technology
A study on self-stabilizing algorithms for mobile agents
- Principal Investigator
  
  Ooshita Fukuhito
- Project Period (FY)
  2018 – 2020
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 60010:Theory of informatics-related
- Research Institution
  Nara Institute of Science and Technology
Research on Topology Reconfiguration for Maximum Power Generation in Photovoltaic SystemsPrincipal Investigator
- Principal Investigator
  
  Inoue Michiko
- Project Period (FY)
  2015 – 2017
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Mathematical informatics
- Research Institution
  Nara Institute of Science and Technology
Research on Built-in Self-Test to Enhance LSI Reliability through its LifecyclePrincipal Investigator
- Principal Investigator
  
  Inoue Michiko
- Project Period (FY)
  2013 – 2015
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Computer system
- Research Institution
  Nara Institute of Science and Technology
Basic Studies on Testability and Security for Network-on-Chip
- Principal Investigator
  
  FUJIWARA Hideo
- Project Period (FY)
  2008 – 2010
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Computer system/Network
- Research Institution
  Nara Institute of Science and Technology
Software-Based Self-Test for Processors to guarantee high fault efficiency for structured faultsPrincipal Investigator
- Principal Investigator
  
  INOUE Michiko
- Project Period (FY)
  2006 – 2008
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Computer system/Network
- Research Institution
  Nara Institute of Science and Technology
BASIC STUDIES ON TEST ARCHITECTURE AND DESIGN FOR TESTABILITY FOR SYSTEM-ON-CHIP
- Principal Investigator
  
  FUJIWARA Hideo
- Project Period (FY)
  2003 – 2006
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Computer system/Network
- Research Institution
  NARA INSTITUTE OF SCIENCE AND TECHNOLOGY
低消費電力性とテスト容易性をともに考慮したVLSI高位設計Principal Investigator
- Principal Investigator
  
  井上美智子
- Project Period (FY)
  2002 – 2004
- Research Category
  
  Grant-in-Aid for Exploratory Research
- Research Field
  
  計算機科学
- Research Institution
  Nara Institute of Science and Technology
分散共有メモリ環境において故障耐性を考慮した効率のよい分散アルゴリズムの設計Principal Investigator
- Principal Investigator
  
  井上美智子
- Project Period (FY)
  2000 – 2001
- Research Category
  
  Grant-in-Aid for Encouragement of Young Scientists (A)
- Research Field
  
  計算機科学
- Research Institution
  Nara Institute of Science and Technology
Distributed Algorithms for Implementing Highly Reliable Distributed Systems
- Principal Investigator
  
  MASUZAWA Toshimitsu
- Project Period (FY)
  1998 – 2000
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas (B)
- Research Institution
  Osaka University
  Nara Institute of Science and Technology
メモリ共有型マルチプロセッサシステムにおける無待機アルゴリズムに関する研究Principal Investigator
- Principal Investigator
  
  井上美智子
- Project Period (FY)
  1997 – 1998
- Research Category
  
  Grant-in-Aid for Encouragement of Young Scientists (A)
- Research Field
  
  計算機科学
- Research Institution
  Nara Institute of Science and Technology
BASIC STUDIES ON VLSISYNTHESIS FOR TESTABILITY FROM HIGHER LEVEL
- Principal Investigator
  
  FUJIWARA Hideo
- Project Period (FY)
  1997 – 2000
- Research Category
  
  Grant-in-Aid for Scientific Research (B).
- Research Field
  
  計算機科学
- Research Institution
  NARA INSTITUTE OF SCIENCE AND TECHNOLOGY

[Journal Article] Fast gathering despite a linear number of weakly Byzantine agents<sup>†</sup>2024
- Author(s)
  Jion Hirose, Junya Nakamura, Fukuhito Ooshita, and Michiko Inoue
- Journal Title
  
  Concurrency and Computation: Practice and Experience
  
  Volume: - Issue: 14
- DOI
  10.1002/cpe.8055
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-22K11903, KAKENHI-PROJECT-20H04140
[Journal Article] Eventually consistent distributed ledger despite degraded atomic broadcast2021
- Author(s)
  Gregory Benassy, Fukuhito Ooshita, and Michiko Inoue
- Journal Title
  
  Concurrency and Computation: Practice and Experience
  
  Volume: - Issue: 11
- DOI
  10.1002/cpe.6199
- NAID
  120007166832
- Peer Reviewed / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K11167
[Journal Article] Byzantine-tolerant gathering of mobile agents in asynchronous arbitrary networks with authenticated whiteboards2020
- Author(s)
  Masashi Tsuchida, Fukuhito Ooshita, and Michiko Inoue
- Journal Title
  
  IEICE Transactions on Information and Systems
  
  Volume: E103-D
- NAID
  130007867759
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18K11167
[Journal Article] A population protocol for uniform k-partition under global fairness2019
- Author(s)
  Hiroto Yasumi, Naoki Kitamura, Fukuhito Ooshita, Taisuke Izumi, and Michiko Inoue
- Journal Title
  
  International Journal of Networking and Computing
  
  Volume: 9 Pages: 97-110
- NAID
  130007581112
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-18K11167
[Journal Article] A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint2010
- Author(s)
  Ryoichi Inoue, Toshinori Hosokawa, Hideo Fujiwara
- Journal Title
  
  IEICE Transactions on Information and Systems Vol.E93-D, No.1
  
  Pages: 24-32
- NAID
  10026812987
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20300018
[Journal Article] Design and Optimization of Transparency-Based TAM for SoC Test2010
- Author(s)
  Tomokazu Yoneda, Akiko Shuto, Hideyuki Ichihara, Tomoo Inoue, Hideo Fujiwara
- Journal Title
  
  IEICE Trans. on Inf. and Syst. Vol.E93-D, No.6
  
  Pages: 1549-1559
- NAID
  10027987897
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20300018
[Journal Article] 部分スルー可検査性に基づく順序回路のテスト生成法2009
- Author(s)
  岡伸也, Chia Yee Ooi, 市原英行, 井上智生, 藤原秀雄
- Journal Title
  
  電子情報通信学会和文論文誌D-I Vol.J92-D, No.12
  
  Pages: 2207-2216
- NAID
  110007482414
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20300018
[Journal Article] A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint2009
- Author(s)
  Ryoichi Inoue
- Journal Title
  
  IEICE Transactions on Information and Systems E93-D
  
  Pages: 24-32
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20300018
[Journal Article] Design for testability method to avoid error masking of software-based self-test for processors2008
- Author(s)
  Masato Nakazato, Michiko Inoue, Satoshi Ohtake and Hideo Fujiwara
- Journal Title
  
  IEICE Trans. on Information and Systems Vol.E91-D, No.3
  
  Pages: 763-770
- NAID
  10026802191
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18500038
[Journal Article] A Low Power Deterministic Test Using Scan Chain Disable Technique2006
- Author(s)
  Zhiqiang You, Tsuyoshi Iwagaki, Michiko Inoue, Hideo Fujiwara
- Journal Title
  
  IEICE Transactions on Information and Systems Vol.E89-D, No.6
  
  Pages: 1931-1939
- NAID
  110007503110
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15300018
[Journal Article] Instruction-Based Self-Testing of Delay Faults it Pipelined Processors2006
- Author(s)
  Virendra Singh, Michiko Inoue, Kewal K. Saluja, Hideo Fujiwara
- Journal Title
  
  IEEE Trans. on Very Large Scale Integration (VLSI) Systems Vol.14, No.11
  
  Pages: 1203-1215
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15300018
[Journal Article] Non-Scan Design for Single-Port-Change Delay Fault Testability2006
- Author(s)
  Yuki Yoshikawa, Satoshi Ohtake, Michiko Inoue, Hideo Fujiwara
- Journal Title
  
  IPSJ (Information Processing Society of Japan) Journal (Special Issue on Design Methodology of System LSIs) Vol.47, No.6
  
  Pages: 1619-1628
- NAID
  130000022321
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15300018
[Journal Article] Instruction-based self-testing of delay faults in pipelined processors2006
- Author(s)
  Virendra Singh, Michiko Inoue, Kewal K. Saluja and Hideo Fujiwara
- Journal Title
  
  IEEE Trans. on Very Large Scale Integration(VLSI)Systems Vol.14, No.11
  
  Pages: 1203-1215
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18500038
[Journal Article] Software-Based Self-Test of Processors for Stuck-at Faults and Path Delay Faults2005
- Author(s)
  Michiko Inoue, Kazuko Kambe, Virendra Singh, Hideo Fujiwara
- Journal Title
  
  Trans. of IEICE (DI), (Invited Paper) (in Japanese) Vol.J88-D-I, No.6
  
  Pages: 1003-1011
- NAID
  110003203373
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15300018
[Journal Article] 縮退故障とパス遅延故障のためのプロセッサの命令レベル自己テスト法2005
- Author(s)
  井上美智子
- Journal Title
  
  電子情報通信学会和文論文誌D-I J88-D-I, 6
  
  Pages: 1003-1011
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15300018
[Journal Article] Delay Fault Testing of Processor Cores in Functional Mode2005
- Author(s)
  Virendra Singh, Michiko Inoue, Kewal K. Saluja, Hideo Fujiwara
- Journal Title
  
  IEICE Transactions on Information and Systems Vol.E88-D, No.3
  
  Pages: 610-618
- NAID
  110003214225
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15300018
[Journal Article] 縮退故障とパス遅延故障のためのプロセッサの命令レベル自己テスト法2005
- Author(s)
  井上美智子
- Journal Title
  
  電子情報通信学会和文論文誌D-1 J88-D-I,6
  
  Pages: 1003-1011
- Data Source
  KAKENHI-PROJECT-15300018
[Journal Article] Power-Constrained Test Synthesis and Scheduling Algorithms for Non-Scan BIST-able RTL Data Paths2005
- Author(s)
  Zhiqiang You, Ken'ichi Yamaguchi, Michiko Inoue, Jacob Savir, Hideo Fujiwara
- Journal Title
  
  IEICE Transactions on Information and Systems Vol.E88-D, No.3
  
  Pages: 1940-1947
- NAID
  110003214398
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15300018
[Journal Article] Power-constrained test scheduling for RTL datapaths of non-scan BIST schemes2004
- Author(s)
  Z.You, K.Yamaguchi, M.Inoue, J.Savir, H.Fujiwara
- Journal Title
  
  Proceedings of the IEEE 13th Asian Test Symposium (ATS'04)
  
  Pages: 32-39
- Data Source
  KAKENHI-PROJECT-14658092
[Journal Article] Hierarchical BIST : Test-Per-Clock BIST Scheme with Low Overhead2003
- Author(s)
  Ken-ichi Yamaguchi, Michiko Inoue, Hideo Fujiwara
- Journal Title
  
  Trans. of IEICE (in Japanese) Vol.J86-D-I, No.7
  
  Pages: 469-479
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15300018
[Journal Article] Internally balanced structure with hold and switching functions2003
- Author(s)
  Chikateru Jinno, Michiko Inoue, Hideo Fujiwara
- Journal Title
  
  Trans. of IEICE (DI) (in Japanese) Vol.J86-D-I, No.9
  
  Pages: 682-690
- NAID
  110003171271
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15300018
[Journal Article] Partial scan approach for secret information protect ion
- Author(s)
  M. Inoue
- Journal Title
  
  Proceedings of 14th IEEE European Test Symposium (掲載決定)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18500038
[Presentation] Gathering in carrier graphs: Meeting via public transportation system2024
- Author(s)
  Haozhi Zheng, Ryota Eguchi, Fukuhito Ooshita, and Michiko Inoue
- Organizer
  3rd Symposium on Algorithmic Foundation of Dynamic Networks (SAND)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22K11903
[Presentation] Meeting times of non-atomic random walks2023
- Author(s)
  Ryota Eguchi, Fukuhito Ooshita, Michiko Inoue, and Sebastien Tixeuil
- Organizer
  25th International Symposium on Stabilization, Safety, and Security of Distributed Systems (SSS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22K11903
[Presentation] Gathering despite a linear number of weakly Byzantine agents2022
- Author(s)
  Jion Hirose, Junya Nakamura, Fukuhito Ooshita, and Michiko Inoue
- Organizer
  14th International Workshop on Parallel and Distributed Algorithms and Applications (PDAA)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22K11903
[Presentation] Brief announcement: Gathering despite a linear number of weakly Byzantine agents2022
- Author(s)
  Jion Hirose, Junya Nakamura, Fukuhito Ooshita, and Michiko Inoue
- Organizer
  41st ACM Symposium on Principles of Distributed Computing (PODC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22K11903
[Presentation] Terminating grid exploration with myopic luminous robots2021
- Author(s)
  Shota Nagahama, Fukuhito Ooshita, and Michiko Inoue
- Organizer
  23rd Workshop on Advances in Parallel and Distributed Computational Models (APDCM)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K11167
[Presentation] Gathering with a strong team in weakly Byzantine environments2021
- Author(s)
  Jion Hirose, Junya Nakamura, Fukuhito Ooshita, and Michiko Inoue
- Organizer
  22nd International Conference on Distributed Computing and Networking (ICDCN)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K11167
[Presentation] Uniform bipartition in population protocol model with arbitrary communication graphs2020
- Author(s)
  Hiroto Yasumi, Fukuhito Ooshita, Michiko Inoue, and Sebastien Tixeuil
- Organizer
  24th International Conference on Principles of Distributed Systems (OPODIS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K11167
[Presentation] Uniform bipartition in population protocol model over arbitrary communication networks2020
- Author(s)
  Hiroto Yasumi, Fukuhito Ooshita, Michiko Inoue, and Sebastien Tixeuil
- Organizer
  電子情報通信学会コンピュテーション研究会
- Data Source
  KAKENHI-PROJECT-18K11167
[Presentation] Gathering for mobile agents with a strong team in weakly Byzantine environments2020
- Author(s)
  Jion Hirose, Masashi Tsuchida, Junya Nakamura, Fukuhito Ooshita, and Michiko Inoue
- Organizer
  電子情報通信学会コンピュテーション研究会
- Data Source
  KAKENHI-PROJECT-18K11167
[Presentation] Brief announcement: Gathering with a strong team in weakly Byzantine environments2020
- Author(s)
  Jion Hirose, Masashi Tsuchida, Junya Nakamura, Fukuhito Ooshita, and Michiko Inoue
- Organizer
  27th International Colloquium on Structural Information and Communication Complexity (SIROCCO)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K11167
[Presentation] Uniform partition in population protocol model under weak fairness2019
- Author(s)
  Hiroto Yasumi, Fukuhito Ooshita, Michiko Inoue
- Organizer
  the 23rd International Conference on Principles of Distributed Systems (OPODIS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K11167
[Presentation] Black hole search despite Byzantine agents2019
- Author(s)
  Masashi Tsuchida, Fukuhito Ooshita, and Michiko Inoue
- Organizer
  the 21st International Symposium on Stabilization, Safety, and Security of Distributed Systems (SSS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K11167
[Presentation] 視界に制限のあるライト付きモバイルロボットによるリング探索2019
- Author(s)
  長濵将太，大下福仁，井上美智子
- Organizer
  電子情報通信学会コンピュテーション研究会
- Data Source
  KAKENHI-PROJECT-18K11167
[Presentation] Ring exploration of myopic luminous robots with visibility more than one2019
- Author(s)
  Shota Nagahama, Fukuhito Ooshita, and Michiko Inoue
- Organizer
  the 21st International Symposium on Stabilization, Safety, and Security of Distributed Systems (SSS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K11167
[Presentation] Eventually consistent distributed ledger relying on degraded atomic broadcast2019
- Author(s)
  Gregory Benassy, Fukuhito Ooshita, and Michiko Inoue
- Organizer
  the 11th International Workshop on Parallel and Distributed Algorithms and Applications (PDAA)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K11167
[Presentation] ゼロ遅延論理シミュレーションに基づく遅延故障インジェクション環境2016
- Author(s)
  川崎真司, 米田友和, 大和勇太, 井上美智子
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会
- Place of Presentation
  機械振興会館（東京都港区）
- Year and Date
  2016-02-17
- Data Source
  KAKENHI-PROJECT-25280015
[Presentation] Reliability enhancement of embedded memory with combination of aging-aware adaptive in-field self-repair and ECC2016
- Author(s)
  Gian Mayuga, Yuta Yamato, Tomokazu Yoneda, Yasuo Sato and Michiko Inoue
- Organizer
  the 21st IEEE European Test Symposium
- Place of Presentation
  Amsterdam, The Netherlands
- Year and Date
  2016-05-24
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-25280015
[Presentation] 重み付きランダムパターンとリシードを組み合わせた組込み自己テスト手法2016
- Author(s)
  里中沙矢香, 米田友和, 大和勇太, 井上美智子
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会
- Place of Presentation
  機械振興会館（東京都港区）
- Year and Date
  2016-02-17
- Data Source
  KAKENHI-PROJECT-25280015
[Presentation] An ECC-Based memory architecture with online self-repair capabilities for reliability enhancement2015
- Author(s)
  Gian Mayuga, Yuta Yamato, Tomokazu Yoneda, Yasuo Sato and Michiko Inoue
- Organizer
  the 20th IEEE European Test Symposium
- Place of Presentation
  Cluj-Napoca, Romania
- Year and Date
  2015-05-25
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-25280015
[Presentation] メモリの隣接パタン依存故障テストに対するバックグラウンド列の生成2015
- Author(s)
  上岡真也, 米田友和, 大和勇太, 井上美智子
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会
- Place of Presentation
  福江文化会館（長崎県五島市）
- Year and Date
  2015-12-01
- Data Source
  KAKENHI-PROJECT-25280015
[Presentation] Memory block based scan-BIST architecture for application-dependent FPGA testing2014
- Author(s)
  Keita Ito, Tomokazu Yoneda, Yuta Yamato, Kazumi Hatayama, Michiko Inoue
- Organizer
  ACM/SIGDA International Symposium on Field-Programmable Gate Arrays
- Place of Presentation
  Monterey, California, USA
- Data Source
  KAKENHI-PROJECT-25280015
[Presentation] Reliability of ECC-based memory architectures with online self-repair capabilities2014
- Author(s)
  Gian Mayuga, Yuta Yamato, Tomokazu Yoneda, Yasuo Sato and Michiko Inoue
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会
- Place of Presentation
  高岡テクノドーム（富山県高岡市）
- Year and Date
  2014-12-19
- Data Source
  KAKENHI-PROJECT-25280015
[Presentation] FPGA向けアプリケーション依存テストのための効率的なスキャンBISTアーキテクチャ2013
- Author(s)
  伊藤渓太, 米田友和, 大和勇太, 畠山一実, 井上美智子
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会
- Place of Presentation
  石川県七尾市
- Data Source
  KAKENHI-PROJECT-25280015
[Presentation] Efficient scan-based BIST architecture for application-dependent FPGA test2013
- Author(s)
  Keita Ito, Tomokazu Yoneda, Yuta Yamato, Kazumi Hatayama, Michiko Inoue
- Organizer
  The Forteenth Workshop on RTL and High Level Testing
- Place of Presentation
  台湾・宜蘭
- Data Source
  KAKENHI-PROJECT-25280015
[Presentation] A Method of Unsensitizable Path Identification using High Level Design Information2010
- Author(s)
  Satoshi Ohtake, Naotsugu Ikeda, Michiko Inoue, Hideo Fujiwara
- Organizer
  5th International Conference on Design & Technology of Integrated Systems in Nanoscale Era
- Data Source
  KAKENHI-PROJECT-20300018
[Presentation] Aging Test Strategy and Adaptive Test Scheduling for SoC Failure Prediction2010
- Author(s)
  Hyunbean Yi, Tomokazu Yoneda, Michiko Inoue, Yasuo Sato, Seiji Kajihara, Hideo Fujiwara
- Organizer
  IEEE International On-Line Testing Symposium
- Data Source
  KAKENHI-PROJECT-20300018
[Presentation] Seed Ordering and Selection for High Quality Delay Test2010
- Author(s)
  Tomokazu Yoneda, Michiko Inoue, Akira Taketani, Hideo Fujiwara
- Organizer
  Proc. of IEEE the 19th Asian Test Symposium
- Data Source
  KAKENHI-PROJECT-20300018
[Presentation] Capture in Turn Scan for Reduction of Test Date Volume, Test Application Time and Test Power2010
- Author(s)
  Zhiqiang You, Jiedi Huang, Michiko Inoue, Jishun Kuang, Hideo Fujiwara
- Organizer
  Proc. of IEEE the 19th Asian Test Symposium
- Data Source
  KAKENHI-PROJECT-20300018
[Presentation] Thermal-Uniformity-Aware X-Filling to Reduce Temperature-Induced Delay Variation for Accurate At-Speed Testing2010
- Author(s)
  Tomokazu Yoneda, Michiko Inoue, Yasuo Sato, Hideo Fujiwara
- Organizer
  28th IEEE VLSI Test Symposium
- Data Source
  KAKENHI-PROJECT-20300018
[Presentation] Test Pattern Selection to Optimize Delay Test Quality with a Limited Size of Test Set2010
- Author(s)
  Michiko Inoue, Akira Taketani, Tomokazu Yoneda, Hiroshi Iwata, Hideo Fujiwara
- Organizer
  2010 IEEE European Test Symposium
- Data Source
  KAKENHI-PROJECT-20300018
[Presentation] Bipartite Full Scan Design : A DFT Method for Asynchronous Circuits2010
- Author(s)
  Hiroshi Iwata, Satoshi Ohtake, Michiko Inoue, Hideo Fujiwara
- Organizer
  Proc. of IEEE the 19th Asian Test Symposium
- Data Source
  KAKENHI-PROJECT-20300018
[Presentation] Test Pattern Selection to Optimize Delay Test Quality with a Limited Size of Test Set2010
- Author(s)
  Michiko Inoue
- Organizer
  2010 IEEE European Test Symposium
- Place of Presentation
  Prague, Czech Republic
- Year and Date
  2010-05-25
- Data Source
  KAKENHI-PROJECT-20300018
[Presentation] Partial Scan Approach for Secret Information Protection2009
- Author(s)
  Michiko Inoue, Tomokazu Yoneda, Muneo Hasegawa, Hideo Fujiwara
- Organizer
  2009 IEEE European Test Symposium
- Data Source
  KAKENHI-PROJECT-20300018
[Presentation] A Response Compactor for Extended Compatibility Scan Tree Construction2009
- Author(s)
  Zhiqiang You, Jiedi Huang, Michiko Inoue, Jishun Kuang, Hideo Fujiwara
- Organizer
  Proc. EEE 8th International Conference on ASIC
- Data Source
  KAKENHI-PROJECT-20300018
[Presentation] Partial scan approach for secret information protection2009
- Author(s)
  Michiko Inoue, Tomokazu Yoneda, Muneo Hasegawa and Hideo Fujiwara
- Organizer
  Proceedings of the 14th IEEE European Test Symposium(ETS'09)
- Data Source
  KAKENHI-PROJECT-18500038
[Presentation] Test Generation and DFT Based on Partial Thru Testability2009
- Author(s)
  Nobuya Oka, Chia Yee Ooi, Hideyuki Ichihara, Tomoo Inoue, Hideo Fujiwara
- Organizer
  2009 IEEE European Test Symposium, poster session
- Data Source
  KAKENHI-PROJECT-20300018
[Presentation] Partial Scan Approach for Secret Information Protection2009
- Author(s)
  Michiko Inoue
- Organizer
  2009 IEEE European Test Symposium
- Place of Presentation
  Sevilla, Spain
- Year and Date
  2009-05-26
- Data Source
  KAKENHI-PROJECT-20300018
[Presentation] Path-based Resource Binding to Reduce Delay Fault Test Cost2009
- Author(s)
  Michiko Inoue
- Organizer
  10th IEEE Workshop on RTL and High Level Testing
- Place of Presentation
  Hong Kong
- Year and Date
  2009-11-27
- Data Source
  KAKENHI-PROJECT-20300018
[Presentation] Unsensitizable Path Identification at RTL Using High-Level Synthes is Information2009
- Author(s)
  Satoshi Ohtake, Naotsugu Ikeda, Michiko Inoue, Hideo Fuji waral
- Organizer
  Digest of papers of 16th IEEE International Test Synthesis Workshop
- Data Source
  KAKENHI-PROJECT-18500038
[Presentation] A Synthesis Method to Alleviate Over-testing of Delay Faults Based on RTL Don't Care Path Identification2009
- Author(s)
  Yuki Yoshikawa, Satoshi Ohtake, Tomoo Inoue, Hideo Fujiwara
- Organizer
  IEEE 27th VLSI Test Symposium
- Data Source
  KAKENHI-PROJECT-20300018
[Presentation] Fast False Path Identification Based on Functional Unsensitizability Using RTL Information2009
- Author(s)
  Yuki Yoshikawa, Satoshi Ohtake, Tomoo Inoue, Hideo Fujiwara
- Organizer
  14th Asia and South Pacific Design Automation Conference
- Data Source
  KAKENHI-PROJECT-20300018
[Presentation] "Delay test of FPGA routing networks by branched test paths, " Informal Digest of Papers2008
- Author(s)
  Elena Hammari, Michiko Inoue, Einar J. Aas and Hideo Fujiwara
- Organizer
  13th IEEE European Test Symposium(ETS'08)
- Data Source
  KAKENHI-PROJECT-18500038
[Presentation] Design for testability of software-based self-test for processors2006
- Author(s)
  Masato Nakazato, Satoshi Ohtake, Michiko Inoue and Hideo Fujiwara
- Organizer
  15th IEEE Asian Test Symposium(ATS'06)
- Data Source
  KAKENHI-PROJECT-18500038
[Presentation] プロセッサの命令レベル自己テストのためのテスト容易化設計2006
- Author(s)
  中里昌人, 大竹哲史, 井上美智子, 藤原秀雄
- Organizer
  信学技報(ICD2006-40~59)
- Data Source
  KAKENHI-PROJECT-18500038
[Presentation] An ECC-Based memory architecture with online self-repair capabilities for reliability enhancement
- Author(s)
  Gian Mayuga, Yuta Yamato, Tomokazu Yoneda, Yasuo Sato and Michiko Inoue
- Organizer
  IEEE European Test Symposium
- Place of Presentation
  Cluj-Napoca, Romania
- Year and Date
  2015-05-25 – 2015-05-29
- Data Source
  KAKENHI-PROJECT-25280015
[Presentation] Parallel path delay fault simulation for multi/many-core processors with SIMD units
- Author(s)
  Yussuf Ali, Yuta Yamato, Tomokazu Yoneda, Kazumi Hatayama, Michiko Inoue
- Organizer
  IEEE Asian Test Symposium
- Place of Presentation
  Hangzhou, China
- Year and Date
  2014-11-16 – 2014-11-19
- Data Source
  KAKENHI-PROJECT-25280015
[Presentation] An online repair strategy and reliability for ECC-Based memory architectures
- Author(s)
  Gian Mayuga, Yuta Yamato, Tomokazu Yoneda, Yasuo Sato and Michiko Inoue
- Organizer
  IEEE Workshop on RTL and High Level Testing
- Place of Presentation
  Hangzhou, China
- Year and Date
  2014-11-19 – 2014-11-20
- Data Source
  KAKENHI-PROJECT-25280015

1. YONEDA Tomokazu (20359871)

# of Collaborated Projects: 5 results

# of Collaborated Products: 19 results
2. OHTAKE Satoshi (20314528)

# of Collaborated Projects: 4 results

# of Collaborated Products: 9 results
3. FUJIWARA Hideo (70029346)

# of Collaborated Projects: 3 results

# of Collaborated Products: 23 results
4. MASUZAWA Toshimitsu (50199692)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
5. Ooshita Fukuhito (20362650)

# of Collaborated Projects: 2 results

# of Collaborated Products: 19 results
6. YAMATO Yuta (20707244)

# of Collaborated Projects: 1 results

# of Collaborated Products: 12 results
7. INOUE Tomoo (40252829)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
8. FUJIWARA Akihiro (10295008)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
9. KATAYAMA Yoshiaki (10263435)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
10. MASUDA Hideo (90304063)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
11. SAITOH Akinori (20235021)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

Inoue Michiko 井上 美智子

井上 美智子 イノウエ ミチコ

INOUE Michiko 井上 美智子

Research Projects

Research Products

Co-Researchers

A study on Byzantine-tolerant algorithms for mobile robots

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A study on self-stabilizing algorithms for mobile agents

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Research on Topology Reconfiguration for Maximum Power Generation in Photovoltaic SystemsPrincipal Investigator

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Research on Built-in Self-Test to Enhance LSI Reliability through its LifecyclePrincipal Investigator

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Basic Studies on Testability and Security for Network-on-Chip

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Software-Based Self-Test for Processors to guarantee high fault efficiency for structured faultsPrincipal Investigator

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BASIC STUDIES ON TEST ARCHITECTURE AND DESIGN FOR TESTABILITY FOR SYSTEM-ON-CHIP

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低消費電力性とテスト容易性をともに考慮したVLSI高位設計Principal Investigator

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分散共有メモリ環境において故障耐性を考慮した効率のよい分散アルゴリズムの設計Principal Investigator

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Distributed Algorithms for Implementing Highly Reliable Distributed Systems

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メモリ共有型マルチプロセッサシステムにおける無待機アルゴリズムに関する研究Principal Investigator

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BASIC STUDIES ON VLSISYNTHESIS FOR TESTABILITY FROM HIGHER LEVEL

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[Journal Article] Fast gathering despite a linear number of weakly Byzantine agents<sup>†</sup>2024

Author(s)

Journal Title

Inoue Michiko 井上美智子

井上美智子イノウエミチコ

INOUE Michiko 井上美智子