KANESHIRO Chinami 兼城千波

Researcher Number	30318993
Other IDs
Affiliation (based on the past Project Information) *help	2003 – 2004: 神奈川工科大学, 工学部, 助手 2001: Kanagawa Inst. Technol., Faculty of Eng., Inst., 工学部, 助手 1999 – 2001: 神奈川工科大学, 工学部, 助手
Review Section/Research Field	Principal Investigator Electronic materials/Electric materials Except Principal Investigator Electronic materials/Electric materials
Keywords	Principal Investigator センシングプローブ / 金属微粒子 / 集積化 / めっき / スプリングプローブ Except Principal Investigator 自然酸化膜 / フェルミ準位ピンニング / 表面処理 / surface treatment / interface control … More / surface control / Gallium Nitride / GaN / 界面制御 / 表面制御 / 窒化ガリウム / ショットキー接合 / Al_2O_3 / SiN_χ / Fermi level pinning / MIS structure / ECRプラズマ / MIS接合 / 窒化シリコン膜 / フェルミ準位ビンニング / アルミナ膜 / 窒化シリコン酸 / MIS構造 / natural oxide / Fermi level pinnning / ohmic contact / Schottky contact / フェルミン準位ピンニング / オーミック接合 / ナノショットキー / 化合物半導体 / 電気化学プロセス Less

金属微粒子によるコンタクトマイクロプローブの作製に関する研究Principal Investigator
- Principal Investigator
  
  兼城千波
- Project Period (FY)
  2003 – 2004
- Research Category
  
  Grant-in-Aid for Young Scientists (B)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  Kanagawa Institute of Technology
電気化学プロセスを利用したショットキー接合形成における溶液/半導体界面の反応機構
- Principal Investigator
  
  HASHIZUME Tamotsu
- Project Period (FY)
  1999
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas (A)
- Research Institution
  Hokkaido University
Metal contact formation to GaN based on the interface control technologies
- Principal Investigator
  
  HASHIZUME Tamotsu
- Project Period (FY)
  1999 – 2001
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  HOKKAIDO UNIVERSITY
"Insulated gate structures on GaN and their interface properties"
- Principal Investigator
  
  HASHIZUME Tamotsu
- Project Period (FY)
  1999 – 2001
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  HOKKAIDO UNIVERSITY

All 2004 2003

All Journal Article

[Journal Article] Chip-Bonding for Integrated Circuit by using Micro-spring Probe2004
- Author(s)
  Chinami Kaneshiro, Kohji Hohkawa
- Journal Title
  
  206th Meeting of The Electrochemical Society
  
  Pages: 1120-1120
- Data Source
  KAKENHI-PROJECT-15760227
[Journal Article] Liquid Sensor in Multi-Functional Integrated Circuit2004
- Author(s)
  C.Kaneshiro, K.Koh, A.Yamamura, K.Matsumoto, K.Hohkawa
- Journal Title
  
  Microfabricated Systems and MEMS VII PV 2004-09
  
  Pages: 324-329
- Data Source
  KAKENHI-PROJECT-15760227
[Journal Article] Fabrication of Micro-Contact Probe Using Mo-Cr Spring with Au Plating Bump2003
- Author(s)
  Chinami Kaneshiro, Kohji Hohkawa
- Journal Title
  
  2003 MRS Fall Meetings Proceedings ; Symposium A Micro- and Nanosystems 782
- Data Source
  KAKENHI-PROJECT-15760227

1. HASHIZUME Tamotsu (80149898)

# of Collaborated Projects: 3 results

# of Collaborated Products: 0 results
2. FUJIKURA Hajime (70271640)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
3. MOTOHISA Junichi (60212263)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
4. TAKEYAMA Mayumi (80236512)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
5. KASAI Seiya (30312383)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
6. 長谷川英機 (60001781)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
7. SEKI Shouhei

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

KANESHIRO Chinami 兼城千波

Research Projects

Research Products

Co-Researchers

金属微粒子によるコンタクトマイクロプローブの作製に関する研究Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

電気化学プロセスを利用したショットキー接合形成における溶液/半導体界面の反応機構

Principal Investigator

Project Period (FY)

Research Category

Research Institution

Metal contact formation to GaN based on the interface control technologies

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

"Insulated gate structures on GaN and their interface properties"

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Journal Article] Chip-Bonding for Integrated Circuit by using Micro-spring Probe2004

Author(s)

Journal Title

Data Source

[Journal Article] Liquid Sensor in Multi-Functional Integrated Circuit2004

Author(s)

Journal Title

Data Source

[Journal Article] Fabrication of Micro-Contact Probe Using Mo-Cr Spring with Au Plating Bump2003

Author(s)

Journal Title

Data Source

KANESHIRO Chinami 兼城 千波

Research Projects

Research Products

Co-Researchers

金属微粒子によるコンタクトマイクロプローブの作製に関する研究Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

電気化学プロセスを利用したショットキー接合形成における溶液/半導体界面の反応機構

Principal Investigator

Project Period (FY)

Research Category

Research Institution

Metal contact formation to GaN based on the interface control technologies

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

"Insulated gate structures on GaN and their interface properties"

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Journal Article] Chip-Bonding for Integrated Circuit by using Micro-spring Probe2004

Author(s)

Journal Title

Data Source

[Journal Article] Liquid Sensor in Multi-Functional Integrated Circuit2004

Author(s)

Journal Title

Data Source

[Journal Article] Fabrication of Micro-Contact Probe Using Mo-Cr Spring with Au Plating Bump2003

Author(s)

Journal Title

Data Source

KANESHIRO Chinami 兼城千波