Bitou Youichi 尾藤洋一

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BITOU Youichi 尾藤洋一

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Researcher Number	30357842
Other IDs
Affiliation (Current)	2025: 国立研究開発法人産業技術総合研究所, 計量標準総合センター, 副研究部門長
Affiliation (based on the past Project Information) *help	2021 – 2024: 国立研究開発法人産業技術総合研究所, 計量標準総合センター, 副研究部門長 2006: National Institute of Advanced Industrial Science and Technolog, Metrology Institute of Japan, Senior Research Scientist, 計測標準研究部門, 主任研究員 2005: 独立行政法人産業技術総合研究所, 計測標準研究部門, 研究員
Review Section/Research Field	Principal Investigator Basic Section 18020:Manufacturing and production engineering-related Except Principal Investigator Basic Section 21030:Measurement engineering-related / Applied optics/Quantum optical engineering
Keywords	Principal Investigator マイクロCMM / 形状測定 / フリーフォーム / 精密形状計測 / 計量標準 / 三次元計測 / 精密計測 / トレーサビリティ / CMM / 形状計測 … More Except Principal Investigator … More 光コム / 位相 / 両面干渉計 / 群屈折率 / デュアルコム分光 / displacement measurement / optical cavity / interferometry / Yb / mode-locked laser / ultrashort pulsed laser / picometer metrology / optical comb / 高効率動作 / 共振器 / モード同期レーザ / 超短パルスレーザ / 変位計測 / 光共振器 / 干渉計測 / イッテルビウム / モード同期レーザー / 超短パルスレーザー / ピコメートル計測 Less

Development of a high-precision method for measuring the group refractive index using a dual-comb spectral interferometer and a double-sided interferometer.
- Principal Investigator
  
  清水祐公子
- Project Period (FY)
  2022 – 2024
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Review Section
  
  Basic Section 21030:Measurement engineering-related
- Research Institution
  National Institute of Advanced Industrial Science and Technology
Development of high precision free-form shape measurement system traceable to Avogadro's constantPrincipal Investigator
- Principal Investigator
  
  Bitou Youichi
- Project Period (FY)
  2021 – 2023
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Review Section
  
  Basic Section 18020:Manufacturing and production engineering-related
- Research Institution
  National Institute of Advanced Industrial Science and Technology
Absolute optical frequency scanning interferometry for picometer displacement measurement using femtosecond optical combs
- Principal Investigator
  
  MINOSHIMA Kaoru
- Project Period (FY)
  2005 – 2006
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Applied optics/Quantum optical engineering
- Research Institution
  National Institute of Advanced Industrial Science and Technology (AIST)

All 2023 2022 2006 2005

All Journal Article Presentation

[Journal Article] Two-point diameter calibration of a sphere using a micro-coordinate measuring machine at NMIJ2022
- Author(s)
  Yohan Kondo, Akiko Hirai and Bitou Youichi
- Journal Title
  
  Metrologia
  
  Volume: 59 Issue: 2 Pages: 024005-024005
- DOI
  10.1088/1681-7575/ac579e
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21H01232
[Journal Article] Displacement metrology with sub-pm resolution in air based on a fs-comb wavelength synthesizer2006
- Author(s)
  T.R.Schibli, K.Minoshima, Y.Bitou, F.-L.Hong, H.Inaba, A.Onae, H.Matsumoto
- Journal Title
  
  Optics Express Vol.14-13
  
  Pages: 5984-5993
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17360034
[Journal Article] Accurate wide-range displacement measurement using tunable diode laser and optical frequency comb generator2006
- Author(s)
  Y.Bitou, T.R.Schibli, K.Minoshima
- Journal Title
  
  Optics Express Vol.14-2
  
  Pages: 644-654
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17360034
[Journal Article] Accurate wide-range displacement measurement using tunable diode laser and optical frequency comb generator2006
- Author(s)
  Y.Bitou, et al.
- Journal Title
  
  OPTICS EXPRESS 14・2
  
  Pages: 644-654
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17360034
[Journal Article] Phase-locked widely tunable optical single-frequency generator based on a femtosecond comb2005
- Author(s)
  T.R.Schibli, K.Minoshima, F.-L.Hong, H.Inaba, Y.Bitou, A.Onae, H.Matsumoto
- Journal Title
  
  Opt. Lett. Vol.30-17
  
  Pages: 2323-2325
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17360034
[Presentation] マイクロCMMを用いた球直径測定に関する研究―ブロックゲージ表面粗さの影響について―2023
- Author(s)
  近藤余範、川嶋なつみ、平井亜紀子、尾藤洋一
- Organizer
  精密工学会誌春季講演論文集
- Data Source
  KAKENHI-PROJECT-21H01232
[Presentation] マイクロCMMを用いた球直径測定に関する研究―T型先鋭スタイラスの開発―2023
- Author(s)
  近藤余範、川嶋なつみ、平井亜紀子、尾藤洋一
- Organizer
  精密工学会誌秋季講演論文集
- Data Source
  KAKENHI-PROJECT-21H01232

1. MINOSHIMA Kaoru (20358112)

# of Collaborated Projects: 1 results

# of Collaborated Products: 3 results
2. KAWATO Sakae (60313730)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
3. 近藤余範 (10586316)

# of Collaborated Projects: 1 results

# of Collaborated Products: 3 results
4. 早稲田篤 (20272172)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
5. 倉本直樹 (60356938)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
6. 水島茂喜 (60358091)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
7. 清水祐公子 (30357222)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
8. 平井亜紀子 (00357849)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
9. 大久保章 (30635800)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
10. 稲場肇 (70356492)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
11. 入松川知也 (00828056)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

Bitou Youichi 尾藤 洋一

BITOU Youichi 尾藤 洋一

Research Projects

Research Products

Co-Researchers

Development of a high-precision method for measuring the group refractive index using a dual-comb spectral interferometer and a double-sided interferometer.

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Development of high precision free-form shape measurement system traceable to Avogadro's constantPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Absolute optical frequency scanning interferometry for picometer displacement measurement using femtosecond optical combs

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Journal Article] Two-point diameter calibration of a sphere using a micro-coordinate measuring machine at NMIJ2022

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Displacement metrology with sub-pm resolution in air based on a fs-comb wavelength synthesizer2006

Author(s)

Journal Title

Description

Data Source

[Journal Article] Accurate wide-range displacement measurement using tunable diode laser and optical frequency comb generator2006

Author(s)

Journal Title

Description

Data Source

[Journal Article] Accurate wide-range displacement measurement using tunable diode laser and optical frequency comb generator2006

Author(s)

Journal Title

Description

Data Source

[Journal Article] Phase-locked widely tunable optical single-frequency generator based on a femtosecond comb2005

Author(s)

Journal Title

Description

Data Source

[Presentation] マイクロCMMを用いた球直径測定に関する研究―ブロックゲージ表面粗さの影響について―2023

Author(s)

Organizer

Data Source

[Presentation] マイクロCMMを用いた球直径測定に関する研究―T型先鋭スタイラスの開発―2023

Author(s)

Organizer

Data Source

Bitou Youichi 尾藤洋一

BITOU Youichi 尾藤洋一