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OKUNO Kimio  奥野 公夫

ORCIDConnect your ORCID iD *help
Researcher Number 40103395
Other IDs
External Links
Affiliation (based on the past Project Information) *help 1997: Nagasaki Inst.of Appl.Science, Depa.of Electri.Eng., Professor, 工学部, 教授
1991 – 1996: 長崎総合科学大学, 工学部, 助教授
Review Section/Research Field
Principal Investigator
表面界面物性 / Applied materials
Keywords
Principal Investigator
単原子層 / 薄膜 / 電界イオン顕微鏡 / 界面 / 電界放射 / 超薄膜層 / シリコン / Field ion microscope / Interface / 電界脱離 … More / Pd / Field emission / Semiconductor film / Thin-film / Ultrathin film / Silicon / 電界放射顕微鏡 / シリサイド合金 / シリサイド / 薄膜成長 / 半導体薄膜 / Film / Field emission microscope / Ultra thin film / Pseudomorph / 疑似形態 / 上層 / 成長層 / 電界電子放射顕微鏡 / 疑似形態層 / シリコン-半導体界面 / Si Less
  • Research Projects

    (5 results)
  •  Evaluation of Semiconductor-Metal Atomic Interfaces with High Field MicroscopiesPrincipal Investigator

    • Principal Investigator
      OKUNO Kimio
    • Project Period (FY)
      1996 – 1997
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      表面界面物性
    • Research Institution
      Nagasaki Institute of Applied Science
  •  半導体-金属原子界面層の電界放射・イオン顕微鏡による評価Principal Investigator

    • Principal Investigator
      奥野 公夫
    • Project Period (FY)
      1995
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Nagasaki Institute of Applied Science
  •  半導体-金属原子界面層の電界放射・イオン顕微鏡による評価Principal Investigator

    • Principal Investigator
      奥野 公夫
    • Project Period (FY)
      1994
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Nagasaki Institute of Applied Science
  •  半導体-金属原子界面層の電界放射・イオン顕微鏡による評価Principal Investigator

    • Principal Investigator
      奥野 公夫
    • Project Period (FY)
      1993
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Nagasaki Institute of Applied Science
  •  Evaluation of atomic layer at metal-metal interfaces with field ion microscopePrincipal Investigator

    • Principal Investigator
      OKUNO Kimio
    • Project Period (FY)
      1991 – 1992
    • Research Category
      Grant-in-Aid for General Scientific Research (C)
    • Research Field
      Applied materials
    • Research Institution
      Nagasaki Institute of Applied Science

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