TANISHIRO Yasumasa 谷城康眞

… Alternative Names

TANISHIORO Yasumasa 谷城康眞

TANISHIRO Masaetsu 谷城康真

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Researcher Number	40143648
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Affiliation (based on the past Project Information) *help	2010 – 2011: 東京工業大学, 大学院・理工学研究科, 助教 2006: Tokyo Institute of Technology, Department of Condensed Matter Physics, Assistant Professor, 大学院理工学研究科, 助手 2001 – 2005: 東京工業大学, 大学院・理工学研究科, 助手 1998: 東京工業大学, 大学院・理工学研究科, 助手 1991 – 1997: 東京工業大学, 理学部, 助手 1986 – 1988: Tokyo Institute of Technology, asistant, 理学部, 助手
Review Section/Research Field	Principal Investigator 表面界面物性 / Applied materials science/Crystal engineering Except Principal Investigator 結晶学 / 固体物性Ⅰ(光物性・半導体・誘電体) / Nanostructural science / Physical properties of metals / Physics / 表面界面物性 / Applied materials
Keywords	Principal Investigator SOI / CaF_2 / RHEED / epitaxial growth / surface and interface / silicon / シリコン / Si / 表面界面物性 / 電気伝導 … More / 表面加工 / 原子付加 / 超イオン伝導体 / STM … More Except Principal Investigator STM / シリコン表面 / 表面再配列構造 / 表面構造 / 走査トンネル顕微鏡 / 吸着構造 / 電子顕微鏡 / 結晶成長 / 高分解能・超高真空電子顕微鏡 / 超高真空電子顕微鏡 / 金 / 走査型トンネル顕微鏡 / 表面 / 表面電子顕微鏡 / REM / SPA-LEED / 反射電顕法 / その場観察 / Gold cluster / Si(111)7x7 / reconstructed surface structure / high-resolution UHV electron microscope / シリコン / 真空蒸着 / ヘテロエピタクシャル成長 / 超高真空・高分解能電子顕微鏡法 / シリコン-金属吸着構造 / シリコンー金属吸着構造 / 金属微粒子の構造 / Hydrogen on Si / Oxygen on Si / Si Surfaces / Reflection Electron Mictoscpy / Surface Electron Mictoscpy / 反射電子顕微法 / Si(III)表面 / ガス吸着 / 低温表面 / 表面顕微鏡法 / Surface Structure / UHV Electron Microsocpy / Scanning tunneling Microscopy / 表面局在構造解析 / STM型超高真空電子顕微鏡 / グラファイト / surface structure analysis by transmission electron diffraction / 7x7 reconstruction of silicon surface / UHV electron microscope / 表面・結晶成長のミクロプロセス / 金原子とクラスター構造の高分解能観察 / 高分解能反射顕微鏡法 / 透過回析法による表面構造解析 / シリコン表面の7×7再配列構造 / active site / rutile / gold / HRTEM / catalyst / in-situ TEM / ultra fine particle / STS / 金触媒 / ナノ粒子 / 活性サイト / ルチル / 高分解能TEM / 触媒 / その場観察TEM / 超微粒子 / Atomic chain / Helical multi-shell nanowire / Super ionic conductor / Nonlinear conductance / Ballistic transport / Quantum Point Contact / 量子化電気伝導 / 量子コンタクト / 融体 / ナノワイヤー / 量子化コンダクタンス / ナノワイヤ / 原子間力顕微鏡 / 原子鎖 / ヘリカル多層ナノワイヤ / 超イオン伝導体 / 非線形コンダクタンス / バリスティック伝導 / 量子ポイントコンタクト / electronic property / atomic structure / surface / Twin-tip / SOI / CaF_2 / Si / 電気伝導 / 表面界面物性 / 表面物性 / 双探針 / facet plane / surface conductivity / high index surfaces / adsorbate strcuctures / phase transition / silicon surfaces / 電子線回折 / サーファクタント / 高指数表面 / 表面超構造 / ファセット面 / 表面電気伝導 / 高指数面 / 相転移 / Reflection elect. microsc. / Transmission elect. microsc. / Si (001) 2x1 / Surface strain / Internal surface stress / Si(111)5x2-Au / Si(111) / 表面再構成 / 反対電顕法 / 透過電顕法 / Si(001)2×1 / 表面内部応力 / 表面歪 / phase transition of Si(III) surface / Si surfaces / current effect on surfaces / electromigration / 通電効果 / ステップ構造 / エレクトロマイグレ-ション / Si(111)表面相転移 / Si(111)相転移 / 表面電流効果 / エレクトロマイグレーション / シリコン表面での混晶成長 / 超高真空電子顕微鏡法 / シリコン(001) / 混晶 / 表面アニール / 表面拡散 / シリコン(111) / 白金(111) / イオンスパッター / 反射電子顕微鏡 / 表面プラズモン / ルミネッセンス / ナノプローブ / 収差補正 / 表面ステップ構造 / エピタクシャル成長 / surfactant / 金属超格子 Less

Angle Resolved Spectroscopic Observation of Electron Beam induced Radiation from Nano-Structures excited by Low-Energy Electron Nano-probe
- Principal Investigator
  
  TAKAYANAGI Kunio
- Project Period (FY)
  2007 – 2011
- Research Category
  
  Grant-in-Aid for Scientific Research (S)
- Research Field
  
  Nanostructural science
- Research Institution
  Tokyo Institute of Technology
Observation of quantum effect of catalyst activity of Gold Nanoisland / MO_x
- Principal Investigator
  
  TAKAYANAGI Kunio
- Project Period (FY)
  2004 – 2006
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Nanostructural science
- Research Institution
  Tokyo Institute of Technology
Quantum Contact
- Principal Investigator
  
  TAKAYANAGI Kunio
- Project Period (FY)
  2000 – 2003
- Research Category
  
  Grant-in-Aid for Specially Promoted Research
- Review Section
  
  Physics
- Research Institution
  Tokyo Institute of Technology
超イオン伝導体走査探針による金属原子の連続付加による表面加工Principal Investigator
- Principal Investigator
  
  谷城康眞
- Project Period (FY)
  1997 – 1998
- Research Category
  
  Grant-in-Aid for Exploratory Research
- Research Field
  
  Applied materials science/Crystal engineering
- Research Institution
  Tokyo Institute of Technology
MECHANISMS OF EPITAXY AND PROPERTIES OF COHERENT THIN FILMS
- Principal Investigator
  
  YAGI Katsumichi
- Project Period (FY)
  1995 – 1997
- Research Category
  
  Grant-in-Aid for international Scientific Research
- Research Field
  
  表面界面物性
- Research Institution
  TOKYO INSTITUTE OF TECHNOLOGY
Development of twin-tip STM and application to surface sciencePrincipal Investigator
- Principal Investigator
  
  TANISHIRO Yasumasa, 八木克道
- Project Period (FY)
  1995 – 1997
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  固体物性Ⅰ(光物性・半導体・誘電体)
- Research Institution
  Tokyo Institute of Technology
Growth of Silicon Thin Film on Si (111)-CaF_2 for the Measurement of Surface Electronic PropertiesPrincipal Investigator
- Principal Investigator
  
  TANISHIRO Yasumasa
- Project Period (FY)
  1994 – 1995
- Research Category
  
  Grant-in-Aid for General Scientific Research (C)
- Research Field
  
  表面界面物性
- Research Institution
  Tokyo Institute of Technology
TRANSMISSION ELECTRON MICROSCOPE STUDY OF INTERNAL STRESSES AT RECONSTRUCTED CLEAN AND METAL ADSORBED SURFACES
- Principal Investigator
  
  YAGI Katsumichi
- Project Period (FY)
  1993 – 1994
- Research Category
  
  Grant-in-Aid for General Scientific Research (B)
- Research Field
  
  固体物性Ⅰ(光物性・半導体・誘電体)
- Research Institution
  TOKYO INTITUTE OF TECHNOLOGY
金属超格子を作る新しい試みのその場電顕法による研究
- Principal Investigator
  
  YAGI Katsumichi
- Project Period (FY)
  1991
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Research Institution
  Tokyo Institute of Technology
Reflection Microscope Study of Current Effects on Si surfaces
- Principal Investigator
  
  YAGI Katsumichi
- Project Period (FY)
  1991 – 1992
- Research Category
  
  Grant-in-Aid for General Scientific Research (B)
- Research Field
  
  Applied materials
- Research Institution
  Tokyo Institute of Technology
Studies on Surfaces and Heterogrowths by High-Resolution UHV Electron Microscopy
- Principal Investigator
  
  TAKAYANAGI K
- Project Period (FY)
  1987 – 1988
- Research Category
  
  Grant-in-Aid for General Scientific Research (B)
- Research Field
  
  結晶学
- Research Institution
  Tokyo Institute of Technology
反射電子顕微鏡法によるイオンスパッター過程のその場観察
- Principal Investigator
  
  八木克道
- Project Period (FY)
  1986
- Research Category
  
  Grant-in-Aid for Special Project Research
- Research Institution
  Tokyo Institute of Technology
超高真空電子顕微鏡による非平衡状態からの混晶成長と構造の解析
- Principal Investigator
  
  高柳邦夫
- Project Period (FY)
  1986
- Research Category
  
  Grant-in-Aid for Special Project Research
- Research Institution
  Tokyo Institute of Technology
Development of STM for structure analysis of surfaces
- Principal Investigator
  
  TAKAYANAGI Kunio
- Project Period (FY)
  1986 – 1987
- Research Category
  
  Grant-in-Aid for Developmental Scientific Research
- Research Field
  
  Physical properties of metals
- Research Institution
  Tokyo Institute of Technology
Developemtn of Low temperture Surface Electron Mictoscpy and its Application to Gas Adsotption on Surfaces.
- Principal Investigator
  
  YAGI Katsumichi
- Project Period (FY)
  1986 – 1987
- Research Category
  
  Grant-in-Aid for Developmental Scientific Research
- Research Field
  
  結晶学
- Research Institution
  Tokyo Institute of Technology
Ultra-high vacuum electron microscope study on Micro-processes of surface and crystal growth.
- Principal Investigator
  
  TAKAYANAGI Kunio
- Project Period (FY)
  1984 – 1986
- Research Category
  
  Grant-in-Aid for General Scientific Research (A)
- Research Field
  
  結晶学
- Research Institution
  Tokyo Institute of Technology

All 2012 2011 2010 2009 2008

All Journal Article Presentation

[Journal Article] Electron microscopy at a sub-50 pm resolution2011
- Author(s)
  K.Takayanagi, S.Kim, S.Lee, Y.Oshima, T.Tanaka, Y.Tanishiro, H.Sawada, F.Hosokawa, T.Tomita, T.Kaneyama, Y.Kondo
- Journal Title
  
  Journal of Electron Microsc
  
  Volume: 60 Issue: suppl 1 Pages: S239-S244
- DOI
  10.1093/jmicro/dfr048
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19101004
[Journal Article] Electronmicroscopy ata sub-50 pm resolution2011
- Author(s)
  K. Takayanagi, S. Kim, S. Lee, Y. Oshima, T. Tanaka, Y. Tanishiro, H. Sawada, F. Hosokawa, T. Tomita, T. Kaneyama and Y. Kondo
- Journal Title
  
  Journalof ElectronMicrosc
  
  Volume: Vol.60
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19101004
[Journal Article] Quantitative Annular Dark Field STEM Image of Silicon Crystal using a Large Convergent Electron Probe with a 300-kv Cold Field Emission Gun2010
- Author(s)
  S.Kim, Y.Oshima, H.sawada, T.Kaneyama, Y.Kondo, M.Takeguchi, Y.Nakayama, Y.Tanishiro, K.Takayanagi
- Journal Title
  
  Journal of Electron Microscopy
  
  Volume: 60 Pages: 109-116
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19101004
[Journal Article] Quantita tive Annular Dark Field STEM Image of Silicon Crystal using a Large Conver gent Electron Probe with a 300-kV Col d Field Emission Gun2010
- Author(s)
  S. Kim, Y. Oshima, H. Sawada, T. Kaneyama, Y. Kondo, M. Takeguchi, Y. Nakayama, Y. Tanishiro, and K. Takayanagi
- Journal Title
  
  Journal of Elec tron Microscopy
  
  Volume: Vol.60 Pages: 109-116
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19101004
[Journal Article] Direct Imaging of Lithium Atoms in LiV_2O_4 by a Spherical Aberration Corrected Electron Microscope2010
- Author(s)
  Y.Oshima, H.Sawada, F.Hosokawa, E.Okunishi, T.Kaneyama, Y.Kondo, S.Niitaka, H.Takagi, Y.Tanishiro, K.Takayanagi
- Journal Title
  
  Journal of Electron Microscopy
  
  Volume: 59 Pages: 457-467
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19101004
[Journal Article] Direct Imaging of Lithium Atoms in LiV2O4 by a Spherical Aberration Co rrected Electron Microscope2010
- Author(s)
  Y. Oshima, H. Sawada, F. Hosokawa, E. Okunishi, T. Kaneyama, Y. Kondo, S. Niitaka, H. Takagi, Y. Tanishiro, and K. Takayanagi
- Journal Title
  
  Journal of Electron M icroscopy
  
  Volume: Vol.59
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19101004
[Journal Article] A Dopant Cluster in a Highly Antimony Doped Silicon Crystal2010
- Author(s)
  S.Kim, Y.Oshima, H.Sawada, N.Hashikawa, K.Asayama, T.Kaneyama, Y.Kondo, Y.Tanishiro, K.Takayanagi
- Journal Title
  
  Applied Physics.Express
  
  Volume: 3
- NAID
  10026586310
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19101004
[Journal Article] A Dopant Cluster in a Highly Antimony Doped Si licon Crystal2010
- Author(s)
  S. Kim, Y. Oshima, H. Sawada, N. Hashikawa, K. Asayama, T. Kaneyama, Y. Kondo, Y. Tanishiro and K. Takayanagi
- Journal Title
  
  Applied Physics. Expre ss
  
  Volume: Vol.3
- NAID
  10026586310
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19101004
[Journal Article] STEM imaging of 47-pm-separated atomic columns by a spherical aberration -corrected electron microscope with a 300-kV cold field emission gun2009
- Author(s)
  H. Sawada, Y. Tanishiro, N. Ohashi, T. Tomita F. Hosokawa, T. Kaneyama, Y. Kondo, K. Takayanagi
- Journal Title
  
  J. Electron. Microsc 58
  
  Pages: 357-361
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19101004
[Journal Article] STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun2009
- Author(s)
  H.Sawada, Y.Tanishiro, N.Ohashi, T.Tomita F.Hosokawa, T.Kaneyama, Y.Kondo, K.Takayanagi
- Journal Title
  
  J. Electron. Microsc. 58
  
  Pages: 357-361
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19101004
[Journal Article] Measurement Method of Aberration from Ronchigram by Autocorrelation Function2008
- Author(s)
  H. Sawada, T. Sannomiya, F. Hosokawa, T. Nakamichi, T. Kaneyama, T. Tomita, Y. Kondo, T. Tanaka, Y. Oshima, Y. Tanishiro, K. Takayanagi
- Journal Title
  
  Ultramicroscopy 108
  
  Pages: 1467-1475
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19101004
[Presentation] 球面収差補正STEMによるZコントラストイメージング2012
- Author(s)
  和田麻友香、谷城康眞、高柳邦夫
- Organizer
  日本物理学会、第67回年次大会
- Place of Presentation
  関西学院大学
- Year and Date
  2012-03-27
- Data Source
  KAKENHI-PROJECT-19101004
[Presentation] Z-contrast Imaging by Cs-corrected STEM2011
- Author(s)
  M.Wada、Y.Tanishiro, K.Takayanagi
- Organizer
  ISSS-6
- Place of Presentation
  Tokyo in Japan
- Year and Date
  2011-12-12
- Data Source
  KAKENHI-PROJECT-19101004
[Presentation] Observation of defects in CuInSe2 by 300kV aberration corrected scanning transmission electron microscope2011
- Author(s)
  A. Takeshita, T. Tanaka, T. Kubota, H. Miyake, H. Sawada, Y. Kondo, Y. Oshima, Y. Tanishiro and K. Takayanagi
- Organizer
  APS March Meeting 2011
- Place of Presentation
  Dallas USA
- Year and Date
  2011-03-21
- Data Source
  KAKENHI-PROJECT-19101004
[Presentation] An effect of probe current on ADF image intensity of Si crystal2011
- Author(s)
  S. Kim, Y. Oshima, Y. Tanishiro and K. Takayanagi
- Organizer
  APS March Meeting 2011
- Place of Presentation
  Dallas USA
- Year and Date
  2011-03-24
- Data Source
  KAKENHI-PROJECT-19101004
[Presentation] Z-contrast Imaging by Aberration-Corrected ADF-STEM2011
- Author(s)
  M.Wada, Y.Tanishiro, K.Takayanagi
- Organizer
  ALC'11
- Place of Presentation
  Korea
- Year and Date
  2011-05-24
- Data Source
  KAKENHI-PROJECT-19101004
[Presentation] Surface/interface imaging by ABF-STEM method : Litium ions in diffusion channel of LIB electrode materials2011
- Author(s)
  S. Lee, Y. Oshima, H. Sawada, F. Hosokawa, E. Okunishi, T. Kaneyama, Y. Kondo, Y. Tanishiro and K. Takayanagi
- Organizer
  ISSS-6
- Place of Presentation
  Tokyo Japan
- Year and Date
  2011-12-14
- Data Source
  KAKENHI-PROJECT-19101004
[Presentation] Z-contrast Imaging by Aberration-Corrected ADF-STEM2011
- Author(s)
  M. Wada, Y. Tanishiro and K. Takayanagi
- Organizer
  ALC' 11
- Place of Presentation
  Korea
- Year and Date
  2011-05-24
- Data Source
  KAKENHI-PROJECT-19101004
[Presentation] Z-contrast Imaging by Cs-corrected STEM2011
- Author(s)
  M. Wada、Y. Tanishiro and K. Takayanagi
- Organizer
  ISSS-6
- Place of Presentation
  Tokyo
- Year and Date
  2011-12-12
- Data Source
  KAKENHI-PROJECT-19101004
[Presentation] Visualization of Lithium Atoms in LiV_2O_4 by a SphericalAberration Corrected Electron Microscope2010
- Author(s)
  Y.Oshima, H.Sawada, E.Okunishi, Y.Kondo, S.Niitaka, H.Takagi, Y.Tanishiro, K.Takayanagi
- Organizer
  Microscopy & Microanalysis 2010 Meeting
- Place of Presentation
  Portland U.S.A
- Year and Date
  2010-08-04
- Data Source
  KAKENHI-PROJECT-19101004
[Presentation] Visualization of Lithium Atoms in LiV2O4 by a Spherical Aberration Corrected Electron Microscope2010
- Author(s)
  Y. Oshima, H. Sawada, E. Okunishi, Y. Kondo, S. Niitaka, H. Takagi, Y. Tanishiro and K. Takayanagi
- Organizer
  Microscopy & Microanalysis2010 Meeting
- Place of Presentation
  Portland U. S. A
- Year and Date
  2010-08-04
- Data Source
  KAKENHI-PROJECT-19101004
[Presentation] Visualization of Lithium Atoms in LiV2O4 using a Spherical Aberration Corrected Electron Microscope2010
- Author(s)
  Y. Oshima, H. Sawada, Y. Kondo, K. Takayanagi, Y. Tanishiro
- Organizer
  7th International Microscopy Congress
- Place of Presentation
  Riode Janeiro Brazil
- Year and Date
  2010-09-20
- Data Source
  KAKENHI-PROJECT-19101004
[Presentation] Visualization of Lithium Atoms in LiV_2O_4 using a Spherical Aberration Corrected Electron Microscope2010
- Author(s)
  Y.Oshima, H.Sawada, Y.Kondo, K.Takayanagi, Y.Tanishiro
- Organizer
  17th International Microscopy Congress
- Place of Presentation
  Rio de Janeiro, BRAZIL
- Year and Date
  2010-09-20
- Data Source
  KAKENHI-PROJECT-19101004

1. TAKAYANAGI Kunio (80016162)

# of Collaborated Projects: 8 results

# of Collaborated Products: 23 results
2. YAGI Katsumichi (90016072)

# of Collaborated Projects: 7 results

# of Collaborated Products: 0 results
3. MINODA Hiroki (20240757)

# of Collaborated Projects: 6 results

# of Collaborated Products: 0 results
4. YAMAMOTO Naoki (90108184)

# of Collaborated Projects: 3 results

# of Collaborated Products: 0 results
5. HASEGWA Shuzi (00228446)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
6. INO Shozo (70005867)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
7. OHSHIMA Yoshifumi (80272699)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
8. TANAKA Takayuki (10367120)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
9. 長尾忠昭 (40267456)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
10. 平山博之 (60271582)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
11. HENZLER M.

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
12. IWATUKI Masashi

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
13. KONDO Yukihito

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
14. HARADA Yoshiyasu

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
15. HORNVON Hoeg

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
16. HORN V.HOEGEN M.

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
17. HORN von Hoe

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
18. HENZLER M

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
19. YAGI Kastumichi

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

TANISHIRO Yasumasa 谷城 康眞

TANISHIORO Yasumasa 谷城 康眞

TANISHIRO Masaetsu 谷城 康真

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超イオン伝導体走査探針による金属原子の連続付加による表面加工Principal Investigator

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Development of twin-tip STM and application to surface sciencePrincipal Investigator

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Growth of Silicon Thin Film on Si (111)-CaF_2 for the Measurement of Surface Electronic PropertiesPrincipal Investigator

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TANISHIRO Yasumasa 谷城康眞

TANISHIORO Yasumasa 谷城康眞

TANISHIRO Masaetsu 谷城康真