hashizume masaki 橋爪正樹

… Alternative Names

橋爪正樹ハシヅメマサキ

Hashizume Masaki 橋爪正樹

HASHIZUME Masaki 橋爪正樹

Less

Researcher Number	40164777
Other IDs
External Links
Affiliation (Current)	2025: 放送大学, 徳島学習センター, 特任教授
Affiliation (based on the past Project Information) *help	2023: 放送大学, 徳島学習センター, 特任教授 2017 – 2021: 徳島大学, 大学院社会産業理工学研究部(理工学域), 教授 2016: 徳島大学, 大学院理工学研究部, 教授 2015: 徳島大学, ソシオテクノサイエンス研究部, 教授 2012 – 2013: 徳島大学, ソシオテクノサイエンス研究部, 教授 … More 2010 – 2011: 徳島大学, 大学院・ソシオテクノサイエンス研究部, 教授 2007 – 2008: The University of Tokushima, 大学院・ソシオテクノサイエンス研究部, 教授 2006: 徳島大学, 大学院ソシオテクノサイエンス研究部, 教授 2004 – 2005: 徳島大学, 工学部, 教授 2001 – 2003: 徳島大学, 工学部, 助教授 Less
Review Section/Research Field	Principal Investigator Computer system/Network / Computer system / Basic Section 60040:Computer system-related / 計算機科学
Keywords	Principal Investigator 電流テスト / CMOS / 断線 / 短絡 / 断線故障 / リード浮き / 電気検査 / current test / open defect / supply current … More / IC / SoC / 組込型検査回路 / フィールドテスト / ダイ間配線 / テスト容易化設計 / 破断検出 / 抵抗断線 / 予兆検出 / 電子デバイス・機器 / ディペンダブル・コンピューティング / 計算機システム / 電気的検査法 / 欠陥検出法 / 実装基板回路 / インターコネクトテスト / アセンブリ基板 / ３次元積層IC / 電気検査法 / 電荷量 / 欠陥検出 / 電荷注入 / IC検査 / lead open / electrical test / ピン浮き / CMOS論理回路 / IDDQテスト / 電気的検査 / lead opne / IC pin open / logic circuit / test / ICピン浮き故障 / 電源電流 / 論理回路 / テスト / CMOS　IC / 動的電源電圧変動 / 動的電源電流 / 遅延故障 / 電流センサ回路 / IDDTテスト / 高信頼性 / ミックスドシグナルIC / 検査容易化設計 / DA変換器 / マイクロコンピュータ / SiP / ディペンダブルコンピューティング / SoC, SiP Less

Design for Testability for Electrical Tests of Interconnects between Dies after ShipmentPrincipal Investigator
- Principal Investigator
  
  橋爪正樹
- Project Period (FY)
  2023 – 2025
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 60040:Computer system-related
- Research Institution
  The Open University of Japan
Open Defect Detection at Interconnects among IC Chips with Relaxation OscilatorsPrincipal Investigator
- Principal Investigator
  
  HASHIZUME Masaki
- Project Period (FY)
  2017 – 2020
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Computer system
- Research Institution
  The University of Tokushima
IC Test Method Based on Charge Volume Injected from a Power Supply Circuit within a Timing WindowPrincipal Investigator
- Principal Investigator
  
  Hashizume Masaki
- Project Period (FY)
  2015 – 2016
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Computer system
- Research Institution
  The University of Tokushima
Dynamic Supply Current Test Method with Built-in IDDT Appearance Time SensorPrincipal Investigator
- Principal Investigator
  
  HASHIZUME Masaki
- Project Period (FY)
  2012 – 2013
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Computer system/Network
- Research Institution
  The University of Tokushima
Supply Current Testable Design of DACs in SoCsPrincipal Investigator
- Principal Investigator
  
  HASHIZUME Masaki
- Project Period (FY)
  2010 – 2011
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Computer system/Network
- Research Institution
  The University of Tokushima
Current Testing for Opens and Shorts in SoCs and SiPsPrincipal Investigator
- Principal Investigator
  
  HASHIZUME Masaki
- Project Period (FY)
  2006 – 2008
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Computer system/Network
- Research Institution
  The University of Tokushima
Electrical Testing of Open Defects in Deep Sub-micron CMOS Logic CircuitsPrincipal Investigator
- Principal Investigator
  
  HASHIZUME Masaki
- Project Period (FY)
  2003 – 2005
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Computer system/Network
- Research Institution
  The University of Tokushima
Open Defect Detection Method Based on Supply Current in CMOS Logic CircuitsPrincipal Investigator
- Principal Investigator
  
  MASHIZUME Masaaki
- Project Period (FY)
  2001 – 2002
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  計算機科学
- Research Institution
  The University of Tokushima

[Journal Article] A DfT Technique for Electrical Interconnect Testing of Circuit Boards with 3D Stacked SRAM ICs2023
- Author(s)
  Yuki Ikiri, Hiroyuki Yotsuyanagi, Fara Ashikin Binti Ali, Shyue-Kung Lu, Masaki Hashizume
- Journal Title
  
  Proc. of 12th IEEE CPMT Symposium Japan (ICSJ2023)
  
  Volume: - Pages: 113-116
- Peer Reviewed / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23K11039
[Journal Article] Open Defect Detection in Assembled Circuit Boards with Built-In Relaxation Oscillators2021
- Author(s)
  Ikiri Yuki, Fumiya Sako, Hashizume Masaki, Yotsuyanagi Hiroyuki, Shyue-Kung Lu, Toru Yazaki, Yasuhiro Ikeda and Yutaka Uematsu
- Journal Title
  
  IEEE Transactions on Components, Packaging and Manufacturing Technology
  
  Volume: 11 Issue: 6 Pages: 931-943
- DOI
  10.1109/tcpmt.2021.3079159
- Peer Reviewed / Open Access / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01715
[Journal Article] Detectable Resistance Increase of Open Defects in Assembled PCBs by Quiescent Currents through Embedded Diodes2021
- Author(s)
  Yuya Okumoto, Hiroyuki Yotsuyanagi, Masaki Hashizume and Shyue-Kung Lu
- Journal Title
  
  Proc. of 2021 International Conference on Electronics Packaging (ICEP)
  
  Volume: -
- Peer Reviewed / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01715
[Journal Article] Temperature Sensing with a Relaxation Oscillator in CMOS ICs2020
- Author(s)
  Fumiya Sako, Yuki Ikiri, Masaki Hashizume, Hiroyuki Yotsuyanagi, Hiroshi Yokoyama and Shyue-Kung Lu
- Journal Title
  
  Proc. of The 35th International Technical Conference on Circuits/Systems, Computers and Communications
  
  Volume: - Pages: 141-144
- Peer Reviewed / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01715
[Journal Article] Open Defect Detection Not Utilizing Boundary Scan Flip-Flops in Assembled Circuit Boards2020
- Author(s)
  Michiya Kanda, Masaki Hashizume, Binti ALI Fara Ashikin, Hiroyuki Yotsuyanagi, Shyue-Kung Lu
- Journal Title
  
  IEEE Transactions on Components, Packaging and Manufacturing Technology
  
  Volume: 10 Issue: 5 Pages: 895-907
- DOI
  10.1109/tcpmt.2020.2973182
- Peer Reviewed / Open Access / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01715
[Journal Article] Electrical Field Test Method of Resistive Open Defects between Dies by Quiescent Currents through Embedded Diodes2019
- Author(s)
  Soneda Hanna、Hashizume Masaki、Yotsuyanagi Hiroyuki、Lu Shyue-Kung
- Journal Title
  
  Proc. of The IEEE 2019 International 3D Systems Integration Conference
  
  Volume: 1 Pages: 1-5
- DOI
  10.1109/3dic48104.2019.9058777
- Peer Reviewed / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01715
[Journal Article] Stand-by Mode Test Method of Interconnects between Dies in 3D ICs with IEEE 1149.1 Test Circuits2018
- Author(s)
  Kanda Michiya、Yabui Daisuke、Hashizume Masaki、Yotsuyanagi Hiroyuki、Lu Shyue-Kung
- Journal Title
  
  Proc. of IEEE CPMT Symposium Japan 2018
  
  Volume: 1 Pages: 189-192
- DOI
  10.1109/icsj.2018.8602560
- Peer Reviewed / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01715
[Journal Article] A Design for Testability of Open Defects at Interconnects in 3D Stacked ICs2018
- Author(s)
  ASHIKIN Fara、HASHIZUME Masaki、YOTSUYANAGI Hiroyuki、LU Shyue-Kung、ROTH Zvi
- Journal Title
  
  IEICE Trans. Inf. & Syst.
  
  Volume: E101.D Issue: 8 Pages: 2053-2063
- DOI
  10.1587/transinf.2018EDP7093
- NAID
  130007429462
- ISSN
  0916-8532, 1745-1361
- Year and Date
  2018-08-01
- Language
  English
- Peer Reviewed / Open Access / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01715
[Journal Article] A Power Supply Circuit for Interconnect Tests Based on Injected Charge Volume of 3D IC2016
- Author(s)
  Kouhei Ohtani, Masaki Hashizume, Daisuke Suga, Hiroyuki Yotsuyanagi and Shyue-Kung Lu
- Journal Title
  
  Proc. of IEEE CPMT Symposium Japan 2016
  
  Volume: － Pages: 139-140
- Peer Reviewed / Acknowledgement Compliant / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K12002
[Journal Article] A Built-in Test Circuit for Injected Charge Tests of Open Defects in CMOS ICs2016
- Author(s)
  Kouhei Ohtani, Daisuke Suga, Hiroyuki Yotsuyanagi and Masaki Hashizume
- Journal Title
  
  Proc. of International Technical Conference on Circuits/Systems, Computers and Communications 2016
  
  Volume: － Pages: 291-294
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-15K12002
[Journal Article] Electrical Test for Open Defects in CMOS ICs by Injected Charge2015
- Author(s)
  Daisuke Suga, Hiroyuki Yotsuyanagi, Hiroyuki Yotsuyanagi and Masaki Hashizume
- Journal Title
  
  Proc. of International Technical Conference on Circuits/Systems, Computers and Communications 2015
  
  Volume: _ Pages: 653-656
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-15K12002
[Journal Article] Electrical Interconnect Test Method of 3D ICs by Injected Charge Volume2015
- Author(s)
  Daisuke Suga, Masaki Hashizume, Hiroyuki Yotsuyanagi and Shyue-Kung Lu
- Journal Title
  
  Proc. of　IEEE 3D System Integration Conference 2015
  
  Volume: _ Pages: TS8.19.1-TS8.19.6
- DOI
  10.1109/3dic.2015.7334588
- Peer Reviewed / Acknowledgement Compliant / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K12002
[Journal Article] A Built-in Test Circuit for Detecting Open Defects by IDDT Appearance Time in CMOS ICs2014
- Author(s)
  Masaki Hashizume, Shohei Suenaga and Hiroyuki Yotsuyanagi
- Journal Title
  
  Proc. of International Conference on Design & Concurrent Engineering 2014
  
  Volume: (to appear)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24650021
[Journal Article] Built-in IDDT Appearance Time Sensor for Detecting Open Faults in 3D IC2013
- Author(s)
  Shohei Suenaga, Masaki Hashizume, Hiroyuki Yotsuyanagi, Tetsuo Tada and Shyue-Kung Lu
- Journal Title
  
  Proc. of IEEE CPMT Symposium Japan(ICSJ2013)
  
  Pages: 247-250
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24650021
[Journal Article] A Built-in Sensor for IDDT Testing of CMOS ICs2012
- Author(s)
  Shohei Suenaga, Hiroyuki Yotsuyanagi and Masaki Hashizume
- Journal Title
  
  Proc. of 2012 International Technical Conference on Circuits/Systems, Computers and Communications
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24650021
[Journal Article] A Supply Current Testable DAC of Resistor String Type2011
- Author(s)
  Masaki Hashizume
- Journal Title
  
  Proc.RISP International Workshop on Nonlinear Circuit and Signal Processing
  
  Pages: 13-16
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22650009
[Journal Article] A Supply Current Testable Register String DAC of Decoder Type2011
- Author(s)
  M.Hashizume, et al
- Journal Title
  
  Proc.of IEEE 11th International Symposium on Communications and Information Technologies
  
  Pages: 58-63
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22650009
[Journal Article] A Supply Current Testable DAC of Resistor String Type, Proc.2011
- Author(s)
  Masaki Hashizume, Yutaka Hata, Hiroyuki Yotsuyanagi, Yukiya Miura
- Journal Title
  
  RISP International Workshop on Nonlinear Circuit and Signal Processing
  
  Pages: 13-16
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22650009
[Journal Article] Practical Testability of Supply Current Testable DACs of Resistor Type2011
- Author(s)
  Miyamori Yoshihiko, Hiroyuki Yotsuyanagi, Masaki Hashizume
- Journal Title
  
  Proc. of 2011 International Technical Conference on Circuits/ Systems, Computers and Communications
  
  Pages: 1015-1018
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22650009
[Journal Article] A Supply Current Testable Register String DAC of Decoder Type2011
- Author(s)
  Masaki Hashizume, Yutaka Hata, Hiroyuki Yotsuyanagi, Yukiya Miura
- Journal Title
  
  Proc. of IEEE 11th International Symposium on Communications and Information Technologies
  
  Pages: 58-63
- DOI
  10.1109/iscit.2011.6092183
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22650009
[Journal Article] Open Lead Detection of QFP ICs Using Logic Gates as Open Sensors2009
- Author(s)
  Akira Ono, Hiroyuki Yotsuyanagi, Masao Takagi, Masaki Hashizume
- Journal Title
  
  Proc. of International Conference on ElectronicsPackaging 2009
  
  Pages: 434-439
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18500039
[Journal Article] CMOS ゲート回路を断線センサとして用いた部品結合不良検出法2009
- Author(s)
  小野安季良, 一宮正博, 四柳浩之, 高木正夫, 橋爪正樹
- Journal Title
  
  エレクトロニクス実装学会誌 Vol.12, No.2
  
  Pages: 137-143
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18500039
[Journal Article] Open Lead Detection Based on Logical Change Caused by AC Voltage Signal Stimulus2008
- Author(s)
  Akira Ono, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Masao Takagi, Masaki Hashizume
- Journal Title
  
  Proc. of 2008 International Technical Conference on Circuits/Systems, Computers and Communications
  
  Pages: 241-244
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18500039
[Journal Article] Test Method for Detecting Open Leads of Low Voltage LSIs2008
- Author(s)
  Akira Ono, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Masao Takagi , Masaki Hashizume
- Journal Title
  
  Proc. of International Conference on Electronics Packaging 2008
  
  Pages: 457-462
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18500039
[Journal Article] Current Testble Design of Resistor String DACs for Open Defects2008
- Author(s)
  Yutaka Hata, Masaki Hashizume, Hiroyuki Yotsuyanagi, Yukiya Miura
- Journal Title
  
  Proc. of 2008 International Technical Conference on Circuits/Systems, Computers and Communications
  
  Pages: 1533-1536
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18500039
[Journal Article] Open Lead Detection of CMOS Logic Circuits by Low Pressure Probing2007
- Author(s)
  Ono Akira, Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi
- Journal Title
  
  Proc. of International Conference on Electronics Packaging
  
  Pages: 359-364
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18500039
[Journal Article] 交流電界印加時の電流テストによる CMOS LSIのリード浮き検出のための印加交流電圧2007
- Author(s)
  高木正夫, 橋爪正樹, 一宮正博, 四柳浩之
- Journal Title
  
  エレクトロニクス実装学会誌 Vol.8, No.3
  
  Pages: 219-228
- NAID
  110006249330
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18500039
[Journal Article] Current Testable Design of Resistor String DACs2007
- Author(s)
  Masaki Hashizume, Yutaka Hata, Tomomi Nishida, Hiroyuki Yotsuyanagi, Yukiya Miura
- Journal Title
  
  Proc. of 16th Asian Test Symposium
  
  Pages: 399-403
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18500039
[Journal Article] Interconnect Open Detection by Supply Current Testing under AC Electric Field Application2007
- Author(s)
  Masaki Hashizume, Yuuki Ogata, Mitsuru Tojo, Masahiro Ichimiya, Hiroyuki Yotsuyanagi
- Journal Title
  
  Proc. of IEEE International Workshop on Current and Defect Based Testing
  
  Pages: 25-29
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18500039
[Journal Article] Interconnect Open Detection by Supply Current Testing under AC Electric Field Application2007
- Author(s)
  Masaki Hashizume
- Journal Title
  
  Proc. of IEEE International Workshop on Current and Defect Based Testing
  
  Pages: 25-29
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18500039
[Journal Article] est Circuit for Vectorless Open Lead Detection of CMOS Ics2007
- Author(s)
  Masaki Hashizume, Masahiro Ichimiya, Akira Ono and Hiroyuki Yotsuyanagi
- Journal Title
  
  IEEE 6-th International Board Test Workshop
- URL
  http://www.molesystems.com/BTW/material/BTW07//Papers/BTW07-Paper%202.3.pdf,
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18500039
[Journal Article] Current Testable Design of Resistor String DACs2007
- Author(s)
  Masaki Hashizume
- Journal Title
  
  Proc. of IEEE 16th Asian Test Symposium
  
  Pages: 399-403
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18500039
[Journal Article] Test Circuit for Open Lead Detection of CMOS ICs Based on Supply Current2006
- Author(s)
  Masaki Hashizume, Hiroyuki Yotsuyanagi
- Journal Title
  
  the IEEE European Board Test Workshop
- URL
  http://www.molesystems.com/BTW/material/EBTW06//EBTW06%20Papers/EBTW06-4-1-Hashizume.pdf
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18500039
[Journal Article] At Speed Testing of Bus Interconnects in Microcomputers2006
- Author(s)
  Eiji Tasaka, Masaki Hashizume, Seiichi Nishimoto, Hiroyuki Yotsuyanagi, Takahiro Oie, Ikuro Morita, Toshihiro Kayahara
- Journal Title
  
  Proc. of IEEE 7th Workshop on RTL and High Level Testing
  
  Pages: 123-127
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18500039
[Journal Article] Test Circuit for Open Lead Detection of CMOS ICs Based on Supply Current2006
- Author(s)
  Masaki Hashizume
- Journal Title
  
  IEEE European Board Test Workshop 2006
- Data Source
  KAKENHI-PROJECT-18500039
[Journal Article] Open Lead Detection Based on Supply Current of CMOS Logic Circuits by AC voltage Signal Application2006
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc. of International Conference on Electronics Packaging (to appear)
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] Open Lead Detection Based on Supply Current of CMOS Logic Circuits by AC Voltage Signal Application2006
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc. of the 2006 International Conference on Electronics Packaging (to appear)
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] Open Lead Detection Based on Supply Current of CMOS Logic Circuits by AC Voltage Signal Application2006
- Author(s)
  Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada
- Journal Title
  
  Proc. of International Conference on Electronics Packaging
  
  Pages: 147-152
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18500039
[Journal Article] Current Testing of Interconnect Opens between CMOS LSIs Having Scan Cells2006
- Author(s)
  Tojo Mitsuru, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Masaki Hashizume
- Journal Title
  
  Proc. of IEEE International Workshop on Current and Defect Based Testing
  
  Pages: 39-42
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18500039
[Journal Article] Open Lead Detection Based on Supply Current of CMOS Logic Circuits by AC Voltage Signal Application2006
- Author(s)
  Masaki Hashizume
- Journal Title
  
  Proceedings of International Conference on Electronics Packaging 2006
  
  Pages: 147-152
- Data Source
  KAKENHI-PROJECT-18500039
[Journal Article] Open Leads Detection Based on Supply Current of CMOS Logic Circuits by AC Voltage Signal Application2006
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc.of International Conference on Electronics Packaging (to appear)
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] Electric Field for Detecting Open Leads in CMOS Logic Circuits by Supply Current Testing2005
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc.of IEEE International Symposium on Circuits and Systems
  
  Pages: 2995-2998
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] Electric Field for Detecting Open Leads in CMOS Logic Circuits by Supply Current Testing2005
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc.of IEEE International Symposium on Circuits and Systems (to appear)
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] Vectorless Open Pin Detection Method for CMOS Logic Circuits2005
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc.of International Conference on Electronics Packaging
  
  Pages: 391-396
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] Electric Field for Detecting Open Leads in CMOS Logic Circuits by Supply Current Testing2005
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc. of IEEE International Symposium on Circuits and Systems
  
  Pages: 2995-2998
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] Vectorless Open Pin Detection Method for CMOS Logic Circuits2005
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc. of the 2005 International Conference on Electronics Packaging
  
  Pages: 391-396
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] Vectorless Open Pin Detection Method for CMOS Logic Circuits2005
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc. of International Conference on Electronics Packaging
  
  Pages: 391-396
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] Electric Field for Detecting Open Leads in CMOS Logic Circuits by Supply Current Testing2005
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc. of the IEEE International Symposium on Circuits and Systems
  
  Pages: 2995-2998
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] Vectorless Open Pin Detection Method for Logic Circuits2005
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc.of International Conference on Electronics Packaging (to appear)
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] Current Testable Design of Register String DACs2005
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc of IEEE International Workshop on Electronic Design, Test and Applications
  
  Pages: 197-200
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] Current Testable Design of Register String DACs2005
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc.of IEEE International Workshop on Electronic Design, Test and Applications
  
  Pages: 197-200
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] Current Testable Design of Register String DACs2005
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc. of the IEEE International Workshop on Electronic Design, Test and Applications
  
  Pages: 197-200
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] Identification and Frequency estimation of Feedback Bridging Faults Generating Logical Oscillation in CMOS Circuits2004
- Author(s)
  M.Hashizume
- Journal Title
  
  IEICE Transaction on Information and Systems E87-D・3
  
  Pages: 571-579
- NAID
  110003213913
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] CMOS Open Fault Detection by Appearance Time of Switching Supply Current2004
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc.of the IEEE 2^<nd> International Workshop on Electronic Design, Test & Application
  
  Pages: 183-188
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] IDDQ Test method Based on Wavelet Transformation for Noisy Current Measurement Environment2004
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc.of the 13-th IEEE Asian Test Symposium
  
  Pages: 112-117
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] Test Circuit for CMOS Lead Open Detection by Supply Current Testing under AC Electric Field Application2004
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc. of the IEEE 47-th Midwest Symposium on Circuits and Systems
  
  Pages: 1557-1560
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] IDDQ Test method Based on Wavelet Transformation for Noisy Current Measurement Environment2004
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc. of the 13-th IEEE Asian Test Symposium
  
  Pages: 112-117
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] Test Circuit for CMOS Lead Open Detection by Supply Current Testing under AC Electric Field Application2004
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc.of the IEEE 47-th Midwest Symposium on Circuits and Systems
  
  Pages: 1557-1560
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] CMOS Open Fault Detection by Appearance Time of Switching Supply Current2004
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc.of the second IEEE International Workshop on Electronic Design, Test, and Applications
  
  Pages: 183-188
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] IDDQ Test Method Based on Wavalet Transformation for Noisy Current Measurement Environment2004
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc.of the 13-th IEEE Asian Test Symposium
  
  Pages: 112-117
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] Identification and Frequency Estimation of Feedback Bridging Faults Generating Logical Oscillation in CMOS Circuits2004
- Author(s)
  M.Hashizume
- Journal Title
  
  IEICE Transactions on Information and Systems Vol.E87-D, No.3
  
  Pages: 571-579
- NAID
  110003213913
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] CMOS Open Fault Detection by Appearance Time of Switching Supply Current2004
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc. of the second IEEE International Workshop on Electronic Design, Test, and Applications
  
  Pages: 183-188
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] A BIST Circuit for IDDQ Tests2003
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc.of the 12-th IEEE Asian Test Symposium
  
  Pages: 390-395
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] Testability of Supply Current Test in an AGC2003
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc.of the 2003 International Technical Conference on Circuits/Systems, Computers and Communications
  
  Pages: 836-839
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] Electric Field Application Method Effective for Pin Open Detection Based on Supply Current in CMOS Logic Circuits2003
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc.of the 2003 International Conference on Electronics Packaging
  
  Pages: 75-80
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] Electric Field Application Method Effective for Pin Open Detection Based on Supply Current in CMOS Logic Circuits2003
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc. of the 2003 International Conference on Electronics Packaging
  
  Pages: 75-80
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] Testability of Supply Current Test in an AGC2003
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc. of the 2003 International Technical Conference on Circuits/Systems, Computers and Communications
  
  Pages: 836-839
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] A Supply Current Test Method for Bridging Faults in CMOS Microprocessor Based Circuits2003
- Author(s)
  M.Hashizume
- Journal Title
  
  Journal of Japan Institute of Electronics Packaging Vol.6, No.7
  
  Pages: 564-572
- NAID
  10013959093
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] CMOSマイクロコンピュータ回路の電源電流によるブリッジ故障検出法2003
- Author(s)
  橋爪正樹
- Journal Title
  
  エレクトロニクス実装学会誌 6・7
  
  Pages: 564-572
- NAID
  10013959093
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15500041
[Journal Article] A BIST Circuit for IDDQ Tests2003
- Author(s)
  M.Hashizume
- Journal Title
  
  Proc. of the 12-th IEEE Asian Test Symposium
  
  Pages: 390-395
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15500041
[Patent] 論理回路の断線故障の検査装置2006
- Inventor(s)
  橋爪正樹, 一宮正博
- Industrial Property Rights Holder
  青野敏博
- Industrial Property Number
  2006-114044
- Filing Date
  2006-04-18
- Data Source
  KAKENHI-PROJECT-18500039
[Patent] 電子回路の配線故障検査法とその検査容易化回路2006
- Inventor(s)
  橋爪正樹, 一宮正博, 四柳浩之
- Industrial Property Rights Holder
  青野敏博
- Industrial Property Number
  2006-309430
- Filing Date
  2006-11-15
- Data Source
  KAKENHI-PROJECT-18500039
[Patent] 固体撮像装置およびその特性検査方法2006
- Inventor(s)
  山達正明, 橋爪正樹
- Industrial Property Rights Holder
  シャープ, 徳島大学
- Industrial Property Number
  2006-032796
- Filing Date
  2006-02-09
- Data Source
  KAKENHI-PROJECT-15500041
[Patent] 固体撮像装置およびその特性検査方法2006
- Inventor(s)
  山達正明, 橋爪正樹
- Industrial Property Rights Holder
  シャープ, 徳島大学
- Industrial Property Number
  2006-032796
- Filing Date
  2006-02-09
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15500041
[Patent] 電源電流による検査容易化論理回路2004
- Inventor(s)
  橋爪正樹, 一宮正博
- Industrial Property Rights Holder
  橋爪正樹, 一宮正博
- Filing Date
  2004-10-14
- Data Source
  KAKENHI-PROJECT-15500041
[Patent] 回路検査装置2002
- Inventor(s)
  一宮正博, 橋爪正樹
- Industrial Property Rights Holder
  一宮正博, 橋爪正樹
- Filing Date
  2002-03-30
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15500041
[Presentation] アナログ素子のみで構成する弛緩発振器によるIC間抵抗断線の検出可能性調査2023
- Author(s)
  大松正男, 大寺佑都, 四柳浩之, 橋爪正樹, Shyue-Kung Lu
- Organizer
  エレクトロニクス実装学会第33回マイクロエレクトロニクスシンポジウム
- Data Source
  KAKENHI-PROJECT-23K11039
[Presentation] オフセットキャンセル型コンパレータ内インバータゲートの増幅度の温度依存性2023
- Author(s)
  小松原滉人, 大松正男, 四柳浩之, 橋爪正樹
- Organizer
  電気・電子・情報関係学会四国支部連合大会
- Data Source
  KAKENHI-PROJECT-23K11039
[Presentation] Recovery of Defective TSVs with A Small Number of Redundant TSVs in 3D Stacked ICs2021
- Author(s)
  Yuki Ikiri, Masaki Hashizume, Hiroyuki Yotsuyanagi, Hiroshi Yokoyama and Shyue-Kung Lu
- Organizer
  The 21st IEEE Workshop on RTL and High Level Testing
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01715
[Presentation] 電流テストによるダイ間断線検出のためのpMOSのオン抵抗値を用いた断線抵抗値の推定2020
- Author(s)
  奥本裕也, 曽根田伴奈, 橋爪正樹, 四柳浩之, Shyue-Kung Lu
- Organizer
  電子情報通信学会ソサイエティ大会
- Data Source
  KAKENHI-PROJECT-17H01715
[Presentation] アナログ素子で構成する弛緩発振器によるCMOS IC内温度測定2020
- Author(s)
  大寺佑都, 硲文弥, 伊喜利勇貴, 四柳浩之, 橋爪正樹, Shyue-Kung Lu
- Organizer
  電子情報通信学会ソサイエティ大会
- Data Source
  KAKENHI-PROJECT-17H01715
[Presentation] 弛緩発振器を用いた組込み型温度センサによる温度推定の可能性2020
- Author(s)
  硲文弥, 伊喜利勇貴, 橋爪正樹, 四柳浩之, 横山洋之, Shyue-Kung Lu
- Organizer
  電気・電子・情報関係学会四国支部連合大会
- Data Source
  KAKENHI-PROJECT-17H01715
[Presentation] 電気試験法による実装基板内抵抗断線の出荷後検出法2019
- Author(s)
  曽根田伴奈, 神田道也, 四柳浩之, 橋爪正樹, Shyue-Kung Lu
- Organizer
  第29回マイクロエレクトロニクスシンポジウム
- Data Source
  KAKENHI-PROJECT-17H01715
[Presentation] Health Monitoring of Electronic Circuits in IoT Systems2019
- Author(s)
  Masaki Hashizume
- Organizer
  The 5-th International Forum on Advanced Technologies
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01715
[Presentation] バウンダリスキャンテストによる3D IC内ダイ間抵抗断線検出可能性調査2019
- Author(s)
  池内康祐, 神田道也, 四柳浩之, 橋爪正樹, Shyue-Kung Lu
- Organizer
  第29回マイクロエレクトロニクスシンポジウム
- Data Source
  KAKENHI-PROJECT-17H01715
[Presentation] バウンダリスキャンテスト回路を用いた待機モード時電気試験を可能にするTAPCの開発2019
- Author(s)
  池内康祐, 神田道也, 平井智士, 四柳浩之, 橋爪正樹
- Organizer
  第33回エレクトロニクス実装学会春季講演大会
- Data Source
  KAKENHI-PROJECT-17H01715
[Presentation] Oscillation Frequency Estimation of Ring Oscillator for Interconnect Tests in 3D Stacked ICs2018
- Author(s)
  Miyatake Noriko, Masaki Hashizume, Hiroyuki Yotsuyanagi, Hiroshi Yokoyama and Tetsuo Tada
- Organizer
  2018 RISP International Workshop on Nonlinear Circuits, Communications
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01715
[Presentation] MOS製造ばらつきに対するダイオード組込型検査用回路を用いた検査法の抵抗断線検出能力2018
- Author(s)
  曽根田伴奈, 神田道也, 橋爪正樹, 四柳浩之, Shyue-Kung Lu
- Organizer
  電気関係学会四国支部連合大会
- Data Source
  KAKENHI-PROJECT-17H01715
[Presentation] リングオシレータを用いた3D IC内ダイ間断線検出のMOS製造ばらつきによる影響2018
- Author(s)
  宮武典子, 四柳浩之, 横山洋之, 橋爪正樹, 多田哲生
- Organizer
  電気関係学会四国支部連合大会
- Data Source
  KAKENHI-PROJECT-17H01715
[Presentation] リングオシレータを用いた3D IC内ダイ間配線検査法の発振周波数の温度依存性調査2017
- Author(s)
  宮武典子, 四柳浩之, 横山洋之, 橋爪正樹, 多田哲生
- Organizer
  電気関係学会四国支部連合大会
- Data Source
  KAKENHI-PROJECT-17H01715
[Presentation] A Defective Level Monitor of Open Defects in 3D ICs with a Comparator of Offset Cancellation Type2017
- Author(s)
  Michiya Kanda, Masaki Hashizume, Hiroyuki Yotsuyanagi and Shyue-Kung Lu
- Organizer
  2017 IEEE Int. Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01715
[Presentation] BC1タイプのバウンダリスキャンテスト回路を用いた実装基板のオンライン配線検査法2017
- Author(s)
  薮井大輔, 四柳浩之, 橋爪正樹
- Organizer
  第27回マイクロエレクトロニクスシンポジウム
- Data Source
  KAKENHI-PROJECT-17H01715
[Presentation] 電荷注入回数によるIC間配線の試験回路2017
- Author(s)
  大谷航平, 菅大介, 四柳浩之, 橋爪正樹
- Organizer
  第31回エレクトロニクス実装学会春季講演大会
- Place of Presentation
  慶應義塾大学(神奈川県横浜市)
- Year and Date
  2017-03-06
- Data Source
  KAKENHI-PROJECT-15K12002
[Presentation] IDDT出現時間を用いる断線故障検査法の伝搬不能故障検出に対する有効性調査2016
- Author(s)
  三好大地, 四柳浩之, 橋爪正樹
- Organizer
  電気関係学会四国支部連合大会
- Place of Presentation
  徳島大学（徳島県徳島市）
- Year and Date
  2016-09-17
- Data Source
  KAKENHI-PROJECT-15K12002
[Presentation] 電荷注入量による断線不良検出の回路規模に対する影響調査2016
- Author(s)
  大谷航平, 菅大介, 四柳浩之, 橋爪正樹
- Organizer
  電気関係学会四国支部連合大会
- Place of Presentation
  徳島大学（徳島県徳島市）
- Year and Date
  2016-09-17
- Data Source
  KAKENHI-PROJECT-15K12002
[Presentation] A Power Supply Circuit for Detecting Open Defects in SoCs by Amount of Injected Charge2016
- Author(s)
  Masaki Hashizume,Kohei Ohtani,Daisuke Suga,Hiroyuki Yotsuyanagi and Shyue-Kung Lu
- Organizer
  Taiwan and Japan Conference on Circuits and Systems(TJCAS2016)
- Place of Presentation
  National Cheng Kung University(Tainan,Taiwan)
- Year and Date
  2016-07-31
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K12002
[Presentation] 電荷注入量によるIC間配線の電流テストの可能性評価2015
- Author(s)
  菅大介, 四柳浩之, 橋爪正樹
- Organizer
  電気関係学会四国支部連合大会講演論文集
- Place of Presentation
  高知工科大学(高知県香美市）
- Year and Date
  2015-09-26
- Data Source
  KAKENHI-PROJECT-15K12002
[Presentation] 組込み型IDDT出現時間検出回路の実験による評価用設計2013
- Author(s)
  末永翔平, 四柳浩之, 橋爪正樹
- Organizer
  電気関係学会四国支部連合大会講演論文集
- Place of Presentation
  徳島大学, 徳島県
- Year and Date
  2013-09-21
- Data Source
  KAKENHI-PROJECT-24650021
[Presentation] 組込み型IDDT出現時間検出回路の実験による評価用設計2013
- Author(s)
  末永翔平, 四柳浩之, 橋爪正樹
- Organizer
  電気関係学会四国支部連合大会
- Place of Presentation
  徳島大学（徳島大学）
- Data Source
  KAKENHI-PROJECT-24650021
[Presentation] A Supply Current Testable DAC of Resistor String Type2012
- Author(s)
  Masaki Hashizume, Hiroyuki Yotsuyanagi, Yukiya Miura
- Organizer
  Japan-Taiwan Joint Workshop on Advanced VLSI Testing
- Place of Presentation
  都久志会館(Fukuoka)
- Year and Date
  2012-05-21
- Data Source
  KAKENHI-PROJECT-22650009
[Presentation] 組込み型IDDT出現時間検出回路による断線故障の検出のための必要条件2012
- Author(s)
  末永翔平, 四柳浩之, 橋爪正樹
- Organizer
  電気関係学会四国支部連合大会講演論文集
- Place of Presentation
  四国電力株式会社総合研修所, 香川県
- Year and Date
  2012-09-29
- Data Source
  KAKENHI-PROJECT-24650021
[Presentation] デコーダ型DA変換器の電流テスト容易化設計2011
- Author(s)
  橋爪正樹
- Organizer
  2011年度電気関係学会四国支部連合大会
- Place of Presentation
  阿南工業高等専門学校(徳島県)
- Year and Date
  2011-09-23
- Data Source
  KAKENHI-PROJECT-22650009
[Presentation] デコーダ型DA変換器の電流テスト容易化設計2011
- Author(s)
  橋爪正樹, 秦豊, 四柳浩之, 三浦幸也
- Organizer
  電気関係学会四国支部連合大会
- Place of Presentation
  阿南工業高等専門学校(阿南市)
- Year and Date
  2011-09-23
- Data Source
  KAKENHI-PROJECT-22650009
[Presentation] 抵抗ラダー型DAC内MOS短絡の電流テスト容易化設計2011
- Author(s)
  橋爪正樹, 秦豊, 四柳浩之, 三浦幸也
- Organizer
  2011年電子情報通信学会総合大会
- Place of Presentation
  東京都市大学(東京都世田谷区)
- Year and Date
  2011-03-16
- Data Source
  KAKENHI-PROJECT-22650009
[Presentation] 抵抗ラダー型DAC内MOS短絡の電流テスト容易化設計2011
- Author(s)
  橋爪正樹
- Organizer
  2011年度電子情報通信学会総合大会
- Place of Presentation
  東京都市大学(東京)
- Year and Date
  2011-03-14
- Data Source
  KAKENHI-PROJECT-22650009
[Presentation] 抵抗ラダー型DAC の電流テスト容易化設計2009
- Author(s)
  橋爪正樹
- Organizer
  電子情報通信学会総合大会
- Place of Presentation
  愛媛大学 (松山市)
- Year and Date
  2009-03-17
- Data Source
  KAKENHI-PROJECT-18500039
[Presentation] QFP ICのリード浮きの電気的検出用回路2009
- Author(s)
  橋爪正樹
- Organizer
  エレクトロニクス実装学会講演大会
- Place of Presentation
  関東学院大学(横浜市)
- Year and Date
  2009-03-11
- Data Source
  KAKENHI-PROJECT-18500039
[Presentation] QFP ICのリード浮きの電気的検出用回路,2009
- Author(s)
  橋爪正樹, 一宮正博, 四柳浩之, 小野安季良, 高木正夫
- Organizer
  エレクトロニクス実装学会講演大会
- Place of Presentation
  関東学院大学
- Year and Date
  2009-03-11
- Data Source
  KAKENHI-PROJECT-18500039
[Presentation] 抵抗ラダー型DACの電流テスト容易化設計2009
- Author(s)
  橋爪正樹, 秦豊, 四柳浩之, 三浦幸也
- Organizer
  電子情報通信学会総合大会
- Place of Presentation
  愛媛大学
- Year and Date
  2009-03-17
- Data Source
  KAKENHI-PROJECT-18500039
[Presentation] 検査回路の電源電流測定によるICの電源リード浮き検査能力評価2009
- Author(s)
  小野安季良, 一宮正博, 四柳浩之, 高木正夫, 橋爪正樹
- Organizer
  エレクトロニクス実装学会講演大会
- Place of Presentation
  関東学院大学
- Year and Date
  2009-03-11
- Data Source
  KAKENHI-PROJECT-18500039
[Presentation] Test Circuit for Locating Open Leads of QFP Ics2008
- Author(s)
  Masaki Hashizume, Akihito Shimoura, Masahiro Ichimiya, Hiroyuki Yotsuyanagi
- Organizer
  IEEE 7-th International Board Test Workshop
- Place of Presentation
  Fort Collins, USA.
- Year and Date
  2008-09-18
- Data Source
  KAKENHI-PROJECT-18500039
[Presentation] PIC16F84A内のバス故障用実時間テストプログラム2008
- Author(s)
  嶋本竜也, 田坂英司, 茅原敏広, 四柳浩之, 橋爪正樹
- Organizer
  電気関係学会四国支部連合大会
- Place of Presentation
  徳島大学
- Year and Date
  2008-09-27
- Data Source
  KAKENHI-PROJECT-18500039
[Presentation] 0.35μm CMOSICの配線断線時の故障動作の実測2008
- Author(s)
  加藤健二, 一宮正博, 四柳浩之, 橋爪正樹
- Organizer
  電気関係学会四国支部連合大会
- Place of Presentation
  徳島大学
- Year and Date
  2008-09-27
- Data Source
  KAKENHI-PROJECT-18500039
[Presentation] 電流テストによるQFP ICのリード浮き診断回路2008
- Author(s)
  橋爪正樹, 一宮正博, 四柳浩之, 下谷光生, 多田哲生, 小山健
- Organizer
  電気関係学会四国支部連合大会
- Place of Presentation
  徳島大学
- Year and Date
  2008-09-27
- Data Source
  KAKENHI-PROJECT-18500039
[Presentation] Test Circuit for Locating Open Leads of QFP ICs2008
- Author(s)
  Masaki Hashizume
- Organizer
  IEEE 7-th Internat ional Board Test Workshop
- Place of Presentation
  Intel (Fort Collins, U. S. A. )
- Year and Date
  2008-09-12
- Data Source
  KAKENHI-PROJECT-18500039
[Presentation] 交流電圧信号印加時の論理値異常によるリード浮き検出回路の試作2008
- Author(s)
  内倉健一, 一宮正博, 四柳浩之, 橋爪正樹
- Organizer
  交流電圧信号印加時の論理値異常によるリード浮き検出回路の試作
- Place of Presentation
  徳島大学
- Year and Date
  2008-09-27
- Data Source
  KAKENHI-PROJECT-18500039
[Presentation] 電流テストによるQFP ICのリード浮き診断回路2008
- Author(s)
  橋爪正樹
- Organizer
  電気関係学会四国支部連合大会
- Place of Presentation
  徳島大学(徳島市)
- Year and Date
  2008-09-27
- Data Source
  KAKENHI-PROJECT-18500039
[Presentation] 電流テスト容易化抵抗ストリング型D/A変換器の故障検出能力2008
- Author(s)
  秦豊, 四柳浩之, 橋爪正樹, 三浦幸也
- Organizer
  電気関係学会四国支部連合大会
- Place of Presentation
  徳島大学
- Year and Date
  2008-09-27
- Data Source
  KAKENHI-PROJECT-18500039
[Presentation] 電流テストによるQFPCPLD IC のリード浮きの検査能力評価2008
- Author(s)
  小野安季良, 一宮正博, 四柳浩之, 高木正夫, 橋爪正樹
- Organizer
  第22回エレクトロニクス実装学会講演大会
- Place of Presentation
  東京大学
- Year and Date
  2008-03-18
- Data Source
  KAKENHI-PROJECT-18500039
[Presentation] 0.35μmCMOS プロセスで試作したICのリード浮きの電流テスト可能性評価2007
- Author(s)
  滝川徳郎, 東條充, 一宮正博, 四柳浩之, 橋爪正樹
- Organizer
  電気関係学会四国支部連合大会
- Place of Presentation
  徳島大学
- Year and Date
  2007-09-29
- Data Source
  KAKENHI-PROJECT-18500039
[Presentation] 抵抗ストリング型D/A 変換器の電流テスト容易化設計2007
- Author(s)
  秦豊, 飯野純一, 四柳浩之, 橋爪正樹,三浦幸也
- Organizer
  電気関係学会四国支部連合大会
- Place of Presentation
  徳島大学
- Year and Date
  2007-09-29
- Data Source
  KAKENHI-PROJECT-18500039
[Presentation] 論理IC実装時に発生する抵抗を伴うリード浮きに対する電流テスト能力評価2007
- Author(s)
  小野安季良, 一宮正博, 四柳浩之, 橋爪正樹, 月本功, 高木正夫
- Organizer
  マイクロエレクトロニクスシンポジウム
- Place of Presentation
  甲南大学
- Year and Date
  2007-09-14
- Data Source
  KAKENHI-PROJECT-18500039
[Presentation] Test Circuit for Vectorless Open Lead Detection of CMOS Ics2007
- Author(s)
  Masaki Hashizume
- Organizer
  IEEE 6-th International Board Test Workshop
- Place of Presentation
  Intel(Fort Collins,U.S.A.)
- Year and Date
  2007-10-12
- Data Source
  KAKENHI-PROJECT-18500039
[Presentation] 0.35umCMOSプロセスで試作したICのリード浮きの電流テスト可能性評価2007
- Author(s)
  橋爪正樹
- Organizer
  電気関係学会四国支部連合大会
- Place of Presentation
  徳島大学(徳島市)
- Year and Date
  2007-09-29
- Data Source
  KAKENHI-PROJECT-18500039
[Presentation] CMOSQFP ICのリード浮きの電気的検査法2007
- Author(s)
  橋爪正樹, 一宮正博, 四柳浩之
- Organizer
  第38回国際電子回路産業展
- Place of Presentation
  東京
- Year and Date
  2007-05-31
- Data Source
  KAKENHI-PROJECT-18500039
[Presentation] Z80 のバス縮退故障の実時間テストプログラム2007
- Author(s)
  嶋本竜也, 田坂英司, 茅原敏広, 四柳浩之, 大家隆弘, 橋爪正樹
- Organizer
  電気関係学会四国支部連合大会
- Place of Presentation
  徳島大学
- Year and Date
  2007-09-29
- Data Source
  KAKENHI-PROJECT-18500039
[Presentation] 交流電界印加時の電流テストによる試作IC内断線の検査2007
- Author(s)
  東條充, 一宮正博, 四柳浩之, 橋爪正樹
- Organizer
  電気関係学会四国支部連合大会
- Place of Presentation
  徳島大学
- Year and Date
  2007-09-29
- Data Source
  KAKENHI-PROJECT-18500039
[Presentation] 交流電界印加による電流テスト用検査装置の試作2006
- Author(s)
  東條充, 一宮正博, 四柳浩之, 橋爪正樹
- Organizer
  電気関係学会四国支部連合大会
- Place of Presentation
  愛媛大学
- Year and Date
  2006-09-26
- Data Source
  KAKENHI-PROJECT-18500039

1. 四柳浩之 (90304550)

# of Collaborated Projects: 2 results

# of Collaborated Products: 22 results
2. 横山洋之 (80250900)

# of Collaborated Projects: 1 results

# of Collaborated Products: 6 results
3. 多田哲生 (40368832)

# of Collaborated Projects: 1 results

# of Collaborated Products: 2 results

hashizume masaki 橋爪 正樹

橋爪 正樹 ハシヅメ マサキ

Hashizume Masaki 橋爪 正樹

HASHIZUME Masaki 橋爪 正樹

Research Projects

Research Products

Co-Researchers

Design for Testability for Electrical Tests of Interconnects between Dies after ShipmentPrincipal Investigator

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Open Defect Detection at Interconnects among IC Chips with Relaxation OscilatorsPrincipal Investigator

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IC Test Method Based on Charge Volume Injected from a Power Supply Circuit within a Timing WindowPrincipal Investigator

Principal Investigator

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Dynamic Supply Current Test Method with Built-in IDDT Appearance Time SensorPrincipal Investigator

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Supply Current Testable Design of DACs in SoCsPrincipal Investigator

Principal Investigator

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Current Testing for Opens and Shorts in SoCs and SiPsPrincipal Investigator

Principal Investigator

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Electrical Testing of Open Defects in Deep Sub-micron CMOS Logic CircuitsPrincipal Investigator

Principal Investigator

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Open Defect Detection Method Based on Supply Current in CMOS Logic CircuitsPrincipal Investigator

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[Journal Article] A DfT Technique for Electrical Interconnect Testing of Circuit Boards with 3D Stacked SRAM ICs2023

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Data Source

[Journal Article] Open Defect Detection in Assembled Circuit Boards with Built-In Relaxation Oscillators2021

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DOI

Data Source

[Journal Article] Detectable Resistance Increase of Open Defects in Assembled PCBs by Quiescent Currents through Embedded Diodes2021

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Data Source

[Journal Article] Temperature Sensing with a Relaxation Oscillator in CMOS ICs2020

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[Journal Article] Open Defect Detection Not Utilizing Boundary Scan Flip-Flops in Assembled Circuit Boards2020

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DOI

Data Source

[Journal Article] Electrical Field Test Method of Resistive Open Defects between Dies by Quiescent Currents through Embedded Diodes2019

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Journal Title

hashizume masaki 橋爪正樹

橋爪正樹ハシヅメマサキ

Hashizume Masaki 橋爪正樹

HASHIZUME Masaki 橋爪正樹