CHO Yasuo 長康雄

… Alternative Names

長康雄チヨウヤスオ

CHO YASUO 長康夫

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Researcher Number	40179966
Other IDs
External Links
Affiliation (Current)	2025: 東北大学, 未来科学技術共同研究センター, 特任教授
Affiliation (based on the past Project Information) *help	2024: 東北大学, 未来科学技術共同研究センター, 特任教授 2022: 東北大学, 未来科学技術共同研究センター, 特任教授 2001 – 2021: Tohoku University, Research Institute of Electrical Communication, Professor, 電気通信研究所, 教授 2006: 東北大, 電気通信研究所, 教授 1997 – 2000: 東北大学, 電気通信研究所, 助教授 … More 1999: 東北大学, 電機通信研究所, 助教授 1996: 山口大学, 工学部, 助教授 1993 – 1994: 山口大学, 工学部, 助教授 Less
Review Section/Research Field	Principal Investigator Applied physics, general / Electron device/Electronic equipment / Electronic materials/Electric materials / Medium-sized Section 21:Electrical and electronic engineering and related fields / 電子デバイス・機器工学 / Thin film/Surface and interfacial physical properties / Engineering / Science and Engineering / Science and Engineering Except Principal Investigator 電子デバイス・機器工学 … More / Medium-sized Section 29:Applied condensed matter physics and related fields / General applied physics / Electronic materials/Electric materials / Science and Engineering Less
Keywords	Principal Investigator 走査型非線形誘電率顕微鏡 / ドメイン / 強誘電体 / 強誘電体記録 / 超高密度記録 / 超高密度強誘電体記録 / 原子分解能 / MOS界面 / 界面準位密度 / 時間分解走査型非線形誘電率顕微鏡 … More / 超高次非線形誘電率顕微鏡法 / 局所DLTS法 / 界面電荷輸送現象 / 1.5Tbit / Scanning Nonlinear Dielectric microscopy / 原子双極子モーメント / 超高次非線形誘電率顕微鏡法 / 走査型非線形誘電率ポテンショメトリ / 分極ドメイン / 高次非線形誘電率顕微法 / 走査プローブ顕微鏡 / 間分解 SNDM装置 / 走査型非線形誘電率常磁性共鳴顕微鏡 / トラップ / 走査型非線形誘電率ポテンショメリ / Dit分布観測 / 時間分解SNDM / 超高次SNDM法 / 走査型非線形誘電率顕微鏡法 / 時間分解SNDM法 / 次世代パワー半導体 / 界面順位密度 / パワーデバイス / ワイドギャップ半導体 / 移動度 / MOS界面欠陥 / 走査型非線形誘電率ポテンショメリ / 超高次非線形誘電率顕微鏡 / super high density data storage / data storage / SPM / domain / ferroelectrics / scanning nonlinear dielectric microscopy / 強誘電体記 / Ultra-high density ferroelectric date / Nano-second domain inversion / inchi / Tb記録 / ナノセカンドドメイン反転 / inch^2 / Ultra-high density ferroelectric data storage / Higher order nonlinear dielectric microscopy / Atomic scale resolution / サブナノメータ分解能 / 双極子モーメント / 原子分離能 / Photothermal dielectric microscopy / Dielectric materials / Temperature characteristics / Scanning Electron-Beam Dielectric microscopy / SEM / 誘電率温度係数 / 走査型電子線誘導率顕微鏡 / 光熱誘電率顕微鏡 / 誘電率温度特性 / 走査型電子線誘電率顕微鏡 / ferroelectric recording / ferroelectric domain / nano-meter resolution / Scanning Nonlinear dielectric microscopy / 高分解能 / 局所異方性 / 強誘電分極 / ナノメータ分解能 / 走査型非線形誘電ポテンショメトリ / 走査型非線形誘電ポテンショメトリ / 半導体デバイス計測 / 半導体原子計測 / 半導体計測技術 / 原子分解能SNDM / オペランド計測． / SiCーMOSFET / 太陽電池 / グラフェン / 化合物パワー半導体デバイス / 超高次走査型非線形誘電率顕微鏡 / SNDM / プローブメモリ / 高密度記録 / サブナノスケール分解能 / 温度可変型SNDM / 強誘電分極ドメイン / 動的測定法 / 非線形誘電率顕微鏡 / 非線形定数 / K-dv方程式 / ショックウェーブ / 金属グレーティング導波路 / 弾性表面波 / ソリトン … More Except Principal Investigator 走査型非線形誘電率顕微鏡 / KNbO_3 / 圧電薄膜 / 弾性表面波 / Surface Acoustic Wave / SAWフィルタ / MOSFET / プローブ顕微鏡 / ワイドバンドギャップ半導体 / パワーエレクトロニクス / AlN圧電薄膜 / 分極反転層 / 層厚測定 / 極性反転圧電薄膜 / 極性反転構造 / 走査型非線形誘電率顕微法 / 分極反転 / Scanning nonlinear dielectric microscopy / Materials for SAW devices / Evaluation of single crystal materials / Leaky surface acoustic wave / Damaged surface layer / Standard specimen / LFB ultrasonic material characterization / Ultrasonic microspectroscopy / 走査形非線形誘電率顕微鏡 / V(z)曲線解析法 / LFB超音波顕微鏡 / SAWデバイス用材料 / 単結晶材料評価 / 漏洩弾性表面波 / 表面加工層 / 標準試料 / LFB超音波材料解析システム / 超音波マイクロスペクトロスコピー / Piezoelectric Thin Film / SAW Filter / ニオブ酸カリウム / Mobile Communication / Spread Spectrum Communication / Wide Band Filters / Piezoelectric Single Crystals / Elastic Convolver / Zero TCF Substrate / KNbO_3 single crystal / 弾性表面波コンボルバ / 超高結合材料 / 零温度係数基板 / KNbO3単結晶 / 非線形誘電率顕微鏡 / スペクトル拡散通信 / 広帯域フィルタ / 単結晶育成 / 弾性表面波コンボルバー / 零温度特性基板 / KNbO_3単結晶 / 強誘電分極 / 強誘電体記録 / ペロブスカイト酸化物トラシジスタ / 成長初期過程 / 新強誘電体探索 / 化学溶液プロセス / 濃度相境界 / モルフォトロピック相境界 / 低温プロセッシング / PZT / 2次相転移点 / 低温プロセス / マルテンサイト型合金 / ケミカルプロセッシング / MFIS-FET / 強誘電体・半導体接合 / MFIS(MFS)構造 / ケミカル・プロセッシング / ドメイン構造観察 / リラクサ強誘電体 / MIFS-FET / 希土類ドープ Less

SNDMを用いた次世代パワーエレクトロニクスの創出に資する革新的評価技術の開発
- Principal Investigator
  
  山末耕平
- Project Period (FY)
  2024 – 2027
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Review Section
  
  Medium-sized Section 29:Applied condensed matter physics and related fields
- Research Institution
  Tohoku University
Elucidation of atomic structure and dynamics of carrier trap sitesPrincipal Investigator
- Principal Investigator
  
  Cho Yasuo
- Project Period (FY)
  2021 – 2022
- Research Category
  
  Grant-in-Aid for Challenging Research (Exploratory)
- Review Section
  
  Medium-sized Section 21:Electrical and electronic engineering and related fields
- Research Institution
  Tohoku University
界面電荷輸送現象解明のための高機能走査型非線形誘電率顕微鏡群の研究開発Principal Investigator
- Principal Investigator
  
  長康雄
- Project Period (FY)
  2016
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  Tohoku University
Origin elucidation of the problems in the interface electric charge transportation phenomenon using scanning nonlinear dielectric microscopyPrincipal Investigator
- Principal Investigator
  
  Cho Yasuo
- Project Period (FY)
  2016 – 2020
- Research Category
  
  Grant-in-Aid for Scientific Research (S)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  Tohoku University
Measurement method for polarity-inverted layered piezoelectric thin films using scanning nonlinear dielectric microscopy
- Principal Investigator
  
  ODAGAWA HIROYUKI
- Project Period (FY)
  2015 – 2017
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  General applied physics
- Research Institution
  National Institute of Technology, Kumamoto College
Visualization of atomic dipole moment and identification of atomic species by using scanning nonlinear dielectric microscopyPrincipal Investigator
- Principal Investigator
  
  CHO Yasuo
- Project Period (FY)
  2012 – 2014
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  Tohoku University
High functionalization of nonlinear dielectric microscopy and its application to electronic devicesPrincipal Investigator
- Principal Investigator
  
  Cho Yasuo
- Project Period (FY)
  2011 – 2015
- Research Category
  
  Grant-in-Aid for Scientific Research (S)
- Research Field
  
  Electron device/Electronic equipment
- Research Institution
  Tohoku University
Next Generation Super High Density Ferroelectric Data Storage Using Scanning Nonlinear Dielectric Microscopy TechniquePrincipal Investigator
- Principal Investigator
  
  CHO Yasuo
- Project Period (FY)
  2006 – 2010
- Research Category
  
  Grant-in-Aid for Specially Promoted Research
- Review Section
  
  Science and Engineering
  Engineering
- Research Institution
  Tohoku University
1平方インチ当たり10テラビットの記録密度を持つSNDM強誘電体プローブメモリPrincipal Investigator
- Principal Investigator
  
  長康雄
- Project Period (FY)
  2006
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Electron device/Electronic equipment
- Research Institution
  Tohoku University
強誘電体薄膜の物性制御と次世代メモリデバイスへの応用
- Principal Investigator
  
  奥山雅則
- Project Period (FY)
  2004
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Review Section
  
  Science and Engineering
- Research Institution
  Osaka University
Super high density and high speed ferroelectric data storage based on scanning nonlinear dielectric microscopyPrincipal Investigator
- Principal Investigator
  
  CHO Yasuo
- Project Period (FY)
  2003 – 2005
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Electron device/Electronic equipment
- Research Institution
  Tohoku University
Electric dipole moment memory based on scanning nonlinear dielectric microscopyPrincipal Investigator
- Principal Investigator
  
  CHO Yasuo
- Project Period (FY)
  2001 – 2002
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  電子デバイス・機器工学
- Research Institution
  TOHOKU UNIVERSITY
超高分解能走査型非線形誘電率顕微鏡法を用いた強誘電体中のドメイン構造の解析Principal Investigator
- Principal Investigator
  
  長康雄
- Project Period (FY)
  2000 – 2003
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Review Section
  
  Science and Engineering
- Research Institution
  Tohoku University
KNbO_3単結晶を用いたIOGH_2広帯域SAWデバイスと製造プロセスの最適化
- Principal Investigator
  
  小田川裕之
- Project Period (FY)
  2000 – 2002
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  電子デバイス・機器工学
- Research Institution
  Tohoku University
強誘電体単結晶を用いた双極子記録メディアの基礎的検討
- Principal Investigator
  
  小田川裕之
- Project Period (FY)
  2000
- Research Category
  
  Grant-in-Aid for Exploratory Research
- Research Field
  
  電子デバイス・機器工学
- Research Institution
  Tohoku University
Electric dipole moment visualization using scanning nonlinear dielectric microscopyPrincipal Investigator
- Principal Investigator
  
  CHO Yasuo
- Project Period (FY)
  2000 – 2001
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Applied physics, general
- Research Institution
  Tohoku University
Development of a Method to Evaluate the Surface of Single Crystal Substrates for Super-High-Frequency SAW Devices by UMS Technology
- Principal Investigator
  
  KUSHIBIKI Jun-ichi
- Project Period (FY)
  2000 – 2002
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  Tohoku University
Fabrication of KNbO_3 Thin Film and Application to SAW Device for Future Mobile Tohoku University Communication
- Principal Investigator
  
  ODAGAWA Hiroyuki
- Project Period (FY)
  1999 – 2000
- Research Category
  
  Grant-in-Aid for Scientific Research (B).
- Research Field
  
  電子デバイス・機器工学
- Research Institution
  Tohoku University
Super High Coupling Surface Acoustic Wave Devices and Applications for Future Mobile Communication Systems
- Principal Investigator
  
  YAMANOUCHI Kazuhiko
- Project Period (FY)
  1998 – 1999
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  電子デバイス・機器工学
- Research Institution
  Tohoku Institute of Technology
  Tohoku University
Scanning Electron-Beam Dielectric MicroscopyPrincipal Investigator
- Principal Investigator
  
  CHO Yasuo
- Project Period (FY)
  1998 – 1999
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Applied physics, general
- Research Institution
  TOHOKU UNIVERSITY
Development of Scanning Nonlinear Dielectric Microscope with high resolution and its Application to Ferroelectric RecordingPrincipal Investigator
- Principal Investigator
  
  CHO Yasuo
- Project Period (FY)
  1997 – 1999
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Applied physics, general
- Research Institution
  TOHOKU UNIVERSITY
非線形誘電率顕微鏡の高分解能化の達成とその誘電体記録への応用Principal Investigator
- Principal Investigator
  
  長康雄
- Project Period (FY)
  1996
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Applied physics, general
- Research Institution
  Yamaguchi University
機能性材料の非線形特性の動的測定法の確立と非線形性出現機構の解明Principal Investigator
- Principal Investigator
  
  長康雄
- Project Period (FY)
  1994
- Research Category
  
  Grant-in-Aid for General Scientific Research (C)
- Research Field
  
  Applied physics, general
- Research Institution
  Yamaguchi University
金属グレーティング導波路上を伝搬するSAWソリトンの実験的検証Principal Investigator
- Principal Investigator
  
  長康雄
- Project Period (FY)
  1993
- Research Category
  
  Grant-in-Aid for Encouragement of Young Scientists (A)
- Research Field
  
  Applied physics, general
- Research Institution
  Yamaguchi University

[Book] マイクロビームアナリシス・ハンドブック2014
- Author(s)
  長　康雄
- Total Pages
  708
- Publisher
  オーム社
- Data Source
  KAKENHI-PROJECT-24656027
[Book] Innovative Graphene Technologies: Evaluation and Applications Volume 22013
- Author(s)
  Shin-ichiro Kobayashi， Yasuo Cho
- Total Pages
  540
- Publisher
  SMITHERS RAPRA TECHNOLOGY LTD.
- Data Source
  KAKENHI-PROJECT-23226008
[Book] Innovative Graphene Technologies: Evaluation and Applications Volume 22013
- Author(s)
  Shin-ichiro Kobayashi， Yasuo Cho:
- Total Pages
  540
- Publisher
  SMITHERS RAPRA TECHNOLOGY LTD.
- Data Source
  KAKENHI-PROJECT-24656027
[Book] Polar Oxides - Properties, Characterization, and Imaging2004
- Author(s)
  Y.Cho
- Total Pages
  387
- Publisher
  WILEY-VCH Verlag GmbH & Co.KGaA
- Data Source
  KAKENHI-PROJECT-15206036
[Journal Article] Boxcar averaging scanning nonlinear dielectric microscopy2022
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Journal Title
  
  Nanomaterials
  
  Volume: 12 Issue: 5 Pages: 794-794
- DOI
  10.3390/nano12050794
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-21K18706, KAKENHI-PROJECT-20H02613
[Journal Article] Nanoscale mapping to assess the asymmetry of local C?V curves obtained from ferroelectric materials2022
- Author(s)
  Hiranaga Yoshiomi、Mimura Takanori、Shimizu Takao、Funakubo Hiroshi、Cho Yasuo
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 61 Issue: SN Pages: SN1014-SN1014
- DOI
  10.35848/1347-4065/ac7f7a
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21K18887, KAKENHI-PROJECT-18K04932, KAKENHI-PROJECT-21K18706, KAKENHI-PROJECT-16H06360
[Journal Article] Local capacitance-voltage profiling and deep level transient spectroscopy of SiO2/SiC interfaces by scanning nonlinear dielectric microscopy2022
- Author(s)
  Kohei Yamasue Yasuo Cho
- Journal Title
  
  Microelectronics Reliability
  
  Volume: 135 Pages: 114588-114588
- DOI
  10.1016/j.microrel.2022.114588
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21K18706, KAKENHI-PROJECT-16H06360
[Journal Article] Surface Potential Fluctuations of SiO2/SiC Interfaces Investigated by Local Capacitance-Voltage Profiling Based on Time-Resolved Scanning Nonlinear Dielectric Microscopy2022
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Journal Title
  
  Materials Science Forum
  
  Volume: 1062 Pages: 335-340
- DOI
  10.4028/p-2t7zak
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21K18706, KAKENHI-PROJECT-16H06360
[Journal Article] Microscopic Evaluation of Al2O3/p-Type Diamond (111) Interfaces Using Scanning Nonlinear Dielectric Microscopy2022
- Author(s)
  Yu Ogata, Kohei Yamasue, Xufang Zhang,Tsubasa Matsumoto, Norio Tokuda and Yasuo Cho
- Journal Title
  
  Materials Science Forum
  
  Volume: 1062 Pages: 298-303
- DOI
  10.4028/p-n0z51t
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21K18706, KAKENHI-PROJECT-16H06360
[Journal Article] High-precision local C?V mapping for ferroelectrics using principal component analysis2021
- Author(s)
  Hiranaga Yoshiomi、Mimura Takanori、Shimizu Takao、Funakubo Hiroshi、Cho Yasuo
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 60 Issue: SF Pages: SFFB09-SFFB09
- DOI
  10.35848/1347-4065/ac13d9
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18K04932, KAKENHI-PROJECT-21K18706
[Journal Article] Simulation of nanoscale domain growth for ferroelectric recording2021
- Author(s)
  Fukuzawa Kenji、Hiranaga Yoshiomi、Cho Yasuo
- Journal Title
  
  AIP Advances
  
  Volume: 11 Issue: 11 Pages: 115117-115117
- DOI
  10.1063/5.0074004
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18K04932, KAKENHI-PROJECT-21K18706
[Journal Article] Flexoelectric nanodomains in rare-earth iron garnet thin films under strain gradient2021
- Author(s)
  Yamahara Hiroyasu、Feng Bin、Seki Munetoshi、Adachi Masaki、Sarker Md Shamim、Takeda Takahito、Kobayashi Masaki、Ishikawa Ryo、Ikuhara Yuichi、Cho Yasuo、Tabata Hitoshi
- Journal Title
  
  Communications Materials
  
  Volume: 2 Issue: 1 Pages: 95-95
- DOI
  10.1038/s43246-021-00199-y
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-20H05651, KAKENHI-PROJECT-21H01614, KAKENHI-PROJECT-21J12725, KAKENHI-PROJECT-19K21962, KAKENHI-PROJECT-20K21073, KAKENHI-PROJECT-21K18706, KAKENHI-PROJECT-19K15022, KAKENHI-PROJECT-18K18850
[Journal Article] Optimization of signal intensity in intermittent contact scanning nonlinear dielectric microscopy2019
- Author(s)
  Yamasue K.、Cho Y.
- Journal Title
  
  Microelectronics Reliability
  
  Volume: 100-101 Pages: 113345-113345
- DOI
  10.1016/j.microrel.2019.06.037
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16H06360
[Journal Article] Two-dimensional defect mapping of the SiO2/4H-SiC interface2019
- Author(s)
  Woerle Judith、Johnson Brett C.、Bongiorno Corrado、Yamasue Kohei、Ferro Gabriel、Dutta Dipanwita、Jung Thomas A.、Sigg Hans、Cho Yasuo、Grossner Ulrike、Camarda Massimo
- Journal Title
  
  Physical Review Materials
  
  Volume: 3 Issue: 8 Pages: 084602-084602
- DOI
  10.1103/physrevmaterials.3.084602
- Peer Reviewed / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Journal Article] Carrier distribution imaging using ∂C/∂z-mode scanning nonlinear dielectric microscopy2019
- Author(s)
  Hiranaga Yoshiomi、Cho Yasuo
- Journal Title
  
  Review of Scientific Instruments
  
  Volume: 90 Issue: 8 Pages: 083705-083705
- DOI
  10.1063/1.5097906
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16H06360
[Journal Article] Local carrier distribution imaging on few-layer MoS2 exfoliated on SiO2 by scanning nonlinear dielectric microscopy2018
- Author(s)
  Yamasue Kohei、Cho Yasuo
- Journal Title
  
  Applied Physics Letters
  
  Volume: 112 Issue: 24 Pages: 243102-243102
- DOI
  10.1063/1.5032277
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16H06360
[Journal Article] Scanning probe-type data storage beyond hard disk drive and flash memory2018
- Author(s)
  Cho Yasuo、Hong Seungbum
- Journal Title
  
  MRS Bulletin
  
  Volume: 43 Issue: 5 Pages: 365-370
- DOI
  10.1557/mrs.2018.98
- Peer Reviewed / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Journal Article] High resolution observation of defects at SiO2/4H-SiC interfaces using time-resolved scanning nonlinear dielectric microscopy2018
- Author(s)
  Yamagishi Y.、Cho Y.
- Journal Title
  
  Microelectronics Reliability
  
  Volume: 88-90 Pages: 242-245
- DOI
  10.1016/j.microrel.2018.07.058
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16H06360
[Journal Article] Nanoscale linear permittivity imaging based on scanning nonlinear dielectric microscopy2018
- Author(s)
  Yoshiomi Hiranaga, Norimichi Chinone and Yasuo Cho
- Journal Title
  
  Nanotechnology
  
  Volume: 29 Issue: 20 Pages: 205709-205709
- DOI
  10.1088/1361-6528/aab3c2
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16H06360
[Journal Article] Quantitative measurement of active dopant density distribution in phosphorus-implanted monocrystalline silicon solar cell using scanning nonlinear dielectric microscopy2017
- Author(s)
  K. Hirose, K. Tanahashi, H. Takato, and Y. Cho
- Journal Title
  
  Appl. Phys. Lett.
  
  Volume: 111 Issue: 3
- DOI
  10.1063/1.4994813
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16H06360
[Journal Article] Two-Dimensional Imaging of Trap Distribution in SiO2/SiC Interface Using Local Deep Level Ttransient Spectroscopy Based on Super-Higher-Order Scanning Nonlinear Dielectric Microscopy2017
- Author(s)
  Norimichi Chinone, Ryoji Kosugi ,Yasunori Tanaka, Shinsuke Harada, Hajime Okumura, and Yasuo Cho
- Journal Title
  
  Materials Science Forum
  
  Volume: 897 Pages: 127-130
- DOI
  10.4028/www.scientific.net/msf.897.127
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16H06360
[Journal Article] “Local deep level transient spectroscopy using super-higher-order scanning nonlinear dielectric microscopy and its application to imaging two-dimensional distribution of SiO2/SiC interface traps2017
- Author(s)
  Norimichi Chinone, and Yasuo Cho
- Journal Title
  
  J. Appl. Phys.
  
  Volume: 122 Issue: 10
- DOI
  10.1063/1.4991739
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16H06360
[Journal Article] Nanosecond microscopy of capacitance at SiO2/4H-SiC interfaces by time-resolved scanning nonlinear dielectric microscopy2017
- Author(s)
  Y. Yamagishi, and Y. Cho
- Journal Title
  
  Appl. Phys. Lett.
  
  Volume: 111 Issue: 16
- DOI
  10.1063/1.4999794
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16H06360
[Journal Article] High resolution characterizations of fine structure of semiconductor device and material using scanning nonlinear dielectric microscopy2017
- Author(s)
  Yasuo Cho
- Journal Title
  
  Jpn.J.Appl.Phys.
  
  Volume: 56 Issue: 10 Pages: 100101-100101
- DOI
  10.7567/jjap.56.100101
- NAID
  210000148306
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16H06360
[Journal Article] Quantitative thickness measurement of polarity-inverted piezoelectric thin-film layer by scanning nonlinear dielectric microscopy2017
- Author(s)
  Hiroyuki Odagawa, Koshiro Terada, Yohei Tanaka, Hiroaki Nishikawa, Takahiko Yanagitani and Yasuo Cho
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 56 Issue: 10S Pages: 10PF18-10PF18
- DOI
  10.7567/jjap.56.10pf18
- NAID
  210000148395
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-15K04725, KAKENHI-PROJECT-16H06360
[Journal Article] Universal Parameter Evaluating SiO2/SiC Interface Quality Based on Scanning Nonlinear Dielectric Microscopy2017
- Author(s)
  Norimichi Chinone, Alpana Nayak, Ryoji Kosugi ,Yasunori Tanaka, Shinsuke Harada, Yuji Kiuchi, Hajime Okumura, and Yasuo Cho
- Journal Title
  
  Materials Science Forum
  
  Volume: 897 Pages: 159-162
- DOI
  10.4028/www.scientific.net/msf.897.159
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16H06360
[Journal Article] Dynamic observation of ferroelectric domain switching using scanning nonlinear dielectric microscopy2017
- Author(s)
  Yoshiomi Hiranaga, Takanori Mimura, Takao Shimizu, Hiroshi Funakubo, Yasuo Cho
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 56 Issue: 10S Pages: 10PF16-10PF16
- DOI
  10.7567/jjap.56.10pf16
- NAID
  210000148393
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17K14807, KAKENHI-PROJECT-17J10208, KAKENHI-PROJECT-16H06360
[Journal Article] Evaluation of silicon- and carbon-face SiO2/SiC MOS interface quality based on scanning nonlinear dielectric microscopy2017
- Author(s)
  Norimichi Chinone, Alpana Nayak, Ryoji Kosugi, Yasunori Tanaka, Shinsuke Harada, Hajime Okumura, and Yasuo Cho
- Journal Title
  
  Appl. Phys. Lett.
  
  Volume: 111 Issue: 6
- DOI
  10.1063/1.4990865
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16H06360
[Journal Article] Nondestructive and local evaluation of SiO2/SiC interface using super-higher-order scanning nonlinear dielectric microscopy2016
- Author(s)
  Norimichi Chinone, Ryoji Kosugi, Yasunori Tanaka, Shinsuke Harada,Hajime Okumura, and Yasuo Cho
- Journal Title
  
  Materials Science Forum
  
  Volume: 858 Pages: 469-472
- DOI
  10.4028/www.scientific.net/msf.858.469
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23226008
[Journal Article] Visualization of polarization and two dimensional electron gas distribution in AlGaN/GaN heterostructure using scanning nonlinear dielectric microscopy2016
- Author(s)
  Kotaro Hirose, Norimichi Chinone, and Yasuo Cho
- Journal Title
  
  Materials Science Forum
  
  Volume: 858 Pages: 1182-1185
- DOI
  10.4028/www.scientific.net/msf.858.1182
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-23226008
[Journal Article] Graphene on C-terminated face of 4H-SiC observed by noncontact scanning nonlinear dielectric potentiometry2016
- Author(s)
  Kohei Yamasue, Hirokazu Fukidome, Keiichiro Tashima, Maki Suemitsu, and Yasuo Cho
- Journal Title
  
  Jpn. J. Appl. Phys.
  
  Volume: 55 Issue: 8S1 Pages: 08NB02-08NB02
- DOI
  10.7567/jjap.55.08nb02
- NAID
  210000146969
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-23226008, KAKENHI-PROJECT-15K04673, KAKENHI-PROJECT-16H06360
[Journal Article] Method for measuring polarity-inverted layered structure in dielectric thin films using scanning nonlinear dielectric microscopy2016
- Author(s)
  Hiroyuki Odagawa, Koshiro Terada, Hiroaki Nishikawa, Takahiko Yanagitani, Yasuo Cho
- Journal Title
  
  Ferroelectrics
  
  Volume: 498(1) Issue: 1 Pages: 47-51
- DOI
  10.1080/00150193.2016.1169493
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-15K04725, KAKENHI-PROJECT-15K13974
[Journal Article] Visualization of Gate-Bias-Induced Carrier Redistribution in SiC Power DIMOSFET Using Scanning Nonlinear Dielectric Microscopy2016
- Author(s)
  Norimichi Chinone, and Yasuo Cho
- Journal Title
  
  IEEE TRANSACTIONS ON ELECTRON DEVICES
  
  Volume: 63 Issue: 8 Pages: 3165-3170
- DOI
  10.1109/ted.2016.2571780
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23226008, KAKENHI-PROJECT-16H06360, KAKENHI-PROJECT-14J08084
[Journal Article] Simultaneous observation of two dimensional electron gas and polarization in AlGaN/GaN heterostructure using scanning nonlinear dielectric microscopy2016
- Author(s)
  Kotaro Hirose, Yasunori Goto, Norimichi Chinone, and Yasuo Cho
- Journal Title
  
  Jpn. J. Appl. Phys.
  
  Volume: 55 Issue: 8S1 Pages: 08NB13-08NB13
- DOI
  10.7567/jjap.55.08nb13
- NAID
  210000146980
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-23226008, KAKENHI-PROJECT-16H06360
[Journal Article] Local deep level transient spectroscopy using super-higher-order scanning nonlinear dielectric microscopy2016
- Author(s)
  N. Chinone, R.Kosugi ,Y. Tanaka, S. Harada, H. Okumura, and Y. Cho
- Journal Title
  
  Microelectronics Reliability
  
  Volume: 64 Pages: 566-569
- DOI
  10.1016/j.microrel.2016.07.088
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23226008, KAKENHI-PROJECT-16H06360, KAKENHI-PROJECT-14J08084
[Journal Article] High-density ferroelectric recording using a hard disk drive-type data storage system2016
- Author(s)
  Tomonori Aoki, Yoshiomi Hiranaga, and Yasuo Cho
- Journal Title
  
  J. Appl. Phys.
  
  Volume: 119 Issue: 18 Pages: 184101-184101
- DOI
  10.1063/1.4948940
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-23226008, KAKENHI-PROJECT-16H06360
[Journal Article] Interfacial charge states in graphene on SiC studied by noncontact scanning nonlinear dielectric potentiometry2015
- Author(s)
  Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu, and Yasuo Cho
- Journal Title
  
  Physical Review Letters
  
  Volume: 114 Issue: 22 Pages: 226103-226103
- DOI
  10.1103/physrevlett.114.226103
- Peer Reviewed / Acknowledgement Compliant / Open Access
- Data Source
  KAKENHI-PROJECT-15K04673, KAKENHI-PROJECT-23000008, KAKENHI-PROJECT-23226008
[Journal Article] Experimental study of electric dipoles on an oxygen-adsorbed Si(100)-2×1 surface by non-contact scanning nonlinear dielectric microscopy2015
- Author(s)
  Masataka Suzuki, Kohei Yamasue, and Yasuo Cho
- Journal Title
  
  Appl. Phys. Lett.
  
  Volume: 107 Issue: 3
- DOI
  10.1063/1.4927244
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-23226008
[Journal Article] Interfacial capacitance between a ferroelectric Fe3O4 thin film and a semiconducting Nb:SrTiO3 substrate2015
- Author(s)
  R. Takahashi,Y. Cho, M. Lippmaa
- Journal Title
  
  J. Appl. Phys
  
  Volume: 117 Issue: 1 Pages: 014104-014104
- DOI
  10.1063/1.4905384
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24656027, KAKENHI-PROJECT-25706022, KAKENHI-PLANNED-26105002, KAKENHI-PROJECT-23226008
[Journal Article] Scanning nonlinear dielectric potentiometry2015
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Journal Title
  
  Review of Scientific Instruments
  
  Volume: 86 Issue: 9 Pages: 093704-093704
- DOI
  10.1063/1.4930181
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-15K04673, KAKENHI-PROJECT-23226008
[Journal Article] 走査型非線形誘電率顕微法に・E謔驪ﾉ性反転層状構造圧電薄膜の層厚の定量測定2015
- Author(s)
  寺田浩士朗, 西川宏明, 田中陽平, 小田川裕之, 柳谷隆彦, 長康雄
- Journal Title
  
  電子情報通信学会技術報告
  
  Volume: US2015-62 Pages: 23-26
- Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-15K04725
[Journal Article] Visualization and analysis of active dopant distribution in a p-i-n structured amorphous silicon solar cell using scanning nonlinear dielectric microscopy2015
- Author(s)
  K. Hirose, N. Chinone, and Y. Cho
- Journal Title
  
  AIP ADVANCES
  
  Volume: 5 Issue: 9
- DOI
  10.1063/1.4931028
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-23226008
[Journal Article] Nano-Domains and Related Phenomena in Congruent Lithium Tantalate Single Crystals Studied by Scanning Nonlinear Dielectric Microscopy2014
- Author(s)
  Yasuo Cho
- Journal Title
  
  IEEE TRANSACTION ON ULTRASONICS, FERROELECTRICS, AND FREQUENCY CONTROL
  
  Volume: 61 Issue: 8 Pages: 1368-1378
- DOI
  10.1109/tuffc.2014.3045
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-24656027, KAKENHI-PROJECT-23226008
[Journal Article] Cross-sectional dopant profiling and depletion layer visualization of SiC power double diffused metal-oxide-semiconductor field effect transistor using super-higher-order nonlinear dielectric microscopy2014
- Author(s)
  N. Chinone, T.Nakamura, Y. Cho
- Journal Title
  
  J. Appl. Phys
  
  Volume: 116 Issue: 8
- DOI
  10.1063/1.4893959
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-24656027, KAKENHI-PROJECT-23226008
[Journal Article] Investigation of solution-processed bismuth-niobium-oxide films2014
- Author(s)
  Satoshi Inoue, Tomoki Ariga, Shin Matsumoto, Masatoshi Onoue, Takaaki Miyasako, Eisuke Tokumitsu, Norimichi Chinone, Yasuo Cho and Tatsuya Shimoda
- Journal Title
  
  J. Appl. Phys.
  
  Volume: 116 Issue: 15
- DOI
  10.1063/1.4898323
- NAID
  120005652019
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24360119, KAKENHI-PROJECT-24656027, KAKENHI-PROJECT-23226008
[Journal Article] Pb (Zr, Ti)O3 recording media for probe data storage devices prepared by rf magnetron sputtering2014
- Author(s)
  Yoshiomi Hiranaga,Yasuo Cho
- Journal Title
  
  Jpn. J. Appl. Phys.
  
  Volume: 53 Issue: 9S Pages: 09PA05-09PA05
- DOI
  10.7567/jjap.53.09pa05
- NAID
  210000144474
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-24656027, KAKENHI-PROJECT-23226008
[Journal Article] Improved study of electric dipoles on the Si(100)-2x1 surface by non-contact scanning nonlinear dielectric microscopy2014
- Author(s)
  M. Suzuki, K. Yamasue, M. Abe, Y. Sugimoto, and Y. Cho
- Journal Title
  
  Applied Physics Letters
  
  Volume: 105 Issue: 10 Pages: 1016031-3
- DOI
  10.1063/1.4895031
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-14F03355, KAKENHI-PROJECT-24656027, KAKENHI-PUBLICLY-26110516, KAKENHI-PROJECT-26600015, KAKENHI-PROJECT-23226008
[Journal Article] Nano-Domains and Related Phenomena in Congruent Lithium Tantalate Single Crystals Studied by Scanning Nonlinear Dielectric Microscopy2014
- Author(s)
  Yasuo Cho
- Journal Title
  
  IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
  
  Volume: Vol.61
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24656027
[Journal Article] Charge gradient microscopy2014
- Author(s)
  Seungbum Hong , Sheng Tong , Woon lk Park , Yoshiomi Hiranaga , Yasuo Cho, Andreas Roelofs
- Journal Title
  
  Proc. Natl. Acad. Sci. USA
  
  Volume: 111 Issue: 18 Pages: 6566-6569
- DOI
  10.1073/pnas.1324178111
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24656027, KAKENHI-PROJECT-23226008
[Journal Article] Atomic-dipole-moment induced local surface potential on Si(111)-(7x7) surface studied by non-contact scanning nonlinear dielectric microscopy2014
- Author(s)
  K. Yamasue, M. Abe, Y. Sugimoto, and Y. Cho
- Journal Title
  
  Applied Physics Letters
  
  Volume: 105 Issue: 12 Pages: 1216011-5
- DOI
  10.1063/1.4896323
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-14F03355, KAKENHI-PROJECT-24656027, KAKENHI-PUBLICLY-26110516, KAKENHI-PROJECT-26600015, KAKENHI-PROJECT-23226008
[Journal Article] Electrical conduction in nanodomains in congruent lithium tantalate single crystal2013
- Author(s)
  Yasuo Cho
- Journal Title
  
  Appl. Phys. Lett.
  
  Volume: 104 Issue: 4
- DOI
  10.1063/1.4863754
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-23226008, KAKENHI-PROJECT-24656027
[Journal Article] High resolution imaging in cross-section of a metal-oxide-semiconductor field-effect-transistor using super-higher-order nonlinear dielectric microscopy2013
- Author(s)
  N. Chinone, K. Yamasue, K. Honda, Y. Cho
- Journal Title
  
  Journal of Physics : Conference Series
  
  Volume: 471 Pages: 012023-012023
- DOI
  10.1088/1742-6596/471/1/012023
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-23226008, KAKENHI-PROJECT-24656027
[Journal Article] Measurements of Nonlinear Dielectric Constants of Pb(Zr,Ti)O3 Thin Films Using a Dynamic Measuring Method2013
- Author(s)
  Yoshiomi Hiranaga, Yasuo Cho
- Journal Title
  
  Jpn. J. Appl. Phys.
  
  Volume: 52 Issue: 9S1 Pages: 09KA08-09KA08
- DOI
  10.7567/jjap.52.09ka08
- NAID
  210000142824
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23226008, KAKENHI-PROJECT-24656027
[Journal Article] Simultaneous measurement of tunneling current and atomic dipole moment on Si(111) -(7×7) surface by noncontact scanning nonlinear dielectric microscopy2013
- Author(s)
  Kohei Yamasue, Yasuo Cho
- Journal Title
  
  J. Appl. Phys.
  
  Volume: 113 Issue: 1
- DOI
  10.1063/1.4772705
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-23226008, KAKENHI-PROJECT-24656027
[Journal Article] Atomic dipole moment distribution on a hydrogen-adsorbed Si(111) - (7×7) surface observed by noncontact scanning nonlinear dielectric microscopy2013
- Author(s)
  Daisuke Mizuno, Kohei Yamasue, Yasuo Cho
- Journal Title
  
  Appl. Phys. Lett.
  
  Volume: 103 Issue: 10
- DOI
  10.1063/1.4820348
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-23226008, KAKENHI-PROJECT-24656027
[Journal Article] Visualization of Electrons Localized in Metal-Oxide-Nitride-Oxide-Semiconductor Flash Memory Thin Gate Films by Detecting High-Order Nonlinear Permittivity Using Scanning Nonlinear Dielectric Microscopy2012
- Author(s)
  Koichiro Honda, Yasuo Cho
- Journal Title
  
  Appl. Phys. Express
  
  Volume: Vol.5 Issue: 3 Pages: 036602-036602
- DOI
  10.1143/apex.5.036602
- NAID
  10030511604
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23226008, KAKENHI-PROJECT-24656027
[Journal Article] Scanning nonlinear dielectric microscopy observation of accumulated charges in metal-SiO2-SiN-SiO2-Si flash memory by detecting higher-order nonlinear permittivity2012
- Author(s)
  Koichiro Honda
- Journal Title
  
  Appl. Phys. Lett.
  
  Volume: Vol.101 Issue: 24
- DOI
  10.1063/1.4769352
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23226008, KAKENHI-PROJECT-24656027
[Journal Article] Atomic Scale Imaging of TiO2(100) Reconstructed Surfaces by Noncontact Scanning Nonlinear Dielectric Microscopy2012
- Author(s)
  Nobuhiro Sawai
- Journal Title
  
  Jpn. J. Appl Phys.
  
  Volume: Vol.51 Issue: 12R Pages: 121801-121801
- DOI
  10.1143/jjap.51.121801
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23226008, KAKENHI-PROJECT-24656027
[Journal Article] Observation of Nanoscale Ferroelectric Domains Using Super-Higher-Order Nonlinear Dielectric Microscopy2012
- Author(s)
  Norimichi Chinone, Kohei Yamasue, Yoshiomi Hiranaga, Yasuo Cho
- Journal Title
  
  Jpn. J. Appl. Phys
  
  Volume: Vol.51 Issue: 9S1 Pages: 09LE07-09LE07
- DOI
  10.1143/jjap.51.09le07
- NAID
  210000141273
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23226008, KAKENHI-PROJECT-24656027
[Journal Article] Scanning nonlinear dielectric microscopy2011
- Author(s)
  Yasuo Cho
- Journal Title
  
  J. Mater. Res.
  
  Volume: Vol.26 Issue: 16 Pages: 2007-2016
- DOI
  10.1557/jmr.2011.219
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23226008
[Journal Article] Ferroelectric Data Recording Using Servo-Controlled Tracking Technique2010
- Author(s)
  K. Tanaka and Y. Cho
- Journal Title
  
  Jpn. J. Appl. Phys
  
  Volume: Vol.49
- NAID
  210000069223
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18002005
[Journal Article] Actual information storage with a recording density of 4 Tbit/in.^2 in a ferroelectric recording medium2010
- Author(s)
  K. Tanaka and Y. Cho
- Journal Title
  
  Appl. Phys. Lett
  
  Volume: Vol.97 Pages: 92901-92901
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18002005
[Journal Article] Nanodomain Formation on Ferroelectrics and Development of Hard-Disk-Drive-Type Ferroelectric Data Storage Devices2009
- Author(s)
  Y. Hiranaga, T. Uda, Y. Kurihashi, H. Tochishita, M. Kodota and Y. Cho
- Journal Title
  
  Jpn. J. Appl. Phys.
  
  Volume: Vol.48
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18002005
[Journal Article] Dependence of long term stability on the initial radius of small inverted domains formed on congruent single-crystal LiTaO_32009
- Author(s)
  N. Odagawa and Y. Cho
- Journal Title
  
  Appl. Phys. Lett
  
  Volume: Vol.95 Pages: 142907-142907
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18002005
[Journal Article] Scanning Nonlinear Dielectric Microscopy Nano-Science and Technology for Next Generation High Density Ferroelectric Data Storage2008
- Author(s)
  K. TANAKA, Y. KURIHASHI, T. UDA, Y. DAIMON, N. ODAGAWA, R. HIROSE, Y. HIRANAGA, and Y. CHO
- Journal Title
  
  Jpn. J. Appl. Phys
  
  Volume: Vol.47 Pages: 3311-3311
- NAID
  40016057191
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18002005
[Journal Article] The influence of 180° ferroelectric domain wall width on the thresho ld field for wall motion2008
- Author(s)
  Samrat Choudhury
- Journal Title
  
  Journal of Applied Physics 104
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18002005
[Journal Article] Scanning Nonlinear Dielectric Microscopy Nano-Science and Technology for Next Generation High Density Ferroelectric Data Storage2008
- Author(s)
  Kenkou TANAKA, Yuichi KURIHASHI, Tomoya UDA, Yasuhiro DAIMON, Nozomi ODAGAWA, Ryusuke HIROSE, Yoshiomi HIRANAGA, and Yasuo CHO
- Journal Title
  
  Jpn. J. Appl. Phys Vol.47, No.5
  
  Pages: 3311-3325
- NAID
  40016057191
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18002005
[Journal Article] Cross- sectional observation of nanodomain dots formed in both congruent and stoichiometric LiTaO3 crystals2007
- Author(s)
  Yasuhiro Daimon and Yasuo Cho
- Journal Title
  
  Appl. Phys. Lett. Vol.90
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18002005
[Journal Article] Atomic Dipole Moment Distribution of Si Atoms on a Si (111)-(7×7) Surface Studied Using Noncontact Scanning Nonlinear Dielectric Microscopy2007
- Author(s)
  Yasuo Cho
- Journal Title
  
  Physical Review Letters 99
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18002005
[Journal Article] Novel HDD-type SNDM Ferroelectric Data Storage System Aimed at High-Speed Data Transfer with Single Probe Operation2007
- Author(s)
  Yoshiomi Hiranaga, Tomoya Uda, Yuichi Kurihashi, Kenkou Tanaka, and Yasuo Cho
- Journal Title
  
  IEEE TRANSACTION ON ULTRASONICS, FERROELECTRICS, AND FREQUENCY CONTROL Vol.54, No.12
  
  Pages: 2523-2528
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18002005
[Journal Article] Scanning Nonlinear Dielectric Microscope with Super High Resolution2007
- Author(s)
  Yasuo Cho
- Journal Title
  
  Jpn. J. Appl. Phys 46
  
  Pages: 4428-4434
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18002005
[Journal Article] Atomic Dipole Moment Distribution of Si Atoms on a Si(111)-(7×7) Surface Studied Using Noncontact Scanning Nonlinear Dielectric Microscopy2007
- Author(s)
  Yasuo Cho and Ryusuke Hirose
- Journal Title
  
  Physical Review Letters Vol.99, No.18
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18002005
[Journal Article] Atomic Dipole Moment Distribution of Si Atoms on a Si(111)-(7×7) Surface Studied Using Noncontact Scanning Nonlinear Dielectric Microscopy2007
- Author(s)
  Y. Cho and R. Hirose
- Journal Title
  
  Physical Review Letters
  
  Volume: Vol.99 Pages: 186101-186101
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18002005
[Journal Article] Nanoscale Ferroelectric Information Storage Based on Scanning Nonlinear Dielectric Microscopy2007
- Author(s)
  Yasuo Cho
- Journal Title
  
  Journal of Nanoscience and Nanotechnology 7・1
  
  Pages: 105-116
- Data Source
  KAKENHI-PROJECT-18002005
[Journal Article] Novel HDD-type SNDM Ferroelectric Data Storage System Aimed at High-Speed Data Transfer with Single Probe Operation2007
- Author(s)
  Y. Hiranaga, T. Uda, Y. Kurihashi, K. Tanaka, and Y. Cho
- Journal Title
  
  IEEE TRANSACTION ON ULTRASONICS, FERROELECTRICS, AND FREQUENCY CONTROL
  
  Volume: Vol.54 Pages: 2523-2523
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18002005
[Journal Article] Observation of [110] surface band within {101} a-domain of heteroepitaxial PbTiO_3 thin film fabricated by hydrothermal epitaxy2006
- Author(s)
  S.K.Choi
- Journal Title
  
  Appl.Phys.Lett. Vol.88
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15206036
[Journal Article] Wall behavior of nanodomains as a function of their initial state2006
- Author(s)
  Nozomi Odagawa and Yasuo Cho
- Journal Title
  
  Appl. Phys. Lett. Vol.89
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18002005
[Journal Article] Nanodomain manipulation for ultrahigh density ferroelectric data storage2006
- Author(s)
  Yasuo Cho
- Journal Title
  
  Nanotechnology 17・7
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15206036
[Journal Article] Nanodomain manipulation for ultrahigh density ferroelectric data storage2006
- Author(s)
  Yasuo Cho
- Journal Title
  
  Nanotechnology Vol.17
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15206036
[Journal Article] Long-term- retention characteristics of small inverted dots formed on congruent single-crystal LiTaO_32006
- Author(s)
  Nozomi Odagawa and Yasuo Cho
- Journal Title
  
  Appl. Phys. Lett. Vol.89
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18002005
[Journal Article] Observation of [110] surface band within {101} a-domain of heteroepitaxial PbTiO_3 thin film fabricated by hydrothermal epitaxy2006
- Author(s)
  S.K.Choi
- Journal Title
  
  Appl. Phys. Lett. 88・5
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15206036
[Journal Article] Nanodomain manipulation for ultrahigh density ferroelectric data storage2006
- Author(s)
  Yasuo Cho
- Journal Title
  
  Nanotechnology 17・7
- Data Source
  KAKENHI-PROJECT-18002005
[Journal Article] Ultrahigh-Density Ferroelectric Data Storage Based on Scanning Nonlinear Dielectric Microscopy2005
- Author(s)
  Yasuo Cho
- Journal Title
  
  Jpn.J.Appl.Phys Vol.44
  
  Pages: 5339-5343
- NAID
  10016676620
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15206036
[Journal Article] Ultrahigh-Density Ferroelectric Data Storage Based on Scanning Nonlinear Dielectric Microscopy2005
- Author(s)
  Yasuo Cho
- Journal Title
  
  Jpn. J. Appl. Phys 44・7B
  
  Pages: 5339-5343
- NAID
  10016676620
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15206036
[Journal Article] Ultrahigh-Density Ferroelectric Data Storage Based on Scanning Nonlinear Dielectric Microscopy2005
- Author(s)
  Yasuo Cho
- Journal Title
  
  Jpn.J.Appl.Phys 44・7B
  
  Pages: 5339-5343
- NAID
  10016676620
- Data Source
  KAKENHI-PROJECT-15206036
[Journal Article] Realization of 10 Tbit/in.^2 memory density and subnanosecond domain switching time in ferroelectric data storage2005
- Author(s)
  Yasuo Cho
- Journal Title
  
  Appl.Phys.Lett 87・23
- Data Source
  KAKENHI-PROJECT-15206036
[Journal Article] 非線形誘電率顕微鏡と次世代超高密度強誘電体記録2005
- Author(s)
  長康雄
- Journal Title
  
  電子情報通信学会論文誌C J88-C・1
  
  Pages: 1-12
- NAID
  110003207329
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15206036
[Journal Article] Realization of 10 Tbit/in^2. memory density and subnanosecond domain switching time in ferroelectric data storage2005
- Author(s)
  Yasuo Cho
- Journal Title
  
  Appl.Phys.Lett. Vol.87
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15206036
[Journal Article] Scanning Nonlinear Dielectric Microscope and Its Application to Next Generation Super High-Density Ferroelectric Data Storage2005
- Author(s)
  Yasuo Cho
- Journal Title
  
  Denshi Joho Tushin Gakkai Ronbunshi Vol.J.88-C
  
  Pages: 1-12
- NAID
  110003207329
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15206036
[Journal Article] Realization of 10 Tbit/in.2 memory density and subnanosecond domain switching time in ferroelectric data storage2005
- Author(s)
  Yasuo Cho
- Journal Title
  
  Appl. Phys. Lett. 87・23
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15206036
[Journal Article] Hydrothermally Deposited PbTiO3 Epitaxial Thin Film2005
- Author(s)
  T.Morita, Y.Cho
- Journal Title
  
  Journal of Korean Physical Society 46・1
  
  Pages: 10-14
- Data Source
  KAKENHI-PROJECT-12134204
[Journal Article] Fundamental Study on Ferroelectric Data Storage with the Density Above 1 Tbit/inch^2 Using Congruent Lithium Tantalate2004
- Author(s)
  YASUO CHO
- Journal Title
  
  Integrated Ferroelectrics 61
  
  Pages: 77-81
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15206036
[Journal Article] Fundamental Study on Ferroelectric Data Storage with the Density Above 1 Tbit/inch^2 Using Congruent Lithium Tantalate2004
- Author(s)
  YASUO CHO
- Journal Title
  
  Integrated Ferroelectrics Vol.61
  
  Pages: 77-81
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15206036
[Journal Article] Terabit inch^<-2> ferroelectric data storage using scanning nonlinear dielectric microscopy nanodomain engineering system2003
- Author(s)
  Y.Cho
- Journal Title
  
  Nanotechnology Vol.14
  
  Pages: 637-642
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15206036
[Journal Article] Scanning Nonlinear Dielectric Microscopy : "Overview -A High Resolution Tool for Observing Ferroelectric Domains and Nano-domain Engineering-"2003
- Author(s)
  Yasuo Cho
- Journal Title
  
  Journal of the Korean Ceramic Society Vol.40
  
  Pages: 1047-1057
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15206036
[Journal Article] Terabit inch-2 ferroelectric data storage using scanning nonlinear dielectric microscopy nanodomain engineering system2003
- Author(s)
  Y.Cho
- Journal Title
  
  Nanotechnology 14
  
  Pages: 637-642
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15206036
[Journal Article] Scanning Nonlinear Dielectric Microscopy : "Overview-A High Resolution Tool for Observing Ferroelectric Domains and Nano-domain Engineering-2003
- Author(s)
  Yasuo Cho
- Journal Title
  
  Journal of the Korean Ceramic Society 40・11
  
  Pages: 1047-1057
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15206036
[Patent] PCT/JP2023/ 94962023
- Inventor(s)
  長　康雄
- Industrial Property Rights Holder
  国立大学法人東北大学
- Industrial Property Rights Type
  特許
- Filing Date
  2023
- Overseas
- Data Source
  KAKENHI-PROJECT-16H06360
[Patent] 誘電体再生装置および誘電体記録再生装置2023
- Inventor(s)
  長　康雄
- Industrial Property Rights Holder
  国立大学法人東北大学
- Industrial Property Rights Type
  特許
- Filing Date
  2023
- Overseas
- Data Source
  KAKENHI-PROJECT-21K18706
[Patent] 強誘電体薄膜製造方法、電圧印加エッチング装置、強誘電体結晶薄膜基板及び強誘電体結晶ウェハ2010
- Inventor(s)
  長康雄, 尾上篤
- Industrial Property Rights Holder
  長尾康雄, パイオニア株式会社
- Acquisition Date
  2010-12-10
- Data Source
  KAKENHI-PROJECT-18002005
[Patent] DATA RTECORDING/REPRODUCING APPARATUS AND METHOD USING NEEDLE-SHAPED MEMBER2008
- Inventor(s)
  Ysuo Cho, Atsudhi Onoe
- Industrial Property Rights Holder
  Yasuo Cho, Pioneer Corporation
- Acquisition Date
  2008-06-10
- Overseas
- Data Source
  KAKENHI-PROJECT-18002005
[Patent] 誘電体記録再生ヘッド及び誘電体記録再生装置2007
- Inventor(s)
  長康雄, 尾上篤
- Industrial Property Rights Holder
  長康雄, パイオニア株式会社
- Acquisition Date
  2007-05-18
- Data Source
  KAKENHI-PROJECT-18002005
[Patent] 探針空隙制御方法、及び、記録再生装置2005
- Inventor(s)
  長康雄
- Industrial Property Rights Holder
  東北大学
- Industrial Property Number
  2005-079716
- Filing Date
  2005-03-18
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15206036
[Patent] 誘電体記録・再生装置及び記録方法ならびにその電極2005
- Inventor(s)
  長康雄
- Industrial Property Rights Holder
  東北大学
- Industrial Property Number
  2005-081209
- Filing Date
  2005-03-22
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15206036
[Presentation] Correlation analysis on local capacitance-voltage profiles of a SiO2/SiC interface observed by time-resolved scanning nonlinear dielectric microscopy2023
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  7th IEEE Electron Devices Technology and Manufacturing(EDTM) Conference 2023
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Correlation analysis on local capacitance-voltage profiles of a SiO2/SiC interface observed by time-resolved scanning nonlinear dielectric microscopy2023
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  7th IEEE Electron Devices Technology and Manufacturing(EDTM) Conference
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18706
[Presentation] Statistical analysis of local C-V map data for ferroelectric thin films2022
- Author(s)
  Yoshiomi Hiranaga, Yasuo Cho
- Organizer
  7th International Symposium on Dielectric Materials and Applications (ISyDMA’7)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18706
[Presentation] Microscopic carrier distribution imaging of black silicon solar cell by scanning nonlinear dielectric microscopy” the 33rd International Photovoltaic Science and Engineering Conference (PVSEC-33)2022
- Author(s)
  Yasuo Cho, Beniamino Iandolo, Ole Hansen
- Organizer
  the 33rd International Photovoltaic Science and Engineering Conference (PVSEC-33)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Real-space analysis on surface potential fluctuations of Al2O3/GaN interfaces by scanning nonlinear dielectric microscopy2022
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  International Workshop on Nitride Semiconductor(IWN2022)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Scanning Nonlinear Dielectric Microscopic Investigation of Mechanically Exfoliated WSe2/SiO2 and Suspended WSe22022
- Author(s)
  Koki Takano, Kohei Yamasue, Toshiaki Kato, Toshiaki Kato and Yasuo Cho
- Organizer
  2022 MRS Fall Meeting & Exhibit
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18706
[Presentation] Experimental research on curved photovoltaic modules : effects of hot spots, interconnect schemes and curvature on electrical PV performance2022
- Author(s)
  Sachiko Jonai, Haruto Morishita, Yasuo Cho, Diego Bronneberg, Martin Huijzer, Angele Reinders
- Organizer
  the 33rd International Photovoltaic Science and Engineering Conference (PVSEC-33)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Statistical analysis of local C-V map data for ferroelectric thin films2022
- Author(s)
  Yoshiomi Hiranaga, Yasuo Cho
- Organizer
  7th International Symposium on Dielectric Materials and Applications (ISyDMA’7)
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Real-space analysis on surface potential fluctuations of Al2O3/GaN interfaces by scanning nonlinear dielectric microscopy2022
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  International Workshop on Nitride Semiconductor(IWN2022)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18706
[Presentation] Microscopic carrier distribution imaging of black silicon solar cell by scanning nonlinear dielectric microscopy2022
- Author(s)
  Yasuo Cho, Beniamino Iandolo, Ole Hansen
- Organizer
  The 33rd International Photovoltaic Science and Engineering Conference (PVSEC-33)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18706
[Presentation] Scanning Nonlinear Dielectric Microscopic Investigation of Mechanically Exfoliated WSe2/SiO2 and Suspended WSe22022
- Author(s)
  Koki Takano, Kohei Yamasue, Toshiaki Kato, Toshiaki Kato and Yasuo Cho
- Organizer
  2022 MRS Fall Meeting & Exhibit
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Local Capacitance-Voltage Profiling on MoS2/SiO2 and MoS2/h-BN/SiO2 by Scanning Nonlinear Dielectric Microscopy Assisted with an Insulating Tip2022
- Author(s)
  Taiyo Ishizuka, Kohei Yamasue, and Yasuo Cho
- Organizer
  EDTM 2022
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18706
[Presentation] Quantitative measurement of active dopant density distribution in black silicon solar cell using scanning nonlinear dielectric microscopy2022
- Author(s)
  Yasuo Cho, Beniamino Iandolo, Ole Hansen
- Organizer
  49th IEEE Photovoltaic Specialists Conference (PVSC 49)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18706
[Presentation] Comparative study on carrier distribution of mechanically exfoliated WSe2/SiO2 and suspended WSe2 by scanning nonlinear dielectric microscopy2022
- Author(s)
  Koki Takano, Kohei Yamasue, Toshiaki Kato, Toshiro Kaneko and Yasuo Cho
- Organizer
  THE 22ND INTERNATIONAL VACUUM CONGRESS IVC-22
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Quantitative measurement of active dopant density distribution in black silicon solar cell using scanning nonlinear dielectric microscopy2022
- Author(s)
  Yasuo Cho, Beniamino Iandolo, Ole Hansen
- Organizer
  49th IEEE Photovoltaic Specialists Conference
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Carrier Profile Mapping in a 3D Flash Memory Cell using Scanning Nonlinear Dielectric Microscopy2022
- Author(s)
  Jun Hirota, Ken Hoshino, Kohei Yamasue, and Yasuo Cho.
- Organizer
  EDTM 2022
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18706
[Presentation] Experimental research on curved photovoltaic modules : effects of hot spots, interconnect schemes and curvature on electrical PV performance2022
- Author(s)
  Sachiko Jonai, Haruto Morishita, Yasuo Cho, Diego Bronneberg
- Organizer
  The 33rd International Photovoltaic Science and Engineering Conference (PVSEC-33)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18706
[Presentation] Comparative study on carrier distribution of mechanically exfoliated WSe2/SiO2 and suspended WSe2 by scanning nonlinear dielectric microscopy2022
- Author(s)
  Koki Takano, Kohei Yamasue, Toshiaki Kato, Toshiro Kaneko and Yasuo Cho
- Organizer
  THE 22ND INTERNATIONAL VACUUM CONGRESS IVC-22
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18706
[Presentation] A Scanning Nonlinear Dielectric Microscopic Investigation of Al2O3/Diamond MOS Interfaces2021
- Author(s)
  Yasuo Cho, Yu Ogata, Kohei Yamasue, Xufang Zhang, Tsubasa Matsumoto, Norio Tokuda
- Organizer
  2021 MRS Fall Meeting & Exhibit
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18706
[Presentation] Scanning Nonlinear Dielectric Microscopic Investigation of Active Dopant Density Distribution in Black Silicon Solar Cell2021
- Author(s)
  Yasuo Cho, Beniamino Iandolo, Ole Hansen
- Organizer
  2021 MRS Fall Meeting & Exhibit
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18706
[Presentation] Nanoscale characterization techniques for ultra-thin van der Waals semiconductors based on scanning nonlinear dielectric microscopy2021
- Author(s)
  Kohei Yamasue, Yasuo Cho
- Organizer
  The 5th international symposium on“Elucidation of Next Generation Functional Materials・Surface and Interface Properties”
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18706
[Presentation] Nanoscale study on surface potential fluctuations of SiO2/SiC interfaces by time-resolved scanning nonlinear dielectric microscopy2021
- Author(s)
  Kohei Yamasue, and Yasuo Cho
- Organizer
  52th IEEE Semiconductor Interface Specialists Conference
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18706
[Presentation] Local Capacitance-Voltage Profiling and Deep Level Transient Spectroscopy of SiO2/SiC Interfaces by Scanning Nonlinear Dielectric Microscopy2021
- Author(s)
  Kohei Yamasue, Yasuo Cho
- Organizer
  IPFA2021
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18706
[Presentation] Microscopic Carrier Distribution Imaging of Atomically-Thin van der Waals Semiconductors by Scanning Nonlinear Dielectric Microscopy2021
- Author(s)
  Yasuo Cho, Kohei Yamasue
- Organizer
  Microscopic Carrier Distribution Imaging of Atomically-Thin van der Waals Semiconductors by Scanning Nonlinear Dielectric Microscopy
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18706
[Presentation] Nanoscale capacitance-voltage profiling of DC bias induced stress on a high-κ/SiO2/Si gate stack2021
- Author(s)
  Koharu Suzuki, Kohei Yamasue, Yasuo Cho
- Organizer
  ESREF2021
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18706
[Presentation] Simultaneous interface defect density and differential capacitance imaging by time-resolved scanning nonlinear dielectric microscopy2021
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  ISTFA 2021
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18706
[Presentation] Nanoscale Domain Dynamics Characterization Using Local C-V Mapping2021
- Author(s)
  Yoshiomi Hiranaga and Yasuo Cho
- Organizer
  The Sixth International Symposium on Dielectric Materials and Applications
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18706
[Presentation] Surface potential fluctuations of SiO2/SiC interfaces investigated by local capacitance-voltage profiling based on time-resolved scanning nonlinear dielectric microscopy2021
- Author(s)
  K. YAMASUE, Y. CHO
- Organizer
  ECSCRM 2021
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18706
[Presentation] Recording Medium Design Aiming at Realizing Ferroelectric Probe Data Storage2021
- Author(s)
  Yoshiomi Hiranaga and Yasuo Cho
- Organizer
  The Sixth International Symposium on Dielectric Materials and Applications
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18706
[Presentation] Local capacitance-voltage profiling and high voltage stress effect study of SiO2/SiC structures by time-resolved scanning nonlinear dielectric microscopy2021
- Author(s)
  Kohei Yamasue, Koharu Suzuki, Yasuo Cho
- Organizer
  ESREF2021
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18706
[Presentation] Nanoscale evaluation of Al2O3/diamond MOS interfaces using time-resolved scanning nonlinear dielectric microscopy2021
- Author(s)
  Y. OGATA, K. YAMASUE, X. ZHANG, T. MATSUMOTO, N. TOKUDA, Y. CHO
- Organizer
  ECSCRM 2021
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K18706
[Presentation] High-Resolution Observation of Ferroelectric Domains Using Scanning Nonlinear Dielectric Microscopy With Ultra Sharp Diamond Probe2019
- Author(s)
  Tomotaka Ishida, Yoshiomi Hiranaga and Yasuo Cho
- Organizer
  Asia-Pacific PFM 2019
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Improvement of Signal-to-Noise Ratio in Carrier Distribution Imaging in Intermittent Contact Scanning Nonlinear Dielectric Microscopy Based on Boxcar Integration2019
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  8th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Unintentional doping effects on atomically-thin Nb-doped MoS2 observed by scanning nonlinear dielectric microscopy2019
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  International Symposium for Testing and Failure Analysis 2019
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] A New Evaluation Technique for Interface Defect Density on High-κ/SiO2/Si and SiO2/Si Gate Stacks using Scanning Nonlinear Dielectric Microscopy2019
- Author(s)
  K. Suzuki, K. Yamasue, and Y. Cho
- Organizer
  50th IEEE Semiconductor Interface Specialists Conference
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Flexoelectricity and magnetism in strain-gradient rare-earth iron garnet thin films2019
- Author(s)
  Hiroyasu Yamahara, Sarker Md Shamim, Munetoshi Seki, Yasuo Cho, Hitoshi Tabata
- Organizer
  26th International Workshop on Oxide Electronics
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Optimization of signal intensity in intermittent contact scanning nonlinear dielectric microscopy2019
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  The 30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Carrier Distribution Investigation of Potential-Induced Degradation in Monocrystalline Silicon Solar Cell Using Scanning Nonlinear Dielectric Microscopy2019
- Author(s)
  Yasuo Cho
- Organizer
  he 29th International PV Science and Engineering Conference
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Influence of non-uniform interface defect distribution on channel mobility in SiC MOSFETs investigated by local deep level transient spectroscopy and device simulation2019
- Author(s)
  Kohei Yamasue Yuji Yamagishi, Yasuo Cho
- Organizer
  International Conference on Silicon Carbide and Related Materials 2019
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] High Resolution Mapping of Defects at SiO2/SiC Interfaces by Local-DLTS Based on Time Resolved Scanning Nonlinear Dielectric Microscopy2019
- Author(s)
  Yuji Yamagishi and Yasuo Cho
- Organizer
  The International Symposium on the Physical and Failure Analysis of Integrated Circuits
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Surface dipole induced potentials on metals observed by noncontact scanning nonlinear dielectric potentiometry2019
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  The 17th International Conference on the Formation of Semiconductor Interfaces
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] ∂C/∂z-Mode Scanning Nonlinear Dielectric Microscopy for Linear Permittivity Imaging2019
- Author(s)
  Yoshiomi Hiranaga, Yasuo Cho
- Organizer
  Asia-Pacific PFM 2019
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Boxcar averaging based scanning nonlinear dielectric microscopy and its application to carrier distribution imaging on 2D semiconductors2019
- Author(s)
  Kohei Yamasue, Yasuo Cho
- Organizer
  2019 International Integrated Reliability Workshop
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] A study on evaluation of interface defect density on high-κ/SiO2/Si and SiO2/Si gate stacks using scanning nonlinear dielectric microscopy2019
- Author(s)
  Koharu Suzuki, Kohei Yamasue, Yasuo Cho
- Organizer
  2019 International Integrated Reliability Workshop
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Nanoscale carrier distribution imaging on atomically-thin layered semiconductors by scanning nonlinear dielectric microscop2019
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  The 4th international symposium on “Elucidation of Property of Next Generation Functional Materials and Surface/Interface
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] 2D Interface Defect Density Evaluation on Macrostepped SiO2/SiC Using Local Deep Level Transient Spectroscopy Based on Scanning Nonlinear Dielectric Microscopy2019
- Author(s)
  A. Hosaka, K. Yamasue, J. Woerle, G. Ferro, U. Grossner, M. Camarda, and Y. Cho
- Organizer
  50th IEEE Semiconductor Interface Specialists Conference
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Unintentional n-Type Doping on Single Layer Nb-Doped MoS2 Observed by Scanning Nonlinear Dielectric Microscopy2019
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  2019 MRS Fall Meeting & Exhibit
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] High Resolution Observation of Subsurface Defects at SiO2/4H-SiC Interfaces by Local Deep Level Transient Spectroscopy Based on Time-Resolved Scanning Nonlinear Dielectric Microscopy2019
- Author(s)
  Y. Yamagishi and Y. Cho
- Organizer
  IRPS 2019
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Spatially Resolved Defect Mapping of the SiO2/4H-SiC Interface2019
- Author(s)
  Judith Woerle, Brett Johnson, Corrado Bongiorno, Kohei Yamasue, Gabriel Ferro, Dipanwita Dutta, Yasuo Cho, Ulrike Grossner, Massimo Camarda
- Organizer
  International Conference on Silicon Carbide and Related Materials 2019
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] High resolution characterizations of fine structure of electric devices and materials using scanning nonlinear dielectric microscopy2019
- Author(s)
  Yasuo Cho
- Organizer
  High Frequency Scanning Probe Microscopy Workshop
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Carrier profiling of the 10-nm-order structure in a 3D Flash memory cell using scanning nonlinear dielectric microscopy2019
- Author(s)
  Jun Hirota, Ken Hoshino, Tsukasa Nakai, Kohei Yamasue, and Yasuo Cho
- Organizer
  International Symposium for Testing and Failure Analysis 2019
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Spatially-resolved evaluation of interface defect density on macrostepped SiO2/SiC using local deep level transient spectroscopy2019
- Author(s)
  Anna Hosaka, Kohei Yamasue, Judith Woerle, Gabriel Ferro, Ulrike Grossner, Massimo Camarda, Yasuo Cho
- Organizer
  2019 International Integrated Reliability Workshop
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Novel carrier measurement methodology for floating gate of sub-20 nm node flash memory using scanning nonlinear dielectric microscopy2018
- Author(s)
  Jun Hirota, Yuji Yamagishi, Shiro Takeno and Yasuo Cho
- Organizer
  ISTFA 2018
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Quantitative Evaluation of Carrier Distribution in Silicon Solar Cell Using Scanning Nonlinear Dielectric Microscopy2018
- Author(s)
  Kotaro Hirose, Katsuto Tanahashi, Hidetaka Takato, and Yasuo Cho
- Organizer
  IPFA 2018
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] ∂C/∂z-Mode Scanning Nonlinear Dielectric Microscopy for Local Permittivity Imaging2018
- Author(s)
  Yoshiomi Hiranaga, Yasuo Cho
- Organizer
  ECAPD-2018
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Scanning nonlinear dielectric microscopy study on nanoscale carrier distribution in two dimensional semiconductors2018
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  ICN+T2018
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Charge State Evaluation of Passivation Layers for Silicon Solar Cells by Scanning Nonlinear Dielectric Microscopy2018
- Author(s)
  K. Kakikawa, Y. Yamagishi, H. Takato, K. Tanahashi and Y. Cho
- Organizer
  IRPS2018
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] High Resolution Mapping of Subsurface Defects at SiO2/SiC Interfaces by Local Deep Level Transient Spectroscopy Based on Time-Resolved Scanning Nonlinear Dielectric Microscopy2018
- Author(s)
  Y. Yamagishi and Y. Cho
- Organizer
  SISC 2018
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Imaging of nanoscale linear permittivity by using ∂C/∂z-mode scanning nonlinear dielectric microscopy2018
- Author(s)
  Yoshiomi Hiranaga, Yasuo Cho
- Organizer
  Electroceramics XVI
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] High resolution observation of defects at SiO2/4H-SiC interfaces by time-resolved scanning nonlinear dielectric microscopy2018
- Author(s)
  Yuji Yamagishi, and Yasuo Cho
- Organizer
  ESREF2018
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Development of time-resolved scanning nonlinear dielectric microscopy and its application to local deep level transient spectroscopy2018
- Author(s)
  Yuji Yamagishi and Yasuo Cho
- Organizer
  ICN+T2018
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Local deep level transient spectroscopy imaging for MOS interface trap distribution2018
- Author(s)
  N. Chinone and Y. Cho
- Organizer
  PCSI45
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] ∂C/∂z-mode scanning nonlinear dielectric microscopy for imaging nanoscale linear permittivity2018
- Author(s)
  Yoshiomi Hiranaga and Yasuo Cho
- Organizer
  ICN+T2018
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Measurement Method of Depth Profile in Polarity-Inverted Layered Structure Using Scanning Nonlinear Dielectric Microscopy with Soft Probe tip2018
- Author(s)
  Hiroyuki Odagawa, Yohei Tanaka, Yasuo Cho
- Organizer
  ECAPD-2018
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] HDD Type High Speed Data Readout Demonstrations in Ferroelectric Data Storage Using Pb(Zr,Ti)O3 Recording Medium2018
- Author(s)
  R. M. ABEYSINGHE, Y. HIRANAGA and Y. CHO
- Organizer
  2018 ISAF-FMA-AMF-AMEC-PFM Joint Conference
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Evaluation of Local Charge State in Al2O3 Passivation Layers of Silicon Solar Cells Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy2018
- Author(s)
  K. Kakikawa, Y. Yamagishi, K. Tanahashi, H. Takato and Y. Cho
- Organizer
  ACSIN-14 & ICSPM26
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Nanoscale Permittivity Imaging Using ∂C/∂z-mode Scanning Nonlinear Dielectric Microscopy2018
- Author(s)
  Y. Hiranaga and Y. Cho
- Organizer
  ACSIN-14 & ICSPM26
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] DC bias dependent nanoscale carrier distribution on a few-layer WSe2 on SiO2 observed by scanning nonlinear dielectric microscopy2018
- Author(s)
  Kohei Yamasue, Toshiaki Kato, Toshiro Kaneko and Yasuo Cho
- Organizer
  ECOSS34
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Nanoscale Linear Permittivity Imaging Based on Scanning Nonlinear Dielectric Microscopy2018
- Author(s)
  Yoshiomi Hiranaga and Yasuo Cho
- Organizer
  IUMRS-ICEM 2018
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Scanning nonlinear dielectric microscopy in peak-force tapping mode and its application to transition metal dichalcogenides2018
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  ISPM2018
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Improved readout speed in ferroelectric probe data storage with large nonlinear permittivity media2018
- Author(s)
  Reshan Maduka Abeysinghe, Yoshiomi Hiranaga, Yasuo Cho
- Organizer
  ECAPD-2018
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Few-layer WSe2 on SiO2 Observed by Scanning Nonlinear Dielectric Microscopy and Electrostatic Force Microscopy2018
- Author(s)
  K. Yamasue, T. Kato, T. Kaneko and Y. Cho
- Organizer
  ACSIN-14 & ICSPM26
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Nanoscale carrier distribution imaging of layered semiconductor materials using scanning nonlinear dielectric microscopy2018
- Author(s)
  K. Yamasue and Y. Cho
- Organizer
  PCSI45
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Electric Field Effects on Few-Layer WSe2/SiO2 Investigated by Scanning Nonlinear Dielectric Microscopy2018
- Author(s)
  Kohei Yamasue, Toshiaki Kato, Toshiro Kaneko and Yasuo Cho
- Organizer
  2018 MRS Fall Meeting & Exhibit
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Local Evaluation of Al2O3 Passivation Layers for Crystalline Silicon Solar Cells by Super-Higher-Order Scanning Nonlinear Dielectric Microscopy2018
- Author(s)
  Kento Kakikawa, Yuji Yamagishi, Katsuto Tanahashi, Hidetaka Takato, Yasuo Cho
- Organizer
  World Conference on Photovoltaic Energy Conversion (WCPEC7)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] ∂C/∂z-mode SNDM for imaging nanoscale linear permittivity2018
- Author(s)
  Yoshiomi HIRANAGA and Yasuo CHO
- Organizer
  The 3rd International Symposium on“Recent Trends in the Elucidation and Function Discovery of Next Generation Functional Materials of Surface / Interface Properties”
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] High-resolution observation of defects at nitride SiO2/4H-SiC interfaces by local deep level transient spectroscopy2018
- Author(s)
  Y. Yamagishi, K. Yamasue and Y. Cho
- Organizer
  ECSCRM2018
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Nanoscale Linear Permittivity Measurement Using Scanning Nonlinear Dielectric Microscopy2018
- Author(s)
  Yoshiomi Hiranaga and Yasuo Cho
- Organizer
  Third International Symposium on Dielectric Materials and Applications
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Quantitative measurement of active dopant density distribution in textured emitter of phosphorus-implanted monocrystalline silicon solar cell using scanning nonlinear dielectric microscopy2018
- Author(s)
  Kotaro Hirose, Katsuto Tanahashi, Hidetaka Takato, and Yasuo Cho
- Organizer
  TechConnect World 2018
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Local Permittivity Measurement Using ∂C/∂z-Mode Scanning Nonlinear Dielectric Microscopy2018
- Author(s)
  Y. HIRANAGA and Y. CHO
- Organizer
  2018 ISAF-FMA-AMF-AMEC-PFM Joint Conference
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] High-Resolution Observation of Defects at SiO2/SiC Interfaces by Local Deep Level Transient Spectroscopy Based on Time-Resolved Scanning Nonlinear Dielectric Microscopy2018
- Author(s)
  Yuji Yamagishi and Yasuo Cho
- Organizer
  2018 MRS Fall Meeting & Exhibit
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] High resolution mapping of subsurface defects at SiO2/SiC interfaces by time-resolved scanning nonlinear dielectric microscopy2018
- Author(s)
  Yuji Yamagishi, and Yasuo Cho
- Organizer
  ISTFA 2018
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Nanoscale Linear Dielectric Constant Imaging Using ∂C/∂z -Mode Scanning Nonlinear Dielectric Microscopy2018
- Author(s)
  Yoshiomi Hiranaga and Yasuo Cho
- Organizer
  2018 MRS Fall Meeting & Exhibit
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Local Evaluation of Non-Uniform Charge Distribution in Al2O3 Passivation Layers for Silicon Solar Cells Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy2018
- Author(s)
  Kento Kakikawa, Yuji Yamagishi, Katsuto Tanahashi, Hidetaka Takato, and Yasuo Cho
- Organizer
  2018 MRS Fall Meeting & Exhibit
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Quantitative imaging of carrier distribution in silicon solar cell using scanning nonlinear dielectric microscopy2018
- Author(s)
  Kotaro Hirose, Katsuto Tanahashi, Hidetaka Takato, and Yasuo Cho
- Organizer
  ISTFA 2018
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Nondestructive Measurements of Double-Layered Piezoelectric Polarity-Inverted Structure Using Scanning Nonlinear Dielectric Microscopy2018
- Author(s)
  Hiroyuki Odagawa, Yohei Tanaka, Yasuo Cho
- Organizer
  Third International Symposium on Dielectric Materials and Applications
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Quantitative Imaging of MOS Interface Trap Distribution by Using Local Deep Level Transient Spectroscopy2018
- Author(s)
  Norimichi Chinone and Yasuo Cho
- Organizer
  IPFA 2018
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Visualization of Traps at SiO2/SiC Interfaces near the Conduction Band by Local Deep Level Transient Spectroscopy at Low Temperatures2017
- Author(s)
  T. Abe, Y. Yamagishi and Y. Cho
- Organizer
  ICSPM25
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Quantitative Analysis of Active Dopant Distribution and Estimation of Effective Diffusivity in Phosphorus-Implanted Emitter of Si Solar Cell Using Scanning Nonlinear Dielectric Microscopy2017
- Author(s)
  Kotaro Hirose, Katsuto Tanahashi, Hidetaka Takato, and Yasuo Cho
- Organizer
  IEEE PVSC-44
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Local deep level transient spectroscopy for two-dimensional MOS interface characterization based on scanning nonlinear dielectric microscopy2017
- Author(s)
  N. Chinone, and Y. Cho
- Organizer
  16th International Conference on the Formation of Semiconductor Interfaces(icsfi2017)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Quantitative Measurement of Active Dopant Density Distribution and Evaluation of Effective Diffusivities in Phosphorus-Implanted Monocrystalline Silicon Solar Cell Using Scanning Nonlinear Dielectric Microscopy2017
- Author(s)
  Kotaro Hirose, Katsuto Tanahashi, Hidetaka Takato, and Yasuo Cho
- Organizer
  2017 MRS Fall Meeting & Exhibit
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] DC bias dependence of local deep level transient spectroscopy signal and quantitative two-dimensional imaging of SiO2/SiC interface trap density2017
- Author(s)
  N. Chinone, R. Kosugi, Y. Tanaka, S. Harada, H. Okumura,and Y. Cho
- Organizer
  ICSCRM 2017
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Ferroelectric Probe Data Storage Using HfO2-Based Thin-Film Recording Media2017
- Author(s)
  Y. Hiranaga, T. Mimura, T. Shimizu, H. Funakubo and Y. Cho
- Organizer
  2017 Joint IEEE ISAF-IWATMD-PFM
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Quantitative imaging of MOS interface trap using local deep level transient spectroscopy based on scanning nonlinear dielectric microscopy2017
- Author(s)
  N. Chinone,and Y. Cho
- Organizer
  48th IEEE Semiconductor Interface Specialists Conference
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Improvement of Local Deep Level Transient Spectroscopy for Microscopic Evaluation of SiO2/4H-SiC Interfaces2017
- Author(s)
  Yuji Yamagishi and Yasuo Cho
- Organizer
  ICSCRM 2017
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Two‐dimensional imaging of MOS interface trap using local deep level transient spectroscopy based on scanning nonlinear dielectric microscopy2017
- Author(s)
  N. Chinone,and Y. Cho
- Organizer
  DRIP XVII
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Local Deep Level Transient Spectroscopy Imaging on Trap Distribution in SiC MOS Interface Based on Scanning Nonlinear Dielectric Microscopy2017
- Author(s)
  N. Chinone, and Y. Cho
- Organizer
  The 19th International Scanning Probe Microscopy Conference
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] EVALUATION OF EFFECTIVE DIFFUSIVITIES AND THREE-DIMENSIONAL SIMULATION OF CARRIER DISTRIBUTION IN PHOSPHORUS-IMPLANTED EMITTER OF SI SOLAR CELL USING SCANNING NONLINEAR DIELECTRIC MICROSCOPY2017
- Author(s)
  Kotaro Hirose, Katsuto Tanahashi, Hidetaka Takato, and Yasuo Cho
- Organizer
  PVSEC-27
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Atomic resolution imaging and carrier type determination of Molybdenum disulfide by noncontact scanning nonlinear dielectric microscopy2017
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  ECOSS 33
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Imaging of MOS Interface Trap Distribution using Local Deep Level Transient Spectroscopy Based on Scanning Nonlinear Dielectric Microscopy2017
- Author(s)
  N. Chinone,and Y. Cho
- Organizer
  AVS 64th International Symposium & Exhibition
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Quantitative thickness measurement in polarity-inverted piezoelectric layered thin film using scanning nonlinear dielectric microscopy2017
- Author(s)
  H. Odagawa, K. Terada, H. Nishikawa, Y. Tanaka, T. Yanagitani and Y. Cho
- Organizer
  2017 Joint IEEE ISAF - IWATMD - PFM (26th International Symposium on Applications of Ferroelectrics (ISAF))
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K04725
[Presentation] Quantitative Imaging of SiO2/SiC Interface Trap Density Using Local Deep Level Transient Spectroscopy2017
- Author(s)
  Norimichi Chinone, Ryoji Kosugi, Yasunori Tanaka, Shinsuke Harada, Hajime Okumura, Yasuo Cho
- Organizer
  2017 MRS Fall Meeting & Exhibit
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Local Carrier Distribution Imaging of Two-Dimensional Semiconductors by Scanning Nonlinear Dielectric Microscopy2017
- Author(s)
  K. Yamasue and Y. Cho
- Organizer
  ICSPM25
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Dynamic Observation of Nanoscale Domain Switching Behaviors in Ferroelectric HfO2 films Using Scanning Nonlinear Dielectric Microscopy2017
- Author(s)
  Y. Hiranaga, T. Mimura, T. Shimizu, H. Funakubo and Y. Cho
- Organizer
  2017 Joint IEEE ISAF-IWATMD-PFM
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] “Atomic Resolution Imaging of MoS2 by Scanning Nonlinear Dielectric Microscopy2017
- Author(s)
  K.Yamasue and Y. Cho
- Organizer
  The 19th International Scanning Probe Microscopy Conference
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Local evaluation of Al2O3 passivation layers crystalline silicon solar cells by super-higher-order scanning nonlinear dielectric microscopy2017
- Author(s)
  K. Kakikawa, Y. Yamagishi, H. Takato, K. Tanahashi and Y. Cho
- Organizer
  ICSPM25
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Local Carrier and Charge Distribution Imaging on Molybdenum Disulfide by Scanning Nonlinear Dielectric Microscopy2017
- Author(s)
  K. Yamasue and Y. Cho
- Organizer
  ISSS-8 2017
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Measurement Method of Multi-layer Piezoelectric Polarity-inverted Structure Using Scanning Nonlinear Dielectric Microscopy2017
- Author(s)
  H. Odagawa, Y. Tanaka, T. Yanagitani, and Y. Cho
- Organizer
  2017 Joint IEEE ISAF-IWATMD-PFM
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Local Deep Level Transient Spectroscopy Imaging Based on Scanning Nonlinear Dielectric Microscopy2017
- Author(s)
  Norimichi Chinone, and Yasuo Cho
- Organizer
  The 2nd International Symposium on “Recent Trends in Analysis Techniques for Functional Materials and Devices”
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] DC bias dependence of local deep level transient spectroscopy spectrum and quantitative two-dimensional imaging of SiO2/SiC interface trap density2017
- Author(s)
  N. Chinone, R. Kosugi, S. Harada, Y. Tanaka, H. Okumura,and Y. Cho
- Organizer
  ESREF 2017
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Local deep level transient spectroscopy for two-dimensional trap distribution in MOS interface using super-higher-order scanning nonlinear dielectric microscopy2017
- Author(s)
  Yasuo Cho
- Organizer
  The 20th Microscopy of Semi Conducting Materials
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Proposal of Local Deep Level Transient Spectroscopy Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy and 2-Dimensional Imaging of Trap Distribution in SiO2 /SiC Interface2016
- Author(s)
  N. Chinone, R.Kosugi ,Y. Tanaka, S. Harada, H. Okumura, and Y. Cho
- Organizer
  IPFA 2016
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Nanoscaled Permittivity Distribution Imaging Using an SNDM Probe2016
- Author(s)
  Y. Hiranaga, N. Chinone, K. Hirose, and Y. Cho
- Organizer
  2016 Joint ISAF/ECAPD/PFM Conference
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Quantitative Analysis of Two-dimensional Carrier Concentration in Phosphorus-implanted Emitter Solar Cell using Scanning Nonlinear Dielectric Microscopy2016
- Author(s)
  Kotaro Hirose, Katsuto Tanahashi, Hidetaka Takato, and Yasuo Cho
- Organizer
  PVSEC26
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Two-dimensional imaging of trap distribution in SiO2 /SiC interface using local deep level transient spectroscopy based on super-higher-order scanning nonlinear dielectric microscopy2016
- Author(s)
  N. Chinone, R.Kosugi ,Y. Tanaka, S. Harada, H. Okumura, and Y. Cho
- Organizer
  ecscrm2016
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Quantitative Thickness Measurement in Layered Polarity-Inverted Piezoelectric Thin Films Using Scanning Nonlinear Dielectric Microscopy2016
- Author(s)
  Koshiro Terada, Hiroaki Nishikawa, Yohei Tanaka1, Hiroyuki Odagawa1, Takahiko Yanagitani, and Yasuo Cho
- Organizer
  The 3rd International Conference of Global Network for Innovative Technology
- Place of Presentation
  Penang, Malaysia
- Year and Date
  2016-01-27
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K04725
[Presentation] Polarization Charge Density Measurement by Noncontact Scanning Nonlinear Dielectric Potentiometry2016
- Author(s)
  K. Yamasue, and Y. Cho
- Organizer
  ICSPM24
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Two-Dimensional Characterization of Phosphorus-Implanted Emitter and Phosphorus-Diffused Emitter of Silicon Solar Cell Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy2016
- Author(s)
  K. Hirose, N. Chinone & Y. Cho
- Organizer
  EU PVSEC 2016
- Place of Presentation
  Munich, Germany
- Year and Date
  2016-06-20
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Two-dimensional Analysis of Carrier Distribution in Phosphorus-Implanted Emitter and Phosphorus-Diffused Emitter using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy2016
- Author(s)
  Kotaro Hirose, Katsuto Tanahashi, Hidetaka Takato, Norimichi Chinone, Yasuo Cho
- Organizer
  43rd IEEE Photovoltaic Specialists Conference
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Ferroelectric Nanodomain Observation in Yttrium-Doped HfO2 Thin Films Using Scanning Nonlinear Dielectric Microscopy2016
- Author(s)
  Z. Chen, Y. Hiranaga, T. Shimizu, K. Katayama, T. Mimura, H. Funakubo, and Y. Cho
- Organizer
  2016 Joint ISAF/ECAPD/PFM Conference
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Surface polarization measurement on a reconstructed Si(111) surface by noncontact scanning nonlinear dielectric potentiometry2016
- Author(s)
  K. Yamasue, and Y. Cho
- Organizer
  NC-AFM 2016
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Surface polarization on a Si(111) reconstructed surface measured by noncontact scanning nonlinear dielectric potentiometry2016
- Author(s)
  K. Yamasue, and Y. Cho
- Organizer
  ecoss32
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] urface polarization on a Si(111) reconstructed surface measured by noncontact scanning nonlinear dielectric potentiometry2016
- Author(s)
  K. Yamasue, and Y. Cho
- Organizer
  ecoss32
- Place of Presentation
  Grenoble, France
- Year and Date
  2016-08-28
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Local deep level transient spectroscopy using super-higher-order scanning nonlinear dielectric microscopy2016
- Author(s)
  Norimichi Chinone, Ryoji Kosugi, Yasunori Tanaka, Shinske Harada, Hajime Okumura, and Yasuo Cho
- Organizer
  ESREF2016
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Universal parameter evaluating SiO2 /SiC interface quality based on scanning nonlinear dielectric microscopy2016
- Author(s)
  N. Chinone, A. Nayak, R.Kosugi ,Y. Tanaka, S. Harada, Y. Kiuchi, H. Okumura, and Y. Cho
- Organizer
  ecscrm2016
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Quantitative thickness measurement in polarity-inverted piezoelectric layered thin film using scanning nonlinear dielectric microscopy2016
- Author(s)
  H. Odagawa, K. Terada, H. Nishikawa, Y. Tanaka, T. Yanagitani, and Y. Cho
- Organizer
  2016 Joint ISAF/ECAPD/PFM Conference
- Place of Presentation
  Darmstadt, Germany
- Year and Date
  2016-08-21
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Quantitative thickness measurement in polarityinverted piezoelectric layered thin film using scanning nonlinear dielectric microscopy2016
- Author(s)
  Hiroyuki Odagawa, Koshiro Terada, Hiroaki Nishikawa, Yohei Tanaka, Takahiko Yanagitani and Yasuo Cho
- Organizer
  2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Applications of Polar Dielectrics & Workshop on Piezoresponse Force Microscopy (ISAF/ECAPD/PFM)
- Place of Presentation
  Darmstadt, Germany
- Year and Date
  2016-08-21
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K04725
[Presentation] Surface polarization measurement on a reconstructed Si(111) surface by noncontact scanning nonlinear dielectric potentiometry2016
- Author(s)
  K. Yamasue, and Y. Cho
- Organizer
  NC-AFM 2016
- Place of Presentation
  Nottingham,UK
- Year and Date
  2016-07-25
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Two-dimensional local deep level transient spectroscopy imaging using super-higher-order scanning nonlinear dielectric microscopy2016
- Author(s)
  N. Chinone, R.Kosugi ,Y. Tanaka, S. Harada, H. Okumura, and Y. Cho
- Organizer
  ISTFA2016
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] TWO-DIMENSIONAL CHARACTERIZATION OF PHOSPHORUS-IMPLANTED EMITTER AND PHOSPHORUS-DIFFUSED EMITTER OF SILICON SOLAR CELL USING SUPER-HIGHER-ORDER SCANNING NONLINEAR DIELECTRIC MICROSCOPY2016
- Author(s)
  Kotaro Hirose,Katsuto Tanahashi, Hidetaka Takato, Norimichi Chinone and Yasuo Cho
- Organizer
  32nd European Photovoltaic Solar Energy Conference and Exhibition
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Two-dimensional Analysis of Carrier Distribution in Phosphorus-Implanted Emitter and Phosphorus-Diffused Emitter using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy2016
- Author(s)
  Kotaro Hirose, Katsuto Tanahashi, Hidetaka Takato, Norimichi Chinone, Yasuo Cho
- Organizer
  43rd IEEE Photovoltaic Specialists Conference
- Place of Presentation
  PORTLAND , U.S.A
- Year and Date
  2016-06-05
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Universal Parameter Characterizing SiO2/SiC Interface Quality Based on Scanning Nonlinear Dielectric Microscopy2016
- Author(s)
  Norimichi Chinone, Alpana Nayak, Ryoji Kosugi, Yasuonori Tanaka, Shinsuke Harada, Yuji Kiuchi, Hajime Okumura, Yasuo Cho
- Organizer
  016 MRS fall meeting
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Local deep level Transient Spectroscopy Imaging for Characterization of Two-Dimensional Trap Distribution in SiO2/SiC Interface Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy2016
- Author(s)
  Norimichi Chinone, Ryoji Kosugi, Yasuonori Tanaka, Shinsuke Harada, Hajime Okumura, Yasuo Cho
- Organizer
  2016 MRS fall meeting
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] An Universal Parameter Showing SiO2/SiC Interface Quality of Both Silicon and Carbon-face based on Scanning Nonlinear Dielectric Microscopy2016
- Author(s)
  Norimichi Chinone, Alpana Nayak, Ryoji Kosugi ,Yasunori Tanaka, Shinsuke Harada, Yuji Kiuchi, Hajime Okumura, Yasuo Cho
- Organizer
  ISCSI-VII/ ISTDM 2016
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Quantitative thickness measurement in polarity-inverted piezoelectric layered thin film using scanning nonlinear dielectric microscopy2016
- Author(s)
  H. Odagawa, K. Terada, H. Nishikawa, Y. Tanaka, T. Yanagitani, and Y. Cho
- Organizer
  2016 Joint ISAF/ECAPD/PFM Conference
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Ferroelectric Nanodomain Observation in Yttrium-Doped HfO2 Thin Films Using Scanning Nonlinear Dielectric Microscopy2016
- Author(s)
  Z. Chen, Y. Hiranaga, T. Shimizu, K. Katayama, T. Mimura, H. Funakubo, and Y. Cho
- Organizer
  2016 Joint ISAF/ECAPD/PFM Conference
- Place of Presentation
  Darmstadt, Germany
- Year and Date
  2016-08-21
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Two-Dimensional Characterization of Phosphorus-Implanted Emitter and Phosphorus-Diffused Emitter of Silicon Solar Cell Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy2016
- Author(s)
  K. Hirose, N. Chinone & Y. Cho
- Organizer
  EU PVSEC 2016
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Two-Dimensional Characterization of Active Dopant Distribution in a p-i-n Structured Amorphous Silicon Solar Cell Using Scanning Nonlinear Dielectric Microscopy2016
- Author(s)
  K. Hirose, N. Chinone & Y. Cho
- Organizer
  EU PVSEC 2016
- Place of Presentation
  Munich, Germany
- Year and Date
  2016-06-20
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] SCANNING NONLINEAR DIELECTRIC POTENTIOMETRY：NEW STRATEGY FOR MESURING DIPOLE-INDUCED POTENTIALS IN ATOIMIC SCALE2015
- Author(s)
  Y. Cho, K. Yamasue
- Organizer
  ISPM Conference 2015
- Place of Presentation
  RIO DE JANEIRO, Brazil
- Year and Date
  2015-06-21
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Simultaneous Imaging of Atomically Resolved Topography and Potential of Graphene on C-Terminated Face of SiC Using Scanning Nonlinear Dielectric Potentiometry2015
- Author(s)
  Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu, Yasuo Cho
- Organizer
  2015 MRS fall meeting
- Place of Presentation
  Boston, USA
- Year and Date
  2015-11-29
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Method for Measuring Polarity-Inverted Layered Structure in Dielectric Thin Films Using Scanning Nonlinear Dielectric Microscocpy2015
- Author(s)
  Hiroyuki Odagawa, Koshiro Terada, Hiroaki Nishikawa, TakahikoYanagitani abd Yasuo Cho
- Organizer
  13th European Meeting on Ferroelectricity (EMF2015)
- Place of Presentation
  Porto, Portugal
- Year and Date
  2015-06-28
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K04725
[Presentation] Visualization of Carrier Distribution in Operated SiC Power-MOSFET Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy2015
- Author(s)
  Norimichi Chinone, Yasuo Cho
- Organizer
  2015 MRS fall meeting
- Place of Presentation
  Boston, USA
- Year and Date
  2015-11-29
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Gate-bias dependent carrier distribution visualization in SiC power-MOSFET using super-higher-order SNDM2015
- Author(s)
  Norimichi Chinone, Yasuo Cho
- Organizer
  EMN CANCUN MEETING 2015
- Place of Presentation
  Cancun,Mexico
- Year and Date
  2015-06-08
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Investigation of Oxygen Adsorbed Si(100)-(2x1) Surface Using Noncontact Scanning Nonlinear Dielectric Microscopy2015
- Author(s)
  Masataka Suzuki, Kohei Yamasue, Yasuo Cho
- Organizer
  2015 MRS fall meeting
- Place of Presentation
  Boston, USA
- Year and Date
  2015-11-29
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Non-contact scanning nonlinear dielectric microscopy study of oxygen-adsorption on a Si(100)-(2×1) surface2015
- Author(s)
  Kohei Yamasue, Masataka Suzuki, Yasuo Cho
- Organizer
  ECOSS-31
- Place of Presentation
  Barcelona, Spain
- Year and Date
  2015-08-31
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Nondestructive and local evaluation of SiO2/SiC interface using superhigher-order scanning nonlinear dielectric microscopy2015
- Author(s)
  Norimichi Chinone, Ryoji Kosugi, Yasunori Tanaka, Shinsuke Harada, Hajime Okumura, Yasuo Cho
- Organizer
  ICSCRM 2015
- Place of Presentation
  Giardini Naxos, Italy
- Year and Date
  2015-10-04
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Oxygen adsorption on a Si(100)-(2×1) surface studied by noncontact scanning nonlinear dielectric microscopy2015
- Author(s)
  M. Suzuki, K. Yamasue, and Y. Cho
- Organizer
  nc AFM 2015
- Place of Presentation
  Cassis, France
- Year and Date
  2015-09-07
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] 走査型非線形誘電率顕微法による層状極性反転圧電膜の層厚の定量測定2015
- Author(s)
  寺田浩士朗, 西川宏明, 田中陽平, 小田川裕之, 柳谷隆彦, 長康雄
- Organizer
  超音波エレクトロニクスの基礎と応用に関するシンポジウム(USE2015)
- Place of Presentation
  つくば
- Year and Date
  2015-11-05
- Data Source
  KAKENHI-PROJECT-15K04725
[Presentation] Dopant Profiling Analysis of P-I-N Structure in Thin-Film Amorphous Silicon Solar Cell Using Scanning Nonlinear Dielectric Microscopy2015
- Author(s)
  Kotaro Hirose, Norimichi Chinone, Yasuo Cho
- Organizer
  2015 MRS fall meeting
- Place of Presentation
  Boston, USA
- Year and Date
  2015-11-29
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] wo dimensional electron gas and polarization measurement in AlGaN/GaN heterostructure using scanning nonlinear dielectric microscopy2015
- Author(s)
  K. Hirose, Y. Goto, N. Chinone, and Y. Cho
- Organizer
  ICSPM23
- Place of Presentation
  ヒルトンニセコビレッジホテル，北海道虻田郡ニセコ町, Japan
- Year and Date
  2015-12-10
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Hard-Disk-Drive-Type Ferroelectric Data Recording with Memory Density over 1 Tbit/inch2 Based on Scanning Nonlinear Dielectric Microscopy2015
- Author(s)
  Tomonori Aoki, Yoshiomi Hiranaga, Yasuo Cho
- Organizer
  2015 MRS fall meeting
- Place of Presentation
  Boston, USA
- Year and Date
  2015-11-29
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Observation of graphene on C-terminated face of SiC using noncontact scanning nonlinear dielectric potentiometry2015
- Author(s)
  K. Yamasue, H. Fukidome, K. Funakubo, M. Suemitsu, and Y. Cho
- Organizer
  nc AFM 2015
- Place of Presentation
  Cassis, France
- Year and Date
  2015-09-07
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Polarization and Two Dimensional Electron Gas Visualization in AlGaN/GaN Heterostructure2015
- Author(s)
  Kotaro Hirose, Norimichi Chinone, Yasunori Goto, Yasuo Cho
- Organizer
  2015 MRS fall meeting
- Place of Presentation
  Boston, USA
- Year and Date
  2015-11-29
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Negligible Covalent Bonding in Proper Ferroelectric Ferromagnet: Strained La2NiMnO6 Thin Film2015
- Author(s)
  Ryota Takahashi, Isao Ohkubo, Kunihiko Yamauchi, Miho Kitamura, Yasunari Sakurai, Masaharu Oshima, Tamio Oguchi, Yasuo Cho, Mikk Lippmaa
- Organizer
  2015 MRS fall meeting
- Place of Presentation
  Boston, USA
- Year and Date
  2015-11-29
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Carrier redistribution analysis of gate-biased SiC power-MOSFET using super-higher-order scanning nonlinear dielectric microscopy2015
- Author(s)
  Norimichi Chinone and Yasuo Cho
- Organizer
  ISTFA 2015
- Place of Presentation
  Portland, USA
- Year and Date
  2015-11-01
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Graphene　on C-terminated Face of 4H-SiC Observed by Noncontact Scanning Nonlinear Dielectric Potentiometry2015
- Author(s)
  K. Yamasue, H. Fukidome, K. Tashima, M. Suemitsu, Y. Cho
- Organizer
  ICSPM23
- Place of Presentation
  ヒルトンニセコビレッジホテル，北海道虻田郡ニセコ町, Japan
- Year and Date
  2015-12-10
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Observation of polarization and two dimensional electron gas in AlGaN/GaN heterostructure using scanning nonlinear dielectric microscopy2015
- Author(s)
  Kotaro Hirose, Norimichi Chinone and Yasuo Cho
- Organizer
  ISTFA 2015
- Place of Presentation
  Portland, USA
- Year and Date
  2015-11-01
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Data Bit Recording with a Density Exceeding 1 Tbit/inch2 Using an HDD-Type Ferroelectric Probe Data Storage Unit2015
- Author(s)
  T. Aoki, Y. Hiranaga, and Y. Cho
- Organizer
  2015 JOINT ISAF-ISIF-PFM CONFERENCE
- Place of Presentation
  SINGAPORE
- Year and Date
  2015-05-24
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Visualization of gate-bias dependent carrier distribution in SiC power-MOSFET using super-higher-order scanning nonlinear dielectric microscopy2015
- Author(s)
  Norimichi Chinone and Yasuo Cho
- Organizer
  ESREF 2015
- Place of Presentation
  Toulouse, France
- Year and Date
  2015-10-05
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Charge Gradient Microscopy:Electromechanical Charge Scraping at the Nanoscale2015
- Author(s)
  S. Hong, S. Tong, Y. Choi, W. Park, Y. Hiranaga, Y. Cho, A. Roelofs
- Organizer
  EMA2015
- Place of Presentation
  Orlando, Florida
- Year and Date
  2015-01-21
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Charge Gradient Microscopy : Electromechanical Charge Scraping and Refill of Screening Charges2015
- Author(s)
  Seungbum Hong, Sheng Tong, Yoon-Young Choi, Woon Ik Park, Liliana Stan, Yoshiomi Hiranaga, Yasuo Cho,Andreas Roelofs
- Organizer
  MMC 2015
- Place of Presentation
  Manchester, UK
- Year and Date
  2015-06-29
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] HYDROGEN-INTERCALATED GRAPHENE ON SiC STUDIED BY NONCONTACT SCANNING NONLINEAR DIELECTRIC POTENTIOMETRY2015
- Author(s)
  Y. Cho, K. Yamasue, H. Fukidome,K. Funakubo, M. Suemitsu
- Organizer
  ISPM Conference 2015
- Place of Presentation
  RIO DE JANEIRO, Brazil
- Year and Date
  2015-06-21
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Method for Measuring Polarity-Inverted Layered Structure in Dielectric Thin Films Using Scanning Nonlinear Dielectric Microscopy2015
- Author(s)
  H.Odagawa, K.Terada, H.Nishikawa, T.Yanagitani, and Y. Cho
- Organizer
  13th EUROPEAN MEETING ON FERROELECTRICITY
- Place of Presentation
  PORTO, PORTUGAL
- Year and Date
  2015-06-28
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Local and Nondestructive Evaluation of SiO2/SiC Interface Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy2015
- Author(s)
  Norimichi Chinone, Ryoji Kosugi, Yasuonori Tanaka, Shinsuke Harada, Hajime Okumura, Yasuo Cho
- Organizer
  2015 MRS fall meeting
- Place of Presentation
  Boston, USA
- Year and Date
  2015-11-29
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Graphene on C-terminated face of 4H-SiC studied by noncontact scanning nonlinear dielectric potentiometry2015
- Author(s)
  Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu, Yasuo Cho
- Organizer
  ECOSS-31
- Place of Presentation
  Barcelona, Spain
- Year and Date
  2015-08-31
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Effect of Ion Beam Irradiation on Recording Media of Ferroelectric Probe Data Storage2015
- Author(s)
  Y. Hiranaga, Y. T. Chen, and Y. Cho
- Organizer
  2015 JOINT ISAF-ISIF-PFM CONFERENCE
- Place of Presentation
  SINGAPORE
- Year and Date
  2015-05-24
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Read/Write Demonstration of Ferroelectric Probe Data Storage with a Density Exceeding 1 Tbit/inch22015
- Author(s)
  T. Aoki, Y. Hiranaga, and Y. Cho
- Organizer
  13th EUROPEAN MEETING ON FERROELECTRICITY
- Place of Presentation
  PORTO, PORTUGAL
- Year and Date
  2015-06-28
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Surface Analytical Study on Ferroelectric Recording Media Using XPS and SNDM2015
- Author(s)
  Y. Hiranaga, Y. T. Chen, and Y. Cho
- Organizer
  13th EUROPEAN MEETING ON FERROELECTRICITY
- Place of Presentation
  PORTO, PORTUGAL
- Year and Date
  2015-06-28
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Visualization of polarization and two dimensional electron gas distribution in AlGaN/GaN heterostructure using scanning nonlinear dielectric microscopy2015
- Author(s)
  Kotaro Hirose, Norimichi Chinone, Yasuo Cho
- Organizer
  ICSCRM 2015
- Place of Presentation
  Giardini Naxos, Italy
- Year and Date
  2015-10-04
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Measurement of Nonlinear Dielectric Constants of PZT Thin Films used in Ferroelectric Probe Data Storage Technology2014
- Author(s)
  Y. Hiranaga and Y. Cho
- Organizer
  2014 Joint IEEE ISAF-IWATMD-PFM
- Place of Presentation
  PennState(State college), USA
- Year and Date
  2014-05-12
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] High resolution imaging of dopant and depletion layer distribution in SiC power MOSFET using super-higher-order nonlinear dielectric microscopy2014
- Author(s)
  Norimichi Chinone, Takashi Nakamura, Yasuo Cho
- Organizer
  ESREF2014
- Place of Presentation
  Berlin, Germany
- Year and Date
  2014-09-29
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Conduction in nanodomain inversion dots in congruent lithium tantalate single crystal2014
- Author(s)
  Y. Cho
- Organizer
  ECAPD 2014
- Place of Presentation
  Vilnius, Lithuania
- Year and Date
  2014-07-07
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Pyroelectric Detection of Spontaneous Polarization in Multiferroic La2NiMnO6 Thin Films2014
- Author(s)
  Ryota Takahashi, Isao Ohkubo, Miho Kitamura, Masaharu Oshima, Yasuo Cho, Mikk Lippmaa
- Organizer
  2014 MRS Spring Meeting
- Place of Presentation
  San Francisco, USA
- Year and Date
  2014-04-21
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Simultaneous Observation of Topography and Electric Dipole Moments on Si(100)-2×1 Surface Using Non-Contact Scanning Nonlinear Dielectric Microscopy2014
- Author(s)
  Masataka Suzuki, Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho
- Organizer
  2014 MRS fall meeting
- Place of Presentation
  Boston, USA
- Year and Date
  2014-11-30
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Investigation of Hydrogen-Intercalated Graphene on 4H-SiC(0001) by Noncontact Scanning Nonlinear Dielectric Microscopy2014
- Author(s)
  Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu, Yasuo Cho
- Organizer
  ECOSS30
- Place of Presentation
  Antalya, TURKEY
- Year and Date
  2014-08-31
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] A Novel Method for Simultaneous Measurement of Topography and Dipole-Induced Local Surface Potential Based on Noncontact Scanning Nonlinear Dielectric Microscopy2014
- Author(s)
  K. Yamasue, Yasuo Cho
- Organizer
  ICN+T 2014
- Place of Presentation
  Vail, Colorado, USA
- Year and Date
  2014-07-20
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] A New Atomically Resolved Potentiometry for Dipole-Induced Local Surface Potential Based on Noncontact Scanning Nonlinear Dielectric Microscopy2014
- Author(s)
  Kohei Yamasue, Yasuo Cho
- Organizer
  ECOSS30
- Place of Presentation
  Antalya, TURKEY
- Year and Date
  2014-08-31
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Charge gradient microscopy: high-speed visualization of polarization charges using a nanoscale probe2014
- Author(s)
  eungbum Hong, Sheng Tong, Woon Ik Park, Yoshiomi Hiranaga, Yasuo Cho, and Andreas Roelofs
- Organizer
  Nanoscale Spectroscopy and Nanotechnology 8
- Place of Presentation
  Chicago, USA
- Year and Date
  2014-07-28
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] High-Resolution Imaging of Hydrogen-Intercalated Graphene on 4H-SiC(0001) Using Non-Contact Scanning Nonlinear Dielectric Microscopy2014
- Author(s)
  Kohei Yamasue, H. Fukidome, K. Funakubo, M. Suemitsu, Y. Cho
- Organizer
  ICN+T 2014
- Place of Presentation
  Vail, Colorado, USA
- Year and Date
  2014-07-20
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Measurement of Polarization Structure in Layered Piezoelectric Thin Films Using Scanning Nonlinear Dielectric Microscopy2014
- Author(s)
  H. Odagawa, T. Yanagitani, Y. Cho
- Organizer
  ECAPD 2014
- Place of Presentation
  Vilnius, Lithuania
- Year and Date
  2014-07-07
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Dipole-Induced Potential Measurement Using Noncontact Scanning Nonlinear Dielectric Microscopy2014
- Author(s)
  Kohei Yamasue, Yasuo Cho
- Organizer
  2014 MRS fall meeting
- Place of Presentation
  Boston, USA
- Year and Date
  2014-11-30
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Study of Electric Dipole Moment Distribution on Si(100)-2×1 Surface by Non-Contact Scanning Nonlinear Dielectric Microscopy2014
- Author(s)
  Masataka Suzuki, K. Yamasue, M. Abe, Y. Sugimoto, Y. Cho
- Organizer
  ICN+T 2014
- Place of Presentation
  Vail, Colorado, USA
- Year and Date
  2014-07-20
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Charge Gradient Microscopy: A Method to Image Ferroelectric and Piezoelectric Domains2014
- Author(s)
  Andreas Roelofs, Sheng Tong, Woon Ik Park, Yoshiomi Hiranaga, Yasuo Cho, Seungbum Hong
- Organizer
  2014 MRS Spring Meeting
- Place of Presentation
  San Francisco, USA
- Year and Date
  2014-04-21
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Comparative Study on Pristine and Hydrogen-Intercalated Graphene on 4H-SiC(0001) Surface Using Noncontact Scanning Nonlinear Dielectric Microscopy2014
- Author(s)
  Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu, Yasuo Cho
- Organizer
  2014 MRS fall meeting
- Place of Presentation
  Boston, USA
- Year and Date
  2014-11-30
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Investigation of electric dipole moments on Si(100)-2×1 surface using non-contact scanning nonlinear dielectric microscopy2014
- Author(s)
  Masataka Suzuki, Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho
- Organizer
  ECOSS30
- Place of Presentation
  Antalya, TURKEY
- Year and Date
  2014-08-31
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Evaluation of Power SiC -MOSFET Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy : Imaging of Carrier Distribution and Depletion Layer2014
- Author(s)
  N. Chinone, T. Nakamura, Y. Cho
- Organizer
  ISTFA 2014
- Place of Presentation
  Houston, Texas
- Year and Date
  2014-11-09
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Atomic dipole moment induced variation of local surface potential on Si(111)-(7×7) surface studied by noncontact scanning nonlinear dielectric microscopy2013
- Author(s)
  Kohei Yamasue , Yasuo Cho
- Organizer
  19th International Vacuum Congress
- Place of Presentation
  Paris, France
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Bias voltage dependence of atomic dipole moment and topography on hydrogen-adsorbed Si(111)-(7×7) surface studied by noncontact scanning nonlinear dielectric microscopy2013
- Author(s)
  Kohei Yamasue, Daisuke Mizuno, Yasuo Cho
- Organizer
  NC-AFM 2013
- Place of Presentation
  University of Maryland College Park, Maryland, USA
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Current Conduction around Nanodomain Inversion Dot in Lithium Tantalate Single Crystal Studied by Using C-AFM and SNDM2013
- Author(s)
  Yasuo Cho
- Organizer
  2013 MRS fall meeting
- Place of Presentation
  Boston, USA
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Site specific measurement of surface potential shift on Si(111)-(7ｘ7) surface by noncontact scanning nonliear dielectric microscopy2013
- Author(s)
  Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho
- Organizer
  NC-AFM 2013
- Place of Presentation
  University of Maryland College Park, Maryland, USA
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Conduction in Nanodomains in Lithium Tantalate Single Crystal2013
- Author(s)
  Yasuo Cho
- Organizer
  ICSS 2013
- Place of Presentation
  Las Vegas Nevada, USA
- Invited
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Investigation of physical and electrical properties of hydrogen-adsorbed Si(111)-7×7 surface by using noncontact scanning nonlinear dielectric microscopy2013
- Author(s)
  Daisuke Mizuno, Kohei Yamasue, Yasuo Cho
- Organizer
  18th Microscopy of Semiconducting Materials Meeting
- Place of Presentation
  University of Oxford, UK
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Observation of atomic dipole moment on hydrogen and oxygen adsorbed Si(111)-7×7 surfaces by using noncontact scanning nonlinear dielectric microscopy2013
- Author(s)
  Y. Cho, D. Mizuno, K. Yamasue
- Organizer
  19th International Vacuum Congress
- Place of Presentation
  Paris, France
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Site Specific Measurement of Atomic Dipole Moment Induced Local Surface Potentials on Si(111)-(7×7) Surface by Noncontact Scanning Nonlinear Dielectric Microscopy2013
- Author(s)
  Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho
- Organizer
  2013 MRS fall meeting
- Place of Presentation
  Boston, USA
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Effectiveness of the scanning nonlinear dielectric microscopy on the failure analysis of semiconductor devices2013
- Author(s)
  Koichiro Honda, Yasuo Cho
- Organizer
  24th European Symposium on Reliability of Electron Devices
- Place of Presentation
  Arcachon, France
- Invited
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] CURRENT CONDUCTION AROUND NANODOMAIN INVERSION DOT IN LITHIUM TANTALATE SINGLE CRYSTAL2013
- Author(s)
  Yasuo Cho
- Organizer
  13th International Meeting on Ferroelectricity
- Place of Presentation
  Krakow, Poland
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Site-specific Measurement of Atomic Dipole Moment Induced Surface Potential on Si(111)-(7×7) by Noncontact Scanning Nonlinear Dielectric Microscopy2013
- Author(s)
  Kohei Yamasue , Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho
- Organizer
  ACSIN-12 & ICSPM21
- Place of Presentation
  Tsukuba, Japan
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] High Resolution Visualization of Carrier Distribution in SiC-MOSFET Using Super-Higher-Order Nonlinear Dielectric Microscopy2013
- Author(s)
  Norimichi Chinone, Takashi Nakamura, Yasuo Cho
- Organizer
  2013 MRS fall meeting
- Place of Presentation
  Boston, USA
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] High resolution imaging of cross section of metal-oxide-semiconductor field-effect-transistor using super-higher-order nonlinear dielectric microscopy2013
- Author(s)
  N.Chinone, K.Yamasue, K.Honda,Y.Cho
- Organizer
  18th Microscopy of Semiconducting Materials Meeting
- Place of Presentation
  University of Oxford, UK
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Nano -Domains and Their Related Phenomena in LiTaO3 Single Crystal Studied by Using Scanning Nonlinear Dielectric Microscopy2013
- Author(s)
  Yasuo Cho
- Organizer
  2013 Joint UFFC, EFTF and PFM Symposium
- Place of Presentation
  Prague, Czech Republic
- Invited
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Interfacial Capacitance between an Fe3 O4 Film and a Nb:TiO3 Substrate2013
- Author(s)
  Ryota Takahashi, Yasuo Cho, Mikk Lippmaa
- Organizer
  2013 MRS fall meeting
- Place of Presentation
  Boston, USA
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Atomic electric dipole moment visualization using scanning nonlinear dielectric microscopy2012
- Author(s)
  Y. CHO
- Organizer
  11th International Symposium on Ferroic Domains and Micro-to Nanoscopic Structures
- Place of Presentation
  Ekaterinburg, Russia
- Invited
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Atomic electric dipole moment visualization using scanning nonlinear dielectric microscopy2012
- Author(s)
  Y. CHO
- Organizer
  11th International Symposium on Ferroic Domains and Micro-to Nanoscopic Structures
- Place of Presentation
  Ekaterinburg, Russia
- Invited
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Observation of Threshold Voltage Distribution of Transistors in a Metal-SiO2-SiN-SiO2-semiconductor Flash Memory Using Scanning Nonlinear Dielectric Microscopy2012
- Author(s)
  Koichiro Honda, Yasuo Cho
- Organizer
  2012 MRS fall meeting
- Place of Presentation
  Boston, USA
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Scanning nonlinear dielectric microscopy nano science and technology2012
- Author(s)
  Yasuo Cho
- Organizer
  2012 EMN Fall Meeting
- Place of Presentation
  Las Vegas, USA
- Invited
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Super Higher Order Nonlinear Dielectric Microscopy with Super High Resolution2012
- Author(s)
  Norimichi Chinone, Kohei Yamasue, Yoshiomi Hiranaga Koichiro Honda, Yasuo Cho
- Organizer
  2012 MRS fall meeting
- Place of Presentation
  Boston, USA
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Atomic electric dipole moment visualization using scanning nonlinear dielectric microscopy2012
- Author(s)
  Y. CHO
- Organizer
  11th International Symposium on Ferroic Domains and Micro to Nanoscopic Structures
- Place of Presentation
  Ekaterinburg, Russia
- Invited
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Observation of dipole moments on hydrogen-adsorbed Si(111)-(7×7) surface by non-contact scanning nonlinear dielectric microscopy2012
- Author(s)
  Daisuke Mizuno, Kohei Yamasue, Yasuo Cho
- Organizer
  15th International Conference on non-contact Atomic Force Microscopy
- Place of Presentation
  Cesky Krumlov, Czech Republic
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Super-higher order nonlinear dielectric microscopy studies on ferroelectric materials and semiconductor devices2012
- Author(s)
  N.CHINONE, K. YAMASUE, Y. HIRANAGA, K.HONDA, Y. CHO
- Organizer
  International Conference on Nanoscience + Technology 2012
- Place of Presentation
  Paris, FRANCE
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Atomic dipole moments on hydrogen-adsorbed Si(111)-7×7 surface observed by using noncontact scanning nonlinear dielectric microscopy2012
- Author(s)
  Daisuke Mizuno, Kohei Yamasue, Yasuo Cho
- Organizer
  The 20th International Colloquium on Scanning Probe Microscopy
- Place of Presentation
  Naha, Japan
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Super-higher order nonlinear dielectric microscopy studies on ferroelectric materials and semiconductor devices2012
- Author(s)
  N.CHINONE, K. YAMASUE, Y. HIRANAGA, K.HONDA, Y. CHO
- Organizer
  International Conference on Nanoscience + Technology 2012
- Place of Presentation
  Paris, FRANCE
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Scanning nonlinear dielectric microscopy nano science and technology2012
- Author(s)
  Yasuo Cho
- Organizer
  2012 EMN Fall Meeting
- Place of Presentation
  Las Vegas, USA
- Invited
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Non-contact Scanning Nonlinear Dielectric Microscopy Studies of Atomic Dipole Moments on Hydrogen-adsorbed Si(111)-7×7 Surface2012
- Author(s)
  Daisuke Mizuno, Kohei Yamasue, Yasuo Cho
- Organizer
  2012 MRS fall meeting
- Place of Presentation
  Boston, USA
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Resolution improvement of scanning nonlinear dielectric microscopy by measuring the super higher-order nonlinear dielectric constants2012
- Author(s)
  N.Chinone, K. Yamasue, Y. Hiranaga, K.Honda, Y. Cho
- Organizer
  The 15th European Microscopy Congress
- Place of Presentation
  Manchester, UK
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Atomic dipole moments on hydrogen-adsorbed Si(111)-7×7 surface observed by using noncontact scanning nonlinear dielectric microscopy2012
- Author(s)
  Daisuke Mizuno, Kohei Yamasue, Yasuo Cho
- Organizer
  The 20th International Colloquium on Scanning Probe Microscopy
- Place of Presentation
  Naha, Japan
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Simultaneous imaging of current and local dipole moments of Si(111)-(7×7) surface by noncontact scanning nonlinear dielectric microscopy2012
- Author(s)
  Kohei Yamasue, Yasuo Cho
- Organizer
  15th International Conference on non-contact Atomic Force Microscopy
- Place of Presentation
  Cesky Krumlov, Czech Republic
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Resolution improvement of scanning nonlinear dielectric microscopy by measuring the super higher-order nonlinear dielectric constants2012
- Author(s)
  N.Chinone, K. Yamasue, Y. Hiranaga, K.Honda, Y. Cho
- Organizer
  The 15th European Microscopy Congress
- Place of Presentation
  Manchester, UK
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Simultaneous imaging of current and local dipole moments of Si(111)-(7×7) surface by noncontact scanning nonlinear dielectric microscopy2012
- Author(s)
  Kohei Yamasue, Yasuo Cho
- Organizer
  15th International Conference on non-contact Atomic Force Microscopy
- Place of Presentation
  Cesky Krumlov, Czech Republic
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Observing of charges stored in metal-oxide-nitride-oxide semiconductor flash memory by using higher order nonlinear dielectric microscopy2012
- Author(s)
  K. Honda, T. Iwai, Y. Cho
- Organizer
  The 15th European Microscopy Congress
- Place of Presentation
  Manchester, UK
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Super Higher Order Nonlinear Dielectric Microscopy with Super High Resolution2012
- Author(s)
  Norimichi Chinone, Kohei Yamasue, Yoshiomi Hiranaga Koichiro Honda, Yasuo Cho
- Organizer
  2012 MRS fall meeting
- Place of Presentation
  Boston, USA
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Non-contact Scanning Nonlinear Dielectric Microscopy Studies of Atomic Dipole Moments on Hydrogen-adsorbed Si(111)-7×7 Surface2012
- Author(s)
  Daisuke Mizuno, Kohei Yamasue, Yasuo Cho
- Organizer
  2012 MRS fall meeting
- Place of Presentation
  Boston, USA
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Observing of charges stored in metal-oxide-nitride-oxide semiconductor flash memory by using higher order nonlinear dielectric microscopy2012
- Author(s)
  K. Honda, T. Iwai, Y. Cho
- Organizer
  The 15th European Microscopy Congress
- Place of Presentation
  Manchester, UK
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Observation of dipole moments on hydrogen-adsorbed Si(111)-(7×7) surface by non-contact scanning nonlinear dielectric microscopy2012
- Author(s)
  Daisuke Mizuno, Kohei Yamasue, Yasuo Cho
- Organizer
  15th International Conference on non-contact Atomic Force Microscopy
- Place of Presentation
  Cesky Krumlov, Czech Republic)
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Scanning nonlinear dielectric microscopy nano science and technology2012
- Author(s)
  Yasuo Cho
- Organizer
  2012 EMN Fall Meeting
- Place of Presentation
  Las Vegas, USA
- Invited
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Observation of Threshold Voltage Distribution of Transistors in a Metal-SiO2-SiN-SiO2-semiconductor Flash Memory Using Scanning Nonlinear Dielectric Microscopy”2012
- Author(s)
  Koichiro Honda, Yasuo Cho
- Organizer
  2012 MRS fall meeting
- Place of Presentation
  Boston, USA
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Scanning nonlinear dielectric microscopy with high resolution and its application to next generation high density ferroelectric data storage2011
- Author(s)
  Yasuo Cho
- Organizer
  E-MRS ICAM IUMRS 2011 Spring Meeting
- Place of Presentation
  Nice, France
- Invited
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Ferroelectric Super-High Density Data Storage Based on Scanning Nonlinear Dielectric Microscopy2010
- Author(s)
  Yasuo Cho
- Organizer
  The 3^<rd> International Symposium on Innovations in Advanced Materials for Optics & Electronics
- Place of Presentation
  Toyama (Japan)
- Year and Date
  2010-10-18
- Data Source
  KAKENHI-PROJECT-18002005
[Presentation] Scanning Nonlinear Dielectric Microscopy2010
- Author(s)
  Y.Cho
- Organizer
  2010 MRS Fall Meeting
- Place of Presentation
  Boston (U.S.A.)
- Year and Date
  2010-12-01
- Data Source
  KAKENHI-PROJECT-18002005
[Presentation] Scanning Nonlinear Dielectric Microscopy2010
- Author(s)
  Y. Cho
- Organizer
  2010 MRS Fall Meeting
- Place of Presentation
  Boston
- Year and Date
  2010-12-01
- Data Source
  KAKENHI-PROJECT-18002005
[Presentation] Ferroelectric Super-High Density Data Storage Based on Scanning Nonlinear Dielectric Microscopy2010
- Author(s)
  Y. Cho, K. Tanaka, and Y. Hiranaga
- Organizer
  The 3^<rd> International Symposium on Innovations in Advanced Materials for Optics & Electronics
- Place of Presentation
  Toyama
- Year and Date
  2010-10-18
- Data Source
  KAKENHI-PROJECT-18002005
[Presentation] 非接触一走査型非線形誘電率顕微鏡によるSi(110)-16x2構造の観察2009
- Author(s)
  長侑平
- Organizer
  第56回応用物理学関係連合講演会
- Place of Presentation
  つくば
- Year and Date
  2009-03-31
- Data Source
  KAKENHI-PROJECT-18002005
[Presentation] Scanning nonlinear dielectric microscopy with super high resolution2008
- Author(s)
  Y. Cho, R. Hirose, S. Kobayashi and N. Kin
- Organizer
  第27回電子材料シンポジウム
- Place of Presentation
  伊豆市
- Year and Date
  2008-07-09
- Data Source
  KAKENHI-PROJECT-18002005
[Presentation] Next Generation Ferroelectric high Density Data Storage Based on Scanning Nonlinear Dielectric Microscopy2008
- Author(s)
  Yasuo Cho, Yoshiomi Hiranaga, Kenkou Tanaka, Yuichi Kurihashi, and Tomoya Uda
- Organizer
  The 2nd IEEE Nanotechnology Materials and Devices Conference, Abstract
- Place of Presentation
  Kyoto, Japan
- Data Source
  KAKENHI-PROJECT-18002005
[Presentation] Scanning Nonlinear Dielectric Microscopy Nanoscience and Technology for Next Generation High Density Ferroelectric Data Storage2008
- Author(s)
  Yasuo Cho
- Organizer
  2008 MRS Spring Meeting
- Place of Presentation
  San Francisco, USA
- Year and Date
  2008-03-24
- Data Source
  KAKENHI-PROJECT-18002005
[Presentation] Scanning Nonlinear Dielectric Microscopy Nano Science and Technology for Next Generation High Density Ferroelectric Data Storage2008
- Author(s)
  Yasuo Cho, Kenkou Tanaka, Yuichi Kurihashi, Tomoya Uda, Yasuhiro Daimon, Nozomi Odagawa, Ryusuke Hirose and Yoshiomi Hiranaga
- Organizer
  20th International Symposium on Integrated Ferroelectrics
- Place of Presentation
  Biopolis, Singapore
- Data Source
  KAKENHI-PROJECT-18002005
[Presentation] Scanning Nonlinear Dielectric Microscopy Nano Science and Technology for Nest Generation High Density Ferroelectric Data Storage2008
- Author(s)
  Y. Cho, K. Tanaka, Y. Kurihashi, T. Uda, Y. Daimon, N. Odagawa, R. Hirose and Y. Hiranaga
- Organizer
  20^<th> International Symposium on Integrated Ferroelectrics
- Place of Presentation
  Singapore
- Year and Date
  2008-06-10
- Data Source
  KAKENHI-PROJECT-18002005
[Presentation] Scanning nonlinear dielectric microscopy with super high resolution2008
- Author(s)
  Yasuo Cho
- Organizer
  27th Electric Materials Symposium
- Place of Presentation
  修善寺
- Year and Date
  2008-07-09
- Data Source
  KAKENHI-PROJECT-18002005
[Presentation] Next Generation Ferroelectric high Density Data Storage Based on Scanning Nonlinear Dielectric Microscopy2008
- Author(s)
  Yasuo Cho
- Organizer
  The 2nd IEEE Nanotechnology Materials and Devices Conference
- Place of Presentation
  Kyoto, Japan
- Year and Date
  2008-10-21
- Data Source
  KAKENHI-PROJECT-18002005
[Presentation] Scanning Nonlinear Dielectric Microscopy Nanoscience and Technology for Next Generation High Density Ferroelectric Data Storage2008
- Author(s)
  Y. Cho
- Organizer
  2008 MRS Spring Meeting
- Place of Presentation
  San Francisco
- Year and Date
  2008-03-24
- Data Source
  KAKENHI-PROJECT-18002005
[Presentation] Next Generation Ferroelectric high Density Data Storage Based on Scanning Nonlinear Dielectric Microscopy2008
- Author(s)
  Y. Cho, Y. Hiranaga, K. Tanaka, Y. Kurihashi, and T. Uda
- Organizer
  The 2nd IEEE Nanotechnology Materials and Devices Conference
- Place of Presentation
  Kyoto
- Year and Date
  2008-10-21
- Data Source
  KAKENHI-PROJECT-18002005
[Presentation] Scanning Nonlinear Dielectric Microscopy Nano Science and Technology for Next Generation High Density Ferroelectric DataStorae2008
- Author(s)
  Yasuo Cho
- Organizer
  20^<th> International Symposium on Integrated Fe rroelectrics
- Place of Presentation
  Singapore 「Bio Poeis」
- Year and Date
  2008-06-10
- Data Source
  KAKENHI-PROJECT-18002005
[Presentation] Scanning nonlinear dielectric microscopy with atomic resolution2007
- Author(s)
  Y. Cho
- Organizer
  13^<th> US-Japan Seminar on Dielectric and Piezoelectric Ceramics
- Place of Presentation
  Awaji Island
- Year and Date
  2007-11-04
- Data Source
  KAKENHI-PROJECT-18002005
[Presentation] Recent progress on ultra high density SNDM ferroelectric probe memory2007
- Author(s)
  Yasuo Cho
- Organizer
  Materials Today Asia, Abstract
- Place of Presentation
  Beijing, China
- Year and Date
  2007-09-03
- Data Source
  KAKENHI-PROJECT-18002005
[Presentation] Cross-sectional observation of nano-domain dots formed in lithium tantalite single crystal2007
- Author(s)
  Yasuo Cho
- Organizer
  International Conference on Nanoscience and Technology 2007
- Place of Presentation
  Stockholm, Sweden
- Year and Date
  2007-07-03
- Data Source
  KAKENHI-PROJECT-18002005
[Presentation] Recent progress on ultra high density SNDM ferroelectric probe memory2007
- Author(s)
  Y. Cho, Y. Hiranaga, K. Tanaka, N. Odagaw, T. Uda, Y. Kurihashi
- Organizer
  Materials Today Aisa
- Place of Presentation
  Beijing
- Year and Date
  2007-09-03
- Data Source
  KAKENHI-PROJECT-18002005
[Presentation] Nanoscale Structure of a Ferroelectric Domain Wall using Scanning Probe Microscopy2007
- Author(s)
  L. Tian, S. Kalinin, E. Eliseev, A. Mozorovska, N. Odagawa, Y. Cho and V. Gopalan
- Organizer
  2007 MRS Fall Meeting
- Place of Presentation
  Boston
- Year and Date
  2007-11-28
- Data Source
  KAKENHI-PROJECT-18002005
[Presentation] Electric dipole moment observation of single si atom on Si (111)7×7 surface using non-contact scanning nonlinear dielectric microscopy2007
- Author(s)
  Yasuo Cho
- Organizer
  International Conference on Nanoscience and Technology 2007
- Place of Presentation
  Stockholm, Sweden
- Year and Date
  2007-07-03
- Data Source
  KAKENHI-PROJECT-18002005
[Presentation] Atomic dipole moment observation of Si (111) 7x7 surface using non-contact scanning nonlinear dielectric microscopy2007
- Author(s)
  Yasuo Cho
- Organizer
  The 10th International Conference on Non-Contact Atomic Force Microscopy
- Place of Presentation
  Antalya, Turkey
- Year and Date
  2007-09-18
- Data Source
  KAKENHI-PROJECT-18002005
[Presentation] Non-Contact Probe Control and High-Speed Writing for Rotated-Disk-Type Ferroelectric Data Storage Devices2007
- Author(s)
  Y. Hiranaga, T. Uda, Y. Kurihashi, K. Tanaka, N. Odagawa and Y. Cho
- Organizer
  The 16th IEEE International Symposium on the Applications of Ferroelectrics, Proceedings
- Place of Presentation
  Nara, Japan
- Data Source
  KAKENHI-PROJECT-18002005
[Presentation] Atomic Dipole Moment Distributions on Semiconductor and Insulator Surface Studied using Non-contact Scanning Nonlinear Dielectric Microscopy2007
- Author(s)
  Yasuo Cho
- Organizer
  2007 MRS Fall Meeting
- Place of Presentation
  Boston, U.S.A.
- Year and Date
  2007-11-26
- Data Source
  KAKENHI-PROJECT-18002005
[Presentation] Observation of atomic dipole moment on hydrogen and oxygen adsorbed Si(111)-7×7 surfaces by using noncontact scanning nonlinear dielectric microscopy
- Author(s)
  Y. Cho, D. Mizuno, K. Yamasue
- Organizer
  19th International Vacuum Congress
- Place of Presentation
  Paris, France
- Year and Date
  2013-09-09 – 2013-09-13
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] High-Resolution Imaging of Hydrogen-Intercalated Graphene on 4H-SiC(0001) Using Non-Contact Scanning Nonlinear Dielectric Microscopy
- Author(s)
  Kohei Yamasue, H. Fukidome, K. Funakubo, M. Suemitsu, Y. Cho
- Organizer
  ICN+T 2014
- Place of Presentation
  Vail, Colorado
- Year and Date
  2014-07-20 – 2014-07-25
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] A Novel Method for Simultaneous Measurement of Topography and Dipole-Induced Local Surface Potential Based on Noncontact Scanning Nonlinear Dielectric Microscopy
- Author(s)
  K. Yamasue, Yasuo Cho
- Organizer
  ICN+T 2014
- Place of Presentation
  Vail, Colorado
- Year and Date
  2014-07-20 – 2014-07-25
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Measurement of Polarization Structure in Layered Piezoelectric Thin Films Using Scanning Nonlinear Dielectric Microscopy
- Author(s)
  H. Odagawa, T. Yanagitani, Y. Cho
- Organizer
  ECAPD 2014
- Place of Presentation
  Vilnius, Lithuania
- Year and Date
  2014-07-07 – 2014-07-11
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Atomic dipole moment induced variation of local surface potential on Si(111)-(7×7) surface studied by noncontact scanning nonlinear dielectric microscopy
- Author(s)
  Kohei Yamasue , Yasuo Cho
- Organizer
  19th International Vacuum Congress
- Place of Presentation
  Paris, France
- Year and Date
  2013-09-09 – 2013-09-13
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Dipole-Induced Potential Measurement Using Noncontact Scanning Nonlinear Dielectric Microscopy
- Author(s)
  Kohei Yamasue, Yasuo Cho
- Organizer
  2014 MRS fall meeting
- Place of Presentation
  Boston
- Year and Date
  2014-11-30 – 2014-12-05
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] High Resolution Visualization of Carrier Distribution in SiC-MOSFET Using Super-Higher-Order Nonlinear Dielectric Microscopy
- Author(s)
  Norimichi Chinone, Takashi Nakamura, Yasuo Cho
- Organizer
  2013 MRS fall meeting
- Place of Presentation
  Boston, USA
- Year and Date
  2013-12-01 – 2013-12-06
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Conduction in nanodomain inversion dots in congruent lithium tantalate single crystal
- Author(s)
  Y. Cho
- Organizer
  ECAPD 2014
- Place of Presentation
  Vilnius, Lithuania
- Year and Date
  2014-07-07 – 2014-07-11
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Charge gradient microscopy: high-speed visualization of polarization charges using a nanoscale probe
- Author(s)
  Seungbum Hong, Sheng Tong, Woon Ik Park, Yoshiomi Hiranaga, Yasuo Cho, Andreas Roelofs
- Organizer
  Nanoscale Spectroscopy and Nanotechnology 8
- Place of Presentation
  Chicago
- Year and Date
  2014-07-28 – 2014-07-31
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] High resolution imaging of dopant and depletion layer distribution in SiC power MOSFET using super-higher-order nonlinear dielectric microscopy
- Author(s)
  Norimichi Chinone, Takashi Nakamura, Yasuo Cho
- Organizer
  ESREF2014
- Place of Presentation
  Berlin
- Year and Date
  2014-09-29 – 2014-10-06
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Site-specific Measurement of Atomic Dipole Moment Induced Surface Potential on Si(111)-(7×7) by Noncontact Scanning Nonlinear Dielectric Microscopy
- Author(s)
  Kohei Yamasue , Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho
- Organizer
  ACSIN-12 & ICSPM21
- Place of Presentation
  Tsukuba, Japan
- Year and Date
  2013-11-04 – 2013-11-08
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Investigation of physical and electrical properties of hydrogen-adsorbed Si(111)-7×7 surface by using noncontact scanning nonlinear dielectric microscopy
- Author(s)
  Daisuke Mizuno, Kohei Yamasue, Yasuo Cho
- Organizer
  18th Microscopy of Semiconducting Materials Meeting
- Place of Presentation
  University of Oxford, UK
- Year and Date
  2013-04-07 – 2013-04-11
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Site Specific Measurement of Atomic Dipole Moment Induced Local Surface Potentials on Si(111)-(7× 7) Surface by Noncontact Scanning Nonlinear Dielectric Microscopy
- Author(s)
  Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho
- Organizer
  2013 MRS fall meeting
- Place of Presentation
  Boston, USA
- Year and Date
  2013-12-01 – 2013-12-06
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Measurement of Nonlinear Dielectric Constants of PZT Thin Films used in Ferroelectric Probe Data Storage Technology
- Author(s)
  Y. Hiranaga, Y. Cho
- Organizer
  2014 Joint IEEE ISAF-IWATMD-PFM
- Place of Presentation
  State College
- Year and Date
  2014-05-12 – 2014-05-16
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Noncontact scanning nonlinear dielectric microscopy study of graphene on 4H-SiC(0001) and its hydrogen-intercalation
- Author(s)
  Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu, Yasuo Cho
- Organizer
  NC-AFM 2014
- Place of Presentation
  Tsukuba
- Year and Date
  2014-08-04 – 2014-08-08
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Conduction in Nanodomains in Lithium Tantalate Single Crystal
- Author(s)
  Yasuo Cho
- Organizer
  ICSS 2013
- Place of Presentation
  Las Vegas Nevada, USA
- Year and Date
  2013-12-15 – 2013-12-18
- Invited
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Pyroelectric Detection of Spontaneous Polarization in Multiferroic La2NiMnO6 Thin Films
- Author(s)
  Ryota Takahashi, Isao Ohkubo, Miho Kitamura, Masaharu Oshima, Yasuo Cho, Mikk Lippmaa
- Organizer
  2014 MRS Spring Meeting
- Place of Presentation
  San Francisco
- Year and Date
  2014-04-21 – 2014-04-25
- Invited
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Investigation of electric dipole moments on Si(100)-2×1 surface using non-contact scanning nonlinear dielectric microscopy
- Author(s)
  Masataka Suzuki, Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho
- Organizer
  ecoss30
- Place of Presentation
  Antalya, TURKEY
- Year and Date
  2014-08-31 – 2014-09-05
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Simultaneous Observation of Topography and Electric Dipole Moments on Si(100)-2×1 Surface Using Non-Contact Scanning Nonlinear Dielectric Microscopy
- Author(s)
  Masataka Suzuki, Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho
- Organizer
  2014 MRS fall meeting
- Place of Presentation
  Boston
- Year and Date
  2014-11-30 – 2014-12-05
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] A New Atomically Resolved Potentiometry for Dipole-Induced Local Surface Potential Based on Noncontact Scanning Nonlinear Dielectric Microscopy
- Author(s)
  Kohei Yamasue, Yasuo Cho
- Organizer
  ecoss30
- Place of Presentation
  Antalya, TURKEY
- Year and Date
  2014-08-31 – 2014-09-05
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Investigation of Hydrogen-Intercalated Graphene on 4H-SiC(0001) by Noncontact Scanning Nonlinear Dielectric Microscopy
- Author(s)
  Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu, Yasuo Cho
- Organizer
  ecoss30
- Place of Presentation
  Antalya, TURKEY
- Year and Date
  2014-08-31 – 2014-09-05
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Evaluation of Power SiC -MOSFET Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy : Imaging of Carrier Distribution and Depletion Layer
- Author(s)
  N. Chinone, T. Nakamura, and Y. Cho
- Organizer
  ISTFA 2014
- Place of Presentation
  Houston
- Year and Date
  2014-11-09 – 2014-11-13
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Interfacial Capacitance between an Fe3 O4 Film and a Nb:TiO3 Substrate
- Author(s)
  Ryota Takahashi, Yasuo Cho, Mikk Lippmaa
- Organizer
  2013 MRS fall meeting
- Place of Presentation
  Boston, USA
- Year and Date
  2013-12-01 – 2013-12-06
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Site specific measurement of surface potential shift on Si(111)-(7ｘ7) surface by noncontact scanning nonliear dielectric microscopy
- Author(s)
  Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho
- Organizer
  NC-AFM 2013
- Place of Presentation
  University of Maryland College Park, Maryland, USA
- Year and Date
  2013-08-05 – 2013-08-09
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Charge Gradient Microscopy: A Method to Image Ferroelectric and Piezoelectric Domains
- Author(s)
  Andreas Roelofs, Sheng Tong, Woon Ik Park, Yoshiomi Hiranaga, Yasuo Cho, Seungbum Hong
- Organizer
  2014 MRS Spring Meeting
- Place of Presentation
  San Francisco
- Year and Date
  2014-04-21 – 2014-04-25
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Current Conduction around Nanodomain Inversion Dot in Lithium Tantalate Single Crystal Studied by Using C-AFM and SNDM
- Author(s)
  Yasuo Cho
- Organizer
  2013 MRS fall meeting
- Place of Presentation
  Boston, USA
- Year and Date
  2013-12-01 – 2013-12-06
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] CURRENT CONDUCTION AROUND NANODOMAIN INVERSION DOT IN LITHIUM TANTALATE SINGLE CRYSTAL
- Author(s)
  Yasuo Cho
- Organizer
  13th International Meeting on Ferroelectricity
- Place of Presentation
  Krakow, Poland
- Year and Date
  2013-09-02 – 2013-09-06
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] High resolution imaging of cross section of metal-oxide-semiconductor field-effect-transistor using super-higher-order nonlinear dielectric microscopy
- Author(s)
  N.Chinone, K.Yamasue, K.Honda,Y.Cho
- Organizer
  18th Microscopy of Semiconducting Materials Meeting
- Place of Presentation
  University of Oxford, UK University of Oxford, UK Prague, Czech Republic University of Maryland College Park, Maryland, USA 発
- Year and Date
  2013-04-07 – 2013-04-11
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Comparative Study on Pristine and Hydrogen-Intercalated Graphene on 4H-SiC(0001) Surface Using Noncontact Scanning Nonlinear Dielectric Microscopy
- Author(s)
  Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu, Yasuo Cho
- Organizer
  2014 MRS fall meeting
- Place of Presentation
  Boston
- Year and Date
  2014-11-30 – 2014-12-05
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Effectiveness of the scanning nonlinear dielectric microscopy on the failure analysis of semiconductor devices
- Author(s)
  Koichiro Honda, Yasuo Cho
- Organizer
  24th European Symposium on Reliability of Electron Devices
- Place of Presentation
  Arcachon, France
- Year and Date
  2013-09-30 – 2013-10-04
- Invited
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Charge Gradient Microscopy:Electromechanical Charge Scraping at the Nanoscale
- Author(s)
  S. Hong, S. Tong, Y. Choi, W. Park, Y. Hiranaga, Y. Cho, A. Roelofs
- Organizer
  EMA2015
- Place of Presentation
  Orlando,Florida
- Year and Date
  2015-01-21 – 2015-01-23
- Invited
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Bias voltage dependence of atomic dipole moment and topography on hydrogen-adsorbed Si(111)-(7× 7) surface studied by noncontact scanning nonlinear dielectric microscopy
- Author(s)
  Kohei Yamasue, Daisuke Mizuno, Yasuo Cho
- Organizer
  NC-AFM 2013
- Place of Presentation
  University of Maryland College Park, Maryland, USA
- Year and Date
  2013-08-05 – 2013-08-09
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Observation of electric dipole moments on Si(100)-2×1 surface by using non-contact scanning nonlinear dielectric microscopy
- Author(s)
  Masataka Suzuki, Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho
- Organizer
  NC-AFM 2014
- Place of Presentation
  Tsukuba
- Year and Date
  2014-08-04 – 2014-08-08
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Surface potentiometry based on scanning nonlinear dielectric　microscopy
- Author(s)
  Kohei Yamasue, Yasuo Cho
- Organizer
  NC-AFM 2014
- Place of Presentation
  Tsukuba
- Year and Date
  2014-08-04 – 2014-08-08
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Scanning Nonlinear Dielectric Microscopy for Visualization of Dopant Distribution in Amorphous Silicon Solar Cells
- Author(s)
  K. Hirose, N. Chinone, Y. Cho
- Organizer
  ICSPM22
- Place of Presentation
  Izu Atagawa
- Year and Date
  2014-12-11 – 2014-12-13
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Study of Electric Dipole Moment Distribution on Si(100)-2×1 Surface by Non-Contact Scanning Nonlinear Dielectric Microscopy
- Author(s)
  Masataka Suzuki, K. Yamasue, M. Abe, Y. Sugimoto, Y. Cho
- Organizer
  ICN+T 2014
- Place of Presentation
  Vail, Colorado
- Year and Date
  2014-07-20 – 2014-07-25
- Data Source
  KAKENHI-PROJECT-24656027
[Presentation] Nano -Domains and Their Related Phenomena in LiTaO3 Single Crystal Studied by Using Scanning Nonlinear Dielectric Microscopy
- Author(s)
  Yasuo Cho
- Organizer
  2013 Joint UFFC, EFTF and PFM Symposium
- Place of Presentation
  Prague, Czech Republic
- Year and Date
  2013-07-21 – 2013-07-25
- Invited
- Data Source
  KAKENHI-PROJECT-23226008

1. HIROYUKI Odagawa (00250845)

# of Collaborated Projects: 9 results

# of Collaborated Products: 8 results
2. YAMASUE Kohei (70467455)

# of Collaborated Projects: 5 results

# of Collaborated Products: 78 results
3. HIRANAGA Yoshiomi (70436161)

# of Collaborated Projects: 4 results

# of Collaborated Products: 52 results
4. YAMANOUCHI Kazuhiko (00006230)

# of Collaborated Projects: 3 results

# of Collaborated Products: 0 results
5. HIROSE Ryusuke (60422143)

# of Collaborated Projects: 1 results

# of Collaborated Products: 7 results
6. KIN Nobuhiro (80418269)

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
7. TSUYOSHI Takano (50085411)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
8. KUSHIBIKI Jun-ichi (50108578)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
9. MATSUMOTO Yasushi (20312598)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
10. IZUMI Takanaga (30323059)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
11. ARAKAWA Mototaka (00333865)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
12. OHARA Koya (70400421)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
13. 奥山雅則 (60029569)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
14. 石橋善弘 (00023052)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
15. 藤村紀文 (50199361)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
16. 安田直彦 (90021625)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
17. 清水勝 (30154305)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
18. 目黒敏靖 (50182150)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
19. 森田剛 (60344735)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
20. 柳谷隆彦 (10450652)

# of Collaborated Projects: 1 results

# of Collaborated Products: 8 results
21. HATANO Hideki

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
22. 宮下雅仁

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
23. SUGIMOTO Yoshiaki

# of Collaborated Projects: 0 results

# of Collaborated Products: 2 results
24. 徳光永輔

# of Collaborated Projects: 0 results

# of Collaborated Products: 1 results
25. 清水荘雄

# of Collaborated Projects: 0 results

# of Collaborated Products: 1 results
26. 田畑仁

# of Collaborated Projects: 0 results

# of Collaborated Products: 1 results

CHO Yasuo 長 康雄

長 康雄 チヨウ ヤスオ

CHO YASUO 長 康夫

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Elucidation of atomic structure and dynamics of carrier trap sitesPrincipal Investigator

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界面電荷輸送現象解明のための高機能走査型非線形誘電率顕微鏡群の研究開発Principal Investigator

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Origin elucidation of the problems in the interface electric charge transportation phenomenon using scanning nonlinear dielectric microscopyPrincipal Investigator

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Visualization of atomic dipole moment and identification of atomic species by using scanning nonlinear dielectric microscopyPrincipal Investigator

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High functionalization of nonlinear dielectric microscopy and its application to electronic devicesPrincipal Investigator

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Next Generation Super High Density Ferroelectric Data Storage Using Scanning Nonlinear Dielectric Microscopy TechniquePrincipal Investigator

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1平方インチ当たり10テラビットの記録密度を持つSNDM強誘電体プローブメモリPrincipal Investigator

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Super high density and high speed ferroelectric data storage based on scanning nonlinear dielectric microscopyPrincipal Investigator

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Electric dipole moment memory based on scanning nonlinear dielectric microscopyPrincipal Investigator

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超高分解能走査型非線形誘電率顕微鏡法を用いた強誘電体中のドメイン構造の解析Principal Investigator

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CHO Yasuo 長康雄

長康雄チヨウヤスオ

CHO YASUO 長康夫