Kyuno Kentaro 弓野健太郎

… Alternative Names

弓野健太郎キユウノケンタロウ

KYUNO Kentaro 弓野健太郎

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Researcher Number	40251467
Other IDs
External Links
Affiliation (Current)	2025: 芝浦工業大学, 工学部, 教授
Affiliation (based on the past Project Information) *help	2025: 芝浦工業大学, 工学部, 教授 2022 – 2023: 芝浦工業大学, 工学部, 教授 2013 – 2016: 芝浦工業大学, 工学部, 教授 2010: Shibaura Institute of Technology, 工学部, 教授 2008 – 2009: Shibaura Institute of Technology, 工学部, 准教授 … More 2001 – 2005: 東京大学, 大学院・工学系研究科, 講師 2000: University of Tokyo, Faculty of Engineering, lecturer, 工学部, 講師 1999: 東京大学, 生産技術研究所, 助手 1994 – 1995: 東京大学, 生産技術研究所, 助手 Less
Review Section/Research Field	Principal Investigator Basic Section 26010:Metallic material properties-related / Inorganic materials/Physical properties / Physical properties of metals / Nanomaterials/Nanobioscience Except Principal Investigator Electronic materials/Electric materials / Physical properties of metals / Structural/Functional materials
Keywords	Principal Investigator 結晶成長 / 薄膜 / 太陽電池 / 半導体物性 / 表面・界面物性 / 構造・機能材料 / 半導体 / Molecular Thin Film / Scanning Probe Microscopy / Crystal Growth … More / Thin Film / 分子膜 / 走査型トンネル顕微鏡 / RRAM / スイッチング / ReRAM / ナノ細線 / 酸化物 / メモリ / 光磁気メモリ材料 / 金属多層膜 / 分子線エピタキシ-法 / 第一原理的電子論 / 垂直磁気異方性 … More Except Principal Investigator MEAM / シリコン / amorphous / polarizability / germanium / silicon / lanthanum oxide / yttrium oxide / hafnium oxide / high-k dielectrics / MISキャパシタ / ゲート絶縁膜 / オフアクシススパッタリング / オープンサーキットポテンシャル / スパックリング / Open Circuit Potential法 / 分光エリプソメトリー / 斜入射X線反射率測定 / 原子状酸素 / 酸化レート / 界面制御 / 基板面方位 / 高誘電率膜 / 光学フォノン / シリケート / Y2O3 / HfO2 / 界面層 / Y_2O_3 on Ge / LaYO_3薄膜 / 遠赤外特性 / Y-doped HfO_2 / High-k膜 / Y_2O_3 / La_2O_3 / HfO_2 / アモルファス / 分極率 / ゲルマニウム / 酸化ランタン / 酸化イットリウム / 酸化ハフニウム / 高誘電率絶縁膜 / Diffusivity / Cluster / Nucleation / Dissociation / Surface diffusion / Crystal growth / Scanning tunneling-microscope / Field ion microscope / 拡散係数 / クラスター / 核生成 / 解離 / 表面拡散 / 結晶成長 / 走査型トンネル顕微鏡 / 電界イオン顕微鏡 / giant magnetoresistance effect / perpendicular magnetic anisotropy / metallic multilayr / surfactant epitaxy / 金属多層膜 / 巨大磁気抵抗効果 / 垂直磁気異方性 / 金属人工格子 / サーファクタントエピタキシ- Less

流動性を有する共晶合金の準安定相に関する研究と溶液成長likeな固相成長への応用Principal Investigator
- Principal Investigator
  
  弓野健太郎
- Project Period (FY)
  2025 – 2027
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 26010:Metallic material properties-related
- Research Institution
  Shibaura Institute of Technology
金属触媒を利用した半導体結晶薄膜の低温形成Principal Investigator
- Principal Investigator
  
  弓野健太郎
- Project Period (FY)
  2022 – 2024
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 26010:Metallic material properties-related
- Research Institution
  Shibaura Institute of Technology
Study on the fluid phases on the surface of eutectic systems at room temperaturePrincipal Investigator
- Principal Investigator
  
  Kyuno Kentaro
- Project Period (FY)
  2015 – 2016
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Inorganic materials/Physical properties
- Research Institution
  Shibaura Institute of Technology
Low temperature crystallization of Si by metal-induced crystallization methodPrincipal Investigator
- Principal Investigator
  
  Kyuno Kentaro
- Project Period (FY)
  2013 – 2016
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Inorganic materials/Physical properties
- Research Institution
  Shibaura Institute of Technology
Creation and annihilation of conductive nanowires in insulatorsPrincipal Investigator
- Principal Investigator
  
  KYUNO Kentaro
- Project Period (FY)
  2008 – 2010
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Nanomaterials/Nanobioscience
- Research Institution
  Shibaura Institute of Technology
シリコン基板上に作製した超薄膜・希土類金属酸化物の誘電率制御指針の構築
- Principal Investigator
  
  TORIUMI Akira
- Project Period (FY)
  2001 – 2003
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  The University of Tokyo
Control of thin-film growth by controlling the shape of 2-dimensional nucleus during initial stagePrincipal Investigator
- Principal Investigator
  
  KYUNO Kentaro
- Project Period (FY)
  2001 – 2002
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Physical properties of metals
- Research Institution
  The University of Tokyo
Study of Interface Control in Ultra-thin High-k Film on Silicon Substrate
- Principal Investigator
  
  TORIUMI Akira
- Project Period (FY)
  2001 – 2005
- Research Category
  
  Grant-in-Aid for Scientific Research (S)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  The University of Tokyo
Development of combined FIM/STM system and investigation of the mechanism of thin-film growth on the atomic level
- Principal Investigator
  
  YAMAMOTO Ryoichi
- Project Period (FY)
  1999 – 2000
- Research Category
  
  Grant-in-Aid for Scientific Research (A).
- Research Field
  
  Physical properties of metals
- Research Institution
  University of Tokyo
極限的垂直磁気異方性をもつ金属人工格子の理論的設計Principal Investigator
- Principal Investigator
  
  弓野健太郎
- Project Period (FY)
  1995
- Research Category
  
  Grant-in-Aid for Encouragement of Young Scientists (A)
- Research Field
  
  Physical properties of metals
- Research Institution
  The University of Tokyo
Study on the initial stage of thin film growth to control the structure of hetero-interface on the atomic level
- Principal Investigator
  
  YAMAMOTO Ryoichi
- Project Period (FY)
  1994 – 1995
- Research Category
  
  Grant-in-Aid for General Scientific Research (B)
- Research Field
  
  Structural/Functional materials
- Research Institution
  Institute of Industrial Science

[Journal Article] Fabrication of an atomically smooth Ge(111) surface by Au-induced crystallization at 170 °C2023
- Author(s)
  Narin Sunthornpan, Kentaro Kyuno
- Journal Title
  
  Applied Physics Letters
  
  Volume: 122 Issue: 17 Pages: 172101-172101
- DOI
  10.1063/5.0145370
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22K04675
[Journal Article] Morphology of Ge thin films crystallized by Au-induced layer exchange at low temperature (220 °C)2022
- Author(s)
  Sunthornpan Narin、Kimura Kenjiro、Kyuno Kentaro
- Journal Title
  
  Journal of Vacuum Science & Technology B
  
  Volume: 40 Issue: 3 Pages: 030601-030601
- DOI
  10.1116/6.0001774
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22K04675
[Journal Article] Fabrication of crystalline Ge thin films by co-deposition of Au and Ge at low substrate temperatures (<200 °C) without post annealing2016
- Author(s)
  Takatoshi Sugiyama, Naoya Mishiba, Masao Kamiko, and Kentaro Kyuno
- Journal Title
  
  Applied Physics Express
  
  Volume: 9 Issue: 9 Pages: 095501-095501
- DOI
  10.7567/apex.9.095501
- NAID
  210000138051
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-25289231, KAKENHI-PROJECT-15K14130
[Journal Article] Effect of seed layers on structure of self-organized Ag nanodots on MgO substrates2015
- Author(s)
  M.Kamiko,R.Suenaga,J.W.Koo,K.Kyuno,Y.Mitsuda,J.G.Ha
- Journal Title
  
  Japanese Journal of Applied Phyiscs
  
  Volume: 54 Issue: 6S1 Pages: 06FH06-06FH06
- DOI
  10.7567/jjap.54.06fh06
- NAID
  210000145254
- Peer Reviewed / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K14130, KAKENHI-PROJECT-25289231
[Journal Article] Ge 結晶薄膜の低温合成：フレキシブルデバイスへの応用を目指して2015
- Author(s)
  弓野健太郎
- Journal Title
  
  真空ジャーナル
  
  Volume: 151 Pages: 13-15
- Data Source
  KAKENHI-PROJECT-25289231
[Journal Article] Effect of Ti seed layers on structure of self-organized epitaxial face-centered-cubic -Ag(001) oriented nanodots2013
- Author(s)
  M. Kamiko, R. Suenaga, J.-W. Koo, K. Nose, K. Kyuno, J.-G. Ha
- Journal Title
  
  Journal of Applied Physics
  
  Volume: 114 Issue: 24 Pages: 244307-244307
- DOI
  10.1063/1.4856975
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24560874, KAKENHI-PROJECT-25289231
[Journal Article] Epitaxial growth of fcc-Ag(001) nanodot on MgO(001) substrate via Ti seed layer assisted agglomeration2013
- Author(s)
  Masao Kamiko, Ryo Suenaga, Jung-Woo Koo, Kenji Nose, Kentaro Kyuno, Jae-Geun Ha
- Journal Title
  
  Journal of Physics D: Applied Physics
  
  Volume: 46 Issue: 50 Pages: 505304-505304
- DOI
  10.1088/0022-3727/46/50/505304
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24560874, KAKENHI-PROJECT-25289231
[Journal Article] Two-Step Forming Process in Planar-Type Cu_2O-Based Resistive Switching Devices2011
- Author(s)
  K.Suzuki, N.Igarashi, K.Kyuno
- Journal Title
  
  Applied Physics Express 4
  
  Pages: 51801-51801
- NAID
  10028210204
- Data Source
  KAKENHI-PROJECT-20510108
[Journal Article] Observation of the Creations and Annihilations of Local Current Paths in HfO_2 thin films on Pt by Ultrahigh Vacuum Conductive-Atomic Force Microscopy : Evidence of Oxygen Spill Over during the Forming Process2009
- Author(s)
  N.Sasaki, K.Kita, A.Toriumi, K.Kyuno
- Journal Title
  
  Japanese Journal of Applied Physics 48
  
  Pages: 60202-60202
- Data Source
  KAKENHI-PROJECT-20510108
[Journal Article] Moisture-absorption-induced permittivity deterioration and surface roughness enhancement of lanthanum oxide films on silicon2006
- Author(s)
  Y.Zhao, M.Toyama, K.Kita, K.Kyuno, A.Toriumi
- Journal Title
  
  Applied Physics Letters 88(7)
  
  Pages: 72904-72904
- NAID
  10022542508
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Origin of Permittivity Enhancement of HfSiO and HfON Film with High Temperature Annealing2006
- Author(s)
  K.Tomida, K.Kita, K.Kyuno, A.Toriumi
- Journal Title
  
  International Conference on Microelectronics and Interfaces (ICMI'06)
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Moisture-absorption-induced permittivity deterioration and surface roughness enhancement of lanthanum oxide films on silicon2006
- Author(s)
  Y.Zhao, M.Toyama, K.Kita, K.Kyuno, A.Toriumi
- Journal Title
  
  Appl.Phys.Lett. 88
  
  Pages: 72904-72904
- NAID
  10022542508
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Dielectric Properties of Metal-Doped HfO_2 for Higher-k Gate Insulators (invited paper)2006
- Author(s)
  K.Kita, K.Tomida, Y.Yamamoto, Y.Zhao, K.Kyuno, A.Toriumi
- Journal Title
  
  2006 International Meeting for Future of Electron Devices, Kansai (IMFEDK)
  
  Pages: 27-28
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] GIXR Analysis of High-k Multilayer Structure2005
- Author(s)
  H.Shimizu, K.Tomida, K.Kita, K.Kyuno, A.Toriumi
- Journal Title
  
  Ext.Abst. 10th Workshop on Gate Stacks -Physics in Materials, Fabrication Processes and Characterizations-
  
  Pages: 167-172
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Polarity Dependence of Leakage Current in HfO_2/SiO_2 Stacked Structures : An Observation by UHV-C-AFM2005
- Author(s)
  K.Kyuno, K.Kita, A.Toriumi
- Journal Title
  
  Ext.Abst. 10th Workshop on Gate Stacks -Physics in Materials, Fabrication Processes and Characterizations-
  
  Pages: 309-314
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Thermally Robust Y_2O_3/Ge MOS Capacitors2005
- Author(s)
  H.Nomura, K.Kita, K.Kyuno, A.Toriumi
- Journal Title
  
  Ext.Abst. 2005 Int.Conf. on Solid State Devices and Materials (SSDM)
  
  Pages: 858-859
- NAID
  10022543442
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Evolution of Leakage Paths in HfO_2/SiO_2 Stacked Gate Dielectrics : A Stable Direct Observation by Ultrahigh Vacuum Conducting Atomic Force Microscopy2005
- Author(s)
  K.Kyuno, K.Kita, A.Toriumi
- Journal Title
  
  Appl.Phys.Lett. 86(6)
  
  Pages: 63510-63510
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Kinetic Model of Si Oxidation at HfO_2/Si Interface with Post Deposition Annealing2005
- Author(s)
  H.Shimizu, K.Kita, K.Kyuno, A.Toriumi
- Journal Title
  
  Japanese Journal of Applied Physics Pt.1,44
  
  Pages: 6131-6135
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Far- and Mid- Infrared Absorption Study of HfO_2/SiO_2/Si System (invited paper)2005
- Author(s)
  A.Toriumi, K.Tomida, H.Shimizu, K.Kita, K.Kyuno
- Journal Title
  
  207th Meeting of the Electrochemical Society
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Moisture Absorption-Induced Permittivity Deterioration and Surface Roughness Enhancement of Lanthanum Oxide Films on Silicon2005
- Author(s)
  Y.Zhao, M.Toyama, K.Kita, K.Kyuno, A.Toriumi
- Journal Title
  
  Ext.Abst. 2005 Int.Conf. on Solid State Devices and Materials (SSDM)
  
  Pages: 546-547
- NAID
  10022542508
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Evolution of leakage paths in HfO_2/SiO_2 stacked gate dielectrics : A stable direct observation by ultrahigh vacuum conducting atomic force microscopy2005
- Author(s)
  K.Kyuno, K.Kita, A.Toriumi
- Journal Title
  
  Applied Physics Letters 86(6)
  
  Pages: 63510-63510
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Evolution of Leakage Path in HfO^2/SiO^2 Stacked Gate Dielectrics : A Stable Direct Observation by Ultrahigh Vacuum Conducting Atomic Force Microscopy,2005
- Author(s)
  K.Kyuno et al.
- Journal Title
  
  Appl. Phys. Lett. 86(6)
  
  Pages: 63510-63510
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Hfo^2/SiO^2スタック構造におけるリーク電流の極性依存性 : UHV-C-AFMによる観察2005
- Author(s)
  弓野健太郎, 他
- Journal Title
  
  ゲートスタック研究会-材料・プロセス・評価の物理- 第10回
  
  Pages: 309-314
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] High Crystallization Temperature and Low Fixed Charge Density of HfLaO_x Films2005
- Author(s)
  Y.Yamamoto, K.Kita, K.Kyuno, A.Toriumi
- Journal Title
  
  36th IEEE Semiconductor Interface Specialists Conference (SISC) P-11
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Ion-Implanted p/n Junction Characteristics p- and n-type Germanium2005
- Author(s)
  T.Nishimura, M.Toyama, K.Kita, K.Kyuno, A.Toriumi
- Journal Title
  
  Ext.Abst. 2005 Int.Conf. on Solid State Devices and Materials (SSDM)
  
  Pages: 520-521
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Effects of Germanium Surface Orientation on HfO_2/Ge Interface2005
- Author(s)
  M.Toyama, K.Kita, K.Kyuno, A.Toriumi
- Journal Title
  
  Ext.Abst. 10th Workshop on Gate Stacks -Physics in Materials, Fabrication Processes and Characterizations-
  
  Pages: 209-214
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] High Crystallization Temperature and Low Fixed Charge Density of HfLaOx Films2005
- Author(s)
  Y.Yamamoto, K.Kita, K.Kyuno, A.Toriumi
- Journal Title
  
  36th IEEE Semiconductor Interface Specialists Conference (SISC) 36
  
  Pages: 10-10
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Design Methodology for La_2O_3-Based Ternary Higher-k Dielectrics2005
- Author(s)
  K.Kita, Yi Zhao, Y.Yamamoto, K.Kyuno, A.Toriumi
- Journal Title
  
  Ext.Abst. 2005 Int.Conf. on Solid State Devices and Materials (SSDM)
  
  Pages: 252-253
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Design Methodology for La2O_3-Based Ternary Higher-k Dielectrics2005
- Author(s)
  K.Kita, Yi Zhao, Y.Yamamoto, K.Kyuno, A.Toriumi
- Journal Title
  
  Extended Abstracts of 2005 International Conference on Solid State Devices and Materials 2005
  
  Pages: 858-859
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Kinetic Model of Si Oxidation at HfO_2/Si Interface with Post Deposition Annealing2005
- Author(s)
  H.Shimizu, K.Kita, K.Kyuno, A.Toriumi
- Journal Title
  
  Jpn.J.Appl.Phys.Pt.1 44(8)
  
  Pages: 6131-6135
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] A New Hf-based Dielectric Member, HfLaO_x, for Amorphous High-k Gate Insulators in Advanced CMOS2005
- Author(s)
  Y.Yamamoto, K.Kita, K.Kyuno, A.Toriumi
- Journal Title
  
  Ext.Abst. 2005 Int.Conf. on Solid State Devices and Materials (SSDM)
  
  Pages: 254-255
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Annealing Effects on CVD-SiO_2 Films Characterized by OCP Measurement2005
- Author(s)
  K.Kita, K.Kyuno, A.Toriumi
- Journal Title
  
  Ext.Abst. 10th Workshop on Gate Stacks -Physics in Materials, Fabrication Processes and Characterizations-
  
  Pages: 265-270
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Permittivity Increase of Yttrium-Doped HfO_2 through Structural Phase Transformation2004
- Author(s)
  K.Kita, K.Kyuno, A.Toriumi
- Journal Title
  
  35th IEEE Semiconductor Interface Specialists Conference (SISC) LP-3
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Initial Growth Mechanism Difference between HfO_2 Films on Ge and Si Substrates2004
- Author(s)
  K.Kita, M.Sasagawa, M.Toyama, K.Kyuno, A.Toriumi
- Journal Title
  
  Ext.Abst. 9th Workshop on Formation, Characterization and Reliability of Ultrathin Silicon Oxides
  
  Pages: 259-264
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Stable Observation of the Evolution of Leakage Spots in HfO_2/SiO_2 stacked structures.2004
- Author(s)
  K.Kyuno et al.
- Journal Title
  
  Extended Abstracts of 2004 International Conference on Solid State Devices and Materials
  
  Pages: 788-789
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Stable Observation of the Evolution of Leakage Spots in HfO_2/SiO_2 Stacked Structures2004
- Author(s)
  K.Kyuno, K.Kita, A.Toriumi
- Journal Title
  
  Ext.Abst. 2004 Int.Conf. Solid State Dev.Mater. (SSDM)
  
  Pages: 788-789
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] IR Absorption Study of HfO_2 and HfO_2/Si Interface Ranging from 200cm^<-1> to 2000cm^<-1>2004
- Author(s)
  K.Tomida, H.Shimizu, K.Kita, K.Kyuno, A.Toriumi
- Journal Title
  
  Integration of Advanced Micro- and Nanoelectronic Devices - Critical Issues and Solutions, MRS Symp.Proc. 811
  
  Pages: 319-324
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Difference between O_2 and N_2 Annealing Effects on CVD-SiO_2 Film Quality Studied by Open-Circuit Measurement2004
- Author(s)
  K.Kita, K.Kyuno, A.Toriumi
- Journal Title
  
  Ext.Abst. 2004 Int.Conf. Solid State Dev.Mater. (SSDM)
  
  Pages: 786-787
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Far Infrared Study of Structural Distortion and Transformation of HfO_2 by Introducing a Slight Amount Si2004
- Author(s)
  K.Tomida, K.Kita, K.Kyuno, A.Toriumi
- Journal Title
  
  Ext.Abst. 2004 Int.Conf. Solid State Dev.Mater. (SSDM)
  
  Pages: 790-791
- NAID
  10022540150
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Dielectric Constant Increase of Yttrium-Doped HfO_2 by Structural Phase Modification2004
- Author(s)
  K Kita, K Kyuno, A Toriumi
- Journal Title
  
  Ext.Abst. 2004 Int.Conf. Solid State Dev.Mater. (SSDM)
  
  Pages: 794-795
- NAID
  10022540160
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Growth Mechanism Difference of Sputtered HfO_2 between on Ge and on Si2004
- Author(s)
  K.Kita, K.Kyuno, A.Toriumi
- Journal Title
  
  Appl.Phys.Lett. 85(1)
  
  Pages: 52-54
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Oxidation Mechanism at HfO_2/Si Interface2004
- Author(s)
  H.Shimizu, K.Tomida, M.Sasagawa, K.Kita, K.Kyuno, A.Toriumi
- Journal Title
  
  Ext.Abst. 9th Workshop on Formation, Characterization and Reliability of Ultrathin Silicon Oxides
  
  Pages: 265-270
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Stable Observation of the Evolution of Leakage Spots in HfO^2/SiO^2 stacked structures2004
- Author(s)
  K.Kyuno et al.
- Journal Title
  
  Extended Abstracts of 2004 International Conference on Solid State Devices and Materials 2004
  
  Pages: 788-789
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Retarded Growth of Sputtered HfO_2 films on Germanium2004
- Author(s)
  K.Kita, K.Kyuno, A.Toriumi
- Journal Title
  
  Integration of Advanced Micro- and Nanoelectronic Devices - Critical Issues and Solutions, MRS Symp.Proc. 811
  
  Pages: 169-174
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Permittivity Increase of Yttrium-Doped HfO_2 through Structural Phase Transformation2004
- Author(s)
  K.Kita, K.Kyuno, A.Toriumi
- Journal Title
  
  Appl.Phys.Lett. 86(7)102906(2005).rface Specialists Conference (SISC) LP-3
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Advantages of Ge (111) Surface for High Quality HfO_2/Ge Interface2004
- Author(s)
  M.Toyama, K.Kita, K.Kyuno, A.Toriumi
- Journal Title
  
  Ext.Abst. 2004 Int.Conf. Solid State Dev.Mater. (SSDM)
  
  Pages: 226-227
- NAID
  10022538299
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Post-Deposition Annealing Effects on Interface States Generation in HfO_2/SiO_2/Si MOS Capacitors2004
- Author(s)
  M.Sasagawa, K.Kita, K.Kyuno, A.Toriumi
- Journal Title
  
  Ext.Abst. 2004 Int.Conf. Solid State Dev.Mater. (SSDM)
  
  Pages: 534-535
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Generalized Model of Oxidation Mechanism at HfO_2/Si Interface with Post-Deposition Annealing2004
- Author(s)
  H.Shimizu, K.Kita, K.Kyuno, A.Toriumi
- Journal Title
  
  Ext.Abst. 2004 Int.Conf. Solid State Dev.Mater. (SSDM)
  
  Pages: 796-797
- NAID
  10022540167
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Oxidation-Induced Damages on Germanium MIS Capacitors with HfO_2 Gate Dielectrics2003
- Author(s)
  K.Kita, M.Sasagawa, K.Tomida, K.Kyuno, A.Toriumi
- Journal Title
  
  Ext.Abst. 2003 Int.Conf. Solid State Dev.Mater. (SSDM)
  
  Pages: 292-293
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] New Method for Characterizing Dielectric Properties of High-k Films with Time-Dependent Open-Circuit Potential Measurement2003
- Author(s)
  K.Kita, M.Sasagawa, K.Kyuno, A.Toriumi
- Journal Title
  
  Jpn.J.Appl.Phys. 42,Pt.2(6B)
- NAID
  10011259919
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] A New Characterization Technique for Depth-Dependent Dielectric Properties of High-k Films by Open-Circuit Potential Measurement2003
- Author(s)
  K.Kita, M.Sasagawa, K.Kyuno, A.Toriumi
- Journal Title
  
  2003 Int. Conference on Characterization and Metrology for ULSI Technology, AIP Conf.Proc. 550
  
  Pages: 166-170
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Further EOT Scaling of Ge/HfO_2 over Si/HfO_2 MOS Systems2003
- Author(s)
  K.Kita, M.Sasagawa, K.Tomida, M.Toyama, K.Kyuno, A.Toriumi
- Journal Title
  
  Int. Workshop on Gate Insulator (IWGI)
  
  Pages: 186-191
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] Interface Oxidation Mechanism in HfO_2/Silicon System with Post-Deposition Annealing2003
- Author(s)
  H.Shimizu, M.Sasagawa, K.Kita, K.Kyuno, A.Toriumi
- Journal Title
  
  Ext.Abst.Int.Conf. Solid State Dev.Mater. (SSDM)
  
  Pages: 486-487
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Journal Article] New method for Characterizing Dielectric Properties of High-k Films Using Time-Dependent Open-Circuit Potential Measurement2002
- Author(s)
  K.Kita M.Sasagawa, K.Kyuno, A.Toriumi
- Journal Title
  
  Ext.Abst.Int.Conf. Solid State Dev.Mater. (SSDM)
  
  Pages: 66-67
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13852009
[Patent] ゲルマニウム層の製造方法、ゲルマニウム層、ゲルマニウム層付基板、ゲルマニウムナノドット、ゲルマニウムナノワイヤ付き基板及び薄膜トランジスタ2015
- Inventor(s)
  弓野健太郎、大石知司、三芝直也、杉山貴俊、原浩子
- Industrial Property Rights Holder
  芝浦工業大学
- Industrial Property Rights Type
  特許
- Industrial Property Number
  2015-016009
- Filing Date
  2015-01-29
- Data Source
  KAKENHI-PROJECT-25289231
[Presentation] AuSb，Au触媒を用いたアニールによるGe薄膜の結晶化及びその電気特性2024
- Author(s)
  楊淳祥、弓野健太郎
- Organizer
  日本金属学会　2024年春期講演大会（第174回）
- Data Source
  KAKENHI-PROJECT-22K04675
[Presentation] Ag触媒を用いたMIC法による多結晶Ge薄膜の成膜プロセスおよび電気特性2024
- Author(s)
  渡部祐大、小林和矢、弓野健太郎
- Organizer
  日本金属学会　2024年春期講演大会（第174回）
- Data Source
  KAKENHI-PROJECT-22K04675
[Presentation] Auで被膜した加熱基板上におけるGe薄膜の結晶化：Ge膜厚依存性2024
- Author(s)
  小杉哲平、弓野健太郎
- Organizer
  日本金属学会　2024年春期講演大会（第174回）
- Data Source
  KAKENHI-PROJECT-22K04675
[Presentation] Au薄膜上へのスパッタによるGe薄膜の結晶化と電気特性2024
- Author(s)
  星佑樹、弓野健太郎
- Organizer
  日本金属学会　2024年春期講演大会（第174回）
- Data Source
  KAKENHI-PROJECT-22K04675
[Presentation] Auで被覆した加熱基板へのスパッタによるGe薄膜の結晶化2023
- Author(s)
  赤坂駿英, 弓野健太郎
- Organizer
  日本金属学会第172回講演大会
- Data Source
  KAKENHI-PROJECT-22K04675
[Presentation] Crystallization behavior of Ge thin films during metal-induced crystallization using Au2023
- Author(s)
  Narin Sunthornpan, Kentaro Kyuno
- Organizer
  The 9th International Symposium on Organic and Inorganic Electronic Materials and Related Nanotechnologies
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22K04675
[Presentation] AuSb合金を用いたMIC法で作製したGe薄膜の構造と電気特性2023
- Author(s)
  加藤雅基, 弓野健太郎
- Organizer
  日本金属学会第172回講演大会
- Data Source
  KAKENHI-PROJECT-22K04675
[Presentation] Low temperature growth of crystalline semiconductor thin films by metal-induced crystallization: A simulation based on Cahn Hilliard model2023
- Author(s)
  Tetsunosuke Harada, Kentaro Kyuno
- Organizer
  The 9th International Symposium on Organic and Inorganic Electronic Materials and Related Nanotechnologies
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22K04675
[Presentation] AgSb合金を用いたMIC法によるn型Ge結晶薄膜の作製と電気特性の膜厚依存性2023
- Author(s)
  大久保拓海, 弓野健太郎
- Organizer
  日本金属学会第172回講演大会
- Data Source
  KAKENHI-PROJECT-22K04675
[Presentation] Ag-Sb合金を用いたGe薄膜の低温結晶化2023
- Author(s)
  浅野友太、弓野健太郎
- Organizer
  日本金属学会　2023年秋期講演大会（第173回）
- Data Source
  KAKENHI-PROJECT-22K04675
[Presentation] AuGe合金の第一原理電子状態計算2023
- Author(s)
  原田哲之介, 弓野健太郎
- Organizer
  日本金属学会第172回講演大会
- Data Source
  KAKENHI-PROJECT-22K04675
[Presentation] Realizing an atomically flat surface of Ge (111) thin film at low temperature (220°C) by gold-induced layer exchange2022
- Author(s)
  Narin Sunthornpan, Kentaro Kyuno
- Organizer
  The 64th Electronic Materials Conference
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22K04675
[Presentation] CRYSTALLIZATION OF GERMANIUM THIN FILMS USING GOLD-ANTIMONY (AuSb) AS A CATALYST2017
- Author(s)
  Joseph B. Mutunga,Takumi Kondo,Tatsuya Suzuki,Masao Kamiko,Kentaro Kyuno
- Organizer
  11th South East Asian Technical University Consortium Symposium
- Place of Presentation
  ベトナム
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-25289231
[Presentation] CRYSTALLIZATION OF GERMANIUM THIN FILMS USING GOLD-ANTIMONY (AuSb) AS A CATALYST2017
- Author(s)
  Joseph B. Mutunga,Takumi Kondo,Tatsuya Suzuki,Masao Kamiko,Kentaro Kyuno
- Organizer
  11th South East Asian Technical University Consortium Symposium
- Place of Presentation
  ベトナム
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K14130
[Presentation] AuGe/Au積層膜のアニールによるGe結晶薄膜の作成 (2)2016
- Author(s)
  熊谷健太、神子公男、弓野健太郎
- Organizer
  応用物理学会秋季学術講演会
- Place of Presentation
  新潟市
- Data Source
  KAKENHI-PROJECT-25289231
[Presentation] AuとGeの同時スパッタによるGe薄膜の結晶化(Ⅲ)2016
- Author(s)
  高鳥毛怜, 神子公男, 弓野健太
- Organizer
  応用物理学会秋季学術講演会
- Place of Presentation
  新潟市
- Data Source
  KAKENHI-PROJECT-15K14130
[Presentation] AuGe/Au積層膜のアニールによるGe結晶薄膜の作成 (2)2016
- Author(s)
  熊谷健太、神子公男、弓野健太郎
- Organizer
  応用物理学会秋季学術講演会
- Place of Presentation
  新潟市
- Data Source
  KAKENHI-PROJECT-15K14130
[Presentation] AuとGeの同時スパッタによるGe薄膜の結晶化(Ⅲ)2016
- Author(s)
  高鳥毛　怜, 神子公男, 弓野健太郎
- Organizer
  応用物理学会秋季学術講演会
- Place of Presentation
  新潟市
- Data Source
  KAKENHI-PROJECT-25289231
[Presentation] AuSb induced crystallization of Ge thin films2016
- Author(s)
  J.B.Mutunga, T.Kondo, T.Suzuki, M.Kamiko, K.Kyuno
- Organizer
  応用物理学会秋季学術講演会
- Place of Presentation
  新潟市
- Data Source
  KAKENHI-PROJECT-15K14130
[Presentation] AuGe/Au積層膜のアニールによるGe結晶薄膜の作製(1)2016
- Author(s)
  阿久津敏、神子公男、弓野健太郎
- Organizer
  応用物理学会秋季学術講演会
- Place of Presentation
  新潟市
- Data Source
  KAKENHI-PROJECT-25289231
[Presentation] AuSb induced crystallization of Ge thin films2016
- Author(s)
  J.B.Mutunga, T.Kondo, T.Suzuki, M.Kamiko, K.Kyuno
- Organizer
  応用物理学会秋季学術講演会
- Place of Presentation
  新潟市
- Data Source
  KAKENHI-PROJECT-25289231
[Presentation] AuGe/Au積層膜のアニールによるGe結晶薄膜の作製(1)2016
- Author(s)
  阿久津敏、神子公男、弓野健太郎
- Organizer
  応用物理学会秋季学術講演会
- Place of Presentation
  新潟市
- Data Source
  KAKENHI-PROJECT-15K14130
[Presentation] AuとGeの同時スパッタによる Ge薄膜の結晶化の膜厚依存性2015
- Author(s)
  山本怜,杉山貴俊,神子公男,弓野健太郎
- Organizer
  応用物理学会秋季学術講演会
- Place of Presentation
  名古屋国際会議場
- Year and Date
  2015-09-13
- Data Source
  KAKENHI-PROJECT-25289231
[Presentation] AuとGeの同時スパッタによるGe薄膜の結晶化の膜厚依存性2015
- Author(s)
  山本怜、杉山貴俊、神子公男、弓野健太郎
- Organizer
  応用物理学会秋季学術講演会
- Place of Presentation
  名古屋国際会議場
- Year and Date
  2015-09-13
- Data Source
  KAKENHI-PROJECT-15K14130
[Presentation] Au(111)表面上におけるGeのSTM観察2015
- Author(s)
  若林陽介、橋口浩平、神子公男、弓野健太郎
- Organizer
  応用物理学会秋季学術講演会
- Place of Presentation
  名古屋国際会議場
- Year and Date
  2015-09-13
- Data Source
  KAKENHI-PROJECT-25289231
[Presentation] AuとGeの同時スパッタによる結晶Ge薄膜の作製：リンドープの影響2015
- Author(s)
  鈴木竜也、高鳥毛怜、杉山貴俊、神子公男、弓野健太郎
- Organizer
  応用物理学会秋季学術講演会
- Place of Presentation
  名古屋国際会議場
- Year and Date
  2015-09-13
- Data Source
  KAKENHI-PROJECT-15K14130
[Presentation] AuとGeの同時スパッタによる結晶Ge薄膜の作製：リンドープの影響2015
- Author(s)
  鈴木竜也、高鳥毛怜、杉山貴俊、神子公男、弓野健太郎
- Organizer
  応用物理学会秋季学術講演会
- Place of Presentation
  名古屋国際会議場
- Year and Date
  2015-09-13
- Data Source
  KAKENHI-PROJECT-25289231
[Presentation] Au(111)表面上におけるGeのSTM観察2015
- Author(s)
  若林陽介、橋口浩平、神子公男、弓野健太郎
- Organizer
  応用物理学会秋季学術講演会
- Place of Presentation
  名古屋国際会議場
- Year and Date
  2015-09-13
- Data Source
  KAKENHI-PROJECT-15K14130
[Presentation] AuとGeの同時スパッタによるGe薄膜の結晶化2014
- Author(s)
  杉山貴俊，神子公男，弓野健太郎
- Organizer
  応用物理学会春季学術講演会
- Place of Presentation
  青山学院大学
- Data Source
  KAKENHI-PROJECT-25289231
[Presentation] Si/Ag(111)の表面形態のSTM観察(II)2014
- Author(s)
  稲瀬陽介，神子公男，弓野健太郎
- Organizer
  応用物理学会春季学術講演会
- Place of Presentation
  青山学院大学
- Data Source
  KAKENHI-PROJECT-25289231
[Presentation] Tiシード層による自己組織化Ag薄膜の凝集過程2013
- Author(s)
  神子公男，末永亮，野瀬健二，具正祐，弓野健太郎，光田好孝，河在根
- Organizer
  応用物理学会秋季学術講演会
- Place of Presentation
  同志社大学
- Data Source
  KAKENHI-PROJECT-25289231
[Presentation] Cuを触媒に用いたMIC法によるSi薄膜の結晶化2013
- Author(s)
  庫井俊輔, 飯島裕貴, 三芝直也, 神子公男, 弓野健太郎
- Organizer
  日本金属学会秋期講演大会
- Place of Presentation
  金沢大学
- Data Source
  KAKENHI-PROJECT-25289231
[Presentation] Cu_2Oを用いた平面型ReRAM素子におけるフォーミング過程の直接観察2010
- Author(s)
  弓野健太郎、鈴木和典
- Organizer
  第71回応用物理学会学術講演会
- Place of Presentation
  長崎大学
- Year and Date
  2010-09-17
- Data Source
  KAKENHI-PROJECT-20510108
[Presentation] 平面型ReRAM素子におけるフォーミング現象初期過程の直接観察2010
- Author(s)
  鈴木和典、弓野健太郎
- Organizer
  応用物理学会
- Place of Presentation
  東海大学
- Year and Date
  2010-03-18
- Data Source
  KAKENHI-PROJECT-20510108
[Presentation] Direct observation of the forming process in crystalline Cu2O resistive switching devices2010
- Author(s)
  N.Igarashi, K.Suzuki, K.Kyuno
- Organizer
  20th Materials Research Society of Japan Academic Symposium
- Place of Presentation
  Yokohama
- Year and Date
  2010-12-21
- Data Source
  KAKENHI-PROJECT-20510108
[Presentation] Improvement of the Device Yield of TiO2 based ReRAM by Oxidation of Electrodes2009
- Author(s)
  E.Shinozaki, K.Kyuno
- Organizer
  Academic Symposium of MRS-Japan
- Place of Presentation
  Yokohama
- Year and Date
  2009-12-08
- Data Source
  KAKENHI-PROJECT-20510108
[Presentation] Direct Observation of Conductive Path after Forming Process in Planar ReRAM2009
- Author(s)
  K.Suzuki, K.Kyuno
- Organizer
  Academic Symposium of MRS-Japan
- Place of Presentation
  Yokohama
- Year and Date
  2009-12-08
- Data Source
  KAKENHI-PROJECT-20510108
[Presentation] 平面型ReRAMにおけるフォーミング現象の直接観察2009
- Author(s)
  鈴木和典、弓野健太郎
- Organizer
  応用物理学会
- Place of Presentation
  富山大学
- Year and Date
  2009-09-09
- Data Source
  KAKENHI-PROJECT-20510108
[Presentation] 電極の酸化によるTiO2薄膜の抵抗変化スイッチング現象の安定化2009
- Author(s)
  星野智也、弓野健太郎
- Organizer
  日本金属学会
- Place of Presentation
  京都大学
- Year and Date
  2009-09-16
- Data Source
  KAKENHI-PROJECT-20510108
[Presentation] AuによるGeのMIC法における熱処理温度および膜厚依存性
- Author(s)
  末永容平、弓野健太郎
- Organizer
  日本金属学会2015年春期講演大会
- Place of Presentation
  東京大学　駒場キャンパス
- Year and Date
  2015-03-18 – 2015-03-20
- Data Source
  KAKENHI-PROJECT-25289231
[Presentation] Au-Ge同時スパッタによるアモルファスGeの結晶化
- Author(s)
  小室尚貴、神子公男、弓野健太郎
- Organizer
  日本金属学会2015年春期講演大会
- Place of Presentation
  東京大学　駒場キャンパス
- Year and Date
  2015-03-18 – 2015-03-20
- Data Source
  KAKENHI-PROJECT-25289231
[Presentation] Alを用いたSurfactant Crystallization法による結晶Si薄膜の作製
- Author(s)
  飯島裕貴、弓野健太郎、神子公男
- Organizer
  日本金属学会2014年秋期講演大会
- Place of Presentation
  名古屋大学　東山キャンパス
- Year and Date
  2014-09-24 – 2014-09-26
- Data Source
  KAKENHI-PROJECT-25289231
[Presentation] Ag/mica上に蒸着したSiの影響によるAgの構造変化(II)
- Author(s)
  橋口浩平、若林陽介、稲瀬陽介、神子公男、弓野健太郎
- Organizer
  日本金属学会2015年春期講演大会
- Place of Presentation
  東京大学　駒場キャンパス
- Year and Date
  2015-03-18 – 2015-03-20
- Data Source
  KAKENHI-PROJECT-25289231
[Presentation] AuとGeの同時スパッタによるGe薄膜の結晶化(Ⅱ)
- Author(s)
  杉山貴俊、神子公男、弓野健太郎
- Organizer
  2015年第62回応用物理学会春季学術講演会
- Place of Presentation
  東海大学　湘南キャンパス
- Year and Date
  2015-03-11 – 2015-03-14
- Data Source
  KAKENHI-PROJECT-25289231
[Presentation] Agを用いたMIC法によるSiの結晶化挙動
- Author(s)
  谷口公一、神子公男、弓野健太郎
- Organizer
  日本金属学会2015年春期講演大会
- Place of Presentation
  東京大学　駒場キャンパス
- Year and Date
  2015-03-18 – 2015-03-20
- Data Source
  KAKENHI-PROJECT-25289231
[Presentation] Ag/mica上に蒸着したSiの影響によるAgの構造変化
- Author(s)
  橋口浩平、稲瀬陽介、神子公男、弓野健太郎
- Organizer
  日本金属学会2014年秋期講演大会
- Place of Presentation
  名古屋大学　東山キャンパス
- Year and Date
  2014-09-24 – 2014-09-26
- Data Source
  KAKENHI-PROJECT-25289231
[Presentation] Au,Ge同時スパッタ法による結晶化Ge薄膜の作製
- Author(s)
  三芝直也、杉山貴俊、神子公男、弓野健太郎
- Organizer
  日本金属学会2014年秋期講演大会
- Place of Presentation
  名古屋大学　東山キャンパス
- Year and Date
  2014-09-24 – 2014-09-26
- Data Source
  KAKENHI-PROJECT-25289231

1. TORIUMI Akira (50323530)

# of Collaborated Projects: 3 results

# of Collaborated Products: 41 results
2. KAMIKO Masao (80334366)

# of Collaborated Projects: 2 results

# of Collaborated Products: 31 results
3. YAMAMOTO Ryoichi (10107550)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
4. KITA Kita (00343145)

# of Collaborated Projects: 1 results

# of Collaborated Products: 41 results
5. HA Jae-Geun

# of Collaborated Projects: 0 results

# of Collaborated Products: 2 results
6. SUENAGA Ryo

# of Collaborated Projects: 0 results

# of Collaborated Products: 2 results
7. KOO Jung-Woo

# of Collaborated Projects: 0 results

# of Collaborated Products: 2 results
8. NOSE Kenji

# of Collaborated Projects: 0 results

# of Collaborated Products: 2 results

Kyuno Kentaro 弓野 健太郎

弓野 健太郎 キユウノ ケンタロウ

KYUNO Kentaro 弓野 健太郎

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流動性を有する共晶合金の準安定相に関する研究と溶液成長likeな固相成長への応用Principal Investigator

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金属触媒を利用した半導体結晶薄膜の低温形成Principal Investigator

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Study on the fluid phases on the surface of eutectic systems at room temperaturePrincipal Investigator

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Low temperature crystallization of Si by metal-induced crystallization methodPrincipal Investigator

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Creation and annihilation of conductive nanowires in insulatorsPrincipal Investigator

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シリコン基板上に作製した超薄膜・希土類金属酸化物の誘電率制御指針の構築

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Control of thin-film growth by controlling the shape of 2-dimensional nucleus during initial stagePrincipal Investigator

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Study of Interface Control in Ultra-thin High-k Film on Silicon Substrate

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Development of combined FIM/STM system and investigation of the mechanism of thin-film growth on the atomic level

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極限的垂直磁気異方性をもつ金属人工格子の理論的設計Principal Investigator

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Study on the initial stage of thin film growth to control the structure of hetero-interface on the atomic level

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[Journal Article] Fabrication of an atomically smooth Ge(111) surface by Au-induced crystallization at 170 °C2023

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[Journal Article] Morphology of Ge thin films crystallized by Au-induced layer exchange at low temperature (220 °C)2022

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Kyuno Kentaro 弓野健太郎

弓野健太郎キユウノケンタロウ

KYUNO Kentaro 弓野健太郎

[Journal Article] Ge 結晶薄膜の低温合成：フレキシブルデバイスへの応用を目指して2015