Akimoto Koichi 秋本晃一

… Alternative Names

AKIMOTO Koichi 秋本晃一

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Researcher Number	40262852
Other IDs
External Links
Affiliation (Current)	2025: 日本女子大学, 理学部, 教授
Affiliation (based on the past Project Information) *help	2012 – 2017: 日本女子大学, 理学部, 教授 2011: 名古屋大学, 工学(系)研究科(研究院), 准教授 2009 – 2011: Nagoya University, 工学研究科, 准教授 2007 – 2009: 名古屋大学, 大学院・工学研究科, 准教授 2006: Nagoya University, Graduate School of Engineering, Associate Professor, 大学院工学研究科, 助教授 … More 2003 – 2005: 名古屋大学, 大学院・工学研究科, 助教授 2000 – 2003: 名古屋大学, 工学研究科, 助教授 1995 – 1996: 名古屋大学, 工学部, 助教授 Less
Review Section/Research Field	Principal Investigator Applied materials science/Crystal engineering / Crystal engineering / Condensed matter physics I / 固体物性Ⅰ(光物性・半導体・誘電体) Except Principal Investigator 表面界面物性 / Design engineering/Machine functional elements/Tribology / Thin film/Surface and interfacial physical properties / Thin film/Surface and interfacial physical properties
Keywords	Principal Investigator シンクロトロン放射光 / メゾスコピック / 窒化ガリウム / 結晶工学 / 化合物半導体 / X線 / 格子ひずみ / 表面構造 / 電子回折 / 結晶欠陥 … More / Ｘ線トポグラフィー / Ｘ線回折 / CTR散乱 / Ｘ線ＣＴＲ散乱 / X-ray photoelectron spectroscopy / Phase transition / Crystal structure / X-ray diffraction / High-k film / Synchrotron radiation / 光電子分光 / 構造相転移 / 結晶構造 / 高誘電率絶縁膜 / Synchrotron Radiation / Dynamical Theory / Reconstructed Surface / Strain Relaxation / X-Ray Diffraction / Surface / 再構成構造 / 動力学的回折理論 / 再構成表面 / 格子緩和 / 表面 / ＧａＮ / GaN / X線回折 … More Except Principal Investigator シリコン / ステップダイナミクス / X線回折 / X線回析 / 走査トンネル顕微鏡 / シリコン表面 / 表面構造 / ナノ構造 / 放射線X線粒子線 / 表面・界面物性 / トライボロジー / gold / silver / silicon / semiconductor / 1D structure / buried interface / surface structure / x-ray diffraction / 金属一次元構造 / STM / 金属1次元構造 / 高指数面 / 金 / 銀 / 半導体 / 1次元構造 / 埋もれた界面 / Silicon Surfaces / Scanning Tunneling Microscopy / Step dynamics / Nano-structure / Silicon / ステップダイナミックス / Metal-silicon interface / X-ray diffarction / reflection high-energy electron diffraction / Scanning tunneling microscopy / Metal adsorption / Epitaxial growth / Adsorption / Silicon surfaces / 反射高速原子回折 / 反射高速電子回折 / 金属・シリコン界面 / 反射高速電子回析 / 金属吸着 / エピタキシャル成長 / 脱離・吸着 / 原子分解 / 電子密度分布 / 反復位相回復 / ホログラフィ / 位相問題 / トポロジカル絶縁体 / Ｘ線回折 / 表面界面構造 / 放射線Ｘ線粒子線 / 国際情報交換 / フランス / 薄膜 / 国際情報交流 / 超薄膜 / ナノ材料 Less

Study on strain fields and surface reconstructions of GaN crystals which have microstructure in mesoscopic scale.Principal Investigator
- Principal Investigator
  
  Akimoto Koichi
- Project Period (FY)
  2015 – 2017
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Crystal engineering
- Research Institution
  Japan Women's University
Analysis of precise electron density of topological insulator thin films by applying direct methods to surface X-ray diffraction
- Principal Investigator
  
  TAKAHASHI Toshio
- Project Period (FY)
  2013 – 2015
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  Tokyo Gakugei University
  The University of Tokyo
Study on strain fields of GaN crystals which have microstructures in mesoscopic scale.Principal Investigator
- Principal Investigator
  
  AKIMOTO Koichi
- Project Period (FY)
  2012 – 2014
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Applied materials science/Crystal engineering
- Research Institution
  Japan Women's University
Study on the correlation between the behavior of a soft metal layer at frictional interface and its tribological properties
- Principal Investigator
  
  GOTO Minoru
- Project Period (FY)
  2011 – 2013
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Design engineering/Machine functional elements/Tribology
- Research Institution
  Ube National College of Technology
Study on crystal grains of GaN which has microstructures in mesoscopic scale.Principal Investigator
- Principal Investigator
  
  AKIMOTO Koichi
- Project Period (FY)
  2009 – 2011
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Applied materials science/Crystal engineering
- Research Institution
  Nagoya University
Study on structural changes of solid surfaces due to tribological interaction in sliding interfaces
- Principal Investigator
  
  GOTO Minoru
- Project Period (FY)
  2007 – 2009
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Design engineering/Machine functional elements/Tribology
- Research Institution
  Ube National College of Technology
Phase transition of high-dielectric insulating films studied by extremely asymmetric X-ray diffraction and X-ray photoelectron spectroscopyPrincipal Investigator
- Principal Investigator
  
  AKIMOTO Koichi
- Project Period (FY)
  2004 – 2006
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Condensed matter physics I
- Research Institution
  Nagoya University
Study on the one-dimensional structure of metals on semiconductor surfaces and buried interfaces
- Principal Investigator
  
  TAKAHASHI Toshio
- Project Period (FY)
  2004 – 2006
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  The University of Tokyo
Relaxation processes of nano structures on semiconductor surfaces.
- Principal Investigator
  
  ICHIMIYA Ayahiko
- Project Period (FY)
  2001 – 2003
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  表面界面物性
- Research Institution
  Nagoya University
Strain Relaxation at Semiconductor Surface Revealed by X-Ray DiffractionPrincipal Investigator
- Principal Investigator
  
  AKIMOTO Koichi
- Project Period (FY)
  2000 – 2002
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  固体物性Ⅰ(光物性・半導体・誘電体)
- Research Institution
  Nagoya University
Dynamic Processes in Atomic Level on Silicon Surfaces
- Principal Investigator
  
  ICHIMIYA Ayahiko
- Project Period (FY)
  1995 – 1996
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  表面界面物性
- Research Institution
  Nagoya University

[Journal Article] Polarity Determination of GaN Thin Films by Anomalous X-Ray Diffraction2015
- Author(s)
  秋本晃一
- Journal Title
  
  Nihon Kessho Gakkaishi
  
  Volume: 57 Issue: 5 Pages: 263-268
- DOI
  10.5940/jcrsj.57.263
- NAID
  130005105680
- ISSN
  0369-4585, 1884-5576
- Language
  Japanese
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-15K04667, KAKENHI-PROJECT-25246026
[Journal Article] Determination of non-uniform graphene thickness on SiC(0001) by X-ray diffraction2013
- Author(s)
  A. Ruammaitree, H. Nakahara, K. Akimoto, K. Soda, Y. Saito
- Journal Title
  
  Applied Surface Science
  
  Volume: 282 Pages: 297-301
- DOI
  10.1016/j.apsusc.2013.05.122
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24560009
[Journal Article] Quantitative strain analysis of surfaces and interfaces using extremely asymmetric X-ray diffraction2010
- Author(s)
  K.Akimoto, T.Emoto
- Journal Title
  
  Journal of Physics : Condensed Matter
  
  Volume: 22 Pages: 473001-473001
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21560013
[Journal Article] Quantitative strain analysis of surfaces and interfaces using extremely asymmetric X-ray diffraction(Topical Review)2010
- Author(s)
  K. Akimoto and T. Emoto
- Journal Title
  
  Journal of Physics : Condensed Matter
  
  Volume: 22(47) Issue: 47 Pages: 473001-473001
- DOI
  10.1088/0953-8984/22/47/473001
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21560013
[Journal Article] Structure of the SiC(0001)-√3×√3-R30゜ surface after initial oxidation2010
- Author(s)
  W.Voegeli, K.Akimoto, A.Ichimiya, Y.Hisada.
- Journal Title
  
  Surface Science
  
  Volume: 604 Pages: 1713-1717
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21560013
[Journal Article] Structure of the quasi-one-dimensional Si(553)-Au surface : Gold dimer row and silicon honeycomb chain2010
- Author(s)
  W.Voegeli, T.Shirasawa, T.Takahashi, K.Akimotoa.
- Journal Title
  
  Physical Review B
  
  Volume: 82 Pages: 75426-75426
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21560013
[Journal Article] Structure of the quasi-one-dimensional Si(553)-Au surface2010
- Author(s)
  W. Voegeli, T. Takayama, T. Shirasawa, M. Abe, K. Kubo, T. Takahashi, K. Akimoto, and H. Sugiyama
- Journal Title
  
  Gold dimer row and silicon honeycomb chain, Phys. Rev
  
  Volume: 82 Issue: 7 Pages: 75426-75426
- DOI
  10.1103/physrevb.82.075426
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21560013
[Journal Article] Critical thickness of polycrystalline Ag layers yielding friction reduction due to tribo-assisted reorientation2009
- Author(s)
  Minoru Goto, Koichi Akimoto
- Journal Title
  
  Proc.WTC4
  
  Pages: 685-685
- Data Source
  KAKENHI-PROJECT-19560154
[Journal Article] Ag薄膜の摩擦配向現象と配向パターン実現の可能性2009
- Author(s)
  後藤実, 秋本晃一, 仙波伸也
- Journal Title
  
  電子情報通信学会技術研究報告 Vol.109
  
  Pages: 13-18
- NAID
  110007483403
- Data Source
  KAKENHI-PROJECT-19560154
[Journal Article] Strain evolution in Si substrate due to implantation of Me Vion observed by extremely asymmetric x-ray diffraction2009
- Author(s)
  T. Emoto, J. Ghatak, P. V. Satyam, and K. Akimoto
- Journal Title
  
  J Appl. Physics
  
  Volume: 106(4) Issue: 4 Pages: 43516-43516
- DOI
  10.1063/1.3202329
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21560013
[Journal Article] Ag薄膜の摩擦配向現象と配向パターン実現の可能性2009
- Author(s)
  後藤実、秋本晃一、仙波伸也
- Journal Title
  
  電子情報通信学会技術研究報告 Vol.109
  
  Pages: 13-18
- NAID
  110007483403
- Data Source
  KAKENHI-PROJECT-19560154
[Journal Article] Structural Study of the Si(553)-Au Surface2009
- Author(s)
  T. Takayama, W. Voegeli, T. Shirasawa, K. Kubo, M. Abe, and T. Takahashi, K. Akimoto, H. Sugiyama
- Journal Title
  
  e-J. Surf. Sci. Nanotechnol.
  
  Volume: 7 Pages: 533-536
- DOI
  10.1380/ejssnt.2009.533
- NAID
  130004439142
- ISSN
  1348-0391
- Language
  English
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21560013
[Journal Article] Critical thickness of polycrystalline Ag layers yielding friction reduction due to tribo-assisted reorientation2009
- Author(s)
  Minoru Goto, Koichi Akimoto
- Journal Title
  
  Proc. The Sixth International Conference on Flow Dynamics
  
  Pages: 104-105
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19560154
[Journal Article] Critical thickness of polycrystalline Ag layers yielding friction reduction due to tribo-assisted reorientation2009
- Author(s)
  Minoru Goto, Koichi Akimoto
- Journal Title
  
  Proc. WTC4
  
  Pages: 685-685
- Data Source
  KAKENHI-PROJECT-19560154
[Journal Article] Structural Study of the Si(553)-Au Surface2009
- Author(s)
  T.Takayama, W.Voegeli, T.Takahashi, K.Akimoto
- Journal Title
  
  e-Journal of Surface Science and Nanotechnology 7
  
  Pages: 533-536
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21560013
[Journal Article] Critical thickness of polycrystalline Ag layers yielding friction reduction due to tribo-assisted reorientation2009
- Author(s)
  Minoru Goto, Koichi Akimoto
- Journal Title
  
  Proc.The Sixth International Conference on Flow Dynamics
  
  Pages: 104-105
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19560154
[Journal Article] Strain evolution in Si substrate due to implantation of MeV ion observed by extremely asymmetric x-ray diffraction2009
- Author(s)
  T.Emoto, P.V.Satyam, K.Akimoto
- Journal Title
  
  Journal of Applied Physics 106(4)
  
  Pages: 43516-43516
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21560013
[Journal Article] Selective growth of epitaxial Ag film using Tribo-assisted reorientation2008
- Author(s)
  M. Goto, K. Akimoto, F. Honda
- Journal Title
  
  Proc. Instn Mech. Engrs Part J: J. Engineering Tribology Vol.222
  
  Pages: 241-248
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19560154
[Journal Article] Selective Growth of Homo-epitaxial Ag Nano-Layer on Tribo-Assisted-Reorientation2008
- Author(s)
  M. Goto, H. Kobayashi, K. Akimoto
- Journal Title
  
  Tribolo gy Online Vol.3
  
  Pages: 173-176
- NAID
  130000067159
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19560154
[Journal Article] Structural study of Si(111)-6 × 1-Ag surface using surface x-ray diffraction2007
- Author(s)
  K.Sumitani, K.Masuzawa, T.Hoshino, R.Yoshida, S.Nakatani, T.Takahashi, H.Tajiri, K.Akimoto, H.Sugiyama, X.Zhang, H.Kawata
- Journal Title
  
  Surf. Sci. (in printing)
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16360017
[Journal Article] Structural study of Si(111)-6×1-Ag surface using surface x-ray diffraction2007
- Author(s)
  K.Sumitani, K.Masuzawa, T.Hoshino, R.Yoshida, S.Nakatani, T.Takahashi, H.Tajiri, K.Akimoto, H.Sugiyama, X.Zhang, H.Kawata
- Journal Title
  
  Surf. Sci. (印刷中)
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-16360017
[Journal Article] Structure of the oxidized 4H-SiC(0001)-3x3 surface2007
- Author(s)
  W.Voegeli, K.Akimoto, T.Urata, S.Nakatani, K.Sumitani, T.Takahashi, Y.Hisada, Y.Mitsuoka, S.Mukainakano, H.Sugiyama, X.Zhang, H.Kawata
- Journal Title
  
  Surf. Sci. 601
  
  Pages: 1048-1053
- Data Source
  KAKENHI-PROJECT-16360017
[Journal Article] Structure of the oxidized 4H-SiC(0001)-3 × 3 surface2007
- Author(s)
  W.Voegeli, K.Akimoto, T.Urata, S.Nakatani, K.Sumitani, T.Takahashi, Y.Hisada, Y.Mitsuoka, S.Mukainakano, H.Sugiyama, X.Zhang, H.Kawata
- Journal Title
  
  Surf. Sci. 601
  
  Pages: 1048-1053
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16360017
[Journal Article] Structural study of Si(111)-6x1-Ag surface using surface x-ray diffraction2007
- Author(s)
  K.Sumitani, K.Masuzawa, T.Hoshino, R.Yoshida, S.Nakatani, T.Takahashi, H.Tajiri, K.Akimoto, H.Sugiyama, X.Zhang, H.Kawata
- Journal Title
  
  Surf. Sci. (印刷中)
- Data Source
  KAKENHI-PROJECT-16360017
[Journal Article] Crystal orientation changes of Ag thin films on the Si(111) substrate due to tribo-assisted recrystallization2006
- Author(s)
  K.Akimoto et al.
- Journal Title
  
  Thin Solid Films 515
  
  Pages: 444-447
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16340088
[Journal Article] Crystal orientation changes of Ag thin films on the Si(111) substrate due to tribo-assisted recrystallization2006
- Author(s)
  K.Akimoto 他
- Journal Title
  
  Thin Solid Films 515
  
  Pages: 444-447
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-16340088
[Journal Article] Structure of the SiC (0001) 3x3 Reconstruction Studied by Surface X-ray Diffraction2006
- Author(s)
  W.Voegeli, K.Akimoto, T.Aoyama, K.Sumitani, S.Nakatani, H.Tajiri, T.Takahashi, Y.Hisada, S.Mukainakano, X.Zhang, H.Sugiyama, H.Kawata
- Journal Title
  
  Appl. Surf. Sci. 252
  
  Pages: 5259-5262
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16360017
[Journal Article] Crystal orientation changes of Ag thin films on the Si (111) substrate due to tribo-assisted recrystallization2006
- Author(s)
  K.Akimoto 他
- Journal Title
  
  Thin Solid Films 515
  
  Pages: 444-447
- Data Source
  KAKENHI-PROJECT-16340088
[Journal Article] Structure of the SiC (0001) 3x3 Reconstruction Studied by Surface X-ray Diffraction2006
- Author(s)
  W.Voegeli, K..Akimoto, T.Aoyama, K.Sumitani, S.Nakatani, H.Tajiri, T.Takahashi, Y.Hisada, S.Mukainakano, X.Zhang, H.Sugiyama, H.Kawata
- Journal Title
  
  Appl. Surf. Sci. 252
  
  Pages: 5259-5262
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-16360017
[Journal Article] Sample holder assembly covering a wide range of temperatures for surface X-ray diffraction2004
- Author(s)
  H.Tajiri, K.Sumitani, S.Nakatani, T.Takahashi, K.Akimoto, H.Sugiyama, X.Zhang, H.Kawata
- Journal Title
  
  Appl. Surf. Sci. 237
  
  Pages: 645-648
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-16360017
[Journal Article] Structure of the Si(113) surface studied by surface X-ray diffraction2004
- Author(s)
  Y.Mizuno, K.Akimoto, T.Aoyama, H.Suzuki, H.Nakahara, A.Ichimiya, K.Sumitani, T.Takahashi, X.W.Zhang, H.Sugiyama, H.Kawata
- Journal Title
  
  Appl. Surf. Sci. 237
  
  Pages: 40-44
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-16360017
[Journal Article] Structure of the SiC(0001) 3x3 Reconstruction Studied by Surface X-ray Diffraction
- Author(s)
  W.Voegeli, K.Akimoto, T.Aoyama, K.Sumitani, S.Nakatani, H.Tajiri, T.Takahashi, Y.Hisada, S.Mukainakano, X.Zhang, H.Sugiyama, H.Kawata
- Journal Title
  
  Appl.Surf.Sci. (in press)
- Data Source
  KAKENHI-PROJECT-16360017
[Patent] 周期表第13族金属窒化物基板2012
- Inventor(s)
  浪田秀郎,長尾哲,秋本晃一
- Industrial Property Rights Holder
  三菱化学株式会社
- Industrial Property Number
  2011-176546
- Filing Date
  2012-02-28
- Data Source
  KAKENHI-PROJECT-21560013
[Patent] 窒化物半導体結晶の測定方法、ドメインの検出方法および窒化物半導体結晶の評価方法2011
- Inventor(s)
  浪田秀郎,長尾哲,大畑達寛,内山泰宏,秋本晃一
- Industrial Property Rights Holder
  三菱化学株式会社
- Industrial Property Number
  2011-176546
- Filing Date
  2011-08-12
- Data Source
  KAKENHI-PROJECT-21560013
[Patent] 窒化物半導体結晶の測定方法、ドメインの検出方法および窒化物半導体結晶の評価方法2011
- Inventor(s)
  浪田秀郎, 長尾哲, 大畑達寛, 内山泰宏, 秋本晃一
- Industrial Property Rights Holder
  三菱化学株式会社
- Industrial Property Number
  2011-176546
- Filing Date
  2011-08-12
- Data Source
  KAKENHI-PROJECT-21560013
[Presentation] X線CTR散乱法によるGaN結晶表面の測定2018
- Author(s)
  海野由佳、北島由梨、秋本晃一
- Organizer
  日本物理学会第73回年次大会
- Data Source
  KAKENHI-PROJECT-15K04667
[Presentation] X線CTR散乱法によるGaN結晶表面の測定2017
- Author(s)
  海野由佳、安藤香代子、野口彩純、北島由梨、天貝早希、宮下遥香、秋本晃一
- Organizer
  第64回応用物理学会春季学術講演会
- Place of Presentation
  パシフィコ横浜、神奈川県横浜市
- Year and Date
  2017-03-14
- Data Source
  KAKENHI-PROJECT-15K04667
[Presentation] Characterization of GaN crystals with the X-ray topography2017
- Author(s)
  Yuko Kitano, Mizuki Shoro, Satoko Miyakawa, Koichi Akimoto
- Organizer
  Joint Symposium 2017, Ewha Womans University, Japan Women’s University and Ochanomizu University for the promotion and research for women in science
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K04667
[Presentation] X線トポグラフ法によるGaN結晶の評価2017
- Author(s)
  北野祐子、宮川理子、正露瑞季、秋本晃一
- Organizer
  第78回応用物理学会秋季学術講演会
- Data Source
  KAKENHI-PROJECT-15K04667
[Presentation] Lattice strain evaluation by using indirect X-ray reflection2017
- Author(s)
  Haruka Miyashita, Saki Amagai, Koichi Akimoto
- Organizer
  Joint Symposium 2017, Ewha Womans University, Japan Women’s University and Ochanomizu University for the promotion and research for women in science
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K04667
[Presentation] FWHM Images of the Rocking Curves by X-Ray Topography2017
- Author(s)
  Mizuki Shoro, Yuko Kitano, Satoko Miyakawa, Koichi Akimoto
- Organizer
  Joint Symposium 2017, Ewha Womans University, Japan Women’s University and Ochanomizu University for the promotion and research for women in science
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K04667
[Presentation] Analysis of the desorbed species from HVPE GaN samples2017
- Author(s)
  Yuri Kitajima, Yuka Umino, Koichi Akimoto
- Organizer
  Joint Symposium 2017, Ewha Womans University, Japan Women’s University and Ochanomizu University for the promotion and research for women in science
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K04667
[Presentation] X線の遠まわり反射によるひずみ半導体の格子ひずみ評価2017
- Author(s)
  宮下遥香、天貝早希、秋本晃一、村上達海、小椋厚志
- Organizer
  日本物理学会 2017年秋季大会
- Data Source
  KAKENHI-PROJECT-15K04667
[Presentation] X線トポグラフ法における半値幅画像の作成2017
- Author(s)
  正露瑞季、北野祐子、宮川理子、秋本晃一
- Organizer
  日本物理学会 2017年秋季大会
- Data Source
  KAKENHI-PROJECT-15K04667
[Presentation] Characterization of GaN Crystals with X-ray topography2017
- Author(s)
  Yuko Kitano, Satoko Miyakawa, Mizuki Shoro, Koichi Akimoto
- Organizer
  International Symposium on Novel Energy Nanomaterials, Catalysts and Surfaces for Future
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K04667
[Presentation] Structure and Strain of Hafnium Oxide Thin Films Studied by X-Ray Diffraction2017
- Author(s)
  Koichi Akimoto and Fumie Nishikawa
- Organizer
  Joint Symposium 2017, Ewha Womans University, Japan Women’s University and Ochanomizu University for the promotion and research for women in science
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K04667
[Presentation] X線トポグラフ法によるGaN結晶の断面試料の評価(1)2016
- Author(s)
  宮川理子、北野祐子、井上絵美子、秋本晃一
- Organizer
  第77回応用物理学会秋季学術講演会
- Place of Presentation
  朱鷺メッセ、新潟県新潟市
- Year and Date
  2016-09-13
- Data Source
  KAKENHI-PROJECT-15K04667
[Presentation] X線トポグラフ法によるGaN結晶の断面試料の評価(2)2016
- Author(s)
  北野祐子、宮川理子、井上絵美子、秋本晃一
- Organizer
  第77回応用物理学会秋季学術講演会
- Place of Presentation
  朱鷺メッセ、新潟県新潟市
- Year and Date
  2016-09-13
- Data Source
  KAKENHI-PROJECT-15K04667
[Presentation] Characterization of GaN Crystals with X-ray topography2016
- Author(s)
  Yuko Kitano, Satoko Miyakawa, Emiko Inoue, Koichi Akimoto
- Organizer
  Joint Symposium 2016, Ewha Womans University, Japan Women’s University and Ochanomizu University for the promotion and research for women in science
- Place of Presentation
  Ewha Womans University, Seoul, Korea
- Year and Date
  2016-12-06
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K04667
[Presentation] Simulation of reflection high-energy electron diffraction patterns for Gallium Nitride crystal surfaces2016
- Author(s)
  Yuka Umino, Kayoko Ando, Azumi Noguchi, Koichi Akimoto
- Organizer
  Joint Symposium 2016, Ewha Womans University, Japan Women’s Univerity and Ochanomizu University for the promotion and research for women in science University
- Place of Presentation
  Ewha Womans University, Seoul, Korea
- Year and Date
  2016-12-06
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K04667
[Presentation] Polarity Determination of GaN Thin Films by Anomalous X-Ray Diffraction2015
- Author(s)
  K. Akimoto
- Organizer
  Joint Symposium 2015, Ewha Womans University, Japan Women’s University and Ochanomizu University for the promotion and research for women in science
- Place of Presentation
  ソウル（韓国）
- Year and Date
  2015-12-08
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-25246026
[Presentation] Characterization of GaN Crystals with X-ray topography2015
- Author(s)
  Satoko Miyakawa, Emiko Inoue, Yuko Kitano, Koichi Akimoto
- Organizer
  Joint Symposium 2015, Ewha Womans University, Japan Women’s University and Ochanomizu University for the promotion and research for women in science
- Place of Presentation
  Ewha Womans University (Seoul, Korea)
- Year and Date
  2015-12-08
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K04667
[Presentation] X線トポグラフ法によるGaN結晶の欠陥評価2015
- Author(s)
  井上絵美子、野口彩純、大山美咲、渡辺玲那、秋本晃一
- Organizer
  日本物理学会第70回年次大会
- Place of Presentation
  早稲田大学（東京都新宿区）
- Year and Date
  2015-03-24
- Data Source
  KAKENHI-PROJECT-25246026
[Presentation] X線の遠まわり反射による格子ひずみ評価2015
- Author(s)
  西川史恵、平井知子、秋本晃一
- Organizer
  日本物理学会2015年秋季大会
- Place of Presentation
  関西大学千里山キャンパス（大阪）
- Year and Date
  2015-09-16
- Data Source
  KAKENHI-PROJECT-25246026
[Presentation] Polarity Determination of GaN Thin Films by Anomalous X-Ray Diffraction2015
- Author(s)
  K. Akimoto
- Organizer
  Joint Symposium 2015, Ewha Womans University, Japan Women’s University and Ochanomizu University for the promotion and research for women in science
- Place of Presentation
  Ewha Womans University (Seoul, Korea)
- Year and Date
  2015-12-08
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K04667
[Presentation] X線の遠まわり反射による格子ひずみ評価2015
- Author(s)
  西川史恵，平井知子，秋本晃一
- Organizer
  日本物理学会2015年秋季大会
- Place of Presentation
  関西大学吹田キャンパス（大阪府吹田市）
- Year and Date
  2015-09-16
- Data Source
  KAKENHI-PROJECT-15K04667
[Presentation] Quantitative Strain Analysis of Surfaces and Interfaces Using Extremely Asymmetric X-Ray Diffraction2014
- Author(s)
  K. Akimoto
- Organizer
  第3回表面界面物理に関する国際会議(PSI2014)
- Place of Presentation
  Hotel Blue Lily Resort（インド・オリッサ州・プリー）
- Invited
- Data Source
  KAKENHI-PROJECT-24560009
[Presentation] Quantitative Strain Analysis of Surfaces and Interfaces Using Extremely Asymmetric X-Ray Diffraction2014
- Author(s)
  K. Akimoto
- Organizer
  Joint Symposium 2014, Ewha Womans University, Japan Women’s University and Ochanomizu University for the promotion and research for women in science
- Place of Presentation
  ソウル（韓国）
- Year and Date
  2014-12-03
- Invited
- Data Source
  KAKENHI-PROJECT-25246026
[Presentation] Quantitative Strain Analysis of Surfaces and Interfaces Using Extremely Asymmetric X-Ray Diffraction2013
- Author(s)
  K. Akimoto, T. Emoto
- Organizer
  2013 JSAP-MRS Joint Symposia
- Place of Presentation
  同志社大学、京都
- Invited
- Data Source
  KAKENHI-PROJECT-24560009
[Presentation] X線回折法によるGaN表面近傍のひずみ評価2012
- Author(s)
  鈴木良和,持木健吾,秋本晃一,浪田秀郎,長尾哲
- Organizer
  2012年春季第59回応用物理学関係連合講演会
- Place of Presentation
  早稲田大学(東京都)
- Year and Date
  2012-03-18
- Data Source
  KAKENHI-PROJECT-21560013
[Presentation] X線回折法によるGaN表面近傍のひずみ評価(計算)2011
- Author(s)
  鈴木良和,持木健吾,秋本晃一,榎本貴志
- Organizer
  2011年秋季第72回応用物理学会学術講演会
- Place of Presentation
  山形大学(山形県)
- Year and Date
  2011-08-30
- Data Source
  KAKENHI-PROJECT-21560013
[Presentation] Strain analysis of SiC and GaN surface regions using extremely asymmetric X-ray diffraction, 11th International Conference on Atomically Controlled Surfaces2011
- Author(s)
  K. Akimoto
- Organizer
  11th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures(ACSIN11)
- Place of Presentation
  St. Petersburg(Russia)
- Year and Date
  2011-10-04
- Data Source
  KAKENHI-PROJECT-21560013
[Presentation] 極端に非対称なX線回折法による半導体表面界面の格子ひずみ解析2011
- Author(s)
  秋本晃一
- Organizer
  物質・材料研究機構
- Place of Presentation
  茨城県
- Year and Date
  2011-07-25
- Data Source
  KAKENHI-PROJECT-21560013
[Presentation] 極端に非対称なX線回折法による半導体表面界面の格子ひずみ解析2011
- Author(s)
  秋本晃一
- Organizer
  第58回応用物理学関係連合講演会
- Place of Presentation
  要旨集
- Year and Date
  2011-03-09
- Data Source
  KAKENHI-PROJECT-21560013
[Presentation] Strain analysis of SiC and GaN surface regions using extremely asymmetric X-ray diffraction2011
- Author(s)
  K.Akimoto
- Organizer
  11th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN11)
- Place of Presentation
  St.Petersburg (Russia)
- Year and Date
  2011-10-04
- Data Source
  KAKENHI-PROJECT-21560013
[Presentation] X線トポグラフ法によるGaN結晶の結晶面の傾きと面間隔の伸縮の分離2011
- Author(s)
  持木健吾,鈴木良和,秋本晃一,浪田秀郎,長尾哲
- Organizer
  2011年秋季第72回応用物理学会学術講演会
- Place of Presentation
  山形大学(山形県
- Year and Date
  2011-08-30
- Data Source
  KAKENHI-PROJECT-21560013
[Presentation] X線トポグラフ法によるGaN結晶の結晶面の傾きと面間隔の伸縮の分離2011
- Author(s)
  持木健吾, 鈴木良和, 秋本晃一, 浪田秀郎, 長尾哲
- Organizer
  2011年秋季第72回応用物理学会学術講演会
- Place of Presentation
  山形大学(山形県)
- Year and Date
  2011-08-30
- Data Source
  KAKENHI-PROJECT-21560013
[Presentation] Ag/SiO_2/Si(100)の摩擦によるひずみと配向性の変化2009
- Author(s)
  吉田樹矢, 秋本晃一, 後藤実
- Organizer
  応用物理学会2009年秋季講演会
- Place of Presentation
  富山大学
- Year and Date
  2009-09-09
- Data Source
  KAKENHI-PROJECT-19560154
[Presentation] Novel Film Growth Mechanism using Tribo-Assisted Phenomenon2009
- Author(s)
  K.Akimoto
- Organizer
  10th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures
- Place of Presentation
  グラナダ国際会議場(グラナダ、スペイン)
- Year and Date
  2009-09-22
- Data Source
  KAKENHI-PROJECT-21560013
[Presentation] Critical thickness of polycrystalline Ag layers yielding friction reduction due to tribo-assisted reorientation2009
- Author(s)
  Minoru GOTO, Koichi AKIMOTO
- Organizer
  The Sixth International Conference on Flow Dynamics(招待講演)
- Place of Presentation
  Hotel Metropolitan Sendai, Sendai(Japan)
- Year and Date
  2009-11-05
- Data Source
  KAKENHI-PROJECT-19560154
[Presentation] Novel Film Growth Method using Tribo-Assisted Phenomenon2009
- Author(s)
  Koichi AKIMOTO, Hiroaki KOBAYASHI, Tatsuya YOSHIDA, Minoru GOTO
- Organizer
  10^<th> International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures
- Place of Presentation
  Granada Conference Centre, Granada(Spain)
- Year and Date
  2009-09-22
- Data Source
  KAKENHI-PROJECT-19560154
[Presentation] Novel Film Growth Method using Tribo-Assisted Phenomenon, 10th International Conference on Atomically Controlled Surfaces2009
- Author(s)
  Koichi AKIMOTO
- Organizer
  Interfaces and Nanostructures
- Place of Presentation
  Granada Conference Centre ( Granada Spain)
- Year and Date
  2009-09-22
- Data Source
  KAKENHI-PROJECT-19560154
[Presentation] Critical thickness of tribo-assisted recrystallization in the Ag/Si system2008
- Author(s)
  K. Akimoto
- Organizer
  ISSS-5
- Place of Presentation
  早稲田大学(東京)
- Year and Date
  2008-11-13
- Data Source
  KAKENHI-PROJECT-19560154
[Presentation] X線トポグラフ法によるGaN結晶の欠陥評価
- Author(s)
  井上絵美子、野口彩純、大山美咲、渡辺玲那、秋本晃一
- Organizer
  日本物理学会第70回年次大会
- Place of Presentation
  早稲田大学（東京都新宿区）
- Year and Date
  2015-03-21 – 2015-03-24
- Data Source
  KAKENHI-PROJECT-24560009
[Presentation] GaN Lattice Distortion and Surface Structure
- Author(s)
  Azumi Noguchi, Emiko Inoue, Misaki Oyama, Rena Watanabe, Koichi Akimoto
- Organizer
  Joint Symposium 2014, Ewha Womans University, Japan Women’s University and Ochanomizu University for the promotion and research for women in science
- Place of Presentation
  Ewha Womans University, Seoul （韓国）
- Year and Date
  2014-12-02 – 2014-12-04
- Data Source
  KAKENHI-PROJECT-24560009
[Presentation] Quantitative Strain Analysis of Surfaces and Interfaces Using Extremely Asymmetric X-Ray Diffraction
- Author(s)
  Koichi Akimoto
- Organizer
  Joint Symposium 2014, Ewha Womans University, Japan Women’s University and Ochanomizu University for the promotion and research for women in science
- Place of Presentation
  Ewha Womans University, Seoul （韓国）
- Year and Date
  2014-12-02 – 2014-12-04
- Invited
- Data Source
  KAKENHI-PROJECT-24560009
[Presentation] Quantitative Strain Analysis of Surfaces and Interfaces Using Extremely Asymmetric X-Ray Diffraction
- Author(s)
  K. Akimoto
- Organizer
  3th International Conference on Physics at Surfaces and Interfaces
- Place of Presentation
  プリ（インド）
- Invited
- Data Source
  KAKENHI-PROJECT-25246026

1. GOTO Minoru (00435455)

# of Collaborated Projects: 2 results

# of Collaborated Products: 11 results
2. TAKAHASHI Toshio (20107395)

# of Collaborated Projects: 2 results

# of Collaborated Products: 10 results
3. ICHIMIYA Ayahiko (00023292)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
4. EMOTO Takashi (70314044)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
5. IWAKI Masanori (20421860)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
6. MIKI Hiroyuki (80325943)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
7. TAKENO Takanori (00451617)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
8. ITO Kosuke (40420004)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
9. SHIRASAWA Tetsuroh (80451889)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
10. HORIO Yoshimi (00238792)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
11. NAKAHARA Hitohsi (20293649)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
12. HIROSE Kazuyuki (00280553)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
13. 高橋功 (10212010)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
14. 中谷信一郎 (40198122)

# of Collaborated Projects: 1 results

# of Collaborated Products: 9 results

Akimoto Koichi 秋本 晃一

AKIMOTO Koichi 秋本 晃一

Research Projects

Research Products

Co-Researchers

Study on strain fields and surface reconstructions of GaN crystals which have microstructure in mesoscopic scale.Principal Investigator

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Analysis of precise electron density of topological insulator thin films by applying direct methods to surface X-ray diffraction

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Study on strain fields of GaN crystals which have microstructures in mesoscopic scale.Principal Investigator

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Study on the correlation between the behavior of a soft metal layer at frictional interface and its tribological properties

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Study on crystal grains of GaN which has microstructures in mesoscopic scale.Principal Investigator

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Study on structural changes of solid surfaces due to tribological interaction in sliding interfaces

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Phase transition of high-dielectric insulating films studied by extremely asymmetric X-ray diffraction and X-ray photoelectron spectroscopyPrincipal Investigator

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Study on the one-dimensional structure of metals on semiconductor surfaces and buried interfaces

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Relaxation processes of nano structures on semiconductor surfaces.

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Strain Relaxation at Semiconductor Surface Revealed by X-Ray DiffractionPrincipal Investigator

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Dynamic Processes in Atomic Level on Silicon Surfaces

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[Journal Article] Polarity Determination of GaN Thin Films by Anomalous X-Ray Diffraction2015

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[Journal Article] Determination of non-uniform graphene thickness on SiC(0001) by X-ray diffraction2013

Akimoto Koichi 秋本晃一

AKIMOTO Koichi 秋本晃一