LEE Yeonkyeon 李年慶

Researcher Number	40373104
Affiliation (based on the past Project Information) *help	2005: Ritsumeikan University, Fac. Science and Engineering, Assistant Professor, 理工学部, 助手 2004 – 2005: 立命館大学, COE推進機構, 研究員 2004: 立命館大学, COE推進機構, ポスドク研究員
Review Section/Research Field	Principal Investigator Materials/Mechanics of materials Except Principal Investigator Materials/Mechanics of materials
Keywords	Principal Investigator Atomic Force Microscope / Micro Structural Design / Cantilever / Silicon / Bending Testing / Fatigue Life / 疲労革命 / マイクロ構造設計 / カンチレバー / シリコン / 原子間力顕微鏡 / 曲げ試験 / 疲労寿命 … More Except Principal Investigator … More FIB-CVD / NEMS / MEMS / Young's Modulus / Tensile Test / Carbon nanowire / ピエゾ抵抗 / 単結晶シリコン / ナノワイヤ / ヤング率 / 引張試験 / カーボンナノワイヤ Less

Mechanical And Electrical Characterization for Piezo-resistive Nanowires Using MEMS/NEMS Technology
- Principal Investigator
  
  ISONO Yoshiatda
- Project Period (FY)
  2004 – 2006
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Ritsumeikan University
Development of Elevated Temperature Fatigue Testing Technique for Micro Components used in Micro Power Generating SystemsPrincipal Investigator
- Principal Investigator
  
  LEE Yeonkyeon
- Project Period (FY)
  2004 – 2005
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Ritsumeikan University

All 2005

All Journal Article

[Journal Article] Mechanical Characterization of Single Crystal Silicon and UV-LIGA Nickel Thin Films Using Tensile Tester Operated in AFM2005
- Author(s)
  Yeonkyeong Lee, Tada Junichi, Yoshitada Isono
- Journal Title
  
  Fatigue and Fracture of Engineering Materials and Structures (Blackwell Publishing) Vol.28
  
  Pages: 675-686
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16560086
[Journal Article] Mechanical Characterization of Single Crystal Silicon and UV-LIGA Nickel Thin Films Using Tensile Tester Operated in AFM2005
- Author(s)
  Yeonkyeong Lee, Tada Junichi, Yoshitada Isono
- Journal Title
  
  Fatigue and Fracture of Engineering Materials and Structures (Black well Publishing) 28
  
  Pages: 675-686
- Data Source
  KAKENHI-PROJECT-16560086
[Journal Article] Mechanical Characterization of Single Crystal Silicon and UV-LIGA Nickel Thin Films Using Tensile Tester operated in AFM2005
- Author(s)
  Yeonkyeong Lee, Tada Junichi, Yoshitada Isono
- Journal Title
  
  Fatigue and Fracture of Engineering Materials and Structures, Blackwell Publishing 28
  
  Pages: 675-686
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-16560086

1. ISONO Yoshiatda (20257819)

# of Collaborated Projects: 2 results

# of Collaborated Products: 3 results
2. SUGIYAMA Susumu (20278493)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
3. TORIYAMA Toshiyuki (30227681)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

LEE Yeonkyeon 李年慶

Research Projects

Research Products

Co-Researchers

Mechanical And Electrical Characterization for Piezo-resistive Nanowires Using MEMS/NEMS Technology

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Development of Elevated Temperature Fatigue Testing Technique for Micro Components used in Micro Power Generating SystemsPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Journal Article] Mechanical Characterization of Single Crystal Silicon and UV-LIGA Nickel Thin Films Using Tensile Tester Operated in AFM2005

Author(s)

Journal Title

Description

Data Source

[Journal Article] Mechanical Characterization of Single Crystal Silicon and UV-LIGA Nickel Thin Films Using Tensile Tester Operated in AFM2005

Author(s)

Journal Title

Data Source

[Journal Article] Mechanical Characterization of Single Crystal Silicon and UV-LIGA Nickel Thin Films Using Tensile Tester operated in AFM2005

Author(s)

Journal Title

Description

Data Source

LEE Yeonkyeon 李 年慶

Research Projects

Research Products

Co-Researchers

Mechanical And Electrical Characterization for Piezo-resistive Nanowires Using MEMS/NEMS Technology

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Development of Elevated Temperature Fatigue Testing Technique for Micro Components used in Micro Power Generating SystemsPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Journal Article] Mechanical Characterization of Single Crystal Silicon and UV-LIGA Nickel Thin Films Using Tensile Tester Operated in AFM2005

Author(s)

Journal Title

Description

Data Source

[Journal Article] Mechanical Characterization of Single Crystal Silicon and UV-LIGA Nickel Thin Films Using Tensile Tester Operated in AFM2005

Author(s)

Journal Title

Data Source

[Journal Article] Mechanical Characterization of Single Crystal Silicon and UV-LIGA Nickel Thin Films Using Tensile Tester operated in AFM2005

Author(s)

Journal Title

Description

Data Source

LEE Yeonkyeon 李年慶