Kuroda Rihito 黒田理人

… Alternative Names

KURODA Rihito 黒田理人

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Researcher Number	40581294
Other IDs
Affiliation (Current)	2025: 東北大学, 未来科学技術共同研究センター, 教授
Affiliation (based on the past Project Information) *help	2021 – 2024: 東北大学, 未来科学技術共同研究センター, 教授 2016 – 2021: 東北大学, 工学研究科, 准教授 2014 – 2015: 東北大学, 工学(系)研究科(研究院), 准教授 2014: 東北大学, 大学院工学研究科, 准教授 2010 – 2011: 東北大学, 大学院・工学研究科, 助教
Review Section/Research Field	Principal Investigator Electron device/Electronic equipment Except Principal Investigator Electron device/Electronic equipment / Medium-sized Section 39:Agricultural and environmental biology and related fields / Basic Section 21060:Electron device and electronic equipment-related
Keywords	Principal Investigator 電子デバイス・機器 / 吸光イメージング / 撮像素子 / センシングデバイス / ランダムテレグラフノイズ / 原子レベル平坦化 / ランダム・テレグラフ・ノイズ / しきい値ばらつき / 電子デバイス・集積回路 / 電子デバイス・電子機器 … More / MOSFET / Random Telegraph Signalノイズ / ノイズ / シリコン / CMOSイメージセンサ / Random Telegraph Noise / 1/fノイズ / MOSトランジスタ … More Except Principal Investigator 電子デバイス・機器 / トマト / 野菜 / 生理障害 / 液晶エタロン / 高感度CMOSイメージセンサ / 液晶バンドパスフィルタ / 分光イメージング / 1光子検出 / フォトンカウンティング / 撮像素子 / センシングデバイス / 平坦化 / ストレス誘起電流 / リーク電流 / シリコン / MOSFET / 電子デバイス・集積回路 Less

作物の生理障害の機構解明におけるブレークスルーテクノロジーの開発と検証
- Principal Investigator
  
  金山喜則
- Project Period (FY)
  2021 – 2025
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Review Section
  
  Medium-sized Section 39:Agricultural and environmental biology and related fields
- Research Institution
  Tohoku University
Construction of High-Sensitivity Real-Time Spectroscopic Imaging by Innovative High-Speed Spectroscopy and its Application to Non-Invasive Diagnostics
- Principal Investigator
  
  Ishinabe Takahiro
- Project Period (FY)
  2019 – 2021
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Review Section
  
  Basic Section 21060:Electron device and electronic equipment-related
- Research Institution
  Tohoku University
Establishment of innovative small light amount difference image sensor with linear response 100 million electron full well capacityPrincipal Investigator
- Principal Investigator
  
  KURODA Rihito
- Project Period (FY)
  2017 – 2019
- Research Category
  
  Grant-in-Aid for Young Scientists (A)
- Research Field
  
  Electron device/Electronic equipment
- Research Institution
  Tohoku University
Establishment of a CMOS image sensor with photon countable sensitivity, linear response and high full well capacity
- Principal Investigator
  
  Sugawa Shigetoshi
- Project Period (FY)
  2015 – 2017
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Electron device/Electronic equipment
- Research Institution
  Tohoku University
Minimization of variation and noise of electrical characteristics of MOS transistors due to atomically flat gate insulator film/Si interfacePrincipal Investigator
- Principal Investigator
  
  Kuroda Rihito
- Project Period (FY)
  2014 – 2015
- Research Category
  
  Grant-in-Aid for Young Scientists (B)
- Research Field
  
  Electron device/Electronic equipment
- Research Institution
  Tohoku University
Accurate measurement and statistical analysis of gate leakage current of MOSFETs with atomically flat interface
- Principal Investigator
  
  SUGAWA Shigetoshi
- Project Period (FY)
  2012 – 2014
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Electron device/Electronic equipment
- Research Institution
  Tohoku University
Device Structure Optimization of MOS Transistors for Reduction of Low Frequency NoisePrincipal Investigator
- Principal Investigator
  
  KURODA Rihito
- Project Period (FY)
  2010 – 2011
- Research Category
  
  Grant-in-Aid for Research Activity Start-up
- Research Field
  
  Electron device/Electronic equipment
- Research Institution
  Tohoku University

All 2022 2020 2019 2018 2017 2016 2015 2014 2013 2012 2011 2010 Other

All Journal Article Presentation Book Patent

[Book] 2020版薄膜作製応用ハンドブック第2章第6節イメージセンサ2020
- Author(s)
  權田　俊一、近藤　高志、田畑　仁、小口　多美夫、中村　浩次、勝本　信吾、大見　俊一郎、工藤　聡也、神野　伊策、喜久田　寿郎、宮﨑　照宣、久保田　均、湯浅　新治、桜庭　裕弥、矢口　裕之、市野　邦男、山田　実、内田　裕久、井上　光輝、黒田　理人、他
- Total Pages
  8
- Publisher
  エヌ・ティー・エス
- ISBN
- Data Source
  KAKENHI-PROJECT-17H04921
[Book] 車載センシング技術の開発と ADAS、自動運転システムへの応用　第2章第1節 CMOSイメージセンサの広ダイナミックレンジ化技術2017
- Author(s)
  黒田理人
- Total Pages
  17
- Publisher
  技術情報協会
- ISBN
  9784861046582
- Data Source
  KAKENHI-PROJECT-17H04921
[Book] The Micro-World Observed by Ultra High-Speed Cameras: We See What You Don’t See, Part III Cameras with CCD/CMOS Sensors, Cameras with on-chip memory CMOS image sensors2017
- Author(s)
  Rihito Kuroda, Shigetoshi Sugawa
- Total Pages
  22
- Publisher
  Springer International Publishing
- ISBN
  9783319614908
- Data Source
  KAKENHI-PROJECT-17H04921
[Book] The Micro-World Observed by Ultra High-Speed Cameras: We See What You Don’t See, Part III Cameras with CCD/CMOS Sensors, Cameras with on-chip memory CMOS image sensors2017
- Author(s)
  Rihito Kuroda, Shigetoshi Sugawa
- Total Pages
  22
- Publisher
  Springer International Publishing
- ISBN
  9783319614908
- Data Source
  KAKENHI-PROJECT-15H02245
[Book] 光アライアンス2017年12月号　三次元積層を用いた先進CMOSイメージセンサ技術2017
- Author(s)
  黒田理人
- Total Pages
  5
- Publisher
  日本工業出版
- Data Source
  KAKENHI-PROJECT-15H02245
[Book] 光アライアンス2017年12月号　三次元積層を用いた先進CMOSイメージセンサ技術2017
- Author(s)
  黒田理人
- Total Pages
  5
- Publisher
  日本工業出版
- Data Source
  KAKENHI-PROJECT-17H04921
[Book] 車載センシング技術の開発と ADAS、自動運転システムへの応用　第2章第1節 CMOSイメージセンサの広ダイナミックレンジ化技術2017
- Author(s)
  黒田理人
- Total Pages
  17
- Publisher
  技術情報協会
- ISBN
  9784861046582
- Data Source
  KAKENHI-PROJECT-15H02245
[Journal Article] A High Near-Infrared Sensitivity Over 70-dB SNR CMOS Image Sensor With Lateral Overflow Integration Trench Capacitor2020
- Author(s)
  Maasa Murata, Rihito Kuroda, Yasuyuki Fujihara, Yusuke Otsuka, Hiroshi Shibata, Taku Shibaguchi, Yutaka Kamata, Noriyuki Miura, Naoya Kuriyama, Shigetoshi Sugawa
- Journal Title
  
  IEEE TRANSACTIONS ON ELECTRON DEVICES
  
  Volume: 67 Issue: 4 Pages: 1653-1659
- DOI
  10.1109/ted.2020.2975602
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-17H04921, KAKENHI-PROJECT-18J20657
[Journal Article] Over 100 Million Frames per Second 368 Frames Global Shutter Burst CMOS Image Sensor with Pixel-wise Trench Capacitor Memory Array2020
- Author(s)
  Manabu Suzuki, Yuki Sugama, Rihito Kuroda and Shigetoshi Sugawa
- Journal Title
  
  Sensors
  
  Volume: 20 Issue: 4 Pages: 1086-1086
- DOI
  10.3390/s20041086
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-17H04921, KAKENHI-PROJECT-19J11127
[Journal Article] An Optical Filter-Less CMOS Image Sensor with Differential Spectral Response Pixels for Simultaneous UV-Selective and Visible Imaging2020
- Author(s)
  Yhang Ricardo Sipauba Carvalho da Silva, Rihito Kuroda and Shigetoshi Sugawa
- Journal Title
  
  Sensors
  
  Volume: 20 Issue: 1 Pages: 13-13
- DOI
  10.3390/s20010013
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-17H04921
[Journal Article] A CMOS image sensor with dual pixel reset voltage for high accuracy ultraviolet light absorption spectral imaging2019
- Author(s)
  Yusuke Aoyagi, Yasuyuki Fujihara, Maasa Murata, Hiroya Shike, Rihito Kuroda, Shigetoshi Sugawa
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 58 Issue: SB Pages: SBBL03-SBBL03
- DOI
  10.7567/1347-4065/aaffc1
- NAID
  210000135422
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17H04921
[Journal Article] A high-sensitivity compact gas concentration sensor using ultraviolet light absorption with a heating function for a high-precision trimethyl aluminum gas supply system2019
- Author(s)
  Hidekazu Ishii, Masaaki Nagase, Nobukazu Ikeda, Yoshinobu Shiba, Yasuyuki Shirai, Rihito Kuroda, and Shigetoshi Sugawa
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 58 Issue: SB Pages: SBBL04-SBBL04
- DOI
  10.7567/1347-4065/aafe69
- NAID
  210000135401
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17H04921
[Journal Article] Over 100 million frames per second high speed global shutter CMOS image sensor2019
- Author(s)
  R. Kuroda, M. Suzuki, S. Sugawa
- Journal Title
  
  Proceedings of SPIE
  
  Volume: 11051 Pages: 12-12
- DOI
  10.1117/12.2524492
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17H04921
[Journal Article] A Highly Robust Silicon Ultraviolet Selective Radiation Sensor Using Differential Spectral Response Method2019
- Author(s)
  Yhang Ricardo Sipauba Carvalho da Silva, Rihito Kuroda and Shigetoshi Sugawa
- Journal Title
  
  Sensors
  
  Volume: 19 Issue: 12 Pages: 2755-2755
- DOI
  10.3390/s19122755
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-17H04921
[Journal Article] High Speed and Narrow-Bandpass Liquid Crystal Filter for Real-Time Multi Spectral Imaging Systems2018
- Author(s)
  Kohei Terashima, Kazuhiro Wako, Yasuyuki Fujihara, Yusuke Aoyagi, Maasa Murata, Yosei Shibata, Shigetoshi Sugawa, Takahiro Ishinabe, Rihito Kuroda, Hideo Fujikake
- Journal Title
  
  IEICE Trans. Electron.
  
  Volume: E101.C Issue: 11 Pages: 897-900
- DOI
  10.1587/transele.E101.C.897
- ISSN
  0916-8524, 1745-1353
- Year and Date
  2018-11-01
- Language
  English
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17H04921
[Journal Article] Statistical Analysis of Threshold Voltage Variation Using MOSFETs With Asymmetric Source and Drain2018
- Author(s)
  Shinya Ichino, Akinobu Teramoto, Rihito Kuroda, Takezo Mawaki, Tomoyuki Suwa, Shigetoshi Sugawa
- Journal Title
  
  IEEE Electron Device Letters
  
  Volume: 39 Issue: 12 Pages: 1836-1839
- DOI
  10.1109/led.2018.2874012
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17H04921
[Journal Article] [Papers] Statistical Analyses of Random Telegraph Noise in Pixel Source Follower with Various Gate Shapes in CMOS Image Sensor2018
- Author(s)
  Rihito Kuroda, Akinobu Teramoto and Shigetoshi Sugawa
- Journal Title
  
  ITE Transactions on Media Technology and Applications
  
  Volume: 6 Issue: 3 Pages: 163-170
- DOI
  10.3169/mta.6.163
- NAID
  130007387394
- ISSN
  2186-7364
- Language
  English
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-17H04921
[Journal Article] Effect of drain current on appearance probability and amplitude of random telegraph noise in low-noise CMOS image sensors2018
- Author(s)
  Ichino S.、Mawaki T.、Teramoto A.、Kuroda R.、Rark H.、Wakshima S.、Goto T.、Suwa T.、Sugawa S.
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 57 Issue: 4S Pages: 04FF08-04FF08
- DOI
  10.7567/jjap.57.04ff08
- NAID
  210000148922
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-15H02245, KAKENHI-PROJECT-17H04921
[Journal Article] [Papers] A Multi Spectral Imaging System with a 71dB SNR 190-1100 nm CMOS Image Sensor and an Electrically Tunable Multi Bandpass Filter2018
- Author(s)
  Yasuyuki Fujihara, Yusuke Aoyagi, Maasa Murata, Satoshi Nasuno, Shunichi Wakashima, Rihito Kuroda, Kohei Terashima, Takahiro Ishinabe, Hideo Fujikake, Kazuhiro Wako and Shigetoshi Sugawa
- Journal Title
  
  ITE Transactions on Media Technology and Applications
  
  Volume: 6 Issue: 3 Pages: 187-194
- DOI
  10.3169/mta.6.187
- NAID
  130007387396
- ISSN
  2186-7364
- Language
  English
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-17H04921, KAKENHI-PROJECT-18J20657
[Journal Article] Experimental investigation of localized stress-induced leakage current distribution in gate dielectrics using array test circuit2018
- Author(s)
  Park H.、Teramoto A.、Kuroda R.、Suwa T.、Sugawa S.
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 57 Issue: 4S Pages: 04FE11-04FE11
- DOI
  10.7567/jjap.57.04fe11
- NAID
  210000148908
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-15H02245, KAKENHI-PROJECT-17H04921
[Journal Article] A high sensitivity 20Mfps CMOS image sensor with readout speed of 1Tpixel/sec for visualization of ultra-high speed phenomena2017
- Author(s)
  Rihito Kuroda, Shigetoshi Sugawa
- Journal Title
  
  Proceedings of SPIE
  
  Volume: 10328 Pages: 1032802-1032802
- DOI
  10.1117/12.2270787
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-15H02245, KAKENHI-PROJECT-17H04921
[Journal Article] Formation technology of flat surface with epitaxial growth on ion-implanted (100)-oriented Si surface of thin silicon-on-insulator2017
- Author(s)
  Furukawa K.、Teramoto A.、Kuroda R.、Suwa T.、Hashimoto K.、Sugawa S.、Suzuki D.、Chiba Y.、Ishii K.、Shimizu A.、Hasebe K.
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 56 Issue: 10 Pages: 105503-105503
- DOI
  10.7567/jjap.56.105503
- NAID
  210000148334
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-15H02245, KAKENHI-PROJECT-17H04921
[Journal Article] Hole-Trapping Process at Al2O3/GaN Interface Formed by Atomic Layer Deposition2017
- Author(s)
  Teramoto A.、Saito M.、Suwa T.、Narita T.、Kuroda R.、Sugawa S.
- Journal Title
  
  IEEE Electron Device Letters
  
  Volume: 38 Issue: 9 Pages: 1309-1312
- DOI
  10.1109/led.2017.2734914
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17H04921
[Journal Article] Analysis and reduction of leakage current of 2 kV monolithic isolator with wide trench spiral isolation structure2016
- Author(s)
  Yusuke Takeuchi, Rihito Kuroda and Shigetoshi Sugawa
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 55 Issue: 4S Pages: 04EF07-04EF07
- DOI
  10.7567/jjap.55.04ef07
- NAID
  210000146330
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26820121, KAKENHI-PROJECT-15H02245
[Journal Article] [Paper] A CMOS Image Sensor with 240 μV/e<sup>–</sup> Conversion Gain, 200 ke<sup>–</sup> Full Well Capacity, 190-1000 nm Spectral Response and High Robustness to UV light2016
- Author(s)
  Satoshi Nasuno, Shunichi Wakashima, Fumiaki Kusuhara, Rihito Kuroda, Shigetoshi Sugawa
- Journal Title
  
  ITE Transactions on Media Technology and Applications
  
  Volume: 4 Issue: 2 Pages: 116-122
- DOI
  10.3169/mta.4.116
- NAID
  130005142728
- ISSN
  2186-7364
- Language
  English
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-26820121, KAKENHI-PROJECT-15H02245
[Journal Article] [Paper] A High Quantum Efficiency High Readout Speed 1024 Pixel Ultraviolet-Visible-Near Infrared Waveband Photodiode Array2016
- Author(s)
  Rihito Kuroda, Takahiro Akutsu, Yasumasa Koda, Kenji Takubo, Hideki Tominaga, Ryuta Hirose, Tomohiro Karasawa, Shigetoshi Sugawa
- Journal Title
  
  ITE Transactions on Media Technology and Applications
  
  Volume: 4 Issue: 2 Pages: 109-115
- DOI
  10.3169/mta.4.109
- NAID
  130005142727
- ISSN
  2186-7364
- Language
  English
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-26820121, KAKENHI-PROJECT-15H02245
[Journal Article] Introduction of Atomically Flattening of Si Surface to Large-Scale Integration Process Employing Shallow Trench Isolation2016
- Author(s)
  Tetsuya Goto, Rihito Kuroda, Naoya Akagawa, Tomoyuki Suwa, Akinobu Teramoto, Xiang Li, Toshiki Obara, Daiki Kimoto, Shigetoshi Sugawa, Yutaka Kamata, Yuki Kumagai, and Katsuhiko Shibusawa
- Journal Title
  
  ECS Journal of Solid State Science and Technology
  
  Volume: 5 Issue: 2 Pages: P67-P72
- DOI
  10.1149/2.0221602jss
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-15H02245, KAKENHI-PROJECT-26820121
[Journal Article] [Paper] A 20Mfps Global Shutter CMOS Image Sensor with Improved Light Sensitivity and Power Consumption Performances2016
- Author(s)
  Rihito Kuroda, Yasuhisa Tochigi, Ken Miyauchi, Tohru Takeda, Hidetake Sugo, Fan Shao, Shigetoshi Sugawa
- Journal Title
  
  ITE Transactions on Media Technology and Applications
  
  Volume: 4 Issue: 2 Pages: 149-154
- DOI
  10.3169/mta.4.149
- NAID
  130005142726
- ISSN
  2186-7364
- Language
  English
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-26820121, KAKENHI-PROJECT-15H02245
[Journal Article] [Paper] Analysis and Reduction Technologies of Floating Diffusion Capacitance in CMOS Image Sensor for Photon-Countable Sensitivity2016
- Author(s)
  Fumiaki Kusuhara, Shunichi Wakashima, Satoshi Nasuno, Rihito Kuroda, Shigetoshi Sugawa
- Journal Title
  
  ITE Transactions on Media Technology and Applications
  
  Volume: 4 Issue: 2 Pages: 91-98
- DOI
  10.3169/mta.4.91
- NAID
  130005142720
- ISSN
  2186-7364
- Language
  English
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-26820121, KAKENHI-PROJECT-15H02245
[Journal Article] [Paper] Floating Capacitor Load Readout Operation for Small, Low Power Consumption and High S/N Ratio CMOS Image Sensors2016
- Author(s)
  Shunichi Wakashima, Fumiaki Kusuhara, Rihito Kuroda, Shigetoshi Sugawa
- Journal Title
  
  ITE Transactions on Media Technology and Applications
  
  Volume: 4 Issue: 2 Pages: 99-108
- DOI
  10.3169/mta.4.99
- NAID
  130005142719
- ISSN
  2186-7364
- Language
  English
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-26820121, KAKENHI-PROJECT-15H02245
[Journal Article] Low Temperature Atomically Flattening of Si Surface of Shallow Trench Isolation Pattern2015
- Author(s)
  T. Goto, R. Kuroda, T. Suwa, A. Teramoto, N. Akagawa, D. Kimoto, S. Sugawa, T. Ohmi, Y. Kamata, Y. Kumagai, and K. Shibusawa
- Journal Title
  
  ECS Transactions
  
  Volume: 66 Issue: 5 Pages: 285-292
- DOI
  10.1149/06605.0285ecst
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-15H02245, KAKENHI-PROJECT-26820121
[Journal Article] Analysis of breakdown voltage of area surrounded by multiple trench gaps in 4 kV monolithic isolator for communication network interface2015
- Author(s)
  Yusuke Takeuchi, Rihito Kuroda and Shigetoshi Sugawa
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 54 Issue: 4S Pages: 04DB01-04DB01
- DOI
  10.7567/jjap.54.04db01
- NAID
  210000144957
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24360129
[Journal Article] Effect of Process Temperature of Al2O3 Atomic Layer Deposition Using Accurate Process Gasses Supply System2015
- Author(s)
  H. Sugita, Y. Koda, T. Suwa, R. Kuroda, T. Goto, H. Ishii, S. Yamashita, A. Teramoto, S. Sugawa, and T. Ohmi
- Journal Title
  
  ECS Transactions
  
  Volume: 66 Issue: 4 Pages: 305-314
- DOI
  10.1149/06604.0305ecst
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-15H02245, KAKENHI-PROJECT-26820121
[Journal Article] Atomically flattening of Si surface of silicon on insulator and isolation-patterned wafers2015
- Author(s)
  Tetsuya Goto, Rihito Kuroda, Naoya Akagawa, Tomoyuki Suwa, Akinobu Teramoto, Xiang Li, Toshiki Obara, Daiki Kimoto, Shigetoshi Sugawa, Tadahiro Ohmi, Yutaka Kamata, Yuki Kumagai, and Katsuhiko Shibusawa
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 54 Issue: 4S Pages: 04DA04-04DA04
- DOI
  10.7567/jjap.54.04da04
- NAID
  210000144951
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22000010, KAKENHI-PROJECT-24360129, KAKENHI-PROJECT-26820121
[Journal Article] Analysis of breakdown voltage of area surrounded by multiple trench gaps in 4 kV monolithic isolator for communication network interface2015
- Author(s)
  Yusuke Takeuchi, Rihito Kuroda and Shigetoshi Sugawa
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 54
- NAID
  210000144957
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26820121
[Journal Article] Measurement and Analysis of Seismic Response in Semiconductor Manufacturing Equipment2015
- Author(s)
  Kaori Komoda, Masashi Sakuma, Masakazu Yata, Yoshio Yamazaki, Fuminobu Imaizumi, Rihito Kuroda and Shigetoshi Sugawa
- Journal Title
  
  IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
  
  Volume: 28 Issue: 3 Pages: 289-296
- DOI
  10.1109/tsm.2015.2427807
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-15H02245, KAKENHI-PROJECT-26820121
[Journal Article] Si image sensors with wide spectral response and high robustness to ultraviolet light exposure2014
- Author(s)
  Rihito Kuroda and Shigetoshi Sugawa
- Journal Title
  
  IEICE Electron. Express
  
  Volume: 11 Issue: 10 Pages: 20142004-20142004
- DOI
  10.1587/elex.11.20142004
- NAID
  130004725750
- ISSN
  1349-2543
- Language
  English
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24360129, KAKENHI-PROJECT-26820121
[Journal Article] High Selectivity in Dry Etching of Silicon Nitride over Si Using a Novel Hydrofluorocarbon Etch Gas in a Microwave Excited Plasma for FinFET2014
- Author(s)
  Y. Nakao, T. Matsuo, A. Teramoto, H. Utsumi, K. Hashimoto, R. Kuroda, Y. Shirai, S. Sugawa, and T. Ohmi
- Journal Title
  
  ECS Transactions
  
  Volume: 61 Issue: 3 Pages: 29-37
- DOI
  10.1149/06103.0029ecst
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24360129, KAKENHI-PROJECT-26820121
[Journal Article] Stress induced leakage current generated by hot-hole injection2013
- Author(s)
  Akinobu Teramoto, Hyeonwoo Park, Takuya Inatsuka, Rihito Kuroda, Shigetoshi Sugawa, Tadahiro Ohmi
- Journal Title
  
  Microelectronic Engineering
  
  Volume: 109 Pages: 298-301
- DOI
  10.1016/j.mee.2013.03.116
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24360129
[Journal Article] On the Interface Flattening Effect and Gate Insulator Breakdown Characteristic of Radical Reaction Based Insulator Formation Technology2012
- Author(s)
  R. Kuroda, A. Teramoto, X. Li, T. Suwa, S. Sugawa, and T. Ohmi
- Journal Title
  
  Jpn. J. Appl. Phys.
  
  Volume: 51
- NAID
  210000140192
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22860004
[Journal Article] On the Interface Flattening Effect and Gate Insulator Breakdown Characteristic of Radical Reaction Based Insulator Formation Technology2012
- Author(s)
  Rihito Kuroda
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 51 Issue: 2S Pages: 02BA01-02BA01
- DOI
  10.1143/jjap.51.02ba01
- NAID
  210000140192
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22860004
[Journal Article] Recovery Characteristics of Anomalous Stress-Induced Leakage Current of 5. 6 nm Oxide Films2012
- Author(s)
  T. Inatsuka, Y. Kumagai, R. Kuroda, A. Teramoto, S. Sugawa and T. Ohmi
- Journal Title
  
  Jpn. J. Appl. Phys.
  
  Volume: 51
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22860004
[Journal Article] A Test Circuit for Statistical Evaluation of p-n Junction Leakage Current and Its Noise2012
- Author(s)
  K. Abe, T. Fujisawa, H. Suzuki, S. Watabe, R. Kuroda, S. Sugawa, A. Teramoto and T. Ohmi
- Journal Title
  
  IEEE Trans. Semicond. Manuf.
  
  Volume: (印刷中)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22860004
[Journal Article] Different Properties of Erbium Silicides on Si(100)and Si(551)Orientation Surfaces2011
- Author(s)
  H. Tanaka, A. Teramoto, R. Kuroda, Y. Nakao, T. Suwa, K. Kawase, S. Sugawa and T. Ohmi
- Journal Title
  
  ECS Trans.
  
  Volume: 41 Pages: 365-373
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22860004
[Journal Article] Analysis of the Low-Frequency Noise Reduction in Si(100)Metal. Oxide. Semiconductor Field-Effect Transistors2011
- Author(s)
  P. Gaubert, A. Teramoto, R. Kuroda, Y. Nakao, H. Tanaka, S. Sugawa, and T. Ohmi
- Journal Title
  
  J. Appl. Phys.
  
  Volume: 50
- NAID
  210000070258
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22860004
[Journal Article] Impact of Channel Direction Dependent Low Field Hole Mobility on (100)Orientation Silicon Surface2011
- Author(s)
  R. Kuroda, A. Teramoto, S. Sugawa, and T. Ohmi
- Journal Title
  
  Jpn. J. Appl. Phys.
  
  Volume: 50
- NAID
  210000070260
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22860004
[Journal Article] Highly Reliable Radical SiO_2 Films on Atomically Flat Silicon Surface Formed by Low Temperature Pure Ar Annealing2011
- Author(s)
  X. Li, R. Kuroda, T. Suwa, A. Teramoto, S. Sugawa and T. Ohmi
- Journal Title
  
  Jpn. J. Appl. Phys.
  
  Volume: 50
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22860004
[Journal Article] Formation speed of atomically flat surface on Si (100)in ultra-pure argon2011
- Author(s)
  X. Li, A. Teramoto, T. Suwa, R. Kuroda, S. Sugawa, and T. Ohmi
- Journal Title
  
  Microelec. Eng.
  
  Volume: 88 Pages: 3133-3139
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22860004
[Journal Article] Impact of Channel Direction Dependent Low Field Hole Mobility on (100) Orientation Silicon Surface2011
- Author(s)
  Rihito Kuroda
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 50 Issue: 4S Pages: 04DC03-04DC03
- DOI
  10.1143/jjap.50.04dc03
- NAID
  210000070260
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22860004
[Journal Article] Gate SiO2 Film Integrity on Ultra-Pure Argon Anneal (100)Silicon Surface2011
- Author(s)
  A. Teramoto, X. Li, R. Kuroda, T. Suwa, S. Sugawa and T. Ohmi
- Journal Title
  
  ECS Trans.
  
  Volume: 41 Pages: 147-156
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22860004
[Journal Article] Evaluation for Anomalous Stress-Induced Leakage Current of Gate SiO_2 Films Using Array Test Pattern2011
- Author(s)
  Y. Kumagai, A. Teramoto, T. Inatsuka, R. Kuroda, T. Suwa, S. Sugawa and T. Ohmi
- Journal Title
  
  IEEE Trans. Electron Dev.
  
  Volume: 58 Pages: 3307-3313
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22860004
[Journal Article] Large-Scale Test Circuits for High-Speed and Highly Accurate Evaluation of Variability and Noise in Metal. Oxide. Semiconductor Field-Effect Transistor Electrical Characteristics2011
- Author(s)
  Y. Kumagai, K. Abe, T. Fujisawa, S. Watabe, R. Kuroda, N. Miyamoto, T. Suwa, A. Teramoto, S. Sugawa and T. Ohmi
- Journal Title
  
  Jpn. J. Appl. Phys.
  
  Volume: 50
- NAID
  210000071398
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22860004
[Journal Article] Impact of Work Function Optimized S/D Silicide Contact for High Current Drivability CMOS2010
- Author(s)
  Y. Yukihisa, R. Kuroda, H. Tanaka, T. Isogai, A. Teramoto, S. Sugawa, and T. Ohmi
- Journal Title
  
  ECS Trans.
  
  Volume: 28 Pages: 315-324
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22860004
[Journal Article] Atomically Flattening Technology at 850C^。 for Si(100)Surface2010
- Author(s)
  X. Li, T. Suwa, A. Teramoto, R. Kuroda, S. Sugawa, and T. Ohmi
- Journal Title
  
  ECS Trans.
  
  Volume: 28 Pages: 299-309
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22860004
[Patent] 受光デバイスおよび受光デバイスの信号読み出し方法2018
- Inventor(s)
  須川成利、黒田理人
- Industrial Property Rights Holder
  国立大学法人東北大学
- Industrial Property Rights Type
  特許
- Filing Date
  2018
- Acquisition Date
  2020
- Data Source
  KAKENHI-PROJECT-17H04921
[Patent] 光センサ及びその信号読み出し方法並びに固体撮像装置及びその信号読み出し方法2015
- Inventor(s)
  須川成利、黒田理人、若嶋駿一
- Industrial Property Rights Holder
  国立大学法人東北大学
- Industrial Property Rights Type
  特許
- Filing Date
  2015
- Acquisition Date
  2017
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] 高性能イメージセンサを用いたトマトの生理障害と品質の非破壊測定2022
- Author(s)
  青代香菜子・黒田理人・堀千秋・中山翔太・堀江駿斗・須川成利・金山喜則
- Organizer
  園芸学会
- Data Source
  KAKENHI-PROJECT-21H04721
[Presentation] イメージング・デバイスの技術動向2020
- Author(s)
  黒田理人
- Organizer
  日本学術振興会半導体界面制御技術第154委員会　第115回研究会
- Invited
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] An Over 120dB Dynamic Range Linear Response Single Exposure CMOS Image Sensor with Two-stage Lateral Overflow Integration Trench Capacitors2020
- Author(s)
  Yasuyuki Fujihara, Maasa Murata, Shota Nakayama, Rihito Kuroda, Shigetoshi Sugawa
- Organizer
  Electronic Imaging 2020, Imaging Sensors and Systems 2020
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] Resistance Measurement Platform for Statistical Analysis of Next Generation Memory Materials2019
- Author(s)
  Takeru Maeda, Yuya Omura, Akinobu Teramoto, Rihito Kuroda, Tomoyuki Suwa, and Shigetoshi Sugawa
- Organizer
  2019 IEEE International Conference on Microelectronic Test Structures
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] 高SN比吸光イメージングによる真空チャンバー内ガス濃度分布計測2019
- Author(s)
  髙橋圭吾, シパウバカルバリオダシルバイヤンギリカルド, 沼尾直毅, 黒田理人, 藤原康行, 村田真麻, 石井秀和, 森本達郎, 諏訪智之, 寺本章伸, 須川成利
- Organizer
  映像情報メディア学会技術報告・情報センシング研究会
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] SN比CMOS吸光イメージセンサによる半導体プロセスチャンバー内ガス濃度分布計測2019
- Author(s)
  髙橋圭吾，Yhang Ricardo Sipauba Carvalho da Silva，黒田理人，藤原康行，村田真麻，石井秀和，森本達郎，諏訪智之，寺本章伸，須川成利
- Organizer
  電子情報通信学会シリコン材料・デバイス研究会
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] Advanced CMOS image sensor technologies for sensing applications in the era of IoT2019
- Author(s)
  Rihito Kuroda, Shigetoshi Sugawa
- Organizer
  The Sixth Symposium on Novel Optoelectronic Detection Technology and Application
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] 広光波長帯域・広ダイナミックレンジCMOSイメージセンサ2019
- Author(s)
  黒田理人
- Organizer
  光とレーザーの科学技術フェア2019 究極を目指すイメージセンシングセミナー
- Invited
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] A VGA Optical Filter-less CMOS Image Sensor with UV-selective and Visible Light Channels by Differential Spectral Response Pixels2019
- Author(s)
  Yhang Ricardo Sipauba Carvalho da Silva, Rihito Kuroda, and Shigetoshi Sugawa
- Organizer
  2019 International Image Sensor Workshop
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] Real-time Multi-spectral Imaging System using Bluephase Liquid Crystal Fabry-Perot Tunable Filter2019
- Author(s)
  Takahiro Ishinabe, Kosuke Shinatake, Rihito Kuroda, Kazuhiro Wako, Yosei Shibata, Shigetoshi Sugawa, Hideo Fujikake
- Organizer
  PhotonIcs & Electromagnetics Research Symposium (PIERS 2019)
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19H02187
[Presentation] 先進CMOS イメージセンサ開発へ向けたRTS ノイズの計測・解析技術2019
- Author(s)
  黒田理人
- Organizer
  電子情報通信学会シリコン材料・デバイス研究会
- Invited
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] 横型オーバーフロー蓄積トレンチ容量を有する飽和電子数2430万個・近赤外高感度CMOSイメージセンサ2019
- Author(s)
  村田真麻，黒田理人，藤原康行，大塚雄介，柴田　寛，柴口　拓，鎌田　浩，三浦規之，栗山尚也，須川成利
- Organizer
  映像情報メディア学会技術報告・情報センシング研究会
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] 0.1aFの検出精度を有するCMOS近接容量イメージセンサ2019
- Author(s)
  山本将大，黒田理人，鈴木　学，後藤哲也，羽森　寛，村上真一，安田俊朗，横道やよい，須川成利
- Organizer
  映像情報メディア学会技術報告・情報センシング研究会
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] Over 100 Million Frames per Second 368 Frames Global Shutter Burst CMOS Image Sensor with In-pixel Trench Capacitor Memory Array2019
- Author(s)
  Manabu Suzuki, Rihito Kuroda, and Shigetoshi Sugawa
- Organizer
  2019 International Image Sensor Workshop
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] A 24.3Me- Full Well Capacity CMOS Image Sensor with Lateral Overflow Integration Trench Capacitor for High Precision Near Infrared Absorption Imaging2019
- Author(s)
  黒田理人
- Organizer
  電気学会「ナノエレクトロニクス基盤ヘテロ集積化・応用技術調査専門委員会」
- Invited
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] 高紫外光感度・高飽和CMOSイメージセンサを用いたサブppmオーダのオゾン水対流のイメージング2018
- Author(s)
  村田真麻, 藤原康行, 青柳雄介, 黒田理人, 須川成利
- Organizer
  映像情報メディア学会技術報告・情報センシング研究会
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] A CMOS Proximity Capacitance Image Sensor with 16μm Pixel Pitch, 0.1aF Detection Accuracy and 60 Frames Per Second2018
- Author(s)
  M. Yamamoto, R. Kuroda, M. Suzuki, T. Goto, H. Hamori, S. Murakami, T. Yasuda and S. Sugawa
- Organizer
  2018 IEEE International Electron Devices Meeting
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] Dual Pixel Reset Voltage CMOS Image Sensor For High SNR Ultraviolet Light Absorption Spectral Imaging2018
- Author(s)
  Yusuke Aoyagi, Yasuyuki Fujihara, Maasa Murata, Hiroya Shike, Rihito Kuroda, and Shigetoshi Sugawa
- Organizer
  2018 International Conference on Solid State Devices and Materials
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] High Sensitivity Compact Gas Concentration Sensor with Heating Function for High Precision Trimethyl Aluminum Gas Supply System2018
- Author(s)
  Hidekazu Ishii, Masaaki Nagase, Nobukazu Ikeda, Yoshinobu Shiba, Yasuyuki Shirai, Rihito Kuroda, and Shigetoshi Sugawa
- Organizer
  2018 International Conference on Solid State Devices and Materials
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] High-speed multi-bandpass liquid-crystal filter using dual-frequency liquid crystal for real-time spectral imaging system2018
- Author(s)
  Takahiro Ishinabe, Kohei Terashima, Kazuhiro Wako, Yasuyuki Fujihara, Yusuke Aoyagi, Maasa Murata, Satoshi Nasuno, Shunichi Wakashima, Rihito Kuroda, Yosei Shibata, Shigetoshi Sugawa, Hideo Fujikake
- Organizer
  SPIE PHOTONICS WEST 2018
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] RTS noise characterization and suppression for advanced2018
- Author(s)
  Rihito Kuroda, Shinya Ichino, Takezo Mawaki, Tomoyuki Suwa, Akinobu Teramoto, and Shigetoshi Sugawa
- Organizer
  4th International Workshop on Image Sensors and Imaging Systems
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] Effects of Process Gases and Gate TiN Electrode during the Post Deposition Anneal to ALD-Al2O3 Dielectric Film2018
- Author(s)
  Masaya Saito, Akinobu Teramoto, Tomoyuki Suwa, Kenshi Nagumo, Yoshinobu Shiba, Rihito Kuroda and Shigetoshi Sugawa
- Organizer
  American Vacuum Society 65th International Symposium & Exhibition
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] Improved Conductance Method for Interface Trap Density of ZrO2-Si interface2018
- Author(s)
  Hsin Jyun Lin, Akinobu Teramoto, Hiroshi Watanabe, Rihito Kuroda, Kota Umezawa, Kiichi Furukawa, and Shigetoshi Sugawa
- Organizer
  2018 International Conference on Solid State Devices and Materials
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] High-speed multi-bandpass liquid-crystal filter using dual-frequency liquid crystal for real-time spectral imaging system2018
- Author(s)
  Takahiro Ishinabe, Kohei Terashima, Kazuhiro Wako, Yasuyuki Fujihara, Yusuke Aoyagi, Maasa Murata, Satoshi Nasuno, Shunichi Wakashima, Rihito Kuroda, Yosei Shibata, Shigetoshi Sugawa, Hideo Fujikake
- Organizer
  SPIE PHOTONICS WEST 2018
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] 最高撮像速度5000万コマ/秒を有するプロトタイプグローバルシャッタ高速CMOSイメージセンサ2018
- Author(s)
  鈴木学, 鈴木将, 黒田理人, 須川成利
- Organizer
  映像情報メディア学会技術報告・情報センシング研究会
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] High Speed Global Shutter CMOS Image Sensors Toward Over 100Mfps2018
- Author(s)
  Rihito Kuroda, Manabu Suzuki and Shigetoshi Sugawa
- Organizer
  Ultrafast imaging and particle tracking instrumentation and methods 2018
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] ソースとドレインが非対称のMOSFETを用いた電気的特性ばらつきの統計的解析2018
- Author(s)
  市野真也, 寺本章伸, 黒田理人, 間脇武蔵, 諏訪智之, 須川成利
- Organizer
  シリコン材料・デバイス研究会
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] 紫外－可視－近赤外光帯域・高感度イメージセンサと分光イメージングへの応用展開2018
- Author(s)
  黒田理人
- Organizer
  光とレーザーの科学技術フェア2018　イメージセンサーオープンセミナー
- Invited
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] Over 100Mfps high speed global shutter CMOS image sensor2018
- Author(s)
  Rihito Kuroda, Manabu Suzuki and Shigetoshi Sugawa
- Organizer
  32nd International Congress on High-Speed Imaging and Photonics
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] バーストCDS動作を用いた撮影速度1億2500万コマ/秒の高速CMOSイメージセンサ2018
- Author(s)
  鈴木学, 黒田理人, 須川成利
- Organizer
  映像情報メディア学会技術報告・情報センシング研究会
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] A Preliminary Chip Evaluation toward Over 50Mfps Burst Global Shutter Stacked CMOS Image Sensor2018
- Author(s)
  Manabu Suzuki, Masashi Suzuki, Rihito Kuroda, Shigetoshi Sugawa
- Organizer
  IS&T International Symposium on Electronic Imaging 2018
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] 高速化・高感度化技術の今後2018
- Author(s)
  黒田理人
- Organizer
  次世代画像入力ビジョンシステム部会・映像情報メディア学会共催公開講演会『イメージセンサ３０年の進歩と更なる発展』
- Invited
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] 最高撮像速度5000万コマ/秒を有するプロトタイプグローバルシャッタ高速CMOSイメージセンサ2018
- Author(s)
  鈴木学, 鈴木将, 黒田理人, 須川成利
- Organizer
  映像情報メディア学会技術報告・情報センシング研究会
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] A Preliminary Chip Evaluation toward Over 50Mfps Burst Global Shutter Stacked CMOS Image Sensor2018
- Author(s)
  Manabu Suzuki, Masashi Suzuki, Rihito Kuroda, Shigetoshi Sugawa
- Organizer
  IS&T International Symposium on Electronic Imaging 2018
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] A 24.3Me- Full Well Capacity CMOS Image Sensor with Lateral Overflow Integration Trench Capacitor for High Precision Near Infrared Absorption Imaging2018
- Author(s)
  M. Murata, R. Kuroda, Y. Fujihara, Y. Aoyagi, H. Shibata, T. Shibaguchi, Y. Kamata, N. Miura, N. Kuriyama and S. Sugawa
- Organizer
  2018 IEEE International Electron Devices Meeting
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] 高速化・高感度化技術の今後2018
- Author(s)
  黒田理人
- Organizer
  次世代画像入力ビジョンシステム部会・映像情報メディア学会共催公開講演会『イメージセンサ３０年の進歩と更なる発展』
- Invited
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] 局所的ストレス誘起ゲートリーク電流の統計的分布の解析とSi表面平坦化工程による低減2017
- Author(s)
  朴賢雨, 黒田理人, 後藤哲也, 諏訪智之, 寺本章伸, 木本大幾, 須川成利
- Organizer
  電子情報通信学会・シリコン材料・デバイス研究会
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] 撮像速度1000万コマ/秒を超える高速度CMOSイメージセンサの高感度化・多記録枚数化2017
- Author(s)
  黒田理人
- Organizer
  次世代画像入力ビジョンシステム部会第171回定例会
- Place of Presentation
  東京理科大学森戸記念館（東京都・新宿区）
- Invited
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] Impact of Drain Current to Appearance Probability and Amplitude of Random Telegraph Noise in Low Noise CMOS Image Sensors2017
- Author(s)
  Shinya Ichino, Takezo Mawaki, Akinobu Teramoto, Rihito Kuroda, Hyeonwoo Park, Takeru Maeda, Shunichi Wakashima, Tetsuya Goto, Tomoyuki Suwa, Shigetoshi Sugawa
- Organizer
  2017 International Conference on Solid State Devices and Materials
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] 紫外吸光とチャージアンプ回路を用いた高感度・小型リアルタイムガス濃度計2017
- Author(s)
  石井秀和, 永瀬正明, 池田信一, 志波良信, 白井泰雪, 黒田理人, 須川成利
- Organizer
  電子情報通信学会・シリコン材料・デバイス研究会
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] Impact of Random Telegraph Noise with Various Time Constants and Number of States in CMOS Image Sensors2017
- Author(s)
  Rihito Kuroda, Akinobu Teramoto, Shigetoshi Sugawa
- Organizer
  2017 International Image Sensor Workshop
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] 画素SFで発生するランダムテレグラフノイズの統計的解析～トランジスタ形状・時定数・遷移数の影響～2017
- Author(s)
  黒田理人, 寺本章伸, 市野真也, 間脇武蔵, 若嶋駿一, 須川成利
- Organizer
  映像情報メディア学会技術報告・情報センシング研究会
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] Experimental Investigation of Localized Stress Induced Leakage Current Distribution in Gate Dielectrics Using Array Test Circuit2017
- Author(s)
  Hyeonwoo Park, Tomoyuki Suwa, Rihito Kuroda, Akinobu Teramoto, Shigetoshi Sugawa
- Organizer
  2017 International Conference on Solid State Devices and Materials
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] 高密度アナログメモリを搭載した超高速グローバルシャッタCMOSイメージセンサ2017
- Author(s)
  鈴木学, 鈴木将, 黒田理人, 熊谷勇喜, 千葉亮, 三浦規之, 栗山尚也, 須川成利
- Organizer
  映像情報メディア学会技術報告・情報センシング研究会
- Place of Presentation
  NHK放送技術研究所（東京都・世田谷区）
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] 局所的ストレス誘起ゲートリーク電流の統計的分布の解析とSi表面平坦化工程による低減2017
- Author(s)
  朴賢雨, 黒田理人, 後藤哲也, 諏訪智之, 寺本章伸, 木本大幾, 須川成利
- Organizer
  電子情報通信学会・シリコン材料・デバイス研究会
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] Statistical Analysis of Random Telegraph Noise in Source Follower Transistors with Various Shapes2017
- Author(s)
  Shinya Ichino, Takezo Mawaki, Shunichi Wakashima, Akinobu Teramoto, Rihito Kuroda, Phillipe Gaubert, Tetsuya Goto, Tomoyuki Suwa, Shigetoshi Sugawa
- Organizer
  2017 International Image Sensor Workshop
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] 撮像速度1000万コマ／秒を超える高速度CMOSイメージセンサ技術の進展2017
- Author(s)
  黒田理人, 鈴木学, 鈴木将, 須川成利
- Organizer
  高速度イメージングとフォトニクスに関する総合シンポジウム2017
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] Impact of SiO2/Si Interface Micro-roughness on SILC Distribution and Dielectric Breakdown: A Comparative Study with Atomically Flattened Devices2017
- Author(s)
  Hyeonwoo Park, Tetsuya Goto, Rihito Kuroda, Akinobu Teramoto, Tomoyuki Suwa, Daiki Kimoto, Shigetoshi Sugawa
- Organizer
  International Reliability Physics Symposium 2017
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] Analysis of Random Telegraph Noise Behaviors of nMOS and pMOS toward Back Bias Voltage Changing2017
- Author(s)
  Takezo Mawaki, Akinobu Teramoto, Rihito Kuroda, Shinya Ichino, Shigetoshi Sugawa
- Organizer
  2017 International Conference on Solid State Devices and Materials
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] 紫外吸光とチャージアンプ回路を用いた高感度・小型リアルタイムガス濃度計2017
- Author(s)
  石井秀和, 永瀬正明, 池田信一, 志波良信, 白井泰雪, 黒田理人, 須川成利
- Organizer
  電子情報通信学会・シリコン材料・デバイス研究会
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] SNR 70dB超のCMOSイメージセンサと半値幅10nmのチューナブルマルチバンドパスフィルタを用いた分光イメージングシステム2017
- Author(s)
  青柳雄介, 藤原康行, 村田真麻, 那須野悟史, 若嶋駿一, 黒田理人, 寺島康平, 石鍋隆宏, 藤掛英夫, 若生一広, 須川成利
- Organizer
  映像情報メディア学会技術報告・情報センシング研究会
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] Spectral Absorption Imaging with an Over 70dB SNR CMOS Image Sensor2017
- Author(s)
  Maasa Murata, Yasuyuki Fujihara, Yusuke Aoyagi, Rihito Kuroda, Shigetoshi Sugawa
- Organizer
  電気関係学会東北支部連合大会
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] Atomically flat interface for noise reduction in SOI-MOSFETs2017
- Author(s)
  Gaubert P.、Kircher A.、Park H.、Kuroda R.、Sugawa S.、Goto T.、Suwa T.、Teramoto A.
- Organizer
  2017 International Conference on Noise and Fluctuations
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] Narrow-Bandpass Liquid Crystal Filter for Real-Time Multi Spectral Imaging Systems2017
- Author(s)
  Kohei Terashima, Takahiro Ishinabe, Kazuo Wako, Yasuyuki Fujihara, Yusuke Aoyagi, Maasa Murata, Satoshi Nasuno, Shunichi Wakashima, Rihito Kuroda, Yosei Shibata, Shigetoshi Sugawa, Hideo Fujikake
- Organizer
  International Display Workshops
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] 広光波長帯域イメージセンサ技術と分光イメージングへの展開2017
- Author(s)
  黒田理人
- Organizer
  次世代画像入力ビジョンシステム部会第170回定例会「次世代イメージセンサと新技術の展開」
- Place of Presentation
  東京理科大学森戸記念館（東京都・新宿区）
- Invited
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] Impact of SiO2/Si Interface Micro-roughness on SILC Distribution and Dielectric Breakdown: A Comparative Study with Atomically Flattened Devices2017
- Author(s)
  Hyeonwoo Park, Tetsuya Goto, Rihito Kuroda, Akinobu Teramoto, Tomoyuki Suwa, Daiki Kimoto, Shigetoshi Sugawa
- Organizer
  International Reliability Physics Symposium 2017
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] Impact of Drain Current to Appearance Probability and Amplitude of Random Telegraph Noise in Low Noise CMOS Image Sensors2017
- Author(s)
  Shinya Ichino, Takezo Mawaki, Akinobu Teramoto, Rihito Kuroda, Hyeonwoo Park, Takeru Maeda, Shunichi Wakashima, Tetsuya Goto, Tomoyuki Suwa, Shigetoshi Sugawa
- Organizer
  2017 International Conference on Solid State Devices and Materials
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] Narrow-Bandpass Liquid Crystal Filter for Real-Time Multi Spectral Imaging Systems2017
- Author(s)
  Kohei Terashima, Takahiro Ishinabe, Kazuo Wako, Yasuyuki Fujihara, Yusuke Aoyagi, Maasa Murata, Satoshi Nasuno, Shunichi Wakashima, Rihito Kuroda, Yosei Shibata, Shigetoshi Sugawa, Hideo Fujikake
- Organizer
  International Display Workshops
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] Impact of Random Telegraph Noise with Various Time Constants and Number of States in CMOS Image Sensors2017
- Author(s)
  Rihito Kuroda, Akinobu Teramoto, Shigetoshi Sugawa
- Organizer
  2017 International Image Sensor Workshop
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] リアルタイム分光イメージングシステム用の高速ナローバンドパス液晶フィルタ2017
- Author(s)
  寺島康平, 石鍋隆宏, 若生一広, 藤原康行, 青柳雄介, 村田真麻, 那須野悟史, 若嶋駿一, 黒田理人, 柴田陽生, 須川成利, 藤掛英夫
- Organizer
  Optics & Photonics Japan 2017
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] 高精度アレイテスト回路計測技術を用いたソースフォロアトランジスタの動作条件変化によるランダムテレグラフノイズの挙動解析2017
- Author(s)
  市野真也, 間脇武蔵, 寺本章伸, 黒田理人, 若嶋駿一, 須川成利
- Organizer
  電子情報通信学会・シリコン材料・デバイス研究会
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] 高精度アレイテスト回路計測技術を用いたソースフォロアトランジスタの動作条件変化によるランダムテレグラフノイズの挙動解析2017
- Author(s)
  市野真也, 間脇武蔵, 寺本章伸, 黒田理人, 若嶋駿一, 須川成利
- Organizer
  電子情報通信学会・シリコン材料・デバイス研究会
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] 10Mfps 960 Frames Video Capturing Using a UHS Global Shutter CMOS Image Sensor with High Density Analog Memories2017
- Author(s)
  Manabu Suzuki, Masashi Suzuki, Rihito Kuroda, Yuki Kumagai, Akira Chiba, Noriyuki Miura, Naoya Kuriyama, Shigetoshi Sugawa
- Organizer
  2017 International Image Sensor Workshop
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] リアルタイム分光イメージングシステム用の高速ナローバンドパス液晶フィルタ2017
- Author(s)
  寺島康平, 石鍋隆宏, 若生一広, 藤原康行, 青柳雄介, 村田真麻, 那須野悟史, 若嶋駿一, 黒田理人, 柴田陽生, 須川成利, 藤掛英夫
- Organizer
  Optics & Photonics Japan 2017
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] 急峻pn接合Siダイオード技術を用いた高感度・高速性能低加速電圧電子線検出器2017
- Author(s)
  黒田理人, 幸田安真, 原昌也, 角田博之, 須川成利
- Organizer
  映像情報メディア学会技術報告・情報センシング研究会
- Place of Presentation
  NHK放送技術研究所（東京都・世田谷区）
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] SNR 70dB超のCMOSイメージセンサと半値幅10nmのチューナブルマルチバンドパスフィルタを用いた分光イメージングシステム2017
- Author(s)
  青柳雄介, 藤原康行, 村田真麻, 那須野悟史, 若嶋駿一, 黒田理人, 寺島康平, 石鍋隆宏, 藤掛英夫, 若生一広, 須川成利
- Organizer
  映像情報メディア学会技術報告・情報センシング研究会
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] Statistical Analysis of Random Telegraph Noise in Source Follower Transistors with Various Shapes2017
- Author(s)
  Shinya Ichino, Takezo Mawaki, Shunichi Wakashima, Akinobu Teramoto, Rihito Kuroda, Phillipe Gaubert, Tetsuya Goto, Tomoyuki Suwa, Shigetoshi Sugawa
- Organizer
  2017 International Image Sensor Workshop
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] A Spectral Imaging System with an Over 70dB SNR CMOS Image Sensor and Electrically Tunable 10nm FWHM Multi-Bandpass Filter2017
- Author(s)
  Yasuyuki Fujihara, Yusuke Aoyagi, Satoshi Nasuno, Shunichi Wakashima, Rihito Kuroda, Kohei Terashima, Takahiro Ishinabe, Hideo Fujikake, Kazuhiro Wako, Shigetoshi Sugawa
- Organizer
  2017 International Image Sensor Workshop
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] Atomically flat interface for noise reduction in SOI-MOSFETs2017
- Author(s)
  Gaubert P.、Kircher A.、Park H.、Kuroda R.、Sugawa S.、Goto T.、Suwa T.、Teramoto A.
- Organizer
  2017 International Conference on Noise and Fluctuations
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] Experimental Investigation of Localized Stress Induced Leakage Current Distribution in Gate Dielectrics Using Array Test Circuit2017
- Author(s)
  Hyeonwoo Park, Tomoyuki Suwa, Rihito Kuroda, Akinobu Teramoto, Shigetoshi Sugawa
- Organizer
  2017 International Conference on Solid State Devices and Materials
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] 画素SFで発生するランダムテレグラフノイズの統計的解析～トランジスタ形状・時定数・遷移数の影響～2017
- Author(s)
  黒田理人, 寺本章伸, 市野真也, 間脇武蔵, 若嶋駿一, 須川成利
- Organizer
  映像情報メディア学会技術報告・情報センシング研究会
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] 撮像速度1000万コマ／秒を超える高速度CMOSイメージセンサ技術の進展2017
- Author(s)
  黒田理人, 鈴木学, 鈴木将, 須川成利
- Organizer
  高速度イメージングとフォトニクスに関する総合シンポジウム2017
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] A Spectral Imaging System with an Over 70dB SNR CMOS Image Sensor and Electrically Tunable 10nm FWHM Multi-Bandpass Filter2017
- Author(s)
  Yasuyuki Fujihara, Yusuke Aoyagi, Satoshi Nasuno, Shunichi Wakashima, Rihito Kuroda, Kohei Terashima, Takahiro Ishinabe, Hideo Fujikake, Kazuhiro Wako, Shigetoshi Sugawa
- Organizer
  2017 International Image Sensor Workshop
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] 10Mfps 960 Frames Video Capturing Using a UHS Global Shutter CMOS Image Sensor with High Density Analog Memories2017
- Author(s)
  Manabu Suzuki, Masashi Suzuki, Rihito Kuroda, Yuki Kumagai, Akira Chiba, Noriyuki Miura, Naoya Kuriyama, Shigetoshi Sugawa
- Organizer
  2017 International Image Sensor Workshop
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H04921
[Presentation] Analysis of Random Telegraph Noise Behaviors of nMOS and pMOS toward Back Bias Voltage Changing2017
- Author(s)
  Takezo Mawaki, Akinobu Teramoto, Rihito Kuroda, Shinya Ichino, Shigetoshi Sugawa
- Organizer
  2017 International Conference on Solid State Devices and Materials
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] Spectral Absorption Imaging with an Over 70dB SNR CMOS Image Sensor2017
- Author(s)
  Maasa Murata, Yasuyuki Fujihara, Yusuke Aoyagi, Rihito Kuroda, Shigetoshi Sugawa
- Organizer
  電気関係学会東北支部連合大会
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] 画素毎の接続を有する3次元積層を用いた先進グローバルシャッタCMOSイメージセンサ技術2016
- Author(s)
  黒田理人
- Organizer
  SEMICON Japan2016 TechSTAGE・STS 先端デバイス・プロセスセッション(2)
- Place of Presentation
  東京ビッグサイト（東京都・江東区）
- Year and Date
  2016-12-14
- Invited
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] An Over 1Mfps Global Shutter CMOS Image Sensor with 480 Frame Storage Using Vertical Analog Memory Integration2016
- Author(s)
  Manabu Suzuki, Masashi Suzuki, Rihito Kuroda, Yuki Kumagai, Akira Chiba, Noriyuki Miura, Naoya Kuriyama, Shigetoshi Sugawa
- Organizer
  2016 IEEE International Electron Devices Meeting
- Place of Presentation
  San Francisco, USA
- Year and Date
  2016-12-05
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] A High Sensitivity Compact Gas Concentration Sensor using UV Light and Charge Amplifier Circuit2016
- Author(s)
  Hidekazu Ishii, Masaaki Nagase, Nobukazu Ikeda,Yoshinobu Shiba, Yasuyuki Shirai, Rihito Kuroda and Shigetoshi Sugawa
- Organizer
  IEEE Sensors 2016
- Place of Presentation
  Orlando, USA
- Year and Date
  2016-10-30
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] 190-1100 nm Waveband Multispectral Imaging System using High Light Resistance Wide Dynamic Range CMOS Image Sensor2016
- Author(s)
  Yasuyuki Fujihara, Satoshi Nasuno, Shunichi Wakashima, Yusuke Aoyagi, Rihito Kuroda and Shigetoshi Sugawa
- Organizer
  IEEE Sensors 2016
- Place of Presentation
  Orlando, USA
- Year and Date
  2016-10-30
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] CMOSイメージセンサの高速化・高感度化・広光波長帯域化技術2016
- Author(s)
  黒田理人, 須川成利
- Organizer
  第191回研究集会シリコンテクノロジー分科会ナノ・接合技術研究会「接合技術の新展開」
- Place of Presentation
  宝塚大学梅田キャンパス（大阪府・大阪市）
- Year and Date
  2016-02-28
- Invited
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] Wide dynamic range LOFIC CMOS image sensors: principle, achievements and extendibility2016
- Author(s)
  Rihito Kuroda and Shigetoshi Sugawa
- Organizer
  International Forum on Detectors for Photon Science
- Place of Presentation
  富士ビューホテル（山梨県・富士河口湖町）
- Year and Date
  2016-02-29
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] 190-1100 nm waveband multispectral imaging system using high UV-light resistance 94dB dynamic range CMOS image sensor2016
- Author(s)
  Yasuyuki Fujihara, Satoshi Nasuno, Shunichi Wakashima, Yusuke Aoyagi, Rihito Kuroda, Shigetoshi Sugawa
- Organizer
  3rd International Workshop on Image Sensors and Imaging Systems
- Place of Presentation
  東京工業大学田町キャンパス（東京都・港区）
- Year and Date
  2016-11-17
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] On-Chip Optical Filter Technology with Low Extinction Coefficient SiN for Ultraviolet-Visible-Near Infrared Light Waveband Spectral Imaging2016
- Author(s)
  Yasumasa Koda, Yhang Ricardo Sipauba Carvalho da Silva, Loic Julien, Daisuke Sawada, Tetsuya Goto, Rihito Kuroda and Shigetoshi Sugawa
- Organizer
  2016 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices
- Place of Presentation
  函館国際ホテル（北海道・函館市）
- Year and Date
  2016-07-04
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] Random Telegraph Noise Measurement and Analysis based on Arrayed Test Circuit toward High S/N CMOS Image Sensors2016
- Author(s)
  Rihito Kuroda, Akinobu Teramoto and Shigetoshi Sugawa
- Organizer
  29th IEEE International Conference on Microelectronic Test Structures
- Place of Presentation
  メルパルク横浜（神奈川県・横浜市）
- Year and Date
  2016-03-28
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] A Dead-time free global shutter stacked CMOS image sensor with in-pixel LOFIC and ADC using pixel-wise connections2016
- Author(s)
  Rihito Kuroda, Hidetake Sugo, Shunichi Wakashima, Shigetoshi Sugawa
- Organizer
  3rd International Workshop on Image Sensors and Imaging Systems
- Place of Presentation
  東京工業大学田町キャンパス（東京都・港区）
- Year and Date
  2016-11-17
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] A High Sensitivity 20Mfps CMOS Image Sensor with Readout speed of 1Tpixel/sec for Visualization of Ultra-high Speed Phenomena2016
- Author(s)
  Rihito Kuroda and Shigetoshi Sugawa
- Organizer
  The 31st International Congress on High-speed Imaging and Photonics
- Place of Presentation
  ホテル阪急エキスポパーク（大阪府・吹田市）
- Year and Date
  2016-11-07
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] Dynamic Response of Random Telegraph Noise Time Constants toward Bias Voltage Changing2016
- Author(s)
  T. Mawaki, A. Teramoto, S. Ichino, R. Kuroda, T. Goto, T. Suwa, S. Sugawa
- Organizer
  平成28年度電気関係学会東北支部連合大会
- Place of Presentation
  東北工業大学八木山キャンパス（宮城県・仙台市）
- Year and Date
  2016-08-30
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] 画素毎の接続を用いた画素内に横型オーバーフロー蓄積容量およびAD変換器を有する露光時間途切れのないグローバルシャッタ積層型CMOSイメージセンサ2016
- Author(s)
  黒田理人, 須郷秀武, 若嶋駿一, 須川成利
- Organizer
  映像情報メディア学会技術報告・情報センシング研究会
- Place of Presentation
  機会振興会館（東京都・港区）
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] CMOSイメージセンサの高速化・高感度化・広光波長帯域化技術2016
- Author(s)
  黒田理人, 須川成利
- Organizer
  第191回研究集会シリコンテクノロジー分科会ナノ・接合技術研究会「接合技術の新展開(応用物理学会シリコンテクノロジー分科会)
- Place of Presentation
  宝塚大学梅田キャンパス（大阪府・大阪市）
- Year and Date
  2016-02-27
- Invited
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] Random Telegraph Noise Measurement and Analysis based on Arrayed Test Circuit toward High S/N CMOS Image Sensors2016
- Author(s)
  Rihito Kuroda, Akinobu Teramoto and Shigetoshi Sugawa
- Organizer
  29th IEEE International Conference on Microelectronic Test Structures
- Place of Presentation
  メルパルク横浜（神奈川県・横浜市）
- Year and Date
  2016-03-28
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] A Dead-time Free Global Shutter CMOS Image Sensor with in-pixel LOFIC and ADC using Pixel-wise Connections2016
- Author(s)
  Rihito Kuroda, Hidetake Sugo, Shunichi Wakashima, and Shigetoshi Sugawa
- Organizer
  Symposium on VLSI Circuits 2016報告会
- Place of Presentation
  神戸大学・梅田インテリジェントラボラトリ（大阪府・大阪市）
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] A Dead-time Free Global Shutter CMOS Image Sensor with in-pixel LOFIC and ADC using Pixel-wise Connection2016
- Author(s)
  Hidetake Sugo, Shunichi Wakashima, Rihito Kuroda, Yuichiro Yamashita, Hirofumi Sumi, Tzu-Jui Wang, Po-Sheng Chou, Ming -Chieh Hsu and Shigetoshi Sugawa
- Organizer
  2016 Symposium on VLSI Circuits
- Place of Presentation
  Honolulu, USA
- Year and Date
  2016-06-15
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] 動作電圧変化時の過渡状態におけるランダムテレグラフノイズの挙動に関する研究2016
- Author(s)
  間脇武蔵, 寺本章伸, 黒田理人, 市野真也, 後藤哲也, 諏訪智之, 須川成利
- Organizer
  電子情報通信学会技術研究報告・シリコン材料・デバイス研究会
- Place of Presentation
  東北大学青葉山キャンパス（宮城県・仙台市）
- Year and Date
  2016-10-26
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] Wide dynamic range LOFIC CMOS image sensors: principle, achievements and extendibility2016
- Author(s)
  Rihito Kuroda and Shigetoshi Sugawa
- Organizer
  International Forum on Detectors for Photon Science
- Place of Presentation
  富士ビューホテル（山梨県・富士河口湖町）
- Year and Date
  2016-02-29
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] A 20Mfps Global Shutter CMOS Image Sensor with Improved Sensitivity and Power Consumption2015
- Author(s)
  Shigetoshi Sugawa, Rihito Kuroda, Tohru Takeda, Fan Shao, Ken Miyauchi and Yasuhisa Tochigi
- Organizer
  2015 INTERNATIONAL IMAGE SENSOR WORKSHOP
- Place of Presentation
  Vaals, Netherlands
- Year and Date
  2015-06-08
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] A CMOS Image Sensor with 240μV/e- Conversion Gain, 200ke- Full Well Capacity and 190-1000nm Spectral Response2015
- Author(s)
  Satoshi Nasuno, Shunichi Wakashima, Fumiaki Kusuhara, Rihito Kuroda, Shigetoshi Sugawa
- Organizer
  2015 INTERNATIONAL IMAGE SENSOR WORKSHOP
- Place of Presentation
  Vaals, Netherlands
- Year and Date
  2015-06-08
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] An Ultraviolet Radiation Sensor Using Differential Spectral Response of Silicon Photodiodes2015
- Author(s)
  Yhang Ricardo Sipauba Carvalho da Silva, Yasumasa Koda, Satoshi Nasuno, Rihito Kuroda, Shigetoshi Sugawa
- Organizer
  IEEE Sensors 2015
- Place of Presentation
  Busan, South Korea
- Year and Date
  2015-11-01
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] ゲート絶縁膜/Si界面の原子オーダー平坦化によるランダムテレグラフノイズ低減効果2015
- Author(s)
  黒田理人, 後藤哲也, 赤川直也, 木本大幾, 寺本章伸, 須川成利
- Organizer
  映像情報メディア学会技術報告　情報センシング研究会
- Place of Presentation
  東京理科大学森戸記念館（東京都・新宿区）
- Year and Date
  2015-05-08
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] 電荷電圧変換ゲイン240uV/e-、飽和電子数200ke-、感度波長帯域190-1000nmを有するCMOSイメージセンサ2015
- Author(s)
  那須野悟史, 若嶋駿一, 楠原史章, 黒田理人, 須川成利
- Organizer
  映像情報メディア学会技術報告　情報センシング研究会
- Place of Presentation
  機会振興会館（東京都・港区）
- Year and Date
  2015-09-18
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] A CMOS Image Sensor with 240μV/e- Conversion Gain, 200ke- Full Well Capacity and 190-1000nm Spectral Response2015
- Author(s)
  Satoshi Nasuno, Shunichi Wakashima, Fumiaki Kusuhara, Rihito Kuroda, Shigetoshi Sugawa
- Organizer
  2015 INTERNATIONAL IMAGE SENSOR WORKSHOP
- Place of Presentation
  Vaals, Netherlands
- Year and Date
  2015-06-08
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] Effect of Process Temperature of Al2O3 Atomic Layer Deposition Using Accurate Process Gasses Supply System2015
- Author(s)
  Hisaya Sugita, Yasukasa Koda, Tomoyuki Suwa, Rihito Kuroda, Tetsuya Goto, Hidekazu Ishii, Satoru Yamashita, Akinobu Teramoto, Shigetoshi Sugawa, and Tadahiro Ohmi
- Organizer
  227th Meeting of The Electrochemical Society
- Place of Presentation
  Chicago, USA
- Year and Date
  2015-05-24
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] UV/VIS/NIR imaging technologies: challenges and opportunities2015
- Author(s)
  Rihito Kuroda, Shigetoshi Sugawa
- Organizer
  2015 SPIE Sensing Technology + Applications
- Place of Presentation
  Baltimore, USA
- Year and Date
  2015-04-20
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] Analysis and Reduction of Floating Diffusion Capacitance Components of CMOS Image Sensor for Photon-Countable Sensitivity2015
- Author(s)
  Fumiaki Kusuhara, Shunichi Wakashima, Satoshi Nasuno, Rihito Kuroda and Shigetoshi Sugawa
- Organizer
  2015 INTERNATIONAL IMAGE SENSOR WORKSHOP
- Place of Presentation
  Vaals, Netherlands
- Year and Date
  2015-06-08
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] Low Temperature Atomically Flattening of Si Surface of Shallow Trench Isolation Pattern2015
- Author(s)
  Tetsuya Goto, Rihito Kuroda, Tomoyuki Suwa, Akinobu Teramoto, Naoya Akagawa, Daiki Kimoto, Shigetoshi Sugawa, Tadahiro Ohmi, Yutaka Kamata, Yuki Kumagai and Katsuhiko Shibusawa
- Organizer
  227th Meeting of The Electrochemical Society
- Place of Presentation
  Chicago, USA
- Year and Date
  2015-05-24
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] フローティングディフュージョン容量成分の解析・低減技術と高感度・高飽和CMOSイメージセンサへの適用2015
- Author(s)
  楠原史章, 若嶋駿一, 那須野悟史, 黒田理人, 須川成利
- Organizer
  映像情報メディア学会技術報告　情報センシング研究会
- Place of Presentation
  機会振興会館（東京都・港区）
- Year and Date
  2015-09-18
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] Electrical Properties of MOSFETs Introducing Atomically Flat Gate Insulator/Silicon Interface2015
- Author(s)
  Tetsuya GOTO, Rihito KURODA, Tomoyuki SUWA, Akinobu TERAMOTO, Toshiki OBARA, Daiki KIMOTO
- Organizer
  電子情報通信学会　シリコン材料・デバイス研究会
- Place of Presentation
  東北大学青葉山キャンパス（宮城県・仙台市）
- Year and Date
  2015-10-29
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] A 80% QE High Readout Speed 1024 Pixel Linear Photodiode Array for UV-VIS-NIR Spectroscopy2015
- Author(s)
  Rihito Kuroda, Takahiro Akutsu, Yasumasa Koda, Kenji Takubo, Hideki Tominaga, Ryuuta Hirose, Tomohiro Karasawa and Shigetoshi Sugawa
- Organizer
  2015 INTERNATIONAL IMAGE SENSOR WORKSHOP
- Place of Presentation
  Vaals, Netherlands
- Year and Date
  2015-06-08
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] Effect of Process Temperature of Al2O3 Atomic Layer Deposition Using Accurate Process Gasses Supply System2015
- Author(s)
  Hisaya Sugita, Yasukasa Koda, Tomoyuki Suwa, Rihito Kuroda, Tetsuya Goto, Hidekazu Ishii, Satoru Yamashita, Akinobu Teramoto, Shigetoshi Sugawa, and Tadahiro Ohmi
- Organizer
  227th Meeting of The Electrochemical Society
- Place of Presentation
  Chicago, USA
- Year and Date
  2015-05-24
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] A Linear Response Single Exposure CMOS Image Sensor with 0.5e- Readout Noise and 76ke- Full Well Capacity2015
- Author(s)
  Shunichi Wakashima, Fumiaki Kusuhara, Rihito Kuroda and Shigetoshi Sugawa
- Organizer
  2015 SYMPOSIUM ON VLSI CIRCUITS
- Place of Presentation
  リーガロイヤルホテル京都（京都府・京都市）
- Year and Date
  2015-06-15
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] Electrical Properties of MOSFETs Introducing Atomically Flat Gate Insulator/Silicon Interface2015
- Author(s)
  Tetsuya Goto, Rihito Kuroda, Tomoyuki Suwa, Akinobu Teramoto, Toshiki Obara, Daiki Kimoto, Shigetoshi Sugawa, Yutaka Kamata, Yuki Kumagai, Katsuhiko Shibusawa
- Organizer
  電子情報通信学会　シリコン材料デバイス研究会
- Place of Presentation
  東北大学青葉山キャンパス（宮城県・仙台市）
- Year and Date
  2015-10-29
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] Low Temperature Atomically Flattening of Si Surface of Shallow Trench Isolation Pattern2015
- Author(s)
  Tetsuya Goto, Rihito Kuroda, Tomoyuki Suwa, Akinobu Teramoto, Naoya Akagawa, Daiki Kimoto, Shigetoshi Sugawa, Tadahiro Ohmi, Yutaka Kamata, Yuki Kumagai and Katsuhiko Shibusawa
- Organizer
  227th Meeting of The Electrochemical Society
- Place of Presentation
  Chicago, USA
- Year and Date
  2015-05-24
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] A Linear Response Single Exposure CMOS Image Sensor with 0.5e- Readout Noise and 76ke- Full Well Capacity2015
- Author(s)
  Shunichi Wakashima, Fumiaki Kusuhara, Rihito Kuroda and Shigetoshi Sugawa
- Organizer
  2015 SYMPOSIUM ON VLSI CIRCUITS
- Place of Presentation
  リーガロイヤルホテル京都（京都府・京都市）
- Year and Date
  2015-06-15
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] Advanced CMOS Image Sensor Development2015
- Author(s)
  Rihito Kuroda
- Organizer
  Tohoku Univ. - imec Seminar 2015 Sendai Symposium on Analytical Science 2015 Joint Seminar on "Unobtrusive Sensing & Daily Health Screening"
- Place of Presentation
  東北大学青葉山キャンパス（宮城県・仙台市）
- Year and Date
  2015-11-13
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] A 80% QE High Readout Speed 1024 Pixel Linear Photodiode Array for UV-VIS-NIR Spectroscopy2015
- Author(s)
  Rihito Kuroda, Takahiro Akutsu, Yasumasa Koda, Kenji Takubo, Hideki Tominaga, Ryuuta Hirose, Tomohiro Karasawa and Shigetoshi Sugawa
- Organizer
  2015 INTERNATIONAL IMAGE SENSOR WORKSHOP
- Place of Presentation
  Vaals, Netherlands
- Year and Date
  2015-06-08
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] UV/VIS/NIR imaging technologies: challenges and opportunities2015
- Author(s)
  Rihito Kuroda, Shigetoshi Sugawa
- Organizer
  2015 SPIE Sensing Technology + Applications
- Place of Presentation
  Baltimore, USA
- Year and Date
  2015-04-20
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] Analysis and reduction of leakage current of 2kV monolithic isolator with wide trench spiral isolation structure2015
- Author(s)
  Yusuke Takeuchi, Rihito Kuroda and Shigetoshi Sugawa
- Organizer
  Extended Abstracts of the 2015 International Conference on Solid State Devices and Materials
- Place of Presentation
  札幌コンベンションセンター（北海道・札幌市）
- Year and Date
  2015-09-27
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] A 20Mfps Global Shutter CMOS Image Sensor with Improved Sensitivity and Power Consumption2015
- Author(s)
  Shigetoshi Sugawa, Rihito Kuroda, Tohru Takeda, Fan Shao, Ken Miyauchi and Yasuhisa Tochigi
- Organizer
  2015 INTERNATIONAL IMAGE SENSOR WORKSHOP
- Place of Presentation
  Vaals, Netherlands
- Year and Date
  2015-06-08
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] Analysis and reduction of leakage current of 2kV monolithic isolator with wide trench spiral isolation structure2015
- Author(s)
  Yusuke Takeuchi, Rihito Kuroda and Shigetoshi Sugawa
- Organizer
  2015 International Conference on Solid State Devices and Materials
- Place of Presentation
  札幌コンベンションセンター（北海道・札幌市）
- Year and Date
  2015-09-27
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] ゲート絶縁膜/Si界面の原子オーダー平坦化によるランダムテレグラフノイズ低減効果2015
- Author(s)
  黒田理人, 後藤哲也, 赤川直也, 木本大幾, 寺本章伸, 須川成利
- Organizer
  映像情報メディア学会技術報告　情報センシング研究会
- Place of Presentation
  東京理科大学森戸記念館（東京都・新宿区）
- Year and Date
  2015-05-08
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] An Ultraviolet Radiation Sensor Using Differential Spectral Response of Silicon Photodiodes2015
- Author(s)
  Yhang Ricardo Sipauba Carvalho da Silva, Yasumasa Koda, Satoshi Nasuno, Rihito Kuroda, Shigetoshi Sugawa
- Organizer
  IEEE Sensors 2015
- Place of Presentation
  Busan, South Korea
- Year and Date
  2015-11-01
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] フローティングディフュージョン容量成分の解析・低減技術と高感度・高飽和CMOSイメージセンサへの適用2015
- Author(s)
  楠原史章, 若嶋駿一, 那須野悟史, 黒田理人, 須川成利
- Organizer
  映像情報メディア学会技術報告　情報センシング研究会
- Place of Presentation
  機会振興会館（東京都・港区）
- Year and Date
  2015-09-18
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] Analysis and Reduction of Floating Diffusion Capacitance Components of CMOS Image Sensor for Photon-Countable Sensitivity2015
- Author(s)
  Fumiaki Kusuhara, Shunichi Wakashima, Satoshi Nasuno, Rihito Kuroda and Shigetoshi Sugawa
- Organizer
  2015 INTERNATIONAL IMAGE SENSOR WORKSHOP
- Place of Presentation
  Vaals, Netherlands
- Year and Date
  2015-06-08
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] Advanced CMOS Image Sensor Development2015
- Author(s)
  Rihito Kuroda
- Organizer
  Tohoku Univ. - imec Seminar 2015 Sendai Symposium on Analytical Science 2015 Joint Seminar on "Unobtrusive Sensing & Daily Health Screening"
- Place of Presentation
  東北大学青葉山キャンパス（宮城県・仙台市）
- Year and Date
  2015-11-13
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15H02245
[Presentation] 電荷電圧変換ゲイン240uV/e-、飽和電子数200ke-、感度波長帯域190-1000nmを有するCMOSイメージセンサ2015
- Author(s)
  那須野悟史, 若嶋駿一, 楠原史章, 黒田理人, 須川成利
- Organizer
  映像情報メディア学会技術報告　情報センシング研究会
- Place of Presentation
  機会振興会館（東京都・港区）
- Year and Date
  2015-09-18
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] Demonstrating Individual Leakage Path from RTS of SILC2014
- Author(s)
  A. Teramoto, T. Inatsuka, T. Obara, N. Akagawa, R. Kuroda, S. Sugawa and T. Ohmi
- Organizer
  2014 IEEE International Reliability Physics Symposium
- Place of Presentation
  Waikoloa, USA
- Data Source
  KAKENHI-PROJECT-24360129
[Presentation] Stress induced leakage current generated by hot-hole injection2013
- Author(s)
  A. Teramoto, H.W. Park, T. Inatsuka, R. Kuroda, S. Sugawa, T. Ohmi
- Organizer
  18th Conference of “Insulating Films on Semiconductors”
- Place of Presentation
  Krakow, Poland
- Data Source
  KAKENHI-PROJECT-24360129
[Presentation] Demonstrating Distribution of SILC Values at Individual Leakage Spots2013
- Author(s)
  Takuya Inatsuka, Rihito Kuroda, Akinobu Teramoto, Yuki Kumagai, Shigetoshi Sugawa, and Tadahiro Ohmi
- Organizer
  IEEE International Reliability Physics Symposium 2013
- Place of Presentation
  Monterey, USA
- Data Source
  KAKENHI-PROJECT-24360129
[Presentation] Impact of Injected Carrier Types to Stress Induced Leakage Current Using Substrate Hot Carrier Injection Stress2013
- Author(s)
  H. W. Park, A. Teramoto, T. Inatsuka, R. Kuroda, S. Sugawa, and T. Ohmi
- Organizer
  2013 Asia-Pacific Workshop on Fundamentals and Application of Advanced Semiconductor Devices
- Place of Presentation
  Seoul, Korea
- Data Source
  KAKENHI-PROJECT-24360129
[Presentation] A Test Circuit for Extremely Low Gate Leakage Current Measurement of 10 aA for 80, 000 MOSFETs in 80s2012
- Author(s)
  Y. Kumagai, T. Inatsuka, R. Kuroda, A. Teramoto, T. Suwa, S. Sugawa and T. Ohmi
- Organizer
  IEEE Intl. Conf. on Microelectronic Test Structures
- Place of Presentation
  San Diego, U. S. A.
- Year and Date
  2012-03-21
- Data Source
  KAKENHI-PROJECT-22860004
[Presentation] Statistical Analysis of Random Telegraph Noise Reduction Effect by Separating Channel From the Interface2012
- Author(s)
  A. Yonezawa, A. Teramoto, R. Kuroda, H. Suzuki, S. Sugawa and T. Ohmi
- Organizer
  IEEE Intl. Reliability Rhys. Symp.
- Place of Presentation
  Anaheim, U. S. A.
- Year and Date
  2012-04-18
- Data Source
  KAKENHI-PROJECT-22860004
[Presentation] Development of Direct-polish Process of CMP and Post-CMP Clean for Next Generation Advanced Cu Interconnects2011
- Author(s)
  Rihito Kuroda
- Organizer
  2011 International Conference on Planarization&CMP
- Place of Presentation
  Seoul, Korea
- Year and Date
  2011-11-09
- Data Source
  KAKENHI-PROJECT-22860004
[Presentation] Different properties of erbium silicides on Si(100)and Si(551)orientation surfaces2011
- Author(s)
  H. Tanaka, A. Teramoto, R. Kuroda, Y. Nakao, T. Suwa, S. Sugawa, and T. Ohmi
- Organizer
  220th Meeting of The Electrochemical Society
- Place of Presentation
  Boston, U. S. A.
- Year and Date
  2011-10-13
- Data Source
  KAKENHI-PROJECT-22860004
[Presentation] Highly Ultraviolet Light Sensitive and Highly Reliable Photodiode with Atomically Flat Si Surface2011
- Author(s)
  Rihito Kuroda
- Organizer
  2011 International Image Sensor Workshop
- Place of Presentation
  大沼
- Year and Date
  2011-06-08
- Data Source
  KAKENHI-PROJECT-22860004
[Presentation] ラジカル反応ベース絶縁膜形成プロセスにおける界面平坦化効果と絶縁膜破壊特性との関係2011
- Author(s)
  黒田理人
- Organizer
  電子情報通信学会シリコン材料・デバイス研究会
- Place of Presentation
  仙台
- Year and Date
  2011-10-20
- Data Source
  KAKENHI-PROJECT-22860004
[Presentation] Gate SiO2 Film Integrity on Ultra-Pure Argon Anneal (100)Silicon Surface2011
- Author(s)
  A. Teramoto, X. Li, R. Kuroda, T. Suwa, S. Sugawa, and T. Ohmi
- Organizer
  220th Meeting of The Electrochemical Society
- Place of Presentation
  Boston, U. S. A.
- Year and Date
  2011-10-10
- Data Source
  KAKENHI-PROJECT-22860004
[Presentation] 埋め込み構造によるMOSFETにおけるランダム・テレグラフ・ノイズの低減2011
- Author(s)
  鈴木裕彌, 黒田理人, 寺本章伸, 米澤秋彰浩, 松岡弘章, 中澤泰希, 阿部健一, 須川成利, 大見忠弘
- Organizer
  電子情報通信学会, シリコン材料・デバイス研究会
- Place of Presentation
  仙台
- Year and Date
  2011-10-20
- Data Source
  KAKENHI-PROJECT-22860004
[Presentation] ラジカル反応ベース絶縁膜形成プロセスにおける界面平坦化効果と絶縁膜破壊特性との関係2011
- Author(s)
  黒田理人, 寺本章伸, 李翔, 諏訪智之, 須川成利, 大見忠弘
- Organizer
  電子情報通信学会, シリコン材料・デバイス研究会
- Place of Presentation
  仙台
- Year and Date
  2011-10-20
- Data Source
  KAKENHI-PROJECT-22860004
[Presentation] デュアルシリサイドを用いた低直列抵抗CMOS ソース/ドレイン電極形成技術2011
- Author(s)
  黒田理人, 田中宏明, 中尾幸久, 寺本章伸, 宮本直人, 須川成利, 大見忠弘
- Organizer
  電気学会, 電子デバイス研究会
- Place of Presentation
  水上町
- Year and Date
  2011-03-01
- Data Source
  KAKENHI-PROJECT-22860004
[Presentation] Impact of Random Telegraph Noise Reduction with Buried Channel MOSFET2011
- Author(s)
  H. Suzuki, R. Kuroda, A. Teramoto, A. Yonezawa, S. Sugawa and T. Ohmi
- Organizer
  2011 Intl. Conf. on SOLID STATE DEVICES AND MATERIALS
- Place of Presentation
  名古屋
- Year and Date
  2011-09-29
- Data Source
  KAKENHI-PROJECT-22860004
[Presentation] High reliable SiO_2 Films on Atomically Flat Silicon Surface Formed by Low Temperature Pure Ar Annealing2011
- Author(s)
  X. Li, R. Kuroda, T. Suwa, A. Teramoto, S. Sugawa, and T. Ohmi
- Organizer
  Intl. Workshop on Dielectric Thin Films For Future Electron Devices : Science and Technology
- Place of Presentation
  東京
- Year and Date
  2011-01-20
- Data Source
  KAKENHI-PROJECT-22860004
[Presentation] 異常Stress Induced Leakage Currentの発生・回復特性の統計的評価2011
- Author(s)
  稲塚卓也, 熊谷勇喜, 黒田理人, 寺本章伸, 須川成利, 大見忠弘
- Organizer
  電子情報通信学会, シリコン材料・デバイス研究会
- Place of Presentation
  仙台
- Year and Date
  2011-10-20
- Data Source
  KAKENHI-PROJECT-22860004
[Presentation] On the Si Surface Flattening Effect and Gate Insulator Breakdown Characteristic of Radical Reaction Based Insulator Formation Technology2011
- Author(s)
  R. Kuroda, A. Teramoto, X. Li, T. Suwa, S. Sugawa and T. Ohmi
- Organizer
  2011 Intl. Conf. on SOLID STATE DEVICES AND MATERIALS
- Place of Presentation
  名古屋
- Year and Date
  2011-09-28
- Data Source
  KAKENHI-PROJECT-22860004
[Presentation] 原子レベル平坦化Si表面を用いた紫外光高感度・高信頼性フォトダイオード2011
- Author(s)
  黒田理人
- Organizer
  社団法人映像情報メディア学会情報センシング研究会
- Place of Presentation
  東京(招待講演)
- Year and Date
  2011-11-18
- Data Source
  KAKENHI-PROJECT-22860004
[Presentation] On the Si Surface Flattening Effect and Gate Insulator Breakdown Characteristic of Radical Reaction Based Insulator Formation Technology2011
- Author(s)
  Rihito Kuroda
- Organizer
  2011 International Conference on SOLID STATE DEVICES AND MATERIALS
- Place of Presentation
  名古屋
- Year and Date
  2011-09-28
- Data Source
  KAKENHI-PROJECT-22860004
[Presentation] デュアルシリサイトを用いた低直列抵抗CMOSソース/トレイン電極形成技術2011
- Author(s)
  黒田理人
- Organizer
  電気学会電子デバイス研究会
- Place of Presentation
  水上町
- Year and Date
  2011-03-01
- Data Source
  KAKENHI-PROJECT-22860004
[Presentation] Recovery Characteristic of Anomalous Stress Induced Leakage Current of 5. 6nm Oxide Films2011
- Author(s)
  T. Inatsuka, Y. Kumagai, R. Kuroda, A. Teramoto, S. Sugawa, and T. Ohmi
- Organizer
  2011 Intl. Conf. on SOLID STATE DEVICES AND MATERIALS
- Place of Presentation
  名古屋
- Year and Date
  2011-09-28
- Data Source
  KAKENHI-PROJECT-22860004
[Presentation] Impact of Channel Direction Dependent Low Field Hole Mobility on Si (100)2010
- Author(s)
  Rihito Kuroda
- Organizer
  2010 International Conference on SOLID STATE DEVICES AND MATERIALS
- Place of Presentation
  東京
- Year and Date
  2010-09-22
- Data Source
  KAKENHI-PROJECT-22860004
[Presentation] Drastic reduction of the low frequency noise in Si(100)p-MOSFETs2010
- Author(s)
  P. Gaubert, A. Teramoto, R. Kuroda, Y. Nakao, H. Tanaka and T. Ohmi
- Organizer
  2010 Intl. Conf. on SOLID STATE DEVICES AND MATERIALS
- Place of Presentation
  東京
- Year and Date
  2010-09-23
- Data Source
  KAKENHI-PROJECT-22860004
[Presentation] Large Scale Test Circuits for Systematic Evaluation of Variability and Noise of MOSFETs' Electrical Characteristics2010
- Author(s)
  Y. Kumagai, K. Abe, T. Fujisawa, S. Watabe, R. Kuroda, N. Miyamoto, T. Suwa, A. Teramoto, S. Sugawa and T. Ohmi
- Organizer
  2010 Intl. Conf. on SOLID STATE DEVICES AND MATERIALS
- Place of Presentation
  東京
- Year and Date
  2010-09-23
- Data Source
  KAKENHI-PROJECT-22860004
[Presentation] Ultra-low Series Resistance W/ErSi_2/n^+-Si and W/Pd_2Si/p^+-Si S/D Electrodes for Advanced CMOS Platform2010
- Author(s)
  Rihito Kuroda
- Organizer
  IEEE International Electron Device Meeting
- Place of Presentation
  San Francisco, U.S.A.
- Year and Date
  2010-12-08
- Data Source
  KAKENHI-PROJECT-22860004
[Presentation] Impact of Channel Direction Dependent Low Field Hole Mobility on Si(100)2010
- Author(s)
  R. Kuroda, A. Teamoto, S. Sugawa and T. Ohmi
- Organizer
  2010 Intl. Conf. on SOLID STATE DEVICES AND MATERIALS
- Place of Presentation
  東京
- Year and Date
  2010-09-23
- Data Source
  KAKENHI-PROJECT-22860004
[Presentation] Ultra-low Series Resistance W/ErSi_2/n^+-Si and W/Pd_2Si/p^+-Si S/D Electrodes for Advanced CMOS Platform2010
- Author(s)
  R. Kuroda, H. Tanaka, Y. Nakao, A. Teramoto, N. Miyamoto, S. Sugawa and T. Ohmi
- Organizer
  2010 IEEE IEEE Intl. Electron Devices Meeting
- Place of Presentation
  San Francisco, U. S. A.
- Year and Date
  2010-12-08
- Data Source
  KAKENHI-PROJECT-22860004
[Presentation] Analyzing Correlation between Multiple Traps in RTN Characteristics
- Author(s)
  Toshiki Obara, Akinobu Teramoto, Akihiro Yonezawa, Rihito Kuroda, Shigetoshi Sugawa, and Tadahiro Ohmi
- Organizer
  2014 IEEE International Reliability Physics Symposium
- Place of Presentation
  Waikoloa, USA
- Year and Date
  2014-06-03 – 2014-06-05
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] Analysis of Pixel Gain and Linearity of CMOS Image Sensor using Floating Capacitor Load Readout Operation
- Author(s)
  S. Wakashima, F. Kusuhara, R. Kuroda, S. Sugawa
- Organizer
  IS&T/SPIE Electronic Imaging
- Place of Presentation
  San Francisco, USA
- Year and Date
  2015-02-08 – 2015-02-12
- Data Source
  KAKENHI-PROJECT-24360129
[Presentation] Demonstrating Individual Leakage Path from Random Telegraph Signal of Stress Induced Leakage Current
- Author(s)
  A. Teramoto, T. Inatsuka, T. Obara, N. Akagawa, R. Kuroda, S. Sugawa and T. Ohmi
- Organizer
  2014 IEEE International Reliability Physics Symposium
- Place of Presentation
  Waikoloa, USA
- Year and Date
  2014-06-03 – 2014-06-05
- Data Source
  KAKENHI-PROJECT-24360129
[Presentation] A 20Mfps Global Shutter CMOS Image Sensor with Improved Sensitivity and Power Consumption
- Author(s)
  Shigetoshi Sugawa, Rihito Kuroda, Tohru Takeda, Fan Shao, Ken Miyauchi and Yasuhisa Tochigi
- Organizer
  International Image Sensor Workshop 2015
- Place of Presentation
  Vaals, Netherlands
- Year and Date
  2015-06-08 – 2015-06-11
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] A 80% QE High Readout Speed 1024 Pixel Linear Photodiode Array for UV-VIS-NIR Spectroscopy
- Author(s)
  Rihito Kuroda, Takahiro Akutsu, Yasumasa Koda, Kenji Takubo, Hideki Tominaga, Ryuuta Hirose, Tomohiro Karasawa and Shigetoshi Sugawa
- Organizer
  International Image Sensor Workshop 2015
- Place of Presentation
  Vaals, Netherlands
- Year and Date
  2015-06-08 – 2015-06-11
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] Wide spectral response and highly robust Si image sensor technology
- Author(s)
  Rihito Kuroda and Shigetoshi Sugawa
- Organizer
  2nd Asian Image Sensor and Imaging System Symposium
- Place of Presentation
  東京工業大学キャンパス・イノベーションセンター（東京都・港区）
- Year and Date
  2014-12-01 – 2014-12-02
- Invited
- Data Source
  KAKENHI-PROJECT-24360129
[Presentation] A Novel Analysis of Oxide Breakdown based on Dynamic Observation using Ultra-High Speed Video Capturing Up to 10,000,000 Frames Per Second
- Author(s)
  Rihito Kuroda, Fan Shao, Daiki Kimoto, Kiichi Furukawa, Hidetake Sugo, Tohru Takeda, Ken Miyauchi, Yasuhisa Tochigi, Akinobu Teramoto and Shigetoshi Sugawa
- Organizer
  2014 IEEE International Reliability Physics Symposium
- Place of Presentation
  Waikoloa, USA
- Year and Date
  2014-06-03 – 2014-06-05
- Data Source
  KAKENHI-PROJECT-24360129
[Presentation] A CMOS Image Sensor with 240μV/e- Conversion Gain, 200ke- Full Well Capacity and 190-1000nm Spectral Response
- Author(s)
  Satoshi Nasuno, Shunichi Wakashima, Fumiaki Kusuhara, Rihito Kuroda and Shigetoshi Sugawa
- Organizer
  International Image Sensor Workshop 2015
- Place of Presentation
  Vaals, Netherlands
- Year and Date
  2015-06-08 – 2015-06-11
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] Analysis of the breakdown voltage of an area surrounded by the multi-trench gaps in a 4kV monolithic isolator for a communication network interface
- Author(s)
  Yusuke Takeuchi, Rihito Kuroda and Shigetoshi Sugawa
- Organizer
  2014 International Conference on Solid State Devices and Materials
- Place of Presentation
  つくば国際会議場（茨城県・つくば市）
- Year and Date
  2014-09-08 – 2014-09-11
- Data Source
  KAKENHI-PROJECT-24360129
[Presentation] Analyzing Correlation between Multiple Traps in RTN Characteristics
- Author(s)
  Toshiki Obara, Akinobu Teramoto, Akihiro Yonezawa, Rihito Kuroda, Shigetoshi Sugawa, and Tadahiro Ohmi
- Organizer
  Toshiki Obara, Akinobu Teramoto, Akihiro Yonezawa, Rihito Kuroda, Shigetoshi Sugawa, and Tadahiro Ohmi
- Place of Presentation
  Waikoloa, USA
- Year and Date
  2014-06-03 – 2014-06-05
- Data Source
  KAKENHI-PROJECT-24360129
[Presentation] A Novel Analysis of Oxide Breakdown based on Dynamic Observation using Ultra-High Speed Video Capturing Up to 10,000,000 Frames Per Second
- Author(s)
  Rihito Kuroda, Fan Shao, Daiki Kimoto, Kiichi Furukawa, Hidetake Sugo, Tohru Takeda, Ken Miyauchi, Yasuhisa Tochigi, Akinobu Teramoto and Shigetoshi Sugawa
- Organizer
  2014 IEEE International Reliability Physics Symposium
- Place of Presentation
  Waikoloa, USA
- Year and Date
  2014-06-03 – 2014-06-05
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] Demonstrating Individual Leakage Path from Random Telegraph Signal of Stress Induced Leakage Current
- Author(s)
  A. Teramoto, T. Inatsuka, T. Obara, N. Akagawa, R. Kuroda, S. Sugawa and T. Ohmi
- Organizer
  2014 IEEE International Reliability Physics Symposium
- Place of Presentation
  Waikoloa, USA
- Year and Date
  2014-06-03 – 2014-06-05
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] Analysis of Pixel Gain and Linearity of CMOS Image Sensor using Floating Capacitor Load Readout Operation
- Author(s)
  S. Wakashima, F. Kusuhara, R. Kuroda, S. Sugawa
- Organizer
  IS&T/SPIE Electronic Imaging
- Place of Presentation
  San Francisco, USA
- Year and Date
  2015-02-08 – 2015-02-12
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] Analysis of the breakdown voltage of an area surrounded by the multi-trench gaps in a 4kV monolithic isolator for a communication network interface
- Author(s)
  Yusuke Takeuchi, Rihito Kuroda and Shigetoshi Sugawa
- Organizer
  2014 International Conference on Solid State Device and Materials
- Place of Presentation
  つくば国際会議場（茨城県・つくば市）
- Year and Date
  2014-09-08 – 2014-09-11
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] Analysis and Reduction of Floating Diffusion Capacitance Components of CMOS Image Sensor for Photon-Countable Sensitivity
- Author(s)
  Fumiaki Kusuhara, Shunichi Wakashima, Satoshi Nasuno, Rihito Kuroda and Shigetoshi Sugawa
- Organizer
  International Image Sensor Workshop 2015
- Place of Presentation
  Vaals, Netherlands
- Year and Date
  2015-06-08 – 2015-06-11
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] Atomically Flattening of Si Surface of SOI and Isolation-patterned Wafers
- Author(s)
  T. Goto, R. Kuroda, N. Akagawa, T. Suwa, A. Teramoto, X. Li, S. Sugawa, T. Ohmi, Y. Kumagai, Y. Kamata, and T. Shibusawa
- Organizer
  2014 International Conference on Solid State Devices and Materials
- Place of Presentation
  つくば国際会議場（茨城県・つくば市）
- Year and Date
  2014-09-08 – 2014-09-11
- Data Source
  KAKENHI-PROJECT-24360129
[Presentation] Atomically Flattening of Si Surface of SOI and Isolation-patterned Wafers
- Author(s)
  T. Goto, R. Kuroda, N. Akagawa, T. Suwa, A. Teramoto, X. Li, S. Sugawa, T. Ohmi, Y. Kumagai, Y. Kamata, and T. Shibusawa
- Organizer
  2014 International Conference on Solid State Device and Materials
- Place of Presentation
  つくば国際会議場（茨城県・つくば市）
- Year and Date
  2014-09-08 – 2014-09-11
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] Wide spectral response and highly robust Si image sensor technology
- Author(s)
  Rihito Kuroda and Shigetoshi Sugawa
- Organizer
  2nd Asian Image Sensor and Imaging System Symposium
- Place of Presentation
  東京工業大学キャンパス・イノベーションセンター（東京都・港区）
- Year and Date
  2014-12-01 – 2014-12-02
- Invited
- Data Source
  KAKENHI-PROJECT-26820121
[Presentation] High Selectivity in a Dry Etching of Silicon Nitride over Si Using a Novel Hydrofluorocarbon Etch Gas in a Microwave Excited Plasma for FinFET
- Author(s)
  Yukihisa Nakao, Takatoshi Matsuo, Akinobu Teramoto, Hidetoshi Utsumi, Keiichi Hashimoto, Rihito Kuroda, Yasuyuki Shirai, Shigetoshi Sugawa, and Tadahiro Ohmi
- Organizer
  225th Meeting of The Electrochemical Society
- Place of Presentation
  Orlando, USA
- Year and Date
  2014-05-11 – 2014-05-15
- Data Source
  KAKENHI-PROJECT-24360129
[Presentation] UV/VIS/NIR imaging technologies: challenges and opportunities
- Author(s)
  Rihito Kuroda and Shigetoshi Sugawa
- Organizer
  SPIE DSS, Sensing Technology + Applications
- Place of Presentation
  Baltimore, USA
- Year and Date
  2015-04-20 – 2015-04-24
- Invited
- Data Source
  KAKENHI-PROJECT-26820121

1. SUGAWA Shigetoshi (70321974)

# of Collaborated Projects: 3 results

# of Collaborated Products: 76 results
2. Ishinabe Takahiro (30361132)

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
3. 柴田陽生 (70771880)

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
4. 若生一広 (90500893)

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
5. 金山喜則 (10233868)

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
6. 高橋英樹 (20197164)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
7. 加藤一幾 (30613517)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
8. 渡部敏裕 (60360939)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
9. 栗原大輔 (90609439)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
10. GOTO Tetsiua

# of Collaborated Projects: 0 results

# of Collaborated Products: 1 results
11. 諏訪智之

# of Collaborated Projects: 0 results

# of Collaborated Products: 1 results
12. 大見忠弘

# of Collaborated Projects: 0 results

# of Collaborated Products: 1 results

Kuroda Rihito 黒田 理人

KURODA Rihito 黒田 理人

Research Projects

Research Products

Co-Researchers

作物の生理障害の機構解明におけるブレークスルーテクノロジーの開発と検証

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Project Period (FY)

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Construction of High-Sensitivity Real-Time Spectroscopic Imaging by Innovative High-Speed Spectroscopy and its Application to Non-Invasive Diagnostics

Principal Investigator

Project Period (FY)

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Review Section

Research Institution

Establishment of innovative small light amount difference image sensor with linear response 100 million electron full well capacityPrincipal Investigator

Principal Investigator

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Research Field

Research Institution

Establishment of a CMOS image sensor with photon countable sensitivity, linear response and high full well capacity

Principal Investigator

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Minimization of variation and noise of electrical characteristics of MOS transistors due to atomically flat gate insulator film/Si interfacePrincipal Investigator

Principal Investigator

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Research Institution

Accurate measurement and statistical analysis of gate leakage current of MOSFETs with atomically flat interface

Principal Investigator

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Device Structure Optimization of MOS Transistors for Reduction of Low Frequency NoisePrincipal Investigator

Principal Investigator

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[Book] 2020版 薄膜作製応用ハンドブック 第2章第6節イメージセンサ2020

Author(s)

Total Pages

Publisher

ISBN

Data Source

[Book] 車載センシング技術の開発と ADAS、自動運転システムへの応用 第2章 第1節 CMOSイメージセンサの広ダ イナミックレンジ化技術2017

Author(s)

Total Pages

Publisher

ISBN

Data Source

[Book] The Micro-World Observed by Ultra High-Speed Cameras: We See What You Don’t See, Part III Cameras with CCD/CMOS Sensors, Cameras with on-chip memory CMOS image sensors2017

Author(s)

Total Pages

Publisher

ISBN

Data Source

[Book] The Micro-World Observed by Ultra High-Speed Cameras: We See What You Don’t See, Part III Cameras with CCD/CMOS Sensors, Cameras with on-chip memory CMOS image sensors2017

Author(s)

Total Pages

Publisher

ISBN

Data Source

[Book] 光アライアンス2017年12月号 三次元積層を用いた先進CMOSイメージセンサ技術2017

Author(s)

Total Pages

Publisher

Data Source

[Book] 光アライアンス2017年12月号 三次元積層を用いた先進CMOSイメージセンサ技術2017

Author(s)

Total Pages

Publisher

Kuroda Rihito 黒田理人

KURODA Rihito 黒田理人

[Book] 2020版薄膜作製応用ハンドブック第2章第6節イメージセンサ2020

[Book] 車載センシング技術の開発と ADAS、自動運転システムへの応用　第2章第1節 CMOSイメージセンサの広ダイナミックレンジ化技術2017

[Book] 光アライアンス2017年12月号　三次元積層を用いた先進CMOSイメージセンサ技術2017

[Book] 光アライアンス2017年12月号　三次元積層を用いた先進CMOSイメージセンサ技術2017

[Book] 車載センシング技術の開発と ADAS、自動運転システムへの応用　第2章第1節 CMOSイメージセンサの広ダイナミックレンジ化技術2017