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Nishizawa Shinichi  西澤 真一

… Alternative Names

NISHIZAWA Sinichi  西澤 真一

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Researcher Number 40757522
Other IDs
  • ORCIDhttps://orcid.org/0000-0002-1172-7286
Affiliation (Current) 2025: 広島大学, 先進理工系科学研究科(先), 准教授
Affiliation (based on the past Project Information) *help 2022 – 2025: 早稲田大学, 理工学術院(情報生産システム研究科・センター), 講師(任期付)
2022 – 2023: 埼玉大学, 理工学研究科, 助教
2019 – 2021: 福岡大学, 工学部, 助教
2017 – 2018: 埼玉大学, 理工学研究科, 助教
2016: 埼玉大学, 大学院理工学研究科, 助教
Review Section/Research Field
Principal Investigator
Basic Section 60040:Computer system-related / Computer system
Except Principal Investigator
Computer system / Basic Section 60070:Information security-related / Basic Section 60040:Computer system-related
Keywords
Principal Investigator
集積回路 / 記憶保持特性 / フリップフロップ / 記憶特性 / モニター回路 / NBTI / トランジスタ特性診断 / BIST / テスト / ばらつきモニタ / プロセスモニタ / トランジスタ特性ばらつき / ばらつき評価回路 … More
Except Principal Investigator
… More 信頼性 / 経年劣化 / IoT / LSI / DVFS / AES / 耐タンパ性 / サイドチャネル攻撃 / 特性ゆらぎ / 常時起動デバイス / スタックトランジスタ / バルク / FDSOI / パワエレ / BTI / ランダムテレグラフノイズ / RTN / NBTI / 永久故障 / 一時故障 / パワーエレクトロニクス / ソフトエラー / 組込システム / ディペンダブルシステム / 組込みシステム / 製造容易化 / 低消費電力化 / 集積回路 / システムオンチップ Less
  • Research Projects

    (7 results)
  • Research Products

    (16 results)
  • Co-Researchers

    (13 People)
  •  設計・製造協調最適化を実現するドメイン特化セルライブラリの自動合成Principal Investigator

    • Principal Investigator
      西澤 真一
    • Project Period (FY)
      2025 – 2028
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Review Section
      Basic Section 60040:Computer system-related
    • Research Institution
      Waseda University
  •  A Tamper-resistant LSI Design Technique Using Dynamic Power Voltage Scaling Control

    • Principal Investigator
      請園 智玲
    • Project Period (FY)
      2024 – 2026
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Review Section
      Basic Section 60070:Information security-related
    • Research Institution
      Fukuoka University
  •  Reutilization of scan test design for transistor performance degradation diagnosisPrincipal Investigator

    • Principal Investigator
      西澤 真一
    • Project Period (FY)
      2021 – 2024
    • Research Category
      Grant-in-Aid for Early-Career Scientists
    • Review Section
      Basic Section 60040:Computer system-related
    • Research Institution
      Waseda University
      Fukuoka University
  •  Long-term NBTI measurement and its modeling

    • Principal Investigator
      Matsumoto Takashi
    • Project Period (FY)
      2018 – 2023
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Review Section
      Basic Section 60040:Computer system-related
    • Research Institution
      The University of Tokyo
  •  Process Variation Estimation using Flip-Flop Retention CharacteristicsPrincipal Investigator

    • Principal Investigator
      Nishizawa Shinichi
    • Project Period (FY)
      2017 – 2019
    • Research Category
      Grant-in-Aid for Young Scientists (B)
    • Research Field
      Computer system
    • Research Institution
      Fukuoka University
      Saitama University
  •  An IoT that can keep on running over years efficiently and reliably

    • Principal Investigator
      Kobayashi Kazutoshi
    • Project Period (FY)
      2015 – 2018
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Computer system
    • Research Institution
      Kyoto Institute of Technology
  •  LSI design methodology that enables robust operation under the supply as low as threshold voltage by self-compensating performance variability

    • Principal Investigator
      ONODERA Hidetoshi
    • Project Period (FY)
      2013 – 2016
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Computer system
    • Research Institution
      Kyoto University

All 2023 2022 2020 2019 2018 2015 2014 2013 Other

All Journal Article Presentation

  • [Journal Article] libretto: An Open Cell Timing Characterizer for Open Source VLSI Design2022

    • Author(s)
      Shinichi Nishizawa, Toru Nakura
    • Journal Title

      IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences

      Volume: -

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21K17723
  • [Journal Article] Universal NBTI Compact Model Replicating AC Stress/Recovery from a Single-shot Long-term DC Measurement2020

    • Author(s)
      Hosaka Takumi、Nishizawa Shinichi、Kishida Ryo、Matsumoto Takashi、Kobayashi Kazutoshi
    • Journal Title

      IPSJ Transactions on System LSI Design Methodology

      Volume: 13 Issue: 0 Pages: 56-64

    • DOI

      10.2197/ipsjtsldm.13.56

    • NAID

      130007887399

    • Peer Reviewed / Open Access
    • Data Source
      KAKENHI-PROJECT-18K11210
  • [Journal Article] Design Methodology for Variation Tolerant D-Flip-Flop Using Regression Analysis2018

    • Author(s)
      NISHIZAWA Shinichi、ONODERA Hidetoshi
    • Journal Title

      IEICE Trans. Fundamentals

      Volume: E101.A Issue: 12 Pages: 2222-2230

    • DOI

      10.1587/transfun.E101.A.2222

    • NAID

      130007539015

    • ISSN
      0916-8508, 1745-1337
    • Year and Date
      2018-12-01
    • Language
      English
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-17K12657
  • [Journal Article] Layout Generator with Flexible Grid Assignment for Area Efficient Standard Cell2015

    • Author(s)
      Shinichi Nishizawa, Tohru Ishihara, Hidetoshi Onodera
    • Journal Title

      IPSJ Transactions on System LSI Design Methodology

      Volume: 8 Issue: 0 Pages: 131-135

    • DOI

      10.2197/ipsjtsldm.8.131

    • NAID

      130005091214

    • ISSN
      1882-6687
    • Language
      English
    • Peer Reviewed / Acknowledgement Compliant / Open Access
    • Data Source
      KAKENHI-PROJECT-25280014
  • [Journal Article] Standard Cell Structure with Flexible P/N Well Boundaries for Near-Threshold Voltage Operation2013

    • Author(s)
      Shinichi Nishizawa, Tohru Ishihara, Hidetoshi Onodera
    • Journal Title

      IEICE Trans. Fundamentals

      Volume: E96.A Issue: 12 Pages: 2499-2507

    • DOI

      10.1587/transfun.E96.A.2499

    • NAID

      130003385302

    • ISSN
      0916-8508, 1745-1337
    • Language
      English
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-25280014
  • [Presentation] ハードウェア設計のオープンソース化に向けたライブラリキャラクタライザの開発2023

    • Author(s)
      西澤真一、名倉徹
    • Organizer
      IEICE総合大会シンポジウム
    • Invited
    • Data Source
      KAKENHI-PROJECT-21K17723
  • [Presentation] Library characterizer for open-source VLSI design2022

    • Author(s)
      Shinichi Nishizawa, Toru Nakura
    • Organizer
      The Workshop on Open-Source EDA Technology (WOSET)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21K17723
  • [Presentation] Process Variation Estimation using An IDDQ Test and FlipFlop Retention Characteristics2020

    • Author(s)
      Shinichi Nishizawa,and Kazuhito Ito
    • Organizer
      International Conference on Microelectronic Test Structures
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-17K12657
  • [Presentation] Compact Modeling of NBTI Replicationg AC Stress / Recovery from a Single-shot Long-term DC Measurement2019

    • Author(s)
      Shinichi NISHIZAWA, Takumi HOSAKA, Ryo KISHIDA, Takashi MATSUMOTO, Kazutoshi KOBAYASHI
    • Organizer
      25th IEEE International Symposium on On-Line Testing and Robust System Design
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18K11210
  • [Presentation] 単発DCストレス測定による負バイアス温度不安定性のAC特性を再現可能なモデル2019

    • Author(s)
      保坂 巧、西澤真一、岸田 亮、松本高士、小林和淑
    • Organizer
      電子情報通信学会 デザインガイア2019
    • Data Source
      KAKENHI-PROJECT-18K11210
  • [Presentation] Process Variation Aware D-Flip-Flop Design using Regression Analysis2018

    • Author(s)
      Shinichi Nishizawa and Hidetoshi Onodera
    • Organizer
      International Symposium on Quality Electronic Design
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-17K12657
  • [Presentation] Process Variation Estimation using A Combination of Ring Oscillator Delay and FlipFlop Retention Characteristics2018

    • Author(s)
      Takuma Konno, Shinichi Nishizawa and Kazuhito Ito
    • Organizer
      International Conference on Microelectronic Test Structures
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-17K12657
  • [Presentation] An impact of process variation on supply voltage dependence of logic path delay variation2015

    • Author(s)
      S. Nishizawa, T. Ishihara, H. Onodera
    • Organizer
      International Symposium on VLSI Design, Automation and Test
    • Place of Presentation
      Hsinchu(Taiwan)
    • Year and Date
      2015-04-27
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-25280014
  • [Presentation] Variation Tolerant Design of D-Flip-Flops for Low Voltage Circuit Operation2014

    • Author(s)
      Shinichi Nishizawa, Tohru Ishihara, Hidetoshi Onodera
    • Organizer
      International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU)
    • Place of Presentation
      Santa Cruz, CA, USA
    • Data Source
      KAKENHI-PROJECT-25280014
  • [Presentation] Variation-Aware Flip-Flop Energy Optimization for Ultra Low Voltage Operation

    • Author(s)
      Tatsuya Kamakari, Shinichi Nishizawa, Tohru Ishihara, Hidetoshi Onodera
    • Organizer
      IEEE International System-On-Chip Conference
    • Place of Presentation
      Las Vegas, Nevada, USA
    • Year and Date
      2014-09-02 – 2014-09-05
    • Data Source
      KAKENHI-PROJECT-25280014
  • [Presentation] Design Methodology of Process Variation Tolerant D-Flip-Flops for Low Voltage Circuit Operation

    • Author(s)
      Shinichi Nishizawa, Tohru Ishihara, Hidetoshi Onodera
    • Organizer
      IEEE International System-On-Chip Conference
    • Place of Presentation
      Las Vegas, Nevada, USA
    • Year and Date
      2014-09-02 – 2014-09-05
    • Data Source
      KAKENHI-PROJECT-25280014
  • 1.  Kobayashi Kazutoshi (70252476)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 3 results
  • 2.  Matsumoto Takashi (70417369)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 3 results
  • 3.  ONODERA Hidetoshi (80160927)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 4 results
  • 4.  土谷 亮 (20432411)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 5.  石原 亨 (30323471)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 4 results
  • 6.  Mahfuzul Islam A. K. M. (80762195)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 7.  古田 潤 (30735767)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 8.  吉河 武文 (60636702)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 9.  請園 智玲 (50610060)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 10.  Stoffels Steve
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 11.  Posthuma Niels
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 12.  Li Xiangdong
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 13.  Decoutere Stefaan
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results

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