Sasagawa Kazuhiko 笹川和彦

… Alternative Names

SASAGAWA Kazuhiko 笹川和彦

Less

Researcher Number	50250676
Other IDs
External Links
Affiliation (Current)	2025: 弘前大学, 理工学研究科, 教授
Affiliation (based on the past Project Information) *help	2019 – 2024: 弘前大学, 理工学研究科, 教授 2009 – 2017: 弘前大学, 理工学研究科, 教授 2009 – 2012: Hirosaki University, 大学院・理工学研究科, 教授 2007: Hirosaki University, Hirosaki University, Graduate School of Science and Technology, Associate Professor 2007: Hirosaki University, Graduate of Science and Technology, Professor … More 1999 – 2006: Fac. of Sci. Tech., Hirosaki Univ., Associate Professor, 理工学部, 助教授 1998: 東北大学, 大学院・工学研究科, 講師 1997: Tohoku University, Graduate School of Engineering, Research Associate, 大学院・工学研究科, 助手 1995 – 1996: 東北大学, 工学部, 助手 Less
Review Section/Research Field	Principal Investigator Materials/Mechanics of materials / Materials/Mechanics of materials / Basic Section 18010:Mechanics of materials and materials-related / Rehabilitation science/Welfare engineering / Rehabilitation science/Welfare engineering Except Principal Investigator Materials/Mechanics of materials / Materials/Mechanics of materials / Rehabilitation science/Welfare engineering / Basic Section 90130:Medical systems-related / Basic Section 58080:Gerontological nursing and community health nursing-related / Basic Section 58060:Clinical nursing-related / Material processing/treatments / Intelligent mechanics/Mechanical systems
Keywords	Principal Investigator エレクトロマイグレーション / 電子パッケージ / 数値シミュレーション / 支配パラメータ / 金属薄膜配線 / Numerical Simulation / Metal Line / 信頼性 / バンブー配線 / 角部 … More / 金属ナノ粒子配線 / Bamboo Line / Governing Parameter / Electromigration / Electronic Package / ハプティックインターフェイス / センサ / 接触圧力 / カーボンナノチューブ / 多結晶配線 / 断線故障 / 強度評価 / 薄膜金属配線 / 信頼性評価 / フレキシブルエレクトロニクス / 損傷機構 / 金属ナノ粒子 / フレキシブル回路 / ヒューマンインターフェイス / タッチパネル / 触覚センサー / ヒューマンインターフェース / Electronic Packaging / High Density Integration / Scaling Down / Lifetime Extension / Semiconductor Integrated Circuit / 高密度実装 / 微細化 / 長寿命化 / 半導体集積回路 / Passivation / Line Failure / electromigration / 数直シミュレーション / 保護膜 / Polycrystalline Line / Failure Prediction / 断線予測 / バーチャルリアリティ / ハプティック・インターフェイス / せん断応力 / せん断力 / 高密度電流 / 電子デバイス / 絶縁膜 / 支配パレメータ / 短絡故障 / 半導体デバイス / 強度評価パラメータ / 温度勾配特異性 / 電流特異性 / 熱応力 / 特異熱流束場 / 特異電流場 … More Except Principal Investigator Microwave / マイクロ波 / Contactless / Laser / 高分解能 / 非接触 / 導電率 / レーザ / Delamination / 電子パッケージ / はく離 / Quantitative Evaluation / 定量評価 / 薄膜 / Nondestructive Evaluation / 非破壊評価 / 日本語子音 / 構音訓練 / 構音・摂食・嚥下障害 / 舌圧測定システム / 電気的パラトグラフ / 原子再配列 / エレクトロマイグレーション / 自動穿刺 / 拡散 / 粘弾性 / 皮膚血管モデル / 力学特性 / 光学特性 / ロボット / 模擬皮膚 / 模擬血管 / 穿刺 / 応力 / 褥瘡 / 外力 / 末梢神経損傷 / 剪断力 / 圧力 / 末梢神経 / 体位 / Surface Topography / AFM Probe / Electrical Property / Nono-area / Microscope / Atomic Force / 表面計測 / 近接場計測 / 電気特性 / 原子間力顕微鏡 / 表面形状計測 / AFMプローブ / 電気的特性 / ナノ領域 / 顕微鏡 / 原子間力 / Nano-positioning / Nano-scale Measurement / Semiconductor / Nano-Indentation / Analysis of Atomic Structure / Thin Film / Reliability / Strength of nano-scale materials / 強度物性 / ナノポジショニング / ナノ計測 / 半導体 / ナノインデンテーション / 原子構造解析 / 信頼性 / ナノ強度物性 / High resolution / Electronic package / Tomography / Electro-optic crystal / THz wave / トモグラフィー / 電気光学結晶 / テラヘルツ波 / High Resolution / Quantitative Measurement / Electro-optic effect / Conductivity / Silicon Wafer / 定量計測 / 電気光学効果 / シリコンウェーハ / Materials / IC Package / Spatial Resolution / Imaging / Focusing Sensor / 材料 / 空間分解能 / イメージング / 集束センサ / Interface Fracture Toughness / Fracture resistance / Interface Crack / Adhesive Strength / Thin Films / 界面破壊じん性 / き裂進展抵抗曲線 / 界面き裂 / 付着強度 / Electromagnetic Field / Crack Depth / Simplified Evaluation / Crack Interactions / Personal Computer / D.C.Potential Drop Technique / Multiple Cracks / 電磁場 / き裂深さ / 簡易評価 / き裂干渉 / パーソナルコンピュータ / 直流電位差法 / 多重き裂 / 金属マイクロ材料 / ストレスマイグレーション / はんだボール / 金属薄膜配線 / 舌接触口蓋床 / 臓器モデル / 人間機械システム / 知能機械 / 構音,摂食,嚥下障害 / 構音，摂食，嚥下障害 / ナノ接合 / 金属ナノコイル / 機械的特性 / 高い秩序度 / 原子集約 / 原子拡散 / 金属ナノマテリアル / 単結晶 / ボトムアップ技術 / メタリックナノワイヤ / ナノ材料 / 電流密度 / 温度勾配 / 電子機器 / 発生機構 / 原子流束発散 / 吸熱現象 / 発 / 熱電効果 / トムソン効果 Less

褥瘡好発部位における内部応力と組織変形の関連性の検証
- Principal Investigator
  
  小野綾
- Project Period (FY)
  2023 – 2025
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 58080:Gerontological nursing and community health nursing-related
- Research Institution
  Hirosaki Gakuin University
Development of an automated puncture method for skin vascular models with equivalent optical and mechanical properties of human
- Principal Investigator
  
  佐川貢一
- Project Period (FY)
  2023 – 2025
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 90130:Medical systems-related
- Research Institution
  Hirosaki University
手術体位による外力と末梢神経への影響の検討
- Principal Investigator
  
  村岡祐介
- Project Period (FY)
  2022 – 2026
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 58060:Clinical nursing-related
- Research Institution
  Hirosaki Gakuin University
Development of evaluation and improvement method for reliability of Ag nanoparticle ink line used in flexible electronic circuitsPrincipal Investigator
- Principal Investigator
  
  笹川和彦
- Project Period (FY)
  2022 – 2025
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Review Section
  
  Basic Section 18010:Mechanics of materials and materials-related
- Research Institution
  Hirosaki University
Investigation of damage mechanism of metal nanoparticle interconnect used in flexible electronic circuits under electrical and mechanical loadingsPrincipal Investigator
- Principal Investigator
  
  SASAGAWA Kazuhiko
- Project Period (FY)
  2019 – 2022
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 18010:Mechanics of materials and materials-related
- Research Institution
  Hirosaki University
ENHANCEMENT OF SPATIAL RESOLUTION OF THIN AND FLEXIBLE TACTILE SENSOR AND HIGH FUNCTIONALIZATION OF TOUCH PANELPrincipal Investigator
- Principal Investigator
  
  SASAGAWA Kazuhiko
- Project Period (FY)
  2016 – 2017
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Rehabilitation science/Welfare engineering
- Research Institution
  Hirosaki University
Suppression and Utilization of Migration Phenomena Based on Control of Passivation for Metallic Thin Film and Micro Ball
- Principal Investigator
  
  SAKA Masumi
- Project Period (FY)
  2014 – 2016
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Tohoku University
IDENTIFICATION OF GOVERNING PARAMETER AND RELIABILITY EVALUATION FOR CARBON-NANOTUBE DAMAGE UNDER HI-DENSITY ELECTRONIC CURRENTPrincipal Investigator
- Principal Investigator
  
  SASAGAWA Kazuhiko
- Project Period (FY)
  2013 – 2015
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Hirosaki University
Rehabilitation of the articulation and swallowing disorder by the dental prosthesis fabricated of electropalatogram and tongue pressure at the articulation
- Principal Investigator
  
  SASAKI TOMOFUMI
- Project Period (FY)
  2012 – 2014
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Rehabilitation science/Welfare engineering
- Research Institution
  Tohoku University
DEVELOPMENT OF HAPTIC DISPLAY ATTACHABLE TO HUMAN SKIN USING FABRIC ACTUATORPrincipal Investigator
- Principal Investigator
  
  SASAGAWA Kazuhiko
- Project Period (FY)
  2011 – 2012
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Rehabilitation science/Welfare engineering
- Research Institution
  Hirosaki University
INVESTIGATION OF DAMAGE MECHANISM AND ESTIMATION OF STRENGTH OF CARBON NANOTUBES AS ELECTRONIC MATERIAL UNDER HIGH-DENSITY ELECTRONIC CURRENTPrincipal Investigator
- Principal Investigator
  
  SASAGAWA Kazuhiko
- Project Period (FY)
  2009 – 2012
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Hirosaki University
Examination of the training system of articulation and swallowing disorder by electropalatogram and tongue pressure at the articulation
- Principal Investigator
  
  SASAKI Tomofumi
- Project Period (FY)
  2009 – 2011
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Rehabilitation science/Welfare engineering
- Research Institution
  Tohoku University
ハプティックインターフェイスを指向した生体用接触圧力及びせん断力センサの新規構築Principal Investigator
- Principal Investigator
  
  笹川和彦
- Project Period (FY)
  2009 – 2010
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Rehabilitation science/Welfare engineering
- Research Institution
  Hirosaki University
内視鏡医療トレーニングのための括約筋をもつアクティブ臓器モデルの開発
- Principal Investigator
  
  牧野英司
- Project Period (FY)
  2009 – 2010
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Intelligent mechanics/Mechanical systems
- Research Institution
  Hirosaki University
Formation of Metallic Nanomaterials by Controlled Atomic Accumulation and Their Characterizations
- Principal Investigator
  
  SAKA Masumi
- Project Period (FY)
  2006 – 2010
- Research Category
  
  Grant-in-Aid for Scientific Research (S)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Tohoku University
原子拡散と再配列の制御によるメタリックナノワイヤの創製と機械的・電気的特性評価
- Principal Investigator
  
  坂真澄
- Project Period (FY)
  2005 – 2006
- Research Category
  
  Grant-in-Aid for Exploratory Research
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Tohoku University
Development of Microwave Atomic Force Microscope and Quantitative Evaluation of Electrical Properties in Nano-Area
- Principal Investigator
  
  YANG Ju
- Project Period (FY)
  2005 – 2007
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Nagoya University
  Tohoku University
Development of Guidelines on Circuit Design for Longer Lifetime of Electronic Devices Based on Accurate Prediction of Metal Line DamagePrincipal Investigator
- Principal Investigator
  
  SASAGAWA Kazuhiko
- Project Period (FY)
  2005 – 2007
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Hirosaki University
Measurement system of fluctuation map of strength and mechanical properties of nano-scale materials using nano-positioning technique
- Principal Investigator
  
  MIURA Hideo
- Project Period (FY)
  2004 – 2006
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  TOHOKU UNIVERSITY
Evaluation Method for Metal Line Failure Induced by High Current Density in Order to Ensure ULSI ReliabilityPrincipal Investigator
- Principal Investigator
  
  SASAGAWA Kazuhiko
- Project Period (FY)
  2003 – 2004
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Hirosaki University
Development of THz Wave Tomography Technique and Nondestructive Evaluation of Delamination in Mounted Electronic Packages
- Principal Investigator
  
  JU Yang
- Project Period (FY)
  2002 – 2003
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Tohoku University
Development of a Microwave-Laser Measurement Technique and Contactless Measurement of Conductivity of Silicon Wafer in an Infinitesimal Area
- Principal Investigator
  
  JU Yang
- Project Period (FY)
  2001 – 2002
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Material processing/treatments
- Research Institution
  Tohoku University
電子パッケージ薄膜配線のヒロック形成予測と短絡故障強度評価法への展開Principal Investigator
- Principal Investigator
  
  笹川和彦
- Project Period (FY)
  2000 – 2001
- Research Category
  
  Grant-in-Aid for Encouragement of Young Scientists (A)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Hirosaki University
電流下の原子流束発散に着目したトムソン効果発生機構解明の新規アプローチ
- Principal Investigator
  
  SAKA Masumi
- Project Period (FY)
  1999 – 2000
- Research Category
  
  Grant-in-Aid for Exploratory Research
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Tohoku University
Development of Prediction Method for Metal Line Failure Induced by High Current DensityPrincipal Investigator
- Principal Investigator
  
  SASAGAWA Kazuhiko
- Project Period (FY)
  1999 – 2000
- Research Category
  
  Grant-in-Aid for Scientific Research (B).
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Hirosaki University
Development of a Microwave Focusing Sensor and a High Resolution Imaging System for Nondestructive Evaluation of Materials
- Principal Investigator
  
  SAKA Masumi
- Project Period (FY)
  1999 – 2000
- Research Category
  
  Grant-in-Aid for Scientific Research (B).
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Tohoku University
エレクトロマイグレーション支配パラメーターの特定と電子パッケージ薄膜配線の強度評価Principal Investigator
- Principal Investigator
  
  笹川和彦
- Project Period (FY)
  1998 – 1999
- Research Category
  
  Grant-in-Aid for Encouragement of Young Scientists (A)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Hirosaki University
  Tohoku University
Establishment of a new method of evaluation for the adhesive strength of thin films by micro-indentation wit two degrees of freedom
- Principal Investigator
  
  KAMIYA Shoji
- Project Period (FY)
  1998 – 1999
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  TOHOKU UNIVERSITY
電子パッケージ薄膜配線のエレクトロマイグレーション強度評価パラメータの特定と応用Principal Investigator
- Principal Investigator
  
  笹川和彦
- Project Period (FY)
  1996
- Research Category
  
  Grant-in-Aid for Encouragement of Young Scientists (A)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Tohoku University
電子パッケージ薄膜配線における特異電流/熱流束場の支配パラメータの解明と強度評価Principal Investigator
- Principal Investigator
  
  笹川和彦
- Project Period (FY)
  1995
- Research Category
  
  Grant-in-Aid for Encouragement of Young Scientists (A)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Tohoku University
Research on Interaction of Multiple Cracks and Nondestructive Evaluation by Means of Electromagnetic Techniques
- Principal Investigator
  
  SAKA Masumi
- Project Period (FY)
  1995 – 1997
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Tohoku University

[Book] 金属ナノ粒子、微粒子の合成、調整と最新応用技術2021
- Author(s)
  笹川和彦, 藤﨑和弘（分担執筆）
- Total Pages
  558
- Publisher
  技術情報協会
- ISBN
  9784861048623
- Data Source
  KAKENHI-PROJECT-19K04084
[Book] Metallic Micro, ano Nano Materials-Fabrication with Atomic Diffusion2011
- Author(s)
  M. Saka (Ed.), M. Saka, K. Sasagawa, M. Muraoka, H. Tohmyoh, Y. Ju (Authors), Metallic Micro, Nano Materials
- Publisher
  Springer
- Data Source
  KAKENHI-PROJECT-18106003
[Book] Metallic Micro and Nano Materials-Fabrication with Atomic Diffusion2011
- Author(s)
  M.Saka(Ed.), M.Saka, K.Sasagawa, M.Muraoka, H.Tohmyoh, Y.Ju (Authors)
- Publisher
  Springer
- Data Source
  KAKENHI-PROJECT-18106003
[Book] Proceedings of IPACK2007 (CD-ROM)2007
- Author(s)
  K. Sasagawa (S. Fukushi)
- Publisher
  ASME
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Book] サイエンス＆テクノロジー2006
- Author(s)
  新宮原正三, (笹川和彦ほか13名)
- Total Pages
  206
- Publisher
  金属微細配線におけるマイグレーションのメカニズムと対策
- Data Source
  KAKENHI-PROJECT-17656036
[Book] 金属微細配線におけるマイグレーションのメカニズムと対策2006
- Author(s)
  新宮原正三(笹川和彦ほか13名)
- Total Pages
  206
- Publisher
  サイエンス&テクノロジー
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Book] サイエンス＆テクノロジー2006
- Author(s)
  新宮原正三(笹川和彦ほか13名)
- Total Pages
  206
- Publisher
  金属微細配線におけるマイグレーションのメカニズムと対策
- Data Source
  KAKENHI-PROJECT-18106003
[Book] 金属微細配線におけるマイグレーションのメカニズムと対策2006
- Author(s)
  新宮原正三(笹川和彦ほか13名)
- Total Pages
  206
- Publisher
  サイエンス＆テクノロジー
- Data Source
  KAKENHI-PROJECT-17360045
[Book] 金属微細配線におけるマイグレーションのメカニズムと対策2006
- Author(s)
  新宮原正三, 笹川和彦, ほか13名
- Publisher
  サイエンス & テクノロジー
- Data Source
  KAKENHI-PROJECT-18106003
[Book] Mechanism and Provision for Migration in Metal Lines2006
- Author(s)
  S. Shingubara (K. Sasagawa, et. al.)
- Total Pages
  206
- Publisher
  Science & Technology
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Journal Article] Damage Analysis in Ag Nanoparticle Interconnect Line Under High-Density Electric Current2022
- Author(s)
  Daiki Saito, Kazuhiko Sasagawa, Takeshi Moriwaki, Kazuhiro Fujisaki
- Journal Title
  
  ASME Journal of Electronic Packaging
  
  Volume: 144(4) Issue: 4
- DOI
  10.1115/1.4053365
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19K04084
[Journal Article] Computational evaluation of optimal reservoir and sink lengths for threshold current density of electromigration damage considering void and hillock formation2021
- Author(s)
  Ryuji Takaya, Kazuhiko Sasagawa, Takeshi Moriwaki, Kazuhiro Fujisaki
- Journal Title
  
  Microelectronics Reliability
  
  Volume: 118 Pages: 114060-114060
- DOI
  10.1016/j.microrel.2021.114060
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19K04084
[Journal Article] Damage of Flexible Electronic Line Under Mechanical and Electrical Stress Loading2021
- Author(s)
  Ryota Horiuchi, Kazuhiko Sasagawa, Kazuhiro Fujisaki
- Journal Title
  
  Proc. of ASME InterPACK 2021
  
  Volume: -
- DOI
  10.1115/ipack2021-68902
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19K04084
[Journal Article] Electromigration Damage of Flexible Electronic Lines Printed With Ag Nanoparticle Ink2020
- Author(s)
  Daiki Saito, Kazuhiko Sasagawa ,Takeshi Moriwaki ,Kazuhiro Fujisaki
- Journal Title
  
  Journal of Electronic Packaging
  
  Volume: 142 Issue: 3
- DOI
  10.1115/1.4046849
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19K04084
[Journal Article] Damege of Flexible Electronic Line Printed with Ag Nanoparticle Ink Due to High-Current Density2019
- Author(s)
  Daiki Saito, Kazuhiko Sasagawa, Takeshi Moriwaki, Kazuhiro Fujisaki
- Journal Title
  
  Proc. ASME 2019 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems
  
  Volume: -
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19K04084
[Journal Article] 高密度電流下の銀ナノ粒子インク配線における凝集塊分布の観察2019
- Author(s)
  斉藤大輝，笹川和彦，森脇健司，藤﨑和弘
- Journal Title
  
  第29回マイクロエレクトロニクスシンポジウム論文集
  
  Volume: - Pages: 139-142
- NAID
  40022301710
- Data Source
  KAKENHI-PROJECT-19K04084
[Journal Article] Development of Thin and Flexible Contact Pressure Sensing System for High Spatial Resolution Measurements2017
- Author(s)
  Kazuhiko Sasagawa, Junpei Narita
- Journal Title
  
  Sensors and Actuators A
  
  Volume: Vol. 263 Pages: 610-613
- DOI
  10.1016/j.sna.2017.07.024
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16K12946
[Journal Article] 採血手技の運動および力覚の計測2017
- Author(s)
  其田雅人，笹川和彦，藤崎和弘，森脇健司，萱場広之
- Journal Title
  
  臨床バイオメカニクス
  
  Volume: 38巻 Pages: 393-398
- NAID
  40021346302
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16K12946
[Journal Article] Development of Tube-type Pressure Distribution Sensor for Performance Evaluation of Endovascular Device2017
- Author(s)
  Takeshi Moriwaki, Asuka Saito, Kazuhiko Sasagawa, Kazuhiro Fujisaki
- Journal Title
  
  Proc. The 12th International Symposium in Advanced Science and Technology in Experimental Mechanics (ISEM)
  
  Volume: - Pages: 1-4
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16K12946
[Journal Article] Development of Sensing System of Three-Axis Stress for Touch Panel Operation2016
- Author(s)
  Renta Kasai, Kazuhiko Sasagawa, Kazuhiro Fujisaki
- Journal Title
  
  Proceedings of International Conference on Asia-Pacific Conference on Fracture and Strength 2016
  
  Volume: No. 16-204 Pages: 309-310
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16K12946
[Journal Article] Damage of Single-wall Carbon Nanotube Network Structure under Electric Current Loading2016
- Author(s)
  S. Sato, K. Fujisaki, K. Sasagawa
- Journal Title
  
  Mechanical Engineering Journal
  
  Volume: 3 Issue: 6 Pages: 16-00292-16-00292
- DOI
  10.1299/mej.16-00292
- NAID
  130005250610
- Peer Reviewed / Acknowledgement Compliant / Open Access
- Data Source
  KAKENHI-PROJECT-26289001
[Journal Article] Evaluation of Threshold Current Density of Electromigration Damage Considering Passivation Thickness2016
- Author(s)
  H. Kikuchi, K. Sasagawa, K. Fujisaki
- Journal Title
  
  2016 International Conference on Advances in Electrical, Electronic and Systems Engineering (ICAEESE 2016), Conference Paper Collection
  
  Volume: －
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-26289001
[Journal Article] Numerical Analysis of Allowable Current Density for Electromigration of Interconnect Tree Structure with Reservoir2015
- Author(s)
  K. Fujisaki, H. Narita, K. Sasagawa
- Journal Title
  
  Proceedings of ASME InterPACK/ICNMM2015
  
  Volume: 2
- DOI
  10.1115/ipack2015-48744
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-25420002, KAKENHI-PROJECT-26289001
[Journal Article] Experimental Study of Damage Mechanism of Carbon Nanotube as Nano-component of Electronic Devices under High Current Density2014
- Author(s)
  Kazuhiko Sasagawa, Kazuhiro Fujisaki, Jun Unuma, Ryota Azuma
- Journal Title
  
  Journal of Electronic Packaging
  
  Volume: 136 Issue: 4
- DOI
  10.1115/1.4026878
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-25420002
[Journal Article] Experimental Study of Damage Mechanism of Carbon Nanotube as Nano-Component of Electronic Devices under High Current Density2013
- Author(s)
  K. Sasagawa, K. Fujisaki, J. Unuma and R.Azuma
- Journal Title
  
  Proceedings of ASME InterPACK2013 (CD-ROM)
  
  Volume: (掲載決定)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360046
[Journal Article] 構音障害のリハビリテーションのための舌‐口蓋接触圧力分布測定システム2013
- Author(s)
  塚原智, 小山拓馬, 石川諒, 笹川和彦, 佐々木具文
- Journal Title
  
  第25回バイオエンジニアリング講演会講演論文集
  
  Volume: 25 Pages: 513-514
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24500572
[Journal Article] Experimental Study of Damage Mechanism of Carbon Nanotube as Nano-Component of Electronic Devices under High Current Density2013
- Author(s)
  K. Sasagawa, K. Fujisaki, J. Unuma and R. Azuma
- Journal Title
  
  Proceedings of ASME InterPACK2013 (CD-ROM)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360046
[Journal Article] Numerical Study of Allowable Current Density for Electromigration Damage of Multilevel Interconnection in Integrated Circuit (Keynote Lecture)2013
- Author(s)
  K. Sasagawa, T. Fujisaki and T. Yanagi
- Journal Title
  
  Proc. 13th Int. Conf. Fracture
  
  Volume: (掲載決定)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360046
[Journal Article] Development of Shear Stress Sensing System for Application to a Haptic Display2012
- Author(s)
  K. Sasagawa, T. Oyama, K. Tokiyoshi and K. Yokoyama
- Journal Title
  
  Proceedings of 7th International Symposium on Advanced Science and Technology in Experimental Mechanics
  
  Volume: M117
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23650344
[Journal Article] Evaluation of Threshold Current Density in Interconnect with Reservoir Structure Using Numerical Modeling of Electromigration Damage2012
- Author(s)
  K. Sasagawa, T. Yanagi and J. Unuma
- Journal Title
  
  Proc. 7th Int. Symp. on Advanced Science and Technology in Exp. Mechanics (USB Memory)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360046
[Journal Article] Evaluation of Threshold Current Density in Interconnect with Reservoir Structure Using Numerical Modeling of Electromigration Damage2012
- Author(s)
  K. Sasagawa, T. Yanagi and J. Unuma
- Journal Title
  
  Proceedings of 7th International Symposium on Advanced Science and Technology in Experimental Mechanics (USB Memory)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360046
[Journal Article] リザーバ構造配線におけるエレクトロマイグレーション損傷の数値シミュレーションによるしきい電流密度の評価2012
- Author(s)
  笹川和彦, 柳　貴裕, 鵜沼　潤
- Journal Title
  
  第22回マイクロエレクトロニクスシンポジウム論文集
  
  Pages: 191-194
- NAID
  130007887099
- Data Source
  KAKENHI-PROJECT-21360046
[Journal Article] A Comparison of Electromigration Failure of Metal Lines with Fracture Mechanics2012
- Author(s)
  H.Abe, M.Muraoka, K.Sasagawa, M.Saka
- Journal Title
  
  Acta Mech.Sin.
  
  Volume: 28(印刷中)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360046
[Journal Article] Change in Damage Mechanism of MWCNTs under Electric Current with Oxygen Concentration2011
- Author(s)
  K.Sasagawa, J.Unuma
- Journal Title
  
  Proc.13th International Conference on Electric Materials and Packaging(USB flash memory)
  
  Pages: 69-72
- Data Source
  KAKENHI-PROJECT-21360046
[Journal Article] Effect of Oxygen Concentration on Damage Mechanism of Carbon Nanotubes under High Current Density2011
- Author(s)
  K.Sasagawa, J.Unuma, T.Abo
- Journal Title
  
  Proc.ASME InterPACK2011
  
  Volume: (CD-ROM)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360046
[Journal Article] Development of Simulation of Nanostructure Production Due to Electromigration Considering Specimen's Damage2011
- Author(s)
  K.Sasagawa, T.Abo, J.Unuma
- Journal Title
  
  Proceedings of ICM&P2011
  
  Volume: (印刷中)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18106003
[Journal Article] Development of Simulation of Nanostructure Production due to Electromigration Considering Specimen's Damage2011
- Author(s)
  K.Sasagawa, T.Abo, J.Unuma
- Journal Title
  
  Proc.the 4th JSME/ASME International Conference on Materials and Processing
  
  Volume: (CD-ROM)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360046
[Journal Article] Effect of Oxygen Concentration on Damage Mechanism of Carbon Nanotubes under High Current Density2011
- Author(s)
  K. Sasagawa, J. Unuma and T. Abo
- Journal Title
  
  Proc. ASME InterPACK2011 (CD-ROM)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360046
[Journal Article] Development of Simulation of Nanostructure Production Due to Electromigration Considering Specimen's Damage2011
- Author(s)
  K.Sasagawa, T.Abo, J.Unuma
- Journal Title
  
  Proceedings of ASME/JSME ICM&P2011
  
  Volume: (印刷中)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360046
[Journal Article] Effect of Oxygen Concentration on Damage Mechanism of Carbon Nanotubes under High Current Density2011
- Author(s)
  K.Sasagawa, T.Abo, J.Unuma
- Journal Title
  
  Proceedings of ASME InterPACK2011
  
  Volume: (印刷中)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360046
[Journal Article] 生体への適用を目的とした接触圧力およびせん断圧力の同時測定センサの開発2011
- Author(s)
  時吉康太, 笹川和彦
- Journal Title
  
  臨床バイオメカニクス
  
  Volume: Vol.32 Pages: 309-313
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21500462
[Journal Article] 生体への適用を目的とした接触圧力およびせん断応力の同時測定センサの開発2011
- Author(s)
  笹川和彦
- Journal Title
  
  臨床バイオメカニクス
  
  Volume: Vol.32 Pages: 309-313
- NAID
  40019053701
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21500462
[Journal Article] Change in Damage Mechanism of MWCNTs under Electric Current with Oxygen Concentration2011
- Author(s)
  K. Sasagawa and J. Unuma
- Journal Title
  
  Proc. 13th International Conference on Electric Materials and Packaging(USB flash memory)
  
  Pages: 69-72
- Data Source
  KAKENHI-PROJECT-21360046
[Journal Article] 接触圧力およびせん断応力の分布測定を可能にするセンサシステムの開発2010
- Author(s)
  笹川和彦
- Journal Title
  
  日本機械学会
  
  Volume: 76 Pages: 83-87
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21500462
[Journal Article] 生体内の接触圧力およびせん断応力の同時測定センサの開発2010
- Author(s)
  笹川和彦
- Journal Title
  
  日本機械学会東北支部講演論文集 45
  
  Pages: 82-83
- Data Source
  KAKENHI-PROJECT-21500462
[Journal Article] Simulation of Nanostructure Production by Electromigration Considering Specimen's Shape2010
- Author(s)
  K.Sasagawa, A.Kirita, S.Fukushi, M.Saka
- Journal Title
  
  J.Nanosci.Nanotechnol. 10(印刷中)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360046
[Journal Article] Simulation of Nanostructure Production by Electromigration Considering Specimen's Shape2010
- Author(s)
  K. Sasagawa, A. Kirita, S. Fukushi and M. Saka
- Journal Title
  
  J. Nanosci. Nanotechnol
  
  Volume: Vol. 10 Pages: 6036-6040
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360046
[Journal Article] 生体への適用を目的とした接触圧力およびせん断応力の同時測定センサの開発2010
- Author(s)
  笹川和彦
- Journal Title
  
  臨床バイオメカニクス
  
  Volume: 37 Pages: 111-111
- NAID
  40019053701
- Data Source
  KAKENHI-PROJECT-21500462
[Journal Article] Simulation of nanostructure production by electromigration considering specimen's shape2010
- Author(s)
  K. Sasagawa, A. Kirita, S. Fukushi, M. Saka
- Journal Title
  
  J. Nanosci. Nanotechnol.
  
  Volume: 10 Pages: 6036-6040
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18106003
[Journal Article] Simulation of Nanostructure Production by Electromigration Considering Specimen's Shape. J2010
- Author(s)
  K. Sasagawa, A. Kirita, S. Fukushi and M. Saka
- Journal Title
  
  Nanosci. Nanotechnol
  
  Volume: 10(9) Pages: 6036-6040
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21500462
[Journal Article] Simulation of Nanostructure Production by Electromigration Considering Specimen's Shape2010
- Author(s)
  K.Sasagawa, A.Kirita, S.Fukushi, M.Saka
- Journal Title
  
  J.Nanosci. Nanotechnol.
  
  Volume: 10 Pages: 6036-6040
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360046
[Journal Article] Development of Sensor System for Measurement of Distributions of Contact Pressure and Shear Stress on Contacting Skin Surface2010
- Author(s)
  K.Sasagawa, K.Tokiyoshi
- Journal Title
  
  Proc. 5th International Symposium on Advance and Technology in Experimental Mechanics
  
  Volume: CD-ROM
- Data Source
  KAKENHI-PROJECT-21650146
[Journal Article] Simulation of Nanostructure Production by Electromigration Considering Specimen's Shape2010
- Author(s)
  K.Sasagawa, A.Kirita, S.Fukushi, M.Saka
- Journal Title
  
  J.Nanosci.Nanotechnol.
  
  Volume: 10 Pages: 6036-6040
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18106003
[Journal Article] Numerical Simulation of Threshold Current Density of Electromigration Damage in Cu Interconnect Tree2009
- Author(s)
  K.Sasagawa, A.Kirita, T.Abo, A.H.Hassan
- Journal Title
  
  Proceedings of InterPACK 2009 (CD-ROM)
  
  Pages: 6-6
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360046
[Journal Article] A Numerical Simulation of Nanostructure Formation Utilizing Electromigration2009
- Author(s)
  K. Sasagawa, S. Fukushi, Y. Sun and M. Saka
- Journal Title
  
  J. Electron. Mater
  
  Volume: Vol. 38 Pages: 2201-2206
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360046
[Journal Article] Derivation of Film Characteristic Constants of Polycrystalline Line for Reliability Evaluation Against Electromigration Failure2009
- Author(s)
  M.Hasegawa, K.Sasagawa, S.Uno, M.Saka, H.Abe
- Journal Title
  
  Mech.Mater. 41
  
  Pages: 1090-1095
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360046
[Journal Article] Numerical Simulation of Threshold Current Density of Electromigration Damage in Cu Interconnect Tree2009
- Author(s)
  K.Sasagawa, A.Kirita, T.Abo, A.H.Hassan
- Journal Title
  
  Proceedings of InterPACK 2009 (CD-ROM)
  
  Pages: 6-6
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18106003
[Journal Article] A Numerical Simulation of Nanostructure Formation Utilizing Electromigration2009
- Author(s)
  K.Sasagawa, S.Fukushi, Y.Sun, M.Saka
- Journal Title
  
  J.Electron.Mater. 38
  
  Pages: 2201-2206
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360046
[Journal Article] Derivation of Film Characteristic Constants of Polycrystalline Line for Reliability Evaluation Against Electromigration Failure2009
- Author(s)
  M.Hasegawa, K.Sasagawa, S.Uno, M.Saka, H.Abe
- Journal Title
  
  Mech.Mater. 41
  
  Pages: 1090-1095
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18106003
[Journal Article] A Numerical Simulation of Nanostructure Formation Utilizing Electromigration2009
- Author(s)
  K.Sasagawa, S.Fukushi, Y.Sun, M.Saka
- Journal Title
  
  J.Electron.Mater. 38
  
  Pages: 2201-2206
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18106003
[Journal Article] 嚥下時の口腔および咽頭内の接触圧力同時測定システムの開発2009
- Author(s)
  笹川和彦
- Journal Title
  
  臨床バイオメカニクス 30
  
  Pages: 83-87
- NAID
  10026981518
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21500462
[Journal Article] Derivation of Electromigration Characteristic Constants of Metal Line Used in Electronic Devices2009
- Author(s)
  K.Sasagawa, T.Gomyo, A.Kirita
- Journal Title
  
  Proceedings of ICF12 (CD-ROM)
  
  Pages: 9-9
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18106003
[Journal Article] Simulation of nanostructure production by electromigration considering specimen's shape2009
- Author(s)
  K. Sasagawa, A. Kirita, S. Fukushi, M. Saka
- Journal Title
  
  J. Nanosci. Nanotechnol 9(印刷中)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18106003
[Journal Article] Derivation of Electromigration Characteristic Constants of Metal Line Used in Electronic Devices2009
- Author(s)
  K.Sasagawa, T.Gomyo, A.Kirita
- Journal Title
  
  Proceedings of ICF12 (CD-ROM)
  
  Pages: 9-9
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360046
[Journal Article] 嚥下時の口腔および咽頭内の接触圧力同時測定システムの開発2009
- Author(s)
  大里泰彦, 笹川和彦, 横山紘太郎, 才藤栄一, 近藤和泉
- Journal Title
  
  臨床バイオメカニクス
  
  Volume: Vol.30 Pages: 83-87
- NAID
  10026981518
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21500462
[Journal Article] A numerical simulation of nanostructure formation utilizing electromigration2009
- Author(s)
  K. Sasagawa, S. Fukushi, Y. Sun, M. Saka
- Journal Title
  
  J. Electron. Mater.
  
  Volume: 38 Pages: 2201-2206
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18106003
[Journal Article] Evaluation of Threshold Current Density of Electromigration Damage in Angled Bamboo Lines2007
- Author(s)
  K. Sasagawa (S. Fukushi)
- Journal Title
  
  Proceedings of IPACK2007 (CD-ROM), ASME
- Description
  「研究成果報告書概要(和文)」より
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17360045
[Journal Article] Evaluation of Threshold Current Density of Electromigration Damage in Angled Bamboo Lines2007
- Author(s)
  K. Sasagawa(S. Fukushi)
- Journal Title
  
  Proc. 2007 ASME/Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems IPACK2007-33237(CD-ROM)
  
  Pages: 1-6
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206011
[Journal Article] Evaluation of Threshold Current Density of Electromigration Damage in Angled Bamboo Lines2007
- Author(s)
  K. Sasagawa (S. Fukushi)
- Journal Title
  
  Proc. ASME/Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems 2007 (CD-ROM)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17206011
[Journal Article] Evaluation of Threshold Current Density of Electromigration Damage in Angled Bamboo Lines2007
- Author(s)
  K. Sasagawa (S. Fukushi)
- Journal Title
  
  Proceedings of IPACK2007 (CD-ROM)
  
  Pages: 2007-33237
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Journal Article] Threshold Current Density of Electromigration Damage in Angled Polycrystalline Line2007
- Author(s)
  K. Sasagawa (N. Yamaji, S. Fukushi)
- Journal Title
  
  Key Engineering Materials 353-358
  
  Pages: 2958-2961
- Description
  「研究成果報告書概要(和文)」より
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17360045
[Journal Article] Evaluation of Threshold Current Density of Electromigration Damage in Angled Bamboo Lines2007
- Author(s)
  K. Sasagawa(S. Fukushi)
- Journal Title
  
  Proceedings of IPACK2007, ASME (CD-ROM)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17360045
[Journal Article] Threshold Current Density of Electromigration Damage in Angled Polycrystalline Lime2007
- Author(s)
  K. Sasagawa(N. Yamaji and S. Fukushi)
- Journal Title
  
  Key Engineering Materials 353-358
  
  Pages: 2958-2961
- Description
  「研究成果報告書概要(和文)」より
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17206011
[Journal Article] Threshold Current Density of Electromigration Damage in Angled Polycrystalline Line2007
- Author(s)
  K. Sasagawa (N. Yamaji and S. Fukushi)
- Journal Title
  
  Key Engineering Materials 353-358
  
  Pages: 2958-2961
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17206011
[Journal Article] Threshold Current Density of Electromigration Damage in Angled Polycrystalline Line2007
- Author(s)
  K. Sasagawa(N. Yamaji, S. Fukushi)
- Journal Title
  
  Key Engineering Materials Vols.353-358
  
  Pages: 2958-2961
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17360045
[Journal Article] Threshold Current Density of Electromigration Damage in Angled Polycrystalline Line2007
- Author(s)
  K. Sasagawa (N. Yamaji and S. Fukushi)
- Journal Title
  
  Key Engineering Materials 353-358
  
  Pages: 2958-2961
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Journal Article] Evaluation of Threshold Current Density of Electromigration Damage in Angled Bamboo Lines2007
- Author(s)
  K. Sasagawa(S. Fukushi)
- Journal Title
  
  Proc. 2007 ASME/Pacific Rim Technical Conference and Exhibifion on Integration and Packaging of MEMS, HEMS, and Electronic Systems(CD-ROM) IPACK2007-33237
  
  Pages: 1-6
- Description
  「研究成果報告書概要(和文)」より
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17206011
[Journal Article] Threshold Current Density of Electromigration Damage in Angled Polycrystalline Line2007
- Author(s)
  K. Sasagawa(N. Yamaji, S. Fukushi)
- Journal Title
  
  Key Engineering Materials
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206011
[Journal Article] Threshold Current Density of Electromigration Damage in Angled Polycrystalline Line2007
- Author(s)
  K. Sasagawa(N. Yamaji, S. Fukushi)
- Journal Title
  
  Key Engineering Materials 353-358
  
  Pages: 2958-2961
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18106003
[Journal Article] 多結晶およびバンブー構造Al配線におけるエレクトロマイグレーション損傷しきい電流密度2006
- Author(s)
  笹川和彦(山路尚, 福士翔大)
- Journal Title
  
  応用物理学会薄膜・表面物理分科会第12回LSI配線における原子輸送・応力問題研究会予稿集
  
  Pages: 21-22
- Data Source
  KAKENHI-PROJECT-17360045
[Journal Article] 折れ曲がるバンブー構造配線のエレクトロマイグレーション損傷しきい電流密度2006
- Author(s)
  笹川和彦, (山路尚, 福士翔大)
- Journal Title
  
  日本機械学会 2006年次大会講演論文集(1) No.06-1
  
  Pages: 907-908
- Data Source
  KAKENHI-PROJECT-17656036
[Journal Article] 半導体集積回路配線におけるエレクトロマイグレーション損傷しきい電流密度の評価2006
- Author(s)
  笹川和彦, (山路尚, 福士翔大)
- Journal Title
  
  エレクトロニクス実装学会MES2006第16回マイクロエレクトロニクスシンポジウム論文集
  
  Pages: 267-270
- Data Source
  KAKENHI-PROJECT-17656036
[Journal Article] エレクトロマイグレーション損傷と数値シミュレーションによる信頼性評価法2006
- Author(s)
  笹川和彦
- Journal Title
  
  日本材料学会第43回X線材料強度に関する討論会講演論文集
  
  Pages: 12-17
- Data Source
  KAKENHI-PROJECT-17360045
[Journal Article] 多結晶およびバンブー構造Al配線におけるエレクトロマイグレーション損傷しきい電流密度2006
- Author(s)
  笹川和彦(山路尚, 福士翔大)
- Journal Title
  
  応用物埋学会薄膜・表面物理分科会第12回LSI配線における原子輸送・応力問題研究会予稿集
  
  Pages: 21-22
- Data Source
  KAKENHI-PROJECT-18106003
[Journal Article] Threshold Current Density of Elecromigration Damage in Angled Polycrystalline Line2006
- Author(s)
  K.Sasagawa(N.Yamaji, S.Fukushi)
- Journal Title
  
  Abstracts of 2006 Asian Pacific Conference for Fracture and Strength
  
  Pages: 415-415
- Data Source
  KAKENHI-PROJECT-17360045
[Journal Article] 多結晶およびバンブー構造Al配線におけるエレクトロマイグレーション損傷しきい電流密度2006
- Author(s)
  笹川和彦, (山路尚, 福士翔大)
- Journal Title
  
  応用物理学会薄膜・表面物理分科会第12回LSI配線における原子輸送・応力問題研究会予稿集
  
  Pages: 21-22
- Data Source
  KAKENHI-PROJECT-17656036
[Journal Article] エレクトロマイグレーション損傷と数値シミュレーションによる信頼性評価法2006
- Author(s)
  笹川和彦
- Journal Title
  
  日本材料学会第43回X線材料強度に関する討論会講演論文集
  
  Pages: 12-17
- Data Source
  KAKENHI-PROJECT-18106003
[Journal Article] 多結晶配線における配線二次元形状がしきい電流密度に及ぼす影響2006
- Author(s)
  山路尚, (笹川和彦)
- Journal Title
  
  日本機械学会東北支部第41期総会・講演会講演論文集 No.2006-1
  
  Pages: 51-52
- Data Source
  KAKENHI-PROJECT-17360045
[Journal Article] Electromigration Failure of Metal Lines2006
- Author(s)
  H.Abe(K.Sasagawa, M.Saka)
- Journal Title
  
  International Journal of Fracture 138・1-4
  
  Pages: 219-240
- Data Source
  KAKENHI-PROJECT-17360045
[Journal Article] 半導体集積回路配線におけるエレクトロマイグレーション損傷しきい電流密度の評価2006
- Author(s)
  笹川和彦(山路尚, 福士翔大)
- Journal Title
  
  エレクトロニクス実装学会 MES2006 第16回マイクロエレクトロニクスシンポジウム論文集
  
  Pages: 267-270
- Data Source
  KAKENHI-PROJECT-17360045
[Journal Article] 折れ曲がるバンブー構造配線のエレクトロマイグレーション損傷しきい電流密度2006
- Author(s)
  笹川和彦(山路尚, 福士翔大)
- Journal Title
  
  日本機械学会2006年次大会講演論文集(1) No.06-1
  
  Pages: 907-908
- Data Source
  KAKENHI-PROJECT-17360045
[Journal Article] Derivation of Film Characteristic Constants by Using Governing Parameter for Electromigration Damage in Passivated Bamboo Line2005
- Author(s)
  M.Hasegawa (K.Sasagawa, M.Saka)
- Journal Title
  
  Proc.11th International Conference on Fracture Paper ID 3699 (CD-ROM)
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] Electromigration Failure of Metal Lines2005
- Author(s)
  H.Abe, K.Sasagawa, M.Saka
- Journal Title
  
  Proceedings of 11th International Conference on Fracture (CD-ROM)(Plenary lecture)
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] Verification of Prediction Method for Electromigration Failure Using Angled Polycrystalline Line2005
- Author(s)
  S.Uno, M.Hasegawa, K.Sasagawa, M.Saka
- Journal Title
  
  Key Engineering Materials Vol.297-300
  
  Pages: 263-268
- Data Source
  KAKENHI-PROJECT-16206013
[Journal Article] Effect of Line-Shape on Threshold Current Density of Electromigration Damage in Bamboo Lines2005
- Author(s)
  K.Sasagawa, (S.Uno, N.Yamaji, M.Saka)
- Journal Title
  
  Proc.ASME/Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS and Electronic Systems (CD-ROM)
- Data Source
  KAKENHI-PROJECT-17360045
[Journal Article] Effect of Line-Shape on Threshold Current Density of Electromigration Damage2005
- Author(s)
  K.Sasagawa (S.Uno, N.Yamaji, M.Saka)
- Journal Title
  
  Proc.IPACK2005, ASME Paper ID IPACK2005-73133 (CD-ROM)(in press)
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] Verification of Prediction Method for Electromigration Failure Using Angled Polycrystalline Line2005
- Author(s)
  S.Uno (M.Hasegawa, K.Sasagawa et al.)
- Journal Title
  
  Key Engineering Materials 297-300
  
  Pages: 263-268
- Data Source
  KAKENHI-PROJECT-17206011
[Journal Article] Effect of Line-Shape on Threshold Current Density of Electromigration Damage in Bamboo Lines2005
- Author(s)
  K. Sasagawa(S. Uno, N. Yamaji, M. Saka)
- Journal Title
  
  Proc. 2005 ASME/Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems LPACK2005-73133(CD-ROM)
  
  Pages: 1-6
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206011
[Journal Article] Effect of Line-Shape on Threshold Current Density of Electromigration Damage in Bamboo Lines2005
- Author(s)
  K.Sasagawa (S.Uno, N.Yamaji, M.Saka)
- Journal Title
  
  Proc. 2005 ASME/Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems IPACK2005-73133(CD-ROM)
  
  Pages: 1-6
- Data Source
  KAKENHI-PROJECT-17206011
[Journal Article] Verification of Prediction Method for Electromigration Failure Using Angled Polycrystalline Line2005
- Author(s)
  S. Uno (M. Hasegawa, K. Sasagawa and M. Saka)
- Journal Title
  
  Key Engineering Materials 297-300
  
  Pages: 263-268
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Journal Article] Derivation of Film Characteristic Constants by Using Governing Parameter for Electromigration Damage in Passivated Bambooline2005
- Author(s)
  M.Hasegawa (K.Sasagawa, M.Saka)
- Journal Title
  
  Proc. 11th International Conference on Fracture (CD-ROM)
  
  Pages: 1-8
- Data Source
  KAKENHI-PROJECT-17206011
[Journal Article] Derivation of Film Characteristic Constants by Using Governing Parameter for Electromigration Damage in Passivated Bamboo line2005
- Author(s)
  M. Hasegawa (K. Sasagawa and M. Saka)
- Journal Title
  
  Proc. 11th International Conference on Fracture (CD-ROM)
  
  Pages: 1-6
- Description
  「研究成果報告書概要(和文)」より
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17206011
[Journal Article] 二次元形状の多結晶配線におけるエレクトロマイグレーション損傷しきい電流密度2005
- Author(s)
  笹川和彦, (山路尚, 宇野茂雄)
- Journal Title
  
  日本機械学会第18回計算力学講演会講演論文集 No.05-2
  
  Pages: 23-24
- Data Source
  KAKENHI-PROJECT-17360045
[Journal Article] Verification of Prediction Method for Electromigration Failure Using Angled Polycrystalline Line2005
- Author(s)
  S. Uno (M. Hasegawa, K. Sasagawa, M. Saka)
- Journal Title
  
  Key Engineering Materials 297-300
  
  Pages: 263-268
- Description
  「研究成果報告書概要(和文)」より
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17360045
[Journal Article] バンブー配線の二次元形状がエレクトロマイグレーション損傷のしきい電流に及ぼす影響2005
- Author(s)
  笹川和彦, (宇野茂雄, 山路尚, 坂真澄)
- Journal Title
  
  日本機械学会 2005年次大会講演論文集(VI) No.05-1
  
  Pages: 287-288
- Data Source
  KAKENHI-PROJECT-17360045
[Journal Article] Derivation of Film Characteristic Constants by Using Governing Parameter for Electromigration Damage in Passivated Bamboo Line2005
- Author(s)
  M.Hassegawa, K.Sasagawa, M.Saka
- Journal Title
  
  Proceedings of 11th International Conference on Fracture (CD-ROM)
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] バンブー配線における配線二次元形状がエレクトロマイグレーション損傷しきい電流密度に及ぼす影響2005
- Author(s)
  笹川和彦, (宇野茂雄, 山路尚, 坂真澄)
- Journal Title
  
  応用物理学会薄膜・表面物理分科会第11回LSI配線における原子輸送・応力問題研究会講演論文集
  
  Pages: 40-41
- Data Source
  KAKENHI-PROJECT-17360045
[Journal Article] Effect of Line-Shape on Threshold Current Density of Electromigration Damage in Bamboo Lines2005
- Author(s)
  K. Sasagawa (S. Uno, N. Yamaji and M. Saka)
- Journal Title
  
  Proc. 2005 ASME/Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems (CD-ROM) IPACK2005-73133
  
  Pages: 1-6
- Description
  「研究成果報告書概要(和文)」より
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17206011
[Journal Article] Derivation of Film Characteristic Constants by Using Governing Parameter for Electromigration Damage in Passivated Bamboo line2005
- Author(s)
  M. Hasegawa(K. Sasagawa, M. Saka)
- Journal Title
  
  Proc. 11th International Conference on Fracture (CD-ROM)
  
  Pages: 1-6
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206011
[Journal Article] Electromigration Failure of Metal Lines2005
- Author(s)
  H.Abe (K.Sasagawa, M.Saka)
- Journal Title
  
  Abstracts of 11th International Conference on Fracture
  
  Pages: 17-17
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] Verification of Prediction Method for Electromigration Failure Using Angled Polycrystalline Line2005
- Author(s)
  S. Uno(M. Hasegawa, K. Sasagawa, et. al.)
- Journal Title
  
  Key Engineering Materials
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17206011
[Journal Article] Effect of Line-Shape on Threshold Current Density of Electromigration Damage in Bamboo Lines2005
- Author(s)
  K.Sasagawa, (S.Uno, N.Yamaji, M.Saka)
- Journal Title
  
  Proceedings of IPACK2005, ASME (CD-ROM)(掲載予定)
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] Verification of Prediction Method for Electromigration Failure Using Angled Polycrystalline Line2005
- Author(s)
  S. Uno (M. Hasegawa, K. Sasagawa, et. al.)
- Journal Title
  
  Key Engineering Materials 297-300
  
  Pages: 263-268
- Description
  「研究成果報告書概要(和文)」より
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17206011
[Journal Article] Electromigration Failure of Metal Lines2005
- Author(s)
  H.Abe, (K.Sasagawa, M.Saka)
- Journal Title
  
  Abstracts of 11th International Conference on Fracture
  
  Pages: 17-17
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] Derivation of Film Characteristic Constants by Using Governing Parameter for Electromigration Damage in Passivated Bamboo Line2005
- Author(s)
  M.Hasegawa, (K.Sasagawa, M.Saka)
- Journal Title
  
  Proceedings of 11th International Conference on Fracture (CD-ROM)
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] Absolute Thermopower of Aluminum Wire before and after Electromigration2004
- Author(s)
  K.Sasagawa (T.Sato, M.Saka)
- Journal Title
  
  Proc.the Autumn Meeting of JSME Tohoku Division No.041-2
  
  Pages: 29-30
- NAID
  110004059830
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] 配線端のドリフト速度計測による配線物性定数の導出法2004
- Author(s)
  長谷川昌孝, 笹川和彦, 宇野茂雄, 坂真澄
- Journal Title
  
  日本機械学会2004年度年次大会講演論文集(I) No.04-1
  
  Pages: 403-404
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] Derivation of Film Constants of Al Polycrystalline Line by Drift Velocity Measurement and Evaluation of Threshold Current2004
- Author(s)
  M.Hasegawa (K.Sasagawa, S.Uno, M.Saka)
- Journal Title
  
  Proc.10th Conf.Atomic Transportation and Stress Problem in LSI Metallization
  
  Pages: 38-39
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] ドリフト速度計測によるAl多結晶配線の物性定数の導出としきい電流密度の評価2004
- Author(s)
  長谷川昌孝, (笹川和彦, 宇野茂雄, 坂真澄)
- Journal Title
  
  応用物理学会薄膜・表面物理分科会第10回LSI配線における原子輸送および応力問題研究会講演論文集
  
  Pages: 38-39
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] ドリフト速度計測によるバンブー金属配線の物性定数の導出2004
- Author(s)
  長谷川昌孝, 笹川和彦, 宇野茂雄
- Journal Title
  
  日本機械学会第17回計算力学講演会講演論文集 No.04-40
  
  Pages: 805-806
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] LSI配線のエレクトロマイグレーション特性に関する物性定数の導出としきい電流密度の評価2004
- Author(s)
  笹川和彦, 長谷川昌孝, 宇野茂雄, 坂真澄
- Journal Title
  
  第2回マイクロマテリアルシンポジウム講演論文集
  
  Pages: 80-83
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] ドリフト速度計測によるバンブー金属配線の物性定数の導出2004
- Author(s)
  長谷川昌孝, (笹川和彦, 宇野茂雄)
- Journal Title
  
  日本機械学会第17回計算力学講演会講演論文集 No.04-40
  
  Pages: 805-806
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] ドリフト速度計測によるAl多結晶配線の物性定数の導出としきい電流密度の評価2004
- Author(s)
  長谷川昌孝, 笹川和彦, 宇野茂雄, 坂真澄
- Journal Title
  
  応用物理学会薄膜・表面物理分科会第10回LSI配線における原子輸送および応力問題研究会講演論文集
  
  Pages: 38-39
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] LSI配線のエレクトロマイグレーション特性に関する物性定数の導出としきい電流密度の評価2004
- Author(s)
  笹川和彦, (長谷川昌孝, 宇野茂雄, 坂真澄)
- Journal Title
  
  日本材料学会第2回マイクロマテリアルシンポジウム講演論文集
  
  Pages: 80-83
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] Derivation of Film Characteristic Constants in Bamboo Line by Drift Velocity Measurement2004
- Author(s)
  M.Hasegawa (K.Sasagawa, S.Uno)
- Journal Title
  
  Proc.the 17th Computational Mechanics Conference No.04-40
  
  Pages: 805-806
- NAID
  110004070593
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] Derivation of Film Characteristic Constants by Drift Velocity Measurement2004
- Author(s)
  M.Hasegawa (K.Sasagawa, S.Uno, M.Saka)
- Journal Title
  
  Proc.Mechanical Engineering Congress Japan 04 (I) No.04-1
  
  Pages: 403-404
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] エレクトロマイグレーション前後におけるアルミバルク材の熱電能の検討2004
- Author(s)
  笹川和彦, (佐藤匠, 坂真澄)
- Journal Title
  
  日本機械学会東北支部第10期秋季講演会講演論文集 No.041-2
  
  Pages: 29-30
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] Verification of Prediction Method for Electromigration Failure Using Angled Polycrystalline Line2004
- Author(s)
  S.Uno (M.Hasegawa, K.Sasagawa, M.Saka)
- Journal Title
  
  Abstracts of Asian Pacific Conference for Fracture and Strength '04
  
  Pages: 105-105
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] Derivation of Film Constants Concerning Electromigration Characteristics and Evaluation of Threshold Current Density2004
- Author(s)
  K.Sasagawa (M.Hasagawa, S.Uno, M.Saka)
- Journal Title
  
  Proc.the 2nd Symposium on Micromaterials, JSMS
  
  Pages: 80-83
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] 配線端のドリフト速度計測による配線物性定数の導出法2004
- Author(s)
  長谷川昌孝, (笹川和彦, 宇野茂雄, 坂真澄)
- Journal Title
  
  日本機械学会2004年度年次大会講演論文集(I) No.04-1
  
  Pages: 403-404
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] Failure Prediction in Passivated Polycrystalline Line Considering Passivation Thickness2003
- Author(s)
  K.Sasagawa (M.Hasegawa, M.Saka)
- Journal Title
  
  Proc.2003 Annual Meeting of the JSME/MMD No.03-11
  
  Pages: 609-610
- NAID
  110002489465
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] Electromigration2003
- Author(s)
  K.Sasagawa
- Journal Title
  
  Journal of the Japanese Society for Experimental Mechanics 3(4)
  
  Pages: 71-72
- NAID
  10011869583
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] Derivation of the Film Characteristic Constants Using the Governing Parameter for Electromigration Damage at Metal Line Ends2003
- Author(s)
  M.Hasegawa (K.Sasagawa, S.Uno, M.Saka)
- Journal Title
  
  Proc.of ISMMMIE2003, The International Symposium on Micro-Mechanical Engineering, JSME
  
  Pages: 433-439
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] Derivation of the Film Characteristic Constants Using the Governing Parameter for Electromigration Damage at Metal Line Ends2003
- Author(s)
  M.Hasegawa, (K.Sasagawa, S.Uno, M.Saka)
- Journal Title
  
  Proceedings of ISMME2003, The International Symposium on Micro-Mechanical Engineering, JSME
  
  Pages: 433-439
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] Film Characteristics Derived by the Governing Parameter for Electromigration Damage at Metal Line End2003
- Author(s)
  M.Hasegawa (K.Sasagawa, Y.Watanabe, S.Uno, M.Saka)
- Journal Title
  
  Proc.the 16th Computational Mechanics Conference No.03-02
  
  Pages: 665-666
- NAID
  110002489045
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] 配線端部におけるエレクトロマイグレーション損傷支配パラメータを用いた配線物性値の導出2003
- Author(s)
  長谷川昌孝, (笹川和彦, 渡邊祥達, 宇野茂雄, 坂真澄)
- Journal Title
  
  日本機械学会第16回計算力学講演会講演論文集 No.03-26
  
  Pages: 665-666
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] Failure Prediction of the Metal Line in IC Considering Passivation Thickness2003
- Author(s)
  K.Sasagawa (M.Hasegawa, N.Yoshida, M.Saka)
- Journal Title
  
  Proc.the.11th Symposium on Fracture and Fracture Mechanics
  
  Pages: 127-132
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] 保護膜の厚さを考慮した保護膜被覆多結晶配線の断線故障予測2003
- Author(s)
  笹川和彦, (長谷川昌孝, 坂真澄)
- Journal Title
  
  M&M2003日本機械学会材料力学部門講演会講演論文集 No.03-11
  
  Pages: 609-610
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] Evaluation Method of the Threshold Current Density for Electromigration Damage in IC Metal Lines2003
- Author(s)
  M.Hasegawa (K.Sasagawa, M.Saka)
- Journal Title
  
  Proc.the Second Japan-Taiwan Workshop on Mechanical and Aerospace Engineering, Tokyo Institute of Technology & Tohoku University
  
  Pages: 129-137
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] Evaluation Method of the Threshold Current Density for Electromigration Damage in IC Metal Lines2003
- Author(s)
  M.Hasegawa, (K.Sasagawa, M.Saka)
- Journal Title
  
  Proceedings of The Second Japan-Taiwan Workshop on Mechanical and Aerospace Engineering
  
  Pages: 129-137
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] エレクトロマイグレーション2003
- Author(s)
  笹川和彦
- Journal Title
  
  日本実験力学会誌「実験力学」 3・4
  
  Pages: 71-72
- NAID
  10011869583
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] 配線端部のドリフト速度計測に基づいた金属薄膜配線物性値の導出2003
- Author(s)
  長谷川昌孝, (笹川和彦, 宇野茂雄, 坂真澄)
- Journal Title
  
  日本金属学会第2回東北支部大会講演論文集
  
  Pages: 10-11
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] Derivation of the Film Characteristic Constants Based on Drift Velocity Measurement2003
- Author(s)
  M.Hasegawa (K.Sasagawa, S.Uno, M.Saka)
- Journal Title
  
  Proc.the Second Tohoku Division Conference of the JIM
  
  Pages: 10-11
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Journal Article] 保護膜厚さを考慮した集積回路配線の断線故障予測法2003
- Author(s)
  笹川和彦, (長谷川昌孝, 吉田直樹, 坂真澄)
- Journal Title
  
  日本材料学会第11回破壊力学シンポジウム講演論文集
  
  Pages: 127-132
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15560058
[Patent] 分布測定センサ、分布測定センサシステム、分布測定プログラムおよび記録媒体2017
- Inventor(s)
  笹川和彦
- Industrial Property Rights Holder
  弘前大学
- Industrial Property Rights Type
  特許
- Filing Date
  2017
- Overseas
- Data Source
  KAKENHI-PROJECT-16K12946
[Patent] 分布測定センサ，分布測定センサシステム，分布測定プログラムおよび記録媒体2016
- Inventor(s)
  笹川和彦
- Industrial Property Rights Holder
  弘前大学
- Industrial Property Rights Type
  特許
- Industrial Property Number
  2016-216304
- Filing Date
  2016-11-04
- Data Source
  KAKENHI-PROJECT-16K12946
[Patent] ビア接続の多層配線の信頼性を評価する信頼性評価シミュレーションプログラム，ビア接続の多層配線の許容電流密度向上方法およびビア接続の多層配線2012
- Inventor(s)
  笹川和彦
- Industrial Property Rights Holder
  弘前大学
- Industrial Property Rights Type
  特許
- Filing Date
  2012-09-06
- Data Source
  KAKENHI-PROJECT-21360046
[Patent] ビア接続の多層配線の信頼性を評価する信頼性評価シミュレーションプログラム,ビア接続の多層配線の許容電流密度向上方法およびビア接続の多層配線2012
- Inventor(s)
  笹川和彦
- Industrial Property Rights Holder
  弘前大学
- Filing Date
  2012-09-06
- Overseas
- Data Source
  KAKENHI-PROJECT-21360046
[Patent] 接触圧力測定システム2010
- Inventor(s)
  笹川和彦
- Industrial Property Rights Holder
  弘前大学
- Filing Date
  2010-08-05
- Data Source
  KAKENHI-PROJECT-21650146
[Patent] センサ装置および分布測定装置2010
- Inventor(s)
  笹川和彦
- Industrial Property Rights Holder
  弘前大学
- Filing Date
  2010-09-10
- Data Source
  KAKENHI-PROJECT-21650146
[Patent] 金属配線の信頼性評価装置及び方法, 並びに金属配線の信頼性評価のためのプログラムを格納した記録媒体2007
- Inventor(s)
  笹川和彦
- Industrial Property Rights Holder
  科学技術振興機構
- Industrial Property Number
  2007-246243
- Filing Date
  2007-09-21
- Data Source
  KAKENHI-PROJECT-18106003
[Presentation] Contact Stress Measurement on Sacral Skin Surface : Investigating Pressure Injury Development and Progression Mechanisms2023
- Author(s)
  Aya ONO, Kazuhiko SASAGAWA, Kotaro MIURA, Kazuhiro FUJISAKI
- Organizer
  生体医工学シンポジウム2023
- Data Source
  KAKENHI-PROJECT-23K10382
[Presentation] Measurement of contact stresses on lower leg with positioning during robotic surgery2023
- Author(s)
  Yusuke Muraoka, Kazuhiko Sasagawa, Kazuhiro Fujisaki,Kotaro Miura
- Organizer
  生体医工学シンポジウム
- Data Source
  KAKENHI-PROJECT-22K10907
[Presentation] 高密度電流下フレキシブルAg配線の損傷に対する保護膜の影響2022
- Author(s)
  工藤泰河, 笹川和彦, 藤崎和弘
- Organizer
  日本機械学会東北支部第52回学生員卒業研究発表講演会
- Data Source
  KAKENHI-PROJECT-19K04084
[Presentation] 高密度電流によるグラフェンインク配線の損傷2021
- Author(s)
  大坪拓生, 笹川和彦, 森脇健司, 藤﨑和弘
- Organizer
  日本実験力学会2021年度年次講演会
- Data Source
  KAKENHI-PROJECT-19K04084
[Presentation] 酸化インジウムスズ電子配線の高密度電流下における損傷機構の検討2021
- Author(s)
  鈴木雄, 笹川和彦, 森脇健司, 藤﨑和弘
- Organizer
  日本機械学会M&M2021材料力学カンファレンス
- Data Source
  KAKENHI-PROJECT-19K04084
[Presentation] 酸化インジウムスズ電子配線の高密度電流下における損傷評価2021
- Author(s)
  鈴木　雄，森脇健司，笹川和彦，藤崎和弘
- Organizer
  日本機械学会東北学生会第51回学生員卒業研究発表講演会
- Data Source
  KAKENHI-PROJECT-19K04084
[Presentation] フレキシブル基板上に印刷した導電性インク配線の高密度電流負荷試験2021
- Author(s)
  大坪拓生，笹川和彦，森脇健司，藤崎和弘
- Organizer
  日本機械学会東北学生会第51回学生員卒業研究発表講演会
- Data Source
  KAKENHI-PROJECT-19K04084
[Presentation] 圧力センサアレイを用いた前腕部筋活動計測に基づく手指動作の推定2018
- Author(s)
  五十嵐達也, 藤﨑和弘, 笹川和彦, 森脇健司
- Organizer
  日本機械学会東北学生会第48回学生員卒業研究発表講演会
- Data Source
  KAKENHI-PROJECT-16K12946
[Presentation] 接触界面応力計測のための薄型3軸力覚センサの高感度化2017
- Author(s)
  齊藤飛翔, 笹川和彦, 藤﨑和弘, 森脇健司
- Organizer
  日本非破壊検査協会　平成29年度東北支部講演会
- Data Source
  KAKENHI-PROJECT-16K12946
[Presentation] リザーバ形状が微細構造配線のエレクトロマイグレーションしきい電流密度に及ぼす影響2017
- Author(s)
  高谷隆司，水科拓己，笹川和彦，藤﨑和弘，森脇健司
- Organizer
  日本機械学会東北学生会第 47 回学生員卒業研究発表講演会
- Place of Presentation
  東北学院大学（多賀城市）
- Year and Date
  2017-03-08
- Data Source
  KAKENHI-PROJECT-26289001
[Presentation] Study on Damage of Carbon Nanotubes under Electronic Current2017
- Author(s)
  Kazuhiko Sasagawa, Kazuhiro Fujisaki
- Organizer
  Nano Science & Technology 2017
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16K12946
[Presentation] フィルム型三軸応力センサを用いたカテーテル手技の力覚計測2017
- Author(s)
  齊藤飛翔, 森脇健司, 藤﨑和弘, 笹川和彦
- Organizer
  第44回日本臨床バイオメカニクス学会
- Data Source
  KAKENHI-PROJECT-16K12946
[Presentation] 薄型力覚センサを用いた熟練採血手技の評価システムの開発2017
- Author(s)
  笹川和彦，其田雅人，藤崎和弘，森脇健司，萱場広之
- Organizer
  第50回日本生体医工学会東北支部大会
- Place of Presentation
  東北大学カタールサイエンスキャンパスホール，仙台市
- Year and Date
  2017-01-21
- Data Source
  KAKENHI-PROJECT-16K12946
[Presentation] 生体内接触部の圧力・せん断応力計測用薄型センサの開発2017
- Author(s)
  齊藤飛翔，笹川和彦，藤﨑和弘，森脇健司
- Organizer
  日本機械学会東北学生会第 47 回学生員卒業研究発表講演会
- Place of Presentation
  東北学院大学，多賀城市
- Year and Date
  2017-03-08
- Data Source
  KAKENHI-PROJECT-16K12946
[Presentation] 血管内治療デバイス評価用チューブタイプ圧力分布センサの開発2017
- Author(s)
  森脇健司, 藤﨑和弘, 笹川和彦
- Organizer
  日本機械学会第30回バイオエンジニアリング講演会
- Data Source
  KAKENHI-PROJECT-16K12946
[Presentation] ステントー血管モデル間応力測定のためのフィルム型せん断応力センサの開発2017
- Author(s)
  森脇健司，藤崎和弘，笹川和彦
- Organizer
  日本機械学会第29回バイオエンジニアリング講演会
- Place of Presentation
  ウインクあいち，名古屋市
- Year and Date
  2017-01-20
- Data Source
  KAKENHI-PROJECT-16K12946
[Presentation] 折れ曲がりサブミクロン電子配線におけるエレクトロマイグレーション損傷しきい電流密度の評価2016
- Author(s)
  水科拓己，菊池大樹，笹川和彦，藤﨑和弘
- Organizer
  日本機械学会第29回計算力学講演会
- Place of Presentation
  名古屋大学（名古屋市）
- Year and Date
  2016-09-22
- Data Source
  KAKENHI-PROJECT-26289001
[Presentation] 採血手技の運動および力覚の計測2016
- Author(s)
  其田雅人，笹川和彦，藤﨑和弘，森脇健司，萱場広之
- Organizer
  第43回日本臨床バイオメカニクス学会
- Place of Presentation
  北海道立道民活動センターかでる2・7，札幌市
- Year and Date
  2016-10-08
- Data Source
  KAKENHI-PROJECT-16K12946
[Presentation] Development of Sensing System of Three-Axis Stress for Touch Panel Operation2016
- Author(s)
  Renta Kasai, Kazuhiko Sasagawa, Kazuhiro Fujisaki
- Organizer
  The 16th International Conference on Biomedical Engineering
- Place of Presentation
  Stephen Riady Centre, Singapore
- Year and Date
  2016-12-07
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16K12946
[Presentation] Effect of Taper Shape of IC Line on Threshold Current Density of Electromigration Damage2016
- Author(s)
  H. Kikuchi, K. Sasagawa, K. Fujisaki
- Organizer
  Asia-Pacific Conference on Fracture and Strength 2016 (APCFS2016)
- Place of Presentation
  Toyama International Conference Center (Toyama, Japan)
- Year and Date
  2016-09-19
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26289001
[Presentation] 折れ曲がり形状を有する微細電子配線の損傷しきい電流密度の評価2016
- Author(s)
  水科拓己，菊池大樹，笹川和彦，藤﨑和弘
- Organizer
  日本非破壊検査協会平成28年度東北支部講演会
- Place of Presentation
  エル・パーク仙台（仙台市）
- Year and Date
  2016-04-22
- Data Source
  KAKENHI-PROJECT-26289001
[Presentation] 配線形状の異なるバンブー構造配線におけるエレクトロマイグレーション損傷しきい電流密度2016
- Author(s)
  水科拓己, 笹川和彦, 藤﨑和弘
- Organizer
  日本機械学会東北学生会第46回卒業研究発表講演会
- Place of Presentation
  福島大学（福島市）
- Year and Date
  2016-03-04
- Data Source
  KAKENHI-PROJECT-26289001
[Presentation] Evaluation of Allowable Current Density for Electromigration Damage in Via-connected Interconnect2015
- Author(s)
  K. Fujisaki, K. Sasagawa, H. Narita
- Organizer
  17th Electronic Materials and Packaging Conference
- Place of Presentation
  Portland State University, Portland, USA
- Year and Date
  2015-09-02
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-25420002
[Presentation] カーボンナノチューブネットワーク配線の電流による疲労損傷特性2015
- Author(s)
  笹川和彦, 藤﨑和弘, 佐藤俊介, 帷子拓也
- Organizer
  日本材料学会第64期通常総会･学術講演会
- Place of Presentation
  山形大学（米沢市）
- Year and Date
  2015-05-22
- Data Source
  KAKENHI-PROJECT-26289001
[Presentation] An Effective Way to Increase Threshold Current Density against Electromigration of a Metal Line2015
- Author(s)
  Y. Kimura, H. Ikadai, M. Saka, K. Sasagawa, H. Tohmyoh
- Organizer
  11th Int. Conf. Diffusion in Solids and Liquids
- Place of Presentation
  NH Munchen Messe (Munich, Germany)
- Year and Date
  2015-06-22
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26289001
[Presentation] 高密度電流の流れる金属配線の許容電流予測と信頼性向上2015
- Author(s)
  笹川和彦
- Organizer
  大学連携新技術説明会
- Place of Presentation
  JST東京本部別館ホール（東京・市ヶ谷）
- Year and Date
  2015-03-10
- Data Source
  KAKENHI-PROJECT-26289001
[Presentation] Evaluation of Allowable Current Density for Electromigration Damage in Via-connected Interconnect2015
- Author(s)
  K. Fujisaki, K. Sasagawa, H. Narita
- Organizer
  17th International Conference on Electronics Materials and Packaging (EMAP2015)
- Place of Presentation
  Portland State University (Portland, USA)
- Year and Date
  2015-09-01
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26289001
[Presentation] Damage of CNT Network Structure under Accelerated Condition2015
- Author(s)
  S. Sato, K. Fujisaki, K. Sasagawa, T. Katabira
- Organizer
  International Conference on Advanced Technology in Experimental Mechanics 2015 (ATEM 2015)
- Place of Presentation
  Loisir Hotel Toyohashi (Toyohashi, Japan)
- Year and Date
  2015-10-04
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26289001
[Presentation] Damage Observation of CNT Networked Structure under High Current Density2015
- Author(s)
  K. Fujisaki, K. Sasagawa, D. Narita
- Organizer
  ASME 2015 InterPACK/ICNMM
- Place of Presentation
  The Fairmont San Francisco Hotel (San Francisco, USA)
- Year and Date
  2015-07-06
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26289001
[Presentation] しきい電流密度に着目した金属薄膜配線におけるエレクトロマイグレーション抑制に関する考察2015
- Author(s)
  筏井大斗，木村康裕，坂　真澄，笹川和彦，燈明泰成
- Organizer
  日本機械学会東北学生会　第45回卒業研究発表講演会
- Place of Presentation
  八戸工業高等専門学校（青森県八戸市）
- Year and Date
  2015-03-10
- Data Source
  KAKENHI-PROJECT-26289001
[Presentation] Damage of CNT Network Structure under Accelerated Condition2015
- Author(s)
  S. Sato, K. Fujisaki, K. Sasagawa, T. Katabira
- Organizer
  International Conference on Advanced Technology in Experimental Mechanics 2015
- Place of Presentation
  Loisir Hotel Toyohashi, Toyohashi, Japan
- Year and Date
  2015-10-05
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-25420002
[Presentation] カーボンナノチューブネットワーク配線の電流による疲労損傷特性2015
- Author(s)
  笹川和彦, 藤崎和弘, 佐藤俊介, 帷子拓也
- Organizer
  日本材料学会第64期通常総会･学術講演会
- Place of Presentation
  山形大学（米沢市）
- Year and Date
  2015-05-23
- Data Source
  KAKENHI-PROJECT-25420002
[Presentation] Damage Observation of CNT Networked Structure under High Current Density2015
- Author(s)
  K. Fujisaki, K. Sasagawa, D. Narita
- Organizer
  ASME InterPACK/ICNMM2015
- Place of Presentation
  The Fairmont San Francisco Hotel, San Francisco, USA
- Year and Date
  2015-07-06
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-25420002
[Presentation] 電子デバイス配線CNTの強度信頼性評価法の構築2014
- Author(s)
  笹川和彦
- Organizer
  半導体理工学研究センターSTARCワークショップ2014
- Place of Presentation
  新横浜国際ホテル（横浜）
- Year and Date
  2014-09-03
- Data Source
  KAKENHI-PROJECT-26289001
[Presentation] 電子デバイス配線におけるエレクトロマイグレーション損傷の強度信頼性評価2014
- Author(s)
  笹川和彦
- Organizer
  日本機械学会RC265「高密度エレクトロニクス実装における信頼性評価と熱制御に関する研究分科会」
- Place of Presentation
  日本機械学会会議室（東京）
- Year and Date
  2014-09-24
- Data Source
  KAKENHI-PROJECT-26289001
[Presentation] 電子デバイス配線CNTの強度信頼性評価法の構築2014
- Author(s)
  笹川　和彦
- Organizer
  STARCワークショップ2014
- Place of Presentation
  新横浜国際ホテル（横浜市）
- Year and Date
  2014-09-03
- Data Source
  KAKENHI-PROJECT-25420002
[Presentation] パブティックインターフェースのための電気活性高分子膜アクチュエータの作製2013
- Author(s)
  小山拓馬,笹川和彦,藤崎和弘
- Organizer
  日本機械学会東北支部第48期総会・講演会
- Place of Presentation
  東北大学(仙台市)
- Year and Date
  2013-03-15
- Data Source
  KAKENHI-PROJECT-23650344
[Presentation] 材料システムとしての電子機器安全性と生体機能性の評価2013
- Author(s)
  笹川和彦
- Organizer
  平成24年度日本材料学会東北支部総会・材料フォーラム講演会(招待講演)
- Place of Presentation
  カレッジプラザ(秋田市)
- Year and Date
  2013-03-25
- Data Source
  KAKENHI-PROJECT-21360046
[Presentation] 微細電子配線の安全性評価と生体の応力評価2013
- Author(s)
  笹川和彦
- Organizer
  日本非破壊検査協会東北支部「支部会・講演会」(招待講演)
- Place of Presentation
  青年文化センター(仙台市)
- Year and Date
  2013-04-26
- Data Source
  KAKENHI-PROJECT-21360046
[Presentation] 微細電子配線の安全性評価と生体の応力評価2013
- Author(s)
  笹川和彦
- Organizer
  日本非破壊検査協会東北支部「支部会・講演会」
- Place of Presentation
  青年文化センター(仙台市)
- Year and Date
  2013-04-26
- Data Source
  KAKENHI-PROJECT-23650344
[Presentation] 電子デバイス用カーボンナノチューブの高密度電流下における強度特性2013
- Author(s)
  笹川和彦, 藤崎和弘, 鵜沼潤, 東亮汰
- Organizer
  2013年度日本機械学会年次大会
- Place of Presentation
  岡山大学（岡山市）
- Data Source
  KAKENHI-PROJECT-25420002
[Presentation] 材料システムとしての電子機器安全性と生体機能性の評価2013
- Author(s)
  笹川和彦
- Organizer
  平成24年度日本材料学会東北支部総会・材料フォーラム講演会
- Place of Presentation
  カレッジプラザ(秋田市)
- Year and Date
  2013-03-25
- Data Source
  KAKENHI-PROJECT-23650344
[Presentation] 高密度電流下でのカーボンナノチューブの強度に及ぼす周囲環境の影響2013
- Author(s)
  東亮汰,笹川和彦,藤崎和弘,鵜沼潤
- Organizer
  日本機械学会東北学生会第43回学生員卒業研究発表講演会
- Place of Presentation
  一関工業高等専門学校(一関市)
- Year and Date
  2013-03-11
- Data Source
  KAKENHI-PROJECT-21360046
[Presentation] Evaluation of Threshold Current Density in Interconnect with Reservoir Structure Using Numerical Modeling of Electromigration Damage2012
- Author(s)
  K. Sasagawa and T. Yanagi
- Organizer
  2012 International Conference on Solid State Devices and Materials
- Place of Presentation
  Kyoto International Conference Center (Kyoto, Japan)
- Data Source
  KAKENHI-PROJECT-21360046
[Presentation] 薄膜状導電性高分子材料を用いたアクチュエータ機構の開発2012
- Author(s)
  小山拓馬,横山紘太郎,笹川和彦
- Organizer
  日本機械学会東北学生会第42回学生員卒業研究発表講演会
- Place of Presentation
  福島工業高等専門学校(いわき市)
- Year and Date
  2012-03-06
- Data Source
  KAKENHI-PROJECT-23650344
[Presentation] 薄膜状導電性高分子材料を用いたアクチュエータ機構の開発2012
- Author(s)
  小山拓馬, 横山紘太郎, 笹川和彦
- Organizer
  日本機械学会東北学生会第42回学生員卒業研究発表講演会
- Place of Presentation
  福島工業高等専門学校（いわき市）
- Data Source
  KAKENHI-PROJECT-23650344
[Presentation] 薄くてしなやかな接触圧力およびせん断応力センサの開発2012
- Author(s)
  小山拓馬,時吉康太,笹川和彦
- Organizer
  日本機械学会第23回バイオフロンティア講演会
- Place of Presentation
  弘前文化センター(弘前市)
- Data Source
  KAKENHI-PROJECT-23650344
[Presentation] Development of Numerical Simulation of Electromigration Damage in Cu Multilevel Interconnection with Reservoir Structure2012
- Author(s)
  K. Sasagawa and T. Yanagi
- Organizer
  12th International Workshop on Stress-Induced Phenomena in Microelectronics
- Place of Presentation
  Co-op Inn Kyoto (Kyoto, Japan)
- Data Source
  KAKENHI-PROJECT-21360046
[Presentation] 薄くてしなやかな接触圧力およびせん断応力センサの開発2012
- Author(s)
  小山拓馬, 時吉康太, 笹川和彦
- Organizer
  日本機械学会第23回バイオフロンティア講演会
- Place of Presentation
  弘前文化センター（弘前市）
- Data Source
  KAKENHI-PROJECT-23650344
[Presentation] 皮膚上に作用する接触圧力およびせん断圧力の分布測定システム2011
- Author(s)
  横山鉱太郎, 笹川和彦, 時吉康太, 小山拓馬, 塚原智
- Organizer
  第38回日本臨床バイオメカニクス学会
- Place of Presentation
  神戸
- Data Source
  KAKENHI-PROJECT-21500462
[Presentation] 内視鏡手下への適用を目的とした高空間分解能接触圧力センサシステム2011
- Author(s)
  横山紘太郎,石川諒,笹川和彦
- Organizer
  日本非破壊検査協会平成23年度秋季講演大会
- Place of Presentation
  淡路夢舞台国際会議場(淡路市)
- Year and Date
  2011-10-18
- Data Source
  KAKENHI-PROJECT-23650344
[Presentation] 皮膚上に作用する接触圧力およびせん断応力の分布計測システム2011
- Author(s)
  横山紘太郎, 笹川和彦, 時吉康太, 小山拓馬, 塚原　智
- Organizer
  第38回　日本臨床バイオメカニクス学会
- Place of Presentation
  神戸ポートピアホテル（神戸市）
- Data Source
  KAKENHI-PROJECT-23650344
[Presentation] Development of Simulation of Nanostructure Production due to Electromigration Considering Specimen's Damage2011
- Author(s)
  K.Sasagawa, T.Abo, J.Unuma
- Organizer
  4th JSME/ASME International Conference on Materials and Processing
- Place of Presentation
  Corvallis, Oregon, USA
- Year and Date
  2011-06-16
- Data Source
  KAKENHI-PROJECT-21360046
[Presentation] 皮膚上に作用する接触圧力およびせん断応力の分布計測システム2011
- Author(s)
  横山紘太郎,笹川和彦,時吉康太,小山拓馬,塚原智
- Organizer
  第38回日本臨床バイオメカニクス学会
- Place of Presentation
  神戸ポートピアホテル(神戸市)
- Year and Date
  2011-11-18
- Data Source
  KAKENHI-PROJECT-23650344
[Presentation] 皮膚上に作用する接触圧力およびせん断応力の分布計測システム2011
- Author(s)
  笹川和彦
- Organizer
  第38回臨床バイオメカニクス学会
- Place of Presentation
  神戸
- Data Source
  KAKENHI-PROJECT-21500462
[Presentation] Change in Damage Mechanism of MWCNTs under Electric Current with Oxygen Concentration2011
- Author(s)
  K. Sasagawa and J. Unuma
- Organizer
  13th International Conference on Electric Materials and Packaging
- Place of Presentation
  Kyoto Garden Palace, Kyoto
- Year and Date
  2011-12-13
- Data Source
  KAKENHI-PROJECT-21360046
[Presentation] 内視鏡手下への適用を目的とした高空間分解能接触圧力センサシステム2011
- Author(s)
  横山紘太郎, 石川　諒, 笹川和彦
- Organizer
  日本非破壊検査協会　平成23年度秋季講演大会
- Place of Presentation
  淡路夢舞台国際会議場（淡路市）
- Data Source
  KAKENHI-PROJECT-23650344
[Presentation] プリント基板Cu配線のエレクトロマイグレーション損傷に関する物性定数の導出(日本非破壊検査協会新進賞受賞:鵜沼潤)2011
- Author(s)
  鵜沼潤, 阿保雄大, 笹川和彦, 五明利雄
- Organizer
  日本非破壊検査協会平成23年度秋季講演大会
- Place of Presentation
  淡路夢舞台国際会議場(淡路市)
- Year and Date
  2011-10-18
- Data Source
  KAKENHI-PROJECT-21360046
[Presentation] Effect of Oxygen Concentration on Damage Mechanism of Carbon Nanotubes under High Current Density2011
- Author(s)
  K.Sasagawa, J.Unuma, T.Abo
- Organizer
  ASME 2011 Pacific Rim Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Systems, MEMS and NEMS (InterPACK2011)
- Place of Presentation
  Portland, Oregon, USA
- Year and Date
  2011-07-06
- Data Source
  KAKENHI-PROJECT-21360046
[Presentation] プリント基板Cu配線のエレクトロマイグレーション損傷に関する物性定数の導出(日本非破壊検査協会新進賞受賞:鵜沼潤)2011
- Author(s)
  鵜沼潤, 阿保雄大, 笹川和彦, 五明利雄
- Organizer
  日本非破壊検査協会平成23年度秋季講演大会
- Place of Presentation
  淡路夢舞台国際会議場(淡路市)
- Year and Date
  2011-10-18
- Data Source
  KAKENHI-PROJECT-21360046
[Presentation] ツリー構造配線のエレクトロマイグレーション損害における配線形状の影響(日本機械学会若手優秀講演フェロー賞受賞)2010
- Author(s)
  阿保雄大, 笹川和彦
- Organizer
  日本機械学会東北支部第46期秋季講演会
- Place of Presentation
  秋田大学(秋田市)
- Year and Date
  2010-09-24
- Data Source
  KAKENHI-PROJECT-21360046
[Presentation] 異よる創製条件下のエレクトロマイグレーションによる金属ナノストラクチャー創製の数値シミュレーション2010
- Author(s)
  笹川和彦, 阿保雄大, 鵜沼潤
- Organizer
  日本機械学会2010年度年次大会
- Place of Presentation
  名古屋工業大学(名古屋市)
- Year and Date
  2010-09-06
- Data Source
  KAKENHI-PROJECT-21360046
[Presentation] 生体への適用を目的とした接触圧力およびせん断応力の同時測定センサの開発2010
- Author(s)
  時吉康太, 笹川和彦
- Organizer
  第37回日本臨床バイオメカニクス学会
- Place of Presentation
  国立京都国際会館(京都市)
- Year and Date
  2010-11-01
- Data Source
  KAKENHI-PROJECT-21650146
[Presentation] 高密度電流下におけるカーボンナノチューブの損傷機構に関する研究2010
- Author(s)
  鵜沼潤, 笹川和彦, 阿保雄大
- Organizer
  日本機械学会M＆M2010材料力学カンファレンス
- Place of Presentation
  長岡技術科学大学(長岡市)
- Year and Date
  2010-10-10
- Data Source
  KAKENHI-PROJECT-21360046
[Presentation] 内視鏡手術へ適用可能な高空間分解能接触圧力センサ2010
- Author(s)
  笹川和彦, 石川諒, 横山絋太郎, 大里泰彦
- Organizer
  日本機械学会M&M2010材料力学カンファレンス
- Place of Presentation
  長岡技術科学大学(長岡市)
- Year and Date
  2010-10-11
- Data Source
  KAKENHI-PROJECT-21650146
[Presentation] 接触圧力およびせん断応力の分布測定を可能にするセンサシステムの開発2010
- Author(s)
  時吉康太, 笹川和彦, 横山鉱太郎
- Organizer
  日本機械学会
- Place of Presentation
  長岡
- Data Source
  KAKENHI-PROJECT-21500462
[Presentation] 異なる創製条件下のエレクトロマイグレーションによる金属ナノストラクチャー創製の数値シミュレーション2010
- Author(s)
  笹川和彦, 阿保雄大, 鵜沼潤
- Organizer
  日本機械学会2010年度年次大会
- Place of Presentation
  名古屋工業大学(名古屋市)
- Year and Date
  2010-09-06
- Data Source
  KAKENHI-PROJECT-18106003
[Presentation] 内視鏡に格納可能な生体用接触圧力センサの開発2010
- Author(s)
  石川諒, 横山紘太郎, 大里泰彦, 笹川和彦
- Organizer
  日本機械学会東北学生会第40回学生員卒業研究発表講演会
- Place of Presentation
  秋田大学(秋田市)
- Year and Date
  2010-03-05
- Data Source
  KAKENHI-PROJECT-21650146
[Presentation] ツリー構造配線のエレクトロマイグレーション損傷しきい電流密度における配線形状の影響2010
- Author(s)
  阿保雄大, 笹川和彦
- Organizer
  日本機械学会東北支部第46期秋季講演会
- Place of Presentation
  秋田大学(秋田市)(日本機械学会若手優秀講演フェロー賞受賞)
- Year and Date
  2010-09-24
- Data Source
  KAKENHI-PROJECT-18106003
[Presentation] Evaluation of Threshold Current Density of Electromigration Damage in Interconnect Tree with Angled Cu Lines2010
- Author(s)
  K.Sasagawa, T.Abo
- Organizer
  12th International Conference on Electronics Materials and Packaging(EMAP2010)
- Place of Presentation
  Orchard Hotel, Singapore
- Year and Date
  2010-10-26
- Data Source
  KAKENHI-PROJECT-21360046
[Presentation] 電子デバイスと生体の材料システムを評価する2010
- Author(s)
  笹川和彦
- Organizer
  平成22年度化学系学協会東北大会
- Place of Presentation
  岩手大学工学部(盛岡市)(招待講演)
- Year and Date
  2010-09-26
- Data Source
  KAKENHI-PROJECT-18106003
[Presentation] Evaluation of Threshold Current Density of Electromigration Damage in Interconnect Tree with Angled Cu Lines2010
- Author(s)
  K.Sasagawa, T.Abo
- Organizer
  12th International Conference on Electronics Materials and Packaging (EMAP2010)
- Place of Presentation
  Orchard Hotel, Singapore
- Year and Date
  2010-10-26
- Data Source
  KAKENHI-PROJECT-18106003
[Presentation] 電子デバイスと生体の材料システムを評価する2010
- Author(s)
  笹川和彦
- Organizer
  平成22年度化学系学協会東北大会
- Place of Presentation
  岩手大学工学部(盛岡市) 招待講演
- Year and Date
  2010-09-26
- Data Source
  KAKENHI-PROJECT-21360046
[Presentation] 高密度電流下におけるカーボンナノチューブ損傷に対する雰囲気環境の影響2010
- Author(s)
  笹川和彦, 阿保雄大, 鵜沼潤
- Organizer
  日本機械学会東北支部第45期総会・講演会
- Place of Presentation
  東北大学(仙台市)
- Year and Date
  2010-03-12
- Data Source
  KAKENHI-PROJECT-21360046
[Presentation] 生体内の接触圧力およびせん断応力の同時測定センサの開発2010
- Author(s)
  笹川和彦, 横山紘太郎, 時吉康太
- Organizer
  日本機械学会東北支部第45期総会・講演会
- Place of Presentation
  東北大学(仙台市)
- Year and Date
  2010-03-12
- Data Source
  KAKENHI-PROJECT-21650146
[Presentation] 高密度電流下におけるカーボンナノチューブ損傷に対する雰囲気環境の影響2010
- Author(s)
  笹川和彦, 阿保雄大, 鵜沼潤
- Organizer
  日本機械学会東北支部第45期総会・講演会
- Place of Presentation
  東北大学(仙台市)
- Year and Date
  2010-03-12
- Data Source
  KAKENHI-PROJECT-18106003
[Presentation] 高密度電流下におけるカーボンナノチューブの損傷機構に関する研究2010
- Author(s)
  鵜沼潤, 笹川和彦, 阿保雄大
- Organizer
  日本機械学会M&M2010材料力学カンファレンス
- Place of Presentation
  長岡技術科学大学(長岡市)
- Year and Date
  2010-10-10
- Data Source
  KAKENHI-PROJECT-21360046
[Presentation] 電子デバイスと生体の材料システムを評価する2010
- Author(s)
  笹川和彦
- Organizer
  平成22年度化学系学協会東北大会(招待講演)
- Place of Presentation
  岩手大学工学部(盛岡市)
- Year and Date
  2010-09-26
- Data Source
  KAKENHI-PROJECT-21360046
[Presentation] 内視鏡視下手術への使用が可能な生体用接触圧力分布測定システムの開発2010
- Author(s)
  笹川和彦, 大里泰彦, 横山紘太郎, 石川諒
- Organizer
  日本機械学会東北支部第45期総会・講演会
- Place of Presentation
  東北大学(仙台市)
- Year and Date
  2010-03-12
- Data Source
  KAKENHI-PROJECT-21650146
[Presentation] 内視鏡手術への応用を目的とした高空間分解能接触圧力センサシステムの開発2010
- Author(s)
  石川諒, 笹川和彦, 横山絋太郎, 大里泰彦
- Organizer
  第37回日本臨床バイオメカニクス学会
- Place of Presentation
  国立京都国際会館(京都市)
- Year and Date
  2010-11-01
- Data Source
  KAKENHI-PROJECT-21650146
[Presentation] ツリー構造配線のエレクトロマイグレーション損傷しきい電流密度における配線形状の影響(日本機械学会若手優秀講演フェロー賞受賞:阿保雄大)2010
- Author(s)
  阿保雄大, 笹川和彦
- Organizer
  日本機械学会東北支部第46期秋季講演会
- Place of Presentation
  秋田大学(秋田市)
- Year and Date
  2010-09-24
- Data Source
  KAKENHI-PROJECT-21360046
[Presentation] 導電性高分子膜を用いた接触圧力分布センサの開発2010
- Author(s)
  時吉康太, 横山紘太郎, 大里泰彦, 笹川和彦
- Organizer
  日本機械学会東北学生会第40回学生員卒業研究発表講演会
- Place of Presentation
  秋田大学(秋田市)
- Year and Date
  2010-03-05
- Data Source
  KAKENHI-PROJECT-21650146
[Presentation] 接触圧力およびせん断応力の分布測定を可能にするセンサシステムの開発2010
- Author(s)
  時吉康太, 笹川和彦, 横山紘太郎
- Organizer
  日本機械学会M&M2010材料力学カンファレンス
- Place of Presentation
  長岡技術科学大学(長岡市)
- Year and Date
  2010-10-10
- Data Source
  KAKENHI-PROJECT-21650146
[Presentation] ツリー構造Cu配線におけるエレクトロマイグレーション損傷しきい電流密度の数値シミュレーションの開発2009
- Author(s)
  笹川和彦, 桐田聡彦, 阿保雄大, アブドルハフィズ
- Organizer
  応用物理学会薄膜・表面物理分科会LSIにおける原子輸送・応力問題第14回研究会
- Place of Presentation
  東京工業大学(東京)
- Year and Date
  2009-07-27
- Data Source
  KAKENHI-PROJECT-21360046
[Presentation] 脛骨粗面外側偏位が内側膝蓋大腿靭帯再建術後の膝蓋大腿関節接触圧に及ぼす影響2009
- Author(s)
  津田英一, 石橋恭之, 山本祐司, 塚田晴彦, 佐々木規博, 藤哲, 笹川和彦
- Organizer
  第36回日本臨床バイオメカニクス学会
- Place of Presentation
  ひめぎんホール(松山市)
- Year and Date
  2009-10-17
- Data Source
  KAKENHI-PROJECT-21650146
[Presentation] 試験片の損傷を考慮したエレクトロマイグレーションによる金属ナノストラクチャー創製の数値シミュレーション2009
- Author(s)
  笹川和彦, 桐田聡彦, 阿保雄大, アブドルハフィズ
- Organizer
  日本機械学会2009年度年次大会
- Place of Presentation
  岩手大学(盛岡市)
- Year and Date
  2009-09-15
- Data Source
  KAKENHI-PROJECT-18106003
[Presentation] 試験片の損傷を考慮したエレクトロマイグレーションによる金属ナノストラクチャー創製の数値シミュレーション2009
- Author(s)
  笹川和彦, 桐田聡彦, 阿保雄大, アブドルハフィズ
- Organizer
  日本機械学会2009年度年次大会
- Place of Presentation
  岩手大学(盛岡市)
- Year and Date
  2009-09-15
- Data Source
  KAKENHI-PROJECT-21360046
[Presentation] ツリー構造Cu配線におけるエレクトロマイグレーション損傷しきい電流密度の数値シミュレーションの開発2009
- Author(s)
  笹川和彦, 桐田聡彦, 阿保雄大, アブドルハフィズ
- Organizer
  応用物理学会薄膜・表面物理分科会LSIにおける原子輸送・応力問題第14回研究会
- Place of Presentation
  東京工業大学(東京)
- Year and Date
  2009-07-27
- Data Source
  KAKENHI-PROJECT-18106003
[Presentation] Effect of Passivation Material on Characteristics of Electromigration Damage in Integrated Circuit Al Lines2008
- Author(s)
  N. Sawajiri (S. Fukushi, A. Kirita and K. Sasagawa)
- Organizer
  2008 Annual Meeting of JSME Tohoku Regional Student Division
- Place of Presentation
  Hachinohe/Hachinohe Institute of Technology
- Year and Date
  2008-03-07
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] Formation of Metallic micro/nanomaterials by utilizing migration phenomena and enhancement of their functions2008
- Author(s)
  M. Saka, H. Tohmyoh, M. Muraoka, Y. Ju, K. Sasagawa
- Organizer
  The 6th International Forum on Advanced Material Science and Technology
- Place of Presentation
  Hong Kong, China
- Year and Date
  2008-06-12
- Data Source
  KAKENHI-PROJECT-18106003
[Presentation] Threshold Current Density of Electromigration Damage in Bamboo Lines with Two-Dimensional Shape2008
- Author(s)
  S. Fukushi (K. Sasagawa)
- Organizer
  43th JSME Tohoku Division Annual Meeting
- Place of Presentation
  Sendai/Tohoku Univ.
- Year and Date
  2008-03-15
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] 多結晶AI配線におけるエレクトロマイグレーション損傷しきい電流密度の実験的評価2008
- Author(s)
  桐田聡彦(福士翔大, 山路尚, 笹川和彦)
- Organizer
  日本機械学会東北支部第43期総会・講演会
- Place of Presentation
  仙台/東北大学
- Year and Date
  2008-03-15
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] Formation of metallic micro/nanomaterials by utilizing migration phenomena and enhancement of their functions2008
- Author(s)
  M. Saka, H. Tohmyoh, M. Muraoka, Y. Ju, K. Sasagawa
- Organizer
  IFAMST 2008
- Place of Presentation
  Hong Kong, China
- Year and Date
  2008-06-12
- Data Source
  KAKENHI-PROJECT-18106003
[Presentation] 二次元形状が異なるバンブー構造配線におけるエレクトロマイグレーション損傷のしきい電流密度2008
- Author(s)
  福士翔大(笹川和彦)
- Organizer
  日本機械学会東北支部第43期総会・講演会
- Place of Presentation
  仙台/東北大学
- Year and Date
  2008-03-15
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] 多結晶A1配線におけるエレクトロマイグレーション損傷しきい電流密度の実験的評価2008
- Author(s)
  桐田聡彦(福士翔大, 山路尚, 笹川和彦)
- Organizer
  日本機械学会東北支部第43期総会・講演会
- Place of Presentation
  仙台/東北大学
- Year and Date
  2008-03-15
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] Experimental Estimation of Threshold Current Density of Electromigration Damage in Polycrystalline Al Line2008
- Author(s)
  A. Kirita (S. Fukushi, N. Yamaji and K. Sasagawa)
- Organizer
  43th JSME Tohoku Division Annual Meeting
- Place of Presentation
  Sendai/Tohoku Univ.
- Year and Date
  2008-03-15
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] 半導体A1配線におけるエレクトロマイグレーション損傷特性に及ぼす保護膜の影響2008
- Author(s)
  沢尻直柔(福士翔大, 桐田聡彦, 笹川和彦)
- Organizer
  日本機械学会東北学生会第38回卒業研究発表講演会
- Place of Presentation
  八戸/八戸工業大学
- Year and Date
  2008-03-07
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] エレクトロマイグレーションを利用したナノワイヤ創製の数値シミュレーション2007
- Author(s)
  笹川和彦(福士翔大, Yuxin Sun, 坂真澄)
- Organizer
  日本機械学会2007年度年次大会
- Place of Presentation
  大阪/関西大学
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] 電子デバイス銅配線におけるエレクトロマイグレーションの支配的拡散経路に関する研究2007
- Author(s)
  笹川和彦(桐田聡彦, 福士翔大)
- Organizer
  日本機械学会2007年度年次大会
- Place of Presentation
  大阪/関西大学
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] Investigation on Dominant Path of Electromigration Diffusion in Copper Lines of Electronic Devices2007
- Author(s)
  K. Sasagawa (A. Kirita and S. Fukushi)
- Organizer
  Mechanical Engineering Congress, 2007 Japan
- Place of Presentation
  Osaka/Kansai Univ.
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] 金属ナノワイヤの創製と応用のためのいくつかの基礎技術2007
- Author(s)
  坂真澄(笹川和彦, 巨陽, 村岡幹夫, 燈明泰成)
- Organizer
  日本学術振興会将来加工技術第136委員会第21回研究会
- Place of Presentation
  弘済会館(千代田区)
- Year and Date
  2007-08-24
- Data Source
  KAKENHI-PROJECT-18106003
[Presentation] Numerical Simulation for Production of Nanowire Using Electromigration2007
- Author(s)
  K. Sasagawa (S. Fukushi, Y. Sun and M. Saka)
- Organizer
  Mechanical Engineering Congress, 2007 Japan
- Place of Presentation
  Osaka/Kansai Univ.
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] エレクトロマイグレーションを利用したナノワイヤ創製の数値シミュレーション2007
- Author(s)
  笹川和彦(福士翔大, Yuxin Sun, 坂真澄)
- Organizer
  日本機械学会2007年度年次大会
- Place of Presentation
  関西大学千里山キャンパス(吹田市)
- Year and Date
  2007-09-11
- Data Source
  KAKENHI-PROJECT-18106003
[Presentation] 電子デバイス銅配線におけるエレクトロマイグレーション損傷のメカニズム解明に関する基礎研究2007
- Author(s)
  桐田聡彦(福士翔大, 笹川和彦)
- Organizer
  日本機械学会東北学生会第37回卒業研究発表講演会
- Place of Presentation
  弘前/弘前大学
- Year and Date
  2007-03-05
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] Evaluation of Threshold Current Density of Electromigration Damage in Metal Line of Electronic Devices2007
- Author(s)
  K. Sasagawa (S. Fukushi and N. Yamaji)
- Organizer
  13th Symposium on Fracture and Fracture Mechanics
- Place of Presentation
  Atami/KKR Hotel Atami
- Year and Date
  2007-12-17
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] Preliminary Study on Clarification of Mechanism of Electromigration Damage in Copper Lines of Electronic Devices2007
- Author(s)
  A. Kirita (S. Fukushi and K. Sasagawa)
- Organizer
  2007 Annual Meeting of JSME Tohoku Regional Student Division
- Place of Presentation
  Hirosaki/Hirosaki Univ.
- Year and Date
  2007-03-05
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] 集積回路配線のエレクトロマイグレーション損傷に対するしきい電流密度評価2007
- Author(s)
  笹川和彦(福士翔大, 山路尚)
- Organizer
  第13回破壊力学シンポジウム
- Place of Presentation
  熱海/KKRホテル熱海
- Year and Date
  2007-12-17
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] 電子デバイス銅配線におけるエレクトロマイグレーションの支配的拡散経路に関する研究2007
- Author(s)
  笹川和彦(桐田聡彦, 福士翔大)
- Organizer
  日本機械学会2007年度年次大会
- Place of Presentation
  関西大学千里山キャンパス(吹田市)
- Year and Date
  2007-09-12
- Data Source
  KAKENHI-PROJECT-18106003
[Presentation] 半導体集積回路配線におけるエレクトロマイグレーション損傷しきい電流密度の評価2006
- Author(s)
  笹川和彦(山路尚, 福士翔大)
- Organizer
  エレクトロニクス実装学会 MES2006第16回マイクロエレクトロニクスシンポジウム
- Place of Presentation
  大阪/大阪大学
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] Effect of Line-shape on Threshold Current Density in Polycrystalline Lines2006
- Author(s)
  N. Yamaji (K. Sasagawa)
- Organizer
  41th JSME Tohoku Division Annual Meeting
- Place of Presentation
  Sendai/Tohoku Univ.
- Year and Date
  2006-03-14
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] Threshold Current Density of Electromigration Damage in Polycrystalline and Bamboo Al Lines2006
- Author(s)
  K. Sasagawa (N. Yamaji and S. Fukushi)
- Organizer
  12th Conf. Atomic Transportation and Stress Problem in LSI Metallization
- Place of Presentation
  Kyoto/Paruru Plaza Kyoto
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] 折れ曲がるバンブー構造配線のエレクトロマイグレーション損傷しきい電流密度2006
- Author(s)
  笹川和彦(山路尚, 福士翔大)
- Organizer
  日本機械学会2006年次大会
- Place of Presentation
  熊本/熊本大学
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] 多結晶およびバンブー構造A1配線におけるエレクトロマイグレーション損傷しきい電流密度2006
- Author(s)
  笹川和彦(山路尚, 福士翔大)
- Organizer
  応用物理学会薄膜・表面物理分科会第12回LSI配線における原子輸送・応力問題研究会
- Place of Presentation
  京都/ぱ・る・るプラザ京都
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] エレクトロマイグレーション損傷と数値シミュレーションによる信頼性評価法2006
- Author(s)
  笹川和彦
- Organizer
  日本材料学会第43回X線材料強度に関する討論会
- Place of Presentation
  東京/東京都大田区産業プラザ
- Year and Date
  2006-12-01
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] Effect of Line-Shape on Threshold Current Density of Electromigration Damage in Integrated Circuit Lines2006
- Author(s)
  S. Fukushi (N. Yamaji and K. Sasagawa)
- Organizer
  2006 Annual Meeting of JSME Tohoku Regional Student Division
- Place of Presentation
  Iwaki/waki Meisei Univ.
- Year and Date
  2006-03-04
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] Evaluation of Threshold Current Density of Electromigration Damage in Metal Line of Integrated Circuit2006
- Author(s)
  K. Sasagawa (N. Yamaji and S. Fukushi)
- Organizer
  16th Micro Electronics Symposium
- Place of Presentation
  Osaka/Osaka Univ. Convention Center
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] Threshold Current Density of Electromigration Damage in Angled Bamboo Lines2006
- Author(s)
  K. Sasagawa (N. Yamaji and S. Fukushi)
- Organizer
  Mechanical Engineering Congress, 2006 Japan
- Place of Presentation
  Kumamoto/Kumamoto Univ
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] 多結晶配線における配線二次元形状がしきい電流密度に及ぼす影響2006
- Author(s)
  山路尚(笹川和彦)
- Organizer
  日本機械学会東北支部第41期総会・講演会
- Place of Presentation
  仙台/東北大学
- Year and Date
  2006-03-14
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] 半導体集積回路配線のエレクトロマイグレーション損傷しきい電流に及ぼす配線形状の影響2006
- Author(s)
  福士翔大(山路尚, 笹川和彦)
- Organizer
  日本機械学会東北学生会第36回卒業研究発表講演会
- Place of Presentation
  いわき/いわき明星大学
- Year and Date
  2006-03-04
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] Electromigration Damage in LSI Metal Lines and Evaluation Method for Its Reliability by Means of Numerical Simulation2006
- Author(s)
  K. Sasagawa
- Organizer
  2006 JSMS Conference The 43rd Workshop X-Ray Studies on Mechanical Behavior of Materals
- Place of Presentation
  Tokyo/Plaza Industry Ota
- Year and Date
  2006-12-01
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] バンブー配線の二次元形状がエレクトロマイグレーション損傷のしきい電流に及ぼす影響2005
- Author(s)
  笹川和彦(宇野茂雄, 山路尚, 坂真澄)
- Organizer
  日本機械学会2005年次大会
- Place of Presentation
  東京/電気通信大学
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] 二次元形状の多結晶配線におけるエレクトロマイグレーション損傷しきい電流密度2005
- Author(s)
  笹川和彦(山路尚, 宇野茂雄)
- Organizer
  日本機械学会第18回計算力学講演会
- Place of Presentation
  つくば/筑波大学
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] Study on Effect of Two-Dimensional Line-Shape of Bamboo Lines on Threshold Current Density of Electromigration Damage2005
- Author(s)
  K. Sasagawa (S. Uno, N. Yamaji and M. Saka)
- Organizer
  Mechanical Engineering Congress in Japan 05
- Place of Presentation
  Tokyo/the University of Electro-Communications
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] バンブー配線における配線二次元形状がエレクトロマイグレーション損傷しきい電流密度に及ぼす影響2005
- Author(s)
  笹川和彦(宇野茂雄, 山路尚, 坂真澄)
- Organizer
  応用物理学会薄膜・表面物理分科会第11回LSI配線における原子輸送・応力問題研究会
- Place of Presentation
  東京/東京工業大学
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] Threshold Current Density of Electromigration Damage in Polycrystalline Line with Two-Dimensional Shape2005
- Author(s)
  K. Sasagawa (N. Yamaji and S. Uno)
- Organizer
  18th JSME Computational Mechanics Conference
- Place of Presentation
  Tsukuba/Tsukuba Univ.
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] Evaluation of Threshold Current Density of Electromigration Damage in Bamboo Line with Two-Dimensional Shape2005
- Author(s)
  K. Sasagawa (S, Uno, N. Yamaji and M. Saka)
- Organizer
  11th Conf. Atomic Transportation and Stress Problem in LSI Metallization
- Place of Presentation
  Tokyo/Tokyo Institute of Technology
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17360045
[Presentation] Numerical Study of Allowable Current Density for Electromigration Damage of Multilevel Interconnection in Integrated Circuit
- Author(s)
  K. Sasagawa, K. Fujisaki, T. Yanagi
- Organizer
  13th International Conference on Fracture
- Place of Presentation
  China National Convention Center, Beijing, China
- Data Source
  KAKENHI-PROJECT-25420002
[Presentation] 材料システムとしての電子機器安全性と生体機能性の評価
- Author(s)
  笹川和彦
- Organizer
  平成２４年度日本材料学会東北支部総会・材料フォーラム講演会
- Place of Presentation
  カレッジプラザ（秋田市）
- Invited
- Data Source
  KAKENHI-PROJECT-23650344
[Presentation] パブティックインターフェースのための電気活性高分子膜アクチュエータの作製
- Author(s)
  小山拓馬、笹川和彦、藤崎和弘
- Organizer
  日本機械学会東北支部　第48期総会・講演会
- Place of Presentation
  東北大学（仙台市）
- Data Source
  KAKENHI-PROJECT-23650344
[Presentation] 微細電子配線の安全性評価と生体の応力評価
- Author(s)
  笹川和彦
- Organizer
  日本非破壊検査協会　東北支部「支部会・講演会」
- Place of Presentation
  青年文化センター（仙台市）
- Invited
- Data Source
  KAKENHI-PROJECT-25420002
[Presentation] Experimental Study of Damage Mechanism of Carbon Nanotube as Nano-component of Electronic Devices under High Current Density
- Author(s)
  K. Sasagawa, K. Fujisaki, J. Unuma, R. Azuma
- Organizer
  ASME 2013 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems
- Place of Presentation
  Hyatt Regency San Francisco Airport, San Francisco, USA
- Data Source
  KAKENHI-PROJECT-25420002
[Presentation] CNTネットワーク構造を有する電子デバイス配線の高密度電流下での損傷
- Author(s)
  成田大輝，笹川和彦，藤崎和弘
- Organizer
  日本機械学会　東北学生会　第44回学生員卒業研究発表講演会
- Place of Presentation
  山形大学（米沢市）
- Data Source
  KAKENHI-PROJECT-25420002
[Presentation] 高密度電流下でのカーボンナノチューブの強度に及ぼす周囲環境の影響
- Author(s)
  東　亮汰，笹川和彦，藤崎和弘，鵜沼　潤
- Organizer
  日本機械学会東北学生会第43回学生員卒業研究発表講演会
- Place of Presentation
  一関工業高等専門学校（一関市）
- Data Source
  KAKENHI-PROJECT-21360046
[Presentation] 材料システムとしての電子機器安全性と生体機能性の評価
- Author(s)
  笹川和彦
- Organizer
  平成２４年度日本材料学会東北支部総会・材料フォーラム講演会
- Place of Presentation
  カレッジプラザ（秋田市）
- Invited
- Data Source
  KAKENHI-PROJECT-21360046
[Presentation] CNTネットワーク構造を有する配線の高密度電流下における損傷
- Author(s)
  藤崎和弘，成田大輝，笹川和彦
- Organizer
  日本機械学会M&M2014カンファレンス
- Place of Presentation
  福島大学（福島市）
- Year and Date
  2014-07-19 – 2014-07-21
- Data Source
  KAKENHI-PROJECT-25420002
[Presentation] 微細電子配線の安全性評価と生体の応力評価
- Author(s)
  笹川和彦
- Organizer
  日本非破壊検査協会　東北支部「支部会・講演会」
- Place of Presentation
  青年文化センター（仙台市）
- Invited
- Data Source
  KAKENHI-PROJECT-21360046
[Presentation] 微細電子配線の安全性評価と生体の応力評価
- Author(s)
  笹川和彦
- Organizer
  日本非破壊検査協会　東北支部「支部会・講演会」
- Place of Presentation
  青年文化センター（仙台市）
- Invited
- Data Source
  KAKENHI-PROJECT-23650344
[Presentation] インクジェット法による金属ナノ粒子配線の高密度電流下における損傷
- Author(s)
  相内暁，笹川和彦，藤崎和弘
- Organizer
  日本機械学会　東北学生会　第44回学生員卒業研究発表講演会
- Place of Presentation
  山形大学（米沢市）
- Data Source
  KAKENHI-PROJECT-25420002

1. SAKA Masumi (20158918)

# of Collaborated Projects: 14 results

# of Collaborated Products: 71 results
2. JU Yang (60312609)

# of Collaborated Projects: 7 results

# of Collaborated Products: 6 results
3. MURAOKA Mikio (50190872)

# of Collaborated Projects: 4 results

# of Collaborated Products: 6 results
4. TOHMYOH Hironori (50374955)

# of Collaborated Projects: 3 results

# of Collaborated Products: 7 results
5. KAMIYA Shoji (00204628)

# of Collaborated Projects: 3 results

# of Collaborated Products: 0 results
6. ITO Hidemi (50005104)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
7. FUJISAKI Kazuhiro (90435678)

# of Collaborated Projects: 2 results

# of Collaborated Products: 12 results
8. SASAKI Tomofumi (40323034)

# of Collaborated Projects: 2 results

# of Collaborated Products: 1 results
9. SOYAMA Hitoshi (90211995)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
10. OGURA Yukio (80091700)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
11. MORIKAWA Hidehiro (60302155)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
12. SASAKI Keiichi (30178644)

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
13. HANAWA Soshi (90431585)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
14. TANNO Ken (90113860)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
15. UMEHARA Noritsugu (70203586)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
16. MIYATA Hiroshi (80312479)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
17. MIURA Hideo (90361112)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
18. GAO Wei (70270816)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
19. OGAWA Kazuhiro (50312616)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
20. 牧野英司 (70109495)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
21. 小野俊郎 (30374812)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
22. 峯田貴 (50374814)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
23. 趙旭 (20650790)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
24. 村岡祐介 (90835828)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
25. 徳悠葵 (60750180)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
26. 小野綾 (60636843)

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
27. 三浦鴻太郎 (30846829)

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
28. 佐川貢一 (30272016)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
29. 岡和彦 (00194324)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
30. 小渡亮介 (20792477)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
31. TAKEUCHI Masahiro

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
32. 岩崎富生

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

Sasagawa Kazuhiko 笹川 和彦

SASAGAWA Kazuhiko 笹川 和彦

Research Projects

Research Products

Co-Researchers

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Development of evaluation and improvement method for reliability of Ag nanoparticle ink line used in flexible electronic circuitsPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Investigation of damage mechanism of metal nanoparticle interconnect used in flexible electronic circuits under electrical and mechanical loadingsPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

ENHANCEMENT OF SPATIAL RESOLUTION OF THIN AND FLEXIBLE TACTILE SENSOR AND HIGH FUNCTIONALIZATION OF TOUCH PANELPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

IDENTIFICATION OF GOVERNING PARAMETER AND RELIABILITY EVALUATION FOR CARBON-NANOTUBE DAMAGE UNDER HI-DENSITY ELECTRONIC CURRENTPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

DEVELOPMENT OF HAPTIC DISPLAY ATTACHABLE TO HUMAN SKIN USING FABRIC ACTUATORPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

INVESTIGATION OF DAMAGE MECHANISM AND ESTIMATION OF STRENGTH OF CARBON NANOTUBES AS ELECTRONIC MATERIAL UNDER HIGH-DENSITY ELECTRONIC CURRENTPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

ハプティックインターフェイスを指向した生体用接触圧力及びせん断力センサの新規構築Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Principal Investigator

Project Period (FY)

Research Category

Sasagawa Kazuhiko 笹川和彦

SASAGAWA Kazuhiko 笹川和彦