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YAMADA Fumihiko  山田 郁彦

ORCIDConnect your ORCID iD *help
Researcher Number 50527926
Other IDs
Affiliation (based on the past Project Information) *help 2013: 豊田工業大学, 工学(系)研究科(研究院), 研究員
2012 – 2013: 豊田工業大学, 工学(系)研究科(研究院), 研究補助者
Review Section/Research Field
Principal Investigator
Nanostructural science
Keywords
Principal Investigator
組成分析 / 膜厚分析 / 誘電率測定 / 膜厚測定 / 表面ナノ構造 / EFM / AFM / 誘電率 / 膜厚 / 静電気力 / 走査型プローブ顕微鏡
  • Research Projects

    (1 results)
  • Research Products

    (20 results)
  •  Imaging the buried nanostructures beneath the surface using scanning probe microscopyPrincipal Investigator

    • Principal Investigator
      YAMADA Fumihiko
    • Project Period (FY)
      2012 – 2013
    • Research Category
      Grant-in-Aid for Young Scientists (B)
    • Research Field
      Nanostructural science
    • Research Institution
      Toyota Technological Institute

All 2013 2012

All Journal Article Presentation

  • [Journal Article] Subsurface measurement of nanostructures on GaAs by electrostatic force microscopy2013

    • Author(s)
      Fumihiko Yamada, Itaru Kamiya
    • Journal Title

      Applied Surface Science

      Volume: Vol. 271 Pages: 131-135

    • DOI

      10.1016/j.apsusc.2013.01.146

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-24710109
  • [Presentation] Workfunction mapping of interface between crystalline Si and metal paste electrode using KFM2013

    • Author(s)
      Fumihiko Yamada, Manabu Yoshida, Mari Aoki, Hideo Tokuhisa, Uichi Itoh, Isao Sumita, Shigenobu Sekine, Itaru Kamiya and Yoshio Ohshita
    • Organizer
      EU PVSEC 2014 29th European PV Solar Energy Conference and Exhibition
    • Place of Presentation
      Parisフランス
    • Data Source
      KAKENHI-PROJECT-24710109
  • [Presentation] nm-scaled workfunction mapping of interface between crystalline Si and metal paste electrode using KFM2013

    • Author(s)
      Fumihiko Yamada, Manabu Yoshida, Hideo Tokuhisa, Mari Aoki , Uichi Itoh, Isao Sumita, Shigenobu Sekine, Itaru Kamiya and Yoshio Ohshita
    • Organizer
      7th International Workshop on Crystalline Silicon Solar Cells
    • Place of Presentation
      福岡
    • Data Source
      KAKENHI-PROJECT-24710109
  • [Presentation] KFMを用いたSi-電極界面のナノスケールにおける仕事関数測定2013

    • Author(s)
      山田郁彦,吉田学,青木真理,伊東宇一,住田勲勇,関根重信,神谷格,大下祥雄
    • Organizer
      日本応用物理学会第74回応用物理学会学術講演会
    • Place of Presentation
      京都
    • Data Source
      KAKENHI-PROJECT-24710109
  • [Presentation] nm-scaled workfunction mapping of interface between crystalline Si and metal paste electrode using KFM2013

    • Author(s)
      Fumihiko Yamada, Manabu Yoshida, Hideo Tokuhisa, Mari Aoki , Uichi Itoh, Isao Sumita, Shigenobu Sekine, Itaru Kamiya, Yoshio Ohshita
    • Organizer
      7th International Workshop on Crystalline Silicon Solar Cells
    • Place of Presentation
      福岡、 九州大学
    • Data Source
      KAKENHI-PROJECT-24710109
  • [Presentation] Workfunction mapping of Si-metal paste interface on an atomic scale using KFM2013

    • Author(s)
      Fumihiko Yamada, Manabu Yoshida, Mari Aoki, Hideo Tokuhisa, Itoh Uichi, Isao Sumita, Shigenobu Sekine, Itaru Kamiya and Yoshio Ohshita
    • Organizer
      4th Workshop on Metallization for Crystalline Silicon Solar Cells
    • Place of Presentation
      Constance, Germany
    • Data Source
      KAKENHI-PROJECT-24710109
  • [Presentation] Workfunction mapping of Si-metal paste interface on an atomic scale using KFM2013

    • Author(s)
      Fumihiko Yamada, Manabu Yoshida, Mari Aoki, Hideo Tokuhisa, Uichi Itoh, Isao Sumita, Shigenobu Sekine, Itaru Kamiya and Yoshio Ohshita
    • Organizer
      4th Workshop on Contacting Silicon Solar Cells
    • Place of Presentation
      Constance, Germany
    • Data Source
      KAKENHI-PROJECT-24710109
  • [Presentation] KFMを用いたSi-電極界面のナノスケールにおける仕事関数測定2013

    • Author(s)
      山田 郁彦,吉田 学,青木 真理, 伊東 宇一,住田 勲勇,関根 重信,神谷 格,大下 祥雄
    • Organizer
      第74回応用物理学会秋季学術講演会
    • Place of Presentation
      京都、 同志社大学
    • Data Source
      KAKENHI-PROJECT-24710109
  • [Presentation] Workfunction mapping of Si-metal paste interface on an atomic scale using KFM2013

    • Author(s)
      Fumihiko Yamada, Manabu Yoshida, Mari Aoki, Hideo Tokuhisa, Uichi Itoh, Isao Sumita, Shigenobu Sekine, Itaru Kamiya, Yoshio Ohshita
    • Organizer
      4th Workshop on Metallization for Crystalline Silicon Solar Cells
    • Place of Presentation
      ドイツ、 コンスタンツ
    • Data Source
      KAKENHI-PROJECT-24710109
  • [Presentation] AFMを用いたSi-金属ペースト電極(銀及び銅)界面のポテンシャル測定2013

    • Author(s)
      山田 郁彦,吉田 学,青木 真理,伊東 宇一, 住田 勲勇,神谷 格,大下 祥雄
    • Organizer
      2013年春季 第60回応用物理学会学術講演会
    • Place of Presentation
      厚木, 神奈川県
    • Data Source
      KAKENHI-PROJECT-24710109
  • [Presentation] Workfunction mapping of interface between crystalline Si and metal paste electrode using KFM2013

    • Author(s)
      Fumihiko Yamada, Manabu Yoshida, Mari Aoki, Hideo Tokuhisa, Uichi Itoh, Isao Sumita, Shigenobu Sekine, Itaru Kamiya, Yoshio Ohshita
    • Organizer
      EU PVSEC 2014 29th European PV Solar Energy Conference and Exhibition
    • Place of Presentation
      フランス、 パリ
    • Data Source
      KAKENHI-PROJECT-24710109
  • [Presentation] AFMを用いたSi-金属ペースト電極(銀及び銅)界面のポテンシャル測定2013

    • Author(s)
      山田郁彦,吉田学,青木真理,伊東宇一,住田勲男,神谷格,大下祥雄
    • Organizer
      日本応用物理学会第60回春季応用物理学会学術講演会
    • Place of Presentation
      神奈川
    • Data Source
      KAKENHI-PROJECT-24710109
  • [Presentation] Electric Characterization of Interface between Si Substrate and Cu-based Metal Paste on an Atomic Scale using KFM2012

    • Author(s)
      Fumihiko Yamada, Manabu Yoshida, Uichi Itoh, Isao Sumita, Itaru Kamiya and Yoshio Oshita
    • Organizer
      20^<th> International Colloquium on Scanning Probe Microscopy
    • Place of Presentation
      那覇
    • Data Source
      KAKENHI-PROJECT-24710109
  • [Presentation] Electronic Characterization of Interface between Si Substrate and Cu-Based Metal Paste on an Atomic Scale using KFM2012

    • Author(s)
      Fumihiko Yamada, Manabu Yoshida, Uichi Itoh, Isao Sumita, Itaru Kamiya and Yoshio Oshita
    • Organizer
      20th International Colloquium on Scanning Probe Microscopy
    • Place of Presentation
      那覇, 沖縄県
    • Data Source
      KAKENHI-PROJECT-24710109
  • [Presentation] Electrical property measurement of the interface between the Si solar cell and the metal electrode2012

    • Author(s)
      Fumihiko Yamada and Itaru Kamiya
    • Organizer
      orea-Japan Top University League Workshop on Photovoltaics 2012
    • Place of Presentation
      ソウル韓国
    • Data Source
      KAKENHI-PROJECT-24710109
  • [Presentation] Electrical property measurement of the interface between the Si solar cell and the metal electrode using AFM2012

    • Author(s)
      Fumihiko Yamada and Itaru Kamiya
    • Organizer
      Korea- Japan Top University League Workshop on Photovoltaics 2012
    • Place of Presentation
      韓国, ソウル
    • Data Source
      KAKENHI-PROJECT-24710109
  • [Presentation] Thickness mapping of subsurface nanostructures using FM-EFM2012

    • Author(s)
      Fumihiko Yamada, Ken-ichi Shimomura and Itaru Kamiya
    • Organizer
      14th International Scanning Probe Microscopy Conference
    • Place of Presentation
      トロントカナダ
    • Data Source
      KAKENHI-PROJECT-24710109
  • [Presentation] Thickness mapping of subsurface nanostructures using FM-EFM2012

    • Author(s)
      Fumihiko Yamada, Ken-ichi Shimomura and Itaru Kamiya
    • Organizer
      14th International Scanning Probe Microscopy Conference
    • Place of Presentation
      Toronto, Canada
    • Data Source
      KAKENHI-PROJECT-24710109
  • [Presentation] InAsドットを用いたEFM膜厚測定における定量性の検討2012

    • Author(s)
      山田郁彦, 下村憲一, 神谷格
    • Organizer
      2012年秋季 第73回応用物理学会学術講演会
    • Place of Presentation
      松山, 愛媛県
    • Data Source
      KAKENHI-PROJECT-24710109
  • [Presentation] InAsドットを用いたEFM膜厚測定における定量性の検討2012

    • Author(s)
      山田郁彦,下村憲一,神谷格
    • Organizer
      日本応用物理学会第73回応用物理学会学術講演会
    • Place of Presentation
      愛媛
    • Data Source
      KAKENHI-PROJECT-24710109

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