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MATSUURA Hideharu  松浦 秀治

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Matsuura Hideharu  松浦 秀治

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Researcher Number 60278588
Other IDs
External Links
Affiliation (Current) 2025: 大阪電気通信大学, 工学部, 教授
Affiliation (based on the past Project Information) *help 2020 – 2023: 大阪電気通信大学, 工学部, 教授
2014 – 2016: 大阪電気通信大学, 工学部, 教授
2003 – 2007: 大阪電気通信大学, 工学部, 教授
1998 – 1999: 大阪電気通信大学, 工学部, 助教授
1997: Osaka Electro-Communication University, Dept.of Electronics, Lecturer., 工学部・電子工学科, 専任講師
1996: 大阪電気通信大学, 工学部, 専任講師
Review Section/Research Field
Principal Investigator
Basic Section 21050:Electric and electronic materials-related / Electron device/Electronic equipment / Electronic materials/Electric materials
Except Principal Investigator
電子デバイス・機器工学 / Electron device/Electronic equipment
Keywords
Principal Investigator
4H-SiC / ホール係数 / 電気伝導機構 / Al添加4H-SiC / 高濃度Al添加4H-SiC / IGBT / p型4H-SiC / XRD / ホッピング伝導 / バンド伝導 … More / 抵抗率 / 電気伝導 / Alドープ / SiC / XRD分析 / Hall係数の符号反転 / Hall係数 / VRH伝導 / NNH伝導 / radiation-resistance / semi-insulating semiconductor / silicon drift detector / X-ray fluorescence / X-ray detector / 耐放射線性 / 半絶縁性半導体 / Silicon Drift Detector / 蛍光X線 / X線検出素子 / 有機半導体/有機半導体へテロ接合 / 欠陥評価 / 有機半導体/無機半導体へテロ接合 / 薄膜 / 有機半導体/有機半導体ヘテロ接合 / 有機半導体/無機半導体ヘテロ接合 / 有機半導体 / 接合特性 / バルクへテロ接合 / 有機/無機半導体ヘテロ接合 / 有機薄膜太陽電池 … More
Except Principal Investigator
MBE / AlInAs / superlattice / InGaSb / InAs / GaSb / Type II / InGaAs / Infrared / Cascade laser / InP substrate / AlGaAsSb barrier layer / InGaAs super lattice / Miniband Transition / Super lattice laser / ミニバンド間遷移 / 赤外 / カスケードレーザ / InP基板 / AlGaAsSb障壁層 / InGaAs超格子 / ミニバンド遷移 / 超格子レーザ / doping / MBE with a water cooling System / infrared semiconductor laser / Type II bandstructure / Type I band structure / AlGaSb / InGaSb) / (InAs / quantum well / InGaAsSb / AlGaAsSb / GaSb based infrared laser / TypeII / ドーピング / 超格子 / 水冷式分子線成長法 / 赤外半導体レーザ / multiple reflecting film / diffusion / disorder / surface emitting / strained quantum well / heterostructure / micro laser / 多重反射膜 / 拡散 / ディスオーダ / 面発光 / 歪量子井戸 / ヘテロ構造 / マイクロレーザ Less
  • Research Projects

    (7 results)
  • Research Products

    (54 results)
  • Co-Researchers

    (5 People)
  •  Investigation of Electrical Conduction Mechanisms in Heavily Al-doped 4H-SiC for collector of SiC-IGBTPrincipal Investigator

    • Principal Investigator
      松浦 秀治
    • Project Period (FY)
      2023 – 2025
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Review Section
      Basic Section 21050:Electric and electronic materials-related
    • Research Institution
      Osaka Electro-Communication University
  •  Physical Models of Temperature-dependent Resitivity and Hall Coefficient in Heavily Al-doped 4H-SiCPrincipal Investigator

    • Principal Investigator
      Matsuura Hideharu
    • Project Period (FY)
      2020 – 2022
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Review Section
      Basic Section 21050:Electric and electronic materials-related
    • Research Institution
      Osaka Electro-Communication University
  •  Investigation of organic semiconductor/inorganic semiconductor heterojunctions and organic semiconductor heterojunctionsPrincipal Investigator

    • Principal Investigator
      MATSUURA Hideharu
    • Project Period (FY)
      2014 – 2016
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Electronic materials/Electric materials
    • Research Institution
      Osaka Electro-Communication University
  •  Investigation of high energy X-ray detectors to detect a trace of pollutant capable of operating at room temperaturePrincipal Investigator

    • Principal Investigator
      MATSUURA Hideharu
    • Project Period (FY)
      2006 – 2007
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Electron device/Electronic equipment
    • Research Institution
      Osaka Electro-Communication University
  •  Infrared Semiconductor Laser by Subband Transition at 3μmwavelength Band

    • Principal Investigator
      SUSAKI Wataru
    • Project Period (FY)
      2003 – 2005
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Electron device/Electronic equipment
    • Research Institution
      Osaka Electro-Communication University
  •  室温動作赤外半導体レーザの長波長化に関する研究

    • Principal Investigator
      SUSAKI Wataru
    • Project Period (FY)
      1998 – 1999
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      電子デバイス・機器工学
    • Research Institution
      Osaka Electro-Communication University
  •  Disordering by Diffusion of Impurities in InGaAs/AlGa/GaAs Multiple Layrs and Its Application to Vertical Cavity Surface Emitting Micro Lasers

    • Principal Investigator
      SUSAKI Wataru
    • Project Period (FY)
      1996 – 1997
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      電子デバイス・機器工学
    • Research Institution
      Osaka Electro-Communication University

All 2023 2022 2021 2020 2015 2008 2007 2006 Other

All Journal Article Presentation Patent

  • [Journal Article] Comparison of temperature-dependent resistivity of heavily Al- and N-codoped 4H-SiC grown by physical vapor transport and heavily Al-doped 4H-SiC grown by chemical vapor deposition2023

    • Author(s)
      Hidaka Atsuki、Kondo Yuki、Takeshita Akinobu、Matsuura Hideharu、Eto Kazuma、Ji Shiyang、Kojima Kazutoshi、Kato Tomohisa、Yoshida Sadafumi、Okumura Hajime
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 62 Issue: 10 Pages: 1010011-6

    • DOI

      10.35848/1347-4065/acfb64

    • Peer Reviewed / Open Access
    • Data Source
      KAKENHI-PROJECT-23K03946
  • [Journal Article] Negative Hall coefficient in band conduction region in heavily Al-doped 4H-SiC2023

    • Author(s)
      Matsuura Hideharu、Hidaka Atsuki、Ji Shiyang、Eto Kazuma、Ishida Yuuki、Yoshida Sadafumi
    • Journal Title

      Journal of Applied Physics

      Volume: 134 Issue: 11 Pages: 1157011-10

    • DOI

      10.1063/5.0165404

    • Peer Reviewed / Open Access
    • Data Source
      KAKENHI-PROJECT-23K03946
  • [Journal Article] Electrical Properties of Heavily Al-Doped 4H-SiC2023

    • Author(s)
      Matsuura Hideharu、Takeshita Akinobu、Nishihata Rinya、Kondo Yuuki、Hidaka Atsuki
    • Journal Title

      Materials Science Forum

      Volume: 1093 Pages: 73-86

    • DOI

      10.4028/p-cmryy7

    • Peer Reviewed / Open Access
    • Data Source
      KAKENHI-PROJECT-23K03946
  • [Journal Article] Electrical Properties of Heavily Al-Doped 4H-SiC2023

    • Author(s)
      Hideharu Matsuura, Akinobu Takeshita, Rinya Nishihata, Yuuki Kondo, and Atsuki Hidaka
    • Journal Title

      Materials Science Forum

      Volume: -

    • Peer Reviewed / Open Access
    • Data Source
      KAKENHI-PROJECT-20K04565
  • [Journal Article] Sign and Activation Energy of Hall Coefficient for Hopping Conduction in Heavily Al-Doped 4H-SiC2022

    • Author(s)
      Hideharu Matsuura, Rinya Nishihata, and Atsuki Hidaka
    • Journal Title

      Journal of Physics and Chemistry Research

      Volume: 4 Issue: 1 Pages: 1-8

    • DOI

      10.36266/jpcr/145

    • Peer Reviewed / Open Access
    • Data Source
      KAKENHI-PROJECT-20K04565
  • [Journal Article] Simple physical model for the sign of the Hall coefficient in variable-range hopping conduction in heavily Al-doped p-type 4H-SiC2021

    • Author(s)
      Matsuura Hideharu、Kondo Yuki、Iida Kosuke、Hidaka Atsuki、Ji Shiyang、Eto Kazuma、Kojima Kazutoshi、Kato Tomohisa、Yoshida Sadafumi、Okumura Hajime
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 60 Issue: 3 Pages: 031008-031008

    • DOI

      10.35848/1347-4065/abe645

    • Peer Reviewed / Open Access
    • Data Source
      KAKENHI-PROJECT-20K04565
  • [Journal Article] Anomalous Conduction between the Band and Nearest-Neighbor Hopping Conduction Regions in Heavily Al-Doped p-Type 4H-SiC2020

    • Author(s)
      Hidaka Atsuki、Takeshita Akinobu、Ogawa Kohei、Imamura Tatsuya、Takano Kota、Okuda Kazuya、Matsuura Hideharu、Ji Shi Yang、Eto Kazuma、Mitani Takeshi、Kojima Kazutoshi、Kato Tomohisa、Yoshida Sadafumi、Okumura Hajime
    • Journal Title

      Materials Science Forum

      Volume: 1004 Pages: 224-230

    • DOI

      10.4028/www.scientific.net/msf.1004.224

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20K04565
  • [Journal Article] Anomalous Temperature Dependence of the Hall Coefficient of Heavily Al-Doped 4H-SiC Epilayers in the Band Conduction Region2020

    • Author(s)
      Matsuura Hideharu、Nishihata Rinya、Takeshita Akinobu、Ogawa Kohei、Imamura Tatsuya、Takano Kota、Okuda Kazuya、Hidaka Atsuki、Ji Shi Yang、Eto Kazuma、Kojima Kazutoshi、Kato Tomohisa、Yoshida Sadafumi、Okumura Hajime
    • Journal Title

      Materials Science Forum

      Volume: 1004 Pages: 215-223

    • DOI

      10.4028/www.scientific.net/msf.1004.215

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20K04565
  • [Journal Article] Sign of Hall coefficient in nearest-neighbor hopping conduction in heavily Al-doped p-type 4H-SiC2020

    • Author(s)
      Matsuura Hideharu、Takeshita Akinobu、Hidaka Atsuki、Ji Shiyang、Eto Kazuma、Mitani Takeshi、Kojima Kazutoshi、Kato Tomohisa、Yoshida Sadafumi、Okumura Hajime
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 59 Issue: 5 Pages: 051004-051004

    • DOI

      10.35848/1347-4065/ab8701

    • Peer Reviewed / Open Access
    • Data Source
      KAKENHI-PROJECT-20K04565
  • [Journal Article] Characterization of Intrinsic Defects in High-Purity High-Resistivity p-Type 6H-SiC2008

    • Author(s)
      H.Matsuura, H.Yanase, and M.Takahashi
    • Journal Title

      Japanese Journal of Applied Physice (in press)

    • NAID

      40016294912

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Journal Article] Mechanisms of unexpected reduction in hole concentration in Al-doped 4H-SiC by 200 keV electron irradiation2008

    • Author(s)
      H.Matsuura, N.Minohara, and T.Ohshima
    • Journal Title

      Japanese Journal of Applied Physice (in press)

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Journal Article] Characterization of Traps in Semi-Insulating 4H-SiC by Discharge Current Transient Spectroscopy2008

    • Author(s)
      M.Takahashi and H.Matsuura
    • Journal Title

      Materials Science Forum (in press)

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Journal Article] Characterization of deep centers in semi-insulating SiC and HgI_2:Application of discharge current transient spectroscopy2008

    • Author(s)
      H.Matsuura, M.Takahashi, S.Nagata, and K.Taniguchi
    • Journal Title

      Journal of Materials Science:Materials in Electronics (in press)

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Journal Article] Mechanisms of Reduction in Hole Concentration in Al-Implanted p-type 6H-SiC by 1 MeV Electron Irradiation2008

    • Author(s)
      H.Matsuura, K.Izawa, N.Minohara, and T.Ohshima
    • Journal Title

      Japanese Journal of Applied Physice (in press)

    • NAID

      40016161753

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Journal Article] Mechanisms of Decrease in Hole Concentration in Al-doped 4H-SiC by Irradiation of 200 keV Electrons2007

    • Author(s)
      H.Matsuura, N.Minohara, Y.Inagawa, M.Takahashi, T.Ohshima, and H.Itoh
    • Journal Title

      Materials Science Forum 556-557

      Pages: 379-382

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Journal Article] Mechanisms of Decrease in Hole Concentration in Al-doped 4H-SiC by Irradiation of 200 keV Electrons2007

    • Author(s)
      H. Matsuura
    • Journal Title

      Materials Science Forum. 556-557

      Pages: 379-382

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Journal Article] Characterization of deep centers in semi-insulating SiC and HigI_2 : Application of discharge current transientr spectroscopy

    • Author(s)
      H. Matsuura
    • Journal Title

      Journal of Materials Science : Materials in Electronics (in press)

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Journal Article] Mechanisms of unexpected reduction in hole concentration in Al-doped 4H-SiC by 200 keV electron irradiation

    • Author(s)
      H. Matsuura
    • Journal Title

      Journal of Applied Physics (in press)

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Journal Article] Mechanisms of Reduction in Hole Concentration in Al-Implanted p-type 6H-SiC by 1 MeV Electron irradiation

    • Author(s)
      H. Matsuura
    • Journal Title

      Japanese Journal of Applied Physics (in press)

    • NAID

      40016161753

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Journal Article] Characterization of Traps in Semi-Insulating 4H-SiC by Discharge Current Transient Spectroscopy

    • Author(s)
      M. Takahashi and H. Matsuura
    • Journal Title

      Materials Science Forum (in press)

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Journal Article] Characterization of Intrinsic Defects in High-Purity High-Resistivity p-Type 6H-SiC

    • Author(s)
      H. Matsuura
    • Journal Title

      Japanese Journal of Applied Physics (in press)

    • NAID

      40016294912

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Patent] 放射線検出器2007

    • Inventor(s)
      松浦 秀治, 谷口 一雄, 宇高 忠
    • Industrial Property Rights Holder
      松浦 秀治, 谷口 一雄, 宇高 忠
    • Industrial Property Number
      2007-098037
    • Filing Date
      2007-04-04
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Patent] 放射線検出器2006

    • Inventor(s)
      松浦秀治, 谷ロ一雄, 宇高 忠
    • Industrial Property Rights Holder
      松浦秀治, 谷ロ一雄, 宇高 忠
    • Industrial Property Number
      2006-336727
    • Filing Date
      2006-12-14
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Patent] 放射線検出器2006

    • Inventor(s)
      松浦 秀治, 谷口 一雄, 宇高 忠
    • Industrial Property Rights Holder
      松浦 秀治, 谷口 一雄, 宇高 忠
    • Industrial Property Number
      2006-336727
    • Filing Date
      2006-12-14
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Presentation] Temperature-Dependent Hall Coefficient in Band Conduction Region for Heavily Al-Doped 4H-SiC2023

    • Author(s)
      Hideharu Matsuura, Akinobu Takeshita, Rinya Nishihata, Yuki Kondo, Atsuki Hidaka, Shiyang Ji, Kazuma Eto, Yuuki Ishida, Kazutoshi Kojima, Tomohisa Kato, Sadafumi Yoshida, and Hajime Okumura
    • Organizer
      International Conference on Silicon Carbide and Related Materials (ICSCRM2023)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-23K03946
  • [Presentation] Al濃度1E20 cm^-3台前半でのp型4H-SiC CVDエピ膜の結晶性と電気特性との関係2022

    • Author(s)
      近藤 佑樹, 日高 淳輝, 松浦 秀治, 紀 世陽, 江藤 数馬, 児島 一聡, 加藤 智久, 吉田 貞史, 奥村 元
    • Organizer
      第64回応用物理学会春季学術講演会
    • Data Source
      KAKENHI-PROJECT-20K04565
  • [Presentation] Electrical Properties of Heavily Al-Doped 4H-SiC2022

    • Author(s)
      Hideharu Matsuura, Akinobu Takeshita, Rinya Nishihata, Yuuki Kondo, and Atsuki Hidaka
    • Organizer
      3rd Asia-Pacific Conference on Silicon Carbide and Related Materials
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-20K04565
  • [Presentation] Al濃度10^20 cm^-3台前半でのp型4H-SiCエピ膜の電気抵抗率の温度依存性とAl濃度との関係2020

    • Author(s)
      近藤 佑樹, 竹下 明伸, 今村 辰哉, 高野 晃大, 奥田 和也, 日高 淳輝, 松浦 秀治, 紀 世陽, 江藤 数馬, 児島 一聡, 加藤 智久, 吉田 貞史, 奥村 元
    • Organizer
      第81回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-20K04565
  • [Presentation] 逆型有機薄膜太陽電池の経年劣化に関して2015

    • Author(s)
      鍔優、松浦秀治
    • Organizer
      電気関係学会関西連合大開
    • Place of Presentation
      摂南大学(大阪府・寝屋川市)
    • Year and Date
      2015-11-14
    • Data Source
      KAKENHI-PROJECT-26420283
  • [Presentation] Characterization of deep centers in semi-insulating SiC and HgI_2:application of discharge current transient spectroscopy2007

    • Author(s)
      H.Matsuura, M.Takahashi, S.Nagata, and K.Taniguchi
    • Organizer
      14th Semiconducting and Insulating Materials Conference (SIMC XIV 2007)
    • Place of Presentation
      Feyatteville, Arkansas, USA
    • Year and Date
      2007-05-19
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Presentation] Hall測定によるワイドギャップ半導体中の不純物の評価2007

    • Author(s)
      松浦 秀治
    • Organizer
      第12回結晶工学セミナー(結晶工学スクール応用編)「電気・光学素子技術の基礎と応用」-ワイドバンドギャップ半導体編-
    • Place of Presentation
      学習院創立百周年記念会館
    • Year and Date
      2007-10-04
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Presentation] 200keV電子線照射におけるAl-doped 4H-SiCエビ膜の耐放射線性2007

    • Author(s)
      蓑原 伸正、稲川 祐介、高橋 美雪、松浦 秀治、大島 武、伊藤 久義
    • Organizer
      SiC及び関連ワイドギャップ半導体研究会第16回講演会
    • Place of Presentation
      愛知県女性総合センター
    • Year and Date
      2007-11-29
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Presentation] Characterization of deep centers in semi-insulating SiC and HgI_2 : application of discharge current transient spectroscopy2007

    • Author(s)
      H. Matsuura
    • Organizer
      14th Semiconducting and Insulating Materials Conference
    • Place of Presentation
      Feyatteville, Arkansas, USA
    • Year and Date
      2007-05-19
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Presentation] 高純度半絶縁性4H-SiCを用いた室温動作可能なx線検出素子の可能性2007

    • Author(s)
      高橋 美雪、前田 健寿、山本 和代、松浦 秀治
    • Organizer
      第68回応用物理学会学術講演会
    • Place of Presentation
      北海道工業大学
    • Year and Date
      2007-09-06
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Presentation] Characterization of deep centers in semi-insulating SiC and HgI_2:application of discharge current transient spectroscopy2007

    • Author(s)
      H.Matsuura, M.Takahashi, S.Nagata, and K.Taniguchi
    • Organizer
      14th Semiconducting and Insulating Materials Conference(SIMC XIV 2007)
    • Place of Presentation
      Feyatteville,Arkansas,USA
    • Year and Date
      2007-05-19
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Presentation] Characterization of Traps in Semi-Insulating 4H-SiC by Discharge Current Transient Spectroscopy2007

    • Author(s)
      M.Takahashi, H.Matsuura
    • Organizer
      International Conference on SiC and Related Materials 2007
    • Place of Presentation
      Otsu,Shiga,Japan
    • Year and Date
      2007-10-18
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Presentation] 200keV電子線照射実験からのAl-doped 4H-SiCエビ膜中の深いアクセプタの起源の考察2007

    • Author(s)
      蓑原 伸正, 稲川 祐介, 高橋 美雪, 松浦 秀治, 大島 武, 伊藤 久義
    • Organizer
      第68回応用物理学会学術講演会
    • Place of Presentation
      北海道工業大学
    • Year and Date
      2007-09-05
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Presentation] 放電電流過渡分光法による高純度半絶縁性4H-SiC中の欠陥評価2007

    • Author(s)
      高橋 美雪、松浦 秀治
    • Organizer
      SiC及び関連ワイドギャップ半導体研究会第16回講演会
    • Place of Presentation
      愛知県女性総合センター
    • Year and Date
      2007-11-29
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Presentation] Possibility of High-Purity Semi-Insulating 4H-SiC Being Used as Portable X-Ray Detector Operating at Room Temperature2007

    • Author(s)
      H.Matsuura and M.Takahashi
    • Organizer
      International Conference on SiC and Related Materials 2007
    • Place of Presentation
      Otsu,Shiga,Japan
    • Year and Date
      2007-10-18
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Presentation] 1MeV電子線照射によるAl-doped 6H-SiCの正孔密度とアクセプタ密度の変化2007

    • Author(s)
      井澤 圭亮, 蓑原 伸正, 外館 憲、松浦 秀治, 大島 武, 伊藤 久義
    • Organizer
      第68回応用物理学会学術講演会
    • Place of Presentation
      北海道工業大学
    • Year and Date
      2007-09-05
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Presentation] 200keV電子線照射実験からのAl-doped 4H-SiCエピ膜中の深いアクセプタの起源の考察2007

    • Author(s)
      蓑原 伸正, 稲川 祐介, 高橋 美雪、松浦 秀治, 大島 武, 伊藤 久義
    • Organizer
      第68回応用物理学会学術講演会
    • Place of Presentation
      北海道工業大学
    • Year and Date
      2007-09-05
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Presentation] Possibility of High-Purity Semi-Insulating 4H-SiC Being Used as Portable X-Ray Detector Operating at Room Temperature2007

    • Author(s)
      H. Matsuura
    • Organizer
      International Conference on SiC and Related Materials 2007
    • Place of Presentation
      Otsu, Shiga, Japan
    • Year and Date
      2007-10-18
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Presentation] 簡易型SDD素子の開発に向けて2007

    • Author(s)
      松浦 秀治
    • Organizer
      大阪電気通信大学エレクトロ基礎研究所ワークショップ
    • Place of Presentation
      大阪電気通信大学
    • Year and Date
      2007-03-23
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Presentation] Characterization of Traps in Semi-Insulating 4H-SiC by Discharge Current Transient Spectroscopy2007

    • Author(s)
      M. Takahashi, H. Matsuura
    • Organizer
      International Conference on SiC and Related Materials 2007
    • Place of Presentation
      Otsu, Shiga, Japan
    • Year and Date
      2007-10-18
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Presentation] p型4H-SiCの耐放射線性2006

    • Author(s)
      松浦 秀治、蓑原 伸正、高橋 美雪、大島 武、伊藤 久義
    • Organizer
      SiC及び関連ワイドギャップ半導体研究会第15回講演会
    • Place of Presentation
      高崎シティーギャラリー
    • Year and Date
      2006-11-09
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Presentation] Decrease in Hole Concentration in Al-doped 4H-SiC by Irradiation of 200 keV electrons2006

    • Author(s)
      H. Matsuura
    • Organizer
      7th International Workshop on Radiation Effects on Semiconductor Devices for Space Application
    • Place of Presentation
      Takasaki City Gallery, Takasaki, Japan
    • Year and Date
      2006-10-17
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Presentation] Si Substrate Suitable for Radiation-Resistant Space Solar Cells2006

    • Author(s)
      H.Matsuura, S.Kawasaki, T.Ohshima, and H.Itoh
    • Organizer
      7th International Workshop on Radiation Effects on Semi conductor Devices for Space Application
    • Place of Presentation
      Takasaki City Gallery,Takasaki,Japan
    • Year and Date
      2006-10-17
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Presentation] Mechanisms of Decrease in Hole Concentration in Al-doped 4H-SiC by Irradiation of 200 keV Electrons2006

    • Author(s)
      H.Matsuura, N.Minohara, Y.Inagawa, M.Takahashi, T.Ohshima, and H.Itoh
    • Organizer
      6th European Conference on Silicon Carbide and Related Materials
    • Place of Presentation
      Newcastle upon Tyne,UK
    • Year and Date
      2006-09-05
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Presentation] Decrease in Hole Concentration in Al-doped 4H-SiC by Irradiation of 200 keV Electrons2006

    • Author(s)
      N.Minohara, Y.Inagawa, M.Takahashi, H.Matsuura, T.Ohshima, and H.Itoh
    • Organizer
      2nd International Student Conference at Ibaraki University
    • Place of Presentation
      Ibaraki University,Ibaraki,Japan
    • Year and Date
      2006-10-05
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Presentation] Si Substrate Suitable for Radiation-Resistant Space Solar Cells2006

    • Author(s)
      H. Matsuura
    • Organizer
      7th International Workshop on Radiation Effects on Semiconductor Devices for Space Application
    • Place of Presentation
      Takasaki City Gallery, Takasaki, Japan
    • Year and Date
      2006-10-17
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Presentation] Mechanisms of Decrease in Hole Concentration in Al-doped 4H-SiC by Irradiation of 200 keV Electrons2006

    • Author(s)
      H. Matsuura
    • Organizer
      6th European Conference on Silicon Carbide and Related Materials
    • Place of Presentation
      Newcastle upon Tyne, UK
    • Year and Date
      2006-09-05
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Presentation] Al-doped 4H-SiCエビ膜中の正孔密度の200keV電子線照射量依存性2006

    • Author(s)
      蓑原 伸正, 稲川 祐介, 高橋 美雪, 松浦 秀治, 大島 武, 伊藤 久義
    • Organizer
      第67回応用物理学会学術講演会
    • Place of Presentation
      立命館大学草津キャンパス
    • Year and Date
      2006-08-30
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Presentation] Decrease in Hole Concentration in Al-doped 4H-SiC by Irradiation of 200 keV electrons2006

    • Author(s)
      H.Matsuura, N.Minohara, M.Takahashi, T.Ohshima, and H.Itoh
    • Organizer
      7th International Workshop on Radiation Effects on Semi conductor Devices for Space Application
    • Place of Presentation
      Takasaki City Gallery,Takasaki,Japan
    • Year and Date
      2006-10-17
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • [Presentation] Decrease in Hole Concentration in Al-doped 4H-SiC by Irradiation of 200 keV Electrons2006

    • Author(s)
      N. Minohara, H. Matsuura
    • Organizer
      2nd International Student Conference at Ibaraki University
    • Place of Presentation
      Ibaraki University, Ibaraki
    • Year and Date
      2006-10-05
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-18560356
  • 1.  SUSAKI Wataru (00268294)
    # of Collaborated Projects: 4 results
    # of Collaborated Products: 0 results
  • 2.  SHIBATA Noboru (90076836)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 3.  OHNO Nobuhito (20194251)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 4.  TOMIOKA Akihiro (10211400)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 5.  TANIGUCHI Kazuo (50076832)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 3 results

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