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Nakamura Kazuyuki  中村 和之

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NAKAMURA Kazuyuki  中村 和之

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Researcher Number 60336097
Other IDs
External Links
Affiliation (Current) 2025: 九州工業大学, マイクロ化総合技術センター, 教授
Affiliation (based on the past Project Information) *help 2008 – 2024: Kyushu Institute of Technology, マイクロ化総合技術センター, 教授
2007: Kyushu Institute of Technology, マイクロ化総合技術センタ一, 教授
2002 – 2005: 九州工業大学, マイクロ化総合技術センター, 助教授
Review Section/Research Field
Principal Investigator
Electron device/Electronic equipment / Basic Section 21060:Electron device and electronic equipment-related / 電子デバイス・機器工学 / Science and Engineering
Keywords
Principal Investigator
SRAM / 素子ばらつき / CMOS / 連想メモリ / TCAM / レシオレス / 不揮発メモリ / インターフェース / システムLSI / LUTカスケード … More / 人工知能 / ニューラルネットワーク / Interface / 低電圧 / LSI / 経年劣化 / 動作マージン / ばらつき / 素子劣化 / アナログ回路 / PLL / 画像処理 / 高速通信 / SoC / Cascade / AI / 脳型LSI / ニューラルネット / 推論 / 超低電圧 / ハードウエアエンジン / 検索 / 低消費電力 / CAM / Multi-value logic / Device fluctuation / Band-width / Coding / Serial Communication / System in a Package / インターフェイス / コーディング / バンド幅 / O / I / 多値伝送 / シリアル通信 / non-volatile memory / image Processing / device variataion / Communication / System-LSI / System-on-A-Chip / スタティックノイズマージン / スタティックノイズマージ / SNM / ノイズマージン / メモリ / マージン / 環境変動 / 環境変化 / 最適化 / インターフェース回路 / ワーストケース / リファレンス回路 / マナログ回路 / レギュレータ / 製造後補正 / トリミング / 集積回路 Less
  • Research Projects

    (10 results)
  • Research Products

    (52 results)
  • Co-Researchers

    (2 People)
  •  メモリカスケード型ニューロモルフィックLSIのフリーEDA環境による設計と実証Principal Investigator

    • Principal Investigator
      中村 和之
    • Project Period (FY)
      2024 – 2026
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Review Section
      Basic Section 21060:Electron device and electronic equipment-related
    • Research Institution
      Kyushu Institute of Technology
  •  メモリカスケード構成による記憶駆動型人工知能LSIの実現に関する研究Principal Investigator

    • Principal Investigator
      中村 和之
    • Project Period (FY)
      2021 – 2024
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Review Section
      Basic Section 21060:Electron device and electronic equipment-related
    • Research Institution
      Kyushu Institute of Technology
  •  Study on Realization of Brain-like Hardware by Sequential Driving of Ratio-less Tri-level Associative MemoryPrincipal Investigator

    • Principal Investigator
      Nakamura Kazuyuki
    • Project Period (FY)
      2018 – 2022
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Review Section
      Basic Section 21060:Electron device and electronic equipment-related
    • Research Institution
      Kyushu Institute of Technology
  •  Study on fully digital ternary content addressable memory for high-speed processing of the big data.Principal Investigator

    • Principal Investigator
      NAKAMURA KAZUYUKI
    • Project Period (FY)
      2015 – 2017
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Electron device/Electronic equipment
    • Research Institution
      Kyushu Institute of Technology
  •  Study on fully digital ratio-less SRAM design for avoiding the variability and aging effects of device characteristicsPrincipal Investigator

    • Principal Investigator
      NAKAMURA KAZUYUKI
    • Project Period (FY)
      2012 – 2014
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Electron device/Electronic equipment
    • Research Institution
      Kyushu Institute of Technology
  •  Study on automatic operating margin maximization for analog VLSI circuits with the endurance for device characteristic variation and aging degradation.Principal Investigator

    • Principal Investigator
      NAKAMURA Kazuyuki
    • Project Period (FY)
      2009 – 2011
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Electron device/Electronic equipment
    • Research Institution
      Kyushu Institute of Technology
  •  Study on novel analog design method using post-fabrication trimming with CMOS non-volatile memoriesPrincipal Investigator

    • Principal Investigator
      NAKAMURA Kazuyuki
    • Project Period (FY)
      2007 – 2008
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Electron device/Electronic equipment
    • Research Institution
      Kyushu Institute of Technology
  •  Study on Ultra High-bandwidth Interconnect Circuits for System-in-a-packagePrincipal Investigator

    • Principal Investigator
      NAKAMURA Kazuyuki
    • Project Period (FY)
      2004 – 2005
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Electron device/Electronic equipment
    • Research Institution
      KYUSHU INSTITUTE OF TECHNOLOGY
  •  耐ばらつき超高バンド幅SoCマクロ間インターコネクト回路技術の研究Principal Investigator

    • Principal Investigator
      中村 和之
    • Project Period (FY)
      2002 – 2003
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Review Section
      Science and Engineering
    • Research Institution
      Kyushu Institute of Technology
  •  Study on Ultra High-bandwidth Interconnect Circuits for System-on-a-chipPrincipal Investigator

    • Principal Investigator
      NAKAMURA Kazuyuki
    • Project Period (FY)
      2002 – 2003
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      電子デバイス・機器工学
    • Research Institution
      KYUSHU INSTITUTE OF TECHNOLOGY

All 2019 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 2008 2004 2003 2002 Other

All Journal Article Presentation Patent

  • [Journal Article] Design and measurement of fully digital ternary content addressable memory using ratioless static random access memory cells and hierarchical-AND matching comparator2018

    • Author(s)
      D. Nishikata, M. A. Bin Mohd Ali, K. Hosoda, H.Matsumoto, K. Nakamura
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 57 Issue: 4S Pages: 04FF11-04FF11

    • DOI

      10.7567/jjap.57.04ff11

    • NAID

      120006778228

    • Peer Reviewed / Open Access / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15K06021, KAKENHI-PROJECT-18K04266
  • [Journal Article] Self-stabilization techniques for intermediate power level in stacked-Vdd integrated circuits using DC-balanced coding methods2016

    • Author(s)
      Yusuke Kohara, Naoya Kubo, Tomofumi Nishiyama, Taiki Koizuka, Mohammad Alimudin, Amirul Rahmat, Hitoshi Okamura, Tomoyuki Yamanokuchi, Kazuyuki Nakamura
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 55 Issue: 4S Pages: 04EF06-04EF06

    • DOI

      10.7567/jjap.55.04ef06

    • NAID

      210000146329

    • Peer Reviewed / Acknowledgement Compliant / Open Access
    • Data Source
      KAKENHI-PROJECT-15K06021
  • [Journal Article] Ratioless full-complementary 12-transistor static random access memory for ultra low supply voltage operation2015

    • Author(s)
      Takahiro Kondo, Hiromasa Yamamoto, Satoko Hoketsu, Hitoshi Imi, Hitoshi Okamura, Kazuyuki Nakamura
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 54 Issue: 4S Pages: 04DD11-04DD11

    • DOI

      10.7567/jjap.54.04dd11

    • NAID

      120006782185

    • Peer Reviewed / Acknowledgement Compliant / Open Access
    • Data Source
      KAKENHI-PROJECT-24560408
  • [Journal Article] Complementary Metal Oxide Semiconductor Operational Amplifier Offset Calibration Technique Using Closed Loop Offset Amplifier and Folded-Alternated Resistor String Digital-to-Analog Converter2012

    • Author(s)
      Hiroyuki Morimoto, Hiroaki Goto, Hajime Fujiwara, Kazuyuki Nakamura
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: Vol.51 No.2 Issue: 2S Pages: 02BE10-02BE10

    • DOI

      10.1143/jjap.51.02be10

    • NAID

      120006782184

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21560356
  • [Journal Article] An Electrically Adjustable 3-Terminal Regulator for Post-Fabrication Level-Trimming with a Reliable 1-Wire Serial I/O2011

    • Author(s)
      H. Morimoto, H. Koike, K. Nakamura
    • Journal Title

      IEICE Trans. Electron.

      Volume: E94-C Issue: 6 Pages: 945-952

    • DOI

      10.1587/transele.E94.C.945

    • NAID

      10029804120

    • ISSN
      0916-8524, 1745-1353
    • Language
      English
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21560356
  • [Journal Article] An Optimal Design Method for Complementary Metal Oxide Semiconductor Even-Stage Ring Oscillators Containing Latches2010

    • Author(s)
      Y. Kohara, M. Asano, Y. Kawakami, Y. Uchida, H. Koike, K. Nakamura
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: Vol. 49, Issue 4

    • NAID

      120006782186

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21560356
  • [Journal Article] An Optimal Design Method for Complementary Metal Oxide Semiconductor Even-Stage Ring Oscillators Containing Latches2010

    • Author(s)
      Yusuke Kohara, Masaharu Asano, Yoshihiro Kawakami, Yasuhisa Uchida, Hiroki Koike, Kazuyuki Nakamura
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: Volume 49, Issue 4

    • NAID

      120006782186

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21560356
  • [Journal Article] LSI間高速通信用4値I/0回路の設計2004

    • Author(s)
      白木 良典, 中村 和之
    • Journal Title

      電子情報通信学会2004年ソサイエティ大会発表論文概要集

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-16560302
  • [Journal Article] Design of the 4-level I/O circuit for high-speed interconnection for LSIs2004

    • Author(s)
      Yoshinori Shiraki, Kazuyuki Nakamura
    • Journal Title

      2004 Digest of IEICE Society Conference

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-16560302
  • [Journal Article] LSI間高速通信用4値I/O回路の設計2004

    • Author(s)
      白木良典, 中村和之
    • Journal Title

      電子情報通信学会2004年ソサイエティ大会発表論文概要集

    • Data Source
      KAKENHI-PROJECT-16560302
  • [Journal Article] LSI間高速通信用4値I/O回路の設計2004

    • Author(s)
      白木 良典, 中村 和之
    • Journal Title

      電子情報通信学会2004年ソサイエティ大会発表論文概要集

    • Data Source
      KAKENHI-PROJECT-16560302
  • [Journal Article] Long-Term Data Retention Test Method for Ferroelectric RAM2003

    • Author(s)
      Hiroki Koike, Kazuyuki Nakamura et al.
    • Journal Title

      IEICE Transactions on Electronics VOL.J86-C, No.8

      Pages: 902-912

    • NAID

      110003202110

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-14550325
  • [Journal Article] 強誘電体メモリ(FeRAM)の長期データ保持特性テスト法2003

    • Author(s)
      小池洋紀, 中村和之 他
    • Journal Title

      電子情報通信学会論文誌 J86-C, No.8

      Pages: 902-912

    • NAID

      110003202110

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-14550325
  • [Journal Article] Super-Parallel Link technology for Tbps Inter-chip communication2002

    • Author(s)
      Kazuyuki, Nakamura
    • Journal Title

      2002 Workshop for Circuits and System in Karuizawa

      Pages: 221-226

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-14550325
  • [Journal Article] Analog bit-map analysis using image processing technique for large scale non-volatile memories.2002

    • Author(s)
      Kazuyuki Nakamura
    • Journal Title

      2002 IEICE Society Conference

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-14550325
  • [Journal Article] LSI間のTbps通信を目指すスーパーパラレルリンク技術の概要2002

    • Author(s)
      中村 和之
    • Journal Title

      2002年回路とシステム(軽井沢)ワークショップ論文集

      Pages: 221-226

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-14550325
  • [Journal Article] 大規模不揮発メモリLSIのアナログビットマップ解析と画像処理の適用2002

    • Author(s)
      中村 和之
    • Journal Title

      2002年電子情報通信学会ソサエティ大会講演論文集

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-14550325
  • [Journal Article] Analog bit-map analysis for large scale non-volatile memories2002

    • Author(s)
      Tomomi Yano, Hiroki Koike, Kazuyuki Nakamura
    • Journal Title

      2002 IEICE System LSI Workshop in Biwako

      Pages: 283-286

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-14550325
  • [Journal Article] 大規模不揮発メモリLSIのアナログビットマップ解析システム2002

    • Author(s)
      矢野智美, 小池洋紀, 中村和之
    • Journal Title

      第6回システムLSI(琵琶湖)ワークショップ論文集(ポスターセッション

      Pages: 283-286

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-14550325
  • [Patent] 半導体装置及びニューラルネットワークの構成方法2019

    • Inventor(s)
      中村和之
    • Industrial Property Rights Holder
      九州工業大学
    • Industrial Property Rights Type
      特許
    • Industrial Property Number
      2019-069485
    • Filing Date
      2019
    • Data Source
      KAKENHI-PROJECT-18K04266
  • [Patent] 符号変換回路及び並列信号変換送受信システム2016

    • Inventor(s)
      小原祐輔、久保直也、中村和之
    • Industrial Property Rights Holder
      小原祐輔、久保直也、中村和之
    • Industrial Property Rights Type
      特許
    • Industrial Property Number
      2016-053531
    • Filing Date
      2016-03-17
    • Data Source
      KAKENHI-PROJECT-15K06021
  • [Patent] 半導体記憶装置2013

    • Inventor(s)
      中村和之、齊藤貴彦、岡村均
    • Industrial Property Rights Holder
      中村和之、齊藤貴彦、岡村均
    • Industrial Property Rights Type
      特許
    • Filing Date
      2013-03-22
    • Overseas
    • Data Source
      KAKENHI-PROJECT-24560408
  • [Patent] 半導体記憶装置2012

    • Inventor(s)
      中村和之、齋藤貴彦、岡村均
    • Industrial Property Rights Holder
      九州工業大学
    • Industrial Property Number
      2012-076414
    • Filing Date
      2012-03-29
    • Data Source
      KAKENHI-PROJECT-21560356
  • [Patent] 半導体記憶装置2011

    • Inventor(s)
      中村和之、齋藤貴彦
    • Industrial Property Rights Holder
      九州工業大学
    • Industrial Property Number
      2011-035109
    • Filing Date
      2011-02-21
    • Data Source
      KAKENHI-PROJECT-21560356
  • [Patent] 電子デバイス2008

    • Inventor(s)
      森本浩之, 中村和之
    • Industrial Property Rights Holder
      九州工業大学
    • Filing Date
      2008-01-29
    • Data Source
      KAKENHI-PROJECT-19560347
  • [Presentation] Vth-Shiftable SRAM Cell TEGs for Direct Measurement for the immunity of the Threshold Voltage Variability2017

    • Author(s)
      S. Yamaguchi, H. Imi, S. Tokumaru, T Kondo, H. Yamamoto, K. Nakamura
    • Organizer
      IEEE International Conference on Microelectronic Test Structures (ICMTS) 2017
    • Place of Presentation
      Grenoble, FRANCE
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15K06021
  • [Presentation] Fully Digital Ternary Content Addressable Memory using Ratio-less SRAM Cells and Hierarchical-AND Matching Comparator for Ultra-low-voltage Operation2017

    • Author(s)
      D. Nishikata, M. A. Bin Mohd Ali, K. Hosoda, H.Matsumoto, K. Nakamura
    • Organizer
      2017 International Conference on Solid State Devices and Materials
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15K06021
  • [Presentation] Vth-Shiftable SRAM Cell TEGs for Direct Measurement for the immunity of the Threshold Voltage Variability2016

    • Author(s)
      S. Yamaguchi, H. Imi, S. Tokumaru, K. Nakamura
    • Organizer
      IEEE/ACM Workshop on Variability Modeling and Characterization
    • Place of Presentation
      Austin,TX,USA
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15K06021
  • [Presentation] A Measurement of Ratio-less 12-transistor SRAM cell Operation at Ultra-low Supply-voltage2014

    • Author(s)
      T. Kondo, H. Yamamoto, H. Imi, H. Okamura, K. Nakamura
    • Organizer
      International Conference on Solid State Devices and Materials(SSDM)
    • Place of Presentation
      Tsukuba, Japan
    • Year and Date
      2014-09-10
    • Data Source
      KAKENHI-PROJECT-24560408
  • [Presentation] CMOS SRAMセルのしきい値電圧ばらつき耐性評価用TEGの設計及び評価2014

    • Author(s)
      伊見 仁,徳丸 翔吾,岡村 均,中村 和之
    • Organizer
      LSIとシステムのワークショップ2014
    • Place of Presentation
      北九州国際会議場
    • Year and Date
      2014-05-26
    • Data Source
      KAKENHI-PROJECT-24560408
  • [Presentation] A Ratio-Less 10-Transistor Cell and Static Column Retention Loop Structure for Fully Digital SRAM Design2013

    • Author(s)
      Saito, T. ; Okamura, H. ; Yamamoto, H. ; Nakamura, K.
    • Organizer
      2012 4th IEEE International Memory Workshop (IMW)
    • Place of Presentation
      Milan, Italy
    • Data Source
      KAKENHI-PROJECT-24560408
  • [Presentation] Mosaic SRAM Cell TEGs with Intentionally-added Device Variability for Confirming the Ratio-less SRAM Operation2013

    • Author(s)
      Hitoshi Okamura, Takahiko Saito, Hiroaki Goto, Masahiro Yamamoto and Kazuyuki Nakamura
    • Organizer
      IEEE International Conference on Microelectronic Test Structures (ICMTS 2013)
    • Place of Presentation
      Osaka, Japan
    • Data Source
      KAKENHI-PROJECT-24560408
  • [Presentation] A Ratio-Less 10-Transistor Cell and Static Column Retention Loop Structure for Fully Digital SRAM2012

    • Author(s)
      T. Saito, H. Okamura, M. Yamamoto, K. Nakamura
    • Organizer
      2012 4th IEEE International Memory Workshop (IMW)
    • Place of Presentation
      Milano Italy
    • Year and Date
      2012-05-29
    • Data Source
      KAKENHI-PROJECT-21560356
  • [Presentation] A Universal Test Structure for the Direct Measurement of the Design Margin of Even-Stage Ring Oscillators with CMOS Latch2012

    • Author(s)
      Y. Hirakawa, A. Motomura,K. Ota,N. Mimura, K. Nakamura
    • Organizer
      IEEE International Conference on Microelectronic Test Structures (ICMTS) 2012
    • Place of Presentation
      San Diego USA
    • Year and Date
      2012-03-20
    • Data Source
      KAKENHI-PROJECT-21560356
  • [Presentation] A Universal Test Structure for the Direct Measurement of the Design Margin of Even-Stage Ring Oscillators with CMOS Latch2012

    • Author(s)
      Y.Hirakawa, A. Motomura,K. Ota,N. Mimura, K. Nakamura
    • Organizer
      IEEE International Conference on Microelectronic Test Structures (ICMTS) 2012
    • Place of Presentation
      San Diego, USA
    • Data Source
      KAKENHI-PROJECT-21560356
  • [Presentation] An Experimental Verification of the Design Margin Analysis Method for Even-Stage Ring Oscillators with CMOS Latch2011

    • Author(s)
      Y. Hirakawa, N. Mimura, A. Motomura, K. Nakamura
    • Organizer
      International Conference on Solid State Devices and Materials(SSDM)
    • Place of Presentation
      Nagoya, Japan
    • Data Source
      KAKENHI-PROJECT-21560356
  • [Presentation] 省面積抵抗ストリング DAC と閉ループ・オフセット検出を用いた CMOS オペアンプのオフセット校正2011

    • Author(s)
      森本浩之、後藤弘明、藤原宗、中村
    • Organizer
      デザインガイア 2011
    • Place of Presentation
      宮崎市
    • Year and Date
      2011-11-28
    • Data Source
      KAKENHI-PROJECT-21560356
  • [Presentation] CMOS偶数段リング発振回路の設計マージンの測定2011

    • Author(s)
      平川、本村、三村、中村
    • Organizer
      電子情報通信学会 2011 総合大会
    • Place of Presentation
      東京
    • Year and Date
      2011-03-15
    • Data Source
      KAKENHI-PROJECT-21560356
  • [Presentation] 電源遷移時間を考慮した偶数段リング発振回路発振領域の検討2011

    • Author(s)
      三村法寛・平川豊・中村和之
    • Organizer
      電子情報通信学会 2011総合大会
    • Place of Presentation
      東京都市大学
    • Year and Date
      2011-03-15
    • Data Source
      KAKENHI-PROJECT-21560356
  • [Presentation] An Experimental Verification of the Design Margin Analysis Method for Even-Stage Ring Oscillators with CMOS Latch2011

    • Author(s)
      Y. Hirakawa, N. Mimura, A. Motomura, K. Nakamura
    • Organizer
      2011 International Conference on Solid State Devices and Materials(SSDM)
    • Place of Presentation
      Nagoya Japan
    • Year and Date
      2011-09-29
    • Data Source
      KAKENHI-PROJECT-21560356
  • [Presentation] CMOS Op-amp Offset Calibration Technique Using a Closed Loop Offset Amplifier and Compact Resistor String DAC2011

    • Author(s)
      H. Morimoto, H. Koike, K. Nakamura
    • Organizer
      2011 International Conference on Solid State Devices and Materials(SSDM)
    • Place of Presentation
      Nagoya, Japan
    • Data Source
      KAKENHI-PROJECT-21560356
  • [Presentation] CMOS Op-amp Offset Calibration Technique Using a Closed Loop Offset Amplifier and Compact Resistor String DAC2011

    • Author(s)
      H. Morimoto, H. Goto, H. Fujiwara, K. Nakamura
    • Organizer
      2011 International Conference on Solid State Devices and Materials(SSDM)
    • Place of Presentation
      Nagoya Japan
    • Year and Date
      2011-09-29
    • Data Source
      KAKENHI-PROJECT-21560356
  • [Presentation] CMOS偶数段リング発振回路の設計マージンの測定2011

    • Author(s)
      平川豊・本村綾美・三村法寛・中村和之
    • Organizer
      電子情報通信学会 2011総合大会
    • Place of Presentation
      東京都市大学
    • Year and Date
      2011-03-16
    • Data Source
      KAKENHI-PROJECT-21560356
  • [Presentation] 電源遷移時間を考慮した偶数段リング発振回路発振領域の検討2011

    • Author(s)
      三村、平川、中村
    • Organizer
      電子情報通信学会 2011 総合大会
    • Place of Presentation
      東京
    • Year and Date
      2011-03-15
    • Data Source
      KAKENHI-PROJECT-21560356
  • [Presentation] An Electrically Adjustable 3-Terminal Regulator with Post-Fabrication Level-Trimming Function2010

    • Author(s)
      Hiroyuki Morimoto, Hiroki Koike, Kazuyuki Nakamura
    • Organizer
      15th Asia and South Pacific Design Automation Conference (ASP-DAC 2010)
    • Place of Presentation
      採択済み
    • Data Source
      KAKENHI-PROJECT-19560347
  • [Presentation] 複数個のラッチを有する CMOS 偶数段リング発振回路の最適設計2010

    • Author(s)
      平川、小原、川上、中村
    • Organizer
      LSI とシステムのワークショップ 2010
    • Place of Presentation
      北九州市
    • Year and Date
      2010-05-18
    • Data Source
      KAKENHI-PROJECT-21560356
  • [Presentation] 複数個のラッチを有するCMOS偶数段リング発振回路の最適設計2010

    • Author(s)
      平川豊, 小原祐輔, 川上義弘, 中村和之
    • Organizer
      LSIとシステムのワークショップ2010
    • Place of Presentation
      北九州国際会議場
    • Year and Date
      2010-05-18
    • Data Source
      KAKENHI-PROJECT-21560356
  • [Presentation] 片チャネルラッチ構成の偶数段リング発振回路の検討2010

    • Author(s)
      小原、平川、中村
    • Organizer
      電子情報通信学会 2010 総合大会
    • Place of Presentation
      仙台市
    • Year and Date
      2010-03-16
    • Data Source
      KAKENHI-PROJECT-21560356
  • [Presentation] 片チャネルラッチ構成の偶数段リング発振回路の検討2010

    • Author(s)
      小原祐輔、平川豊、中村和之
    • Organizer
      電子情報通信学会2010総合大会
    • Place of Presentation
      東北大学
    • Year and Date
      2010-03-16
    • Data Source
      KAKENHI-PROJECT-21560356
  • [Presentation] ユニバーサルSRAM TEGによるSRAM動作マージンの評価2009

    • Author(s)
      野田和徳, 齋藤慶顕, 中村和之
    • Organizer
      電子情報通信学会全国大会
    • Place of Presentation
      愛媛大学
    • Year and Date
      2009-03-17
    • Data Source
      KAKENHI-PROJECT-19560347
  • [Presentation] CMOS不揮発メモリとその設計法に関する研究開発及び事業化2008

    • Author(s)
      中村 和之
    • Organizer
      電子情報通信学会 全国大会
    • Place of Presentation
      北九州学術研究都市
    • Year and Date
      2008-03-21
    • Data Source
      KAKENHI-PROJECT-19560347
  • [Presentation] Ratio-less 10Tr-SRAMセルとColumn Retention Loop構造による完全デジタルSRAMの設計及び評価

    • Author(s)
      山本裕允、齋藤貴彦、岡村均、中村和之
    • Organizer
      LSIとシステムのワークショップ 2013
    • Place of Presentation
      北九州国際会議場
    • Data Source
      KAKENHI-PROJECT-24560408
  • 1.  YOSHIDA Mika (50336096)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 2.  MORIMOTO Hiroyuki
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 1 results

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