Fujiwara Yukio 藤原幸雄

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FUJIWARA Yukio 藤原幸雄

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Researcher Number	60415742
Affiliation (Current)	2025: 国立研究開発法人産業技術総合研究所, 計量標準総合センター, 上級主任研究員
Affiliation (based on the past Project Information) *help	2022 – 2023: 国立研究開発法人産業技術総合研究所, 計量標準総合センター, 上級主任研究員 2018 – 2021: 国立研究開発法人産業技術総合研究所, 計量標準総合センター, 研究グループ長 2017: 国立研究開発法人産業技術総合研究所, 計量標準総合センター, 主任研究員 2015 – 2016: 国立研究開発法人産業技術総合研究所, 分析計測標準研究部門, 主任研究員 2014: 独立行政法人産業技術総合研究所, 分析計測標準研究部門, 主任研究員 … More 2010 – 2013: 独立行政法人産業技術総合研究所, 計測フロンティア研究部門, 主任研究員 2008: National Institute of Advanced Industrial Science and Technology, 計測フロンティア研究部門, 研究員 2007: National Institute of Advanced Industrial Science and Technology, 計測フロンティア研究部門, 研究員 Less
Review Section/Research Field	Principal Investigator Analytical chemistry / Basic Section 80040:Quantum beam science-related / Basic Section 34020:Analytical chemistry-related / Thin film/Surface and interfacial physical properties
Keywords	Principal Investigator 表面分析 / クラスター / 二次イオン質量分析 / イオン液体 / イオンビーム / SIMS / 質量分析 / エレクトロスプレー / 二次イオン / 負イオン … More / プロトン化 / クラスターイオン / プロトン / 分析化学 / プロトン付加 / ビーム / 帯電液滴 / イオン源 / 放射線、X線、粒子線 / 放射線、Ｘ線、粒子線 / 分析科学 / 表面・界面物性 / ソフトイオン化 / 負イオンビーム / 大質量陰イオン / クラスタービーム / 二次イオン質量分析法(SIMS) / ビーム応用 Less

Research Projects
(6 results)
Research Products
(34 results)

新規クラスター負イオンビーム源の開発：反応性プロトン含有ＦＩＢ技術のＳＩＭＳ展開Principal Investigator
- Principal Investigator
  
  藤原幸雄
- Project Period (FY)
  2022 – 2024
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 80040:Quantum beam science-related
- Research Institution
  National Institute of Advanced Industrial Science and Technology
Organic secondary ion mass spectrometry with high sensitivity and high lateral resolution: development of a new cluster ion beam sourcePrincipal Investigator
- Principal Investigator
  
  Fujiwara Yukio
- Project Period (FY)
  2019 – 2022
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 34020:Analytical chemistry-related
- Research Institution
  National Institute of Advanced Industrial Science and Technology
Development of a protic-ionic-liquid beam source toward high-sensitivity and high-lateral-resolution SIMS imaging of organic materialsPrincipal Investigator
- Principal Investigator
  
  Fujiwara Yukio
- Project Period (FY)
  2016 – 2018
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Analytical chemistry
- Research Institution
  National Institute of Advanced Industrial Science and Technology
Development of a charged-droplet beam source for secondary ion mass spectrometry using ionic liquidsPrincipal Investigator
- Principal Investigator
  
  Fujiwara Yukio
- Project Period (FY)
  2013 – 2015
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Analytical chemistry
- Research Institution
  National Institute of Advanced Industrial Science and Technology
Development of a new soft-ionization method of organic molecules on surfaces for imaging mass spectrometryPrincipal Investigator
- Principal Investigator
  
  FUJIWARA Yukio
- Project Period (FY)
  2010 – 2012
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Analytical chemistry
- Research Institution
  National Institute of Advanced Industrial Science and Technology
Beam generation of large anions in a solution for secondary ion mass spectrometry (SIMS)Principal Investigator
- Principal Investigator
  
  FUJIWARA Yukio
- Project Period (FY)
  2007 – 2008
- Research Category
  
  Grant-in-Aid for Young Scientists (B)
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  National Institute of Advanced Industrial Science and Technology

[Journal Article] Temperature effects on electrospray current from an externally wetted EMI-Im ionic liquid ion source2023
- Author(s)
  Fujiwara Yukio
- Journal Title
  
  Journal of Vacuum Science & Technology B
  
  Volume: 41 Issue: 6 Pages: 064204-064204
- DOI
  10.1116/6.0003088
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22K12666
[Journal Article] Negative ion beam bombardment of a protic ionic liquid: Alleviating surface charging and damage and analyzing the surface of organic insulating materials2022
- Author(s)
  Yukio Fujiwara and Naoaki Saito
- Journal Title
  
  Journal of Vacuum Science & Technology A
  
  Volume: 40 Issue: 5 Pages: 053203-053203
- DOI
  10.1116/6.0001999
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19K05535
[Journal Article] Negative-cluster ion beam production from the tip of a sharp needle: Suppression of surface charging and surface analysis of an insulated sample2021
- Author(s)
  Yukio Fujiwara and Naoaki Saito
- Journal Title
  
  Journal of Vacuum Science & Technology A
  
  Volume: 39 Issue: 6 Pages: 063218-063218
- DOI
  10.1116/6.0001431
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19K05535
[Journal Article] Electrochemical Reactions of Ionic Liquid in Vacuum and Their Influence on Ion-Beam Production by Electrospray2020
- Author(s)
  Yukio Fujiwara
- Journal Title
  
  Journal of The Electrochemical Society
  
  Volume: 167 Issue: 16 Pages: 166504-166504
- DOI
  10.1149/1945-7111/abcb3f
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19K05535
[Journal Article] Ion beam generation from a protic ionic liquid source with an externally wetted tungsten needle2019
- Author(s)
  Yukio Fujiwara, Naoaki Saito
- Journal Title
  
  Journal of Applied Physics
  
  Volume: 126 Issue: 24 Pages: 244901-244901
- DOI
  10.1063/1.5133821
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19K05535
[Journal Article] Cluster ion beam generation from a wetted needle emitter for organic secondary ion mass spectrometry (organic SIMS) using a protic ionic liquid, propylammonium nitrate2018
- Author(s)
  Yukio Fujiwara , Naoaki Saito
- Journal Title
  
  Rapid Commun Mass Spectrom.
  
  Volume: 32 Issue: 21 Pages: 1867-1874
- DOI
  10.1002/rcm.8256
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16K05832
[Journal Article] Time-of-flight secondary ion mass spectrometry using a new primary ion beam generated by vacuum electrospray of a protic ionic liquid, propylammonium nitrate2017
- Author(s)
  Fujiwara Yukio、Saito Naoaki
- Journal Title
  
  Rapid Communications in Mass Spectrometry
  
  Volume: 31 Issue: 22 Pages: 1859-1867
- DOI
  10.1002/rcm.7960
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16K05832
[Journal Article] Effects of a proton-conducting ionic liquid on secondary ion formation in time-of-flight secondary ion mass spectrometry2016
- Author(s)
  Y. Fujiwara, N. Saito
- Journal Title
  
  Rapid Commun. Mass Spectrom.
  
  Volume: 30 Issue: 1 Pages: 239-249
- DOI
  10.1002/rcm.7439
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-25410163
[Journal Article] Increasing the intensity of protonated secondary ions in time-of-flight secondary ion mass spectrometry using a proton-conducting ionic liquid, diethylmethylammonium trifluoromethanesulfonate2015
- Author(s)
  Y. Fujiwara, N. Saito
- Journal Title
  
  Applied Physics Express
  
  Volume: 8 Issue: 7 Pages: 076601-076601
- DOI
  10.7567/apex.8.076601
- NAID
  210000137595
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-25410163
[Journal Article] Development of an Ionic-liquid Ion Beam Source for Secondary Ion Mass Spectrometry (SIMS)2014
- Author(s)
  Yukio Fujiwara, Naoaki Saito
- Journal Title
  
  e-J. Surf. Sci. Nanotechnol.
  
  Volume: 12 Issue: 0 Pages: 119-123
- DOI
  10.1380/ejssnt.2014.119
- NAID
  130004933808
- ISSN
  1348-0391
- Language
  English
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-25410163
[Journal Article] Emission characteristics of a charged-droplet beam source using vacuum electrospray of an ionic liquid2013
- Author(s)
  Yukio Fujiwara, Naoaki Saito, Hidehiko Nonaka, Shingo Ichimura
- Journal Title
  
  Surface and Interface Analysis
  
  Volume: 45巻 Issue: 1 Pages: 517-521
- DOI
  10.1002/sia.5071
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22550091
[Presentation] イオン液体で濡らした針先端からのプロトン含有クラスターイオンビームの生成：集束イオンビーム(FIB)用の液体金属イオン源を参考として2019
- Author(s)
  藤原幸雄、齋藤直昭
- Organizer
  第67回質量分析総合討論会
- Data Source
  KAKENHI-PROJECT-19K05535
[Presentation] 液体金属イオン源方式のプロトン性イオン液体ビーム源の開発：有機イメージング質量分析の感度と面分解能の向上2018
- Author(s)
  藤原幸雄、齋藤直昭
- Organizer
  日本表面真空学会学術講演会
- Data Source
  KAKENHI-PROJECT-16K05832
[Presentation] 針型エミッターからのプロトン性イオン液体のビーム生成：高集束性かつ高感度なSIMS用クラスターイオン源を目指して2018
- Author(s)
  藤原幸雄、齋藤直昭
- Organizer
  第65回応用物理学会春季学術講演会
- Invited
- Data Source
  KAKENHI-PROJECT-16K05832
[Presentation] A new primary ion beam source using vacuum electrospray of protic ionic liquids2017
- Author(s)
  Yukio Fujiwara, Naoaki Saito
- Organizer
  The 21th International Conference on Secondary Ion Mass Spectrometry (SIMS XXI)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16K05832
[Presentation] プロトン性イオン液体のイオンビーム化と二次イオン質量分析（SIMS）の高感度化2015
- Author(s)
  藤原幸雄、齋藤直昭
- Organizer
  第6 回イオン液体討論会
- Place of Presentation
  同志社大学（京都府）
- Year and Date
  2015-10-27
- Data Source
  KAKENHI-PROJECT-25410163
[Presentation] Development of a vacuum-electrospray beam source using a proton-conducting ionic liquid [dema][TfO]: enhancing effect of protonated organic molecules2015
- Author(s)
  Y. Fujiwara, N. Saito
- Organizer
  The 20th International Conference on Secondary Ion Mass Spectrometry (SIMS XX)
- Place of Presentation
  The Westin Seattle、シアトル、米国
- Year and Date
  2015-09-15
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-25410163
[Presentation] クラスターイオンビームの二次イオン質量分析（SIMS）への応用2015
- Author(s)
  藤原幸雄、齋藤直昭
- Organizer
  学術振興会第132委員会（荷電粒子ビームの工業への応用）第217回研究会
- Place of Presentation
  東京理科大学（東京都）
- Year and Date
  2015-10-02
- Invited
- Data Source
  KAKENHI-PROJECT-25410163
[Presentation] イオン液体ビーム照射による有機系試料の二次イオン質量分析(SIMS)2015
- Author(s)
  藤原幸雄、齋藤直昭
- Organizer
  第62回応用物理学会春季学術講演会
- Place of Presentation
  東海大学湘南キャンパス（神奈川県平塚市）
- Year and Date
  2015-03-14
- Data Source
  KAKENHI-PROJECT-25410163
[Presentation] 真空エレクトロスプレーを用いた二次イオン質量分析（SIMS）用イオン液体ビーム源の開発2014
- Author(s)
  藤原幸雄、齋藤直昭
- Organizer
  第62回質量分析総合討論会
- Place of Presentation
  ホテル阪急エキスポパーク（大阪府吹田市）
- Year and Date
  2014-05-14
- Data Source
  KAKENHI-PROJECT-25410163
[Presentation] A new primary ion beam source for Secondary Ion Mass Spectrometry (SIMS) using vacuum electrospray of ionic liquids2014
- Author(s)
  Yukio Fujiwara, Naoaki Saito
- Organizer
  The 20th International Mass Spectrometry Conference
- Place of Presentation
  ジュネーブ国際会議場（スイス）
- Year and Date
  2014-08-25
- Data Source
  KAKENHI-PROJECT-25410163
[Presentation] Charged-droplet beam source using vacuum electrospray of an ionic liquid for secondary ion mass spectrometry (SIMS)2012
- Author(s)
  藤原幸雄
- Organizer
  19th International Mass Spectrometry Conference (IMSC 2012)
- Place of Presentation
  国立京都国際会館(京都市)
- Year and Date
  2012-09-17
- Data Source
  KAKENHI-PROJECT-22550091
[Presentation] Development of an ion beam source for Cluster SIMS using vacuum electrospray of an ionic liquid2011
- Author(s)
  藤原幸雄
- Organizer
  18th International Conference on Secondary Ion Mass Spectrometry
- Place of Presentation
  伊国トレント
- Year and Date
  2011-09-21
- Data Source
  KAKENHI-PROJECT-22550091
[Presentation] Development of an ion beam source for Cluster SIMS using vacuum electrospray of an ionic liquid2011
- Author(s)
  藤原幸雄
- Organizer
  18th International Conference on Secondary Ion Mass Spectrometry
- Place of Presentation
  トレント市(伊国)
- Year and Date
  2011-09-21
- Data Source
  KAKENHI-PROJECT-22550091
[Presentation] Application of an electrospray technique to Secondary Ion Mass Spectrometry (SIMS)2010
- Author(s)
  藤原幸雄
- Organizer
  American Vacuum Society 57th International Symposium
- Place of Presentation
  米国アルバカーキ市
- Year and Date
  2010-10-19
- Data Source
  KAKENHI-PROJECT-22550091
[Presentation] Application of an electrospray technique to Secondary Ion Mass Spectrometry (SIMS)2010
- Author(s)
  藤原幸雄
- Organizer
  American Vacuum Society 57th International Symposium
- Place of Presentation
  アルバカーキ市(米国)
- Year and Date
  2010-10-19
- Data Source
  KAKENHI-PROJECT-22550091
[Presentation] A new liquid-type cluster-ion-beam source for Secondary Ion Mass Spectrometry using an electrospray ionization technique2008
- Author(s)
  藤原幸雄、渡辺幸次、野中秀彦、齋藤直昭、藤本俊幸、黒河明、一村信吾
- Organizer
  56th ASMS Conference on Mass Spectrometry
- Place of Presentation
  デンバー(米国)
- Year and Date
  2008-06-05
- Data Source
  KAKENHI-PROJECT-19760029
[Presentation] A new liquid-type cluster-ion-beam source for Secondary Ion Mass Spectrometry using an electrospray ionization technique2008
- Author(s)
  藤原幸雄, 他
- Organizer
  第56回米国質量分析学会
- Place of Presentation
  Colorado convention center(米国デンバー市)
- Year and Date
  2008-06-04
- Data Source
  KAKENHI-PROJECT-19760029
[Presentation] 溶液型クラスターイオンビーム源の開発-イオン液体のエレクトロスプレー特性-2008
- Author(s)
  藤原幸雄、渡辺幸次、野中秀彦、齋藤直昭、藤本俊幸、黒河明、一村信吾
- Organizer
  第55 回応用物理学関係連合講演会
- Place of Presentation
  日本大学理工学部(船橋市)
- Year and Date
  2008-03-27
- Data Source
  KAKENHI-PROJECT-19760029
[Presentation] 溶液型クラスターイオンビーム源の開発-イオン液体のエレクト白スプレー特性-2008
- Author(s)
  藤原幸雄, 他
- Organizer
  第55回応用物理学関係連合講演会
- Place of Presentation
  日本大学理工学部(船橋市)
- Year and Date
  2008-03-27
- Data Source
  KAKENHI-PROJECT-19760029
[Presentation] Development of an Ionic-liquid Ion Beam Source for Secondary Ion Mass Spectrometry (SIMS)
- Author(s)
  Yukio Fujiwara, Naoaki Saito
- Organizer
  12th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-12)
- Place of Presentation
  国際会議場（茨城県つくば市）
- Data Source
  KAKENHI-PROJECT-25410163
[Presentation] Charged-droplet beam source using vacuum electrospray of an ionic liquid for secondary ion mass spectrometry (SIMS)
- Author(s)
  藤原幸雄
- Organizer
  19th International Mass Spectrometry Conference (IMSC 2012)
- Place of Presentation
  国立京都国際会館（京都市）
- Data Source
  KAKENHI-PROJECT-22550091
[Presentation] 真空エレクトロスプレーを用いたイオン液体ビーム源の開発と二次イオン質量分析（ＳＩＭＳ）への応用
- Author(s)
  藤原幸雄、齋藤直昭
- Organizer
  第61回質量分析総合討論会
- Place of Presentation
  つくば国際会議場（茨城県つくば市）
- Data Source
  KAKENHI-PROJECT-25410163
[Presentation] 真空エレクトロスプレーを用いたSIMS用イオン液体ビーム源の開発
- Author(s)
  藤原幸雄、齋藤直昭
- Organizer
  第61回応用物理学会春季学術講演会
- Place of Presentation
  青山学院大学相模原キャンパス(神奈川県相模原市)
- Data Source
  KAKENHI-PROJECT-25410163

Fujiwara Yukio 藤原 幸雄

FUJIWARA Yukio 藤原 幸雄

Research Projects

Research Products

新規クラスター負イオンビーム源の開発：反応性プロトン含有ＦＩＢ技術のＳＩＭＳ展開Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Organic secondary ion mass spectrometry with high sensitivity and high lateral resolution: development of a new cluster ion beam sourcePrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Development of a protic-ionic-liquid beam source toward high-sensitivity and high-lateral-resolution SIMS imaging of organic materialsPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Development of a charged-droplet beam source for secondary ion mass spectrometry using ionic liquidsPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Development of a new soft-ionization method of organic molecules on surfaces for imaging mass spectrometryPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Beam generation of large anions in a solution for secondary ion mass spectrometry (SIMS)Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Journal Article] Temperature effects on electrospray current from an externally wetted EMI-Im ionic liquid ion source2023

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Negative ion beam bombardment of a protic ionic liquid: Alleviating surface charging and damage and analyzing the surface of organic insulating materials2022

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Negative-cluster ion beam production from the tip of a sharp needle: Suppression of surface charging and surface analysis of an insulated sample2021

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Electrochemical Reactions of Ionic Liquid in Vacuum and Their Influence on Ion-Beam Production by Electrospray2020

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Ion beam generation from a protic ionic liquid source with an externally wetted tungsten needle2019

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Cluster ion beam generation from a wetted needle emitter for organic secondary ion mass spectrometry (organic SIMS) using a protic ionic liquid, propylammonium nitrate2018

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Time-of-flight secondary ion mass spectrometry using a new primary ion beam generated by vacuum electrospray of a protic ionic liquid, propylammonium nitrate2017

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Effects of a proton-conducting ionic liquid on secondary ion formation in time-of-flight secondary ion mass spectrometry2016

Author(s)

Journal Title

DOI

Data Source

Fujiwara Yukio 藤原幸雄

FUJIWARA Yukio 藤原幸雄

[Presentation] 針型エミッターからのプロトン性イオン液体のビーム生成：高集束性かつ高感度なSIMS用クラスターイオン源を目指して2018