Fujiwara Yukio 藤原幸雄

… Alternative Names

Researcher Number	60415742
Affiliation (Current)	2021: 国立研究開発法人産業技術総合研究所, 計量標準総合センター, 研究グループ長
Affiliation (based on the past Project Information) *help	2018 – 2019: 国立研究開発法人産業技術総合研究所, 計量標準総合センター, 研究グループ長 2017: 国立研究開発法人産業技術総合研究所, 計量標準総合センター, 主任研究員 2015 – 2016: 国立研究開発法人産業技術総合研究所, 分析計測標準研究部門, 主任研究員 2014: 独立行政法人産業技術総合研究所, 分析計測標準研究部門, 主任研究員 2010 – 2013: 独立行政法人産業技術総合研究所, 計測フロンティア研究部門, 主任研究員 2008: National Institute of Advanced Industrial Science and Technology, 計測フロンティア研究部門, 研究員 2007: National Institute of Advanced Industrial Science and Technology, 計測フロンティア研究部門, 研究員
Review Section/Research Field	Principal Investigator Analytical chemistry / Thin film/Surface and interfacial physical properties / Basic Section 34020:Analytical chemistry-related
Keywords	Principal Investigator 二次イオン質量分析 / SIMS / 表面分析 / クラスター / 質量分析 / イオンビーム / イオン液体 / エレクトロスプレー / ビーム応用 / 二次イオン質量分析法(SIMS) … More

Research Projects
(5 results)
Research Products
(30 results)

高感度・高面分解能な有機系二次イオン質量分析の実現：新規クラスタービーム源の開発Principal Investigator
- Principal Investigator
  
  藤原幸雄
- Project Period (FY)
  2019 – 2021
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 34020:Analytical chemistry-related
- Research Institution
  National Institute of Advanced Industrial Science and Technology
Development of a protic-ionic-liquid beam source toward high-sensitivity and high-lateral-resolution SIMS imaging of organic materialsPrincipal Investigator
- Principal Investigator
  
  Fujiwara Yukio
- Project Period (FY)
  2016 – 2018
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Analytical chemistry
- Research Institution
  National Institute of Advanced Industrial Science and Technology
Development of a charged-droplet beam source for secondary ion mass spectrometry using ionic liquidsPrincipal Investigator
- Principal Investigator
  
  Fujiwara Yukio
- Project Period (FY)
  2013 – 2015
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Analytical chemistry
- Research Institution
  National Institute of Advanced Industrial Science and Technology
Development of a new soft-ionization method of organic molecules on surfaces for imaging mass spectrometryPrincipal Investigator
- Principal Investigator
  
  FUJIWARA Yukio
- Project Period (FY)
  2010 – 2012
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Analytical chemistry
- Research Institution
  National Institute of Advanced Industrial Science and Technology
Beam generation of large anions in a solution for secondary ion mass spectrometry (SIMS)Principal Investigator
- Principal Investigator
  
  FUJIWARA Yukio
- Project Period (FY)
  2007 – 2008
- Research Category
  
  Grant-in-Aid for Young Scientists (B)
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  National Institute of Advanced Industrial Science and Technology

All 2019 2018 2017 2016 2015 2014 2013 2012 2011 2010 2008 Other

All Journal Article Presentation

[Journal Article] Ion beam generation from a protic ionic liquid source with an externally wetted tungsten needle2019
- Author(s)
  Yukio Fujiwara, Naoaki Saito
- Journal Title
  
  Journal of Applied Physics
  
  Volume: 126 Pages: 244901-244901
- DOI
  10.1063/1.5133821
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19K05535
[Journal Article] Cluster ion beam generation from a wetted needle emitter for organic secondary ion mass spectrometry (organic SIMS) using a protic ionic liquid, propylammonium nitrate2018
- Author(s)
  Yukio Fujiwara , Naoaki Saito
- Journal Title
  
  Rapid Commun Mass Spectrom.
  
  Volume: 32 Pages: 1867-1874
- DOI
  10.1002/rcm.8256
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16K05832
[Journal Article] Time-of-flight secondary ion mass spectrometry using a new primary ion beam generated by vacuum electrospray of a protic ionic liquid, propylammonium nitrate2017
- Author(s)
  Fujiwara Yukio、Saito Naoaki
- Journal Title
  
  Rapid Communications in Mass Spectrometry
  
  Volume: 31 Pages: 1859-1867
- DOI
  10.1002/rcm.7960
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16K05832
[Journal Article] Effects of a proton-conducting ionic liquid on secondary ion formation in time-of-flight secondary ion mass spectrometry2016
- Author(s)
  Y. Fujiwara, N. Saito
- Journal Title
  
  Rapid Commun. Mass Spectrom.
  
  Volume: 30 Pages: 239-249
- DOI
  10.1002/rcm.7439
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-25410163
[Journal Article] Increasing the intensity of protonated secondary ions in time-of-flight secondary ion mass spectrometry using a proton-conducting ionic liquid, diethylmethylammonium trifluoromethanesulfonate2015
- Author(s)
  Y. Fujiwara, N. Saito
- Journal Title
  
  Applied Physics Express
  
  Volume: 8 Issue: 7 Pages: 076601-076601
- DOI
  10.7567/apex.8.076601
- NAID
  210000137595
- ISSN
  1882-0778, 1882-0786
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-25410163
[Journal Article] Development of an Ionic-liquid Ion Beam Source for Secondary Ion Mass Spectrometry (SIMS)2014
- Author(s)
  Yukio Fujiwara, Naoaki Saito
- Journal Title
  
  e-J. Surf. Sci. Nanotech.
  
  Volume: 12 Issue: 0 Pages: 119-123
- DOI
  10.1380/ejssnt.2014.119
- NAID
  130004933808
- ISSN
  1348-0391
- Language
  English
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-25410163
[Journal Article] Emission characteristics of a charged-droplet beam source using vacuum electrospray of an ionic liquid2013
- Author(s)
  Yukio Fujiwara, Naoaki Saito, Hidehiko Nonaka, Shingo Ichimura
- Journal Title
  
  Surface and Interface Analysis
  
  Volume: 45巻 Pages: 517-521
- DOI
  10.1002/sia.5071
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22550091
[Presentation] イオン液体で濡らした針先端からのプロトン含有クラスターイオンビームの生成：集束イオンビーム(FIB)用の液体金属イオン源を参考として2019
- Author(s)
  藤原幸雄、齋藤直昭
- Organizer
  第67回質量分析総合討論会
- Data Source
  KAKENHI-PROJECT-19K05535
[Presentation] 液体金属イオン源方式のプロトン性イオン液体ビーム源の開発：有機イメージング質量分析の感度と面分解能の向上2018
- Author(s)
  藤原幸雄、齋藤直昭
- Organizer
  日本表面真空学会学術講演会
- Data Source
  KAKENHI-PROJECT-16K05832
[Presentation] 針型エミッターからのプロトン性イオン液体のビーム生成：高集束性かつ高感度なSIMS用クラスターイオン源を目指して2018
- Author(s)
  藤原幸雄、齋藤直昭
- Organizer
  第65回応用物理学会春季学術講演会
- Invited
- Data Source
  KAKENHI-PROJECT-16K05832
[Presentation] A new primary ion beam source using vacuum electrospray of protic ionic liquids2017
- Author(s)
  Yukio Fujiwara, Naoaki Saito
- Organizer
  The 21th International Conference on Secondary Ion Mass Spectrometry (SIMS XXI)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16K05832
[Presentation] プロトン性イオン液体のイオンビーム化と二次イオン質量分析（SIMS）の高感度化2015
- Author(s)
  藤原幸雄、齋藤直昭
- Organizer
  第6 回イオン液体討論会
- Place of Presentation
  同志社大学（京都府）
- Year and Date
  2015-10-27
- Data Source
  KAKENHI-PROJECT-25410163
[Presentation] Development of a vacuum-electrospray beam source using a proton-conducting ionic liquid [dema][TfO]: enhancing effect of protonated organic molecules2015
- Author(s)
  Y. Fujiwara, N. Saito
- Organizer
  The 20th International Conference on Secondary Ion Mass Spectrometry (SIMS XX)
- Place of Presentation
  The Westin Seattle、シアトル、米国
- Year and Date
  2015-09-15
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-25410163
[Presentation] クラスターイオンビームの二次イオン質量分析（SIMS）への応用2015
- Author(s)
  藤原幸雄、齋藤直昭
- Organizer
  学術振興会第132委員会（荷電粒子ビームの工業への応用）第217回研究会
- Place of Presentation
  東京理科大学（東京都）
- Year and Date
  2015-10-02
- Invited
- Data Source
  KAKENHI-PROJECT-25410163
[Presentation] イオン液体ビーム照射による有機系試料の二次イオン質量分析(SIMS)2015
- Author(s)
  藤原幸雄、齋藤直昭
- Organizer
  第62回応用物理学会春季学術講演会
- Place of Presentation
  東海大学湘南キャンパス（神奈川県平塚市）
- Year and Date
  2015-03-14
- Data Source
  KAKENHI-PROJECT-25410163
[Presentation] 真空エレクトロスプレーを用いた二次イオン質量分析（SIMS）用イオン液体ビーム源の開発2014
- Author(s)
  藤原幸雄、齋藤直昭
- Organizer
  第62回質量分析総合討論会
- Place of Presentation
  ホテル阪急エキスポパーク（大阪府吹田市）
- Year and Date
  2014-05-14
- Data Source
  KAKENHI-PROJECT-25410163
[Presentation] A new primary ion beam source for Secondary Ion Mass Spectrometry (SIMS) using vacuum electrospray of ionic liquids2014
- Author(s)
  Yukio Fujiwara, Naoaki Saito
- Organizer
  The 20th International Mass Spectrometry Conference
- Place of Presentation
  ジュネーブ国際会議場（スイス）
- Year and Date
  2014-08-25
- Data Source
  KAKENHI-PROJECT-25410163
[Presentation] Charged-droplet beam source using vacuum electrospray of an ionic liquid for secondary ion mass spectrometry (SIMS)2012
- Author(s)
  藤原幸雄
- Organizer
  19th International Mass Spectrometry Conference (IMSC 2012)
- Place of Presentation
  国立京都国際会館(京都市)
- Year and Date
  2012-09-17
- Data Source
  KAKENHI-PROJECT-22550091
[Presentation] Development of an ion beam source for Cluster SIMS using vacuum electrospray of an ionic liquid2011
- Author(s)
  藤原幸雄
- Organizer
  18th International Conference on Secondary Ion Mass Spectrometry
- Place of Presentation
  伊国トレント
- Year and Date
  2011-09-21
- Data Source
  KAKENHI-PROJECT-22550091
[Presentation] Development of an ion beam source for Cluster SIMS using vacuum electrospray of an ionic liquid2011
- Author(s)
  藤原幸雄
- Organizer
  18th International Conference on Secondary Ion Mass Spectrometry
- Place of Presentation
  トレント市(伊国)
- Year and Date
  2011-09-21
- Data Source
  KAKENHI-PROJECT-22550091
[Presentation] Application of an electrospray technique to Secondary Ion Mass Spectrometry (SIMS)2010
- Author(s)
  藤原幸雄
- Organizer
  American Vacuum Society 57th International Symposium
- Place of Presentation
  米国アルバカーキ市
- Year and Date
  2010-10-19
- Data Source
  KAKENHI-PROJECT-22550091
[Presentation] Application of an electrospray technique to Secondary Ion Mass Spectrometry (SIMS)2010
- Author(s)
  藤原幸雄
- Organizer
  American Vacuum Society 57th International Symposium
- Place of Presentation
  アルバカーキ市(米国)
- Year and Date
  2010-10-19
- Data Source
  KAKENHI-PROJECT-22550091
[Presentation] A new liquid-type cluster-ion-beam source for Secondary Ion Mass Spectrometry using an electrospray ionization technique2008
- Author(s)
  藤原幸雄、渡辺幸次、野中秀彦、齋藤直昭、藤本俊幸、黒河明、一村信吾
- Organizer
  56th ASMS Conference on Mass Spectrometry
- Place of Presentation
  デンバー(米国)
- Year and Date
  2008-06-05
- Data Source
  KAKENHI-PROJECT-19760029
[Presentation] A new liquid-type cluster-ion-beam source for Secondary Ion Mass Spectrometry using an electrospray ionization technique2008
- Author(s)
  藤原幸雄, 他
- Organizer
  第56回米国質量分析学会
- Place of Presentation
  Colorado convention center(米国デンバー市)
- Year and Date
  2008-06-04
- Data Source
  KAKENHI-PROJECT-19760029
[Presentation] 溶液型クラスターイオンビーム源の開発-イオン液体のエレクトロスプレー特性-2008
- Author(s)
  藤原幸雄、渡辺幸次、野中秀彦、齋藤直昭、藤本俊幸、黒河明、一村信吾
- Organizer
  第55 回応用物理学関係連合講演会
- Place of Presentation
  日本大学理工学部(船橋市)
- Year and Date
  2008-03-27
- Data Source
  KAKENHI-PROJECT-19760029
[Presentation] 溶液型クラスターイオンビーム源の開発-イオン液体のエレクト白スプレー特性-2008
- Author(s)
  藤原幸雄, 他
- Organizer
  第55回応用物理学関係連合講演会
- Place of Presentation
  日本大学理工学部(船橋市)
- Year and Date
  2008-03-27
- Data Source
  KAKENHI-PROJECT-19760029
[Presentation] Development of an Ionic-liquid Ion Beam Source for Secondary Ion Mass Spectrometry (SIMS)
- Author(s)
  Yukio Fujiwara, Naoaki Saito
- Organizer
  12th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-12)
- Place of Presentation
  国際会議場（茨城県つくば市）
- Data Source
  KAKENHI-PROJECT-25410163
[Presentation] Charged-droplet beam source using vacuum electrospray of an ionic liquid for secondary ion mass spectrometry (SIMS)
- Author(s)
  藤原幸雄
- Organizer
  19th International Mass Spectrometry Conference (IMSC 2012)
- Place of Presentation
  国立京都国際会館（京都市）
- Data Source
  KAKENHI-PROJECT-22550091
[Presentation] 真空エレクトロスプレーを用いたイオン液体ビーム源の開発と二次イオン質量分析（ＳＩＭＳ）への応用
- Author(s)
  藤原幸雄、齋藤直昭
- Organizer
  第61回質量分析総合討論会
- Place of Presentation
  つくば国際会議場（茨城県つくば市）
- Data Source
  KAKENHI-PROJECT-25410163
[Presentation] 真空エレクトロスプレーを用いたSIMS用イオン液体ビーム源の開発
- Author(s)
  藤原幸雄、齋藤直昭
- Organizer
  第61回応用物理学会春季学術講演会
- Place of Presentation
  青山学院大学相模原キャンパス(神奈川県相模原市)
- Data Source
  KAKENHI-PROJECT-25410163

Fujiwara Yukio 藤原 幸雄

FUJIWARA Yukio 藤原 幸雄

Research Projects

Research Products

高感度・高面分解能な有機系二次イオン質量分析の実現：新規クラスタービーム源の開発Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Development of a protic-ionic-liquid beam source toward high-sensitivity and high-lateral-resolution SIMS imaging of organic materialsPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Development of a charged-droplet beam source for secondary ion mass spectrometry using ionic liquidsPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Development of a new soft-ionization method of organic molecules on surfaces for imaging mass spectrometryPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Beam generation of large anions in a solution for secondary ion mass spectrometry (SIMS)Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Journal Article] Ion beam generation from a protic ionic liquid source with an externally wetted tungsten needle2019

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Cluster ion beam generation from a wetted needle emitter for organic secondary ion mass spectrometry (organic SIMS) using a protic ionic liquid, propylammonium nitrate2018

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Time-of-flight secondary ion mass spectrometry using a new primary ion beam generated by vacuum electrospray of a protic ionic liquid, propylammonium nitrate2017

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Effects of a proton-conducting ionic liquid on secondary ion formation in time-of-flight secondary ion mass spectrometry2016

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Increasing the intensity of protonated secondary ions in time-of-flight secondary ion mass spectrometry using a proton-conducting ionic liquid, diethylmethylammonium trifluoromethanesulfonate2015

Author(s)

Journal Title

DOI

NAID

ISSN

Data Source

[Journal Article] Development of an Ionic-liquid Ion Beam Source for Secondary Ion Mass Spectrometry (SIMS)2014

Author(s)

Journal Title

DOI

NAID

ISSN

Language

Data Source

[Journal Article] Emission characteristics of a charged-droplet beam source using vacuum electrospray of an ionic liquid2013

Author(s)

Journal Title

DOI

Data Source

[Presentation] イオン液体で濡らした針先端からのプロトン含有クラスターイオンビームの生成：集束イオンビーム(FIB)用の液体金属イオン源を参考として2019

Author(s)

Organizer

Data Source

[Presentation] 液体金属イオン源方式のプロトン性イオン液体ビーム源の開発：有機イメージング質量分析の感度と面分解能の向上2018

Author(s)

Fujiwara Yukio 藤原幸雄

FUJIWARA Yukio 藤原幸雄

[Presentation] 針型エミッターからのプロトン性イオン液体のビーム生成：高集束性かつ高感度なSIMS用クラスターイオン源を目指して2018