Sato Shingo 佐藤伸吾

Researcher Number	60709137
Other IDs
Affiliation (Current)	2025: 関西大学, システム理工学部, 准教授
Affiliation (based on the past Project Information) *help	2021 – 2023: 関西大学, システム理工学部, 准教授
Review Section/Research Field	Principal Investigator Basic Section 21050:Electric and electronic materials-related
Keywords	Principal Investigator 界面電荷密度 / 移動度 / シート抵抗 / 低電界移動度 / チャネル伝導 / 容量-電圧特性 / 伝送線路モデル / Kelvin法 / 積層半導体基板 / pseudo-MOS法

Research Projects
(1 results)
Research Products
(9 results)

A Study on Parameter Extraction Method of Carrier Transport Properties in Layered Semiconductor SubstratesPrincipal Investigator
- Principal Investigator
  
  Sato Shingo
- Project Period (FY)
  2021 – 2023
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 21050:Electric and electronic materials-related
- Research Institution
  Kansai University

All 2024 2023 2022 2021

All Journal Article Presentation

[Journal Article] Detailed analysis of the capacitance characteristic measured using the pseudo-metal–oxide–semiconductor method2024
- Author(s)
  Sato Shingo、Yuan Yifan
- Journal Title
  
  Solid-State Electronics
  
  Volume: 217 Pages: 108950-108950
- DOI
  10.1016/j.sse.2024.108950
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21K04160
[Journal Article] Detailed analysis of electrical components on a layered wafer via the AC pseudo-MOS method2023
- Author(s)
  Yuan Yifan、Sato Shingo
- Journal Title
  
  Solid-State Electronics
  
  Volume: 210 Pages: 108811-108811
- DOI
  10.1016/j.sse.2023.108811
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21K04160
[Journal Article] Detailing Influence of Contact Condition and Island Edge on Dual-Configuration Kelvin Pseudo-MOSFET Method2021
- Author(s)
  Mori Daigo、Nakata Iori、Matsuda Masayoshi、Sato Shingo
- Journal Title
  
  IEEE Transactions on Electron Devices
  
  Volume: 68 Issue: 6 Pages: 2906-2911
- DOI
  10.1109/ted.2021.3074115
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21K04160
[Presentation] AC pseudo-MOS法による積層ウエハ上の電気的成分の詳細解析2024
- Author(s)
  袁一凡, 佐藤伸吾
- Organizer
  先端科学技術シンポジウム2024
- Data Source
  KAKENHI-PROJECT-21K04160
[Presentation] Detailed analysis of electrical components on a layered wafer with an ac pseudo-MOS method2023
- Author(s)
  Y. Yuan, and S. Sato
- Organizer
  9th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K04160
[Presentation] Detailed analysis of electrical components on a layered wafer with an ac pseudo-MOS method,2023
- Author(s)
  Y. Yuan, S. Sato
- Organizer
  EuroSOI-ULIS’2023
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K04160
[Presentation] 高精度電気物性値抽出に向けた積層半導体基板評価技術の開発2023
- Author(s)
  袁一凡, 佐藤伸吾
- Organizer
  第27回関西大学先端科学技術シンポジウム
- Data Source
  KAKENHI-PROJECT-21K04160
[Presentation] Detailed analysis of electrical components on SOI wafer with an ac pseudo-MOS method,2022
- Author(s)
  Y. Yuan, and S. Sato
- Organizer
  The 2022 International Meeting for Future of Electron Devices, Kansai
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K04160
[Presentation] Modeling the propagation of ac signal on the channel of the pseudo-MOS method2021
- Author(s)
  Shingo Sato
- Organizer
  2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K04160

Sato Shingo 佐藤 伸吾

Research Projects

Research Products

A Study on Parameter Extraction Method of Carrier Transport Properties in Layered Semiconductor SubstratesPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

[Journal Article] Detailed analysis of the capacitance characteristic measured using the pseudo-metal&#8211;oxide&#8211;semiconductor method2024

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Detailed analysis of electrical components on a layered wafer via the AC pseudo-MOS method2023

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Detailing Influence of Contact Condition and Island Edge on Dual-Configuration Kelvin Pseudo-MOSFET Method2021

Author(s)

Journal Title

DOI

Data Source

[Presentation] AC pseudo-MOS法による積層ウエハ上の電気的成分の詳細解析2024

Author(s)

Organizer

Data Source

[Presentation] Detailed analysis of electrical components on a layered wafer with an ac pseudo-MOS method2023

Author(s)

Organizer

Data Source

[Presentation] Detailed analysis of electrical components on a layered wafer with an ac pseudo-MOS method,2023

Author(s)

Organizer

Data Source

[Presentation] 高精度電気物性値抽出に向けた積層半導体基板評価技術の開発2023

Author(s)

Organizer

Data Source

[Presentation] Detailed analysis of electrical components on SOI wafer with an ac pseudo-MOS method,2022

Author(s)

Organizer

Data Source

[Presentation] Modeling the propagation of ac signal on the channel of the pseudo-MOS method2021

Author(s)

Organizer

Data Source

Sato Shingo 佐藤伸吾

[Journal Article] Detailed analysis of the capacitance characteristic measured using the pseudo-metal–oxide–semiconductor method2024