KIMURA YOSHIHIDE 木村吉秀

… Alternative Names

木村吉秀キムラヨシヒデ

KIMURA Yoshihide 木村吉秀

木村良秀キムラヨシヒデ

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Researcher Number	70221215
Other IDs
External Links
Affiliation (Current)	2025: 大阪大学, 大学院工学研究科, 准教授
Affiliation (based on the past Project Information) *help	2015: 大阪大学, 工学研究科, 准教授 2013 – 2015: 大阪大学, 工学(系)研究科(研究院), 准教授 2007 – 2010: 大阪大学, 工学研究科, 准教授 2007 – 2008: Osaka University, Graduate School of Engineering, Associate Professor 2006: 大阪大学, 大学院工学研究科, 助教授 … More 2006: 大阪大学, 工学研究科, 助教授 2000 – 2005: Graduate School of Engineering, Osaka University, Associate professor, 大学院・工学研究科, 助教授 1998 – 1999: 大阪大学, 大学院・工学研究科, 助手 1990 – 1997: 大阪大学, 工学部, 助手 Less
Review Section/Research Field	Principal Investigator Applied physics, general / Thin film/Surface and interfacial physical properties Except Principal Investigator Applied physics, general / 応用物理学一般(含航海学) / Thin film/Surface and interfacial physical properties / 表面界面物性 / Applied physics, general / Thin film/Surface and interfacial physical properties / Electronic materials/Electric materials
Keywords	Principal Investigator Electron energy loss spectroscopy / Trace elements mapping / SDD X-ray detector / Transmission Electron Microscope / Transmitted Electron / Characteristic X-ray / Wave form measurement / Coincidence Detection / 波形フィッティング / 半導体X銭検出器 … More / SDD X線検出器 / 検出時刻精度 / 波形推定 / 波形計測 / 半導体X線検出器 / 透過型電子顕微鏡 / コインシデンス / 微量元素分布 / SDDX線検出器 / 同時刻検出 / 電子顕微鏡 / 透過電子 / 特性X線 / 波形計測法 / コインシデンス検出 / 真空蒸着 / 超高真空電子顕微鏡 / ガス雰囲気観察 / 発光中心 / 希土類金属 / 電子線照射 / シリコンナノドット … More Except Principal Investigator 球面収差補正 / 高分解能電子顕微鏡 / DNA / Aberration-Free observation / Spherical aberration Correction / 位相像観察 / 超解像位相差電子顕微鏡 / 能動型画像処理 / 超解像電子顕微鏡 / 無収差観察 / 生体試料観察 / 透過型高分解能電子顕微鏡 / Phase Electron Microscope / 3次元フーリエフィルタリング法 / 電子顕微鏡 / 焦点位置変調型画像処理 / ホローコーン照明 / Transmission Electron Microscope / 3次元フーリエ・フィルタリング法 / DNA分子直視観察 / ミニマムドーズシステム / Bio Medical Sample / 高圧変調 / 実時間画像処理 / 透過型電子顕微鏡 / 波動場再構成 / 位相コントラスト / ナノ材料 / コマ収差補正 / 非点収差補正 / 界面構造解析 / low electron dose / radiation damage / 3 dimensional Fourier filtering / phase reconstruction / aberration correction / tansmission electron microscope / 低ドーズ観察 / 電子線照射損傷 / 位相像再構成 / 収差補正 / unstained biological sample / Three Dimensional Fourier Filtering / MC simulation / rotor-type X-ray source / wavelength-tunable X-ray source / high-brightness X-ray source / nano-film / MCシミュレーション / 回転対陰極式X線源 / 波長可変X線源 / 高輝度X線源 / ナノ薄膜 / Low electron dose / Phase Electron Microscopy / Molecular structure / Sealing Film / Environmental Cell / Transmission Elecron Microscope / ガス雰囲気対応 / 圧力隔壁膜 / 環境ホルダー / Real-Time Correction / Hollow Cone Illumination / 3D Fourier Filtering / Defocus Image Modulation Processing / 実時間観察 / 能動型焦点位置変調画像処理 / High-Resolution Electron Microscopy / Spherical-Aberration-Free Observation / Real-time Processing / Accelerating voltage Modulation / Active Modulation Processing / 位相像分解観察 / 実時間変調処理法 / 無収差電子顕微鏡法 / 無球面収差観察 / 実時間処理 / 加速電圧変調 / Surface topography / Surface Potential / Micro Surface Physics / Holography Microscopy / Reflection Electron Microscopy / 表面トポグラフィー / 表面再構成 / 超高真空試料ホルダー / 高輝度電子銃 / 反射電子線ホログラフィー / 表面反応の動的観察 / 反射電子顕微鏡法 / 表面トボグラフィー / 表面電位 / 反射電子回折 / ミクロ表面物性 / ホログラフィー顕微鏡 / 反射電子顕微鏡 / staining free observation / acceleration voltage modulation / real-time image processing / aberration-free observation / ultra high resolution electron microscope / active image processing / 焦点ブレ変調 / 金微粒子 / 無収差像 / 原子レベル像観察 / 無染色電顕観察 / 高圧変調スルーフォーカス / 無収差電子顕微鏡像 / large sized X-ray detector / two dimensional detection / position sensitive detector / electron microscope / coincidence / 位置有感検出器 / 原子直視コインシデンス電子顕微鏡 / 二次観察 / 二次元観察 / 位置敏感検出器 / 元素分析 / コインシデンス / ３次元フーリエフィルタリング法 / 触媒化学反応 / その場観察技術 / グラフェン生成 / 原子レベル直視観察 / 各種収差補正 / 焦点位置追尾 / 実時間焦点位置変調法 / 触媒反応 / その場観察 / 波動場再構成法 / 無収差結像 / コマ収差 / 色収差 / 球面収差 / 位相・振幅分離再生 / 色消し結像条件 / 色収差補正 / 動的ホローコーン照明 / YAGレーザ加工 / Sn02 / レーザ加工 / エピタキシャル / 次世代ディスプレイ / SnO_2, YAGレーザ加工 / ナノシード層 / フラットパネルディスプレイ / 透明導電膜 / 位相CT / ナノデバイス / CT / Csコレクター / FE電子銃 / 走査型透過電子顕微鏡 / 放射光 / 解析・評価 / 表面・界面物性 / 光電子顕微鏡 / ウィーンフィルター / 断面試料作製 / 透過電子顕微鏡 / 集束イオンビーム / 集束イオンビーム加工 / ダイヤモンド界面 / 断面TEM観察 / SIMS / O_2^+ / superlattice / AlAs / GaAs / AES / depth profiling / Sputtering / 電位分布直接観察 / 電子線ホログラフィ- / 超格子界面 Less

Visualization of chemical reaction at an atomic scale by in-situ wave field restoration TEM method
- Principal Investigator
  
  Takai Yoshizo
- Project Period (FY)
  2013 – 2015
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  Osaka University
Simultaneous correction of spherical and chromatic aberrations by dynamic hollow-cone illumination
- Principal Investigator
  
  TAKAI Yoshizo
- Project Period (FY)
  2008 – 2010
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  Osaka University
Study of Ultra Low Resistance Thin Film of SnO2for Next Generation Display
- Principal Investigator
  
  SATOH Ryohei
- Project Period (FY)
  2007 – 2008
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  Osaka University
Development of Nano-phase Tomographic STEM
- Principal Investigator
  
  IKUTA Takashi
- Project Period (FY)
  2006 – 2010
- Research Category
  
  Grant-in-Aid for Creative Scientific Research
- Research Institution
  Osaka Electro-Communication University
Development of bio electron microscopy under ultra low electron dose conditions
- Principal Investigator
  
  TAKAI Yoshizo
- Project Period (FY)
  2006 – 2007
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  Osaka University
UHV-TEMを用いたLa注入シリコンナノドットアレイ電界発光素子の開発Principal Investigator
- Principal Investigator
  
  木村吉秀
- Project Period (FY)
  2003 – 2004
- Research Category
  
  Grant-in-Aid for Exploratory Research
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  Osaka University
Development of Super Resolution Bio-Phase Transmission Electron Microscopy
- Principal Investigator
  
  TAKAI Yoshizo
- Project Period (FY)
  2003 – 2004
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Applied physics, general
- Research Institution
  Osaka University
放射光-極微解析ナノスコープ
- Principal Investigator
  
  越川孝範
- Project Period (FY)
  2001 – 2005
- Research Category
  
  Grant-in-Aid for Creative Scientific Research
- Research Institution
  Osaka Electro-Communication University
Direct Observation of DNA at a Molecular Scale Level by Three-Dimensional Fourier Filtering Method
- Principal Investigator
  
  TAKAI Yoshizo
- Project Period (FY)
  2001 – 2002
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Applied physics, general
- Research Institution
  Osaka University
Development of high-brightness and wavelength-tunable nano-film-rotor-type X-ray source
- Principal Investigator
  
  NAGATOMI Takaharu
- Project Period (FY)
  2001 – 2002
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Applied physics, general
- Research Institution
  Osaka University
Development of wave form measurement method for high acuracy of detection time in semiconductor X-ray detectorPrincipal Investigator
- Principal Investigator
  
  KIMURA Yoshihide
- Project Period (FY)
  2001 – 2002
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Applied physics, general
- Research Institution
  Osaka University
Development of TEM specimen Holder Enabling Atomic Level Observation under One Atomospheric Pressure
- Principal Investigator
  
  TAKAI Yoshizo
- Project Period (FY)
  2000 – 2001
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Applied physics, general
- Research Institution
  Osaka University
Development of Super Resolution Phase Electron Microscopy
- Principal Investigator
  
  TAKAI Yoshizo
- Project Period (FY)
  1998 – 2000
- Research Category
  
  Grant-in-Aid for Scientific Research (B).
- Research Field
  
  Applied physics, general
- Research Institution
  Osaka University
ナノトームFIB装置用セクター型ウィーンフィルターの試作
- Principal Investigator
  
  高井義造
- Project Period (FY)
  1996
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  表面界面物性
- Research Institution
  Osaka University
ホローコーン照明による回転非対称収差除去法の開発
- Principal Investigator
  
  高井義造
- Project Period (FY)
  1996 – 1997
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Applied physics, general
- Research Institution
  Osaka University
ホローコーン照明による超解像無収差結像法の開発
- Principal Investigator
  
  高井義造
- Project Period (FY)
  1995
- Research Category
  
  Grant-in-Aid for General Scientific Research (C)
- Research Field
  
  Applied physics, general
- Research Institution
  Osaka University
Real-Time Active Modulation Electron Microscopy
- Principal Investigator
  
  SHIMIZU Ryuichi
- Project Period (FY)
  1995 – 1996
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Applied physics, general
- Research Institution
  Osaka University
^<18>O_2^+イオン銃の試作
- Principal Investigator
  
  井上雅彦
- Project Period (FY)
  1994
- Research Category
  
  Grant-in-Aid for Developmental Scientific Research (B)
- Research Field
  
  Applied physics, general
- Research Institution
  Osaka University
無収差電子顕微鏡と試作FIB装置を用いた系統的界面構造解析法の確立
- Principal Investigator
  
  TAKAI Yoshizo
- Project Period (FY)
  1994
- Research Category
  
  Grant-in-Aid for General Scientific Research (C)
- Research Field
  
  表面界面物性
- Research Institution
  Osaka University
Development of Scanning Reflection Electron Holography Microscopy (SREHM)
- Principal Investigator
  
  SHIMIZU Ryuichi
- Project Period (FY)
  1993 – 1994
- Research Category
  
  Grant-in-Aid for General Scientific Research (A)
- Research Field
  
  Applied physics, general
- Research Institution
  Osaka University
Development of Active Modulation Image Processing Ultra High Resolution Electron Microscope
- Principal Investigator
  
  SHIMIZU Ryuichi
- Project Period (FY)
  1992 – 1993
- Research Category
  
  Grant-in-Aid for Developmental Scientific Research (B)
- Research Field
  
  応用物理学一般(含航海学)
- Research Institution
  Osaka University
Development of Atom Resolution Coincidence Electron Microscope.
- Principal Investigator
  
  SHIMIZU Ryuich
- Project Period (FY)
  1990 – 1991
- Research Category
  
  Grant-in-Aid for Developmental Scientific Research (B)
- Research Field
  
  応用物理学一般(含航海学)
- Research Institution
  Osaka University.
原子直視ホログラフィ-電子顕微鏡による超格子界面の電位分布の直接観察
- Principal Investigator
  
  SHIMIZU Ryuich
- Project Period (FY)
  1989 – 1990
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Research Institution
  Osaka University

All 2016 2015 2014 2013 2010 2009 2008 2007 2006 Other

All Journal Article Presentation

[Journal Article] Development of a Defocus Modulation Transmission Electron Microscope System for In-situ High Resolution Observation2015
- Author(s)
  T. Tamura, Y. Kimura and Y. Takai
- Journal Title
  
  Proc. of 10th International Symposium on atomic level characterization for new materials and devices (ALC’15)
  
  Volume: 1 Pages: 60-61
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-25286059
[Journal Article] Precise Measurement of Specimen Height by 3 Dimensonal Fourier Filtering Method2015
- Author(s)
  M. Inamori, Y. Kimura and Y.Takai
- Journal Title
  
  Proc. of 10th International Symposium on atomic level characterization for new materials and devices (ALC’15)
  
  Volume: 1 Pages: 62-63
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-25286059
[Journal Article] Development of Parallel Image Detection System Using Annular Pupils for Scanning Transmission Electron Microscope2010
- Author(s)
  Takaomi Matsutani, Masaki Taya, Takeo Tanaka, Yoshihide Kimura, Yoshizo Takai, Tadahiro Kawasaki, Mikio Ichihashi, Takashi Ikuta
- Journal Title
  
  AIP Conference Proceedings Vol.1282
  
  Pages: 111-114
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Development of Parallel Detection and Processing System using Multidetector Array in Scanning Transmission Electron Microscope with Annular Pupil2010
- Author(s)
  T.Matsutani, M.Taya, T.Fujimura, H.Inui, T.Tanaka, Y.Kimura, Y.Takai, Kawasaki, M.Ichihashi, T.Ikuta
- Journal Title
  
  Plasma Application and Hybrid Functionally Materials Vol.19
  
  Pages: 87-88
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Development of Electron Optical System Using Annular Pupils for Scanning Transmission Electron Microscope2009
- Author(s)
  T.Matsutani, M.Taya, T.Tanaka, Y.Kimura, Y.Takai, T.Kawasaki, M.Ichihashi, T.Ikuta
- Journal Title
  
  Proceedings of the 7th International Symposium on Atomic Level Characterizations for New Materials and Devices '09 (ALC'09), held in Maui, Hawaii, USA, 08P37 (2009年12月8日発表)
  
  Pages: 245-248
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Evaluation of annular pupil for scanning transmission electron microscope formed by focused ion beam technique2009
- Author(s)
  T. Matsutani, M. Taya, T. Ikuta, T. Fujimura, H. Inui, T. Tanaka, I. Shimizu, Y. Kimura, Y. Takai, T. Kawasaki, and M. Ichihashi
- Journal Title
  
  Vacuum 83
  
  Pages: 201-204
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Annular Pupils for Electron Optics Able to Suppress High-Energy Electron Scattering Formed by Focused Ion Beam Technique2009
- Author(s)
  T.Matsutani, M.Taya, T.Fujimura, H.Inui, T.Tanaka, Y.Kimura, Y.Takai, T.Kawasaki, M.Ichihashi, T.Ikuta
- Journal Title
  
  Advances in Applied Plasma Science Vol.7
  
  Pages: 259-260
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Evaluation of annular pupil for scanning transmission electron microscope formed by focused ion beam technique2009
- Author(s)
  Takaomi Matsutani, Masaki Taya, Takashi Ikuta, Tetsuya Fujimura, Hirohiko Inui, Takeo Tanaka, Ippei Shimizu, Yoshihide Kimura, Yoshizo Takai, Tadahiro Kawasaki, Mikio Ichihashi
- Journal Title
  
  Vacuum Vol.83
  
  Pages: 201-204
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Focal Depth Extension by Hollow-cone Illumination with Annular Pupils for 200kV-Scanning Transmission Electron Microscope Tomography2009
- Author(s)
  T.Kawasaki, T.Matsutani, M.Taya, Y.Kimura, M.Ichihashi, T.Ikuta
- Journal Title
  
  Advances in Applied Plasma Science
  
  Pages: 261-262
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Development of Computer Assisted Imaging System for TEM with Direct Electron Detection Type CCD Camera2009
- Author(s)
  H. Kizawa, W. Togashi, M. Hayashida, Y. Kimura and Y. Takai
- Journal Title
  
  7th International Symposium on Atomic Level Characterizations for New Materials and Devices' 09(ALC' 09)
  
  Volume: 1巻 Pages: 239-240
- Data Source
  KAKENHI-PROJECT-20246015
[Journal Article] Aberration Analysis of Cs-corrector System with Twin Hexapoles and Transfer Lens Doublet in Scanning Transmission Electron Microscope by Simple Ray Tracing Based on Geometrical Optics2008
- Author(s)
  川崎忠寛, 市橋幹雄, 松谷貴臣, 木村吉秀, 生田孝
- Journal Title
  
  Surf.Interface Analysis Vol.40
  
  Pages: 1732-1735
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Wave Field Reconstruction under Critial Low Electron Dose Conditions : Comparison of SWFM and 3D-FFM2008
- Author(s)
  Y. Takai, T. Nomaguchi, and Y. Kimura
- Journal Title
  
  The 9th Asia-Pacific Microscopy Conference(APMC9)
  
  Volume: 1巻 Pages: 146-147
- Data Source
  KAKENHI-PROJECT-20246015
[Journal Article] 焦点位置変調電子顕微鏡による収差補正技術の開発とその応用2008
- Author(s)
  高井義造、木村吉秀
- Journal Title
  
  J. Vac. Soc. Jpn
  
  Volume: 51(11) Pages: 707-713
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20246015
[Journal Article] Measurement of Precision for Developing Automatic Transmission Electron Microscope2008
- Author(s)
  M. Hayashida, Y. Kimura, Y. Takai
- Journal Title
  
  Surf. Interface Anal
  
  Volume: 40(13) Pages: 1777-1780
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20246015
[Journal Article] Aberration-Free Imaging by Dynamic Hollow-cone Illumination in Transmission Electron Microscopy2008
- Author(s)
  K. Kitade, H. Yoshimori, T. Ikuta, Y. Kimura, and Y. Takai
- Journal Title
  
  The 9th Asia-Pacific Microscopy Conference(APMC9)
  
  Volume: 1巻 Pages: 35-36
- Data Source
  KAKENHI-PROJECT-20246015
[Journal Article] Aberration Analysis of Cs-corrector System with Twin Hexapoles and Transfer Lens Doublet in Scanning Transmission Electron Microscope by Simple Ray Tracing Based on Geometrical Optics2008
- Author(s)
  T. Kawasaki, M. Ichihashi, T. Matsutani, Y. Kimura and T. Ikuta
- Journal Title
  
  Surf.Interface Analysis 40
  
  Pages: 1732-1735
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Aberration-Free STEM Imaging System Incorporating Parallel Detection and Processing Techniques Using a Multidetector Array2008
- Author(s)
  Y. Takai, M. Taya, Y. Kimura, and T. Ikuta
- Journal Title
  
  The 9th Asia-Pacific Microscopy Conference(APMC9)
  
  Volume: 1巻 Pages: 37-38
- Data Source
  KAKENHI-PROJECT-20246015
[Journal Article] 集束イオンビームを用いた電子光学系輪帯瞳用アパーチャの作製2007
- Author(s)
  藤原誠,田中武雄,志水一平,松谷貴臣,日坂真樹,安江常夫,生田孝,田屋昌樹,木村吉秀,高井義造,川崎忠寛,市橋幹雄
- Journal Title
  
  真空(J.Vac.Soc.Jpn) Vol.50
  
  Pages: 639-643
- NAID
  10019784337
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Development of Annular Pupil for Scanning Transmission Electron Microscope by Focused Ion Beam Technique2007
- Author(s)
  Takaomi Matsutani, Masaki Taya, Takashi Ikuta, Tetsuya Fujimura, Hrihiko Inui, Takeo Tanaka, Yoshihide Kimura, Yoshizo Takai, Tadahiro Kawasaki, Mikio Ichihashi
- Journal Title
  
  Advances in Applied Plasma Science Vol.6
  
  Pages: 209-212
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Aberration Analysis of Cs-corrector System with Twin Hexapoles and Transfer Lens Doublet in Scanning Transmission Electron Microscope by Simple Ray Tracing Based on Geometrical Optics2007
- Author(s)
  川崎忠寛, 市橋幹雄, 松谷貴臣, 木村吉秀, 生田孝
- Journal Title
  
  Proceedings of the International Symposium on EcoTopia Science Vol.1
  
  Pages: 1245-1247
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Development of Annular Pupil for Electron Optics by Focused Ion Beam Technique2007
- Author(s)
  Takaomi Matsutani, Masaki Taya, Takashi Ikuta, Tetsuya Fujimura, Hrihiko Inui, Takeo Tanaka, Yoshihide Kimura, Yoshizo Takai, Tadahiro Kawasaki, Mikio Ichihashi
- Journal Title
  
  Proceedings of the 6th International Symposium on Atomic Level Characterizations for New Materials and Devices '07 (ALC'07), held in Kanazawa, Japan, TuP-13 (2007年10月30日発表)
  
  Pages: 147-150
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Interpretation of Cs-corrector System with Twin Hexapoles and Transfer Doublet based on Geometrical Optics Theory2007
- Author(s)
  Tadahiro Kawasaki, Mikio Ichihashi, Taisuke Nakamura, Takeshi Kawasaki, Takaomi Matsutani, Yoshihide Kimura, Takashi Ikuta
- Journal Title
  
  Proceedings of the 6th International Symposium on Atomic Level Characterizations for New Materials and Devices '07 (ALC'07), held in Kanazawa, Japan, TuP-2 (2007年10月30日発表)
  
  Pages: 119-122
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Development of the computer-emulated low-dose system2006
- Author(s)
  M.Hayashida, T.Nomaguchi, Y.Kimura, Y.Takai
- Journal Title
  
  16^<th> International Microscopy Congress (Sapporo) 2
  
  Pages: 1072-1072
- Data Source
  KAKENHI-PROJECT-18206007
[Journal Article] Estimation of suitable condition for observing. copper phthalocyanine crystalline film by transmission electron microscopy2006
- Author(s)
  M.Hayashida, T.Kawasaki, Y.Kimura, Y.Takai
- Journal Title
  
  Nuclear Instruments and Mehtods in Physics Research B 248
  
  Pages: 273-278
- Data Source
  KAKENHI-PROJECT-18206007
[Journal Article] Atomic Level Characterization Based on Defocus Modulation Electron Microscopy2006
- Author(s)
  Y.Takai, M.Taya H.Chikada, Y.Kimura
- Journal Title
  
  Microchimica Acta Vol.155
  
  Pages: 11-17
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Estimation of minimum electron dose necessary to resolve molecular structure of deoxyribonucleic acid by phase transmission electron microscopy2006
- Author(s)
  T.Nomaguchi, Y.Kimura, Y.Takai
- Journal Title
  
  Applied Physics Letter 89
  
  Pages: 231907-231907
- Data Source
  KAKENHI-PROJECT-18206007
[Journal Article] Observation of Individual DNA molecular structure using transmission electron microscope under low-dose conditions2006
- Author(s)
  T.Nomaguchi, M.Hayashida, Y.Kimura, Y.Takai
- Journal Title
  
  16^<th> International Microscopy Congress (Sapporo) 2
  
  Pages: 944-944
- Data Source
  KAKENHI-PROJECT-18206007
[Journal Article] Atomic Level Characterization Based on Defocus Modulation Electron Microscopy2006
- Author(s)
  Y.Takai, M.Taya, H.Chikada, Y.Kimura
- Journal Title
  
  Microchimica Acta Vol.55, No.1-2
  
  Pages: 11-17
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Molecular-scale imaging of unstained deoxyribonucleic acid fibers by phase transmission electron microscopy2006
- Author(s)
  Y.Takai, T.Nomaguchi, S.Matsushita, Y.Kimura
- Journal Title
  
  Applied Physics Letter 89
  
  Pages: 133903-133903
- Data Source
  KAKENHI-PROJECT-18206007
[Presentation] 焦点位置追尾が可能な実時間波動場再構成電子顕微鏡システムの開発2016
- Author(s)
  田村孝弘、木村吉秀、高井義造
- Organizer
  第63回応用物理学会春季学術講演会
- Place of Presentation
  東京工業大学、東京都、目黒区
- Year and Date
  2016-03-19
- Invited
- Data Source
  KAKENHI-PROJECT-25286059
[Presentation] 波動場再構成電子顕微鏡システムの開発2016
- Author(s)
  高井義造、田村孝弘、木村吉秀
- Organizer
  日本顕微鏡学会第72回学術講演会
- Place of Presentation
  仙台国際センター、宮城県仙台市
- Year and Date
  2016-06-14
- Data Source
  KAKENHI-PROJECT-25286059
[Presentation] 無収差観察が可能な実時間波動場再構成電子顕微鏡システムの開発2016
- Author(s)
  田村孝弘、木村吉秀、高井義造
- Organizer
  日本顕微鏡学会第72回学術講演会
- Place of Presentation
  仙台国際センター、宮城県仙台市
- Year and Date
  2016-06-14
- Data Source
  KAKENHI-PROJECT-25286059
[Presentation] 焦点位置追尾機能を有する変調電子顕微鏡システムの開発2015
- Author(s)
  田村孝弘、木村吉秀、高井義造
- Organizer
  第76回応用物理学会秋季学術講演会
- Place of Presentation
  名古屋国際会議場、愛知県名古屋市
- Year and Date
  2015-09-13
- Data Source
  KAKENHI-PROJECT-25286059
[Presentation] 透過電子顕微鏡における無収差結像に関する予備的研究2014
- Author(s)
  渡邊友加里，木村吉秀，高井義造
- Organizer
  日本顕微鏡学会第70回学術講演会
- Place of Presentation
  幕張メッセ国際会議場
- Data Source
  KAKENHI-PROJECT-25286059
[Presentation] 3次元フーリエフィルタリング法を利用した試料高さ位置の精密測定2014
- Author(s)
  稲盛真幸，木村吉秀，高井義造
- Organizer
  日本顕微鏡学会第70回学術講演会
- Place of Presentation
  幕張メッセ国際会議場
- Data Source
  KAKENHI-PROJECT-25286059
[Presentation] ハロイサイトの電子線照射損傷の定量的評価2013
- Author(s)
  森潔史，小暮敏博，木村吉秀，高井義造
- Organizer
  日本顕微鏡学会第６９回学術講演会
- Place of Presentation
  ホテル阪急エキスポパーク
- Data Source
  KAKENHI-PROJECT-25286059
[Presentation] 電子顕微鏡における直接電子入射 CCD撮像2013
- Author(s)
  木村吉秀
- Organizer
  日本顕微鏡学会第６９回学術講演会
- Place of Presentation
  ホテル阪急エキスポパーク
- Invited
- Data Source
  KAKENHI-PROJECT-25286059
[Presentation] Development of Parallel Detection and Processing System using Multidetector Array in Scanning Transmission Electron Microscope with Annular Pupil2010
- Author(s)
  Takaomi Matsutani, Masaki Taya, Takeo Tanaka, Yoshihide Kimura, Yoshizo Takai, Tadahiro Kawasaki, Mikio Ichihashi, Takashi Ikuta
- Organizer
  The 17th Annual Meeting of IAPS International Workshop 2010 in Busan
- Place of Presentation
  Busan, Korea
- Year and Date
  2010-02-26
- Data Source
  KAKENHI-PROJECT-18GS0211
[Presentation] 集束イオンビームによるテーパを有した電子光学系輪帯瞳の開発2009
- Author(s)
  松谷貴臣,田中武雄,木村吉秀,高井義造,川崎忠寛,市橋幹雄,生田孝
- Organizer
  平成21年電気学会全国大会
- Place of Presentation
  北海道
- Data Source
  KAKENHI-PROJECT-18GS0211
[Presentation] 集束イオンビームによる走査型透過電子顕微鏡用輪帯アパーチャの開発2009
- Author(s)
  松谷貴臣,田中武雄,木村吉秀,高井義造,川崎忠寛,市橋幹雄,生田孝
- Organizer
  第50回真空に関する連合講演会
- Place of Presentation
  学習院大学,東京(2009年11月5日発表)
- Data Source
  KAKENHI-PROJECT-18GS0211
[Presentation] 透過型電子顕微鏡における動的ホローコーン照明の高精度化2009
- Author(s)
  北出晃平, 生田孝, 木村吉秀, 高井義造
- Organizer
  第70回応用物理学会学術講演会
- Place of Presentation
  富山大学
- Data Source
  KAKENHI-PROJECT-20246015
[Presentation] 走査型透過電子顕微鏡における輪帯照明システムの開発2008
- Author(s)
  松谷貴臣,田屋昌樹,生田孝,田中武雄,木村吉秀,高井義造,川崎忠寛,市橋幹雄
- Organizer
  日本顕微鏡学会第64回学術講演会
- Place of Presentation
  京都
- Data Source
  KAKENHI-PROJECT-18GS0211
[Presentation] 走査型透過電子顕微鏡における輪帯照明システムの開発2008
- Author(s)
  松谷貴臣, 田屋昌樹, 生田孝, 田中武雄, 木村吉秀, 高井義造, 川崎忠寛
- Organizer
  日本顕微鏡学会第64回学術講演会
- Place of Presentation
  京都市
- Data Source
  KAKENHI-PROJECT-20246015
[Presentation] 電子顕微鏡自動化におけるコンデンサーレンズのヒステリシス対策2008
- Author(s)
  林田美咲, 木村吉秀
- Organizer
  日本顕微鏡学会第64回学術講演会
- Place of Presentation
  京都市
- Data Source
  KAKENHI-PROJECT-20246015
[Presentation] 動的ホローコーン照明を用いた無収差結像2008
- Author(s)
  高井義造, 吉森宏雅, 北出昇平, 木村吉秀
- Organizer
  日本顕微鏡学会第64回学術講演会
- Place of Presentation
  京都市
- Data Source
  KAKENHI-PROJECT-20246015
[Presentation] Formation of High-energy Electron Scattering Suppressible Annular Pupils for Electron Optics by Focused Ion Beam Technique2008
- Author(s)
  Takaomi Matsutani, Masaki Taya, Takashi Ikuta, Tetsuya Fujimura, Hirohiko Inui, Takeo Tanaka, Yoshihide Kimura, Yoshizo Takai, Tadahiro Kawasaki, Mikio Ichihashi, Toshimi Ohye
- Organizer
  The 15th Annual Meeting of Institute of Applied Plasma Science
- Place of Presentation
  held in Tairen, China
- Data Source
  KAKENHI-PROJECT-18GS0211
[Presentation] Aberration-Free Imaging by Dynamic Hollow-cone Illumination in Transmission Electron Microscopy2008
- Author(s)
  K.Kitade, H.Yoshimori, T.Ikuta, Y.Kimura, Y.Takai
- Organizer
  Proc.of the 9th Asia-Pacific Microscopy Conference (APMC9)(2-7 Nov.)
- Place of Presentation
  held in Jeju island, Korea
- Data Source
  KAKENHI-PROJECT-18GS0211
[Presentation] Development of Annular Pupil for Scanning Transmission Electron Microscope by Focused Ion Beam Technique2007
- Author(s)
  Takaomi Matsutani, Masaki Taya, Takashi Ikuta, Makoto Fujiwara, Takeo Tanaka, Yoshihide Kimura, Yoshizo Takai, Tadahiro Kawasaki, Mikio Ichihashi
- Organizer
  The 6th International Symposium on Applied Plasma Science
- Place of Presentation
  held in Nikko, Japan(2007年9月27日発表)
- Data Source
  KAKENHI-PROJECT-18GS0211
[Presentation] A Process for Exit Wave Restoration Using Through-focus Series2007
- Author(s)
  N.Nomaguchi, Yoshihide Kimura, Yoshizo Takai
- Organizer
  Proceedings of the 6th International Symposium on Atomic Level Characterizations for New Materials and Devices '07 (ALC'07)(TuP-9)
- Place of Presentation
  held in Kanazawa, Japan(2007年10月30日発表)
- Data Source
  KAKENHI-PROJECT-18GS0211
[Presentation] 3次元フーリエフィルタリング法を利用した試料高さ位置の精密測定
- Author(s)
  稲盛真幸、木村吉秀、高井義造
- Organizer
  日本顕微鏡学会第70回学術講演会
- Place of Presentation
  千葉、幕張メッセ国際会議場
- Year and Date
  2014-05-11 – 2014-05-13
- Data Source
  KAKENHI-PROJECT-25286059
[Presentation] 透過電子顕微鏡における無収差結像に関する予備的検討
- Author(s)
  渡邊友加里、木村吉秀、高井義造
- Organizer
  日本顕微鏡学会第70回学術講演会
- Place of Presentation
  千葉、幕張メッセ国際会議場
- Year and Date
  2014-05-11 – 2014-05-13
- Data Source
  KAKENHI-PROJECT-25286059

1. TAKAI Yoshizo (30236179)

# of Collaborated Projects: 15 results

# of Collaborated Products: 25 results
2. IKUTA Takashi (20103343)

# of Collaborated Projects: 9 results

# of Collaborated Products: 21 results
3. NAGATOMI Takaharu (90314369)

# of Collaborated Projects: 7 results

# of Collaborated Products: 0 results
4. SHIMIZU Ryuich (40029046)

# of Collaborated Projects: 5 results

# of Collaborated Products: 0 results
5. YASUE Tuneo (00212275)

# of Collaborated Projects: 2 results

# of Collaborated Products: 1 results
6. SATOH Ryohei (80343242)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
7. ICHIHASHI Mikio (90345869)

# of Collaborated Projects: 2 results

# of Collaborated Products: 20 results
8. 坪川純之 (40175469)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
9. 井上雅彦 (60191889)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
10. OBORI Kenichi

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
11. TSUNO Katsushige

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
12. 野口恒行

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
13. HISAKA Masaki (40340640)

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
14. USUKURA Jiro (30143415)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
15. KAWASAKI Tadahiro (10372533)

# of Collaborated Projects: 1 results

# of Collaborated Products: 20 results
16. OYE Toshjimi (30076632)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
17. KODAMA Tetsuji (50262861)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
18. MATSUTANI Takaomi (00411413)

# of Collaborated Projects: 1 results

# of Collaborated Products: 20 results
19. FUKUDA Takeshi (50354585)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
20. IWATA Yoshiharu (30263205)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
21. MORINAGA Eiji (80432508)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
22. 越川孝範 (60098085)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
23. 吉川英樹 (20354409)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
24. 吉田清和 (50263223)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
25. 高井義造 (93023619)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
26. FUKUSHIMA Kurio

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
27. 田口雅美

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
28. 吉田多見男

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
29. 福島整

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
30. 尾野直紀

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
31. 高木透

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
32. 山川洋幸

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
33. OBORI Ken-ich

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

KIMURA YOSHIHIDE 木村 吉秀

木村 吉秀 キムラ ヨシヒデ

KIMURA Yoshihide 木村 吉秀

木村 良秀 キムラ ヨシヒデ

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UHV-TEMを用いたLa注入シリコンナノドットアレイ電界発光素子の開発Principal Investigator

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Development of wave form measurement method for high acuracy of detection time in semiconductor X-ray detectorPrincipal Investigator

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KIMURA YOSHIHIDE 木村吉秀

木村吉秀キムラヨシヒデ

KIMURA Yoshihide 木村吉秀

木村良秀キムラヨシヒデ