kusaka kazuya 日下一也

… Alternative Names

Researcher Number	70274256
Other IDs
External Links
Affiliation (Current)	2021: 徳島大学, 大学院社会産業理工学研究部(理工学域), 講師
Affiliation (based on the past Project Information) *help	2020: 徳島大学, 大学院社会産業理工学研究部(理工学域), 講師 2010 – 2011: 徳島大学, 大学院・ソシオテクノサイエンス研究部, 講師 2009: 徳島大学, 大学院・ソシオテクノサイエンス研究部, 助教 2006: The University of Tokushima, Institute of Technology and Science, Assistant, 大学院ソシオテクノサイエンス研究部, 助手 2006: 徳島大学, 大学院・ソシオテクノサイエンス研究部, 助手 … More
Review Section/Research Field	Principal Investigator Materials/Mechanics of materials / Materials/Mechanics of materials Except Principal Investigator Materials/Mechanics of materials / Materials/Mechanics of materials / Basic Section 18010:Mechanics of materials and materials-related
Keywords	Principal Investigator X線回折 / 窒化物半導体 / 窒化アルミニウム / 窒化ガリウム / アパッタリング / c軸配向 / 残留応力 / ガラス基板 / スパッタリング / 薄膜 … More Except Principal Investigator 薄膜 / 熱応力 / Thin film / Thermal stress / 残留応力 / X線応力測定 / ストレスマイグレーション / Cu膜 / Cu薄膜 / Residual stress / 銅双結晶 / アルミニウム3重結晶 / 結晶粒界 / 微視的残留応力 / 放射光応力測定 / 中性子応力測定 / 単結晶応力測定 / アルミニウム / 3重結晶 / 双結晶変形 / 変形拘束 / 内部応力 / その場観察 / 表面形態 / 優先方位 / 熱サイクル / ストレスマグレーション / Internal stress / In-situ observation / Surface morphology / Stress migration / Preferred orientation / X-ray stress measurement / X線測定 / シンクロトロン放射光 / Al配線 / エレクトロマイグレーション / 高温その場測定 / X-ray measurement / Synchrotron radiations / ナノサイズ / Al膜 / 熱サイクル試験 / Al薄膜 / 保護膜 / Nano-size / Al film / Cu film / Thermal cycle test / 多層膜 / エロージョン / 膜厚比 Less

Cr/CrN多層コーティング膜を利用した耐エロージョン材料の開発Ongoing
- Principal Investigator
  
  米倉大介
- Project Period (FY)
  2020 – 2022
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 18010:Mechanics of materials and materials-related
- Research Institution
  The University of Tokushima
Deformation constraint by grain boundary observed with microscopic view point
- Principal Investigator
  
  HANABUSA Takao
- Project Period (FY)
  2009 – 2011
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  The University of Tokushima
微小領域にレーザピーニング処理したアルミニウム合金の内部応力評価Principal Investigator
- Principal Investigator
  
  日下一也
- Project Period (FY)
  2005 – 2006
- Research Category
  
  Grant-in-Aid for Young Scientists (B)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  The University of Tokushima
What is a controlling factor of the strength of thin films?
- Principal Investigator
  
  HANABUSA Takao
- Project Period (FY)
  2005 – 2006
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  The University of Tokushima
In-situ system observation of thermal stress in thin films by in-lab X-ray equipment and synchrotron radiation
- Principal Investigator
  
  HANABUSA Takao
- Project Period (FY)
  2002 – 2003
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  The University of Tokushima
スパッタリング窒化物半導体薄膜の作製とX線回折を用いた特性評価Principal Investigator
- Principal Investigator
  
  日下一也
- Project Period (FY)
  1999 – 2000
- Research Category
  
  Grant-in-Aid for Encouragement of Young Scientists (A)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  The University of Tokushima
Internal Stress and Atomic Transportation in Thin Film and Line Structure
- Principal Investigator
  
  HANABUSA Takao
- Project Period (FY)
  1998 – 1999
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  The University of Tokushima

All 2010 2006 2005

All Journal Article

[Journal Article] Measurement of Micro Residual Stress Near The Grain Boundary in Copper Bycrystal2010
- Author(s)
  Ayumi Shiro, Takao Hanabusa, Tatsuya Okada, Masayuki Nishida, Kazuya Kusaka, Osami Sakata
- Journal Title
  
  Advanced Materials Research
  
  Volume: Vols. 89-91 Pages: 515-520
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21560095
[Journal Article] Thermal stress behavior in nano-size thin aluminum films2006
- Author(s)
  T.Hanabusa, K.Kusaka, S.Shingubara, O.Sakata
- Journal Title
  
  International Journal of Modern Physics B Vol. 20 No. 25, 26 ＆ 27
  
  Pages: 4691-4696
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17560071
[Journal Article] Thermal stress behavior in nano-size thin aluminum films2006
- Author(s)
  T.Hanabusa, K.Kusaka, S.Shingubara, O.Sakata
- Journal Title
  
  International Journal of Modern Physics B 20-25 26 ＆ 27
  
  Pages: 4691-4696
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17560071
[Journal Article] Thermal stress behavior in nano-size thin aluminum films2006
- Author(s)
  T.Hanabusa, K.Kusaka, S.Shingubara, O.Sakata
- Journal Title
  
  International Journal of Modern Physics B Vol.20 No.25,26＆27
  
  Pages: 4691-4696
- Data Source
  KAKENHI-PROJECT-17560071
[Journal Article] In-situ observation of thermal stress in nano-size thin aluminum films2005
- Author(s)
  T.Hanabusa, K.Kusaka, S.Shingubara, O.Sakata
- Journal Title
  
  Materials Science Forum Vol.490-491
  
  Pages: 577-582
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17560071
[Journal Article] Residual stress measurement in sputtered copper thin films by synchrotron radiation and ordinary X-rays2005
- Author(s)
  M.Hataya, T.Hanabusa, K.Kusaka, K.Tominaga, T.Matsue, O.Sakata
- Journal Title
  
  Materials Science Forum Vol. 490-491
  
  Pages: 661-666
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17560071
[Journal Article] Residual stress measurement in sputtered copper thin films by synchrotron radiation and ordinary X-rays2005
- Author(s)
  M.Hataya, T.Hanabusa, K.Kusaka, K.Tominaga, T.Matsue, O.Sakata
- Journal Title
  
  Materials Science Forum Vol.490-491
  
  Pages: 661-666
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17560071
[Journal Article] In-situ observation of thermal stress in nano-size thin aluminum films2005
- Author(s)
  T.Hanabusa, K.Kusaka, S.Shingubara, O.Sakata
- Journal Title
  
  Materials Science Forum Vol. 490-491
  
  Pages: 577-582
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17560071
[Journal Article] レーザーピーニング処理したアルミニウム合金の残留応力のレーザーパワー密度および走査速度依存性2005
- Author(s)
  日下一也
- Journal Title
  
  材料 54巻,7号
  
  Pages: 672-678
- NAID
  110006266558
- Data Source
  KAKENHI-PROJECT-17760085

1. HANABUSA Takao (20035637)

# of Collaborated Projects: 4 results

# of Collaborated Products: 8 results
2. NISHIDA I Masayuk (80332047)

# of Collaborated Projects: 2 results

# of Collaborated Products: 1 results
3. OKADA Tatsuya (20281165)

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
4. 米倉大介 (70314846)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
5. SHIRO Ayumi

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
6. BUNYA Hirotomo

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
7. KAWANO Tomoya

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

kusaka kazuya 日下 一也

日下 一也 クサカ カズヤ

KUSAKA Kazuya 日下 一也

Research Projects

Research Products

Co-Researchers

Cr/CrN多層コーティング膜を利用した耐エロージョン材料の開発Ongoing

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Deformation constraint by grain boundary observed with microscopic view point

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

微小領域にレーザピーニング処理したアルミニウム合金の内部応力評価Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

What is a controlling factor of the strength of thin films?

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

In-situ system observation of thermal stress in thin films by in-lab X-ray equipment and synchrotron radiation

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

スパッタリング窒化物半導体薄膜の作製とX線回折を用いた特性評価Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Internal Stress and Atomic Transportation in Thin Film and Line Structure

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Journal Article] Measurement of Micro Residual Stress Near The Grain Boundary in Copper Bycrystal2010

Author(s)

Journal Title

Data Source

[Journal Article] Thermal stress behavior in nano-size thin aluminum films2006

Author(s)

Journal Title

Description

Data Source

[Journal Article] Thermal stress behavior in nano-size thin aluminum films2006

Author(s)

Journal Title

Description

Data Source

[Journal Article] Thermal stress behavior in nano-size thin aluminum films2006

Author(s)

Journal Title

Data Source

[Journal Article] In-situ observation of thermal stress in nano-size thin aluminum films2005

Author(s)

Journal Title

Description

Data Source

[Journal Article] Residual stress measurement in sputtered copper thin films by synchrotron radiation and ordinary X-rays2005

Author(s)

Journal Title

Description

Data Source

[Journal Article] Residual stress measurement in sputtered copper thin films by synchrotron radiation and ordinary X-rays2005

Author(s)

Journal Title

Description

kusaka kazuya 日下一也

日下一也クサカカズヤ

KUSAKA Kazuya 日下一也