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MORIYAMA Miki  守山 実希

ORCIDConnect your ORCID iD *help
… Alternative Names

守山 美希  モリヤマ ミキ

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Researcher Number 70303857
Other IDs
External Links
Affiliation (based on the past Project Information) *help 2000 – 2003: Kyoto Univ. Research Associate, 工学研究科, 助手
1999: 京都大学, 大学院・工学研究科, 助手
1998: 京都大学, 工学研究科, 助手
Review Section/Research Field
Principal Investigator
Structural/Functional materials
Except Principal Investigator
Structural/Functional materials / Physical properties of metals
Keywords
Principal Investigator
配線信頼性 / Impurity / Microvoid / Reliability / Copper Interconnect / ULSI / 水素脆性 / Si半導体デバイス / 不純物 / マイクロボイド … More / Cu配線材 / ULSIデバイス / 粒成長 / Siデバイス / 薄膜材料 / 室温粒成長 / 真性歪み / 異常粒成長 / Cu配線材料 / Si-ULSIデバイス … More
Except Principal Investigator
CdTe / Ohmic contact / 微細構造 / InGaAs / NiInGe / GaAs / 接触抵抗 / 界面 / 電極 / オーミック・コンタクト / Interfacial microstructure / Current transport / Potentiometry / Wide-gap semiconductor / STP解析 / 炭化シリコン / ポテンショメトリー / 走査トンネル顕微鏡 / 半導体界面 / 金属 / オーム性電極材料 / 電流輸送 / STP解析法 / ワイドギャップ半導体 / オーム性電極 / contact materials / radiation detectors / ショットキー電極材 / 半導体放射線検出器 / Microstructure / Electrode / Contact resistance / Interface / FET / コンタクト抵抗 / 拡散バリア材 / 低障壁中間層 / TaTi / GaN Less
  • Research Projects

    (6 results)
  • Research Products

    (10 results)
  • Co-Researchers

    (8 People)
  •  Ohmic contact materials for wide-gap semiconductors : Fabrication and STP analysis.

    • Principal Investigator
      MURAKAMI Masanori
    • Project Period (FY)
      2003 – 2005
    • Research Category
      Grant-in-Aid for Scientific Research (A)
    • Research Field
      Physical properties of metals
    • Research Institution
      KYOTO UNIVERSITY
  •  Development of highly reliable contacts on p-type CdTe for radiation detectors

    • Principal Investigator
      MURAKAMI Masanori
    • Project Period (FY)
      2001 – 2002
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Structural/Functional materials
    • Research Institution
      KYOTO UNIVERSITY
  •  Formation Mechanism of Unique Voids in Cu Interconnects for ULSIPrincipal Investigator

    • Principal Investigator
      MORIYAMA Miki
    • Project Period (FY)
      2001 – 2002
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Structural/Functional materials
    • Research Institution
      KYOTO UNIVERSITY
  •  水素吸蔵金属とGaN半導体の接合界面における水素の挙動

    • Principal Investigator
      KOIDE Yasuo
    • Project Period (FY)
      2000 – 2001
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Structural/Functional materials
    • Research Institution
      Kyoto University
  •  ULSIデバイス用Cu配線材料にみられる"異常"結晶粒成長の解明Principal Investigator

    • Principal Investigator
      守山 実希
    • Project Period (FY)
      1999 – 2000
    • Research Category
      Grant-in-Aid for Encouragement of Young Scientists (A)
    • Research Field
      Structural/Functional materials
    • Research Institution
      Kyoto University
  •  ガリウム・ヒ素化合物半導体用の超新機能電極材料の研究

    • Principal Investigator
      MURAKAMI Mosanori
    • Project Period (FY)
      1998 – 2000
    • Research Category
      Grant-in-Aid for Scientific Research (A).
    • Research Field
      Structural/Functional materials
    • Research Institution
      KYOTO UNIVERSITY

All 2005 2004

All Journal Article

  • [Journal Article] Development of electrode materials for semiconductor devices2005

    • Author(s)
      Masanori Murakami, Y.Koide, M.Moriyama, S.Tsukimoto
    • Journal Title

      Materials Science Forum 475-479巻

      Pages: 1705-1714

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-15206069
  • [Journal Article] Development of electrode materials for semiconductor devices2005

    • Author(s)
      Masanori Murakami, Y.Koide, M.Moriyama, S.Tsukimoto
    • Journal Title

      Materials Science Forum 475-479

      Pages: 1705-1714

    • Data Source
      KAKENHI-PROJECT-15206069
  • [Journal Article] Development of electrode materials for semiconductor devices.2005

    • Author(s)
      Masanori Murakami, Y.Koide, M.Moriyama, S.Tsukimoto
    • Journal Title

      Materials Science Forum 475-479

      Pages: 1705-1714

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-15206069
  • [Journal Article] Correlation between the electrical properties and the interfacial microstructures of TiAl-based ohmic contacts to p-type 4H-SiC.2004

    • Author(s)
      S.Tsukimoto, K.Nitta, T.Sakai, M.Moriyama, M.Murakami
    • Journal Title

      Journal of Electronic Materials, 33

      Pages: 460-466

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-15206069
  • [Journal Article] Ternary TiAlGe ohmic contacts for p-type 4H-SiC2004

    • Author(s)
      T.Sakai, K.Nitta, S.Tsukimono, M.Moriyama, Masanori Murakami
    • Journal Title

      JOURNAL OF APPLIED PHYSICS 95巻5号

      Pages: 2187-2189

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-15206069
  • [Journal Article] Development of electrode materials for semiconductor devices.2004

    • Author(s)
      Masanori Murakami, M.Moriyama, S.Tsukimoto
    • Journal Title

      Transactions of the Materials Research Society of Japan 29

      Pages: 45-50

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-15206069
  • [Journal Article] Ternary TiAlGe ohmic contacts for p-type 4H-SiC.2004

    • Author(s)
      T.Sakai, K.Nitta, S.Tsukimoto, M.Moriyama, Masanori Murakami
    • Journal Title

      Journal of Applied Physics 95

      Pages: 2187-2189

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-15206069
  • [Journal Article] Development of electrode materials for semiconductor devices2004

    • Author(s)
      M.Murakami, M.Moriyama, S.Tsukimoto
    • Journal Title

      Trans. the Materials Research Society of Japan 29巻

      Pages: 45-50

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-15206069
  • [Journal Article] Correlation between the electrical properties and the interfacial microstructures of TiAl-based ohmic contacts to p-type 4H-SiC2004

    • Author(s)
      S.Tsukimoto, K.Nitta, T.Sakai, M.Moriyama, M.Murakami
    • Journal Title

      Journal of Electronic Materials 33巻

      Pages: 460-466

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-15206069
  • [Journal Article] Development of electrode materials for semiconductor devices2004

    • Author(s)
      M.Murakami, M.Moriyama, S.Tsukimoto
    • Journal Title

      Transactions of the Materials Research Society of Japan 29巻

      Pages: 45-50

    • Data Source
      KAKENHI-PROJECT-15206069
  • 1.  MURAKAMI Mosanori (70229970)
    # of Collaborated Projects: 5 results
    # of Collaborated Products: 10 results
  • 2.  KOIDE Yasuo (70195650)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 0 results
  • 3.  MORI Hidetsugu (60283644)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 4.  MATSUBARA Eiichiro (90173864)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 5.  SAKAI Akira (80143543)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 4 results
  • 6.  KUROKAWA Shu (90303859)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 7.  ITO Kazuhiro (60303856)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 8.  TSUKIMOTO Susumu (50346087)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 9 results

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