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Sato Nobuo  佐藤 宣夫

… Alternative Names

佐藤 宣夫  サトウ ノブオ

SATOH Nobuo  佐藤 宣夫

SATO Nobuo  佐藤 宣夫

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Researcher Number 70397602
Other IDs
  • ORCIDhttps://orcid.org/0000-0001-7052-7164
Affiliation (Current) 2025: 千葉工業大学, 工学部, 教授
Affiliation (based on the past Project Information) *help 2022 – 2024: 千葉工業大学, 工学部, 教授
2019 – 2020: 千葉工業大学, 工学部, 教授
2015 – 2016: 千葉工業大学, 工学部, 教授
2014: 千葉工業大学, 工学部, 准教授
2007 – 2011: Kyoto University, 工学研究科, 助教
2009 – 2010: Kyoto University, 大学院・工学研究科, 助教
2006: 京都大学, 工学研究科, 産学官連携研究員
Review Section/Research Field
Principal Investigator
Power engineering/Power conversion/Electric machinery / Structural/Functional materials / Science and Engineering / Thin film/Surface and interfacial physical properties
Except Principal Investigator
Medium-sized Section 25:Social systems engineering, safety engineering, disaster prevention engineering, and related fields / Science and Engineering / Electronic materials/Electric materials / Power engineering/Power conversion/Electric machinery
Keywords
Principal Investigator
表面・界面物性 / 周波数変調 / プローブ顕微鏡 / パワーデバイス / 高周波駆動 / 高速スイッチング / 高周波スイッチング / フライバックコンバータ / 電力変換回路 / パワー半導体デバイス … More / 走査プローブ技術 / 赤外線分光 / ナノプローブ / 強誘電体薄膜 / 光機能材料 / センサー材料 / ナノプローブ工学 / 制御工学 / ナノ材料 / 光学物性 / 微小変位検出 / 表面物性 / 圧電カンチレバー / 散逸力 / 光誘起相互作用力 / 近接場光 / ナノスケール評価 / ノイズ解析 / 光誘起相互作用 / 散逸エネルギー計測 / 周波数変調方式 / 近接場光学 … More
Except Principal Investigator
非破壊検査 / 周波数シフト帰還型レーザー / テラヘルツ波 / 走査型プローブ顕微鏡 / 距離計測 / 周波数シフト帰還レーザー / 非破壊診断 / 国際情報交換(アゼルバイジャン) / 近接場顕微鏡 / タリウム化合物 / プローブ顕微鏡 / ナノドメインの可視化 / 近接場光顕微鏡 / 構造相転移 / ナノ変調構造 / ナノドメイン / コメンシュレート相 / ナノ空間変調構造 / タリウム系化合物 / パラメトリック共振 / Arnoldの舌 / カンチレバー / MEMS / 微小エネルギー / ナノ・マイクロ機構 / 共振 / 点接触AFM / 表面電位 / 高分解能マルチプローブ計測 / AFMポテンショメトー / 高分解能マルチプローブ技術 / 走査ゲート顕微鏡 / AFMポテンショメトリー / 表面電位計測 / 3次元フォースマップ / 誘電泳動 / 密度勾配遠心分離 / 高分解能マルチプローブAFM / 周波数変調(FM)検出法 / ケルビンプローブAFM / 原子間力顕微鏡(AFM) / カーボンナノチューブ / ナノ材料 / ナノ加工 / 真空紫外 / 微細組立 / 自己集積化単分子膜 / ナノ粒子 / リソグラフィ / 微細加工 Less
  • Research Projects

    (10 results)
  • Research Products

    (68 results)
  • Co-Researchers

    (22 People)
  •  Application development of nondestructive inspection by frequency shifted terahertz wave

    • Principal Investigator
      水津 光司
    • Project Period (FY)
      2022 – 2026
    • Research Category
      Grant-in-Aid for Scientific Research (A)
    • Review Section
      Medium-sized Section 25:Social systems engineering, safety engineering, disaster prevention engineering, and related fields
    • Research Institution
      Chiba Institute of Technology
  •  Nondestructive diagnosis of buildings by frequency shifted terahertz waves

    • Principal Investigator
      SUIZU Koji
    • Project Period (FY)
      2018 – 2020
    • Research Category
      Grant-in-Aid for Scientific Research (A)
    • Review Section
      Medium-sized Section 25:Social systems engineering, safety engineering, disaster prevention engineering, and related fields
    • Research Institution
      Chiba Institute of Technology
  •  Development of the power supply with high-speed switching by wide band-gap semiconductorPrincipal Investigator

    • Principal Investigator
      SATOH Nobuo
    • Project Period (FY)
      2014 – 2016
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Power engineering/Power conversion/Electric machinery
    • Research Institution
      Chiba Institute of Technology
  •  Visualization of nano spatial modulation structure of thallium compound by scanning probe microscope

    • Principal Investigator
      WAKITA Kazuki
    • Project Period (FY)
      2014 – 2016
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Electronic materials/Electric materials
    • Research Institution
      Chiba Institute of Technology
  •  Development of mechanism for operating nano/micro structure and scavenging micro-energy

    • Principal Investigator
      HIKIHARA Takashi
    • Project Period (FY)
      2009 – 2011
    • Research Category
      Grant-in-Aid for Challenging Exploratory Research
    • Research Field
      Power engineering/Power conversion/Electric machinery
    • Research Institution
      Kyoto University
  •  FM検出型AFMに基づく超精密プローブ制御による光誘起相互作用力計測Principal Investigator

    • Principal Investigator
      佐藤 宣夫
    • Project Period (FY)
      2008
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Review Section
      Science and Engineering
    • Research Institution
      Kyoto University
  •  Detection of molecular vibration with frequency modulation atomic force Microscopy by infrared-light irradiationPrincipal Investigator

    • Principal Investigator
      SATOH Nobuo
    • Project Period (FY)
      2008 – 2009
    • Research Category
      Grant-in-Aid for Young Scientists (B)
    • Research Field
      Structural/Functional materials
    • Research Institution
      Kyoto University
  •  Spatial-arrangement of nano-objects based on monolayer lithography

    • Principal Investigator
      SUGIMURA Hiroyuki
    • Project Period (FY)
      2007 – 2010
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Review Section
      Science and Engineering
    • Research Institution
      Kyoto University
  •  Novel Nanoprobe Method for Investigating of Electrical and Mechanical Properties of Carbon Nanotubes

    • Principal Investigator
      YAMADA Hirofumi
    • Project Period (FY)
      2007 – 2011
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Review Section
      Science and Engineering
    • Research Institution
      Kyoto University
  •  周波数変調方式AFMを用いた光誘起相互作用力計測に基づく近接場光検出Principal Investigator

    • Principal Investigator
      佐藤 宣夫
    • Project Period (FY)
      2006 – 2007
    • Research Category
      Grant-in-Aid for Young Scientists (B)
    • Research Field
      Thin film/Surface and interfacial physical properties
    • Research Institution
      Kyoto University

All 2023 2022 2021 2020 2019 2018 2016 2015 2014 2010 2009 2008 2007 Other

All Journal Article Presentation Book Patent

  • [Book] 有機デバイスのための界面評価と制御技術2009

    • Author(s)
      佐藤宣夫(分担)
    • Publisher
      シーエムシー出版
    • Data Source
      KAKENHI-PROJECT-20760469
  • [Book] 有機デバイスのための界面評価と制御技術2009

    • Author(s)
      佐藤宣夫(分担執筆)
    • Publisher
      シーエムシー出版
    • Data Source
      KAKENHI-PROJECT-20760469
  • [Journal Article] Visualization of Current Paths by High-Frequency Magnetic Fields Using the Down-Conversion Method2023

    • Author(s)
      角 真輝, 鶴岡 智彦, 田村 知孝, 佐藤 宣夫
    • Journal Title

      IEEJ Transactions on Industry Applications

      Volume: 143 Issue: 3 Pages: 236-241

    • DOI

      10.1541/ieejias.143.236

    • ISSN
      0913-6339, 1348-8163
    • Year and Date
      2023-03-01
    • Language
      Japanese
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22H00249
  • [Journal Article] Evaluation of Internal Structure of GaN High Electron Mobility Transistor2022

    • Author(s)
      加藤 圭一郎, 山本 秀和, 佐藤 宣夫
    • Journal Title

      IEEJ Transactions on Sensors and Micromachines

      Volume: 142 Issue: 12 Pages: 316-324

    • DOI

      10.1541/ieejsmas.142.316

    • ISSN
      1341-8939, 1347-5525
    • Year and Date
      2022-12-01
    • Language
      Japanese
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22H00249
  • [Journal Article] Evaluation of silicon carbide Schottky barrier diode within guard ring by multifunctional scanning probe microscopy2020

    • Author(s)
      Keita Nakayama, Sho Masuda, Nobuo Satoh and Hidekazu Yamamoto
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 59 Issue: SN Pages: SN1014-SN1014

    • DOI

      10.35848/1347-4065/ab9629

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18H03827
  • [Journal Article] Cross-sectional observation in nanoscale for Si power MOSFET by atomic force microscopy/Kelvin probe force microscopy/scanning capacitance force microscopy2019

    • Author(s)
      Atsushi Doi, Mizuki Nakajima, Sho Masuda, Nobuo Satoh and Hidekazu Yamamoto
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 58 Issue: SI Pages: SIIA04-SIIA04

    • DOI

      10.7567/1347-4065/ab1642

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18H03827
  • [Journal Article] Terahertz imaging for multiple reflectors using time-domain correlating synthesis method2018

    • Author(s)
      Kazuma Sato, Ryo Toh and Koji Suizu
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 57 Issue: 12 Pages: 122502-122502

    • DOI

      10.7567/jjap.57.122502

    • NAID

      210000149858

    • Peer Reviewed / Open Access
    • Data Source
      KAKENHI-PROJECT-18H03827
  • [Journal Article] Investigation of the depletion layer by scanning capacitance force microscopy with Kelvin probe force microscopy2016

    • Author(s)
      T. Uruma, N. Satoh and H. Yamamoto
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 55 Issue: 8S1 Pages: 08NB10-08NB10

    • DOI

      10.7567/jjap.55.08nb10

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26420246
  • [Journal Article] Surface Potential and Topography Measurements of Gallium Nitride on Sapphire by Scanning Probe Microscopy2016

    • Author(s)
      潤間 威史, 佐藤 宣夫, 石川 博康
    • Journal Title

      IEEJ Transactions on Sensors and Micromachines

      Volume: 136 Issue: 4 Pages: 96-101

    • DOI

      10.1541/ieejsmas.136.96

    • NAID

      130005141444

    • ISSN
      1341-8939, 1347-5525
    • Language
      Japanese
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26420246
  • [Journal Article] Optical and mechanical detection of near-field light by atomic force microscopy using a piezoelectric cantilever2016

    • Author(s)
      N. Satoh, K. Kobayashi, S. Watanabe, T. Fujii, K. Matsushige and H. Yamada
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 55 Issue: 8S1 Pages: 08NB04-08NB04

    • DOI

      10.7567/jjap.55.08nb04

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26420246
  • [Journal Article] Surface Potential Investigation of Fullerene Derivative Film on Platinum Electrode under UV Irradiation by Kelvin Probe Force Microscopy Using a Piezoelectric Cantilever2015

    • Author(s)
      N. Satoh, S. Katori, K. Kobayashi, S. Watanabe, T. Fujii, K. Matsushige, H. Yamada
    • Journal Title

      e-J. Surf. Sci. Nanotechnol.

      Volume: 13 Issue: 0 Pages: 102-106

    • DOI

      10.1380/ejssnt.2015.102

    • NAID

      130004933845

    • ISSN
      1348-0391
    • Language
      English
    • Peer Reviewed / Open Access
    • Data Source
      KAKENHI-PROJECT-26420246
  • [Journal Article] Twin-probe Atomic Force Microscopy with Optical Beam Deflection using Vertically Incident Lasers by Two Beam Splitter2015

    • Author(s)
      佐藤 宣夫, 常見 英加, 小林 圭, 小松原 隆司, 樋口 誠司, 松重 和美, 山田 啓文
    • Journal Title

      IEEJ Transactions on Sensors and Micromachines

      Volume: 135 Issue: 4 Pages: 135-141

    • DOI

      10.1541/ieejsmas.135.135

    • NAID

      130005061969

    • ISSN
      1341-8939, 1347-5525
    • Language
      Japanese
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26420246
  • [Journal Article] Surface Potential Measurement of Fullerene Derivative/Copper Phthalocyanine on Indium Tin Oxide Electrode by Kelvin Probe Force Microscopy2015

    • Author(s)
      N. Satoh, M. Yamaki, K. Noda, S. Katori, K. Kobayashi, K. Matsushige, H. Yamada
    • Journal Title

      pn. J. Appl. Phys.

      Volume: 54 Issue: 8S1 Pages: 08KF06-08KF06

    • DOI

      10.7567/jjap.54.08kf06

    • Peer Reviewed / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26420246, KAKENHI-PROJECT-25286057
  • [Journal Article] CdS:O薄膜のナノ構造の評価2015

    • Author(s)
      中嶋将大, 浅葉亮, 鈴木昭典, 佐藤宣夫, 脇田和樹, 沈用球, Kh. Khalilova, N. Mamedov, A. Bayramov, E. Huseynov
    • Journal Title

      平成26年度応用物理学会 多元系化合物・太陽電池研究会成果報告集

      Volume: 27

    • Open Access
    • Data Source
      KAKENHI-PROJECT-26420278
  • [Journal Article] Surface Potential Measurement of Organic Multi-layered Films on Electrodes by Kelvin Probe Force Microscopy2015

    • Author(s)
      N. Satoh, S. Katori, K. Kobayashi, K. Matsushige, H. Yamada
    • Journal Title

      IEICE TRANSACTIONS on Electronics

      Volume: E98-C Pages: 91-97

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26420246
  • [Journal Article] Study of nano-crystals in CdS:O thin films by Kelvin probe force microscopy2014

    • Author(s)
      M. Nakajima, R. Asaba, A. Suzuki, N. Sato, Y. Shim, K. Wakita, Kh. Khalilova, N. Mamedov, A. Bayramov, and E. Huseynov
    • Journal Title

      Technical digest of the 6th World Conference on Photovoltaic Energy Conversion

      Volume: 24

    • Open Access
    • Data Source
      KAKENHI-PROJECT-26420278
  • [Journal Article] Scanning near-field optical microscopy system based on frequency-modulation atomic force microscopy using a piezoelectric cantilever2014

    • Author(s)
      N. Satoh, K. Kobayashi, S. Watanabe, T. Fujii, K. Matsushige, H. Yamada
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 53 Issue: 12 Pages: 125201-125201

    • DOI

      10.7567/jjap.53.125201

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26420246
  • [Journal Article] Surface Potential Measurement of Fullerene/Copper Phthalocyanine Films on Indium Tin Oxide Electrode by Kelvin Probe Force Microscopy2014

    • Author(s)
      N. Satoh, S. Katori, K. Kobayashi, K. Matsushige, H. Yamada
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 53 Issue: 5S1 Pages: 05FY03-05FY03

    • DOI

      10.7567/jjap.53.05fy03

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26420246
  • [Journal Article] Observation of Two Peculiar Types of Electronic Dispersive Structures in Thallium Selenide Studied by Angle-Resolved Photoemission Spectroscopy2014

    • Author(s)
      S. Motonami, M. Arita, H. Anzai, K. Wakita, S. Hamidov, Z. Jahangirli, Y. Taguchi, H. Namatame, M. Taniguchi, G. Orudzhev, N. Mamedov, and K. Mimura
    • Journal Title

      Journal of the Physical Society of Japan (Letters)

      Volume: 83 Issue: 5 Pages: 053707-053707

    • DOI

      10.7566/jpsj.83.053707

    • NAID

      210000133066

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-24540381, KAKENHI-PROJECT-26420278
  • [Journal Article] Multi-probe atomic force microscopy using piezoelectric cantilevers2007

    • Author(s)
      N. Satoh, E. Tsunemi, Y. Miyato, K. Kobayashi, S. Watanabe, K. Matsushige, H. Yamada
    • Journal Title

      Japanese Journal of Applied Physics 46

      Pages: 5543-5547

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18760030
  • [Patent] 走査型プローブ顕微鏡の出力処理方法および走査型プローブ顕微鏡2008

    • Inventor(s)
      常見英加, 佐藤宣夫, 小林圭, 山田啓文, 松重和美
    • Industrial Property Rights Holder
      常見英加, 佐藤宣夫, 小林圭, 山田啓文, 松重和美
    • Filing Date
      2008-12-10
    • Data Source
      KAKENHI-PROJECT-20760469
  • [Presentation] パルス幅変調方式を用いたDC-DCコンバータの磁場計測による電流経路可視化2023

    • Author(s)
      角 真輝,長嶋一真,田村知孝,佐藤宣夫
    • Organizer
      電気学会全国大会
    • Data Source
      KAKENHI-PROJECT-22H00249
  • [Presentation] 原子間力顕微鏡1自由度モデルにおける周波数応答特性の理論解導出に関する一検討2023

    • Author(s)
      吉田崚人,佐藤宣夫,清水邦康
    • Organizer
      電子情報通信学会 非線形問題研究会
    • Data Source
      KAKENHI-PROJECT-22H00249
  • [Presentation] チタン酸バリウム系積層セラミックコンデンサの劣化解析に向けたSCFMによるキャリア分布観測2023

    • Author(s)
      角 真輝,大山 祐生,佐藤 宣夫
    • Organizer
      第84回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-22H00249
  • [Presentation] 多機能走査型プローブ顕微鏡を用いた直流電流起因磁場観測2023

    • Author(s)
      大山 祐生,角 真輝,佐藤 宣夫
    • Organizer
      第84回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-22H00249
  • [Presentation] FM-AFM/KFM/SCFMによるSiC製プレーナ型パワーMOSFETのナノスケール観測2022

    • Author(s)
      増田 匠,土井敦史,山本秀和,佐藤宣夫
    • Organizer
      電気学会 産業応用部門大会
    • Data Source
      KAKENHI-PROJECT-22H00249
  • [Presentation] ダウンコンバージョン法と電流経路可視化技術によるアルミ電解コンデンサの定量劣化評価に向けた一検討2022

    • Author(s)
      長嶋一真,角 真輝,田村知孝,佐藤宣夫
    • Organizer
      電気学会 産業応用部門大会
    • Data Source
      KAKENHI-PROJECT-22H00249
  • [Presentation] 走査型プローブ顕微鏡を用いたSiC製パワー半導体デバイスのナノスケール観測2021

    • Author(s)
      土井敦史,田中一光,佐藤宣夫,山本秀和
    • Organizer
      令和3年電気学会全国大会
    • Data Source
      KAKENHI-PROJECT-18H03827
  • [Presentation] 走査型プローブ顕微鏡用の電圧フィードバック制御回路の小型化とその周波数特性2021

    • Author(s)
      山田晃嵩,土井敦史,佐藤宣夫
    • Organizer
      令和3年電気学会全国大会
    • Data Source
      KAKENHI-PROJECT-18H03827
  • [Presentation] 走査型プローブ顕微鏡を用いた焦電素子のナノスケール観測2021

    • Author(s)
      出口雄一,佐藤宣夫
    • Organizer
      令和3年電気学会全国大会
    • Data Source
      KAKENHI-PROJECT-18H03827
  • [Presentation] Investigation of power semiconductor devices under applying voltage by multi-purpose scanning probe microscope2020

    • Author(s)
      N. Satoh, A. Doi, H. Yamamoto
    • Organizer
      IEEE Workshop on Wide Bandgap Power Devices and Applications in ASIA 2020 (WiPDA-Asia)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03827
  • [Presentation] Evaluation of internal structure of GaN high electron mobility transistor2020

    • Author(s)
      K. Kato, K. Nakayama, N. Satoh, H. Yamamoto
    • Organizer
      28th International Colloquium on Scanning Probe Microscopy (ICSPM28)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03827
  • [Presentation] 走査型プローブ顕微鏡によるパワー半導体素子内部構造の観測2019

    • Author(s)
      土井敦史,増田翔,佐藤宣夫,山本秀和
    • Organizer
      2019年電気学会 産業応用部門大会
    • Data Source
      KAKENHI-PROJECT-18H03827
  • [Presentation] Observation of power semiconductor devices on cross-sectional surface by scanning probe microscope2019

    • Author(s)
      A. Doi, N. Satoh, H. Yamamoto, Y.M iyato, H. Nozaki, H. Nakamoto, and Y. Terui
    • Organizer
      32nd International Microprocesses and Nanotechnology Conference (MNC2019)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03827
  • [Presentation] 電圧フィードバック制御回路の製作とその評価2019

    • Author(s)
      山田晃嵩,土井敦史,佐藤宣夫
    • Organizer
      令和2年 電気学会全国大会
    • Data Source
      KAKENHI-PROJECT-18H03827
  • [Presentation] Nanoscale observation of power semiconductor devices in operation state by scanning probe microscope2019

    • Author(s)
      K. Nakayama, S. Masuda, N. Satoh, and H. Yamamoto
    • Organizer
      27th International Colloquium on Scanning Probe Microscopy (ICSPM27)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H03827
  • [Presentation] 相関合成法を用いたテラヘルツ波イメージングにおける多重反射波の影響について2018

    • Author(s)
      佐藤数馬、陶良、水津光司
    • Organizer
      電子情報通信学会超音波研究会
    • Data Source
      KAKENHI-PROJECT-18H03827
  • [Presentation] Near-field Light Detection as photo-induced force by Atomic Force Microscopy with Frequency Modulation2016

    • Author(s)
      N. Satoh, K. Kobayashi, K. Matsushige and H. Yamada
    • Organizer
      24th International Colloquium on Scanning Probe Microscopy (ICSPM24)
    • Place of Presentation
      Hawaii(米国)
    • Year and Date
      2016-12-14
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26420246
  • [Presentation] Flyback Converter Using SiC Power-MOSFET to Achieve High Frequency Operation Over 10MHz2016

    • Author(s)
      Nobuo Satoh, Yasuyuki Nishida
    • Organizer
      International Symposium on Nonlinear Theory and its Applications (NOLTA2016)
    • Place of Presentation
      Yugawara(静岡県熱海市)
    • Year and Date
      2016-11-28
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26420246
  • [Presentation] 走査型プローブ顕微鏡によるSapphire 基板上GaNの観測2015

    • Author(s)
      潤間威史,佐藤宣夫,石川博康
    • Organizer
      平成27年電気学会全国大会
    • Place of Presentation
      東京都市大学(東京都世田谷区)
    • Year and Date
      2015-03-25
    • Data Source
      KAKENHI-PROJECT-26420246
  • [Presentation] Optical and Mechanical Detection of Near-field Light by Atomic Force Microscopy using a Piezoelectric Cantilever2015

    • Author(s)
      N. Satoh, K. Kobayashi, S. Watanabe,T. Fujii, K. Matsushige, H. Yamada
    • Organizer
      23rd International Colloquium on Scanning Probe Microscopy (ICSPM23)
    • Place of Presentation
      ヒルトンニセコビレッジホテル (北海道虻田郡ニセコ町)
    • Year and Date
      2015-12-10
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26420246
  • [Presentation] リチウムイオン電池に対する電気二重層キャパシタおよびアルミ電解コンデンサの併用に関する検討2015

    • Author(s)
      牛崎 拓,佐藤宣夫
    • Organizer
      平成27年電気学会全国大会
    • Place of Presentation
      東京都市大学(東京都世田谷区)
    • Year and Date
      2015-03-24
    • Data Source
      KAKENHI-PROJECT-26420246
  • [Presentation] First-principles study of incommensurate phase in TlInSe2 and TlInS22015

    • Author(s)
      Masato Ishikawa, Takahashi Nakayama, Kazuki Wakita, Nazim Mamedov
    • Organizer
      International Conference on Thermoelectric Materials Science 2015
    • Place of Presentation
      名古屋大学 (愛知県名古屋市)
    • Year and Date
      2015-11-09
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26420278
  • [Presentation] Surface Potential Measurement ofα-NPD Thin Film Fabricated by Mist-Vapor Deposition and Vacuum Evaporation Methods2015

    • Author(s)
      S. Katori, A. Odaka, T. Uruma, N. Satoh
    • Organizer
      Eighth International Conference on Molecular Electronics and Bioelectronics (M&BE8)
    • Place of Presentation
      タワーホール船堀 (東京都江東区)
    • Year and Date
      2015-06-22
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26420246
  • [Presentation] First-principles study of Nanostructure of TlInSe22015

    • Author(s)
      Masato Ishikawa, Takahashi Nakayama, Kazuki Wakita, Nazim Mamedov
    • Organizer
      European Materials Research Society 2015 Fall Meeting, Symposium A: materials for Energy storage and conversion
    • Place of Presentation
      Warsaw, Poland
    • Year and Date
      2015-09-15
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26420278
  • [Presentation] Development of Multi-Probe Atomic Force Microscope and Probe Interaction2015

    • Author(s)
      Nobuo Satoh
    • Organizer
      2015 International Symposium on Nonlinear Theory and its Applications (NOLTA2015)
    • Place of Presentation
      Hong Kong (China)
    • Year and Date
      2015-12-03
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26420246
  • [Presentation] Observation of the Schottky barrier diode under applied bias voltage with Kelvin probe force microscopy2015

    • Author(s)
      T. Uruma, N. Satoh
    • Organizer
      23rd International Colloquium on Scanning Probe Microscopy (ICSPM23)
    • Place of Presentation
      ヒルトンニセコビレッジホテル (北海道虻田郡ニセコ町)
    • Year and Date
      2015-12-10
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26420246
  • [Presentation] A Flyback Converter using Power MOSFET to Achieve High Frequency Operation beyond 13.56MHz2015

    • Author(s)
      N. Satoh, H. Otake, T. Nakamura, T. Hikihara
    • Organizer
      The 41st Annual Conference of the IEEE Industrial Electronics Society (IECON2015)
    • Place of Presentation
      パシフィコ横浜 (神奈川県横浜市)
    • Year and Date
      2015-11-10
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26420246
  • [Presentation] CdS:O薄膜のナノ構造の評価2014

    • Author(s)
      中嶋将大, 浅葉亮, 鈴木昭典, 佐藤宣夫, 脇田和樹, 沈用球, Kh. Khalilova, N. Mamedov, A. Bayramov, E. Huseynov
    • Organizer
      平成26年度応用物理学会 多元系化合物・太陽電池研究会年末講演会
    • Place of Presentation
      龍谷大学 (京都府京都市)
    • Year and Date
      2014-11-28
    • Data Source
      KAKENHI-PROJECT-26420278
  • [Presentation] リチウムイオン電池に対する電気二重層キャパシタおよびアルミ電解コンデンサの併用効果の検討2014

    • Author(s)
      牛崎 拓,佐藤宣夫
    • Organizer
      平成26年電気学会 産業応用部門大会
    • Place of Presentation
      東京電機大学(東京都足立区)
    • Year and Date
      2014-08-26
    • Data Source
      KAKENHI-PROJECT-26420246
  • [Presentation] High-speed switching operation of wide band-gap semiconductor and its circuit application2014

    • Author(s)
      Nobuo Satoh
    • Organizer
      International Conference on Solid State Devices and Materials (SSDM2014)
    • Place of Presentation
      つくば国際会議場(茨城県つくば市)
    • Year and Date
      2014-09-08
    • Invited
    • Data Source
      KAKENHI-PROJECT-26420246
  • [Presentation] FM-DFM/KFMを用いた有機分子積層膜の表面電位計測2010

    • Author(s)
      佐藤宣夫
    • Organizer
      第57回 応用物理学関係連合講演会
    • Place of Presentation
      東海大学(神奈川県)
    • Year and Date
      2010-03-19
    • Data Source
      KAKENHI-PROJECT-20760469
  • [Presentation] FM-DFM/KFMを用いた有機分子積層膜の表面電位計測2010

    • Author(s)
      佐藤宣夫, 香取重尊, 小林圭, 山田啓文, 松重和美
    • Organizer
      第57回応用物理学関係連合講演会
    • Place of Presentation
      東海大学
    • Year and Date
      2010-03-19
    • Data Source
      KAKENHI-PROJECT-20760469
  • [Presentation] 有機/無機複合型太陽電池のための表面電位観察2009

    • Author(s)
      佐藤宣夫, 山木理生, 香取尊重, 小林圭, 山田啓文, 松重和美
    • Organizer
      平成21年電気学会全国大会
    • Place of Presentation
      北海道大学
    • Year and Date
      2009-03-19
    • Data Source
      KAKENHI-PROJECT-20760469
  • [Presentation] Investigation of local surface properties by dynamic force microscopy using a piezo-electric cantilever2009

    • Author(s)
      Nobuo Satoh
    • Organizer
      2009 MicRO Alliance in IMTEK
    • Place of Presentation
      Freiburg University
    • Year and Date
      2009-07-27
    • Data Source
      KAKENHI-PROJECT-20760469
  • [Presentation] ツインプローブ原子間力顕微鏡の開発とプローブ間距離制御2009

    • Author(s)
      佐藤宣夫, 常見英加, 小林圭, 小松原隆司, 樋口誠司, 山田啓文, 松重和美
    • Organizer
      平成21年電気関係学会関西支部連合大会
    • Place of Presentation
      大阪大学
    • Year and Date
      2009-11-07
    • Data Source
      KAKENHI-PROJECT-20760469
  • [Presentation] Detection of Photo-induced Force by Frequency Modulation Detection-based Dynamic Force Microscopy2008

    • Author(s)
      Nobuo Satoh, Kei Kobayashi, Kazumi Matsushige, Hirofumi Yamada
    • Organizer
      The 5th International Symposium on Surface Science and Nanotechnology
    • Place of Presentation
      Tokyo, Japan
    • Year and Date
      2008-11-12
    • Data Source
      KAKENHI-PROJECT-20043018
  • [Presentation] Detection of Photo-induced Force by Frequency Modulation Detection-based Dynamic Force Microscopy2008

    • Author(s)
      Nobuo Satoh, Kei Kobayashi, Kazumi Matsushige, Hirofumi Yamada
    • Organizer
      The 5th International Symposium on Surface Science and Nanotechnology
    • Place of Presentation
      早稲田大学
    • Year and Date
      2008-11-10
    • Data Source
      KAKENHI-PROJECT-20760469
  • [Presentation] ツインプローブ原子間力顕微鏡の開発とその基本性能2008

    • Author(s)
      佐藤宣夫, 常見英加, 小林圭, 小松原隆司, 樋口誠司, 山田啓文, 松重和美
    • Organizer
      平成20年電気関係学会関西支部連合大会
    • Place of Presentation
      京都工芸繊維大学
    • Year and Date
      2008-11-09
    • Data Source
      KAKENHI-PROJECT-20760469
  • [Presentation] Local Electrical Measurement of Organic Thin Films with Two-probe AFM/ICFM2008

    • Author(s)
      E. Tsunemi, N. Satoh, K. Kobayashi, K. Matsushige, H. Yamada
    • Organizer
      International Symposium on Surface Science and Nanotechnology (ISSS-5)
    • Place of Presentation
      Tokyo
    • Year and Date
      2008-11-10
    • Data Source
      KAKENHI-PLANNED-19054010
  • [Presentation] 金属電極に架橋したオリゴチオフェン分子薄膜のFM-KFM表面電位測定2008

    • Author(s)
      小野山有亮, 小林 圭, 佐藤宣夫, 松重和美, 山田啓文
    • Organizer
      2008年春季 第55回応用物理学関係連合講演会
    • Place of Presentation
      日本大学
    • Year and Date
      2008-03-28
    • Data Source
      KAKENHI-PLANNED-19054010
  • [Presentation] Investigation of local surface potential on highly ordered organic semiconductor film2007

    • Author(s)
      Y. Onoyama, K. Kobayashi, N. Satoh, K. Matsushige, H. Yamada
    • Organizer
      Korea-Japan Joint Forum 2007 (KJF 2007)
    • Place of Presentation
      Seoul, Korea
    • Year and Date
      2007-09-27
    • Data Source
      KAKENHI-PLANNED-19054010
  • [Presentation] Local surface potential measurements of oligothiophene molecular films connected to nano-gap metallic electrodes by Kelvin probe force microscopy2007

    • Author(s)
      N. Satoh, Y. Onoyama, K. Kaisei, K. Kobayashi, K. Matsushige and H. Yamada
    • Organizer
      CREST Workshop on Molecular Nano-Electronic Devices
    • Place of Presentation
      Kyoto, Japan
    • Year and Date
      2007-11-19
    • Data Source
      KAKENHI-PROJECT-18760030
  • [Presentation] Local Surface Potential Measurements on Oligothiophene Molecular Films between Metallic Electrodes by Kelvin Probe Force Microscopy2007

    • Author(s)
      Y. Onoyama, K. Kobayashi, N. Satoh, K. Matsushige and H. Yamada
    • Organizer
      15th International Colloquium on Scanning Probe Microscopy
    • Place of Presentation
      Atagawa, Japan
    • Year and Date
      2007-12-06
    • Data Source
      KAKENHI-PROJECT-18760030
  • [Presentation] Surface potentials of PCBM molecular films under light irradiation investigated by FM-DFM/KFM2007

    • Author(s)
      M. Yamaki, N. Satoh, S. Katori, K. Kobayashi, K. Matsushige and H. Yamada
    • Organizer
      15th International Colloquium on Scanning Probe Microscopy
    • Place of Presentation
      Atagawa, Japan
    • Year and Date
      2007-12-06
    • Data Source
      KAKENHI-PROJECT-18760030
  • [Presentation] Development of multi-probe AFM with optical beam deflection method2007

    • Author(s)
      E. Tsunemi, N. Satoh, K. Kobayashi, K. Matsushige and H. Yamada
    • Organizer
      Materials Research Society Fall Meeting
    • Place of Presentation
      Boston, USA
    • Year and Date
      2007-11-26
    • Data Source
      KAKENHI-PROJECT-18760030
  • [Presentation] 可視光入射によるFM-DFM/KFMを用いた有機分子薄膜の表面電位計測2007

    • Author(s)
      佐藤宣夫, 山木理生, 香取重尊, 小林 圭, 藤田静雄, 松重和美, 山田啓文
    • Organizer
      第68回応用物理学会学術講演会
    • Place of Presentation
      Sapporo, Japan
    • Year and Date
      2007-09-08
    • Data Source
      KAKENHI-PROJECT-18760030
  • [Presentation] Study of nano-crystals in CdS:O thin films by Kelvin probe force microscopy

    • Author(s)
      M. Nakajima, R. Asaba, A. Suzuki, N. Sato, Y. Shim, K. Wakita, Kh. Khalilova, N. Mamedov, A. Bayramov, and E. Huseynov
    • Organizer
      The 6th World Conference on Photovoltaic Energy Conversion
    • Place of Presentation
      Kyoto, Japan (京都国際会館)
    • Year and Date
      2014-11-23 – 2014-11-27
    • Data Source
      KAKENHI-PROJECT-26420278
  • 1.  SUIZU Koji (20342800)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 2 results
  • 2.  長 敬三 (00633356)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 2 results
  • 3.  内海 秀幸 (10316804)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 0 results
  • 4.  中林 寛暁 (20296320)
    # of Collaborated Projects: 2 results
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  • 5.  枚田 明彦 (40500674)
    # of Collaborated Projects: 2 results
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  • 6.  陶 良 (60327161)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 8 results
  • 7.  SUGIMURA Hiroyuki (10293656)
    # of Collaborated Projects: 1 results
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  • 8.  MURASE Kuniaki (30283633)
    # of Collaborated Projects: 1 results
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  • 9.  ICHII Takashi (30447908)
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  • 10.  YAMADA Hirofumi (40283626)
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    # of Collaborated Products: 3 results
  • 11.  KOBAYASHI Kei (40335211)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 3 results
  • 12.  NODA Kei (30372569)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 13.  MIYATO Yuji (80512780)
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  • 14.  HIKIHARA Takashi (70198985)
    # of Collaborated Projects: 1 results
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  • 15.  YAMASUE Kohei (70467455)
    # of Collaborated Projects: 1 results
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  • 16.  WAKITA Kazuki (80201151)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 6 results
  • 17.  石田 謙司 (20303860)
    # of Collaborated Projects: 1 results
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  • 18.  三村 功次郎 (40305652)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 1 results
  • 19.  沈 用球 (20336803)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 4 results
  • 20.  石原 沙織 (00589046)
    # of Collaborated Projects: 1 results
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  • 21.  ISHIKAWA Masato
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 2 results
  • 22.  MAMEDOV Nazim
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 6 results

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