KOBAYASHI Toshiro 小林敏郎

Researcher Number	70563865
Other IDs
Affiliation (based on the past Project Information) *help	2021 – 2022: 津山工業高等専門学校, 総合理工学科, 嘱託教授 2018 – 2020: 津山工業高等専門学校, 総合理工学科, 教授 2012 – 2017: 津山工業高等専門学校, その他部局等, 教授
Review Section/Research Field	Principal Investigator Design engineering/Machine functional elements/Tribology / Basic Section 18030:Design engineering-related
Keywords	Principal Investigator 設計工学 / 薄膜 / 屈曲性 / 有機EL / 剥離 / 有機半導体 / フレキシブル / 損傷 / 座屈 / 密着力 … More / polimer / thin films / buckling / delamination / Compressive strain / Flexible semiconductor, / Delamination / OLED / ナノインデンター / 引張り試験 / 歪み / 温度依存 / 割れ / 実験力学 / 発光効率 Less

Establishment of buckling peeling damage prevention technology and evaluation/design method for flexible organic semiconductor devicesPrincipal Investigator
- Principal Investigator
  
  Kobayashi Toshiro
- Project Period (FY)
  2018 – 2022
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 18030:Design engineering-related
- Research Institution
  Tsuyama National College of Technology
Improving the flexibility of organic semiconductor thin films and establishing the evaluation methodPrincipal Investigator
- Principal Investigator
  
  Kobayashi Toshiro
- Project Period (FY)
  2015 – 2017
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Design engineering/Machine functional elements/Tribology
- Research Institution
  Tsuyama National College of Technology
Improvement in the Ductility of Organic Semiconductor Materials Used in a Flexible Organic Light Emitting DiodePrincipal Investigator
- Principal Investigator
  
  KOBAYASHI Toshiro
- Project Period (FY)
  2012 – 2014
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Design engineering/Machine functional elements/Tribology
- Research Institution
  Tsuyama National College of Technology

All 2023 2022 2021 2020 2019 2017 2016 2014 2013

All Journal Article Presentation Patent

[Journal Article] Delamination Behavior in Compression Bending Test of Organic Semiconductor Device2023
- Author(s)
  Toshiro KOBAYASHI, Shigeru NAGASAWA, Hideaki FURUMOTO, Ion GRUESCU, Akinobu YAMAGUCHI, and Yuichi UTSUMI
- Journal Title
  
  Advanced Experimental Mechanics
  
  Volume: Vol.8
- Peer Reviewed / Open Access / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K03901
[Journal Article] Observing the Delamination Interface in Multi Layered Thin Films with a MgAg Alloy Top Layer and Organic Semiconductor under Layers on a Flexible Substrate2020
- Author(s)
  KOBAYASHI Toshiro, FURUMOTO Hideaki, YAMAGUCHI Akinobu, KANEMATSU Hideyuki, GRUESCU Ion Cosmin
- Journal Title
  
  Advanced Experimental Mechanics
  
  Volume: 5 Issue: 0 Pages: 151-156
- DOI
  10.11395/aem.5.0_151
- NAID
  130007953482
- ISSN
  2189-4752, 2424-175X
- Year and Date
  2020-08-31
- Language
  English
- Peer Reviewed / Open Access / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K03901
[Journal Article] Cracking of Aluminum and Silver Alloy Thin Films on Polymer Thin Films2019
- Author(s)
  T. Kobayashi, H. Furumoto, S. Nagasawa, H. Kanematsu, I. S. Gruescu and Y. Utsumi
- Journal Title
  
  Advanced Experimental Mechanics
  
  Volume: 4 Issue: 0 Pages: 115-120
- DOI
  10.11395/aem.4.0_115
- NAID
  130007755151
- ISSN
  2189-4752, 2424-175X
- Year and Date
  2019-08-31
- Language
  English
- Peer Reviewed / Open Access / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K03901
[Journal Article] Cracking of Aluminum and Silver Alloy Thin Films on Polymer Thin Films2019
- Author(s)
  Toshiro KOBAYASHI, Hideaki FURUMOTO, Shigeru NAGASAWA, Hideyuki KANEMATSU, Ion Cosmin GRUESCU, Yuichi UTSUMI
- Journal Title
  
  Advanced Experimental Mechanics
  
  Volume: 4
- NAID
  130007755151
- Peer Reviewed / Open Access / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K03901
[Journal Article] Measuring Temperature Dependence of Critical Cracking Strain of Thin Films for Organic Light Emitting Diode2017
- Author(s)
  Toshiro Kobayashi, Munkhzul Munkhsog, Yuichi Utsumi, Hideyuki Kanematsu and Tsuyoshi Masuda
- Journal Title
  
  Advanced Experimental Mechanics
  
  Volume: Vol.2
- NAID
  130006191209
- Peer Reviewed / Acknowledgement Compliant / Open Access
- Data Source
  KAKENHI-PROJECT-15K05777
[Journal Article] <b>Measuring Temperature Dependence of Critical Cracking Strain of Thin Films for Organic Light Emitting Diod</b><b>e </b>2017
- Author(s)
  T. Kobayashi, M. Munkhtsog, Y. Utsumi, H. Kanematsu and T. Masuda
- Journal Title
  
  Advanced Experimental Mechanics
  
  Volume: 2 Issue: 0 Pages: 128-133
- DOI
  10.11395/aem.2.0_128
- NAID
  130006191209
- ISSN
  2189-4752, 2424-175X
- Language
  English
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-15K05777
[Journal Article] Improvement in the Ductility of Organic Semiconductor MaterialsUsed in a Flexible Organic Light Emitting Diode2014
- Author(s)
  T. Kobayashi, T. Yokoyama, Y. Utsumi, H. Kanematsu T. Masuda and M. Yamamoto
- Journal Title
  
  Journal of The Japanease Society of Experimental Mechanics
  
  Volume: 14
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24560178
[Journal Article] Measurement of Reduced Elastic Modulus of Organic Semiconductor Materials for Flexible Organic Light Emitting Diode2014
- Author(s)
  T. Kobayashi, H. Ikeda, Y. Utsumi, H. Kanematsu T. Masuda and M. Yamamoto
- Journal Title
  
  Journal of The Japanease Society of Experimental Mechanics
  
  Volume: 14
- NAID
  130004687808
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24560178
[Journal Article] Study on Evaluation Methods for Mechanical Properties of Organic Semiconductor Materials2013
- Author(s)
  T. Kobayashi, T. Yokoyama, Y. Utsumi, H. Kanematsu and T. Masuda
- Journal Title
  
  Journal ofPhysics:ConferenceSeries
  
  Volume: 433 Pages: 1-7
- DOI
  10.1088/1742-6596/433/1/012009
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24560178
[Patent] フレキシブル有機半導体素子2014
- Inventor(s)
  小林敏郎
- Industrial Property Rights Holder
  小林敏郎
- Industrial Property Rights Type
  特許
- Filing Date
  2014-04-15
- Data Source
  KAKENHI-PROJECT-24560178
[Presentation] Detection of buckling of flexible organic light-emitting diodes during bending test2022
- Author(s)
  T. Kobayashi, T. Horiuchi, H. Furumoto, Y. Utsumi, A. Yamaguchi, and I. C. Gruescu
- Organizer
  The 2022 European Materials Research Society (E-MRS) Fall Meeting
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K03901
[Presentation] Effect of insert material on peel strength of organic light emitting diode thin films2022
- Author(s)
  T. Kobayashi, I. Maruyama, Y. Utsumi, A. Yamaguchi and I. C. Gruescu
- Organizer
  35th European Conference on Surface Science (ECOSS 35)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K03901
[Presentation] Delamination Behavior in Compression Bending Test of Organic Semiconductor Device2021
- Author(s)
  T. Kobayashi, S. Nagasawa, H. Furumoto, Ion Gruescu, A. Yamaguchi, and Y. Utsumi,
- Organizer
  16th International Symposium on Advanced Science and Technology in Experimental Mechanics (ISEM 2021), On-line
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K03901
[Presentation] Detecting the delamination damage for flexible organic light-emitting diodes2020
- Author(s)
  M. Doi, T. Kobayashi, 〇T.　Horiuchi, H. Furumoto, Y. Utsumi, A. Yamaguchi, H. Kanematsu and I. C. Gruescu
- Organizer
  第30回日本MRS年次大会
- Data Source
  KAKENHI-PROJECT-18K03901
[Presentation] Examining a structure and manufacturing method of flexible organic light emitting diode device sheet that can expand and contract in two dimensions2020
- Author(s)
  〇I. Nagami, T. Kobayashi, H. Furumoto, Y. Utsumi, A. Yamaguchi, H. Kanematsu and I. C. Gruescu
- Organizer
  第30回日本MRS年次大会
- Data Source
  KAKENHI-PROJECT-18K03901
[Presentation] Effects of Material Properties and Adhesive Strength on Compression Damages of Thin Films Constituting Organic Light Emitting Diode2019
- Author(s)
  〇M.Doi, T. Kobayashi and S. Nagasawa
- Organizer
  The Irago Conference 2019
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K03901
[Presentation] Buckling of Thin Films Constituting Organic Light Emitting2019
- Author(s)
  T. Kobayashi, Y. Utsumi, H. Kanematsu, T. Masuda and T. Nishikawa
- Organizer
  European Congress on Surface Science (ECOSS 34)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K03901
[Presentation] Experimental study on peel strength of organic light emitting diode thin films2019
- Author(s)
  〇I, Maruyama, T. Kobayashi and S. Nagasawa
- Organizer
  The Irago Conference 2019
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K03901
[Presentation] Effect of Layer Structure on Buckling Damage of Organic Light Emitting Diode2019
- Author(s)
  〇R. Ogasawara, T. Kobayashi and S. Nagasawa
- Organizer
  The Irago Conference 2019
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K03901
[Presentation] Fracture Behavior of Aluminum and Silver alloy Thin Films on Polymer Thin Films2019
- Author(s)
  Toshiro KOBAYASHI, Hideaki FURUMOTO, Shigeru NAGASAWA, Hideyuki KANEMATSU, Ion Cosmin GRUESCU and Mizuki ONO
- Organizer
  13th International Symposium on Advanced Science and Technology in Experimental Mechanics
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K03901
[Presentation] Damage of Metal Thin Films Deposited on Polymer Thin Films2019
- Author(s)
  〇T. Kobayashi, H. Furumoto, A. Yamaguchi, H. Kanematsu and I. C. Gruescu
- Organizer
  14th International Symposium on Advanced Science and Technology in Experimental Mechanics (ISEM)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K03901
[Presentation] 有機半導体薄膜の引張試験時の圧縮歪に起因する座屈剥離現象2017
- Author(s)
  〇小林敏郎, 岡田真,内海裕一, 兼松秀行, 枡田剛
- Organizer
  有機ＥＬ討論会　第24回例会
- Place of Presentation
  ＮＨＫ放送技術研究所，東京
- Year and Date
  2017-06-15
- Data Source
  KAKENHI-PROJECT-15K05777
[Presentation] 有機半導体薄膜の引張試験時の圧縮歪に起因する座屈剥離現象2017
- Author(s)
  〇小林敏郎, 岡田真,内海裕一, 兼松秀行, 枡田剛
- Organizer
  有機ＥＬ討論会第24回例会，2017年6月，ＮＨＫ放送技術研究所，東京
- Data Source
  KAKENHI-PROJECT-15K05777
[Presentation] Delamination of organic and metal thin films on PEN substrate2017
- Author(s)
  T. Kobayashi and 〇H. Okita
- Organizer
  The Irago Conference 2017, 01-02, Nov.2017, Tokyo, Japan
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K05777
[Presentation] Ductility of Thin Films Constituting Organic Light Emitting Diodes2017
- Author(s)
  〇T. Kobayashi, M. Munkhtsog, Y. Utsumi, H. Kanematsu, and T. Masuda
- Organizer
  33rd European Conference on Surface Science (ECOSS-33)
- Place of Presentation
  Szeged，Hungary
- Year and Date
  2017-08-27
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K05777
[Presentation] Ductility of Thin Films Constituting Organic Light Emitting Diodes2017
- Author(s)
  〇T. Kobayashi, M. Munkhtsog, Y. Utsumi, H. Kanematsu, and T. Masuda
- Organizer
  33rd European Conference on Surface Science (ECOSS-33) 27Aug.-1Sep 2017, Szeged, Hungary
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K05777
[Presentation] Temperature Dependence of Critical Cracking Strain of Thin Films for Organic Light Emitting Diode2016
- Author(s)
  Toshiro KOBAYASHI, Munkhzul MUNKHTSOG, Yuichi UTUMI, Hideyuki KANEMATSU and Tsuyoshi MASUDA
- Organizer
  The 11th International Symposium on Advanced Science and Technology in Experimental Mechanics
- Place of Presentation
  Ho Chi Minh, Vietnam
- Year and Date
  2016-11-01
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K05777
[Presentation] Measurement of Critical Cracking Strain of Organic Thin Films Prepared by Wet Coating Process2016
- Author(s)
  〇T. Kobayashi, M. Munkhtsog, Y. Utsumi, H. Kanematsu, and T. Masuda
- Organizer
  14th European Vacuum Conference (EVC-14)
- Place of Presentation
  Portoroz, Slovenia
- Year and Date
  2016-06-06
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K05777
[Presentation] 有機ＥＬ半導体用薄膜の割れ発生限界歪の評価事例2016
- Author(s)
  岡本丈司, 〇小林敏郎, 内海裕一, 兼松秀行, 枡田剛
- Organizer
  有機ＥＬ討論会　第22回例会
- Place of Presentation
  東工大，東京
- Year and Date
  2016-06-23
- Data Source
  KAKENHI-PROJECT-15K05777
[Presentation] Temperature Dependence of Critical Cracking Strain of Thin Films for Organic Light Emitting Diode2016
- Author(s)
  〇T. Kobayashi, M. Munkhtsog, Y. Utsumi, H. Kanematsu and T. Masuda
- Organizer
  11th International Symposium on Advanced Science and Technology in Experimental Mechanics
- Place of Presentation
  Ho Chi Minh, Vietnam
- Year and Date
  2016-11-01
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K05777
[Presentation] フレキシブル有機EL用高分子薄膜の弾性係数の計測2016
- Author(s)
  〇小林敏郎, 内海裕一, 兼松秀行, 枡田剛
- Organizer
  有機ＥＬ討論会　第23回例会
- Place of Presentation
  富山市民プラザ，富山
- Year and Date
  2016-11-17
- Data Source
  KAKENHI-PROJECT-15K05777
[Presentation] 有機ＥＬ半導体用薄膜の割れ発生限界歪の評価事例2016
- Author(s)
  岡本丈司, 小林敏郎, 内海裕一, 兼松秀行, 枡田剛
- Organizer
  「有機ＥＬ討論会」第２２回例会
- Place of Presentation
  東京
- Year and Date
  2016-06-23
- Data Source
  KAKENHI-PROJECT-15K05777
[Presentation] Measuring the Critical Strain of Crack Initiation in Thin Films for Flexible Organic Light Emission Diode2014
- Author(s)
  T. Kobayashi, J.Okamoto, Y. Utsumi, H. Kanematsu and T. Masuda
- Organizer
  The 7th International Symposium on Surface Science (ISSS7)
- Place of Presentation
  Shimane Prefectural Convention Center, Kunibiki Messe, Matsue, Shimane, Japan
- Year and Date
  2014-11-06
- Data Source
  KAKENHI-PROJECT-24560178
[Presentation] Improvement in the Ductility of Organic Semiconductor MaterialsUsed in a Flexible Organic Light Emitting Diode2013
- Author(s)
  T. Kobayashi
- Organizer
  8th International Symposium on Advanced Science and Technology in Experimental Mechanics
- Place of Presentation
  Sendai, Japan
- Data Source
  KAKENHI-PROJECT-24560178
[Presentation] Measuring the Ductility of Organic Semiconductor Materials2013
- Author(s)
  T. Kobayashi
- Organizer
  19th　International Vacuum Congress
- Place of Presentation
  Paris, France
- Data Source
  KAKENHI-PROJECT-24560178

1. UTSUMI Yuichi (80326298)

# of Collaborated Projects: 1 results

# of Collaborated Products: 10 results
2. KANEMATSU Hideyuki (10185952)

# of Collaborated Projects: 1 results

# of Collaborated Products: 11 results
3. 岡田真 (60637065)

# of Collaborated Projects: 1 results

# of Collaborated Products: 2 results
4. COLLIGON John

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
5. MASUDA Tsuyashi

# of Collaborated Projects: 1 results

# of Collaborated Products: 11 results

KOBAYASHI Toshiro 小林 敏郎

Research Projects

Research Products

Co-Researchers

Establishment of buckling peeling damage prevention technology and evaluation/design method for flexible organic semiconductor devicesPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Improving the flexibility of organic semiconductor thin films and establishing the evaluation methodPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Improvement in the Ductility of Organic Semiconductor Materials Used in a Flexible Organic Light Emitting DiodePrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Journal Article] Delamination Behavior in Compression Bending Test of Organic Semiconductor Device2023

Author(s)

Journal Title

Data Source

[Journal Article] Observing the Delamination Interface in Multi Layered Thin Films with a MgAg Alloy Top Layer and Organic Semiconductor under Layers on a Flexible Substrate2020

Author(s)

Journal Title

DOI

NAID

ISSN

Year and Date

Language

Data Source

[Journal Article] Cracking of Aluminum and Silver Alloy Thin Films on Polymer Thin Films2019

Author(s)

Journal Title

DOI

NAID

ISSN

Year and Date

Language

Data Source

[Journal Article] Cracking of Aluminum and Silver Alloy Thin Films on Polymer Thin Films2019

Author(s)

Journal Title

NAID

Data Source

[Journal Article] Measuring Temperature Dependence of Critical Cracking Strain of Thin Films for Organic Light Emitting Diode2017

Author(s)

Journal Title

NAID

Data Source

[Journal Article] <b>Measuring Temperature Dependence of Critical Cracking Strain of Thin Films for Organic Light Emitting Diod</b><b>e </b>2017

Author(s)

Journal Title

DOI

NAID

ISSN

Language

Data Source

[Journal Article] Improvement in the Ductility of Organic Semiconductor MaterialsUsed in a Flexible Organic Light Emitting Diode2014

Author(s)

Journal Title

Data Source

[Journal Article] Measurement of Reduced Elastic Modulus of Organic Semiconductor Materials for Flexible Organic Light Emitting Diode2014

Author(s)

Journal Title

NAID

Data Source

[Journal Article] Study on Evaluation Methods for Mechanical Properties of Organic Semiconductor Materials2013

Author(s)

Journal Title

DOI

Data Source

[Patent] フレキシブル有機半導体素子2014

Inventor(s)

Industrial Property Rights Holder

Industrial Property Rights Type

KOBAYASHI Toshiro 小林敏郎