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TAKAOKA Akio  鷹岡 昭夫

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鷹岡 昭夫  タカオカ アキオ

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Researcher Number 80029272
Other IDs
External Links
Affiliation (Current) 2025: 大阪大学, その他部局等, 名誉教授
Affiliation (based on the past Project Information) *help 2005 – 2006: 大阪大学, 超高圧電子顕微鏡センター, 教授
2002: Osaka University, Research for Ultra-High Voltage Electron Microscopy, Professor, 超高圧電子顕微鏡センター, 教授
2001: 大阪大学, 超高圧電子顕微鏡センター, 助教授
1993 – 1994: 大阪大学, 工学部, 助教授
1990 – 1991: 大阪大学, 工学部, 助教授
Review Section/Research Field
Principal Investigator
Biomedical engineering/Biological material science / 電子デバイス・機器工学 / Applied physics, general / 物理計測・光学
Keywords
Principal Investigator
電子顕微鏡 / 薄膜 / Automatic CT / 3D observation of cells / Automatic alignment / Automatic electron microscope / Electron tomography / ソフト開発 / 自動化 / 立体解析 … More / トモグラフィー / 細胞診断 / CT自動化 / 細胞3次元観察 / 自動アライメント / 電子顕微鏡自動制御 / 電子線トモグラフィー / on-off control of EB / crosstalk between neighboring columns / electron optical simulation / multi-micro-beam / electron beam lithography / シミュレーション / マルチビーム / 軌道解析 / 電磁界解析 / リソグラフィー / 電子ビーム / 空間電荷効果 / 電子光学シミュレーション / マルチ・マイクロコラム / 電子ビームリソグラフィー / Electron thermal diffuse scattering / Laser heating / Local temperature measurement / Thermal conductivity measurement / Thin film / Transmission electron microscope / レーザ加熱 / 電子線熱散漫散乱 / レーザー加熱 / 局所温度測定 / 熱伝導率測定 / Thermal Diffuse Scattering / Thermal Diffusivity / Transmission Electron Microscope / Electron Beam / Thermal Conductivity / Thin Film / Local Temperature / Temperature Measurement / 薄膜温度 / 電子ビ-ム / 熱散漫散乱 / 電子線 / 熱拡散係数 / 熱伝導率 / 局所温度 / 温度計測 Less
  • Research Projects

    (4 results)
  • Research Products

    (21 results)
  •  Development of automatic electron microscope for tomography and application to cell biologyPrincipal Investigator

    • Principal Investigator
      TAKAOKA Akio
    • Project Period (FY)
      2005 – 2006
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Biomedical engineering/Biological material science
    • Research Institution
      Osaka University
  •  Electron Optics of Electron Beam Lithography System with Multi-Micro ColumnsPrincipal Investigator

    • Principal Investigator
      TAKAOKA Akio
    • Project Period (FY)
      2001 – 2002
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      電子デバイス・機器工学
    • Research Institution
      Osaka University
  •  Measurement of heat transfer in sub-micron area of thin films by transmission electron microscopePrincipal Investigator

    • Principal Investigator
      TAKAOKA Akio
    • Project Period (FY)
      1993 – 1994
    • Research Category
      Grant-in-Aid for General Scientific Research (C)
    • Research Field
      Applied physics, general
    • Research Institution
      Osaka University
  •  Temperature measurement on submicron-area of thin films by using electron beamPrincipal Investigator

    • Principal Investigator
      TAKAOKA Akio
    • Project Period (FY)
      1990 – 1991
    • Research Category
      Grant-in-Aid for General Scientific Research (C)
    • Research Field
      物理計測・光学
    • Research Institution
      Osaka University

All 2007 2006 2005

All Journal Article

  • [Journal Article] Microscopic tomography with ultra-UHEM and application2007

    • Author(s)
      Akio Takaoka, T.Hasegawa, K.Yoshida, H.Mori
    • Journal Title

      Ultramicroscopy (submitted)

    • Data Source
      KAKENHI-PROJECT-17500305
  • [Journal Article] Microscopic tomography with ultra-HVEM and application2007

    • Author(s)
      Akio Takaoka, T.Hasegawa, K.Yoshida, H.Mori
    • Journal Title

      Ultramicroscopy (submitted)

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17500305
  • [Journal Article] Microscopic tomography with ultra-HVEM and application2007

    • Author(s)
      Akio Takaoka, T.Hasegawa K.Yoshida, H.Mori
    • Journal Title

      Ultramicroscopy (submitted)

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17500305
  • [Journal Article] Feature of ultra-HVEM tomography and application2006

    • Author(s)
      Akio Takaoka, T.Hasegawa, K.Yoshida, H.Mori
    • Journal Title

      Proc. 4^<th> Int. Cong. on Electron Tomography Vol. 1

      Pages: 57-57

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17500305
  • [Journal Article] Microscopic tomography with ultra-HVEM and application2006

    • Author(s)
      A.Takaoka, T.Hasegawa, K.Yoshida, H.Mori
    • Journal Title

      Proc. 16^<th> International Microscopy Congress vol. 2

      Pages: 680-680

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17500305
  • [Journal Article] Optimization of electron energy in tomography for sample conditions-Development of 300kV IVEM specially designed for 3D observation-2006

    • Author(s)
      Akio Takaoka et al.
    • Journal Title

      Proc.16^<th> International Microscopy Congress vol.2

      Pages: 1142-1142

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17500305
  • [Journal Article] Microscopic tomography with ultra-UHEM and application2006

    • Author(s)
      AKio TaKaoKa, T.Hasegawa, K.Yoshida, H.Mori
    • Journal Title

      Proc. 16^<th> international Microscopy Congress vol.2

      Pages: 680-680

    • Data Source
      KAKENHI-PROJECT-17500305
  • [Journal Article] Automatic alignment of electron tomography series without artificial fiducial markers using two-dimensional Affine motion model2006

    • Author(s)
      Tokiyori Ito, T.Kameoka, A.Takaoka
    • Journal Title

      Proc. 16^<th> International Microscopy Congress vol. 2

      Pages: 708-708

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17500305
  • [Journal Article] Feature of ultra-HVEM tomography and application2006

    • Author(s)
      Akio Takaoka, T.Hasegawa K.Yoshida, H.Mori
    • Journal Title

      Proc.4^<th> Int.Cong.on Electron Tomography vol.1

      Pages: 57-57

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17500305
  • [Journal Article] Automatic alignment of electron tomography series without artificial fiducial markers using two-dimensional Affine motion model2006

    • Author(s)
      ToKiyori Ito, T.Kameoka, A.Takaoka
    • Journal Title

      Proe. 16^<th> International Microscopy Congress vol.2

      Pages: 708-708

    • Data Source
      KAKENHI-PROJECT-17500305
  • [Journal Article] Nano-observation or HIV entry process by electron microscopic tomography2006

    • Author(s)
      Toshiyuki Goto, A. Takaoka
    • Journal Title

      Proc. 16^<th> International Microscopy Congress vol.2

      Pages: 415-415

    • Data Source
      KAKENHI-PROJECT-17500305
  • [Journal Article] Optimization of electron energy in tomography for sample conditions -Development of 300kV IVEM specially designed for 3D observation-2006

    • Author(s)
      Akio TaKaoKa et al.
    • Journal Title

      Proc. 16^<th> International Microscopy Congress vol.2

      Pages: 1142-1142

    • Data Source
      KAKENHI-PROJECT-17500305
  • [Journal Article] Optimization of electron energy in tomography for sample conditions -Development of 300kV IVEM specially designed for 3D observation-2006

    • Author(s)
      Akio Takaoka et al.
    • Journal Title

      Proc. 16^<th> International Microscopy Congress vol. 2

      Pages: 1142-1142

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17500305
  • [Journal Article] Automatic alignment of electron tomography series without artificial fiducial markers using two-dimensional Affine motion model2006

    • Author(s)
      Tokiyori Ito, T.Kameoka, A.Takaoka
    • Journal Title

      Proc.16^<th> International Microscopy Congress vol.2

      Pages: 708-708

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17500305
  • [Journal Article] Nano-observation of HIV entry process by electron microscopic tomography2006

    • Author(s)
      Toshiyuki Goto, A.Takaoka
    • Journal Title

      Proc.16^<th> International Microscopy Congress vol.2

      Pages: 415-415

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17500305
  • [Journal Article] Feature or ultra-HVEM tomography and application2006

    • Author(s)
      AKio Takaoka, T.Hasegawa, K.Yoshida, H.Mori
    • Journal Title

      Proc. 4^<th> Int. Cong. on Electron Tomography vol.1

      Pages: 415-415

    • Data Source
      KAKENHI-PROJECT-17500305
  • [Journal Article] Microscopic tomography with ultra-HVEM and application2006

    • Author(s)
      Akio Takaoka, T.Hasegawa, K.Yoshida, H.Mori
    • Journal Title

      Proc.16^<th> International Microscopy Congress vol.2

      Pages: 680-680

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17500305
  • [Journal Article] Nano-observation of HIV entry process by electron microscopic tomography2006

    • Author(s)
      Toshiyuki Goto, A. Takaoka
    • Journal Title

      Proc. 16^<th> International Microscopy Congress vol. 2

      Pages: 415-415

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17500305
  • [Journal Article] Feature of electron tomography with Ultra-HVEM of Osaka University2005

    • Author(s)
      A.Takaoka, K.Matoba, T.Hasegawa, H.Mori
    • Journal Title

      Proc. Microscopy and Mlcroanalysis 2005

    • Data Source
      KAKENHI-PROJECT-17500305
  • [Journal Article] 超高圧電子顕微鏡トモグラフィーによる立体観察技術〜病理組織から半導体デバイスまで〜2005

    • Author(s)
      鷹岡昭夫
    • Journal Title

      顕微鏡学会関東支部第30回講演会予稿集

      Pages: 30-35

    • Data Source
      KAKENHI-PROJECT-17500305
  • [Journal Article] Electron microscopic tomography with ultra-HVEM2005

    • Author(s)
      A.Takaoka, H.Mori
    • Journal Title

      Proc. 11th Int. Beijing Cof. and Exhibition on Instrumental Amalysis 2005 (CD)

    • Data Source
      KAKENHI-PROJECT-17500305

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