TAKAMATSU Yuzo 高松雄三

Researcher Number	80039255
Other IDs
External Links
Affiliation (based on the past Project Information) *help	2008: Ehime University, 大学院・理工学研究科, 教授 2006 – 2008: 愛媛大学, 理工学研究科, 教授 2003 – 2005: 愛媛大学, 工学部, 教授 1990 – 1992: 愛媛大学, 工学部, 教授 1987: Faculty of Engineering, Ehime University, 工学部, 教授 1986: 佐賀大学, 理工学部, 助教授
Review Section/Research Field	Principal Investigator Computer system/Network Except Principal Investigator 計算機工学 / 情報工学
Keywords	Principal Investigator Open fault / Internal bridging fault / Stuck-at fault / Test compaction / Built-in self test / Fault diagnosis / Testing of LSIs / 消費電力削減 / テスト系列圧縮 / 遅延故障 … More / VLSIの故障診断 / VLSIの故障検査 / ドントケア値 / クロストーク故障 / ブリッジ故障 / 故障検査 / 論理回路のテスト / オープン故障 / 内部ブリッジ故障 / 縮退故障 / テスト圧縮 / 組込み自己テスト / 故障診断 / 論理回路の故障検査 / ハードウエア記述言語 / 保守性 / ソフトウエアメトリクス / テストケース / ハード協調テスト / ハード協調設計 / ソフト / 協調テスト / ソフトウエア / ハードウエア / テスト / 組み込みシステム … More Except Principal Investigator 故障診断 / Fault Detection and Diagnosis / Highly Reliable Design / Testable design / Fault-Tolerant Design / Intelligent Systems / Fault-Tolerant System / Fault-Tolerant Computer / VLSI設計自動化 / ソフトウェアの高信頼化 / 知識工学 / 高信頼化 / フォールトトレランス / 設計検証 / 故障検査 / 高信頼化設計 / 検査容易設計 / 耐故障設計 / 知的システム / 耐故障システム / 耐故障コンピュータ / LST Testing / Highly Observable Testing / Electron Beam Testing / Fault Diagnosis / Testable Design / テストパタ-ン生成 / 診断容易化設計 / 電子ビ-ムテスト / 論理回路 / LSIテスト / 全可観測テスト / 電子ビームテスト / テスト容易化設計 Less

Development of Soft/Hard Co-Test Method for Embedded SystemsPrincipal Investigator
- Principal Investigator
  
  TAKAMATSU Yuzo
- Project Period (FY)
  2006 – 2008
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Computer system/Network
- Research Institution
  Ehime University
Study on Built-in Self Test and Fault Diagnosis for Very High Speed and Deep Sub-micron VLSIsPrincipal Investigator
- Principal Investigator
  
  TAKAMATSU Yuzo
- Project Period (FY)
  2003 – 2005
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Computer system/Network
- Research Institution
  Ehime University
Testable Design and Diagnosis under Highly Observable Condition
- Principal Investigator
  
  KINOSHITA Kozo
- Project Period (FY)
  1990 – 1992
- Research Category
  
  Grant-in-Aid for General Scientific Research (B)
- Research Field
  
  情報工学
- Research Institution
  Osaka University
Intelligent Apraochces to Fault-Tolerant Computer Systems
- Principal Investigator
  
  KINOSHITA KOZO
- Project Period (FY)
  1985 – 1987
- Research Category
  
  Grant-in-Aid for Co-operative Research (A)
- Research Field
  
  計算機工学
- Research Institution
  HIROSHIMA UNIVERSITY

All 2008 2007 2006 2005 2004

All Journal Article Presentation

[Journal Article] ハードウェアテスト生成ツールを用いた組込みシステムに対するテストケール生成法2008
- Author(s)
  樋上喜信, 藤尾昇平, 阿萬裕久, 高橋寛, 高松雄三
- Journal Title
  
  組込みシステムシンポジウム論文集
  
  Pages: 151-157
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18500055
[Journal Article] ハードウェアテスト生成ツールを用いた組込みシステムに対するテストケース生成法2008
- Author(s)
  樋上喜信, 藤尾昇平, 阿萬裕久, 高橋寛, 高松雄三
- Journal Title
  
  組込みシステムシンポジウム論文集無し
  
  Pages: 151-157
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18500055
[Journal Article] ハードウエア設計に対するソフトウエアメトリクスの適用2007
- Author(s)
  阿萬裕久, 池田裕輔, 市川直樹, 樋上喜信, 高橋寛, 高松雄三
- Journal Title
  
  電子情報通信学会総合大会論文集
- Data Source
  KAKENHI-PROJECT-18500055
[Journal Article] Compaction of Pass/Fail-based Diagnostic Test Vectors for Combinational and Sequential Circuits2006
- Author(s)
  Y.Higami, K.K.Saluja, H.Takahashi, S.Kobayashi, Y.Takamatsu
- Journal Title
  
  Proc.of IEEE The Eleventh Asia and South Pacific Design Automation
  
  Pages: 659-664
- NAID
  110004729724
- Data Source
  KAKENHI-PROJECT-15500043
[Journal Article] On Finding Don't Cares in Test Sequences for Sequential Circuits2006
- Author(s)
  Y. Higami, S. Kajihara, I. Pomeranz, S. Kobayashi and Y. Takamatsu
- Journal Title
  
  IEICE Trans. on Inf. & Syst. vol.E89-D, no.11
  
  Pages: 2748-2755
- NAID
  110007538482
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18500055
[Journal Article] 組合せ回路および順序回路に対する検出・非検出情報に基づく診断用テスト圧縮法2006
- Author(s)
  樋上喜信, Kewal K. Saluja, 高橋寛, 小林真也, 高松雄三
- Journal Title
  
  情報処理学会論文誌 vol.47, no.5
  
  Pages: 1269-1277
- NAID
  110004729724
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18500055
[Journal Article] Compaction of Pass/Fail-based Diagnostic Test Vectors for Combinational and Sequential Circuits2006
- Author(s)
  Y.Higami, K.K.Saluja, H.Takahashi, S.Kobayashi, Y.Takamatsu
- Journal Title
  
  Proc.of IEEE Eleventh Asia and South Pacific Design Automation Conference
  
  Pages: 659-664
- NAID
  110004729724
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15500043
[Journal Article] Compaction of Pass/Fail-based Diagnostic Test Vectors for Combinational and Sequential Circuits2006
- Author(s)
  Y.Higami, K.K.Saluji, H.Takahashi, S.Kobayashi, Y.Takamatsu
- Journal Title
  
  Proc. of IEEE The Eleventh Asia and South Pacific Design Automation
  
  Pages: 659-664
- NAID
  110004729724
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15500043
[Journal Article] On the Fault Diagnosis in the Presence of Unknown Fault Models Using Pass/Fail Information2005
- Author(s)
  Y.Takamatsu, T.Seiyama, H.Takahashi, Y.Higami, K.Yamazaki
- Journal Title
  
  Proc.of IEEE Int.Sympo.on Circuits and Systems
  
  Pages: 2987-2990
- Data Source
  KAKENHI-PROJECT-15500043
[Journal Article] On the Fault Diagnosis in the Presence of Unknown Fault Models Using Pass/Fail Information2005
- Author(s)
  Y.Takamatsu, T.Seiyama, H.Takahashi, Y.Higami, K.Yamazaki
- Journal Title
  
  Proc.of IEEE Int.Sympo. on Circuits and Systems
  
  Pages: 2987-2990
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15500043
[Journal Article] A Method for Reducing the Target Fault List of Crosstalk Faults in Synchronous Sequential Circuits2005
- Author(s)
  H.Takahashi, K.J.Keller, K.T.Le, K.K.Saluja, Y.Takamatsu
- Journal Title
  
  IEEE Trans.on Computer-Aided Design of Integrated Circuits and Systems 24-2
  
  Pages: 252-263
- Data Source
  KAKENHI-PROJECT-15500043
[Journal Article] A Method for Reducing the Target Fault List of Crosstalk Faults in Synchronous Sequential Circuits2005
- Author(s)
  H.Takahashi, K.J.Keller, K.T.Le, K.K.Saluja, Y.Takamatsu
- Journal Title
  
  IEEE Trans.on Computer-Aided Design of Integrated Circuits and Systems vol.24, no.2
  
  Pages: 252-263
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15500043
[Journal Article] A Method for Reducing the Target Fault List of Crosstalk Faults in Synchronous Sequetial Circuits2005
- Author(s)
  H.Takahashi, K.J.Keller, K.T.Le, K.K.Saluja, Y.Takamatsu
- Journal Title
  
  IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems vol.24,no.2
  
  Pages: 252-263
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15500043
[Journal Article] On the Fault Diagnosis in the Presence of Unknown Fault Models Using Pass/Fail Information2005
- Author(s)
  Y.Takamatsu, T.Seiyama, H.Takahashi, Y.Higami, K.Yamazaki
- Journal Title
  
  Proc. of IEEE Int. Sympo. on Circuits and Systems
  
  Pages: 2987-2990
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15500043
[Journal Article] Techniques for Finding Xs in Test Sequences for Sequential Circuits and Applications of Test Length/Power Reductior2004
- Author(s)
  Y.Higami, S.Kajihara, S.Kobayeshi, Y.Takamatsu
- Journal Title
  
  Proc.of the Thirteenth Asian Test Symposium
  
  Pages: 46-49
- Data Source
  KAKENHI-PROJECT-15500043
[Journal Article] Failure Analysis of Open Faults by Using Detecting/Undetecting Information on Tests2004
- Author(s)
  Y.Sato, H.Takahashi, Y.Higami, Y.Takamatsu
- Journal Title
  
  Proc.of the Thirteenth Asian Test Symposium
  
  Pages: 222-227
- Data Source
  KAKENHI-PROJECT-15500043
[Journal Article] Acceleration Techniques for Crosstalk Fault Simulation2004
- Author(s)
  Y.Higami, M.Sato, H.Takahashi, S.Kobayashi, Y.Takamatsu
- Journal Title
  
  Proc.of the Int'l Multi-Conf.on Advanced Computer System & Computer Information Systems and Industrial Management
  
  Pages: 300-309
- Data Source
  KAKENHI-PROJECT-15500043
[Presentation] ハードウエアテスト生成ツールを用いた組み込みシステムのテストケース生成について2008
- Author(s)
  高橋寛, 樋上喜信, 阿萬裕久, 釜山天平, 小林真也, 高松雄三
- Organizer
  電子情報通信学会総合大会
- Place of Presentation
  早稲田大学(北九州市)
- Year and Date
  2008-03-18
- Data Source
  KAKENHI-PROJECT-18500055
[Presentation] 原因-結果グラフを用いた組込みシステムに対する自動テストケース生成法2008
- Author(s)
  藤尾昇平, 阿萬裕久, 樋上喜信, 高橋寛, 高松雄三
- Organizer
  電気関係学科四国支部連合大会
- Place of Presentation
  徳島
- Year and Date
  2008-09-27
- Data Source
  KAKENHI-PROJECT-18500055
[Presentation] 原因-結果グラフを用いた組込みシステムに対する自動テストケール生成法2008
- Author(s)
  藤尾昇平, 阿萬裕久, 樋上喜信, 高橋寛, 高松雄三
- Organizer
  電気関係学科四国支部連合大会論文集, p. 300
- Year and Date
  2008-09-27
- Data Source
  KAKENHI-PROJECT-18500055
[Presentation] ハードウエアテスト生成ツールを用いた組み込みシステムのテストケース生成について2008
- Author(s)
  高橋寛, 樋上喜信, 阿萬裕久, 釜山天平, 小林真也, 高松雄三
- Organizer
  電子情報通信学会総合大会
- Year and Date
  2008-03-18
- Data Source
  KAKENHI-PROJECT-18500055
[Presentation] 直交表を用いた単体テストに関する考察~JUnit支援ツールの試作~2007
- Author(s)
  山田輝, 阿萬裕久, 高松雄三
- Organizer
  電子情報通信学会技術報告, vol.107, no.5, pp.1-6
- Year and Date
  2007-04-19
- Data Source
  KAKENHI-PROJECT-18500055
[Presentation] ゲートレベルを用いたトランジスタショートに対するテスト生成法2007
- Author(s)
  樋上喜信, K. K. Saluja, 高橋寛, 小林真也, 高松雄三
- Organizer
  電子情報通信学会技術報告(DC研究会), vol. 106, no. 476, pp. 34-39
- Year and Date
  2007-02-09
- Data Source
  KAKENHI-PROJECT-18500055
[Presentation] 直交表を用いた単体テストに関する考察〜JUnit支援ツールの試作2007
- Author(s)
  山田輝・阿萬裕久・高松雄三
- Organizer
  電子情報通信学会技術報告
- Place of Presentation
  会津大学(会津若松市)
- Year and Date
  2007-04-19
- Data Source
  KAKENHI-PROJECT-18500055
[Presentation] ハードウエア設計に対するソフトウェアメトリクスの適用2007
- Author(s)
  阿萬裕久, 池田裕輔, 市川直樹, 樋上喜信, 高橋寛, 高松雄三
- Organizer
  電子情報通信学会総合大会
- Year and Date
  2007-03-21
- Data Source
  KAKENHI-PROJECT-18500055
[Presentation] Diagnosis of Transistor Shorts in Logic Test Environment2006
- Author(s)
  Y. Higami, K. K. Saluja, H. Takahasi, K. Kobayashi and Y. Takamatsu
- Organizer
  Proc. IEEE Fifteenth Asian Test Symposium, pp. 354-359
- Year and Date
  2006-11-26
- Data Source
  KAKENHI-PROJECT-18500055

1. TAKAHASHI Hiroshi (80226878)

# of Collaborated Projects: 2 results

# of Collaborated Products: 21 results
2. HIGAMI Yoshinobu (40304654)

# of Collaborated Projects: 2 results

# of Collaborated Products: 21 results
3. KINOSHITA Kozo (00028995)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
4. AMAN Hirohisa (50333513)

# of Collaborated Projects: 1 results

# of Collaborated Products: 10 results
5. YASUI Hiroshi (60029014)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
6. ITAZAKI Noriyoshi (90223073)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
7. KOMATSU Masaharu (90116583)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
8. KIKUNO Tohru (50093745)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
9. MUKAIDONO Masao (00061987)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
10. OKAMOTO Takuji (60032934)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
11. TOHMA Yoshihiro (50016317)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
12. 内藤祥雄 (00115114)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
13. 古賀義亮

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

TAKAMATSU Yuzo 高松 雄三

Research Projects

Research Products

Co-Researchers

Development of Soft/Hard Co-Test Method for Embedded SystemsPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Study on Built-in Self Test and Fault Diagnosis for Very High Speed and Deep Sub-micron VLSIsPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Testable Design and Diagnosis under Highly Observable Condition

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Intelligent Apraochces to Fault-Tolerant Computer Systems

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Journal Article] ハードウェアテスト生成ツールを用いた組込みシステムに対するテストケール生成法2008

Author(s)

Journal Title

Data Source

[Journal Article] ハードウェアテスト生成ツールを用いた組込みシステムに対するテストケース生成法2008

Author(s)

Journal Title

Data Source

[Journal Article] ハードウエア設計に対するソフトウエアメトリクスの適用2007

Author(s)

Journal Title

Data Source

[Journal Article] Compaction of Pass/Fail-based Diagnostic Test Vectors for Combinational and Sequential Circuits2006

Author(s)

Journal Title

NAID

Data Source

[Journal Article] On Finding Don't Cares in Test Sequences for Sequential Circuits2006

Author(s)

Journal Title

NAID

Data Source

[Journal Article] 組合せ回路および順序回路に対する検出・非検出情報に基づく診断用テスト圧縮法2006

Author(s)

Journal Title

NAID

Data Source

[Journal Article] Compaction of Pass/Fail-based Diagnostic Test Vectors for Combinational and Sequential Circuits2006

Author(s)

Journal Title

NAID

Description

Data Source

[Journal Article] Compaction of Pass/Fail-based Diagnostic Test Vectors for Combinational and Sequential Circuits2006

Author(s)

Journal Title

NAID

Description

Data Source

[Journal Article] On the Fault Diagnosis in the Presence of Unknown Fault Models Using Pass/Fail Information2005

Author(s)

Journal Title

Data Source

[Journal Article] On the Fault Diagnosis in the Presence of Unknown Fault Models Using Pass/Fail Information2005

Author(s)

Journal Title

Description

Data Source

[Journal Article] A Method for Reducing the Target Fault List of Crosstalk Faults in Synchronous Sequential Circuits2005

Author(s)

Journal Title

Data Source

TAKAMATSU Yuzo 高松雄三

[Presentation] 直交表を用いた単体テストに関する考察〜JUnit支援ツールの試作2007