OHYA Shin-ichi 大谷眞一

… Alternative Names

Researcher Number	80120864
Other IDs
External Links
Affiliation (Current)	2020: 東京都市大学, 理工学部, 教授
Affiliation (based on the past Project Information) *help	1999 – 2005: 武蔵工業大学, 工学部, 教授 1994 – 1997: 武蔵工業大学, 工学部, 助教授 1991 – 1992: 武蔵工業大学, 工学部, 講師 1987: 武蔵工業大学, 助手
Review Section/Research Field	Principal Investigator Materials/Mechanics of materials / Materials/Mechanics of materials Except Principal Investigator 機械材料工学 / Materials/Mechanics of materials / 溶接工学
Keywords	Principal Investigator X線応力測定 / X-ray stress measurement / 単一入射法 / Single exposure technique / 動的測定 / 疲労 / X線イメージセンサ / X-ray stress analysis / Dynamic measurement / Fatigue strength … More Except Principal Investigator X線応力測定 / 残留応力 / Residual stress / イメージングプレート / PSPC / cosα法 / 微小領域 / 画像処理 / Cosd法 / イメ-ジングプレ-ト / 単一入射法 / Cosα法 / X-ray stress analysis / Imaging Plate / Cosalpha method / Localized area / Image processing / 単結晶 / 背面反射法 / ラウエ回折 / ラウエ回折法 / X-ray stress measurement, / Single crystal, / Imaging plate, / Back reflection method, / Laue diffraction / 溶接構造物 / 塑性変形 / φ-Sin^24法 / 疲労強度 / 呈色反応 / φ-sin^24法 / 溶接残留応力 / 拘束応力 / 位置検出型計数管 / Welded structure / X-ray stress measurement / -sin^2 mitahob Plastic deformation / Fatigue strength Less

Residual Stress Measurement on Thin Films Using Low Energy Synchrotron RadiationPrincipal Investigator
- Principal Investigator
  
  OHYA Shin-ichi, 秋田貢一
- Project Period (FY)
  2003 – 2005
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Musashi Institute of Technology
Development to Determine The Components of Plane Stress Using Whole Diffraction Ring.Principal Investigator
- Principal Investigator
  
  OHYA Shin-ichi
- Project Period (FY)
  2002 – 2004
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Musashi Institute of Technology
The Crack Detection Using Dynamic X-ray Stress Measurement during Fatigue TestPrincipal Investigator
- Principal Investigator
  
  OHYA Shin-ichi
- Project Period (FY)
  1999 – 2001
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Musashi Institute of Technology
X-RAY STRESS ANALYSIS ON SINGLE CRYSTAL BY USING IMAGING PLATE
- Principal Investigator
  
  YOSHIOKA Yasuo
- Project Period (FY)
  1996 – 1997
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Musashi Institute of Technology
In Situ Stress Analysis under Dynamic State by Using X-ray DiffractionPrincipal Investigator
- Principal Investigator
  
  OHYA Shin-ichi
- Project Period (FY)
  1994 – 1995
- Research Category
  
  Grant-in-Aid for General Scientific Research (C)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  MUSASHI INSTITUTE OF TECHNOLOGY
X-Ray Measurement of Stress in a Localized Area of Ceramics by Use of Imaging Plate
- Principal Investigator
  
  YOSHIOKA Yasuo
- Project Period (FY)
  1991 – 1992
- Research Category
  
  Grant-in-Aid for General Scientific Research (C)
- Research Field
  
  機械材料工学
- Research Institution
  MUSASHI INSTITUTE OF TECHNOLOGY
Study on Application of X-ray Stress Measurement to Welded Structures
- Principal Investigator
  
  IWATA Mitsumasa, NAGAI Kin-ichi
- Project Period (FY)
  1987 – 1988
- Research Category
  
  Grant-in-Aid for Co-operative Research (A)
- Research Field
  
  溶接工学
- Research Institution
  HIROSHIMA UNIVERSITY

All 2004 2003 2002

All Journal Article

[Journal Article] X-Ray Stress Measurement Using Whole Back Diffraction Ring2004
- Author(s)
  S.I.Ohya, K.Akita, Y.Shitaba, M.Yoshikawa
- Journal Title
  
  Residual Stresses VII
  
  Pages: 137-142
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-14550088
[Journal Article] X-Ray Stress Measurement Using Whole Back Diffraction Ring2004
- Author(s)
  S.I.Ohya, K.Akita, Y.Shitaba, M.Yoshikawa
- Journal Title
  
  Proceedings of The 7^<th> International Conference on Residual Stresses ICRS7, Residual Stresses VII
  
  Pages: 137-142
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-14550088
[Journal Article] DEVELOPMENT OF STRESS ANALYZER USING WHOLE X-RAY DIFFRACTION RING2004
- Author(s)
  Y.Shitaba, M.Yoshikawa, S.Ohya, K.Akita, Y.Hagiwara
- Journal Title
  
  Proceedings of The 35^<th> Symposium on Stress-strain Measurement and Strength Evaluation, The Japanese Soc.for Non-Destructive Inspection
  
  Pages: 133-1138
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-14550088
[Journal Article] X-Ray Stress Measurement Using Whole Back Diffraction Ring2004
- Author(s)
  Shin-ichi Ohya, Kohichi Akita, Yuichi Shitaba, Mitsutoshi Yoshikawa
- Journal Title
  
  Material Science Forum, Residual Stresses VII 490-491
  
  Pages: 137-142
- Data Source
  KAKENHI-PROJECT-14550088
[Journal Article] 背面反射回折X線像を用いた応力測定装置の開発2004
- Author(s)
  大谷眞一, 秋田貢一, 萩原芳彦, 下羽悠一, 吉川光俊
- Journal Title
  
  日本非破壊検査協会第35回応力・ひずみ測定と強度評価シンポジウム講演論文集
  
  Pages: 133-138
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-14550088
[Journal Article] Cu薄膜の残留応力に及ぼすPTFE中間層および膜厚の影響2003
- Author(s)
  熊谷正芳(武蔵工大院), 秋田貢一(武蔵工大), 大谷眞一(武蔵工大), ほか
- Journal Title
  
  第47回日本学術会議材料研究連合講演会論文集
  
  Pages: 307-307
- Data Source
  KAKENHI-PROJECT-15560083
[Journal Article] Stress Measurement Using Whole X-ray Diffraction Ring2002
- Author(s)
  M.Yoshikawa, S.Ohya, K.Akita, Y.Hagiwara, K.Hasegawa
- Journal Title
  
  Proceedings of The 38^<th> Symposium on X-ray Studies on Mechanical Behaviour of Materials, Soc.of Material Science, Japan
  
  Pages: 7-12
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-14550088
[Journal Article] 背面回折X線像を用いた応力測定2002
- Author(s)
  吉川光俊, 大谷眞一, 秋田貢一, 萩原芳彦, 長谷川賢一
- Journal Title
  
  日本材料学会第38回X線材料強度に関するシンポジウム講演論文集
  
  Pages: 7-12
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-14550088

1. YOSHIOKA Yasuo (40061501)

# of Collaborated Projects: 4 results

# of Collaborated Products: 0 results
2. HAGIWARA Yoshihiko (70061546)

# of Collaborated Projects: 3 results

# of Collaborated Products: 4 results
3. MOCHIKI Kohichi (80107549)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
4. AKITA Koichi (10231820)

# of Collaborated Projects: 2 results

# of Collaborated Products: 8 results
5. IWATA Mitsumasa (80034346)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
6. NAGAI Kin-ichi (10034290)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
7. HASEGAWA Ken-ichi (40010798)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
8. SUGIYAMA Yoshihiro (60061511)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
9. NISHIZAWA Hidekazu (70127116)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
10. OTA Shozaburo (10139404)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
11. HONDA Kazuo (20032914)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
12. 田丸武好 (30043566)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

OHYA Shin-ichi 大谷 眞一

OHYA Shin'ichi 大谷 真一

大谷 眞一 オオヤ シンイチ

Research Projects

Research Products

Co-Researchers

Residual Stress Measurement on Thin Films Using Low Energy Synchrotron RadiationPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Development to Determine The Components of Plane Stress Using Whole Diffraction Ring.Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

The Crack Detection Using Dynamic X-ray Stress Measurement during Fatigue TestPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

X-RAY STRESS ANALYSIS ON SINGLE CRYSTAL BY USING IMAGING PLATE

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

In Situ Stress Analysis under Dynamic State by Using X-ray DiffractionPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

X-Ray Measurement of Stress in a Localized Area of Ceramics by Use of Imaging Plate

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Study on Application of X-ray Stress Measurement to Welded Structures

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Journal Article] X-Ray Stress Measurement Using Whole Back Diffraction Ring2004

Author(s)

Journal Title

Description

Data Source

[Journal Article] X-Ray Stress Measurement Using Whole Back Diffraction Ring2004

Author(s)

Journal Title

Description

Data Source

[Journal Article] DEVELOPMENT OF STRESS ANALYZER USING WHOLE X-RAY DIFFRACTION RING2004

Author(s)

Journal Title

Description

Data Source

[Journal Article] X-Ray Stress Measurement Using Whole Back Diffraction Ring2004

Author(s)

Journal Title

Data Source

[Journal Article] 背面反射回折X線像を用いた応力測定装置の開発2004

Author(s)

Journal Title

Description

Data Source

[Journal Article] Cu薄膜の残留応力に及ぼすPTFE中間層および膜厚の影響2003

Author(s)

Journal Title

Data Source

[Journal Article] Stress Measurement Using Whole X-ray Diffraction Ring2002

Author(s)

Journal Title

Description

OHYA Shin-ichi 大谷眞一

OHYA Shin'ichi 大谷真一

大谷眞一オオヤシンイチ