• Search Research Projects
  • Search Researchers
  • How to Use
  1. Back to previous page

FUJII YOSHIKAZU  藤居 義和

ORCIDConnect your ORCID iD *help
… Alternative Names

藤居 義和  フジイ ヨシカズ

FUJII Yoshikazu  藤居 義和

FUJII Yosikazu  藤居 義和

Less
Researcher Number 80238534
Other IDs
External Links
Affiliation (Current) 2021: 神戸大学, 工学研究科, 准教授
Affiliation (based on the past Project Information) *help 2018 – 2019: 神戸大学, 工学研究科, 准教授
1995 – 2002: 神戸大学, 工学部, 助教授
1991 – 1993: 京都大学, 工学部, 助手
Review Section/Research Field
Principal Investigator
Applied materials science/Crystal engineering / Basic Section 29020:Thin film/surface and interfacial physical properties-related
Except Principal Investigator
Applied materials / 機械工作・生産工学
Keywords
Principal Investigator
表面ステップ / 超高真空 / 結晶成長 / ultrahigh vacuum / 微小角入射X線散乱 / crystal growth / surface roughness / X-ray scattering at small glancing angle / X-ray CCD camera / in-situ observation … More / 表面 / X線 / 結晶 / 表面荒さ / surface step / PbSe (111) crystal surface / 微小入射X線散乱 / 表面粗さ / 実時間測定 / 微小角斜入射イオン散乱 / 水切り運動 / 表面ウェイク誘起電場 / 表面阻止能 / 表面航跡 / 単結晶清浄表面 / 鏡面反射散乱 / surface / X-ray / crystal / X-ray scattering at small glancing angle incidence / X線CCDカメラ / その場観察 / 高温での純鉄表面 / PbSe(111)表面 / crystal growth incidence / pure iron surface under high temperature / X線エネルギー測定 / X線二次元分布測定 / X-ray energy two-dimensional detection system / 表面散乱型X線顕微鏡 / 表面元素マッピング / photon count / X線反射率法 / 表面・界面 / X線反射率法 / 表面界面 … More
Except Principal Investigator
斜入射イオン散乱 / 表面ステップ / 表面歪 / 表面欠陥 / 表面阻止能 / エピタクシ-成長 / イオン散乱 / テルル化錫 / 不整合転位 / 鉛カルコゲナイド / エピタキシャル成長薄膜 / 異面不整合転位 / 成長表面のその場観察 / 反射イオン強度振動 / 2次元核成長 / 鏡面反射イオン分光法 / Layer-by-layer成長 / GaAs / エピタキシャル成長表面のその場観察 / 表面ブロッキング / 電子移行反応 / surface blocking / glancing angle scattering of fast ions / charge exchange at surface / surface stopping power / surface defects / surface distortion / 楕円振動切削加工法 / 超精密切削 / ダイヤモンド工具 / マイクロ加工 / 切りくず生成 / 仕上げ面粗さ / 形状精度 / 3次元複雑形状 / Elliptical vibration cutting / Ultraprecision cutting / Diamond tool / Micro machining / Chip formation / Surface roughness / Shape accuracy / 3 dimensional structure Less
  • Research Projects

    (11 results)
  • Research Products

    (2 results)
  • Co-Researchers

    (8 People)
  •  高精度界面構造解析のためのX線反射率法の改良の研究Principal InvestigatorOngoing

    • Principal Investigator
      藤居 義和
    • Project Period (FY)
      2018 – 2020
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Review Section
      Basic Section 29020:Thin film/surface and interfacial physical properties-related
    • Research Institution
      Kobe University
  •  In-situ analysis of the growing surface by two dimensional detection of x-ray scattering at small glancing angle incidencePrincipal Investigator

    • Principal Investigator
      FUJII Yoshikazu
    • Project Period (FY)
      2001 – 2002
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Applied materials science/Crystal engineering
    • Research Institution
      Kobe University
  •  ULTRAPRECISION MACHINING OF 3 DIMENSIONAL MICRO STRUCTURES BY APPLYING ELLIPTICAL VIBRATION CUTTING

    • Principal Investigator
      MORIWAKI Toshimichi
    • Project Period (FY)
      2000 – 2001
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      機械工作・生産工学
    • Research Institution
      KOBE UNIVERSITY
  •  Real time analysis on the growing crystal surface by X-ray scattering at small glancing angle incidencePrincipal Investigator

    • Principal Investigator
      FUJII Yoshikazu
    • Project Period (FY)
      1999 – 2000
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Applied materials science/Crystal engineering
    • Research Institution
      Kobe University
  •  In-situ observation of the crystal growth process by X-ray scattering at small glancing angle incidencePrincipal Investigator

    • Principal Investigator
      FUJII Yoshikazu
    • Project Period (FY)
      1997 – 1998
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Applied materials science/Crystal engineering
    • Research Institution
      Kobe University
  •  Investigation of the growing surfaces of crystal by X-ray scattering at small glancing angle incidencePrincipal Investigator

    • Principal Investigator
      FUJII Yoshikazu
    • Project Period (FY)
      1995 – 1996
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Applied materials science/Crystal engineering
    • Research Institution
      Kobe University
  •  成長初期におけるエピタキシャル膜構造の研究

    • Principal Investigator
      万波 通彦
    • Project Period (FY)
      1993
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Kyoto University
  •  微小角斜射イオンの異常散乱の研究Principal Investigator

    • Principal Investigator
      藤居 義和
    • Project Period (FY)
      1993
    • Research Category
      Grant-in-Aid for Encouragement of Young Scientists (A)
    • Research Field
      Applied materials science/Crystal engineering
    • Research Institution
      Kyoto University
  •  成長初期におけるエピタキシャル膜構造の研究

    • Principal Investigator
      万波 通彦
    • Project Period (FY)
      1992
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Kyoto University
  •  成長初期におけるエピタキシャル膜構造の研究

    • Principal Investigator
      MANNAMI Michihiko
    • Project Period (FY)
      1991
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Kyoto University
  •  Study of Crystal Surfaces by Ion Surface Blocking

    • Principal Investigator
      MANNAMI Michihiko
    • Project Period (FY)
      1991 – 1992
    • Research Category
      Grant-in-Aid for General Scientific Research (B)
    • Research Field
      Applied materials
    • Research Institution
      KYOTO UNIVERSITY

All 2019

All Journal Article Presentation

  • [Journal Article] Derivation of surface roughness correlation function using X-ray reflectivity2019

    • Author(s)
      Yoshikazu Fujii
    • Journal Title

      ALC'19 Proceedings

      Volume: 1 Pages: 1-3

    • Data Source
      KAKENHI-PROJECT-18K04938
  • [Presentation] Derivation of surface roughness correlation function using X-ray reflectivity2019

    • Author(s)
      Yoshikazu Fujii
    • Organizer
      ALC '19 12th International Symposium on Atomic Level Characterizations for New Materials and Devices'19
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18K04938
  • 1.  MANNAMI Michihiko (60025294)
    # of Collaborated Projects: 4 results
    # of Collaborated Products: 0 results
  • 2.  木村 健二 (50127073)
    # of Collaborated Projects: 3 results
    # of Collaborated Products: 0 results
  • 3.  SUSUKI Yasufumi (00196784)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 0 results
  • 4.  YOSHIDA Kentaroh (60031085)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 0 results
  • 5.  MORIWAKI Toshimichi (00031104)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 6.  SHIBASAKA Toshiro (80094530)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 7.  SHAMOTO Eiji (20216146)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 8.  HINO Rei (80273762)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results

URL: 

Are you sure that you want to connect your ORCID iD to this researcher?
* This action can be performed only by the researcher themselves.

Information User Guide FAQ News Terms of Use Attribution of KAKENHI

Powered by NII kakenhi