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Naitou Yuichi  内藤 裕一

ORCIDConnect your ORCID iD *help
… Alternative Names

内藤 裕一  ナイトウ ユウイチ

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Researcher Number 80392637
Affiliation (based on the past Project Information) *help 2022: 国立研究開発法人産業技術総合研究所, エレクトロニクス・製造領域, 主任研究員
2020: 国立研究開発法人産業技術総合研究所, エレクトロニクス・製造領域, 主任研究員
2015 – 2016: 国立研究開発法人産業技術総合研究所, ナノエレクトロニクス研究部門, 主任研究員
2014: 独立行政法人産業技術総合研究所, ナノエレクトロニクス研究部門, 主任研究員
Review Section/Research Field
Principal Investigator
Thin film/Surface and interfacial physical properties
Except Principal Investigator
Basic Section 29030:Applied condensed matter physics-related
Keywords
Principal Investigator
走査型トンネル顕微鏡 / ドーパント / 半導体表面 / ヘリウムイオンビーム / 単一欠陥 / ヘリウムイオンドープ / アンダーソン局在 / 金属ー絶縁体転移 / ヘリウムイオン顕微鏡 / ヘリウムイオン … More / ドーズ / グラフェン / 走査型容量顕微鏡 / 走査型プローブ顕微鏡 … More
Except Principal Investigator
ヘリウムイオン顕微鏡 / 電圧標準 / 雑音温度計 / 熱力学温度 / ジョセフソン効果 / 微細加工 / ヘリウムイオンビーム顕微鏡 / ジョセフソン接合 / 高温超伝導 / 超伝導 Less
  • Research Projects

    (2 results)
  • Research Products

    (2 results)
  • Co-Researchers

    (6 People)
  •  Development of quantum voltage noise source using high-temperature superconductor for precision thermodynamic thermometer

    • Principal Investigator
      Urano Chiharu
    • Project Period (FY)
      2020 – 2022
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Review Section
      Basic Section 29030:Applied condensed matter physics-related
    • Research Institution
      National Institute of Advanced Industrial Science and Technology
  •  Electric induced ionization dynamics of single dopant atom observed by low temperature scanning tunneling microscopyPrincipal Investigator

    • Principal Investigator
      Naitou Yuichi
    • Project Period (FY)
      2014 – 2016
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Thin film/Surface and interfacial physical properties
    • Research Institution
      National Institute of Advanced Industrial Science and Technology

All 2017

All Journal Article Presentation

  • [Journal Article] Conductivity change of defective graphene by helium ion beams2017

    • Author(s)
      Yuichi Naitou and Shinichi Ogawa
    • Journal Title

      AIP Advances

      Volume: 7 Issue: 4

    • DOI

      10.1063/1.4979983

    • Peer Reviewed / Acknowledgement Compliant / Open Access
    • Data Source
      KAKENHI-PROJECT-26390071
  • [Presentation] Direct nano-patterning of graphene by Anderson localization2017

    • Author(s)
      内藤裕一
    • Organizer
      応用物理学会
    • Place of Presentation
      パシフィコ横浜
    • Invited
    • Data Source
      KAKENHI-PROJECT-26390071
  • 1.  金子 晋久 (30371032)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 2.  Urano Chiharu (30356589)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 3.  永崎 洋 (20242018)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 4.  三澤 哲郎 (40635819)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 5.  森田 行則 (60358190)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 6.  石田 茂之 (90738064)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results

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