Shintani Michihiro 新谷道広

Researcher Number	80748913
Other IDs
Affiliation (Current)	2025: 京都工芸繊維大学, 電気電子工学系, 准教授
Affiliation (based on the past Project Information) *help	2022 – 2024: 京都工芸繊維大学, 電気電子工学系, 准教授 2018 – 2020: 奈良先端科学技術大学院大学, 先端科学技術研究科, 助教 2017: 奈良先端科学技術大学院大学, 情報科学研究科, 助教 2016: 京都大学, 情報学研究科, 特定助教 2015: 京都大学, 情報学研究科, 研究員
Review Section/Research Field	Principal Investigator Basic Section 60040:Computer system-related / Computer system Except Principal Investigator Basic Section 21010:Power engineering-related
Keywords	Principal Investigator 高信頼化 / ニューラルネットワーク / 高集積化 / ガウス過程 / 専用ハードウェア / メムキャパシタ / 検査容易化 / 信頼性 / 機械学習 / 誤り訂正符号 … More / 永久故障 / 過渡故障 / 脳型コンピュータ / 誤り訂正 / メモリスタ / NBTI緩和 / 回路シミュレーション / タイミング解析 / NBTI / 経年劣化 / プロセッサ設計 / MOSFET / トランジスタ … More Except Principal Investigator オートチューニング / 学習最適化 / デジタルツイン / デジタルアクティブゲートドライバ / SiCパワーMOSFET Less

Development of fast self regulating digital active gate driver for SiC MOSFET
- Principal Investigator
  
  引原隆士
- Project Period (FY)
  2023 – 2025
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Review Section
  
  Basic Section 21010:Power engineering-related
- Research Institution
  Research Institute for Applied Sciences
  Kyoto University
高信頼化に向けたメムキャパシタ脳型コンピュータ設計基盤Principal Investigator
- Principal Investigator
  
  新谷道広
- Project Period (FY)
  2022 – 2024
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 60040:Computer system-related
- Research Institution
  Kyoto Institute of Technology
Study on high reliability of neuromorphic hardwarePrincipal Investigator
- Principal Investigator
  
  Shintani Michihiro
- Project Period (FY)
  2018 – 2020
- Research Category
  
  Grant-in-Aid for Early-Career Scientists
- Review Section
  
  Basic Section 60040:Computer system-related
- Research Institution
  Nara Institute of Science and Technology
Study on high reliable processor based on mitigation and observation of agingPrincipal Investigator
- Principal Investigator
  
  Shintani Michihiro
- Project Period (FY)
  2015 – 2017
- Research Category
  
  Grant-in-Aid for Young Scientists (B)
- Research Field
  
  Computer system
- Research Institution
  Nara Institute of Science and Technology
  Kyoto University

All 2024 2023 2022 2021 2020 2019 2018 2017 2016 2015

All Journal Article Presentation

[Journal Article] Wafer-Level Characteristic Variation Modeling Considering Systematic Discontinuous Effects2024
- Author(s)
  NAGAO Takuma、NAKAMURA Tomoki、KAJIYAMA Masuo、EIKI Makoto、INOUE Michiko、SHINTANI Michihiro
- Journal Title
  
  IEICE Trans. Fundamentals
  
  Volume: E107.A Issue: 1 Pages: 96-104
- DOI
  10.1587/transfun.2023KEP0010
- ISSN
  0916-8508, 1745-1337
- Year and Date
  2024-01-01
- Language
  English
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22K11954
[Journal Article] EcoFlex-HDP: High-Speed and Low-Power and Programmable Hyperdimensional-Computing Platform with CPU Co-processing2024
- Author(s)
  Yuya Isaka, Nau Sakaguchi, Michiko Inoue, Michihiro Shintani
- Journal Title
  
  Proc. of IEEE Design, Automation and Test in Europe (DATE)
  
  Volume: -
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22K11954
[Journal Article] ccelerating Machine Learning-Based Memristor Compact Modeling Using Sparse Gaussian Process2024
- Author(s)
  Yuta Shintani, Michiko Inoue, Michihiro Shintani
- Journal Title
  
  Proc. of IEEE Design, Automation and Test in Europe (DATE)
  
  Volume: -
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22K11954
[Journal Article] Efficient Wafer-Level Spatial Variation Modeling for Multi-Site RF IC Testing2024
- Author(s)
  MIAN Riaz-ul-haque、NAKAMURA Tomoki、KAJIYAMA Masuo、EIKI Makoto、SHINTANI Michihiro
- Journal Title
  
  IEICE Trans. Fundamentals
  
  Volume: E107.A Issue: 8 Pages: 1139-1150
- DOI
  10.1587/transfun.2023EAP1115
- ISSN
  0916-8508, 1745-1337
- Year and Date
  2024-08-01
- Language
  English
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22K11954
[Journal Article] Experimental Study of Pass/Fail Threshold Determination Based on Gaussian Process Regression2023
- Author(s)
  Daisuke Goeda, Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki, Takashi Sato, Michihiro Shintani
- Journal Title
  
  Proc. of Workshop on Synthesis And System Integration of Mixed Information Technologies (SASIMI)
  
  Volume: -
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22K11954
[Journal Article] Feasibility Study of Incremental Neural Network Based Test Escape Detection by Introducing Transfer Learning Technique2023
- Author(s)
  Takaya Ayano、Shintani Michihiro
- Journal Title
  
  Proc. of IEEE International Test Conference in Asia (ITC-Asia)
  
  Volume: - Pages: 1-6
- DOI
  10.1109/itc-asia58802.2023.10301182
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22K11954
[Journal Article] Lifetime Improvement Method for Memristor-Based Hyperdimensional Computing Accelerator2023
- Author(s)
  Iwasaki Tetsuro、Shintani Michihiro
- Journal Title
  
  Proc. of IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)
  
  Volume: - Pages: 1-2
- DOI
  10.1109/imfedk60983.2023.10366339
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22K11954
[Journal Article] Improving Efficiency and Robustness of Gaussian Process Based Outlier Detection via Ensemble Learning2023
- Author(s)
  Eiki Makoto、Nakamura Tomoki、Kajiyama Masuo、Inoue Michiko、Sato Takashi、Shintani Michihiro
- Journal Title
  
  Proc. of International Test Conference (ITC)
  
  Volume: - Pages: 132-140
- DOI
  10.1109/itc51656.2023.00029
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22K11954
[Journal Article] Measurement and Modeling of Ambient-air-induced Degradation in Organic Thin-Film Transistor2020
- Author(s)
  Michihiro Shintani, Michiaki Saito, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato
- Journal Title
  
  IEEE Transactions on Semiconductor Manufacturing
  
  Volume: 33 Issue: 2 Pages: 216-223
- DOI
  10.1109/tsm.2020.2986609
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18K18025, KAKENHI-PROJECT-20H04156
[Journal Article] Cost-Efficient Recycled FPGA Detection through Statistical Performance Characterization Framework2020
- Author(s)
  Ahmed Foisal、Shintani Michihiro、Inoue Michiko
- Journal Title
  
  IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
  
  Volume: E103.A Issue: 9 Pages: 1045-1053
- DOI
  10.1587/transfun.2019kep0014
- NAID
  130007893711
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18K18025
[Journal Article] Area-Efficient and Reliable Error Correcting Code Circuit Based on Hybrid CMOS/Memristor Circuit2020
- Author(s)
  Ishizaka Mamoru、Shintani Michihiro、Inoue Michiko
- Journal Title
  
  Journal of Electronic Testing
  
  Volume: 36 Issue: 4 Pages: 537-546
- DOI
  10.1007/s10836-020-05892-3
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18K18025
[Journal Article] Accurate Recycled FPGA Detection Using an Exhaustive-Fingerprinting Technique Assisted by WID Process Variation Modeling2020
- Author(s)
  Ahmed Foisal、Shintani Michihiro、Inoue Michiko
- Journal Title
  
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  
  Volume: - Issue: 8 Pages: 1-1
- DOI
  10.1109/tcad.2020.3023684
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18K18025
[Journal Article] Identification and Application of Invariant Critical Paths under NBTI Degradation2017
- Author(s)
  Song Bian, Shumpei Morita, Michihiro Shintani, Hiromitsu Awano, Masayuki Hiromoto, and Takashi Sato
- Journal Title
  
  IEICE Trans. Fundamentals
  
  Volume: E100.A Issue: 12 Pages: 2797-2806
- DOI
  10.1587/transfun.E100.A.2797
- NAID
  130006236529
- ISSN
  0916-8508, 1745-1337
- Language
  English
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-17H01713, KAKENHI-PROJECT-17J06952, KAKENHI-PROJECT-15K15960
[Journal Article] Utilization of Path-Clustering in Efficient Stress-Control Gate Replacement for NBTI Mitigation2017
- Author(s)
  Shumpei Morita, Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato
- Journal Title
  
  IEICE Trans. Fundamentals
  
  Volume: E100.A Issue: 7 Pages: 1464-1472
- DOI
  10.1587/transfun.E100.A.1464
- NAID
  130007311781
- ISSN
  0916-8508, 1745-1337
- Language
  English
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-17H01713, KAKENHI-PROJECT-15K15960
[Journal Article] Path clustering for test pattern reduction of variation-aware adaptive path delay testing2017
- Author(s)
  Michihiro Shintani, Takumi Uezono, Kazumi Hatayama, Kazuya Masu, and Takashi Sato
- Journal Title
  
  Journal of Electronic Testing: Theory and Applications (JETTA)
  
  Volume: 32 Issue: 5 Pages: 601-609
- DOI
  10.1007/s10836-016-5614-0
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-26280014, KAKENHI-PROJECT-15K15960
[Journal Article] Fast Estimation of NBTI-Induced Delay Degradation Based on Signal Probability2016
- Author(s)
  Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato
- Journal Title
  
  IEICE Trans. Fundamentals
  
  Volume: E99.A Issue: 7 Pages: 1400-1409
- DOI
  10.1587/transfun.E99.A.1400
- NAID
  130005159598
- ISSN
  0916-8508, 1745-1337
- Language
  English
- Peer Reviewed / Acknowledgement Compliant / Open Access
- Data Source
  KAKENHI-PROJECT-26280014, KAKENHI-PROJECT-15K15960
[Journal Article] Fast Estimation of NBTI-Induced Delay Degradation Based on Signal Probability2016
- Author(s)
  Song Bian, Michihiro Shintani, Masayuki Hiromoto, Takashi Sato
- Journal Title
  
  IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
  
  Volume: E99
- NAID
  130005159598
- Peer Reviewed / Acknowledgement Compliant / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] ガウス過程回帰に基づく薄膜強誘電体メムキャパシタのモデル化と評価2024
- Author(s)
  浦田涼雅, 篠田太陽, 木村睦, 新谷道広
- Organizer
  電子情報通信学会技術研究報告 (VLSI設計技術研究会)
- Data Source
  KAKENHI-PROJECT-22K11954
[Presentation] 誤り検出と冗長救済によるメモリスタ超次元コンピューティング推論アクセラレータの長寿命化2023
- Author(s)
  岩崎哲朗, 新谷道広
- Organizer
  電子情報通信学会技術研究報告 (VLSI設計技術研究会)
- Data Source
  KAKENHI-PROJECT-22K11954
[Presentation] 低消費電力デバイスのためのプログラマブルな二値超次元計算アクセラレータ2023
- Author(s)
  井阪友哉, 坂口生有, 井上美智子, 新谷道広
- Organizer
  電子情報通信学会技術研究報告 (VLSI設計技術研究会)
- Data Source
  KAKENHI-PROJECT-22K11954
[Presentation] 転移学習を用いた自己符号化器による逐次見逃し故障 LSI 検出2023
- Author(s)
  高谷彩乃, 新谷道広
- Organizer
  電子情報通信学会技術研究報告 (VLSI設計技術研究会)
- Data Source
  KAKENHI-PROJECT-22K11954
[Presentation] ガウス過程回帰に基づくLSI テストにおける適応的良品判定基準決定手法2023
- Author(s)
  五枝大典, 中村友紀, 梶山賀生, 栄木誠, 新谷道広
- Organizer
  電子情報通信学会技術研究報告 (VLSI設計技術研究会)
- Data Source
  KAKENHI-PROJECT-22K11954
[Presentation] ガウス過程を用いた機械学習に基づくメモリスタモデリングの高速化2023
- Author(s)
  新谷悠太, 井上美智子, 新谷道広
- Organizer
  電子情報通信学会技術研究報告 (VLSI設計技術研究会)
- Data Source
  KAKENHI-PROJECT-22K11954
[Presentation] Wafer-Level Characteristic Variation Modeling Considering Systematic Discontinuous Effects2023
- Author(s)
  Takuma Nagao, Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki, Michiko Inoue, and Michihiro Shintani
- Organizer
  Proc. of IEEE/ACM Asia and South Pacific Design Automation Conference (ASP-DAC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22K11954
[Presentation] 機械学習に基づく薄膜メムキャパシタのモデル化に関する一考察2023
- Author(s)
  浦田涼雅, 木村睦, 新谷道広
- Organizer
  情報処理学会 SLDM研究発表会 (SLDM WIP Forum 2023)
- Data Source
  KAKENHI-PROJECT-22K11954
[Presentation] ガウス過程を用いたウェハーレベル特性モデル化手法のカーネル関数選択に関する実験的検討2022
- Author(s)
  廣江達也, ミアリアーズウルハック, 新谷道広
- Organizer
  電子情報通信学会ソサエティ大会
- Data Source
  KAKENHI-PROJECT-22K11954
[Presentation] Accurate Failure Rate Prediction Based on Gaussian Process Using WAT Data2022
- Author(s)
  Makoto Eiki, Tomoki Nakamura, Masuo Kajiyama, Michiko Inoue, and Michihiro Shintani
- Organizer
  Proc. of IEEE International Test Conference (ITC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22K11954
[Presentation] 自己参照に基づく直接密度比推定を用いた教師なし再利用FPGA検出2021
- Author(s)
  井阪友哉、新谷道広、アフメドフォイサル、井上美智子
- Organizer
  電子情報通信学会技術研究報告 (ディペンダブルコンピューティング研究会)
- Data Source
  KAKENHI-PROJECT-18K18025
[Presentation] LBIST-PUF: An LBIST Scheme Towards Efficient Challenge-Response Pairs Collection and Machine-Learning Attack Tolerance Improvement2020
- Author(s)
  Shintani Michihiro、Mino Tomoki、Inoue Michiko
- Organizer
  IEEE Asian Test Symposium (ATS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K18025
[Presentation] Recycled FPGA detection using exhaustive fingerprinting characterization2020
- Author(s)
  Shintani Michihiro
- Organizer
  The 15th D2T Symposium, The University of Tokyo
- Invited
- Data Source
  KAKENHI-PROJECT-18K18025
[Presentation] 網羅的パス解析による高精度な再利用FPGA検出手法2020
- Author(s)
  新谷道広, アフメドフォイサル, 井上美智子
- Organizer
  電子情報通信学会技術研究報告(ディペンダブルコンピューティング研究会)
- Data Source
  KAKENHI-PROJECT-18K18025
[Presentation] チェックサムとオンラインテストによるメモリスタニューラルネットワークの耐故障設計2020
- Author(s)
  石坂守, 新谷道広, 井上美智子
- Organizer
  電子情報通信学会技術研究報告(VLSI設計技術研究会)
- Data Source
  KAKENHI-PROJECT-18K18025
[Presentation] Feature Engineering for Recycled FPGA Detection Based on WID Variation Modeling2019
- Author(s)
  Foisal Ahmed, Michihiro Shintani, and Michiko Inoue
- Organizer
  IEEE European Test Symposium (ETS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K18025
[Presentation] Variational Autoencoder-Based Efficient Test Escape Detection2019
- Author(s)
  Michihiro Shintani, Kouichi Kumaki, and Michiko Inoue
- Organizer
  電子情報通信学会技術研究報告(ディペンダブルコンピューティング研究会)
- Data Source
  KAKENHI-PROJECT-18K18025
[Presentation] Low Cost Recycled FPGA Detection Using Virtual Probe Technique2019
- Author(s)
  Foisal Ahmed, Michihiro Shintani, and Michiko Inoue
- Organizer
  IEEE International Test Conference in Asia (ITC-Asia)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K18025
[Presentation] 製造検査時における組込み自己テスト回路を利用した効率的なPUF回路のチャレンジレスポンス対の生成と評価2019
- Author(s)
  三野智貴, 新谷道広, 井上美智子
- Organizer
  電子情報通信学会技術研究報告(ディペンダブルコンピューティング研究会)
- Data Source
  KAKENHI-PROJECT-18K18025
[Presentation] 自動微分を用いた SPICE モデルパラメータ抽出環境の構築2019
- Author(s)
  上田葵, 新谷道広, 岩田大志, 山口賢一, 井上美智子
- Organizer
  電子情報通信学会技術研究報告(VLSI設計技術研究会)
- Data Source
  KAKENHI-PROJECT-18K18025
[Presentation] An Efficient Approach to Recycled FPGA Detection Using WID Variation Modeling2019
- Author(s)
  Foisal Ahmed, Michihiro Shintani, and Michiko Inoue
- Organizer
  電子情報通信学会技術研究報告(ディペンダブルコンピューティング研究会)
- Data Source
  KAKENHI-PROJECT-18K18025
[Presentation] Feature Engineering for Recycled FPGA Detection Based on WID Variation Modeling2019
- Author(s)
  Foisal Ahmed, Michihiro Shintani, and Michiko Inoue
- Organizer
  IEEE European Test Conference (ETS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K18025
[Presentation] Comparative Study of Delay Degradation Caused by NBTI Considering Stress Frequency Dependence2018
- Author(s)
  Zuitoku Shin, Shumpei Morita, Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato
- Organizer
  Workshop on Synthesis And System Integration of Mixed Information technologies (SASIMI)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] Area-efficient and Reliable Hybrid CMOS/Memristor ECC Circuit for ReRAM Storage2018
- Author(s)
  Mamoru Ishizaka, Michihiro Shintani, and Michiko Inoue
- Organizer
  IEEE Asian Test Symposium (ATS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K18025
[Presentation] 重み推定によるメモリスタニューラルネットワークの信頼性向上の試み2018
- Author(s)
  石坂守, 新谷道広, 井上美智子
- Organizer
  電子情報通信学会技術研究報告(ディペンダブルコンピューティング研究会)
- Data Source
  KAKENHI-PROJECT-18K18025
[Presentation] Area-Efficient Memristor-Crossbar-Based Error Correcting Code Circuit2018
- Author(s)
  Mamoru Ishizaka, Michihiro Shintani, and Michiko Inoue
- Organizer
  Workshop on Security, Reliability, Test, Privacy, Safety and Trust of Future Devices (SURREALIST)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K18025
[Presentation] Efficient Worst-case Timing Analysis of Critical-Path Delay under Workload-Dependent Aging Degradation2018
- Author(s)
  Shumpei Morita, Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato
- Organizer
  IEEE/ACM Asia and South Pacific Design Automation Conference (ASP-DAC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] A Study on NBTI-induced Delay Degradation Considering Stress Frequency Dependence2018
- Author(s)
  Zuitoku Shin, Shumpei Morita, Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato
- Organizer
  International Symposium on Quality Electronic Design (ISQED)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] メモリスタニューラルネットワークにおける縮退故障による識別性能への影響2018
- Author(s)
  石坂守, 新谷道広, 井上美智子
- Organizer
  電子情報通信学会総合大会
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] Efficient Parameter-Extraction of SPICE Compact Model through Automatic Differentiation2018
- Author(s)
  Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato
- Organizer
  IEEE International Conference on Microelectronic Test Structures (ICMTS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] A Golden-Free Hardware Trojan Detection Technique Considering Intra-Die Variation2018
- Author(s)
  Fakir Sharif Hossain, Tomokazu Yoneda, Michihiro Shintani, Michiko Inoue, and Alex Orailoglu
- Organizer
  電子情報通信学会技術研究報告(ディペンダブルコンピューティング研究会)
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] Artificial Neural Network Based Test Escape Screening Using Generative Model2018
- Author(s)
  Michihiro Shintani, Yoshiyuki Nakamura, and Michiko Inoue
- Organizer
  IEEE International Test Conference (ITC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K18025
[Presentation] メモリスタ論理による誤り訂正符号回路の設計と評価2018
- Author(s)
  石坂守, 新谷道広, 井上美智子
- Organizer
  電子情報通信学会技術研究報告(ディペンダブルコンピューティング研究会)
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] Area-Efficient Memristor-Crossbar-Based Error Correcting Code Circuit2018
- Author(s)
  Mamoru Ishizaka, Michihiro Shintani, and Michiko Inoue
- Organizer
  Workshop on Security, Reliability, Test, Privacy, Safety and Trust of Future Devices (SURREALIST)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] トランジスタ劣化の永続・回復可能成分を考慮したしきい値電圧変動の時間依存モデル2017
- Author(s)
  新瑞徳, 森田俊平, 新谷道広, 廣本正之, 佐藤高史
- Organizer
  回路とシステムワークショップ (於北九州国際会議場)
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] Device Identification from Mixture of Measurable Characteristics2017
- Author(s)
  Michihiro Shintani, Kazuki Oishi, Rui Zhou, Masayuki Hiromoto, and Takashi Sato
- Organizer
  32nd Annual IEEE Applied Power Electronics Conference & Exposition (APEC)
- Place of Presentation
  Tampa, FL, USA
- Year and Date
  2017-03-26
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] Comparative Study of Path Selection and Objective Function in Replacing NBTI Mitigation Logic2017
- Author(s)
  Shumpei Morita, Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato
- Organizer
  International Symposium on Quality Electronic Design (ISQED)
- Place of Presentation
  Santa Clara, CA, Japan
- Year and Date
  2017-03-14
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] LSTA: Learning-Based Static Timing Analysis for High-Dimensional Correlated On-Chip Variations2017
- Author(s)
  Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato
- Organizer
  ACM/IEEE Design Automation Conference (DAC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] LSTA: Learning-Based Static Timing Analysis for High-Dimensional Correlated On-Chip Variations2017
- Author(s)
  Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato
- Organizer
  ACM/EDAC/IEEE Design Automation Conference (DAC)
- Place of Presentation
  Austin, TX, USA
- Year and Date
  2017-06-18
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] Intra-Die-Variation-Aware Side Channel Analysis for Hardware Trojan Detection2017
- Author(s)
  Fakir Sharif Hossain, Tomokazu Yoneda, Michihiro Shintani, Michiko Inoue, and Alex Orailoglu
- Organizer
  IEEE Asian Test Symposium (ATS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] トランジスタ劣化の永続・回復可能成分を考慮したしきい値電圧変動の時間依存モデル2017
- Author(s)
  忻瑞徳, 森田俊平, 新谷道広, 廣本正之, 佐藤高史
- Organizer
  第30回回路とシステムワークショップ
- Place of Presentation
  北九州国際会議場福岡県北九州市
- Year and Date
  2017-05-11
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] Parameter Extraction for MOSFET Current Model Using Backward Propagation of Errors2017
- Author(s)
  Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato
- Organizer
  IEEE/ACM Workshop on Variability Modeling and Characterization (VMC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] Workload-Aware Worst Path Analysis of Processor-Scale NBTI Degradation2016
- Author(s)
  Song Bian, Michihiro Shintani, Shumpei Morita, Hiromitsu Awano, Masayuki Hiromoto, and Takashi Sato
- Organizer
  Great Lakes Symposium on VLSI (GLSVLSI)
- Place of Presentation
  Boston, MA, USA
- Year and Date
  2016-05-18
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] 機械学習による経年劣化タイミング解析手法2016
- Author(s)
  辺松, 新谷道広, 廣本正之, 佐藤高史
- Organizer
  情報処理学会DAシンポジウム2016
- Place of Presentation
  山代温泉ゆのくに天祥石川県加賀市
- Year and Date
  2016-09-14
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] Nonlinear Delay-Table Approach for Full-Chip NBTI Degradation Prediction2016
- Author(s)
  Song Bian, Michihiro Shintani, Masayuki Hiromoto, Takashi Sato
- Organizer
  International Symposium on Quality Electronic Design (ISQED)
- Place of Presentation
  Santa Clara, CA, USA
- Year and Date
  2016-03-15
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] Unique Device Identification Framework for Power MOSFETs Using Inherent Device Variation2016
- Author(s)
  Michihiro Shintani, Kazuki Oishi, Rui Zhou, Masayuki Hiromoto, and Takashi Sato
- Organizer
  IEEE/ACM Workshop on Variability Modeling and Characterization (VMC)
- Place of Presentation
  Austin, TX, USA
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] 信号確率伝播に基づくプロセッサのためのNBTI起因最大遅延パスの抽出2016
- Author(s)
  辺松, 新谷道広, 森田俊平, 粟野浩光, 廣本正之, 佐藤高史
- Organizer
  回路とシステムワークショップ
- Place of Presentation
  北九州国際会議場(福岡県,北九州市)
- Year and Date
  2016-05-12
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] Mitigation of NBTI-Induced Timing Degradation in Processor2016
- Author(s)
  Song Bian, Michihiro Shintani, Zheng Wang, Masayuki Hiromoto, Anupam Chattopadhyay, and Takashi Sato
- Organizer
  International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU)
- Place of Presentation
  Santa Rosa, CA, USA
- Year and Date
  2016-03-10
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] Runtime NBTI Mitigation for Processor Lifespan Extension via Selective Node Control2016
- Author(s)
  Song Bian, Michihiro Shintani, Zheng Wang, Masayuki Hiromoto, Anupam Chattopadhyay, and Takashi Sato
- Organizer
  IEEE Asian Test Symposium (ATS)
- Place of Presentation
  Hiroshima International Convention Center, Hiroshima, Japan
- Year and Date
  2016-11-21
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] NBTIによるしきい値電圧変動のストレス確率依存性の評価2016
- Author(s)
  忻瑞徳, 森田俊平, 新谷道広, 廣本正之, 佐藤高史
- Organizer
  電子情報通信学会ソサイエティ大会
- Place of Presentation
  北海道大学北海道札幌市
- Year and Date
  2016-09-20
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] 代表パス抽出による劣化緩和セル置換箇所の高速な選択手法2016
- Author(s)
  森田俊平, 辺松, 新谷道広, 廣本正之, 佐藤高史
- Organizer
  第29回回路とシステムワークショップ
- Place of Presentation
  北九州国際会議場福岡県北九州市
- Year and Date
  2016-05-12
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] Representative Path Approach for Time-Efficient NBTI Mitigation Logic Replacement2016
- Author(s)
  Shumpei Morita, Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato
- Organizer
  IEEE/ACM Workshop on Variability Modeling and Characterization (VMC)
- Place of Presentation
  Austin, TX, USA
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] 信号確率伝播に基づいたプロセッサのためのNBTI起因最大遅延パスの抽出2016
- Author(s)
  辺松, 新谷道広, 森田俊平, 粟野皓光, 廣本正之, 佐藤高史
- Organizer
  第29回回路とシステムワークショップ
- Place of Presentation
  北九州国際会議場福岡県北九州市
- Year and Date
  2016-05-12
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] 代表パス抽出による劣化緩和セル置換箇所の高速な選択手法2016
- Author(s)
  森田俊平, 辺松, 新谷道広, 廣本正之, 佐藤高史
- Organizer
  回路とシステムワークショップ
- Place of Presentation
  北九州国際会議場(福岡県,北九州市)
- Year and Date
  2016-05-12
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] Path Grouping Approach for Efficient Candidate Selection of Replacing NBTI Mitigation Logic2016
- Author(s)
  Shumpei Morita, Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato
- Organizer
  the 20th Workshop on Synthesis And System Integration of Mixed Information technologies (SASIMI2016)
- Place of Presentation
  Kyoto Research Park, Kyoto, Japan
- Year and Date
  2016-10-24
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] Fast Estimation on NBTI-Induced Delay Degradation Based on Signal Probability2015
- Author(s)
  Song Bian, Michihiro Shintani, Masayuki Hiromoto, Takashi Sato
- Organizer
  DAシンポジウム
- Place of Presentation
  山代温泉ゆのくに天祥(石川県,加賀市)
- Year and Date
  2015-08-26
- Data Source
  KAKENHI-PROJECT-15K15960
[Presentation] プロセッサのNBTI劣化緩和法における劣化抑止制御回路の置換箇所削減に関する一検討2015
- Author(s)
  森田俊平, 辺松, 新谷道広, 廣本正之, 佐藤高史
- Organizer
  電子情報通信学会ソサイエティ大会
- Place of Presentation
  東北大学川内キャンパス(宮城県,仙台市)
- Year and Date
  2015-09-08
- Data Source
  KAKENHI-PROJECT-15K15960

1. 中島康彦 (00314170)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
2. 木村睦 (60368032)

# of Collaborated Projects: 1 results

# of Collaborated Products: 2 results
3. 引原隆士 (70198985)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
4. 持山志宇 (20867866)

# of Collaborated Projects: 1 results

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5. 福永崇平 (20914138)

# of Collaborated Projects: 1 results

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6. 高山創 (30981063)

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7. SATO Takashi

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Shintani Michihiro 新谷 道広

Research Projects

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Development of fast self regulating digital active gate driver for SiC MOSFET

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高信頼化に向けたメムキャパシタ脳型コンピュータ設計基盤Principal Investigator

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Study on high reliability of neuromorphic hardwarePrincipal Investigator

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Study on high reliable processor based on mitigation and observation of agingPrincipal Investigator

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[Journal Article] Wafer-Level Characteristic Variation Modeling Considering Systematic Discontinuous Effects2024

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[Journal Article] EcoFlex-HDP: High-Speed and Low-Power and Programmable Hyperdimensional-Computing Platform with CPU Co-processing2024

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[Journal Article] ccelerating Machine Learning-Based Memristor Compact Modeling Using Sparse Gaussian Process2024

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[Journal Article] Efficient Wafer-Level Spatial Variation Modeling for Multi-Site RF IC Testing2024

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[Journal Article] Experimental Study of Pass/Fail Threshold Determination Based on Gaussian Process Regression2023

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[Journal Article] Feasibility Study of Incremental Neural Network Based Test Escape Detection by Introducing Transfer Learning Technique2023

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[Journal Article] Lifetime Improvement Method for Memristor-Based Hyperdimensional Computing Accelerator2023

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[Journal Article] Improving Efficiency and Robustness of Gaussian Process Based Outlier Detection via Ensemble Learning2023

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[Journal Article] Measurement and Modeling of Ambient-air-induced Degradation in Organic Thin-Film Transistor2020

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[Journal Article] Cost-Efficient Recycled FPGA Detection through Statistical Performance Characterization Framework2020

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Shintani Michihiro 新谷道広