ISLAM MAHFUZUL ＩＳＬＡＭＭＡＨＦＵＺＵＬ

… Alternative Names

Mahfuzul Islam ISLAM MAHFUZUL

Mahfuzul Islam A. K. M.

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Researcher Number	80762195
Other IDs	https://orcid.org/0000-0002-5011-4044
Affiliation (Current)	2024: 東京科学大学, 工学院, 准教授
Affiliation (based on the past Project Information) *help	2019 – 2022: 京都大学, 工学研究科, 講師 2016: 東京大学, 生産技術研究所, 助教
Review Section/Research Field	Principal Investigator Basic Section 60040:Computer system-related Except Principal Investigator Computer system
Keywords	Principal Investigator 順序統計 / ADC / 製造ばらつき / MOSトランジスタ / ばらつき / 信頼性 / 経年劣化 / AD変換回路 / 統計的選択 / アナログ回路 … More / CMOS / IoT / 低消費電力 / センサ / 電源電圧依存性 / フラッシュ型ADC / アナログーディジタル変換回路 / モデリング / ディジタル / アナログ / 温度センサ / 集積回路 … More Except Principal Investigator 組込システム / ディペンダブルシステム / 組込みシステム / 製造容易化 / 低消費電力化 / 集積回路 / システムオンチップ Less

Low-power and high-reliability design of analog integrated circuit based on order statisticsPrincipal Investigator
- Principal Investigator
  
  ISLAM MAHFUZUL
- Project Period (FY)
  2022 – 2024
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 60040:Computer system-related
- Research Institution
  Kyoto University
Low-power design of CMOS sensor circuits utilizing device mismatchPrincipal Investigator
- Principal Investigator
  
  Mahfuzul Islam
- Project Period (FY)
  2019 – 2021
- Research Category
  
  Grant-in-Aid for Early-Career Scientists
- Review Section
  
  Basic Section 60040:Computer system-related
- Research Institution
  Kyoto University
LSI design methodology that enables robust operation under the supply as low as threshold voltage by self-compensating performance variability
- Principal Investigator
  
  ONODERA Hidetoshi
- Project Period (FY)
  2013 – 2016
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Computer system
- Research Institution
  Kyoto University

All 2023 2022 2021 2020 2019 2017 2016 2014 2013 Other

All Journal Article Presentation Book Patent

[Book] Chapter "Monitor Circuits for Cross-Layer Resiliency" in "Dependable Embedded Systems"2020
- Author(s)
  Mahfuzul Islam, and Hidetoshi Onodera
- Total Pages
  23
- Publisher
  Springer
- ISBN
  9783030520175
- Data Source
  KAKENHI-PROJECT-19K20233
[Book] Chapter "Random Telegraph Noise Under Switching Operation" in "Noise in Nanoscale Semiconductor Devices"2020
- Author(s)
  Kazutoshi Kobayashi, Mahfuzul Islam, Takashi Matsumoto, and Ryo Kishida
- Total Pages
  49
- Publisher
  Springer
- ISBN
  9783030375003
- Data Source
  KAKENHI-PROJECT-19K20233
[Journal Article] Wide-range and low supply dependency MOSFET-based temperature sensor utilizing statistical properties of scaled MOSFETs2023
- Author(s)
  Ota Shinichi、Islam Mahfuzul、Hisakado Takashi、Wada Osami
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 62 Issue: SC Pages: SC1098-SC1098
- DOI
  10.35848/1347-4065/acb94e
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22K11953
[Journal Article] On-chip leakage current variation measurement using external-reference-free current-to-time conversion for densely placed MOSFETs2022
- Author(s)
  Islam Mahfuzul、Harada Shogo
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 61 Issue: SC Pages: SC1056-SC1056
- DOI
  10.35848/1347-4065/ac506a
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-19K20233
[Journal Article] On-Chip Detection of Process Shift and Process Spread for Post-Silicon Diagnosis and Model-Hardware Correlation2013
- Author(s)
  A.K.M. Mahfuzul Islam, and Hidetoshi Onodera
- Journal Title
  
  IEICE Trans. Inf. & Syst.
  
  Volume: E96.D Issue: 9 Pages: 1971-1979
- DOI
  10.1587/transinf.E96.D.1971
- NAID
  130003370985
- ISSN
  0916-8532, 1745-1361
- Language
  English
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-25280014
[Patent] アナログデバイスおよびその制御方法、温度センサ、並びにアナログ素子対応付けシステム2020
- Inventor(s)
  イスラムマーフズル，久門尚史，和田修己
- Industrial Property Rights Holder
  イスラムマーフズル，久門尚史，和田修己
- Industrial Property Rights Type
  特許
- Filing Date
  2020
- Overseas
- Data Source
  KAKENHI-PROJECT-19K20233
[Patent] 集積回路における微細デバイスの特性分布の性質を利用したデバイスの選択技術及びデバイスの適切な選択による回路方式2019
- Inventor(s)
  イスラムマーフズル，久門尚史，和田修己
- Industrial Property Rights Holder
  イスラムマーフズル，久門尚史，和田修己
- Industrial Property Rights Type
  特許
- Industrial Property Number
  2019-200993
- Filing Date
  2019
- Data Source
  KAKENHI-PROJECT-19K20233
[Presentation] Demonstration of order statistics based Flash ADC in a 65nm process2022
- Author(s)
  Mahfuzul Islam, Takehiro Kitamura, Takashi Hisakado, Osami Wada
- Organizer
  28th Asia and South Pacific Design Automation Conference
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22K11953
[Presentation] Wide temperature- and voltage-range temperature sensing utilizing statistical property of sub-threshold MOSFET current2022
- Author(s)
  Shinichi Ota, Mahfuzul Islam, Takashi Hisakado, and Osami Wada
- Organizer
  International Conference on Solid State Devices and Materials
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22K11953
[Presentation] Performance Improvement of Order Statistics Based Flash ADC Using Multiple Comparator Groups2022
- Author(s)
  Takehiro Kitamura, Mahfuzul Islam, Takashi Hisakado, and Osami Wada
- Organizer
  IEEE International NEWCAS Conference
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22K11953
[Presentation] Measurement of temperature effect on comparator offset voltage variation2022
- Author(s)
  Yuma Iwata, Takehiro Kitamura, and Mahfuzul Islam
- Organizer
  IEEE International Conference on Microelectronic Test Structures
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22K11953
[Presentation] Homogeneous ring oscillator with staggered layout for gate-level delay characterization2022
- Author(s)
  Misaki Udo, Mahfuzul Islam, and Hidetoshi Onodera
- Organizer
  IEEE International Microelectronic Test Structures (ICMTS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19K20233
[Presentation] On-chip leakage current variation measurement using reference-free current-to-time conversion2021
- Author(s)
  Shogo Harada, and Mahfuzul Islam
- Organizer
  International Conference on Solid State Devices and Materials
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19K20233
[Presentation] A process scalable voltage-reference-Free temperature sensor utilizing MOSFET threshold voltage variation2021
- Author(s)
  Shogo Harada, Mahfuzul Islam, Takashi Hisakado, and Osami Wada
- Organizer
  IEEE Asian Solid-State Circuits Conference (A-SSCC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19K20233
[Presentation] Flash ADC Utilizing Offset Voltage Variation With Order Statistics Based Comparator Selection2021
- Author(s)
  Takehiro Kitamura, Mahfuzul Islam, Takashi Hisakado, and Osami Wada
- Organizer
  International Symposium on Quality Electronic Design (ISQED)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19K20233
[Presentation] CDF Distance Based Statistical Parameter Extraction Using Nonlinear Delay Variation Models2021
- Author(s)
  Kensuke Murakami, Mahfuzul Islam, and Hidetoshi Onodera
- Organizer
  27th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19K20233
[Presentation] Increased Delay Variability due to Random Telegraph Noise under Dynamic Back-gate Tuning2020
- Author(s)
  Misaki Udo, Keisuke Murakami, Mahfuzul Islam, Hidetoshi Onodera
- Organizer
  IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19K20233
[Presentation] オフセット電圧の順序統計量を利用したフラッシュ型ADCの理論検討2020
- Author(s)
  北村健浩, イスラムマーフズル, 久門尚史, 和田修己
- Organizer
  電子情報通信学会総合大会, 2020
- Data Source
  KAKENHI-PROJECT-19K20233
[Presentation] コンパレータのオンチップ選択機構を有する順序統計に基づいたフラッシュ型ADCの設計2020
- Author(s)
  北村健浩, イスラムマーフズル, 久門尚史, 和田修己
- Organizer
  DAシンポジウム
- Data Source
  KAKENHI-PROJECT-19K20233
[Presentation] しきい値電圧差を利用した時間領域処理による広い電源電圧で動作するCMOS温度センサ2020
- Author(s)
  原田彰吾, イスラムマーフズル, 久門尚史, 和田修己
- Organizer
  DAシンポジウム
- Data Source
  KAKENHI-PROJECT-19K20233
[Presentation] MOSFETの統計的選択によるレファレンス不要なCMOS温度センサの設計2019
- Author(s)
  原田彰吾, イスラムマーフズル, 久門尚史, 和田修己
- Organizer
  電子情報通信学会VLSI設計技術研究会 (VLD) , 愛媛, 2019年11月
- Data Source
  KAKENHI-PROJECT-19K20233
[Presentation] A Statistical Modeling Methodology of RTN Gate Size Dependency Based on Skewed Ring Oscillators2017
- Author(s)
  A.K.M. Mahfuzul Islam, Tatsuya Nakai, Hidetoshi Onodera
- Organizer
  2017 IEEE International Conference on Microelectronic Test Structures
- Place of Presentation
  Grenoble(France)
- Year and Date
  2017-03-28
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-25280014
[Presentation] On-chip Monitoring and Compensation Scheme with Fine-grain Body Biasing for Robust and Energy-Efficient Operations2016
- Author(s)
  A.K.M. Mahfuzul Islam and Hidetoshi Onodera
- Organizer
  21st Asia and South Pacific Design Automation Conference (ASP-DAC)
- Place of Presentation
  Macao(China)
- Year and Date
  2016-01-25
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-25280014
[Presentation] Statistical Analysis and Modeling of Random Telegraph Noise Based on Gate Delay Variation Measurement2016
- Author(s)
  A.K.M. Mahfuzul Islam, Tatsuya Nakai, and Hidetoshi Onodera
- Organizer
  International Conference on Microelectronic Test Structures
- Place of Presentation
  メルパルク横浜(神奈川県・横浜市)
- Year and Date
  2016-03-28
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-25280014
[Presentation] Cell-based Physical Design Automation for Analog and Mixed Signal Application2014
- Author(s)
  Norihiro Kamae, Islam A.K.M Mahfuzul, Akira Tsuchiya, Hidetoshi Onodera
- Organizer
  International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU)
- Place of Presentation
  Santa Cruz, CA, USA
- Data Source
  KAKENHI-PROJECT-25280014
[Presentation] In-Situ Variability Characterization of Individual Transistors Using Topology-Reconfigurable Ring Oscillators2014
- Author(s)
  A.K.M. Mahfuzul Islam, and Hidetoshi Onodera
- Organizer
  International Conference on Microelectronic Test Structures
- Place of Presentation
  Udine, Italy
- Data Source
  KAKENHI-PROJECT-25280014
[Presentation] Reconfigurable Delay Cell for Area-efficient Implementation of On-chip MOSFET Monitor Schemes2013
- Author(s)
  A.K.M. Mahfuzul Islam, Tohru Ishihara, and Hidetoshi Onodera
- Organizer
  IEEE Asian Solid State Circuits Conference
- Place of Presentation
  Singapore
- Data Source
  KAKENHI-PROJECT-25280014
[Presentation] Area-efficient Reconfigurable Ring Oscillator for Characterization of Static and Dynamic Variations2013
- Author(s)
  A.K.M. Mahfuzul Islam, and Hidetoshi Onodera
- Organizer
  International Conference on Solid State Devices and Materials
- Place of Presentation
  Fukuoka
- Data Source
  KAKENHI-PROJECT-25280014
[Presentation] Sensitivity-independent Extraction of Vth Variation Utilizing Log-normal Delay Distribution
- Author(s)
  A.K.M.Mahfuzul Islam, Hidetoshi Onodera
- Organizer
  2015 IEEE International Conference on Microelectronic Test Structures
- Place of Presentation
  Phoenix, AZ, USA
- Year and Date
  2015-03-24 – 2015-03-26
- Data Source
  KAKENHI-PROJECT-25280014
[Presentation] Characterization and compensation of performance variability using on-chip monitors
- Author(s)
  A.K.M. Mahfuzul Islam, and Hidetoshi Onodera
- Organizer
  2014 International Symposium on VLSI Design, Automation and Test
- Place of Presentation
  Hsinchu, Taiwan
- Year and Date
  2014-04-28 – 2014-04-30
- Invited
- Data Source
  KAKENHI-PROJECT-25280014

1. ONODERA Hidetoshi (80160927)

# of Collaborated Projects: 1 results

# of Collaborated Products: 9 results
2. NISHIZAWA Sinichi (40757522)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
3. 土谷亮 (20432411)

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
4. 石原亨 (30323471)

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results

ISLAM MAHFUZUL ＩＳＬＡＭ ＭＡＨＦＵＺＵＬ

Mahfuzul Islam ISLAM MAHFUZUL

Mahfuzul Islam A. K. M.

Research Projects

Research Products

Co-Researchers

Low-power and high-reliability design of analog integrated circuit based on order statisticsPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Low-power design of CMOS sensor circuits utilizing device mismatchPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

LSI design methodology that enables robust operation under the supply as low as threshold voltage by self-compensating performance variability

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Book] Chapter "Monitor Circuits for Cross-Layer Resiliency" in "Dependable Embedded Systems"2020

Author(s)

Total Pages

Publisher

ISBN

Data Source

[Book] Chapter "Random Telegraph Noise Under Switching Operation" in "Noise in Nanoscale Semiconductor Devices"2020

Author(s)

Total Pages

Publisher

ISBN

Data Source

[Journal Article] Wide-range and low supply dependency MOSFET-based temperature sensor utilizing statistical properties of scaled MOSFETs2023

Author(s)

Journal Title

DOI

Data Source

[Journal Article] On-chip leakage current variation measurement using external-reference-free current-to-time conversion for densely placed MOSFETs2022

Author(s)

Journal Title

DOI

Data Source

[Journal Article] On-Chip Detection of Process Shift and Process Spread for Post-Silicon Diagnosis and Model-Hardware Correlation2013

Author(s)

Journal Title

DOI

NAID

ISSN

Language

Data Source

[Patent] アナログデバイスおよびその制御方法、温度センサ、並びにアナログ素子対応付けシステム2020

Inventor(s)

Industrial Property Rights Holder

Industrial Property Rights Type

Filing Date

Data Source

[Patent] 集積回路における微細デバイスの特性分布の性質を利用したデバイスの選択技術及びデバイスの適切な選択による回路方式2019

Inventor(s)

Industrial Property Rights Holder

Industrial Property Rights Type

Industrial Property Number

Filing Date

Data Source

[Presentation] Demonstration of order statistics based Flash ADC in a 65nm process2022

Author(s)

Organizer

Data Source

[Presentation] Wide temperature- and voltage-range temperature sensing utilizing statistical property of sub-threshold MOSFET current2022

Author(s)

Organizer

Data Source

[Presentation] Performance Improvement of Order Statistics Based Flash ADC Using Multiple Comparator Groups2022

Author(s)

Organizer

Data Source

[Presentation] Measurement of temperature effect on comparator offset voltage variation2022

ISLAM MAHFUZUL ＩＳＬＡＭＭＡＨＦＵＺＵＬ