KUDOU Tomohiro 工藤友裕

… Alternative Names

工藤友裕クドウトモヒロ

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Researcher Number	90225160
Affiliation (Current)	2025: 熊本高等専門学校, リベラルアーツ系理数グループ, 教授
Affiliation (based on the past Project Information) *help	2007: Kumamoto National College of Technology, Department of General, Associated Professor 2007: Kumamoto National College of Technology, 一般科目, Associated Professor 2006: 熊本電波工業高等専門学校, 一般科, 助教授 2006: 熊本電波工業高等専門学校, 一般科目, 助教授 2005: 熊本電波工業高等専門学校, 電子工学科, 助教授 … More 2004: Kumamoto National College of Technology, Department of Electronic Engineering, Associate Professor, 電子工学科, 助教授 2004: 独立行政法人国立高等専門学校機構熊本電波工業高等専門学校, 電子工学科, 助教授 2003: 熊本電波工業高等専門学校, 電子工学科, 助教授 2000 – 2002: 熊本電波工業高等専門学校, 情報通信工学科, 助教授 1998 – 1999: Department of Information and Communication Engineering, Associate Researcher, 情報通信工学科, 助手 1997: 熊本電波工業高等専門学校, 電子工学科, 助手 Less
Review Section/Research Field	Principal Investigator Inorganic materials/Physical properties Except Principal Investigator Engineering fundamentals / Physical properties of metals / 電子デバイス・機器工学 / Structural/Functional materials / Electronic materials/Electric materials
Keywords	Principal Investigator SiGe / MOSFET / radiation damage / proton / SiC / 高温照射 / 電子線 / 歪Si / 照射損傷 / 陽子線 … More Except Principal Investigator … More 格子欠陥 / 照射損傷 / Recovery by annealing / Induced lattice defects / High energy particle / Radiation damage / 半導体デバイス / 回復 / 熱処理 / 劣化 / 宇宙空間 / 高エネルギー粒子 / Degradation / Electron / InGaAs HEMT / SiGe hetero device / SiGe / 特性劣化 / recovery / induced lattice defect / SOI transisor / SiC transistor / proton / electron / radiation damage / MOSFET / 歪Si / GaN LED / 高温照射 / 電子線 / 陽子線 / 宇宙環境 / 放射線 / SOI MOS / InGaAs photodiode / 高工ネルギー粒子 / Radiation source dependence of radiation atom / Degradation of performance / submicron MOSFETs / AlGaAs HEMT / InGaAsデバイス / HEMT / InGaAs / 放射線損傷 / 高エネルギー粒子線 Less

Radiation damage mechanism of advanced semiconductor materials and devices
- Principal Investigator
  
  SHIGAKI Kazuasda
- Project Period (FY)
  2005 – 2007
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Engineering fundamentals
- Research Institution
  Kumamoto National College of Technology
Irradiation temperature dependence of advanced semiconductor devicesPrincipal Investigator
- Principal Investigator
  
  KUDOU Tomohiro
- Project Period (FY)
  2005 – 2007
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Inorganic materials/Physical properties
- Research Institution
  Kumamoto National College of Technology
Study on radiation damages of semiconductor devices for high and low temperature
- Principal Investigator
  
  SHIGAKI Kazusada
- Project Period (FY)
  2002 – 2004
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Physical properties of metals
- Research Institution
  Kumamoto National College of Technology
Radiation damage of InGaAs device and its decrease method
- Principal Investigator
  
  KAZUSADA Shigaki
- Project Period (FY)
  1999 – 2001
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Structural/Functional materials
- Research Institution
  Kumamoto National College of Technology
Study on high-performance of advanced semiconductor
- Principal Investigator
  
  OHYAMA Hidenori
- Project Period (FY)
  1999 – 2001
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  電子デバイス・機器工学
- Research Institution
  Kumamoto National College of Technology
Radiation in advanced semiconductor devices and materials
- Principal Investigator
  
  OHYAMA Hidenori
- Project Period (FY)
  1997 – 1998
- Research Category
  
  Grant-in-Aid for international Scientific Research
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  Kumamoto National College of Technology

All 2008 2007

All Journal Article Presentation

[Journal Article] Optical property and crystalline quarity Si and Ge added β-Ga_2O_3 thin films2007
- Author(s)
  K. Takakura, T. Kudou, et. al.
- Journal Title
  
  Journal of Materials Science Materials in Electronics 19
  
  Pages: 167-170
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17560602
[Journal Article] Optical property and crystalline quarity Si and Ge added β-Ga_2O_3 thin films2007
- Author(s)
  K.Takakura, T.Kudou, et. al.
- Journal Title
  
  Journal of Materials Science Materials in Electronics 19
  
  Pages: 167-170
- Description
  「研究成果報告書概要(和文)」より
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17560602
[Journal Article] Optical property and crystalline quarity Si and Ge added □-Ga2O3 thin films2007
- Author(s)
  K. Takakura, T. Kudou, et. al.
- Journal Title
  
  Journal of Materials Science Materials in Electronics 19
  
  Pages: 167-170
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17560602
[Presentation] 歪Si MOSFETの陽子線照射損傷2008
- Author(s)
  葉山清輝, 工藤友裕, 他
- Organizer
  応用物理学会
- Place of Presentation
  日本大学船橋
- Year and Date
  2008-03-28
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17560602

1. OHYAMA Hidenori (80152271)

# of Collaborated Projects: 6 results

# of Collaborated Products: 0 results
2. HAYAMA Kiyoteru (00238148)

# of Collaborated Projects: 6 results

# of Collaborated Products: 1 results
3. HAKATA Tetsuya (60237899)

# of Collaborated Projects: 5 results

# of Collaborated Products: 0 results
4. KAZUSADA Shigaki (50044722)

# of Collaborated Projects: 4 results

# of Collaborated Products: 0 results
5. TAKAKURA Kenichirou (70353349)

# of Collaborated Projects: 3 results

# of Collaborated Products: 3 results
6. SIMOEN Eddy

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
7. CLAEYS Cor

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
8. EDDY Simoen

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
9. COR Claeys

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
10. SIMONE Eddy

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

KUDOU Tomohiro 工藤 友裕

工藤 友裕 クドウ トモヒロ

Research Projects

Research Products

Co-Researchers

Radiation damage mechanism of advanced semiconductor materials and devices

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Irradiation temperature dependence of advanced semiconductor devicesPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Study on radiation damages of semiconductor devices for high and low temperature

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Radiation damage of InGaAs device and its decrease method

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Study on high-performance of advanced semiconductor

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Radiation in advanced semiconductor devices and materials

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Journal Article] Optical property and crystalline quarity Si and Ge added β-Ga_2O_3 thin films2007

Author(s)

Journal Title

Data Source

[Journal Article] Optical property and crystalline quarity Si and Ge added β-Ga_2O_3 thin films2007

Author(s)

Journal Title

Description

Data Source

[Journal Article] Optical property and crystalline quarity Si and Ge added □-Ga2O3 thin films2007

Author(s)

Journal Title

Description

Data Source

[Presentation] 歪Si MOSFETの陽子線照射損傷2008

Author(s)

Organizer

Place of Presentation

Year and Date

Description

Data Source

KUDOU Tomohiro 工藤友裕

工藤友裕クドウトモヒロ