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AKIYAMA Nobuyuki  秋山 伸幸

ORCIDConnect your ORCID iD *help
Researcher Number 90251850
Other IDs
External Links
Affiliation (based on the past Project Information) *help 2002 – 2003: 長岡技術科学大学, 工学部, 教授
1994 – 1998: 長岡技術科学大学, 工学部, 教授
Review Section/Research Field
Principal Investigator
計測・制御工学 / Measurement engineering
Except Principal Investigator
Intelligent mechanics/Mechanical systems
Keywords
Principal Investigator
TFT-LCD / クラック検出 / FZ wafer / CZ wafer / scattered light detection / COP (crystal originated particle) detection / particle detection / インライン自動検査装置 / COP検出 / 半導体ウエハ表面検査 … More / 結晶空洞検出 / ナノメータ不純物検出 / non-contact detection / laser diffusion / ceramics / non-destructive inspection / crack / クラック検査 / マイクロクラック検査 / 外観自動検査 / レーザ拡散 / セラミックス内部欠陥 / セラミックスクラック / Detection of Scattered Light / New-Medium / Laser Diode / Liquid Crystal Display / Detection of Particle / 標準粒子 / 歩留り向上 / ニューメディア / 散乱光検出 / 半導体レーザ / 不純物検出 / 液晶表示素子 / 微粒子検出 / FID / 溶媒検出 / 媒体検出 / 浸透媒体 / ファイン焼結体 … More
Except Principal Investigator
Wear / Friction / Measurement / Computer Aided Testing / 摩耗 / 摩擦 / 計測 / 計算機援用検査 Less
  • Research Projects

    (5 results)
  • Co-Researchers

    (8 People)
  •  Development of Automatic Detection Machine for Contaminants on Wafer and Crystal Originated Particles (COP) in Wafer with Nano-meter orderPrincipal Investigator

    • Principal Investigator
      AKIYAMA Nobuyuki
    • Project Period (FY)
      2002 – 2003
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Measurement engineering
    • Research Institution
      Nagaoka University of Technology
  •  Realization of parts lifecycle lengthening using highly automated inspection system

    • Principal Investigator
      YAMADA Yasuhiro
    • Project Period (FY)
      2002 – 2003
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Intelligent mechanics/Mechanical systems
    • Research Institution
      University of Fukui
  •  Development of Rapid Detection and Evaluation System for Inner and Narrow Defects in Fine CeramicsPrincipal Investigator

    • Principal Investigator
      AKIYAMA Nobuyuki
    • Project Period (FY)
      1997 – 1998
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      計測・制御工学
    • Research Institution
      Nagaoka University of Technology
  •  Inspection System for Nano-meter Particle on Circuit Board used for New-medium with High Power Laser DiodePrincipal Investigator

    • Principal Investigator
      AKIYAMA Nobuyuki
    • Project Period (FY)
      1995 – 1996
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      計測・制御工学
    • Research Institution
      Nagaoka University of Technology
  •  浸透媒体検出によるファイン焼結微細クラック自動検出法の研究Principal Investigator

    • Principal Investigator
      秋山 伸幸
    • Project Period (FY)
      1994
    • Research Category
      Grant-in-Aid for General Scientific Research (C)
    • Research Field
      計測・制御工学
    • Research Institution
      Nagaoka University of Technology
  • 1.  ISHIZAKI Kouzou (10176183)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 2.  KURITA Masanori (20087175)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 3.  YAMADA Yasuhiro (40220412)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 4.  KOMURA Yoshiaki (00020214)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 5.  HARA Yasuhiko
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 6.  YOSHIMURA Takaharu
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 7.  KOSIZUMI Mituyoshi
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 8.  MASUDA Masanobu
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results

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