KASHIWAKURA Takayuki 柏倉隆之

… Alternative Names

柏倉隆之カシワクラタカユキ

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Researcher Number	90261817
Other IDs
Affiliation (Current)	2025: 宇都宮大学, 工学部, 准教授
Affiliation (based on the past Project Information) *help	2005 – 2006: 宇都宮大学, 工学部, 講師 1998 – 2001: 宇都宮大学, 工学部, 助手 1994: Faculty of Engineering Utsunomiya University, Asistant, 工学部, 助手
Review Section/Research Field	Principal Investigator Thin film/Surface and interfacial physical properties Except Principal Investigator 固体物性Ⅰ(光物性・半導体・誘電体) / Applied materials science/Crystal engineering
Keywords	Principal Investigator oxide / chemical state / nano / grazing incidence / electron beam / spectroscopy / x-ray / 遷移金属 / 状態分析 / 化学結合 … More / シリケート / ナノメートル / 酸化物 / 化学状態 / ナノ / 小角入射 / 電子線 / 分光 / X線 … More Except Principal Investigator 軟X線分光器 / surface and interface / interface electronic structure / Si interface / MnSi / inverse photoelectron / Soft X-ray emission spectra / X線光電子スペクトル / X線電子スペクトル / 逆光電子スペクトル / シリコン界面 / シリサイド / 界面電子状態 / 薄膜成長 / 共鳴逆光電子スペクトル / 軟X線発光スペクトル / Si表面,界面 / Mnシリサイド / Soft X-ray Spectroscopy / Soft X-ray Monochrometor / Position Sensitive Detector / X-ray Crystal Spectrometer / Soft X-ray Spectrometer / 軟X線分光法 / X線モノクロメータ / 軟X線単色計 / 位置敏感型検出器 / X線結晶分光器 / Soft X-Ray Resonant Auger / Soft X-Ray Raman Scattering / Soft X-Ray Specctrometer / 軟X線計測 / 軟X線ラマン散乱 Less

Development of a grazing incidence electron-induced x-ray emission spectroscopy technique for in-depth analysis of oxide thin films.Principal Investigator
- Principal Investigator
  
  KASHIWAKURA Takayuki
- Project Period (FY)
  2005 – 2006
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  Utsunomiya University
Research in the electronic structure of MnSi/Si interface by soft X-ray emission spectroscopy and inverse resonant photoelectron spectroscopy
- Principal Investigator
  
  NAKAI Shun-ichi
- Project Period (FY)
  1999 – 2001
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Applied materials science/Crystal engineering
- Research Institution
  Utsunomiya University
Development of curved crystal spectrometer for soft X-ray emission spectroscopy
- Principal Investigator
  
  NAKAI Shun-ichi
- Project Period (FY)
  1998 – 2000
- Research Category
  
  Grant-in-Aid for Scientific Research (B).
- Research Field
  
  固体物性Ⅰ(光物性・半導体・誘電体)
- Research Institution
  Utsunomiya University
Trial production of the curved crystal spectrometer for soft X-Ray Raman scattering spectroscopy
- Principal Investigator
  
  NAKAI Shunichi
- Project Period (FY)
  1993 – 1994
- Research Category
  
  Grant-in-Aid for Developmental Scientific Research (B)
- Research Field
  
  固体物性Ⅰ(光物性・半導体・誘電体)
- Research Institution
  Faculty of Engineering Utsunomiya University

All 2007 2006 Other

All Journal Article

[Journal Article] In-Depth Chemical State Analysis of a Lanthanum Silicate Layer Formed by Thermal Oxidation of LaSi_x/Si(100)2007
- Author(s)
  T.Kashiwakura, S.Nakai, M.Suzuki
- Journal Title
  
  Transactions of the Materials Research Society of Japan
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17560020
[Journal Article] In-Depth Chemical State Analysis of a Lanthanum Silicate Layer Formed by Thermal Oxidation of LaSix/Si(100)2007
- Author(s)
  T.Kashiwakura, S.Nakai, M.Suzuki
- Journal Title
  
  Transactions of the Materials Research Society of Japan (to be published)
- NAID
  130007922972
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17560020
[Journal Article] Study of Surface Oxidation of Iron Foils by Grazing Incidence Electron-Induced X-ray Emission Spectroscopy2006
- Author(s)
  T.Kashiwakura, S.Nakai
- Journal Title
  
  Radiation Physics and Chemistry Vol.75
  
  Pages: 1888-1893
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17560020
[Journal Article] Study of Surface Oxidation of Iron Foils by Grazing Incidence Electron-Induced X-ray Emission Spectroscopy2006
- Author(s)
  T.Kashiwakura, S.Nakai
- Journal Title
  
  Radiation Physics and Chemistry 75
  
  Pages: 1888-1893
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17560020
[Journal Article] In-Depth Chemical State Analysis of a Lanthanum Silicate Layer Formed by Thermal Oxidation of LaSix/Si(100)2006
- Author(s)
  T.Kashiwakura, S.Nakai, M.Suzuki
- Journal Title
  
  Transactions of the Materials Research Society of Japan (印刷中)(To be published in)
- NAID
  130007922972
- Data Source
  KAKENHI-PROJECT-17560020
[Journal Article] Study of Surface Oxidation of Iron Foils by Grazing Incidence Electron-induced X-ray Emission Spectroscopy2006
- Author(s)
  T.Kashiwakura, S.Nakai
- Journal Title
  
  Radiation Physics and Chemistry 75
  
  Pages: 1888-1893
- Data Source
  KAKENHI-PROJECT-17560020
[Journal Article] Study of surface oxidation of iron foils by grazing incidence electron-induced X-ray emission spectroscopy
- Author(s)
  T.Kashiwakura, S.Nakai
- Journal Title
  
  Radiation Physics and Chemistry, Proceedings of the 20^<th> International Conference X05 (to be published)
- Data Source
  KAKENHI-PROJECT-17560020

1. NAKAI Shunichi (70081429)

# of Collaborated Projects: 3 results

# of Collaborated Products: 0 results
2. SAITOH Keiichi

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
3. YAMAZAKI Takafumi

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
4. 斎藤啓一

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

KASHIWAKURA Takayuki 柏倉 隆之

柏倉 隆之 カシワクラ タカユキ

Research Projects

Research Products

Co-Researchers

Development of a grazing incidence electron-induced x-ray emission spectroscopy technique for in-depth analysis of oxide thin films.Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Research in the electronic structure of MnSi/Si interface by soft X-ray emission spectroscopy and inverse resonant photoelectron spectroscopy

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Development of curved crystal spectrometer for soft X-ray emission spectroscopy

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Trial production of the curved crystal spectrometer for soft X-Ray Raman scattering spectroscopy

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Journal Article] In-Depth Chemical State Analysis of a Lanthanum Silicate Layer Formed by Thermal Oxidation of LaSi_x/Si(100)2007

Author(s)

Journal Title

Description

Data Source

[Journal Article] In-Depth Chemical State Analysis of a Lanthanum Silicate Layer Formed by Thermal Oxidation of LaSix/Si(100)2007

Author(s)

Journal Title

NAID

Description

Data Source

[Journal Article] Study of Surface Oxidation of Iron Foils by Grazing Incidence Electron-Induced X-ray Emission Spectroscopy2006

Author(s)

Journal Title

Description

Data Source

[Journal Article] Study of Surface Oxidation of Iron Foils by Grazing Incidence Electron-Induced X-ray Emission Spectroscopy2006

Author(s)

Journal Title

Description

Data Source

[Journal Article] In-Depth Chemical State Analysis of a Lanthanum Silicate Layer Formed by Thermal Oxidation of LaSix/Si(100)2006

Author(s)

Journal Title

NAID

Data Source

[Journal Article] Study of Surface Oxidation of Iron Foils by Grazing Incidence Electron-induced X-ray Emission Spectroscopy2006

Author(s)

Journal Title

Data Source

[Journal Article] Study of surface oxidation of iron foils by grazing incidence electron-induced X-ray emission spectroscopy

Author(s)

Journal Title

Data Source

KASHIWAKURA Takayuki 柏倉隆之

柏倉隆之カシワクラタカユキ