Holographic Analysis of Incident Electron Beam Angular Distribution of Characteristic X-rays: Internal Detector Electron Holography
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- Hayashi Kouichi
- Institute for Materials Research, Tohoku University
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- Matsushita Tomohiro
- Japan Synchrotron Radiation Research Institute (JASRI), SPring-8
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- Matsubara Eiichiro
- Department of Materials Science and Engineering, Kyoto University
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The incident electron beam angular distribution of Ti Kα characteristic X-rays from a strontium titanate single crystal was measured by scanning electron microscopy. The isotropy exhibits typical features observed in conventional photoelectron holography. Reconstructions by Fourier-transformation-based algorithm clearly show neighboring Sr and Ti atoms around Ti, the validity of which was verified by computer simulation. The demonstration paves the way to obtaining multiple energy holograms of nanostructured materials using the energy tunability of focused electron beams.
収録刊行物
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- Journal of the Physical Society of Japan
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Journal of the Physical Society of Japan 75 (5), 053601-, 2006
一般社団法人 日本物理学会
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詳細情報
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- CRID
- 1390001204190405376
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- NII論文ID
- 110004702307
- 210000106129
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- NII書誌ID
- AA00704814
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- BIBCODE
- 2006JPSJ...75e3601H
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- ISSN
- 13474073
- 00319015
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- NDL書誌ID
- 7907876
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可