書誌事項
- タイトル別名
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- Progress of Three-Dimensional Atomic Image Investigations by X-Ray Fluorescence Holography
- ケイコウ Xセン ホログラフィー ニ ヨル 3ジゲン ゲンシ イメージ ケンキュウ ノ シンテン
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抄録
<p>In recent years, X-ray fluorescence holography (XFH) investigations are remarkably developed to draw three-dimensional (3D) atomic images and to clarify local structures of functional materials, which can compensate for disadvantages of other methods for structural characterizations such as diffraction and X-ray absorption fine structure (XAFS). One of the important topics on the XFH experiments is to find an impurity site in a crystal. The second is to utilize a two-dimensional detector for saving data acquisition time and for conducting valence-selective XFH experiments. In this article, recent progresses of the XFH technique and their applications to functional materials are introduced.</p>
収録刊行物
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- 表面と真空
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表面と真空 61 (12), 784-789, 2018-12-10
公益社団法人 日本表面真空学会
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キーワード
詳細情報
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- CRID
- 1390564238051302144
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- NII論文ID
- 130007528735
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- NII書誌ID
- AA12808657
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- ISSN
- 24335843
- 24335835
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- NDL書誌ID
- 029402709
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
- KAKEN
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- 抄録ライセンスフラグ
- 使用不可