弓野 健太郎  Kyuno Kentaro

Applied Physics Letters

巻: 122 号: 17 ページ: 172101-172101

10.1063/5.0145370

Journal of Vacuum Science & Technology B

巻: 40 号: 3 ページ: 030601-030601

10.1116/6.0001774

Applied Physics Express

巻: 9 号: 9 ページ: 095501-095501

10.7567/apex.9.095501

210000138051

Japanese Journal of Applied Phyiscs

巻: 54 号: 6S1 ページ: 06FH06-06FH06

10.7567/jjap.54.06fh06

210000145254

真空ジャーナル

巻: 151 ページ: 13-15

Journal of Applied Physics

巻: 114 号: 24 ページ: 244307-244307

10.1063/1.4856975

Journal of Physics D: Applied Physics

巻: 46 号: 50 ページ: 505304-505304

10.1088/0022-3727/46/50/505304

Applied Physics Express 4

ページ: 51801-51801

10028210204

Japanese Journal of Applied Physics 48

ページ: 60202-60202

Applied Physics Letters 88(7)

ページ: 72904-72904

10022542508

International Conference on Microelectronics and Interfaces (ICMI'06)

Appl.Phys.Lett. 88

ページ: 72904-72904

10022542508

2006 International Meeting for Future of Electron Devices, Kansai (IMFEDK)

ページ: 27-28

Ext.Abst. 10th Workshop on Gate Stacks -Physics in Materials, Fabrication Processes and Characterizations-

ページ: 167-172

Ext.Abst. 10th Workshop on Gate Stacks -Physics in Materials, Fabrication Processes and Characterizations-

ページ: 309-314

Ext.Abst. 2005 Int.Conf. on Solid State Devices and Materials (SSDM)

ページ: 858-859

10022543442

Appl.Phys.Lett. 86(6)

ページ: 63510-63510

Japanese Journal of Applied Physics Pt.1,44

ページ: 6131-6135

207th Meeting of the Electrochemical Society

Ext.Abst. 2005 Int.Conf. on Solid State Devices and Materials (SSDM)

ページ: 546-547

10022542508

Applied Physics Letters 86(6)

ページ: 63510-63510

Appl. Phys. Lett. 86(6)

ページ: 63510-63510

ゲートスタック研究会-材料・プロセス・評価の物理- 第10回

ページ: 309-314

36th IEEE Semiconductor Interface Specialists Conference (SISC) P-11

Ext.Abst. 2005 Int.Conf. on Solid State Devices and Materials (SSDM)

ページ: 520-521

Ext.Abst. 10th Workshop on Gate Stacks -Physics in Materials, Fabrication Processes and Characterizations-

ページ: 209-214

36th IEEE Semiconductor Interface Specialists Conference (SISC) 36

ページ: 10-10

Ext.Abst. 2005 Int.Conf. on Solid State Devices and Materials (SSDM)

ページ: 252-253

Extended Abstracts of 2005 International Conference on Solid State Devices and Materials 2005

ページ: 858-859

Jpn.J.Appl.Phys.Pt.1 44(8)

ページ: 6131-6135

Ext.Abst. 2005 Int.Conf. on Solid State Devices and Materials (SSDM)

ページ: 254-255

Ext.Abst. 10th Workshop on Gate Stacks -Physics in Materials, Fabrication Processes and Characterizations-

ページ: 265-270

35th IEEE Semiconductor Interface Specialists Conference (SISC) LP-3

Ext.Abst. 9th Workshop on Formation, Characterization and Reliability of Ultrathin Silicon Oxides

ページ: 259-264

Extended Abstracts of 2004 International Conference on Solid State Devices and Materials

ページ: 788-789

Ext.Abst. 2004 Int.Conf. Solid State Dev.Mater. (SSDM)

ページ: 788-789

Integration of Advanced Micro- and Nanoelectronic Devices - Critical Issues and Solutions, MRS Symp.Proc. 811

ページ: 319-324

Ext.Abst. 2004 Int.Conf. Solid State Dev.Mater. (SSDM)

ページ: 786-787

Ext.Abst. 2004 Int.Conf. Solid State Dev.Mater. (SSDM)

ページ: 790-791

10022540150

Ext.Abst. 2004 Int.Conf. Solid State Dev.Mater. (SSDM)

ページ: 794-795

10022540160

Appl.Phys.Lett. 85(1)

ページ: 52-54

Ext.Abst. 9th Workshop on Formation, Characterization and Reliability of Ultrathin Silicon Oxides

ページ: 265-270

Extended Abstracts of 2004 International Conference on Solid State Devices and Materials 2004

ページ: 788-789

Integration of Advanced Micro- and Nanoelectronic Devices - Critical Issues and Solutions, MRS Symp.Proc. 811

ページ: 169-174

Appl.Phys.Lett. 86(7)102906(2005).rface Specialists Conference (SISC) LP-3

Ext.Abst. 2004 Int.Conf. Solid State Dev.Mater. (SSDM)

ページ: 226-227

10022538299

Ext.Abst. 2004 Int.Conf. Solid State Dev.Mater. (SSDM)

ページ: 534-535

Ext.Abst. 2004 Int.Conf. Solid State Dev.Mater. (SSDM)

ページ: 796-797

10022540167

Ext.Abst. 2003 Int.Conf. Solid State Dev.Mater. (SSDM)

ページ: 292-293

Jpn.J.Appl.Phys. 42,Pt.2(6B)

10011259919

2003 Int. Conference on Characterization and Metrology for ULSI Technology, AIP Conf.Proc. 550

ページ: 166-170

Int. Workshop on Gate Insulator (IWGI)

ページ: 186-191

Ext.Abst.Int.Conf. Solid State Dev.Mater. (SSDM)

ページ: 486-487

Ext.Abst.Int.Conf. Solid State Dev.Mater. (SSDM)

ページ: 66-67