細川 利典  Hosokawa Toshinori

IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences

巻: E107.A 号: 3 ページ: 583-591

10.1587/transfun.2023VLP0018

2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)

巻: 24 ページ: 228-231

10.1109/iolts.2018.8474097

2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)

巻: 24 ページ: 43-46

10.1109/iolts.2018.8474268

2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)

巻: 24 ページ: 195-200

10.1109/iolts.2018.8474080